AD AD876JST Cmos a/d converter Datasheet

a
FEATURES
CMOS 10-Bit 20 MSPS Sampling A/D Converter
Pin-Compatible 8-Bit Option
Power Dissipation: 160 mW
+5 V Single Supply Operation
Differential Nonlinearity: 0.5 LSB
Guaranteed No Missing Codes
Power Down (Standby) Mode
Three-State Outputs
Digital I/Os Compatible with +5 V or +3.3 V Logic
Adjustable Reference Input
Small Size: 28-Lead SOIC, 28-Lead SSOP, or 48-Lead
Thin Quad Flatpack (TQFP)
10-Bit 20 MSPS 160 mW
CMOS A/D Converter
AD876
FUNCTIONAL BLOCK DIAGRAM
AVDD
CLK
SHA
SHA
GAIN
The AD876 is a CMOS, 160 mW, 10-bit, 20 MSPS analog-todigital converter (ADC). The AD876 has an on-chip input
sample-and-hold amplifier. By implementing a multistage pipelined architecture with output error correction logic, the AD876
offers accurate performance and guarantees no missing codes
over the full operating temperature range. Force and sense connections to the reference inputs minimize external voltage drops.
The AD876 can be placed into a standby mode of operation
reducing the power below 50 mW. The AD876’s digital I/O
interfaces to either +5 V or +3.3 V logic. Digital output pins
can be placed in a high impedance state; the format of the output is straight binary coding.
The AD876’s speed, resolution and single-supply operation
ideally suit a variety of applications in video, multimedia, imaging, high speed data acquisition and communications. The
AD876’s low power and single-supply operation satisfy requirements for high speed portable applications. Its speed and resolution ideally suit charge coupled device (CCD) input systems
such as color scanners, digital copiers, electronic still cameras
and camcorders.
SHA
DRVDD
GAIN
SHA
REFTF
GAIN
STBY
A/D
AIN
A/D
D/A
A/D
D/A
A/D
D/A
THREESTATE
REFTS
CORRECTION LOGIC
REFBS
REFBF
AD876
OUTPUT BUFFERS
(MSB)
D9
D0
(LSB)
CML
PRODUCT DESCRIPTION
DVDD
AVSS
DVSS
DRVSS
The AD876 comes in a space saving 28-lead SOIC and 48-lead
thin quad flatpack (TQFP) and is specified over the commercial
(0°C to +70°C) temperature range.
PRODUCT HIGHLIGHTS
Low Power
The AD876 at 160 mW consumes a fraction of the power of
presently available 8- or 10-bit, video speed converters. Powerdown mode and single-supply operation further enhance its
desirability in low power, battery operated applications such
as electronic still cameras, camcorders and communication
systems.
Very Small Package
The AD876 comes in a 28-lead SOIC, 28-lead SSOP, and 48lead surface mount, thin quad flat package. The TQFP package
is ideal for very tight, low headroom designs.
Digital I/O Functionality
The AD876 offers three-state output control.
Pin Compatible Upgrade Path
The AD876 offers the option of laying out designs for eight
bits and migrating to 10-bit resolution if prototype results
warrant.
REV. B
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties
which may result from its use. No license is granted by implication or
otherwise under any patent or patent rights of Analog Devices.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781/329-4700
World Wide Web Site: http://www.analog.com
Fax: 781/326-8703
© Analog Devices, Inc., 1998
AD876* PRODUCT PAGE QUICK LINKS
Last Content Update: 02/23/2017
COMPARABLE PARTS
DESIGN RESOURCES
View a parametric search of comparable parts.
• AD876 Material Declaration
• PCN-PDN Information
DOCUMENTATION
• Quality And Reliability
Application Notes
• Symbols and Footprints
• AN-297: Test Video A/D Converters Under Dynamic
Conditions
DISCUSSIONS
Data Sheet
View all AD876 EngineerZone Discussions.
• AD876: 10-Bit 20 MSPS 160 mW CMOS A/D Converter
Data Sheet
REFERENCE MATERIALS
Technical Articles
• Correlating High-Speed ADC Performance to Multicarrier
3G Requirements
SAMPLE AND BUY
Visit the product page to see pricing options.
TECHNICAL SUPPORT
Submit a technical question or find your regional support
number.
