RLAT 200K Report_RH1814MW_Fab Lot WF001929.pdf

RLAT Report
10-326 100808 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Radiation Lot Acceptance Testing (RLAT) of the RH1814MW Quad Op Amp
for Linear Technology
Customer: Linear Technology (PO 56741L)
RAD Job Number: 10-326
Part Type Tested: Linear Technology RH1814MW Quad Op Amp
Commercial Part Number: RH1814MW
Traceability Information: Fab Lot# WF001929, Wafer 6, Assembly Lot# 558858.1. Information obtained from
Linear Technology PO#56741L. Date code marking on the package is 1004A, see Appendix A for a photograph
of the device and part markings.
Quantity of Units: 12 units total, 10 units for biased irradiation and 2 control units. Serial numbers 1245 to
1251, 1261 to 1263 were biased during irradiation. Serial numbers 1264 and 1265 were used as controls. See
Appendix B for the radiation bias connection table.
Pre-Irradiation Burn-In: Burn-In performed by Linear Technology prior to receipt by RAD.
TID Dose Rate and Test Increments: 50-300rad(Si)/s with readings at pre-irradiation, 10, 20, 30, 40, 50, 60,
70, 75, 100, and 200krad(Si).
TID Overtest and Post-Irradiation Anneal: No overtest or anneal.
TID Test Standard: MIL-STD-883G, Method 1019.7, Condition A
TID Electrical Test Conditions: Pre-irradiation, and within one hour following each radiation exposure.
Test Programs: RH1814W.SRC
Test Hardware: LTS2020 Tester, 2101 Family Board, 0600 Fixture, and RH1814W BGSS-080826 DUT Board.
Facility and Radiation Source: Radiation Assured Devices Longmire Laboratories, Colorado Springs, CO using
the JLSA 81-24 high dose rate Co60 source. Dosimetry performed by CaF2 TLDs traceable to NIST. RAD’s
dosimetry has been audited by DSCC and RAD has been awarded Laboratory Suitability for MIL-STD-750 TM
1019.5.
Irradiation and Test Temperature: Ambient room temperature for irradiation and test controlled to 24°C±6°C
per MIL-STD-883.
RLAT Result: PASSED. The units showed no significant degradation with
total dose. All parameters remained within their datasheet specifications to
the maximum dose level tested of 200krad(Si)
An ISO 9001:2008 and DSCC Certified Company
1
RLAT Report
10-326 100808 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
1.0. Overview and Background
It is well known that total dose ionizing radiation can cause parametric degradation and ultimately
functional failure in electronic devices. The damage occurs via electron-hole pair production, transport
and trapping in the dielectric and interface regions. In discrete devices the bulk of the damage is
frequently manifested as a reduction in the gain and/or breakdown voltage of the device. The damage
will usually anneal with time following the end of the radiation exposure. Due to this annealing, and to
ensure a worst-case test condition MIL-STD-883 TM1019.7 calls out a dose rate of 50 to 300rad(Si)/s as
Condition A and further specifies that the time from the end of an incremental radiation exposure and
electrical testing shall be 1-hour or less and the total time from the end of one incremental irradiation to
the beginning of the next incremental radiation step should be 2-hours or less. The work described in
this report was performed to meet MIL-STD-883 TM1019.7 Condition A.
2.0. Radiation Test Apparatus
The total ionizing dose testing described in this final report was performed using the facilities at
Radiation Assured Devices’ Longmire Laboratories in Colorado Springs, CO. The high dose rate total
ionizing dose (TID) source is a JLSA 84-21 irradiator modified to provide a panoramic exposure. The
Co-60 rods are held in the base of the irradiator heavily shielded by lead, during the radiation exposures
the rod is raised by an electronic timer/controller and the exposure is performed in air. The dose rate for
this irradiator in this configuration ranges from <1rad(Si)/s to a maximum of approximately
120rad(Si)/s, determined by the distance from the source. For high-dose rate experiments the bias
boards are placed in a radial fashion equidistant from the raised Co-60 rods with the distance adjusted to
provide the required dose rate. The irradiator calibration is maintained by Radiation Assured Devices
Longmire Laboratories using thermoluminescent dosimeters (TLDs)) traceable to the National Institute
of Standards and Technology (NIST). Figure 2.1 shows a photograph of the JLSA 81-24 Co-60
irradiator at RAD’s Longmire Laboratory facility.
RAD is currently certified by the Defense Supply Center Columbus (DSCC) for Laboratory Suitability
under MIL STD 750. Additional details regarding Radiation Assured Devices dosimetry for TM1019
Condition A testing are available in RAD’s report to DSCC entitled: “Dose Rate Mapping of the J.L.
Shepherd and Associates Model 81 Irradiator Installed by Radiation Assured Devices”
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RLAT Report
10-326 100808 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Figure 2.1. Radiation Assured Devices’ high dose rate Co-60 irradiator. The dose rate is obtained by
positioning the device-under-test at a fixed distance from the gamma cell. The dose rate for this
irradiator varies from approximately 120rad(Si)/s close to the rods down to 1rad(Si)/s at a distance of
approximately 2-feet.
An ISO 9001:2008 and DSCC Certified Company
3
RLAT Report
10-326 100808 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
3.0. Radiation Test Conditions
The RH1814MW Quad Op Amp described in this final report were irradiated using a split 5V supply
that is biased, which has been shown to be the worst-case bias condition for these units. See the TID
Bias Table in Appendix B for the full bias circuits. In our opinion, this bias circuit satisfies the
requirements of MIL-STD-883G TM1019.7 Section 3.9.3 Bias and Loading Conditions which states
“The bias applied to the test devices shall be selected to produce the greatest radiation induced damage
or the worst-case damage for the intended application, if known. While maximum voltage is often worst
case some bipolar linear device parameters (e.g. input bias current or maximum output load current)
exhibit more degradation with 0 V bias.” Note that the determination of pass / fail for this lot is based
on the response of the biased units only.
The devices were irradiated to a maximum total ionizing dose level of 200krad(Si) with incremental
readings at 10, 20, 30, 40, 50, 60, 70, 75 and 100krad(Si). Electrical testing occurred within one hour
following the end of each irradiation segment. For intermediate irradiations, the parts were tested and
returned to total dose exposure within two hours from the end of the previous radiation increment.
The TID bias board was positioned in the Co-60 cell to provide the required minimum of 50rad(Si)/s
and was located inside a lead-aluminum enclosure. The lead-aluminum enclosure is required under
MIL-STD-883G TM1019.7 Section 3.4 that reads as follows: “Lead/Aluminum (Pb/Al) container. Test
specimens shall be enclosed in a Pb/Al container to minimize dose enhancement effects caused by lowenergy, scattered radiation. A minimum of 1.5 mm Pb, surrounding an inner shield of at least 0.7 mm
Al, is required. This Pb/Al container produces an approximate charged particle equilibrium for Si and
for TLDs such as CaF2. The radiation field intensity shall be measured inside the Pb/Al container (1)
initially, (2) when the source is changed, or (3) when the orientation or configuration of the source,
container, or test-fixture is changed. This measurement shall be performed by placing a dosimeter (e.g.,
a TLD) in the device-irradiation container at the approximate test-device position. If it can be
demonstrated that low energy scattered radiation is small enough that it will not cause dosimetry errors
due to dose enhancement, the Pb/Al container may be omitted”.
The final dose rate within the high dose rate lead-aluminum enclosure was determined based on TLD
dosimetry measurements (see previous section). The final dose rate for this work was 50.5rad(Si)/s with
a precision of ±5%.
An ISO 9001:2008 and DSCC Certified Company
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RLAT Report
10-326 100808 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
4.0. Tested Parameters
During the radiation lot acceptance testing the following pre- and post-irradiation electrical parameters
were measured:
1. Positive Supply Current
2. Negative Supply Current
3. Input Offset Voltage (Op Amp 1-4)
4. Input Offset Current (Op Amp 1-4)
5. + Input Bias Current (Op Amp 1-4)
6. - Input Bias Current (Op Amp 1-4)
7. CMRR (Op Amp 1-4)
8. PSRR (Op Amp 1-4)
9. Large Signal Voltage Gain RL=500 (Op Amp 1-4)
10. Large Signal Voltage Gain RL=100 (Op Amp 1-4)
11. Channel Separation (Op Amp 1-4, all permutations)
12. Output Voltage Swing High RL=500 (Op Amp 1-4)
13. Output Voltage Swing High RL=100 (Op Amp 1-4)
14. Output Voltage Swing Low RL=500 (Op Amp 1-4)
15. Output Voltage Swing Low RL=100 (Op Amp 1-4)
16. Maximum Output Source Current (Op Amp 1-4)
17. Maximum Output Sink Current (Op Amp 1-4)
18. Positive Short-Circuit Current (Op Amp 1-4)
19. Negative Short-Circuit Current (Op Amp 1-4)
The parametric data was obtained as read and record and all the raw data plus an attributes summary are
contained in a separate Excel file. The attributes data contains the average, standard deviation and the
average with the KTL values applied. The KTL value used in this work is 2.065 per MIL-HDBK-814
using one sided tolerance limits of 90/90 and a 10-piece sample size. The 90/90 KTL values were
selected to match the statistical levels specified in the MIL-PRF-38535 sampling plan for the
qualification of a radiation hardness assured (RHA) component. Note that the following criteria must be
met for a device to pass the RLAT: following the radiation exposure each of the 10 pieces irradiated
under electrical bias shall pass the specification value. If any of the 10 pieces irradiated under electrical
bias exceed the datasheet specifications, then the lot could be logged as a failure.
An ISO 9001:2008 and DSCC Certified Company
5
RLAT Report
10-326 100808 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
5.0. Total Ionizing Dose Test Results
Based on this criterion the RH1814MW QUAD OP AMP (from the lot date code identified on the first
page of this test report) PASSED the RLAT to the maximum tested dose level of 200krad(Si) with all
parameters remaining within their datasheet specifications. The data shown in this report uses much
finer dose increments at the low dose levels to better understand the low total dose performance. In
previous tests (with larger dose increments) we have observed degradation of selected VOS, CMRR and
PSRR parameters with the units improving with total dose, passing at the 100krad(Si) and 200krad(Si)
dose levels. It appears that using relatively large dose increments can cause a low total dose “failure”
possible due to a slightly different radiation response of matching of OpAmp input transistors. The
LT1814 datasheet p.12 "Circuit Operation" discussion describes complementary NPN and PNP emitter
followers buffering input transistors. Uneven gamma-induced degradation of the various input
transistors could produce large voltage offsets, possibly recovering after significant charge saturation in
the oxides. Figures 5.1 through 5.152 show plots of all the measured parameters versus total ionizing
dose while Tables 5.1 – 5.152 show the corresponding raw data for each of these parameters.
In the data plots the solid diamonds are the average of the measured data points for the sample irradiated
under electrical bias while the shaded diamonds are the average of the measured data points for the units
irradiated with all pins tied to ground. The black lines (solid or dashed) are the average of the data
points after application of the KTL statistics on the sample irradiated in the biased condition while the
shaded lines (solid or dashed) are the average of the data points after application of the KTL statistics on
the sample irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
The control units, as expected, show no significant changes to any of the parameters. Therefore we can
conclude that the electrical testing remained in control throughout the duration of the tests and the
observed degradation was due to the radiation exposure.
An ISO 9001:2008 and DSCC Certified Company
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RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
Specification MAX
1.50E-02
Positive Supply Current @+/-5V (A)
1.45E-02
1.40E-02
1.35E-02
1.30E-02
1.25E-02
1.20E-02
1.15E-02
1.10E-02
1.05E-02
1.00E-02
0
50
100
150
Total Dose (krad(Si))
Figure 5.1. Plot of Positive Supply Current @+/-5V (A) versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
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200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.1. Raw data for Positive Supply Current @+/-5V (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Supply Current @+/-5V (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MAX
Status
0
1.21E-02
1.19E-02
1.21E-02
1.18E-02
1.21E-02
1.23E-02
1.18E-02
1.20E-02
1.18E-02
1.22E-02
1.20E-02
1.22E-02
10
1.20E-02
1.18E-02
1.19E-02
1.17E-02
1.19E-02
1.22E-02
1.16E-02
1.17E-02
1.16E-02
1.20E-02
1.19E-02
1.20E-02
20
1.19E-02
1.17E-02
1.18E-02
1.15E-02
1.18E-02
1.21E-02
1.15E-02
1.17E-02
1.15E-02
1.19E-02
1.18E-02
1.20E-02
30
1.18E-02
1.16E-02
1.18E-02
1.15E-02
1.18E-02
1.20E-02
1.15E-02
1.16E-02
1.15E-02
1.18E-02
1.19E-02
1.20E-02
40
1.18E-02
1.16E-02
1.17E-02
1.14E-02
1.17E-02
1.19E-02
1.14E-02
1.16E-02
1.14E-02
1.17E-02
1.19E-02
1.21E-02
50
1.17E-02
1.15E-02
1.17E-02
1.13E-02
1.16E-02
1.19E-02
1.13E-02
1.15E-02
1.13E-02
1.17E-02
1.19E-02
1.21E-02
60
1.16E-02
1.14E-02
1.16E-02
1.11E-02
1.16E-02
1.18E-02
1.12E-02
1.14E-02
1.13E-02
1.16E-02
1.19E-02
1.21E-02
70
1.16E-02
1.13E-02
1.15E-02
1.10E-02
1.15E-02
1.17E-02
1.12E-02
1.14E-02
1.12E-02
1.15E-02
1.19E-02
1.21E-02
75
1.16E-02
1.13E-02
1.15E-02
1.10E-02
1.15E-02
1.17E-02
1.12E-02
1.13E-02
1.12E-02
1.15E-02
1.19E-02
1.21E-02
100
1.14E-02
1.11E-02
1.13E-02
1.07E-02
1.13E-02
1.15E-02
1.10E-02
1.12E-02
1.10E-02
1.13E-02
1.19E-02
1.21E-02
200
1.04E-02
1.01E-02
1.03E-02
9.54E-03
1.03E-02
1.04E-02
9.98E-03
1.02E-02
1.00E-02
1.02E-02
1.19E-02
1.21E-02
1.20E-02
1.81E-04
1.24E-02
1.16E-02
1.44E-02
PASS
1.18E-02
1.91E-04
1.22E-02
1.14E-02
1.44E-02
PASS
1.17E-02
1.94E-04
1.21E-02
1.13E-02
1.44E-02
PASS
1.17E-02
1.90E-04
1.21E-02
1.13E-02
1.44E-02
PASS
1.16E-02
1.93E-04
1.20E-02
1.12E-02
1.44E-02
PASS
1.15E-02
1.97E-04
1.19E-02
1.11E-02
1.44E-02
PASS
1.15E-02
2.06E-04
1.19E-02
1.10E-02
1.44E-02
PASS
1.14E-02
2.09E-04
1.18E-02
1.10E-02
1.44E-02
PASS
1.14E-02
2.13E-04
1.18E-02
1.09E-02
1.44E-02
PASS
1.12E-02
2.38E-04
1.17E-02
1.07E-02
1.44E-02
PASS
1.01E-02
2.59E-04
1.07E-02
9.61E-03
1.44E-02
PASS
An ISO 9001:2008 and DSCC Certified Company
8
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
-1.00E-02
Negative Supply Current @+/-5V (A)
-1.05E-02
-1.10E-02
-1.15E-02
-1.20E-02
-1.25E-02
-1.30E-02
-1.35E-02
-1.40E-02
-1.45E-02
-1.50E-02
0
50
100
150
Total Dose (krad(Si))
Figure 5.2. Plot of Negative Supply Current @+/-5V (A) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias and the black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
9
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.2. Raw data for Negative Supply Current @+/-5V (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Supply Current @+/-5V (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
-1.21E-02
-1.19E-02
-1.21E-02
-1.19E-02
-1.21E-02
-1.24E-02
-1.18E-02
-1.21E-02
-1.18E-02
-1.22E-02
-1.20E-02
-1.22E-02
10
-1.20E-02
-1.18E-02
-1.20E-02
-1.17E-02
-1.19E-02
-1.22E-02
-1.16E-02
-1.18E-02
-1.16E-02
-1.20E-02
-1.19E-02
-1.21E-02
20
-1.19E-02
-1.17E-02
-1.19E-02
-1.16E-02
-1.19E-02
-1.21E-02
-1.15E-02
-1.17E-02
-1.16E-02
-1.19E-02
-1.19E-02
-1.21E-02
30
-1.19E-02
-1.16E-02
-1.18E-02
-1.15E-02
-1.18E-02
-1.21E-02
-1.15E-02
-1.17E-02
-1.15E-02
-1.18E-02
-1.19E-02
-1.21E-02
40
-1.18E-02
-1.16E-02
-1.18E-02
-1.14E-02
-1.17E-02
-1.20E-02
-1.14E-02
-1.16E-02
-1.14E-02
-1.18E-02
-1.19E-02
-1.21E-02
50
-1.17E-02
-1.15E-02
-1.17E-02
-1.13E-02
-1.17E-02
-1.19E-02
-1.14E-02
-1.15E-02
-1.14E-02
-1.17E-02
-1.19E-02
-1.21E-02
60
-1.17E-02
-1.14E-02
-1.16E-02
-1.12E-02
-1.16E-02
-1.18E-02
-1.13E-02
-1.15E-02
-1.13E-02
-1.16E-02
-1.19E-02
-1.21E-02
70
-1.16E-02
-1.14E-02
-1.16E-02
-1.11E-02
-1.15E-02
-1.18E-02
-1.12E-02
-1.14E-02
-1.12E-02
-1.16E-02
-1.19E-02
-1.21E-02
75
-1.16E-02
-1.13E-02
-1.16E-02
-1.10E-02
-1.15E-02
-1.17E-02
-1.12E-02
-1.14E-02
-1.13E-02
-1.16E-02
-1.19E-02
-1.21E-02
100
-1.14E-02
-1.12E-02
-1.14E-02
-1.07E-02
-1.13E-02
-1.15E-02
-1.10E-02
-1.12E-02
-1.10E-02
-1.13E-02
-1.19E-02
-1.21E-02
200
-1.04E-02
-1.02E-02
-1.04E-02
-9.59E-03
-1.03E-02
-1.05E-02
-1.00E-02
-1.02E-02
-1.00E-02
-1.03E-02
-1.19E-02
-1.21E-02
-1.20E-02
1.83E-04
-1.17E-02
-1.24E-02
-1.44E-02
PASS
-1.19E-02
1.92E-04
-1.15E-02
-1.23E-02
-1.44E-02
PASS
-1.18E-02
1.92E-04
-1.14E-02
-1.22E-02
-1.44E-02
PASS
-1.17E-02
1.90E-04
-1.13E-02
-1.21E-02
-1.44E-02
PASS
-1.17E-02
1.96E-04
-1.13E-02
-1.21E-02
-1.44E-02
PASS
-1.16E-02
2.01E-04
-1.12E-02
-1.20E-02
-1.44E-02
PASS
-1.15E-02
2.09E-04
-1.11E-02
-1.19E-02
-1.44E-02
PASS
-1.14E-02
2.10E-04
-1.10E-02
-1.19E-02
-1.44E-02
PASS
-1.14E-02
2.14E-04
-1.10E-02
-1.19E-02
-1.44E-02
PASS
-1.12E-02
2.36E-04
-1.07E-02
-1.17E-02
-1.44E-02
PASS
-1.02E-02
2.56E-04
-9.65E-03
-1.07E-02
-1.44E-02
PASS
An ISO 9001:2008 and DSCC Certified Company
10
RLAT Report
10-326 100808 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
5.00E-03
Input Offset Voltage @+/-5V #1 (V)
4.00E-03
3.00E-03
2.00E-03
1.00E-03
0.00E+00
-1.00E-03
-2.00E-03
-3.00E-03
-4.00E-03
-5.00E-03
0
50
100
150
Total Dose (krad(Si))
Figure 5.3. Plot of Input Offset Voltage @+/-5V #1 (V) versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
11
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.3. Raw data for Input Offset Voltage @+/-5V #1 (V) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage @+/-5V #1 (V)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
-9.80E-05
-1.40E-05
-3.90E-05
-8.52E-04
-1.31E-04
-6.33E-04
-2.91E-04
-2.49E-04
-3.04E-04
-1.26E-04
-3.50E-04
-4.23E-04
10
-1.68E-04
-6.60E-05
-1.09E-04
-9.12E-04
-2.01E-04
-6.83E-04
-3.60E-04
-3.32E-04
-3.86E-04
-2.02E-04
-3.53E-04
-4.25E-04
20
-2.41E-04
-1.40E-04
-1.77E-04
-1.04E-03
-2.56E-04
-7.61E-04
-4.30E-04
-4.10E-04
-4.60E-04
-2.76E-04
-3.55E-04
-4.24E-04
30
-2.84E-04
-1.85E-04
-2.48E-04
-1.13E-03
-3.18E-04
-8.09E-04
-4.88E-04
-4.68E-04
-5.25E-04
-3.30E-04
-3.55E-04
-4.26E-04
40
-3.43E-04
-2.34E-04
-3.00E-04
-1.25E-03
-3.63E-04
-8.62E-04
-5.21E-04
-5.30E-04
-5.82E-04
-3.63E-04
-3.55E-04
-4.25E-04
50
-3.87E-04
-2.70E-04
-3.54E-04
-1.36E-03
-4.13E-04
-8.93E-04
-5.55E-04
-5.67E-04
-6.13E-04
-3.80E-04
-3.55E-04
-4.28E-04
60
-4.23E-04
-2.94E-04
-3.95E-04
-1.48E-03
-4.50E-04
-9.18E-04
-5.93E-04
-6.18E-04
-6.53E-04
-4.13E-04
-3.55E-04
-4.27E-04
70
-4.60E-04
-3.07E-04
-4.40E-04
-1.57E-03
-4.99E-04
-9.37E-04
-6.08E-04
-6.36E-04
-6.77E-04
-4.22E-04
-3.55E-04
-4.27E-04
75
-4.48E-04
-2.90E-04
-4.32E-04
-1.58E-03
-4.87E-04
-9.05E-04
-6.02E-04
-6.27E-04
-6.75E-04
-4.02E-04
-3.56E-04
-4.25E-04
100
-5.72E-04
-4.04E-04
-5.58E-04
-1.86E-03
-6.21E-04
-1.02E-03
-6.95E-04
-7.43E-04
-7.96E-04
-4.88E-04
-3.55E-04
-4.26E-04
200
-1.16E-03
-8.04E-04
-1.21E-03
-2.28E-03
-1.25E-03
-1.50E-03
-1.24E-03
-1.34E-03
-1.33E-03
-9.44E-04
-3.55E-04
-4.27E-04
-2.74E-04
2.71E-04
2.86E-04
-8.33E-04
-1.50E-03
PASS
1.50E-03
PASS
-3.42E-04
2.67E-04
2.10E-04
-8.94E-04
-2.00E-03
PASS
2.00E-03
PASS
-4.19E-04
2.82E-04
1.63E-04
-1.00E-03
-2.00E-03
PASS
2.00E-03
PASS
-4.79E-04
2.91E-04
1.23E-04
-1.08E-03
-2.00E-03
PASS
2.00E-03
PASS
-5.35E-04
3.10E-04
1.06E-04
-1.18E-03
-2.00E-03
PASS
2.00E-03
PASS
-5.79E-04
3.27E-04
9.63E-05
-1.26E-03
-4.00E-03
PASS
4.00E-03
PASS
-6.23E-04
3.48E-04
9.60E-05
-1.34E-03
-4.00E-03
PASS
4.00E-03
PASS
-6.55E-04
3.64E-04
9.73E-05
-1.41E-03
-4.00E-03
PASS
4.00E-03
PASS
-6.45E-04
3.72E-04
1.23E-04
-1.41E-03
-4.00E-03
PASS
4.00E-03
PASS
-7.75E-04
4.17E-04
8.71E-05
-1.64E-03
-4.00E-03
PASS
4.00E-03
PASS
-1.31E-03
3.96E-04
-4.88E-04
-2.12E-03
-4.00E-03
PASS
4.00E-03
PASS
An ISO 9001:2008 and DSCC Certified Company
12
RLAT Report
10-326 100808 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
5.00E-03
Input Offset Voltage @+/-5V #2 (V)
4.00E-03
3.00E-03
2.00E-03
1.00E-03
0.00E+00
-1.00E-03
-2.00E-03
-3.00E-03
-4.00E-03
-5.00E-03
0
50
100
150
Total Dose (krad(Si))
Figure 5.4. Plot of Input Offset Voltage @+/-5V #2 (V) versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
13
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.4. Raw data for Input Offset Voltage @+/-5V #2 (V) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage @+/-5V #2 (V)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
-1.00E-04
-5.41E-04
-2.09E-04
-2.46E-04
7.40E-05
3.34E-04
-5.32E-04
-7.00E-05
-1.89E-04
-2.53E-04
-1.93E-04
-5.97E-04
10
-1.42E-04
-5.94E-04
-2.78E-04
-2.96E-04
2.80E-05
2.61E-04
-5.90E-04
-1.20E-04
-2.53E-04
-3.73E-04
-1.91E-04
-5.97E-04
20
-1.84E-04
-6.50E-04
-3.54E-04
-3.79E-04
-2.20E-05
1.92E-04
-6.52E-04
-1.85E-04
-3.18E-04
-4.67E-04
-1.91E-04
-5.98E-04
30
-2.25E-04
-6.89E-04
-4.13E-04
-4.51E-04
-5.10E-05
1.29E-04
-6.99E-04
-2.31E-04
-3.76E-04
-5.34E-04
-1.93E-04
-5.97E-04
40
-2.78E-04
-7.20E-04
-4.76E-04
-5.41E-04
-7.50E-05
8.60E-05
-7.36E-04
-2.78E-04
-4.23E-04
-6.06E-04
-1.92E-04
-5.96E-04
50
-3.06E-04
-7.38E-04
-5.29E-04
-6.33E-04
-1.07E-04
4.70E-05
-7.67E-04
-3.03E-04
-4.55E-04
-6.57E-04
-1.92E-04
-6.00E-04
60
-3.30E-04
-7.58E-04
-5.76E-04
-7.33E-04
-1.28E-04
1.40E-05
-8.12E-04
-3.29E-04
-4.87E-04
-7.10E-04
-1.93E-04
-5.98E-04
70
-3.46E-04
-7.76E-04
-5.99E-04
-8.27E-04
-1.43E-04
-1.70E-05
-8.25E-04
-3.53E-04
-5.17E-04
-7.60E-04
-1.93E-04
-5.97E-04
75
-3.43E-04
-7.50E-04
-5.94E-04
-8.32E-04
-1.30E-04
-7.00E-06
-8.16E-04
-3.44E-04
-5.09E-04
-7.64E-04
-1.93E-04
-6.01E-04
100
-4.32E-04
-8.28E-04
-7.11E-04
-1.10E-03
-2.25E-04
-1.08E-04
-8.98E-04
-4.36E-04
-6.19E-04
-8.99E-04
-1.93E-04
-6.00E-04
200
-9.29E-04
-1.21E-03
-1.32E-03
-1.68E-03
-6.49E-04
-5.65E-04
-1.36E-03
-8.97E-04
-1.17E-03
-1.68E-03
-1.93E-04
-5.98E-04
-1.73E-04
2.61E-04
3.65E-04
-7.12E-04
-1.50E-03
PASS
1.50E-03
PASS
-2.36E-04
2.62E-04
3.05E-04
-7.76E-04
-2.00E-03
PASS
2.00E-03
PASS
-3.02E-04
2.65E-04
2.44E-04
-8.48E-04
-2.00E-03
PASS
2.00E-03
PASS
-3.54E-04
2.65E-04
1.94E-04
-9.02E-04
-2.00E-03
PASS
2.00E-03
PASS
-4.05E-04
2.70E-04
1.53E-04
-9.62E-04
-2.00E-03
PASS
2.00E-03
PASS
-4.45E-04
2.73E-04
1.20E-04
-1.01E-03
-4.00E-03
PASS
4.00E-03
PASS
-4.85E-04
2.84E-04
1.02E-04
-1.07E-03
-4.00E-03
PASS
4.00E-03
PASS
-5.16E-04
2.92E-04
8.76E-05
-1.12E-03
-4.00E-03
PASS
4.00E-03
PASS
-5.09E-04
2.94E-04
9.88E-05
-1.12E-03
-4.00E-03
PASS
4.00E-03
PASS
-6.26E-04
3.21E-04
3.68E-05
-1.29E-03
-4.00E-03
PASS
4.00E-03
PASS
-1.15E-03
3.86E-04
-3.48E-04
-1.94E-03
-4.00E-03
PASS
4.00E-03
PASS
An ISO 9001:2008 and DSCC Certified Company
14
RLAT Report
10-326 100808 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
5.00E-03
Input Offset Voltage @+/-5V #3 (V)
4.00E-03
3.00E-03
2.00E-03
1.00E-03
0.00E+00
-1.00E-03
-2.00E-03
-3.00E-03
-4.00E-03
-5.00E-03
0
50
100
150
Total Dose (krad(Si))
Figure 5.5. Plot of Input Offset Voltage @+/-5V #3 (V) versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
15
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.5. Raw data for Input Offset Voltage @+/-5V #3 (V) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage @+/-5V #3 (V)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
-3.47E-04
-7.51E-04
-5.68E-04
-1.88E-04
-1.36E-04
-6.36E-04
9.90E-05
-2.25E-04
-2.01E-04
-1.93E-04
5.00E-05
-2.41E-04
10
-3.92E-04
-7.93E-04
-6.28E-04
-2.37E-04
-1.86E-04
-7.11E-04
4.00E-05
-2.50E-04
-2.73E-04
-2.75E-04
5.40E-05
-2.49E-04
20
-4.62E-04
-8.57E-04
-7.03E-04
-3.28E-04
-2.54E-04
-7.87E-04
-2.30E-05
-2.62E-04
-3.53E-04
-3.64E-04
5.30E-05
-2.49E-04
30
-5.04E-04
-8.97E-04
-7.53E-04
-4.15E-04
-2.94E-04
-8.52E-04
-7.30E-05
-2.76E-04
-4.32E-04
-4.32E-04
5.00E-05
-2.50E-04
40
-5.60E-04
-9.32E-04
-7.96E-04
-5.13E-04
-3.36E-04
-9.09E-04
-1.21E-04
-2.95E-04
-4.96E-04
-4.96E-04
5.00E-05
-2.49E-04
50
-5.86E-04
-9.54E-04
-8.49E-04
-5.90E-04
-3.48E-04
-9.58E-04
-1.56E-04
-2.92E-04
-5.35E-04
-5.57E-04
5.00E-05
-2.49E-04
60
-6.19E-04
-9.80E-04
-8.73E-04
-6.78E-04
-3.71E-04
-9.96E-04
-2.00E-04
-3.22E-04
-5.78E-04
-5.92E-04
4.90E-05
-2.49E-04
70
-6.40E-04
-9.92E-04
-9.09E-04
-7.63E-04
-3.72E-04
-1.03E-03
-2.23E-04
-3.21E-04
-6.26E-04
-6.36E-04
5.00E-05
-2.49E-04
75
-6.36E-04
-9.73E-04
-8.91E-04
-7.69E-04
-3.60E-04
-1.01E-03
-2.31E-04
-3.18E-04
-6.25E-04
-6.34E-04
5.00E-05
-2.49E-04
100
-7.30E-04
-1.05E-03
-9.94E-04
-1.03E-03
-4.40E-04
-1.13E-03
-3.43E-04
-3.77E-04
-7.80E-04
-7.79E-04
5.00E-05
-2.49E-04
200
-1.27E-03
-1.39E-03
-1.51E-03
-1.45E-03
-8.41E-04
-1.70E-03
-9.29E-04
-7.04E-04
-1.49E-03
-1.50E-03
4.70E-05
-2.49E-04
-3.15E-04
2.61E-04
2.25E-04
-8.54E-04
-1.50E-03
PASS
1.50E-03
PASS
-3.71E-04
2.61E-04
1.69E-04
-9.10E-04
-2.00E-03
PASS
2.00E-03
PASS
-4.39E-04
2.65E-04
1.07E-04
-9.86E-04
-2.00E-03
PASS
2.00E-03
PASS
-4.93E-04
2.66E-04
5.63E-05
-1.04E-03
-2.00E-03
PASS
2.00E-03
PASS
-5.45E-04
2.66E-04
4.09E-06
-1.09E-03
-2.00E-03
PASS
2.00E-03
PASS
-5.83E-04
2.74E-04
-1.73E-05
-1.15E-03
-4.00E-03
PASS
4.00E-03
PASS
-6.21E-04
2.72E-04
-5.83E-05
-1.18E-03
-4.00E-03
PASS
4.00E-03
PASS
-6.51E-04
2.80E-04
-7.21E-05
-1.23E-03
-4.00E-03
PASS
4.00E-03
PASS
-6.45E-04
2.75E-04
-7.78E-05
-1.21E-03
