STMicroelectronics M39832-B12WNE1T Single chip 8 mbit 1mb x8 or 512kb x16 flash and 256 kbit parallel eeprom memory Datasheet

M39832
Single Chip 8 Mbit (1Mb x8 or 512Kb x16) Flash and
256 Kbit Parallel EEPROM Memory
PRELIMINARY DATA
2.7V to 3.6V SUPPLY VOLTAGE for
PROGRAM, ERASE and READ OPARATIONS
FLASH ARRAY
– Boot block (Top or Bottom location)
– Parameter and Main blocks
– Selectable x8/x16 Data Bus (BYTE pin).
EEPROM ARRAY
– x8 Data Bus only.
120ns ACCESS TIME
(Flash and EEPROM array)
WRITE, PROGRAM and ERASE STATUS BITS
CONCURRENT MODE (Read Flash while
writing to EEPROM)
100,000 ERASE/WRITE CYCLES
10 YEARS DATA RETENTION
LOW POWER CONSUMPTION
– Stand-by mode: 100µA
– Automatic Stand-by mode
64 bytes ONE TIME PROGRAMMABLE
MEMORY (x8 Data Bus only)
STANDARD EPROM/OTP MEMORY
PACKAGE
EXTENDED TEMPERATURE RANGES
TSOP48 (NE)
12 x 20 mm
Figure 1. Logic Diagram
VCC
19
15
A0-A18
DQ0-DQ14
W
DESCRIPTION
The M39832 is a memory device combining Flash
and EEPROM into a single chip and using single
supply voltage. The memory is mapped in two
arrays: 8 Mbit of Flash memory and 256 Kbit of
EEPROM memory. Each space is independant for
writing, in concurrent mode the Flash Memory can
be read while the EEPROM is being written.
An additional 64 bytes of EPROM are One Time
Programmable.
The M39832 EEPROM memory array is organized
in byte only (regardless on the BYTE pin). It may
be written by byte or by page of 64 bytes and the
integrity of the data can be secured with the help
of the Software Data Protection (SDP).
EE
DQ15A–1
M39832
BYTE
EF
ERB
G
FRB
RP
VSS
February 1999
This is preliminary information on a new product now in development or undergoing evaluation. Details are subject to change without notice.
AI00844
1/36
M39832
Figure 2. TSOP Pin Connections
A15
A14
A13
A12
A11
A10
A9
A8
ERB
EE
W
RP
NC
NC
FRB
A18
A17
A7
A6
A5
A4
A3
A2
A1
1
12
13
48
M39832
24
37
36
25
Table 1. Signal Names
A16
BYTE
VSS
DQ15A–1
DQ7
DQ14
DQ6
DQ13
DQ5
DQ12
DQ4
VCC
DQ11
DQ3
DQ10
DQ2
DQ9
DQ1
DQ8
DQ0
G
VSS
EF
A0
AI00845
Warning: NC = Not Connected.
DESCRIPTION (cont’d)
The M39832 Flash Memory array can be configured as 1Mb x8 or 512Kb x16 with the BYTE input
pin. The M39832-T and M39832-B feature asymetrically blocked architecture providing system memory integration. Both M39832-B and M39832-T
devices have a Flash array of 19 blocks, one Boot
Block of 16 KBytes or 8 KWords, two Parameter
Blocks of 8 KBytes or 4 KWords, one Main Block
of 32 KBytes or 16 KWords and fifteen Main Blocks
of 64 KBytes or 32 KWords. The M39832-T has the
Boot Block at the top of the memory address space
and the M39832-B locates the Boot Block starting
at the bottom. The memory maps are showed in
Figures 3A and 3B. Each block can be erased
separately,any combination of blocks can be specified for multi-block erase or the entire chip may be
erased. The Erase operations are managed automatically. The block erase operation can be sus-
2/36
A0-A18
Address Inputs
DQ0-DQ7
Data Input/Outputs, Commands Input
DQ8-DQ14
Data Input/Outputs
DQ15A–1
Data Input/Outputs or Address Input
EE
EEPROM Array Enable
EF
Flash Array Enable
G
Output Enable
W
Write Enable
RP
Reset/Block Temporary Unprotect
ERB
EEPROM Ready/Busy Output
FRB
Flash Ready/Busy Output
BYTE
Flash Array Byte/Word Organization
VCC
Supply Voltage
VSS
Ground
pended in order to read from or program to any
block not being ersased, and then resumed. Block
protection provides additional data security. Each
block can be separately protected or unprotected
against Program or Erase on programming equipment. All previously protected blocks can be temporarily unprotected in the application. The Flash
memory array is functionally compatible with the
M29W800 Single Voltage Flash Memory device.
During a Program or Erase cycle in the Flash array
or during a Write in the EEPROM array, status bits
available on certain DQn pins provide information
on the M39832 internal logic.
PIN DESCRIPTION
Byte/Word Organization Select (BYTE). The
BYTE input selects the output configuration for the
Flash array: Byte-wide (x8) mode or Word-wide
(x16) mode. The EEPROM array and the 64 Bytes
OTP Row are always accessed Byte-wide (x8).
When BYTE is High, the Word-wide mode is selected for the Flash array (x16) and the data are
read and programmed on DQ0-DQ15. The Flash
array is accessed with A0-A18 Adrress lines. In this
mode, data in the EEPROM array (x8) are read and
programmed on DQ0-DQ7 and the array is accessed with A0-A14. The 64 bytes OTP are read
and programmed on DQ0-DQ7 and are accessed
with A0-A5 and A6 = 0.
When BYTE is Low, the Byte-wide mode is selected
for the Flash array (x8) and the data are read and
M39832
Table 2. Absolute Maximum Ratings (1)
Symbol
Parameter
Value
Unit
Ambient Operating Temperature
–40 to 85
°C
TBIAS
Temperature Under Bias
–50 to 125
°C
TSTG
Storage Temperature
–65 to 150
°C
VIO (2)
Input or Output Voltages
–0.6 to 5
V
Supply Voltage
–0.6 to 5
V
A9, G, EF Voltage
–0.6 to 13.5
V
TA
VCC
VA9, VG, VEF
(2)
Notes: 1. Except for the rating "Operating Temperature Range", stresses above those listed in the Table "Absolute Maximum Ratings"
may cause permanent damage to the device. These are stress ratings only and operation of the device at these or any other
conditions above those indicated in the Operating sections of this specification is not implied. Exposure to Absolute Maximum
Rating conditions for extended periods may affect device reliability. Refer also to the STMicroelectronics SURE Program and other
relevant quality documents.
2. Minimum Voltage may undershoot to –2V during transition and for less than 20ns.
programmed on DQ0-DQ7. In this mode, DQ8DQ14 are at high impedance and DQ15A–1 is the
LSB address bit, making the Flash array to be
accessed with A–1-A18 Adress lines. In this mode,
data in the EEPROM array (x8) are read and
programmed on DQ0-DQ7 and the array is accessed with A–1-A13. The 64 bytes OTP are read
and programmed on DQ0-DQ7 and are accessed
with A-1 - A4 and A6 = 0.
Address Inputs (A0-A18). The address inputs for
the memory array are latched during a write operation on the falling edge at Chip Enable (EE or EF)
or Write Enable W. In Word-wide organisation the
address lines are A0-A18, in Byte-wide organisation DQ15A–1 acts as an additional LSB address
line. When A9 is raised to VID, either a Read
Electronic Signature Manufacturer or Device Code,
Block Protection Status or a Write Block Protection
or Block Unprotection is enabled depending on the
combination of levels on A0, A1, A6, A12 and A15.
Data Input/Output (DQ0-DQ7). T he se I nputs/Outputs are used in the Byte-wide and Wordwide organisations. The input is data to be
programmed in the memory array or a command
to be written. Both are latched on the rising edge
of Chip Enable (EE or EF) or Write Enable W. The
output is data from the Memory Array, the Electronic Signature Manufacturer or Device codes, the
Block Protection Status or the Status register Data
Polling bit DQ7, the Toggle Bits DQ6 and DQ2, the
Error bit DQ5 or the Erase Timer bit DQ3. Outputs
are valid when Chip Enable (EE or EF) and Output
Enable G are active. The output is high impedance
when the chip is deselected or the outputs are
disabled and when RP is at a Low level.
Data Input/Outputs (DQ8-DQ14 and DQ15A–1).
These Inputs/Outputs are additionally used in the
Word-wide organisation. When BYTE is High DQ8-
DQ14 and DQ15A–1 act as the MSB of the Data
Input or Output, functioning as described for DQ0DQ7 above, and DQ8 - DQ15 are ’don’t care’ for
command inputs or status outputs. When BYTE is
Low, DQ8-DQ14 are high impedance, DQ15A–1 is
the Address A–1 input.
Memory Array Enable (EE and EF). The Memory
Array Enable (EE or EF) activates the memory
control logic, input buffers, decoders and sense
amplifiers. When the EE input is driven high, the
EEPROM memory array is not selected; when the
EF input is driven high, the Flash memory array is
not selected. Attempts to access both EEPROM
and Flash arrays (EE low and EF low) are forbidden. Switching between the two memory array
enables (EE and EF) must not be made on the
same clock cycle, a delay of greater than tEHFL must
be inserted.
