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1-888-IN
Microprocessor CORE Voltage Regulator
Multi-Phase Buck PWM Controller
The HIP6301V and HIP6302V control microprocessor
CORE voltage regulation by driving up to four
synchronous-rectified buck channels in parallel. Multiphase
buck converter architecture uses interleaved timing to
multiply ripple frequency and reduce input and output ripple
currents. Lower ripple results in fewer components, lower
component cost, reduced power dissipation, and a smaller
implementation area. The HIP6301V is a versatile 2- to
4-phase controller and the HIP6302V is a cost-saving
dedicated 2-phase controller.
The HIP6301V and HIP6302V are exact pin compatible
replacements for their predecessor parts, the HIP6301 and
HIP6302. They are the first controllers to incorporate
Dynamic VID™ technology to manage the output voltage
and current during on-the-fly DAC changes. Using Dynamic
VID, the HIP6301V and HIP6302V detect changes in the
VID code, and gradually change the reference in 25mV
increments until reaching the new value. By gradually
changing the reference setting, in-rush current and the
accompanying voltage swings remain negligibly small.
Intersil offers a wide range of MOSFET drivers to form highly
integrated solutions for high-current, high slew-rate
applications. The HIP6301V and HIP6302V regulate output
voltage, balance load currents and provide protective
functions for two to four synchronous-rectified buck
converter channels. These parts feature an integrated
high-bandwidth error amplifier for fast, precise regulation
and a 5-bit DAC for the digital interface to program the 0.8%
accuracy. A window comparator toggles PGOOD if the
output voltage moves out of range, and acts to protect the
load in case of over voltage.
Current sensing is accomplished by reading the voltage
developed across the lower MOSFETs during their
conduction intervals. Current sensing provides the needed
signals for precision droop, channel-current balancing, load
sharing, and overcurrent protection. This saves cost by
taking advantage of the power device’s parasitic on
resistance.
1
HIP6301V, HIP6302V
May 5, 2008
FN9034.3
Features
• Multi-Phase Power Conversion
• Precision CORE Voltage Regulation
- ±0.8% System Accuracy Over-Temperature
• Microprocessor Voltage Identification Input
- Dynamic-VID Technology
- 5-bit VID Decoder
• Precision Channel-Current Balance
• Overcurrent Protection
• Lossless Current Sensing
• Programmable “Droop” Voltage
• Fast Transient Response
• Selection of 2-, 3-, or 4-Phase Operation
• High Ripple Frequency (100kHz to 6MHz)
• Pb-Free Available (RoHS Compliant)
Ordering Information
PART
MARKING
TEMP.
RANGE
(°C)
PACKAGE
HIP6301VCB*
HIP6301VCB
0 to +70
20 Ld SOIC
M20.3
HIP6301VCBZ*
(Note)
HIP6301VCBZ
0 to +70
20 Ld SOIC
(Pb-free)
M20.3
HIP6301VCBZA* HIP6301VCBZ
(Note)
0 to +70
20 Ld SOIC
(Pb-free)
M20.3
HIP6302VCB*
HIP6302VCB
0 to +70
16 Ld SOIC
M16.15
HIP6302VCBZ*
(Note)
HIP6302VCBZ
0 to +70
16 Ld SOIC
(Pb-free)
M16.15
PART
NUMBER
PKG.
DWG. #
*Add “-T” suffix for tape and reel. Please refer to TB347 for details on
reel specifications.
NOTE: These Intersil Pb-free plastic packaged products employ
special Pb-free material sets; molding compounds/die attach materials
and 100% matte tin plate PLUS ANNEAL - e3 termination finish, which
is RoHS compliant and compatible with both SnPb and Pb-free
soldering operations. Intersil Pb-free products are MSL classified at Pbfree peak reflow temperatures that meet or exceed the Pb-free
requirements of IPC/JEDEC J STD-020.
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 1-888-468-3774 | Intersil (and design) is a trademark of Intersil Americas Inc.
Copyright © Intersil Americas Inc. 2002, 2004, 2008. All Rights Reserved
Dynamic VID™ is a trademark of Intersil Americas Inc.
HIP6301V, HIP6302V
Pinouts
HIP6302V
(16 LD SOIC
TOP VIEW
HIP6301V
(20 LD SOIC
TOP VIEW
VID4 1
20 VCC
VID4 1
VID3 2
19 PGOOD
VID3 2
15 PGOOD
VID2 3
18 PWM4
VID2 3
14 ISEN1
VID1 4
17 ISEN4
VID1 4
13 PWM1
VID0 5
16 ISEN1
VID0 5
12 PWM2
COMP 6
15 PWM1
COMP 6
11 ISEN2
14 PWM2
FB 7
10 VSEN
FS/DIS 8
13 ISEN2
FS/DIS 8
GND 9
12 ISEN3
VSEN 10
11 PWM3
FB 7
2
16 VCC
9 GND
FN9034.3
May 5, 2008
HIP6301V, HIP6302V
HIP6301V Block Diagram
VCC
PGOOD
POWER-ON
RESET (POR)
VSEN
+
UV
-
X 0.9
THREE-STATE
OV
LATCH
CLOCK AND
SAWTOOTH
GENERATOR
S
+
+
OV

-
X1.15
+
+
PWM1
PWM
-
SOFTSTART
AND FAULT
LOGIC
FS/DIS
-

+
PWM2
PWM
-
COMP
+

+
PWM3
PWM
-
VID0
-
VID1
VID2
VID3
DYNAMIC
VID
D/A
+
+
-
E/A
-
VID4

+
-
CURRENT
FB
CORRECTION
PWM4
PWM
PHASE
NUMBER
CHANNEL
DETECTOR
ISEN1
I_TOT
-
+
+

+
OC
+
+
I_TRIP
ISEN2
ISEN3
ISEN4
GND
3
FN9034.3
May 5, 2008
HIP6301V, HIP6302V
HIP6302V Block Diagram
VCC
PGOOD
POWER-ON
RESET (POR)
VSEN
+
UV
-
X 0.9
TRI-STATE
OV
LATCH
CLOCK AND
SAWTOOTH
GENERATOR
S
+
+
OV
-
X1.15

