A1340 High Precision Programmable Linear Hall Effect Sensor IC with EEPROM, Analog Output, and Advanced Output Linearization FEATURES AND BENEFITS DESCRIPTION • Advanced 32-segment output linearization functionality enables high output accuracy and linearity in the presence of non-linear input magnetic fields • Customer adjustable sensitivity and offset, bandwidth, output clamps, and 1st and 2nd order temperature compensation • Simultaneous programming of all parameters for accurate and efficient system optimization • Factory trimmed magnetic input range (coarse sensitivity) and signal offset • Sensitivity temperature coefficient and magnetic offset drift preset at Allegro, for maximum device accuracy without requiring customer temperature testing • Temperature-stable, mechanical stress immune, and extremely low noise device output via proprietary four-phase chopper stabilization and differential circuit design techniques • Diagnostics for open circuit and undervoltage • Wide ambient temperature range: –40°C to 150°C • Operates with 4.5 to 5.5 V supply voltage The A1340 device is a high precision, programmable Hall effect linear sensor integrated circuit (IC) for both automotive and non-automotive applications. The signal path of the A1340 provides flexibility through external programming that allows the generation of an accurate, and customized output voltage from an input magnetic signal. The A1340 provides 12 bits of output resolution, and supports a maximum bandwidth of 3 kHz. Package: 4-pin SIP (suffix KT) A key feature of the A1340 is its ability to produce a highly linear device output for nonlinear input magnetic fields. To achieve this, the device divides the output into 32 equal segments and applies a unique linearization coefficient factor to each segment. Linearization coefficients are stored in a look-up table in EEPROM. 1 mm case thickness The BiCMOS, monolithic integrated circuit incorporates a Hall sensor element, precision temperature-compensating circuitry to reduce the intrinsic sensitivity and offset drift of the Hall element, a small-signal high-gain amplifier, proprietary dynamic offset cancellation circuits, and advanced output linearization circuitry. With on-board EEPROM and advanced signal processing functions, the A1340 provides an unmatched level of customer reprogrammable options for characteristics such as gain and offset, bandwidth, and output clamps. Multiple input magnetic range and signal offset choices can be preset at the factory. In addition, the device supports separate hot and cold, 1st and 2nd order temperature compensation. The A1340 sensor is available in a lead (Pb) free 4-pin single in-line package (KT suffix), with 100% matte tin leadframe plating. Not to scale Analog Subsystem Digital Signal Processing Output Stage ...00110011... Magnetic Signal 12-bit Hall Element Factory Preset Magnetic Range and Signal Offset A to D Conversion Bandwidth and Temperature Compensation Sensitivity and Fine Offset Adjustment Linearization Clamps Figure 1: A1340 Signal Processing Path. D to A Conversion Functions with programmable parameters indicated by double-headed arrows. A1340-DS, Rev. 2 Output Voltage 12-bit Output Driver A1340 Selection Guide Part Number A1340LKTTN-4-T High Precision Programmable Linear Hall Effect Sensor IC with EEPROM, Analog Output, and Advanced Output Linearization Packing* 4000 pieces per 13-in. reel *Contact Allegro™ for additional packing options Specifications Absolute Maximum Ratings Thermal Characteristics Functional Block Diagram Pin-out Diagram and Terminal List Electrical Characteristics Magnetic Characteristics Programmable Characteristics Thermal Characteristics Characteristic Performance Functional Description Signal Processing Parameter Setting Digital Signal Processing Bandwidth Selection Temperature Compensation Digital Output Sensitivity (Gain) Adjustment Output Fine Offset Adjustment Linearization of Output Output Polarity Output Signal Clamps Setting Protection Features Typical Application Programming Serial Interface Transaction Types Writing the Access Code Writing to Non-Volatile EEPROM 3 3 3 4 4 5 6 7 10 11 14 14 14 14 14 16 16 16 17 18 18 18 19 19 19 19 Table of Contents Writing to Volatile Registers 20 Reading from EEPROM 20 Error Checking 20 Serial Interface Reference 21 Serial Interface Message Structure 22 Read23 Read Acknowledge 24 Write24 Write Access Code 25 Write Disable Code 25 Write Enable Code 26 EEPROM Structure 27 Definitions of Terms 37 Package Outline Drawing 40 EEPROM Customer-Programmable Parameter Reference 29 Power-On Time, tPO37 Respnse TIme, tRESP37 Quiescent Voltage Output (QVO), VOUT(Q)37 Sensitivity, Sens 37 Magnetic Offset Drift Through Temperature Range 37 Sensitivity Drift Through Temperature Range 38 Sensitivity Drift Due to Package Hysteresis, DSensPKG38 Linearity Sensitivity Error 38 Ratiometric38 Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 2 A1340 High Precision Programmable Linear Hall Effect Sensor IC with EEPROM, Analog Output, and Advanced Output Linearization SPECIFICATIONS Absolute Maximum Ratings Characteristic Symbol Notes Rating Unit Forward Supply Voltage VCC 19 V Reverse Supply Voltage VRCC –20 V Forward Supply Current ICC 30 mA Reverse Supply Current IRCC –30 mA Forward Output Voltage (VOUT Pin) VOUT 29 V Reverse Output Voltage (VOUT Pin) VROUT –0.5 V ISINK 50 mA Forward Output Sink Current (VOUT Pin) Maximum Number of EEPROM Write Cycles Maximum voltage depends on programmed voltage settings EEPROMW(max) 100 cycle Operating Ambient Temperature TA –40 to 150 ºC Maximum Junction Temperature TJ(max) 165 ºC Tstg –65 to 165 ºC Storage Temperature L temperature range Thermal Characteristics may require derating at maximum conditions, see application information Characteristic Symbol Test Conditions* Value Unit Package Thermal Resistance RθJA 1-layer PCB with copper limited to solder pads 174 ºC/W *Additional thermal information available on the Allegro website. Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 3 High Precision Programmable Linear Hall Effect Sensor IC with EEPROM, Analog Output, and Advanced Output Linearization A1340 VCC UVLO Factory Coarse Sensitivity and Magnetic Range Setting POR Analog Regulator Factory Coarse Offset Trim Digital Regulator Clock Generator EEPROM Analog Front End Digital Subsystem ADC Hall Element Serial Decode Anti-Alias Filter Temperature Sensor ADC Precision Reference A/D 12 12 Serial Interface Bandwidth Select Temperature Compensation HV Pulse Master Control Digital Sensitivity and Offset Trim Pulse Detect EEPROM Control Scan/ IDDQ Linearization Clamp DAC Driver VOUT GND Functional Block Diagram Pin-out Diagram and Terminal List Table Terminal List Table 1 Number Name 1 VCC 2 VOUT 3 NC 4 GND Function Input power supply, use bypass capacitor to connect to ground Analog output pin; EEPROM strobe input Not connected; connect to GND for optimal ESD performance Device ground 2 3 4 Package KT, 4-Pin SIP Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 4 A1340 High Precision Programmable Linear Hall Effect Sensor IC with EEPROM, Analog Output, and Advanced Output Linearization ELECTRICAL CHARACTERISTICS: valid through full operating temperature range, TA , and supply voltage, VCC , CBYPASS = 10 nF, unless otherwise specified Characteristics Symbol Test Conditions Min. Typ. Max. Unit1 4.5 – 5.5 V General Electrical Characteristics Supply Voltage Supply Current Supply Zener Clamp Voltage Hall Chopping Frequency4 Undervoltage Lockout Threshold2 VCC ICC VZSUPPLY fC TA = 25°C; ICC = ICC(max) + 3 mA 5 – 15 mA 19 – – V TA = 25°C – 128 – kHz VCC(UV_low) TA = 25°C, UVLO falling 3.5 – 4.2 V VCC(UV_high) TA = 25°C, UVLO rising 3.7 – 4.45 V V Output Electrical Characteristics Output Saturation Voltage Output Current Limit Output Noise Peak to Peak3 VSAT(H) ROUT = 10 kΩ to GND, VCC – VOUT ,TA = 25°C – 0.2 0.3 VSAT(L) ROUT = 10 kΩ to VCC, TA = 25°C – 0.2 0.3 V ILIMIT(SNK) VOUT = VCC(max), TA = 25°C 25 35 42 mA ILIMIT(SRC) VOUT = GND, TA = 25°C –4 –1.6 – mA – 6 – mVpp Vnpp Output Zener Clamp Voltage VZOUT TA = 25°C 29 – – V Output Load Resistance4 RLOAD VOUT to VCC, VOUT to GND 10 – – kΩ Output Load Capacitance4,5 CLOAD VOUT to GND – – 10 nF BW = 3000 Hz – 0.6 0.75 ms BW = 1500 Hz – 1.1 1.4 ms BW = 375 Hz – 3.2 4.0 ms BW = 3000 Hz – 0.5 – ms BW = 1500 Hz – 0.9 – ms BW = 375 Hz – 3.24 – ms Power-On Time4,6,7 Response Time7,8 tPO tRESP 11 G (gauss) = 0.1 mT (millitesla). 2See Protection Features section. 3Capacitor of 10 nF connected between output and ground. 4Determined by design. 5Clarity of a Read Acknowledge message from the device to the controller will be affected by the amount of capacitance and wire inductance on the device output. In such case, it is recommended to slow down the communication speed, and to lower the receiver threshold for reading digital Manchester signal to 1 V. 6Defined as time from V CC reaching VCC(min) to VOUT reaching 90% of its steady state. See Definitions of Terms section. 7Parameter is verified by lab characterization with a limited amount of samples. 8Defined time from step in gauss of applied magnetic field to V OUT step reaching 90% of its steady state. See Definitions of Terms section. Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 5 High Precision Programmable Linear Hall Effect Sensor IC with EEPROM, Analog Output, and Advanced Output Linearization A1340 MAGNETIC CHARACTERISTICS: valid across full operating temperature range, TA , and supply voltage range, VCC , CBYPASS = 10 nF; unless otherwise specified Characteristics Factory Programmed Device Symbol Test Conditions Min. Typ. Max. Unit1 – ±300 – G Values2 Magnetic Input Signal Range BIN Magnetic Input Signal Offset BINOFFSET Output Sensitivity Quiescent Voltage Output Output Clamp Initial Voltage Sensitivity Drift Over Temperature3 Offset (QVO) Drift Over Temperature4 SENS_COARSE = 4 – 0 – V SENS_MULT = 0, TA = 25°C 8.08 8.33 8.58 mV/G BIN = 0 G, TA = 25°C 2.42 2.50 2.58 V VCLP(H)init – VCC – VSAT(H) – V VCLP(L)init – VSAT(L) – V TA = –40°C to 25°C – <±0.03 – %/°C TA = 25°C to 150°C – <±0.02 – %/°C TA = –40°C to 25°C – <±0.7 – mV/°C TA = 25°C to 150°C – <±0.1 – mV/°C Sens VOUT(Q) DSens DVOUT(Q) SIG_OFFSET = 0 11 G (gauss) = 0.1 mT (millitesla). 2Device performance is optimized for the input magnetic range of SENS_COARSE = 4 and input offset of SIG_OFFSET=0. If a different magnetic input range or signal offset is required, please see the tables in the section EEPROM Customer-Programmable Parameter Reference, near the end of this document. 3Does not include drift over lifetime and package hysteresis. 4Offset drifts with temperature changes will be altered from the factory programmed values if Magnetic Input Signal Range is changed. If changes in Magnetic Input Signal Range cannot be avoided because of application requirements, please contact Allegro for detailed information. Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 6 High Precision Programmable Linear Hall Effect Sensor IC with EEPROM, Analog Output, and Advanced Output Linearization A1340 PROGRAMMABLE CHARACTERISTICS: valid through full operating temperature range, TA , and supply voltage, VCC , CBYPASS = 10 nF, unless otherwise specified Characteristics Internal Bandwidth Symbol Test Conditions Min. Typ. Max. Unit1 – 2 – bit 375 – 3000 Hz TA = 25°C, measured as a percentage of BW – ±5 – % QVO_FINE – 12 – bit –1 – +1 V TA = 25°C, BIN = 0 G – 1.22 – mV SENS_COARSE = 4, Measured at VCC = 5 V, TA = 25°C 5 – 11.6 mV/G SENS_MULT – 12 – bit Programming2 Bandwidth Programming Bits BW Bandwidth Programming Range BW Bandwidth Post-Programming Tolerance ∆BW TA = 25°C; for programming values, see BW in EEPROM Structure section Fine Quiescent Voltage Output (QVO)2 Fine Quiescent Voltage Output Programming Bits Fine Quiescent Voltage Output Programming Range Fine Quiescent Voltage Output Programming Step Size QVO_FINE TA = 25°C, BIN = 0 G, VOUT(Q) = 2.5 V StepQVO_ FINE Output Sensitivity2 Output Sensitivity SENS_OUT Sensitivity Multiplier Programming Bits Sensitivity Multipler Programming Range SENS_MULT TA = 25°C 0 – 2 – Sensitivity Multiplier Programming Step Size StepSENS_ TA = 25°C MULT – 0.00048 – – – 33 – data sampling point LIN_x, programmed with output fitting method – 12 – bit Output Polarity Bit LIN_OUTPUT_INVERT – 1 – bit Input Polarity Bit LIN_INPUT_INVERT – 1 – bit Linearization2 Linearization Positions Linearization Position Coefficient Bits LINPOS_ COEFF Continued on the next page… Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 7 High Precision Programmable Linear Hall Effect Sensor IC with EEPROM, Analog Output, and Advanced Output Linearization A1340 PROGRAMMABLE CHARACTERISTICS (continued): valid through full operating temperature range, TA , and supply volt- age, VCC , CBYPASS = 10 nF, unless otherwise specified Characteristics Symbol Temperature Compensation Test Conditions Min. Typ. Max. Unit1 TC1_SENS_CLD, TA = –40°C – 8 – bit TC1_SENS_HOT, TA = 150°C (TC)2 1st Order Sensitivity TC Programming Bits – 8 – bit Typical 1st Order Sensitivity TC Programming Range3 TC1_SENS_ CLD TC1_SENS_ HOT – 98 – +291 m%/°C Typical 1st Order Sensitivity TC Programming Step Size3 StepTC1SENS – 1.53 – m%/°C 2nd Order Sensitivity TC Programming Bits Typical 2nd Order Sensitivity TC Programming Range4 TC2_SENS_CLD, TA = –40°C – 9 – bit TC2_SENS_HOT, TA = 150°C – 9 – bit –1.53 – +1.53 m%/°C2 – 0.00596 – m%/°C2 – 8 – bit –122 – +122 mG/°C – 0.954 – mG/°C TC2_SENS_ CLD TC2_SENS_ HOT 2nd Order Sensitivity TC Programming StepTC2SENS Step Size4 1st Order Magnetic Offset TC Programming Bits Typical 1st Order Magnetic Offset TC Programming Range 1st Order Magnetic Offset TC Step Size TC1_OFFSET TC1_OFFSET StepTC1_ OFFSET Output Clamping Range2 Clamp Programming Bits Output Clamp Programming Range5 Clamp Programming Step Size CLAMP_HIGH – 6 – bit CLAMP_LOW – 6 – bit VCLP(H) CLAMP_HIGH, measured as VOUT , TA = 25°C, VCC = 5 V 2.54 – VCC – VSAT(H) V VCLP(L) CLAMP_LOW, measured as VOUT , TA = 25°C, VCC = 5 V VSAT(L) – 2.46 V StepCLP(H) Measured as ΔVOUT , TA = 25°C – 39 – mV StepCLP(L) Measured as ΔVOUT , TA = 25°C – 39 – mV Continued on the next page… Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 8 A1340 High Precision Programmable Linear Hall Effect Sensor IC with EEPROM, Analog Output, and Advanced Output Linearization PROGRAMMABLE CHARACTERISTICS (continued): valid through full operating temperature range, TA , and supply volt- age, VCC , CBYPASS = 10 nF, unless otherwise specified Characteristics Symbol Test Conditions Min. Typ. Max. Unit1 –1 – 1 % – <±1 – % – ±2 – % <±0.5 – % Accuracy Linearity Sensitivity Error LinERR Sensitivity Drift Due to Package Hysteresis Variation on final programmed Sensitivity value; ∆SensPKG measured at TA = 25°C after temperature cycling from 25°C to 150°C and back to 25°C Sensitivity Drift Over Lifetime ∆SensLIFE Ratiometry Quiescent Voltage Output Error RatVOUTQERR Ratiometry Sensitivity Error RatSENSERR – <±1 – % Ratiometry Clamp Error RatCLPERR – <±1 – % TA = 25°C, shift after AEC Q100 grade 0 qualification testing – 11 G (gauss) = 0.1 mT (millitesla). by design. unit m% / C means: (10–3 × %) / C. 4The unit m% / C2 means: (10–3 × %) / C2. 5Clamp_High minimum value trim can not be lower than QVO trim. Clamp_Low maximum value trim can not be higher than QVO trim. 2Determined 3The Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 9 A1340 High Precision Programmable Linear Hall Effect Sensor IC with EEPROM, Analog Output, and Advanced Output Linearization Thermal Characteristics may require derating at maximum conditions Characteristic Symbol Package Thermal Resistance Test Conditions* 1-layer PCB with copper limited to solder pads RθJA Value Units 174 ºC/W *Additional thermal information available on Allegro website. Power Dissipation versus Ambient Temperature 1100 Power Dissipation, PD (mW) 1000 900 800 1-layer PCB, Package KT (RθJA = 174 C/W) 700 600 500 400 300 200 100 0 20 40 60 80 100 120 140 160 180 Temperature (°C) Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 10 High Precision Programmable Linear Hall Effect Sensor IC with EEPROM, Analog Output, and Advanced Output Linearization A1340 CHARACTERISTIC PERFORMANCE Average Supply Current (On) versus Temperature 12.0 12.0 11.6 11.6 11.2 TA (°C) 10.8 -40 10.4 0 -20 25 10.0 50 9.6 75 9.2 125 100 150 8.8 8.4 8.0 4.0 4.5 5.0 5.5 Supply Current, ICC(av) (mA) Supply Current, ICC(av) (mA) Average Supply Current versus Supply Voltage VCC (V) 11.2 4.5 10.8 5.0 5.5 10.4 10.0 6.0 9.6 9.2 8.8 8.4 8.0 -60 -40 -20 Supply Voltage, VCC (V) Output Saturation Voltage (Low) versus Average Supply Voltage 40 60 80 100 120 140 160 300 250 TA (°C) -40 -20 200 0 25 50 150 75 100 125 100 150 50 0 4.0 4.5 5.0 5.5 Output Saturation Voltage, VSAT(L) (mV) Output Saturation Voltage, VSAT(L) (mV) 20 Output Saturation Voltage (Low) versus Average Temperature 300 250 200 VCC (V) 4.5 150 5.0 5.5 100 50 0 -60 6.0 -40 Supply Voltage, VCC (V) -20 200 0 25 50 150 75 100 125 100 150 50 Supply Voltage, VCC (V) 5.5 6.0 Output Saturation Voltage, VSAT(H) (mV) TA (°C) -40 5.0 20 40 60 80 100 120 140 160 300 250 4.5 0 Output Saturation Voltage (High) versus Average Temperature 300 0 4.0 -20 Ambient Temperature, TA (°C) Output Saturation Voltage (High) versus Average Supply Voltage Output Saturation Voltage, VSAT(H) (mV) 0 Ambient Temperature, TA (°C) 250 200 VCC (V) 4.5 150 5.0 5.5 100 50 0 -60 -40 -20 0 20 40 60 80 100 120 140 160 Ambient Temperature, TA (°C) Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 11 High Precision Programmable Linear Hall Effect Sensor IC with EEPROM, Analog Output, and Advanced Output Linearization A1340 8.580 0.040 Average + 3 sigma 0.020 Average 0.010 0 -0.010 Average – 3 sigma -0.020 -0.030 -0.040 -0.050 -80 Factory Programmed Sensitivity versus Ambient Temperature 8.530 0.030 Sensitivity, Sens (mV/G) Sensitivity Drift, ∆Sens (%/°C) 0.050 Factory Programmed Sensitivity Drift versus Ambient Temperature ∆TA relative to TA = 25°C -60 -40 -20 0 20 40 60 80 100 120 8.480 8.430 8.380 Average 8.280 8.230 Average – 3 sigma 8.180 8.130 8.080 -60 140 Average + 3 sigma 8.330 -40 Factory Programmed Quiescent Voltage Output Drift versus Ambient Temperature 0.300 QVO, VOUT(Q) (V) QVO (mV/°C) 40 60 80 100 120 140 160 2.580 Average + 3 sigma Average 0.100 -0.200 -0.300 Average – 3 sigma -0.500 ∆TA relative to TA = 25°C -60 -40 -20 0 20 40 60 80 100 2.540 Average + 3 sigma 