-4.00E-03
PASS
4.00E-03
PASS
-7.65E-04
2.93E-04
-1.61E-04
-1.37E-03
-4.00E-03
PASS
4.00E-03
PASS
-1.28E-03
3.35E-04
-5.87E-04
-1.97E-03
-4.00E-03
PASS
4.00E-03
PASS
An ISO 9001:2008 and DSCC Certified Company
16
RLAT Report
10-326 100808 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
5.00E-03
Input Offset Voltage @+/-5V #4 (V)
4.00E-03
3.00E-03
2.00E-03
1.00E-03
0.00E+00
-1.00E-03
-2.00E-03
-3.00E-03
-4.00E-03
-5.00E-03
0
50
100
150
Total Dose (krad(Si))
Figure 5.6. Plot of Input Offset Voltage @+/-5V #4 (V) versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
17
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.6. Raw data for Input Offset Voltage @+/-5V #4 (V) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage @+/-5V #4 (V)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
-8.73E-04
-1.27E-04
-1.25E-04
-3.26E-04
-7.46E-04
-4.70E-05
-2.02E-04
-8.00E-04
-5.50E-05
4.20E-05
3.45E-04
-2.18E-04
10
-9.25E-04
-1.86E-04
-2.03E-04
-4.03E-04
-8.03E-04
-8.40E-05
-2.69E-04
-8.56E-04
-1.28E-04
-3.10E-05
3.40E-04
-2.18E-04
20
-9.94E-04
-2.65E-04
-2.89E-04
-5.04E-04
-8.69E-04
-1.30E-04
-3.43E-04
-9.12E-04
-2.05E-04
-1.17E-04
3.38E-04
-2.19E-04
30
-1.04E-03
-3.14E-04
-3.65E-04
-6.02E-04
-9.22E-04
-1.59E-04
-3.95E-04
-9.65E-04
-2.74E-04
-1.76E-04
3.38E-04
-2.21E-04
40
-1.10E-03
-3.59E-04
-4.42E-04
-7.11E-04
-9.72E-04
-2.04E-04
-4.42E-04
-9.98E-04
-3.21E-04
-2.15E-04
3.38E-04
-2.20E-04
50
-1.13E-03
-3.91E-04
-5.13E-04
-8.14E-04
-1.02E-03
-2.34E-04
-4.73E-04
-1.02E-03
-3.64E-04
-2.49E-04
3.39E-04
-2.21E-04
60
-1.16E-03
-4.16E-04
-5.59E-04
-9.12E-04
-1.06E-03
-2.62E-04
-5.27E-04
-1.05E-03
-3.89E-04
-2.64E-04
3.38E-04
-2.21E-04
70
-1.18E-03
-4.35E-04
-6.19E-04
-1.01E-03
-1.10E-03
-2.86E-04
-5.43E-04
-1.07E-03
-4.09E-04
-2.86E-04
3.39E-04
-2.21E-04
75
-1.17E-03
-4.13E-04
-6.16E-04
-1.03E-03
-1.10E-03
-2.74E-04
-5.22E-04
-1.05E-03
-3.99E-04
-2.68E-04
3.38E-04
-2.21E-04
100
-1.26E-03
-5.16E-04
-7.53E-04
-1.30E-03
-1.23E-03
-3.54E-04
-6.14E-04
-1.13E-03
-5.10E-04
-3.68E-04
3.38E-04
-2.21E-04
200
-1.70E-03
-1.02E-03
-1.48E-03
-1.77E-03
-1.90E-03
-7.88E-04
-1.14E-03
-1.59E-03
-1.01E-03
-8.66E-04
3.39E-04
-2.21E-04
-3.26E-04
3.47E-04
3.90E-04
-1.04E-03
-1.50E-03
PASS
1.50E-03
PASS
-3.89E-04
3.43E-04
3.19E-04
-1.10E-03
-2.00E-03
PASS
2.00E-03
PASS
-4.63E-04
3.38E-04
2.36E-04
-1.16E-03
-2.00E-03
PASS
2.00E-03
PASS
-5.21E-04
3.38E-04
1.77E-04
-1.22E-03
-2.00E-03
PASS
2.00E-03
PASS
-5.77E-04
3.41E-04
1.28E-04
-1.28E-03
-2.00E-03
PASS
2.00E-03
PASS
-6.21E-04
3.43E-04
8.70E-05
-1.33E-03
-4.00E-03
PASS
4.00E-03
PASS
-6.59E-04
3.49E-04
6.15E-05
-1.38E-03
-4.00E-03
PASS
4.00E-03
PASS
-6.93E-04
3.57E-04
4.41E-05
-1.43E-03
-4.00E-03
PASS
4.00E-03
PASS
-6.84E-04
3.63E-04
6.54E-05
-1.43E-03
-4.00E-03
PASS
4.00E-03
PASS
-8.04E-04
3.87E-04
-4.89E-06
-1.60E-03
-4.00E-03
PASS
4.00E-03
PASS
-1.33E-03
4.05E-04
-4.89E-04
-2.16E-03
-4.00E-03
PASS
4.00E-03
PASS
An ISO 9001:2008 and DSCC Certified Company
18
RLAT Report
10-326 100808 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
2.00E-06
Input Offset Current @+/-5V #1 (A)
1.50E-06
1.00E-06
5.00E-07
0.00E+00
-5.00E-07
-1.00E-06
-1.50E-06
-2.00E-06
0
50
100
150
Total Dose (krad(Si))
Figure 5.7. Plot of Input Offset Current @+/-5V #1 (A) versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
19
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.7. Raw data for Input Offset Current @+/-5V #1 (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Current @+/-5V #1 (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
-3.00E-08
2.00E-08
2.00E-08
0.00E+00
-1.00E-08
0.00E+00
0.00E+00
0.00E+00
2.00E-08
2.00E-08
0.00E+00
0.00E+00
10
-2.00E-08
4.00E-08
5.00E-08
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
5.00E-08
4.00E-08
0.00E+00
0.00E+00
20
-3.00E-08
6.00E-08
6.00E-08
1.00E-08
0.00E+00
0.00E+00
0.00E+00
0.00E+00
7.00E-08
6.00E-08
0.00E+00
0.00E+00
30
-3.00E-08
7.00E-08
8.00E-08
2.00E-08
0.00E+00
0.00E+00
0.00E+00
1.00E-08
9.00E-08
8.00E-08
0.00E+00
0.00E+00
40
-4.00E-08
9.00E-08
1.00E-07
3.00E-08
0.00E+00
-1.00E-08
0.00E+00
1.00E-08
1.10E-07
1.00E-07
0.00E+00
0.00E+00
50
-5.00E-08
1.10E-07
1.10E-07
4.00E-08
0.00E+00
-2.00E-08
-1.00E-08
0.00E+00
1.30E-07
1.10E-07
0.00E+00
0.00E+00
60
-6.00E-08
1.20E-07
1.20E-07
4.00E-08
0.00E+00
-2.00E-08
-1.00E-08
1.00E-08
1.40E-07
1.30E-07
0.00E+00
0.00E+00
70
-7.00E-08
1.30E-07
1.40E-07
5.00E-08
0.00E+00
-2.00E-08
-2.00E-08
1.00E-08
1.60E-07
1.40E-07
0.00E+00
0.00E+00
75
-8.00E-08
1.40E-07
1.50E-07
6.00E-08
0.00E+00
-2.00E-08
-2.00E-08
2.00E-08
1.70E-07
1.50E-07
0.00E+00
0.00E+00
100
-9.00E-08
1.70E-07
1.80E-07
1.10E-07
0.00E+00
-2.00E-08
-2.00E-08
3.00E-08
2.20E-07
1.80E-07
0.00E+00
0.00E+00
200
-2.00E-07
2.80E-07
3.20E-07
1.20E-07
-3.00E-08
-9.00E-08
-9.00E-08
3.00E-08
4.10E-07
3.30E-07
0.00E+00
0.00E+00
4.00E-09
1.65E-08
3.80E-08
-3.00E-08
-4.00E-07
PASS
4.00E-07
PASS
1.60E-08
2.59E-08
6.95E-08
-3.75E-08
-5.00E-07
PASS
5.00E-07
PASS
2.30E-08
3.56E-08
9.65E-08
-5.05E-08
-5.00E-07
PASS
5.00E-07
PASS
3.20E-08
4.34E-08
1.22E-07
-5.76E-08
-5.00E-07
PASS
5.00E-07
PASS
3.90E-08
5.55E-08
1.54E-07
-7.55E-08
-5.00E-07
PASS
5.00E-07
PASS
4.20E-08
6.68E-08
1.80E-07
-9.59E-08
-7.50E-07
PASS
7.50E-07
PASS
4.70E-08
7.38E-08
1.99E-07
-1.05E-07
-7.50E-07
PASS
7.50E-07
PASS
5.20E-08
8.36E-08
2.25E-07
-1.21E-07
-7.50E-07
PASS
7.50E-07
PASS
5.70E-08
8.96E-08
2.42E-07
-1.28E-07
-7.50E-07
PASS
7.50E-07
PASS
7.60E-08
1.09E-07
3.00E-07
-1.48E-07
-1.00E-06
PASS
1.00E-06
PASS
1.08E-07
2.14E-07
5.51E-07
-3.35E-07
-1.50E-06
PASS
1.50E-06
PASS
An ISO 9001:2008 and DSCC Certified Company
20
RLAT Report
10-326 100808 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
2.00E-06
Input Offset Current @+/-5V #2 (A)
1.50E-06
1.00E-06
5.00E-07
0.00E+00
-5.00E-07
-1.00E-06
-1.50E-06
-2.00E-06
0
50
100
150
Total Dose (krad(Si))
Figure 5.8. Plot of Input Offset Current @+/-5V #2 (A) versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
21
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.8. Raw data for Input Offset Current @+/-5V #2 (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Current @+/-5V #2 (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
1.00E-08
-2.00E-08
1.00E-08
0.00E+00
-1.00E-08
2.00E-08
0.00E+00
-2.00E-08
0.00E+00
0.00E+00
3.00E-08
2.00E-08
10
1.00E-08
0.00E+00
4.00E-08
0.00E+00
0.00E+00
4.00E-08
2.00E-08
0.00E+00
2.00E-08
0.00E+00
3.00E-08
2.00E-08
20
0.00E+00
2.00E-08
5.00E-08
3.00E-08
3.00E-08
6.00E-08
4.00E-08
2.00E-08
4.00E-08
0.00E+00
3.00E-08
2.00E-08
30
0.00E+00
4.00E-08
5.00E-08
5.00E-08
4.00E-08
7.00E-08
6.00E-08
4.00E-08
5.00E-08
0.00E+00
3.00E-08
2.00E-08
40
0.00E+00
5.00E-08
6.00E-08
8.00E-08
6.00E-08
9.00E-08
7.00E-08
5.00E-08
7.00E-08
-2.00E-08
3.00E-08
2.00E-08
50
0.00E+00
7.00E-08
7.00E-08
1.00E-07
7.00E-08
1.00E-07
8.00E-08
6.00E-08
8.00E-08
-3.00E-08
3.00E-08
2.00E-08
60
0.00E+00
8.00E-08
7.00E-08
1.30E-07
9.00E-08
1.20E-07
9.00E-08
8.00E-08
1.00E-07
-4.00E-08
3.00E-08
2.00E-08
70
-1.00E-08
1.00E-07
8.00E-08
1.60E-07
1.10E-07
1.40E-07
1.10E-07
9.00E-08
1.10E-07
-4.00E-08
3.00E-08
2.00E-08
75
-1.00E-08
1.10E-07
8.00E-08
1.70E-07
1.10E-07
1.50E-07
1.10E-07
1.10E-07
1.20E-07
-4.00E-08
3.00E-08
2.00E-08
100
-2.00E-08
1.40E-07
1.00E-07
2.60E-07
1.50E-07
1.80E-07
1.30E-07
1.40E-07
1.50E-07
-5.00E-08
3.00E-08
1.00E-08
200
-1.10E-07
2.80E-07
2.10E-07
3.90E-07
2.80E-07
3.10E-07
2.60E-07
2.80E-07
2.90E-07
-1.50E-07
3.00E-08
2.00E-08
-1.00E-09
1.29E-08
2.56E-08
-2.76E-08
-4.00E-07
PASS
4.00E-07
PASS
1.30E-08
1.64E-08
4.68E-08
-2.08E-08
-5.00E-07
PASS
5.00E-07
PASS
2.90E-08
1.97E-08
6.97E-08
-1.17E-08
-5.00E-07
PASS
5.00E-07
PASS
4.00E-08
2.31E-08
8.77E-08
-7.69E-09
-5.00E-07
PASS
5.00E-07
PASS
5.10E-08
3.48E-08
1.23E-07
-2.08E-08
-5.00E-07
PASS
5.00E-07
PASS
6.00E-08
4.22E-08
1.47E-07
-2.71E-08
-7.50E-07
PASS
7.50E-07
PASS
7.20E-08
5.27E-08
1.81E-07
-3.67E-08
-7.50E-07
PASS
7.50E-07
PASS
8.50E-08
6.28E-08
2.15E-07
-4.46E-08
-7.50E-07
PASS
7.50E-07
PASS
9.10E-08
6.62E-08
2.28E-07
-4.58E-08
-7.50E-07
PASS
7.50E-07
PASS
1.18E-07
9.11E-08
3.06E-07
-7.02E-08
-1.00E-06
PASS
1.00E-06
PASS
2.04E-07
1.82E-07
5.80E-07
-1.72E-07
-1.50E-06
PASS
1.50E-06
PASS
An ISO 9001:2008 and DSCC Certified Company
22
RLAT Report
10-326 100808 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
2.00E-06
Input Offset Current @+/-5V #3 (A)
1.50E-06
1.00E-06
5.00E-07
0.00E+00
-5.00E-07
-1.00E-06
-1.50E-06
-2.00E-06
0
50
100
150
Total Dose (krad(Si))
Figure 5.9. Plot of Input Offset Current @+/-5V #3 (A) versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
23
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.9. Raw data for Input Offset Current @+/-5V #3 (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Current @+/-5V #3 (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
-2.00E-08
-2.00E-08
2.00E-08
0.00E+00
0.00E+00
-2.00E-08
0.00E+00
0.00E+00
0.00E+00
-1.00E-08
1.00E-08
0.00E+00
10
-1.00E-08
0.00E+00
4.00E-08
2.00E-08
2.00E-08
-1.00E-08
3.00E-08
-1.00E-08
0.00E+00
-1.00E-08
1.00E-08
0.00E+00
20
-1.00E-08
2.00E-08
6.00E-08
4.00E-08
4.00E-08
-2.00E-08
4.00E-08
-1.00E-08
0.00E+00
0.00E+00
1.00E-08
0.00E+00
30
-2.00E-08
3.00E-08
8.00E-08
7.00E-08
6.00E-08
-2.00E-08
6.00E-08
-2.00E-08
-2.00E-08
-2.00E-08
1.00E-08
0.00E+00
40
-2.00E-08
5.00E-08
1.00E-07
9.00E-08
7.00E-08
-3.00E-08
7.00E-08
-2.00E-08
-2.00E-08
-2.00E-08
1.00E-08
0.00E+00
50
-2.00E-08
6.00E-08
1.10E-07
1.10E-07
9.00E-08
-5.00E-08
9.00E-08
-2.00E-08
-3.00E-08
-3.00E-08
1.00E-08
0.00E+00
60
-2.00E-08
7.00E-08
1.20E-07
1.40E-07
1.10E-07
-5.00E-08
1.00E-07
-2.00E-08
-4.00E-08
-4.00E-08
1.00E-08
0.00E+00
70
-3.00E-08
9.00E-08
1.40E-07
1.70E-07
1.20E-07
-7.00E-08
1.20E-07
-3.00E-08
-4.00E-08
-4.00E-08
1.00E-08
0.00E+00
75
-3.00E-08
1.00E-07
1.50E-07
1.80E-07
1.30E-07
-6.00E-08
1.30E-07
-4.00E-08
-4.00E-08
-4.00E-08
1.00E-08
0.00E+00
100
-3.00E-08
1.30E-07
1.80E-07
2.60E-07
1.60E-07
-7.00E-08
1.50E-07
-4.00E-08
-5.00E-08
-5.00E-08
1.00E-08
0.00E+00
200
-9.00E-08
2.60E-07
3.20E-07
4.20E-07
2.90E-07
-1.80E-07
2.90E-07
-1.30E-07
-1.70E-07
-1.30E-07
1.00E-08
0.00E+00
-5.00E-09
1.27E-08
2.12E-08
-3.12E-08
-4.00E-07
PASS
4.00E-07
PASS
7.00E-09
1.89E-08
4.60E-08
-3.20E-08
-5.00E-07
PASS
5.00E-07
PASS
1.60E-08
2.76E-08
7.29E-08
-4.09E-08
-5.00E-07
PASS
5.00E-07
PASS
2.00E-08
4.40E-08
1.11E-07
-7.08E-08
-5.00E-07
PASS
5.00E-07
PASS
2.70E-08
5.33E-08
1.37E-07
-8.32E-08
-5.00E-07
PASS
5.00E-07
PASS
3.10E-08
6.62E-08
1.68E-07
-1.06E-07
-7.50E-07
PASS
7.50E-07
PASS
3.70E-08
7.73E-08
1.97E-07
-1.23E-07
-7.50E-07
PASS
7.50E-07
PASS
4.30E-08
9.24E-08
2.34E-07
-1.48E-07
-7.50E-07
PASS
7.50E-07
PASS
4.80E-08
9.72E-08
2.49E-07
-1.53E-07
-7.50E-07
PASS
7.50E-07
PASS
6.40E-08
1.23E-07
3.18E-07
-1.90E-07
-1.00E-06
PASS
1.00E-06
PASS
8.80E-08
2.45E-07
5.94E-07
-4.18E-07
-1.50E-06
PASS
1.50E-06
PASS
An ISO 9001:2008 and DSCC Certified Company
24
RLAT Report
10-326 100808 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
2.00E-06
Input Offset Current @+/-5V #4 (A)
1.50E-06
1.00E-06
5.00E-07
0.00E+00
-5.00E-07
-1.00E-06
-1.50E-06
-2.00E-06
0
50
100
150
Total Dose (krad(Si))
Figure 5.10. Plot of Input Offset Current @+/-5V #4 (A) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias and the black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
25
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.10. Raw data for Input Offset Current @+/-5V #4 (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Current @+/-5V #4 (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
0.00E+00
0.00E+00
-1.00E-08
0.00E+00
0.00E+00
-2.00E-08
3.00E-08
2.00E-08
0.00E+00
-1.00E-08
0.00E+00
1.00E-08
10
0.00E+00
0.00E+00
0.00E+00
-1.00E-08
2.00E-08
-1.00E-08
5.00E-08
6.00E-08
2.00E-08
0.00E+00
0.00E+00
1.00E-08
20
0.00E+00
0.00E+00
0.00E+00
-2.00E-08
3.00E-08
-2.00E-08
6.00E-08
9.00E-08
4.00E-08
3.00E-08
0.00E+00
1.00E-08
30
0.00E+00
0.00E+00
0.00E+00
-2.00E-08
4.00E-08
-2.00E-08
7.00E-08
1.20E-07
6.00E-08
5.00E-08
0.00E+00
1.00E-08
40
-1.00E-08
0.00E+00
-1.00E-08
-2.00E-08
5.00E-08
-3.00E-08
7.00E-08
1.40E-07
8.00E-08
6.00E-08
0.00E+00
1.00E-08
50
-2.00E-08
0.00E+00
-2.00E-08
-3.00E-08
5.00E-08
-3.00E-08
8.00E-08
1.70E-07
9.00E-08
8.00E-08
0.00E+00
1.00E-08
60
-2.00E-08
0.00E+00
-2.00E-08
-3.00E-08
5.00E-08
-3.00E-08
9.00E-08
1.90E-07
1.00E-07
9.00E-08
0.00E+00
1.00E-08
70
-3.00E-08
-1.00E-08
-2.00E-08
-3.00E-08
6.00E-08
-3.00E-08
1.00E-07
2.20E-07
1.20E-07
1.10E-07
0.00E+00
1.00E-08
75
-3.00E-08
0.00E+00
-3.00E-08
-4.00E-08
6.00E-08
-3.00E-08
1.00E-07
2.20E-07
1.20E-07
1.10E-07
0.00E+00
1.00E-08
100
-2.00E-08
-1.00E-08
-2.00E-08
-2.00E-08
8.00E-08
-2.00E-08
1.20E-07
2.90E-07
1.50E-07
1.50E-07
0.00E+00
1.00E-08
200
-1.00E-07
-6.00E-08
-7.00E-08
-1.30E-07
1.10E-07
-8.00E-08
2.00E-07
6.00E-07
2.80E-07
2.60E-07
0.00E+00
1.00E-08
1.00E-09
1.45E-08
3.09E-08
-2.89E-08
-4.00E-07
PASS
4.00E-07
PASS
1.30E-08
2.45E-08
6.36E-08
-3.76E-08
-5.00E-07
PASS
5.00E-07
PASS
2.10E-08
3.57E-08
9.48E-08
-5.28E-08
-5.00E-07
PASS
5.00E-07
PASS
3.00E-08
4.57E-08
1.24E-07
-6.44E-08
-5.00E-07
PASS
5.00E-07
PASS
3.30E-08
5.54E-08
1.47E-07
-8.14E-08
-5.00E-07
PASS
5.00E-07
PASS
3.70E-08
6.77E-08
1.77E-07
-1.03E-07
-7.50E-07
PASS
7.50E-07
PASS
4.20E-08
7.44E-08
1.96E-07
-1.12E-07
-7.50E-07
PASS
7.50E-07
PASS
4.90E-08
8.67E-08
2.28E-07
-1.30E-07
-7.50E-07
PASS
7.50E-07
PASS
4.80E-08
8.80E-08
2.30E-07
-1.34E-07
-7.50E-07
PASS
7.50E-07
PASS
7.00E-08
1.07E-07
2.90E-07
-1.50E-07
-1.00E-06
PASS
1.00E-06
PASS
1.01E-07
2.35E-07
5.87E-07
-3.85E-07
-1.50E-06
PASS
1.50E-06
PASS
An ISO 9001:2008 and DSCC Certified Company
26
RLAT Report
10-326 100808 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
Positive Input Bias Current @+/-5V #1 (A)
2.00E-05
1.50E-05
1.00E-05
5.00E-06
0.00E+00
-5.00E-06
-1.00E-05
-1.50E-05
-2.00E-05
0
50
100
150
Total Dose (krad(Si))
Figure 5.11. Plot of Positive Input Bias Current @+/-5V #1 (A) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias and the black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
27
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.11. Raw data for Positive Input Bias Current @+/-5V #1 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Input Bias Current @+/-5V #1 (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
3.50E-07
3.60E-07
3.00E-07
3.10E-07
2.80E-07
3.80E-07
4.00E-07
3.80E-07
3.70E-07
3.80E-07
3.20E-07
3.50E-07
10
3.30E-07
3.30E-07
2.70E-07
2.80E-07
2.60E-07
3.40E-07
3.70E-07
3.30E-07
3.40E-07
3.40E-07
3.20E-07
3.50E-07
20
3.00E-07
3.10E-07
2.40E-07
2.60E-07
2.40E-07
3.10E-07
3.40E-07
3.00E-07
3.20E-07
3.10E-07
3.20E-07
3.50E-07
30
2.80E-07
3.00E-07
2.30E-07
2.50E-07
2.30E-07
3.00E-07
3.30E-07
2.90E-07
3.10E-07
2.90E-07
3.20E-07
3.50E-07
40
2.60E-07
2.90E-07
2.20E-07
2.40E-07
2.20E-07
2.80E-07
3.20E-07
2.70E-07
3.10E-07
2.80E-07
3.20E-07
3.50E-07
50
2.40E-07
2.80E-07
2.10E-07
2.30E-07
2.20E-07
2.70E-07
3.00E-07
2.60E-07
3.00E-07
2.80E-07
3.20E-07
3.50E-07
60
2.30E-07
2.80E-07
2.00E-07
2.30E-07
2.20E-07
2.70E-07
3.00E-07
2.50E-07
3.00E-07
2.80E-07
3.20E-07
3.50E-07
70
2.20E-07
2.80E-07
2.00E-07
2.20E-07
2.20E-07
2.70E-07
2.90E-07
2.40E-07
3.10E-07
2.80E-07
3.20E-07
3.50E-07
75
2.10E-07
2.90E-07
2.00E-07
2.30E-07
2.30E-07
2.70E-07
3.00E-07
2.50E-07
3.10E-07
2.90E-07
3.20E-07
3.50E-07
100
1.90E-07
2.80E-07
1.90E-07
2.20E-07
2.30E-07
2.60E-07
2.90E-07
2.40E-07
3.10E-07
2.80E-07
3.20E-07
3.50E-07
200
-5.00E-08
1.20E-07
2.00E-08
6.00E-08
1.10E-07
8.00E-08
1.20E-07
0.00E+00
2.00E-07
1.10E-07
3.20E-07
3.50E-07
3.51E-07
4.04E-08
4.34E-07
2.68E-07
-4.00E-06
PASS
4.00E-06
PASS
3.19E-07
3.60E-08
3.93E-07
2.45E-07
-5.00E-06
PASS
5.00E-06
PASS
2.93E-07
3.43E-08
3.64E-07
2.22E-07
-5.00E-06
PASS
5.00E-06
PASS
2.81E-07
3.38E-08
3.51E-07
2.11E-07
-5.00E-06
PASS
5.00E-06
PASS
2.69E-07
3.45E-08
3.40E-07
1.98E-07
-5.00E-06
PASS
5.00E-06
PASS
2.59E-07
3.25E-08
3.26E-07
1.92E-07
-7.50E-06
PASS
7.50E-06
PASS
2.56E-07
3.50E-08
3.28E-07
1.84E-07
-7.50E-06
PASS
7.50E-06
PASS
2.53E-07
3.74E-08
3.30E-07
1.76E-07
-7.50E-06
PASS
7.50E-06
PASS
2.58E-07
3.94E-08
3.39E-07
1.77E-07
-7.50E-06
PASS
7.50E-06
PASS
2.49E-07
4.18E-08
3.35E-07
1.63E-07
-1.00E-05
PASS
1.00E-05
PASS
7.70E-08
7.20E-08
2.26E-07
-7.16E-08
-1.50E-05
PASS
1.50E-05
PASS
An ISO 9001:2008 and DSCC Certified Company
28
RLAT Report
10-326 100808 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
Positive Input Bias Current @+/-5V #2 (A)
2.00E-05
1.50E-05
1.00E-05
5.00E-06
0.00E+00
-5.00E-06
-1.00E-05
-1.50E-05
-2.00E-05
0
50
100
150
Total Dose (krad(Si))
Figure 5.12. Plot of Positive Input Bias Current @+/-5V #2 (A) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias and the black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
29
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.12. Raw data for Positive Input Bias Current @+/-5V #2 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Input Bias Current @+/-5V #2 (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
3.70E-07
3.30E-07
3.90E-07
2.50E-07
3.30E-07
3.90E-07
3.20E-07
3.30E-07
3.10E-07
2.80E-07
4.10E-07
4.00E-07
10
3.40E-07
3.00E-07
3.70E-07
2.20E-07
2.90E-07
3.40E-07
2.90E-07
2.90E-07
2.80E-07
2.40E-07
4.10E-07
4.00E-07
20
3.30E-07
2.70E-07
3.60E-07
2.00E-07
2.70E-07
3.10E-07
2.60E-07
2.60E-07
2.50E-07
2.10E-07
4.10E-07
4.00E-07
30
3.10E-07
2.60E-07
3.60E-07
1.80E-07
2.50E-07
2.80E-07
2.40E-07
2.50E-07
2.30E-07
2.00E-07
4.10E-07
3.90E-07
40
3.00E-07
2.40E-07
3.50E-07
1.70E-07
2.40E-07
2.60E-07
2.30E-07
2.30E-07
2.20E-07
1.90E-07
4.10E-07
4.00E-07
50
2.90E-07
2.30E-07
3.60E-07
1.60E-07
2.30E-07
2.40E-07
2.20E-07
2.20E-07
2.10E-07
1.70E-07
4.10E-07
4.00E-07
60
2.90E-07
2.30E-07
3.60E-07
1.50E-07
2.30E-07
2.30E-07
2.10E-07
2.10E-07
2.00E-07
1.70E-07
4.10E-07
4.00E-07
70
2.90E-07
2.20E-07
3.70E-07
1.50E-07
2.30E-07
2.20E-07
2.10E-07
2.00E-07
2.00E-07
1.60E-07
4.10E-07
4.00E-07
75
2.90E-07
2.30E-07
3.80E-07
1.50E-07
2.40E-07
2.20E-07
2.10E-07
2.00E-07
2.00E-07
1.60E-07
4.10E-07
4.00E-07
100
2.80E-07
2.20E-07
3.90E-07
1.50E-07
2.40E-07
2.00E-07
2.00E-07
1.90E-07
1.90E-07
1.50E-07
4.10E-07
4.00E-07
200
1.40E-07
3.00E-08
3.70E-07
-3.00E-08
7.00E-08
-8.00E-08
0.00E+00
-3.00E-08
-1.00E-08
-5.00E-08
4.10E-07
4.00E-07
3.30E-07
4.50E-08
4.23E-07
2.37E-07
-4.00E-06
PASS
4.00E-06
PASS
2.96E-07
4.55E-08
3.90E-07
2.02E-07
-5.00E-06
PASS
5.00E-06
PASS
2.72E-07
4.98E-08
3.75E-07
1.69E-07
-5.00E-06
PASS
5.00E-06
PASS
2.56E-07
5.19E-08
3.63E-07
1.49E-07
-5.00E-06
PASS
5.00E-06
PASS
2.43E-07
5.17E-08
3.50E-07
1.36E-07
-5.00E-06
PASS
5.00E-06
PASS
2.33E-07
5.74E-08
3.51E-07
1.15E-07
-7.50E-06
PASS
7.50E-06
PASS
2.28E-07
5.98E-08
3.51E-07
1.05E-07
-7.50E-06
PASS
7.50E-06
PASS
2.25E-07
6.38E-08
3.57E-07
9.32E-08
-7.50E-06
PASS
7.50E-06
PASS
2.28E-07
6.65E-08
3.65E-07
9.07E-08
-7.50E-06
PASS
7.50E-06
PASS
2.21E-07
7.09E-08
3.67E-07
7.45E-08
-1.00E-05
PASS
1.00E-05
PASS
4.10E-08
1.32E-07
3.13E-07
-2.31E-07
-1.50E-05
PASS
1.50E-05
PASS
An ISO 9001:2008 and DSCC Certified Company
30
RLAT Report
10-326 100808 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
Positive Input Bias Current @+/-5V #3 (A)
2.00E-05
1.50E-05
1.00E-05
5.00E-06
0.00E+00
-5.00E-06
-1.00E-05
-1.50E-05
-2.00E-05
0
50
100
150
Total Dose (krad(Si))
Figure 5.13. Plot of Positive Input Bias Current @+/-5V #3 (A) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias and the black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
31
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.13. Raw data for Positive Input Bias Current @+/-5V #3 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Input Bias Current @+/-5V #3 (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
3.70E-07
3.00E-07
4.00E-07
2.50E-07
3.40E-07
3.80E-07
3.30E-07
3.40E-07
3.20E-07
2.60E-07
3.70E-07
3.80E-07
10
3.40E-07
2.70E-07
3.60E-07
2.20E-07
3.00E-07
3.40E-07
3.00E-07
3.10E-07
2.80E-07
2.20E-07
3.70E-07
3.80E-07
20
3.20E-07
2.50E-07
3.40E-07
2.00E-07
2.80E-07
3.10E-07
2.70E-07
2.90E-07
2.70E-07
2.00E-07
3.70E-07
3.80E-07
30
3.10E-07
2.30E-07
3.30E-07
1.90E-07
2.70E-07
2.90E-07
2.50E-07
2.80E-07
2.50E-07
1.80E-07
3.70E-07
3.80E-07
40
2.90E-07
2.20E-07
3.10E-07
1.90E-07
2.60E-07
2.70E-07
2.40E-07
2.70E-07
2.40E-07
1.70E-07
3.70E-07
3.80E-07
50
2.80E-07
2.10E-07
3.00E-07
1.80E-07
2.50E-07
2.50E-07
2.40E-07
2.70E-07
2.30E-07
1.60E-07
3.70E-07
3.80E-07
60
2.80E-07
2.10E-07
2.90E-07
1.80E-07
2.50E-07
2.40E-07
2.30E-07
2.60E-07
2.30E-07
1.50E-07
3.70E-07
3.80E-07
70
2.80E-07
2.10E-07
3.00E-07
1.80E-07
2.50E-07
2.30E-07
2.30E-07
2.60E-07
2.30E-07
1.50E-07
3.70E-07
3.80E-07
75
2.80E-07
2.10E-07
3.00E-07
1.80E-07
2.50E-07
2.30E-07
2.30E-07
2.60E-07
2.30E-07
1.50E-07
3.70E-07
3.80E-07
100
2.70E-07
2.10E-07
3.00E-07
1.80E-07
2.50E-07
2.20E-07
2.20E-07
2.60E-07
2.20E-07
1.40E-07
3.70E-07
3.80E-07
200
1.00E-07
3.00E-08
1.20E-07
7.00E-08
9.00E-08
-2.00E-08
2.00E-08
1.00E-07
5.00E-08
-4.00E-08
3.70E-07
3.80E-07
3.29E-07
4.89E-08
4.30E-07
2.28E-07
-4.00E-06
PASS
4.00E-06
PASS
2.94E-07
4.79E-08
3.93E-07
1.95E-07
-5.00E-06
PASS
5.00E-06
PASS
2.73E-07
4.67E-08
3.69E-07
1.77E-07
-5.00E-06
PASS
5.00E-06
PASS
2.58E-07
4.85E-08
3.58E-07
1.58E-07
-5.00E-06
PASS
5.00E-06
PASS
2.46E-07
4.35E-08
3.36E-07
1.56E-07
-5.00E-06
PASS
5.00E-06
PASS
2.37E-07
4.37E-08
3.27E-07
1.47E-07
-7.50E-06
PASS
7.50E-06
PASS
2.32E-07
4.32E-08
3.21E-07
1.43E-07
-7.50E-06
PASS
7.50E-06
PASS
2.32E-07
4.47E-08
3.24E-07
1.40E-07
-7.50E-06
PASS
7.50E-06
PASS
2.32E-07
4.47E-08
3.24E-07
1.40E-07
-7.50E-06
PASS
7.50E-06
PASS
2.27E-07
4.60E-08
3.22E-07
1.32E-07
-1.00E-05
PASS
1.00E-05
PASS
5.20E-08
5.39E-08
1.63E-07
-5.93E-08
-1.50E-05
PASS
1.50E-05
PASS
An ISO 9001:2008 and DSCC Certified Company
32
RLAT Report
10-326 100808 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
Positive Input Bias Current @+/-5V #4 (A)
2.00E-05
1.50E-05
1.00E-05
5.00E-06
0.00E+00
-5.00E-06
-1.00E-05
-1.50E-05
-2.00E-05
0
50
100
150
Total Dose (krad(Si))
Figure 5.14. Plot of Positive Input Bias Current @+/-5V #4 (A) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias and the black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
33
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.14. Raw data for Positive Input Bias Current @+/-5V #4 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Input Bias Current @+/-5V #4 (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
3.50E-07
3.70E-07
2.90E-07
3.50E-07
3.00E-07
3.70E-07
4.10E-07
3.90E-07
3.60E-07
3.50E-07
3.50E-07
3.50E-07
10
3.20E-07
3.40E-07
2.60E-07
3.10E-07
2.70E-07
3.20E-07
3.70E-07
3.70E-07
3.20E-07
3.00E-07
3.50E-07
3.40E-07
20
2.90E-07
3.20E-07
2.40E-07
2.90E-07
2.50E-07
2.90E-07
3.50E-07
3.60E-07
2.90E-07
2.70E-07
3.50E-07
3.40E-07
30
2.70E-07
3.00E-07
2.20E-07
2.70E-07
2.40E-07
2.70E-07
3.40E-07
3.60E-07
2.60E-07
2.50E-07
3.50E-07
3.40E-07
40
2.50E-07
2.90E-07
2.10E-07
2.60E-07
2.30E-07
2.60E-07
3.20E-07
3.60E-07
2.50E-07
2.30E-07
3.50E-07
3.50E-07
50
2.30E-07
2.80E-07
2.00E-07
2.40E-07
2.20E-07
2.50E-07
3.10E-07
3.60E-07
2.40E-07
2.20E-07
3.50E-07
3.50E-07
60
2.20E-07
2.70E-07
1.90E-07
2.30E-07
2.20E-07
2.40E-07
3.10E-07
3.60E-07
2.30E-07
2.20E-07
3.50E-07
3.40E-07
70
2.10E-07
2.60E-07
1.90E-07
2.30E-07
2.20E-07
2.30E-07
3.10E-07
3.70E-07
2.20E-07
2.20E-07
3.50E-07
3.40E-07
75
2.10E-07
2.70E-07
1.90E-07
2.30E-07
2.20E-07
2.30E-07
3.10E-07
3.80E-07
2.30E-07
2.20E-07
3.50E-07
3.50E-07
100
2.00E-07
2.60E-07
1.80E-07
2.30E-07
2.30E-07
2.20E-07
3.00E-07
3.90E-07
2.00E-07
2.10E-07
3.50E-07
3.50E-07
200
-6.00E-08
7.00E-08
-2.00E-08
2.00E-08
8.00E-08
-2.00E-08
1.20E-07
3.80E-07
-3.00E-08
-4.00E-08
3.50E-07
3.50E-07
3.54E-07
3.66E-08
4.30E-07
2.78E-07
-4.00E-06
PASS
4.00E-06
PASS
3.18E-07
3.65E-08
3.93E-07
2.43E-07
-5.00E-06
PASS
5.00E-06
PASS
2.95E-07
3.89E-08
3.75E-07
2.15E-07
-5.00E-06
PASS
5.00E-06
PASS
2.78E-07
4.37E-08
3.68E-07
1.88E-07
-5.00E-06
PASS
5.00E-06
PASS
2.66E-07
4.55E-08
3.60E-07
1.72E-07
-5.00E-06
PASS
5.00E-06
PASS
2.55E-07
4.86E-08
3.55E-07
1.55E-07
-7.50E-06
PASS
7.50E-06
PASS
2.49E-07
5.09E-08
3.54E-07
1.44E-07
-7.50E-06
PASS
7.50E-06
PASS
2.46E-07
5.44E-08
3.58E-07
1.34E-07
-7.50E-06
PASS
7.50E-06
PASS
2.49E-07
5.69E-08
3.66E-07
1.32E-07
-7.50E-06
PASS
7.50E-06
PASS
2.42E-07
6.21E-08
3.70E-07
1.14E-07
-1.00E-05
PASS
1.00E-05
PASS
5.00E-08
1.30E-07
3.19E-07
-2.19E-07
-1.50E-05
PASS
1.50E-05
PASS
An ISO 9001:2008 and DSCC Certified Company
34
RLAT Report
10-326 100808 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
Negative Input Bias Current @+/-5V #1 (A)
2.00E-05
1.50E-05
1.00E-05
5.00E-06
0.00E+00
-5.00E-06
-1.00E-05
-1.50E-05
-2.00E-05
0
50
100
150
Total Dose (krad(Si))
Figure 5.15. Plot of Negative Input Bias Current @+/-5V #1 (A) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
35
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.15. Raw data for Negative Input Bias Current @+/-5V #1 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Input Bias Current @+/-5V #1 (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
3.90E-07
3.50E-07
2.70E-07
3.10E-07
3.00E-07
3.80E-07
4.00E-07
3.80E-07
3.50E-07
3.60E-07
3.20E-07
3.40E-07
10
3.50E-07
3.00E-07
2.20E-07
2.80E-07
2.60E-07
3.40E-07
3.60E-07
3.30E-07
2.90E-07
3.00E-07
3.20E-07
3.40E-07
20
3.30E-07
2.50E-07
1.80E-07
2.50E-07
2.40E-07
3.20E-07
3.40E-07
3.00E-07
2.50E-07
2.60E-07
3.20E-07
3.40E-07
30
3.20E-07
2.30E-07
1.50E-07
2.20E-07
2.30E-07
3.00E-07
3.30E-07
2.80E-07
2.20E-07
2.30E-07
3.20E-07
3.40E-07
40
3.00E-07
2.00E-07
1.20E-07
2.10E-07
2.20E-07
3.00E-07
3.20E-07
2.60E-07
2.00E-07
1.90E-07
3.20E-07
3.40E-07
50
3.00E-07
1.70E-07
1.00E-07
1.90E-07
2.20E-07
2.90E-07
3.20E-07
2.50E-07
1.80E-07
1.70E-07
3.20E-07
3.40E-07
60
2.90E-07
1.60E-07
8.00E-08
1.80E-07
2.20E-07
2.90E-07
3.10E-07
2.40E-07
1.60E-07
1.50E-07
3.20E-07
3.40E-07
70
2.90E-07
1.50E-07
6.00E-08
1.70E-07
2.20E-07
2.90E-07
3.20E-07
2.40E-07
1.50E-07
1.40E-07
3.20E-07
