R528 - Reliability Data

Reliability Data Report
Product Family R528
LTC6652 / LTC6655
Reliability Data Report
Report Number: R528
Report generated on: Mon Jan 18 14:01:05 PST 2016
OPERATING LIFE TEST
PACKAGE TYPE
SOIC/MSOP
Totals
SAMPLE SIZE
594
594
OLDEST DATE
NEWEST DATE
K DEVICE HRS
CODE
CODE
(+125°C)
0715
-
0919
-
594
594
1
No. of FAILURES
2,3
0
0
HIGHLY ACCELERATED STRESS TEST AT +130 DEG C / 85% RH
PACKAGE TYPE
SOIC/MSOP
Totals
SAMPLE SIZE
297
297
OLDEST DATE
NEWEST DATE
K DEVICE HRS
No. of FAILURES
4
CODE
CODE
(+85°C)
1046
-
1440
-
874
874
0
0
K DEVICE HRS
No. of FAILURES
PRESSURE COOKER TEST AT 15 PSIG , +121 DEG C
PACKAGE TYPE
SAMPLE SIZE
SOIC/MSOP
1111
Totals
1,111
OLDEST DATE
NEWEST DATE
CODE
CODE
0646
1413
114
0
-
-
114
0
OLDEST DATE
NEWEST DATE
K DEVICE
No. of FAILURES
CODE
CODE
CYCLES
0646
-
1413
-
540
540
0
0
OLDEST DATE
NEWEST DATE
K DEVICE
No. of FAILURES
TEMP CYCLE FROM -65 TO 150 DEG C
PACKAGE TYPE
SOIC/MSOP
Totals
SAMPLE SIZE
1196
1,196
THERMAL SHOCK FROM -65 TO 150 DEG C
PACKAGE TYPE
SAMPLE SIZE
CODE
CODE
CYCLES
SOIC/MSOP
1516
0648
1413
581
0
Totals
1,516
-
-
581
0
OLDEST DATE
NEWEST DATE
K DEVICE HRS
No. of FAILURES
CODE
CODE
0646
-
1046
-
323
323
0
0
HIGH TEMPERATURE BAKE AT 150 DEG C
PACKAGE TYPE
SAMPLE SIZE
SOIC/MSOP
Totals
333
333
(1) Assumes Activation Energy = 0.7 Electron Volts
(2) Failure Rate Equivalent to +55 °C, 60% Confidence Level =19.95 FITS
(3) Mean Time Between Failure in Years = 5722.67
(4) Assumes 20X Acceleration from 85 °C to +130 °C
Note 1: 1 FIT = 1 Failure in One Billion Hours.
Note 2: HAST, Temp Cycle & Thermal Shock are subjected to J-STD-020 MSL Preconditioning
Reliability Data Report
Report Number: R528
Report generated on: Mon Jan 18 14:01:05 PST 2016
HIGH TEMPERATURE BAKE AT 175 DEG C
PACKAGE TYPE
SAMPLE SIZE
SOIC/MSOP
616
Totals
616
OLDEST DATE
NEWEST DATE
K DEVICE HRS
No. of FAILURES
CODE
CODE
0648
-
1440
462
0
-
462
0