2.520 2.500 2.460 2.440 120 2.420 -60 140 -40 -20 1.0 0.2 Average VCC (V) 4.5 5.5 Average – 3 sigma -2.0 -0.3 -20 -20 0 0 20 20 40 40 60 60 80 80 100 100 Ambient Temperature, TA (°C) Ambient Temperature, TA (°C) 120 120 140 140 160 160 Linearity (%) (%) Sensitivity Ratiometry 0.3 -40 -40 40 60 80 100 120 140 160 0.5 0.4 2.0 -0.1 -1.0 -0.2 20 Negative Linearity versus Ambient Temperature Average Sensitivity Ratiometry versus Ambient Temperature 3.0 0.5 Average + 3 sigma 0 Ambient Temperature, TA (°C) Positive Linearity versus Ambient Temperature Average Quiescent Voltage Output Ratiometry versus Ambient Temperature 3.0 0.1 0 0 Average Average – 3 sigma 2.480 Change in Ambient Temperature, ∆TA (°C) QVO Linearity Ratiometry (%)(%) 20 2.560 0.500 -0.4 -3.0 -0.5-60 -60 0 Factory Programmed Quiescent Voltage Output versus Ambient Temperature 0.700 -0.700 -80 -20 Ambient Temperature, TA (°C) Change in Ambient Temperature, ∆TA (°C) 0.4 2.0 0.3 1.0 0.2 Average Average + 3 sigma 0.1 0 0 VCC (V) 4.5 5.5 -0.1 -1.0 -0.2 Average – 3 sigma -2.0 -0.3 -0.4 -3.0 -0.5-60 -60 -40 -40 -20 -20 0 0 20 20 40 40 60 60 80 80 100 100 Ambient Temperature, TA (°C) Ambient Temperature, TA (°C) 120 120 140 140 Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 160 160 12 2.560 Average + 3 sigma 0.300 Average 0.100 A1340 -0.200 -0.300 Average – 3 sigma -0.500 -0.700 -80 QVO, VOUT(Q) (V) QVO (mV/°C) 0.500 -40 -20 0 20 Average + 3 sigma 2.520 40 60 80 100 2.500 Average – 3 sigma 2.480 2.460 2.440 120 2.420 -60 140 -40 -20 Change in Ambient Temperature, ∆TA (°C) 0.5 0.4 0.4 0.3 0.2 VCC (V) 0.1 4.5 0 5.5 -0.1 -0.2 -0.3 -0.4 -20 0 20 40 60 80 100 Ambient Temperature, TA (°C) 120 140 160 Sensitivity Ratiometry (%) QVO Ratiometry (%) 0.5 -40 0 20 40 60 80 100 120 140 160 Ambient Temperature, TA (°C) Average Quiescent Voltage Output Ratiometry versus Ambient Temperature -0.5 -60 Average High Precision Programmable Linear Hall Effect Sensor IC with EEPROM, Analog Output, and Advanced Output Linearization ∆TA relative to TA = 25°C -60 2.540 Average Sensitivity Ratiometry versus Ambient Temperature 0.3 0.2 VCC (V) 0.1 4.5 0 5.5 -0.1 -0.2 -0.3 -0.4 -0.5 -60 -40 -20 0 20 40 60 80 100 120 140 160 Ambient Temperature, TA (°C) Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 13 A1340 High Precision Programmable Linear Hall Effect Sensor IC with EEPROM, Analog Output, and Advanced Output Linearization FUNCTIONAL DESCRIPTION This section provides descriptions of the operating features and subsystems of the A1340. For more information on specific terms, refer to the Definitions of Terms section. Tables of EEPROM parameter values are provided in the EEPROM Structure section. Signal Processing Parameter Setting The A1340 has customer-programmable parameters that allow the user to optimize the signal processing performed by the A1340. Customer-programmable parameters apply to digital signal processing (DSP) stage. Programmed settings are stored in onboard EEPROM. The programming communication protocol is described in the Programming Serial Interface section. The initial analog processing is factory programmed to match the application environment in terms of magnetic field range and offset. This allows optimization of the electrical signal presented to the DSP stage: YAD (V) = SENS_COARSE (mV/G) × BIN + SIG_OFFSET (V) + VOUT(Q)(1) where: YAD is the output of the analog subsystem to the A-to-D converter, BANDWIDTH SELECTION The 3-dB bandwidth, BW , determines the frequency at which the DSP function imports data from the analog front end A-to-D convertor. It is programmed by setting the BW parameter in the EEPROM. The values chosen for BW and RANGE affect the DSP stage output resolution and the Response Time, tRESP . These tradeoffs are represented in the Electrical Characteristics table, above. TEMPERATURE COMPENSATION The magnetic properties of materials can be affected by changes in temperature, even within the rated ambient operating temperature range, TA . Any change in the magnetic circuit due to temperature variation causes a proportional change in the device output. The device can be compensated internally using the Temperature Compensation (TC) circuitry. TC coefficients can be programmed for Sensitivity and magnetic offset. The effect of temperature is referred to as drift. Table 1: Bandwidth-Related Tradeoffs Bandwidth Selection, BW (kHz) SENS_COARSE is the factory-set coarse sensitivity, BIN is the current magnetic input signal, DSP Output Resolution (bit) 0.375 12 1.500 11 to 12 3.000 10 to 11 SIG_OFFSET the factory-set signal offset, and The DSP stage provides customer-programmable sensitivity (gain) fine offset adjusting, TC processing, bandwidth, clamp, and linearization selection. Output is a digital voltage signal, proportional to the applied magnetic signal. Digital Signal Processing The digitized analog signal is digitally processed to optimize accuracy and resolution for conversion to the device output stage. An advanced linearization feature also is available. TC1_OFFSET (G/°C) VOUT(Q) is the quiescent voltage output with no factory compensation. QOUT TC 1_O FFS ET TC1_OFFSET Code 0 Min Cod e TC 1_O E FFS TM ax Cod e TA Figure 2: The 1st Order Magnetic Offset Temperature Compensation Coefficient (TC1_OFFSET) TC1_OFFSET is used for linear adjustment of device output for temperature changes. Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 14 High Precision Programmable Linear Hall Effect Sensor IC with EEPROM, Analog Output, and Advanced Output Linearization TC1_SENS(m%/C2) For magnetic offset, compensation for 1st Order Magnetic Offset TC, TC1_OFFSET , is a linear algorithm accounting for effects of ambient temperature changes during device operation (see Figure 2). It can be programmed using the TC1_OFFSET parameter in a range of ±122 mG/°C. This compensation is applied in DSP, after bandwidth selection. Sensitivity drift compensation is customer-programmed (described below), within a framework of programmed temperature compensation. Optional temperature compensation for Sensitivity can be applied using built-in first-order and second-order algorithms. Both approaches adjust the device gain in response to input signal drift by adding or subtracting a value. The coefficients are programmed separately for temperatures above 25°C and below 25°C, as shown in Table 2. The resulting functions are illustrated in figure 4). TC 25°C 1_S EN S_C LD Ma TC1_SENS_CLD Code 0 TC S_ 1_SEN CLD M xC TC ode in Cod 1_S EN H S_ OT Ma xC ode TC1_SENS_HOT Code 0 e TC1_SE NS_HO T Min C ode _S EN CL DM i n Co d e e EN T C2 _S T C2 _ S E S_H OT x Ma TC2_SENS_HOT Code 0 NS _ HO TM in C e 2_ NS L _C ax C od e od SE TC2_SENS_CLD Code 0 DM od 25°C S_ C T C2 TC1_SENS(m%/C2) TA TC A1340 TA Table 2: Sensitivity Temperature Compensation Options Figure 4: Sensitivity TC Functions: (upper) first order; (lower) second order TA Range < 25°C > 25°C 1st Order TC1_SENS_CLD TC1_SENS_HOT 2nd Order TC2_SENS_CLD TC2_SENS_HOT Sensitivity Multiplier /Fine QVO Adjustment TC Codes Applied for TA = 25°C Output Sensitivity and Offset Applied Linearization Linearization Coefficients Applied Clamps Are Set Figure 3: Signal Path for Digital Subsystem Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 15 High Precision Programmable Linear Hall Effect Sensor IC with EEPROM, Analog Output, and Advanced Output Linearization Either first-order or second-order, or both TC algorithms can be applied. To apply an algorithm, select non-zero coefficients for the corresponding EEPROM parameters (TC1_SENS_CLD and TC1_SENS_HOT for first-order, TC2_SENS_CLD and TC2_SENS_HOT for second order). If a method should not be used, set the corresponding EEPROM parameter values to zero. If both are selected, the A1340 applies the first-order, and then the second-order algorithm during this stage. The programmed values set the temperature compensation, YTC, according to the following formula: YTC (V) = YAD (V) + [ (TC1_SENS (m%/°C) × ΔTA (°C)) + (TC2_SENS (m%/°C2) × ΔTA2 (°C)) ] × ( YAD (V) – SIG_OFFSET (V) ) + TC1_OFFSET (G/°C) × SENS_COARSE_COEF × 5 (mV/G) × ΔTA (°C) (2) where: YAD is the input from the analog subsystem via the A-to-D converter, TC1_SENS is the first-order coefficient: either TC1_SENS_HOT or TC1_SENS_CLD depending on TA , TC2_SENS is the second-order coefficient: either TC2_SENS_ HOT or TC2_SENS_CLD depending on TA , ΔTA is the change in ambient temperature from 25°C (for example: at 150°C, ΔTA = 150°C – 25°C = 125°C, or at –40°C, ΔTA = –40°C – 25°C = –65°C), and SIG_OFFSET (set to 0) is the factory programmed addition to the magnetic offset parameter (sets the centerpoint of YAD ), and SENS_COARSE_COEF = SENS_COARSE(code 0) / SENS_COARSE(factory code) (sets the factory-programmed sensitivity of the YAD function). DIGITAL OUTPUT SENSITIVITY (GAIN) ADJUSTMENT Sensitivity is applied in the DSP subsystem, after bandwidth selection and temperature compensation. Note: If Sensitivity must be adjusted more than 20% from the nominal value, please consider switching input magnetic range for the optimization of A-to-D input. OUTPUT FINE OFFSET ADJUSTMENT The Fine Offset adjustment is the segment of the DSP signal used to trim the device output, VOUT . QVO_FINE is a