TI1 ESD401DPY 1-channel esd protection diode with robust iec esd performance Datasheet

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ESD401
SLVSE49A – JULY 2017 – REVISED JULY 2017
ESD401 1-Channel ESD Protection Diode With Robust IEC ESD Performance
1 Features
3 Description
•
The ESD401 is a bidirectional TVS ESD protection
diode featuring low RDYN and low clamping voltage.
The ESD401 is rated to dissipate ESD strikes
exceeding the maximum level specified in the IEC
61000-4-2 international standard (Level 4). The low
dynamic resistance (0.7 Ω) to ensure system level
protection against transient events. This device
features a 0.77 pF IO capacitance making it ideal for
protecting interfaces such as USB 2.0. The device
can operate with ultra-low leakage up to ±5.5 V and
survive DC faults up to 8.3 V.
•
•
•
•
•
•
•
•
The ESD401 is offered in the industry standard 0402
(DPY) package.
Device Information(1)
PART NUMBER
ESD401DPY
•
End Equipment
– Wearables
– Laptops and Desktops
– Mobile and Tablets
– Set-Top Boxes
– DVR and NVR
– TV and Monitors
– EPOS (Electronic Point of Sale)
Interfaces
– 1 Gbps Ethernet
– USB 2.0/1.1 with 5.5 V tolerance
– GPIO
– Pushbuttons/Keypad
– Audio
BODY SIZE (NOM)
0.60 mm × 1.00 mm
(1) For all available packages, see the orderable addendum at
the end of the data sheet.
2 Applications
•
PACKAGE
X1SON (2)
Typical USB 2.0 Application Schematic
5-V Source
VBUS
DD+
1
GND
1
USB Transceiver
ESD401
•
Robust IEC 61000-4-2 Level 4 ESD Protection
– ±24-kV Contact Discharge
– ±30-kV Air Gap Discharge
IEC 61000-4-5 Surge Protection
– 4.5 A (8/20 µs)
– Low Vclamp of 12 V at 1.8 A IPP (8/20 µs)
IEC 61000-4-4 EFT Protection
– 80 A (5/50 ns)
Bi-directional ESD diode to protect interfaces up
to ± 5.5 V
IO Capacitance: 0.77 pF (Typical)
High DC Breakdown Voltage: 8.3 V (Typical)
Ultra Low Leakage Current: 30 pA (Typical)
Low Dynamic Resistance 0.7 Ω (Typical)
Industrial Temperature Range: –40°C to +125°C
Industry Standard 0402 Package
ESD401
1
2
2
Copyright © 2017, Texas Instruments Incorporated
1
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
ESD401
SLVSE49A – JULY 2017 – REVISED JULY 2017
www.ti.com
Table of Contents
1
2
3
4
5
6
7
Features ..................................................................
Applications ...........................................................
Description .............................................................
Revision History.....................................................
Pin Configuration and Functions .........................
Specifications.........................................................
1
1
1
2
3
4
6.1
6.2
6.3
6.4
6.5
6.6
6.7
4
4
4
4
4
5
6
Absolute Maximum Ratings ......................................
ESD Ratings — JEDEC Specification .....................
ESD Ratings—IEC Specification ..............................
Recommended Operating Conditions.......................
Thermal Information ..................................................
Electrical Characteristics...........................................
Typical Characteristics ..............................................
Detailed Description .............................................. 8
7.1 Overview ................................................................... 8
7.2 Functional Block Diagram ......................................... 8
7.3 Feature Description................................................... 8
7.4 Device Functional Modes.......................................... 9
8
Application and Implementation ........................ 10
8.1 Application Information............................................ 10
8.2 Typical Application ................................................. 10
9 Power Supply Recommendations...................... 12
10 Layout................................................................... 12
10.1 Layout Guidelines ................................................. 12
10.2 Layout Example .................................................... 12
11 Device and Documentation Support ................. 13
11.1
11.2
11.3
11.4
11.5
11.6
Documentation Support ........................................
Receiving Notification of Documentation Updates
Community Resources..........................................
Trademarks ...........................................................
Electrostatic Discharge Caution ............................
