Aeroflex ACT-E128K32N-250F2T Act-e128k32 high speed 4 megabit eeprom multichip module Datasheet

ACT–E128K32 High Speed
4 Megabit EEPROM Multichip Module
CIRCUIT TECHNOLOGY
Features
www.aeroflex.com
■ 4 Low Power 128K x 8 EEPROM Die in One MCM ■ Packaging – Hermetic Ceramic
Package
■ Organized as 128K x 32
● User
66 Pin, 1.08" x 1.08" x .160" PGA Type, No Shoulder,
Aeroflex code# "P3"
● 66 Pin, 1.08" x 1.08" x .185" PGA Type, With
Shoulder, Aeroflex code# "P7"
● 68 Lead, .88" x .88" x .200" Dual-Cavity Small
Outline Gull Wing, Aeroflex code# "F2" (Drops into
the 68 Lead JEDEC .99"SQ CQFJ footprint)
●
Configurable to 256K x 16 or 512K x 8
■ CMOS and TTL Compatible Inputs and Outputs
■ Access Times of 120,140,150, 200, 250& 300ns
■ +5V ±10% Supply
■ MIL-PRF-38534 Compliant MCMs Available
■ Automatic Page Write Operation
■ Hardware and Software Data Protection
■ Page Write Cycle Time: 10ms Max
■ Internal Decoupling Capacitors for Low Noise
■ Data Retention Ten Years Minimum
Operation
■ Commercial, Industrial and Military Temperature
Ranges
■ SMD# 5962–94585 Released (P7 & F2)
■ Low Power CMOS
■ Data Polling for End of Write Detection
■ Industry Standard Pinouts
General Description
Block Diagram – PGA Type Package (P3,P7) & CQFP (F2)
WE1 CE1 WE2 CE2 WE3 CE3 WE4 CE4
A0 – A16
OE
128Kx8
128Kx8
128Kx8
128Kx8
8
8
8
8
I/O0-7
I/O8-15
I/O16-23
I/O 24-31
Pin Description
I/O0-31
Data I/O
A0–16 Address Inputs
WE1-4 Write Enables
OE
Output Enable
CE1-4
Chip Enables
VCC
Power Supply
GND
Ground
The ACT–E128K32 is a high
speed, 4 megabit, CMOS
EEPROM multichip module
(MCM) designed for full
temperature range military,
space, or high reliability
applications. The MCM can be
organized as a 256K x 16 bits
or 512K x 8 bits device and is
input and output CMOS and
TTL compatible. Writing is
executed when the write enable
(WE) and chip enable (CE)
inputs are low and output
enable (OE) is high. Reading is
accomplished when WE is high
and CE and OE are both low.
Access
times
grades
of
120, 140, 150, 200, 250 & 300ns
are standard.
The
ACT–E128K32
is
packaged in a choice of
hermetically sealed co-fired
ceramic packages, a 66 pin,
1.08" sq PGA or a 68 lead, .88"
sq gullwing CQFP. The device
operates over the temperature
range of -55°C to +125°C and
military environment.
eroflex Circuit Technology - Advanced Multichip Modules © SCD1662 REV B 9/5/01
Absolute Maximum Ratings
Parameter
Symbol
Range
Units
TC
-55 to +125
°C
TSTG
-65 to +150
°C
VG
-0.6 to +6.25
V
All Output Voltages with respect to Ground
-
-0.6 to VCC+0.6
V
Voltage on OE and A9 with respect to Ground
-
-0.6 to +13.5
V
Operating Temperature
Storage Temperature Range
All Input Voltages with respect to Ground
NOTICE: Stresses above those listed under "Absolute Maximums Rating" may cause permanent damage to the device. This is a stress rating only and functional
operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect device reliability.