customer-programmable parameter that sets the Quiescent Voltage Output, VOUT(Q) , which is device output when there is no significant applied magnetic field. The programmed value sets the DSP output, YDA , taking into account the selected Sensitivity: YDA = SENS_MULT × YTC (V) + QVO_FINE (V) (2) SENS_OUT (mV/G) = SENS_MULT × SENS (mV/G) (3) where SENS_MULT is the multiplication factor from 0.6 to 1.4. QVO_FINE is set as a percentage of VOUT . LINEARIZATION OF OUTPUT Magnetic fields are not always linear throughout the full range of target positions, such as in the case of ring magnet targets rotated in front of a non-back-biased linear Hall sensor IC, shown in Figure 5. The A1340 provides a programmable linearization feature that allows adjustment of the transfer characteristic of the device so that, as the actual position of the target changes, the resulting changes in the applied magnetic field can be output as corresponding linear increments. Device Output (%) A1340 100 90 80 70 60 50 40 30 20 10 0 -4 Initial Output Linearized Output -3 -2 -1 0 1 2 3 4 Ring Magnet Rotation (°) Figure 5: Example of Linearization of a Sinusoidal Magnetic Signal Generated by a Rotating Ring Magnet Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 16 High Precision Programmable Linear Hall Effect Sensor IC with EEPROM, Analog Output, and Advanced Output Linearization A1340 In order to achieve this, an initial set of linearization coefficients has to be created. The user takes 33 samples of BIN: at the start and at every 1/32 interval of the full input range. The user then enters these 33 values into the Allegro ASEK programming utility for the A1340, or an equivalent customer software program, and generates coefficients corresponding to the values. The user then uses the software load function to transmit the coefficients to the EEPROM (LINPOS_COEFF parameter). The user then sets the LIN_TABLE_DONE parameter to 1. Each of the coefficient values can be individually overwritten during normal operation. Figure 6 shows an example input-output curve. The y axis represents the 32 equal full scale position segments, and the x axis represents the the range of movement. When the A1340 is in operation, it applies a linearization curve built from the 33 coefficients provided by the user. For example, at position 5 the device originally would output 384 LSB of magnetic field internal to device before the D-to-A converter. This 384 LSB is treated as input to the inverse linearization function, after rescaling to the x axis as follows: (384 – 128(offset)) × [32 / (3968(LSBmax) – 128(LSBmin))] + 1 = 3.2 For x = 3.2, the inverse function will give output of 570 LSB which is right on the curve of the linear output signal. OUTPUT POLARITY Device Output Polarity can be changed using the linearization table, and the LIN_INPUT_INVERT and LIN_OUT_INVERT bits. In order to invert the device output polarity with no linearization, the linearization function must be set to gain 1 (linearization table coefficients are decimal values from 0 to 4096 with steps of 128 codes), and one of the bits LIN_INPUT_INVERT or LIN_OUT_INVERT must be set to 1. 4096 3968 3840 3712 3584 3456 Output Signal 3328 3200 Device Digital Output (LSBs) 3072 Input Signal 2944 2816 2688 2560 Linearization Function 2432 2304 2176 2048 1920 1792 1664 (2) Rescaled x = 3.2, yields LSB = 570 1536 1408 1280 1152 1024 896 768 640 (3) Final result is LSB = 570 for the input point 5 512 384 256 (1) x at 5, preprocessing LSB = 384 128 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 Positions Figure 6: Sample of Linearization Function Transfer Characteristic. Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 17 High Precision Programmable Linear Hall Effect Sensor IC with EEPROM, Analog Output, and Advanced Output Linearization A1340 If the goal is to change output polarity and apply linearization, the output polarity should be changed by setting the gain of the linearization function to 1 and setting the LIN_INPUT_INVERT bit to 1. Then user can collect 33 points for linearization and calculate the coefficients. After the coefficients are loaded into the device, successful linearization will be applied by leaving the LIN_INPUT_INVERT bit set to 1 and setting the LIN_TABLE _DONE bit to 1. OUTPUT SIGNAL CLAMPS SETTING To eliminate the effects of outlier points, the A1340 Clamp Range, VCLP , is initially set to a high limit of VCC – Vsat for high clamp and 0 V + Vsat for low clamp, and can be adjusted using the CLAMP_HIGH and CLAMP_LOW parameters. PROTECTION FEATURES Lockout and clamping features protect the A1340 internal circuitry and prevent spurious output when supply voltage is out of specification. Open circuit detection is also provided. Operating Undervoltage Lockout Lockout features protect the A1340 internal circuitry and prevent spurious output when VCC is out of specification. Diagnostic circuitry reuses the output pin (VOUT) to provide feedback to the external controller. The A1340 provides lockout protection for undervoltage on the supply line. Lockout features protect the A1340 internal circuitry and prevent spurious output when VCC is out of specification. Diagnostic circuitry reuses the output pin (VOUT) to provide feedback to the external controller. If the supply voltage drops below VCC(UV_low) the device internal lockout function isolates the onboard processing circuits and pulls the VOUT pin to a diagnostic level. As the supply voltage rises above VCC(UV_high) the diagnostic condition is removed. Open Circuit Detection Diagnostic circuitry reuses the output pin (VOUT) to provide feedback to the external controller if a resistor, ROCD , is placed between VOUT and a separate VBAT or ground reference, as shown in table 3. When an open circuit occurs on any combination of A1340 pins, a corresponding VOUT level is generated. TYPICAL APPLICATION Multiple A1340 linear devices can be connected to the external controller as shown in Figure 7. However, EEPROM programming in the A1340 occurs when the external control unit excites the A1340 VOUT pin by EEPROM pulses generated by the ECU. Whichever A1340s are excited by EEPROM pulses on their VOUT pin will accept commands from the controller. Table 3: Open Circuit Diagnostic Truth Table Node A Node B Node C VOUT State Open Closed Closed Closed 0 V to VBAT Open Closed VOUT(Q) Open Open Closed GND Open Closed Open VBAT Closed Open Open VCC Closed Closed Open VCC to VBAT Closed Open Closed VOUT(Q) Closed Closed Open 0 V to VCC Closed Open Open VCC Open Open Closed GND Open Closed Open GND Open Closed Closed GND VCC1 VBAT Referenced VBAT VCC A VCC A1340 B ROCD VOUT GND C 0.01 µF VCC A1340 VOUT OUT1 GND ECU VCC2 Ground Referenced VCC A VCC A1340 VOUT GND C ROCD B 0.01 µF VCC A1340 VOUT OUT2 GND Figure 7: Typical Application with Multiple A1340s Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 18 A1340 High Precision Programmable Linear Hall Effect Sensor IC with EEPROM, Analog Output, and Advanced Output Linearization PROGRAMMING SERIAL INTERFACE The A1340 incorporates a serial interface that allows an external controller to read and write registers in the A1340 EEPROM and volatile memory. The A1340 uses a point-to-point communication protocol, based on Manchester encoding per G. E. Thomas (a rising edge indicates 0 and a falling edge indicates 1), with address and data transmitted MSB first. Transaction Types Each transaction is initiated by a command from the controller; the A1340 does not initiate any transactions. Two commands are recognized by the A1340: Write and Read. There also are three special function Write commands: Write Access Code, Write Disable Output, and Write Enable Output. One response frame type is generated by the A1340, Read Acknowledge. If the command is Read, the A1340 responds by transmitting the requested data in a Read Acknowledge frame. If the command is any other type, the A1340 does not acknowledge. As shown in Figure 8, The A1340 receives all commands via the VCC pin. It responds to Read commands via the VOUT pin. This implementation of Manchester encoding requires the communication pulses be within a high (VMAN(H)) and low (VMAN(L)) range of voltages for the VCC line and the VOUT line. The Write command pulses to EEPROM are supported by two high voltage pulses on the VOUT line. Writing the Access Code If the external controller will write to or read from the A1340 memory during the current session, it must establish serial communication with the A1340 by sending a Write command including the Access Code within 70 ms after powering up the A1340. If this deadline is missed, all write and read access is disabled until the next power-up. Writing to Non-Volatile EEPROM When a Write command requires writing to non-volatile EEPROM (all standard Writes), after the Write command the controller must also send two Programming pulses, well-separated, long high-voltage strobes via the VOUT pin. These strobes are detected internally, allowing the A1340 to boost the voltage on the EEPROM gates. To ensure these strobes are properly received, the controller must suppress the normal device output on the VOUT pin (that is, the linear output voltage in response to magnetic field