Micron MT9HVF12872KY Ddr2 sdram vlp mini-rdimm Datasheet

512MB, 1GB: (x72, ECC, SR) 244-Pin DDR2 VLP Mini-RDIMM
Features
DDR2 SDRAM VLP Mini-RDIMM
MT9HVF6472(P)K – 512MB
MT9HVF12872(P)K – 1GB
For component data sheets, refer to Micron’s Web site: www.micron.com
Features
Figure 1:
• 244-pin, very low profile mini registered dual in-line
memory module (VLP Mini-RDIMM)
• Fast data transfer rates: PC2-3200, PC2-4200,
PC2-5300, or PC2-6400
• 512MB (64 Meg x 72) or 1GB (128 Meg x 72)
• Supports ECC error detection and correction
• VDD = VDDQ = +1.8V
• VDDSPD = +1.7V to +3.6V
• JEDEC-standard 1.8V I/O (SSTL_18-compatible)
• Differential data strobe (DQS, DQS#) option
• 4n-bit prefetch architecture
• Multiple internal device banks for concurrent
operation
• Supports duplicate output strobe (RDQS/RDQS#)
• Programmable CAS# latency (CL)
• Posted CAS# additive latency (AL)
• WRITE latency = READ latency - 1 tCK
• Programmable burst lengths: 4 or 8
• Adjustable data-output drive strength
• 64ms, 8,192-cycle refresh
• On-die termination (ODT)
• Serial presence-detect (SPD) with EEPROM
• Gold edge contacts
• Single rank
244-Pin VLP Mini-RDIMM
PCB height: 18.2mm (0.72in)
Options
Marking
• Parity
• Operating temperature1
– Commercial (0°C ≤ TA ≤ +70°C)
– Industrial (–40°C ≤ TA ≤ +85°C)
• Package
– 244-pin DIMM (Pb-free)
• Frequency/CAS latency2
– 2.5ns @ CL = 5 (DDR2-800)
– 2.5ns @ CL = 6 (DDR2-800)
– 3ns @ CL = 5 (DDR2-667)
– 3.75ns @ CL = 4 (DDR2-533)
– 5.0ns @ CL = 3 (DDR2-400)
• PCB height
– 18.2mm (0.72in)
P
None
I
Y
-80E
-800
-667
-53E
-40E
Notes: 1. Contact Micron for industrial temperature
module offerings.
2. CL = CAS (READ) latency; registered mode
will add one clock cycle to CL.
Table 1:
Key Timing Parameters
Data Rate (MT/s)
Speed
Grade
Industry
Nomenclature
CL = 6
CL = 5
CL = 4
CL = 3
(ns)
tRP
(ns)
tRC
(ns)
-80E
-800
-667
-53E
-40E
PC2-6400
PC2-6400
PC2-5300
PC2-4200
PC2-3200
–
800
–
–
–
800
667
667
–
–
533
53E
533
533
400
–
–
400
400
400
12.5
15
15
15
15
12.5
15
15
15
15
55
55
55
55
55
PDF: 09005aef81c9620b/Source: 09005aef81c961ec
HVF9C64_128x72K.fm - Rev. C 3/07 EN
1
tRCD
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2005 Micron Technology, Inc. All rights reserved.
Products and specifications discussed herein are subject to change by Micron without notice.
512MB, 1GB: (x72, ECC, SR) 244-Pin DDR2 VLP Mini-RDIMM
Features
Table 2:
Addressing
Refresh count
Row address
Device bank address
Device page size per bank
Device configuration
Column address
Module rank address
Table 3:
512MB
1GB
8K
16K (A0–A13)
4 (BA0, BA1)
1KB
512Mb (64 Meg x 8)
1K (A0–A9)
1 (S0#)
8K
16K (A0–A13)
8 (BA0–BA2)
1KB
1Gb (128 Meg x 8)
1K (A0–A9)
1 (S0#)
Part Numbers and Timing Parameters – 512MB Modules
Base device: MT47H64M8,1 512Mb DDR2 SDRAM
Part Number2
MT9HVF6472(P)KY-80E__
MT9HVF6472(P)KY-800__
MT9HVF6472(P)KY-667__
MT9HVF6472(P)KY-53E__
MT9HVF6472(P)KY-40E__
Table 4:
Module
Density
Configuration
Module
Bandwidth
Memory Clock/
Data Rate
Latency
(CL-tRCD-tRP)
512MB
512MB
512MB
512MB
512MB
64 Meg x 72
64 Meg x 72
64 Meg x 72
64 Meg x 72
64 Meg x 72
6.4 GB/s
6.4 GB/s
5.3 GB/s
4.3 GB/s
3.2 GB/s
2.5ns/800 MT/s
2.5ns/800 MT/s
3.0ns/667 MT/s
3.75ns/533 MT/s
5.0ns/400 MT/s
5-5-5
6-6-6
5-5-5
4-4-4
3-3-3
Part Numbers and Timing Parameters – 1GB Modules
Base device: MT47H128M8,1 1Gb DDR2 SDRAM
Part Number2
MT9HVF12872(P)KY-80E__
MT9HVF12872(P)KY-800__
MT9HVF12872(P)KY-667__
MT9HVF12872(P)KY-53E__
MT9HVF12872(P)KY-40E__
Notes:
PDF: 09005aef81c9620b/Source: 09005aef81c961ec
HVF9C64_128x72K.fm - Rev. C 3/07 EN
Module
Density
Configuration
Module
Bandwidth
Memory Clock/
Data Rate
Latency
(CL-tRCD-tRP)
1GB
1GB
1GB
1GB
1GB
128 Meg x 72
128 Meg x 72
128 Meg x 72
128 Meg x 72
128 Meg x 72
6.4 GB/s
6.4 GB/s
5.3 GB/s
4.3 GB/s
3.2 GB/s
2.5ns/800 MT/s
2.5ns/800 MT/s
3.0ns/667 MT/s
3.75ns/533 MT/s
5.0ns/400 MT/s
5-5-5
6-6-6
5-5-5
4-4-4
3-3-3
1. Data sheets for the base devices can be found on Micron’s Web site.
2. All part numbers end with a two-place code (not shown), designating component and PCB
revisions. Consult factory for current revision codes. Example: MT9HVF12872KY-40EE1.
2
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2005 Micron Technology, Inc. All rights reserved.