3.40E-07
75
3.00E-07
1.50E-07
6.00E-08
1.70E-07
2.30E-07
2.90E-07
3.20E-07
2.30E-07
1.40E-07
1.40E-07
3.20E-07
3.40E-07
100
2.80E-07
1.10E-07
2.00E-08
1.20E-07
2.30E-07
2.80E-07
3.10E-07
2.10E-07
1.00E-07
1.00E-07
3.20E-07
3.40E-07
200
1.50E-07
-1.60E-07
-3.00E-07
-4.00E-08
1.50E-07
1.60E-07
2.00E-07
-3.00E-08
-2.10E-07
-2.20E-07
3.20E-07
3.40E-07
3.49E-07
4.28E-08
4.37E-07
2.61E-07
-4.00E-06
PASS
4.00E-06
PASS
3.03E-07
4.35E-08
3.93E-07
2.13E-07
-5.00E-06
PASS
5.00E-06
PASS
2.72E-07
4.96E-08
3.74E-07
1.70E-07
-5.00E-06
PASS
5.00E-06
PASS
2.51E-07
5.55E-08
3.66E-07
1.36E-07
-5.00E-06
PASS
5.00E-06
PASS
2.32E-07
6.21E-08
3.60E-07
1.04E-07
-5.00E-06
PASS
5.00E-06
PASS
2.19E-07
7.00E-08
3.64E-07
7.45E-08
-7.50E-06
PASS
7.50E-06
PASS
2.08E-07
7.47E-08
3.62E-07
5.38E-08
-7.50E-06
PASS
7.50E-06
PASS
2.03E-07
8.27E-08
3.74E-07
3.21E-08
-7.50E-06
PASS
7.50E-06
PASS
2.03E-07
8.46E-08
3.78E-07
2.83E-08
-7.50E-06
PASS
7.50E-06
PASS
1.76E-07
9.83E-08
3.79E-07
-2.71E-08
-1.00E-05
PASS
1.00E-05
PASS
-3.00E-08
1.86E-07
3.55E-07
-4.15E-07
-1.50E-05
PASS
1.50E-05
PASS
An ISO 9001:2008 and DSCC Certified Company
36
RLAT Report
10-326 100808 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
Negative Input Bias Current @+/-5V #2 (A)
2.00E-05
1.50E-05
1.00E-05
5.00E-06
0.00E+00
-5.00E-06
-1.00E-05
-1.50E-05
-2.00E-05
0
50
100
150
Total Dose (krad(Si))
Figure 5.16. Plot of Negative Input Bias Current @+/-5V #2 (A) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
37
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.16. Raw data for Negative Input Bias Current @+/-5V #2 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Input Bias Current @+/-5V #2 (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
3.60E-07
3.50E-07
3.70E-07
2.50E-07
3.40E-07
3.70E-07
3.20E-07
3.50E-07
3.20E-07
2.70E-07
3.80E-07
3.80E-07
10
3.40E-07
3.00E-07
3.30E-07
2.20E-07
2.90E-07
3.00E-07
2.70E-07
2.90E-07
2.60E-07
2.40E-07
3.80E-07
3.80E-07
20
3.20E-07
2.60E-07
3.10E-07
1.70E-07
2.40E-07
2.50E-07
2.20E-07
2.50E-07
2.20E-07
2.20E-07
3.80E-07
3.80E-07
30
3.10E-07
2.20E-07
3.00E-07
1.30E-07
2.10E-07
2.10E-07
1.90E-07
2.10E-07
1.80E-07
2.10E-07
3.80E-07
3.80E-07
40
3.00E-07
2.00E-07
3.00E-07
9.00E-08
1.80E-07
1.70E-07
1.70E-07
1.80E-07
1.50E-07
2.10E-07
3.80E-07
3.80E-07
50
3.00E-07
1.70E-07
2.90E-07
6.00E-08
1.60E-07
1.40E-07
1.50E-07
1.50E-07
1.20E-07
2.00E-07
3.80E-07
3.80E-07
60
3.00E-07
1.50E-07
2.90E-07
3.00E-08
1.40E-07
1.10E-07
1.20E-07
1.30E-07
1.00E-07
2.00E-07
3.80E-07
3.80E-07
70
3.00E-07
1.30E-07
2.90E-07
0.00E+00
1.30E-07
8.00E-08
1.10E-07
1.10E-07
9.00E-08
2.00E-07
3.80E-07
3.80E-07
75
3.10E-07
1.30E-07
2.90E-07
-2.00E-08
1.30E-07
8.00E-08
1.10E-07
1.00E-07
8.00E-08
2.10E-07
3.80E-07
3.80E-07
100
3.00E-07
8.00E-08
2.90E-07
-1.00E-07
9.00E-08
2.00E-08
7.00E-08
5.00E-08
4.00E-08
2.00E-07
3.80E-07
3.80E-07
200
2.40E-07
-2.50E-07
1.70E-07
-4.10E-07
-2.20E-07
-3.80E-07
-2.60E-07
-3.10E-07
-3.10E-07
1.00E-07
3.80E-07
3.80E-07
3.30E-07
4.11E-08
4.15E-07
2.45E-07
-4.00E-06
PASS
4.00E-06
PASS
2.84E-07
3.75E-08
3.61E-07
2.07E-07
-5.00E-06
PASS
5.00E-06
PASS
2.46E-07
4.43E-08
3.37E-07
1.55E-07
-5.00E-06
PASS
5.00E-06
PASS
2.17E-07
5.31E-08
3.27E-07
1.07E-07
-5.00E-06
PASS
5.00E-06
PASS
1.95E-07
6.42E-08
3.27E-07
6.25E-08
-5.00E-06
PASS
5.00E-06
PASS
1.74E-07
7.34E-08
3.25E-07
2.25E-08
-7.50E-06
PASS
7.50E-06
PASS
1.57E-07
8.43E-08
3.31E-07
-1.71E-08
-7.50E-06
PASS
7.50E-06
PASS
1.44E-07
9.38E-08
3.38E-07
-4.98E-08
-7.50E-06
PASS
7.50E-06
PASS
1.42E-07
1.01E-07
3.51E-07
-6.65E-08
-7.50E-06
PASS
7.50E-06
PASS
1.04E-07
1.25E-07
3.61E-07
-1.53E-07
-1.00E-05
PASS
1.00E-05
PASS
-1.63E-07
2.39E-07
3.30E-07
-6.56E-07
-1.50E-05
PASS
1.50E-05
PASS
An ISO 9001:2008 and DSCC Certified Company
38
RLAT Report
10-326 100808 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
Negative Input Bias Current @+/-5V #3 (A)
2.00E-05
1.50E-05
1.00E-05
5.00E-06
0.00E+00
-5.00E-06
-1.00E-05
-1.50E-05
-2.00E-05
0
50
100
150
Total Dose (krad(Si))
Figure 5.17. Plot of Negative Input Bias Current @+/-5V #3 (A) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
39
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.17. Raw data for Negative Input Bias Current @+/-5V #3 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Input Bias Current @+/-5V #3 (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
3.90E-07
3.30E-07
3.70E-07
2.40E-07
3.40E-07
3.90E-07
3.20E-07
3.50E-07
3.20E-07
2.70E-07
3.60E-07
3.80E-07
10
3.60E-07
2.80E-07
3.20E-07
2.10E-07
2.90E-07
3.50E-07
2.70E-07
3.20E-07
2.90E-07
2.30E-07
3.60E-07
3.70E-07
20
3.40E-07
2.40E-07
2.80E-07
1.70E-07
2.40E-07
3.30E-07
2.30E-07
3.00E-07
2.80E-07
2.10E-07
3.60E-07
3.70E-07
30
3.20E-07
2.10E-07
2.50E-07
1.30E-07
2.10E-07
3.10E-07
2.00E-07
3.00E-07
2.70E-07
2.00E-07
3.60E-07
3.80E-07
40
3.10E-07
1.80E-07
2.20E-07
1.00E-07
1.80E-07
3.10E-07
1.70E-07
2.90E-07
2.60E-07
1.90E-07
3.60E-07
3.80E-07
50
3.10E-07
1.60E-07
2.00E-07
7.00E-08
1.60E-07
3.00E-07
1.50E-07
2.90E-07
2.60E-07
1.90E-07
3.60E-07
3.80E-07
60
3.10E-07
1.40E-07
1.80E-07
4.00E-08
1.40E-07
3.00E-07
1.20E-07
2.90E-07
2.70E-07
1.90E-07
3.60E-07
3.80E-07
70
3.10E-07
1.20E-07
1.60E-07
1.00E-08
1.30E-07
3.00E-07
1.10E-07
2.90E-07
2.70E-07
1.90E-07
3.60E-07
3.70E-07
75
3.10E-07
1.20E-07
1.60E-07
0.00E+00
1.30E-07
3.00E-07
1.10E-07
3.00E-07
2.70E-07
2.00E-07
3.60E-07
3.80E-07
100
3.00E-07
8.00E-08
1.20E-07
-7.00E-08
1.00E-07
2.90E-07
7.00E-08
2.90E-07
2.70E-07
2.00E-07
3.60E-07
3.80E-07
200
1.80E-07
-2.30E-07
-2.00E-07
-3.30E-07
-2.00E-07
1.60E-07
-2.60E-07
2.30E-07
2.20E-07
9.00E-08
3.60E-07
3.80E-07
3.32E-07
4.85E-08
4.32E-07
2.32E-07
-4.00E-06
PASS
4.00E-06
PASS
2.92E-07
4.80E-08
3.91E-07
1.93E-07
-5.00E-06
PASS
5.00E-06
PASS
2.62E-07
5.37E-08
3.73E-07
1.51E-07
-5.00E-06
PASS
5.00E-06
PASS
2.40E-07
6.06E-08
3.65E-07
1.15E-07
-5.00E-06
PASS
5.00E-06
PASS
2.21E-07
6.97E-08
3.65E-07
7.71E-08
-5.00E-06
PASS
5.00E-06
PASS
2.09E-07
7.87E-08
3.71E-07
4.66E-08
-7.50E-06
PASS
7.50E-06
PASS
1.98E-07
9.11E-08
3.86E-07
9.79E-09
-7.50E-06
PASS
7.50E-06
PASS
1.89E-07
1.01E-07
3.97E-07
-1.87E-08
-7.50E-06
PASS
7.50E-06
PASS
1.90E-07
1.04E-07
4.04E-07
-2.44E-08
-7.50E-06
PASS
7.50E-06
PASS
1.65E-07
1.24E-07
4.22E-07
-9.20E-08
-1.00E-05
PASS
1.00E-05
PASS
-3.40E-08
2.27E-07
4.36E-07
-5.04E-07
-1.50E-05
PASS
1.50E-05
PASS
An ISO 9001:2008 and DSCC Certified Company
40
RLAT Report
10-326 100808 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
Negative Input Bias Current @+/-5V #4 (A)
2.00E-05
1.50E-05
1.00E-05
5.00E-06
0.00E+00
-5.00E-06
-1.00E-05
-1.50E-05
-2.00E-05
0
50
100
150
Total Dose (krad(Si))
Figure 5.18. Plot of Negative Input Bias Current @+/-5V #4 (A) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
41
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.18. Raw data for Negative Input Bias Current @+/-5V #4 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Input Bias Current @+/-5V #4 (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
3.60E-07
3.70E-07
3.10E-07
3.50E-07
3.00E-07
3.90E-07
3.80E-07
3.60E-07
3.60E-07
3.60E-07
3.60E-07
3.30E-07
10
3.20E-07
3.30E-07
2.70E-07
3.30E-07
2.50E-07
3.40E-07
3.30E-07
3.10E-07
3.00E-07
3.00E-07
3.50E-07
3.30E-07
20
2.90E-07
3.10E-07
2.40E-07
3.10E-07
2.30E-07
3.10E-07
2.90E-07
2.70E-07
2.50E-07
2.50E-07
3.50E-07
3.30E-07
30
2.80E-07
3.00E-07
2.30E-07
3.00E-07
2.00E-07
3.00E-07
2.70E-07
2.40E-07
2.10E-07
2.10E-07
3.50E-07
3.30E-07
40
2.60E-07
2.90E-07
2.30E-07
2.80E-07
1.90E-07
2.90E-07
2.50E-07
2.10E-07
1.80E-07
1.80E-07
3.50E-07
3.30E-07
50
2.50E-07
2.80E-07
2.20E-07
2.80E-07
1.80E-07
2.70E-07
2.40E-07
2.00E-07
1.50E-07
1.50E-07
3.50E-07
3.30E-07
60
2.40E-07
2.80E-07
2.20E-07
2.70E-07
1.70E-07
2.70E-07
2.20E-07
1.70E-07
1.30E-07
1.20E-07
3.50E-07
3.30E-07
70
2.40E-07
2.80E-07
2.10E-07
2.60E-07
1.60E-07
2.60E-07
2.10E-07
1.60E-07
1.10E-07
1.10E-07
3.50E-07
3.30E-07
75
2.40E-07
2.80E-07
2.20E-07
2.70E-07
1.60E-07
2.60E-07
2.10E-07
1.60E-07
1.00E-07
1.10E-07
3.50E-07
3.40E-07
100
2.20E-07
2.70E-07
2.00E-07
2.40E-07
1.50E-07
2.50E-07
1.80E-07
1.10E-07
5.00E-08
6.00E-08
3.50E-07
3.30E-07
200
5.00E-08
1.40E-07
5.00E-08
1.60E-07
-3.00E-08
6.00E-08
-8.00E-08
-2.10E-07
-3.00E-07
-2.90E-07
3.50E-07
3.30E-07
3.54E-07
2.84E-08
4.13E-07
2.95E-07
-4.00E-06
PASS
4.00E-06
PASS
3.08E-07
2.90E-08
3.68E-07
2.48E-07
-5.00E-06
PASS
5.00E-06
PASS
2.75E-07
3.10E-08
3.39E-07
2.11E-07
-5.00E-06
PASS
5.00E-06
PASS
2.54E-07
4.06E-08
3.38E-07
1.70E-07
-5.00E-06
PASS
5.00E-06
PASS
2.36E-07
4.43E-08
3.27E-07
1.45E-07
-5.00E-06
PASS
5.00E-06
PASS
2.22E-07
5.03E-08
3.26E-07
1.18E-07
-7.50E-06
PASS
7.50E-06
PASS
2.09E-07
5.86E-08
3.30E-07
8.80E-08
-7.50E-06
PASS
7.50E-06
PASS
2.00E-07
6.22E-08
3.28E-07
7.16E-08
-7.50E-06
PASS
7.50E-06
PASS
2.01E-07
6.52E-08
3.36E-07
6.63E-08
-7.50E-06
PASS
7.50E-06
PASS
1.73E-07
7.83E-08
3.35E-07
1.13E-08
-1.00E-05
PASS
1.00E-05
PASS
-4.50E-08
1.70E-07
3.05E-07
-3.95E-07
-1.50E-05
PASS
1.50E-05
PASS
An ISO 9001:2008 and DSCC Certified Company
42
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Common Mode Rejection Ratio @+/-5V #1 (dB)
9.00E+01
8.50E+01
8.00E+01
7.50E+01
7.00E+01
6.50E+01
6.00E+01
5.50E+01
5.00E+01
0
50
100
150
Total Dose (krad(Si))
Figure 5.19. Plot of Common Mode Rejection Ratio @+/-5V #1 (dB) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
43
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.19. Raw data for Common Mode Rejection Ratio @+/-5V #1 (dB) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Common Mode Rejection Ratio @+/-5V #1 (dB)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
8.59E+01
8.87E+01
8.45E+01
8.63E+01
8.40E+01
8.67E+01
8.48E+01
8.58E+01
8.53E+01
8.64E+01
8.57E+01
8.42E+01
10
8.48E+01
8.82E+01
8.33E+01
8.61E+01
8.36E+01
8.59E+01
8.39E+01
8.46E+01
8.44E+01
8.60E+01
8.57E+01
8.43E+01
20
8.51E+01
8.79E+01
8.36E+01
8.60E+01
8.36E+01
8.60E+01
8.41E+01
8.50E+01
8.46E+01
8.58E+01
8.57E+01
8.43E+01
30
8.53E+01
8.79E+01
8.39E+01
8.59E+01
8.36E+01
8.60E+01
8.42E+01
8.51E+01
8.47E+01
8.58E+01
8.57E+01
8.43E+01
40
8.53E+01
8.77E+01
8.39E+01
8.58E+01
8.35E+01
8.59E+01
8.43E+01
8.51E+01
8.47E+01
8.56E+01
8.57E+01
8.42E+01
50
8.53E+01
8.76E+01
8.39E+01
8.56E+01
8.34E+01
8.59E+01
8.42E+01
8.51E+01
8.47E+01
8.55E+01
8.57E+01
8.42E+01
60
8.53E+01
8.74E+01
8.38E+01
8.55E+01
8.33E+01
8.58E+01
8.42E+01
8.49E+01
8.46E+01
8.54E+01
8.57E+01
8.42E+01
70
8.52E+01
8.73E+01
8.37E+01
8.53E+01
8.32E+01
8.57E+01
8.40E+01
8.48E+01
8.45E+01
8.52E+01
8.57E+01
8.42E+01
75
8.52E+01
8.72E+01
8.36E+01
8.52E+01
8.31E+01
8.56E+01
8.40E+01
8.48E+01
8.44E+01
8.51E+01
8.57E+01
8.43E+01
100
8.50E+01
8.67E+01
8.33E+01
8.48E+01
8.28E+01
8.52E+01
8.37E+01
8.44E+01
8.41E+01
8.47E+01
8.57E+01
8.43E+01
200
8.36E+01
8.46E+01
8.18E+01
8.35E+01
8.16E+01
8.36E+01
8.25E+01
8.28E+01
8.27E+01
8.31E+01
8.57E+01
8.42E+01
8.58E+01
1.35E+00
8.86E+01
8.30E+01
7.50E+01
PASS
8.51E+01
1.48E+00
8.81E+01
8.20E+01
7.30E+01
PASS
8.52E+01
1.31E+00
8.79E+01
8.25E+01
7.30E+01
PASS
8.52E+01
1.27E+00
8.78E+01
8.26E+01
7.30E+01
PASS
8.52E+01
1.22E+00
8.77E+01
8.27E+01
7.30E+01
PASS
8.51E+01
1.20E+00
8.76E+01
8.26E+01
6.20E+01
PASS
8.50E+01
1.16E+00
8.74E+01
8.26E+01
6.20E+01
PASS
8.49E+01
1.16E+00
8.73E+01
8.25E+01
6.20E+01
PASS
8.48E+01
1.14E+00
8.71E+01
8.24E+01
6.20E+01
PASS
8.45E+01
1.09E+00
8.67E+01
8.22E+01
6.20E+01
PASS
8.30E+01
9.00E-01
8.48E+01
8.11E+01
6.20E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
44
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Common Mode Rejection Ratio @+/-5V #2 (dB)
9.00E+01
8.50E+01
8.00E+01
7.50E+01
7.00E+01
6.50E+01
6.00E+01
5.50E+01
5.00E+01
0
50
100
150
Total Dose (krad(Si))
Figure 5.20. Plot of Common Mode Rejection Ratio @+/-5V #2 (dB) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
45
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.20. Raw data for Common Mode Rejection Ratio @+/-5V #2 (dB) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Common Mode Rejection Ratio @+/-5V #2 (dB)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
8.62E+01
8.33E+01
8.45E+01
8.64E+01
8.74E+01
8.47E+01
8.49E+01
8.57E+01
8.50E+01
8.56E+01
8.60E+01
8.56E+01
10
8.56E+01
8.26E+01
8.29E+01
8.63E+01
8.67E+01
8.35E+01
8.43E+01
8.48E+01
8.42E+01
8.36E+01
8.60E+01
8.56E+01
20
8.56E+01
8.27E+01
8.36E+01
8.61E+01
8.67E+01
8.39E+01
8.43E+01
8.49E+01
8.43E+01
8.48E+01
8.60E+01
8.56E+01
30
8.55E+01
8.28E+01
8.39E+01
8.60E+01
8.66E+01
8.41E+01
8.43E+01
8.50E+01
8.44E+01
8.53E+01
8.60E+01
8.56E+01
40
8.56E+01
8.28E+01
8.41E+01
8.59E+01
8.67E+01
8.41E+01
8.43E+01
8.51E+01
8.44E+01
8.55E+01
8.60E+01
8.56E+01
50
8.55E+01
8.28E+01
8.41E+01
8.57E+01
8.65E+01
8.41E+01
8.43E+01
8.50E+01
8.43E+01
8.56E+01
8.60E+01
8.57E+01
60
8.55E+01
8.27E+01
8.42E+01
8.56E+01
8.64E+01
8.40E+01
8.42E+01
8.50E+01
8.43E+01
8.56E+01
8.60E+01
8.57E+01
70
8.54E+01
8.26E+01
8.40E+01
8.54E+01
8.62E+01
8.40E+01
8.41E+01
8.48E+01
8.41E+01
8.54E+01
8.60E+01
8.56E+01
75
8.53E+01
8.26E+01
8.40E+01
8.53E+01
8.61E+01
8.38E+01
8.40E+01
8.47E+01
8.41E+01
8.54E+01
8.60E+01
8.56E+01
100
8.50E+01
8.24E+01
8.38E+01
8.50E+01
8.58E+01
8.36E+01
8.37E+01
8.45E+01
8.38E+01
8.51E+01
8.60E+01
8.56E+01
200
8.35E+01
8.11E+01
8.26E+01
8.35E+01
8.40E+01
8.22E+01
8.24E+01
8.29E+01
8.23E+01
8.37E+01
8.60E+01
8.56E+01
8.54E+01
1.16E+00
8.78E+01
8.30E+01
7.50E+01
PASS
8.45E+01
1.39E+00
8.73E+01
8.16E+01
7.30E+01
PASS
8.47E+01
1.20E+00
8.72E+01
8.22E+01
7.30E+01
PASS
8.48E+01
1.12E+00
8.71E+01
8.25E+01
7.30E+01
PASS
8.49E+01
1.10E+00
8.71E+01
8.26E+01
7.30E+01
PASS
8.48E+01
1.08E+00
8.70E+01
8.26E+01
6.20E+01
PASS
8.47E+01
1.06E+00
8.69E+01
8.25E+01
6.20E+01
PASS
8.46E+01
1.04E+00
8.67E+01
8.24E+01
6.20E+01
PASS
8.45E+01
1.04E+00
8.67E+01
8.24E+01
6.20E+01
PASS
8.43E+01
9.83E-01
8.63E+01
8.22E+01
6.20E+01
PASS
8.28E+01
8.75E-01
8.46E+01
8.10E+01
6.20E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
46
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Common Mode Rejection Ratio @+/-5V #3 (dB)
9.00E+01
8.50E+01
8.00E+01
7.50E+01
7.00E+01
6.50E+01
6.00E+01
5.50E+01
5.00E+01
0
50
100
150
Total Dose (krad(Si))
Figure 5.21. Plot of Common Mode Rejection Ratio @+/-5V #3 (dB) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
47
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.21. Raw data for Common Mode Rejection Ratio @+/-5V #3 (dB) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Common Mode Rejection Ratio @+/-5V #3 (dB)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
8.62E+01
8.51E+01
8.56E+01
8.47E+01
8.57E+01
8.51E+01
8.72E+01
8.47E+01
8.54E+01
8.54E+01
8.54E+01
8.76E+01
10
8.54E+01
8.41E+01
8.48E+01
8.46E+01
8.52E+01
8.33E+01
8.62E+01
8.31E+01
8.38E+01
8.41E+01
8.55E+01
8.75E+01
20
8.54E+01
8.43E+01
8.49E+01
8.46E+01
8.52E+01
8.44E+01
8.63E+01
8.37E+01
8.44E+01
8.46E+01
8.55E+01
8.75E+01
30
8.55E+01
8.44E+01
8.49E+01
8.44E+01
8.51E+01
8.49E+01
8.65E+01
8.42E+01
8.48E+01
8.49E+01
8.55E+01
8.76E+01
40
8.55E+01
8.44E+01
8.49E+01
8.43E+01
8.50E+01
8.52E+01
8.65E+01
8.44E+01
8.50E+01
8.49E+01
8.54E+01
8.75E+01
50
8.55E+01
8.44E+01
8.48E+01
8.42E+01
8.49E+01
8.52E+01
8.64E+01
8.44E+01
8.49E+01
8.49E+01
8.55E+01
8.76E+01
60
8.54E+01
8.42E+01
8.47E+01
8.41E+01
8.48E+01
8.51E+01
8.63E+01
8.44E+01
8.49E+01
8.48E+01
8.54E+01
8.76E+01
70
8.53E+01
8.41E+01
8.46E+01
8.40E+01
8.46E+01
8.51E+01
8.62E+01
8.43E+01
8.49E+01
8.48E+01
8.54E+01
8.76E+01
75
8.53E+01
8.40E+01
8.45E+01
8.39E+01
8.46E+01
8.50E+01
8.60E+01
8.42E+01
8.48E+01
8.46E+01
8.55E+01
8.76E+01
100
8.49E+01
8.38E+01
8.42E+01
8.36E+01
8.42E+01
8.47E+01
8.57E+01
8.40E+01
8.45E+01
8.44E+01
8.55E+01
8.76E+01
200
8.34E+01
8.23E+01
8.25E+01
8.24E+01
8.27E+01
8.33E+01
8.40E+01
8.28E+01
8.32E+01
8.30E+01
8.54E+01
8.76E+01
8.55E+01
7.53E-01
8.71E+01
8.39E+01
7.50E+01
PASS
8.45E+01
9.60E-01
8.64E+01
8.25E+01
7.30E+01
PASS
8.48E+01
7.11E-01
8.62E+01
8.33E+01
7.30E+01
PASS
8.49E+01
6.52E-01
8.63E+01
8.36E+01
7.30E+01
PASS
8.50E+01
6.38E-01
8.63E+01
8.37E+01
7.30E+01
PASS
8.50E+01
6.43E-01
8.63E+01
8.36E+01
6.20E+01
PASS
8.49E+01
6.42E-01
8.62E+01
8.35E+01
6.20E+01
PASS
8.48E+01
6.30E-01
8.61E+01
8.35E+01
6.20E+01
PASS
8.47E+01
6.25E-01
8.60E+01
8.34E+01
6.20E+01
PASS
8.44E+01
6.04E-01
8.56E+01
8.31E+01
6.20E+01
PASS
8.29E+01
5.29E-01
8.40E+01
8.18E+01
6.20E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
48
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Common Mode Rejection Ratio @+/-5V #4 (dB)
9.00E+01
8.50E+01
8.00E+01
7.50E+01
7.00E+01
6.50E+01
6.00E+01
5.50E+01
5.00E+01
0
50
100
150
Total Dose (krad(Si))
Figure 5.22. Plot of Common Mode Rejection Ratio @+/-5V #4 (dB) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
49
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.22. Raw data for Common Mode Rejection Ratio @+/-5V #4 (dB) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Common Mode Rejection Ratio @+/-5V #4 (dB)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
8.51E+01
8.59E+01
8.63E+01
8.73E+01
8.58E+01
8.53E+01
8.65E+01
8.59E+01
8.67E+01
8.53E+01
8.68E+01
8.64E+01
10
8.38E+01
8.50E+01
8.44E+01
8.72E+01
8.52E+01
8.46E+01
8.59E+01
8.49E+01
8.55E+01
8.48E+01
8.68E+01
8.64E+01
20
8.42E+01
8.51E+01
8.50E+01
8.70E+01
8.53E+01
8.46E+01
8.58E+01
8.51E+01
8.58E+01
8.48E+01
8.68E+01
8.64E+01
30
8.44E+01
8.52E+01
8.54E+01
8.70E+01
8.53E+01
8.46E+01
8.58E+01
8.52E+01
8.59E+01
8.47E+01
8.68E+01
8.64E+01
40
8.46E+01
8.52E+01
8.57E+01
8.69E+01
8.52E+01
8.46E+01
8.58E+01
8.53E+01
8.59E+01
8.47E+01
8.68E+01
8.63E+01
50
8.46E+01
8.53E+01
8.57E+01
8.67E+01
8.51E+01
8.46E+01
8.58E+01
8.52E+01
8.59E+01
8.45E+01
8.68E+01
8.64E+01
60
8.46E+01
8.52E+01
8.57E+01
8.66E+01
8.50E+01
8.45E+01
8.57E+01
8.51E+01
8.58E+01
8.44E+01
8.68E+01
8.64E+01
70
8.45E+01
8.51E+01
8.56E+01
8.64E+01
8.49E+01
8.44E+01
8.56E+01
8.50E+01
8.57E+01
8.42E+01
8.68E+01
8.64E+01
75
8.44E+01
8.50E+01
8.55E+01
8.63E+01
8.48E+01
8.42E+01
8.55E+01
8.49E+01
8.56E+01
8.42E+01
8.68E+01
8.64E+01
100
8.42E+01
8.48E+01
8.53E+01
8.59E+01
8.45E+01
8.40E+01
8.53E+01
8.47E+01
8.52E+01
8.38E+01
8.68E+01
8.63E+01
200
8.30E+01
8.33E+01
8.39E+01
8.45E+01
8.32E+01
8.25E+01
8.38E+01
8.32E+01
8.36E+01
8.24E+01
8.68E+01
8.64E+01
8.60E+01
6.93E-01
8.74E+01
8.46E+01
7.50E+01
PASS
8.51E+01
9.31E-01
8.71E+01
8.32E+01
7.30E+01
PASS
8.53E+01
7.83E-01
8.69E+01
8.36E+01
7.30E+01
PASS
8.54E+01
7.56E-01
8.69E+01
8.38E+01
7.30E+01
PASS
8.54E+01
7.08E-01
8.68E+01
8.39E+01
7.30E+01
PASS
8.53E+01
6.95E-01
8.68E+01
8.39E+01
6.20E+01
PASS
8.52E+01
6.88E-01
8.67E+01
8.38E+01
6.20E+01
PASS
8.51E+01
6.75E-01
8.65E+01
8.37E+01
6.20E+01
PASS
8.50E+01
6.82E-01
8.64E+01
8.36E+01
6.20E+01
PASS
8.48E+01
6.71E-01
8.62E+01
8.34E+01
6.20E+01
PASS
8.33E+01
6.46E-01
8.47E+01
8.20E+01
6.20E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
50
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
1.00E+02
Power Supply Rejection Ratio #1 (dB)
9.50E+01
9.00E+01
8.50E+01
8.00E+01
7.50E+01
7.00E+01
6.50E+01
6.00E+01
5.50E+01
5.00E+01
0
50
100
150
Total Dose (krad(Si))
Figure 5.23. Plot of Power Supply Rejection Ratio #1 (dB) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias and the black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
51
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.23. Raw data for Power Supply Rejection Ratio #1 (dB) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Power Supply Rejection Ratio #1 (dB)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
9.50E+01
1.01E+02
1.03E+02
9.15E+01
9.32E+01
9.62E+01
9.73E+01
9.69E+01
9.74E+01
9.80E+01
9.95E+01
9.63E+01
10
9.51E+01
1.01E+02
1.03E+02
9.16E+01
9.32E+01
9.64E+01
9.72E+01
9.70E+01
9.73E+01
9.77E+01
9.95E+01
9.65E+01
20
9.52E+01
1.01E+02
1.02E+02
9.17E+01
9.33E+01
9.65E+01
9.74E+01
9.70E+01
9.72E+01
9.77E+01
9.95E+01
9.65E+01
30
9.53E+01
1.01E+02
1.02E+02
9.18E+01
9.32E+01
9.65E+01
9.73E+01
9.71E+01
9.72E+01
9.76E+01
9.95E+01
9.64E+01
40
9.53E+01
1.01E+02
1.02E+02
9.19E+01
9.33E+01
9.67E+01
9.74E+01
9.70E+01
9.71E+01
9.77E+01
9.95E+01
9.65E+01
50
9.56E+01
1.01E+02
1.02E+02
9.19E+01
9.33E+01
9.68E+01
9.75E+01
9.70E+01
9.70E+01
9.76E+01
9.94E+01
9.65E+01
60
9.57E+01
1.01E+02
1.02E+02
9.19E+01
9.32E+01
9.69E+01
9.75E+01
9.69E+01
9.67E+01
9.75E+01
9.95E+01
9.64E+01
70
9.57E+01
1.01E+02
1.01E+02
9.21E+01
9.32E+01
9.72E+01
9.75E+01
9.69E+01
9.67E+01
9.74E+01
9.94E+01
9.65E+01
75
9.58E+01
1.00E+02
1.01E+02
9.21E+01
9.32E+01
9.70E+01
9.74E+01
9.69E+01
9.66E+01
9.74E+01
9.95E+01
9.64E+01
100
9.58E+01
1.00E+02
1.00E+02
9.24E+01
9.30E+01
9.73E+01
9.73E+01
9.67E+01
9.62E+01
9.72E+01
9.94E+01
9.64E+01
200
9.70E+01
9.90E+01
9.83E+01
9.37E+01
9.35E+01
9.86E+01
9.69E+01
9.64E+01
9.56E+01
9.74E+01
9.93E+01
9.65E+01
9.70E+01
3.37E+00
1.04E+02
9.00E+01
7.80E+01
PASS
9.69E+01
3.28E+00
1.04E+02
9.02E+01
7.70E+01
PASS
9.70E+01
3.21E+00
1.04E+02
9.03E+01
7.50E+01
PASS
9.69E+01
3.17E+00
1.03E+02
9.04E+01
7.50E+01
PASS
9.70E+01
3.12E+00
1.03E+02
9.05E+01
7.50E+01
PASS
9.70E+01
3.03E+00
1.03E+02
9.07E+01
6.50E+01
PASS
9.69E+01
2.92E+00
1.03E+02
9.08E+01
6.50E+01
PASS
9.68E+01
2.78E+00
1.03E+02
9.11E+01
6.50E+01
PASS
9.68E+01
2.73E+00
1.02E+02
9.12E+01
6.50E+01
PASS
9.66E+01
2.52E+00
1.02E+02
9.14E+01
6.50E+01
PASS
9.66E+01
1.90E+00
1.01E+02
9.27E+01
6.50E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
52
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
1.00E+02
Power Supply Rejection Ratio #2 (dB)
9.50E+01
9.00E+01
8.50E+01
8.00E+01
7.50E+01
7.00E+01
6.50E+01
6.00E+01
5.50E+01
5.00E+01
0
50
100
150
Total Dose (krad(Si))
Figure 5.24. Plot of Power Supply Rejection Ratio #2 (dB) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias and the black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
53
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.24. Raw data for Power Supply Rejection Ratio #2 (dB) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Power Supply Rejection Ratio #2 (dB)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
1.00E+02
9.02E+01
9.93E+01
9.47E+01
9.68E+01
9.96E+01
9.06E+01
9.32E+01
9.40E+01
9.54E+01
9.89E+01
9.91E+01
10
1.01E+02
9.03E+01
9.92E+01
9.49E+01
9.69E+01
9.91E+01
9.07E+01
9.32E+01
9.39E+01
9.50E+01
9.90E+01
9.91E+01
20
1.01E+02
9.03E+01
9.91E+01
9.49E+01
9.68E+01
9.89E+01
9.07E+01
9.31E+01
9.39E+01
9.52E+01
9.89E+01
9.91E+01
30
1.01E+02
9.04E+01
9.89E+01
9.47E+01
9.70E+01
9.90E+01
9.08E+01
9.31E+01
9.39E+01
9.51E+01
9.89E+01
9.91E+01
40
1.01E+02
9.04E+01
9.90E+01
9.46E+01
9.70E+01
9.90E+01
9.09E+01
9.31E+01
9.39E+01
9.51E+01
9.88E+01
9.91E+01
50
1.01E+02
9.05E+01
9.89E+01
9.46E+01
9.69E+01
9.88E+01
9.10E+01
9.31E+01
9.40E+01
9.51E+01
9.88E+01
9.91E+01
60
1.01E+02
9.05E+01
9.89E+01
9.43E+01
9.69E+01
9.88E+01
9.10E+01
9.31E+01
9.39E+01
9.52E+01
9.89E+01
9.91E+01
70
1.01E+02
9.07E+01
9.89E+01
9.42E+01
9.68E+01
9.88E+01
9.11E+01
9.30E+01
9.41E+01
9.51E+01
9.89E+01
9.91E+01
75
1.01E+02
9.06E+01
9.88E+01
9.43E+01
9.69E+01
9.87E+01
9.12E+01
9.30E+01
9.40E+01
9.50E+01
9.88E+01
9.92E+01
100
1.01E+02
9.06E+01
9.85E+01
9.39E+01
9.66E+01
9.85E+01
9.13E+01
9.30E+01
9.40E+01
9.50E+01
9.89E+01
9.90E+01
200
1.00E+02
9.13E+01
9.82E+01
9.39E+01
9.69E+01
9.81E+01
9.23E+01
9.32E+01
9.45E+01
9.58E+01
9.88E+01
9.90E+01
9.54E+01
3.61E+00
1.03E+02
8.80E+01
7.80E+01
PASS
9.54E+01
3.53E+00
1.03E+02
8.81E+01
7.70E+01
PASS
9.54E+01
3.51E+00
1.03E+02
8.81E+01
7.50E+01
PASS
9.54E+01
3.50E+00
1.03E+02
8.81E+01
7.50E+01
PASS
9.54E+01
3.51E+00
1.03E+02
8.81E+01
7.50E+01
PASS
9.54E+01
3.46E+00
1.03E+02
8.82E+01
6.50E+01
PASS
9.53E+01
3.46E+00
1.02E+02
8.82E+01
6.50E+01
PASS
9.53E+01
3.40E+00
1.02E+02
8.83E+01
6.50E+01
PASS
9.53E+01
3.40E+00
1.02E+02
8.83E+01
6.50E+01
PASS
9.52E+01
3.30E+00
1.02E+02
8.84E+01
6.50E+01
PASS
9.55E+01
2.93E+00
1.02E+02
8.94E+01
6.50E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
54
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
1.00E+02
Power Supply Rejection Ratio #3 (dB)
9.50E+01
9.00E+01
8.50E+01
8.00E+01
7.50E+01
7.00E+01
6.50E+01
6.00E+01
5.50E+01
5.00E+01
0
50
100
150
Total Dose (krad(Si))
Figure 5.25. Plot of Power Supply Rejection Ratio #3 (dB) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias and the black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
55
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.25. Raw data for Power Supply Rejection Ratio #3 (dB) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Power Supply Rejection Ratio #3 (dB)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
9.70E+01
9.05E+01
9.78E+01
9.47E+01
9.83E+01
9.71E+01
9.81E+01
9.21E+01
1.01E+02
9.91E+01
9.90E+01
1.05E+02
10
9.70E+01
9.06E+01
9.78E+01
9.49E+01
9.84E+01
9.64E+01
9.80E+01
9.20E+01
1.01E+02
9.89E+01
9.91E+01
1.05E+02
20
9.70E+01
9.07E+01
9.78E+01
9.49E+01
9.85E+01
9.64E+01
9.79E+01
9.20E+01
1.01E+02
9.88E+01
9.90E+01
1.05E+02
30
9.71E+01
9.07E+01
9.77E+01
9.47E+01
9.85E+01
9.63E+01
9.80E+01
9.20E+01
1.01E+02
9.89E+01
9.90E+01
1.05E+02
40
9.72E+01
9.08E+01
9.78E+01
9.45E+01
9.84E+01
9.64E+01
9.80E+01
9.21E+01
1.01E+02
9.89E+01
9.91E+01
1.05E+02
50
9.72E+01
9.08E+01
9.75E+01
9.45E+01
9.85E+01
9.66E+01
9.79E+01
9.21E+01
1.01E+02
9.88E+01
9.91E+01
1.05E+02
60
9.72E+01
9.08E+01
9.76E+01
9.43E+01
9.86E+01
9.66E+01
9.79E+01
9.22E+01
1.01E+02
9.89E+01
9.90E+01
1.05E+02
70
9.72E+01
9.10E+01
9.74E+01
9.43E+01
9.83E+01
9.65E+01
9.77E+01
9.22E+01
1.01E+02
9.89E+01
9.89E+01
1.05E+02
75
9.72E+01
9.10E+01
9.74E+01
9.44E+01
9.84E+01
9.67E+01
9.77E+01
9.22E+01
1.01E+02
9.86E+01
9.90E+01
1.05E+02
100
9.72E+01
9.10E+01
9.70E+01
9.40E+01
9.81E+01
9.66E+01
9.75E+01
9.23E+01
1.01E+02
9.84E+01
9.89E+01
1.05E+02
200
9.71E+01
9.19E+01
9.67E+01
9.40E+01
9.81E+01
9.70E+01
9.71E+01
9.29E+01
1.01E+02
9.90E+01
9.89E+01
1.05E+02
9.66E+01
3.28E+00
1.03E+02
8.98E+01
7.80E+01
PASS
9.66E+01
3.28E+00
1.03E+02
8.98E+01
7.70E+01
PASS
9.65E+01
3.20E+00
1.03E+02
8.99E+01
7.50E+01
PASS
9.65E+01
3.23E+00
1.03E+02