input). To do so, the external controller sends a Write Disable Output command before transmitting the strobes. This puts the VOUT pin into a high impedance state. After writing is complete, the controller must send an Write Enable Output command to restore VOUT to normal operation. The required sequence is shown in Figure 9. Write/Read Command – Manchester Code ECU High Voltage pulses to activate EEPROM cells VCC A1340 VOUT GND Read Acknowledge – Manchester Code Figure 8: Top-Level Programming Interface Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 19 High Precision Programmable Linear Hall Effect Sensor IC with EEPROM, Analog Output, and Advanced Output Linearization A1340 Writing to Volatile Registers Writing to the volatile register 0x24 is done for Write Access Code, Write Disable Output, and Write Enable Output commands. This requires the external controller to send the Write command on the VCC pin. Successive Write commands to volatile memory must be separated by tWRITE . The required sequence is shown in Figure 9. Reading from EEPROM For proper reading from the A1340, it is recommended that the output be disabled before a Read command is sent. Otherwise the external controller may continue to track the magnetic field input until the first edge of the Read Acknowledge frame. In that case the controller would be required to distinguish between the output associated with the magnetic field and the response to the Read command. To disable output, the external controller sends a Write Disable Output command before transmitting the Read command. This puts the VOUT pin into a high impedance state. After writing is complete, the controller must send a Write Enable Output command to restore VOUT to normal operation. After the Read VCC Write Access Command Disable Output Command Write to EEPROM VOUT Acknowledge frame has been received from the A1340, the controller must send a Write Enable Output command to restore VOUT to normal operation. The required sequence is shown in Figure 9. Error Checking The serial interface uses a cyclic redundancy check (CRC) for data-bit error checking (synchronization bits are ignored during the check). The CRC algorithm is based on the polynomial g(x) = x3 + x + 1 , and the calculation is represented graphically in Figure 10. The trailing 3 bits of a message frame comprise the CRC token. The CRC is initialized at 111. C0 C1 1x 0 1x 1 0x 2 1x 3 = x3 + x + 1 Figure 10: CRC Calculation Write Command EEPROM Programming Pulses Enable Output Command High Impedance High Impedance Normal Operation Input Data C2 Normal Operation GND <70 ms from power-on Write to Volatile Memory (Register 0x24) VCC Read from EEPROM Write Access Command tsPULSE(E) tWRITE(E) Previous Command Write Access Command <70 ms from power-on VCC t tDIS_OUT Write Command tWRITE tWRITE Disable Output Command tENB_OUT Next Command t tWRITE Read Command Enable Output Command <70 ms from power-on VOUT High Impedance Normal Operation Read Acknowledge High Impedance Normal Operation GND t tDIS_OUT tSTART_READ tSTART_READ tENB_OUT Figure 9: Programming Read and Write Timing Diagrams (see Serial Interface Reference section for definitions) Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 20 A1340 High Precision Programmable Linear Hall Effect Sensor IC with EEPROM, Analog Output, and Advanced Output Linearization Serial Interface Reference Table 4: Serial Interface Protocol Characteristics1 Characteristics Symbol Note Min. Typ. Max. Unit Customer Access Code should be fully entered in less than tACC , measured from when VCC crosses VCC(UV_high). – – 70 ms Defined by the input message bit rate sent from the external controller 5 – 100 kbps Input/Output Signal Timing Access code Time Out tacc Baud Rate Bit Time tBIT Data bit pulse width at 5 kbps 195 200 205 µs Data bit pulse width at 100 kbps 9.5 10 10.5 µs –11 – +11 % Bit Time Error errTBIT Deviation in tBIT during one command frame Volatile Memory Write Delay tWRITE Required delay from the trailing edge of certain Write command frames to the leading edge of a following command frame 2 × tBIT – – µs Required delay from the trailing edge of the second EEPROM Programming pulse to the leading edge of a following command frame 2 × tBIT – – µs Required delay from the trailing edge of a Read Acknowledge frame to the leading edge of a following command frame 2 × tBIT – – µs Delay from the trailing edge of a Read tSTART_READ command frame to the leading edge of the Read Acknowledge frame 25 µs – 0.25 × tBIT 50 µs – 0.25 × tBIT 150 µs – 0.25 × tBIT µs Non-Volatile Memory Write Delay Read Acknowledge Delay Read Delay2 tWRITE(E) tREAD Disable Output Delay2 tDIS_OUT Delay from the trailing edge of a Disable Output command frame to the device output going from normal operation to the high impedance state 1 µs – 0.25 × tBIT 5 µs – 0.25 × tBIT 15 µs – 0.25 × tBIT µs Enable Output Delay2 tENB_OUT Delay from the trailing edge of an Enable Output command frame to the device output going from the high impedance state to normal operation 1 µs – 0.25 × tBIT 5 µs – 0.25 × tBIT 15 µs – 0.25 × tBIT µs tsPULSE(E) Delay from last edge of write command to start of EEPROM programming pulse 40 – – μs Applied to VCC line 7.3 – – V VCC – VSAT(H) – – V EEPROM Programming Pulse EEPROM Programming Pulse Setup Time Input/Output Signal Voltage Manchester Code High Voltage VMAN(H) Manchester Code Low Voltage VMAN(L) Read from VOUT line Applied to VCC line – – 5.7 V Read from VOUT line – – VSAT(L) V 1Determined by design. 2In the case where a slower baud rate is used, the output responds before the transfer of the last bit in the command message is completed. Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 21 High Precision Programmable Linear Hall Effect Sensor IC with EEPROM, Analog Output, and Advanced Output Linearization A1340 Serial Interface Message Structure The general format of a command message frame is shown in Figure 11. Note that, in the Manchester coding used, a bit value of 1 is indicated by a falling edge within the bit boundary, and a bit value of zero is indicated by a rising edge within the bit boundary. Read/Write Synchronize 0 Memory Address Data 0 0/1 0/1 0/1 0/1 0/1 0/1 0/1 0/1 0/1 0/1 MSB ... CRC 0/1 0/1 0/1 0/1 MSB The bits are described in Table 5. Manchester Code per G. E. Thomas 0 0 1 1 0 Bit boundaries Figure 11: General Format for Serial Interface Commands Table 5: Serial Interface Command General Format Quantity of Bits Parameter Name Values 2 Synchronization 00 Used to identify the beginning of a serial interface command 1 Read/Write 0 [As required] Write operation 1 [As required] Read operation Description 6 Address 0/1 [Read/Write] Register address (volatile memory or EEPROM) Variable Data 0/1 [As required] 30 bits of data 3 CRC 0/1 Incorrect value indicates errors Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 22 A1340 High Precision Programmable Linear Hall Effect Sensor IC with EEPROM, Analog Output, and Advanced Output Linearization The following command messages can be exchanged between the device and the external controller: • • • • • • Read Read Acknowledge Write Write Access Code Write Disable Output Write Enable Output For EEPROM address information, refer to the EEPROM Structure section. READ Function Provides the address in A1340 memory to be accessed to transmit the contents to the external controller in the next Read Acknowledge command. A timely Write Access Code command is required once, at power-up of the A1340. Syntax Sent by the external controller on the A1340 VCC pin. Sent after a Write Disable Output command. Related Commands Read Acknowledge Read/Write Memory Address Synchronize Pulse Sequence 0 0 CRC 1 0/1 0/1 0/1 0/1 0/1 0/1 0/1 0/1 0/1 MSB Options None Examples Address in non-volatile memory: 0XXXXX Address in volatile memory: 100100 (Register 0x24) Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 23 High Precision Programmable Linear Hall Effect Sensor IC with EEPROM, Analog Output, and Advanced Output Linearization A1340 READ ACKNOWLEDGE Function Transmits to the external controller data retrieved from the A1340 memory in response to the most recent Read command. Syntax Sent by the A1340 on the A1340 VOUT pin. Sent after a Read command and before a Write Enable Output command. Related Commands Read Data (30 bits) Synchronize Pulse Sequence 0 CRC 0/1 0/1 0/1 0/1 . . . 0/1 0/1 0/1 0/1 0/1 0 MSB Options If EEPROM Error Checking and Correction (ECC) is not disabled by factory programming, the 6 MSBs are EEPROM data error checking bits. Refer to the EEPROM Structure section for more information. Examples – WRITE Function Transmits to the A1340 data prepared by the external controller. Syntax Sent by the external controller on the A1340 VCC pin. A timely Write Access Code command is required once, at power-up of the A1340. For writing to non-volatile memory: Sent after a Write Disable Output command. Related Commands Disable Output, Enable Output, Write Access Code Read/Write Synchronize Pulse Sequence 0 0 Data (30 bits) Memory Address 0 0/1 0/1 0/1 0/1 0/1 0/1 0/1 0/1 0/1 . . . MSB Options – Examples Address in non-volatile memory: 0XXXXX Address in volatile memory: 100100 (Register 0x24) CRC 0/1 0/1 0/1 0/1 MSB Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 24 High Precision Programmable Linear Hall Effect Sensor IC with EEPROM, Analog Output, and Advanced Output Linearization A1340 WRITE ACCESS CODE Function Transmits the Access Code to the A1340; data prepared by the external controller, but must match the internal 30-bit code in the A1340 memory. Syntax Sent by the external controller on the A1340 VCC pin. Sent within 70 ms of A1340 power-on, and before any other command. Related Commands Read/Write Pulse Sequence 0 Data (30 bits) Memory Address Synchronize 0 0 1 0 0 1 0 0 MSB 1 0 ... 