• DNL and Some of its Effects on Converter Performance
• MS-2210: Designing Power Supplies for High Speed ADC
DOCUMENT FEEDBACK
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This page is dynamically generated by Analog Devices, Inc., and inserted into this data sheet. A dynamic change to the content on this page will not
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(TMIN to T MAX with AVDD = +5.0 V, DVDD = +5.0 V, DRVDD = +3.3 V, VREFB = +4.0 V, VREFB =
CLOCK = 20 MSPS, unless otherwise noted)
AD876–SPECIFICATIONS +2.0 V, f
Parameter
Min
RESOLUTION
Input Capacitance
POWER SUPPLIES
Operating Voltage
AVDD 1
DVDD1
DRVDD
Operating Current
IAVDD
IDVDD
IDRVDD
3.5
1.6
Max
Units
Bits
± 1.0
± 0.5
±1
GUARANTEED
0.4
0.2
LSB
LSB
% FSR
% FSR
2
2
V p-p
5.0
5.0
pF
4.0
2.0
250
8.0
35
35
4.5
2.5
3.5
1.6
4.0
2.0
250
8.0
35
35
4.5
2.5
V
V
Ω
mA
mV
mV
7.4
7.8
7.8
7.5
8.2
9.0
9.0
8.2
Bits
Bits
Bits
46
49
49
47
51
56
56
51
dB
dB
dB
–62
–62
–60
–65
150
0.5
1
+4.5
+4.5
+3.0
POWER CONSUMPTION
TEMPERATURE RANGE
Specified
AD876
Typ
10
± 0.3
± 1.0
± 0.1
± 0.75
GUARANTEED
0.1
0.1
ANALOG INPUT
Input Range
DYNAMIC PERFORMANCE
Effective Number of Bits
fIN = 1 MHz
fIN = 3.58 MHz
fIN = 10 MHz
Signal-to-Noise and Distortion (S/N+D) Ratio
fIN = 1 MHz
fIN = 3.58 MHz
fIN = 10 MHz
Total Harmonic Distortion (THD)
fIN =1 MHz
fIN = 3.58 MHz
fIN =10 MHz
Spurious Free Dynamic Range2
Full Power Bandwidth
Differential Phase
Differential Gain
Min
8
DC ACCURACY
Integral Nonlinearity (INL)
Differential Nonlinearity (DNL)
No Missing Codes
Offset Error
Gain Error
REFERENCE INPUT
Reference Top Voltage
Reference Bottom Voltage
Reference Input Resistance
Reference Input Current
Reference Top Offset
Reference Bottom Offset
AD876JR-8
Typ
Max
–62
–62
–60
–65
150
0.5
1
–56
+5.25
+5.25
+5.25
+4.5
+4.5
+3.0
–56
dB
dB
dB
dB
MHz
Degree
%
+5.25
+5.25
+5.25
Volts
Volts
Volts
20
12
0.1
25
16
1
20
12
0.1
25
16
1
mA
mA
mA
160
190
160
190
mW
+70
°C
0
+70
0
NOTES
1
AVDD and DV DD must be within 0.5 V of each other to maintain specified performance levels.
2
3.58 MHz Input Frequency.
Specifications subject to change without notice. See Definition of Specifications for additional information.
–2–
REV. B
AD876
(TMIN to TMAX with AV DD = +5.0 V, DV DD = +5.0 V, DRVDD = +3.3 V, V REFT = +4.0 V, VREFB = +2.0 V,
CLOCK = 20 MSPS, CL = 20 pF unless otherwise noted)
DIGITAL SPECIFICATIONS f
Parameter
Symbol
DRVDD
Min
LOGIC INPUT
High Level Input Voltage
VIH
2.4
4.0
4.2
Low Level Input Voltage
VIL
High Level Input Current
Low Level Input Current
Low Level Input Current (CLK Only)
Input Capacitance
IIH
IIL
IIL
CIN
3.0
5.0
5.25
3.0
5.0
5.25
5.0
5.0
5.0
AD876
Typ
0.6
1.0
1.05
+10
+50
+10
–10
–50
–10
5
LOGIC OUTPUTS
High Level Output Voltage
(IOH = 50 µA)
VOH
(IOH = 0.5 mA)
Low Level Output Voltage
(IOL = 50 µA)
VOL
3.0
5.0
5.0
2.4
3.8
2.4
0.7
1.05
0.4
–10
Symbol
Min
V
V
V
V
V
V
µA
µA
µA
pF
10
V
V
V
pF
µA
Max
Units
5
COUT
IOZ
Units
V
V
V
3.6
5.25
5.25
(IOL = 0.6 mA)
Output Capacitance
Output Leakage Current
Max
Specifications subject to change without notice.
TIMING SPECIFICATIONS
Maximum Conversion Rate1
Clock Period
Clock High
Clock Low
Output Delay
Pipeline Delay (Latency)
Aperture Delay Time
Aperture Jitter
Typ
20
tC
tCH
tCL
tOD
50
25
25
20
23
23
10
3.5
4
22
NOTE
1
Conversion rate is operational down to 10 kHz without degradation in specified performance.
SAMPLE N
SAMPLE N+1
SAMPLE N+2
AIN
t CH
t CL
CLK
t OD
tC
OUT
DATA N-4
DATA N-3
DATA N-2
DATA N-1
Figure 1. Timing Diagram
REV. B
–3–
DATA N
MHz
ns
ns
ns
ns
Clock Cycles
ns
ps
AD876
PIN FUNCTION DESCRIPTIONS
SOIC
Pin No.
TQFP
Pin No.
D0 (LSB)
D1–D4
D5–D8
D9 (MSB)
THREESTATE
3
4–7
8–11
12
16
STBY
Symbol
Type
Name and Function
1
2–5
8–11
12
23
DO
DO
17
24
DI
CLK
CML
REFTF
REFBF
REFTS
REFBS
AIN
AVDD
AVSS
DVDD
DVSS
DRVDD
15
26
22
24
21
25
27
28
1
18
14, 19, 20
2
22
38
30
34
29
35
39
42
44
26
17, 27, 28
45
DI
AO
AI
AI
AI
AI
AI
P
P
P
P
P
DRVSS
13
16
P
Least Significant Bit.
Data Bits 1 through 4.
Data Bits 5 through 8.
Most Significant Bit.
THREE-STATE = LOW
THREE-STATE = HIGH
or N/C
Normal Operating Mode
High Impedance Outputs
STBY = LOW or N/C
STBY = HIGH
Normal Operating Mode
Standby Mode
Clock Input.
Bypass Pin for an Internal Bias Point.
Reference Top Force.