8.99E+01
7.50E+01
PASS
9.65E+01
3.19E+00
1.03E+02
8.99E+01
7.50E+01
PASS
9.65E+01
3.23E+00
1.03E+02
8.99E+01
6.50E+01
PASS
9.65E+01
3.18E+00
1.03E+02
8.99E+01
6.50E+01
PASS
9.64E+01
3.12E+00
1.03E+02
9.00E+01
6.50E+01
PASS
9.65E+01
3.09E+00
1.03E+02
9.01E+01
6.50E+01
PASS
9.63E+01
2.95E+00
1.02E+02
9.02E+01
6.50E+01
PASS
9.64E+01
2.73E+00
1.02E+02
9.08E+01
6.50E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
56
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
1.00E+02
Power Supply Rejection Ratio #4 (dB)
9.50E+01
9.00E+01
8.50E+01
8.00E+01
7.50E+01
7.00E+01
6.50E+01
6.00E+01
5.50E+01
5.00E+01
0
50
100
150
Total Dose (krad(Si))
Figure 5.26. Plot of Power Supply Rejection Ratio #4 (dB) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias and the black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
57
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.26. Raw data for Power Supply Rejection Ratio #4 (dB) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Power Supply Rejection Ratio #4 (dB)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
9.38E+01
9.72E+01
9.83E+01
9.69E+01
9.24E+01
9.82E+01
9.89E+01
9.37E+01
9.56E+01
9.72E+01
1.02E+02
9.77E+01
10
9.38E+01
9.72E+01
9.81E+01
9.68E+01
9.24E+01
9.84E+01
9.88E+01
9.39E+01
9.56E+01
9.69E+01
1.02E+02
9.78E+01
20
9.39E+01
9.73E+01
9.81E+01
9.70E+01
9.24E+01
9.85E+01
9.89E+01
9.39E+01
9.56E+01
9.69E+01
1.02E+02
9.78E+01
30
9.41E+01
9.73E+01
9.80E+01
9.69E+01
9.24E+01
9.86E+01
9.91E+01
9.39E+01
9.57E+01
9.69E+01
1.02E+02
9.78E+01
40
9.42E+01
9.74E+01
9.82E+01
9.71E+01
9.24E+01
9.85E+01
9.92E+01
9.39E+01
9.57E+01
9.70E+01
1.02E+02
9.77E+01
50
9.43E+01
9.74E+01
9.81E+01
9.71E+01
9.23E+01
9.87E+01
9.92E+01
9.39E+01
9.57E+01
9.69E+01
1.02E+02
9.77E+01
60
9.45E+01
9.76E+01
9.81E+01
9.71E+01
9.24E+01
9.87E+01
9.94E+01
9.40E+01
9.57E+01
9.70E+01
1.02E+02
9.76E+01
70
9.46E+01
9.76E+01
9.82E+01
9.72E+01
9.23E+01
9.84E+01
9.94E+01
9.40E+01
9.55E+01
9.72E+01
1.02E+02
9.77E+01
75
9.47E+01
9.76E+01
9.80E+01
9.73E+01
9.24E+01
9.83E+01
9.93E+01
9.39E+01
9.56E+01
9.69E+01
1.02E+02
9.77E+01
100
9.48E+01
9.76E+01
9.80E+01
9.73E+01
9.22E+01
9.83E+01
9.93E+01
9.40E+01
9.54E+01
9.70E+01
1.02E+02
9.77E+01
200
9.61E+01
9.77E+01
9.87E+01
9.77E+01
9.26E+01
9.78E+01
9.93E+01
9.41E+01
9.56E+01
9.73E+01
1.02E+02
9.78E+01
9.62E+01
2.24E+00
1.01E+02
9.16E+01
7.80E+01
PASS
9.62E+01
2.20E+00
1.01E+02
9.16E+01
7.70E+01
PASS
9.62E+01
2.22E+00
1.01E+02
9.17E+01
7.50E+01
PASS
9.63E+01
2.22E+00
1.01E+02
9.17E+01
7.50E+01
PASS
9.64E+01
2.23E+00
1.01E+02
9.17E+01
7.50E+01
PASS
9.64E+01
2.26E+00
1.01E+02
9.17E+01
6.50E+01
PASS
9.64E+01
2.24E+00
1.01E+02
9.18E+01
6.50E+01
PASS
9.64E+01
2.24E+00
1.01E+02
9.18E+01
6.50E+01
PASS
9.64E+01
2.19E+00
1.01E+02
9.19E+01
6.50E+01
PASS
9.64E+01
2.23E+00
1.01E+02
9.18E+01
6.50E+01
PASS
9.67E+01
2.10E+00
1.01E+02
9.24E+01
6.50E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
58
RLAT Report
10-326 100808 R1.0
Large Signal Voltage Gain @+/-5V RL=500 #1 (V/mV)
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
3.50E+00
3.00E+00
2.50E+00
2.00E+00
1.50E+00
1.00E+00
5.00E-01
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.27. Plot of Large Signal Voltage Gain @+/-5V RL=500 #1 (V/mV) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias and the
black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
59
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.27. Raw data for Large Signal Voltage Gain @+/-5V RL=500 #1 (V/mV) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Large Signal Voltage Gain @+/-5V RL=500 #1 (V/mV)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
3.10E+00
3.00E+00
2.90E+00
3.10E+00
3.10E+00
3.10E+00
3.10E+00
3.00E+00
3.00E+00
3.10E+00
3.20E+00
2.90E+00
10
3.10E+00
3.00E+00
2.90E+00
3.00E+00
3.10E+00
3.00E+00
3.10E+00
3.00E+00
3.00E+00
3.10E+00
3.20E+00
2.90E+00
20
3.00E+00
2.90E+00
2.90E+00
3.00E+00
3.00E+00
3.00E+00
3.00E+00
2.90E+00
2.90E+00
3.00E+00
3.10E+00
2.90E+00
30
3.00E+00
2.90E+00
2.80E+00
2.90E+00
3.00E+00
2.90E+00
3.00E+00
2.90E+00
2.90E+00
3.00E+00
3.20E+00
2.90E+00
40
3.00E+00
2.80E+00
2.80E+00
2.90E+00
2.90E+00
2.90E+00
2.90E+00
2.90E+00
2.80E+00
2.90E+00
3.20E+00
2.90E+00
50
2.90E+00
2.80E+00
2.70E+00
2.80E+00
2.90E+00
2.80E+00
2.90E+00
2.80E+00
2.80E+00
2.90E+00
3.20E+00
2.90E+00
60
2.90E+00
2.70E+00
2.70E+00
2.80E+00
2.80E+00
2.80E+00
2.80E+00
2.80E+00
2.80E+00
2.80E+00
3.20E+00
2.90E+00
70
2.80E+00
2.70E+00
2.70E+00
2.70E+00
2.80E+00
2.80E+00
2.80E+00
2.70E+00
2.70E+00
2.80E+00
3.20E+00
2.90E+00
75
2.80E+00
2.70E+00
2.70E+00
2.70E+00
2.80E+00
2.70E+00
2.80E+00
2.70E+00
2.70E+00
2.80E+00
3.20E+00
2.90E+00
100
2.70E+00
2.60E+00
2.60E+00
2.60E+00
2.70E+00
2.60E+00
2.70E+00
2.60E+00
2.60E+00
2.70E+00
3.20E+00
2.90E+00
200
2.40E+00
2.20E+00
2.20E+00
2.20E+00
2.30E+00
2.30E+00
2.30E+00
2.30E+00
2.30E+00
2.30E+00
3.20E+00
2.90E+00
3.05E+00
7.07E-02
3.20E+00
2.90E+00
1.50E+00
PASS
3.03E+00
6.75E-02
3.17E+00
2.89E+00
1.40E+00
PASS
2.96E+00
5.16E-02
3.07E+00
2.85E+00
1.30E+00
PASS
2.93E+00
6.75E-02
3.07E+00
2.79E+00
1.30E+00
PASS
2.88E+00
6.32E-02
3.01E+00
2.75E+00
1.30E+00
PASS
2.83E+00
6.75E-02
2.97E+00
2.69E+00
1.00E+00
PASS
2.79E+00
5.68E-02
2.91E+00
2.67E+00
1.00E+00
PASS
2.75E+00
5.27E-02
2.86E+00
2.64E+00
1.00E+00
PASS
2.74E+00
5.16E-02
2.85E+00
2.63E+00
1.00E+00
PASS
2.64E+00
5.16E-02
2.75E+00
2.53E+00
8.00E-01
PASS
2.28E+00
6.32E-02
2.41E+00
2.15E+00
6.00E-01
PASS
An ISO 9001:2008 and DSCC Certified Company
60
RLAT Report
10-326 100808 R1.0
Large Signal Voltage Gain @+/-5V RL=500 #2 (V/mV)
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
3.50E+00
3.00E+00
2.50E+00
2.00E+00
1.50E+00
1.00E+00
5.00E-01
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.28. Plot of Large Signal Voltage Gain @+/-5V RL=500 #2 (V/mV) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias and the
black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
61
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.28. Raw data for Large Signal Voltage Gain @+/-5V RL=500 #2 (V/mV) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Large Signal Voltage Gain @+/-5V RL=500 #2 (V/mV)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
3.10E+00
2.90E+00
3.00E+00
3.20E+00
3.20E+00
3.00E+00
2.90E+00
2.90E+00
3.00E+00
2.90E+00
3.10E+00
3.10E+00
10
3.10E+00
2.90E+00
3.00E+00
3.10E+00
3.20E+00
2.90E+00
2.90E+00
2.80E+00
2.90E+00
2.90E+00
3.10E+00
3.10E+00
20
3.00E+00
2.90E+00
2.90E+00
3.10E+00
3.10E+00
2.90E+00
2.80E+00
2.80E+00
2.90E+00
2.90E+00
3.10E+00
3.10E+00
30
3.00E+00
2.80E+00
2.90E+00
3.00E+00
3.10E+00
2.90E+00
2.80E+00
2.80E+00
2.80E+00
2.80E+00
3.10E+00
3.10E+00
40
2.90E+00
2.80E+00
2.80E+00
3.00E+00
3.00E+00
2.80E+00
2.80E+00
2.70E+00
2.80E+00
2.80E+00
3.10E+00
3.10E+00
50
2.90E+00
2.70E+00
2.80E+00
2.90E+00
3.00E+00
2.80E+00
2.70E+00
2.70E+00
2.80E+00
2.70E+00
3.10E+00
3.10E+00
60
2.90E+00
2.70E+00
2.80E+00
2.90E+00
2.90E+00
2.80E+00
2.70E+00
2.60E+00
2.70E+00
2.70E+00
3.10E+00
3.10E+00
70
2.80E+00
2.70E+00
2.70E+00
2.80E+00
2.90E+00
2.70E+00
2.70E+00
2.60E+00
2.70E+00
2.70E+00
3.10E+00
3.10E+00
75
2.80E+00
2.60E+00
2.70E+00
2.80E+00
2.90E+00
2.70E+00
2.60E+00
2.60E+00
2.70E+00
2.60E+00
3.10E+00
3.10E+00
100
2.70E+00
2.50E+00
2.60E+00
2.70E+00
2.70E+00
2.60E+00
2.50E+00
2.50E+00
2.60E+00
2.50E+00
3.10E+00
3.10E+00
200
2.40E+00
2.20E+00
2.30E+00
2.30E+00
2.40E+00
2.30E+00
2.20E+00
2.20E+00
2.30E+00
2.20E+00
3.10E+00
3.10E+00
3.01E+00
1.20E-01
3.26E+00
2.76E+00
1.50E+00
PASS
2.97E+00
1.25E-01
3.23E+00
2.71E+00
1.40E+00
PASS
2.93E+00
1.06E-01
3.15E+00
2.71E+00
1.30E+00
PASS
2.89E+00
1.10E-01
3.12E+00
2.66E+00
1.30E+00
PASS
2.84E+00
9.66E-02
3.04E+00
2.64E+00
1.30E+00
PASS
2.80E+00
1.05E-01
3.02E+00
2.58E+00
1.00E+00
PASS
2.77E+00
1.06E-01
2.99E+00
2.55E+00
1.00E+00
PASS
2.73E+00
8.23E-02
2.90E+00
2.56E+00
1.00E+00
PASS
2.70E+00
1.05E-01
2.92E+00
2.48E+00
1.00E+00
PASS
2.59E+00
8.76E-02
2.77E+00
2.41E+00
8.00E-01
PASS
2.28E+00
7.89E-02
2.44E+00
2.12E+00
6.00E-01
PASS
An ISO 9001:2008 and DSCC Certified Company
62
RLAT Report
10-326 100808 R1.0
Large Signal Voltage Gain @+/-5V RL=500 #3 (V/mV)
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
3.50E+00
3.00E+00
2.50E+00
2.00E+00
1.50E+00
1.00E+00
5.00E-01
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.29. Plot of Large Signal Voltage Gain @+/-5V RL=500 #3 (V/mV) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias and the
black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
63
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.29. Raw data for Large Signal Voltage Gain @+/-5V RL=500 #3 (V/mV) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Large Signal Voltage Gain @+/-5V RL=500 #3 (V/mV)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
3.10E+00
2.90E+00
3.00E+00
3.30E+00
3.20E+00
3.10E+00
3.00E+00
2.80E+00
3.00E+00
3.00E+00
3.10E+00
3.10E+00
10
3.10E+00
2.90E+00
3.00E+00
3.20E+00
3.10E+00
3.00E+00
3.00E+00
2.80E+00
3.00E+00
3.00E+00
3.10E+00
3.10E+00
20
3.10E+00
2.90E+00
2.90E+00
3.20E+00
3.10E+00
3.00E+00
2.90E+00
2.70E+00
2.90E+00
2.90E+00
3.10E+00
3.10E+00
30
3.00E+00
2.80E+00
2.90E+00
3.10E+00
3.00E+00
2.90E+00
2.90E+00
2.70E+00
2.90E+00
2.90E+00
3.10E+00
3.10E+00
40
3.00E+00
2.80E+00
2.80E+00
3.00E+00
3.00E+00
2.90E+00
2.80E+00
2.70E+00
2.90E+00
2.80E+00
3.10E+00
3.10E+00
50
2.90E+00
2.70E+00
2.80E+00
3.00E+00
3.00E+00
2.80E+00
2.80E+00
2.70E+00
2.80E+00
2.80E+00
3.10E+00
3.10E+00
60
2.90E+00
2.70E+00
2.80E+00
2.90E+00
2.90E+00
2.80E+00
2.80E+00
2.60E+00
2.80E+00
2.70E+00
3.10E+00
3.10E+00
70
2.90E+00
2.70E+00
2.70E+00
2.90E+00
2.90E+00
2.80E+00
2.70E+00
2.60E+00
2.80E+00
2.70E+00
3.10E+00
3.10E+00
75
2.80E+00
2.60E+00
2.70E+00
2.90E+00
2.80E+00
2.70E+00
2.70E+00
2.60E+00
2.70E+00
2.70E+00
3.10E+00
3.10E+00
100
2.70E+00
2.50E+00
2.60E+00
2.70E+00
2.70E+00
2.60E+00
2.60E+00
2.50E+00
2.60E+00
2.60E+00
3.10E+00
3.10E+00
200
2.40E+00
2.20E+00
2.30E+00
2.30E+00
2.40E+00
2.30E+00
2.30E+00
2.20E+00
2.30E+00
2.20E+00
3.10E+00
3.10E+00
3.04E+00
1.43E-01
3.34E+00
2.74E+00
1.50E+00
PASS
3.01E+00
1.10E-01
3.24E+00
2.78E+00
1.40E+00
PASS
2.96E+00
1.43E-01
3.26E+00
2.66E+00
1.30E+00
PASS
2.91E+00
1.10E-01
3.14E+00
2.68E+00
1.30E+00
PASS
2.87E+00
1.06E-01
3.09E+00
2.65E+00
1.30E+00
PASS
2.83E+00
1.06E-01
3.05E+00
2.61E+00
1.00E+00
PASS
2.79E+00
9.94E-02
3.00E+00
2.58E+00
1.00E+00
PASS
2.77E+00
1.06E-01
2.99E+00
2.55E+00
1.00E+00
PASS
2.72E+00
9.19E-02
2.91E+00
2.53E+00
1.00E+00
PASS
2.61E+00
7.38E-02
2.76E+00
2.46E+00
8.00E-01
PASS
2.29E+00
7.38E-02
2.44E+00
2.14E+00
6.00E-01
PASS
An ISO 9001:2008 and DSCC Certified Company
64
RLAT Report
10-326 100808 R1.0
Large Signal Voltage Gain @+/-5V RL=500 #4 (V/mV)
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
3.50E+00
3.00E+00
2.50E+00
2.00E+00
1.50E+00
1.00E+00
5.00E-01
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.30. Plot of Large Signal Voltage Gain @+/-5V RL=500 #4 (V/mV) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias and the
black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
65
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.30. Raw data for Large Signal Voltage Gain @+/-5V RL=500 #4 (V/mV) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Large Signal Voltage Gain @+/-5V RL=500 #4 (V/mV)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
3.00E+00
3.00E+00
3.00E+00
3.00E+00
3.00E+00
3.00E+00
3.00E+00
3.00E+00
3.00E+00
3.00E+00
3.10E+00
3.00E+00
10
3.00E+00
2.90E+00
3.00E+00
2.90E+00
2.90E+00
3.00E+00
3.00E+00
3.00E+00
2.90E+00
3.00E+00
3.10E+00
3.00E+00
20
2.90E+00
2.90E+00
3.00E+00
2.90E+00
2.90E+00
3.00E+00
3.00E+00
2.90E+00
2.90E+00
3.00E+00
3.10E+00
3.00E+00
30
2.90E+00
2.90E+00
2.90E+00
2.80E+00
2.90E+00
2.90E+00
2.90E+00
2.90E+00
2.80E+00
2.90E+00
3.10E+00
3.00E+00
40
2.90E+00
2.80E+00
2.90E+00
2.80E+00
2.80E+00
2.90E+00
2.90E+00
2.80E+00
2.80E+00
2.90E+00
3.10E+00
3.00E+00
50
2.80E+00
2.80E+00
2.80E+00
2.70E+00
2.80E+00
2.80E+00
2.90E+00
2.80E+00
2.70E+00
2.80E+00
3.10E+00
3.00E+00
60
2.80E+00
2.70E+00
2.80E+00
2.70E+00
2.70E+00
2.80E+00
2.80E+00
2.70E+00
2.70E+00
2.80E+00
3.10E+00
3.00E+00
70
2.70E+00
2.70E+00
2.80E+00
2.70E+00
2.70E+00
2.80E+00
2.80E+00
2.70E+00
2.70E+00
2.70E+00
3.10E+00
3.00E+00
75
2.70E+00
2.70E+00
2.80E+00
2.60E+00
2.70E+00
2.70E+00
2.80E+00
2.70E+00
2.70E+00
2.70E+00
3.10E+00
3.00E+00
100
2.60E+00
2.60E+00
2.70E+00
2.50E+00
2.60E+00
2.60E+00
2.70E+00
2.60E+00
2.60E+00
2.60E+00
3.10E+00
3.00E+00
200
2.30E+00
2.30E+00
2.30E+00
2.20E+00
2.30E+00
2.30E+00
2.40E+00
2.30E+00
2.20E+00
2.30E+00
3.10E+00
3.00E+00
3.00E+00
0.00E+00
3.00E+00
3.00E+00
1.50E+00
PASS
2.96E+00
5.16E-02
3.07E+00
2.85E+00
1.40E+00
PASS
2.94E+00
5.16E-02
3.05E+00
2.83E+00
1.30E+00
PASS
2.88E+00
4.22E-02
2.97E+00
2.79E+00
1.30E+00
PASS
2.85E+00
5.27E-02
2.96E+00
2.74E+00
1.30E+00
PASS
2.79E+00
5.68E-02
2.91E+00
2.67E+00
1.00E+00
PASS
2.75E+00
5.27E-02
2.86E+00
2.64E+00
1.00E+00
PASS
2.73E+00
4.83E-02
2.83E+00
2.63E+00
1.00E+00
PASS
2.71E+00
5.68E-02
2.83E+00
2.59E+00
1.00E+00
PASS
2.61E+00
5.68E-02
2.73E+00
2.49E+00
8.00E-01
PASS
2.29E+00
5.68E-02
2.41E+00
2.17E+00
6.00E-01
PASS
An ISO 9001:2008 and DSCC Certified Company
66
RLAT Report
10-326 100808 R1.0
Large Signal Voltage Gain @+/-5V RL=100 #1 (V/mV)
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
2.50E+00
2.00E+00
1.50E+00
1.00E+00
5.00E-01
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.31. Plot of Large Signal Voltage Gain @+/-5V RL=100 #1 (V/mV) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias and the
black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
67
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.31. Raw data for Large Signal Voltage Gain @+/-5V RL=100 #1 (V/mV) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Large Signal Voltage Gain @+/-5V RL=100 #1 (V/mV)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
2.30E+00
2.30E+00
2.20E+00
2.30E+00
2.40E+00
2.30E+00
2.30E+00
2.30E+00
2.30E+00
2.30E+00
2.40E+00
2.20E+00
10
2.30E+00
2.20E+00
2.20E+00
2.30E+00
2.30E+00
2.20E+00
2.30E+00
2.20E+00
2.20E+00
2.30E+00
2.40E+00
2.20E+00
20
2.30E+00
2.20E+00
2.10E+00
2.20E+00
2.30E+00
2.20E+00
2.20E+00
2.20E+00
2.20E+00
2.20E+00
2.40E+00
2.20E+00
30
2.20E+00
2.10E+00
2.10E+00
2.20E+00
2.30E+00
2.20E+00
2.20E+00
2.10E+00
2.10E+00
2.20E+00
2.40E+00
2.20E+00
40
2.20E+00
2.10E+00
2.10E+00
2.10E+00
2.20E+00
2.10E+00
2.10E+00
2.10E+00
2.10E+00
2.20E+00
2.40E+00
2.20E+00
50
2.20E+00
2.10E+00
2.00E+00
2.10E+00
2.20E+00
2.10E+00
2.10E+00
2.10E+00
2.10E+00
2.10E+00
2.40E+00
2.20E+00
60
2.10E+00
2.00E+00
2.00E+00
2.10E+00
2.20E+00
2.10E+00
2.10E+00
2.00E+00
2.00E+00
2.10E+00
2.40E+00
2.20E+00
70
2.10E+00
2.00E+00
2.00E+00
2.00E+00
2.10E+00
2.00E+00
2.00E+00
2.00E+00
2.00E+00
2.00E+00
2.40E+00
2.20E+00
75
2.10E+00
2.00E+00
2.00E+00
2.00E+00
2.10E+00
2.00E+00
2.00E+00
2.00E+00
2.00E+00
2.00E+00
2.40E+00
2.20E+00
100
2.00E+00
1.90E+00
1.90E+00
1.90E+00
2.00E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
2.40E+00
2.20E+00
200
1.70E+00
1.60E+00
1.60E+00
1.60E+00
1.70E+00
1.60E+00
1.60E+00
1.60E+00
1.60E+00
1.60E+00
2.40E+00
2.20E+00
2.30E+00
4.71E-02
2.40E+00
2.20E+00
1.00E+00
PASS
2.25E+00
5.27E-02
2.36E+00
2.14E+00
9.00E-01
PASS
2.21E+00
5.68E-02
2.33E+00
2.09E+00
8.00E-01
PASS
2.17E+00
6.75E-02
2.31E+00
2.03E+00
8.00E-01
PASS
2.13E+00
4.83E-02
2.23E+00
2.03E+00
8.00E-01
PASS
2.11E+00
5.68E-02
2.23E+00
1.99E+00
6.00E-01
PASS
2.07E+00
6.75E-02
2.21E+00
1.93E+00
6.00E-01
PASS
2.02E+00
4.22E-02
2.11E+00
1.93E+00
6.00E-01
PASS
2.02E+00
4.22E-02
2.11E+00
1.93E+00
6.00E-01
PASS
1.92E+00
4.22E-02
2.01E+00
1.83E+00
5.00E-01
PASS
1.62E+00
4.22E-02
1.71E+00
1.53E+00
4.00E-01
PASS
An ISO 9001:2008 and DSCC Certified Company
68
RLAT Report
10-326 100808 R1.0
Large Signal Voltage Gain @+/-5V RL=100 #2 (V/mV)
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
2.50E+00
2.00E+00
1.50E+00
1.00E+00
5.00E-01
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.32. Plot of Large Signal Voltage Gain @+/-5V RL=100 #2 (V/mV) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias and the
black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
69
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.32. Raw data for Large Signal Voltage Gain @+/-5V RL=100 #2 (V/mV) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Large Signal Voltage Gain @+/-5V RL=100 #2 (V/mV)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
2.30E+00
2.20E+00
2.30E+00
2.40E+00
2.40E+00
2.30E+00
2.20E+00
2.20E+00
2.20E+00
2.30E+00
2.30E+00
2.30E+00
10
2.30E+00
2.10E+00
2.20E+00
2.40E+00
2.40E+00
2.20E+00
2.20E+00
2.10E+00
2.20E+00
2.20E+00
2.30E+00
2.30E+00
20
2.20E+00
2.10E+00
2.20E+00
2.40E+00
2.30E+00
2.20E+00
2.10E+00
2.10E+00
2.20E+00
2.20E+00
2.30E+00
2.30E+00
30
2.20E+00
2.10E+00
2.20E+00
2.30E+00
2.30E+00
2.10E+00
2.10E+00
2.10E+00
2.10E+00
2.20E+00
2.30E+00
2.30E+00
40
2.10E+00
2.10E+00
2.10E+00
2.30E+00
2.30E+00
2.10E+00
2.00E+00
2.00E+00
2.10E+00
2.10E+00
2.30E+00
2.30E+00
50
2.10E+00
2.00E+00
2.10E+00
2.20E+00
2.20E+00
2.10E+00
2.00E+00
2.00E+00
2.10E+00
2.10E+00
2.30E+00
2.30E+00
60
2.10E+00
2.00E+00
2.10E+00
2.20E+00
2.20E+00
2.00E+00
2.00E+00
2.00E+00
2.00E+00
2.00E+00
2.30E+00
2.30E+00
70
2.00E+00
1.90E+00
2.00E+00
2.10E+00
2.10E+00
2.00E+00
1.90E+00
1.90E+00
2.00E+00
2.00E+00
2.30E+00
2.30E+00
75
2.00E+00
1.90E+00
2.00E+00
2.10E+00
2.10E+00
2.00E+00
1.90E+00
1.90E+00
2.00E+00
2.00E+00
2.30E+00
2.30E+00
100
1.90E+00
1.80E+00
1.90E+00
2.00E+00
2.00E+00
1.90E+00
1.90E+00
1.80E+00
1.90E+00
1.90E+00
2.30E+00
2.30E+00
200
1.60E+00
1.60E+00
1.60E+00
1.70E+00
1.70E+00
1.60E+00
1.60E+00
1.50E+00
1.60E+00
1.60E+00
2.30E+00
2.30E+00
2.28E+00
7.89E-02
2.44E+00
2.12E+00
1.00E+00
PASS
2.23E+00
1.06E-01
2.45E+00
2.01E+00
9.00E-01
PASS
2.20E+00
9.43E-02
2.39E+00
2.01E+00
8.00E-01
PASS
2.17E+00
8.23E-02
2.34E+00
2.00E+00
8.00E-01
PASS
2.12E+00
1.03E-01
2.33E+00
1.91E+00
8.00E-01
PASS
2.09E+00
7.38E-02
2.24E+00
1.94E+00
6.00E-01
PASS
2.06E+00
8.43E-02
2.23E+00
1.89E+00
6.00E-01
PASS
1.99E+00
7.38E-02
2.14E+00
1.84E+00
6.00E-01
PASS
1.99E+00
7.38E-02
2.14E+00
1.84E+00
6.00E-01
PASS
1.90E+00
6.67E-02
2.04E+00
1.76E+00
5.00E-01
PASS
1.61E+00
5.68E-02
1.73E+00
1.49E+00
4.00E-01
PASS
An ISO 9001:2008 and DSCC Certified Company
70
RLAT Report
10-326 100808 R1.0
Large Signal Voltage Gain @+/-5V RL=100 #3 (V/mV)
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
2.50E+00
2.00E+00
1.50E+00
1.00E+00
5.00E-01
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.33. Plot of Large Signal Voltage Gain @+/-5V RL=100 #3 (V/mV) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias and the
black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
71
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.33. Raw data for Large Signal Voltage Gain @+/-5V RL=100 #3 (V/mV) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Large Signal Voltage Gain @+/-5V RL=100 #3 (V/mV)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
2.30E+00
2.20E+00
2.30E+00
2.50E+00
2.40E+00
2.30E+00
2.30E+00
2.20E+00
2.30E+00
2.30E+00
2.30E+00
2.30E+00
10
2.30E+00
2.20E+00
2.20E+00
2.50E+00
2.40E+00
2.30E+00
2.20E+00
2.10E+00
2.20E+00
2.30E+00
2.30E+00
2.30E+00
20
2.30E+00
2.10E+00
2.20E+00
2.40E+00
2.30E+00
2.20E+00
2.20E+00
2.10E+00
2.20E+00
2.20E+00
2.30E+00
2.30E+00
30
2.20E+00
2.10E+00
2.20E+00
2.40E+00
2.30E+00
2.20E+00
2.10E+00
2.00E+00
2.20E+00
2.20E+00
2.30E+00
2.30E+00
40
2.20E+00
2.10E+00
2.10E+00
2.30E+00
2.30E+00
2.20E+00
2.10E+00
2.00E+00
2.10E+00
2.20E+00
2.30E+00
2.30E+00
50
2.10E+00
2.00E+00
2.10E+00
2.30E+00
2.20E+00
2.10E+00
2.10E+00
2.00E+00
2.10E+00
2.10E+00
2.30E+00
2.30E+00
60
2.10E+00
2.00E+00
2.10E+00
2.20E+00
2.20E+00
2.10E+00
2.00E+00
2.00E+00
2.10E+00
2.10E+00
2.30E+00
2.30E+00
70
2.10E+00
2.00E+00
2.00E+00
2.20E+00
2.10E+00
2.00E+00
2.00E+00
1.90E+00
2.10E+00
2.00E+00
2.30E+00
2.30E+00
75
2.10E+00
1.90E+00
2.00E+00
2.20E+00
2.10E+00
2.00E+00
2.00E+00
1.90E+00
2.00E+00
2.00E+00
2.30E+00
2.30E+00
100
2.00E+00
1.90E+00
1.90E+00
2.10E+00
2.00E+00
1.90E+00
1.90E+00
1.80E+00
1.90E+00
1.90E+00
2.30E+00
2.30E+00
200
1.70E+00
1.60E+00
1.60E+00
1.70E+00
1.70E+00
1.60E+00
1.60E+00
1.60E+00
1.60E+00
1.60E+00
2.30E+00
2.30E+00
2.31E+00
8.76E-02
2.49E+00
2.13E+00
1.00E+00
PASS
2.27E+00
1.16E-01
2.51E+00
2.03E+00
9.00E-01
PASS
2.22E+00
9.19E-02
2.41E+00
2.03E+00
8.00E-01
PASS
2.19E+00
1.10E-01
2.42E+00
1.96E+00
8.00E-01
PASS
2.16E+00
9.66E-02
2.36E+00
1.96E+00
8.00E-01
PASS
2.11E+00
8.76E-02
2.29E+00
1.93E+00
6.00E-01
PASS
2.09E+00
7.38E-02
2.24E+00
1.94E+00
6.00E-01
PASS
2.04E+00
8.43E-02
2.21E+00
1.87E+00
6.00E-01
PASS
2.02E+00
9.19E-02
2.21E+00
1.83E+00
6.00E-01
PASS
1.93E+00
8.23E-02
2.10E+00
1.76E+00
5.00E-01
PASS
1.63E+00
4.83E-02
1.73E+00
1.53E+00
4.00E-01
PASS
An ISO 9001:2008 and DSCC Certified Company
72
RLAT Report
10-326 100808 R1.0
Large Signal Voltage Gain @+/-5V RL=100 #4 (V/mV)
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
2.50E+00
2.00E+00
1.50E+00
1.00E+00
5.00E-01
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.34. Plot of Large Signal Voltage Gain @+/-5V RL=100 #4 (V/mV) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias and the
black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
73
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.34. Raw data for Large Signal Voltage Gain @+/-5V RL=100 #4 (V/mV) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Large Signal Voltage Gain @+/-5V RL=100 #4 (V/mV)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
2.30E+00
2.20E+00
2.30E+00
2.20E+00
2.30E+00
2.30E+00
2.30E+00
2.30E+00
2.20E+00
2.30E+00
2.30E+00
2.20E+00
10
2.20E+00
2.20E+00
2.30E+00
2.20E+00
2.20E+00
2.20E+00
2.20E+00
2.20E+00
2.20E+00
2.20E+00
2.30E+00
2.20E+00
20
2.20E+00
2.20E+00
2.20E+00
2.10E+00
2.20E+00
2.20E+00
2.20E+00
2.20E+00
2.10E+00
2.20E+00
2.30E+00
2.20E+00
30
2.20E+00
2.10E+00
2.20E+00
2.10E+00
2.20E+00
2.20E+00
2.20E+00
2.10E+00
2.10E+00
2.20E+00
2.30E+00
2.20E+00
40
2.10E+00
2.10E+00
2.20E+00
2.10E+00
2.10E+00
2.10E+00
2.10E+00
2.10E+00
2.10E+00
2.10E+00
2.30E+00
2.20E+00
50
2.10E+00
2.10E+00
2.20E+00
2.00E+00
2.10E+00
2.10E+00
2.10E+00
2.10E+00
2.00E+00
2.10E+00
2.30E+00
2.20E+00
60
2.10E+00
2.00E+00
2.10E+00
2.00E+00
2.10E+00
2.10E+00
2.10E+00
2.00E+00
2.00E+00
2.00E+00
2.30E+00
2.20E+00
70
2.00E+00
2.00E+00
2.10E+00
1.90E+00
2.00E+00
2.00E+00
2.00E+00
2.00E+00
2.00E+00
2.00E+00
2.30E+00
2.20E+00
75
2.00E+00
2.00E+00
2.10E+00
1.90E+00
2.00E+00
2.00E+00
2.00E+00
2.00E+00
2.00E+00
2.00E+00
2.30E+00
2.20E+00
100
1.90E+00
1.90E+00
2.00E+00
1.80E+00
1.90E+00
1.90E+00
2.00E+00
1.90E+00
1.90E+00
1.90E+00
2.30E+00
2.20E+00
200
1.60E+00
1.60E+00
1.70E+00
1.50E+00
1.60E+00
1.60E+00
1.70E+00
1.60E+00
1.60E+00
1.60E+00
2.30E+00
2.20E+00
2.27E+00
4.83E-02
2.37E+00
2.17E+00
1.00E+00
PASS
2.21E+00
3.16E-02
2.28E+00
2.14E+00
9.00E-01
PASS
2.18E+00
4.22E-02
2.27E+00
2.09E+00
8.00E-01
PASS
2.16E+00
5.16E-02
2.27E+00
2.05E+00
8.00E-01
PASS
2.11E+00
3.16E-02
2.18E+00
2.04E+00
8.00E-01
PASS
2.09E+00
5.68E-02
2.21E+00
1.97E+00
6.00E-01
PASS
2.05E+00
5.27E-02
2.16E+00
1.94E+00
6.00E-01
PASS
2.00E+00
4.71E-02
2.10E+00
1.90E+00
6.00E-01
PASS
2.00E+00
4.71E-02
2.10E+00
1.90E+00
6.00E-01
PASS
1.91E+00
5.68E-02
2.03E+00
1.79E+00
5.00E-01
PASS
1.61E+00
5.68E-02
1.73E+00
1.49E+00
4.00E-01
PASS
An ISO 9001:2008 and DSCC Certified Company
74
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Channel Separation @+/-5V 1:2 (dB)
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.35. Plot of Channel Separation @+/-5V 1:2 (dB) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias and the black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
75
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.35. Raw data for Channel Separation @+/-5V 1:2 (dB) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Channel Separation @+/-5V 1:2 (dB)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
1.32E+02
1.22E+02
1.13E+02
1.29E+02
1.24E+02
1.30E+02
1.32E+02
1.16E+02
1.08E+02
1.12E+02
1.16E+02
1.14E+02
10
1.22E+02
1.24E+02
1.20E+02
1.16E+02
1.16E+02
1.13E+02
1.15E+02
1.10E+02
1.29E+02
1.28E+02
1.20E+02
1.23E+02
20
1.12E+02
1.14E+02
1.15E+02
1.20E+02
1.12E+02
1.14E+02
1.19E+02
1.13E+02
1.34E+02
1.14E+02
1.27E+02
1.13E+02
30
1.24E+02
1.13E+02
1.13E+02
1.06E+02
1.21E+02
1.22E+02
1.21E+02
1.24E+02
1.06E+02
1.12E+02
1.09E+02
1.14E+02
40
1.25E+02
1.16E+02
1.06E+02
1.31E+02
1.13E+02
1.13E+02
1.27E+02
1.32E+02
1.13E+02
1.31E+02
1.19E+02
1.05E+02
50
1.21E+02
1.15E+02
1.15E+02
1.14E+02
1.18E+02
1.13E+02
1.14E+02
1.36E+02
1.19E+02
1.13E+02
1.31E+02
1.34E+02
60
1.11E+02
1.13E+02
1.09E+02
1.18E+02
1.39E+02
1.15E+02
1.06E+02
1.12E+02
1.11E+02
1.25E+02
1.15E+02
1.10E+02
70
1.03E+02
1.13E+02
1.10E+02
1.10E+02
1.21E+02
1.15E+02
1.14E+02
1.35E+02
1.07E+02
1.09E+02
1.18E+02
1.10E+02
75
1.09E+02
1.21E+02
1.13E+02
1.11E+02
1.14E+02
1.12E+02
1.17E+02
1.27E+02
1.32E+02
1.11E+02
1.11E+02
1.20E+02
100
1.22E+02
1.16E+02
1.22E+02
1.30E+02
1.40E+02
1.26E+02
1.16E+02
1.23E+02
1.13E+02
1.16E+02
1.14E+02
1.27E+02
200
1.20E+02
1.15E+02
1.20E+02
1.26E+02
1.41E+02
1.38E+02
1.11E+02
1.10E+02
1.23E+02
1.19E+02
1.13E+02
1.11E+02
1.22E+02
8.98E+00
1.40E+02
1.03E+02
8.20E+01
PASS
1.19E+02
6.61E+00
1.33E+02
1.06E+02
8.20E+01
PASS
1.17E+02
6.71E+00
1.31E+02
1.03E+02
8.20E+01
PASS
1.16E+02
7.09E+00
1.31E+02
1.02E+02
8.20E+01
PASS
1.21E+02
9.63E+00
1.41E+02
1.01E+02
8.20E+01
PASS
1.18E+02
6.80E+00
1.32E+02
1.04E+02
8.20E+01
PASS
1.16E+02
9.63E+00
1.36E+02
9.59E+01
8.20E+01
PASS
1.14E+02
8.72E+00
1.32E+02
9.57E+01
8.20E+01
PASS
1.17E+02
7.66E+00
1.33E+02
1.01E+02
8.20E+01
PASS
1.22E+02
7.95E+00
1.39E+02
1.06E+02
8.20E+01
PASS
1.22E+02
1.04E+01
1.44E+02
1.01E+02
8.20E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
76
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Channel Separation @+/-5V 1:3 (dB)