The M39832 is in standby when both EF and EE
are High (when no internal Erase or programming
is running). The power consumption is reduced to
the standby level and the outputs are in the high
impedance state, independent of the Output Enable G or Write Enable W inputs.
After 150ns of inactivity and when the addresses
are driven at CMOS levels, the chip automatically
enters a pseudo standby mode where consumption
is reduced to the CMOS standby value, while the
outputs continue to drive the bus.
Output Enable (G). The Output Enable gates the
outputs through the data buffers during a read
operation. The data outputs are in the high impedance state when the Output Enable G is High.
During Block Protect and Block Unprotect operations, the G input must be forced to VID level (12V
+ 0.5V) (for Flash memory array only).
3/36
M39832
Figure 3A. Top Boot Block Memory Map and Block Address Table
TOP BOOT BLOCK
Word-Wide
Byte-Wide
7FFFFh
FFFFFh
Byte-Wide
Word-Wide
FFFFFh
7FFFFh
FC000h
FBFFFh
7E000h
7DFFFh
FA000h
F9FFFh
7D000h
7CFFFh
F8000h
F7FFFh
7C000h
7BFFFh
F0000h
78000h
16K BOOT BLOCK
78000h
77FFFh
F0000h
EFFFFh
70000h
6FFFFh
E0000h
DFFFFh
68000h
67FFFh
D0000h
CFFFFh
60000h
5FFFFh
C0000h
BFFFFh
58000h
57FFFh
B0000h
AFFFFh
50000h
4FFFFh
A0000h
9FFFFh
48000h
47FFFh
90000h
8FFFFh
40000h
3FFFFh
80000h
7FFFFh
38000h
37FFFh
70000h
6FFFFh
30000h
2FFFFh
60000h
5FFFFh
28000h
27FFFh
50000h
4FFFFh
20000h
1FFFFh
40000h
3FFFFh
18000h
17FFFh
30000h
2FFFFh
10000h
0FFFFh
20000h
1FFFFh
08000h
07FFFh
10000h
0FFFFh
00000h
00000h
64K MAIN BLOCK
64K MAIN BLOCK
64K MAIN BLOCK
8K PARAMETER BLOCK
8K PARAMETER BLOCK
32K MAIN BLOCK
64K MAIN BLOCK
64K MAIN BLOCK
64K MAIN BLOCK
64K MAIN BLOCK
64K MAIN BLOCK
64K MAIN BLOCK
64K MAIN BLOCK
64K MAIN BLOCK
64K MAIN BLOCK
64K MAIN BLOCK
64K MAIN BLOCK
64K MAIN BLOCK
AI01725B
4/36
M39832
Figure 3B. Bottom Boot Block Memory Map and Block Address Table
BOTTOM BOOT BLOCK
Word-Wide
Byte-Wide
7FFFFh
FFFFFh
78000h
77FFFh
F0000h
EFFFFh
70000h
6FFFFh
E0000h
DFFFFh
68000h
67FFFh
D0000h
CFFFFh
60000h
5FFFFh
C0000h
BFFFFh
58000h
57FFFh
B0000h
AFFFFh
50000h
4FFFFh
A0000h
9FFFFh
48000h
47FFFh
90000h
8FFFFh
40000h
3FFFFh
80000h
7FFFFh
38000h
37FFFh
70000h
6FFFFh
30000h
2FFFFh
60000h
5FFFFh
28000h
27FFFh
50000h
4FFFFh
20000h
1FFFFh
40000h
3FFFFh
64K MAIN BLOCK
64K MAIN BLOCK
64K MAIN BLOCK
64K MAIN BLOCK
64K MAIN BLOCK
64K MAIN BLOCK
64K MAIN BLOCK
64K MAIN BLOCK
64K MAIN BLOCK
64K MAIN BLOCK
64K MAIN BLOCK
64K MAIN BLOCK
64K MAIN BLOCK
18000h
17FFFh
30000h
2FFFFh
10000h
0FFFFh
20000h
1FFFFh
08000h
07FFFh
10000h
0FFFFh
00000h
00000h
64K MAIN BLOCK
64K MAIN BLOCK
Byte-Wide
Word-Wide
0FFFFh
07FFFh
08000h
07FFFh
04000h
03FFFh
06000h
05FFFh
03000h
02FFFh
04000h
03FFFh
02000h
01FFFh
00000h
00000h
32K MAIN BLOCK
8K PARAMETER BLOCK
8K PARAMETER BLOCK
16K BOOT BLOCK
AI01731B
5/36
M39832
Table 3A. M39832-T Block Address Table
Address Range (x8)
Address Range (x16)
A18
A17
A16
A15
A14
A13
A12
00000h-0FFFFh
00000h-07FFFh
0
0
0
0
X
X
X
10000h-1FFFFh
08000h-0FFFFh
0
0
0
1
X
X
X
20000h-2FFFFh
10000h-17FFFh
0
0
1
0
X
X
X
30000h-3FFFFh
18000h-1FFFFh
0
0
1
1
X
X
X
40000h-4FFFFh
20000h-27FFFh
0
1
0
0
X
X
X
50000h-5FFFFh
28000h-2FFFFh
0
1
0
1
X
X
X
60000h-6FFFFh
30000h-37FFFh
0
1
1
0
X
X
X
70000h-7FFFFh
38000h-3FFFFh
0
1
1
1
X
X
X
80000h-8FFFFh
40000h-47FFFh
1
0
0
0
X
X
X
90000h-9FFFFh
48000h-4FFFFh
1
0
0
1
X
X
X
A0000h-AFFFFh
50000h-57FFFh
1
0
1
0
X
X
X
B0000h-BFFFFh
58000h-5FFFFh
1
1
1
1
X
X
X
C0000h-CFFFFh
60000h-67FFFh
1
1
0
0
X
X
X
D0000h-DFFFFh
68000h-6FFFFh
1
1
0
1
X
X
X
E0000h-EFFFFh
70000h-77FFFh
1
1
1
0
X
X
X
F0000h-F7FFFh
78000h-7BFFFh
1
1
1
1
0
X
X
F8000h-F9FFFh
7C000h-7CFFFh
1
1
1
1
1
0
0
FA000h-FBFFFh
7D000h-7DFFFh
1
1
1
1
1
0
1
FC000h-FFFFFh
7E000h-7FFFFh
1
1
1
1
1
1
X
6/36
M39832
Table 3B. M39832-B Block Address Table
Address Range (x8)
Address Range (x16)
A18
A17
A16
A15
A14
A13
A12
00000h-03FFFh
00000h-01FFFh
0
0
0
0
0
0
X
04000h-05FFFh
02000h-02FFFh
0
0
0
0
0
1
0
06000h-07FFFh
03000h-03FFFh
0
0
0
0
0
1
1
08000h-0FFFFh
04000h-07FFFh
0
0
0
0
1
X
X
10000h-1FFFFh
08000h-0FFFFh
0
0
0
1
X
X
X
20000h-2FFFFh
10000h-17FFFh
0
0
1
0
X
X
X
30000h-3FFFFh
18000h-1FFFFh
0
0
1
1
X
X
X
40000h-4FFFFh
20000h-27FFFh
0
1
0
0
X
X
X
50000h-5FFFFh
28000h-2FFFFh
0
1
0
1
X
X
X
60000h-6FFFFh
30000h-37FFFh
0
1
1
0
X
X
X
70000h-7FFFFh
38000h-3FFFFh
0
1
1
1
X
X
X
80000h-8FFFFh
40000h-47FFFh
1
0
0
0
X
X
X
90000h-9FFFFh
48000h-4FFFFh
1
0
0
1
X
X
X
A0000h-AFFFFh
50000h-57FFFh
1
0
1
0
X
X
X
B0000h-BFFFFh
58000h-5FFFFh
1
0
1
1
X
X
X
C0000h-CFFFFh
60000h-67FFFh
1
1
0
0
X
X
X
D0000h-DFFFFh
68000h-6FFFFh
1
1
0
1
X
X
X
E0000h-EFFFFh
70000h-77FFFh
1
1
1
0
X
X
X
F0000h-FfFFFh
78000h-7FFFFh
1
1
1
1
X
X
X
7/36
M39832
Table 4. Basic Operations
EF
EE
G
W
Operation
VIL
VIH
VIL
VIH
Read in Flash Array
VIH
VIL
VIL
VIH
Read in EEPROM Array
VIL
VIH
VIH
VIL
Write in Flash Array
VIH
VIL
VIH
VIL
Write in EEPROM Array
VIL
VIH
VIH
VIH
Output Disable, DQn = Hi-Z
VIH
VIL
VIH
VIH
Output Disable, DQn = Hi-Z
VIH
VIH
X
X
Standby, DQn = Hi-Z
Note: X = VIL or VIH.
Write Enable (W). Addresses are latched on the
falling edge of W, and Data Inputs are latched on
the rising edge of W.