FS/DIS
+
PWM
-
PWM1
-
SOFTSTART
AND FAULT
LOGIC
COMP
+
VID0

+
PWM
VID1
VID2
VID3
PWM2
DYNAMIC
VID
D/A
+
E/A
-
VID4
CURRENT
FB
CORRECTION
ISEN1
I_TOT
-

OC
+
I_TRIP
+
+
ISEN2
GND
4
FN9034.3
May 5, 2008
HIP6301V, HIP6302V
HIP6301V and HIP6302V Functional Pin Descriptions
HIP6302V
(16 LD SOIC
TOP VIEW
HIP6301V
(20 LD SOIC
TOP VIEW
VID4 1
20 VCC
VID4 1
VID3 2
19 PGOOD
VID3 2
15 PGOOD
VID2 3
18 PWM4
VID2 3
14 ISEN1
VID1 4
17 ISEN4
VID1 4
13 PWM1
VID0 5
16 ISEN1
VID0 5
12 PWM2
COMP 6
15 PWM1
COMP 6
11 ISEN2
14 PWM2
FB 7
10 VSEN
FS/DIS 8
13 ISEN2
FS/DIS 8
GND 9
12 ISEN3
VSEN 10
11 PWM3
FB 7
VID4, VID3, VID2, VID1 and VID0
(Pins 1 thru 5 - Both Parts)
Voltage Identification inputs. The HIP6301V and HIP6302V
decode the VID bits to establish the reference voltage (see
Table 1). Each pin has an internal 20µA pull-up current source
to 2.5V making the parts compatible with CMOS and TTL
logic from 5V down to 2.5V. When a VID change is detected,
the reference voltage slowly ramps up or down to the new
value in 25mV steps. VID input levels above 2.9V may
produce an reference-voltage offset inaccuracy.
COMP (Pin 6 - Both Parts)
Output of the internal error amplifier. Connect this pin to the
external feedback and compensation network.
FB (Pin 7 - Both Parts)
Inverting input of the internal error amplifier.
FS/DIS (Pin 8 - Both Parts)
Channel frequency, FSW, select and disable. A resistor from
this pin to ground sets the switching frequency of the
converter. Pulling this pin to ground disables the converter
and three states the PWM outputs. See Figure 10.
16 VCC
9 GND
PWM1 (Pin 15 - HIP6301V, Pin 13 - HIP6302V),
PWM2 (Pin 14 - HIP6301V, Pin 12 - HIP6302V),
PWM3 (Pin 11 - HIP6301V only) and PWM4
(Pin 18 - HIP6301V only)
PWM outputs for each channel. Connect these pins to the
PWM input of the external MOSFET driver. For HIP6301V
systems using 3 channels, connect PWM4 high. For two
channel systems, connect PWM3 and PWM4 high.
ISEN1 (Pin 16 - HIP6301V, Pin 14 - HIP6302V),
ISEN2 (Pin 13 - HIP6301V, Pin 11 - HIP6302V),
ISEN3 (Pin 12 - HIP6301V only) and ISEN4
(Pin 17 - HIP6301V only)
Current sense inputs from the individual converter channel’s
phase nodes. Unused sense lines MUST be left open.
PGOOD (Pin 19 - HIP6301V, Pin 15 - HIP6302V)
Power-good. This pin is an open-drain logic signal that
indicates when the microprocessor CORE voltage (VSEN
pin) is within specified limits and soft-start has timed out.
VCC (Pin 20 - HIP6301V, Pin 16 - HIP6302V)
Bias supply. Connect this pin to a 5V supply.
GND (Pin 9 - Both Parts)
Bias and reference ground. All signals are referenced to this
pin.
VSEN (Pin 10 - Both Parts)
Power-good monitor input. Connect to the microprocessor CORE
voltage.
5
FN9034.3
May 5, 2008
HIP6301V, HIP6302V
Typical Application - HIP6301V Controller with HIP6601B Gate Drivers
+12V
VIN
VCC
BOOT
UGATE
PVCC
HIP6601B
PHASE
DRIVER
PWM
+5V
LGATE
GND
FB
COMP
+12V
VIN
VCC
VSEN
ISEN1
VCC
PWM1
PGOOD
VID4
PWM2
VID3
ISEN2
VID2
VID1
BOOT
UGATE
PVCC
HIP6601B
DRIVER
PWM
LGATE
MAIN
CONTROL
HIP6301V
VID0
PHASE
GND
VCORE
PWM3
ISEN3
FS/DIS
+12V
VIN
PWM4
GND
ISEN4
VCC
BOOT
UGATE
PVCC
HIP6601B
PHASE
DRIVER
PWM
LGATE
GND
+12V
VIN
VCC
BOOT
UGATE
PVCC
HIP6601B
PWM
PHASE
DRIVER
LGATE
GND
6
FN9034.3
May 5, 2008
HIP6301V, HIP6302V
Absolute Maximum Ratings
Thermal Information
Supply Voltage, VCC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .+7V
Input, Output, or I/O Voltage . . . . . . . . . . GND -0.3V to VCC + 0.3V
Thermal Resistance (Typical, Note 1)
Recommended Operating Conditions
Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +5V ±5%
Ambient Temperature. . . . . . . . . . . . . . . . . . . . . . . . . . 0°C to +70°C
JA (°C/W)
16 Ld SOIC Package . . . . . . . . . . . . . . . . . . . . . . . .
70
20 Ld SOIC Package . . . . . . . . . . . . . . . . . . . . . . . .
65
Maximum Junction Temperature . . . . . . . . . . . . . . . . . . . . . . +150°C
Maximum Storage Temperature Range . . . . . . . . . .-65°C to +150°C
Pb-free reflow profile . . . . . . . . . . . . . . . . . . . . . . . . . .see link below
http://www.intersil.com/pbfree/Pb-FreeReflow.asp
CAUTION: Do not operate at or near the maximum ratings listed for extended periods of time. Exposure to such conditions may adversely impact product reliability and
result in failures not covered by warranty..
NOTES:
1. JA is measured with the component mounted on a high effective thermal conductivity test board in free air. (See Tech Brief TB379 for details.)
2. VID input levels above 2.9V may produce an reference-voltage offset inaccuracy.
3. Parts are 100% tested at +25°C. Temperature limits established by characterization and are not production tested.
Electrical Specifications
Operating Conditions: VCC = 5V, TA = +0°C to +70°C, Unless Otherwise Specified.
PARAMETER
TEST CONDITIONS
MIN
(Note 3)
TYP
MAX
(Note 3)
UNITS
INPUT SUPPLY POWER
Input Supply Current
RT = 100k
-
-
15
mA
POR (Power-On Reset) Threshold
VCC Rising
4.25
4.38
4.5
V
VCC Falling
3.75
3.88
4.00
V
Percent system deviation from programmed VID Codes
-0.8
-
0.8
%
DAC (VID0 - VID3) Input Low Voltage DAC Programming Input Low Threshold Voltage
-
-
0.8
V
DAC (VID0 - VID3) Input High Voltage DAC Programming Input High Threshold Voltage
2.0
-
-
V
VID Pull-Up
VIDx = 0V or VIDx = 2.5V (Note 2); Not tested - for reference only
10
-
40
µA
Frequency, FSW
RT = 100k, ±1%
224
280
336
kHz
Disable Voltage
VFS/DIS to disable controller; Not tested - for reference, only
-
-
1.0
V
DC Gain
RL = 10k to ground
-
72
-
dB
Gain-Bandwidth Product
CL = 100pF, RL = 10k to ground
-
18
-
MHz
Slew Rate
CL = 100pF, RL = 10k to ground
-
5.3
-
V/µs
Maximum Output Voltage
RL = 10k to ground
3.6
-
-
V
Minimum Output Voltage
RL = 10k to ground
-
-
0.5
V
Full-Scale Current Level
Not tested - for reference, only
-
50
-
µA
Overcurrent Trip Level
Not tested - for reference, only
-
82.5
-
µA
Undervoltage Threshold
VSEN Rising
-
0.92
-
VDAC
Undervoltage Threshold
VSEN Falling
-
0.90
-
VDAC
PGOOD Low Output Voltage
IPGOOD = 4mA
-
-
0.4
V
1.12
1.15
1.20
VDAC
-
2
-
%
REFERENCE AND DAC
System Accuracy
CHANNEL GENERATOR
ERROR AMPLIFIER
ISEN
POWER-GOOD MONITOR
PROTECTION
Overvoltage Threshold
VSEN Rising
Overvoltage Hysteresis
VSEN Falling; Not tested - for reference, only
7
FN9034.3
May 5, 2008
HIP6301V, HIP6302V
RIN
FB
VIN
ERROR
AMPLIFIER
+
COMPARATOR
CORRECTION