Reference Bottom Force.
Reference Top Sense.
Reference Bottom Sense.
Analog Input.
+5 V Analog Supply.
Analog Ground.
+5 V Digital Supply.
Digital Ground.
+3.3 V/+5 V Digital Supply. Supply for digital
input and output buffers.
+3.3 V/+5 V Digital Ground. Ground for digital
input and output buffers.
DO
DI
Type: AI = Analog Input; AO = Analog Output; DI = Digital Input; DO = Digital Output; P = Power.
PIN CONFIGURATIONS
AIN
CML
AVSS
AVDD
TQFP
DRVDD
SOIC/SSOP
AVSS
1
28 AVDD
DRVDD
2
27 AIN
*D0
3
26 CML
D0 1
36
*D1
4
25 REFBS
D1 2
35 REFBS
D2
5
24 REFBF
D2 3
34 REFBF
D3
6
23 NC
D3 4
33
D4
7
22 REFTF
D4 5
D5
8
21 REFTS
6
AD876
D6
9
20 DVSS
7
TOP VIEW
(Not to Scale)
D7 10
19 DVSS
D5 8
29 REFTS
D8 11
18 DVDD
D6 9
28 DV
SS
27 DV
SS
41 40 39 38 37
32
31
30 REFTF
17 STBY
D7 10
16 THREE-STATE
D8 11
26 DV
DD
15 CLK
D9 12
25
–4–
STBY
DRVSS
FOR THE AD876JR-8
NC = NO CONNECT
CLK
13 14 15 16 17 18 19 20 21 22 23 24
* PINS D0 AND D1 ARE LEFT OPEN
THREE-STATE
DVSS 14
TOP VIEW
(Not to Scale)
DVSS
D9 12
DRVSS 13
AD876
48 47 46 45 44 43 42
REV. B
AD876
ORDERING GUIDE
ABSOLUTE MAXIMUM RATINGS*
Parameter
With Respect to Min
Max Units
AVDD
DVDD, DRVDD
AVSS
AIN
REFTS, REFTF
REFBS, REFBF
Digital Inputs, CLK
Junction Temperature
Storage Temperature
Lead Temperature
(10 sec)
AVSS
DVSS, DRVSS
DVSS, DRVSS
AVSS
–0.5
–0.5
–0.5
–0.5
+6.5
+6.5
+0.5
+6.5
Volts
Volts
Volts
Volts
AVSS
DVSS, DRVSS
–0.5
–0.5
+6.5
+6.5
+150
+150
Volts
Volts
°C
°C
–65
Temperature
Range
Model
Package
Description
28-Lead SOIC
48-Lead TQFP
(Tape and Reel 13")
0°C to +70°C
28-Lead SOIC
–40°C to +85°C 28-Lead SOIC
–40°C to +85°C 28-Lead SSOP
0°C to +70°C
28-Lead SSOP
0°C to +70°C
28-Lead SSOP
Package
Options
AD876JR
0°C to +70°C
AD876JST-Reel 0°C to +70°C
R-28
ST-48
AD876JR-8
AD876AR
AD876ARS
AD876JRS
AD876JRS-8
R-28
R-28
RS-28
RS-28
RS-28
+300 °C
*Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the
device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum
ratings for extended periods may effect device reliability.
DVDD
DRVDD
DVDD
DVDD
DRVDD
DRVDD
DVSS
DVSS
DVSS
a) D0–D9
DVSS
DRVSS
DRVSS
DRVSS
b) Three-State, Standby
c) CLK
AVDD
REFTF
AVDD
AVDD
AVSS
INTERNAL
REFERENCE
VOLTAGE
REFTS
AVSS
AVSS
AVDD
d) AIN
INTERNAL
REFERENCE
VOLTAGE
REFBS
AVDD
AVSS
REFBF
AVSS
Figure 2. Equivalent Circuits
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection.
Although the AD876 features proprietary ESD protection circuitry, permanent damage may
occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD
precautions are recommended to avoid performance degradation or loss of functionality.
REV. B
–5–
WARNING!
ESD SENSITIVE DEVICE
AD876–Typical Performance Characteristics
1
0
–10
–20
0.5
–40
dB
DNL – LSBs
–30
0
–50
THD
–60
2ND
–0.5
–70
3RD
–80
–1
0
–90
64 128 192 256 320 384 448 512 576 640 704 768 832 896 960
10
1
CODE OFFSET
FREQUENCY – MHz
Figure 6. THD vs. Input Frequency 2nd, 3rd Harmonics
2
60
0
55
–2
50
–4
dB
GAIN – dB
Figure 3. AD876 Typical DNL
45
–6
40
–8
35
–10
1
10
100
30
1000
5
10
FREQUENCY – MHz
Figure 4. Full Power Bandwidth
15
20
CLOCK FREQUENCY – MHz
25
30
Figure 7. SINAD vs. CLK Frequency (AIN = –0.5 dB)
180
60
170
55
160
150
mW
dB
50
45
140
130
40
120
35
30
100
110
100
101
INPUT FREQUENCY – MHz
102
0
5
10
15
CLOCK FREQUENCY – MHz
20
25
Figure 8. Power Consumption vs. Sample Rate
Figure 5. SINAD vs. Input Frequency
(fCLK = 20 MSPS, AIN = –0.5 dB)
–6–
REV. B
AD876
PIPELINE DELAY (LATENCY)
1
2ND
3RD
4TH
5TH
The number of clock cycles between conversion initiation and
the associated output data being made available. New output
data is provided every clock cycle.