512MB, 1GB: (x72, ECC, SR) 244-Pin DDR2 VLP Mini-RDIMM
Pin Assignments and Descriptions
Pin Assignments and Descriptions
Table 5:
Pin Assignments
244-Pin VLP Mini-RDIMM Front
244-Pin VLP Mini-RDIMM Back
Pin Symbol Pin Symbol Pin Symbol Pin Symbol
Pin Symbol Pin Symbol Pin Symbol Pin Symbol
1
VREF
32
VSS
63
VDDQ
94
DQS5#
123
VSS
154
2
3
4
VSS
DQ0
DQ1
33
34
35
DQ24
DQ25
VSS
64
65
66
A2
VDD
VSS
95
96
97
DQS5
VSS
DQ42
124
125
126
DQ4
DQ5
VSS
155
156
157
5
VSS
36
DQS3#
67
VSS
98
DQ43
127
6
DQS0#
37
DQS3
683
99
VSS
128
7
8
9
10
11
12
DQS0
VSS
DQ2
DQ3
VSS
DQ8
38
39
40
41
42
43
VSS
DQ26
DQ27
VSS
CB0
CB1
69
70
71
72
73
74
NC/
PAR_IN
VDD
A10
BA0
VDD
WE#
VDDQ
100
101
102
103
104
105
DQ48
DQ49
VSS
SA2
NC
Vss
13
DQ9
44
VSS
75
CAS#
106
14
VSS
45
DQS8#
76
VDDQ
15
DQS1#
46
DQS8
77
16
17
18
19
20
21
DQS1
VSS
RESET#
NC
VSS
DQ10
47
48
49
50
51
52
VSS
CB2
CB3
VSS
NC
VDDQ
22
DQ11
53
23
VSS
54
24
25
DQ16
DQ17
26
VSS
27
28
29
30
31
185
A3
186
187
188
A1
VDD
CK0
189
CK0#
220
VSS
190
VDD
221
DQ52
129
130
131
132
133
134
DM0/
RDQS0
NC/
RDQS0#
VSS
DQ6
DQ7
VSS
DQ12
DQ13
DQ29
VSS
DM3/
RDQS3
158
NC/
RDQS3#
159
VSS
NC/
RDQS5#
217
VSS
218 DQ46
219 DQ47
160
161
162
163
164
165
191
192
193
194
195
196
A0
BA1
VDD
RAS#
VDDQ
S0#
222
223
224
225
226
227
DQS6#
135
VSS
166
VDDQ
107
DQS6
136
ODT0
NC
108
VSS
137
A13
230
78
79
80
81
82
83
NC
VDDQ
NC
VSS
DQ32
DQ33
109
110
111
112
113
114
DQ50
DQ51
VSS
DQ56
DQ57
VSS
138
139
140
141
142
143
DM1/
RDQS1
NC/
RDQS1#
VSS
RFU
RFU
VSS
DQ14
DQ15
DM8/ 197
RDQS8
167
NC/
198
RDQS8#
168
VSS
199
169
170
171
172
173
174
CB6
CB7
VSS
NC
VDDQ
NC
200
201
202
203
204
205
VDD
NC
VSS
DQ36
DQ37
VSS
231
232
233
234
235
236
CKE0
84
VSS
115
DQS7#
144
VSS
175
VDD
206
VDD
85
DQS4#
116
DQS7
145
DQ20
176
NC
551 NC/BA2
562
NC/
ERR_OUT
57
VDDQ
86
87
DQS4
VSS
117
118
VSS
DQ58
146
147
DQ21
VSS
177
178
NC
VDDQ
88
DQ34
119
DQ59
148
179
A12
210
DQ39
241
VSS
DQS2#
58
A11
89
DQ35
120
VSS
149
180
A9
211
VSS
242
SDA
DQS2
VSS
DQ18
DQ19
59
60
61
62
A7
VDD
A5
A4
90
91
92
93
VSS
DQ40
DQ41
VSS
121
122
SA0
SA1
150
151
152
153
DM2/
RDQS2
NC/
RDQS2#
VSS
DQ22
DQ23
VSS
181
182
183
184
VDD
A8
A6
VDDQ
212
213
214
215
DQ44
DQ45
VSS
DM5/
RDQS5
243
244
SCL
VDDSPD
Notes:
PDF: 09005aef81c9620b/Source: 09005aef81c961ec
HVF9C64_128x72K.fm - Rev. C 3/07 EN
DQ28
DQ30
DQ31
VSS
CB4
CB5
VSS
216
DQ53
VSS
RFU
RFU
VSS
DM6/
RDQS6
228
NC/
RDQS#6
229
VSS
DQ54
DQ55
VSS
DQ60
DQ61
VSS
DM7/
RDQS7
237
NC/
RDQS7#
238
VSS
DM4/
RDQS4
207
NC/
RDQS4#
208
VSS
239
209 DQ38 240
DQ62
DQ63
1. Pin 55 is NC for 512MB, BA2 for 1GB.
2. Pin 56 is NC for non-parity and ERR_OUT for parity.
3. Pin 68 is NC for non-parity and PAR_IN for parity.
3
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2005 Micron Technology, Inc. All rights reserved.
512MB, 1GB: (x72, ECC, SR) 244-Pin DDR2 VLP Mini-RDIMM
Pin Assignments and Descriptions
Table 6:
Pin Descriptions
Symbol
Type
Description
ODT0
Input
(SSTL_18)
CK0, CK0#
Input
(SSTL_18)
CKE0
Input
(SSTL_18)
Input
(SSTL_18)
On-die termination: ODT (registered HIGH) enables termination resistance internal to
the DDR2 SDRAM. When enabled, ODT is only applied to each of the following pins: DQ,
DQS, DQS#, RDQS, RDQS#, CB, and DM. The ODT input will be ignored if disabled via the
LOAD MODE (LM) command.
Clock: CK and CK# are differential clock inputs. All address and control input signals are
sampled on the crossing of the positive edge of CK and negative edge of CK#. Output data
(DQs and DQS/DQS#) is referenced to the crossings of CK and CK#.
Clock enable: CKE (registered HIGH) activates and CKE (registered LOW) deactivates
clocking circuitry on the DDR2 SDRAM.
Chip select: S# enables (registered LOW) and disables (registered HIGH) the command
decoder. All commands are masked when S# is registered HIGH. S# provides for external
rank selection on systems with multiple ranks. S# is considered part of the command code.
Command inputs: RAS#, CAS#, and WE# (along with S#) define the command being
entered.
Bank address inputs: BA0–BA1/BA2 define to which device bank an ACTIVE, READ,
WRITE, or PRECHARGE command is being applied. BA0–BA1/BA2 define which mode
register, including MR, EMR, EMR(2), and EMR(3), is loaded during the LM command.