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.36. Plot of Channel Separation @+/-5V 1:3 (dB) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias and the black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
77
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.36. Raw data for Channel Separation @+/-5V 1:3 (dB) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Channel Separation @+/-5V 1:3 (dB)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
1.18E+02
1.29E+02
1.18E+02
1.09E+02
1.15E+02
1.31E+02
1.08E+02
1.13E+02
1.14E+02
1.12E+02
1.18E+02
1.11E+02
10
1.07E+02
1.23E+02
1.11E+02
1.05E+02
1.09E+02
1.12E+02
1.13E+02
1.14E+02
1.17E+02
1.09E+02
1.28E+02
1.27E+02
20
1.11E+02
1.35E+02
1.23E+02
1.07E+02
1.14E+02
1.20E+02
1.29E+02
1.17E+02
1.36E+02
1.07E+02
1.13E+02
1.32E+02
30
1.19E+02
1.14E+02
1.06E+02
1.14E+02
1.18E+02
1.19E+02
1.17E+02
1.13E+02
1.09E+02
1.14E+02
1.15E+02
1.13E+02
40
1.27E+02
1.39E+02
1.37E+02
1.06E+02
1.22E+02
1.24E+02
1.26E+02
1.30E+02
1.09E+02
1.22E+02
1.15E+02
1.18E+02
50
1.14E+02
1.10E+02
1.11E+02
1.15E+02
1.04E+02
1.35E+02
1.35E+02
1.28E+02
1.20E+02
1.16E+02
1.11E+02
1.14E+02
60
1.37E+02
1.15E+02
1.36E+02
1.22E+02
1.23E+02
1.11E+02
1.20E+02
1.19E+02
1.10E+02
1.15E+02
1.16E+02
1.20E+02
70
1.17E+02
1.30E+02
1.31E+02
1.38E+02
1.16E+02
1.20E+02
1.08E+02
1.33E+02
1.18E+02
1.08E+02
1.17E+02
1.22E+02
75
1.05E+02
1.20E+02
1.06E+02
1.41E+02
1.12E+02
1.15E+02
1.09E+02
1.23E+02
1.19E+02
1.20E+02
1.44E+02
1.77E+02
100
1.11E+02
1.07E+02
1.11E+02
1.08E+02
1.08E+02
1.10E+02
1.18E+02
1.14E+02
1.28E+02
1.08E+02
1.13E+02
1.22E+02
200
1.18E+02
1.14E+02
1.11E+02
1.18E+02
1.23E+02
1.16E+02
1.21E+02
1.15E+02
1.15E+02
1.31E+02
1.16E+02
1.29E+02
1.17E+02
7.74E+00
1.33E+02
1.01E+02
8.20E+01
PASS
1.12E+02
5.38E+00
1.23E+02
1.01E+02
8.20E+01
PASS
1.20E+02
1.08E+01
1.42E+02
9.76E+01
8.20E+01
PASS
1.14E+02
4.19E+00
1.23E+02
1.06E+02
8.20E+01
PASS
1.24E+02
1.07E+01
1.46E+02
1.02E+02
8.20E+01
PASS
1.19E+02
1.06E+01
1.41E+02
9.69E+01
8.20E+01
PASS
1.21E+02
9.26E+00
1.40E+02
1.02E+02
8.20E+01
PASS
1.22E+02
1.06E+01
1.44E+02
1.00E+02
8.20E+01
PASS
1.17E+02
1.05E+01
1.39E+02
9.53E+01
8.20E+01
PASS
1.12E+02
6.41E+00
1.25E+02
9.90E+01
8.20E+01
PASS
1.18E+02
5.65E+00
1.30E+02
1.07E+02
8.20E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
78
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Channel Separation @+/-5V 1:4 (dB)
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.37. Plot of Channel Separation @+/-5V 1:4 (dB) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias and the black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
79
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.37. Raw data for Channel Separation @+/-5V 1:4 (dB) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Channel Separation @+/-5V 1:4 (dB)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
1.14E+02
1.01E+02
1.03E+02
1.07E+02
1.06E+02
1.02E+02
1.04E+02
1.14E+02
1.07E+02
1.10E+02
1.03E+02
1.02E+02
10
1.12E+02
1.07E+02
1.02E+02
1.06E+02
1.09E+02
1.07E+02
1.04E+02
1.09E+02
1.10E+02
1.07E+02
1.03E+02
1.05E+02
20
1.04E+02
1.07E+02
1.07E+02
1.12E+02
1.03E+02
1.04E+02
1.16E+02
1.13E+02
1.02E+02
1.06E+02
1.05E+02
1.01E+02
30
1.03E+02
1.06E+02
1.09E+02
1.07E+02
1.03E+02
1.01E+02
1.08E+02
1.11E+02
1.12E+02
1.04E+02
1.11E+02
1.06E+02
40
1.08E+02
1.11E+02
1.06E+02
1.16E+02
1.04E+02
1.01E+02
1.04E+02
1.10E+02
1.06E+02
1.09E+02
1.08E+02
1.01E+02
50
1.08E+02
1.00E+02
1.01E+02
1.28E+02
1.05E+02
1.00E+02
1.03E+02
1.25E+02
1.12E+02
1.03E+02
1.07E+02
1.04E+02
60
1.57E+02
1.07E+02
1.06E+02
1.04E+02
1.06E+02
1.16E+02
1.10E+02
1.06E+02
1.14E+02
1.10E+02
1.12E+02
1.06E+02
70
1.05E+02
1.06E+02
1.01E+02
1.07E+02
1.08E+02
1.10E+02
1.18E+02
1.03E+02
1.14E+02
1.09E+02
1.03E+02
1.07E+02
75
1.14E+02
1.11E+02
1.09E+02
1.05E+02
1.02E+02
1.07E+02
1.05E+02
1.05E+02
1.10E+02
1.11E+02
1.05E+02
1.12E+02
100
1.07E+02
1.03E+02
1.06E+02
1.22E+02
1.08E+02
1.05E+02
1.03E+02
1.11E+02
1.02E+02
1.07E+02
1.03E+02
1.02E+02
200
1.15E+02
1.06E+02
1.00E+02
1.09E+02
1.05E+02
1.03E+02
1.35E+02
1.14E+02
1.04E+02
1.24E+02
1.02E+02
1.02E+02
1.07E+02
4.60E+00
1.16E+02
9.72E+01
8.20E+01
PASS
1.07E+02
2.88E+00
1.13E+02
1.01E+02
8.20E+01
PASS
1.08E+02
4.79E+00
1.17E+02
9.77E+01
8.20E+01
PASS
1.06E+02
3.52E+00
1.14E+02
9.91E+01
8.20E+01
PASS
1.07E+02
4.35E+00
1.16E+02
9.85E+01
8.20E+01
PASS
1.08E+02
1.01E+01
1.29E+02
8.75E+01
8.20E+01
PASS
1.14E+02
1.59E+01
1.46E+02
8.06E+01
8.20E+01
PASS
1.08E+02
5.08E+00
1.19E+02
9.77E+01
8.20E+01
PASS
1.08E+02
3.58E+00
1.15E+02
1.00E+02
8.20E+01
PASS
1.07E+02
5.78E+00
1.19E+02
9.54E+01
8.20E+01
PASS
1.12E+02
1.08E+01
1.34E+02
8.91E+01
8.20E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
80
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Channel Separation @+/-5V 2:1 (dB)
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.38. Plot of Channel Separation @+/-5V 2:1 (dB) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias and the black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
81
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.38. Raw data for Channel Separation @+/-5V 2:1 (dB) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Channel Separation @+/-5V 2:1 (dB)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
1.27E+02
1.26E+02
1.15E+02
1.20E+02
1.25E+02
1.11E+02
1.25E+02
1.13E+02
1.22E+02
1.22E+02
1.23E+02
1.16E+02
10
1.18E+02
1.27E+02
1.19E+02
1.23E+02
1.30E+02
1.11E+02
1.06E+02
1.07E+02
1.52E+02
1.17E+02
1.07E+02
1.44E+02
20
1.07E+02
1.10E+02
1.03E+02
1.05E+02
1.13E+02
1.17E+02
1.41E+02
1.13E+02
1.19E+02
1.11E+02
1.11E+02
1.10E+02
30
1.20E+02
1.13E+02
1.16E+02
1.35E+02
1.05E+02
1.09E+02
1.12E+02
1.10E+02
1.08E+02
1.09E+02
1.14E+02
1.21E+02
40
1.17E+02
1.11E+02
1.07E+02
1.15E+02
1.19E+02
1.06E+02
1.20E+02
1.31E+02
1.18E+02
1.14E+02
1.24E+02
1.08E+02
50
1.07E+02
1.20E+02
1.20E+02
1.22E+02
1.12E+02
1.31E+02
1.07E+02
1.13E+02
1.27E+02
1.44E+02
1.08E+02
1.05E+02
60
1.19E+02
1.16E+02
1.20E+02
1.09E+02
1.25E+02
1.45E+02
1.08E+02
1.08E+02
1.30E+02
1.26E+02
1.05E+02
1.12E+02
70
1.04E+02
1.49E+02
1.34E+02
1.21E+02
1.18E+02
1.14E+02
1.49E+02
1.13E+02
1.08E+02
1.10E+02
1.14E+02
1.17E+02
75
1.17E+02
1.11E+02
1.10E+02
1.19E+02
1.19E+02
1.08E+02
1.17E+02
1.16E+02
1.54E+02
1.31E+02
1.08E+02
1.31E+02
100
1.51E+02
1.19E+02
1.13E+02
1.14E+02
1.10E+02
1.05E+02
1.25E+02
1.20E+02
1.01E+02
1.16E+02
1.11E+02
1.22E+02
200
1.10E+02
1.32E+02
1.09E+02
1.19E+02
1.11E+02
1.20E+02
1.16E+02
1.13E+02
1.22E+02
1.10E+02
1.08E+02
1.11E+02
1.21E+02
5.57E+00
1.32E+02
1.09E+02
8.20E+01
PASS
1.21E+02
1.34E+01
1.48E+02
9.32E+01
8.20E+01
PASS
1.14E+02
1.06E+01
1.36E+02
9.19E+01
8.20E+01
PASS
1.14E+02
8.41E+00
1.31E+02
9.63E+01
8.20E+01
PASS
1.16E+02
7.24E+00
1.31E+02
1.01E+02
8.20E+01
PASS
1.20E+02
1.16E+01
1.44E+02
9.62E+01
8.20E+01
PASS
1.20E+02
1.17E+01
1.45E+02
9.62E+01
8.20E+01
PASS
1.22E+02
1.65E+01
1.56E+02
8.79E+01
8.20E+01
PASS
1.20E+02
1.34E+01
1.48E+02
9.26E+01
8.20E+01
PASS
1.17E+02
1.36E+01
1.46E+02
8.92E+01
8.20E+01
PASS
1.16E+02
7.22E+00
1.31E+02
1.01E+02
8.20E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
82
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Channel Separation @+/-5V 2:3 (dB)
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.39. Plot of Channel Separation @+/-5V 2:3 (dB) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias and the black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
83
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.39. Raw data for Channel Separation @+/-5V 2:3 (dB) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Channel Separation @+/-5V 2:3 (dB)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
1.01E+02
1.16E+02
1.07E+02
1.07E+02
1.16E+02
1.03E+02
1.01E+02
1.05E+02
1.05E+02
1.04E+02
1.16E+02
1.07E+02
10
1.08E+02
1.03E+02
1.07E+02
1.03E+02
1.05E+02
1.06E+02
1.06E+02
1.14E+02
1.01E+02
1.02E+02
1.02E+02
1.02E+02
20
1.02E+02
1.11E+02
1.05E+02
1.04E+02
1.07E+02
1.10E+02
1.03E+02
1.04E+02
1.02E+02
1.03E+02
1.06E+02
1.07E+02
30
1.06E+02
1.33E+02
1.05E+02
1.02E+02
1.09E+02
1.05E+02
1.03E+02
1.16E+02
1.03E+02
1.04E+02
1.03E+02
1.06E+02
40
1.06E+02
1.23E+02
1.08E+02
1.04E+02
1.10E+02
1.06E+02
1.06E+02
1.17E+02
1.04E+02
1.07E+02
1.04E+02
1.01E+02
50
1.11E+02
1.07E+02
1.11E+02
1.15E+02
1.07E+02
1.05E+02
1.08E+02
1.07E+02
1.16E+02
1.06E+02
1.16E+02
1.14E+02
60
1.10E+02
1.05E+02
1.02E+02
1.04E+02
9.95E+01
1.01E+02
1.07E+02
1.05E+02
1.04E+02
1.01E+02
1.02E+02
1.05E+02
70
1.05E+02
1.06E+02
1.20E+02
1.07E+02
1.03E+02
1.08E+02
1.10E+02
1.03E+02
1.05E+02
1.04E+02
1.08E+02
1.03E+02
75
1.05E+02
1.04E+02
1.05E+02
1.12E+02
1.15E+02
1.01E+02
1.14E+02
1.08E+02
1.05E+02
1.02E+02
1.07E+02
1.29E+02
100
1.06E+02
1.10E+02
1.05E+02
1.24E+02
1.09E+02
1.09E+02
1.01E+02
1.05E+02
1.06E+02
1.02E+02
1.07E+02
9.99E+01
200
1.02E+02
1.09E+02
1.06E+02
1.05E+02
1.06E+02
1.03E+02
1.02E+02
1.08E+02
1.00E+02
1.02E+02
1.08E+02
1.07E+02
1.07E+02
5.29E+00
1.17E+02
9.56E+01
8.20E+01
PASS
1.05E+02
3.60E+00
1.13E+02
9.80E+01
8.20E+01
PASS
1.05E+02
3.02E+00
1.11E+02
9.89E+01
8.20E+01
PASS
1.08E+02
9.56E+00
1.28E+02
8.87E+01
8.20E+01
PASS
1.09E+02
6.25E+00
1.22E+02
9.65E+01
8.20E+01
PASS
1.09E+02
3.67E+00
1.17E+02
1.02E+02
8.20E+01
PASS
1.04E+02
3.13E+00
1.10E+02
9.74E+01
8.20E+01
PASS
1.07E+02
5.00E+00
1.17E+02
9.68E+01
8.20E+01
PASS
1.07E+02
5.00E+00
1.17E+02
9.66E+01
8.20E+01
PASS
1.08E+02
6.57E+00
1.21E+02
9.42E+01
8.20E+01
PASS
1.04E+02
2.78E+00
1.10E+02
9.85E+01
8.20E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
84
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Channel Separation @+/-5V 2:4 (dB)
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.40. Plot of Channel Separation @+/-5V 2:4 (dB) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias and the black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
85
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.40. Raw data for Channel Separation @+/-5V 2:4 (dB) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Channel Separation @+/-5V 2:4 (dB)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
1.10E+02
1.14E+02
1.14E+02
1.13E+02
1.11E+02
1.13E+02
1.27E+02
1.14E+02
1.27E+02
1.04E+02
1.17E+02
1.22E+02
10
1.12E+02
1.12E+02
1.19E+02
1.12E+02
1.39E+02
1.28E+02
1.15E+02
1.40E+02
1.15E+02
1.07E+02
1.13E+02
1.18E+02
20
1.17E+02
1.25E+02
1.24E+02
1.11E+02
1.26E+02
1.18E+02
1.21E+02
1.14E+02
1.10E+02
1.17E+02
1.16E+02
1.08E+02
30
1.10E+02
1.16E+02
1.15E+02
1.08E+02
1.09E+02
1.25E+02
1.22E+02
1.27E+02
1.13E+02
1.05E+02
1.12E+02
1.30E+02
40
1.23E+02
1.39E+02
1.30E+02
1.22E+02
1.07E+02
1.18E+02
1.14E+02
1.10E+02
1.08E+02
1.11E+02
1.31E+02
1.13E+02
50
1.18E+02
1.23E+02
1.17E+02
1.17E+02
1.28E+02
1.14E+02
1.31E+02
1.13E+02
1.09E+02
1.33E+02
1.04E+02
1.25E+02
60
1.12E+02
1.25E+02
1.09E+02
1.08E+02
1.23E+02
1.18E+02
1.09E+02
1.18E+02
1.40E+02
1.18E+02
1.20E+02
1.07E+02
70
1.14E+02
1.14E+02
1.10E+02
1.27E+02
1.15E+02
1.11E+02
1.25E+02
1.08E+02
1.09E+02
1.18E+02
1.09E+02
1.27E+02
75
1.14E+02
1.13E+02
1.14E+02
1.22E+02
1.09E+02
1.36E+02
1.25E+02
1.10E+02
1.10E+02
1.11E+02
1.13E+02
1.31E+02
100
1.17E+02
1.09E+02
1.39E+02
1.23E+02
1.32E+02
1.19E+02
1.25E+02
1.14E+02
1.14E+02
1.05E+02
1.20E+02
1.12E+02
200
1.21E+02
1.10E+02
1.11E+02
1.09E+02
1.07E+02
1.27E+02
1.16E+02
1.23E+02
1.08E+02
1.14E+02
1.15E+02
1.07E+02
1.15E+02
7.30E+00
1.30E+02
9.95E+01
8.20E+01
PASS
1.20E+02
1.18E+01
1.44E+02
9.56E+01
8.20E+01
PASS
1.18E+02
5.73E+00
1.30E+02
1.07E+02
8.20E+01
PASS
1.15E+02
7.31E+00
1.30E+02
9.98E+01
8.20E+01
PASS
1.18E+02
1.03E+01
1.40E+02
9.70E+01
8.20E+01
PASS
1.20E+02
8.16E+00
1.37E+02
1.03E+02
8.20E+01
PASS
1.18E+02
9.79E+00
1.38E+02
9.77E+01
8.20E+01
PASS
1.15E+02
6.49E+00
1.28E+02
1.02E+02
8.20E+01
PASS
1.16E+02
8.60E+00
1.34E+02
9.86E+01
8.20E+01
PASS
1.20E+02
1.03E+01
1.41E+02
9.83E+01
8.20E+01
PASS
1.14E+02
6.77E+00
1.28E+02
1.00E+02
8.20E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
86
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Channel Separation @+/-5V 3:1 (dB)
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.41. Plot of Channel Separation @+/-5V 3:1 (dB) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias and the black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
87
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.41. Raw data for Channel Separation @+/-5V 3:1 (dB) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Channel Separation @+/-5V 3:1 (dB)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
1.08E+02
1.15E+02
1.13E+02
1.18E+02
1.17E+02
1.18E+02
1.21E+02
1.10E+02
1.12E+02
1.10E+02
1.16E+02
1.17E+02
10
1.09E+02
1.11E+02
1.31E+02
1.24E+02
1.12E+02
1.10E+02
1.09E+02
1.17E+02
1.09E+02
1.23E+02
1.22E+02
1.29E+02
20
1.17E+02
1.19E+02
1.17E+02
1.08E+02
1.10E+02
1.09E+02
1.24E+02
1.06E+02
1.32E+02
1.34E+02
1.10E+02
1.07E+02
30
1.07E+02
1.03E+02
1.13E+02
1.09E+02
1.07E+02
1.11E+02
1.16E+02
1.04E+02
1.08E+02
1.14E+02
1.16E+02
1.17E+02
40
1.26E+02
1.10E+02
1.56E+02
1.13E+02
1.14E+02
1.42E+02
1.32E+02
1.39E+02
1.05E+02
1.27E+02
1.69E+02
1.20E+02
50
1.20E+02
1.12E+02
1.07E+02
1.20E+02
1.15E+02
1.14E+02
1.05E+02
1.09E+02
1.11E+02
1.04E+02
1.15E+02
1.17E+02
60
1.43E+02
1.12E+02
1.14E+02
1.09E+02
1.23E+02
1.14E+02
1.04E+02
1.24E+02
1.14E+02
1.13E+02
1.05E+02
1.19E+02
70
1.09E+02
1.02E+02
1.20E+02
1.15E+02
1.02E+02
1.09E+02
1.08E+02
1.08E+02
1.04E+02
1.15E+02
1.10E+02
1.10E+02
75
1.09E+02
1.17E+02
1.11E+02
1.12E+02
1.27E+02
1.11E+02
1.14E+02
1.16E+02
1.16E+02
1.14E+02
1.09E+02
1.05E+02
100
1.19E+02
1.22E+02
1.16E+02
1.06E+02
1.18E+02
1.34E+02
1.16E+02
1.11E+02
1.13E+02
1.08E+02
1.16E+02
1.08E+02
200
1.27E+02
1.13E+02
1.14E+02
1.18E+02
1.22E+02
1.16E+02
1.11E+02
1.23E+02
1.19E+02
1.11E+02
1.11E+02
1.10E+02
1.14E+02
4.11E+00
1.23E+02
1.06E+02
8.20E+01
PASS
1.15E+02
7.77E+00
1.32E+02
9.94E+01
8.20E+01
PASS
1.17E+02
9.94E+00
1.38E+02
9.70E+01
8.20E+01
PASS
1.09E+02
4.39E+00
1.18E+02
1.00E+02
8.20E+01
PASS
1.26E+02
1.62E+01
1.60E+02
9.29E+01
8.20E+01
PASS
1.12E+02
5.51E+00
1.23E+02
1.00E+02
8.20E+01
PASS
1.17E+02
1.09E+01
1.39E+02
9.44E+01
8.20E+01
PASS
1.09E+02
5.99E+00
1.21E+02
9.68E+01
8.20E+01
PASS
1.15E+02
4.98E+00
1.25E+02
1.04E+02
8.20E+01
PASS
1.16E+02
7.88E+00
1.33E+02
1.00E+02
8.20E+01
PASS
1.17E+02
5.32E+00
1.28E+02
1.06E+02
8.20E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
88
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Channel Separation @+/-5V 3:2 (dB)
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.42. Plot of Channel Separation @+/-5V 3:2 (dB) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias and the black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
89
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.42. Raw data for Channel Separation @+/-5V 3:2 (dB) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Channel Separation @+/-5V 3:2 (dB)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
1.07E+02
1.07E+02
1.06E+02
1.07E+02
1.24E+02
1.08E+02
1.05E+02
1.08E+02
1.23E+02
9.99E+01
1.05E+02
1.07E+02
10
1.01E+02
1.15E+02
1.08E+02
1.06E+02
1.07E+02
1.04E+02
1.02E+02
1.23E+02
1.13E+02
1.07E+02
1.07E+02
1.02E+02
20
1.04E+02
1.04E+02
1.10E+02
1.05E+02
1.11E+02
1.08E+02
1.15E+02
1.09E+02
1.05E+02
1.10E+02
1.11E+02
1.08E+02
30
1.11E+02
1.04E+02
1.19E+02
1.10E+02
1.07E+02
1.03E+02
1.05E+02
1.09E+02
1.06E+02
1.12E+02
1.08E+02
1.05E+02
40
1.01E+02
1.04E+02
1.06E+02
1.02E+02
1.09E+02
1.03E+02
1.06E+02
1.03E+02
1.02E+02
1.04E+02
1.11E+02
1.06E+02
50
1.08E+02
1.12E+02
1.11E+02
1.12E+02
1.10E+02
1.07E+02
1.13E+02
1.05E+02
1.10E+02
1.06E+02
1.23E+02
1.06E+02
60
1.14E+02
1.15E+02
1.07E+02
9.83E+01
1.45E+02
1.10E+02
1.03E+02
1.16E+02
1.01E+02
1.06E+02
1.04E+02
1.05E+02
70
1.04E+02
1.14E+02
1.06E+02
1.04E+02
1.25E+02
1.02E+02
1.12E+02
1.19E+02
1.06E+02
1.08E+02
1.12E+02
1.08E+02
75
1.06E+02
1.08E+02
1.14E+02
1.09E+02
1.04E+02
1.03E+02
1.06E+02
1.05E+02
1.07E+02
1.18E+02
1.11E+02
1.28E+02
100
1.14E+02
1.13E+02
1.11E+02
1.05E+02
1.05E+02
1.10E+02
1.06E+02
1.01E+02
1.31E+02
1.08E+02
1.11E+02
1.06E+02
200
1.06E+02
1.05E+02
1.04E+02
1.08E+02
1.25E+02
1.31E+02
1.05E+02
1.04E+02
1.04E+02
1.03E+02
1.09E+02
1.14E+02
1.09E+02
7.77E+00
1.25E+02
9.34E+01
8.20E+01
PASS
1.08E+02
6.68E+00
1.22E+02
9.47E+01
8.20E+01
PASS
1.08E+02
3.59E+00
1.16E+02
1.01E+02
8.20E+01
PASS
1.09E+02
4.80E+00
1.19E+02
9.88E+01
8.20E+01
PASS
1.04E+02
2.53E+00
1.09E+02
9.88E+01
8.20E+01
PASS
1.10E+02
2.72E+00
1.15E+02
1.04E+02
8.20E+01
PASS
1.12E+02
1.34E+01
1.39E+02
8.41E+01
8.20E+01
PASS
1.10E+02
7.29E+00
1.25E+02
9.48E+01
8.20E+01
PASS
1.08E+02
4.81E+00
1.18E+02
9.80E+01
8.20E+01
PASS
1.10E+02
8.21E+00
1.27E+02
9.34E+01
8.20E+01
PASS
1.10E+02
9.85E+00
1.30E+02
8.92E+01
8.20E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
90
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Channel Separation @+/-5V 3:4 (dB)
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.43. Plot of Channel Separation @+/-5V 3:4 (dB) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias and the black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
91
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.43. Raw data for Channel Separation @+/-5V 3:4 (dB) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Channel Separation @+/-5V 3:4 (dB)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
1.14E+02
1.13E+02
1.17E+02
1.12E+02
1.24E+02
1.16E+02
1.13E+02
1.10E+02
1.07E+02
1.16E+02
1.11E+02
1.05E+02
10
1.38E+02
1.25E+02
1.17E+02
1.34E+02
1.27E+02
1.32E+02
1.08E+02
1.02E+02
1.10E+02
1.17E+02
1.13E+02
1.19E+02
20
1.17E+02
1.08E+02
1.11E+02
1.25E+02
1.11E+02
1.24E+02
1.17E+02
1.13E+02
1.10E+02
1.09E+02
1.11E+02
1.18E+02
30
1.17E+02
1.17E+02
1.19E+02
1.18E+02
1.28E+02
1.05E+02
1.04E+02
1.17E+02
1.22E+02
1.15E+02
1.17E+02
1.14E+02
40
1.10E+02
1.11E+02
1.54E+02
1.07E+02
1.19E+02
1.10E+02
1.11E+02
1.11E+02
1.21E+02
1.18E+02
1.18E+02
1.12E+02
50
1.26E+02
1.24E+02
1.16E+02
1.32E+02
1.41E+02
1.11E+02
1.23E+02
1.09E+02
1.08E+02
1.15E+02
1.38E+02
1.22E+02
60
1.17E+02
1.11E+02
1.51E+02
1.12E+02
1.21E+02
1.10E+02
1.14E+02
1.04E+02
1.13E+02
1.25E+02
1.15E+02
1.09E+02
70
1.18E+02
1.20E+02
1.08E+02
1.25E+02
1.12E+02
1.09E+02
1.12E+02
1.17E+02
1.10E+02
1.16E+02
1.10E+02
1.27E+02
75
1.14E+02
1.22E+02
1.37E+02
1.16E+02
1.22E+02
1.10E+02
1.17E+02
1.25E+02
1.21E+02
1.16E+02
1.22E+02
1.15E+02
100
1.17E+02
1.07E+02
1.16E+02
1.34E+02
1.14E+02
1.03E+02
1.32E+02
1.24E+02
1.08E+02
1.09E+02
1.12E+02
1.08E+02
200
1.26E+02
1.25E+02
1.10E+02
1.14E+02
1.23E+02
1.08E+02
1.21E+02
1.13E+02
1.14E+02
1.23E+02
1.09E+02
1.25E+02
1.14E+02
4.51E+00
1.24E+02
1.05E+02
8.20E+01
PASS
1.21E+02
1.19E+01
1.46E+02
9.62E+01
8.20E+01
PASS
1.14E+02
6.22E+00
1.27E+02
1.01E+02
8.20E+01
PASS
1.16E+02
7.08E+00
1.31E+02
1.02E+02
8.20E+01
PASS
1.17E+02
1.38E+01
1.46E+02
8.88E+01
8.20E+01
PASS
1.21E+02
1.07E+01
1.43E+02
9.85E+01
8.20E+01
PASS
1.18E+02
1.31E+01
1.45E+02
9.10E+01
8.20E+01
PASS
1.15E+02
5.45E+00
1.26E+02
1.03E+02
8.20E+01
PASS
1.20E+02
7.58E+00
1.36E+02
1.04E+02
8.20E+01
PASS
1.16E+02
1.06E+01
1.38E+02
9.46E+01
8.20E+01
PASS
1.18E+02
6.51E+00
1.31E+02
1.04E+02
8.20E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
92
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Channel Separation @+/-5V 4:1 (dB)
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.44. Plot of Channel Separation @+/-5V 4:1 (dB) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias and the black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
93
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.44. Raw data for Channel Separation @+/-5V 4:1 (dB) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Channel Separation @+/-5V 4:1 (dB)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
1.11E+02
1.39E+02
1.03E+02
1.06E+02
1.10E+02
1.12E+02
1.08E+02
1.13E+02
1.10E+02
1.17E+02
1.10E+02
1.26E+02
10
1.08E+02
1.16E+02
1.07E+02
1.15E+02
1.16E+02
1.17E+02
1.05E+02
1.09E+02
1.04E+02
1.02E+02
1.09E+02
1.10E+02
20
1.11E+02
1.23E+02
1.07E+02
1.29E+02
1.25E+02
1.08E+02
1.10E+02
1.00E+02
1.03E+02
1.04E+02
1.07E+02
1.11E+02
30
1.08E+02
1.04E+02
1.04E+02
1.45E+02
1.10E+02
1.13E+02
1.25E+02
1.12E+02
1.05E+02
1.16E+02
1.29E+02
1.16E+02
40
1.24E+02
1.04E+02
1.04E+02
1.09E+02
1.07E+02
1.04E+02
1.29E+02
1.09E+02
1.07E+02
1.13E+02
1.10E+02
1.19E+02
50
1.09E+02
1.17E+02
1.03E+02
1.09E+02
1.07E+02
1.11E+02
1.08E+02
1.08E+02
1.10E+02
1.06E+02
1.13E+02
1.30E+02
60
1.08E+02
1.16E+02
9.96E+01
1.29E+02
1.10E+02
1.08E+02
1.19E+02
1.43E+02
1.26E+02
1.06E+02
1.04E+02
1.08E+02
70
1.18E+02
1.02E+02
1.02E+02
1.10E+02
1.08E+02
1.19E+02
1.13E+02
1.11E+02
1.05E+02
1.05E+02
1.18E+02
1.11E+02
75
1.24E+02
1.08E+02
1.06E+02
1.18E+02
1.06E+02
1.04E+02
1.26E+02
1.04E+02
1.11E+02
1.06E+02
1.11E+02
1.21E+02
100
1.11E+02
1.06E+02
1.04E+02
1.04E+02
1.29E+02
1.18E+02
1.19E+02
1.20E+02
1.17E+02
1.03E+02
1.00E+02
1.10E+02
200
1.27E+02
1.08E+02
1.07E+02
1.09E+02
1.15E+02
1.10E+02
1.04E+02
1.11E+02
1.13E+02
1.08E+02
1.11E+02
1.09E+02
1.13E+02
9.85E+00
1.33E+02
9.25E+01
8.20E+01
PASS
1.10E+02
5.57E+00
1.21E+02
9.84E+01
8.20E+01
PASS
1.12E+02
1.01E+01
1.33E+02
9.12E+01
8.20E+01
PASS
1.14E+02
1.25E+01
1.40E+02
8.82E+01
8.20E+01
PASS
1.11E+02
8.49E+00
1.28E+02
9.34E+01
8.20E+01
PASS
1.09E+02
3.57E+00
1.16E+02
1.01E+02
8.20E+01
PASS
1.17E+02
1.31E+01
1.44E+02
8.94E+01
8.20E+01
PASS
1.09E+02
6.12E+00
1.22E+02
9.66E+01
8.20E+01
PASS
1.11E+02
8.09E+00
1.28E+02
9.46E+01
8.20E+01
PASS
1.13E+02
8.82E+00
1.31E+02
9.49E+01
8.20E+01
PASS
1.11E+02
6.50E+00
1.25E+02
9.77E+01
8.20E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
94
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Channel Separation @+/-5V 4:2 (dB)
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.45. Plot of Channel Separation @+/-5V 4:2 (dB) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias and the black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
95
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.45. Raw data for Channel Separation @+/-5V 4:2 (dB) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Channel Separation @+/-5V 4:2 (dB)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
1.14E+02
1.22E+02
1.48E+02
1.29E+02
1.15E+02
1.20E+02
1.16E+02
1.17E+02
1.12E+02
1.12E+02
1.18E+02
1.12E+02
10
1.11E+02
1.40E+02
1.14E+02
1.23E+02
1.20E+02
1.09E+02
1.09E+02
1.65E+02
1.18E+02
1.14E+02
1.30E+02
1.16E+02
20
1.15E+02
1.13E+02
1.15E+02
1.15E+02
1.27E+02
1.14E+02
1.19E+02
1.17E+02
1.13E+02
1.09E+02
1.05E+02
1.20E+02
30
1.15E+02
1.21E+02
1.15E+02
1.08E+02
1.15E+02
1.26E+02
1.10E+02
1.13E+02
1.35E+02
1.17E+02
1.38E+02
1.21E+02
40
1.14E+02
1.14E+02
1.31E+02
1.15E+02
1.16E+02
1.17E+02
1.20E+02
1.15E+02
1.21E+02
1.19E+02
1.15E+02
1.08E+02
50
1.17E+02
1.11E+02
1.13E+02
1.09E+02
1.09E+02
1.15E+02
1.08E+02
1.12E+02
1.05E+02
1.14E+02
1.23E+02
1.20E+02
60
1.09E+02
1.16E+02
1.14E+02
1.13E+02
1.23E+02
1.32E+02
1.75E+02
1.12E+02
1.16E+02
1.08E+02
1.24E+02
1.22E+02
70
1.09E+02
1.15E+02
1.13E+02
1.06E+02
1.24E+02
1.14E+02
1.23E+02
1.19E+02
1.14E+02
1.11E+02
1.19E+02
1.15E+02
75
1.23E+02
1.25E+02
1.28E+02
1.13E+02
1.19E+02
1.16E+02
1.15E+02
1.23E+02
1.14E+02
1.24E+02
1.24E+02
1.16E+02
100
1.22E+02
1.18E+02
1.13E+02
1.11E+02
1.28E+02
1.25E+02
1.11E+02
1.19E+02
1.08E+02
1.12E+02
1.17E+02
1.12E+02
200
1.18E+02
1.25E+02
1.15E+02
1.17E+02
1.13E+02
1.22E+02
1.06E+02
1.14E+02
1.15E+02
1.31E+02
1.15E+02
1.09E+02
1.20E+02
1.09E+01
1.43E+02
9.80E+01
8.20E+01
PASS
1.22E+02
1.74E+01
1.58E+02
8.63E+01
8.20E+01
PASS
1.16E+02
4.73E+00
1.25E+02
1.06E+02
8.20E+01
PASS
1.17E+02
7.89E+00
1.34E+02
1.01E+02
8.20E+01
PASS
1.18E+02
5.25E+00
1.29E+02
1.07E+02
8.20E+01
PASS
1.11E+02
3.79E+00
1.19E+02
1.04E+02
8.20E+01
PASS
1.22E+02
2.00E+01
1.63E+02
8.04E+01
8.20E+01
PASS
1.15E+02
5.70E+00
1.27E+02
1.03E+02
8.20E+01
PASS
1.20E+02
5.12E+00
1.30E+02
1.09E+02
8.20E+01
PASS
1.17E+02
6.77E+00
1.31E+02
1.03E+02
8.20E+01
PASS
1.18E+02
7.04E+00
1.32E+02
1.03E+02
8.20E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
96
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Channel Separation @+/-5V 4:3 (dB)
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.46. Plot of Channel Separation @+/-5V 4:3 (dB) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias and the black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
97
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.46. Raw data for Channel Separation @+/-5V 4:3 (dB) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Channel Separation @+/-5V 4:3 (dB)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
1.21E+02
1.34E+02
1.30E+02
1.12E+02
1.20E+02
1.14E+02
1.11E+02
1.30E+02
1.23E+02
1.10E+02
1.08E+02
1.18E+02
10
1.16E+02
1.08E+02
1.08E+02
1.12E+02
1.14E+02
1.12E+02
1.27E+02
1.10E+02
1.14E+02
1.11E+02
1.22E+02
1.10E+02
20
1.19E+02
1.24E+02
1.22E+02
1.22E+02
1.03E+02
1.20E+02
1.22E+02
1.34E+02
1.32E+02
1.16E+02
1.10E+02
1.11E+02
30
1.20E+02
1.13E+02
1.11E+02
1.08E+02
1.25E+02
1.20E+02
1.20E+02
1.09E+02
1.16E+02
1.17E+02
1.11E+02
1.12E+02
40
1.17E+02
1.14E+02
1.19E+02
1.17E+02
1.16E+02
1.06E+02
1.22E+02
1.23E+02
1.38E+02
1.08E+02
1.05E+02
1.14E+02
50
1.06E+02
1.13E+02
1.20E+02
1.21E+02
1.13E+02
1.18E+02
1.08E+02
1.26E+02
1.14E+02
1.09E+02
1.21E+02
1.23E+02
60
1.10E+02
1.20E+02
1.13E+02
1.11E+02
1.31E+02
1.12E+02
1.15E+02
1.15E+02
1.10E+02
1.04E+02
1.20E+02
1.17E+02
70
1.14E+02
1.09E+02
1.15E+02
1.06E+02
1.07E+02
1.19E+02
1.08E+02
1.10E+02
1.23E+02
1.19E+02
1.28E+02
1.20E+02
75
1.06E+02
1.10E+02
1.20E+02
1.10E+02
1.16E+02
1.18E+02
1.28E+02
1.19E+02
1.20E+02
1.05E+02
1.16E+02
1.07E+02
100
1.06E+02
1.14E+02
1.08E+02
1.22E+02
1.15E+02
1.14E+02
1.15E+02
1.28E+02
1.12E+02
1.27E+02
1.16E+02
1.33E+02
200
1.15E+02
1.11E+02
1.20E+02
1.12E+02
1.12E+02
1.15E+02
1.10E+02
1.13E+02
1.17E+02
1.13E+02
1.11E+02
1.10E+02
1.20E+02
8.66E+00
1.38E+02
1.02E+02
8.20E+01
PASS
1.13E+02
5.60E+00
1.25E+02
1.02E+02
