Features • • • • • • • • • • • Serial Peripheral Interface (SPI) Compatible Supports SPI Modes 0 (0,0) and 3 (1,1) 128-byte Page Mode Only for Write Operations Low-voltage and Standard-voltage Operation – 2.7 (VCC = 2.7V to 5.5V) – 1.8 (VCC = 1.8V to 5.5V) 10 MHz (5V), 5MHz (2.7V) and 2 MHz (1.8V) Clock Rate Block Write Protection Protect 1/4, 1/2, or Entire Array Write Protect (WP) Pin and Write Disable Instructions for both Hardware and Software Data Protection High Reliability – Endurance: 100K Write Cycles – Data Retention: >40 Years 8-lead PDIP, 8-lead EIAJ SOIC, 16-lead JEDEC SOIC, 8-lead Leadless Array Package, and 8-lead SOIC Array Package (SAP) Die Sales: Wafer Form, Waffle Pack, and Bumped Wafers Description The AT25HP256/512 provides 262,144/524,288 bits of serial electrically erasable programmable read only memory (EEPROM) organized as 32,768/65,536 words of 8-bits each. The device is optimized for use in many industrial and commercial applications where high-speed, low-power, and low-voltage operation are essential. The AT25HP256/512 is available in a space saving 8-lead PDIP (AT25HP256/512), 8-lead EIAJ SOIC (AT25HP256), 16-lead JEDEC SOIC (AT25HP512), 8-lead Leadless Array (AT25HP256/512) package, and 8-lead SOIC Array package (SAP). In addition, the entire family is available in 2.7V (2.7V to 5.5V) and 1.8V (1.8V to 5.5V) versions. Table 1. Pin Configurations Pin Name Function CS Chip Select SCK Serial Data Clock SI Serial Data Input SO Serial Data Output GND Ground VCC Power Supply WP Write Protect 256K (32,768 x 8) 512K (65,536 x 8) AT25HP256(1) AT25HP512 Note: 1. Not recommended for new design; please refer to AT25256A datasheet. 16-lead SOIC CS SO NC NC NC NC WP GND 1 2 3 4 5 6 7 8 VCC HOLD NC NC NC NC SCK SI 16 15 14 13 12 11 10 9 8-lead Leadless Array VCC HOLD SCK SI Suspends Serial Input HOLD SPI Serial EEPROMs 8 1 7 2 6 3 5 4 CS SO WP GND Bottom View 8-lead SOIC Array Package (SAP) VCC HOLD SCK SI 8 7 1 2 6 3 5 4 Bottom View CS SO WP GND 8-lead SOIC 8-lead PDIP CS 1 8 VCC SO 2 7 HOLD WP GND 3 6 SCK 4 5 SI CS 1 8 SO 2 7 HOLD WP GND 3 6 SCK 4 5 SI VCC Rev. 1113L–SEEPR–3/06 1 The AT25HP256/512 is enabled through the Chip Select pin (CS) and accessed via a 3wire interface consisting of Serial Data Input (SI), Serial Data Output (SO), and Serial Clock (SCK). All programming cycles are completely self-timed, and no separate erase cycle is required before write. Block Write protection is enabled by programming the status register with top ¼, top ½ or entire array of write protection. Separate Program Enable and Program Disable instructions are provided for additional data protection. Hardware data protection is provided via the WP pin to protect against inadvertent write attempts to the status register. The HOLD pin may be used to suspend any serial communication without resetting the serial sequence. Absolute Maximum Ratings* Operating Temperature..................................–55°C to +125°C *NOTICE: Storage Temperature .....................................–65°C to +150°C Voltage on Any Pin with Respect to Ground .................................... –1.0V to +7.0V Maximum Operating Voltage .......................................... 