S0#
RAS#, CAS#, WE#
BA0, BA1
(512MB)
BA0–BA2
(1GB)
A0–A13
PAR_IN
Input
(SSTL_18)
Input
(SSTL_18)
Input
(SSTL_18)
DQS0–DQS8,
DQS0#–DQS8#
Input
(SSTL_18)
Input
(SSTL_18)
Input
(SSTL_18)
Input
(SSTL_18)
I/O
(SSTL_18)
I/O
(SSTL_18)
DM0–DM8
(RDQS0–RDQS8)
I/O
(SSTL_18)
CB0–CB7
I/O
(SSTL_18)
I/O
(SSTL_18)
Output
(open drain)
Supply
SCL
SA0–SA2
RESET#
DQ0–DQ63
SDA
ERR_OUT
VDD/VDDQ
PDF: 09005aef81c9620b/Source: 09005aef81c961ec
HVF9C64_128x72K.fm - Rev. C 3/07 EN
Address inputs: Provide the row address for ACTIVE commands, and the column address
and auto precharge bit (A10) for READ/WRITE commands, to select one location out of the
memory array in the respective bank. A10 sampled during a PRECHARGE command
determines whether the PRECHARGE applies to one device bank (A10 LOW, device bank
selected by BA0–BA1/BA2) or all device banks (A10 HIGH). The address inputs also provide
the op-code during a LM command.
Parity bit for the address and control bus.
Serial clock for presence-detect: SCL is used to synchronize the presence-detect data
transfer to and from the module.
Presence-detect address inputs: These pins are used to configure the presence-detect
device.
Asynchronously forces all registered outputs LOW when RESET# is LOW. This signal can be
used during power-up to ensure that CKE is LOW and DQs are High-Z.
Data input/output: Bidirectional data bus.
Data strobe: Output with read data, input with write data for source synchronous
operation. Edge-aligned with read data, center-aligned with write data. DQS# is only used
when differential data strobe mode is enabled via the LM command. DQS9#–DQS17# are
only used when RDQS# is enabled via the LM command.
Input data mask: DM is an input mask signal for write data. Input data is masked when
DM is sampled HIGH along with that input data during a WRITE access. DM is sampled on
both edges of DQS. Although DM pins are input-only, the DM loading is designed to match
that of DQ and DQS pins. If RDQS is enabled, DQS0#–DQS8# are used only during the READ
command. If RDQS is disabled, RDQS0–RDQS8 become DM0–DM8 and RDQS0#–RDQS8# are
not used.
Check bits.
Serial presence-detect data: SDA is a bidirectional pin used to transfer addresses and
data into and out of the presence-detect portion of the module.
Parity error found on the address and control bus.
Power supply: 1.8V ±0.1V.
4
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2005 Micron Technology, Inc. All rights reserved.
512MB, 1GB: (x72, ECC, SR) 244-Pin DDR2 VLP Mini-RDIMM
Pin Assignments and Descriptions
Table 6:
Pin Descriptions (continued)
Symbol
Type
VREF
VSS
VDDSPD
NC
RFU
Supply
Supply
Supply
–
–
PDF: 09005aef81c9620b/Source: 09005aef81c961ec
HVF9C64_128x72K.fm - Rev. C 3/07 EN
Description
SSTL_18 reference voltage.
Ground.
Serial EEPROM positive power supply: +1.7V to +3.6V.
No connect: These pins should be left unconnected.
Reserved for future use.
5
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2005 Micron Technology, Inc. All rights reserved.
512MB, 1GB: (x72, ECC, SR) 244-Pin DDR2 VLP Mini-RDIMM
Functional Block Diagram
Functional Block Diagram
Figure 2:
Functional Block Diagram
RS0#
DQS4
DQS4#
DM4/DQS13
NC/DQS13#
DQS0
DQS0#
DM0/DQS9
NC/DQS9#
DM/
RDQS
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
NU/ CS# DQS DQS#
RDQS#
U1
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
NU/ CS# DQS DQS#
RDQS#
U6
DQS5
DQS5#
DM5/DQS14
NC/DQS14#
DQS1
DQS1#
DM1/DQS10
NC/DQS10#
DM/
RDQS
DQ8
DQ9
DQ10
DQ11
DQ12
DQ13
DQ14
DQ15
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
NU/ CS# DQS DQS#
RDQS#
DM/
RDQS
U12
NU/ CS# DQS DQS#
RDQS#
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ40
DQ41
DQ42
DQ43
DQ44
DQ45
DQ46
DQ47
DQS2
DQS2#
DM2/DQS11
NC/DQS11#
U9
DQS6
DQS6#
DM6/DQS15
NC/DQS15#
DM/
RDQS
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ16
DQ17
DQ18
DQ19
DQ20
DQ21
DQ22
DQ23
NU/ CS# DQS DQS#
RDQS#
DM/
RDQS
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ48
DQ49
DQ50
DQ51
DQ52
DQ53
DQ54
DQ55
U2
NU/ CS# DQS DQS#
RDQS#
U7
DQS7
DQS7#
DM7/DQS16
NC/DQS16#
DQS3
DQS3#
DM3/DQS12
NC/DQS12#
DM/
RDQS
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ24
DQ25
DQ26
DQ27
DQ28
DQ29
DQ30
DQ31
DM/
RDQS
NU/ CS# DQS DQS#
RDQS#
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ56
DQ57
DQ58
DQ59
DQ60
DQ61
DQ62
DQ63
U3
DQS8
DQS8#
DM8/DQS17
NC/DQS17#
DM/
RDQS
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
CB0
CB1
CB2
CB3
CB4
CB5
CB6
CB7
NU/ CS# DQS DQS#
RDQS#
CK0
CK0#
U8
DDR2 SDRAM
DDR2 SDRAM
DDR2 SDRAM
DDR2 SDRAM
DDR2 SDRAM
DDR2 SDRAM
DDR2 SDRAM
DDR2 SDRAM
DDR2 SDRAM
Register
PLL
U11
RESET#
SCL
R
E
G
I
S
T
E
R
NU/ CS# DQS DQS#
RDQS#
U5
U10
SPD EEPROM
WP A0
U4
S0#
BA0–BA1/BA2
A0–A15
RAS#
CAS#
WE#
CKE0
ODT0
PAR_IN
DM/
RDQS
DQ32
DQ33
DQ34
DQ35
DQ36
DQ37
DQ38
DQ39
RS0#: DDR2 SDRAM
RBA0–RBA1/RBA2: DDR2 SDRAM
RA0–RA13: DDR2 SDRAM
RRAS#: DDR2 SDRAM
RCAS#: DDR2 SDRAM
RWE#: DDR2 SDRAM
RCKE0: DDR2 SDRAM
RODT0: DDR2 SDRAM
ERR_OUT
A1
SDA
A2
Vss SA0 SA1 SA2
VDDSPD
SPD EEPROM
VDD/ VDDQ
DDR2 SDRAM
VREF
DDR2 SDRAM
VSS
DDR2 SDRAM
RESET#
PDF: 09005aef81c9620b/Source: 09005aef81c961ec
HVF9C64_128x72K.fm - Rev. C 3/07 EN
6
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2005 Micron Technology, Inc. All rights reserved.
