ID 06-09-0105 REV A TEST AND EOL FLOWCHART H-GRADE FLOW TEST AND EOL FLOWCHART H-GRADE FLOW UPDATED 8/28/08 Vendor: Product: Package: Location of Wafer Fab: Assembly: Final Test: Q.C. Test: Source Accept Test: Quality Contact: FLOW CHART INCOMING Linear Technology Corporation CMOS or Bipolar Product All Package Types Linear Technology Corp., Milpitas, CA. or Camas, WA Linear Technology Corporation, Penang, or Malaysia or any approved assembly subcontractor Linear Technology Corp., Milpitas, CA., or Singapore Linear Technology Corp., Milpitas, CA., or Singapore Linear Technology Corp., Milpitas, CA., or Singapore Naib Girn, LTC Milpitas, CA (408) 432-1900 Ext. 2519 PROCESS STEP LTC INCOMING INSPECTION DESCRIPTION INSPECTION/TEST CRITERIA CHECK QUALITY OF PACKAGE DIMENSION INCOMING ASSEMBLED MATERIAL QUALITY INSPECTION AND GATE MANUFACTURING PROCESS QUALITY MONITOR / SURVEILLANCE REWORK METHOD & EQUIPMENT SAMPLING PLAN OPTICAL COMPARATOR & CALIPERS S/S = 2, ACC = 0 EXTERNAL VISUAL 3X TO 30X MICROSCOPE S/S 45, ACC = 0 MARK PERMANENCY (IF INK MARK) MIL-STD-883 METHOD 2015 S/S = 4, ACC = 0 SOLDERABILITY MIL-STD-883 METHOD 2003 S/S = 3, ACC = 0 DIE ATTACH QUALITY DIE SHEAR S/S = 11. ACC = 0 LEAD FATIGUE TEST LEAD FATIGUE TESTER S/S = 10, ACC = 0 SPC TECHNIQUE % LAR TREND CHART CLASS TEST ELECTRICAL TEST TEST TO GUARD BANDED DATASHEET TEST LIMITS INTEGRATED CIRCUIT TEST SYSTEM 100% MINIMUM YIELD CONTROL QA ELECTRICAL TEST @ +25°C ELECTRICAL QUALITY TEST TO GUARD BANDED DATASHEET TEST LIMITS INTEGRATED CIRCUIT TEST SYSTEM S/S = 315, ACC = 0 PPM CHART QA ELECTRICAL TEST @ +150°C OR AS SPECIFIED IN THE DATA SHEET ELECTRICAL QUALITY TEST TO GUARD BANDED DATASHEET TEST LIMITS INTEGRATED CIRCUIT TEST SYSTEM 100% PPM CHART QA ELECTRICAL TEST @ -40°C OR AS SPECIFIED IN THE DATA SHEET ELECTRICAL QUALITY TEST TO GUARD BANDED DATASHEET TEST LIMITS INTEGRATED CIRCUIT TEST SYSTEM S/S = 1000 ACC = 0 PPM CHART EXTERNAL VISUAL INSPECTION CHECK FOR PACKAGE QUALITY VISUAL: BENT LEADS, LEAD FORM CRITERIA, MOLD VOIDS/CRACKS ETC UNAIDED EYE 100% YIELD CHART QA POST PACK INSPECTION PACKAGE/PACK QUALITY INSPECTION VERIFY CORRECT TOP MARK, CORRECT PACK METHOD, CORRECT LABELING, EXTERNAL VISUAL INSPECTION, BENT LEADS 3X TO 10X MICROSCOPE INSPECTION S/S = 116, ACC = 0 % LAR AND PPM P.A. CHART QA SHIPBENCH INSPECTION PLANT CLEARANCE INSPECTION PAPERWORK CHECK, VERIFY CORRECT PART NUMBER AND QUANTITY UNAIDED EYE INSPECTION EVERY SHIPMENT SHIP TO CUSTOMER LINEAR TECHNOLOGY CORPORATION PAGE 1 OF 1