8.20E+01
PASS
1.21E+02
8.59E+00
1.39E+02
1.04E+02
8.20E+01
PASS
1.16E+02
5.53E+00
1.27E+02
1.04E+02
8.20E+01
PASS
1.18E+02
8.93E+00
1.36E+02
9.94E+01
8.20E+01
PASS
1.15E+02
6.29E+00
1.28E+02
1.02E+02
8.20E+01
PASS
1.14E+02
7.25E+00
1.29E+02
9.91E+01
8.20E+01
PASS
1.13E+02
5.88E+00
1.25E+02
1.01E+02
8.20E+01
PASS
1.15E+02
7.12E+00
1.30E+02
1.00E+02
8.20E+01
PASS
1.16E+02
7.44E+00
1.31E+02
1.01E+02
8.20E+01
PASS
1.14E+02
3.10E+00
1.20E+02
1.07E+02
8.20E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
98
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Output Voltage Swing High @+/-5V RL=500 #1 (V)
4.10E+00
4.00E+00
3.90E+00
3.80E+00
3.70E+00
3.60E+00
3.50E+00
3.40E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.47. Plot of Output Voltage Swing High @+/-5V RL=500 #1 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias and the
black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
99
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.47. Raw data for Output Voltage Swing High @+/-5V RL=500 #1 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High @+/-5V RL=500 #1 (V)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
4.02E+00
4.02E+00
4.03E+00
4.03E+00
4.03E+00
4.02E+00
4.02E+00
4.03E+00
4.02E+00
4.02E+00
4.02E+00
4.03E+00
10
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
20
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
30
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
40
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
50
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
60
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
70
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
75
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
100
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
200
4.01E+00
4.01E+00
4.01E+00
4.01E+00
4.01E+00
4.01E+00
4.01E+00
4.01E+00
4.01E+00
4.01E+00
4.02E+00
4.02E+00
4.02E+00
2.33E-03
4.03E+00
4.02E+00
3.80E+00
PASS
4.02E+00
2.33E-03
4.02E+00
4.02E+00
3.80E+00
PASS
4.02E+00
2.64E-03
4.02E+00
4.01E+00
3.80E+00
PASS
4.02E+00
2.44E-03
4.02E+00
4.01E+00
3.80E+00
PASS
4.02E+00
2.16E-03
4.02E+00
4.02E+00
3.80E+00
PASS
4.02E+00
2.20E-03
4.02E+00
4.01E+00
3.70E+00
PASS
4.02E+00
1.96E-03
4.02E+00
4.02E+00
3.70E+00
PASS
4.02E+00
1.85E-03
4.02E+00
4.02E+00
3.70E+00
PASS
4.02E+00
2.06E-03
4.02E+00
4.01E+00
3.70E+00
PASS
4.02E+00
2.01E-03
4.02E+00
4.01E+00
3.60E+00
PASS
4.01E+00
1.90E-03
4.01E+00
4.01E+00
3.50E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
100
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Output Voltage Swing High @+/-5V RL=500 #2 (V)
4.10E+00
4.00E+00
3.90E+00
3.80E+00
3.70E+00
3.60E+00
3.50E+00
3.40E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.48. Plot of Output Voltage Swing High @+/-5V RL=500 #2 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias and the
black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
101
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.48. Raw data for Output Voltage Swing High @+/-5V RL=500 #2 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High @+/-5V RL=500 #2 (V)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
4.02E+00
4.02E+00
4.02E+00
4.03E+00
4.02E+00
4.02E+00
4.02E+00
4.03E+00
4.02E+00
4.03E+00
4.02E+00
4.02E+00
10
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
20
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
30
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
40
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
50
4.01E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
60
4.01E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
70
4.01E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
75
4.01E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
100
4.01E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
200
4.01E+00
4.01E+00
4.01E+00
4.02E+00
4.01E+00
4.01E+00
4.01E+00
4.01E+00
4.01E+00
4.01E+00
4.02E+00
4.02E+00
4.02E+00
2.08E-03
4.03E+00
4.02E+00
3.80E+00
PASS
4.02E+00
2.36E-03
4.02E+00
4.01E+00
3.80E+00
PASS
4.02E+00
2.63E-03
4.02E+00
4.01E+00
3.80E+00
PASS
4.02E+00
2.25E-03
4.02E+00
4.01E+00
3.80E+00
PASS
4.02E+00
2.41E-03
4.02E+00
4.01E+00
3.80E+00
PASS
4.02E+00
2.59E-03
4.02E+00
4.01E+00
3.70E+00
PASS
4.02E+00
2.59E-03
4.02E+00
4.01E+00
3.70E+00
PASS
4.02E+00
2.59E-03
4.02E+00
4.01E+00
3.70E+00
PASS
4.02E+00
2.39E-03
4.02E+00
4.01E+00
3.70E+00
PASS
4.02E+00
2.47E-03
4.02E+00
4.01E+00
3.60E+00
PASS
4.01E+00
2.50E-03
4.02E+00
4.01E+00
3.50E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
102
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Output Voltage Swing High @+/-5V RL=500 #3 (V)
4.10E+00
4.00E+00
3.90E+00
3.80E+00
3.70E+00
3.60E+00
3.50E+00
3.40E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.49. Plot of Output Voltage Swing High @+/-5V RL=500 #3 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias and the
black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
103
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.49. Raw data for Output Voltage Swing High @+/-5V RL=500 #3 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High @+/-5V RL=500 #3 (V)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
4.02E+00
4.02E+00
4.02E+00
4.03E+00
4.02E+00
4.02E+00
4.02E+00
4.03E+00
4.02E+00
4.03E+00
4.02E+00
4.02E+00
10
4.02E+00
4.02E+00
4.02E+00
4.03E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
20
4.02E+00
4.02E+00
4.02E+00
4.03E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
30
4.02E+00
4.02E+00
4.02E+00
4.03E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
40
4.02E+00
4.02E+00
4.02E+00
4.03E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
50
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
60
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
70
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
75
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
100
4.01E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
200
4.01E+00
4.01E+00
4.01E+00
4.01E+00
4.01E+00
4.01E+00
4.01E+00
4.01E+00
4.01E+00
4.01E+00
4.02E+00
4.02E+00
4.02E+00
2.80E-03
4.03E+00
4.02E+00
3.80E+00
PASS
4.02E+00
2.64E-03
4.02E+00
4.01E+00
3.80E+00
PASS
4.02E+00
2.92E-03
4.03E+00
4.01E+00
3.80E+00
PASS
4.02E+00
2.80E-03
4.03E+00
4.01E+00
3.80E+00
PASS
4.02E+00
2.79E-03
4.03E+00
4.01E+00
3.80E+00
PASS
4.02E+00
2.54E-03
4.02E+00
4.01E+00
3.70E+00
PASS
4.02E+00
2.58E-03
4.02E+00
4.01E+00
3.70E+00
PASS
4.02E+00
2.36E-03
4.02E+00
4.01E+00
3.70E+00
PASS
4.02E+00
2.13E-03
4.02E+00
4.01E+00
3.70E+00
PASS
4.02E+00
2.31E-03
4.02E+00
4.01E+00
3.60E+00
PASS
4.01E+00
2.32E-03
4.02E+00
4.01E+00
3.50E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
104
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Output Voltage Swing High @+/-5V RL=500 #4 (V)
4.10E+00
4.00E+00
3.90E+00
3.80E+00
3.70E+00
3.60E+00
3.50E+00
3.40E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.50. Plot of Output Voltage Swing High @+/-5V RL=500 #4 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias and the
black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
105
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.50. Raw data for Output Voltage Swing High @+/-5V RL=500 #4 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High @+/-5V RL=500 #4 (V)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
10
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
20
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
30
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
40
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
50
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
60
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
70
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
75
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
100
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.01E+00
4.02E+00
4.02E+00
200
4.01E+00
4.01E+00
4.01E+00
4.01E+00
4.01E+00
4.01E+00
4.01E+00
4.01E+00
4.01E+00
4.01E+00
4.02E+00
4.02E+00
4.02E+00
1.42E-03
4.03E+00
4.02E+00
3.80E+00
PASS
4.02E+00
1.34E-03
4.02E+00
4.02E+00
3.80E+00
PASS
4.02E+00
1.57E-03
4.02E+00
4.02E+00
3.80E+00
PASS
4.02E+00
1.57E-03
4.02E+00
4.02E+00
3.80E+00
PASS
4.02E+00
1.51E-03
4.02E+00
4.02E+00
3.80E+00
PASS
4.02E+00
1.49E-03
4.02E+00
4.01E+00
3.70E+00
PASS
4.02E+00
1.33E-03
4.02E+00
4.02E+00
3.70E+00
PASS
4.02E+00
1.29E-03
4.02E+00
4.02E+00
3.70E+00
PASS
4.02E+00
1.65E-03
4.02E+00
4.01E+00
3.70E+00
PASS
4.02E+00
1.81E-03
4.02E+00
4.01E+00
3.60E+00
PASS
4.01E+00
2.32E-03
4.01E+00
4.00E+00
3.50E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
106
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Output Voltage Swing High @+/-5V RL=100 #1 (V)
3.70E+00
3.60E+00
3.50E+00
3.40E+00
3.30E+00
3.20E+00
3.10E+00
3.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.51. Plot of Output Voltage Swing High @+/-5V RL=100 #1 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias and the
black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
107
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.51. Raw data for Output Voltage Swing High @+/-5V RL=100 #1 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High @+/-5V RL=100 #1 (V)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
3.62E+00
3.63E+00
3.63E+00
3.63E+00
3.64E+00
3.62E+00
3.62E+00
3.63E+00
3.62E+00
3.62E+00
3.63E+00
3.63E+00
10
3.62E+00
3.62E+00
3.63E+00
3.63E+00
3.63E+00
3.62E+00
3.62E+00
3.62E+00
3.62E+00
3.62E+00
3.63E+00
3.63E+00
20
3.62E+00
3.62E+00
3.63E+00
3.63E+00
3.63E+00
3.62E+00
3.62E+00
3.62E+00
3.62E+00
3.62E+00
3.63E+00
3.63E+00
30
3.62E+00
3.62E+00
3.63E+00
3.63E+00
3.63E+00
3.62E+00
3.62E+00
3.62E+00
3.62E+00
3.62E+00
3.63E+00
3.63E+00
40
3.62E+00
3.62E+00
3.63E+00
3.63E+00
3.63E+00
3.62E+00
3.61E+00
3.62E+00
3.62E+00
3.62E+00
3.63E+00
3.63E+00
50
3.62E+00
3.62E+00
3.63E+00
3.63E+00
3.63E+00
3.62E+00
3.61E+00
3.62E+00
3.62E+00
3.62E+00
3.63E+00
3.63E+00
60
3.62E+00
3.62E+00
3.63E+00
3.63E+00
3.63E+00
3.62E+00
3.61E+00
3.62E+00
3.62E+00
3.62E+00
3.63E+00
3.63E+00
70
3.62E+00
3.62E+00
3.63E+00
3.63E+00
3.63E+00
3.62E+00
3.61E+00
3.62E+00
3.62E+00
3.62E+00
3.63E+00
3.63E+00
75
3.62E+00
3.62E+00
3.63E+00
3.63E+00
3.63E+00
3.61E+00
3.61E+00
3.62E+00
3.62E+00
3.61E+00
3.63E+00
3.63E+00
100
3.61E+00
3.62E+00
3.62E+00
3.62E+00
3.63E+00
3.61E+00
3.61E+00
3.62E+00
3.62E+00
3.61E+00
3.63E+00
3.63E+00
200
3.61E+00
3.61E+00
3.62E+00
3.62E+00
3.62E+00
3.61E+00
3.60E+00
3.61E+00
3.61E+00
3.61E+00
3.63E+00
3.63E+00
3.63E+00
6.29E-03
3.64E+00
3.61E+00
3.35E+00
PASS
3.62E+00
6.26E-03
3.64E+00
3.61E+00
3.35E+00
PASS
3.62E+00
6.52E-03
3.64E+00
3.61E+00
3.30E+00
PASS
3.62E+00
6.41E-03
3.64E+00
3.61E+00
3.30E+00
PASS
3.62E+00
6.58E-03
3.63E+00
3.61E+00
3.30E+00
PASS
3.62E+00
6.27E-03
3.63E+00
3.61E+00
3.25E+00
PASS
3.62E+00
6.36E-03
3.63E+00
3.61E+00
3.25E+00
PASS
3.62E+00
6.02E-03
3.63E+00
3.61E+00
3.25E+00
PASS
3.62E+00
6.14E-03
3.63E+00
3.61E+00
3.25E+00
PASS
3.62E+00
6.13E-03
3.63E+00
3.61E+00
3.15E+00
PASS
3.61E+00
5.78E-03
3.62E+00
3.60E+00
3.05E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
108
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Output Voltage Swing High @+/-5V RL=100 #2 (V)
3.70E+00
3.60E+00
3.50E+00
3.40E+00
3.30E+00
3.20E+00
3.10E+00
3.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.52. Plot of Output Voltage Swing High @+/-5V RL=100 #2 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias and the
black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
109
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.52. Raw data for Output Voltage Swing High @+/-5V RL=100 #2 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High @+/-5V RL=100 #2 (V)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
3.62E+00
3.62E+00
3.63E+00
3.64E+00
3.63E+00
3.62E+00
3.62E+00
3.63E+00
3.63E+00
3.63E+00
3.62E+00
3.62E+00
10
3.61E+00
3.62E+00
3.62E+00
3.64E+00
3.62E+00
3.62E+00
3.62E+00
3.62E+00
3.62E+00
3.63E+00
3.62E+00
3.62E+00
20
3.61E+00
3.62E+00
3.62E+00
3.64E+00
3.62E+00
3.62E+00
3.62E+00
3.62E+00
3.62E+00
3.63E+00
3.62E+00
3.62E+00
30
3.61E+00
3.62E+00
3.62E+00
3.64E+00
3.62E+00
3.62E+00
3.62E+00
3.62E+00
3.62E+00
3.63E+00
3.62E+00
3.62E+00
40
3.61E+00
3.62E+00
3.62E+00
3.64E+00
3.62E+00
3.62E+00
3.62E+00
3.62E+00
3.62E+00
3.63E+00
3.62E+00
3.62E+00
50
3.61E+00
3.62E+00
3.62E+00
3.64E+00
3.62E+00
3.62E+00
3.62E+00
3.62E+00
3.62E+00
3.63E+00
3.62E+00
3.62E+00
60
3.61E+00
3.62E+00
3.62E+00
3.63E+00
3.62E+00
3.62E+00
3.62E+00
3.62E+00
3.62E+00
3.63E+00
3.62E+00
3.62E+00
70
3.61E+00
3.62E+00
3.62E+00
3.63E+00
3.62E+00
3.62E+00
3.62E+00
3.62E+00
3.62E+00
3.63E+00
3.62E+00
3.62E+00
75
3.61E+00
3.62E+00
3.62E+00
3.63E+00
3.62E+00
3.62E+00
3.62E+00
3.62E+00
3.62E+00
3.63E+00
3.62E+00
3.62E+00
100
3.61E+00
3.62E+00
3.62E+00
3.63E+00
3.62E+00
3.61E+00
3.62E+00
3.62E+00
3.62E+00
3.63E+00
3.62E+00
3.62E+00
200
3.60E+00
3.61E+00
3.61E+00
3.63E+00
3.61E+00
3.61E+00
3.61E+00
3.61E+00
3.61E+00
3.62E+00
3.62E+00
3.62E+00
3.63E+00
6.07E-03
3.64E+00
3.61E+00
3.35E+00
PASS
3.62E+00
6.36E-03
3.64E+00
3.61E+00
3.35E+00
PASS
3.62E+00
6.55E-03
3.64E+00
3.61E+00
3.30E+00
PASS
3.62E+00
6.67E-03
3.64E+00
3.61E+00
3.30E+00
PASS
3.62E+00
6.77E-03
3.64E+00
3.61E+00
3.30E+00
PASS
3.62E+00
6.83E-03
3.64E+00
3.61E+00
3.25E+00
PASS
3.62E+00
6.68E-03
3.63E+00
3.61E+00
3.25E+00
PASS
3.62E+00
6.67E-03
3.63E+00
3.61E+00
3.25E+00
PASS
3.62E+00
6.69E-03
3.63E+00
3.61E+00
3.25E+00
PASS
3.62E+00
6.73E-03
3.63E+00
3.60E+00
3.15E+00
PASS
3.61E+00
7.09E-03
3.63E+00
3.60E+00
3.05E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
110
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Output Voltage Swing High @+/-5V RL=100 #3 (V)
3.70E+00
3.60E+00
3.50E+00
3.40E+00
3.30E+00
3.20E+00
3.10E+00
3.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.53. Plot of Output Voltage Swing High @+/-5V RL=100 #3 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias and the
black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
111
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.53. Raw data for Output Voltage Swing High @+/-5V RL=100 #3 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High @+/-5V RL=100 #3 (V)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
3.62E+00
3.63E+00
3.63E+00
3.64E+00
3.63E+00
3.62E+00
3.63E+00
3.63E+00
3.63E+00
3.64E+00
3.63E+00
3.62E+00
10
3.61E+00
3.62E+00
3.62E+00
3.64E+00
3.62E+00
3.62E+00
3.62E+00
3.63E+00
3.62E+00
3.63E+00
3.62E+00
3.62E+00
20
3.61E+00
3.62E+00
3.62E+00
3.64E+00
3.62E+00
3.62E+00
3.62E+00
3.62E+00
3.62E+00
3.63E+00
3.62E+00
3.62E+00
30
3.61E+00
3.62E+00
3.62E+00
3.64E+00
3.62E+00
3.62E+00
3.62E+00
3.62E+00
3.62E+00
3.63E+00
3.62E+00
3.62E+00
40
3.61E+00
3.62E+00
3.62E+00
3.64E+00
3.62E+00
3.62E+00
3.62E+00
3.62E+00
3.62E+00
3.63E+00
3.62E+00
3.62E+00
50
3.61E+00
3.62E+00
3.62E+00
3.64E+00
3.62E+00
3.62E+00
3.62E+00
3.62E+00
3.62E+00
3.63E+00
3.62E+00
3.62E+00
60
3.61E+00
3.62E+00
3.62E+00
3.64E+00
3.62E+00
3.62E+00
3.62E+00
3.62E+00
3.62E+00
3.63E+00
3.62E+00
3.62E+00
70
3.61E+00
3.62E+00
3.62E+00
3.64E+00
3.62E+00
3.62E+00
3.62E+00
3.62E+00
3.62E+00
3.63E+00
3.62E+00
3.62E+00
75
3.61E+00
3.62E+00
3.62E+00
3.64E+00
3.62E+00
3.62E+00
3.62E+00
3.62E+00
3.62E+00
3.63E+00
3.62E+00
3.62E+00
100
3.61E+00
3.62E+00
3.62E+00
3.64E+00
3.62E+00
3.61E+00
3.62E+00
3.62E+00
3.62E+00
3.63E+00
3.62E+00
3.62E+00
200
3.60E+00
3.61E+00
3.61E+00
3.63E+00
3.61E+00
3.61E+00
3.61E+00
3.61E+00
3.61E+00
3.62E+00
3.62E+00
3.62E+00
3.63E+00
7.18E-03
3.64E+00
3.61E+00
3.35E+00
PASS
3.62E+00
7.29E-03
3.64E+00
3.61E+00
3.35E+00
PASS
3.62E+00
7.20E-03
3.64E+00
3.61E+00
3.30E+00
PASS
3.62E+00
7.52E-03
3.64E+00
3.61E+00
3.30E+00
PASS
3.62E+00
7.10E-03
3.64E+00
3.61E+00
3.30E+00
PASS
3.62E+00
7.29E-03
3.64E+00
3.61E+00
3.25E+00
PASS
3.62E+00
7.06E-03
3.64E+00
3.61E+00
3.25E+00
PASS
3.62E+00
7.06E-03
3.64E+00
3.61E+00
3.25E+00
PASS
3.62E+00
6.79E-03
3.64E+00
3.61E+00
3.25E+00
PASS
3.62E+00
6.93E-03
3.63E+00
3.61E+00
3.15E+00
PASS
3.61E+00
6.72E-03
3.63E+00
3.60E+00
3.05E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
112
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Output Voltage Swing High @+/-5V RL=100 #4 (V)
3.70E+00
3.60E+00
3.50E+00
3.40E+00
3.30E+00
3.20E+00
3.10E+00
3.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.54. Plot of Output Voltage Swing High @+/-5V RL=100 #4 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias and the
black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
113
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.54. Raw data for Output Voltage Swing High @+/-5V RL=100 #4 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High @+/-5V RL=100 #4 (V)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
3.62E+00
3.63E+00
3.63E+00
3.63E+00
3.63E+00
3.62E+00
3.62E+00
3.63E+00
3.63E+00
3.62E+00
3.63E+00
3.63E+00
10
3.62E+00
3.62E+00
3.63E+00
3.63E+00
3.63E+00
3.62E+00
3.62E+00
3.62E+00
3.62E+00
3.62E+00
3.63E+00
3.63E+00
20
3.62E+00
3.62E+00
3.63E+00
3.63E+00
3.63E+00
3.62E+00
3.62E+00
3.62E+00
3.62E+00
3.62E+00
3.63E+00
3.63E+00
30
3.62E+00
3.62E+00
3.63E+00
3.63E+00
3.63E+00
3.62E+00
3.62E+00
3.62E+00
3.62E+00
3.62E+00
3.63E+00
3.63E+00
40
3.62E+00
3.62E+00
3.63E+00
3.63E+00
3.63E+00
3.62E+00
3.62E+00
3.62E+00
3.62E+00
3.62E+00
3.63E+00
3.63E+00
50
3.62E+00
3.62E+00
3.63E+00
3.63E+00
3.63E+00
3.62E+00
3.62E+00
3.62E+00
3.62E+00
3.62E+00
3.63E+00
3.63E+00
60
3.62E+00
3.62E+00
3.63E+00
3.62E+00
3.63E+00
3.62E+00
3.62E+00
3.62E+00
3.62E+00
3.62E+00
3.63E+00
3.63E+00
70
3.62E+00
3.62E+00
3.62E+00
3.62E+00
3.63E+00
3.62E+00
3.62E+00
3.62E+00
3.62E+00
3.62E+00
3.63E+00
3.63E+00
75
3.62E+00
3.62E+00
3.62E+00
3.62E+00
3.63E+00
3.61E+00
3.62E+00
3.62E+00
3.62E+00
3.61E+00
3.63E+00
3.63E+00
100
3.61E+00
3.62E+00
3.62E+00
3.62E+00
3.63E+00
3.61E+00
3.62E+00
3.62E+00
3.62E+00
3.61E+00
3.63E+00
3.63E+00
200
3.61E+00
3.61E+00
3.62E+00
3.61E+00
3.62E+00
3.60E+00
3.61E+00
3.61E+00
3.61E+00
3.60E+00
3.63E+00
3.63E+00
3.63E+00
4.03E-03
3.63E+00
3.62E+00
3.35E+00
PASS
3.62E+00
4.07E-03
3.63E+00
3.61E+00
3.35E+00
PASS
3.62E+00
4.50E-03
3.63E+00
3.61E+00
3.30E+00
PASS
3.62E+00
4.53E-03
3.63E+00
3.61E+00
3.30E+00
PASS
3.62E+00
4.71E-03
3.63E+00
3.61E+00
3.30E+00
PASS
3.62E+00
4.48E-03
3.63E+00
3.61E+00
3.25E+00
PASS
3.62E+00
4.58E-03
3.63E+00
3.61E+00
3.25E+00
PASS
3.62E+00
4.45E-03
3.63E+00
3.61E+00
3.25E+00
PASS
3.62E+00
4.61E-03
3.63E+00
3.61E+00
3.25E+00
PASS
3.62E+00
4.58E-03
3.63E+00
3.61E+00
3.15E+00
PASS
3.61E+00
4.81E-03
3.62E+00
3.60E+00
3.05E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
114
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
Specification MAX
Output Voltage Swing Low @+/-5V RL=500 #1 (V)
-3.40E+00
-3.50E+00
-3.60E+00
-3.70E+00
-3.80E+00
-3.90E+00
-4.00E+00
-4.10E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.55. Plot of Output Voltage Swing Low @+/-5V RL=500 #1 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias and the
black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
115
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.55. Raw data for Output Voltage Swing Low @+/-5V RL=500 #1 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low @+/-5V RL=500 #1 (V)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MAX
Status
0
-4.02E+00
-4.03E+00
-4.03E+00
-4.03E+00
-4.03E+00
-4.03E+00
-4.03E+00
-4.03E+00
-4.03E+00
-4.02E+00
-4.03E+00
-4.02E+00
10
-4.02E+00
-4.02E+00
-4.02E+00
-4.03E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.02E+00
20
-4.02E+00
-4.01E+00
-4.02E+00
-4.03E+00
-4.02E+00
-4.01E+00
-4.01E+00
-4.02E+00
-4.02E+00
-4.01E+00
-4.02E+00
-4.02E+00
30
-4.02E+00
-4.01E+00
-4.02E+00
-4.03E+00
-4.02E+00
-4.01E+00
-4.01E+00
-4.02E+00
-4.02E+00
-4.01E+00
-4.02E+00
-4.02E+00
40
-4.02E+00
-4.01E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.01E+00
-4.01E+00
-4.02E+00
-4.02E+00
-4.01E+00
-4.02E+00
-4.02E+00
50
-4.01E+00
-4.01E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.01E+00
-4.01E+00
-4.01E+00
-4.02E+00
-4.01E+00
-4.02E+00
-4.02E+00
60
-4.01E+00
-4.01E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.01E+00
-4.01E+00
-4.01E+00
-4.02E+00
-4.01E+00
-4.02E+00
-4.02E+00
70
-4.01E+00
-4.01E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.01E+00
-4.01E+00
-4.01E+00
-4.02E+00
-4.01E+00
-4.03E+00
-4.02E+00
75
-4.01E+00
-4.01E+00
-4.01E+00
-4.02E+00
-4.02E+00
-4.01E+00
-4.01E+00
-4.01E+00
-4.01E+00
-4.01E+00
-4.02E+00
-4.02E+00
100
-4.01E+00
-4.01E+00
-4.01E+00
-4.02E+00
-4.02E+00
-4.01E+00
-4.01E+00
-4.01E+00
-4.01E+00
-4.01E+00
-4.03E+00
-4.02E+00
200
-4.01E+00
-4.00E+00
-4.00E+00
-4.01E+00
-4.01E+00
-4.00E+00
-4.00E+00
-4.00E+00
-4.00E+00
-4.00E+00
-4.03E+00
-4.02E+00
-4.03E+00
1.96E-03
-4.02E+00
-4.03E+00
-3.80E+00
PASS
-4.02E+00
2.80E-03
-4.01E+00
-4.03E+00
-3.80E+00
PASS
-4.02E+00
3.60E-03
-4.01E+00
-4.02E+00
-3.80E+00
PASS
-4.02E+00
3.74E-03
-4.01E+00
-4.02E+00
-3.80E+00
PASS
-4.02E+00
3.41E-03
-4.01E+00
-4.02E+00
-3.80E+00
PASS
-4.02E+00
3.41E-03
-4.01E+00
-4.02E+00
-3.70E+00
PASS
-4.01E+00
3.23E-03
-4.01E+00
-4.02E+00
-3.70E+00
PASS
-4.01E+00
3.28E-03
-4.01E+00
-4.02E+00
-3.70E+00
PASS
-4.01E+00
3.40E-03
-4.01E+00
-4.02E+00
-3.70E+00
PASS
-4.01E+00
3.26E-03
-4.00E+00
-4.02E+00
-3.60E+00
PASS
-4.00E+00
3.55E-03
-4.00E+00
-4.01E+00
-3.50E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
116
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
Specification MAX
Output Voltage Swing Low @+/-5V RL=500 #2 (V)
-3.40E+00
-3.50E+00
-3.60E+00
-3.70E+00
-3.80E+00
-3.90E+00
-4.00E+00
-4.10E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.56. Plot of Output Voltage Swing Low @+/-5V RL=500 #2 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias and the
black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
117
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.56. Raw data for Output Voltage Swing Low @+/-5V RL=500 #2 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low @+/-5V RL=500 #2 (V)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MAX
Status
0
-4.02E+00
-4.02E+00
-4.03E+00
-4.03E+00
-4.03E+00
-4.02E+00
-4.03E+00
-4.03E+00
-4.01E+00
-4.03E+00
-4.03E+00
-4.02E+00
10
-4.01E+00
-4.01E+00
-4.02E+00
-4.03E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.01E+00
-4.02E+00
-4.02E+00
-4.02E+00
20
-4.01E+00
-4.01E+00
-4.02E+00
-4.03E+00
-4.02E+00
-4.01E+00
-4.01E+00
-4.02E+00
-4.01E+00
-4.02E+00
-4.02E+00
-4.02E+00
30
-4.01E+00
-4.01E+00
-4.02E+00
-4.03E+00
-4.01E+00
-4.01E+00
-4.01E+00
-4.01E+00
-4.01E+00
-4.02E+00
-4.02E+00
-4.02E+00
40
-4.01E+00
-4.01E+00
-4.02E+00
-4.02E+00
-4.01E+00
-4.01E+00
-4.01E+00
-4.02E+00
-4.01E+00
-4.02E+00
-4.02E+00
-4.02E+00
50
-4.01E+00
-4.01E+00
-4.01E+00
-4.02E+00
-4.01E+00
-4.01E+00
-4.01E+00
-4.02E+00
-4.01E+00
-4.02E+00
-4.02E+00
-4.02E+00
60
-4.01E+00
-4.01E+00
-4.01E+00
-4.02E+00
-4.01E+00
-4.01E+00
-4.01E+00
-4.02E+00
-4.01E+00
-4.02E+00
-4.02E+00
-4.02E+00
70
-4.01E+00
-4.01E+00
-4.01E+00
-4.02E+00
-4.01E+00
-4.01E+00
-4.01E+00
-4.02E+00
-4.01E+00
-4.02E+00
-4.02E+00
-4.02E+00
75
-4.01E+00
-4.01E+00
-4.01E+00
-4.02E+00
-4.01E+00
-4.01E+00
-4.01E+00
-4.01E+00
-4.01E+00
-4.02E+00
-4.02E+00
-4.02E+00
100
-4.01E+00
-4.01E+00
-4.01E+00
-4.02E+00
-4.01E+00
-4.01E+00
-4.01E+00
-4.01E+00
-4.01E+00
-4.02E+00
-4.02E+00
-4.02E+00
200
-4.00E+00
-4.00E+00
-4.00E+00
-4.01E+00
-4.00E+00
-4.00E+00
-4.00E+00
-4.01E+00
-4.00E+00
-4.01E+00
-4.02E+00
-4.02E+00
-4.02E+00
5.74E-03
-4.01E+00
-4.04E+00
-3.80E+00
PASS
-4.02E+00
5.79E-03
-4.01E+00
-4.03E+00
-3.80E+00
PASS
-4.02E+00
5.12E-03
-4.00E+00
-4.03E+00
-3.80E+00
PASS
-4.01E+00
4.27E-03
-4.01E+00
-4.02E+00
-3.80E+00
PASS
-4.01E+00
3.97E-03
-4.01E+00
-4.02E+00
-3.80E+00
PASS
-4.01E+00
3.60E-03
-4.01E+00
-4.02E+00
-3.70E+00
PASS
-4.01E+00
3.53E-03
-4.01E+00
-4.02E+00
-3.70E+00
PASS
-4.01E+00
3.57E-03
-4.01E+00
-4.02E+00
-3.70E+00
PASS
-4.01E+00
3.33E-03
-4.01E+00
-4.02E+00
-3.70E+00
PASS
-4.01E+00
3.58E-03
-4.00E+00
-4.02E+00
-3.60E+00
PASS
-4.00E+00
3.53E-03
-4.00E+00
-4.01E+00
-3.50E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
118
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
Specification MAX
Output Voltage Swing Low @+/-5V RL=500 #3 (V)
-3.40E+00
-3.50E+00
-3.60E+00
-3.70E+00
-3.80E+00
-3.90E+00
-4.00E+00
-4.10E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.57. Plot of Output Voltage Swing Low @+/-5V RL=500 #3 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias and the
black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
119
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.57. Raw data for Output Voltage Swing Low @+/-5V RL=500 #3 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low @+/-5V RL=500 #3 (V)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MAX
Status
0
-4.02E+00
-4.03E+00
-4.03E+00
-4.03E+00
-4.03E+00
-4.02E+00
-4.03E+00
-4.03E+00
-4.03E+00
-4.03E+00
-4.03E+00
-4.02E+00
10
-4.01E+00
-4.02E+00
-4.02E+00
-4.03E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.03E+00
-4.02E+00
20
-4.01E+00
-4.01E+00
-4.02E+00
-4.03E+00
-4.02E+00
-4.02E+00
-4.01E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.02E+00
30
-4.01E+00
-4.01E+00
-4.02E+00
-4.03E+00
-4.02E+00
-4.01E+00
-4.01E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.02E+00
40
-4.01E+00
-4.01E+00
-4.02E+00
-4.03E+00
-4.01E+00
-4.01E+00
-4.01E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.02E+00
50
-4.01E+00
-4.01E+00
-4.01E+00
-4.02E+00
-4.01E+00
-4.01E+00
-4.01E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.03E+00
-4.02E+00
60
-4.01E+00
-4.01E+00
-4.01E+00
-4.02E+00
-4.01E+00
-4.01E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.03E+00
-4.02E+00
70
-4.01E+00
-4.01E+00
-4.01E+00
-4.02E+00
-4.01E+00
-4.01E+00
-4.01E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.03E+00
-4.02E+00
75
-4.01E+00
-4.01E+00
-4.01E+00
-4.02E+00
-4.01E+00
