12. IEEE 1149.1 (JTAG) Boundary-Scan Testing for the Cyclone III Device Family December 2011 CIII51014-2.3 CIII51014-2.3 This chapter provides guidelines on using the IEEE Std. 1149.1 boundary-scan test (BST) circuitry in Cyclone® III device family (Cyclone III and Cyclone III LS devices). BST architecture tests pin connections without using physical test probes, and captures functional data while a device is operating normally. Boundary-scan cells (BSCs) in a device can force signals onto pins or capture data from pin or logic array signals. Forced test data is serially shifted into the boundary-scan cells. Captured data is serially shifted out and externally compared to expected results. This chapter contains the following sections: ■ “IEEE Std. 1149.1 BST Architecture” on page 12–1 ■ “IEEE Std. 1149.1 BST Operation Control” on page 12–2 ■ “I/O Voltage Support in a JTAG Chain” on page 12–5 ■ “Guidelines for IEEE Std. 1149.1 BST” on page 12–6 ■ “Boundary-Scan Description Language Support” on page 12–7 IEEE Std. 1149.1 BST Architecture Cyclone III device family operating in the IEEE Std. 1149.1 BST mode use four required pins: ■ TDI ■ TDO ■ TMS ■ TCK The TCK pin has an internal weak pull-down resistor, while the TDI and TMS pins have weak internal pull-up resistors. The TDO output pin and all the JTAG input pins are powered by the VCCIO supply of bank 1A. All user I/O pins are tri-stated during JTAG configuration. 1 For recommendations on how to connect a JTAG chain with multiple voltages across the devices in the chain, refer to “I/O Voltage Support in a JTAG Chain” on page 12–5. f For more information about the description and functionality of all JTAG pins, registers used by the IEEE Std. 1149.1 BST circuitry, and the test access port (TAP) controller, refer to AN39: IEEE 1149.1 (JTAG) Boundary-Scan Testing in Altera Devices. © 2011 Altera Corporation. All rights reserved. ALTERA, ARRIA, CYCLONE, HARDCOPY, MAX, MEGACORE, NIOS, QUARTUS and STRATIX words and logos are trademarks of Altera Corporation and registered in the U.S. Patent and Trademark Office and in other countries. All other words and logos identified as trademarks or service marks are the property of their respective holders as described at www.altera.com/common/legal.html. Altera warrants performance of its semiconductor products to current specifications in accordance with Altera's standard warranty, but reserves the right to make changes to any products and services at any time without notice. Altera assumes no responsibility or liability arising out of the application or use of any information, product, or service described herein except as expressly agreed to in writing by Altera. Altera customers are advised to obtain the latest version of device specifications before relying on any published information and before placing orders for products or services. ISO 9001:2008 Registered Cyclone III Device Handbook Volume 1 December 2011 Subscribe 12–2 Chapter 12: IEEE 1149.1 (JTAG) Boundary-Scan Testing for the Cyclone III Device Family IEEE Std. 1149.1 BST Operation Control IEEE Std. 1149.1 BST Operation Control Table 12–1 lists the boundary-scan register length for devices in Cyclone III device family. Table 12–1. Boundary-Scan Register Length for Cyclone III Device Family Family Cyclone III Cyclone III LS Device Boundary-Scan Register Length EP3C5 603 EP3C10 603 EP3C16 1,080 EP3C25 732 EP3C40 1,632 EP3C55 1,164 EP3C80 1,314 EP3C120 1,620 EP3CLS70 1,314 EP3CLS100 1,314 EP3CLS150 1,314 EP3CLS200 1,314 Table 12–2 lists the IDCODE information for devices in Cyclone III device family. Table 12–2. Device IDCODE for Cyclone III Device Family IDCODE (32 Bits) Family Cyclone III Cyclone III LS Device (1) Version (4 Bits) Part Number (16 Bits) Manufacturer Identity (11 Bits) EP3C5 0000 0010 0000 1111 0001 000 0110 1110 1 EP3C10 0000 0010 0000 1111 0001 000 0110 1110 1 EP3C16 0000 0010 0000 1111 0010 000 0110 1110 1 EP3C25 0000 0010 0000 1111 0011 000 0110 1110 1 EP3C40 0000 0010 0000 1111 0100 000 0110 1110 1 EP3C55 0000 0010 0000 1111 0101 000 0110 1110 1 EP3C80 0000 0010 0000 1111 0110 000 0110 1110 1 EP3C120 0000 0010 0000 1111 0111 000 0110 1110 1 EP3CLS70 0000 0010 0111 0000 0001 000 0110 1110 1 EP3CLS100 0000 0010 0111 0000 0000 000 0110 1110 1 EP3CLS150 0000 0010 0111 0000 0011 000 0110 1110 1 EP3CLS200 0000 0010 0111 0000 0010 000 0110 1110 1 LSB (1 Bit) (2) Notes to Table 12–2: (1) The MSB is on the left. (2) The LSB of the IDCODE is always 1. Cyclone III Device Handbook Volume 1 December 2011 Altera Corporation Chapter 12: IEEE 1149.1 (JTAG) Boundary-Scan Testing for the Cyclone III Device Family IEEE Std. 1149.1 BST Operation Control 12–3 Cyclone III device family supports the IEEE Std. 1149.1 (JTAG) instructions as listed in Table 12–3. Table 12–3. IEEE Std. 1149.1 (JTAG) Instructions Supported by Cyclone III Device Family (Part 1 of 2) JTAG Instruction Instruction Code Description 00 0000 0101 Allows a snapshot of signals at the device pins to be captured and examined during normal device operation, and permits an initial data pattern to be output at the device pins. Also used by the SignalTap® II embedded logic analyzer. 