0 CRC 1 0 0 1 MSB Options None Examples Standard Customer Access Code: 0x2781_1F77 to address 0x24 WRITE DISABLE OUTPUT Function Suppresses normal output from the VOUT pin to allow clear transmission of Read Acknowledge commands and EEPROM Programming pulses. Places VOUT in a high impedance state. Syntax Sent by the external controller on the A1340 VCC pin. For writing to non-volatile memory: Sent before each Write command. For reading: Sent before a Read command. Related Commands Write Enable Output Read/Write Pulse Sequence 0 0 0 1 MSB Options None Examples 0x10 to address 0x24 Data (30 bits) Memory Address Synchronize 0 0 1 0 0 0 ... 0 1 CRC 0 0 0 0 0 1 0 MSB Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 25 High Precision Programmable Linear Hall Effect Sensor IC with EEPROM, Analog Output, and Advanced Output Linearization A1340 WRITE ENABLE OUTPUT Function Restores normal output from the VOUT pin after a high impedance state has been imposed by a Disable Output command. Syntax Sent by the external controller on the A1340 VCC pin. For writing to non-volatile memory: Sent after a Write command and corresponding EEPROM Programming pulses. For reading: Sent after a Read Acknowledge command. Related Commands Write Disable Output Read/Write Pulse Sequence 0 0 0 1 MSB Options None Examples 0x0 to address 0x24 Data (30 bits) Memory Address Synchronize 0 0 1 0 0 0 ... 0 0 CRC 0 0 0 0 0 1 1 MSB Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 26 High Precision Programmable Linear Hall Effect Sensor IC with EEPROM, Analog Output, and Advanced Output Linearization A1340 EEPROM STRUCTURE Programmable values are stored in an onboard EEPROM, including both volatile and non-volatile registers. Although it is separate from the digital subsystem, it is accessed by the digital subsystem EEPROM Controller module. EEPROM Bit Contents 29 28 27 26 25 24 23 The EEPROM is organized as 30-bit wide words, and by default each word has 24 data bits and 6 ECC (Error Checking and Correction) check bits, stored as shown in Figure 12. 22 21 20 19 18 17 D23 D22 D21 D20 D19 D18 D17 D16 D15 D14 D13 D12 D11 16 15 C5 D10 14 13 12 11 10 9 8 7 6 5 4 3 2 1 0 D9 D8 D7 D6 D5 D4 C4 D3 D2 D1 C3 D0 C2 C1 C0 Figure 12: EEPROM Word Bit Sequence; C# – Check Bit, D# – Data Bit Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 27 High Precision Programmable Linear Hall Effect Sensor IC with EEPROM, Analog Output, and Advanced Output Linearization A1340 Table 6: EEPROM Register Map of Customer-Programmable Parameters (Non-Volatile Memory) Address Bits Parameter Name Description DAC profile 0x08 23:15 TC2_SENS_HOT 2nd Order Sensitivity Temperature Coefficient, ΔT (from 25°C) > 0 Two’s complement 0x08 14:6 TC2_SENS_CLD 2nd Order Sensitivity Temperature Coefficient, ΔT (from 25°C) < 0 Two’s complement 0x08 5:2 SENS_COARSE Factory Adjustment of the Magnetic Input Signal Range Non-uniform 0x08 1:0 BW Internal Bandwidth Non-uniform 0x09 23:16 TC1_SENS_HOT 1st Order Sensitivity Temperature Coefficient, ΔT (from 25°C) > 0 Non-uniform 0x09 15:8 TC1_SENS_CLD 1st Order Sensitivity Temperature Coefficient, ΔT (from 25°C) < 0 Non-uniform 0x09 7:0 TC1_OFFSET 1st 0x0A 23:12 SCRATCH_C Customer Scratchpad 0x0A 11:0 SENS_MULT Output Sensitivity/ Sensitivity Multiplier 0x0B to 0x1A 23:12 LINPOS_COEFF Linearization Coefficients (odd-numbered sampling positions) (LIN_1, LIN_3, ..., LIN_31) 0x0B to 0x1B 11:0 LINPOS_COEFF Linearization Coefficients (even-numbered sampling positions) (LIN_0, LIN_2, ..., LIN_32) 0x1B 23 LIN_TABLE_DONE 0x1B 22 LIN_OUTPUT_INVERT 0x1B 21 LIN_INPUT_INVERT 0x1B 20:12 ID 0x1C 23:18 CLAMP_HIGH 0x1C 17:12 CLAMP_LOW 0x1C 11 EEPROM_LOCK1 0x1C 10 Reserved 0x1C 9 OPEN_DRAIN 0x1C 8:4 SIG_OFFSET Order Magnetic Offset Drift Compensation Two’s complement Linearization Complete Flag Linearization Output Polarity Inversion Linearization Input Polarity Inversion Customer Identification Number Clamp Upper Limit Clamp Lower Limit Customer EEPROM Lock Reserved for system use (customer should not write this bit) Disable Internal Pullups on Digital Output Signals Factory Adjustment of Input Signal Offset Two’s complement 0x1C 3:2 Reserved Reserved for System Use (bits written here will not affect device performance) 0x1C 1 Reserved Reserved for system use (customer should not write this bit) 0x1C 0 Reserved Reserved for system use (customer should not write this bit) 0x1D 23:12 SCRATCH_C 0x1D 11:0 QVO_FINE Customer Scratchpad Fine Quiescent Voltage Output (QVO) Two’s complement 1Customer EEPROM lock allows the customer to lock the EEPROM registers from any further changes for the life of the device. Memory reading is still possible after the EEPROM lock bit is set. In the case that a write command is sent to the device by accident after the EEPROM lock, the device needs to be repowered to be accessible again for memory read. Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 28 High Precision Programmable Linear Hall Effect Sensor IC with EEPROM, Analog Output, and Advanced Output Linearization A1340 EEPROM Customer-Programmable Parameter Reference BW (Register Address: 0x08, bits 1:0) Function Filter Bandwidth Selects the filter bandwidth (3-dB frequency) for the digitized applied magnetic field signal, applied when passed to the digital system after analog front-end processing. Syntax Quantity of bits: 2 Related Commands – Values 00: 1500 Hz (Default) 01: (Factory use only) 10: 375 Hz 11: 3000 Hz Options – Examples – CLAMP_HIGH (Register Address: 0x1C, bits 23:18) Function Clamp Upper Limit Sets the maximum valid output value. Syntax Quantity of bits: 6 Related Commands CLAMP_LOW Values 000000: 5 V – Vsat (Default) 111111: 2.5 V for VCC = 5 V Options The default, VCLP(H)init , is used if this parameter is not set. Examples When ratiometry is on (RATIOM_OFF = 0): Range is VCC / 2, up to VCC – Vsat. When ratiometry is off (RATIOM_OFF = 1): Typical value is VCC – 0.5 × VCC × (CLAMP_HIGH / 64) Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 29 High Precision Programmable Linear Hall Effect Sensor IC with EEPROM, Analog Output, and Advanced Output Linearization A1340 CLAMP_LOW (Register Address: 0x1C, bits 17:12) Function Clamp Lower Limit Sets the minimum valid output value. Syntax Quantity of bits: 6 Related Commands CLAMP_HIGH Values 000000: 0 V + Vsat (Default) 111111: 2.5 V for VCC = 5 V Options The default, VCLP(L)init , is used if this parameter is not set. Examples When ratiometry is on (RATIOM_OFF = 0): Range is VCC / 2, down to Vsat. When ratiometry is off (RATIOM_OFF = 1): Typical value is 0 V + 0.5 × VCC × (CLAMP_LOW / 64) ID (Register Address: 0x1B, bits 20:12) Function Customer Identification Number Available register for identifying the A1340 for multiple-unit applications. Syntax Quantity of bits: 12 Related Commands SCRATCH_C Values Free-form Options – Examples – LIN_INPUT_INVERT (Register Address: 0x1B, bit 21) Function Inverts the polarity of the input signal before it is sent into the linearization block. This setting is effective only if LIN_TABLE_DONE is set to 1. Syntax Quantity of bits: 1 Related Commands LIN_x, LIN_OUTPUT_INVERT Values 0: No inversion of signal before input into the linearization block. 1: Input signal inverted before it is sent into the linearization block. Options – Examples – Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 30 High Precision Programmable Linear Hall Effect Sensor IC with EEPROM, Analog Output, and Advanced Output Linearization A1340 LIN_OUTPUT_INVERT (Register Address: 0x1B, bit 22) Function Inverts the polarity of the input signal after the linearization block. This setting is effective only if LIN_TABLE_DONE is set to 1. Syntax Quantity of bits: 1 Related Commands LIN_x, LIN_INPUT_INVERT Values 0: No inversion of signal after processing in the linearization block. 