EEPROM Ready/Busy (ERB). The EEPROM
Ready/Busy pin outputs the status of the device
when the EEPROM memory array is under the
write condition
– ERB = ’0’: internal writing is in process,
– ERB = ’1’: no internal writing in in process.
This status pin can be used when reading (or
fetching opcodes) in the Flash memory array.
The EEPROM Ready/Busy output uses an open
drain transistor, allowing therefore the use of the
M39832 in multi-memory applications with all
Ready/Busy outputs connected to a single
Ready/Busy line (OR-wired with an external pull-up
resistor).
Flash Ready/Busy (FRB). Flash Ready/Busy is an
open-drain output and gives the internal state of
Flash array. When FRB is Low, the Flash array is
Busy with a Program or Erase operation and it will
not accept any additional program or erase instructions except the Erase Suspend instruction. When
FRB is High, the Flash array is ready for any Read,
Program or Erase operation. The FRB will also be
High when the Flash array is put in Erase Suspend
or Standby modes.
Reset/Block Temporary Unprotect Input (RP).
The RP Input provides hardware reset of the Flash
array and temporary unprotection of the protected
Flash block(s). Reset of the Flash array is
acheived by pulling RP to VIL for at least tPLPX.
When the reset pulse is given while the Flash array
is in Read or Standby modes, it will be available for
new operations in tPHEL after the rising edge of RP.
If the Flash array is in Erase, Erase Suspend or
Program modes the reset will take tPLYH during
8/36
which the FRB signal will be held at VIL. The end
of the Flash array reset will be indicated by the
rising edge of FRB. A hardware reset during an
Erase or Program operation will corrupt the data
being programmed or the block(s) being erased.
See Table 14 and Figure 9. Temporary block unprotection is made by holding RP at VID. In this conditio n, previously protected blocks can be
programmed or erased. The transition of RP from
VIH to VID must be slower than tPHPHH. See Table
15 and Figure 9. When RP is returned from VID to
VIH all blocks temporarily unprotected will be again
protected.
OPERATIONS
An operation is defined as the basic decoding of
the logic level applied to the control input pins (EF,
EE, G, W) and the specified voltages applied on
the relevant address pins. These operations are
detailed in Table 3.
Read. Both Chip Enable and Output Enable (that
is EF and G or EE and G) must be low in order to
read the output of the memory.
Read operations are used to output the contents
from the Flash or EEPROM array, the Manufacturer
identifier, the Flash Block protection Status, the
Flash Identifier, the EEPROM identifier or the OTP
row content.
Notes:
– The Chip Enable input mainly provides power
control and should be used for device selection.
The Output Enable input should be used to gate
data onto the output in combination with active
EF or EE input signals.
– The data read depends on the previous instruction entered into the memory.
M39832
Table 5A. Flash Instructions (EF=0, EE=1)
Mne.
Instr.
1st
Cyc.
Cyc.
1+
Addr. (3,7)
X
Data
Read/Reset
RD (2,4) Memory
Array
Addr.
3+
Auto Select
3+
5555h
AAAAh
Word
5555h
2AAAh
5555h
AAh
55h
F0h
Byte
AAAAh
5555h
AAAAh
Word
5555h
2AAAh
5555h
AAh
55h
90h
Byte
AAAAh
5555h
AAAAh Program
Word
5555h
2AAAh
5555h
AAh
55h
A0h
Byte
AAAAh
5555h
AAAAh
AAAAh
5555h
Word
5555h
2AAAh
5555h
5555h
2AAAh
AAh
55h
80h
AAh
55h
30h
Byte
AAAAh
5555h
AAAAh
AAAAh
5555h
AAAAh
Word
5555h
2AAAh
5555h
5555h
2AAAh
5555h
AAh
55h
80h
AAh
55h
10h
(3,7)
Program
4
Data
Addr.
BE
Block Erase
6
Flash Array
Erase
Addr.
6
ES (10)
ER
Erase
Suspend
1
Erase
Resume
1
Read Electronic Signature or Block
Protection Status until a new write
cycle is initiated. See Note 5 and 6.
Read Data Polling or
Address Toggle Bit until Program
completes.
Program
Data
Block
Address
(3,7)
Data
Addr. (3,7)
Data
Addr. (3,7)
Data
7th
Cyc.
Read Memory Array until a new write
cycle is initiated.
(3,7)
Data
FAE
6th
Cyc.
AAAAh
Data
PG
5th
Cyc.
Byte
(3,7)
Addr.
4th
Cyc.
Read Memory Array until a new write cycle is initiated.
(3,7)
Addr.
AS
3rd
Cyc.
F0h
Data
(4)
2nd
Cyc.
X
B0h
X
30h
Additiona
l Block
(8)
30h
Note 9
Read until Toggle stops, then read all the data needed
from any Block(s) not being erased then Resume Erase.
Read Data Polling or Toggle Bits until Erase completes
or Erase is suspended another time
Notes: 1. Commands not interpreted in this table will default to read array mode.
2. A wait of tPLYH is necessary after a Read/Reset command if the memory was in an Erase or Program mode
before starting any new operation (see Table 14 and Figure 9).
3. X = Don’t Care.
4. The first cycles of the RD or AS instructions are followed by read operations. Any number of read cycles can occur after
the command cycles.
5. Signature Address bits A0, A1, at VIL will output Manufacturer code (20h). Address bits A0 at VIH and A1, at VIL will output
Flash code.
6. Block Protection Address: A0, at VIL, A1 at VIH and A15-A18 within the Block will output the Block Protection status.
7. For Coded cycles address inputs A11-A18 are don’t care.
8. Optional, additional Blocks addresses must be entered within the erase timeout delay after last write entry, timeout status
can be verified through DQ3 value (see Erase Timer Bit DQ3 description). When full command is entered, read Data Polling
or Toggle bit until Erase is completed or suspended.
9. Read Data Polling, Toggle bits or FRB until Erase completes.
10.During Erase Suspend, Read and Data Program functions are allowed in blocks not being erased.
9/36
M39832
Table 5B. EEPROM Instructions (EE=0, EF=1)
Mne.
WOTP
Instr.
(2)
Write OTP
Row
1st
Cyc.
Cyc.
>3
Addr.
Byte
Word
Data
ROTP
(2)
Read OTP
Row
Return
from OTP
Read
RT
SSDP (4)
SDP Enable
>3
SSDP
SDP
Disable
2AAAh
3rd
Cyc.
5555h
5555h
2AAAh
5555h
AAh
55h
B0h
2AAAh
5555h
Byte
5555h
Word
5555h
2AAAh
5555h
Data
AAh
55h
90h
Addr.
X (1)
Data
F0h
Addr.
4th
Cyc.
5th
Cyc.
6th
Cyc.
7th
Cyc.
Addr 1
Addr 2
Addr 3
Addr 4
Byte 2
Byte 3
Byte 4
Addr 2
Addr 3
Addr 4
Byte 2
Byte 3
Byte 4
Byte 1
Addr 1
Byte 1
1
≥3
Addr.
Byte
5555h
2AAAh
5555h
Word
5555h
2AAAh
5555h
AAh
55h
A0h
Byte
5555h
2AAAh
5555h
5555h
2AAAh
5555h
Word
5555h
2AAAh
5555h
5555h
2AAAh
5555h
AAh
55h
80h
AAh
55h
20h
Data
(5)
5555h
2nd
Cyc.
6
Addr.
Data
Notes: 1. X = Don’t Care.
2. Once the WOTP has been initiated (first 3 Cycles), from 1 up to 64 bytes can be written in one single write cycle
(See Write OTP chapter in following pages).
3. Once the ROTP has been initiated (first 3 Cycles), from 1 up to 64 bytes of the OTP can be read (See Read OTP chapter
in following pages). The RT (Return) instruction MUST be sent to the device to exit ROTP mode.
4. Once SDP is set (SSDP instruction sent once), it is necessary to send SSDP prior to any byte or page to be written
in the EEPROM array (See Figure 4 and EEPROM array Software Data Protection chapter in following pages).
5. See Figure 5 and EEPROM array Software Data Protection chapter in following pages.
10/36
M39832
Table 6. User Bus Operations (1)
Operation
Block
Protection(2,4)
EE EF
G
W
RP BYTE A0 A1 A6 A9 A12
A15
DQ15
A–1
DQ8DQ14
DQ0-DQ7
VIH VIL VID
VIL
Pulse
VIH
X
X
X
X
VID
X
X
X
X
X
Blocks
VIH VID VID
Unprotection(4)
VIL
Pulse
VIH
X
X
X
X
VID
VIH
VIH
X
X
X
Block
Protection
Verify(2,4)
VIH VIL VIL
VIH
VIH
X
VIL VIH VIL VID A12
A15
X
X
Block Protect
Status (3)
Block
Unprotection
Verify(2,4)
VIH VIL VIL
VIH
VIH
X
VIL VIH VIH VID A12
A15
X
X
Block Protect
Status (3)
Block
Temporary
Unprotection
VIH
X
X
VID
X
X
X
X
X
X
VIH
VIL
VIH
VIL
A0 A1 VIL VID
X
X
A–1
X
64 Bytes User
Defined
VIH
VIL
VIH
VIH
A0 A1 VIL VID
X
X
X
X
64 Bytes User
Defined
VIL
VIH
VIH
VIL
A0 A1 VIL VID
X
X
A–1
X
64 Bytes User
Defined
VIL
VIH
VIH
VIH
A0 A1 VIL VID
X
X
X
X
64 Bytes User
Defined
Write the
EEPROM
Identifier (5)
Read the
EEPROM
Identifier (5)
Notes: 1.