00 0000 1111 Allows the external circuitry and board-level interconnects to be tested by forcing a test pattern at the output pins and capturing test results at the input pins. BYPASS 11 1111 1111 Places the 1-bit bypass register between the TDI and TDO pins, which allows the BST data to pass synchronously through selected devices to adjacent devices during normal device operation. USERCODE 00 0000 0111 Selects the 32-bit USERCODE register and places it between the TDI and TDO pins, allowing the USERCODE to be serially shifted out of TDO. IDCODE 00 000 0110 Selects the IDCODE register and places it between TDI and TDO, allowing the IDCODE to be serially shifted out of TDO. IDCODE is the default instruction at power up and in TAP RESET state. 00 0000 1011 Places the 1-bit bypass register between the TDI and TDO pins, which allows the BST data to pass synchronously through selected devices to adjacent devices during normal device operation, while tri-stating all of the I/O pins. 00 0000 1010 Places the 1-bit bypass register between the TDI and TDO pins, which allows the BST data to pass synchronously through selected devices to adjacent devices during normal device operation while holding I/O pins to a state defined by the data in the boundary scan register. — Used when configuring Cyclone III device family using the JTAG port with a USB-Blaster™ ByteBlaster™ II, MasterBlaster™ or ByteBlasterMV™ download cable, or when using a Jam File, or JBC File via an embedded processor. 00 0000 0001 Emulates pulsing the nCONFIG pin low to trigger reconfiguration even though the physical pin is unaffected. 00 0000 1101 Allows I/O reconfiguration through JTAG ports using the IOCSR for JTAG testing. This is executed after or during configurations. nSTATUS pin must go high before you can issue the CONFIG_IO instruction. 01 1110 1110 Allows CLKUSR pin signal to replace the internal oscillator as the configuration clock source. 10 1110 1110 Allows you to revert the configuration clock source from CLKUSR pin signal set by EN_ACTIVE_CLK back to the internal oscillator. 10 1101 0000 Places the active configuration mode controllers into idle state prior to CONFIG_IO to configure the IOCSR or perform board level testing. 10 1011 0000 This instruction might be used in AS and AP configuration schemes to re-engage the active controller. 10 0111 0000 Places the 22-bit active boot address register between the TDI and TDO pins, allowing a new active boot address to be serially shifted into TDI and into the active parallel (AP) flash controller. In remote system upgrade, the PFC_BOOT_ADDR instruction sets the boot address for the factory configuration. SAMPLE/PRELOAD EXTEST (1) HIGHZ CLAMP ICR Instructions PULSE_NCONFIG CONFIG_IO (2) EN_ACTIVE_CLK (2) DIS_ACTIVE_CLK (2) ACTIVE_DISENGAGE ACTIVE_ENGAGE (2) APFC_BOOT_ADDR December 2011 (2) (2), (3) Altera Corporation Cyclone III Device Handbook Volume 1 12–4 Chapter 12: IEEE 1149.1 (JTAG) Boundary-Scan Testing for the Cyclone III Device Family IEEE Std. 1149.1 BST Operation Control Table 12–3. IEEE Std. 1149.1 (JTAG) Instructions Supported by Cyclone III Device Family (Part 2 of 2) JTAG Instruction FACTORY (4) KEY_PROG_VOL KEY_CLR_VREG (4) (4) Instruction Code Description 10 1000 0001 Enables access to all other JTAG instructions (other than BYPASS, SAMPLE/PRELOAD and EXTEST instructions, which are supported upon power up). This instruction also clears the device configuration data and advanced encryption standard (AES) volatile key. 01 1010 1101 Used to enter and store the security key into volatile registers. When this instruction is executed, TDI is connected to a 512-bit volatile key scan chain. TDO is not connected to the end of this scan chain. 