6.25V Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. DC Output Current........................................................ 5.0 mA Figure 1. Block Diagram 32,768/65,536 x 8 2 AT25HP256/512 1113L–SEEPR–3/06 AT25HP256/512 Table 2. Pin Capacitance(1) Applicable over recommended operating range from TA = 25°C, f = 1.0 MHz, VCC = +5.0V (unless otherwise noted) Symbol Test Conditions COUT Output Capacitance (SO) CIN Note: Max Units Conditions 8 pF VOUT = 0V 6 pF VIN = 0V Input Capacitance (CS, SCK, SI, WP, HOLD) 1. This parameter is characterized and is not 100% tested. Table 3. DC Characteristics Applicable over recommended operating range from: TAI = –40°C to +85°C, VCC = +1.8V to +5.5V, TAC = 0°C to +70°C, VCC = +1.8V to +5.5V (unless otherwise noted) Symbol Parameter VCC1 Supply Voltage VCC2 Max Units 1.8 3.6 V Supply Voltage 2.7 5.5 V VCC3 Supply Voltage 4.5 5.5 V ICC1 Supply Current VCC = 5.0V at 5 MHz, SO = Open Read 6.0 10.0 mA ICC2 Supply Current VCC = 5.0V at 5 MHz, SO = Open Write 4.0 7.0 mA ISB1 Standby Current VCC = 1.8V, CS = VCC 0.1 2.0 µA ISB2 Standby Current VCC = 2.7V, CS = VCC 0.2 2.0 µA ISB3 Standby Current VCC = 5.0V, CS = VCC 2.0 5.0 µA IIL Input Leakage VIN = 0V to VCC –3.0 3.0 µA IOL Output Leakage VIN = 0V to VCC, TAC = 0°C to 70°C –3.0 3.0 µA Input Low Voltage –0.6 VCC x 0.3 V Input High Voltage VCC x 0.7 VCC + 0.5 V 0.4 V VIL(1) VIH (1) VOL1 Output Low Voltage VOH1 Output High Voltage VOL2 Output Low Voltage VOH2 Output High Voltage Note: Test Condition 4.5V ≤ VCC ≤ 5.5V 1.8V ≤ VCC ≤ 3.6V Min IOL = 3.0 mA IOH = –1.6 mA VCC – 0.8 IOL = 0.15 mA IOH = –100 µA Typ V 0.2 VCC – 0.2 V V 1. VIL and VIH max are reference only and are not tested. 3 1113L–SEEPR–3/06 Table 4. AC Characteristics Applicable over recommended operating range from TA = –40°C to +85°C, VCC = As Specified, CL = 1 TTL Gate and 30 pF (unless otherwise noted) Symbol Parameter Voltage Min Max Units fSCK SCK Clock Frequency 4.5 – 5.5 2.7 – 5.5 1.8 – 5.5 0 0 0 10 5 2 MHz tRI Input Rise Time 4.5 – 5.5 2.7 – 5.5 1.8 – 5.5 2 2 2 µs tFI Input Fall Time 4.5 – 5.5 2.7 – 5.5 1.8 – 5.5 2 2 2 µs tWH SCK High Time 4.5 – 5.5 2.7 – 5.5 1.8 – 5.5 40 80 200 ns tWL SCK Low Time 4.5 – 5.5 2.7 – 5.5 1.8 – 5.5 40 80 200 ns tCS CS High Time 4.5 – 5.5 2.7 – 5.5 1.8 – 5.5 50 100 250 ns tCSS CS Setup Time 4.5 – 5.5 2.7 – 5.5 1.8 – 5.5 50 100 250 ns tCSH CS Hold Time 4.5 – 5.5 2.7 – 5.5 1.8 – 5.5 50 100 250 ns tSU Data In Setup Time 4.5 – 5.5 2.7 – 5.5 1.8 – 5.5 12 20 50 ns tH Data In Hold Time 4.5 – 5.5 2.7 – 5.5 1.8 – 5.5 10 20 50 ns tHD Hold Setup Time 4.5 – 5.5 2.7 – 5.5 1.8 – 5.5 25 50 100 ns tCD Hold Hold Time 4.5 – 5.5 2.7 – 5.5 1.8 – 5.5 25 50 100 ns tV Output Valid 4.5 – 5.5 2.7 – 5.5 1.8 – 5.5 0 0 0 tHO Output Hold Time 4.5 – 5.5 2.7 – 5.5 1.8 – 5.5 0 0 0 tLZ Hold to Output Low Z 4.5 – 5.5 2.7 – 5.5 1.8 – 5.5 0 0 0 4 40 80 200 ns ns 100 200 300 ns AT25HP256/512 1113L–SEEPR–3/06 AT25HP256/512 Table 4. AC Characteristics (Continued) Applicable over recommended operating range from TA = –40°C to +85°C, VCC = As Specified, CL = 1 TTL Gate and 30 pF (unless otherwise noted) Symbol Parameter Voltage tHZ Hold to Output High Z tDIS tWC Note: Max Units 4.5 – 5.5 2.7 – 5.5 1.8 – 5.5 100 200 300 ns Output Disable Time 