Recommended Operating Conditions
Symbol
Minimum
Maximum
Units
Power Supply Voltage
+4.5
+5.5
V
VIH
Input High Voltage
+2.0
VCC + 0.3
V
VIL
Input Low Voltage
-0.5
+0.8
V
TC
Case Operating Temperature (Military)
-55
+125
°C
VCC
Parameter
A
Capacitance
(VIN = 0V, f = 1MHz, TC = 25°C)
Symbol
CAD
COE
CWE(1-4)
Parameter
Maximum
Units
A0 – A16 Capacitance
50
pF
Output Enable Capacitance
50
pF
Write Enable Capacitance
20
pF
CCE(1-4)
Chip Enable Capacitance
20
pF
CI/O
I/O0 – I/O31 Capacitance
20
pF
DC Characteristics
(Vcc = 5.0V, Vss = 0V, TC = -55°C to +125°C, unless otherwise specified)
Parameter
Sym
ILI
Input Leakage Current
Conditions
Minimum
Maximum
Units
10
µA
VCC = 5.5V, VIN = GND to VCC
Output Leakage Current
ILOX32 CE = OE = VIH, VOUT = GND to VCC
10
µA
Operating Supply Current x 32 Mode
ICC X32 CE = VIL, OE = VIH, f = 5Mhz
250
mA
5
mA
0.45
V
Operating Supply Current
ISB
CE = VIH, OE = VIH, f = 5Mhz
Output Low Voltage
VOL
IOL = +2.1mA, VCC = 4.5V
Output High Voltage
VOH
IOH = –400µA, VCC = 4.5V
2.4
V
Truth Table
CE
OE
WE
Mode
Data I/O
H
X
X
Standby
High Z
L
L
H
Read
Data Out
L
H
L
Write
Data In
X
H
X
Out Disable
High Z
X
X
H
Write
-
X
Inhibit
-
X
Aeroflex Circuit Technology
L
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SCD1662 REV B 9/5/01 Plainview NY (516) 694-6700
AC Write Characteristics
(VCC = 5V, VSS = 0V, TC = -55°C to +125°C)
Parameter
Symbol
Min
tWC
Write Cycle Time
Max
Units
10
ms
Address Set-up Time
tAS
10
ns
Write Pulse Width (WE or CE)
tWP
150
ns
Chip Enable Set-up Time
tCE
0
ns
Address Hold Time
tAH
100
ns
Data Hold Time
tDH
10
ns
Chip Enable Hold Time
tCEH
0
ns
Data Set-up Time
tDS
100
ns
Output Enable Set-up Time
tOES
10
ns
Output Enable Hold Time
tOEH
10
ns
A
AC Read Characteristics
(VCC = 5V, VSS = 0V, TC = -55°C to +125°C)
Read Cycle Parameter
Symbol
–120
–140
–150
–200
–250
Min
Max Min
Max Min
Max Min
Max Min
120
140
150
200
250
–300
Max Min
Max
300
Units
ns
Read Cycle Time
tRC
Address Access Time
tACC
120
140
150
200
250
300
ns
Chip Enable Access Time
tACE
120
140
150
200
250
300
ns
Output Hold From Address Change,
OE or CE
tOH
0
Output Enable to Output Valid
tOE
0
Chip Enable or OE to High Z Output
tDF
0
55
0
0
55
70
70
0
0
55
0
70
0
55
0
70
0
85
0
70
ns
85
ns
70
ns
Page Write Characteristics
(VCC = 5V, VSS = 0V, TC = -55°C to +125°C)
Parameter
Symbol
Minimum
Maximum
Units
10
ms
Write Cycle Time
tWC
Address Set-up Time
tAS
10
ns
Address Hold Time , See Note 1
tAH
100
ns
Data Set-up Time
tDS
100
ns
Data Hold Time
tDH
10
ns
Write Pulse Width
tWP
150
ns
Byte Load Cycle Time
tBLC
Write Pulse Width High
tWPH
150
50
µs
ns
Note 1 – Page Address must remain valid for duration of write cycle.
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Device Operation
consists of setting the WE line low. The write
cycle begins when the last of either CE or
WE goes low.
The WE line transition from high to low also
initiates an internal delay timer to permit
page mode operation. Each subsequent WE
transition from high to low that occurs before
the completion of the tBLC time out will restart
the timer from zero. The operation of the
timer is the same as a retriggable one-shot.
The ACT-E128K32 is a high-performance
Electrically Erasable and Programmable
Read Only Memory. It is composed of four 1
megabit memory chips and is organized as
131,072 by 32 bits. The device offers access
times of 120 to 300ns with power dissipation
of 1.375W. When the device is deselected,
the CMOS standby current is less than 5 mA.
The ACT-E128K32 is accessed like a Static
RAM for the read or write cycle without the
need for external components. The device
contains a 128-byte page register to allow
writing of up to 128 bytes simultaneously.
During a write cycle, the address and 1 to
128 bytes of data are internally latched,
freeing the address and data bus for other
operations. Following the initiation of a write
cycle, the device will automatically write the
latched data using an internal control timer.
The end of a write cycle can be detected by
DATA polling of I/O7. Once the end of a write
cycle has been detected a new access for a
read or write can begin.
Aeroflex’s ACT-E128K32 has additional
features to ensure high quality and
manufacturability. The device utilizes internal
error correction for extended endurance and
improved data retention characteristics. An
optional software data protection mechanism
is available to guard against inadvertent
writes.