00 0010 1001 Clears the volatile verify register which signifies the validity of the volatile keys stored in the registers. You must clear the volatile verify register by issuing this command whenever you attempt to program a new volatile key. This instruction must be asserted for at least 10 TCK cycles. Notes to Table 12–3: (1) Bus hold and weak pull-up resistor features override the high-impedance state of HIGHZ, CLAMP, and EXTEST. (2) For more information about how to use CONFIG_IO, EN_ACTIVE_CLK, DIS_ACTIVE_CLK, ACTIVE_DISENGAGE, ACTIVE_ENGAGE and APFC_BOOT_ADDR instructions for Cyclone III device family, refer to the Configuration, Design Security, and Remote System Upgrades in Cyclone III Devices chapter. (3) APFC_BOOT_ADDR instruction is not supported in Cyclone III LS devices. (4) For Cyclone III LS devices only. For more information about how to program the security key into the volatile registers, refer to the Configuration, Design Security, and Remote System Upgrades in Cyclone III Devices chapter. The IEEE Std. 1149.1 BST circuitry is enabled upon device power-up. You can perform BST on Cyclone III device family before, after, and during configuration. Cyclone III device family supports the BYPASS, IDCODE and SAMPLE instructions during configuration without interrupting configuration. To send all other JTAG instructions, interrupt the configuration using the CONFIG_IO instruction except for active configuration schemes in which the ACTIVE_DISENGAGE instruction is used instead. The CONFIG_IO instruction allows you to configure I/O buffers via the JTAG port, and when issued, interrupts configuration. This instruction allows you to perform boardlevel testing prior to configuring Cyclone III device family. Alternatively, you can wait for the configuration device to complete configuration. After configuration is interrupted and JTAG BST is complete, you must reconfigure the part via JTAG (PULSE_NCONFIG instruction) or by pulsing nCONFIG low. 1 When you perform JTAG boundary-scan testing before configuration, the nCONFIG pin must be held low. f For more information about the following topics, refer to AN39: IEEE 1149.1 (JTAG) Boundary-Scan Testing in Altera Devices: ■ TAP controller state-machine ■ Timing requirements for IEEE Std. 1149.1 signals ■ Instruction mode ■ Mandatory JTAG instructions (SAMPLE/PRELOAD, EXTEST and BYPASS) ■ Optional JTAG instructions (IDCODE, USERCODE, CLAMP and HIGHZ) The following information is only applicable to Cyclone III LS devices: Cyclone III Device Handbook Volume 1 December 2011 Altera Corporation Chapter 12: IEEE 1149.1 (JTAG) Boundary-Scan Testing for the Cyclone III Device Family I/O Voltage Support in a JTAG Chain 12–5 ■ Only the three mandatory JTAG 1149.1 JTAG instructions (BYPASS, SAMPLE/PRELOAD, EXTEST) and the FACTORY private instruction are supported from the JTAG pins upon power up. The FACTORY instruction (instruction code: 10 1000 0001) must be issued before the device starts loading the core configuration data to enable access to all other JTAG instructions. This instruction also clears the device configuration data and AES volatile key. ■ IDCODE instruction is not supported upon power-up, prior to issuing the FACTORY instruction. However, it is the default instruction when the TAP controller is in the reset state. Without loading any instructions, you can go to the Shift_DR state and shift out the JTAG Device ID. ■ IDCODE, CONFIG_IO, ACTIVE_DISENGAGE, HIGHZ, CLAMP, USERCODE and PULSE_NCONFIG instructions are supported, provided that the FACTORY instruction is executed. I/O Voltage Support in a JTAG Chain A JTAG chain can contain several different devices. However, you must be cautious if the chain contains devices that have different VCCIO levels. The output voltage level of the TDO pin must meet the specifications of the TDI pin it drives. For Cyclone III device family, the TDO pin is powered by the VCCIO power supply. Because the VCCIO supply is 3.3 V, the TDO pin drives out 3.3 V. Devices can interface with each other although they might have different VCCIO levels. For example, a device with a 3.3-V TDO pin can drive to a device with a 5.0-V TDI pin because 3.3 V meets the minimum TTL-level VIH for the 5.0-V TDI pin. JTAG pins on Cyclone III device family can support the input levels of VCCIO of bank 1A. 1 For multiple devices in a JTAG chain with 3.0-V or 3.3-V I/O standard, you must connect a 25-Ω series resistor on a TDO pin driving a TDI pin. You can also interface the TDI and TDO lines of the devices that have different VCCIO levels by inserting a level shifter between the devices. If possible, the JTAG chain must be built in such a way that a device with a higher VCCIO level drives to a device with an equal or lower VCCIO level. This way, a level shifter may be required only to shift the TDO level to a level acceptable to the JTAG tester. December 2011 Altera Corporation Cyclone III Device Handbook Volume 1 12–6 Chapter 12: IEEE 1149.1 (JTAG) Boundary-Scan Testing for the Cyclone III Device Family Guidelines for IEEE Std. 1149.1 BST Figure 