4.5 – 5.5 2.7 – 5.5 1.8 – 5.5 100 100 250 ns Write Cycle Time 4.5 – 5.5 2.7 – 5.5 1.8 – 5.5 10 10 10 ms 4.5 – 5.5 2.7 – 5.5 1.8 – 5.5 1. This parameter is characterized and is not 100% tested. Endurance(1) 5.0V, 25°C, Page Mode Min 100K Write Cycles 5 1113L–SEEPR–3/06 Serial Interface Description MASTER: The device that generates the serial clock. SLAVE: Because the serial clock pin (SCK) is always an input, the AT25HP256/512 always operates as a slave. TRANSMITTER/RECEIVER: The AT25HP256/512 has separate pins designated for data transmission (SO) and reception (SI). MSB: The Most Significant Bit (MSB) is the first bit transmitted and received. SERIAL OP-CODE: After the device is selected with CS going low, the first byte will be received. This byte contains the op-code that defines the operations to be performed. INVALID OP-CODE: If an invalid op-code is received, no data will be shifted into the AT25HP256/512, and the serial output pin (SO) will remain in a high impedance state until the falling edge of CS is detected again. This will reinitialize the serial communication. CHIP SELECT: The AT25HP256/512 is selected when the CS pin is low. When the device is not selected, data will not be accepted via the SI pin, and the SO will remain in a high impedance state. HOLD: The HOLD pin is used in conjunction with the CS pin to select the AT25HP256/512. When the device is selected and a serial sequence is underway, HOLD can be used to pause the serial communication with the master device without resetting the serial sequence. To pause, the HOLD pin must be brought low while the SCK pin is low. To resume serial communication, the HOLD pin is brought high while the SCK pin is low (SCK may still toggle during HOLD). Inputs to the SI pin will be ignored while the SO pin is in the high impedance state. WRITE PROTECT: The write protect pin (WP) will allow normal read/write operations when held high. When the WP pin is brought low and WPEN bit is “1”, all write operations to the status register are inhibited. WP going low while CS is still low will interrupt a write to the status register. If the internal write cycle has already been initiated, WP going low will have no effect on any write operation to the status register. The WP pin function is blocked when the WPEN bit in the status register is “0”. This will allow the user to install the AT25HP256/512 in a system with the WP pin tied to ground and still be able to write to the status register. All WP pin functions are enabled when the WPEN bit is set to “1”. 6 AT25HP256/512 1113L–SEEPR–3/06 AT25HP256/512 SPI Serial Interface Figure 2. Functional Description AT25HP256/512 7 1113L–SEEPR–3/06 The AT25HP256/512 is designed to interface directly with the synchronous serial peripheral interface (SPI) of the 6800 type series of microcontrollers. The AT25HP256/512 utilizes an 8-bit instruction register. The list of instructions and their operation codes are contained in Table 5. All instructions, addresses, and data are transferred with the MSB first and start with a high-to-low CS transition. Table 5. Instruction Set for the AT25HP256/512 Instruction Name Instruction Format Operation WREN 0000 X110 Set Write Enable Latch WRDI 0000 X100 