HARMONICS (dBc)
–68.02
6TH –77.74
–72.85
7TH –75.62
–70.68
8TH –75.98
–78.09
9TH –81.20
REFERENCE TOP/BOTTOM OFFSET
THD = –64.12
SNR = 48.73
SINAD = 48.61
SFDR = –68.02
2
3
6
9
8
Resistance between the reference input and comparator input
tap points causes offset errors. These errors can be nulled out
by using the force-sense connection as shown in the Reference
Input section.
4
7
5
THEORY OF OPERATION
Figure 9. AD876JR-8 Typical FFT (fIN = 3.58 MHz,
AIN = –0.5 dB, fCLOCK = 20 MSPS)
1
2ND
3RD
4TH
5TH
HARMONICS (dBc)
–68.91
6TH –80.55
–73.92
7TH –82.02
–68.67
8TH –81.02
–73.26
9TH –88.94
THD = –64.24
SNR = 55.71
SINAD = 55.14
SFDR = –68.67
APPLYING THE AD876
DRIVING THE ANALOG INPUT
5
3
6
2
8
9
4
7
Figure 10. AD876 Typical FFT (fIN = 3.58 MHz, AIN = –0.5 dB,
fCLOCK = 20 MSPS)
DEFINITIONS OF SPECIFICATIONS
INTEGRAL NONLINEARITY (INL)
Integral nonlinearity refers to the deviation of each individual
code from a line drawn from “zero” through “full scale”. The
point used as “zero” occurs 1/2 LSB before the first code transition. “Full scale” is defined as a level 1 1/2 LSB beyond the last
code transition. The deviation is measured from the center of
each particular code to the true straight line.
DIFFERENTIAL NONLINEARITY (DNL, NO MISSING
CODES)
An ideal ADC exhibits code transitions that are exactly 1 LSB
apart. DNL is the deviation from this ideal value. It is often
specified in terms of the resolution for which no missing codes
(NMC) are guaranteed.
OFFSET ERROR
The first transition should occur at a level 1/2 LSB above
“zero.” Offset is defined as the deviation of the actual first code
transition from that point.
GAIN ERROR
The first code transition should occur for an analog value 1/2 LSB
above nominal negative full scale. The last transition should
occur for an analog value 1 1/2 LSB below the nominal positive
full scale. Gain error is the deviation of the actual difference
between first and last code transitions and the ideal difference
between the first and last code transitions.
REV. B
The AD876 implements a pipelined multistage architecture to
achieve high sample rate with low power. The AD876 distributes the conversion over several smaller A/D subblocks, refining
the conversion with progressively higher accuracy as it passes
the results from stage to stage. As a consequence of the distributed conversion, the AD876 requires a small fraction of the 1023
comparators used in a traditional flash type A/D. A sample-andhold function within each of the stages permits the first stage to
operate on a new input sample while the second and third stages
operate on the two preceding samples.
Figure 11 shows the equivalent analog input of the AD876, a
sample-and-hold amplifier (SHA). Bringing CLK to a logic low
level closes Switches 1 and 2 and opens Switch 3. The input
source connected to AIN must charge capacitor CH during this
time. When CLK transitions from logic “low” to logic “high,”
Switch 1 opens first, placing the SHA in hold mode. Switch 2
opens subsequently. Switch 3 then closes, connects the feedback loop around the op amp, and forces the output of the op
amp to equal the voltage stored on CH. When CLK transitions
from logic “high” to logic “low”, Switch 3 opens first. Switch 2
closes and reconnects the input to CH. Finally, Switch 1 closes
and places the SHA in track mode.
The structure of the input SHA places certain requirements on
the input drive source. The combination of the pin capacitance,
CP, and the hold capacitance, CH, is typically less than 5 pF.
The input source must be able to charge or discharge this capacitance to 10-bit accuracy in one half of a clock cycle. When
the SHA goes into track mode, the input source must charge or
discharge capacitor CH from the voltage already stored on CH
(the previously captured sample) to the new voltage. In the
worst case, a full-scale voltage step on the input, the input
source must provide the charging current through the RON (50 Ω)
of Switch 2 and quickly settle (within 1/2 CLK period). This
situation corresponds to driving a low input impedance. On the
other hand, when the source voltage equals the value previously
stored on CH , the hold capacitor requires no input current and
the equivalent input impedance is extremely high.
Adding series resistance between the output of the source and
the AIN pin reduces the drive requirements placed on the
source. Figure 12 shows this configuration. The bandwidth of
the particular application limits the size of this resistor. To
maintain the performance outlined in the data sheet specifications, the resistor should be limited to 200 Ω or less. For applications with signal bandwidths less than 10 MHz, the user may
increase the size of the series resistor proportionally. Alternatively, adding a shunt capacitance between the AIN pin and
–7–
AD876
analog ground can lower the ac source impedance. The value
of this capacitance will depend on the source resistance and the
required signal bandwidth.
The input span of the AD876 is a function of the reference
voltages. For more information regarding the input range, see
the DRIVING THE REFERENCE TERMINALS section of
the data sheet.
3
AD876
1
AIN
2
CH
CP
Figure 11. AD876 Equivalent Input Structure
< < 200V
AIN
20 kHz. At a sample clock frequency of 20 MHz, the dc bias
current at 3 V dc is approximately 30 µA. If we choose R2 equal
to 1 kΩ and R1 equal to 50 Ω, the parallel capacitance should
be a minimum of 0.008 µF to avoid attenuating signals close to
20 kHz. Note that the bias current will cause a 31.5 mV offset
from the 3 V bias.