+
-
Q1
PWM
CIRCUIT
+
PWM1
HIP6601B
IL1
-
DAC
PROGRAMMABLE
REFERENCE
L01
Q2
PHASE
+

CURRENT
ISEN1
RISEN1
SENSING
I AVERAGE
CURRENT
AVERAGING
VCORE
COUT
+

CURRENT
ISEN2
RLOAD
RISEN2
SENSING
VIN
PHASE
-
+

CORRECTION
COMPARATOR
+
-
Q3
PWM
CIRCUIT
PWM2
L02
HIP6601B
IL2
Q4
FIGURE 1. SIMPLIFIED BLOCK DIAGRAM OF THE HIP6301V VOLTAGE AND CURRENT CONTROL LOOPS FOR 2-PHASE REGULATOR
Operation
Figure 1 shows a simplified diagram of the voltage regulation
and current control loops. Both voltage and current feedback
are used to precisely regulate voltage and tightly control the
output currents, IL1 and IL2, of the two power channels. The
voltage loop comprises the error amplifier, comparators, gate
drivers and output MOSFETs. The error amplifier is
essentially connected as a voltage follower that has as an
input, the programmable reference DAC and an output that
is the CORE voltage.
Voltage Loop
Feedback from the CORE voltage is applied via resistor RIN
to the inverting input of the error amplifier. This signal can
drive the error amplifier output either high or low, depending
upon the CORE voltage. Low CORE voltage makes the
amplifier output move towards a higher output voltage level.
Amplifier output voltage is applied to the positive inputs of
the comparators via the correction summing networks.
Out-of-phase sawtooth signals are applied to the two
Comparators inverting inputs. Increasing error amplifier
voltage results in increased comparator output duty cycle.
This increased duty cycle signal is passed through the PWM
8
CIRCUIT with no phase reversal and on to the HIP6601B,
again with no phase reversal for gate drive to the upper
MOSFETs, Q1 and Q3. Increased duty cycle or ON-time for
the MOSFET transistors results in increased output voltage
to compensate for the low output voltage sensed.
Current Loop
The current control loop works in a similar fashion to the
voltage control loop, but with current control information
applied individually to each channel’s comparator. The
information used for this control is the voltage that is
developed across rDS(ON) of the lower MOSFETs, Q2 and
Q4, when they are conducting. A single resistor converts and
scales the voltage across the MOSFETs to a current that is
applied to the current sensing circuit within the controller.
Output from these sensing circuits is applied to the current
averaging circuit. Each PWM channel receives the
difference signal from the summing circuit that compares the
average sensed current to the individual channel current.
When a power channel’s current is greater than the average
current, the signal applied via the summing correction circuit
to the comparator, reduces the output pulse width of the
comparator to compensate for the detected “above average”
current in that channel.
FN9034.3
May 5, 2008
HIP6301V, HIP6302V
Droop Compensation
Initialization
In addition to control of each power channel’s output current,
the average channel current is also used to provide CORE
voltage droop compensation. Average full channel current is
defined as 50µA. By selecting an input resistor, RIN, the
amount of voltage droop required at full load current can be
programmed. The average current driven into the FB pin
results in a voltage increase across resistor RIN that is in the
direction to make the error amplifier “see” a higher voltage at
the inverting input, resulting in the Error Amplifier adjusting
the output voltage lower. The voltage developed across RIN
is equal to the “droop” voltage. “Current Sensing and
Balancing” on page 13 for more details.
HIP6301V and HIP6302V circuits usually operate from an
ATX power supply. Many functions are initiated by the rising
supply voltage to the VCC pin of the controller. Oscillator,
Sawtooth Generator, Soft-start and other functions are
initialized during this interval. These circuits are controlled by
POR, Power-On Reset. During this interval, the PWM
outputs are driven to a three-state condition that makes
these outputs essentially open. This state results in no gate
drive to the output MOSFETS.
Applications and Convertor Start-Up
Each PWM power channel’s current is regulated. This
enables the PWM channels to accurately share the load
current for enhanced reliability. The HIP6601, HIP6602 or
HIP6603 MOSFET driver interfaces with the HIP6301V. For
more information, see the datasheets for the individual
Intersil MOSFET drivers.
The HIP6301V is capable of controlling up to 4 PWM power
channels. Connecting unused PWM outputs to VCC
automatically sets the number of channels. The phase
relationship between the channels is 360°/number of active
PWM channels. For example, for three channel operation,
the PWM outputs are separated by 120°. Figure 2 shows the
PWM output signals for a four channel system.
PWM 1
PWM 2
PWM 3
PWM 4
FIGURE 2. FOUR PHASE PWM OUTPUT AT 500kHz
Power supply ripple frequency is determined by the channel
frequency, FSW, multiplied by the number of active channels.
For example, if the channel frequency is set to 250kHz and
there are three phases, the ripple frequency is 750kHz.
The IC monitors and precisely regulates the CORE voltage
of a microprocessor. After initial start-up, the controller also
provides protection for the load and the power supply. The
following section discusses these features.
9
Once the VCC voltage reaches 4.375V (±125mV), a voltage
level to insure proper internal function, the PWM outputs are
enabled and the Soft-start sequence is initiated. If for any
reason, the VCC voltage drops below 3.875V (±125mV), the
POR circuit shuts the converter down and again three states
the PWM outputs.
Soft-start
After the POR function is completed with VCC reaching
4.375V, the soft-start sequence is initiated. Soft-start by its
slow rise in CORE voltage from zero, avoids an overcurrent
condition by slowly charging the discharged output
capacitors. This voltage rise is initiated by an internal DAC
that slowly raises the reference voltage to the error amplifier
input. The voltage rise is controlled by the oscillator
frequency and the DAC within the controller, therefore, the
output voltage is effectively regulated as it rises to the final
programmed CORE voltage value.
For the first 32 PWM switching cycles, the DAC output
remains inhibited and the PWM outputs remain three stated.
From the 33rd cycle and for another, approximately
150 cycles the PWM output remains low, clamping the lower
output MOSFETs to ground, (see Figure 3). The time
variability is due to the error amplifier, sawtooth generator and
comparators moving into their active regions. After this short
interval, the PWM outputs are enabled and increment the
PWM pulse width from zero duty cycle to operational pulse
width, thus allowing the output voltage to slowly reach the
CORE voltage. The CORE voltage will reach its programmed
value before the 2048 cycles, but the PGOOD output will not
be initiated until the 2048th PWM switching cycle.
The soft-start time or delay time, DT = 2048/FSW. For an
oscillator frequency, FSW, of 200kHz, the first 32 cycles or
160µs, the PWM outputs are held in a three state level as
explained above. After this period and a short interval
previously described, the PWM outputs are initiated and the
voltage rises in 10.08ms, for a total delay time DT of 10.24ms.
Figure 3 shows the start-up sequence as initiated by a fast
rising 5V supply, VCC, applied to the controller. Note the
short rise to the three state level in PWM 1 output during first
32 PWM cycles.
Figure 4 shows the waveforms when the regulator is
operating at 200kHz. Note that the soft-start duration is a
FN9034.3
May 5, 2008
HIP6301V, HIP6302V
function of the Channel Frequency, as explained previously.
Also note the pulses on the COMP terminal. These pulses
are the current correction signal feeding into the comparator
input (see Figure 1).
12V ATX
SUPPLY
PGOOD
Figure 5 shows the regulator operating from an ATX supply.
In this figure, note the slight rise in PGOOD as the 5V supply
rises.The PGOOD output stage is made up of NMOS and
PMOS transistors. On the rising VCC, the PMOS device
becomes active slightly before the NMOS transistor pulls
“down”, generating the slight rise in the PGOOD voltage.
PWM 1
OUTPUT
VCORE
5V ATX
SUPPLY
VIN = 5V, CORE LOAD CURRENT = 31A
FREQUENCY 200kHz
ATX SUPPLY ACTIVATED BY ATX “PS-ON PIN”
FIGURE 5. SUPPLY POWERED BY ATX SUPPLY
DELAY TIME
PGOOD
VCORE
5V
VCC
Note that Figure 5 shows the 12V gate driver voltage
available before the 5V supply to the controller has reached
its threshold level. If conditions were reversed and the 5V