Reset Write Enable Latch RDSR 0000 X101 Read Status Register WRSR 0000 X001 Write Status Register READ 0000 X011 Read Data from Memory Array WRITE 0000 X010 Write Data to Memory Array WRITE ENABLE (WREN): The device will power up in the write disable state when VCC is applied. All programming instructions must therefore be preceded by a Write Enable instruction. WRITE DISABLE (WRDI): To protect the device against inadvertent writes, the Write Disable instruction disables all programming modes. The WRDI instruction is independent of the status of the WP pin. READ STATUS REGISTER (RDSR): The Read Status Register instruction provides access to the status register. The Ready/Busy and Write Enable status of the device can be determined by the RDSR instruction. Similarly, the block write protection bits indicate the extent of protection employed. These bits are set by using the WRSR instruction. Table 6. Status Register Format 8 Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 Bit 0 WPEN X X X BP1 BP0 WEN RDY AT25HP256/512 1113L–SEEPR–3/06 AT25HP256/512 Table 7. Read Status Register Bit Definition Bit Definition Bit 0 (RDY) Bit 0 = “0” (RDY) indicates the device is ready. Bit 0 = “1” indicates the write cycle is in progress. Bit 1 (WEN) Bit 1= “0” indicates the device is not write-enabled. Bit 1 = “1” indicates the device is write-enabled. Bit 2 (BP0) See Table 8. Bit 3 (BP1) See Table 8. Bits 4-6 are “0”s when device is not in an internal write cycle. Bit 7 (WPEN) See Table 9. Bits 0-7 are “1”s during an internal write cycle. WRITE STATUS REGISTER (WRSR): The WRSR instruction allows the user to select one of four levels of protection. The AT25HP256/512 is divided into four array segments. Top quarter (1/4), top half (1/2), or all of the memory segments can be protected. Any of the data within any selected segment will therefore be READ only. The block write protection levels and corresponding status register control bits are shown in Table 8. The three bits, BP0, BP1, and WPEN are nonvolatile cells that have the same properties and functions as the regular memory cells (e.g., WREN, tWC, RDSR). Table 8. Block Write Protect Bits Status Register Bits Level Array Addresses Protected BP1 BP0 AT25HP256/512 0 0 0 None 1(1/4) 0 1 6000 - 7FFF/C000 - FFFF 2(1/2) 1 0 4000 - 7FFF/8000 - FFFF 3(All) 1 1 0000 - 7FFF/0000 - FFFF The WRSR instruction also allows the user to enable or disable the write protect (WP) pin through the use of the write protect enable (WPEN) bit. Hardware write protection is enabled when the WP pin is low and the WPEN bit is “1”. Hardware write protection is disabled when either the WP pin is high or the WPEN bit is “0.” When the device is hardware write protected, writes to the status register, including the block protect bits and the WPEN bit, and the block-protected sections in the memory array are disabled. Writes are only allowed to sections of the memory which are not block-protected. NOTE: When the WPEN bit is hardware write protected, it cannot be changed back to “0” as long as the WP pin is held low. Table 9. WPEN Operation WPEN WP WEN ProtectedBlocks UnprotectedBlocks Status Register 0 X 0 Protected Protected Protected 0 X 1 Protected Writable