Fairchild FDD6N50TMF085 N-channel unifettm mosfet500 v, 6 a, 900 mî© Datasheet

FDD6N50 / FDU6N50
N-Channel UniFETTM MOSFET
500 V, 6 A, 900 mΩ
Features
Description
• RDS(on) = 900 mΩ (Max.) @ VGS = 10 V, ID = 3 A
UniFETTM MOSFET is Fairchild Semiconductor’s high voltage
MOSFET family based on planar stripe and DMOS technology.
This MOSFET is tailored to reduce on-state resistance, and to
provide better switching performance and higher avalanche
energy strength. This device family is suitable for switching
power converter applications such as power factor correction
(PFC), flat panel display (FPD) TV power, ATX and electronic
lamp ballasts.
• Low Gate Charge (Typ. 12.8 nC)
• Low Crss (Typ. 9 pF)
• 100% Avalanche Tested
• Improved dv/dt Capability
Applications
• LCD/LED/PDP TV
• Lighting
• Uninterruptible Power Supply
• AC-DC Power Supply
D
D
G
S
D-PAK
Absolute Maximum Ratings
Symbol
I-PAK
G
D
G
S
S
TC = 25oC unless otherwise noted.
Parameter
VDSS
Drain-Source Voltage
ID
Drain Current
- Continuous (TC = 25°C)
- Continuous (TC = 100°C)
- Pulsed
FDD6N50TM /
FDD6N50TM_WS /
FDU6N50TU
Unit
500
V
6
3.8
A
A
24
A
IDM
Drain Current
VGSS
Gate-Source voltage
EAS
Single Pulsed Avalanche Energy
(Note 2)
IAR
Avalanche Current
(Note 1)
6
A
EAR
Repetitive Avalanche Energy
(Note 1)
8.9
mJ
dv/dt
Peak Diode Recovery dv/dt
(Note 3)
4.5
V/ns
PD
Power Dissipation
89
0.71
W
W/°C
-55 to +150
°C
300
°C
FDD6N50TM /
FDD6N50TM_WS /
FDU6N50TU
Unit
(Note 1)
(TC = 25°C)
- Derate Above 25°C
TJ, TSTG
Operating and Storage Temperature Range
TL
Maximum Lead Temperature for Soldering, 1/8” from Case for
5 Seconds
±30
V
270
mJ
Thermal Characteristics
Symbol
Parameter
RθJC
Thermal Resistance, Junction-to-Case, Max.
1.4
RθJA
Thermal Resistance, Junction-to-Ambient, Max.
83
©2006 Fairchild Semiconductor Corporation
FDD6N50 / FDU6N50 Rev. C1
1
°C/W
www.fairchildsemi.com
FDD6N50 / FDU6N50 — N-Channel UniFETTM MOSFET
November 2013
Part Number
FDD6N50TM
Top Mark
FDD6N50
Package
DPAK
Packing Method
Tape and Reel
Reel Size
330 mm
Tape Width
16 mm
Quantity
2500 units
FDD6N50TM_WS
FDD6N50S
DPAK
Tape and Reel
330 mm
16 mm
2500 units
FDU6N50TU
FDU6N50
IPAK
Tube
N/A
N/A
75 units
Electrical Characteristics
Symbol
TC = 25°C unless otherwise noted.
Parameter
Conditions
Min.
Typ.