2.
3.
4.
5.
X
X
X
X
X
VIL VIH
VIL VIH
X = VIL or VIH
Block Address must be given on A12-A18 bits.
See Table 8.
Operation performed on programming equipment.
The 65 Bytes User defined EEPROM Identifier are accessed on DQ0-DQ7 with A0 to A5 when BYTE = 1 (x16) or with A–1 to A4
when BYTE = 0 (x8)
Table 7. Read Electronic Signature (following AS instruction or with A9 = VID)
Org.
Wordwide
Code
A1
Other
Addresses
DQ15
A–1
DQ8DQ14
DQ0DQ7
VIH
VIL VIL
Don’t Care
0
00h
20h
VIL VIH
VIH
VIH VIL
Don’t Care
0
00h
D7h
VIH VIL
VIL VIH
VIH
VIH VIL
Don’t Care
0
00h
5Bh
VIH VIL
VIL VIH
VIL
VIL
VIL
Don’t Care
Don’t
Care
Hi-Z
20h
M39832-T
VIH VIL
VIL VIH
VIL
VIH VIL
Don’t Care
Don’t
Care
Hi-Z
D7h
M39832-B
VIH VIL
VIL VIH
VIL
VIH VIL
Don’t Care
Don’t
Care
Hi-Z
5Bh
Device
EE EF
G
VIH VIL
VIL VIH
M39832-T
VIH VIL
M39832-B
Manufacturer
Flash
Manufacturer
Bytewide
W
BYTE
A0
Flash
11/36
M39832
Table 8. Read Block Protection with AS Instruction (EF = 0, EE = 1)
E
G
W
A0
A1
A12-A18
Other
Addresses
DQ0-DQ7
Protected Block
VIL
VIL
VIH
VIL
VIH
Block Address
Don’t Care
01h
Unprotected Block
VIL
VIL
VIH
VIL
VIH
Block Address
Don’t Care
00h
Code
Table 9. Status Bit
DQ
7
Name
Data
Polling
Logic Level
’1’
Erase Complete or erase
block in Erase Suspend
’0’
Erase On-going
DQ
Program Complete or data
of non erase block during
Erase Suspend
DQ
Program On-going
’-1-0-1-0-1-0-1-’
6
Toggle Bit
DQ
’-1-1-1-1-1-1-1-’
5
4
3
Error Bit
Erase or Program On-going
Program Complete
Erase Complete or Erase
Suspend on currently
addressed block
Note
Indicates the P/E.C. status, check during
Program or Erase, and on completion
before checking bits DQ5 for Program or
Erase Success.
Successive reads output complementary
data on DQ6 while Programming or Erase
operations are on-going. DQ6 remains at
constant level when P/E.C. operations are
completed or Erase Suspend is
acknowledged.
’1’
Program or Erase Error
’0’
Program or Erase On-going
’1’
Erase Timeout Period Expired
P/E.C. Erase operation has started. Only
possible command entry is Erase Suspend
(ES).
’0’
Erase Timeout Period
On-going
An additional block to be erased in parallel
can be entered to the P/E.C.
This bit is set to ’1’ in the case of
Programming or Erase failure.
Reserved
Erase
Time Bit
’-1-0-1-0-1-0-1-’
2
Definition
Toggle Bit
1
DQ
1
Reserved
0
Reserved
Chip Erase, Erase or Erase
Suspend on the currently
addressed block.
Erase Error due to the
currently addressed block
(when DQ5 = ’1’).
Indicates the erase status and allows to
identify the erased block
Program on-going, Erase
on-going on another block or
Erase Complete
Erase Suspend read on
non Erase Suspend block
Notes: Logic level ’1’ is High, ’0’ is Low. -0-1-0-0-0-1-1-1-0- represent bit value in successive Read operations.
12/36
M39832
Figure 4. EEPROM SDP Enable Flowcharts
SDP
Set
Page
Write
Instruction
SDP
not Set
WRITE AAh in
Address 5555h
WRITE AAh in
Address 5555h
WRITE 55h in
Address 2AAAh
WRITE 55h in
Address 2AAAh
WRITE A0h in
Address 5555h
Page
Write
Instruction
WRITE A0h in
Address 5555h
WRITE
is enabled
SDP is set
SDP ENABLE ALGORITHM
WRITE Data to
be Written in
any Address
Write
in Memory
Write Data
+
SDP Set
after tWC
AI01698B
Write. A Write operation can be used for two goals:
– either write data in the EEPROM memory array
– or enter a sequence of bytes or word composing
an instruction.
The reader should note that Programming a Flash
byte or word is an instruction (see Instructions
paragraph).
Writing data requires:
– the Chip Enable (either EE or EF) to be Low
– the Write Enable (W) to be Low with Output
Enable (G) High.
Addresses in Flash array (or EEPROM array) are
latched on the falling edge of W or EF (EE) whichever occurs last; the data to be written in Flash
array (EEPROM array) is latched on the rising edge
of W or EF (EE) whichever occurs first.
Specific Read and Write Operations. Device
specific data is accessed through operations decoding the VID level applied on A9 and the logic
levels applied on address inputs (A0, A1, A6).
These specific operations are:
– Read the Manufacturer identifier
– Read the Flash identifier
– Define and Read the Flash Block protection
status
– Read the EEPROM identifier
– Write the EEPROM identifier
Note: The OTP row (64 bytes) is accessed with a
specific software sequence detailed in the paragraph "Write in OTP row".
Instructions
An instruction is defined as a sequence of specific
Write operations. Each received byte or word is
sequentially decoded (and not executed as standard Write operations) and the instruction is executed when the correct number of bytes or word
are properly received and the time between two
consecutive bytes or words is shorter than the
time-out value.
The sequencing of any instruction must be followed
exactly, any invalid combination of instruction bytes
or word or time-out between two consecutive bytes
or word will reset the device logic into a Read
memory state (when addressing the Flash array)
or directly decoded as a single operation when
addressing the EEPROM array.
For efficient decoding of the instruction, the two first
bytes or words of an instruction are the coded
cycles and are followed by a command confirmation byte or word.
13/36
M39832
Figure 5. EEPROM SDP disable Flowchart
Figure 6. EEPROM and Flash Data Polling
Flowchart
START
WRITE AAh in
Address 5555h
READ DQ5 & DQ7
at VALID ADDRESS
WRITE 55h in
Address 2AAAh
Page
Write
Instruction
DQ7
=
DATA
WRITE 80h in
Address 5555h
YES
NO
WRITE AAh in
Address 5555h
NO
WRITE 55h in
Address 2AAAh
DQ5
=1
YES
READ DQ7
WRITE 20h in
Address 5555h
DQ7
=
DATA
Unprotected State
after
tWC (Write Cycle time)
YES
NO
FAIL
PASS
AI01699B
AI01369
READ
Read operations and instructions can be used to:
– read the contents of the Memory Array (Flash
and EEPROM)
– read the status bits and identifiers.
Read data (Flash and EEPROM)
Both Chip Enable EF (or EE) and Output Enable
(G) must be low in order to read the data from the
memory.
Read the Manufacturer Identifier
The manufacturer’s identifier can be read with two
methods: a Read operation or a Read instruction.
Read Operation. The manufacturer’s identifier can
be read with a Read operation with specific logic
14/36
levels applied on A0, A1, A6 and the VID level on
A9 (See Table 7).
Read Instruction. The manufacturer’s identifier
can also be read with a single read operation
immediatly following the AS instruction (See Table
5A and Table 7).
Read the Flash Identifier
The Flash identifier can be read with two methods:
a Read operation or a Read instruction.
Read Operation. The Flash identifier can be read
with a single Read operation with specific logic
levels applied on A0, A1, A6 and the VID level on
A9 (See Table 7).
Read Instruction. The Flash identifier can also be
read with a single read operation immediatly following the AS instruction (See Table 5A and Table 7).
M39832
Read the EEPROM Identifier
The EEPROM identifier (64 bytes, user defined)
can be read with a single Read operation with A6
= ’0’ and A9 = VID (See Table 6).
When accessing the 64 Bytes of EEPROM Identifier, the only LSB addresses are decoded. The LSB
addresses are A0 to A5 when BYTE = ’1’ (x16) and
A–1 to A4 when BYTE = ’0’ (x8). Each Byte of the
EEPROM identifier can be individually accessed in
read or write mode.
Read the OTP Row
The OTP row is mapped in the EEPROM array
(EE = ’0’, EF = ’1’). Read of the OTP row (64 bytes)
is by an instruction (ROTP) composed of three
specific Write operations of data bytes at three
specific memory locations (each location in a different page) before reading the OTP row content
(See Table 5B).