512MB, 1GB: (x72, ECC, SR) 244-Pin DDR2 VLP Mini-RDIMM
General Description
General Description
The MT9HVF6472(P)K and MT9HVF12872(P)K DDR2 SDRAM modules are high-speed,
CMOS, dynamic random-access 512MB and 1GB memory modules organized in a
x72 configuration. DDR2 SDRAM modules use internally configured 4-bank (512Mb) or
8-bank (1Gb) DDR2 SDRAM devices.
DDR2 SDRAM modules use double data rate architecture to achieve high-speed operation. The double data rate architecture is essentially a 4n-prefetch architecture with an
interface designed to transfer two data words per clock cycle at the I/O pins. A single
read or write access for the DDR2 SDRAM module effectively consists of a single
4n-bit-wide, one-clock-cycle data transfer at the internal DRAM core and four corresponding n-bit-wide, one-half-clock-cycle data transfers at the I/O pins.
A bidirectional data strobe (DQS, DQS#) is transmitted externally, along with data, for
use in data capture at the receiver. DQS is a strobe transmitted by the DDR2 SDRAM
device during READs and by the memory controller during WRITEs. DQS is edgealigned with data for READs and center-aligned with data for WRITEs.
DDR2 SDRAM modules operate from a differential clock (CK and CK#); the crossing of
CK going HIGH and CK# going LOW will be referred to as the positive edge of CK.
Commands are registered at every positive edge of CK. Input data is registered on both
edges of DQS, and output data is referenced to both edges of DQS, as well as to both
edges of CK.
Register and PLL Operation
DDR2 SDRAM modules operate in registered mode, where the command/address input
signals are latched in the registers on the rising clock edge and sent to the DDR2 SDRAM
devices on the following rising clock edge (data access is delayed by one clock cycle). A
phase-lock loop (PLL) on the module receives and re-drives the differential clock signals
(CK, CK#) to the DDR2 SDRAM devices. The register(s) and PLL reduce address,
command, control, and clock signal loading by isolating DRAM from the system
controller. PLL clock timing is defined by JEDEC specifications and ensured by use of the
JEDEC clock reference board. Registered mode will add one clock cycle to CL.
Serial Presence-Detect Operation
DDR2 SDRAM modules incorporate serial presence-detect (SPD). The SPD function is
implemented using a 2,048-bit EEPROM. This nonvolatile storage device contains
256 bytes. The first 128 bytes are programmed by Micron to identify the module type and
various SDRAM organizations and timing parameters. The remaining 128 bytes of
storage are available for use by the customer. System READ/WRITE operations between
the master (system logic) and the slave EEPROM device occur via a standard I2C bus
using the DIMM’s SCL (clock) and SDA (data) signals, together with SA (2:0), which
provide eight unique DIMM/EEPROM addresses. Write protect (WP) is tied to VSS on the
module, permanently disabling hardware write protect.
PDF: 09005aef81c9620b/Source: 09005aef81c961ec
HVF9C64_128x72K.fm - Rev. C 3/07 EN
7
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2005 Micron Technology, Inc. All rights reserved.
512MB, 1GB: (x72, ECC, SR) 244-Pin DDR2 VLP Mini-RDIMM
Electrical Specifications
Electrical Specifications
Stresses greater than those listed in Table 7 may cause permanent damage to the
module. This is a stress rating only, and functional operation of the module at these or
any other conditions above those indicated in each device’s data sheet is not implied.
Exposure to absolute maximum rating conditions for extended periods may affect reliability.
Table 7:
Symbol
VDD/VDDQ
VIN, VOUT
II
IOZ
IVREF
TA
TC1
Absolute Maximum Ratings
Parameter
Min
Max
Units
VDD/VDDQ supply voltage relative to VSS
Voltage on any pin relative to VSS
Command/address
Input leakage current; Any input 0V ≤ VIN ≤ VDD;
VREF input 0V ≤ VIN ≤ 0.95V (All other pins not under RAS#, CAS#, WE#, S#,
test = 0V)
CKE, ODT, BA
CK, CK#
DM
Output leakage current; 0V ≤ VOUT ≤ VDDQ; DQs and DQ, DQS, DQS#
ODT are disabled
VREF leakage current; VREF = valid VREF level
Module ambient operating temperature
Commercial
Industrial
DDR2 SDRAM component case operating
Commercial
temperature2
Industrial
–0.5
–0.5
–5
+2.3
+2.3
+5
V
V
µA
–250
–5
–5
+250
+5
+5
µA
–18
0
–40
0
–40
+18
+70
+85
+85
+95
µA
°C
°C
°C
°C
Notes:
1. Refresh rate is required to double when 85°C < TC ≤ 95°C.
2. For further information, refer to technical note TN-00-08: Thermal Applications, available
on Micron’s Web site.
Input Capacitance
Micron encourages designers to simulate the performance of the module to achieve
optimum values. Simulations are significantly more accurate and realistic than a gross
estimation of module capacitance when inductance and delay parameters associated
with trace lengths are used in simulations. JEDEC modules are currently designed using
simulations to close timing budgets.
Component AC Operating Specifications
Recommended AC operating conditions are given in the DDR2 component data sheets.
Component specifications are available on Micron’s Web site. Module speed grades
correlate with component speed grades as shown in Table 8.
Table 8:
Module and Component Speed Grades
Module Speed Grade
Component Speed Grade
-80E
-800
-667
-53E
-40E
-25E
-25
-3
-37E
-5E
PDF: 09005aef81c9620b/Source: 09005aef81c961ec
HVF9C64_128x72K.fm - Rev. C 3/07 EN
8
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2005 Micron Technology, Inc. All rights reserved.
