General Specifications Environmental THERMAL SHOCK MOISTURE RESISTANCE Specification Appearance No visual defects Capacitance Variation C0G (NP0): ± 2.5% or ± .25pF, whichever is greater X7R: ≤ ± 7.5% Z5U: ≤ ± 20% Y5V: ≤ ± 20% Q, Tan Delta To meet initial requirement Insulation Resistance C0G (NP0), X7R: To meet initial requirement Z5U, Y5V: ≥ Initial Value x 0.1 Dielectric Strength No problem observed Measuring Conditions Step Temperature °C Time (minutes) C0G (NP0), X7R: -55° ± 2° 1 Z5U: +10° ± 2° 30 ± 3 Y5V: -30° ± 2° 2 Room Temperature #3 C0G (NP0), X7R: +125° ± 2° 3 30 ± 3 Z5U, Y5V: +85° ± 2° 4 Room Temperature #3 Repeat for 5 cycles and measure after 48 hours ± 4 hours (24 hours for C0G (NP0)) at room temperature. Specification Appearance No visual defects Capacitance Variation C0G (NP0): ± 5% or ± .5pF, whichever is greater X7R: ≤ ± 10% Z5U: ≤ ± 30% Y5V: ≤ ± 30% Q, Tan Delta C0G (NP0):≥ 30pF........................Q ≥ 350 ≥ 10pF, < 30pF ...........Q ≥ 275+5C/2 < 10pF ........................Q ≥ 200+10C X7R: Initial requirement + .5% Z5U: Initial requirement + 1% Y5V: Initial requirement + 2% IMMERSION Specification Appearance No visual defects Capacitance Variation C0G (NP0): ± 2.5% or ± .25pF, whichever is greater X7R: ≤ ± 7.5% Z5U: ≤ ± 20% Y5V: ≤ ± 20% Q, Tan Delta To meet initial requirement Insulation Resistance C0G (NP0), X7R: To meet initial requirement Z5U, Y5V: ≥ Initial Value x 0.1 Dielectric Strength No problem observed Measuring Conditions Step Temperature °C Time (minutes) +65 +5/-0 1 15 ± 2 Pure Water 0±3 2 15 ± 2 NaCl solution Repeat cycle 2 times and wash with water and dry. Store at room temperature for 48 ± 4 hours (24 hours for C0G (NP0)) and measure. Insulation Resistance ≥ Initial Value x 0.3 Measuring Conditions Step Temp. °C Humidity % Time (hrs) 1 +25->+65 90-98 2.5 2 +65 90-98 3.0 3 +65->+25 80-98 2.5 4 +25->+65 90-98 2.5 5 +65 90-98 3.0 6 +65->+25 80-98 2.5 7 +25 90-98 2.0 7a -10 uncontrolled – 7b +25 90-98 – Repeat 20 cycles (1-7) and store for 48 hours (24 hours for C0G (NP0)) at room temperature before measuring. Steps 7a & 7b are done on any 5 out of first 9 cycles. 25 General Specifications Environmental STEADY STATE HUMIDITY (No Load) Specification Appearance No visual defects Capacitance Variation C0G (NP0): ± 5% or ± .5pF, whichever is greater X7R: ≤ ± 10% Z5U: ≤ ± 30% Y5V: ≤ ± 30% Q, Tan Delta C0G (NP0): ≥ 30pF......................Q ≥ 350 ≥ 10pF, < 30pF.........Q ≥ 275+5C/2 < 10pF ....................Q ≥ 200+10C X7R: Initial requirement + .5% Z5U: Initial requirement + 1% Y5V: Initial requirement + 2% Insulation Resistance ≥ Initial Value x 0.3 Measuring Conditions Store at 85 ± 5% relative humidity and 85°C for 1000 hours, without voltage. Remove from test chamber and stabilize at room temperature and humidity for 48 ± 4 hours (24 ±2 hours for C0G (NP0)) before measuring. Charge and discharge currents must be less than 50ma. LOAD HUMIDITY Specification Appearance No visual defects Capacitance Variation C0G (NP0): ± 5% or ± .5pF, whichever is greater X7R: ≤ ± 10% Z5U: ≤ ± 30% Y5V: ≤ ± 30% Q, Tan Delta C0G (NP0): ≥ 30pF .....................Q ≥ 350 ≥ 10pF,< 30pF .........Q ≥ 275+5C/2 < 10pF ....................Q ≥ 200+10C X7R: Initial requirement + .5% Z5U: Initial requirement + 1% Y5V: Initial requirement + 2% 26 Insulation Resistance C0G (NP0), X7R: To meet initial value x 0.3 Z5U, Y5V: ≥ Initial Value x 0.1 Charge devices with rated voltage in test chamber set at 85 ± 5% relative humidity and 85°C for 1000 (+48,-0) hours. Remove from test chamber and stabilize at room temperature and humidity for 48 ± 4 hours (24 ±2 hours for C0G (NP0)) before measuring. Charge and discharge currents must be less than 50ma. LOAD LIFE Specification Appearance No visual defects Capacitance Variation C0G (NP0): ± 3% or ± .3pF, whichever is greater X7R: ≤ ± 10% Z5U: ≤ ± 30% Y5V: ≤ ± 30% Q, Tan Delta C0G (NP0): ≥ 30pF......................Q ≥ 350 ≥ 10pF, < 30pF.........Q ≥ 275+5C/2 < 10pF ....................Q ≥ 200+10C X7R: Initial requirement + .5% Z5U: Initial requirement + 1% Y5V: Initial requirement + 2% Insulation Resistance C0G (NP0), X7R: To meet initial value x 0.3 Z5U, Y5V: ≥ Initial Value x 0.1 Charge devices with twice rated voltage in test chamber set at +125°C ± 2°C for C0G (NP0) and X7R, +85° ± 2°C for Z5U, and Y5V for 1000 (+48,-0) hours. Remove from test chamber and stabilize at room temperature for 48 ± 4 hours (24 ±2 hours for C0G (NP0)) before measuring. Charge and discharge currents must be less than 50ma. General Specifications Mechanical END TERMINATION ADHERENCE Specification No evidence of peeling of end terminal Measuring Conditions After soldering devices to circuit board apply 5N (0.51kg f) for 10 ± 1 seconds, please refer to Figure 1. BEND STRENGTH Speed = 1mm/sec 2mm Deflection R340mm 45mm 5N FORCE 45mm Supports Figure 2. Bend Strength DEVICE UNDER TEST TEST BOARD Figure 1. Terminal Adhesion RESISTANCE TO VIBRATION Specification Appearance: No visual defects Capacitance Within specified tolerance Q, Tan Delta To meet initial requirement Insulation Resistance C0G (NP0), X7R ⱖ Initial Value x 0.3 Z5U, Y5V ⱖ Initial Value x 0.1 Measuring Conditions Vibration Frequency 10-2000 Hz Maximum Acceleration 20G Swing Width 1.5mm Test Time X, Y, Z axis for 2 hours each, total 6 hours of test SOLDERABILITY Specification ⱖ 95% of each termination end should be covered with fresh solder Measuring Conditions Dip device in eutectic solder at 230 ± 5°C for 2 ± .5 seconds Specification Appearance: No visual defects Capacitance Variation C0G (NP0): ± 5% or ± .5pF, whichever is larger X7R: ≤ ± 12% Z5U: ≤ ± 30% Y5V: ≤ ± 30% Insulation Resistance C0G (NP0): ≥ Initial Value x 0.3 X7R: ≥ Initial Value x 0.3 Z5U: ≥ Initial Value x 0.1 Y5V: ≥ Initial Value x 0.1 Measuring Conditions Please refer to Figure 2 Deflection: 2mm Test Time: 30 seconds RESISTANCE TO SOLDER HEAT Specification Appearance: No serious defects, <25% leaching of either end terminal Capacitance Variation C0G (NP0): ± 2.5% or ± 2.5pF, whichever is greater X7R: ≤ ± 7.5% Z5U: ≤ ± 20% Y5V: ≤ ± 20% Q, Tan Delta To meet initial requirement Insulation Resistance To meet initial requirement Dielectric Strength No problem observed Measuring Conditions Dip device in eutectic solder at 260°C, for 1 minute. Store at room temperature for 48 hours (24 hours for C0G (NP0)) before measuring electrical parameters. Part sizes larger than 3.20mm x 2.49mm are reheated at 150°C for 30 ±5 seconds before performing test. 27