12–1 shows the JTAG chain of mixed voltages and how a level shifter is inserted in the chain. Figure 12–1. JTAG Chain of Mixed Voltages Must be 3.3 V tolerant TDI 3.3 V VCCIO 2.5 V VCCIO Tester TDO Level Shifter 1.5 V VCCIO 1.8 V VCCIO Shift TDO to level accepted by tester if necessary Must be 1.8 V tolerant Must be 2.5 V tolerant Guidelines for IEEE Std. 1149.1 BST Use the following guidelines when performing BST with IEEE Std. 1149.1 devices: ■ If the 10 bit checkerboard pattern (1010101010) does not shift out of the instruction register via the TDO pin during the first clock cycle of the SHIFT_IR state, the TAP controller did not reach the proper state. To solve this problem, try one of the following procedures: ■ Verify that the TAP controller has reached the SHIFT_IR state correctly. To advance the TAP controller to the SHIFT_IR state, return to the RESET state and send the code 01100 to the TMS pin. ■ Check the connections to the VCC, GND, JTAG, and dedicated configuration pins on the device. ■ Perform a SAMPLE/PRELOAD test cycle prior to the first EXTEST test cycle to ensure that known data is present at the device pins when you enter the EXTEST mode. If the OEJ update register contains a 0, the data in the OUTJ update register is driven out. The state must be known and correct to avoid contention with other devices in the system. ■ Do not perform EXTEST testing during ICR. This instruction is supported before or after ICR, but not during ICR. Use the CONFIG_IO instruction to interrupt configuration and then perform testing, or wait for configuration to complete. ■ If testing is performed before configuration, hold the nCONFIG pin low. Cyclone III Device Handbook Volume 1 December 2011 Altera Corporation Chapter 12: IEEE 1149.1 (JTAG) Boundary-Scan Testing for the Cyclone III Device Family Boundary-Scan Description Language Support 12–7 c You must not invoke the following private instructions at any instance because these instructions can potentially damage the device, rendering the device useless: ■ 1000010000 ■ 1001000000 ■ 1011100000 Boundary-Scan Description Language Support The boundary-scan description language (BSDL), a subset of VHDL, provides a syntax that allows you to describe the features of an IEEE Std. 1149.1 BST-capable device that can be tested. To download BSDL files for IEEE Std. 1149.1-compliant Cyclone III device family, visit the Altera Download Center. 1 BSDL files for IEEE std. 1149.1-compliant Cyclone III LS devices can also be generated using version 9.0 and later of the Quartus II software. To perform BST on a configured device, a post configuration BSDL file that is customized to your design is required. Post configuration BSDL file generation with BSDL Customizer script (available on the Altera Download Center) is for Cyclone III devices only. Use version 9.0 and later of the Quartus II software to create a post configuration BSDL file for Cyclone III LS devices. f For information on the procedures to generate the generic and post configuration BSDL files with Quartus II software, visit the Altera Download Center. Document Revision History Table 12–4 lists the revision history for this document. Table 12–4. Document Revision History (Part 1 of 2) Date Version Changes ■ Updated “IEEE Std. 1149.1 BST Architecture” on page 12–1 and “I/O Voltage Support in a JTAG Chain” on page 12–5. ■ Minor text edits. December 2011 2.3 December 2009 2.2 Minor changes to the text. July 2009 2.1 Made minor correction to the part number. June 2009 ■ Updated “Introduction” on page 12–1, “IEEE Std. 1149.1 BST Architecture” on page 12–1, “IEEE Std. 1149.1 BST Operation Control” on page 12–2, “Guidelines for IEEE Std. 1149.1 BST” on page 12–6, and “Boundary-Scan Description Language Support” on page 12–7. ■ Updated Table 12–1 on page 12–2, Table 12–2 on page 12–2, and Table 12–3 on page 12–3. 2.0 October 2008 1.3 Updated chapter to new template. May 2008 1.2 Minor textual changes. December 2011 Altera Corporation Cyclone III Device Handbook Volume 1 12–8 Chapter 12: IEEE 1149.1 (JTAG) Boundary-Scan Testing for the Cyclone III Device Family Document Revision History Table 12–4. Document Revision History (Part 2 of 2) Date Version July 2007 March 2007 Cyclone III Device Handbook Volume 1 1.1 1.0 Changes ■ Updated “IEEE Std.1149.1 Boundary-Scan Register” section. ■ Updated IDCODE information and removed SignalTap II instructions in Table 12-4. ■ Updated “BST for Configured Devices” section. ■ Added a guideline to “Guidelines for IEEE Std. 1149.1 Boundary-Scan Testing” section. ■ Added chapter TOC and “Referenced Documents” section. Initial release. December 2011 Altera Corporation