512MB, 1GB: (x72, ECC, SR) 244-Pin DDR2 VLP Mini-RDIMM
IDD Specifications
IDD Specifications
Table 9:
IDD Specifications and Conditions – 512MB
Values shown for MT47H64M8 DDR2 SDRAM only and are computed from values specified in the
512Mb (64 Meg x 8) component data sheet
Parameter/Condition
Operating one bank active-precharge current: tCK = tCK (IDD),
t
RC = tRC (IDD), tRAS = tRAS MIN (IDD); CKE is HIGH, S# is HIGH between
valid commands; Address bus inputs are switching; Data bus inputs are
switching
Operating one bank active-read-precharge current: IOUT = 0mA;
BL = 4, CL = CL (IDD), AL = 0; tCK = tCK (IDD), tRC = tRC (IDD),
tRAS = tRAS MIN (IDD), tRCD = tRCD (IDD); CKE is HIGH, S# is HIGH
between valid commands; Address bus inputs are switching; Data
pattern is same as IDD4W
Precharge power-down current: All device banks
idle; tCK = tCK (IDD); CKE is LOW; Other control and address bus inputs
are stable; Data bus inputs are floating
Precharge quiet standby current: All device banks idle;
tCK = tCK (IDD); CKE is HIGH, S# is HIGH; Other control and address bus
inputs are stable; Data bus inputs are floating
Precharge standby current: All device banks idle; tCK = tCK (IDD); CKE
is HIGH, S# is HIGH; Other control and address bus inputs are switching;
Data bus inputs are switching
Active power-down current: All device banks open;
Fast PDN exit
tCK = tCK (IDD); CKE is LOW; Other control and address
MR[12] = 0
bus inputs are stable; Data bus inputs are floating
Slow PDN exit
MR[12] = 1
Active standby current: All device banks open; tCK = tCK (IDD),
tRAS = tRAS MAX (IDD), tRP = tRP (IDD); CKE is HIGH, S# is HIGH between
valid commands; Other control and address bus inputs are switching;
Data bus inputs are switching
Operating burst write current: All device banks open; Continuous
burst writes; BL = 4, CL = CL (IDD), AL = 0; tCK = tCK (IDD),
tRAS = tRAS MAX (IDD), tRP = tRP (IDD); CKE is HIGH, S# is HIGH between
valid commands; Address bus inputs are switching; Data bus inputs are
switching
Operating burst read current: All device banks open; Continuous
burst reads; IOUT = 0mA; BL = 4, CL = CL (IDD), AL = 0; tCK = tCK (IDD),
t
RAS = tRAS MAX (IDD), tRP = tRP (IDD); CKE is HIGH, S# is HIGH between
valid commands; Address bus inputs are switching; Data bus inputs are
switching
Burst refresh current: tCK = tCK (IDD); REFRESH command at every
tRFC (IDD) interval; CKE is HIGH, S# is HIGH between valid commands;
Other control and address bus inputs are switching; Data bus inputs are
switching
Self refresh current: CK and CK# at 0V; CKE ≤ 0.2V; Other control and
address bus inputs are floating; Data bus inputs are floating
Operating bank interleave read current: All device banks
interleaving reads; IOUT= 0mA; BL = 4, CL = CL (IDD), AL = tRCD (IDD) 1 × tCK (IDD); tCK = tCK (IDD), tRC = tRC (IDD), tRRD = tRRD (IDD), tRCD =
tRCD (IDD); CKE is HIGH, S# is HIGH between valid commands; Address
bus inputs are stable during deselects; Data bus inputs are switching
PDF: 09005aef81c9620b/Source: 09005aef81c961ec
HVF9C64_128x72K.fm - Rev. C 3/07 EN
9
Symbol
-80E
-800
-667
-53E
-40E
Units
IDD0
900
810
720
720
mA
IDD1
1,035
945
855
810
mA
IDD2P
63
63
63
63
mA
IDD2Q
450
405
360
315
mA
IDD2N
495
450
405
360
mA
IDD3P
360
315
270
225
mA
108
108
108
108
mA
IDD3N
630
585
495
405
mA
IDD4W
1,755
1,530
1,260
1,035
mA
IDD4R
1,845
1,620
1,305
1,035
mA
IDD5
2,070
1,620
1,530
1,485
mA
IDD6
63
63
63
63
mA
IDD7
2,700
2,160
2,025
1,980
mA
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2005 Micron Technology, Inc. All rights reserved.
512MB, 1GB: (x72, ECC, SR) 244-Pin DDR2 VLP Mini-RDIMM
IDD Specifications
Table 10:
IDD Specifications and Conditions – 1GB
Values shown for MT47H128M8 DDR2 SDRAM only and are computed from values specified in the
1Gb (128 Meg x 8) component data sheet
Parameter/Condition
t
t
Operating one bank active-precharge current: CK = CK (IDD),
t
RC = tRC (IDD), tRAS = tRAS MIN (IDD); CKE is HIGH, S# is HIGH between
valid commands; Address bus inputs are switching; Data bus inputs are
switching
Operating one bank active-read-precharge current: IOUT = 0mA;
BL = 4, CL = CL (IDD), AL = 0; tCK = tCK (IDD), tRC = tRC (IDD),
t
RAS = tRAS MIN (IDD), tRCD = tRCD (IDD); CKE is HIGH, S# is HIGH
between valid commands; Address bus inputs are switching; Data pattern
is same as IDD4W
Precharge power-down current: All device banks idle; tCK = tCK (IDD);
CKE is LOW; Other control and address bus inputs are stable; Data bus
inputs are floating
Precharge quiet standby current: All device banks idle;
tCK = tCK (IDD); CKE is HIGH, S# is HIGH; Other control and address bus
inputs are stable; Data bus inputs are floating
Precharge standby current: All device banks idle; tCK = tCK (IDD); CKE
is HIGH, S# is HIGH; Other control and address bus inputs are switching;
Data bus inputs are switching
Active power-down current: All device banks open;
Fast PDN exit
tCK = tCK (IDD); CKE is LOW; Other control and address bus MR[12] = 0
inputs are stable; Data bus inputs are floating
Slow PDN exit
MR[12] = 1
Active standby current: All device banks open; tCK = tCK (IDD),
tRAS = tRAS MAX (IDD), tRP = tRP (IDD); CKE is HIGH, S# is HIGH between
valid commands; Other control and address bus inputs are switching;
Data bus inputs are switching
Operating burst write current: All device banks open; Continuous
burst writes; BL = 4, CL = CL (IDD), AL = 0; tCK = tCK (IDD),