Glossary ................................................................
13
13
13
13
13
13
12 Mechanical, Packaging, and Orderable
Information ........................................................... 13
4 Revision History
Changes from Original (July 2017) to Revision A
•
2
Page
Updated Figure 9 andFigure 13 ............................................................................................................................................ 6
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5 Pin Configuration and Functions
DPY Package
2-Pin X1SON
Top View
1
2
Pin Functions
PIN
NO.
NAME
I/O
DESCRIPTION
1
IO
I/O
ESD Protected Channel. If used as ESD IO, connect pin 2 to ground
2
IO
I/O
ESD Protected Channel. If used as ESD IO, connect pin 1 to ground
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ESD401
SLVSE49A – JULY 2017 – REVISED JULY 2017
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6 Specifications
6.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted) (1)
MIN
Electrical fast transient
Peak pulse
MAX
UNIT
80
A
IEC 61000-4-5 power (tp - 8/20 µs) at 25°C
67
W
IEC 61000-4-5 current (tp - 8/20 µs) at 25°C
4.5
A
IEC 61000-4-4 (5/50 ns) at 25°C
TA
Operating free-air temperature
–40
125
°C
Tstg
Storage temperature
–65
155
°C
(1)
Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended
Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
6.2 ESD Ratings — JEDEC Specification
VALUE
V(ESD)
(1)
(2)
Electrostatic discharge
Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001
(1)
UNIT
±2500
Charged-device model (CDM), per JEDEC specification JESD22-C101 (2)
V
±1000
JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
6.3 ESD Ratings—IEC Specification
VALUE
V(ESD)
Electrostatic discharge
IEC 61000-4-2 contact discharge
±24000
IEC 61000-4-2 air-gap discharge
±30000
UNIT
V
6.4 Recommended Operating Conditions
over operating free-air temperature range (unless otherwise noted)
MIN
MAX
VIO
Input pin voltage
–5.5
5.5
UNIT
V
TA
Operating free-air temperature
–40
125
°C
6.5 Thermal Information
ESD401
THERMAL METRIC (1)
DPY (X1SON)
UNIT
2 PINS
RθJA
Junction-to-ambient thermal resistance
420
°C/W
RθJC(top)
Junction-to-case (top) thermal resistance
169.3
°C/W
RθJB
Junction-to-board thermal resistance
276.1
°C/W
ψJT
Junction-to-top characterization parameter
122.1
°C/W
ψJB
Junction-to-board characterization parameter
157.3
°C/W
RθJC(bot)
Junction-to-case (bottom) thermal resistance
N/A
°C/W
(1)
4
For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report.
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6.6 Electrical Characteristics
over operating free-air temperature range (unless otherwise noted)
PARAMETER
VRWM
VBRF
VBRR
VHOLD
VCLAMP
Reverse stand-off voltage
Breakdown voltage, Pin 1 to Pin 2
(1)
Breakdown voltage, Pin 2 to Pin 1
(1)
Holding voltage
(2)
Clamping voltage
TEST CONDITIONS
IIO < 10 nA
MAX
UNIT
5.5
V
IIO =1 mA, at TA = 25°C
7.5
9.1
V
IIO =1 mA, at TA = 25°C
7.5
9.1
V
IIO =1 mA
8.3
IPP = 1 A, TLP, from Pin 1 to Pin 2
and Pin 2 to Pin 1, TA = 25°C
11
IPP = 5 A, TLP, from Pin 1 to Pin 2
and Pin 2 to Pin 1, TA = 25°C
16
IPP = 16 A, TLP, from Pin 1 to Pin 2
and Pin 2 to Pin 1, TA = 25°C
24
IPP = 1.8 A, IEC-61000-4-5 (tp - 8/20
µs) from Pin 1 to Pin 2 and Pin 2 to
Pin 1, TA = 25°C
12
IPP = 4.5 A, IEC-61000-4-5 (tp - 8/20
µs) from Pin 1 to Pin 2 and Pin 2 to
Pin 1, TA = 25°C
15
Leakage current, Pin 1 to Pin2 and
PIn2 to Pin 1
VIO = ±2.5 V
RDYN
Dynamic resistance
Measured between TLP IPP of 10 A
and 20 A, Pin 2 to Pin 1 and Pin 1 to
Pin2, TA = 25°C
CL
Line capacitance
VIO = 0 V, f = 1 MHz, Pin 1 to Pin 2
and Pin2 to Pin1, TA = 25°C
(2)
TYP
–5.5
ILEAK
(1)
MIN
V
V
0.03
10
0.7
0.77
nA
Ω
0.95
pF
VBRF and VBRR are defined as the voltage obtained at 1 mA when sweeping the voltage up, before the device latches into the snapback
state.