Writable 1 Low 0 Protected Protected Protected 9 1113L–SEEPR–3/06 Table 9. WPEN Operation (Continued) WPEN WP WEN ProtectedBlocks UnprotectedBlocks Status Register 1 Low 1 Protected Writable Protected X High 0 Protected Protected Protected X High 1 Protected Writable Writable READ SEQUENCE (READ): Reading the AT25HP256/512 via the SO pin requires the following sequence. After the CS line is pulled low to select a device, the read op-code is transmitted via the SI line followed by the byte address to be read (see Table 10). Upon completion, any data on the SI line will be ignored. The data (D7–D0) at the specified address is then shifted out onto the SO line. If only one byte is to be read, the CS line should be driven high after the data comes out. The read sequence can be continued since the byte address is automatically incremented and data will continue to be shifted out. When the highest address is reached, the address counter will roll over to the lowest address allowing the entire memory to be read in one continuous read cycle. WRITE SEQUENCE (WRITE): In order to program the AT25HP256/512, two separate instructions must be executed. First, the device must be write enabled via the WREN instruction. Then a Write instruction may be executed. Also, the address of the memory location(s) to be programmed must be outside the protected address field location selected by the block write protection level. During an internal write cycle, all commands will be ignored except the RDSR instruction. A Write instruction requires the following sequence. After the CS line is pulled low to select the device, the Write op-code is transmitted via the SI line followed by the byte address and the data (D7–D0) to be programmed (see Table 10). Programming will start after the CS pin is brought high. The Low-to-High transition of the CS pin must occur during the SCK low time immediately after clocking in the D0 (LSB) data bit. The Ready/Busy status of the device can be determined by initiating a Read Status Register (RDSR) instruction. If Bit 0 = “1”, the write cycle is still in progress. If Bit 0 = “0”, the write cycle has ended. Only the RDSR instruction is enabled during the write programming cycle. The AT25HP256/512 is capable of a 128-byte page write operation. After each byte of data is received, the seven low-order address bits are internally incremented by one; the high-order bits of the address will remain constant. If more than 128 bytes of data are transmitted, the address counter will roll over and the previously written data will be overwritten. The AT25HP256/512 is automatically returned to the write disable state at the completion of a write cycle. NOTE: If the device is not write enabled (WREN), the device will ignore the Write instruction and will return to the standby state, when CS is brought high. A new CS falling edge is required to reinitiate the serial communication. Table 10. Address Key Address AT25HP256/512 AN A14 – A0 / A15 – A0 Don’t Care Bits A15 / none NOTE: 128-byte Page Write operation only. Content of the page in the array will not be guaranteed if less than 128 bytes of data is received (byte write is not supported). 