tRAS = tRAS MAX (IDD), tRP = tRP (IDD); CKE is HIGH, S# is HIGH between
valid commands; Address bus inputs are switching; Data bus inputs are
switching
Operating burst read current: All device banks open; Continuous burst
reads; IOUT = 0mA; BL = 4, CL = CL (IDD), AL = 0; tCK = tCK (IDD),
t
RAS = tRAS MAX (IDD), tRP = tRP (IDD); CKE is HIGH, S# is HIGH between
valid commands; Address bus inputs are switching; Data bus inputs are
switching
Burst refresh current: tCK = tCK (IDD); REFRESH command at every
t
RFC (IDD) interval; CKE is HIGH, S# is HIGH between valid commands;
Other control and address bus inputs are switching; Data bus inputs are
switching
Self refresh current: CK and CK# at 0V; CKE ≤ 0.2V; Other control and
address bus inputs are floating; Data bus inputs are floating
Operating bank interleave read current: All device banks
interleaving reads; IOUT = 0mA; BL = 4, CL = CL (IDD),
AL = tRCD (IDD) - 1 × tCK (IDD); tCK = tCK (IDD), tRC = tRC (IDD),
tRRD = tRRD (IDD), tRCD = tRCD (IDD); CKE is HIGH, S# is HIGH between
valid commands; Address bus inputs are stable during deselects; Data bus
inputs are switching
PDF: 09005aef81c9620b/Source: 09005aef81c961ec
HVF9C64_128x72K.fm - Rev. C 3/07 EN
10
Symbol
-80E800
-667
-53E
-40E
Units
IDD0
810
765
630
630
mA
IDD1
990
900
855
810
mA
IDD2P
63
63
63
63
mA
IDD2Q
450
360
360
315
mA
IDD2N
450
360
360
315
mA
IDD3P
360
270
270
270
mA
90
90
90
90
mA
IDD3N
540
495
405
360
mA
IDD4W
1,440
1,215
1,125
945
mA
IDD4R
1,440
1,215
1,125
945
mA
IDD5
2,115
1,935
1,890
1,845
mA
IDD6
63
63
63
63
mA
IDD7
3,015
2,520
2,430
2,340
mA
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2005 Micron Technology, Inc. All rights reserved.
512MB, 1GB: (x72, ECC, SR) 244-Pin DDR2 VLP Mini-RDIMM
Register and PLL Specifications
Register and PLL Specifications
Table 11:
Register Specifications
SSTU32865 device or equivalent JESD82-19
Parameter
Symbol
Pins
Condition
Min
Max
Units
DC high-level
input voltage
VIH(DC)
SSTL_18
VREF(DC) + 125
VDDQ + 250
mV
DC low-level
input voltage
VIL(DC)
SSTL_18
0
VREF(DC) - 125
mV
AC high-level
input voltage
VIH(AC)
SSTL_18
VREF(DC) + 250
VDD
mV
AC low-level
input voltage
VIL(AC)
Address,
control,
command
Address,
control,
command
Address,
control,
command
Address,
control,
command
Parity output
Parity output
All pins
All pins
All pins
SSTL_18
0
VREF(DC) - 250
mV
1.2
–
–5
–
–
–
0.5
+5
200
80
V
V
µA
µA
mA
–
Varies by
manufacturer
µA
–
Varies by
manufacturer
µA
2.5
3.5
pF
–
Varies by
manufacturer
pF
Output high voltage
Output low voltage
Input current
Static standby
Static operating
VOH
VOL
II
IDD
IDD
Dynamic operating
(clock tree)
IDDD
Dynamic operating
(per each input)
IDDD
Input capacitance
(per device, per pin)
Input capacitance
(per device, per pin)
CI
Notes:
PDF: 09005aef81c9620b/Source: 09005aef81c961ec
HVF9C64_128x72K.fm - Rev. C 3/07 EN
CI
LVCMOS
LVCMOS
VI = VDDQ or VSSQ
RESET# = VSSQ (IO = 0)
RESET# = VSSQ;
VI = VIH(AC) or VIL(DC)
IO = 0
n/a
RESET# = VDD, VI = VIH(AC) or
VIL(AC), IO = 0; CK and CK#
switching 50% duty cycle
n/a
RESET# = VDD, VI = VIH(AC) or
VIL(AC), IO = 0; CK and CK#
switching 50% duty cycle;
One data input switching at
tCK/2, 50% duty cycle
All inputs
VI = VREF ±250mV;
except RESET#
VDDQ = 1.8V
RESET#
VI = VDDQ or VSSQ
1. Timing and switching specifications for the register listed above are critical for proper operation of the DDR2 SDRAM registered DIMMs. These are meant to be a subset of the parameters for the specific device used on the module. Detailed information for this register is
available in JEDEC standard JESD82.
11
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2005 Micron Technology, Inc. All rights reserved.
512MB, 1GB: (x72, ECC, SR) 244-Pin DDR2 VLP Mini-RDIMM
Register and PLL Specifications
Table 12:
PLL Specifications
CU877 device or equivalent JESD82-8.01
Parameter
Symbol
Pins
Condition
Min
Max
Units
DC high-level input
voltage
DC low-level input
voltage
Input voltage (limits)
VIH
RESET#
LVCMOS
0.65 × VDD
–
V
VIL
RESET#
LVCMOS
–
0.35 × VDD
V
VIN
–0.3
VDDQ + 0.3
V
DC high-level input
voltage
DC low-level input
voltage
Input differential-pair
cross voltage
Input differential
voltage
Input differential
voltage
Input current
VIH
RESET#, CK,
CK#
CK, CK#
Differential input
0.65 × VDD
–
V
VIL
CK, CK#
Differential input
–
0.35 × VDD
V
VIX
CK, CK#
Differential input
(VDDQ/2) - 0.15
(VDDQ/2) + 0.15
V
VID(DC)
CK, CK#
Differential input
0.3
VDDQ + 0.4
V
VID(AC)
CK, CK#
Differential input
0.6
VDDQ + 0.4
V
II
RESET#
CK, CK#
VI = VDDQ or VSSQ
VI = VDDQ or VSSQ
RESET# = VSSQ; VI = VIH(AC)
or VIL(DC)
CK = CK# = LOW
CK, CK# = 270 MHz,
all outputs open
(not connected to PCB)
VI = VDDQ or VSSQ
–10
–250
100
10
250
–
µA
µA
µA
–
–
500
300
µA
mA
2
3
pF
Output current
IODL
Static supply current
Dynamic supply
IDDLD
IDD
n/a
CIN
Each input
Input capacitance
Table 13:
PLL Clock Driver Timing Requirements and Switching Characteristics
Parameter
Stabilization time
Input clock slew rate
SSC modulation frequency
SSC clock input frequency deviation
PLL loop bandwidth (–3dB from unity gain)
Notes:
PDF: 09005aef81c9620b/Source: 09005aef81c961ec
HVF9C64_128x72K.fm - Rev. C 3/07 EN
Symbol
Min
Max
Units
tL
–
1.0
30
0.0
2.0
15
4
33
–0.50
–
µs
V/ns
kHz
%
MHz
tLS
I
1. PLL timing and switching specifications are critical for proper operation of the DDR2 DIMM.
This is a subset of parameters for the specific PLL used. Detailed PLL information is available
in JEDEC standard JESD82.