VHOLD is defined as the voltage when 1 mA is applied, after the device has successfully latched into the snapback state.
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32
32
28
28
24
24
20
20
Current (A)
Current (A)
6.7 Typical Characteristics
16
12
8
4
4
0
0
4
8
12
16
20
Voltage (V)
24
28
32
0
36
60
0
50
-10
40
-20
Voltage (V)
Voltage (V)
10
30
20
0
-60
30
45
60 75
Time (ns)
90
-70
-15
105 120 135 150
4.5
80
Current (A)
Power (W) 72
4
64
0.9
3.5
56
0.85
48
40
2
32
15
30
45
60 75
Time (ns)
90
105 120 135 150
D004
0.7
24
0.6
8
0.55
0
150
0.5
125
D002
0.8
16
100
36
0.75
1
50
75
Time (Ps)
32
0.95
1.5
25
28
1
Capacitance (pF)
3
2.5
0.5
24
Figure 4. –8-kV IEC 61000-4-2 Waveform, Pin 1 to Pin 2
Power (W)
5
0
0
D003
Figure 3. 8-kV IEC 61000-4-2 Waveform, Pin1 to Pin 2
0
-25
16
20
Voltage (V)
-40
-50
15
12
-30
10
0
8
Figure 2. Negative TLP Curve, Pin 1 to Pin 2 (Plotted as
Positive TLP Curve Pin 2 to Pin 1
70
-10
-15
4
D001
Figure 1. Positive TLP Curve, Pin 1 to Pin 2
Current (A)
12
8
0
0.65
-40
25
85
125
0
D005
Figure 5. Surge (IEC 61000-4-5) Curve (tp = 8/20 µs), Pin 1 to
Pin 2
6
16
0.5
1
1.5
2
Bias Voltage (V)
2.5
3
3.5
D006
Figure 6. Capacitance vs Bias Voltage, Pin 1 to Pin 2
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Typical Characteristics (continued)
0.001
2
1.8
1.6
0.0005
Leakage (nA)
Current (A)
1.4
0
1.2
1
0.8
0.6
-0.0005
0.4
0.2
-0.001
-10
-8
-6
-4
-2
0
2
Voltage (V)
4
6
8
0
-40
10
-20
0
20
D007
Figure 7. DC Voltage Sweep I-V Curve, Pin 1 to Pin 2
40
60
80
Temperature (qC)
100
120
140
D008
Figure 8. Leakage Current vs. Temperature, Pin 1 to Pin 2
1
1.6
0
1.4
-1
Capacitance (pF)
Insertion Loss (dB)
1.2
-2
-3
-4
-5
-6
1
0.8
0.6
0.4
-7
0.2
-8
-9
0.001
0
0.01
0.1
Frequency (GHz)
1
Figure 9. Insertion Loss
10
1
D009
2
3
4
5
Frequency (GHz)
6
7
8
D010
Figure 10. Capacitance vs. Frequency, Pin 1 to Pin 2
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7 Detailed Description
7.1 Overview
The ESD401 is a bidirectional ESD Protection Diode with ultra-low clamping voltage. This device can dissipate
ESD strikes above the maximum level specified by the IEC 61000-4-2 International Standard. The ultra-low
clamping makes this device ideal for protecting any sensitive signal pins.
7.2 Functional Block Diagram
IO
GND
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7.3 Feature Description
7.3.1 IEC 61000-4-2 ESD Protection
The I/O pins can withstand ESD events up to ±24-kV contact and ±30-kV air gap. An ESD-surge clamp diverts
the current to ground.
