IDT74FCT543AT/CT/DT FAST CMOS OCTAL LATCHED TRANSCEIVER INDUSTRIAL TEMPERATURE RANGE FAST CMOS OCTAL LATCHED TRANSCEIVER IDT74FCT543AT/CT/DT FEATURES: DESCRIPTION: • • • • The FCT543T is a non-inverting octal transceiver built using an advanced dual metal CMOS technology. This device contains two sets of eight D-type latches with separate input and output controls for each set. For data flow from A to B, for example, the A-to-B Enable (CEAB) input must be low in order to enter data from A0–A7 or to take data from B0–B7, as indicated in the Function Table. With CEAB low, a low signal on the A-to-B Latch Enable (LEAB) input makes the A-to-B latches transparent; a subsequent low-tohigh transition of the LEAB signal puts the A latches in the storage mode and their outputs no longer change with the A inputs. With CEAB and OEAB both low, the 3-state B output buffers are active and reflect the data present at the output of the A latches. Control of data from B to A is similar, but uses the CEBA, LEBA and OEBA inputs. • • • • A, C, and D grades Low input and output leakage ≤1µA (max.) CMOS power levels True TTL input and output compatibility: – VOH = 3.3V (typ.) – VOL = 0.3V (typ.) High Drive outputs (-15mA IOH, 64mA IOL) Meets or exceeds JEDEC standard 18 specifications Power off disable outputs permit "live insertion" Available in SOIC and QSOP packages FUNCTIONAL BLOCK DIAGRAM DETAIL A D Q B0 LE Q A0 D LE A1 B1 A2 B2 A3 A4 B3 DETAIL A x 7 B4 A5 B5 A6 B6 A7 B7 OEBA OEAB CEBA LEBA CEAB LEAB The IDT logo is a registered trademark of Integrated Device Technology, Inc. INDUSTRIAL TEMPERATURE RANGE JUNE 2006 1 © 2006 Integrated Device Technology, Inc. DSC-5489/6 IDT74FCT543AT/CT/DT FAST CMOS OCTAL LATCHED TRANSCEIVER INDUSTRIAL TEMPERATURE RANGE PIN CONFIGURATION LEBA 1 ABSOLUTE MAXIMUM RATINGS(1) 24 VCC OEBA 2 23 CEBA A0 3 22 B0 A1 4 21 B1 A2 5 20 B2 A3 6 19 B3 A4 7 18 B4 A5 8 17 B5 A6 9 16 B6 A7 10 15 B7 CEAB 11 14 LEAB GND 12 13 OEAB Symbol Description Max Unit VTERM(2) Terminal Voltage with Respect to GND –0.5 to +7 V VTERM(3) Terminal Voltage with Respect to GND –0.5 to VCC+0.5 V TSTG Storage Temperature –65 to +150 °C IOUT DC Output Current –60 to +120 mA NOTES: 1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. No terminal voltage may exceed Vcc by +0.5V unless otherwise noted. 2. Inputs and Vcc terminals only. 3. Output and I/O terminals only. CAPACITANCE (TA = +25°C, F = 1.0MHz) Parameter(1) Symbol Conditions Typ. Max. Unit CIN Input Capacitance VIN = 0V 6 10 pF COUT Output Capacitance VOUT = 0V 8 12 pF NOTE: 1. This parameter is measured at characterization but not tested. SOIC/ QSOP TOP VIEW PIN DESCRIPTION Pin Names OEAB OEBA CEAB CEBA LEAB LEBA A0–A7 B0–B7 2 Description A-to-B Output Enable Input (Active LOW) B-to-A Output Enable Input (Active LOW) A-to-B Enable Input (Active LOW) B-to-A Enable Input (Active LOW) A-to-B Latch Enable Input (Active LOW) B-to-A Latch Enable Input (Active LOW) A-to-B Data Inputs or B-to-A 3-State Outputs B-to-A Data Inputs or A-to-B 3-State Outputs IDT74FCT543AT/CT/DT FAST CMOS OCTAL LATCHED TRANSCEIVER INDUSTRIAL TEMPERATURE RANGE FUNCTION TABLE(1, 2) For A-to-B (Symmetric with B-to-A) CEAB H X X L L