Max
Unit
500
--
--
V
Off Characteristics
BVDSS
Drain-Source Breakdown Voltage
VGS = 0 V, ID = 250 μA
ΔBVDSS
/ ΔTJ
Breakdown Voltage Temperature
Coefficient
ID = 250 μA, Referenced to 25°C
--
0.5
--
V/°C
IDSS
Zero Gate Voltage Drain Current
VDS = 500 V, VGS = 0 V
VDS = 400 V, TC = 125°C
---
---
1
10
μA
μA
IGSSF
Gate-Body Leakage Current, Forward
VGS = 30 V, VDS = 0 V
--
--
100
nA
IGSSR
Gate-Body Leakage Current, Reverse
VGS = -30 V, VDS = 0 V
--
--
-100
nA
3.0
--
5.0
V
On Characteristics
VGS(th)
Gate Threshold Voltage
VDS = VGS, ID = 250 μA
RDS(on)
Static Drain-Source
On-Resistance
VGS = 10 V, ID = 3 A
--
0.76
0.9
Ω
gFS
Forward Transconductance
VDS = 40 V, ID = 3 A
--
2.5
--
S
VDS = 25 V, VGS = 0 V,
f = 1.0 MHz
--
720
940
pF
Dynamic Characteristics
Ciss
Input Capacitance
Coss
Output Capacitance
Crss
Reverse Transfer Capacitance
--
95
190
pF
--
9
13.5
pF
--
6
20
ns
--
55
120
ns
--
25
60
ns
Switching Characteristics
td(on)
Turn-On Delay Time
tr
Turn-On Rise Time
td(off)
Turn-Off Delay Time
tf
Turn-Off Fall Time
Qg
Total Gate Charge
Qgs
Gate-Source Charge
Qgd
Gate-Drain Charge
VDD = 250 V, ID = 6 A,
VGS = 10 V, RG = 25 Ω
(Note 4)
VDS = 400 V, ID = 6 A,
VGS = 10 V
(Note 4)
--
35
80
ns
--
12.8
16.6
nC
--
3.7
--
nC
--
5.8
--
nC
Drain-Source Diode Characteristics and Maximum Ratings
IS
Maximum Continuous Drain-Source Diode Forward Current
--
--
6
A
ISM
Maximum Pulsed Drain-Source Diode Forward Current
--
--
24
A
VSD
Drain-Source Diode Forward Voltage
VGS = 0 V, IS = 6 A
--
--
1.4
V
trr
Reverse Recovery Time
--
275
--
ns
Qrr
Reverse Recovery Charge
VGS = 0 V, IS = 6 A,
dIF/dt =100 A/μs
--
1.7
--
μC
Notes:
1. Repetitive rating: pulse-width limited by maximum junction temperature.
2. IAS = 6 A, VDD = 50 V, L=13.5 mH, RG = 25 Ω, starting TJ = 25°C.
3. ISD ≤ 6 A, di/dt ≤ 200 A/μs, VDD ≤ BVDSS, starting TJ = 25°C.
4. Essentially independent of operating temperature typical characteristics.
©2006 Fairchild Semiconductor Corporation
FDD6N50 / FDU6N50 Rev. C1
2
www.fairchildsemi.com
FDD6N50 / FDU6N50 — N-Channel UniFETTM MOSFET
Package Marking and Ordering Information
Figure 1. On-Region Characteristics
Top :
ID, Drain Current [A]
15
Bottom :
VGS
10.0 V
8.0V
7.5 V
7.0 V
6.5 V
6.0 V
5.5 V
5.0 V
1
10
ID , Drain Current [A]
20
Figure 2. Transfer Characteristics
10
※ Notes :
1. 250μ s Pulse Test
2. TC = 25℃
5
0
0
10
20
30
40
150℃
0
10
25℃
-55℃
-1
10
※ Note
1. VDS = 40V
2. 250μ s Pulse Test
-2
50
10
2
VDS, Drain-Source Voltage [V]
8
10
Figure 4. Body Diode Forward Voltage
Variation vs. Source Current
and Temperature
2.5
IDR , Reverse Drain Current [A]
RDS(ON) [Ω ],Drain-Source On-Resistance
6
VGS , Gate-Source Voltage [V]
Figure 3. On-Resistance Variation vs.