7.3.2 IEC 61000-4-4 EFT Protection
The I/O pins can withstand an electrical fast transient burst of up to 80 A (5/50 ns waveform, 4 kV with 50-Ω
impedance). An ESD-surge clamp diverts the current to ground.
7.3.3 IEC 61000-4-5 Surge Protection
The I/O pins can withstand surge events up to 4.5 A and 67W (8/20 µs waveform). An ESD-surge clamp diverts
this current to ground.
7.3.4 IO Capacitance
The capacitance between each I/O pin to ground is 0.77 pF (typical) and 0.95 pF (maximum).
7.3.5 DC Breakdown Voltage
The DC breakdown voltage of each I/O pin is ±8.3 V typical. This ensures that sensitive equipment is protected
from surges above the reverse standoff voltage of ±5.5 V.
7.3.6 Low Leakage Current
The I/O pins feature an low leakage current of 10 nA (maximum) with a bias of ±2.5 V.
7.3.7 Low ESD Clamping Voltage
The I/O pins feature an ESD clamp that is capable of clamping the voltage to 24 V (TLP IPP = 16 A).
7.3.8 Industrial Temperature Range
This device features an industrial operating range of –40°C to +125°C.
7.3.9 Industry Standard Footprint
The layout of this device makes it simple and easy to add protection to an existing layout. The packages offers
flow-through routing, requiring minimal modification to an existing layout.
8
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7.4 Device Functional Modes
The ESD401 is a passive integrated circuit that triggers when voltages are above VBRF or below VBRR. During
ESD events, voltages as high as ±24 kV (contact) or ±30 kV ( air) can be directed to ground via the internal
diode network. When the voltages on the protected line fall below the trigger levels of ESD401 (usually within
10s of nano-seconds) the device reverts to passive.
Figure 11 shows typical TLP behavior of bi-directional ESD device that does not exhibit snapback.
+ ve
Ipp
RDYN+
-Vhold-TLP
-VBR-TLP
-Vclamp-Ipp
- ve
-Vrwm
Vrwm VBR-TLP
Vhold-TLP
Vclamp-Ipp
+ ve
RDYNNote 1: VBR-TLP and Vhold-TLP shown here are from
the TLP measurements and not to be confused with
the DC measurements of VBRF,VBRR, and VHOLD in
Table 6.6
-Ipp
Note 2: Vrwm is not measured from the TLP curve.
,W¶V VKRZQ KHUH RQO\ WR VKRZ WKDW 9rwm < VBR-TLP
- ve
Figure 11. Typical TlpLP Behavior Of Bi-directional ESD Device that Does Not Exhibit Snapback
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ESD401
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8 Application and Implementation
NOTE
Information in the following applications sections is not part of the TI component
specification, and TI does not warrant its accuracy or completeness. TI’s customers are
responsible for determining suitability of components for their purposes. Customers should
validate and test their design implementation to confirm system functionality.
8.1 Application Information
The ESD401 is a diode type TVS which is used to provide a path to ground for dissipating ESD events on highspeed signal lines between a human interface connector and a system. As the current from ESD passes through
the TVS, only a small voltage drop is present across the diode. This is the voltage presented to the protected IC.
The low RDYN of the triggered TVS holds this voltage, VCLAMP, to a safe level for the protected IC.
8.2 Typical Application
5-V Source
VBUS
DD+
1
USB Transceiver
1
ESD401
ESD401
GND
2
2
Copyright © 2017, Texas Instruments Incorporated
Figure 12. USB 2.0 ESD Schematic
8.2.1 Design Requirements
For this design example, two ESD401 devices are being used in a USB 2.0 application. This provides a complete
ESD protection scheme.
Given the USB 2.0 application, the parameters listed in Table 1 are known.
Table 1. Design Parameters
DESIGN PARAMETER
VALUE
Signal range on DP-DM lines
0 V to 3.6 V
Operating frequency on DP-DM lines
up to 240 MHz or 480 Mbps
8.2.2 Detailed Design Procedure
8.2.2.1 Signal Range
The ESD401 supports signal ranges between –5.5 V and 5.5 V, which supports the USB 2.0 signal range of 0 to
3.6 V on the DM/DP lines..
8.2.2.2 Operating Frequency
The ESD401 has a 0.85 pF (typical) capacitance, which supports the USB 2.0 data rates of 480 Mbps.
