ON Semiconductor TEST PROCEDURE TEST PROCEDURE on NCS2553 VIDEO APPLICATIONS NCS2553 Xavier BIGNALET 27/05/2011 issue 1.0 – Nov 2010 Page 1 of 2 NCS2553 ON Semiconductor TEST PROCEDURE 1. Board Setup: 0.1μF input coupling capacitors 220μF output coupling capacitors 75Ω input matching impedance 75Ω output resistors 2. Power Supply: Plug the GND first. Limit the current to 100mA. Then, plug Vcc at 5V Turn on the supply. 3. Standard definition channel: Apply 1Vpp with 0V offset, 1MHz sinewave on all the input SD INx (pin 1, 2, 3) Measure a sine wave of 1MHz on the output (pin 12, 13, 14) centered around 0V with an amplitude attenuated by a factor of 100/125 meaning an amplitude of 0.8Vpp. Icc should be around 23mA. 4. Bench Setup J8 GND C1 R1 C5 75 220u R2 C6 75 220u R3 C7 75 220u SD OUT1 1Aac 0Adc R5 75 0.1u 1 2 I1 0 I2 1Aac 0Adc 0 U1 C2 R6 75 1 2 3 4 0.1u IN1 OUT1 IN2 OUT2 IN3 OUT3 Vcc GND C9 0 SD OUT2 NCS2553 0.1u C3 8 7 6 5 0 SD OUT3 C8 R7 75 0.1u 10u 2 1 I3 1Aac 0Adc 0 0 Scope J7 Vcc SD OUT1 SD OUT2 SD OUT3 27/05/2011 issue 1.0 – Nov 2010 Page 2 of 2 NCS2553