supply was to rise first, the start-up sequence would be
different. In this case the controller may sense an
overcurrent condition due to charging the output capacitors.
The supply would then restart and go through the normal
soft-start cycle.
Dynamic VID
VIN = 12V
FIGURE 3. START-UP OF 4-PHASE SYSTEM OPERATING
AT 500kHz
V COMP
DELAY TIME
PGOOD
VCORE
5V
VCC
VIN = 12V
The HIP6301V and HIP6302V require up to two full clock
cycles to detect a change in the VID code. VID code
changes that are not valid for at least two cycles may or may
not be detected. Once detected, the controller waits an
additional two-cycle wait period to be certain the change is
stable. After the two-cycle wait period, the DAC begins
stepping toward the new VID setting in 25mV increments.
The DAC makes one 25mV step every two clock cycles. For
example, a 500kHz system detecting a change from 1.300V
to 1.800V requires between 84ms and 88ms to complete the
change.
If a new VID code is detected during a DAC change and the
DAC can continue toward the new VID code without
changing direction, processing continues without
interruption. If a new VID code is detected during a DAC
change and the DAC has to change direction in order to
proceed toward then new VID code, processing halts. A
two-cycle wait period is initiated and processing continues
as above. These decisions are made with reference to the
transitional DAC value rather than the original target value.
FIGURE 4. START-UP OF 4-PHASE SYSTEM OPERATING
AT 200kHz
10
FN9034.3
May 5, 2008
HIP6301V, HIP6302V
input. PWM outputs are driven low when the VSEN pin
detects that the CORE voltage is 15% above the
programmed VID level. This condition drives the PWM
outputs low, causing in the lower or MOSFETs to conduct
and shunt the CORE voltage to ground to protect the load.
1.85V
1.85V
VCORE
VREF
PGOOD
5.00V
VID CHANGE
5.00V
50µs/DIV
FIGURE 6. VCORE TRACKING THE REFERENCE VOLTAGE
AFTER A 1.85V TO 1.10V CHANGE COMMAND
Undervoltage
The VSEN pin also detects when the CORE voltage falls
more than 10% below the VID programmed level. This
causes PGOOD to go low, but has no other effect on
operation and is not latched. There is also hysteresis in this
detection point.
VCORE
Overcurrent
VREF
1.10V
1.10V
PGOOD
5.00V
If after this event, the CORE voltage falls below the
overvoltage limit (plus some hysteresis), the PWM outputs
will be three state. The HIP6601 family drivers pass the
three state information along, and shuts off both upper and
lower MOSFETs. This prevents “dumping” of the output
capacitors back through the lower MOSFETs, avoiding a
possibly destructive ringing of the capacitors and output
inductors. If the conditions that caused the overvoltage still
persist, the PWM outputs will be cycled between three state
and VCORE clamped to ground, as a hysteretic shunt
regulator.
5.00V
VID CHANGE
50µs/DIV
FIGURE 7. VCORE TRACKING THE REFERENCE VOLTAGE
AFTER A 1.10V TO 1.85V CHANGE COMMAND
Fault Protection
The HIP6301V and HIP6302V protect the microprocessor
and the entire power system from damaging stress levels.
Within the controller, both overvoltage and overcurrent
circuits are incorporated to protect the load and regulator.
Overvoltage
The VSEN pin is connected to the microprocessor CORE
voltage. A CORE overvoltage condition is detected when the
VSEN pin goes more than 15% above the programmed VID
level.
In the event of an overcurrent condition, the overcurrent
protection circuit reduces the average current delivered to
less than 25% of the current limit. When an overcurrent
condition is detected, the controller forces all PWM outputs
into a three state mode. This condition results in the gate
driver removing drive to the output stages. The controller
goes into a wait delay timing cycle that is equal to the
soft-start ramp time. PGOOD also goes “low” during this time
due to VSEN going below its threshold voltage.To lower the
average output dissipation, the soft-start initial wait time is
increased from 32 to 2048 cycles, then the soft-start ramp is
initiated. At a PWM frequency of 200kHz, for instance, an
overcurrent detection would cause a dead time of 10.24ms,
then a ramp of 10.08ms.
At the end of the delay, PWM outputs are restarted and the
soft-start ramp is initiated. If a short is present at that time,
the cycle is repeated. This is the hiccup mode.
Figure 8 shows the supply shorted under operation and the
hiccup operating mode previously described. Note that due
to the high short circuit current, overcurrent is detected
before completion of the start-up sequence so the delay is
not quite as long as the normal soft-start cycle.
The overvoltage condition is latched, disabling normal PWM
operation, and causing PGOOD to go low. The latch can
only be reset by lowering and returning VCC high to initiate a
POR and soft-start sequence.
During a latched overvoltage, the PWM outputs will be
driven either low or three state, depending upon the VSEN
11
FN9034.3
May 5, 2008
HIP6301V, HIP6302V
TABLE 1. VOLTAGE IDENTIFICATION CODES (Continued)
.
SHORT APPLIED HERE
VID4
VID3
VID2
VID1
VID0
VDAC
0
1
0
0
1
1.625
0
1
0
0
0
1.650
0
0
1
1
1
1.675
0
0
1
1
0
1.700
HICCUP MODE. SUPPLY POWERED BY ATX SUPPLY
CORE LOAD CURRENT = 31A, 5V LOAD = 5A
SUPPLY FREQUENCY = 200kHz, VIN = 12V
0
0
1
0
1
1.725
0
0
1
0
0
1.750
ATX SUPPLY ACTIVATED BY ATX “PS-ON PIN”
0
0
0
1
1
1.775
0
0
0
1
0
1.800
0
0
0
0
1
1.825
0
0
0
0
0
1.850
PGOOD
SHORT
CURRENT
50A/Div
FIGURE 8. SHORT APPLIED TO SUPPLY AFTER POWER-UP
CORE Voltage Programming
The voltage identification pins (VID0, VID1, VID3, and VID4)
set the CORE output voltage. Each VID pin is pulled to 2.5V by
an internal 20µA current source and accepts open-collector/
open-drain/open-switch-to-ground or standard low-voltage
TTL or CMOS signals.
Table 1 shows the nominal DAC voltage as a function of the
VID codes. The power supply system is ±0.8% accurate over
the operating temperature and voltage range.
TABLE 1. VOLTAGE IDENTIFICATION CODES
VID4
VID3
VID2
VID1
VID0
VDAC
1
1
1
1
1
Off
1
1
1
1
0
1.100
1
1
1
0
1
1.125
1
1
1
0
0
1.150
1
1
0
1
1
1.175
1
1
0
1
0
1.200
1
1
0
0
1
1.225
1
1
0
0
0
1.250
1
0
1
1
1
1.275
1
0
1
1
0
1.300
1
0
1
0
1
1.325
1
0
1
0
0
1.350
1
0
0
1
1
1.375
1
0
0
1
0
1.400
1
0
0
0
1
1.425
1
0
0
0
0
1.450
0
1
1
1
1
1.475
0
1
1
1
0
1.500
0
1
1
0
1
1.525
0
1
1
0
0
1.550
0
1
0
1
1
1.575
0
1
0
1
0
1.600
12
FN9034.3
May 5, 2008
HIP6301V, HIP6302V
RIN
RFB
Cc
COMP
FB
VIN
HIP6301V
COMPARATOR
+
CORRECTION
+
-
L01
Q1
PWM
CIRCUIT
VCORE
PWM
HIP6601
IL
Q2
+
PHASE
DIFFERENCE
+
REFERENCE
DAC
RLOAD
GENERATOR
COUT
SAWTOOTH
ERROR
AMPLIFIER
ISEN
CURRENT
RISEN
SENSING
CURRENT
SENSING
FROM
OTHER
CHANNELS
TO OTHER
CHANNELS
AVERAGING
TO
OVERCURRENT
TRIP
ONLY ONE OUTPUT
STAGE SHOWN
INDUCTOR
CURRENT(S)
FROM
OTHER
CHANNELS
+
COMPARATOR
REFERENCE
FIGURE 9. SIMPLIFIED FUNCTIONAL BLOCK DIAGRAM SHOWING CURRENT AND VOLTAGE SAMPLING
Current Sensing and Balancing
2. Reduce the regulator output voltage with increasing load
current (droop)
Overview
3. Balance the IL currents in multiple channels
The HIP6301V and HIP6302V sample the on-state voltage
drop across each synchronous MOSFET, Q2, as an
indication of the inductor current in that phase, see Figure 9.
Neglecting AC effects (to be discussed later), the voltage
drop across Q2 is simply rDS(ON)(Q2) x inductor current (IL).
Note that IL, the inductor current, is either 1/2, 1/3, or 1/4 of
the total current (ILT), depending on how many phases are
in use.
The voltage at Q2’s drain, the PHASE node, is applied to the
RISEN resistor to develop the IISEN current through the ISEN
pin. This pin is held at virtual ground, so the current through
RISEN is shown in Equation 1:
r DS  ON   Q2 
I L = ---------------------R
ISEN
(EQ. 1)
The IISEN current provides information to perform the
following functions:
1. Detection of an overcurrent condition
13
Overcurrent, Selecting RISEN
The current detected through the RISEN resistor is averaged
with the current(s) detected in the other 1, 2, or 3 channels.
The averaged current is compared with a trimmed, internally
generated current, and used to detect an overcurrent
condition.
The nominal current through the RISEN resistor should be
50µA at full output load current, and the nominal trip point for
overcurrent detection is 165% of that value, or 82.5µA
(typical current levels) as shown in Equation 2. Therefore:
 I L r DS  ON   Q2 
IR ISEN = ---------------------------------------------50A
(EQ. 2)
For a full load of 25A per phase, and an rDS(ON) (Q2) of
4m, RISEN = 2k.
The overcurrent trip point would be 165% of 25A, or ~ 41A
per phase. The RISEN value can be adjusted to change the
