NCP81074A, NCP81074B Single Channel 10A High Speed Low-Side MOSFET Driver The NCP81074 is a single channel, low−side MOSFET driver. It is capable of providing large peak currents into capacitive loads. This driver can deliver a 7 A peak current at the Miller plateau region to help reduce the Miller effect during MOSFETs switching transitions. It exhibits a split output configuration allowing the user to control the turn on and turn off slew rates. This part is available in SOIC−8 and DFN8 2x2 mm packages. www.onsemi.com MARKING DIAGRAMS DFN8 MN SUFFIX CASE 506AA Features • • • • • • • • • High Current Drive Capability ±10 A TTL/CMOS Compatible Inputs Independent of Supply Voltage High Reverse Current Capability (10 A) Peak 4 ns Typical Rise and 4 ns Typical Fall Times with 1.8 nF Load Fast Propagation Delay Times of 15 ns with Input Falling and 15 ns with Input Rising Input Voltage Range from 4.5 V to 20 V Split Output Configuration Dual Input Design Offering Drive Flexibility These Devices are Pb−Free, Halogen Free/BFR Free and are RoHS Compliant Applications • • • • • • • • Server Power Telecommunication, Datacenter Power Synchronous Rectifier Switch Mode Power Supply DC/DC Converter Power Factor Correction Motor Drive Renewable Energy, Solar Inverter © Semiconductor Components Industries, LLC, 2015 November, 2015 − Rev. 3 1 XXMG G 1 XX = Specific Device Code M = Date Code G = Pb−Free Device (Note: Microdot may be in either location) 8 8 1 XXXXXX AYWW G SOIC−8 CASE 751 1 XXXXXX = Specific Device Code A = Assembly Location Y = Year WW = Work Week G = Pb−Free Package ORDERING INFORMATION See detailed ordering, marking and shipping information on page 2 of this data sheet. 1 Publication Order Number: NCP81074/D NCP81074A, NCP81074B ORDERING INFORMATION Device Temperature Range (5C) Marking Input Type Package Type Shipping† NCP81074AMNTBG −40 to +140 CL Fixed Digital Threshold DFN8 2x2 (Pb−Free) 3000 / Tape & Reel NCP81074BMNTBG −40 to +140 CM VDD Based Threshold DFN8 2x2 (Pb−Free) 3000 / Tape & Reel NCP81074ADR2G −40 to +140 NCP81074A Fixed Digital Threshold SOIC−8 (Pb−Free) 2500 / Tape & Reel NCP81074BDR2G −40 to +140 NCP81074B VDD Based Threshold SOIC−8 (Pb−Free) 2500 / Tape & Reel †For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specifications Brochure, BRD8011/D. BLOCK DIAGRAM Figure 1. NCP81074 Block Diagram www.onsemi.com 2 NCP81074A, NCP81074B PIN DESCRIPTION Pin No. Symbol 1 IN+ 2 GND Common ground. This ground should be connected very closely to the source of the power MOSFET. 3 GND Common ground. This ground should be connected very closely to the source of the power MOSFET. 4 OUTL Sink pin. Connect to Gate of MOSFET. 5 OUTH Source Pin. Connect to Gate of MOSFET. 6 VDD Power Supply Input Pin. 7 VDD Power supply Input Pin. IN− Inverting Input which has logic compatible threshold and hysteresis. If not used, this pin should be connected to either VDD or GND. It should not be left unconnected 8 Description Non−Inverting Input which has logic compatible threshold and hysteresis. If not used, this pin should be connected to either VDD or GND. It should not be left unconnected. Figure 2. TYPICAL APPLICATION CIRCUIT ABSOLUTE MAXIMUM RATINGS Value Parameter Supply Voltage VDD Output Current (DC) Min Max Unit −0.3 24 V Iout_dc 0.6 Iout_pulse 10 A Reverse Current (Pulse<1 ms) 10 Output Current (Pulse<0.5 ms) Input