10
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8.2.3 Application Curves
1
0
Insertion Loss (dB)
-1
-2
-3
-4
-5
-6
-7
-8
-9
0.001
0.01
0.1
Frequency (GHz)
1
10
D009
Figure 13. Insertion Loss
Figure 14. Eye Diagram - 3-Gbps Signal No Device
Figure 15. Eye Diagram - 3-Gbps Signal With ESD401
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9 Power Supply Recommendations
The ESD401 is a passive ESD device so there is no need to power it. Take care not to violate the recommended
I/O specification (–5.5 V to 5.5 V) to ensure the device functions properly.
10 Layout
10.1 Layout Guidelines
•
•
•
The optimum placement is as close to the connector as possible.
– EMI during an ESD event can couple from the trace being struck to other nearby unprotected traces,
resulting in early system failures.
– The PCB designer must minimize the possibility of EMI coupling by keeping any unprotected traces away
from the protected traces which are between the TVS and the connector.
Route the protected traces as straight as possible.
Eliminate any sharp corners on the protected traces between the TVS and the connector by using rounded
corners with the largest radii possible.
– Electric fields tend to build up on corners, increasing EMI coupling.
10.2 Layout Example
VBUS
To Power Supply
ESD401
D-
To USB Transceiver
D+
ESD401
Legend
Pin to GND
GND
USB2.0 Connector
Figure 16. USB 2.0 ESD Layout
12
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11 Device and Documentation Support
11.1 Documentation Support
For related documentation see the following:
ESD401DPY Evaluation Module
11.2 Receiving Notification of Documentation Updates
To receive notification of documentation updates, navigate to the device product folder on ti.com. In the upper
right corner, click on Alert me to register and receive a weekly digest of any product information that has
changed. For change details, review the revision history included in any revised document.
11.3 Community Resources
The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective
contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of
Use.
TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration
among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help
solve problems with fellow engineers.
Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and
contact information for technical support.
11.4 Trademarks
E2E is a trademark of Texas Instruments.
11.5 Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
11.6 Glossary
SLYZ022 — TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.
12 Mechanical, Packaging, and Orderable Information
The following pages include mechanical, packaging, and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and revision of
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.
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PACKAGE OPTION ADDENDUM
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3-Aug-2017
PACKAGING INFORMATION
Orderable Device
Status
(1)
ESD401DPYR
ACTIVE
Package Type Package Pins Package
Drawing
Qty
X1SON
DPY
2
10000
Eco Plan
Lead/Ball Finish
MSL Peak Temp
(2)
(6)
(3)
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-1-260C-UNLIM
Op Temp (°C)
Device Marking
(4/5)
-40 to 125
8I
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based
flame retardants must also meet the <=1000ppm threshold requirement.
(3)
MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4)
There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5)
Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6)
Lead/Ball Finish - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead/Ball Finish values may wrap to two lines if the finish
value exceeds the maximum column width.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
Addendum-Page 1
Samples
PACKAGE MATERIALS INFORMATION
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3-Aug-2017
TAPE AND REEL INFORMATION
*All dimensions are nominal
Device
ESD401DPYR
Package Package Pins
Type Drawing
X1SON
DPY
2
SPQ
Reel
Reel
A0
Diameter Width (mm)
(mm) W1 (mm)
10000
180.0
9.5
Pack Materials-Page 1
0.72
B0
(mm)
K0
(mm)
P1
(mm)
1.12
0.43
2.0
W
Pin1
(mm) Quadrant
8.0
Q1
PACKAGE MATERIALS INFORMATION
www.ti.com
3-Aug-2017
*All dimensions are nominal
Device
Package Type
Package Drawing
Pins
SPQ
Length (mm)
Width (mm)
Height (mm)
ESD401DPYR
X1SON
DPY
2
10000
189.0
185.0
36.0
Pack Materials-Page 2
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