10 AT25HP256/512 1113L–SEEPR–3/06 AT25HP256/512 Timing Diagrams (for SPI Mode 0 (0,0)) Figure 3. Synchronous Data Timing tCS VIH CS VIL tCSS tCSH VIH SKC VIL tSU SI tWL tWH tH VIH VALID IN VIL tV VOH tDIS HI - Z HI - Z SO tHO VOL Figure 4. WREN Timing CS SCK SI SO Figure 5. WRDI Timing CS SCK SI SO WRDI OP-CODE HI-Z 11 1113L–SEEPR–3/06 Figure 6. RDSR Timing CS 0 1 2 3 4 5 6 7 8 9 10 7 6 5 11 12 13 14 15 2 1 0 SCK SI SO INSTRUCTION HIGH IMPEDANCE DATA OUT 4 3 MSB Figure 7. WRSR Timing Figure 8. READ Timing 12 AT25HP256/512 1113L–SEEPR–3/06 AT25HP256/512 Figure 9. WRITE Timing (AT25HP256) CS 0 1 2 3 4 5 6 7 8 9 10 11 20 21 22 23 24 25 26 27 28 29 30 31 SCK 1ST BYTE DATA IN BYTE ADDRESS 15 14 13 INSTRUCTION SI ... 3 2 1 0 7 6 5 4 3 2 1 0 HIGH IMPEDANCE SO Figure 10. PAGE WRITE Timing (AT25HP512) CS 0 1 2 3 4 5 6 7 8 9 10 11 20 21 22 23 24 25 26 1043 1044 1045 1046 1047 SCK BYTE ADDRESS 1st BYTE DATA IN 15 14 13 12 INSTRUCTION SI 3 2 1 0 7 6 5 128th BYTE DATA IN 4 3 2 1 0 HIGH IMPEDANCE SO Figure 11. HOLD Timing CS tCD tCD SCK tHD tHD HOLD tHZ SO tLZ 13 1113L–SEEPR–3/06 AT25HP256 Ordering Information(1) Ordering Code (2) AT25HP256-10PU-2.7 AT25HP256-10PU-1.8(2) AT25HP256W-10SU-2.7(2) AT25HP256W-10SU-1.8(2) AT25HP256C1-10CU-2.7(2) AT25HP256C1-10CU-1.8(2) AT25HP256Y4-10YU-1.8(2) AT25HP256-W2.7-11(3) AT25HP256-W1.8-11(3) Notes: Package Operation Range 8P3 8P3 8S2 8S2 8CN1 8CN1 8Y4 Lead-free/Halogen-free/ Industrial Temperature (–40°C to 85°C) Die Sale Die Sale Industrial Temperature (–40°C to 85°C) 1. This device is not recommended for new design. Please refer to AT25256A datasheet. For 2.7 devices used in 4.5V to 5.5V range, please refer to performance values in the AC and DC characteristics table. 2. “U” designates Green Package & RoHS compliant. 3. Available in waffle pack and wafer form; order as SL719 for wafer form. Bumped die available upon request. Please contact Serial EEPROM marketing. Package Type 8CN1 8-lead, 0.300” Wide, Leadless Array Package (LAP) 8P3 8-lead, 0.300" Wide, Plastic Dual In-line Package (PDIP) 8S2 8-lead, 0.200" Wide, Plastic Small Outline Package (EIAJ) 8Y4 8-lead, 6.00 mm x 4.90 mm Body, Dual Footprint, Non-leaded, Small Array Package (SAP) Options –2.7 Low Voltage (2.7V to 5.5V) –1.8 Low Voltage (1.8V to 5.5V) 14 AT25HP256/512 1113L–SEEPR–3/06 AT25HP256/512 AT25HP512 Ordering Information(1) Ordering Code Package Operation Range AT25HP512C1-10CI-2.7 AT25HP512-10PI-2.7 AT25HP512W2-10SI-2.7 8CN1 8P3 16S2 Industrial Temperature (–40°C to 85°C) AT25HP512C1-10CI-1.8 AT25HP512-10PI-1.8 AT25HP512W2-10SI-1.8 8CN1 8P3 16S2 Industrial Temperature (–40°C to 85°C) AT25HP512C1-10CU-2.7(2) AT25HP512C1-10CU-1.8(2) AT25HP512-10PU-2.7(2) AT25HP512-10PU-1.8(2) AT25HP512W2-10SU-2.7(2) AT25HP512W2-10SU-1.8(2) 8CN1 8CN1 8P3 8P3 16S2 16S2 Lead-free/ Halogen-free Industrial Temperature (–40°C to 85°C) Die Sale Die Sale Industrial Temperature (–40°C to 85°C) AT25HP512-W2.7-11(3) AT25HP512-W1.8-11(3) Notes: 1. For 2.7V devices used in the 4.5V to 5.5V range, please refer to performance values in the AC and DC characteristics tables. 2. “U” designates Green Package & RoHS compliant. 