READ
The ACT-E128K32 stores data at the
memory location determined by the address
pins. When CE and OE are low and WE is
high, this data is present on the outputs.
When CE and OE are high, the outputs are in
a high impedance state. This two line control
prevents bus contention.
DATA POLLING
The ACT-E128K32 offers a data polling
feature which allows a faster method of
writing to the device. Figure 5 shows the
timing diagram for this function. During a
byte or page write cycle, an attempted read
of the last byte written will result in the
complement of the written data on I/O7 (For
each Chip). Once the write cycle has been
completed, true data is valid on all outputs
and the next cycle may begin. Data polling
may begin at any time during the write cycle.
WRITE
PAGE WRITE OPERATION
A write cycle is initiated when OE is high and
a low pulse is on WE or CE with CE or WE
low. The address is latched on the falling
edge of CE or WE whichever occurs last.
The data is latched by the rising edge of CE
or WE, whichever occurs first. A byte write
operation will automatically continue to
completion.
The ACT-E128K32 has a page write
operation that allows one to 128 bytes of data
to be written into the device and
consecutively loads during the internal
programming period. Successive bytes may
be loaded in the same manner after the first
data byte has been loaded. An internal timer
begins a time out operation at each write
cycle. If another write cycle is completed
within tBLC or less, a new time out period
begins. Each write cycle restarts the delay
period. The write cycles can be continued as
long as the interval is less than the time out
period.
WRITE CYCLE TIMING
Figures 2 and 3 show the write cycle timing
relationships. A write cycle begins with
address application, write enable and chip
enable. Chip enable is accomplished by
placing the CE line low.
Write enable
Aeroflex Circuit Technology
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A
byte write sequence of specific data to
specific locations. Power transitions will not
reset the software write protection.
Each 128K byte block of the EEPROM has
independent write protection. One or more
blocks may be enabled and the rest disabled
in any combination. The software write
protection guards against inadvertent writes
during power transitions, or unauthorized
modification using a PROM programmer.
The usual procedure is to increment the least
significant address lines from A0 through A6
at each write cycle. In this manner a page of
up to 128 bytes can be loaded in to the
EEPROM in a burst mode before beginning
the relatively long interval programming
cycle.
After the tBLC time out is completed, the
EEPROM begins an internal write cycle.
During this cycle the entire page will be
written at the same time. The internal
programming cycle is the same regardless of
the number of bytes accessed.
HARDWARE DATA PROTECTION
These features protect against inadvertent
writes to the ACT-E128K32. These are
included to improve reliability during normal
operation:
A) Vcc Sense
While below 3.8V typical write cycles
are inhibited.
B) Write inhibiting
Holding OE low and either CE or WE
high inhibits write cycles.
C) Noise filter
Pulses of <10ns (TYP) on WE or CE
will not initiate a write cycle.
SOFTWARE DATA PROTECTION
A software write protection feature may be
enabled or disabled by the user. When
shipped by Aeroflex Microelectronics, the
ACT-E128K32 has the feature disabled.
Write access to the device is unrestricted.
To enable software write protection, the user
writes three access code bytes to three
special internal locations.
Once write
protection has been enabled, each write to
the EEPROM must use the same three byte
write sequence to permit writing. The write
protection feature can be disabled by a six
Aeroflex Circuit Technology
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A
Data Polling Characteristics
(VCC = 5V, VSS = 0V, TC = -55°C to +125°C)
Parameter
Symbol
Min
Data Hold Time
tDH
10
ns
OE Hold Time
tOEH
10
ns
OE to Output Valid
tOE
Write Recovery Time
tWR
Max
Units
55
ns
0
ns
Guaranteed. But not tested.
Figure 1
AC Test Circuit
Current Source
A
IOL
Parameter
Typical
Units
Input Pulse Level
0 – 3.0
V
Input Rise and Fall
VZ ~ 1.5 V
(Bipolar Supply)
To Device Under Test
CL =
50 pF
5
ns
Input and Output Timing Reference Level
1.5
V
Output Lead Capacitance
50
pF
IOH
Current Source
Notes:
1) VZ is programmable from -2V to +7V. 2) I OL and IOH programmable from 0 to 16 mA. 3) Tester Impedance ZO = 75Ω. 4) VZ is typically the
midpoint of VOH and VOL. 5) IOL and IOH are adjusted to simulate a typical resistance load circuit. 6) ATE Tester includes jig capacitance.