Drain Current and Gate Voltage
2.0
VGS = 10V
1.5
VGS = 20V
1.0
0.5
1
10
0
10
150℃
25℃
※ Notes :
1. VGS = 0V
2. 250μ s Pulse Test
※ Note : TJ = 25℃
0.0
-1
0
5
10
15
10
20
0.2
Figure 5. Capacitance Characteristics
VGS, Gate-Source Voltage [V]
Crss
※ Notes :
1. VGS = 0 V
2. f = 1 MHz
10
10
1.4
1.6
1.8
VDS = 400V
8
6
4
2
※ Note : ID = 6A
0
5
10
15
QG, Total Gate Charge [nC]
VDS, Drain-Source Voltage [V]
©2006 Fairchild Semiconductor Corporation
FDD6N50 / FDU6N50 Rev. C1
1.2
VDS = 250V
10
0
1
10
1.0
VDS = 100V
Coss
0
0.8
12
Ciss
100
0.6
Figure 6. Gate Charge Characteristics
Ciss = Cgs + Cgd (Cds = shorted)
Coss = Cds + Cgd
Crss = Cgd
1000
0.4
VSD , Source-Drain Voltage [V]
ID, Drain Current [A]
Capacitance [pF]
4
3
www.fairchildsemi.com
FDD6N50 / FDU6N50 — N-Channel UniFETTM MOSFET
Typical Performance Characteristics
Figure 7. Breakdown Voltage Variation
vs. Temperature
Figure 8. On-Resistance Variation
vs. Temperature
3.0
RDS(ON), (Normalized)
Drain-Source On-Resistance
BVDSS, (Normalized)
Drain-Source Breakdown Voltage
1.2
1.1
1.0
♦ Notes :
0.9
1. VGS = 0 V
2. ID = 250 μA
0.8
-100
-50
0
50
100
150
2.5
2.0
1.5
1.0
♦ Notes :
0.5
1. VGS = 10 V
2. ID = 3 A
0.0
-100
200
-50
0
o
TJ, Junction Temperature [ C]
2
100
150
200
o
Figure 9. Maximum Safe Operating Area
10
50
TJ, Junction Temperature [ C]
Figure 10. Maximum Drain Current
vs. Case Temperature
8
Operation in This Area
is Limited by R DS(on)
6
100 us
ID, Drain Current [A]
ID, Drain Current [A]
10 us
1
10
1 ms
10 ms
DC
0
10
※ Notes :
-1
10
o
1. TC = 25 C
4
2
o
2. TJ = 150 C
3. Single Pulse
-2
10
0
10
1
2
10
0
25
3
10
10
50
75
VDS, Drain-Source Voltage [V]
100
125
150
TC, Case Temperature [℃]
ZθJC(t), Thermal Response [oC/W]
Zθ JC(t), Thermal Response
Figure 11. Transient Thermal Response Curve
10
0
D = 0 .5
0 .2
※ N o te s :
1 . Z θ J C(t) = 1 .4 ℃ /W M a x.
2 . D u ty F a c to r, D = t 1 /t 2
3 . T JM - T C = P D M * Z θ J C(t)
0 .1
10
-1
0 .0 5
PDM
0 .0 2
t1
0 .0 1
t2
s in g le p u ls e
10
-2
10
-5
10
-4
10
-3
10
-2
10
-1
10
0
10
1
t 1 , S q u a re W a v e P u ls e D u ra tio n [s e c ]
©2006 Fairchild Semiconductor Corporation
FDD6N50 / FDU6N50 Rev. C1
4
www.fairchildsemi.com
FDD6N50 / FDU6N50 — N-Channel UniFETTM MOSFET
Typical Performance Characteristics (Continued)
50KΩ
200nF
12V
FDD6N50 / FDU6N50 — N-Channel UniFETTM MOSFET
VGS
Same Type
as DUT
Qg
10V
300nF
VDS
VGS
Qgs
Qgd
DUT
IG = const.
