SSF47NS60H Main Product Characteristics: VDSS 600V RDS(on) 0.059ohm(typ.) ID 47A TO247 Schematic diagram Features and Benefits: High dv/dt and avalanche capabilities 100% avalanche tested Low input capacitance and gate charge Low gate input resistance Description: The SSF47NS60H series MOSFETs is a new technology,which combines an innovative super junction technology and advance process. This new technology achieves low Rdson, energy saving, high reliability and uniformity, superior power density and space saving. Absolute max Rating: Symbol Parameter Max. Units ID @ TC = 25°C Continuous Drain Current, VGS @ 10V① 47 ID @ TC = 100°C Continuous Drain Current, VGS @ 10V① 29.7 IDM Pulsed Drain Current② 142 Power Dissipation③ 208 W Linear Derating Factor 3.12 W/°C VDS Drain-Source Voltage 600 V VGS Gate-to-Source Voltage ± 30 V EAS Single Pulse Avalanche Energy @ L=40.2mH 1267.4 mJ IAS Avalanche Current @ L=20.6mH 9.5 A -55 to + 150 °C PD @TC = 25°C TJ TSTG Operating Junction and Storage Temperature Range ©Silikron Semiconductor CO.,LTD. 2015.03.20 www.silikron.com Version : 1.0 A page 1 of 8 SSF47NS60H Thermal Resistance Symbol Characterizes Typ. Max. Units RθJC Junction-to-case③ — 0.32 ℃/W RθJA Junction-to-ambient (t ≤ 10s) ④ — 50 ℃/W Electrical Characterizes @TA=25℃ unless otherwise specified Symbol Parameter Min. V(BR)DSS Drain-to-Source breakdown voltage 600 RDS(on) Static Drain-to-Source on-resistance VGS(th) Gate threshold voltage IDSS Drain-to-Source leakage current IGSS Gate-to-Source forward leakage Qg Typ. Max. Units — — V VGS = 0V, ID = 250μA — 0.059 0.07 Ω VGS=10V,ID = 23A 2 — 4 — 2.4 — — — 1 — — 50 — — 100 -100 — — Total gate charge — 125 — Qgs Gate-to-Source charge — 29 — Qgd Gate-to-Drain("Miller") charge — 46 — QSW Gate-to-Source crossover charge — 18 — td(on) Turn-on delay time — 36 — tr Rise time — 83 — td(off) Turn-Off delay time — 135 — tf Fall time — 17 — Ciss Input capacitance — 4000 — Coss Output capacitance — 8400 — Crss Reverse transfer capacitance — 770 — V μA nA Conditions VDS = VGS, ID = 250μA TJ = 125°C VDS =600V,VGS = 0V TJ = 125°C VGS =30V VGS = -30V ID = 47A, nC VDS=480V, VGS = 10V VGS=10V, VDS=400V, ns RGEN=8.2Ω ID=23A VGS = 0V pF VDS = 10V ƒ = 1MHz Source-Drain Ratings and Characteristics Symbol IS ISM Parameter Continuous Source Current (Body Diode) Pulsed Source Current (Body Diode) Min. Typ. Max. Units — — 47 A — — 141 A Conditions MOSFET symbol showing the integral reverse p-n junction diode. VSD Diode Forward Voltage — — 1.2 V IS=20A, VGS=0V trr Reverse Recovery Time — 470 — ns TJ = 25°C, IF =23.5A, di/dt = Qrr Reverse Recovery Charge — 8.7 — uC 80A/μs ©Silikron Semiconductor CO.,LTD. 2015.03.20 www.silikron.com Version : 1.0 page 2 of 8 SSF47NS60H Test circuits and Waveforms Switch Waveforms: Notes: ①The maximum current rating is limited by bond-wires. ②Repetitive rating; pulse width limited by max. junction temperature. ③The power dissipation PD is based on max. junction temperature, using junction-to-case thermal resistance. ④The value of RθJA is measured with the device mounted on 1in 2 FR-4 board with 2oz. Copper, in a still air environment with TA =25°C ©Silikron Semiconductor CO.,LTD. 2015.03.20 www.silikron.com Version : 1.0 page 3 of 8 SSF47NS60H Typical electrical and thermal characteristics Figure 1: Power Figure 2. Typ. Gate to source cut-off voltage dissipation Figure 3. Typ. Gate charge ©Silikron Semiconductor CO.,LTD. Figure 4: Typ. Capacitances 2015.03.20 www.silikron.com Version : 1.0 page 4 of 8 SSF47NS60H Typical electrical and thermal characteristics Figure 5. Typ. Output Characteristics Figure 7. Typ. Transfer Characteristics ©Silikron Semiconductor CO.,LTD. Figure 6. Drain-source on-state resistance Figure 8. Drain-source on-state resistance 2015.03.20 www.silikron.com Version : 1.0 page 5 of 8 SSF47NS60H Mechanical Data: TO247 PACKAGE OUTLINE DIMENSION ©Silikron Semiconductor CO.,LTD. 2015.03.20 www.silikron.com Version : 1.0 page 6 of 8 SSF47NS60H Ordering and Marking Information Device Marking: SSF47NS60H Package (Available) TO247 Operating Temperature Range C : -55 to 150 ºC Devices per Unit Package Type TO247 Units/ Tube Tubes/Inner Box 30 8 Reliability Test Program Test Item Conditions High Temperature Reverse Bias(HTRB) High Temperature Gate Bias(HTGB) Units/Inner Inner Box Boxes/Carton Box 240 5 Duration Sample Size Tj=125℃ to 175℃ @ 80% of Max VDSS/VCES/VR 168 hours 500 hours 1000 hours 3 lots x 77 devices Tj=150℃ or 175℃ @ 100% of Max VGSS 168 hours 500 hours 1000 hours 3 lots x 77 devices ©Silikron Semiconductor CO.,LTD. 2015.03.20 www.silikron.com Version : 1.0 Units/Carton Box 1200 page 7 of 8 SSF47NS60H ATTENTION: ■ ■ ■ ■ ■ ■ ■ ■ Any and all Silikron products described or contained herein do not have specifications that can handle applications that require extremely high levels of reliability, such as life-support systems, aircraft's control systems, or other applications whose failure can be reasonably expected to result in serious physical and/or material damage. 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Customer Service Worldwide Sales and Service: [email protected] Technical Support: [email protected] Suzhou Silikron Semiconductor Corp. 11A, 428 Xinglong Street, Suzhou Industrial Park, P.R.China TEL: (86-512) 62560688 FAX: (86-512) 65160705 E-mail: [email protected] ©Silikron Semiconductor CO.,LTD. 2015.03.20 www.silikron.com Version : 1.0 page 8 of 8