Voltage A A IN+, IN− −6 24 V Output Voltages OUTH, OUTL −0.3 VDD + 0.3 V Output Voltages (Pulse<0.5 ms) OUTH, OUTL −3.0 VDD + 3.0 V Junction Operation Temperature TJ −40 150 °C Tstg −65 Storage Temperature Electrostatic Discharge 160 Human body model, HBM 4000 Charge device model, CDM 1000 OUT Latch−up Protection 500 Moisture Sensitivity Level (MSL) V mA MSL1 Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. www.onsemi.com 3 NCP81074A, NCP81074B RECOMMENDED OPERATING CONDITIONS Rating Unit VDD supply Voltage Parameter 4.5 to 20 V IN+, IN− input voltages −5 to 20 V −40 to +140 °C Junction Temperature Range Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond the Recommended Operating Ranges limits may affect device reliability. Table 1. THERMAL INFORMATION Package Theta JA (5C/W) Theta JC (5C/W) DFN−8 2x2 80.3 11.9 SOIC−8 115 50 Table 2. ELECTRICAL CHARACTERISTICS (Note 1) (Typical values: VDD =12V, 1uF from VDD to GND,TA = TJ = −405C to 1405C, typical at TAMB = 255C, unless otherwise specified) Parameter SYMBOL Test Conditions MIN TYP MAX Unit VDD Under Voltage Lockout (rising) VCCR VDD rising 3.7 3.9 4.1 V VDD Under Voltage Lockout (Falling) VCCF VDD falling 3.4 3.6 3.8 V VDD Under Voltage Lockout (hysteresis) VCCH 300 IDD 1.2 SUPPLY VOLTAGE Operating Current (no switching) VDD Under Voltage Lockout to Output Delay (Note 1) VDD rising mV 2 mA ms 10 INPUTS NCP81074A High Threshold NCP81074A Low Threshold VIN_HYS VthH Input rising from logic low 1.9 2.1 2.3 V VthL Input falling from logic high 1.1 1.3 1.5 V Input Signal Hysteresis 0.8 V NCP81074B High Threshold VthH Input rising from logic low (VDD = 8 V to 12 V) VDD −3.5 VDD −3.1 VDD −2.7 V NCP81074B Low Threshold VthL Input falling from logic high (VDD = 8 V to 12 V) GND +2.6 GND +2.9 GND +3.2 V IN− Pull−up Resistor Rin− 200 kW IN+ Pull−Down Resistor Rin+ 200 kW OUTPUTS Output Resistance High ROH IOUT = −10 mA 0.4 0.8 W Output Resistance Low ROL IOUT = +10 mA 0.4 0.8 W Peak Source Current(2) ISource OUT = GND 200 ns Pulse 10 A Miller Plateau Source Current(2) ISource OUT = 5.0 V 200 ns Pulse 7 A Peak Sink Current(2) ISink OUT = VDD 200 ns Pulse 10 A Miller Plateau Sink Current(2) ISink OUT = 5.0 V 200 ns Pulse 7 A www.onsemi.com 4 NCP81074A, NCP81074B Table 2. ELECTRICAL CHARACTERISTICS (Note 1) (Typical values: VDD =12V, 1uF from VDD to GND,TA = TJ = −405C to 1405C, typical at TAMB = 255C, unless otherwise specified) Parameter SYMBOL Test Conditions Propagation Delay Time Low to High, IN Rising (IN to OUT) (Note 2) td1 Propagation Delay Time High to Low, IN Falling (IN to OUT) (Note 2) MIN TYP MAX Unit CLoad = 1.8 nF 15 27 ns td2 CLoad = 1.8 nF 15 27 ns Rise Time (Note 2) tr CLoad = 1.8 nF 4 7 ns Fall Time (Note 2) tf CLoad = 1.8 nF 4 7 ns SWITCHING CHARACTERISTICS Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product performance may not be indicated by the Electrical Characteristics if operated under different conditions. 1. All Limits are 100% tested at TAMB = 25 °C and guaranteed across temperature by design and statistical analysis. 