12
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2005 Micron Technology, Inc. All rights reserved.
512MB, 1GB: (x72, ECC, SR) 244-Pin DDR2 VLP Mini-RDIMM
Register and PLL Specifications
Table 14:
Serial Presence-Detect EEPROM DC Operating Conditions
All voltages referenced to VSS; VDDSPD = +1.7V to +3.6V
Parameter/Condition
Symbol
Min
Max
Units
VDDSPD
VIH
VIL
VOL
ILI
ILO
ISB
ICCR
ICCW
1.7
VDDSPD × 0.7
–0.6
–
0.10
0.05
1.6
0.4
2
3.6
VDDSPD + 0.5
VDDSPD × 0.3
0.4
3
3
4
1
3
V
V
V
V
µA
µA
µA
mA
mA
Supply voltage
Input high voltage: Logic 1; All inputs
Input low voltage: Logic 0; All inputs
Output low voltage: IOUT = 3mA
Input leakage current: VIN = GND to VDDSPD
Output leakage current: VOUT = GND to VDDSPD
Standby current
Power supply current, READ: SCL clock frequency = 100 kHz
Power supply current, WRITE: SCL clock frequency = 100 kHz
Table 15:
Serial Presence-Detect EEPROM AC Operating Conditions
All voltages referenced to VSS; VDDSPD = +1.7V to +3.6V
Parameter/Condition
SCL LOW to SDA data-out valid
Time the bus must be free before a new transition can start
Data-out hold time
SDA and SCL fall time
Data-in hold time
Start condition hold time
Clock HIGH period
Noise suppression time constant at SCL, SDA inputs
Clock LOW period
SDA and SCL rise time
SCL clock frequency
Data-in setup time
Start condition setup time
Stop condition setup time
WRITE cycle time
Notes:
PDF: 09005aef81c9620b/Source: 09005aef81c961ec
HVF9C64_128x72K.fm - Rev. C 3/07 EN
Symbol
Min
Max
Units
Notes
tAA
0.2
1.3
200
–
0
0.6
0.6
–
1.3
–
–
100
0.6
0.6
–
0.9
–
–
300
–
–
–
50
–
0.3
400
–
–
–
10
µs
µs
ns
ns
µs
µs
µs
ns
µs
µs
kHz
ns
µs
µs
ms
1
tBUF
tDH
tF
tHD:DAT
tHD:STA
tHIGH
tI
tLOW
tR
fSCL
tSU:DAT
tSU:STA
tSU:STO
t
WRC
2
2
3
4
1. To avoid spurious start and stop conditions, a minimum delay is placed between SCL = 1 and
the falling or rising edge of SDA.
2. This parameter is sampled.
3. For a restart condition, or following a WRITE cycle.
4. The SPD EEPROM WRITE cycle time (tWRC) is the time from a valid stop condition of a write
sequence to the end of the EEPROM internal ERASE/PROGRAM cycle. During the WRITE
cycle, the EEPROM bus interface circuit is disabled, SDA remains HIGH due to pull-up resistance, and the EEPROM does not respond to its slave address.
13
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2005 Micron Technology, Inc. All rights reserved.
512MB, 1GB: (x72, ECC, SR) 244-Pin DDR2 VLP Mini-RDIMM
Register and PLL Specifications
Table 16:
Byte
Serial Presence-Detect Matrix
Description
0
1
2
3
4
5
Number of SPD bytes used by Micron
Total number of bytes in SPD device
Fundamental memory type
Number of row addresses on assembly
Number of column addresses on assembly
DIMM height and module ranks
6
7
8
9
Module data width
Reserved
Module voltage interface levels
SDRAM cycle time, tCK
(CL = MAX value, see byte 18)
10
SDRAM access from clock, tAC
(CL = MAX value, see byte 18)
11
Module configuration type
12
13
14
15
16
17
18
Refresh rate/type
SDRAM device width (primary SDRAM)
Error-checking SDRAM data width
Reserved
Burst lengths supported
Number of banks on SDRAM device
CAS latencies supported
19
20
Module thickness
DDR2 DIMM type
21
22
SDRAM module attributes
SDRAM device attributes: weak driver
(01) and 50Ω ODT (03)
SDRAM cycle time, tCK,
MAX CL - 1
23
24
SDRAM access from CK, tAC,
MAX CL - 1
25
SDRAM cycle time, tCK,
MAX CL - 2
26
SDRAM access from CK, tAC,
MAX CL - 2
PDF: 09005aef81c9620b/Source: 09005aef81c961ec
HVF9C64_128x72K.fm - Rev. C 3/07 EN
Entry (Version)
512MB
1GB
128
256
DDR2 SDRAM
14
10
18.2mm,
single rank
72
0
SSTL 1.8V
-80E/-800
-667
-53E
-40E
-80E/-800
-667
-53E
-40E
ECC
ECC and parity
7.81µs/SELF
8
8
0
4, 8
4 or 8
-80E (5, 4)
-800 (6, 5, 4)
-667 (5, 4, 3)
-53E/-40E (4, 3)
80
08
08
0E
0A
00
80
08
08
0E
0A
00
48
00
05
25
30
3D
50
40
45
50
60
02
06
82
08
08
00
0C
04
30
70
38
18
01
10
48
00
05
25
30
3D
50
40
45
50
60
02
06
82
08
08
00
0C
08
30
70
38
18
01
10
04
03
01
3D
30
50
40
45
50
60
00/3D
50
00
00/40
45
00
04
03
01
3D
30
50
40
45
50
60
00/3D
50
00
00/40
45
00
Registered
Mini-RDIMM
1 PLL, 2 Reg
-80E/-800/-667
-53E/-40E
-80E/-667
-800
-53E/-40E
-80E/-800
-667
-53E
-40E
-80E/-800
-667
-53E/-40E
-80E/-800
-667
-53E/-40E
14
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2005 Micron Technology, Inc. All rights reserved.