In systems that must use dc-coupling, use an op amp to levelshift a ground-referenced signal to comply with the input
requirements of the AD876. Figure 14 shows an AD817
configured in inverting mode with ac signal gain of –1. The dc
voltage at the noninverting input of the op amp controls the
amount of dc level shifting. A resistive voltage divider attenuates the REFBF signal. The op amp then multiplies the attenuated signal by 2. In the case where REFBF = 1.6 V, the dc
output level will be 2.6 V. The AD817 is a low cost, fast settling,
single supply op amp with a G = –1 bandwidth of 29 MHz. The
AD818 is similar to the AD817 but has a 50 MHz bandwidth.
Other appropriate op amps include the AD8011, AD812 (a dual),
and the AD8001.
VS
Rf = 4.99kV
+VCC
0.1mF
Figure 12. Simple AD876 Drive Requirements
In many cases, particularly in single-supply operation, accoupling offers a convenient way of biasing the analog input
signal at the proper signal range. Figure 13 shows a typical
configuration for ac-coupling the analog input signal to the
AD876. Maintaining the specifications outlined in the data
sheet requires careful selection of the component values. The
most important concern is the f -3 dB high-pass corner that is a
function of R2, and the parallel combination of C1 and C2.
The f -3 dB point can be approximated by the equation
f −3 dB =
1
[2 × π × ( R2) Ceq ]
where Ceq is the parallel combination of C1 and C2. Note that
C1 is typically a large electrolytic or tantalum capacitor that
becomes inductive at high frequencies. Adding a small ceramic
or polystyrene capacitor on the order of 0.01 µF that does not
become inductive until negligibly higher frequencies maintains
a low impedance over a wide frequency range.
AD876
NC
0Vdc
2V p-p
RIN = 4.99kV
AD817 OR
AD818
3kV
AIN
REFBF
14.7kV
NC
Figure 14. Bipolar Level Shift
An integrated difference amplifier such as the AD830 is an
alternate means of providing dc level shifting. The AD830
provides a great deal of flexibility with control over offset and
gain. Figure 15 shows the AD830 precisely level-shifting a
unipolar, ground-referenced signal. The reference voltage,
REFBS, determines the amount of level-shifting. The ac gain
is 1. The AD830 offers the advantages of high CMRR, precise
gain, offset, and high-impedance inputs when compared with a
discrete implementation. For more information regarding the
AD830, see the AD830 data sheet.
+12V
R1
C1
VIN
AD876
0.1
2V
AIN
R2
C2
3V
VB +2V
0
VB
IB
VBIAS
VB
Figure 13. AC-Coupled Inputs
There are additional considerations when choosing the resistor
values. The ac-coupling capacitors integrate the switching
transients present at the input of the AD876 and cause a net dc
bias current, IB, to flow into the input. The magnitude of this
bias current increases with increasing dc signal level and also
increases with sample frequency. This bias current will result in
an offset error of (R1 + R2) × IB. If it is necessary to compensate this error, consider making R2 negligibly small or modifying VBIAS to account for the resultant offset.
As an example, assume that the input to the AD876 must have
a dc bias of 3 V and the minimum expected signal frequency is
AD876
AIN
AD830
0.1
–12V
REFBS
Figure 15. Level Shifting with the AD830
REFERENCE INPUT DRIVING THE REFERENCE
TERMINALS
The AD876 requires an external reference on pins REFTF and
REFBF. The AD876 provides reference sense pins, REFTS
and REFBS, to minimize voltage drops caused by external and
internal wiring resistance. A resistor ladder, nominally 250 Ω,
connects pins REFTF and REFBF.
–8–
REV. B
AD876
Figure 16 shows the equivalent input structure for the AD876
reference pins. There is approximately 5 Ω of resistance between
both the REFTF and REFBT pins and the reference ladder. If
the force-sense connections are not used, the voltage drop
across the 5 Ω resistors will result in a reduced voltage appearing across the ladder resistance. This reduces the input span of
the converter. Applying a slightly larger span between the REFTF
and REFBF pins compensates this error. Note that the temperature coefficients of the 5 Ω resistors are 1350 ppm. The
user should consider the effects of temperature when not using
a force-sense reference configuration.
AD876
5V
REFTF
REFTS
V1
CLK
RLADDER
250V
DACS
REFBS
V2
C (VIN)
CLK
5V
REFBF
Figure 16. AD876 Equivalent Reference Structure
Do not connect the REFTS and REFBS pins in configurations
that do not use a force-sense reference. Connecting the force
and sense lines together allows current to flow in the sense lines.
Any current allowed to flow through these lines must be negligibly small. Current flow causes voltage drops across the resistance in the sense lines. Because the internal D/As of the
AD876 tap different points along the sense lines, each D/A
would receive a slightly different reference voltage if current
were flowing in these wires. To avoid this undesirable condition,
leave the sense lines unconnected. Any current allowed to flow
through these lines must be negligibly small (<100 µA).
ance changes associated with the reference inputs. The simplified diagram of Figure 16 shows that the reference pins connect
to a capacitor for one-half of the clock period. The size of the
capacitor is a function of the analog input voltage.