3mA
Charge
Figure 12. Gate Charge Test Circuit & Waveform
VDS
RG
RL
VDS
90%
VDD
VGS
VGS
DUT
V
10V
GS
10%
td(on)
tr
td(off)
t on
tf
t off
Figure 13. Resistive Switching Test Circuit & Waveforms
BVDSS
1
EAS = ---- L IAS2 -------------------2
BVDSS - VDD
L
VDS
BVDSS
IAS
ID
RG
V
10V
GS
GS
VDD
ID (t)
VDS (t)
VDD
DUT
tp
tp
Time
Figure 14. Unclamped Inductive Switching Test Circuit & Waveforms
©2006 Fairchild Semiconductor Corporation
FDD6N50 / FDU6N50 Rev. C1
5
www.fairchildsemi.com
FDD6N50 / FDU6N50 — N-Channel UniFETTM MOSFET
DUT
+
VDS
_
I SD
L
Driver
RG
VGS
VGS
( Driver )
Same Type
as DUT
VDD
• dv/dt controlled by RG
• ISD controlled by pulse period
Gate Pulse Width
D = -------------------------Gate Pulse Period
10V
IFM , Body Diode Forward Current
I SD
( DUT )
di/dt
IRM
Body Diode Reverse Current
VDS
( DUT )
Body Diode Recovery dv/dt
VSD
VDD
Body Diode
Forward Voltage Drop
Figure 15. Peak Diode Recovery dv/dt Test Circuit & Waveforms
©2006 Fairchild Semiconductor Corporation
FDD6N50 / FDU6N50 Rev. C1
6
www.fairchildsemi.com
FDD6N50 / FDU6N50 — N-Channel UniFETTM MOSFET
Mechanical Dimensions
Figure 16. TO252 (D-PAK), Molded, 3-Lead, Option AA&AB
Package drawings are provided as a service to customers considering Fairchild components. Drawings may change in any manner
without notice. Please note the revision and/or date on the drawing and contact a Fairchild Semiconductor representative to verify or
obtain the most recent revision. Package specifications do not expand the terms of Fairchild’s worldwide terms and conditions, specifically the warranty therein, which covers Fairchild products.
Always visit Fairchild Semiconductor’s online packaging area for the most recent package drawings:
http://www.fairchildsemi.com/package/packageDetails.html?id=PN_TT252-003
©2006 Fairchild Semiconductor Corporation
FDD6N50 / FDU6N50 Rev. C1
7
www.fairchildsemi.com
FDD6N50 / FDU6N50 — N-Channel UniFETTM MOSFET
Mechanical Dimensions
Figure 17. TO-251 (I-PAK), Molded, 3-Lead, Option AA
Package drawings are provided as a service to customers considering Fairchild components. Drawings may change in any manner
without notice. Please note the revision and/or date on the drawing and contact a Fairchild Semiconductor representative to verify or
obtain the most recent revision. Package specifications do not expand the terms of Fairchild’s worldwide terms and conditions, specifically the warranty therein, which covers Fairchild products.
Always visit Fairchild Semiconductor’s online packaging area for the most recent package drawings:
http://www.fairchildsemi.com/package/packageDetails.html?id=PN_TT251-003
©2006 Fairchild Semiconductor Corporation
FDD6N50 / FDU6N50 Rev. C1
8
www.fairchildsemi.com
tm
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Definition of Terms
Datasheet Identification
Product Status
Definition
Advance Information
Formative / In Design
Datasheet contains the design specifications for product development. Specifications
may change in any manner without notice.
Preliminary
First Production
Datasheet contains preliminary data; supplementary data will be published at a later
date. Fairchild Semiconductor reserves the right to make changes at any time without
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Datasheet contains final specifications. Fairchild Semiconductor reserves the right to
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Datasheet contains specifications on a product that is discontinued by Fairchild
Semiconductor. The datasheet is for reference information only.
Rev. I66
©2006 Fairchild Semiconductor Corporation
FDD6N50 / FDU6N50 Rev. C1
9
www.fairchildsemi.com
FDD6N50 / FDU6N50 — N-Channel UniFETTM MOSFET
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