Reliability Report for AME8550 Cu Wire Series Product ______________________________________________________________________ Prepared by Jess Lin, Supervisor of Quality & Reliability Dept. Approved by Amy Shen, Manager of Production Management Dept. REL-AME8550-Cu-A Table of Contents: Ⅰ、General Description Ⅱ、Product Information Ⅲ、Failures In Time Calculation Ⅳ、Product Reliability Test Result Ⅴ、Package Reliability Test Result Ⅵ、IR-reflow Test Result REL-AME8550-Cu-A Ⅰ、General Description: The AME8550 series are highly precise, low power consumption voltage detectors, manufactured using CMOS and fuse trimming technologies. Detect voltage is extremely accurate with minimal temperature drift. Both CMOS and N channel open drain output configurations are available. Ⅱ、Product Information: Pin Configuration A: 1. OUT 2. GND 3. IN (SOT-23) (TSOT-23) A: 1. OUT 2. IN 3. GND 4. NC 5. NC A: 1. OUT 2. IN 3. GND 4. CD 5. NC B: 1. OUT 2. IN 3. GND 4. NC 5. CD Operating Ambient Temperature Range E:-40C to 85C Package Type E: SOT-2X Number of Pins T: 3 V: 5 Output Options Detect Voltage Special Feature A: CMOS output without delay 190: V=1.9V 200: V=2.0V 210: V=2.1V 220: V=2.2V 230: V=2.3V 240: V=2.4V 250: V=2.5V 260: V=2.6V 270: V=2.7V 280: V=2.8V 290: V=2.9V 300: V=3.0V 330: V=3.3V 340: V=3.4V 360: V=3.6V 390: V=3.9V 420: V=4.2V 440: V=4.4V 460: V=4.6V Y: Lead free & B: Open-Drain without delay Low profile Z: Lead Free (SOT-25) (TSOT-25) REL-AME8550-Cu-A Ⅲ、Failures In Time Calculation: Use HTOL test information mentioned in sectionⅣ, FIT (Failures In Time) can be calculated as below: FIT ( x 2 ( , CL ) 10 9 ) /( 2 S H AF ) ( 4 .61 10 9 ) /( 2 77 1000 280 .59 ) =106.69 (pieces per 109 hours) @ 40℃ with 90% Confidence Level. Where AF is acceleration factor setting activation energy to 1.0eV as zero failure. Ⅳ、Product Reliability Test Result: Test Item Test Condition Sample Size / Failures Result HTOL TSTRESS=125℃ 77 pcs / 0 pcs Pass 3 pcs per pin pair / 0 pcs Pass 3 pcs per pin pair / 0 pcs Pass 3 pcs per pin pair / 0 pcs Pass Duration=1000hrs Biased, Read at 168/504/1000 hours ESD Human Body Model Pin-to-Pin test Class 2, 2kV minimum Machine Model Pin-to-Pin test Class B, 200V minimum Latch-up Level A, 100mA minimum REL-AME8550-Cu-A Ⅴ、Package Reliability Test Result: Test Item Test Condition Sample Size / Failures Result MSL 85/85 168 hours 22 pcs / 0 pcs Level 1 77 pcs / 0 pcs Pass 77 pcs / 0 pcs Pass 77 pcs / 0 pcs Pass 77 pcs / 0 pcs Pass 5 pcs / 0 pcs Pass IR-reflow 3 cycles Peak Temp.= 260℃ IPC/JEDEC J-STD-020C HTS Precondition NOTE 1 Temp.=150℃ Duration=1000 hours Unbiased, Read at 1000 hours THT Precondition NOTE 1 Temp.=85℃, R.H.=85% Duration=1000 hours Unbiased, Read at 1000 hours PCT Precondition NOTE 1 Temp.=121℃, R.H.=100% 15PSIG, Unbiased Duration=168 hours Read at 168 hours TCT Precondition NOTE 1 -65℃ ~ 150℃ 500 cycles Unbiased, Read at 500 cycles Solderability Temp.=260℃ (lead-free) Duration=5sec NOTE 1: 85/85 168 hours + IR-reflow 3 cycles with Peak Temp.= 260℃ REL-AME8550-Cu-A Ⅵ、IR-reflow Test Result: Test Item Test Condition Sample Size / Failures Result IR-reflow See IR reflow Profile 22 pcs / 0 pcs Pass Perform 3 cycles test IR reflow Profile: Profile Feature Average Ramp-Up Rate (Tsmax to Tp) Preheat - Temperature Min (Tsmin) - Temperature Max (Tsmax) - Time (tsmin to tsmax) Time maintained above - Temperature (TL) - Time (tL) Peak/Classification Temperature (Tp) Time within 5C of actual Peak Temperature (tp) Ramp-Down Rate Time 25C to Peak Temperature Sn-Pb Eutectic Assembly Pb-Free Assembly 3C /second max. 3C /second max. 100C 150C 60~120 seconds 150C 200C 60~180 seconds 183C 60~150 seconds 245C 217C 60~150 seconds 260C 10~30 seconds 20~40 seconds 6C /second max. 6 minutes max. 6C /second max. 8 minutes max. REL-AME8550-Cu-A The product has successfully met AME’s reliability standard that is required on all AME, Inc products. Furthermore, QRA Dept. of AME, Inc monitors the reliability continuously to make sure that all product will still meet AME’s reliability standard in the future. REL-AME8550-Cu-A