2. Guaranteed by characterization. *See timing Waveforms. Table 3. LOGIC TRUTH TABLE IN+ IN− OUTH OUTL OUT (OUTH & OUTL CONNECTED TOGETHER) L L HIGH−Z L L L H HIGH−Z L L H L H HIGH−Z H H H HIGH−Z L L Figure 3. Non−inverting Input Driver Operation Figure 4. Inverting Input Driver Operation www.onsemi.com 5 NCP81074A, NCP81074B TYPICAL CHARACTERISTICS 250 100 200 150 4.7 nF 100 2.2 nF 470 pF 50 1 nF 0 0 70 60 4.7 nF 50 40 30 2.2 nF 20 1 nF 10 0 470 pF 0 200 400 600 800 1000 1200 1400 1600 1800 2000 SWITCHING FREQUENCY (kHz) SWITCHING FREQUENCY (kHz) Figure 5. Supply Current vs. Switching Frequency, VDD = 12 V Figure 6. Supply Current vs. Switching Frequency, VDD = 4.5 V 8.0 4.75 7.5 20 V 4.25 15 V 4.00 5V 3.75 10 V RISE TIME (nS) 4.50 5V 6.5 15 V 6.0 10 V 5.5 5.0 3.25 4.5 3.00 −60 −40 −20 0 20 40 4.0 −60 −40 −20 80 100 120 140 160 60 20 V 7.0 3.50 0 20 40 60 80 100 120 140 160 TEMPERATURE (°C) TEMPERATURE (°C) Figure 7. Fall Time vs. Temperature CLOAD = 1.8 nF Figure 8. Rise Time vs. Temperature Cload = 1.8 nF 18 16 17 15 16 14 TD2, DELAY TIME (nS) FALL TIME (nS) 80 200 400 600 800 1000 1200 1400 1600 1800 2000 5.00 TD1, DELAY TIME (nS) 10 nF 90 SUPPLY CURRENT (mA) SUPPLY CURRENT (mA) 10 nF 15 14 13 CLOAD = 1 nF CLOAD = 2.2 nF CLOAD = 4.7 nF CLOAD = 10 nF 12 11 13 12 11 10 CLOAD = 1 nF CLOAD = 2.2 nF CLOAD = 4.7 nF CLOAD = 10 nF 9 8 10 7 4 6 8 10 12 14 16 18 20 4 6 8 10 12 14 16 18 20 VDD, SUPPLY VOLTAGE (V) VDD, SUPPLY VOLTAGE (V) Figure 9. Propagation Delay TD1 vs. Supply Voltage Figure 10. Propagation Delay TD2 vs. Supply Voltage www.onsemi.com 6 NCP81074A, NCP81074B TYPICAL CHARACTERISTICS 200 200 180 2 MHz 160 SUPPLY CURRENT (mA) SUPPLY CURRENT (mA) 180 140 120 100 80 1 MHz 60 40 140 120 100 80 60 40 20 0 20 0 4 6 8 12 10 14 16 18 4 20 6 8 10 12 14 16 18 20 SUPPLY VOLTAGE (V) SUPPLY VOLTAGE (V) Figure 11. Supply Current vs. Supply Voltage CLOAD = 2.2 nF Figure 12. Supply Current vs. Supply Voltage CLOAD = 4.7 nF 20 16 Test Conditions: TJ = 25°C 1 ms Positive Pulse Fsw = 1 kHz 12 10 8 6 4 16 14 12 10 8 6 4 2 2 0 −3.0 0 0 0.5 1.0 Test Conditions: TJ = 25°C 1 ms Positive Pulse Fsw = 1 kHz 18 OUTPUT CURRENT (A) 14 1.5 2.0 2.5 3.0 −2.5 −2.0 −1.5 −1.0 −0.5 OUT H − VDD (V) OUT L (V) Figure 13. Reverse Current, PMOS(on), PMOS(off) Figure 14. Reverse Current, PMOS(off), PMOS(on) 1.6 IN+ = VDD 1.4 SUPPLY CURRENT (A) OUTPUT CURRENT (A) 160 GND and VDD 1.2 IN− = VDD 1.0 0.8 0.6 0.4 0.2 0 0 5 10 15 20 SUPPLY VOLTAGE (V) Figure 15. Supply Current vs. Supply Voltage www.onsemi.com 7 25 0 NCP81074A, NCP81074B BENCH WAVEFORMS − Non−Inverting Input Figure 16. Rise Time with 1.8 nF Load Figure 17. Fall Time with 1.8 nF Load Figure 18. Propagation Delays with 1.8 nF Load Figure 19. Propagation Delays with 1.8 nF Load www.onsemi.com 8 NCP81074A, NCP81074B BENCH WAVEFORMS − Inverting Input Figure 20. Rise Time with 1.8 nF Load Figure 21. Fall Time with 1.8 nF Load Figure 22. Propagation Delays with 1.8 nF Load Figure 23. Propagation Delays with 1.8 nF Load www.onsemi.com 9 NCP81074A, NCP81074B PCB LAYOUT RECOMMENDATION Proper component placement is extremely important in high current, fast switching applications to provide appropriate device operation and design robustness. The NCP81074 gate driver exhibits a powerful output stage enabling large peak currents with fast rise and fall times. Eventhough the NCP81074 provides a split output configuration for slew rate control, a proper PCB layout is crucial to ensure maximum performance. The following circuit layout guidelines are strongly recommended when designing with the NCP81074. • Place the driver close to the power MOSFET in order to have a low impedance path between the output pins and the