-4.01E+00
-4.01E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.03E+00
-4.02E+00
100
-4.01E+00
-4.01E+00
-4.01E+00
-4.02E+00
-4.01E+00
-4.01E+00
-4.01E+00
-4.02E+00
-4.01E+00
-4.02E+00
-4.03E+00
-4.02E+00
200
-4.00E+00
-4.00E+00
-4.00E+00
-4.01E+00
-4.00E+00
-4.00E+00
-4.01E+00
-4.01E+00
-4.01E+00
-4.01E+00
-4.03E+00
-4.02E+00
-4.03E+00
3.31E-03
-4.02E+00
-4.03E+00
-3.80E+00
PASS
-4.02E+00
4.48E-03
-4.01E+00
-4.03E+00
-3.80E+00
PASS
-4.02E+00
4.64E-03
-4.01E+00
-4.03E+00
-3.80E+00
PASS
-4.02E+00
4.47E-03
-4.01E+00
-4.03E+00
-3.80E+00
PASS
-4.02E+00
4.06E-03
-4.01E+00
-4.02E+00
-3.80E+00
PASS
-4.02E+00
3.84E-03
-4.01E+00
-4.02E+00
-3.70E+00
PASS
-4.02E+00
3.57E-03
-4.01E+00
-4.02E+00
-3.70E+00
PASS
-4.01E+00
3.63E-03
-4.01E+00
-4.02E+00
-3.70E+00
PASS
-4.01E+00
3.79E-03
-4.01E+00
-4.02E+00
-3.70E+00
PASS
-4.01E+00
3.63E-03
-4.00E+00
-4.02E+00
-3.60E+00
PASS
-4.01E+00
3.78E-03
-4.00E+00
-4.01E+00
-3.50E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
120
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
Specification MAX
Output Voltage Swing Low @+/-5V RL=500 #4 (V)
-3.40E+00
-3.50E+00
-3.60E+00
-3.70E+00
-3.80E+00
-3.90E+00
-4.00E+00
-4.10E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.58. Plot of Output Voltage Swing Low @+/-5V RL=500 #4 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias and the
black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
121
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.58. Raw data for Output Voltage Swing Low @+/-5V RL=500 #4 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low @+/-5V RL=500 #4 (V)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MAX
Status
0
-4.02E+00
-4.03E+00
-4.03E+00
-4.03E+00
-4.03E+00
-4.03E+00
-4.02E+00
-4.03E+00
-4.03E+00
-4.02E+00
-4.03E+00
-4.02E+00
10
-4.02E+00
-4.02E+00
-4.02E+00
-4.03E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.03E+00
-4.02E+00
20
-4.01E+00
-4.01E+00
-4.02E+00
-4.03E+00
-4.02E+00
-4.01E+00
-4.01E+00
-4.01E+00
-4.02E+00
-4.01E+00
-4.03E+00
-4.02E+00
30
-4.01E+00
-4.01E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.01E+00
-4.01E+00
-4.01E+00
-4.01E+00
-4.01E+00
-4.03E+00
-4.02E+00
40
-4.01E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.01E+00
-4.01E+00
-4.01E+00
-4.01E+00
-4.01E+00
-4.03E+00
-4.02E+00
50
-4.01E+00
-4.01E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.01E+00
-4.01E+00
-4.01E+00
-4.01E+00
-4.01E+00
-4.03E+00
-4.02E+00
60
-4.01E+00
-4.01E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.01E+00
-4.01E+00
-4.01E+00
-4.01E+00
-4.01E+00
-4.03E+00
-4.02E+00
70
-4.01E+00
-4.01E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.01E+00
-4.01E+00
-4.01E+00
-4.01E+00
-4.01E+00
-4.03E+00
-4.02E+00
75
-4.01E+00
-4.01E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.01E+00
-4.01E+00
-4.01E+00
-4.01E+00
-4.01E+00
-4.03E+00
-4.02E+00
100
-4.01E+00
-4.01E+00
-4.01E+00
-4.02E+00
-4.02E+00
-4.01E+00
-4.01E+00
-4.01E+00
-4.01E+00
-4.01E+00
-4.03E+00
-4.02E+00
200
-4.00E+00
-4.01E+00
-4.01E+00
-4.01E+00
-4.01E+00
-4.00E+00
-4.00E+00
-4.00E+00
-4.00E+00
-4.00E+00
-4.03E+00
-4.02E+00
-4.03E+00
2.21E-03
-4.02E+00
-4.03E+00
-3.80E+00
PASS
-4.02E+00
3.44E-03
-4.01E+00
-4.03E+00
-3.80E+00
PASS
-4.02E+00
4.30E-03
-4.01E+00
-4.02E+00
-3.80E+00
PASS
-4.01E+00
4.20E-03
-4.01E+00
-4.02E+00
-3.80E+00
PASS
-4.01E+00
4.11E-03
-4.01E+00
-4.02E+00
-3.80E+00
PASS
-4.01E+00
4.00E-03
-4.01E+00
-4.02E+00
-3.70E+00
PASS
-4.01E+00
3.66E-03
-4.01E+00
-4.02E+00
-3.70E+00
PASS
-4.01E+00
3.46E-03
-4.01E+00
-4.02E+00
-3.70E+00
PASS
-4.01E+00
3.53E-03
-4.01E+00
-4.02E+00
-3.70E+00
PASS
-4.01E+00
3.44E-03
-4.00E+00
-4.02E+00
-3.60E+00
PASS
-4.00E+00
3.98E-03
-3.99E+00
-4.01E+00
-3.50E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
122
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
Specification MAX
Output Voltage Swing Low @+/-5V RL=100 #1 (V)
-3.00E+00
-3.10E+00
-3.20E+00
-3.30E+00
-3.40E+00
-3.50E+00
-3.60E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.59. Plot of Output Voltage Swing Low @+/-5V RL=100 #1 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias and the
black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
123
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.59. Raw data for Output Voltage Swing Low @+/-5V RL=100 #1 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low @+/-5V RL=100 #1 (V)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MAX
Status
0
-3.55E+00
-3.55E+00
-3.56E+00
-3.56E+00
-3.56E+00
-3.55E+00
-3.55E+00
-3.55E+00
-3.55E+00
-3.55E+00
-3.55E+00
-3.55E+00
10
-3.54E+00
-3.53E+00
-3.54E+00
-3.56E+00
-3.55E+00
-3.53E+00
-3.53E+00
-3.53E+00
-3.53E+00
-3.54E+00
-3.55E+00
-3.54E+00
20
-3.54E+00
-3.52E+00
-3.53E+00
-3.56E+00
-3.55E+00
-3.52E+00
-3.52E+00
-3.52E+00
-3.52E+00
-3.53E+00
-3.55E+00
-3.54E+00
30
-3.53E+00
-3.52E+00
-3.53E+00
-3.56E+00
-3.55E+00
-3.52E+00
-3.52E+00
-3.52E+00
-3.52E+00
-3.53E+00
-3.55E+00
-3.54E+00
40
-3.53E+00
-3.53E+00
-3.54E+00
-3.56E+00
-3.56E+00
-3.53E+00
-3.52E+00
-3.52E+00
-3.53E+00
-3.53E+00
-3.55E+00
-3.54E+00
50
-3.53E+00
-3.53E+00
-3.54E+00
-3.56E+00
-3.56E+00
-3.53E+00
-3.52E+00
-3.52E+00
-3.53E+00
-3.53E+00
-3.55E+00
-3.54E+00
60
-3.53E+00
-3.53E+00
-3.54E+00
-3.56E+00
-3.56E+00
-3.53E+00
-3.52E+00
-3.53E+00
-3.53E+00
-3.53E+00
-3.55E+00
-3.54E+00
70
-3.53E+00
-3.53E+00
-3.54E+00
-3.56E+00
-3.56E+00
-3.53E+00
-3.52E+00
-3.53E+00
-3.53E+00
-3.53E+00
-3.55E+00
-3.54E+00
75
-3.53E+00
-3.53E+00
-3.54E+00
-3.55E+00
-3.56E+00
-3.53E+00
-3.52E+00
-3.52E+00
-3.53E+00
-3.53E+00
-3.55E+00
-3.54E+00
100
-3.53E+00
-3.53E+00
-3.54E+00
-3.55E+00
-3.56E+00
-3.53E+00
-3.52E+00
-3.52E+00
-3.53E+00
-3.52E+00
-3.55E+00
-3.54E+00
200
-3.52E+00
-3.51E+00
-3.53E+00
-3.53E+00
-3.55E+00
-3.51E+00
-3.50E+00
-3.50E+00
-3.51E+00
-3.50E+00
-3.55E+00
-3.54E+00
-3.55E+00
6.11E-03
-3.54E+00
-3.57E+00
-3.35E+00
PASS
-3.54E+00
1.17E-02
-3.51E+00
-3.56E+00
-3.30E+00
PASS
-3.53E+00
1.40E-02
-3.50E+00
-3.56E+00
-3.30E+00
PASS
-3.53E+00
1.45E-02
-3.50E+00
-3.56E+00
-3.30E+00
PASS
-3.53E+00
1.38E-02
-3.50E+00
-3.56E+00
-3.30E+00
PASS
-3.53E+00
1.35E-02
-3.51E+00
-3.56E+00
-3.25E+00
PASS
-3.54E+00
1.32E-02
-3.51E+00
-3.56E+00
-3.25E+00
PASS
-3.54E+00
1.28E-02
-3.51E+00
-3.56E+00
-3.25E+00
PASS
-3.53E+00
1.29E-02
-3.51E+00
-3.56E+00
-3.25E+00
PASS
-3.53E+00
1.27E-02
-3.51E+00
-3.56E+00
-3.15E+00
PASS
-3.52E+00
1.46E-02
-3.49E+00
-3.55E+00
-3.05E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
124
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
Specification MAX
Output Voltage Swing Low @+/-5V RL=100 #2 (V)
-3.00E+00
-3.10E+00
-3.20E+00
-3.30E+00
-3.40E+00
-3.50E+00
-3.60E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.60. Plot of Output Voltage Swing Low @+/-5V RL=100 #2 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias and the
black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
125
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.60. Raw data for Output Voltage Swing Low @+/-5V RL=100 #2 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low @+/-5V RL=100 #2 (V)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MAX
Status
0
-3.54E+00
-3.53E+00
-3.55E+00
-3.57E+00
-3.56E+00
-3.55E+00
-3.55E+00
-3.55E+00
-3.52E+00
-3.56E+00
-3.55E+00
-3.54E+00
10
-3.52E+00
-3.51E+00
-3.54E+00
-3.57E+00
-3.55E+00
-3.53E+00
-3.53E+00
-3.54E+00
-3.51E+00
-3.56E+00
-3.54E+00
-3.54E+00
20
-3.51E+00
-3.51E+00
-3.53E+00
-3.57E+00
-3.54E+00
-3.53E+00
-3.52E+00
-3.53E+00
-3.51E+00
-3.55E+00
-3.54E+00
-3.54E+00
30
-3.51E+00
-3.52E+00
-3.53E+00
-3.57E+00
-3.54E+00
-3.52E+00
-3.52E+00
-3.53E+00
-3.52E+00
-3.55E+00
-3.54E+00
-3.54E+00
40
-3.51E+00
-3.53E+00
-3.53E+00
-3.57E+00
-3.54E+00
-3.52E+00
-3.52E+00
-3.53E+00
-3.53E+00
-3.55E+00
-3.54E+00
-3.54E+00
50
-3.51E+00
-3.53E+00
-3.53E+00
-3.57E+00
-3.54E+00
-3.52E+00
-3.53E+00
-3.54E+00
-3.53E+00
-3.55E+00
-3.54E+00
-3.54E+00
60
-3.52E+00
-3.53E+00
-3.54E+00
-3.57E+00
-3.54E+00
-3.52E+00
-3.53E+00
-3.54E+00
-3.53E+00
-3.56E+00
-3.54E+00
-3.54E+00
70
-3.52E+00
-3.53E+00
-3.54E+00
-3.57E+00
-3.54E+00
-3.52E+00
-3.53E+00
-3.54E+00
-3.54E+00
-3.56E+00
-3.54E+00
-3.54E+00
75
-3.52E+00
-3.53E+00
-3.54E+00
-3.57E+00
-3.54E+00
-3.52E+00
-3.53E+00
-3.54E+00
-3.54E+00
-3.56E+00
-3.54E+00
-3.54E+00
100
-3.52E+00
-3.53E+00
-3.53E+00
-3.56E+00
-3.54E+00
-3.52E+00
-3.53E+00
-3.54E+00
-3.54E+00
-3.56E+00
-3.54E+00
-3.54E+00
200
-3.50E+00
-3.52E+00
-3.52E+00
-3.54E+00
-3.52E+00
-3.50E+00
-3.52E+00
-3.53E+00
-3.52E+00
-3.55E+00
-3.54E+00
-3.54E+00
-3.55E+00
1.66E-02
-3.51E+00
-3.58E+00
-3.35E+00
PASS
-3.54E+00
1.92E-02
-3.50E+00
-3.57E+00
-3.30E+00
PASS
-3.53E+00
1.91E-02
-3.49E+00
-3.57E+00
-3.30E+00
PASS
-3.53E+00
1.78E-02
-3.49E+00
-3.57E+00
-3.30E+00
PASS
-3.53E+00
1.70E-02
-3.50E+00
-3.57E+00
-3.30E+00
PASS
-3.54E+00
1.57E-02
-3.50E+00
-3.57E+00
-3.25E+00
PASS
-3.54E+00
1.49E-02
-3.51E+00
-3.57E+00
-3.25E+00
PASS
-3.54E+00
1.46E-02
-3.51E+00
-3.57E+00
-3.25E+00
PASS
-3.54E+00
1.44E-02
-3.51E+00
-3.57E+00
-3.25E+00
PASS
-3.54E+00
1.41E-02
-3.51E+00
-3.57E+00
-3.15E+00
PASS
-3.52E+00
1.52E-02
-3.49E+00
-3.55E+00
-3.05E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
126
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
Specification MAX
Output Voltage Swing Low @+/-5V RL=100 #3 (V)
-3.00E+00
-3.10E+00
-3.20E+00
-3.30E+00
-3.40E+00
-3.50E+00
-3.60E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.61. Plot of Output Voltage Swing Low @+/-5V RL=100 #3 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias and the
black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
127
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.61. Raw data for Output Voltage Swing Low @+/-5V RL=100 #3 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low @+/-5V RL=100 #3 (V)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MAX
Status
0
-3.53E+00
-3.55E+00
-3.55E+00
-3.58E+00
-3.56E+00
-3.55E+00
-3.55E+00
-3.56E+00
-3.56E+00
-3.57E+00
-3.55E+00
-3.55E+00
10
-3.50E+00
-3.53E+00
-3.54E+00
-3.58E+00
-3.55E+00
-3.54E+00
-3.53E+00
-3.54E+00
-3.54E+00
-3.56E+00
-3.55E+00
-3.54E+00
20
-3.50E+00
-3.53E+00
-3.53E+00
-3.58E+00
-3.54E+00
-3.53E+00
-3.52E+00
-3.54E+00
-3.53E+00
-3.55E+00
-3.55E+00
-3.54E+00
30
-3.51E+00
-3.53E+00
-3.53E+00
-3.58E+00
-3.54E+00
-3.53E+00
-3.52E+00
-3.54E+00
-3.53E+00
-3.55E+00
-3.55E+00
-3.54E+00
40
-3.51E+00
-3.53E+00
-3.53E+00
-3.58E+00
-3.54E+00
-3.53E+00
-3.52E+00
-3.54E+00
-3.54E+00
-3.56E+00
-3.55E+00
-3.54E+00
50
-3.52E+00
-3.54E+00
-3.53E+00
-3.58E+00
-3.54E+00
-3.53E+00
-3.53E+00
-3.54E+00
-3.54E+00
-3.56E+00
-3.55E+00
-3.54E+00
60
-3.52E+00
-3.54E+00
-3.53E+00
-3.58E+00
-3.54E+00
-3.53E+00
-3.53E+00
-3.54E+00
-3.54E+00
-3.56E+00
-3.55E+00
-3.54E+00
70
-3.52E+00
-3.54E+00
-3.53E+00
-3.57E+00
-3.54E+00
-3.53E+00
-3.53E+00
-3.54E+00
-3.54E+00
-3.56E+00
-3.55E+00
-3.55E+00
75
-3.52E+00
-3.54E+00
-3.53E+00
-3.57E+00
-3.54E+00
-3.53E+00
-3.53E+00
-3.54E+00
-3.54E+00
-3.56E+00
-3.55E+00
-3.54E+00
100
-3.52E+00
-3.54E+00
-3.53E+00
-3.57E+00
-3.54E+00
-3.53E+00
-3.53E+00
-3.55E+00
-3.54E+00
-3.56E+00
-3.55E+00
-3.54E+00
200
-3.50E+00
-3.52E+00
-3.51E+00
-3.55E+00
-3.52E+00
-3.52E+00
-3.52E+00
-3.54E+00
-3.53E+00
-3.55E+00
-3.55E+00
-3.55E+00
-3.55E+00
1.34E-02
-3.53E+00
-3.58E+00
-3.35E+00
PASS
-3.54E+00
1.89E-02
-3.50E+00
-3.58E+00
-3.30E+00
PASS
-3.54E+00
1.93E-02
-3.50E+00
-3.58E+00
-3.30E+00
PASS
-3.53E+00
1.91E-02
-3.50E+00
-3.57E+00
-3.30E+00
PASS
-3.54E+00
1.78E-02
-3.50E+00
-3.57E+00
-3.30E+00
PASS
-3.54E+00
1.66E-02
-3.50E+00
-3.57E+00
-3.25E+00
PASS
-3.54E+00
1.62E-02
-3.51E+00
-3.57E+00
-3.25E+00
PASS
-3.54E+00
1.55E-02
-3.51E+00
-3.57E+00
-3.25E+00
PASS
-3.54E+00
1.52E-02
-3.51E+00
-3.57E+00
-3.25E+00
PASS
-3.54E+00
1.52E-02
-3.51E+00
-3.57E+00
-3.15E+00
PASS
-3.53E+00
1.65E-02
-3.49E+00
-3.56E+00
-3.05E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
128
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
Specification MAX
Output Voltage Swing Low @+/-5V RL=100 #4 (V)
-3.00E+00
-3.10E+00
-3.20E+00
-3.30E+00
-3.40E+00
-3.50E+00
-3.60E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.62. Plot of Output Voltage Swing Low @+/-5V RL=100 #4 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias and the
black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
129
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.62. Raw data for Output Voltage Swing Low @+/-5V RL=100 #4 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low @+/-5V RL=100 #4 (V)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MAX
Status
0
-3.55E+00
-3.55E+00
-3.56E+00
-3.56E+00
-3.57E+00
-3.55E+00
-3.54E+00
-3.55E+00
-3.55E+00
-3.55E+00
-3.56E+00
-3.54E+00
10
-3.54E+00
-3.53E+00
-3.54E+00
-3.56E+00
-3.56E+00
-3.53E+00
-3.52E+00
-3.53E+00
-3.53E+00
-3.53E+00
-3.56E+00
-3.53E+00
20
-3.53E+00
-3.53E+00
-3.54E+00
-3.56E+00
-3.55E+00
-3.52E+00
-3.52E+00
-3.52E+00
-3.52E+00
-3.53E+00
-3.55E+00
-3.53E+00
30
-3.53E+00
-3.53E+00
-3.54E+00
-3.56E+00
-3.55E+00
-3.52E+00
-3.51E+00
-3.52E+00
-3.52E+00
-3.52E+00
-3.56E+00
-3.53E+00
40
-3.53E+00
-3.53E+00
-3.54E+00
-3.56E+00
-3.55E+00
-3.52E+00
-3.52E+00
-3.52E+00
-3.52E+00
-3.53E+00
-3.56E+00
-3.53E+00
50
-3.53E+00
-3.53E+00
-3.54E+00
-3.56E+00
-3.55E+00
-3.52E+00
-3.52E+00
-3.52E+00
-3.53E+00
-3.53E+00
-3.56E+00
-3.53E+00
60
-3.53E+00
-3.54E+00
-3.54E+00
-3.56E+00
-3.55E+00
-3.52E+00
-3.52E+00
-3.52E+00
-3.53E+00
-3.53E+00
-3.56E+00
-3.53E+00
70
-3.53E+00
-3.54E+00
-3.55E+00
-3.55E+00
-3.55E+00
-3.52E+00
-3.52E+00
-3.52E+00
-3.53E+00
-3.53E+00
-3.56E+00
-3.53E+00
75
-3.53E+00
-3.53E+00
-3.54E+00
-3.55E+00
-3.55E+00
-3.53E+00
-3.52E+00
-3.52E+00
-3.53E+00
-3.53E+00
-3.56E+00
-3.53E+00
100
-3.53E+00
-3.53E+00
-3.55E+00
-3.55E+00
-3.55E+00
-3.52E+00
-3.52E+00
-3.52E+00
-3.53E+00
-3.52E+00
-3.56E+00
-3.53E+00
200
-3.52E+00
-3.52E+00
-3.54E+00
-3.53E+00
-3.54E+00
-3.51E+00
-3.50E+00
-3.50E+00
-3.51E+00
-3.50E+00
-3.56E+00
-3.53E+00
-3.55E+00
7.12E-03
-3.54E+00
-3.57E+00
-3.35E+00
PASS
-3.54E+00
1.23E-02
-3.51E+00
-3.56E+00
-3.30E+00
PASS
-3.53E+00
1.49E-02
-3.50E+00
-3.56E+00
-3.30E+00
PASS
-3.53E+00
1.48E-02
-3.50E+00
-3.56E+00
-3.30E+00
PASS
-3.53E+00
1.41E-02
-3.50E+00
-3.56E+00
-3.30E+00
PASS
-3.53E+00
1.36E-02
-3.50E+00
-3.56E+00
-3.25E+00
PASS
-3.53E+00
1.30E-02
-3.51E+00
-3.56E+00
-3.25E+00
PASS
-3.53E+00
1.29E-02
-3.51E+00
-3.56E+00
-3.25E+00
PASS
-3.53E+00
1.24E-02
-3.51E+00
-3.56E+00
-3.25E+00
PASS
-3.53E+00
1.21E-02
-3.51E+00
-3.56E+00
-3.15E+00
PASS
-3.52E+00
1.51E-02
-3.49E+00
-3.55E+00
-3.05E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
130
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Maximum Output Source Current @+/-5V #1 (A)
7.00E-02
6.00E-02
5.00E-02
4.00E-02
3.00E-02
2.00E-02
1.00E-02
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.63. Plot of Maximum Output Source Current @+/-5V #1 (A) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
131
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.63. Raw data for Maximum Output Source Current @+/-5V #1 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Maximum Output Source Current @+/-5V #1 (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
6.02E-02
6.17E-02
6.23E-02
6.31E-02
6.36E-02
6.01E-02
5.99E-02
6.06E-02
6.11E-02
6.04E-02
6.13E-02
6.19E-02
10
6.02E-02
6.17E-02
6.23E-02
6.32E-02
6.36E-02
6.01E-02
5.99E-02
6.07E-02
6.12E-02
6.05E-02
6.16E-02
6.22E-02
20
6.02E-02
6.17E-02
6.24E-02
6.31E-02
6.35E-02
6.01E-02
5.99E-02
6.06E-02
6.12E-02
6.04E-02
6.16E-02
6.22E-02
30
6.01E-02
6.16E-02
6.23E-02
6.30E-02
6.35E-02
6.00E-02
5.96E-02
6.06E-02
6.11E-02
6.02E-02
6.16E-02
6.22E-02
40
6.01E-02
6.15E-02
6.22E-02
6.29E-02
6.34E-02
5.99E-02
5.96E-02
6.05E-02
6.10E-02
6.02E-02
6.16E-02
6.22E-02
50
6.00E-02
6.13E-02
6.22E-02
6.28E-02
6.33E-02
5.99E-02
5.94E-02
6.04E-02
6.10E-02
6.01E-02
6.16E-02
6.22E-02
60
5.99E-02
6.13E-02
6.20E-02
6.27E-02
6.31E-02
5.97E-02
5.94E-02
6.02E-02
6.08E-02
6.01E-02
6.16E-02
6.22E-02
70
5.98E-02
6.12E-02
6.20E-02
6.25E-02
6.30E-02
5.96E-02
5.93E-02
6.02E-02
6.08E-02
6.00E-02
6.16E-02
6.22E-02
75
5.98E-02
6.12E-02
6.20E-02
6.25E-02
6.30E-02
5.96E-02
5.92E-02
6.01E-02
6.08E-02
5.99E-02
6.16E-02
6.22E-02
100
5.95E-02
6.09E-02
6.17E-02
6.22E-02
6.27E-02
5.93E-02
5.88E-02
5.99E-02
6.05E-02
5.96E-02
6.15E-02
6.21E-02
200
5.85E-02
6.00E-02
6.10E-02
6.10E-02
6.17E-02
5.82E-02
5.75E-02
5.89E-02
5.98E-02
5.88E-02
6.15E-02
6.21E-02
6.13E-02
1.32E-03
6.40E-02
5.86E-02
4.00E-02
PASS
6.13E-02
1.32E-03
6.41E-02
5.86E-02
4.00E-02
PASS
6.13E-02
1.32E-03
6.40E-02
5.86E-02
4.00E-02
PASS
6.12E-02
1.35E-03
6.40E-02
5.84E-02
4.00E-02
PASS
6.11E-02
1.32E-03
6.38E-02
5.84E-02
4.00E-02
PASS
6.10E-02
1.33E-03
6.38E-02
5.83E-02
4.00E-02
PASS
6.09E-02
1.31E-03
6.36E-02
5.82E-02
4.00E-02
PASS
6.08E-02
1.31E-03
6.35E-02
5.81E-02
4.00E-02
PASS
6.08E-02
1.34E-03
6.36E-02
5.80E-02
4.00E-02
PASS
6.05E-02
1.32E-03
6.32E-02
5.78E-02
4.00E-02
PASS
5.95E-02
1.37E-03
6.24E-02
5.67E-02
4.00E-02
PASS
An ISO 9001:2008 and DSCC Certified Company
132
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Maximum Output Source Current @+/-5V #2 (A)
7.00E-02
6.00E-02
5.00E-02
4.00E-02
3.00E-02
2.00E-02
1.00E-02
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.64. Plot of Maximum Output Source Current @+/-5V #2 (A) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
133
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.64. Raw data for Maximum Output Source Current @+/-5V #2 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Maximum Output Source Current @+/-5V #2 (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
5.99E-02
6.16E-02
6.11E-02
6.39E-02
6.14E-02
6.01E-02
6.15E-02
6.18E-02
6.18E-02
6.34E-02
6.07E-02
5.99E-02
10
5.96E-02
6.16E-02
6.11E-02
6.40E-02
6.15E-02
6.01E-02
6.15E-02
6.20E-02
6.19E-02
6.35E-02
6.08E-02
6.01E-02
20
5.97E-02
6.16E-02
6.12E-02
6.41E-02
6.15E-02
6.02E-02
6.16E-02
6.19E-02
6.19E-02
6.35E-02
6.09E-02
6.01E-02
30
5.95E-02
6.14E-02
6.11E-02
6.40E-02
6.13E-02
6.01E-02
6.15E-02
6.19E-02
6.18E-02
6.33E-02
6.08E-02
6.01E-02
40
5.94E-02
6.13E-02
6.10E-02
6.40E-02
6.12E-02
6.00E-02
6.13E-02
6.18E-02
6.18E-02
6.31E-02
6.09E-02
6.01E-02
50
5.93E-02
6.13E-02
6.09E-02
6.39E-02
6.11E-02
6.00E-02
6.13E-02
6.18E-02
6.17E-02
6.31E-02
6.09E-02
6.01E-02
60
5.92E-02
6.12E-02
6.08E-02
6.39E-02
6.11E-02
5.99E-02
6.11E-02
6.17E-02
6.17E-02
6.30E-02
6.08E-02
6.01E-02
70
5.90E-02
6.11E-02
6.07E-02
6.38E-02
6.10E-02
5.98E-02
6.11E-02
6.16E-02
6.16E-02
6.29E-02
6.08E-02
6.01E-02
75
5.90E-02
6.11E-02
6.07E-02
6.39E-02
6.10E-02
5.98E-02
6.11E-02
6.16E-02
6.16E-02
6.28E-02
6.09E-02
6.01E-02
100
5.87E-02
6.07E-02
6.05E-02
6.36E-02
6.07E-02
5.95E-02
6.09E-02
6.13E-02
6.13E-02
6.25E-02
6.08E-02
6.00E-02
200
5.75E-02
6.00E-02
5.98E-02
6.30E-02
5.98E-02
5.87E-02
6.00E-02
6.06E-02
6.07E-02
6.16E-02
6.09E-02
6.01E-02
6.16E-02
1.25E-03
6.42E-02
5.91E-02
4.00E-02
PASS
6.17E-02
1.33E-03
6.44E-02
5.89E-02
4.00E-02
PASS
6.17E-02
1.32E-03
6.44E-02
5.90E-02
4.00E-02
PASS
6.16E-02
1.31E-03
6.43E-02
5.89E-02
4.00E-02
PASS
6.15E-02
1.34E-03
6.43E-02
5.87E-02
4.00E-02
PASS
6.14E-02
1.33E-03
6.42E-02
5.87E-02
4.00E-02
PASS
6.14E-02
1.36E-03
6.42E-02
5.85E-02
4.00E-02
PASS
6.12E-02
1.38E-03
6.41E-02
5.84E-02
4.00E-02
PASS
6.13E-02
1.37E-03
6.41E-02
5.84E-02
4.00E-02
PASS
6.10E-02
1.40E-03
6.39E-02
5.81E-02
4.00E-02
PASS
6.02E-02
1.51E-03
6.33E-02
5.70E-02
4.00E-02
PASS
An ISO 9001:2008 and DSCC Certified Company
134
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Maximum Output Source Current @+/-5V #3 (A)
7.00E-02
6.00E-02
5.00E-02
4.00E-02
3.00E-02
2.00E-02
1.00E-02
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.65. Plot of Maximum Output Source Current @+/-5V #3 (A) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
135
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.65. Raw data for Maximum Output Source Current @+/-5V #3 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Maximum Output Source Current @+/-5V #3 (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
5.97E-02
6.17E-02
6.11E-02
6.42E-02
6.13E-02
6.03E-02
6.16E-02
6.19E-02
6.18E-02
6.33E-02
6.10E-02
5.98E-02
10
5.97E-02
6.18E-02
6.11E-02
6.44E-02
6.12E-02
6.04E-02
6.16E-02
6.23E-02
6.19E-02
6.34E-02
6.11E-02
6.00E-02
20
5.96E-02
6.18E-02
6.12E-02
6.44E-02
6.13E-02
6.04E-02
6.16E-02
6.22E-02
6.19E-02
6.33E-02
6.12E-02
6.00E-02
30
5.95E-02
6.16E-02
6.11E-02
6.42E-02
6.12E-02
6.02E-02
6.15E-02
6.21E-02
6.17E-02
6.32E-02
6.11E-02
6.00E-02
40
5.94E-02
6.16E-02
6.11E-02
6.42E-02
6.12E-02
6.01E-02
6.15E-02
6.20E-02
6.16E-02
6.31E-02
6.11E-02
6.00E-02
50
5.94E-02
6.15E-02
6.10E-02
6.41E-02
6.11E-02
6.00E-02
6.14E-02
6.18E-02
6.16E-02
6.30E-02
6.11E-02
6.00E-02
60
5.93E-02
6.14E-02
6.08E-02
6.40E-02
6.11E-02
5.99E-02
6.12E-02
6.18E-02
6.14E-02
6.29E-02
6.11E-02
6.00E-02
70
5.91E-02
6.13E-02
6.08E-02
6.40E-02
6.10E-02
5.97E-02
6.12E-02
6.17E-02
6.14E-02
6.28E-02
6.11E-02
6.00E-02
75
5.92E-02
6.12E-02
6.07E-02
6.39E-02
6.09E-02
5.97E-02
6.12E-02
6.16E-02
6.13E-02
6.27E-02
6.11E-02
6.00E-02
100
5.88E-02
6.10E-02
6.05E-02
6.37E-02
6.07E-02
5.94E-02
6.10E-02
6.13E-02
6.11E-02
6.24E-02
6.10E-02
5.99E-02
200
5.78E-02
6.03E-02
5.98E-02
6.29E-02
6.00E-02
5.82E-02
6.01E-02
6.05E-02
6.01E-02
6.14E-02
6.11E-02
6.00E-02
6.17E-02
1.30E-03
6.44E-02
5.90E-02
4.00E-02
PASS
6.18E-02
1.37E-03
6.46E-02
5.90E-02
4.00E-02
PASS
6.18E-02
1.34E-03
6.45E-02
5.90E-02
4.00E-02
PASS
6.16E-02
1.34E-03
6.44E-02
5.89E-02
4.00E-02
PASS
6.16E-02
1.36E-03
6.44E-02
5.88E-02
4.00E-02
PASS
6.15E-02
1.36E-03
6.43E-02
5.87E-02
4.00E-02
PASS
6.14E-02
1.35E-03
6.42E-02
5.86E-02
4.00E-02
PASS
6.13E-02
1.38E-03
6.41E-02
5.84E-02
4.00E-02
PASS
6.12E-02
1.34E-03
6.40E-02
5.85E-02
4.00E-02
PASS
6.10E-02
1.39E-03
6.39E-02
5.81E-02
4.00E-02
PASS
6.01E-02
1.45E-03
6.31E-02
5.71E-02
4.00E-02
PASS
An ISO 9001:2008 and DSCC Certified Company
136
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Maximum Output Source Current @+/-5V #4 (A)
7.00E-02
6.00E-02
5.00E-02
4.00E-02
3.00E-02
2.00E-02
1.00E-02
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.66. Plot of Maximum Output Source Current @+/-5V #4 (A) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
137
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.66. Raw data for Maximum Output Source Current @+/-5V #4 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Maximum Output Source Current @+/-5V #4 (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
6.06E-02
6.14E-02
6.20E-02
6.25E-02
6.32E-02
6.02E-02
6.01E-02
6.06E-02
6.10E-02
6.05E-02
6.13E-02
6.19E-02
10
6.05E-02
6.13E-02
6.21E-02
6.26E-02
6.32E-02
6.02E-02
6.02E-02
6.08E-02
6.11E-02
6.05E-02
6.15E-02
6.22E-02
20
6.05E-02
6.15E-02
6.21E-02
6.26E-02
6.33E-02
6.02E-02
6.02E-02
6.07E-02
6.10E-02
6.04E-02
6.16E-02
6.21E-02
30
6.04E-02
6.13E-02
6.21E-02
6.24E-02
6.31E-02
6.00E-02
6.01E-02
6.06E-02
6.09E-02
6.02E-02
6.16E-02
6.21E-02
40
6.02E-02
6.12E-02
6.19E-02
6.23E-02
6.30E-02
5.99E-02
6.00E-02
6.06E-02
6.08E-02
6.02E-02
6.15E-02
6.21E-02
50
6.01E-02
6.11E-02
6.18E-02
6.22E-02
6.29E-02
5.98E-02
5.99E-02
6.06E-02
6.07E-02
6.01E-02
6.15E-02
6.21E-02
60
6.00E-02
6.10E-02
6.18E-02
6.21E-02
6.29E-02
5.96E-02
5.99E-02
6.05E-02
6.06E-02
6.00E-02
6.15E-02
6.21E-02
70
5.99E-02
6.10E-02
6.17E-02
6.19E-02
6.27E-02
5.95E-02
5.97E-02
6.03E-02
6.06E-02
5.99E-02
6.14E-02
6.21E-02
75
5.99E-02
6.09E-02
6.17E-02
6.18E-02
6.27E-02
5.95E-02
5.98E-02
6.04E-02
6.05E-02
5.99E-02
6.15E-02
6.21E-02
100
5.95E-02
6.06E-02
6.14E-02
6.15E-02
6.24E-02
5.91E-02
5.95E-02
6.02E-02
6.02E-02
5.95E-02
6.15E-02
6.21E-02
200
5.84E-02
5.96E-02
6.06E-02
6.01E-02
6.16E-02
5.79E-02
5.87E-02
5.97E-02
5.93E-02
5.85E-02
6.15E-02
6.21E-02
6.12E-02
1.05E-03
6.34E-02
5.91E-02
4.00E-02
PASS
6.12E-02
1.04E-03
6.34E-02
5.91E-02
4.00E-02
PASS
6.12E-02
1.06E-03
6.34E-02
5.90E-02
4.00E-02
PASS
6.11E-02
1.08E-03
6.33E-02
5.89E-02
4.00E-02
PASS
6.10E-02
1.08E-03
6.32E-02
5.88E-02
4.00E-02
PASS
6.09E-02
1.07E-03
6.31E-02
5.87E-02
4.00E-02
PASS
6.08E-02
1.08E-03
6.31E-02
5.86E-02
4.00E-02
PASS
6.07E-02
1.07E-03
6.29E-02
5.85E-02
4.00E-02
PASS
6.07E-02
1.05E-03
6.29E-02
5.85E-02
4.00E-02
PASS
6.04E-02
1.08E-03
6.26E-02
5.82E-02
4.00E-02
PASS
5.94E-02
1.12E-03
6.17E-02
5.71E-02
4.00E-02
PASS
An ISO 9001:2008 and DSCC Certified Company
138
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
Specification MAX
Maximum Output Sink Current @+/-5V #1 (A)
0.00E+00
-1.00E-02
-2.00E-02
-3.00E-02
-4.00E-02
-5.00E-02
-6.00E-02
0
50
100
150
Total Dose (krad(Si))
Figure 5.67. Plot of Maximum Output Sink Current @+/-5V #1 (A) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
139
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.67. Raw data for Maximum Output Sink Current @+/-5V #1 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Maximum Output Sink Current @+/-5V #1 (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MAX
Status
0
-5.12E-02
-5.18E-02
-5.28E-02
-5.35E-02
-5.41E-02
-5.07E-02
-5.02E-02
-5.10E-02
-5.15E-02
-5.10E-02
-5.17E-02
-5.20E-02
10
-5.08E-02
-5.11E-02
-5.22E-02
-5.35E-02
-5.37E-02
-5.01E-02
-4.99E-02
-5.05E-02
-5.10E-02
-5.06E-02
-5.17E-02
-5.19E-02
20
-5.06E-02
-5.08E-02
-5.19E-02
-5.35E-02
-5.35E-02
-5.00E-02
-4.96E-02
-5.01E-02
-5.06E-02
-5.02E-02
-5.17E-02
-5.20E-02
30
-5.05E-02
-5.08E-02
-5.18E-02
-5.34E-02
-5.36E-02
-5.00E-02
-4.95E-02
-5.00E-02
-5.05E-02
-5.02E-02
-5.17E-02
-5.20E-02
40
-5.05E-02
-5.08E-02
-5.18E-02
-5.31E-02
-5.37E-02
-5.00E-02
-4.95E-02
-5.00E-02
-5.05E-02
-5.01E-02
-5.17E-02
-5.21E-02
50
-5.05E-02
-5.09E-02
-5.19E-02
-5.31E-02
-5.38E-02
-5.00E-02
-4.95E-02
-5.00E-02
-5.05E-02
-5.00E-02
-5.18E-02
-5.21E-02
60
-5.04E-02
-5.08E-02
-5.19E-02
-5.29E-02
-5.38E-02
-5.00E-02
-4.94E-02
-4.99E-02
-5.04E-02
-5.00E-02
-5.18E-02
-5.21E-02
70
-5.04E-02
-5.08E-02
-5.19E-02
-5.25E-02
-5.37E-02
-4.99E-02