When accessing the OTP row, only the LSB addresses are decoded and A6 must be ’0’. The LSB
addresses are A0 to A5 when BYTE = ’1’ (x16) and
A–1 to A4 when BYTE = ’0’ (x8).
Each Read of the OTP row has to be followed by
the (RT) Return instruction (See Table 5B).
Read the Flash Block Protection Status
Reading the Flash block protection status is by a
read operation immediatly following the AS instruction (See Table 5A and Table 8). A12-A18 define
the Flash block whose protection has to be verified. This Read operation will output a 01h if the
Flash block is protected and a 00h if the Flash block
is not protected.
The Flash block protection status can also be
verified with a single Read operation (see chapter:
Flash array specific features), with VID on A9 (See
Table 6 and Table 8).
Read the Status Bits
The M39832 provides several Write operation
status flags which may be used to minimize the
application write (or erase or program) time. These
signals are available on the I/O port bits when
programming (or erasing) are in progress. It should
be noted that the Ready/Busy pins also reflects the
status of the EEPROM Write and the Flash Programming/Erasing.
Data Polling flag, DQ7. When Erasing or Programming into the Flash block (or when Writing into
the EEPROM block), bit DQ7 outputs the comple-
ment of the bit being entered for Programming/Writing on DQ7. Once the Program instruction or the Write operation is performed, the true
logic value is read on DQ7 (in a Read operation).
Flash memory block specific features:
– Data Polling is effective after the fourth W pulse
(for programming) or after the sixth W pulse (for
Erase). It must be performed at the address
being programmed or at an address within the
Flash sector being erased.
– During an Erase instruction, DQ7 outputs a ’0’.
After completion of the instruction, DQ7 will output the last bit programmed (that is a ’1’ after
erasing).
– if the byte to be programmed is in a protected
Flash sector, the instruction is ignored.
– If all the Flash sectors to be erased are protected, DQ7 will be set to ’0’ for about 100µs, and
then return to the previous addressed byte. No
erasure will be performed.
– if all sectors are protected, a Bulk Erase instruction is ignored.
Toggle flag, DQ6. The M39832 also offers another
way for determining when the EEPROM write or
the Flash memory Program instruction is completed. During the internal Write operation, the DQ6
will toggle from ’0’ to ’1’ and ’1’ to ’0’ on subsequent
attempts to read any byte of the memory, when
either G , EE or EF is low.
When the internal cycle is completed the toggling
will stop and the data read on DQ0-DQ7 is the
addressed memory byte. The device is now accessible for a new Read or Write operation. The operation is completed when two successive reads yield
the same output data.
Flash memory block specific features:
a. The Toggle bit is effective after the fourth W pulse
(for programming) or after the sixth W pulse (for
Erase).
b. If the byte to be programmed belongs to a protected Flash sector, the instruction is ignored and:
– if all the Flash sectors selected for erasure
are protected, DQ6 will toggle to ’0’ for about
100µs, and then return to the previous addressed byte.
– if all sectors are protected, the Bulk Erase instruction is ignored.
15/36
M39832
Figure 7A. Data Toggle Flowchart
Figure 7B. Flash ata Toggle Flowchart
START
START
READ
DQ2, DQ5 & DQ6
READ
DQ5 & DQ6
DQ6
=
TOGGLE
YES
NO
YES
NO
DQ5
=1
YES
READ DQ2, DQ6
NO
DQ2, DQ6
=
TOGGLE
YES
FAIL
DQ5
=1
YES
READ DQ6
DQ6
=
TOGGLE
NO
DQ2, DQ6
=
TOGGLE
NO
NO
YES
PASS
FAIL
PASS
AI01370
AI01873
Toggle Bit, DQ2 (Flash array only). This toggle
bit, together with DQ6, can be used to determine
the device status during the Erase operations. It
can also be used to identify the block being erased.
During Erase or Erase Suspend a read from a block
being erased will cause DQ2 to toggle. A read from
a block not being erased will set DQ2 to ’1’ during
erase and to DQ2 during Erase Suspend. During
Flash Array Erase, a read operation will cause
DQ2 to toggle as all blocks are being erased. DQ2
will be set to ’1’ during program operation and when
erase is complete. After erase completion and if the
error bit DQ5 is set to ’1’, DQ2 will toggle if the faulty
block is addressed.
Error flag, DQ5 (Flash block only). This bit is set
to ’1’ by the internal logic when there is a failure of
programming, block erase, or chip erase that results in invalid data in the memory block. In case of
an error in block erase or program, the block in
which the error occured or to which the programmed data belongs, must be discarded. The
16/36
DQ5 failure condition will also appear if a user tries
to program a ’1’ to a location that is previously
programmed to ’0’. Other Blocks may still be used.
The error bit resets after a Read/Reset (RD) instruction. In case of success of Program or Erase,
the error bit will be set to ’0’ . when A0 is High with
A1 Low.
Erase Timer Bit, DQ3 (Flash array only). This bit
is set to ’0’ by internal logic when the last block
Erase command has been entered to the Command Interface and it is awaiting the Erase start.
When the erase timeout period is finished, after
50ms to 90ms, DQ3 returns to ’1’.
WRITE a BYTE (or a PAGE) in EEPROM
It should be noticed that writing in the EEPROM
array is an operation, it is not an instruction (as for
Programming a byte in the Flash array).
Write a Byte in EEPROM Array
A write operation is initiated when Chip Enable EE
is Low and Write Enable W is Low with Output
M39832
Enable G High. Addresses are latched on the falling
edge of W, EE whichever occurs last.
Once initiated, the write operation is internally
timed until completion, that is during a time tW.
The status of the write operation can be found by
reading the Data Polling and Toggle bits (as detailed in the READ chapter) or the ERB output. This
Ready/Busy output is driven low from the write of
the byte being written until the completion of the
internal Write sequence.
Write a Page in EEPROM Array
The Page write allows up to 64 bytes within the
same EEPROM page to be consecutively latched
into the memory prior to initiating a programming
cycle. All bytes must be located in a single page
address, that is A6-A14 when BYTE is high (x16)
or A5-A13 when BYTE is low (x8) must be the same
for all bytes. Once initiated, the Page write operation is internally timed until completion, that is during a time tWC.
The status of the write operation can be seen by
reading the Data Polling and Toggle bits (as detailed in the READ chapter) or the ERB output. This
Ready/Busy output is driven low from the write of
the first byte to be written until the completion of the
internal Write sequence.
A Page write is composed of successive Write
operations which must be sequenced within a time
period (between two consecutive Write operations)
that is smaller than the tWLWL value. If this period of
time exceeds the tWLWL value, the internal programming cycle will start.
EEPROM Array Software Data Protection
A protection instruction allows the user to inhibit all
write modes to the EEPROM array: the Software
Data Protection (referenced as SDP in the following). The SDP feature is useful for protecting the
EEPROM memory from inadvertent write cycles
that may occur during uncontrolled bus conditions.
The M39832 is shipped as standard in the unprotected state meaning that the EEPROM memory
contents can be changed by the user. After the SDP
enable instruction, the device enters the Protect
Mode where no further write operations have any
effect on the EEPROM memory contents.
The device remains in this mode until a valid SDP
disable instruction is received whereby the device
reverts to the unprotected state.
To enable the Software Data Protection, the device
has to be written (with a Page Write) with three
specific data bytes at three specific memory locations (each location in a different page) as shown
in Figure 4 and Table 5B. This sequence provides
an unlock key to enable the write action, and, at the
same time, SDP continues to be set. Any further
Write in EEPROM when the SDP is set will use this
same sequence of three specific data bytes at three
specific memory locations followed by the bytes to
write. The first SDP enable sequence can be directly followed by the bytes to written.
Similarly, to disable the Software Data Protection
the user has to write specific data bytes into six
different locations with a Page Write addressing
different bytes in different pages, as shown in Figure 5 and Table 5B.
The Software Data Protection state is non-volatile
and is not changed by power on/off sequences. The
SDP enable/disable instructions set/reset an internal non-volatile bit and therefore will require a write
time tWC, This Write operation can be monitored
only on the Toggle bit (status bit DQ6) and the ERB
pin. The Ready/Busy output is driven low from the
first byte to be written (that is the first Write AAh,
@5555h of the SDP set/reset sequence) until the
completion of the internal Write sequence.
Write OTP Row
Writing (only one time) in the OTP row (64 bytes)
is enabled by an instruction (WOTP). This instruction is composed of three specific Write operations
of data bytes at three specific memory locations
(each location in a different page) followed by the
the data to store in the OTP row (refer to Table 5B).
When accessing the OTP row, the only LSB addresses are decoded and A6 must be ’0’. The LSB
addresses are A0 to A5 when BYTE = ’1’ (x16) and
A–1 to A4 when BYTE = ’0’ (x8). Once at least one
Byte of the OTP row has been written (even with
FFh), the whole row becomes Read only.
Write the EEPROM Block Identifier
The EEPROM block identifier (64 Bytes) can be
written with a single Write operation with A6 = ’0’
and the VID level on A9 (see Table 6). When accessing the 64 Bytes of EEPROM Identifier, the
only LSB addresses are decoded. The LSB addresses are A0 to A5 when BYTE = ’1’ (x16) and
A-1 to A4 when BYTE = ’0’ (x8). Each Byte of the
EEPROM identifier can be individually accessed in
read or write mode.
