RELIABILITY DATA LTC2936 / LTC2937 / LTC2943 / LTC2945 / LTC2955 / LTC2960 11/24/2015 • OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE DFN/QFN SSOP/TSSOP NEWEST DATE CODE 391 1146 77 1136 468 (6) • HIGHLY ACCELERATED STRESS TEST AT +131°C/85%RH PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE DFN/QFN 233 0111 233 (6) • PRESSURE COOKER TEST AT 15 PSIG, +121°C PACKAGE TYPE SAMPLE SIZE DFN/QFN SOIC/SOT/MSOP 9,329 50 9,379 (6) • TEMP CYCLE FROM -65°C to +150°C PACKAGE TYPE SAMPLE SIZE SAMPLE SIZE NEWEST DATE CODE 0649 1118 1124 1118 OLDEST DATE CODE NEWEST DATE CODE OLDEST DATE CODE 351.00 77.00 428.00 K DEVICE HOURS (5) AT +85°C 0748 NEWEST DATE CODE 9,361 0639 49 1118 9,410 (6) • THERMAL SHOCK FROM -65°C to +150°C PACKAGE TYPE 1325 1136 OLDEST DATE CODE DFN/QFN SOIC/SOT/MSOP K DEVICE HOURS (1) AT +125°C 451.20 451.20 K DEVICE HOURS 426.22 1.20 427.42 K DEVICE CYCLES 1124 1118 NEWEST DATE CODE 2,008.10 4.90 2,013.00 K DEVICE CYCLES NUMBER OF (2) FAILURES 0 0 0 NUMBER OF FAILURES 0 0 NUMBER OF FAILURES 0 0 0 NUMBER OF FAILURES 0 0 0 NUMBER OF FAILURES DFN/QFN SOIC/SOT/MSOP 10,260 0639 1211 2,722.50 0 49 1118 1118 4.90 0 10,309 2,727.40 0 (1) Assumes Activation Energy = 0.7 Electron Volts (2) Failure Rate Equivalent to +55°C, 60% Confidence Level = 27.58 FITS (3) Mean Time Between Failures in Years = 4139 (4) Environmental data presented for same Process and Package Technology. Mechanical tests preceeded by J-STD-020 Preconditioning. (5) Assumes 20X Acceleration from 85°C to +130°C Note: 1 FIT = 1 Failure in One Billion Hours. Form: 00-03-6209B. R567 Rev 4