The external reference must be able to maintain a low impedance over all frequencies of interest in order to provide the charge
required by the capacitance. By supplying the requisite charge,
the reference voltages will be relatively constant and performance will not degrade. For some reference configurations,
voltage transients will be present on the reference lines; this
is particularly true during the falling edge of CLK. It is important that the reference recovers from the transients and settles to
the desired level of accuracy prior to the rising edges of CLK.
There are several reference configurations suitable for the
AD876 depending on the application, desired level of accuracy,
and cost trade-offs. The simplest configuration, shown in Figure 18, utilizes a resistor string to generate the reference voltages from the converter’s analog power supply. The 0.1 µF
bypass capacitors effectively reduce high-frequency transients.
The 10 µF capacitors act to reduce the impedances at the
REFTF and REFBF pins at lower frequencies. As input frequencies approach dc, the capacitors become ineffective, and
small voltage deviations will appear across the biasing resistors.
This application can maintain 10-bit accuracy for input frequencies above approximately 200 Hz. 8-bit applications can use this
circuit for input frequencies above approximately 50 Hz.
AD876
140V (61%)
10mF
(1.6, 4.5)
(2.5, 4.5)
(1.6, 3.5)
(2.5, 3.5)
REFTF, REFTS
4.5
4.0
3.5
REFBF
0.1mF
NC
REFBS
NC = NO CONNECT
Figure 18. Low Cost Reference Circuit
This reference configuration provides the lowest cost but has
several disadvantages. These disadvantages include poor dc
power supply rejection and poor accuracy due to the variability
of the internal and external resistors.
The AD876 offers force-sense reference connections to eliminate the voltage drops associated with the internal connections
to the reference ladder. Figure 19 shows a suggested circuit
using an AD826 dual, high speed op amp. This configuration
uses 3.6 V and 1.6 V reference voltages for REFT and REFB,
respectively. The connections shown in Figure 19 configure the
op amps as voltage followers.
3.0
Figure 17. AD876 Reference Ranges
While the previous issues address the dc aspects of the AD876
reference, the user must also be aware of the dynamic impedREV. B
2V
10mF
2.5
1.5
2.0
2.5
REFBF, REFBS
250V
(615%)
250V (61%)
3.0
1.0
REFTF
0.1mF
10mF
Input Span (V ) = REFTS – REFBS
The user has flexibility in determining both the full-scale span of
the analog input and where to center this voltage. Figure 17
shows the range over which the AD876 can operate without
degrading the typical performance.
4V
+5V
The voltage drop across the internal resistor ladder determines
the input span of the AD876. The driving voltages required at
the V1 and V2 points are respectively +4 V and +2 V. Calculate
the full-scale input span from the equation
This results in a full-scale input span of approximately +2 V
when REFTS = +4 V and REFBS = +2 V In order to maintain
the requisite 2 V drop across the internal ladder, the external
reference must be capable of providing approximately 8.0 mA.
REFTS
NC
–9–
AD876
common ground, are effectively removed by the AD876’s high
common-mode rejection.
C3
0.1mF
AD876
High frequency noise sources, VN1 and VN2, are shunted to
ground by decoupling capacitors. Any voltage drops between
the analog input ground and the reference bypassing points will
be treated as input signals by the converter via the reference
inputs. Consequently, the reference decoupling capacitors
should be connected to the same analog ground point used to
define the analog input voltage. (For further suggestions, see
the “Grounding and Layout Rules” section of the data sheet.)
REFTS
+5V
6
REFT
8
5
C4
0.1mF
7
REFTF
1/2
AD826
C2
0.1mF
REFBS
C5
0.1mF
2
6
REFB
REFBF
3
1/2
AD826
C1
0.1mF
4
4V
VN1
REFTF
AD876
Figure 19. Kelvin Connected Reference Using the AD826
REFBF
By connecting the op amp feedback through the sense connections of the AD876, the outputs of the op amps automatically
adjust to compensate for the voltage drops that occur within
the converter. The AD826 has the advantage of being able to
maintain stability while driving unlimited capacitive loads. As a
result, 0.1 µF capacitors C1, C2, and C3 can connect directly
to the outputs of the op amps. These decoupling capacitors
reduce high frequency transients. Capacitors C4 and C5 shunt
across the internal resistors of the force sense connections and
prevent instability.
2V
VN2
AIN
Figure 21. Recommended Bypassing for the Reference
Inputs
CLOCK INPUT
This configuration provides excellent performance and a minimal number of components. The circuit also offers the advantage of operating from a single +5 V supply. While alternative
op amps may also be suitable, consider the stability of these op
amps while driving capacitive loads.
The AD876 clock input is buffered internally with an inverter
powered from the DRVDD pin. This feature allows the AD876
to accommodate either +5 V or +3.3 V CMOS logic input signal swings with the input threshold for the CLK pin nominally
at DRVDD /2.
The circuit shown in Figure 20 allows a wider selection of op
amps when compared with the previous configuration. An
The AD876’s pipelined architecture operates on both rising and
falling edges of the input clock. To minimize duty cycle variations the recommended logic family to drive the clock input is
high speed or advanced CMOS (HC/HCT, AC/ACT) logic.
CMOS logic provides both symmetrical voltage threshold levels
and sufficient rise and fall times to support 20 MSPS operation.
The AD876 is designed to support a conversion rate of 20 MSPS;
running the part at slightly faster clock rates may be possible,
although at reduced performance levels. Conversely, some
slight performance improvements might be realized by clocking
the AD876 at slower clock rates.