overcurrent trip point, but it is suggested to stay within ±25%
of nominal.
FN9034.3
May 5, 2008
HIP6301V, HIP6302V
The average of the currents detected through the RISEN
resistors is also steered to the FB pin. There is no DC return
path connected to the FB pin except for RIN, so the average
current creates a voltage drop across RIN. This drop
increases the apparent VCORE voltage with increasing load
current, causing the system to decrease VCORE to maintain
balance at the FB pin. This is the desired “droop” voltage
used to maintain VCORE within limits under transient
conditions.
With a high dv/dt load transient, typical of high performance
microprocessors, the largest deviations in output voltage
occur at the leading and trailing edges of the load transient.
In order to fully utilize the output-voltage tolerance range, the
output voltage is positioned in the upper half of the range
when the output is unloaded and in the lower half of the
range when the controller is under full load. This droop
compensation allows larger transient voltage deviations and
thus reduces the size and cost of the output filter
components.
RIN should be selected to give the desired “droop” voltage at
the normal full load current 50µA applied through the RISEN
resistor (or at a different full load current if adjusted as in
“Overcurrent, Selecting RISEN” on page 13).
effects, such as series resistance, the peak-to-peak value of
the sawtooth current can be described by Equation 4.
2
V IN  V CORE  – V CORE
I P – P = ---------------------------------------------------------------- L   F SW   V IN 
Where: VCORE
VIN
L
FSW
= DC value of the output or VID voltage
= DC value of the input or supply voltage
= value of the inductor
= switching frequency
VIN = 12V,
L = 1.3µH,
FSW = 250kHz,
Then IP-P = 4.3A
25
20
15
10
5
(EQ. 3)
R IN = Vdroop   50A 
(EQ. 4)
Example: For VCORE = 1.6V,
AMPERES
Droop, Selection of RIN
0
For a Vdroop of 80mV, RIN = 1.6k
The AC feedback components, RFB and Cc, are scaled in
relation to RIN.
FIGURE 10. TWO CHANNEL MULTIPHASE SYSTEM
WITH CURRENT BALANCING DISABLED
Current Balancing
The detected currents are also used to balance the phase
currents.
The balancing circuit can not make up for a difference in
rDS(ON) between synchronous rectifiers. If a FET has a
higher rDS(ON), the current through that phase will be
reduced.
25
20
AMPERES
Each phase’s current is compared to the average of all
phase currents, and the difference is used to create an offset
in that phase’s PWM comparator. The offset is in a direction
to reduce the imbalance.
15
10
5
0
Figures 10 and 11 show the inductor current of a 2-phase
system without and with current balancing.
Inductor Current
The inductor current in each phase of a multiphase buck
converter has two components. There is a current equal to
the load current divided by the number of phases (ILT/n), and
a sawtooth current, (IP-P) resulting from switching. The
sawtooth component is dependent on the size of the
inductors, the switching frequency of each phase, and the
values of the input and output voltage. Ignoring secondary
14
FIGURE 11. TWO CHANNEL MULTIPHASE SYSTEM
WITH CURRENT BALANCING ENABLED
The inductor, or load current, flows alternately from VIN
through Q1 and from ground through Q2. The controller
samples the on-state voltage drop across each Q2 transistor
to indicate the inductor current in that phase. The voltage
drop is sampled 1/3 of a switching period, 1/FSW, after Q1 is
FN9034.3
May 5, 2008
HIP6301V, HIP6302V
turned OFF and Q2 is turned on. Because of the sawtooth
current component, the sampled current is different from the
average current per phase. Neglecting secondary effects,
the sampled current (ISAMPLE) can be related to the load
current (ILT) by Equation 5.
(EQ. 5)
There are two sets of critical components in a DC/DC
converter using a HIP6301V or HIP6302V controller and a
HIP6601 family gate driver. The power components are the
most critical because they switch large amounts of energy.
Next are small signal components that connect to sensitive
nodes or supply critical bypassing current and signal coupling.
Where: ILT = total load current
n = the number of channels
Example: Using the previously given conditions, and
for ILT = 100A,
n =4
1,000
Then ISAMPLE = 25.49A
As discussed previously, the voltage drop across each Q2
transistor at the point in time when current is sampled is
rDS(ON) (Q2) x ISAMPLE. The voltage at Q2’s drain, the
PHASE node, is applied through the RISEN resistor to the
HIP6301V ISEN pin. This pin is held at virtual ground, so the
current into ISEN is calculated in Equations 6 and 7:
 I SAMPLE r DS  ON   Q2 
I SENSE = ------------------------------------------------------------------R ISEN
 I SAMPLE r DS  ON   Q2 
R ISEN = ------------------------------------------------------------------50A
(EQ. 6)
(EQ. 7)
Example: From the previous conditions,
500
200
100
50
RT (k)
I LT
------- +  V IN V CORE – 3V
2
n
CORE
I SAMPLE = ----------------------------------------------------------------------------------- 6L   F SW   V IN 
picked up by the lower MOSFET. Any inductance in the
switched current path generates a large voltage spike during
the switching interval. Careful component selection, tight
layout of the critical components, and short, wide circuit
traces minimize the magnitude of voltage spikes. Contact
Intersil for evaluation board drawings of the component
placement and printed circuit board.
20
10
5
where ILT
= 100A,
ISAMPLE
= 25.49A,
2
rDS(ON) (Q2)
= 4m
1
Then: RISEN
= 2.04k and
ICURRENT TRIP
= 165%
Short circuit ILT
= 165A.
10
20
50
100
200
500
1k
2k
5k
10k
CHANNEL OSCILLATOR FREQUENCY, FSW (Hz)
FIGURE 12. RESISTANCE RT vs FREQUENCY
Channel Frequency Oscillator
The channel oscillator frequency is set by placing a resistor,
RT, to ground from the FS/DIS pin. Figure 12 is a curve
showing the relationship between frequency, FSW, and
resistor RT. To avoid pickup by the FS/DIS pin, it is important
to place this resistor next to the pin.
Layout Considerations
MOSFETs switch very fast and efficiently. The speed with
which the current transitions from one device to another
causes voltage spikes across the interconnecting
impedances and parasitic circuit elements. These voltage
spikes can degrade efficiency, radiate noise into the circuit
and lead to device overvoltage stress. Careful component
layout and printed circuit design minimizes the voltage
spikes in the converter. Consider, as an example, the turnoff
transition of the upper PWM MOSFET. Prior to turnoff, the
upper MOSFET was carrying channel current. During the
turnoff, current stops flowing in the upper MOSFET and is
15
The power components should be placed first. Locate the
input capacitors close to the power switches. Minimize the
length of the connections between the input capacitors, CIN,
and the power switches. Locate the output inductors and
output capacitors between the MOSFETs and the load.
Locate the gate driver close to the MOSFETs.
The critical small components include the bypass capacitors
for VCC and PVCC on the gate driver ICs. Locate the bypass
capacitor, CBP, for the controller close to the device. It is
especially important to locate the resistors associated with the
input to the amplifiers close to their respective pins, since they
represent the input to feedback amplifiers. Resistor RT, that
sets the oscillator frequency should also be located next to the
associated pin. It is especially important to place the RSEN
resistor(s) at the respective ISEN terminals.
FN9034.3
May 5, 2008
HIP6301V, HIP6302V
+5VIN
USE INDIVIDUAL METAL RUNS
FOR EACH CHANNEL TO HELP
ISOLATE OUTPUT STAGES
+12V
CBP
LOCATE NEXT TO IC PIN(S)
VCC
CBP
VCC PVCC
CBOOT
RFB
VCORE
HIP6601
PHASE
COUT
RT
HIP6301V
LOCATE NEXT
TO FB PIN
LOCATE NEAR TRANSISTOR
LO1
PWM
COMP FS/DIS
CT
CIN
FB
LOCATE NEXT TO IC PIN
RSEN
RIN
VSEN
ISEN
KEY
ISLAND ON POWER PLANE LAYER
ISLAND ON CIRCUIT PLANE LAYER
VIA CONNECTION TO GROUND PLANE
FIGURE 13. PRINTED CIRCUIT BOARD POWER PLANES AND ISLANDS
A multi-layer printed circuit board is recommended.
Figure 13 shows the connections of the critical components
for one output channel of the converter. Note that capacitors
CIN and COUT could each represent numerous physical
capacitors. Dedicate one solid layer, (usually the middle
layer of the PC board), for a ground plane and make all
critical component ground connections with vias to this layer.
Dedicate another solid layer as a power plane and break this
plane into smaller islands of common voltage levels. Keep