Inputs LEAB X H X L H OEAB X X H L L Latch Status A-to-B Storing Storing X Transparent Storing Output Buffers B0–B7 High Z X High Z Current A Inputs Previous* A Inputs NOTES: 1. * Before LEAB LOW-to-HIGH Transition H = HIGH Voltage Level L = LOW Voltage Level X = Don’t Care 2. A-to-B data flow shown; B-to-A flow control is the same, except using CEBA, LEBA and OEBA. DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE Following Conditions Apply Unless Otherwise Specified: Industrial: TA = –40°C to +85°C, VCC = 5.0V ±5% Symbol Test Conditions(1) Parameter Min. Typ.(2) Max. Unit VIH Input HIGH Level Guaranteed Logic HIGH Level 2 — — V VIL Input LOW Level Guaranteed Logic LOW Level — — 0.8 V IIH Input HIGH Current(4) VCC = Max. VI = 2.7V — — ±1 µA IIL Input LOW Current(4) VCC = Max. VI = 0.5V — — ±1 µA IOZH High Impedance Output Current VCC = Max VO = 2.7V — — ±1 µA IOZL (3-State output pins)(4) II VIK VH Input HIGH Current(4) Clamp Diode Voltage Input Hysteresis VCC = Max., VI = VCC (Max.) VCC = Min, IIN = -18mA ICC Quiescent Power Supply Current VCC = Max., VIN = GND or VCC VO = 0.5V — — — ±1 — — — — –0.7 200 ±1 –1.2 — µA V mV — 0.01 1 mA Min. 2.4 Typ.(2) 3.3 Max. — Unit V OUTPUT DRIVE CHARACTERISTICS Symbol VOH Parameter Output HIGH Voltage VCC = Min Test Conditions(1) IOH = –8mA VIN = VIH or VIL IOH = –15mA 2 3 — IOL = 64mA — 0.3 0.55 V –60 –120 –225 mA — — ±1 µA VOL Output LOW Voltage IOS Short Circuit Current VCC = Min VIN = VIH or VIL VCC = Max., VO = GND(3) IOFF Input/Output Power Off Leakage(5) VCC = 0V, VIN or VO ≤ 4.5V NOTES: 1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type. 2. Typical values are at VCC = 5.0V, +25°C ambient. 3. Not more than one output should be tested at one time. Duration of the test should not exceed one second. 4. The test limit for this parameter is ±5µA at TA = –55°C. 5. This parameter is guaranteed but not tested. 3 IDT74FCT543AT/CT/DT FAST CMOS OCTAL LATCHED TRANSCEIVER INDUSTRIAL TEMPERATURE RANGE POWER SUPPLY CHARACTERISTICS Test Conditions(1) Symbol Parameter ΔICC Quiescent Power Supply Current TTL Inputs HIGH VCC = Max. VIN = 3.4V(3) ICCD Dynamic Power Supply Current(4) VCC = Max., Outputs Open CEAB and OEAB = GND CEBA = VCC One Input Toggling 50% Duty Cycle Total Power Supply Current(6) VCC = Max., Outputs Open fCP = 10MHz (LEAB ) 50% Duty Cycle CEAB and OEAB = GND CEBA = VCC One Bit Toggling at fi = 5MHz 50% duty cycle VCC = Max., Outputs Open fCP = 10MHz (LEAB ) 50% Duty Cycle CEAB and OEAB = GND CEBA = VCC Eight Bits Toggling at fi = 2.5MHz 50% duty cycle IC Min. Typ.(2) Max. Unit — 0.5 2 mA VIN = VCC VIN = GND — 0.15 0.25 mA/ MHz VIN = VCC VIN = GND — 1.5 3.5 mA VIN = 3.4V VIN = GND — 2 5.5 VIN = VCC VIN = GND — 3.8 7.3(5) VIN = 3.4V VIN = GND — 6 16.3(5) NOTES: 1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type. 2. Typical values are at VCC = 5.0V, +25°C ambient. 3. Per TTL driven input; (VIN = 3.4V). All other inputs at VCC or GND. 4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations. 5. Values for these conditions are examples of ΔICC formula. These limits are guaranteed but not tested. 