PROGRAM in the Flash ARRAY
It should be noted that writing data into the
EEPROM array and the Flash array is not performed in a similar way: the Flash memory requires
an instruction (see Instruction chapter) for Erasing
and another instruction for Programming one (or
more) byte(s) or word(s), the EEPROM memory is
directly written with a simple operation (see Operation chapter).
17/36
M39832
Program (PG) Instruction. This instruction uses
four write cycles. Both for Byte-wide configuration
and for Word-wide configuration. The Program
command A0h is written to address AAAAh in the
Byte-wide configuration or to address 5555h in the
Word-wide configuration on the third cycle after two
Coded cycles. A fourth write operation latches the
Address on the falling edge of W or EF and the Data
to be written on the rising edge and starts the
internal operation. Read operations output the
Status Register bits after the programming has
started. Memory programming is made only by
writing ’0’ in place of ’1’. Status bits DQ6 and DQ7
determine if programming is on-going and DQ5
allows verification of any possible error. Programming at an address not in blocks being erased is
also possible during erase suspend. In this case,
DQ2 will toggle at the address being programmed.
Auto Select (AS) Instruction. This instruction
uses the two Coded cycles followed by one write
cycle giving the command 90h to address AAAAh
in the Byte-wide configuration or address 5555h in
the Word-wide configuration for command set-up.
A subsequent read will output the manufacturer
code and the device code or the block protection
status depending on the levels of A0 and A1. The
manufacturer code is output when the addresses
lines A0 and A1 are Low, the Flash code for Top
Boot or Bottom Boot is output when A0 is High with
A1 Low.
The AS instruction allows access to the block protection status. After giving the AS instruction, A0 is
set to VIL with A1 at VIH, while A12-A18 define the
address of the block to be verified. A read in these
conditions will output a 01h if the block is protected
and a 00h if the block is not protected.
The ERASE in the Flash ARRAY
Flash Array Erase (FAE) Instruction. This instruction uses six write cycles. The Erase Set-up
command 80h is written to address AAAAh in the
Byte-wide configuration or the address 5555h in
the Word-wide configuration on the third cycle after
the two Coded cycles. The Flash Array Erase Confirm command 10h is similarly written on the sixth
cycle after another two Coded cycles. If the second
command given is not an erase confirm or if the
Coded cycles are wrong, the instruction aborts and
the device is reset to Read Array. It is not necessary
to program the array with 00h first as it will be done
18/36
automatically before erasing it to FFh. Read operations after the sixth rising edge of W or EF output
the Status Register bits. During the execution of the
erase, Data Polling bit DQ7 returns ’0’, then ’1’ on
completion. The Toggle bits DQ2 and DQ6 toggle
during erase operation and stop when erase is
completed. After completion, the Status Bit DQ5
returns ’1’ if there has been an Erase Failure.
Block Erase (BE) Instruction. This instruction
uses a minimum of six write cycles. The Erase
Set-up command 80h is written to address AAAh in
the Byte-wide configuration or address 5555h in
the Word-wide configuration on third cycle after the
two Coded cycles. The Block Erase Confirm command 30h is similarly written on the sixth cycle after
another two Coded cycles. During the input of the
second command an address within the block to be
erased is given and latched into the memory. Additional block Erase Confirm commands and block
addresses can be written subsequently to erase
other blocks in parallel, without further Coded cycles. The erase will start after the erase timeout
period (see Erase Timer Bit DQ3 description).
Thus, additional Erase Confirm commands for
other blocks must be given within this delay. The
input of a new Erase Confirm command will restart
the timeout period. The status of the internal timer
can be monitored through the level of DQ3, if DQ3
is ’0’ the Block Erase Command has been given
and the timeout is running, if DQ3 is ’1’, the timeout
has expired and the Block(s) are being erased. If
the second command given is not an erase confirm
or if the Coded cycles are wrong, the instruction
aborts, and the device is reset to Read Array. It is
not necessary to program the block with 00h as it
will be done automatically before erasing it to FFh.
Read operations after the sixth rising edge of W or
EF output the Status Register bits.
During the execution of the erase , the memory
accepts only the Erase Suspend ES and Read/Reset RD instructions. Data Polling bit DQ7 returns ’0’
while the erasure is in progress and ’1’ when it has
completed. The Toggle bit DQ2 and DQ6 toggle
during the erase operation. They stop when erase
is completed. After completion the Status bit DQ5
returns ’1’ if there has been an erase failure. In such
a situation, the Toggle bit DQ2 can be used to
determine which block is not correctly erased. In
the case of erase failure, a Read/Reset RD instruction is necessary in order to reset the memory.
M39832
Figure 8. Block Protection Flowchart
START
BLOCK ADDRESS
on A12 to A18
EE = VIH
n=0
G, A9 = VID,
EF = VIL
Wait 4µs
W = VIL
Wait 100µs
W = VIH
G = VIH
Wait 4µs
READ DQ0 at PROTECTION
ADDRESS: A0, A6 = VIL, A1 = VIH and
A12 to A18 DEFINING BLOCK
DQ0
=1
NO
YES
A9 = VIH
++n
= 25
NO
PASS
YES
A9 = VIH
FAIL
AI00853
19/36
M39832
Figure 9. Block Unprotecting Flowchart
START
EE = EF = VIH
n=0
A6, A12, A15 = VIH
G, A9 = VIH
Wait 4µs
EF, G, A9 = VID
Wait 4µs
W = VIL
Wait 10ms
W = VIH
EF, G = VIH
Wait 4µs
READ at UNPROTECTION
ADDRESS: A1, A6 = VIH, A0 = VIL and
A12 to A18 DEFINING BLOCK
(see Note 1)
NO
NO
++n
= 1000
YES
FAIL
DATA
=
00h
INCREMENT
BLOCK
YES
LAST
BLOCK
NO
YES
PASS
AI00850
Note: 1. A6 is kept at VIH during unprotection algorithm in order to secure best unprotection verification. During all other protection status
reads, A6 must be kept at VIL.
20/36
M39832
Table 10. AC Measurement Conditions
Input Rise and Fall Times
Input Pulse Voltages
Figure 11. Output AC Testing Load Circuit
≤ 10ns
VCC
0.V to VCC
Input and Output Timing Ref.
Voltages
IOH
VCC / 2
1N914
DEVICE
UNDER
TEST
Figure 10. AC Testing Input Output Waveform
1N914
CL = 30pF
IOL
VCC
VCC / 2
0V
CL includes JIG capacitance
VOUT = 1.5V when the DEVICE
UNDER TEST is in the
Hi-Z output state.
AI00939
AI00854
Table 11. Capacitance (1) (TA = 25 °C, f = 1 MHz )
Symbol
CIN
COUT
Parameter
Test Condition
Max
Unit
VIN = 0V
6
pF
VOUT = 0V
12
pF
Input Capacitance
Output Capacitance
Min
Note: 1. Sampled only, not 100% tested.
Erase Suspend (ES) Instruction. The Block
Erase operation may be suspended by this instruction which consists of writing the command B0h
without any specific address. No Coded cycles are
required. It permits reading of data from another
block and programming in another block while an
erase operation is in progress. Erase suspend is
accepted only during the Block Erase instruction
execution. Writing this command during Erase
timeout will, in addition to suspending the erase,
terminate the timeout. The Toggle bit DQ6 stops
toggling when erase is suspended. The Toggle bits
will stop toggling between 0.1ms and 15ms after
the Erase Suspend (ES) command has been written. The device will then automatically be set to
Read Memory Array mode. When erase is suspended, a Read from blocks being erased will
output DQ2 toggling and DQ6 at ’1’. A Read from
a block not being erased returns valid data. During
suspension the memory will respond only to the
Erase Resume ER and the Program PG instructions.
A Program operation can be initiated during erase
suspend in one of the blocks not being erased. It
will result in both DQ2 and DQ6 toggling when the
data is being programmed. A Read/Reset command will definitively abort erasure and result in
invalid data in the blocks being erased.
Erase Resume (ER) Instruction. If an Erase Suspend instruction was previously executed, the
erase operation may be resumed by giving the
command 30h, at any address, and without any
Coded cycles.
FLASH ARRAY SPECIFIC FEATURES
Block Protection (See Figure 8). Each block can
be separately protected against Program or Erase
on programming equipment. Block protection provides additional data security, as it disables all
program or erase operations. This mode is activated when both A9 and G are raised to VID and an
address in the block is applied on A12-A18. Block
protection is initiated on the edge of W falling to VIL.
Then after a delay of 100ms, the edge of W rising
to VIH ends the protection operations. Block protection verify is achieved by bringing G, EF, A0 and A6
to VIL and A1 to VIH, while W is at VIH and A9 at VID.
21/36
M39832
Under these conditions, reading the data output will
yield 01h if the block defined by the inputs on
A12-A18 is protected. Any attempt to program or
erase a protected block will be ignored by the
device.