Figure 2
Write Waveforms – WE Controlled
tWC
OE
tOEH
tOES
ADDRESS
tAS
tCEH
tAH
CE
tCE
WE
tWPH
t WP
tDS
t DH
DATA IN
Aeroflex Circuit Technology
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Figure 3
Write Waveforms – CE Controlled
tWC
OE
tOEH
tOES
ADDRESS
tAS
tCEH
tAH
WE
tCE
CE
tWPH
t WP
A
tDS
tDH
DATA IN
Figure 4
Read Waveforms
tRC
ADDRESS
Address Valid
CE
tACE
tOE
OE
tDF
tACC
OUTPUT
High Z
tOH
Output
Valid
Notes:
1. OE may be delayed up to tACS – tOE after the falling edge of CE without impact on tOE or by tACC – tOE
after an address change without impact on tACC.
Aeroflex Circuit Technology
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SCD1662 REV B 9/5/01 Plainview NY (516) 694-6700
Figure 5
Data Polling Waveform
WE1-4
CE1-4
tOEH
OE
tDH
tOE
I/O7
ADDRESS
tWR
High Z
AN
A
AN
AN
AN
AN
Figure 6
Page Mode Write Waveforms
OE
CEX
tWP
WEX
tBLC
tAS
tAH
ADDRESS
t WPH
tDH
Valid ADD
tWC
tDS
DATA
Valid DATA
Byte 0
Byte 1
Byte 2
Byte 3
Byte 127
Notes:
1. A7 through A16 must specify the sector address during each high to low transition of WE (or CE) after the software codes have been entered.
2. OE must be high when WE and CE are both low.
Aeroflex Circuit Technology
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Figure 7
Software Data
Protection Enable Algorithm
Figure 8
Software Data
Protection Disable Algorithm
(1)
Load Data AA
To
Address 5555
Load Data AA
To
Address 5555
Load Data 55
To
Address 2AAA
Load Data 55
To
Address 2AAA
Load Data A0
To
Address 5555
Writes Enabled
(1)
Load Data 80
To
Address 5555
(2)
A
Load Data XX
To
Any Address (4)
Load Data AA
To
Address 5555 (4)
Load Last Byte
To
Last Address
Load Data 55
To
Address 2AAA
Enter Data
Protect State
Load Data 20
To
Address 5555
Exit Data
Protect State (3)
Load Data XX
To
Any Address (4)
Load Last Byte
To
Last Address
NOTES:
1. Data Format: I/O0 - I/O7 (Hex);
Address Format: A14 - A0 (Hex).
2. Write Protect state will be activated at end ot write even if no other
data is loaded.
3. Write Protect state will be deactivated at end of write period even if
no other data is loaded.
4. 1 to 128 bytes of data may be loaded.
Aeroflex Circuit Technology
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Pin Numbers & Functions
66 Pins — PGA Type Package
Pin #
Function
Pin #
Function
Pin #
Function
Pin #
Function
1
I/O8
18
A12
35
I/O25
52
WE3
2
I/O9
19
Vcc
36
I/O26
53
CE3
3
I/O10
20
CE1
37
A6
54
GND
4
A13
21
NC
38
A7
55
I/O19
5
A14
22
I/O3
39
NC
56
I/O31
6
A15
23
I/O15
40
A8
57
I/O30
7
A16
24
I/O14
41
A9
58
I/O29
8
NC
25
I/O13
42
I/O16
59
I/O28
9
I/O0
26
I/O12
43
I/O17
60
A0
10
I/O1
27
OE
44
I/O18
61
A1
11
I/O2
28
NC
45
VCC
62
A2
12
WE2
29
WE1
46
CE4
63
I/O23
13
CE2
30
I/O7
47
WE4
64
I/O22
14
GND
31
I/O6
48
I/O27
65
I/O21
15
I/O11
32
I/O5
49
A3
66
I/O20
16
A10
33
I/O4
50
A4
17
A11
34
I/O24
51
A5
Note: Pins 8, 21, 28 & 39 can be connected to ground by specifing Option "C".
