LOCAL INTERCONNECT NETWORK Test Certificate for LIN 2.1 Conformance Test - MASTER Applicant / Manufacturer: STMicroelectronics STMicroelectronics (Rousset) SAS ZI DE ROUSSET – AVENUE COQ FRANCE - 13106 ROUSSET CEDEX Device Under Test: STM8AF52AATC rev. U cut 2.4 (128K LQFP80) Test Sample Marking: ST U STM8AF52 AATC 9910P VG MYS 99 035 HW: STM8/128-EVAL rev.B SW: STM8_LIN_Package_4.1 Performed Tests: LIN OSI Layer 2 – Data Link Layer Node Configuration / Network Management Specification LIN Conformance Test Specification (October 10th, 2008) References: For the LIN Specification Package Revision 2.1 (November 24, 2006) Result / Status: The device has passed the test. Version / Date: 1.0 / 2011-09-15 Document Number: Test_Certificate_DLL21_20110530_110915_ST_STM8AF_Master_V1.0.doc ihr Reference: 20110530 For further details please ask for the detailed report. ihr GmbH Airport Boulevard B210 77836 Rheinmünster (Germany) TELEFON +49 - (0) - 72 29 -18 47 5 - 0 TELEFAX +49 - (0) - 72 29 - 18 47 5 - 11 eMail: [email protected] Internet: www.ihr.de