Reliability Data Report Product Family R521 LTC2801 \ LTC2802 \ LTC2803 \ LTC2804 \ LTC2850 \ LTC2851 \ LTC2852 \ LTC2854 \ LTC2855 \ LTC2856 \ LTC2857 \ LTC2858 \ LTC2859 \ LTC2861 \ LTC2870 \ LTC2871 \ LTC2872 Reliability Data Report Report Number: R521 Report generated on: Mon Jan 18 14:04:44 PST 2016 OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE OLDEST DATE NEWEST DATE K DEVICE HRS CODE CODE (+125°C) 1 No. of FAILURES 2,3 QFN/DFN SSOP/TSSOP SOIC/MSOP 1956 790 160 1102 0630 0630 1448 1421 0710 341 488 160 0 0 0 Totals 2,906 - - 989 0 K DEVICE HRS No. of FAILURES PRESSURE COOKER TEST AT 15 PSIG , +121 DEG C PACKAGE TYPE SAMPLE SIZE OLDEST DATE NEWEST DATE CODE CODE QFN/DFN SSOP/TSSOP 2198 949 0550 0827 1409 1338 52 29 0 0 SOIC/MSOP Totals 500 3,647 0937 - 1418 - 12 93 0 0 OLDEST DATE NEWEST DATE K DEVICE No. of FAILURES TEMP CYCLE FROM -65 TO 150 DEG C PACKAGE TYPE SAMPLE SIZE CODE CODE CYCLES QFN/DFN SSOP/TSSOP 2189 999 0550 0526 1409 1338 301 139 0 0 SOIC/MSOP Totals 500 3,688 0937 - 1418 - 50 490 0 0 OLDEST DATE NEWEST DATE K DEVICE No. of FAILURES CODE CODE CYCLES THERMAL SHOCK FROM -65 TO 150 DEG C PACKAGE TYPE SAMPLE SIZE QFN/DFN 2242 0550 1409 224 0 SSOP/TSSOP SOIC/MSOP Totals 896 496 3,634 0917 0937 - 1338 1418 - 89 49 362 0 0 0 OLDEST DATE NEWEST DATE K DEVICE HRS No. of FAILURES HIGH TEMPERATURE BAKE AT 150 DEG C PACKAGE TYPE SAMPLE SIZE CODE CODE QFN/DFN 148 0913 1226 123 0 Totals 148 - - 123 0 (1) Assumes Activation Energy = 0.7 Electron Volts (2) Failure Rate Equivalent to +55 °C, 60% Confidence Level =11.98 FITS (3) Mean Time Between Failure in Years = 9528.14 Note: 1 FIT = 1 Failure in One Billion Hours. Note 2: HAST, Temp Cycle & Thermal Shock are subjected to J-STD-020 MSL1 Preconditioning