AD876
20kV
REFTS
47nF
22mF
10V
REFTF
REFT
1/2
OP-295
10mF
0.1mF
20kV
REFBS
47nF
The power dissipated by the correction logic and output buffers
is largely proportional to the clock frequency; running at reduced
clock rates provides a reduction in power consumption. Figure
8 illustrates this trade-off.
10V
REFBF
REFB
1/2
OP-295
10mF
0.1mF
DIGITAL INPUTS AND OUTPUTS
Figure 20. Kelvin Connected Reference Using the OP295
OP295 dual, single-supply op amp provides stable 3.6 V and
1.6 V reference voltages. The AD822 dual op amp is also suitable for single-supply applications. Each half of the OP295 is
compensated to drive the 10 µF and 0.1 µF decoupling capacitors at the REFTF and REFBF pins and maintain stability.
Like any high resolution converter, the layout and decoupling of
the reference is critical. The actual voltage digitized by the
AD876 is relative to the reference voltages. In Figure 21, for
example, the reference return and the bypass capacitors are
connected to the shield of the incoming analog signal. Disturbances in the ground of the analog input, that will be commonmode to the REFT, REFB, and AIN pins because of the
Each of the AD876 digital control inputs, THREE-STATE and
STBY, has an input buffer powered from the DRVDD supply
pins. With DRVDD set to +5 V, all digital inputs readily interface with +5 V CMOS logic. For interfacing with lower voltage
CMOS logic, DRVDD can be set to 3.3 V, effectively lowering
the nominal input threshold of all digital inputs to 3.3 V/2 =
1.65 V.
The format of the digital output is straight binary. Table I shows
the output format for the case where REFTS = 4 V and REFBS
= 2 V.
–10–
REV. B
AD876
Table I. Output Data Format
Approx.
AIN (V)
THREE- DATA
STATE D9 D8 D7 D6 D5 D4 D3 D2 D1 D0
>4
4
3
2
<2
0
0
0
0
0
1
1
1
0
0
1
1
0
0
0
1
1
0
0
0
1
1
0
0
0
1
1
0
0
0
1
1
0
0
0
1
1
0
0
0
1
1
0
0
0
1
1
0
0
0
1
1
0
0
0
X
1
Z
Z
Z
Z
Z
Z
Z
Z
Z
Z
For DRVDD = 5 V, the AD876 output signal swing is compatible with both high speed CMOS and TTL logic families. For
TTL, the AD876 on-chip, output drivers were designed to
support several of the high speed TTL families (F, AS, S). For
applications where the clock rate is below 20 MSPS, other TTL
families may be appropriate. For interfacing with lower voltage
CMOS logic, the AD876 sustains 20 MSPS operation with
DRVDD = 3.3 V. In all cases, check your logic family data
sheets for compatibility with the AD876 Digital Specification
table.
THREE-STATE OUTPUTS
A low power mode feature is provided such that for STBY =
HIGH and the clock disabled, the static power of the AD876
will drop below 50 mW.
The digital outputs of the AD876 can be placed in a high impedance state by setting the THREE-STATE pin to HIGH.
This feature is provided to facilitate in-circuit testing or
evaluation. Note that this function is not intended for enabling/
disabling the ADC outputs from a bus at 20 MSPS. Also, to
avoid corruption of the sampled analog signal during conversion
(3.5 clock cycles), it is highly recommended that the AD876
outputs be enabled on the bus prior to the first sampling. For
the purpose of budgetary timing, the maximum access and float
delay times (tDD, tHL shown in Figure 15) for the AD876 are
150 ns.
GROUNDING AND LAYOUT RULES
As is the case for any high performance device, proper grounding and layout techniques are essential in achieving optimal
performance. The analog and digital grounds on the AD876
have been separated to optimize the management of return
currents in a system. It is recommended that a printed circuit
board (PCB) of at least 4 layers employing a ground plane and
power planes be used with the AD876. The use of ground and
power planes offers distinct advantages:
1. The minimization of the loop area encompassed by a signal
and its return path.
THREE-STATE
2. The minimization of the impedance associated with ground
and power paths.
D0–D9
t DD
ACTIVE
3. The inherent distributed capacitor formed by the power
plane, PCB insulation, and ground plane.
HIGH IMPEDANCE
Figure 22. High-Impedance Output Timing Diagram
These characteristics result in both a reduction of electromagnetic interference (EMI) and an overall improvement in
performance.
It is important to design a layout which prevents noise from
coupling onto the input signal. Digital signals should not be run
in parallel with the input signal traces and should be routed
away from the input circuitry. Separate analog and digital
grounds should be joined together directly under the AD876. A
solid ground plane under the AD876 is also acceptable if the
power and ground return currents are managed carefully. A
general rule of thumb for mixed signal layouts dictates that the
return currents from digital circuitry should not pass through
critical analog circuitry. For further layout suggestions, see the
AD876 Evaluation Board data sheet.
DIGITAL OUTPUTS
Each of the on-chip buffers for the AD876 output bits (D0–D9)
is powered from the DRVDD supply pins, separate from AVDD or
DVDD. The output drivers are sized to handle a variety of logic
families while minimizing the amount of glitch energy generated. In all cases, a fan-out of one is recommended to keep the
capacitive load on the output data bits below the specified 20 pF
level.