1: Input signal inverted after processing in the linearization block. Options – Examples – LINPOS_COEFF (LIN_0, LIN_2, ..., LIN_32) (Register Address: 0x0B to 0x1B, bits 11:0) (LIN_1, LIN_3, ..., LIN_31) (Register Address: 0x0B to 0x1A, bits 23:12) Function Linearization Coefficients These addresses are available to store customer-generated and loaded coefficients used for linearization of the temperature-compensated and offset digital signal. Note: These are not used by the device unless the LIN_TABLE_ DONE bit is set. Syntax Quantity of bits: 12 (each) LIN_x corresponds to Input Sample BINx Coefficient data stored in two’s complement format Values must be monotonically increasing Related Commands LIN_INPUT_INVERT, LIN_OUTPUT_INVERT, LIN_TABLE_DONE Values Calculated according to applied magnetic field Input Sample Options Examples Output Position BIN0 −2048 EEPROM Address Bits Input Sample 0x0B 11:00 BIN16 Output Position EEPROM Address Bits 0 0x13 11:00 BIN1 −1920 0x0B 23:12 BIN17 128 0x13 23:12 BIN2 −1792 0x0C 11:00 BIN18 256 0x14 11:00 BIN3 −1664 0x0C 23:12 BIN19 384 0x14 23:12 BIN4 −1536 0x0D 11:00 BIN20 512 0x15 11:00 BIN5 −1408 0x0D 23:12 BIN21 640 0x15 23:12 BIN6 −1280 0x0E 11:00 BIN22 768 0x16 11:00 BIN7 −1152 0x0E 23:12 BIN23 896 0x16 23:12 BIN8 −1024 0x0F 11:00 BIN24 1024 0x17 11:00 BIN9 −896 0x0F 23:12 BIN25 1152 0x17 23:12 BIN10 −768 0x10 11:00 BIN26 1280 0x18 11:00 BIN11 −640 0x10 23:12 BIN27 1408 0x18 23:12 BIN12 −512 0x11 11:00 BIN28 1536 0x19 11:00 BIN13 −384 0x11 23:12 BIN29 1664 0x19 23:12 BIN14 −256 0x12 11:00 BIN30 1792 0x1A 11:00 BIN15 −128 0x12 23:12 BIN31 1920 0x1A 23:12 BIN32 2047 0x1B 11:00 – Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 31 High Precision Programmable Linear Hall Effect Sensor IC with EEPROM, Analog Output, and Advanced Output Linearization A1340 LIN_TABLE_DONE (Register Address: 0x1B, bit 23) Function Linearization Table Loaded Set by the customer to indicate custom coefficients have been loaded (into the LINPOS_COEFF area of EEPROM). When this flag is set, the device uses the customer coefficients for output linearization. Allows correction for targets that generate non-linear magnetic fields. Syntax Quantity of bits: 1 Related Commands LINPOS_COEFF Values Options – Examples – 0: Linearization algorithm applies default coefficients to the processed signal (Default) 1: Linearization algorithm applies customer-loaded coefficients to the processed signal OPEN_DRAIN (Register Address: 0x1C, bit 9:0) Function Output Digital Signal Pullup Disable Switches off internal pullup resistors when digital serial data is being transmitted and uses customer pullup. (Does not affect transmission of normal magnetic data transmission). Syntax Quantity of bits: 1 Related Commands – Values Options – Examples – 0: Internal output pullup enabled at all times (Default) 1: Disable internal output pullup during transmission of digital serial data QVO_FINE (Register Address: 0x1D, bits 11:0) Function Quiescent Voltage Output (QVO) Adjusts the device normal output (voltage response to applied magnetic field) to set the baseline output level: for a quiescent applied magnetic field (BIN ≈ 0 G). Syntax Quantity of bits: 12 Code stored in two’s complement format Related Commands SIG_OFFSET Values Options The default, VOUT(Q) , is used if this parameter is not set. Examples – 0111 1111 1111: +49.98% of output full scale range (Default) 1000 0000 0000: –50% of output full scale range Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 32 High Precision Programmable Linear Hall Effect Sensor IC with EEPROM, Analog Output, and Advanced Output Linearization A1340 RATIOM_OFF (Register Address: 0x1C, bit 11) Function Output Ratiometry Disable Syntax Quantity of bits: 1 Related Commands – Values 0: Ratiometry enabled (Default) The output is determined by: VOUT = 0.5 × VCC × [(BIN / RANGE (G))+1] 1: Ratiometry disabled The output is determined by: VOUT = 2.5 (V) × [(BIN / RANGE (G))+1] RANGE defined in SENS_COARSE table below. Options – Examples – SCRATCH_C (Register Address: 0x1D, bits 23:12) Function Customer Scratchpad For optional customer use in storing values in the device. Syntax Quantity of bits: 12 Related Commands ID Values Free-form field Options – Examples – Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 33 High Precision Programmable Linear Hall Effect Sensor IC with EEPROM, Analog Output, and Advanced Output Linearization A1340 SENS_COARSE (Register Address: 0x08, bits 5:2) Note: If the Coarse Sensitivity is changed, the offset drifts with temperature changes will be altered from the factory programmed values. If changing Coarse Sensitivity cannot be avoided because of application requirements, please contact Allegro for detailed information. Function Coarse Sensitivity Sets the nominal (coarse) sensitivity of the device, SENS_COARSE, which can be defined as ΔVOUT / ΔBIN . Selection determines the RANGE, the extent of the applied magnetic flux intensity, BIN , sampled for signal processing. (Use SIG_OFFSET to adjust the BIN level at which RANGE is centered.) Syntax Quantity of bits: 4 Related Commands SIG_OFFSET, SENS_OUT Coarse Sensitivity at VCC = 5 V (Typical) (mV/G) RANGE (G) 0000 (Default) 0001 0010 0011 0100 0101 0110 0111 5.00 16.70 12.50 10.00 8.30 6.25 4.00 3.30 ±500 ±150 ±200 ±250 ±300 ±400 ±625 ±750 1000 1001 1010 1011 1100 1101 1110 1111 2.80 2.50 2.00 1.67 1.43 1.25 25.00 1.11 ±875 ±1000 ±1250 ±1500 ±1750 ±2000 ±100 ±2250 Code Values Options – Examples To set a sampled BIN range of 500 G, set RANGE = ±250 G (SENS_COARSE = 0011). That would also set Coarse Sensitivity to 10 mV/G (SENS_COARSE = 0011). Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 34 High Precision Programmable Linear Hall Effect Sensor IC with EEPROM, Analog Output, and Advanced Output Linearization A1340 SENS_MULT (Register Address: 0x0A, bits 11:0) Function Sensitivity Multiplier After temperature compensation, establishes the gain of the device in normal output (response to a change in the applied magnetic field) by indicating a multiplier value. Quantity of bits: 12 2.0 SENS_MULT 1.0 Value Syntax 0 0 0x800 0xFFF SENS_MULT Programming Code Related Commands RANGE, TC1_SENS_CLD, TC1_SENS_HOT, TC2_SENS_CLD, TC2_SENS_HOT Values RANGE: ±300 G SENS_COARSE: 8.33 mV/G Options SENS_OUT = SENS_COARSE, that is, SENS_MULT = 1 (code 0) if this parameter is not set. Examples – Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 35 A1340 High Precision Programmable Linear Hall Effect Sensor IC with EEPROM, Analog Output, and Advanced Output Linearization SIG_OFFSET (Register Address: 0x1C, bits 8:4) Note: If changing Coarse Magnetic Offset cannot be avoided because of application requirements, please contact Allegro for detailed information. Function Magnetic Offset Compensation (Coarse) Adjusts the center of the selected RANGE to adapt to the application magnetic field. (The applied offset, QVO_COARSE, is the sum of the selected SIG_OFFSET and a VOUT(Q) factor that compensates for the magnetic back-biasing of the device.) The offset values are expressed in terms of a percentage of the full scale of the selected RANGE and as a voltage relative to VOUT(Q). Note: This is an analog domain variable, so step size is variable, and the offset values shown here represent the expected typical value for the programmed code. Syntax Quantity of bits: 5 Code stored in two’s complement format. Related Commands RANGE, TC1_OFFSET SIG_OFFSET (% of Full-Scale RANGE) SIG_OFFSET (Typical) (ΔV) 00000 (Default) 00001 00010 00011 00100 00101 00110 00111 0.00 6.25 12.50 18.75 25.00 31.25 37.50 43.75 0.00 0.31 0.63 0.94 1.25 1.56 1.88 2.19 01000 01001 01010 01011 01100 01101 01110 01111 50.00 56.25 62.75 68.75 75.00 81.25 87.50 93.75 2.50 2.81 3.13 3.44 3.75 4.06 4.38 4.69 10000 10001 10010 10011 10100 10101 10110 10111 –100.00 –93.75 –87.50 –81.25 –75.00 –68.75 –62.50 –56.25 –5.00 –4.69 –4.38 –4.06 –3.75 –3.44 –3.13 –2.81 11000 11001 11010 11011 11100 11101 11110 11111 –50.00 –43.75 –37.50 –31.25 –25.00 –18.75 –12.50 –6.25 –2.50 –2.19 –1.88 –1.56 –1.25 –0.94 –0.63 –0.31 Code Values Options The default, VOUT(Q) , is used if this parameter is not set. Examples To set the input range from 0 to 1000 G, with a centerpoint at +500 G: 1. If SENS_COARSE at 5 mV/G (SENS_COARSE code = 0000). This establishes a full scale input RANGE of 1000 G. 2. The full scale input value, 1000 G, is used as the start point of the offset, so: SIG_Offset = (Centerpoint – Full scale input) / Full scale input = 100 × (500 – 1000) / 1000 = –50% 3. Set the SIG_OFFSET code to 11000 (24), to select SIG_OFFSET = –50%. This also has the effect of setting SIG_OFFSET = –2.5 V. Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 36 High Precision Programmable Linear Hall Effect Sensor IC with EEPROM, Analog Output, and Advanced Output Linearization A1340 TC1_OFFSET (Register Address: 0x09, bits 7:0) Function 1st Order Magnetic Offset Temperature Compensation coefficient. Syntax Quantity of bits: 8 Code stored in two’s complement format. Related Commands SIG_OFFSET, TC1_SENS_CLD, TC1_SENS_HOT, TC2_SENS_CLD, TC2_SENS_HOT Values Options No fine magnetic offset is applied if this parameter is not set. Examples – 0111 1111: +122 mG/°C 1000 0000: –122 mG/°C TC1_SENS_CLD (Register Address: 0x09, bits 15:8) TC1_SENS_HOT (Register Address: 0x09, bits 23:16) Function 1st Order Sensitivity Temperature Coefficient. Specifies a compensation factor for drift in device Sensitivity resulting from changes in ambient temperature during operation. Applies a 1st order, linear compensation algorithm. Two different parameters are set, one for increasing values relative to TA = 25°C, and the other for decreasing values, as follows: • TC1_SENS_HOT: ΔTA (from 25°C) > 0 • TC1_SENS_CLD: ΔTA (from 25°C) < 0 Syntax Quantity of bits: 8 (each parameter) Related Commands SENS_MULT, TC2_SENS_HOT, TC2_SENS_CLD Values 1100 0000: –98 m% / °C 1011 1111: +291 m% / °C Increments (step size) of ±1.53 m% / °C Options Set all bits to 0 if TC1_SENS_HOT and TC1_SENS_CLD are not used. Examples Refer to Temperature Compensation section. Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 37 A1340 High Precision Programmable Linear Hall Effect Sensor IC with EEPROM, Analog Output, and Advanced Output Linearization TC2_SENS_CLD (Register Address: 0x08, bits 14:6) TC2_SENS_HOT (Register Address: 0x08, bits 23:15) Function 2nd Order Sensitivity Temperature Coefficient. Specifies a compensation factor for drift in device Sensitivity resulting from changes in ambient temperature during operation. Applies a 2nd order, quadratic compensation algorithm. Two different parameters are set, one for increasing values relative to TA = 25°C, and the other for decreasing values, as follows: • TC2_SENS_HOT: ΔT (from 25°C) > 0 • TC2_SENS_CLD: ΔT (from 25°C) < 0 Syntax Quantity of bits: 9 (each parameter) Related Commands SENS_MULT, TC1_SENS_HOT, TC1_SENS_CLD Values 1 0000 0000: –1.53 m% / °C 0 1111 1111: +1.53 m% / °C Increments (step size) of ±0.00596 m% / °C Options Set all bits to 0 if TC2_SENS_HOT and TC2_SENS_CLD are not used. Examples Refer to Temperature Compensation section. Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 38 High Precision Programmable Linear Hall Effect Sensor IC with EEPROM, Analog Output, and Advanced Output Linearization A1340 DEFINITIONS OF TERMS Power-On Time, tPO The time required for device output to settle within ±10% of its steady state value, after the power supply has reached its minimum specified operating voltage, VCC(min). When the supply is ramped to its operating voltage, the device requires a finite time to power internal circuits before supplying a valid output value. See Figure 13. Response Time, tRESP The time interval between a) when the applied magnetic field reaches 90% of its final intensity, and b) when the device output reaches 90% of its change corresponding to the magnetic field change. See Figure 14. Response time is affected by the programmed bandwidth, f3dB , for the DSP stage. Quiescent Voltage Output (QVO), VOUT(Q) Magnetic Offset Drift Through Temperature Range Due to internal component tolerances and thermal considerations, the magnetic offset may drift from its expected value, BOFFEXPECTED , when changes occur in the operating ambient temperature, TA. For purposes of specification, the Offset Drift Through Temperature Range, ∆BOFF(TC) , is defined as: ∆BOFF(TC) = The proportion of the output voltage to the magnitude of the applied magnetic field. This proportionality is specified as the Sensitivity, Sens (mV/G), and is effectively the gain of the device. V VOUT(Q)TA – VOUT(Q)25°C ∆VOUT = TA – 25°C . (2) where VOUT is measured quiescent output value at temperature TA. % t1 Applied Magnetic Field 100 VCC(min.) 90 B VCC . × 100 (%) (1) The Offset Temperature Coefficient can be seen as a representation of the offset drift over temperature in units mV/°C: Supply Voltage t1 BOFFEXPECTED(TA) where BOFF(TA) is the actual magnetic offset at the current ambient temperature, and BOFFEXPECTED(TA) is the magnetic offset calculated based on factory programmed parameters. The output value in the quiescent state (when no magnetic field is applied, BIN = 0 G). Sensitivity, Sens BOFF(TA) – BOFFEXPECTED(TA) t1= time at which power supply reaches minimum specified operating voltage tPO VOUT A1340 Output VOUT % 100 90 t1= time at which applied magnetic field reaches 90% of operating intensity % 100 90 0 time Figure 13: Definition of Power-On Time A1340 Output t2 t2 t2= time at which output voltage initially generates a valid output tRESP VOUT(Q) = 2.5 V (typ) t2= time at which output voltage initially reaches 90% of its corresponding value time Figure 14: Definition of Response Time Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 39 A1340 High Precision Programmable Linear Hall Effect Sensor IC with EEPROM, Analog Output, and Advanced Output Linearization Sensitivity Drift Through Temperature Range Due to internal component tolerances and thermal considerations, the Sensitivity may drift from its expected value, SensEXPECTED , when changes occur in the operating ambient temperature, TA. For purposes of specification, the Sensitivity Drift Through Temperature Range, ∆SensTC , is defined as: ∆SensTC = SensTA – SensEXPECTED(TA) SensEXPECTED(TA) × 100 (%) . (3) where SensTA is the actual Sens at the current ambient temperature, and SensEXPECTED(TA) is the Sens calculated based on factory programmed parameters. The Sensitivity Temperature Coefficient can be seen as a representation of the Sensitivity drift in %/°C when when a temperature divider, ∆T = TA – 25°C, is inserted into equation 3. Sensitivity Drift Due to Package Hysteresis, ∆SensPKG Package stress and relaxation can cause the device sensitivity at TA = 25°C to change during and after temperature cycling. For purposes of specification, the Sensitivity Drift Due to Package Hysteresis, is defined as: Sens(25°C)2 – Sens(25°C)1 ∆SensPKG = Sens(25°C)1 × 100 (%) (4) where Sens(25°C)1 is the programmed value of Sensitivity at TA = 25°C, and Sens(25°C)2 is the value of Sensitivity at TA = 25°C, after temperature cycling. Linearity Sensitivity Error The A1340 is designed to provide a linear output in response to a ramping applied magnetic field. Consider two magnetic field strengths, B1 and B2. Ideally, the sensitivity of a device is the same for both field strengths, for a given supply voltage and temperature. Linearity error is present when there is a difference between the sensitivities measured at B1 and B2. Linearity Error is calculated separately for the positive (LinERRPOS) and negative (LinERRNEG) applied magnetic fields. Linearity error is measured and defined as: SensBx SensBx/2 × 100 (%) Sens–Bx LinERRNEG = 1– Sens–Bx/2 × 100 (%) LinERRPOS = 1– (5) where: SensBx = |VOUT(Bx) – VOUT(Q)| Bx (6) and BX and –BX are positive and negative magnetic fields Final Linearity Sensitivity Error (LinERR) is the maximum value of the absolute positive and absolute negative linearization errors. Note that unipolar devices only have positive linearity error (LinERRPOS). Ratiometric The A1340 features ratiometric output. This means that the quiescent voltage output, VOUT(Q) , magnetic sensitivity, Sens, and clamp voltage, VOUTCLP , are proportional to the supply voltage, VCC . The ratiometric change in the quiescent output voltage, RatVOUT(Q) (%), is defined as: RatVOUT(Q) = VOUT(Q)VCC / VOUT(Q)5V VCC / 5 V × 100 (%) (7) the ratiometric change in sensitivity is defined as: RatSENS = SensVCC / Sens5V VCC / 5 V × 100 (%) (8) and the ratiometric change in clamp voltage is defined as: RatVCLP = VCLP(VCC) / VCLP(5V) VCC / 5 V × 100 (%) (9) Note that clamping effect is applicable only when clamping is enabled by programming of the device. Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 40 High Precision Programmable Linear Hall Effect Sensor IC with EEPROM, Analog Output, and Advanced Output Linearization A1340 CUSTOMER PACKAGE DRAWING For Reference Only - Not for Tooling Use (Reference DWG-9202) Dimensions in millimeters - NOT TO SCALE Dimensions exclusive of mold flash, gate burs, and dambar protrusions Exact case and lead configuration at supplier discretion within limits shown B 10° 5.21 +0.08 –0.05 1.00 +0.08 –0.05 E 2.60 F Mold Ejector Pin Indent 1.69 F +0.08 3.43 –0.05 F 0.89 MAX 1 2 3 Branded Face 4 A 0.54 REF NNNN YYWW 0.41 +0.08 0.20 –0.05 +0.08 –0.05 D 12.14 ±0.05 1.27 NOM N = Device part number Y = Last two digits of year of manufacture W = Week of manufacture 0.54 REF 0.89 MAX 1.50 +0.08 –0.05 D +0.08 5.21 –0.05 Standard Branding Reference View A Dambar removal protrusion (16X) B Gate and tie burr area C Branding scale and appearance at supplier discretion D Thermoplastic Molded Lead Bar for alignment during shipment E Active Area Depth, 0.37 mm REF F Hall element, not to scale +0.08 1.00 –0.05 Figure 15: Package KT, 4-Pin SIP Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 41 High Precision Programmable Linear Hall Effect Sensor IC with EEPROM, Analog Output, and Advanced Output Linearization A1340 Revision History Revision Revision Date – September 16, 2014 Description of Revision 1 December 2, 2014 Revised Selection Guide 2 February 12, 2015 Revised Package Drawing Initial Release Copyright ©2015, Allegro MicroSystems, LLC Allegro MicroSystems, LLC reserves the right to make, from time to time, such departures from the detail specifications as may be required to permit improvements in the performance, reliability, or manufacturability of its products. Before placing an order, the user is cautioned to verify that the information being relied upon is current. Allegro’s products are not to be used in any devices or systems, including but not limited to life support devices or systems, in which a failure of Allegro’s product can reasonably be expected to cause bodily harm. The information included herein is believed to be accurate and reliable. However, Allegro MicroSystems, LLC assumes no responsibility for its use; nor for any infringement of patents or other rights of third parties which may result from its use. For the latest version of this document, visit our website: www.allegromicro.com Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 42