512MB, 1GB: (x72, ECC, SR) 244-Pin DDR2 VLP Mini-RDIMM
Register and PLL Specifications
Table 16:
Byte
Serial Presence-Detect Matrix (continued)
Description
tRP
27
MIN row precharge time,
28
29
MIN row active-to-row active, tRRD
MIN RAS#-to-CAS# delay, tRCD
30
MIN active-to-precharge time, tRAS
31
32
Module rank density
Address and command setup time, tISb
33
Address and command hold time, tIHb
34
Data/data mask input setup time, tDSb
35
Data/data mask input hold time, tDHb
36
37
Write recovery time, tWR
WRITE-to-READ command delay, tWTR
38
39
40
READ-to-PRECHARGE command delay,
tRTP
Memory analysis probe
Extension for bytes 41 and 42
41
MIN active-to-active/refresh time, tRC1
42
MIN AUTO REFRESH-to-ACTIVE/AUTO
REFRESH command period, tRFC
SDRAM device MAX cycle time,
tCK (MAX)
SDRAM device MAX DQS–DQ skew time,
tDQSQ
43
44
45
46
47–61
62
SDRAM device MAX read data hold skew
factor, tQHS
PLL relock time
Optional features, not supported
SPD revision
PDF: 09005aef81c9620b/Source: 09005aef81c961ec
HVF9C64_128x72K.fm - Rev. C 3/07 EN
Entry (Version)
512MB
1GB
-80E
-800/-667/-53E/-40E
32
3C
1E
32
3C
2D
28
80
17
20
25
35
25
27
37
47
05
10
15
12
17
22
27
3C
1E
28
1E
1E
32
3C
1E
32
3C
2D
28
01
17
20
25
35
25
27
37
47
05
10
15
12
17
22
27
3C
1E
28
1E
1E
00
30
00
39
3C
37
69
00
36
06
39
3C
37
7F
80
80
14
18
1E
23
1E
22
28
2D
0F
00
12
14
18
1E
23
1E
22
28
2D
0F
00
12
-80E
-800/-667/-53E/-40E
-80E/-800/-667/-53E
-40E
512MB, 1GB
-80E/-800
-667
-53E
-40E
-80E/-800
-667
-53E
-40E
-80E/-800
-667/-53E
-40E
-80E/-800
-667
-53E
-40E
-80E
-800/-40E
-667/-53E
-80E
-800/-667/-53E/-40E
-80E
-800/-667/-53E
-40E
-80E/-800
-667
-53E
-40E
-80E/-800
-667
-53E
-40E
Release 1.2
15
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2005 Micron Technology, Inc. All rights reserved.
512MB, 1GB: (x72, ECC, SR) 244-Pin DDR2 VLP Mini-RDIMM
Register and PLL Specifications
Table 16:
Byte
63
64
65–71
72
73–90
91
92
93
94
95–98
99–127
128–255
Serial Presence-Detect Matrix (continued)
Description
Checksum for bytes 0–62
ECC/ECC and parity
Manufacturer’s JEDEC ID code
Manufacturer’s JEDEC ID code
Manufacturing location
Module part number (ASCII)
PCB identification code
Identification code (continued)
Year of manufacture in BCD
Week of manufacture in BCD
Module serial number
Reserved for manufacturer-specific data
Reserved for customer-specific data
Notes:
PDF: 09005aef81c9620b/Source: 09005aef81c961ec
HVF9C64_128x72K.fm - Rev. C 3/07 EN
Entry (Version)
512MB
1GB
-80E
-800
-667
-53E
-40E
MICRON
(continued)
1–12
–
1–9
0
–
–
–
62/66
03/07
1E/22
C9/CD
30/34
2C
FF
01–0C
Variable data
01–09
00
Variable data
Variable data
Variable data
00
FF
03/07
A4/A8
BF/C3
6A/6E
D1/D5
2C
FF
01–0C
Variable data
01–09
00
Variable data
Variable data
Variable data
00
FF
1. The tRC SPD values shown are JEDEC DDR2 device specification values. The actual Micron
DDR2 device specification is tRC = 55ns for all speed grades.
16
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2005 Micron Technology, Inc. All rights reserved.
512MB, 1GB: (x72, ECC, SR) 244-Pin DDR2 VLP Mini-RDIMM
Module Dimensions
Module Dimensions
Figure 3:
244-Pin DDR2 VLP Mini-RDIMM
Front view
3.80 (0.150)
MAX
82.127 (3.233)
81.873 (3.223)
1.00 (0.039) R X2
U1
U2
U4
U3
U6
U5
1.80 (0.071) D X2
6.00 (0.236)
TYP
1.00 (0.039)
TYP
2.00 (0.079)
TYP
0.60 (0.024)
PIN 1 TYP
U7
18.30 (0.720)
18.10 (0.713)
10.00 (0.394)
TYP
0.50 (0.02) R
0.45 (0.018)
TYP
PIN 122
1.10 (0.043)
0.90 (0.035)
42.90 (1.689)
TYP
78.00 (3.071)
TYP
Back view
U10
U8
U9
U11
U12
3.30 (0.130)
TYP
3.60 (0.142) TYP
PIN 123
PIN 244
33.60 (1.323)
TYP
38.40 (1.512)
TYP
3.20 (0.126)
TYP
Notes:
1. All dimensions are in millimeters (inches); MAX/MIN or typical (TYP) where noted.
2. The dimensional diagram is for reference only. Refer to the JEDEC MO document for complete design dimensions.
®
8000 S. Federal Way, P.O. Box 6, Boise, ID 83707-0006, Tel: 208-368-3900
[email protected] www.micron.com Customer Comment Line: 800-932-4992
Micron, the M logo, and the Micron logo are trademarks of Micron Technology, Inc. All other trademarks are the property of
their respective owners.
This data sheet contains minimum and maximum limits specified over the complete power supply and temperature range
for production devices. Although considered final, these specifications are subject to change, as further product
development and data characterization sometimes occur.
PDF: 09005aef81c9620b/Source: 09005aef81c961ec
HVF9C64_128x72K.fm - Rev. C 3/07 EN
17
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2005 Micron Technology, Inc. All rights reserved.
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