Remarks:
– The Verify operation is a read with a simulated
worst case conditions. This allows a guarantee
of the retention of the Protection status
– During the application life, the block protection
status can be accessed with a regular Read
instruction without applying a "high voltage" VID
on A9. This instruction is detailed in Table 5 and
Table 8.
Blocks Unprotection (See Figure 9). All protected
blocks can be unprotected simultaneously on programming equipment to allow updating of bit contents. All blocks must first be protected before the
unprotection operation. Block unprotection is activated when A9, G and E are at VID and A12, A15
at VIH. Unprotection is initiated by the edge of W
falling to VIL. After a delay of 10ms, the unprotection
operation will end. Unprotection verify is achieved
by bringing G and E to VIL while A0 is at VIL, A6 and
A1 are at VIH and A9 remains at VID. In these
conditions, reading the output data will yield 00h if
the block defined by the inputs A12-A18 has been
succesfully unprotected. Each block must be separately verified by giving its address in order to
ensure that it has been unprotected.
Remarks:
– The Verify operation is a read with a simulated
worst case conditions. This allows a guarantee
of the retention of the Protection status
– During the application life, the Block protection
status can be accessed with a regular Read
instruction without "high voltage" VID on A9. This
instruction is detailed in Table 5 and Table 8.
Block Temporary Unprotection. Any previously
protected block can be temporarily unprotected in
order to change stored data. The temporary unprotection mode is activated by bringing RP to VID.
During the temporary unprotection mode the previously protected blocks are unprotected. A block
can be selected and data can be modified by
executing the Erase or Program instruction with the
RP signal held at VID. When RP is returned to VIH,
all the previously protected blocks are again protected.
22/36
Read/Reset (RD) Instruction. The Read/Reset
instruction consists of one write cycle giving the
command F0h. It can be optionally preceded by the
two Coded cycles. Subsequent read operations will
read the memory array addressed and output the
data read. A wait state of 10ms is necessary after
Read/Reset prior to any valid read if the memory
was in an Erase mode when the RD instruction is
given.
GLOSSARY
Array: EEPROM array (256 Kbit) or Flash array (8
Mbit)
Block: part of the Flash array (See Figure 3A and
3B).
Page: 64 bytes of EEPROM
Write and Program: Writing (into the EEPROM
array) and programming (the Flash array is not
performed in a similar way:
– the Flash memory requires an instruction (see
Instruction chapter) for Erasing and another instruction for Programming one (or more) byte(s)
or word(s)
– the EEPROM memory is directly written with a
simple operation (see Operation chapter).
SDP: Software Data Protection. Used for protecting the EEPROM array against false Write operations (as in noisy environments).
POWER SUPPLY and CURRENT CONSUMPTION
Power Up. The M39832 internal logic is reset upon
a power-up condition to Read memory status. Any
Write operation in EEPROM is inhibited during the
first 5 ms following the power-up.
Either EF, EE or W must be tied to VIH during
Power-up for the maximum security of the data
contents and to remove the possibility of a byte
being written on the first rising edge of EF, EE or
W. Any write cycle initiation is locked when Vcc is
below VLKO.
Supply Rails. Normal precautions must be taken
for supply voltage decoupling, each device in a
system should have the VCC rail decoupled with a
0.1µF capacitor close to the VCC and VSS pins. The
printed circuit board trace width should be sufficient
to carry the VCC program and erase currents required.
M39832
Table 12. DC Characteristics
(TA = 0 to 70°C or –40 to 85°C; VCC = 2.7 to 3.6V)
Symbol
Parameter
Max
Unit
0V ≤ VIN ≤ VCC
±1
µA
0V ≤ VOUT ≤ VCC
±1
µA
Supply Current (Read Flash)
EE = VIH, EF = VIL, G =
VIH, f = 6MHz
10
mA
ICC2
Supply Current (Read EEPROM)
EE = VIL, EF = VIH, G =
VIH, f = 6MHz
10
mA
ICC3
Supply Current (Standby)
EF = EE = VCC ± 0.2V
100
µA
ICC4
Supply Current (Flash Block
Program or Erase)
Byte program, Sector or
Chip Erase in progress
20
mA
ICC5
Supply Current (EEPROM Write)
During tWC
20
mA
VIL
Input Low Voltage
–0.5
0.8
V
VIH
Input High Voltage
0.7 VCC
VCC + 0.3
V
VOL
Output Low Voltage
IOL = 1.8mA
0.45
V
VOH
Output High Voltage
IOH = –100µA
VID
A9 High Voltage
IID
VID Current
ILI
Input Leakage Current
ILO
Output Leakage Current
ICC1 (1)
VLKO
VCC Minimum for Write, Erase and
Program
Test Condition
Min
VCC –0.4
11.5
A9 = VID
1.9
V
12.5
V
100
µA
2.3
V
Note: 1. When reading the Flash block when an EEPROM byte(s) is under a write cycle, the supply current is ICC1 + ICC5.
23/36
24/36
Note: Write Enable (W) = High
DQ0-DQ7
G
EF (EE)
EE (EF)
A0-A18
tEHFL
ADDRESS VALID
AND CHIP ENABLE
tAVQV
tGLQV
OUTPUT ENABLE
tGLQX
tELQX
tELQV
VALID
tAVAV
DATA VALID
tEHFL
VALID
tGHQX
tGHQZ
tEHQZ
tEHQX
tAXQX
AI01952
M39832
Figure 12. Read Mode AC Waveforms
M39832
Table 13. Read AC Characteristics
(TA = 0 to 70°C or –20 to 85°C; VCC = 3.3V ± 0.3V)
M39832
Symbol
Alt
Parameter
Test Condition
-120
Min
tAVAV
tRC
Address Valid to Next
Address Valid
(EE, EF) = (VIL, VIH) or
(EE, EF) = (VIH, VIL),
G = VIL
tAVQV
tACC
Address Valid to Output
Valid
(EE, EF) = (VIL, VIH) or
(EE, EF) = (VIH, VIL),
G = VIL
tELQX (1)
tLZ
Chip Enable Low to Output
Transition
G = VIL
tELQV (2)
tCE
Chip Enable Low to Output
Valid
G = VIL
tGLQX (1)
tOLZ
Output Enable Low to
Output Transition
(EE, EF) = (VIL, VIH) or
(EE, EF) = (VIH, VIL)
tGLQV (2)
tOE
Output Enable Low to
Output Valid
(EE, EF) = (VIL, VIH) or
(EE, EF) = (VIH, VIL)
tEHQX
tOH
Chip Enable High to
Output Transition
G = VIL
tEHQZ (1)
tHZ
Chip Enable High to
Output Hi-Z
G = VIL
tGHQX
tOH
Output Enable High to
Output Transition
(EE, EF) = (VIL, VIH) or
(EE, EF) = (VIH, VIL)
tGHQZ (1)
tDF
Output Enable High to
Output Hi-Z
(EE, EF) = (VIL, VIH) or
(EE, EF) = (VIH, VIL)
tAXQX
tOH
Address Transition to
Output Transition
(EE, EF) = (VIL, VIH) or
(EE, EF) = (VIH, VIL),
G = VIL
tEHFL
tCED
EE (EF) Active to EF (EE)
Unit
-150
Max
120
Min
Max
150
120
0
ns
150
0
120
0
ns
150
0
55
0
0
0
ns
ns
40
0
40
ns
ns
55
40
ns
ns
ns
40
ns
0
0
ns
100
100
ns
Notes: 1. Sampled only, not 100% tested.
2. G may be delayed by up to tELQV - tGLQV after the falling edge of EE (or EF) without increasing tELQV.
25/36
M39832
Figure 13. Write AC Waveforms, W Controlled
WRITE CYCLE
A0-A18
VALID
tWLAX
tAVWL
tWHEH
E (1)
tELWL
tWHGL
G
tGHWL
tWLWH
W
tWHWL
tDVWH
tWHDX
VALID
DQ0-DQ7
tWHRH
RB
tWHRL
VCC
tVCHEL
AI01953
Notes: Address are latched on the falling edge of W, Data is latched on the rising edge of W.
E is either EF when EE = VIH or EE when EF = VIH.
26/36
M39832
Figure 14. Write AC Waveforms, E Controlled
WRITE CYCLE
A0-A18
VALID
tELAX
tAVEL
tEHWH
W
tWLEL
tEHGL
G
tGHEL
E
tELEH
(1)
tEHEL
tDVEH
DQ0-DQ7
tEHDX
VALID
tWHRL
RB
VCC
tVCHWL
Notes:
AI01954
Address are latched on the falling edge of E, Data is latched on the rising edge of E.
E is either EF when EE = VIH or EE when EF = VIH.