3. Available in waffle pack and wafer form; order as SL719 for wafer form. Bumped die available upon request. Contact Serial EEPROM marketing. Package Type 8CN1 8-lead, 0.300" Wide, Leadless Array Package (LAP) 8P3 8-lead, 0.300" Wide, Plastic Dual In-line Package (PDIP) 16S2 16-lead, 0.300" Wide, Plastic Gull Wing Small Outline Package (JEDEC SOIC) Options –2.7 Low Voltage (2.7V to 5.5V) –1.8 Low Voltage (1.8V to 5.5V) 15 1113L–SEEPR–3/06 Packaging Information 8CN1 – LAP Marked Pin1 Indentifier E A A1 D Top View Side View Pin1 Corner L1 0.10 mm TYP 8 1 e 7 COMMON DIMENSIONS (Unit of Measure = mm) 2 3 6 b 5 4 e1 L Bottom View Note: SYMBOL MIN NOM MAX A 0.94 1.04 1.14 A1 0.30 0.34 0.38 b 0.36 0.41 0.46 D 7.90 8.00 8.10 E 4.90 5.00 5.10 e NOTE 1 1.27 BSC e1 0.60 REF L 0.62 .0.67 0.72 1 L1 0.92 0.97 1.02 1 1. Metal Pad Dimensions. 11/13/01 R 16 2325 Orchard Parkway San Jose, CA 95131 TITLE 8CN1, 8-lead (8 x 5 x 1.04 mm Body), Lead Pitch 1.27 mm, Leadless Array Package (LAP) DRAWING NO. 8CN1 REV. A AT25HP256/512 1113L–SEEPR–3/06 AT25HP256/512 8P3 – PDIP E 1 E1 N Top View c eA End View COMMON DIMENSIONS (Unit of Measure = inches) D e D1 A2 A SYMBOL A b2 b3 b 4 PLCS Side View L NOM MAX NOTE – – 0.210 2 A2 0.115 0.130 0.195 b 0.014 0.018 0.022 5 b2 0.045 0.060 0.070 6 b3 0.030 0.039 0.045 6 c 0.008 0.010 0.014 D 0.355 0.365 0.400 3 D1 0.005 – – 3 E 0.300 0.310 0.325 4 E1 0.240 0.250 0.280 3 e 0.100 BSC eA 0.300 BSC L Notes: MIN 0.115 0.130 4 0.150 2 1. This drawing is for general information only; refer to JEDEC Drawing MS-001, Variation BA, for additional information. 2. Dimensions A and L are measured with the package seated in JEDEC seating plane Gauge GS-3. 3. D, D1 and E1 dimensions do not include mold Flash or protrusions. Mold Flash or protrusions shall not exceed 0.010 inch. 4. E and eA measured with the leads constrained to be perpendicular to datum. 5. Pointed or rounded lead tips are preferred to ease insertion. 6. b2 and b3 maximum dimensions do not include Dambar protrusions. Dambar protrusions shall not exceed 0.010 (0.25 mm). 01/09/02 R 2325 Orchard Parkway San Jose, CA 95131 TITLE 8P3, 8-lead, 0.300" Wide Body, Plastic Dual In-line Package (PDIP) DRAWING NO. REV. 8P3 B 17 1113L–SEEPR–3/06 16S2 – JEDEC SOIC C 1 H L E N A1 Top View End View e COMMON DIMENSIONS (Unit of Measure = inches) b A D Side View MIN NOM A 0.0926 – 0.1043 A1 0.0040 – 0.0118 b 0.0130 – 0.0200 C 0.0091 – 0.0125 D 0.3977 – 0.4133 2 E 0.2914 – 0.2992 3 H 0.3940 – 0.4190 L 0.0160 – 0.050 SYMBOL e MAX NOTE 5 4 0.050 BSC Notes: 1. This drawing is for general information only; refer to JEDEC drawing MS-013, Variation AA, for additional information. 2. Dimension D does not include mold Flash, protrusions or gate burrs. Mold Flash, protrusions and gate burrs shall not exceed 3. Dimension E does not include inter-lead Flash or protrusion. Inter-lead Flash and protrusions shall not exceed 0.25 mm 4. 5. The lead width B, as measured 0.36 mm (0.014") or greater above the seating plane, shall not exceed a maximum value of 0.61 mm (0.024") per side. 1/9/02 R 18 2325 Orchard Parkway San Jose, CA 95131 TITLE 16S2, 16-lead, 0.300" Wide Body, Plastic Gull Wing Small Outline Package (SOIC) DRAWING NO. 16S2 REV. A AT25HP256/512 1113L–SEEPR–3/06 AT25HP256/512 8S2 – EIAJ SOIC C 1 E E1 L N Top View ∅ End View e b COMMON DIMENSIONS (Unit of Measure = mm) A SYMBOL A1 D Side View NOM MAX NOTE A 1.70 2.16 A1 0.05 0.25 b 0.35 0.48 5 C 0.15 0.35 5 D 5.13 5.35 E1 5.18 5.40 E 7.70 8.26 L 0.51 0.85 ∅ 0° 8° e Notes: 1. 