Reliability Report for AME1117 Series Product

RR-AME1117 _rev. C
Reliability Report
for
AME1117 Series Product
Approved by
Prepared by
Amy Shen
Quality & Reliability Dept.
Manager
Eric Chen
Quality & Reliability Dept.
Engineer
Conclusion:
The AME1117 series product has successfully met AME’s reliability standard that is required on all
AME, Inc products.
Furthermore, QRA Dept. of AME, Inc monitors the reliability continuously to make sure that all
AME1117 series product will still meet AME’s reliability standard in the future.
Table of Contents:
Ⅰ、General Description
Ⅱ、Product Information
Ⅲ、Failures In Time Calculation
Ⅳ、Product Reliability Test Result
Ⅴ、Package Reliability Test Result
Ⅵ、IR-reflow Test Result
Ⅰ、General Description:
The AME1117 is a 1A low-dropout positive voltage regulator. It is available in fixed and adjustable
output voltage versions. Over current and thermal protection are integrated onto the chip. Output current
will limit as while it reaches the pre-set current or temperature limit. The dropout voltage is specified at 1.4V
Maximum at full rated output current. The AME1117 series provides excellent regulation over line, load and
temperature variations.
Ⅱ、Product Information:
Product Grade or
Opition
A: ADJ
B: 2.5V
C: 3.3V
D: 5.0V
E: 1.8V
Operating
Package Type
Temperature Range
C:0℃ to 70℃
Number of
Special Feature
Pins
B: TO-220
C: TO-252
G: SOT-223
T: 3
Z: Lead Free
Ⅲ、Failures In Time Calculation:
Use HTOL test information mentioned in sectionⅣ, FIT (Failures In Time) can be calculated as below:
FIT = ( x 2 (ν ,
CL )
× 10 9 ) /( 2 × S × H × AF ) = ( 4 .61 × 10 9 ) /( 2 × 77 × 1000 × 280 .59 )
=106.69 (pieces per 109 hours) @ 40℃ with 90% Confidence Level.
Where AF is acceleration factor setting activation energy to 1.0eV as zero failure.
Ⅳ、Product Reliability Test Result:
Test Item
HTOL
Test Condition
Precondition
NOTE 1
Sample Size / Failures
Result
77 pcs / 0 pcs
Pass
3 pcs per pin pair / 0 pcs
Pass
TSTRESS=125℃
Duration=1000hrs
Biased, Read at
168/504/1000 hours
ESD
Human Body Model
Pin-to-Pin test
Level 2, 2kV minimum
NOTE 1: 85/85 168 hours + IR-reflow 3 cycles with Peak Temp.= 245℃ (leaded) or 260℃ (lead-free).
Ⅴ、Package Reliability Test Result:
Test Item
Test Condition
Sample Size / Failures
Result
MSL
85/85 168 hours
22 pcs / 0 pcs
Level 1
45 pcs / 0 pcs
Pass
45 pcs / 0 pcs
Pass
45 pcs / 0 pcs
Pass
45 pcs / 0 pcs
Pass
5 pcs / 0 pcs
Pass
IR-reflow 3 cycles
Peak Temp.= 260℃ (lead-free)
IPC/JEDEC J-STD-020C
HTS
Precondition NOTE 2
Temp.=150℃
Duration=1000 hours
Unbiased, Read at
168/504/1000 hours
THT
Precondition NOTE 2
Temp.=85℃, R.H.=85%
Duration=1000 hours
Unbiased, Read at
168/504/1000 hours
PCT
Precondition NOTE 2
Temp.=121℃, R.H.=100%
15PSIG, Unbiased
Duration=168 hours
Read at 168 hours
TCT
Precondition NOTE 2
-65℃ ~ 150℃
1000 cycles
Unbiased, Read at
500/1000 cycles
Solderability
Temp.=245℃ (leaded)
Temp.=260℃ (lead-free)
Duration=5sec
NOTE 2: 85/85 168 hours + IR-reflow 3 cycles with Peak Temp.= 245℃ (leaded) or 260℃ (lead-free).
Ⅵ、IR-reflow Test Result:
Test Item
Test Condition
Sample Size / Failures
Result
IR-reflow
See IR reflow Profile
22 pcs / 0 pcs
Pass
Perform 3 cycles test
IR reflow Profile:
Profile Feature
Average Ramp-Up Rate
(Tsmax to Tp)
Preheat
- Temperature Min (Tsmin)
- Temperature Max (Tsmax)
- Time (tsmin to tsmax)
Time maintained above
- Temperature (TL)
- Time (tL)
Peak/Classification Temperature (Tp)
Time within 5℃ of actual Peak
Temperature (tp)
Ramp-Down Rate
Time 25℃ to Peak Temperature
Sn-Pb Eutectic Assembly
Pb-Free Assembly
3℃/second max.
3℃/second max.
100℃
150℃
60~120 seconds
150℃
200℃
60~180 seconds
183℃
60~150 seconds
245℃
217℃
60~150 seconds
260℃
10~30 seconds
20~40 seconds
6℃/second max.
6 minutes max.
6℃/second max.
8 minutes max.