27/36
M39832
Table 14. Write AC Characteristics, Write Enable Controlled
(TA = 0 to 70°C or –40 to 85°C; VCC = 2.7V to 3.6V)
M39832
Symbol
Alt
Parameter
-120
Min
tAVAV
tWC
Address Valid to Next Address Valid
tCS
tWLWH
Unit
-150
Max
Min
Max
120
150
ns
Chip Enable Low to Write Enable Low
0
0
ns
tWP
Write Enable Low to Write Enable High
50
65
ns
tDVWH
tDS
Input Valid to Write Enable High
50
65
ns
tWHDX
tDH
Write Enable High to Input Transition
0
0
ns
tCH
Write Enable High to Chip Enable High
0
0
ns
tWHWL
tWPH
Write Enable High to Write Enable Low
30
35
ns
tAVWL
tAS
Address Valid to Write Enable Low
0
0
ns
tWLAX
tAH
Write Enable Low to Address Transition
50
65
ns
Output Enable High to Write Enable Low
0
0
ns
VCC High to Chip Enable Low
50
50
µs
Write Enable High to Output Valid (Program)
15
15
µs
Write Enable High to Output Valid
(Sector Erase)
2.0
tELWL
tWHEH
(2)
(2)
tGHWL
tVCHEL
tWHQV1
tVCS
(1)
tWHQV2 (1)
Time Out between 2 consecutive Section Erase
tWHWL0
tWHGL
tWHRL
(3)
tOEH
Write Enable High to Output Enable Low
tDB
Write Enable High to Ready/Busy Output Low
Notes: 1. Time is measured to Data Polling or Toggle Bit, tWHQV = tWHQ7V + tQ7VQV
2. Chip Enable means (EE, EF) = (VIL, VIH) or (EE, EF) = (VIH, VIL).
3. With a 3.3KΩ pull-up resistor.
28/36
30
2.0
80
0
30
sec
80
µs
0
150
ns
150
ns
M39832
Table 15. Write AC Characteristics, EE or EF Controlled
(TA = 0 to 70°C or –40 to 85°C; VCC = 2.7V to 3.6V)
M39832
Symbol
Alt
Parameter
tWLWL
tBLC
Byte Load Cycle (EEPROM)
tWHRH
tWC
Write Cycle Time (EEPROM)
tAVAV
Address Valid to Next Address Valid
-120
Unit
-150
Min
Max
Min
Max
0.2
150
0.2
150
µs
10
ms
10
120
150
ns
tWLEL
tWS
Write Enable Low to Memory Block Enable Low
0
0
ns
tELEH
tCP
Memory Block Enable Low to Memory Block
Enable High
50
65
ns
tDVEH
tDS
Input Valid to Memory Block Enable High
50
65
ns
tEHDX
tDH
Memory Block Enable High to Input Transition
0
0
ns
tEHWH
tWH
Memory Block Enable High to Write Enable High
0
0
ns
tEHEL
tCPH
Memory Block Enable High to Memory Block
Enable Low
30
35
ns
tAVEL
tAS
Address Valid to Memory Block Enable Low
0
0
ns
tELAX
tAH
Memory Block Enable Low to Address Transition
50
65
ns
Output Enable High to Memory Block Enable Low
0
0
ns
VCC High to Write Enable Low
50
50
µs
tEHQV1 (1)
Memory Block Enable High to Output Valid
(Program)
15
15
µs
tEHQV2 (1)
Memory Block Enable High to Output Valid
(Sector Erase)
2.0
tGHEL
tVCHWL
tVCS
tEHGL
tOEH
Memory Block Enable High to Output Enable Low
tEHRL (2)
tDB
EEPROM Block Enable High to Ready/Busy Output
Low
30
0
2.0
30
0
150
sec
ns
150
ns
Notes: 1. Time is measured to Data Polling or Toggle Bit, tWHQV = tWHQ7V + tQ7VQV.
2. With a 3.3KΩ pull-up resistor.
29/36
30/36
Notes: 1.
2.
3.
4.
5.
LAST CYCLE
OF PROGRAM
OR ERASE
DATA POLLING
READ CYCLES
tWHQ7V
tEHQ7V
tELQV
tAVQV
tQ7VQV
IGNORE
DQ7
DATA POLLING (LAST) CYCLE
tGLQV
BYTE ADDRESS (WITHIN SECTORS)
All other timings are as a normal Read cycle.
DQ7 and DQ0-DQ6 can transmit to valid at any point during the data output valid period.
tWHQ7V is the Program or Erase time.
During erasing operation Byte address must be within Sector being erased.
E is either EF when EE = VIH or EE when EF = VIH.
DQ0-DQ6
DQ7
W
G
E
(5)
A0-A18
VALID
VALID
DATA OUTPUT VALID
AI01955
DATA VERIFY
READ CYCLE
M39832
Figure 15. Data Polling DQ7 AC Waveforms
M39832
Table 16. Data Polling and Toggle Bit AC Characteristics (1)
(TA = 0 to 70°C or –40 to 85°C; VCC = 2.7V to 3.6V)
M39832
Symbol
Parameter
-120
Min
tWHQ7V1 (2)
Write Enable High to DQ7 Valid
(Program, W Controlled)
10
tWHQ7V2 (2)
Write Enable High to DQ7 Valid
(Sector Erase, W Controlled)
1.5
tEHQ7V1 (2)
Flash Block Enable High to DQ7 Valid
(Program, EF Controlled)
10
tEHQ7V2 (2)
Flash Block Enable High to DQ7 Valid
(Sector Erase, EF Controlled)
1.5
tQ7VQV
Q7 Valid to Output Valid (Data Polling)
Unit
-150
Max
Min
Max
µs
10
30
1.5
30
µs
10
30
sec
1.5
50
30
sec
55
ns
Notes: 1. All other timings are defined in Read AC Characteristics table.
2. tWHQ7V is the Program or Erase time.
Table 17. Program, Erase Times and Program, Erase Endurance Cycles (Flash Block)
(TA = 0 to 70°C; VCC = 2.7V to 3.6V)
M39832
Parameter
Unit
Typ
Typical after
100k W/E Cycles
Flash array Erase (Preprogrammed)
5
5
sec
Flash array Erase
12
12
sec
Flash array Block Erase
2.4
sec
Parameter Block Erase
2.3
sec
Main Block (32Kb) Erase
2.7
sec
Main Block (64Kb) Erase
3.3
Min
Max
15
sec
Chip Program (Byte)
8
8
sec
Byte Program
10
10
µs
Word Program
20
20
µs
Program/Erase Cycles (per Block)
100,000
cycles
31/36
32/36
LAST CYCLE
OF PROGRAM
OF ERASE
DATA
TOGGLE
READ CYCLE
Notes: 1. All other timings are as a normal Read cycle.
2. E is either EF when EE = VIH or EE when EF = VIH.
DQ0-DQ5,
DQ7
DQ6
W
G
E (2)
A0-A18
DATA TOGGLE
READ CYCLE
IGNORE
STOP TOGGLE
tWHQV
tEHQV
tAVQV
READ CYCLE
VALID
VALID
tGLQV
tELQV
VALID
AI01956
M39832
Figure 16. Data Toggle DQ6 AC Waveforms
M39832
Figure 17. EEPROM Page Write Mode AC Waveforms, W Controlled
A0-A14
or A–1-A13
Addr 0
Addr 1
Addr 2
Addr n
EE
G
tWHWL
tWHRH
tWLWL
W
tWLWH
DQ0-DQ7
Byte 0
Byte 1
Byte 2
Byte n
tWHRL
ERB
AI00856
33/36
M39832
ORDERING INFORMATION SCHEME
Example:
M39832 -
B
15
W
NE
6
T
Array Matrix
T
Top Boot
B
Bottom Boot
Speed
12 120ns
15 150ns
Option
T
Operating Voltage
W
2.7V to 3.6V
Temp. Range
Package
NE TSOP48
12 x 20mm
Tape & Reel
Packing
1
0 to 70 °C
6
–40 to 85 °C
Devices are shipped from the factory with the memory content set at all "1’s" (FFh).
For a list of available options (Speed, Package, etc...) or for further information on any aspect of this device,
please contact the STMicroelectronics Sales Office nearest to you.
34/36
M39832
TSOP48 - 48 lead Plastic Thin Small Outline, 12 x 20mm
mm
Symb
Typ
inches
Min
Max
A
Typ
Min
1.20
Max
0.047
A1
0.05
0.15
0.002
0.006
A2
0.95
1.05
0.037
0.041
B
0.17
0.27
0.007
0.011
C
0.10
0.21
0.004
0.008
D
19.80
20.20
0.780
0.795
D1
18.30
18.50
0.720
0.728
E
11.90
12.10
0.469
0.476
-
-
-
-
L
0.50
0.70
0.020
0.028
α
0°
5°
0°
5°
N
48
e
0.50
0.020
48
CP
0.10
0.004
A2
1
N
e
E
B
N/2
D1
A
CP
D
DIE
C
TSOP-a
A1
α
L
Drawing is not to scale.
35/36
M39832
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences
of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted
by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications mentioned in this publication are subject to
change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not
authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.
The ST logo is a registered trademark of STMicroelectronics
© 1999 STMicroelectronics - All Rights Reserved
STMicroelectronics GROUP OF COMPANIES
Australia - Brazil - Canada - China - France - Germany - Italy - Japan - Korea - Malaysia - Malta - Mexico - Morocco - The Netherlands Singapore - Spain - Sweden - Switzerland - Taiwan - Thailand - United Kingdom - U.S.A.
http://www.st.com
36/36
Similar pages