gate. Keep the traces short and wide to minimize the parasitic inductance and accommodate for high peak currents. • Place the decoupling capacitor close to the gate drive IC. Placing the VDD capacitor close to the pin and ground improves noise filtering. This capacitor supplies • • • high peak currents during the turn−on transition of the MOSFET. Using a low ESL chip capacitor is highly recommended. Keep a tight turn−on turn−off current loop paths to minimize parastic inductance. High di/dt will induce voltage spikes on the output pin and the MOSFET gate. Parallel the source and return signals taking advantage of flux cancellation. Since the NCP81074 is a 2x2mm package driving high peak currents into capacitive loads, adding a shielding ground plane helps in power dissipation and noise blocking. The ground plane should not be a current carrying path to any of the current loops. Any unused pin, should be pulled to either rail depending on the functionality of the pin to avoid any malfunction on the output. Please refer to the pin description table for more information. Figure 24. www.onsemi.com 10 NCP81074A, NCP81074B PACKAGE DIMENSIONS DFN8 2x2 CASE 506AA ISSUE E D PIN ONE REFERENCE 0.15 C 2X 0.10 C NOTES: 1. DIMENSIONING AND TOLERANCING PER ASME Y14.5M, 1994 . 2. CONTROLLING DIMENSION: MILLIMETERS. 3. DIMENSION b APPLIES TO PLATED TERMINAL AND IS MEASURED BETWEEN 0.15 AND 0.20 MM FROM TERMINAL TIP. 4. COPLANARITY APPLIES TO THE EXPOSED PAD AS WELL AS THE TERMINALS. L L L1 ÇÇ ÇÇ 0.15 C 2X A B DETAIL A E OPTIONAL CONSTRUCTIONS ÉÉ ÉÉ EXPOSED Cu TOP VIEW A DETAIL B DIM A A1 A3 b D D2 E E2 e K L L1 MOLD CMPD DETAIL B OPTIONAL CONSTRUCTION 0.08 C (A3) NOTE 4 A1 C SIDE VIEW SEATING PLANE MILLIMETERS MIN MAX 0.80 1.00 0.00 0.05 0.20 REF 0.20 0.30 2.00 BSC 1.10 1.30 2.00 BSC 0.70 0.90 0.50 BSC 0.30 REF 0.25 0.35 −−− 0.10 RECOMMENDED SOLDERING FOOTPRINT* DETAIL A D2 1 8X 8X L 1.30 4 0.50 PACKAGE OUTLINE E2 0.90 K 8 5 8X e/2 e 2.30 b 1 0.10 C A B 0.05 C 8X NOTE 3 0.30 BOTTOM VIEW 0.50 PITCH DIMENSIONS: MILLIMETERS *For additional information on our Pb−Free strategy and soldering details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D. www.onsemi.com 11 NCP81074A, NCP81074B PACKAGE DIMENSIONS SOIC−8 NB CASE 751−07 ISSUE AK NOTES: 1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982. 2. CONTROLLING DIMENSION: MILLIMETER. 3. DIMENSION A AND B DO NOT INCLUDE MOLD PROTRUSION. 4. MAXIMUM MOLD PROTRUSION 0.15 (0.006) PER SIDE. 5. DIMENSION D DOES NOT INCLUDE DAMBAR PROTRUSION. ALLOWABLE DAMBAR PROTRUSION SHALL BE 0.127 (0.005) TOTAL IN EXCESS OF THE D DIMENSION AT MAXIMUM MATERIAL CONDITION. 6. 751−01 THRU 751−06 ARE OBSOLETE. NEW STANDARD IS 751−07. −X− A 8 5 S B 0.25 (0.010) M Y M 1 4 K −Y− G C N DIM A B C D G H J K M N S X 45 _ SEATING PLANE −Z− 0.10 (0.004) H M D 0.25 (0.010) M Z Y S X J SOLDERING FOOTPRINT* S MILLIMETERS MIN MAX 4.80 5.00 3.80 4.00 1.35 1.75 0.33 0.51 1.27 BSC 0.10 0.25 0.19 0.25 0.40 1.27 0_ 8_ 0.25 0.50 5.80 6.20 INCHES MIN MAX 0.189 0.197 0.150 0.157 0.053 0.069 0.013 0.020 0.050 BSC 0.004 0.010 0.007 0.010 0.016 0.050 0 _ 8 _ 0.010 0.020 0.228 0.244 1.52 0.060 7.0 0.275 4.0 0.155 0.6 0.024 1.270 0.050 SCALE 6:1 mm Ǔ ǒinches *For additional information on our Pb−Free strategy and soldering details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D. 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