the metal runs from the PHASE terminal to inductor LO1
short. The power plane should support the input power and
output power nodes. Use copper filled polygons on the top
and bottom circuit layers for the phase nodes. Use the
remaining printed circuit layers for small signal wiring. The
wiring traces from the driver IC to the MOSFET gate and
source should be sized to carry at least one ampere of
current.
Component Selection Guidelines
Output Capacitor Selection
The output capacitor is selected to meet both the dynamic
load requirements and the voltage ripple requirements. The
load transient for the microprocessor CORE is characterized
by high slew rate (di/dt) current demands. In general,
multiple high quality capacitors of different size and dielectric
are paralleled to meet the design constraints.
Modern microprocessors produce severe transient load rates.
High frequency capacitors supply the initially transient current
and slow the load rate-of-change seen by the bulk capacitors.
The bulk filter capacitor values are generally determined by
the ESR (effective series resistance) and voltage rating
requirements rather than actual capacitance requirements.
16
High frequency decoupling capacitors should be placed as
close to the power pins of the load as physically possible. Be
careful not to add inductance in the circuit board wiring that
could cancel the usefulness of these low inductance
components. Consult with the manufacturer of the load on
specific decoupling requirements.
Use only specialized low-ESR capacitors intended for
switching-regulator applications for the bulk capacitors. The
bulk capacitor’s ESR determines the output ripple voltage
and the initial voltage drop following a high slew-rate
transient’s edge. In most cases, multiple capacitors of small
case size perform better than a single large case capacitor.
Bulk capacitor choices include aluminum electrolytic,
OS-Con, Tantalum and even ceramic dielectrics. An
aluminum electrolytic capacitor’s ESR value is related to the
case size with lower ESR available in larger case sizes.
However, the equivalent series inductance (ESL) of these
capacitors increases with case size and can reduce the
usefulness of the capacitor to high slew-rate transient
loading. Unfortunately, ESL is not a specified parameter.
Consult the capacitor manufacturer and measure the
capacitor’s impedance with frequency to select a suitable
component.
Output Inductor Selection
One of the parameters limiting the converter’s response to a
load transient is the time required to change the inductor
current. Small inductors in a multi-phase converter reduce
the response time without significant increases in total ripple
current.
The output inductor of each power channel controls the
ripple current. The control IC is stable for channel ripple
current (peak-to-peak) up to twice the average current. A
FN9034.3
May 5, 2008
single channel’s ripple current is approximtely calculated in
Equation 8:
0.5
V IN – V OUT V OUT
I = --------------------------------  ---------------F SW  L
V IN
0.4
The current from multiple channels tend to cancel each other
and reduce the total ripple current. Figure 14 gives the total
ripple current as a function of duty cycle, normalized to the
parameter  Vo    LxF SW  at zero duty cycle. To determine
the total ripple current from the number of channels and the
duty cycle, multiply the y-axis value by  Vo    LxF SW  .
Small values of output inductance can cause excessive
power dissipation. The HIP6301V and HIP6302V are
designed for stable operation for ripple currents up to twice
the load current. However, for this condition, the RMS
current is 115% above the value shown in “MOSFET
Selection and Considerations” on page 17. With all else
fixed, decreasing the inductance could increase the power
dissipated in the MOSFETs by 30%.
SINGLE
CHANNEL
0.8
VO / (Lx FSW)
RIPPLE CURRENT (AP-P)
1.0
2-CHANNEL
0.4
3-CHANNEL
0.2
4-CHANNEL
0
0.1
0.2
0.3
SINGLE
CHANNEL
0.3
2 CHANNEL
0.2
3 CHANNEL
0.1
0
4 CHANNEL
0
0.1
0.2
0.3
0.4
0.5
DUTY CYCLE (VO/VIN)
FIGURE 15. CURRENT MULTIPLIER vs DUTY CYCLE
First determine the operating duty ratio as the ratio of the
output voltage divided by the input voltage. Find the current
multiplier from the curve with the appropriate power
channels. Multiply the current multiplier by the full load
output current. The resulting value is the RMS current rating
required by the input capacitor.
Use a mix of input bypass capacitors to control the voltage
overshoot across the MOSFETs. Use ceramic capacitance for
the high frequency decoupling and bulk capacitors to supply
the RMS current. Small ceramic capacitors should be placed
very close to the drain of the upper MOSFET to suppress the
voltage induced in the parasitic circuit impedances.
0.6
0
CURRENT MULTIPLIER
(EQ. 8)
0.4
0.5
DUTY CYCLE (VO/VIN)
FIGURE 14. RIPPLE CURRENT vs DUTY CYCLE
Input Capacitor Selection
The important parameters for the bulk input capacitors are
the voltage rating and the RMS current rating. For reliable
operation, select bulk input capacitors with voltage and
current ratings above the maximum input voltage and
largest RMS current required by the circuit. The capacitor
voltage rating should be at least 1.25x greater than the
maximum input voltage and a voltage rating of 1.5x is a
conservative guideline. The RMS current required for a
multi-phase converter can be approximated with the aid of
Figure 15.
For bulk capacitance, several electrolytic capacitors
(Panasonic HFQ series or Nichicon PL series or Sanyo
MV-GX or equivalent) may be needed. For surface mount
designs, solid tantalum capacitors can be used, but caution
must be exercised with regard to the capacitor surge current
rating. These capacitors must be capable of handling the
surge-current at power-up. The TPS series available from
AVX, and the 593D series from Sprague are both surge
current tested.
MOSFET Selection and Considerations
In high-current PWM applications, the MOSFET power
dissipation, package selection and heatsink are the
dominant design factors. The power dissipation includes two
loss components; conduction loss and switching loss. These
losses are distributed between the upper and lower
MOSFETs according to duty factor (see Equation 9). The
conduction losses are the main component of power
dissipation for the lower MOSFETs, Q2 and Q4 of Figure 1.
Only the upper MOSFETs, Q1 and Q3 have significant
switching losses, since the lower device turns on and off into
near zero voltage.
The equations assume linear voltage-current transitions and
do not model power loss due to the reverse-recovery of the
lower MOSFETs body diode. The gate-charge losses are
dissipated by the Driver IC and don't heat the MOSFETs.
17
FN9034.3
May 5, 2008
However, large gate-charge increases the switching time,
tSW which increases the upper MOSFET switching losses.
Ensure that both MOSFETs are within their maximum
junction temperature at high ambient temperature by
calculating the temperature rise according to package
thermal-resistance specifications. A separate heatsink may
be necessary depending upon MOSFET power, package
type, ambient temperature and air flow.
2
I O  r DS  ON   V OUT I O  V IN  t SW  F SW
P UPPER = ------------------------------------------------------------ + ---------------------------------------------------------V IN
2
(EQ. 9)
2
I O  r DS  ON    V IN – V OUT 
P LOWER = --------------------------------------------------------------------------------V IN
A diode, anode to ground, may be placed across Q2 and Q4
of Figure 1. These diodes function as a clamp that catches
the negative inductor swing during the dead time between
the turn off of the lower MOSFETs and the turn on of the
upper MOSFETs. The diodes must be a Schottky type to
prevent the lossy parasitic MOSFET body diode from
conducting. It is usually acceptable to omit the diodes and let
the body diodes of the lower MOSFETs clamp the negative
inductor swing, but efficiency could drop one or two percent
as a result. The diode's rated reverse breakdown voltage
must be greater than the maximum input voltage.
18
FN9034.3
May 5, 2008
HIP6301V, HIP6302V
Small Outline Plastic Packages (SOIC)
M16.15 (JEDEC MS-012-AC ISSUE C)
N
INDEX
AREA
H
0.25(0.010) M
16 LEAD NARROW BODY SMALL OUTLINE PLASTIC PACKAGE
B M
INCHES
E
-B-
1
2
3
L
SEATING PLANE
-A-
A
D
h x 45°
-C-
e
A1
B
0.25(0.010) M
C
0.10(0.004)
C A M
SYMBOL
MIN
MAX
MIN
MAX
NOTES
A
0.0532
0.0688
1.35
1.75
-
A1
0.0040
0.0098
0.10
0.25
-
B
0.013
0.020
0.33
0.51
9
C
0.0075
0.0098
0.19
0.25
-
D
0.3859
0.3937
9.80
10.00
3
E
0.1497
0.1574
3.80
4.00
4
e