REV. B
t HL
–11–
AD876
TP3
TP4
1
U4
74F04
+5VD
STBY
VP6
+5VD
C50
10mF
JP4
4
3ST
VP5
CLK_IN
TP1
R1
51V
JP1
U1
AD876
15
JP2
1
19
9
8
7
6
5
4
3
2
14
CLK
DVSS
13
3_STATE DRVSS
12 9
17 STBY
DB9
18 DVDD
DB8 11 8
16
C62
0.1mF
19 SUBST
REFTS
VP3
20 NC
21 REFTS
REFTS
22 REFTF
NC
23
REFBF
24
REFBS
25
CML
26 AIN
REFTF
REFBF
REFBS
27 AVDD
VP4
REFBS
REFTF
VP1
28
REFBF
VP2
J1
3
+
VP8
2
U4
74F04
5
6
7
8
9
DB7 10 7
DB6 9 6
DB5 8
DB4 7
DB3
5
3
5
2
4
1
DRVDD 3
2
AV
0
DB1
DB0
0
1
2
3
4
SS
1
C64
0.1mF
1
19
9
8
7
6
5
4
3
2
G1
G2
A7
A6
A5
A4
A3
A2
A1
A0
R16
1kV
R17
1.13kV
DC_IN
EXT_CM 2
D7 R4*
D6 R5*
D5 R6*
D4 R7*
D3 R8*
D2 R9*
Y7
Y6
Y5
Y4
Y3
Y2
Y1
Y0
11
12
13
14
15
16
17
18
D0 R11*
D0
D1
D2
D3
D4
R12*
P1
1
P1
2
P1
3
P1
4
P1
5
P1
6
P1
7
P1
8
P1
9
P1 10
P1 11
P1 12
P1 13
P1 14
P1 15
P1 16
P1 17
P1 18
P1 19
P1 20
P1 21
P1 22
P1 23
P1 24
P1 25
P1 26
P1 27
P1 28
P1 29
P1 30
P1 31
P1 32
P1 33
P1 34
P1 35
P1 36
P1 37
P1 38
P1 39
P1 40
+
+
C2
10mF
+5VD
C49
10mF
+5VA
*R2–R12 = 20V
C54
0.1mF
R18
1kV
R14
100V
D5
D6
D7
D8
D9
D1 R10*
C56
0.1mF
+
D8 R3*
U3
74ALS541
C4
10mF
D9 R2*
4
6
DB2
U2
74ALS541
G1
G2 Y7 11
A7 Y6 12
A6 Y5 13
A5 Y4 14
A4 Y3 15
A3 Y2 16
A2 Y1 17
A1 Y0 18
A0
3 INT_CM
JP5
1
TP2
R15
51V
C1
0.1mF
TP18
+
AIN
J2
C3
47mF
Figure 23. AD876 Evaluation Board Schematic
–12–
REV. B
AD876
Figure 24. Silkscreen Layer, Component Side PCXB Layout
Figure 25. Silkscreen Layer, Circuit Side PCB Layout
REV. B
–13–
AD876
Figure 26. Component Side PCB Layout
Figure 27. Circuit Side PCB Layout
–14–
REV. B
AD876
Figure 28. Ground Layer PCB Layout
REV. B
Figure 29. Power Layer PCB Layout
–15–
AD876
OUTLINE DIMENSIONS
Dimensions shown in inches and (mm).
R-28
28-Lead Wide Body (SOIC)
1
14
0.1043 (2.65)
0.0926 (2.35)
PIN 1
0.0118 (0.30)
0.0040 (0.10)
0.4193 (10.65)
0.3937 (10.00)
15
0.2992 (7.60)
0.2914 (7.40)
28
C1991a–0–1/98
0.7125 (18.10)
0.6969 (17.70)
0.0500
(1.27)
BSC
0.0192 (0.49)
0.0138 (0.35)
0.0291 (0.74)
x 45°
0.0098 (0.25)
SEATING 0.0125 (0.32)
PLANE 0.0091 (0.23)
0.0500 (1.27)
0.0157 (0.40)
8°
0°
ST-48
28-Lead Plastic Thin Quad Flatpack (TQFP)
0.059 +0.008 –0.004
(1.50 +0.2 –0.1)
0.354 ± 0.008 (9.00 ± 0.2) SQ
0.055 ± 0.002
(1.40 ± 0.05)
0.02 ± 0.008
(0.5 ± 0.2)
0.039 (1.00)
REF
36
25
37
24
SEATING
PLANE
0.276 ± 0.004
(7.0 ± 0.1)
SQ
TOP VIEW
(PINS DOWN)
0.004 ± 0.002
(0.1 ± 0.05)
48
0° MIN
(3.5° ± 3.5 °)
13
1
12
0.02 ± 0.003
(0.50 ± 0.08)
0.005 +0.002 –0.0008
(0.127 +0.05 –0.02)
0.007 +0.003 –0.001
(0.18 +0.08 –0.03)
RS-28
28-Lead Shrink Small Outline Package (SSOP)
15
1
14
0.311 (7.9)
0.301 (7.64)
0.212 (5.38)
0.205 (5.21)
28
PRINTED IN U.S.A.
0.407 (10.34)
0.397 (10.08)
0.07 (1.79)
0.066 (1.67)
0.078 (1.98) PIN 1
0.068 (1.73)
0.008 (0.203) 0.0256
(0.65)
0.002 (0.050) BSC
0.015 (0.38)
0.010 (0.25)
SEATING 0.009 (0.229)
PLANE
0.005 (0.127)
–16–
8°
0°
0.03 (0.762)
0.022 (0.558)
REV. B
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