"P3" — 1.08" SQ PGA Type (without shoulder) Package
"P7" — 1.08" SQ PGA Type (with shoulder) Package
Bottom View (P7 & P3)
Side View
(P7)
Side View
(P3)
1.085 SQ
MAX
1.000
.185
MAX
.600
.025
.035
Pin 56
.050
1.030
1.040
.100
Pin 1
1.030
1.040
.100
.020
.016
1.000
.020
.016
Pin 66
.180
TYP
All dimensions in inches
Aeroflex Circuit Technology
Pin 11
.180
TYP
.100
.160
MAX
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A
Pin Numbers & Functions
68 Pins — Dual-Cavity CQFP
Pin #
Function
Pin #
Function
Pin #
Function
Pin #
Function
1
GND
18
GND
35
OE
52
GND
2
CE3
19
I/O8
36
CE2
53
I/O23
3
A5
20
I/O9
37
NC
54
I/O22
4
A4
21
I/O10
38
WE2
55
I/O21
5
A3
22
I/O11
39
WE3
56
I/O20
6
A2
23
I/O12
40
WE4
57
I/O19
7
A1
24
I/O13
41
NC
58
I/O18
8
A0
25
I/O14
42
NC
59
I/O17
9
NC
26
I/O15
43
NC
60
I/O16
10
I/O0
27
Vcc
44
I/O31
61
VCC
11
I/O1
28
A11
45
I/O30
62
A10
12
I/O2
29
A12
46
I/O29
63
A9
13
I/O3
30
A13
47
I/O28
64
A8
14
I/O4
31
A14
48
I/O27
65
A7
15
I/O5
32
A15
49
I/O26
66
A6
16
I/O6
33
A16
50
I/O25
67
WE1
17
I/O7
34
CE1
51
I/O24
68
CE4
Package Outline — Dual-Cavity CQFP "F2"
Top View
Pin 9
.990 SQ
±.010
.880 SQ
±.010
Pin 10
Pin 61
*.200 MAX
.010 REF
Pin 60
.015
±.010
.946
±.010
0.010 R
0°- 7°
.050
TYP
.010 ±.005
.040
Detail “A”
Pin 26
Pin 27
Pin 44
.800 REF
Pin 43
See Detail “A”
*.180 MAX available, call factory for details
All dimensions in inches
Aeroflex Circuit Technology
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SCD1662 REV B 9/5/01 Plainview NY (516) 694-6700
A
CIRCUIT TECHNOLOGY
Ordering Information
Model Number
DESC Drawing Number
Speed
Package
ACT-E128K32N-120P7Q
5962-9458506H4X
120ns
PGA Type
ACT-E128K32C-120P7Q
5962-9458506H5X
120ns
PGA Type
ACT-E128K32N-140P7Q
5962-9458505H4X
140ns
PGA Type
ACT-E128K32C-140P7Q
5962-9458505H5X
140ns
PGA Type
ACT-E128K32N-150P7Q
5962-9458504H4X
150ns
PGA Type
ACT-E128K32C-150P7Q
5962-9458504H5X
150ns
PGA Type
ACT-E128K32N-200P7Q
5962-9458503H4X
200ns
PGA Type
ACT-E128K32C-200P7Q
5962-9458503H5X
200ns
PGA Type
ACT-E128K32N-250P7Q
5962-9458502H4X
250ns
PGA Type
ACT-E128K32C-250P7Q
5962-9458502H5X
250ns
PGA Type
ACT-E128K32N-300P7Q
5962-9458501H4X
300ns
PGA Type
ACT-E128K32C-300P7Q
5962-9458501H5X
300ns
PGA Type
ACT-E128K32N-120F2Q
5962-9458506HMX
120ns
CQFP
ACT-E128K32N-140F2Q
5962-9458505HMX
140ns
CQFP
ACT-E128K32N-150F2Q
5962-9458504HMX
150ns
CQFP
ACT-E128K32N-200F2Q
5962-9458503HMX
200ns
CQFP
ACT-E128K32N-250F2Q
5962-9458502HMX
250ns
CQFP
ACT-E128K32N-300F2Q
5962-9458501HMX
300ns
CQFP
Part Number Breakdown
ACT– E 128K 32 N– 200 P7 M
Aeroflex Circuit
Technology
Memory Type
Screening
E = EEPROM
C = Commercial Temp, 0°C to +70°C
I = Industrial Temp, -40°C to +85°C
T = Military Temp, -55°C to +125°C
M = Military Temp, -55°C to +125°C, Screening *
Q = MIL-PRF-38534 Compliant / SMD
Memory Depth
Memory Width, Bits
Options
Package Type & Size
Surface Mount Packages
Thru-Hole Packages
F2 = .88"SQ 68 Lead Dual-Cavity
P3 = 1.085"SQ PGA 66 Pins
without shoulder
CQFP
P7 = 1.085"SQ PGA 66 Pins
with shoulder
N = None
C = Connect to GND – Pins 8,21,28,39 (P3 & P7 Pkg only)
Memory Speed, ns
* Screened to the individual test methods of MIL-STD-883
Specifications subject to change without notice.
Aeroflex Circuit Technology
35 South Service Road
Plainview New York 11830
Aeroflex Circuit Technology
Telephone: (516) 694-6700
FAX:
(516) 694-6715
Toll Free Inquiries: 1-(800) 843-1553
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A
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