B S
1. Symbols are defined in the “MO Series Symbol List” in Section 2.2 of
Publication Number 95.
0.050 BSC
1.27 BSC
-
H
0.2284
0.2440
5.80
6.20
-
h
0.0099
0.0196
0.25
0.50
5
L
0.016
0.050
0.40
1.27
6
N

NOTES:
MILLIMETERS
16
0°
16
8°
0°
7
8°
Rev. 1 6/05
2. Dimensioning and tolerancing per ANSI Y14.5M-1982.
3. Dimension “D” does not include mold flash, protrusions or gate burrs.
Mold flash, protrusion and gate burrs shall not exceed 0.15mm (0.006
inch) per side.
4. Dimension “E” does not include interlead flash or protrusions. Interlead
flash and protrusions shall not exceed 0.25mm (0.010 inch) per side.
5. The chamfer on the body is optional. If it is not present, a visual index
feature must be located within the crosshatched area.
6. “L” is the length of terminal for soldering to a substrate.
7. “N” is the number of terminal positions.
8. Terminal numbers are shown for reference only.
9. The lead width “B”, as measured 0.36mm (0.014 inch) or greater above
the seating plane, shall not exceed a maximum value of 0.61mm
(0.024 inch).
10. Controlling dimension: MILLIMETER. Converted inch dimensions are
not necessarily exact.
19
FN9034.3
May 5, 2008
HIP6301V, HIP6302V
Small Outline Plastic Packages (SOIC)
M20.3 (JEDEC MS-013-AC ISSUE C)
20 LEAD WIDE BODY SMALL OUTLINE PLASTIC PACKAGE
N
INDEX
AREA
H
0.25(0.010) M
B M
INCHES
E
-B-
1
2
3
L
SEATING PLANE
-A-
A
D
h x 45°
-C-
e
A1
B
0.25(0.010) M
C
0.10(0.004)
C A M
SYMBOL
MIN
MAX
MIN
MAX
NOTES
A
0.0926
0.1043
2.35
2.65
-
A1
0.0040
0.0118
0.10
0.30
-
B
0.014
0.019
0.35
0.49
9
C
0.0091
0.0125
0.23
0.32
-
D
0.4961
0.5118
12.60
13.00
3
E
0.2914
0.2992
7.40
7.60
4
e

