ON Semiconductor TEST PROCEDURE TEST PROCEDURE on NCS2563 VIDEO APPLICATIONS NCS2563 Xavier BIGNALET 27/05/2011 issue 1.0 – July 2009 Page 1 of 2 NCS2564 ON Semiconductor TEST PROCEDURE 1. Board Setup: 0.1 uF input coupling capacitors 220uF output coupling capacitors 75 ohms input matching impdance 75 output resistors 2. Power Supply: Plug the GND first. Limit the current to 100mA. Then, plug Vcc at 5V Turn on the supply. 3. Standard definition channel: Apply 1Vpp with 0V offset, 1MHz sinewave on all the input HD INx (pin 1, 2, 3) Measure a sine wave of 1MHz on the output (pin 12, 13, 14) centered around 0V with an amplitude an amplitude of 2.6Vpp at the output of the device. Icc should be around 23mA. 4. Bench Setup J8 GND C1 R1 C5 75 220u R2 C6 HD OUT1 1Aac 0Adc R5 75 0.1u 1 2 I1 0 I2 1Aac 0Adc 0 U1 C2 R6 75 1 2 3 4 0.1u IN1 OUT1 IN2 OUT2 IN3 OUT3 Vcc GND C9 0 8 7 6 5 75 220u R3 C7 75 220u NCS2563 0.1u C3 HD OUT2 0 HD OUT3 C8 1Aac 0Adc R7 75 0.1u 10u 2 1 I3 0 0 Scope J7 Vcc HD OUT1 HD OUT2 HD OUT3 27/05/2011 issue 1.0 – July 2009 Page 2 of 2 NCS2564