6. IC = IQUIESCENT + IINPUTS + IDYNAMIC IC = ICC + ΔICC DHNT + ICCD (fCP/2+ fiNi) ICC = Quiescent Current ΔICC = Power Supply Current for a TTL High Input (VIN = 3.4V) DH = Duty Cycle for TTL Inputs High NT = Number of TTL Inputs at DH ICCD = Dynamic Current caused by an Input Transition Pair (HLH or LHL) fCP = Clock Frequency for Register Devices (Zero for Non-Register Devices) fi = Output Frequency Ni = Number of Outputs at fi All currents are in milliamps and all frequencies are in megahertz. 4 mA IDT74FCT543AT/CT/DT FAST CMOS OCTAL LATCHED TRANSCEIVER INDUSTRIAL TEMPERATURE RANGE SWITCHING CHARACTERISTICS OVER OPERATING RANGE 74FCT543AT Symbol Parameter 74FCT543CT 74FCT543DT Condition(1) Min.(2) Max. Min.(2) Max. Min.(2) Max. Unit 1.5 6.5 1.5 5.3 1.5 4.4 ns 1.5 8 1.5 7 1.5 5 ns 1.5 9 1.5 8 1.5 5.4 ns 1.5 7.5 1.5 6.5 1.5 4.3 ns 2 — 2 — 1.5 — ns 2 — 2 — 1.5 — ns 5 — 5 — 3(3) — ns tPLH Propagation Delay CL = 50pF tPHL Transparant Mode RL = 500Ω Ax to Bx or Bx to Ax tPLH Propagation Delay tPHL LEBA to Ax, LEAB to Bx tPZH Output Enable Time tPZL OEBA or OEAB to Ax or Bx CEBA or CEAB to Ax or Bx tPHZ Output Disable Time tPLZ OEBA or OEAB to Ax or Bx CEBA or CEAB to Ax or Bx tSU Set-up Time, HIGH or LOW Ax or Bx to LEBA or LEAB tH Hold Time, HIGH or LOW Ax or Bx to LEBA or LEAB tW LEBA or LEAB Pulse Width LOW NOTES: 1. See test circuit and waveforms. 2. Minimum limits are guaranteed but not tested on Propagation Delays. 3. This limit is guaranteed but not tested. 5 IDT74FCT543AT/CT/DT FAST CMOS OCTAL LATCHED TRANSCEIVER INDUSTRIAL TEMPERATURE RANGE TEST CIRCUITS AND WAVEFORMS V CC SWITCH POSITION 7.0V 500W V OUT VIN Pulse Generator D.U.T . 50pF RT Test Switch Open Drain Disable Low Enable Low Closed All Other Tests Open 500W DEFINITIONS: CL = Load capacitance: includes jig and probe capacitance. RT = Termination resistance: should be equal to ZOUT of the Pulse Generator. CL Octal Link Test Circuits for All Outputs DATA INPUT tH tSU TIMING INPUT ASYNCHRONOUS CONTROL PRESET CLEAR ETC. SYNCHRONOUS CONTROL PRESET CLEAR CLOCK ENABLE ETC. tREM tSU 3V 1.5V 0V 3V 1.5V 0V LOW-HIGH-LOW PULSE 1.5V tW 3V 1.5V 0V HIGH-LOW-HIGH PULSE 1.5V 3V 1.5V 0V tH Pulse Width Octal Link Octal Link Set-Up, Hold, and Release Times ENABLE SAME PHASE INPUT TRANSITION tPLH tPHL OUTPUT tPLH OPPOSITE PHASE INPUT TRANSITION tPHL 3V 1.5V 0V VOH 1.5V VOL DISABLE 3V CONTROL INPUT tPZL OUTPUT NORMALLY LOW 3V 1.5V 0V SWITCH CLOSED tPLZ 3.5V 1.5V tPZH OUTPUT NORMALLY HIGH SWITCH OPEN 1.5V 0V 3.5V 0.3V VOL tPHZ 0.3V VOH 1.5V 0V Octal Link 0V Octal Link Propagation Delay Enable and Disable Times NOTES: 1. Diagram shown for input Control Enable-LOW and input Control Disable-HIGH. 2. Pulse Generator for All Pulses: Rate ≤ 1.0MHz; tF ≤ 2.5ns; tR ≤ 2.5ns. 6 IDT74FCT543AT/CT/DT FAST CMOS OCTAL LATCHED TRANSCEIVER INDUSTRIAL TEMPERATURE RANGE ORDERING INFORMATION XXXX IDT XX FCT Device Type Temp. Range XX Package X Process CORPORATE HEADQUARTERS 6024 Silver Creek Valley Road San Jose, CA 95138 Blank Industrial SO SOG Q QG Small Outline IC SOIC - Green Quarter-size Small Outline Package QSOP - Green 543AT 543CT 543DT Fast CMOS Octal Latched Transceiver 74 – 40°C to +85°C for SALES: 800-345-7015 or 408-284-8200 fax: 408-284-2775 www.idt.com 7 for Tech Support: [email protected]