Reliability Data Report Product Family R478 LTC1403 \ LTC1407 \ LTC1408 \ LTC2201 \ LTC2202 \ LTC2203 \ LTC2204 \ LTC2205 \ LTC2206 \ LTC2207 \ LTC2208 \ LTC2209 \ LTC2215 \ LTC2216 \ LTC2217 \ LTC2220 \ LTC2221 \ LTC2222 \ LTC2223 \ LTC2224 \ LTC2225 \ LTC2226 \ LTC2227 \ LTC2228 \ LTC2229 \ LTC2230 \ LTC2231 \ LTC2232 \ LTC2233 \ LTC2234 \ LTC2236 \ LTC2237 \ LTC2238 \ LTC2239 \ LTC2245 \ LTC2246 \ LTC2247 \ LTC2248 \ LTC2249 \ LTC2250 \ LTC2251 \ LTC2252 \ LTC2253 \ LTC2254 \ LTC2255 \ LTC2272 \ LTC2273 \ LTC2274 \ LTC2280 \ LTC2281 \ LTC2282 \ LTC2283 \ LTC2284 \ LTC2285 \ LTC2286 \ LTC2287 \ LTC2288 \ LTC2289 \ LTC2290 \ LTC2291 \ LTC2292 \ LTC2293 \ LTC2294 \ LTC2295 \ LTC2296 \ LTC2297 \ LTC2298 \ LTC2299 \ LTC2350 \ LTC2351 \ LTC2355 \ LTC2356 \ LTC2360 \ LTC2361 \ LTC2362 \ LTC2365 \ LTC2366 \ LTC2372 \ LTC2373 Reliability Data Report Report Number: R478 Report generated on: Mon Aug 17 11:54:22 PDT 2015 OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE OLDEST DATE NEWEST DATE K DEVICE HRS CODE CODE (+125°C) 1 No. of FAILURES 2,3 SOIC/MSOP QFN/DFN QFP 1014 1313 154 0309 0438 0713 1428 0740 0746 652 1189 154 0 0 0 TQFP SOT 77 233 0713 0718 0713 0801 77 233 0 0 Totals 2,791 - - 2,305 0 HIGHLY ACCELERATED STRESS TEST AT +130 DEG C / 85% RH PACKAGE TYPE QFN/DFN Totals SAMPLE SIZE 152 152 OLDEST DATE NEWEST DATE K DEVICE HRS No. of FAILURES 4 CODE CODE (+85°C) 0420 - 0429 - 553 553 0 0 K DEVICE HRS No. of FAILURES PRESSURE COOKER TEST AT 15 PSIG , +121 DEG C PACKAGE TYPE SAMPLE SIZE OLDEST DATE NEWEST DATE SOIC/MSOP QFN/DFN 606 13945 CODE CODE 0308 0401 1413 1422 98 1936 0 0 QFP SOT 1432 1352 0652 0726 1022 1238 402 79 0 0 Totals 17,335 - - 2,515 0 OLDEST DATE NEWEST DATE K DEVICE No. of FAILURES TEMP CYCLE FROM -65 TO 150 DEG C PACKAGE TYPE SAMPLE SIZE CODE CODE CYCLES SOIC/MSOP QFN/DFN QFP 605 13830 1251 0308 0401 0652 1413 1422 0906 267 5236 1045 0 0 0 SOT Totals 276 15,962 0716 - 1238 - 58 6,606 0 0 OLDEST DATE NEWEST DATE K DEVICE No. of FAILURES CODE CODE CYCLES THERMAL SHOCK FROM -65 TO 150 DEG C PACKAGE TYPE SAMPLE SIZE SOIC/MSOP 527 0308 1413 257 0 QFN/DFN QFP SOT 12096 1180 177 0401 0652 0740 1422 0902 1238 4905 811 48 0 0 0 Totals 13,980 - - 6,021 0 (1) Assumes Activation Energy = 0.7 Electron Volts (2) Failure Rate Equivalent to +55 °C, 60% Confidence Level =5.14 FITS (3) Mean Time Between Failure in Years = 22206.65 (4) Assumes 20X Acceleration from 85 °C to +130 °C Note 1: 1 FIT = 1 Failure in One Billion Hours. Note 2: HAST, Temp Cycle & Thermal Shock are subjected to J-STD-020 MSL Preconditioning Reliability Data Report Report Number: R478 Report generated on: Mon Aug 17 11:54:22 PDT 2015 HIGH TEMPERATURE BAKE AT 150 DEG C PACKAGE TYPE SAMPLE SIZE QFN/DFN Totals 1395 1,395 OLDEST DATE NEWEST DATE K DEVICE HRS No. of FAILURES CODE CODE 0814 - 1410 - 1321 1,321 0 0 OLDEST DATE NEWEST DATE K DEVICE HRS No. of FAILURES CODE CODE 0803 - 1127 - 240 240 0 0 HIGH TEMPERATURE BAKE AT 175 DEG C PACKAGE TYPE SAMPLE SIZE SOT Totals 240 240