B S
0.050 BSC
1.27 BSC
-
H
0.394
0.419
10.00
10.65
-
h
0.010
0.029
0.25
0.75
5
L
0.016
0.050
0.40
1.27
6
N

NOTES:
MILLIMETERS
20
0°
20
8°
0°
1. Symbols are defined in the “MO Series Symbol List” in Section
2.2 of Publication Number 95.
7
8°
Rev. 2 6/05
2. Dimensioning and tolerancing per ANSI Y14.5M-1982.
3. Dimension “D” does not include mold flash, protrusions or gate
burrs. Mold flash, protrusion and gate burrs shall not exceed
0.15mm (0.006 inch) per side.
4. Dimension “E” does not include interlead flash or protrusions.
Interlead flash and protrusions shall not exceed 0.25mm (0.010
inch) per side.
5. The chamfer on the body is optional. If it is not present, a visual
index feature must be located within the crosshatched area.
6. “L” is the length of terminal for soldering to a substrate.
7. “N” is the number of terminal positions.
8. Terminal numbers are shown for reference only.
9. The lead width “B”, as measured 0.36mm (0.014 inch) or greater
above the seating plane, shall not exceed a maximum value of
0.61mm (0.024 inch)
10. Controlling dimension: MILLIMETER. Converted inch
dimensions are not necessarily exact.
For additional products, see www.intersil.com/en/products.html
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in the quality certifications found at www.intersil.com/en/support/qualandreliability.html
Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design, software and/or specifications at any time
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parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
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20
FN9034.3
May 5, 2008