2. 3. 4. 5. MIN 1.27 BSC 2, 3 4 This drawing is for general information only; refer to EIAJ Drawing EDR-7320 for additional information. Mismatch of the upper and lower dies and resin burrs are not included. It is recommended that upper and lower cavities be equal. If they are different, the larger dimension shall be regarded. Determines the true geometric position. Values b and C apply to pb/Sn solder plated terminal. The standard thickness of the solder layer shall be 0.010 +0.010/−0.005 mm. 10/7/03 R 2325 Orchard Parkway San Jose, CA 95131 TITLE 8S2, 8-lead, 0.209" Body, Plastic Small Outline Package (EIAJ) DRAWING NO. 8S2 REV. C 19 1113L–SEEPR–3/06 8Y4 – SAP PIN 1 INDEX AREA A D1 PIN 1 ID D E1 L A1 E e b e1 A COMMON DIMENSIONS (Unit of Measure = mm) SYMBOL MIN NOM MAX A – – 0.90 A1 0.00 – 0.05 D 5.80 6.00 6.20 E 4.70 4.90 5.10 D1 2.85 3.00 3.15 E1 2.85 3.00 3.15 b 0.35 0.40 0.45 e 1.27 TYP e1 3.81 REF L 0.50 0.60 NOTE 0.70 5/24/04 R 20 1150 E. Cheyenne Mtn. Blvd. Colorado Springs, CO 80906 TITLE 8Y4, 8-lead (6.00 x 4.90 mm Body) SOIC Array Package (SAP) Y4 DRAWING NO. REV. 8Y4 A AT25HP256/512 1113L–SEEPR–3/06 Atmel Corporation 2325 Orchard Parkway San Jose, CA 95131, USA Tel: 1(408) 441-0311 Fax: 1(408) 487-2600 Regional Headquarters Europe Atmel Sarl Route des Arsenaux 41 Case Postale 80 CH-1705 Fribourg Switzerland Tel: (41) 26-426-5555 Fax: (41) 26-426-5500 Asia Room 1219 Chinachem Golden Plaza 77 Mody Road Tsimshatsui East Kowloon Hong Kong Tel: (852) 2721-9778 Fax: (852) 2722-1369 Japan 9F, Tonetsu Shinkawa Bldg. 1-24-8 Shinkawa Chuo-ku, Tokyo 104-0033 Japan Tel: (81) 3-3523-3551 Fax: (81) 3-3523-7581 Atmel Operations Memory 2325 Orchard Parkway San Jose, CA 95131, USA Tel: 1(408) 441-0311 Fax: 1(408) 436-4314 RF/Automotive Theresienstrasse 2 Postfach 3535 74025 Heilbronn, Germany Tel: (49) 71-31-67-0 Fax: (49) 71-31-67-2340 Microcontrollers 2325 Orchard Parkway San Jose, CA 95131, USA Tel: 1(408) 441-0311 Fax: 1(408) 436-4314 La Chantrerie BP 70602 44306 Nantes Cedex 3, France Tel: (33) 2-40-18-18-18 Fax: (33) 2-40-18-19-60 ASIC/ASSP/Smart Cards 1150 East Cheyenne Mtn. Blvd. Colorado Springs, CO 80906, USA Tel: 1(719) 576-3300 Fax: 1(719) 540-1759 Biometrics/Imaging/Hi-Rel MPU/ High Speed Converters/RF Datacom Avenue de Rochepleine BP 123 38521 Saint-Egreve Cedex, France Tel: (33) 4-76-58-30-00 Fax: (33) 4-76-58-34-80 Zone Industrielle 13106 Rousset Cedex, France Tel: (33) 4-42-53-60-00 Fax: (33) 4-42-53-60-01 1150 East Cheyenne Mtn. Blvd. Colorado Springs, CO 80906, USA Tel: 1(719) 576-3300 Fax: 1(719) 540-1759 Scottish Enterprise Technology Park Maxwell Building East Kilbride G75 0QR, Scotland Tel: (44) 1355-803-000 Fax: (44) 1355-242-743 Literature Requests www.atmel.com/literature Disclaimer: The information in this document is provided in connection with Atmel products. No license, express or implied, by estoppel or otherwise, to any intellectual property right is granted by this document or in connection with the sale of Atmel products. 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