-4.94E-02
-4.98E-02
-5.04E-02
-4.99E-02
-5.18E-02
-5.21E-02
75
-5.04E-02
-5.07E-02
-5.18E-02
-5.26E-02
-5.37E-02
-4.99E-02
-4.93E-02
-4.98E-02
-5.02E-02
-4.98E-02
-5.18E-02
-5.21E-02
100
-5.01E-02
-5.04E-02
-5.16E-02
-5.20E-02
-5.34E-02
-4.96E-02
-4.90E-02
-4.94E-02
-4.99E-02
-4.94E-02
-5.17E-02
-5.21E-02
200
-4.93E-02
-4.90E-02
-5.02E-02
-5.05E-02
-5.23E-02
-4.85E-02
-4.78E-02
-4.81E-02
-4.83E-02
-4.78E-02
-5.18E-02
-5.21E-02
-5.18E-02
1.28E-03
-4.91E-02
-5.44E-02
-4.00E-02
PASS
-5.13E-02
1.35E-03
-4.86E-02
-5.41E-02
-4.00E-02
PASS
-5.11E-02
1.42E-03
-4.82E-02
-5.40E-02
-4.00E-02
PASS
-5.10E-02
1.44E-03
-4.81E-02
-5.40E-02
-4.00E-02
PASS
-5.10E-02
1.42E-03
-4.81E-02
-5.39E-02
-4.00E-02
PASS
-5.10E-02
1.46E-03
-4.80E-02
-5.40E-02
-4.00E-02
PASS
-5.09E-02
1.45E-03
-4.80E-02
-5.39E-02
-4.00E-02
PASS
-5.09E-02
1.41E-03
-4.80E-02
-5.38E-02
-4.00E-02
PASS
-5.08E-02
1.43E-03
-4.79E-02
-5.38E-02
-4.00E-02
PASS
-5.05E-02
1.40E-03
-4.76E-02
-5.34E-02
-4.00E-02
PASS
-4.92E-02
1.44E-03
-4.62E-02
-5.22E-02
-4.00E-02
PASS
An ISO 9001:2008 and DSCC Certified Company
140
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
Specification MAX
Maximum Output Sink Current @+/-5V #2 (A)
0.00E+00
-1.00E-02
-2.00E-02
-3.00E-02
-4.00E-02
-5.00E-02
-6.00E-02
0
50
100
150
Total Dose (krad(Si))
Figure 5.68. Plot of Maximum Output Sink Current @+/-5V #2 (A) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
141
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.68. Raw data for Maximum Output Sink Current @+/-5V #2 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Maximum Output Sink Current @+/-5V #2 (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MAX
Status
0
-4.98E-02
-5.11E-02
-5.16E-02
-5.47E-02
-5.19E-02
-5.06E-02
-5.19E-02
-5.27E-02
-5.10E-02
-5.42E-02
-5.08E-02
-5.00E-02
10
-4.93E-02
-5.07E-02
-5.11E-02
-5.46E-02
-5.16E-02
-5.02E-02
-5.15E-02
-5.22E-02
-5.10E-02
-5.40E-02
-5.07E-02
-4.99E-02
20
-4.91E-02
-5.07E-02
-5.09E-02
-5.46E-02
-5.14E-02
-5.00E-02
-5.12E-02
-5.19E-02
-5.09E-02
-5.39E-02
-5.07E-02
-5.00E-02
30
-4.90E-02
-5.10E-02
-5.07E-02
-5.45E-02
-5.11E-02
-4.97E-02
-5.11E-02
-5.18E-02
-5.12E-02
-5.37E-02
-5.07E-02
-5.00E-02
40
-4.90E-02
-5.11E-02
-5.07E-02
-5.43E-02
-5.11E-02
-4.96E-02
-5.11E-02
-5.19E-02
-5.12E-02
-5.38E-02
-5.08E-02
-5.00E-02
50
-4.90E-02
-5.12E-02
-5.07E-02
-5.42E-02
-5.11E-02
-4.98E-02
-5.12E-02
-5.19E-02
-5.14E-02
-5.38E-02
-5.09E-02
-5.00E-02
60
-4.90E-02
-5.12E-02
-5.07E-02
-5.40E-02
-5.10E-02
-4.96E-02
-5.12E-02
-5.19E-02
-5.14E-02
-5.39E-02
-5.08E-02
-5.00E-02
70
-4.90E-02
-5.11E-02
-5.06E-02
-5.39E-02
-5.09E-02
-4.95E-02
-5.11E-02
-5.19E-02
-5.13E-02
-5.39E-02
-5.08E-02
-5.00E-02
75
-4.89E-02
-5.11E-02
-5.06E-02
-5.38E-02
-5.09E-02
-4.94E-02
-5.11E-02
-5.19E-02
-5.13E-02
-5.39E-02
-5.09E-02
-5.00E-02
100
-4.87E-02
-5.08E-02
-5.04E-02
-5.31E-02
-5.05E-02
-4.91E-02
-5.08E-02
-5.16E-02
-5.11E-02
-5.36E-02
-5.08E-02
-5.00E-02
200
-4.77E-02
-4.94E-02
-4.90E-02
-5.16E-02
-4.92E-02
-4.76E-02
-4.95E-02
-5.04E-02
-4.97E-02
-5.28E-02
-5.08E-02
-5.00E-02
-5.19E-02
1.56E-03
-4.87E-02
-5.52E-02
-4.00E-02
PASS
-5.16E-02
1.62E-03
-4.83E-02
-5.50E-02
-4.00E-02
PASS
-5.15E-02
1.65E-03
-4.80E-02
-5.49E-02
-4.00E-02
PASS
-5.14E-02
1.64E-03
-4.80E-02
-5.48E-02
-4.00E-02
PASS
-5.14E-02
1.62E-03
-4.80E-02
-5.47E-02
-4.00E-02
PASS
-5.14E-02
1.60E-03
-4.81E-02
-5.47E-02
-4.00E-02
PASS
-5.14E-02
1.59E-03
-4.81E-02
-5.47E-02
-4.00E-02
PASS
-5.13E-02
1.59E-03
-4.80E-02
-5.46E-02
-4.00E-02
PASS
-5.13E-02
1.60E-03
-4.80E-02
-5.46E-02
-4.00E-02
PASS
-5.10E-02
1.56E-03
-4.78E-02
-5.42E-02
-4.00E-02
PASS
-4.97E-02
1.60E-03
-4.64E-02
-5.30E-02
-4.00E-02
PASS
An ISO 9001:2008 and DSCC Certified Company
142
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
Specification MAX
Maximum Output Sink Current @+/-5V #3 (A)
0.00E+00
-1.00E-02
-2.00E-02
-3.00E-02
-4.00E-02
-5.00E-02
-6.00E-02
0
50
100
150
Total Dose (krad(Si))
Figure 5.69. Plot of Maximum Output Sink Current @+/-5V #3 (A) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
143
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.69. Raw data for Maximum Output Sink Current @+/-5V #3 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Maximum Output Sink Current @+/-5V #3 (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MAX
Status
0
-4.96E-02
-5.23E-02
-5.16E-02
-5.53E-02
-5.20E-02
-5.10E-02
-5.20E-02
-5.29E-02
-5.25E-02
-5.45E-02
-5.17E-02
-5.04E-02
10
-4.90E-02
-5.17E-02
-5.10E-02
-5.53E-02
-5.16E-02
-5.06E-02
-5.15E-02
-5.24E-02
-5.19E-02
-5.41E-02
-5.16E-02
-5.03E-02
20
-4.89E-02
-5.15E-02
-5.08E-02
-5.52E-02
-5.13E-02
-5.05E-02
-5.12E-02
-5.22E-02
-5.17E-02
-5.39E-02
-5.16E-02
-5.04E-02
30
-4.90E-02
-5.14E-02
-5.06E-02
-5.51E-02
-5.12E-02
-5.02E-02
-5.11E-02
-5.20E-02
-5.17E-02
-5.39E-02
-5.16E-02
-5.04E-02
40
-4.91E-02
-5.14E-02
-5.07E-02
-5.50E-02
-5.12E-02
-5.02E-02
-5.10E-02
-5.21E-02
-5.17E-02
-5.40E-02
-5.17E-02
-5.04E-02
50
-4.92E-02
-5.15E-02
-5.07E-02
-5.49E-02
-5.12E-02
-5.02E-02
-5.11E-02
-5.22E-02
-5.18E-02
-5.41E-02
-5.17E-02
-5.05E-02
60
-4.91E-02
-5.15E-02
-5.07E-02
-5.46E-02
-5.11E-02
-5.02E-02
-5.11E-02
-5.22E-02
-5.18E-02
-5.41E-02
-5.17E-02
-5.05E-02
70
-4.90E-02
-5.13E-02
-5.05E-02
-5.45E-02
-5.09E-02
-5.02E-02
-5.11E-02
-5.22E-02
-5.17E-02
-5.41E-02
-5.17E-02
-5.05E-02
75
-4.90E-02
-5.13E-02
-5.05E-02
-5.44E-02
-5.09E-02
-5.01E-02
-5.11E-02
-5.22E-02
-5.17E-02
-5.41E-02
-5.17E-02
-5.05E-02
100
-4.87E-02
-5.10E-02
-5.01E-02
-5.38E-02
-5.06E-02
-4.99E-02
-5.08E-02
-5.21E-02
-5.14E-02
-5.39E-02
-5.17E-02
-5.05E-02
200
-4.76E-02
-4.98E-02
-4.87E-02
-5.22E-02
-4.92E-02
-4.89E-02
-4.95E-02
-5.13E-02
-5.05E-02
-5.30E-02
-5.17E-02
-5.05E-02
-5.24E-02
1.63E-03
-4.90E-02
-5.57E-02
-4.00E-02
PASS
-5.19E-02
1.76E-03
-4.83E-02
-5.56E-02
-4.00E-02
PASS
-5.17E-02
1.76E-03
-4.81E-02
-5.54E-02
-4.00E-02
PASS
-5.16E-02
1.75E-03
-4.80E-02
-5.52E-02
-4.00E-02
PASS
-5.16E-02
1.71E-03
-4.81E-02
-5.52E-02
-4.00E-02
PASS
-5.17E-02
1.71E-03
-4.82E-02
-5.52E-02
-4.00E-02
PASS
-5.16E-02
1.66E-03
-4.82E-02
-5.51E-02
-4.00E-02
PASS
-5.15E-02
1.69E-03
-4.81E-02
-5.50E-02
-4.00E-02
PASS
-5.15E-02
1.67E-03
-4.81E-02
-5.50E-02
-4.00E-02
PASS
-5.12E-02
1.65E-03
-4.78E-02
-5.46E-02
-4.00E-02
PASS
-5.01E-02
1.68E-03
-4.66E-02
-5.35E-02
-4.00E-02
PASS
An ISO 9001:2008 and DSCC Certified Company
144
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
Specification MAX
Maximum Output Sink Current @+/-5V #4 (A)
0.00E+00
-1.00E-02
-2.00E-02
-3.00E-02
-4.00E-02
-5.00E-02
-6.00E-02
0
50
100
150
Total Dose (krad(Si))
Figure 5.70. Plot of Maximum Output Sink Current @+/-5V #4 (A) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
145
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.70. Raw data for Maximum Output Sink Current @+/-5V #4 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Maximum Output Sink Current @+/-5V #4 (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MAX
Status
0
-5.11E-02
-5.18E-02
-5.29E-02
-5.33E-02
-5.39E-02
-5.06E-02
-5.01E-02
-5.08E-02
-5.12E-02
-5.10E-02
-5.19E-02
-5.17E-02
10
-5.07E-02
-5.12E-02
-5.26E-02
-5.32E-02
-5.34E-02
-5.00E-02
-4.96E-02
-5.03E-02
-5.08E-02
-5.05E-02
-5.19E-02
-5.17E-02
20
-5.05E-02
-5.11E-02
-5.22E-02
-5.31E-02
-5.34E-02
-4.99E-02
-4.94E-02
-5.00E-02
-5.05E-02
-5.02E-02
-5.19E-02
-5.17E-02
30
-5.04E-02
-5.10E-02
-5.22E-02
-5.30E-02
-5.31E-02
-4.97E-02
-4.93E-02
-4.97E-02
-5.04E-02
-5.00E-02
-5.19E-02
-5.17E-02
40
-5.03E-02
-5.11E-02
-5.22E-02
-5.29E-02
-5.31E-02
-4.97E-02
-4.93E-02
-4.97E-02
-5.04E-02
-5.01E-02
-5.20E-02
-5.17E-02
50
-5.04E-02
-5.11E-02
-5.23E-02
-5.28E-02
-5.32E-02
-4.98E-02
-4.93E-02
-4.98E-02
-5.04E-02
-5.00E-02
-5.21E-02
-5.18E-02
60
-5.03E-02
-5.11E-02
-5.23E-02
-5.27E-02
-5.31E-02
-4.96E-02
-4.93E-02
-4.96E-02
-5.04E-02
-4.99E-02
-5.21E-02
-5.18E-02
70
-5.02E-02
-5.10E-02
-5.23E-02
-5.24E-02
-5.30E-02
-4.96E-02
-4.91E-02
-4.96E-02
-5.02E-02
-4.99E-02
-5.20E-02
-5.18E-02
75
-5.02E-02
-5.10E-02
-5.23E-02
-5.23E-02
-5.30E-02
-4.96E-02
-4.91E-02
-4.95E-02
-5.02E-02
-4.98E-02
-5.21E-02
-5.18E-02
100
-5.00E-02
-5.07E-02
-5.21E-02
-5.18E-02
-5.27E-02
-4.93E-02
-4.88E-02
-4.91E-02
-5.00E-02
-4.94E-02
-5.21E-02
-5.17E-02
200
-4.89E-02
-4.97E-02
-5.11E-02
-5.06E-02
-5.13E-02
-4.82E-02
-4.75E-02
-4.75E-02
-4.85E-02
-4.78E-02
-5.21E-02
-5.18E-02
-5.17E-02
1.27E-03
-4.90E-02
-5.43E-02
-4.00E-02
PASS
-5.12E-02
1.33E-03
-4.85E-02
-5.40E-02
-4.00E-02
PASS
-5.10E-02
1.40E-03
-4.81E-02
-5.39E-02
-4.00E-02
PASS
-5.09E-02
1.40E-03
-4.80E-02
-5.38E-02
-4.00E-02
PASS
-5.09E-02
1.39E-03
-4.80E-02
-5.37E-02
-4.00E-02
PASS
-5.09E-02
1.39E-03
-4.80E-02
-5.38E-02
-4.00E-02
PASS
-5.08E-02
1.39E-03
-4.80E-02
-5.37E-02
-4.00E-02
PASS
-5.07E-02
1.37E-03
-4.79E-02
-5.36E-02
-4.00E-02
PASS
-5.07E-02
1.37E-03
-4.79E-02
-5.35E-02
-4.00E-02
PASS
-5.04E-02
1.36E-03
-4.76E-02
-5.32E-02
-4.00E-02
PASS
-4.91E-02
1.48E-03
-4.60E-02
-5.22E-02
-4.00E-02
PASS
An ISO 9001:2008 and DSCC Certified Company
146
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Positive Short-Circuit Current @+/-5V #1 (A)
9.00E-02
8.80E-02
8.60E-02
8.40E-02
8.20E-02
8.00E-02
7.80E-02
7.60E-02
7.40E-02
0
50
100
150
Total Dose (krad(Si))
Figure 5.71. Plot of Positive Short-Circuit Current @+/-5V #1 (A) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
147
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.71. Raw data for Positive Short-Circuit Current @+/-5V #1 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Short-Circuit Current @+/-5V #1 (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
8.68E-02
8.71E-02
8.70E-02
8.75E-02
8.74E-02
8.62E-02
8.63E-02
8.63E-02
8.65E-02
8.59E-02
8.63E-02
8.63E-02
10
8.66E-02
8.70E-02
8.70E-02
8.75E-02
8.73E-02
8.61E-02
8.63E-02
8.64E-02
8.66E-02
8.59E-02
8.63E-02
8.64E-02
20
8.62E-02
8.67E-02
8.67E-02
8.72E-02
8.70E-02
8.59E-02
8.61E-02
8.62E-02
8.64E-02
8.58E-02
8.61E-02
8.62E-02
30
8.61E-02
8.65E-02
8.65E-02
8.70E-02
8.69E-02
8.58E-02
8.61E-02
8.61E-02
8.63E-02
8.57E-02
8.60E-02
8.61E-02
40
8.60E-02
8.66E-02
8.65E-02
8.70E-02
8.69E-02
8.58E-02
8.60E-02
8.61E-02
8.63E-02
8.57E-02
8.59E-02
8.59E-02
50
8.60E-02
8.66E-02
8.66E-02
8.71E-02
8.69E-02
8.58E-02
8.60E-02
8.61E-02
8.63E-02
8.57E-02
8.58E-02
8.59E-02
60
8.59E-02
8.65E-02
8.65E-02
8.70E-02
8.69E-02
8.58E-02
8.61E-02
8.61E-02
8.63E-02
8.57E-02
8.58E-02
8.58E-02
70
8.60E-02
8.65E-02
8.65E-02
8.71E-02
8.69E-02
8.58E-02
8.60E-02
8.61E-02
8.63E-02
8.57E-02
8.58E-02
8.58E-02
75
8.61E-02
8.66E-02
8.66E-02
8.72E-02
8.69E-02
8.58E-02
8.61E-02
8.61E-02
8.63E-02
8.57E-02
8.57E-02
8.58E-02
100
8.63E-02
8.68E-02
8.67E-02
8.74E-02
8.72E-02
8.61E-02
8.62E-02
8.63E-02
8.66E-02
8.59E-02
8.58E-02
8.58E-02
200
8.73E-02
8.77E-02
8.76E-02
8.84E-02
8.80E-02
8.70E-02
8.71E-02
8.72E-02
8.74E-02
8.69E-02
8.58E-02
8.59E-02
8.67E-02
5.56E-04
8.79E-02
8.56E-02
7.50E-02
PASS
8.67E-02
5.16E-04
8.78E-02
8.56E-02
7.50E-02
PASS
8.64E-02
4.74E-04
8.74E-02
8.54E-02
7.50E-02
PASS
8.63E-02
4.44E-04
8.72E-02
8.54E-02
7.50E-02
PASS
8.63E-02
4.55E-04
8.72E-02
8.53E-02
7.50E-02
PASS
8.63E-02
4.70E-04
8.73E-02
8.53E-02
7.50E-02
PASS
8.63E-02
4.54E-04
8.72E-02
8.53E-02
7.50E-02
PASS
8.63E-02
4.61E-04
8.73E-02
8.54E-02
7.50E-02
PASS
8.63E-02
4.70E-04
8.73E-02
8.54E-02
7.50E-02
PASS
8.66E-02
4.74E-04
8.75E-02
8.56E-02
7.50E-02
PASS
8.75E-02
4.69E-04
8.84E-02
8.65E-02
7.50E-02
PASS
An ISO 9001:2008 and DSCC Certified Company
148
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Positive Short-Circuit Current @+/-5V #2 (A)
9.00E-02
8.80E-02
8.60E-02
8.40E-02
8.20E-02
8.00E-02
7.80E-02
7.60E-02
7.40E-02
0
50
100
150
Total Dose (krad(Si))
Figure 5.72. Plot of Positive Short-Circuit Current @+/-5V #2 (A) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
149
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.72. Raw data for Positive Short-Circuit Current @+/-5V #2 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Short-Circuit Current @+/-5V #2 (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
8.67E-02
8.72E-02
8.68E-02
8.78E-02
8.67E-02
8.62E-02
8.67E-02
8.67E-02
8.67E-02
8.68E-02
8.61E-02
8.58E-02
10
8.66E-02
8.72E-02
8.68E-02
8.77E-02
8.66E-02
8.62E-02
8.67E-02
8.68E-02
8.67E-02
8.69E-02
8.60E-02
8.59E-02
20
8.62E-02
8.68E-02
8.64E-02
8.74E-02
8.63E-02
8.59E-02
8.64E-02
8.66E-02
8.66E-02
8.67E-02
8.58E-02
8.56E-02
30
8.60E-02
8.67E-02
8.63E-02
8.73E-02
8.62E-02
8.58E-02
8.63E-02
8.65E-02
8.64E-02
8.66E-02
8.57E-02
8.55E-02
40
8.59E-02
8.66E-02
8.63E-02
8.73E-02
8.62E-02
8.58E-02
8.63E-02
8.64E-02
8.64E-02
8.66E-02
8.57E-02
8.54E-02
50
8.60E-02
8.66E-02
8.63E-02
8.74E-02
8.62E-02
8.58E-02
8.63E-02
8.64E-02
8.64E-02
8.66E-02
8.56E-02
8.54E-02
60
8.59E-02
8.66E-02
8.63E-02
8.74E-02
8.62E-02
8.58E-02
8.64E-02
8.65E-02
8.64E-02
8.66E-02
8.56E-02
8.53E-02
70
8.59E-02
8.67E-02
8.63E-02
8.74E-02
8.62E-02
8.59E-02
8.64E-02
8.65E-02
8.64E-02
8.67E-02
8.55E-02
8.53E-02
75
8.60E-02
8.67E-02
8.63E-02
8.75E-02
8.62E-02
8.58E-02
8.64E-02
8.65E-02
8.64E-02
8.67E-02
8.55E-02
8.53E-02
100
8.62E-02
8.69E-02
8.66E-02
8.78E-02
8.64E-02
8.61E-02
8.66E-02
8.67E-02
8.67E-02
8.68E-02
8.56E-02
8.53E-02
200
8.72E-02
8.78E-02
8.74E-02
8.87E-02
8.73E-02
8.70E-02
8.75E-02
8.75E-02
8.75E-02
8.76E-02
8.56E-02
8.53E-02
8.68E-02
4.19E-04
8.77E-02
8.59E-02
7.50E-02
PASS
8.68E-02
4.12E-04
8.77E-02
8.60E-02
7.50E-02
PASS
8.65E-02
3.98E-04
8.73E-02
8.57E-02
7.50E-02
PASS
8.64E-02
4.06E-04
8.72E-02
8.56E-02
7.50E-02
PASS
8.64E-02
3.98E-04
8.72E-02
8.56E-02
7.50E-02
PASS
8.64E-02
4.18E-04
8.73E-02
8.55E-02
7.50E-02
PASS
8.64E-02
4.29E-04
8.73E-02
8.55E-02
7.50E-02
PASS
8.64E-02
4.37E-04
8.73E-02
8.55E-02
7.50E-02
PASS
8.65E-02
4.62E-04
8.74E-02
8.55E-02
7.50E-02
PASS
8.67E-02
4.68E-04
8.76E-02
8.57E-02
7.50E-02
PASS
8.76E-02
4.66E-04
8.85E-02
8.66E-02
7.50E-02
PASS
An ISO 9001:2008 and DSCC Certified Company
150
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Positive Short-Circuit Current @+/-5V #3 (A)
9.00E-02
8.80E-02
8.60E-02
8.40E-02
8.20E-02
8.00E-02
7.80E-02
7.60E-02
7.40E-02
0
50
100
150
Total Dose (krad(Si))
Figure 5.73. Plot of Positive Short-Circuit Current @+/-5V #3 (A) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
151
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.73. Raw data for Positive Short-Circuit Current @+/-5V #3 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Short-Circuit Current @+/-5V #3 (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
8.66E-02
8.71E-02
8.68E-02
8.76E-02
8.64E-02
8.60E-02
8.68E-02
8.67E-02
8.65E-02
8.67E-02
8.61E-02
8.56E-02
10
8.64E-02
8.71E-02
8.68E-02
8.77E-02
8.64E-02
8.60E-02
8.68E-02
8.68E-02
8.66E-02
8.67E-02
8.60E-02
8.57E-02
20
8.60E-02
8.68E-02
8.64E-02
8.73E-02
8.61E-02
8.57E-02
8.66E-02
8.66E-02
8.64E-02
8.66E-02
8.58E-02
8.55E-02
30
8.58E-02
8.66E-02
8.63E-02
8.71E-02
8.61E-02
8.56E-02
8.64E-02
8.65E-02
8.63E-02
8.64E-02
8.58E-02
8.53E-02
40
8.58E-02
8.66E-02
8.63E-02
8.72E-02
8.61E-02
8.56E-02
8.64E-02
8.64E-02
8.63E-02
8.64E-02
8.57E-02
8.52E-02
50
8.58E-02
8.66E-02
8.63E-02
8.72E-02
8.61E-02
8.56E-02
8.64E-02
8.65E-02
8.63E-02
8.64E-02
8.56E-02
8.52E-02
60
8.58E-02
8.65E-02
8.63E-02
8.72E-02
8.61E-02
8.56E-02
8.64E-02
8.65E-02
8.63E-02
8.64E-02
8.56E-02
8.52E-02
70
8.58E-02
8.65E-02
8.63E-02
8.73E-02
8.60E-02
8.57E-02
8.65E-02
8.65E-02
8.63E-02
8.65E-02
8.55E-02
8.51E-02
75
8.58E-02
8.66E-02
8.63E-02
8.73E-02
8.61E-02
8.57E-02
8.64E-02
8.66E-02
8.63E-02
8.64E-02
8.55E-02
8.51E-02
100
8.61E-02
8.68E-02
8.66E-02
8.75E-02
8.63E-02
8.58E-02
8.67E-02
8.67E-02
8.66E-02
8.67E-02
8.56E-02
8.52E-02
200
8.70E-02
8.78E-02
8.74E-02
8.85E-02
8.72E-02
8.68E-02
8.75E-02
8.75E-02
8.74E-02
8.75E-02
8.56E-02
8.52E-02
8.67E-02
4.32E-04
8.76E-02
8.58E-02
7.50E-02
PASS
8.67E-02
4.48E-04
8.76E-02
8.58E-02
7.50E-02
PASS
8.64E-02
4.39E-04
8.73E-02
8.55E-02
7.50E-02
PASS
8.63E-02
4.25E-04
8.72E-02
8.54E-02
7.50E-02
PASS
8.63E-02
4.28E-04
8.72E-02
8.54E-02
7.50E-02
PASS
8.63E-02
4.36E-04
8.72E-02
8.54E-02
7.50E-02
PASS
8.63E-02
4.45E-04
8.72E-02
8.54E-02
7.50E-02
PASS
8.63E-02
4.43E-04
8.73E-02
8.54E-02
7.50E-02
PASS
8.64E-02
4.40E-04
8.73E-02
8.54E-02
7.50E-02
PASS
8.66E-02
4.61E-04
8.75E-02
8.56E-02
7.50E-02
PASS
8.75E-02
4.57E-04
8.84E-02
8.65E-02
7.50E-02
PASS
An ISO 9001:2008 and DSCC Certified Company
152
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Positive Short-Circuit Current @+/-5V #4 (A)
9.00E-02
8.80E-02
8.60E-02
8.40E-02
8.20E-02
8.00E-02
7.80E-02
7.60E-02
7.40E-02
0
50
100
150
Total Dose (krad(Si))
Figure 5.74. Plot of Positive Short-Circuit Current @+/-5V #4 (A) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
153
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.74. Raw data for Positive Short-Circuit Current @+/-5V #4 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Short-Circuit Current @+/-5V #4 (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
8.68E-02
8.70E-02
8.70E-02
8.74E-02
8.73E-02
8.62E-02
8.64E-02
8.62E-02
8.64E-02
8.59E-02
8.63E-02
8.62E-02
10
8.66E-02
8.70E-02
8.70E-02
8.74E-02
8.73E-02
8.62E-02
8.64E-02
8.63E-02
8.65E-02
8.59E-02
8.63E-02
8.63E-02
20
8.62E-02
8.67E-02
8.67E-02
8.71E-02
8.69E-02
8.59E-02
8.62E-02
8.61E-02
8.63E-02
8.58E-02
8.61E-02
8.61E-02
30
8.61E-02
8.65E-02
8.65E-02
8.70E-02
8.69E-02
8.58E-02
8.61E-02
8.61E-02
8.62E-02
8.57E-02
8.61E-02
8.59E-02
40
8.60E-02
8.64E-02
8.65E-02
8.70E-02
8.68E-02
8.58E-02
8.61E-02
8.60E-02
8.62E-02
8.57E-02
8.59E-02
8.58E-02
50
8.60E-02
8.64E-02
8.65E-02
8.70E-02
8.68E-02
8.58E-02
8.61E-02
8.60E-02
8.62E-02
8.57E-02
8.58E-02
8.58E-02
60
8.60E-02
8.64E-02
8.65E-02
8.70E-02
8.68E-02
8.58E-02
8.61E-02
8.61E-02
8.62E-02
8.57E-02
8.58E-02
8.58E-02
70
8.60E-02
8.65E-02
8.65E-02
8.71E-02
8.69E-02
8.58E-02
8.61E-02
8.60E-02
8.62E-02
8.57E-02
8.58E-02
8.57E-02
75
8.61E-02
8.66E-02
8.65E-02
8.71E-02
8.69E-02
8.58E-02
8.61E-02
8.61E-02
8.62E-02
8.57E-02
8.57E-02
8.57E-02
100
8.63E-02
8.68E-02
8.68E-02
8.74E-02
8.70E-02
8.61E-02
8.63E-02
8.63E-02
8.64E-02
8.59E-02
8.58E-02
8.57E-02
200
8.72E-02
8.77E-02
8.76E-02
8.83E-02
8.80E-02
8.70E-02
8.72E-02
8.71E-02
8.73E-02
8.68E-02
8.58E-02
8.58E-02
8.67E-02
5.16E-04
8.77E-02
8.56E-02
7.50E-02
PASS
8.67E-02
4.99E-04
8.77E-02
8.57E-02
7.50E-02
PASS
8.64E-02
4.46E-04
8.73E-02
8.55E-02
7.50E-02
PASS
8.63E-02
4.47E-04
8.72E-02
8.54E-02
7.50E-02
PASS
8.62E-02
4.25E-04
8.71E-02
8.54E-02
7.50E-02
PASS
8.63E-02
4.29E-04
8.72E-02
8.54E-02
7.50E-02
PASS
8.63E-02
4.26E-04
8.71E-02
8.54E-02
7.50E-02
PASS
8.63E-02
4.54E-04
8.72E-02
8.54E-02
7.50E-02
PASS
8.63E-02
4.58E-04
8.73E-02
8.54E-02
7.50E-02
PASS
8.65E-02
4.58E-04
8.75E-02
8.56E-02
7.50E-02
PASS
8.74E-02
4.85E-04
8.84E-02
8.64E-02
7.50E-02
PASS
An ISO 9001:2008 and DSCC Certified Company
154
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
Specification MAX
Negative Short-Circuit Current @+/-5V #1 (A)
-7.40E-02
-7.50E-02
-7.60E-02
-7.70E-02
-7.80E-02
-7.90E-02
-8.00E-02
-8.10E-02
-8.20E-02
-8.30E-02
-8.40E-02
0
50
100
150
Total Dose (krad(Si))
Figure 5.75. Plot of Negative Short-Circuit Current @+/-5V #1 (A) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
155
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.75. Raw data for Negative Short-Circuit Current @+/-5V #1 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Short-Circuit Current @+/-5V #1 (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MAX
Status
0
-8.18E-02
-8.22E-02
-8.23E-02
-8.27E-02
-8.25E-02
-8.13E-02
-8.14E-02
-8.13E-02
-8.18E-02
-8.10E-02
-8.15E-02
-8.13E-02
10
-8.17E-02
-8.21E-02
-8.23E-02
-8.26E-02
-8.25E-02
-8.13E-02
-8.15E-02
-8.14E-02
-8.19E-02
-8.12E-02
-8.15E-02
-8.14E-02
20
-8.13E-02
-8.18E-02
-8.19E-02
-8.24E-02
-8.21E-02
-8.11E-02
-8.12E-02
-8.12E-02
-8.17E-02
-8.09E-02
-8.14E-02
-8.12E-02
30
-8.12E-02
-8.16E-02
-8.19E-02
-8.23E-02
-8.20E-02
-8.09E-02
-8.11E-02
-8.11E-02
-8.16E-02
-8.09E-02
-8.12E-02
-8.10E-02
40
-8.11E-02
-8.17E-02
-8.18E-02
-8.23E-02
-8.20E-02
-8.09E-02
-8.10E-02
-8.10E-02
-8.15E-02
-8.09E-02
-8.11E-02
-8.09E-02
50
-8.11E-02
-8.17E-02
-8.18E-02
-8.23E-02
-8.20E-02
-8.09E-02
-8.11E-02
-8.11E-02
-8.16E-02
-8.09E-02
-8.11E-02
-8.09E-02
60
-8.11E-02
-8.16E-02
-8.18E-02
-8.22E-02
-8.20E-02
-8.09E-02
-8.12E-02
-8.12E-02
-8.16E-02
-8.09E-02
-8.10E-02
-8.08E-02
70
-8.11E-02
-8.18E-02
-8.19E-02
-8.24E-02
-8.21E-02
-8.10E-02
-8.11E-02
-8.11E-02
-8.16E-02
-8.10E-02
-8.09E-02
-8.08E-02
75
-8.12E-02
-8.18E-02
-8.18E-02
-8.24E-02
-8.22E-02
-8.10E-02
-8.12E-02
-8.12E-02
-8.17E-02
-8.10E-02
-8.09E-02
-8.08E-02
100
-8.14E-02
-8.20E-02
-8.21E-02
-8.27E-02
-8.23E-02
-8.13E-02
-8.13E-02
-8.13E-02
-8.19E-02
-8.12E-02
-8.10E-02
-8.08E-02
200
-8.25E-02
-8.30E-02
-8.31E-02
-8.38E-02
-8.33E-02
-8.23E-02
-8.24E-02
-8.23E-02
-8.29E-02
-8.22E-02
-8.10E-02
-8.09E-02
-8.18E-02
5.75E-04
-8.06E-02
-8.30E-02
-7.50E-02
PASS
-8.18E-02
5.28E-04
-8.07E-02
-8.29E-02
-7.50E-02
PASS
-8.16E-02
4.89E-04
-8.05E-02
-8.26E-02
-7.50E-02
PASS
-8.15E-02
4.79E-04
-8.05E-02
-8.25E-02
-7.50E-02
PASS
-8.14E-02
4.90E-04
-8.04E-02
-8.24E-02
-7.50E-02
PASS
-8.15E-02
4.79E-04
-8.05E-02
-8.24E-02
-7.50E-02
PASS
-8.15E-02
4.74E-04
-8.05E-02
-8.24E-02
-7.50E-02
PASS
-8.15E-02
4.98E-04
-8.05E-02
-8.25E-02
-7.50E-02
PASS
-8.15E-02
4.96E-04
-8.05E-02
-8.26E-02
-7.50E-02
PASS
-8.18E-02
5.24E-04
-8.07E-02
-8.28E-02
-7.50E-02
PASS
-8.28E-02
5.30E-04
-8.17E-02
-8.39E-02
-7.50E-02
PASS
An ISO 9001:2008 and DSCC Certified Company
156
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
Specification MAX
Negative Short-Circuit Current @+/-5V #2 (A)
-7.40E-02
-7.50E-02
-7.60E-02
-7.70E-02
-7.80E-02
-7.90E-02
-8.00E-02
-8.10E-02
-8.20E-02
-8.30E-02
-8.40E-02
0
50
100
150
Total Dose (krad(Si))
Figure 5.76. Plot of Negative Short-Circuit Current @+/-5V #2 (A) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
157
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.76. Raw data for Negative Short-Circuit Current @+/-5V #2 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Short-Circuit Current @+/-5V #2 (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MAX
Status
0
-8.17E-02
-8.25E-02
-8.19E-02
-8.29E-02
-8.18E-02
-8.13E-02
-8.20E-02
-8.19E-02
-8.19E-02
-8.21E-02
-8.13E-02
-8.09E-02
10
-8.15E-02
-8.24E-02
-8.19E-02
-8.29E-02
-8.18E-02
-8.12E-02
-8.20E-02
-8.20E-02
-8.20E-02
-8.22E-02
-8.13E-02
-8.10E-02
20
-8.12E-02
-8.20E-02
-8.15E-02
-8.26E-02
-8.14E-02
-8.10E-02
-8.18E-02
-8.18E-02
-8.18E-02
-8.20E-02
-8.11E-02
-8.07E-02
30
-8.10E-02
-8.19E-02
-8.14E-02
-8.25E-02
-8.14E-02
-8.09E-02
-8.17E-02
-8.18E-02
-8.18E-02
-8.20E-02
-8.10E-02
-8.06E-02
40
-8.10E-02
-8.19E-02
-8.14E-02
-8.25E-02
-8.13E-02
-8.08E-02
-8.17E-02
-8.18E-02
-8.17E-02
-8.19E-02
-8.09E-02
-8.05E-02
50
-8.10E-02
-8.19E-02
-8.14E-02
-8.25E-02
-8.14E-02
-8.09E-02
-8.17E-02
-8.18E-02
-8.18E-02
-8.20E-02
-8.08E-02
-8.05E-02
60
-8.10E-02
-8.19E-02
-8.14E-02
-8.26E-02
-8.14E-02
-8.09E-02
-8.18E-02
-8.18E-02
-8.18E-02
-8.20E-02
-8.08E-02
-8.04E-02
70
-8.10E-02
-8.19E-02
-8.15E-02
-8.26E-02
-8.14E-02
-8.09E-02
-8.18E-02
-8.18E-02
-8.18E-02
-8.20E-02
-8.07E-02
-8.04E-02
75
-8.11E-02
-8.19E-02
-8.14E-02
-8.26E-02
-8.14E-02
-8.09E-02
-8.18E-02
-8.18E-02
-8.18E-02
-8.20E-02
-8.07E-02
-8.03E-02
100
-8.13E-02
-8.21E-02
-8.17E-02
-8.30E-02
-8.16E-02
-8.12E-02
-8.20E-02
-8.20E-02
-8.20E-02
-8.23E-02
-8.08E-02
-8.04E-02
200
-8.23E-02
-8.32E-02
-8.27E-02
-8.40E-02
-8.26E-02
-8.21E-02
-8.31E-02
-8.30E-02
-8.30E-02
-8.32E-02
-8.08E-02
-8.04E-02
-8.20E-02
4.47E-04
-8.11E-02
-8.29E-02
-7.50E-02
PASS
-8.20E-02
4.53E-04
-8.11E-02
-8.29E-02
-7.50E-02
PASS
-8.17E-02
4.73E-04
-8.07E-02
-8.27E-02
-7.50E-02
PASS
-8.16E-02
4.62E-04
-8.07E-02
-8.26E-02
-7.50E-02
PASS
-8.16E-02
4.91E-04
-8.06E-02
-8.26E-02
-7.50E-02
PASS
-8.16E-02
4.78E-04
-8.06E-02
-8.26E-02
-7.50E-02
PASS
-8.16E-02
4.90E-04
-8.06E-02
-8.27E-02
-7.50E-02
PASS
-8.17E-02
4.92E-04
-8.06E-02
-8.27E-02
-7.50E-02
PASS
-8.17E-02
4.94E-04
-8.07E-02
-8.27E-02
-7.50E-02
PASS
-8.19E-02
5.21E-04
-8.08E-02
-8.30E-02
-7.50E-02
PASS
-8.29E-02
5.20E-04
-8.19E-02
-8.40E-02
-7.50E-02
PASS
An ISO 9001:2008 and DSCC Certified Company
158
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
Specification MAX
Negative Short-Circuit Current @+/-5V #3 (A)
-7.40E-02
-7.50E-02
-7.60E-02
-7.70E-02
-7.80E-02
-7.90E-02
-8.00E-02
-8.10E-02
-8.20E-02
-8.30E-02
-8.40E-02
0
50
100
150
Total Dose (krad(Si))
Figure 5.77. Plot of Negative Short-Circuit Current @+/-5V #3 (A) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
159
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.77. Raw data for Negative Short-Circuit Current @+/-5V #3 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Short-Circuit Current @+/-5V #3 (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MAX
Status
0
-8.15E-02
-8.22E-02
-8.19E-02
-8.29E-02
-8.15E-02
-8.11E-02
-8.20E-02
-8.19E-02
-8.18E-02
-8.20E-02
-8.13E-02
-8.08E-02
10
-8.14E-02
-8.22E-02
-8.19E-02
-8.29E-02
-8.15E-02
-8.11E-02
-8.21E-02
-8.20E-02
-8.18E-02
-8.20E-02
-8.14E-02
-8.08E-02
20
-8.11E-02
-8.19E-02
-8.16E-02
-8.25E-02
-8.12E-02
-8.08E-02
-8.19E-02
-8.18E-02
-8.16E-02
-8.19E-02
-8.12E-02
-8.06E-02
30
-8.09E-02
-8.18E-02
-8.15E-02
-8.24E-02
-8.11E-02
-8.08E-02
-8.18E-02
-8.18E-02
-8.15E-02
-8.18E-02
-8.10E-02
-8.05E-02
40
-8.08E-02
-8.17E-02
-8.14E-02
-8.24E-02
-8.10E-02
-8.07E-02
-8.18E-02
-8.17E-02
-8.15E-02
-8.18E-02
-8.09E-02
-8.04E-02
50
-8.08E-02
-8.17E-02
-8.14E-02
-8.25E-02
-8.11E-02
-8.07E-02
-8.18E-02
-8.17E-02
-8.15E-02
-8.18E-02
-8.09E-02
-8.03E-02
60
-8.08E-02
-8.18E-02
-8.14E-02
-8.25E-02
-8.12E-02
-8.08E-02
-8.18E-02
-8.18E-02
-8.15E-02
-8.18E-02
-8.08E-02
-8.03E-02
70
-8.09E-02
-8.17E-02
-8.15E-02
-8.25E-02
-8.11E-02
-8.08E-02
-8.19E-02
-8.18E-02
-8.15E-02
-8.19E-02
-8.08E-02
-8.03E-02
75
-8.09E-02
-8.18E-02
-8.15E-02
-8.26E-02
-8.12E-02
-8.08E-02
-8.19E-02
-8.18E-02
-8.15E-02
-8.19E-02
-8.07E-02
-8.02E-02
100
-8.12E-02
-8.20E-02
-8.18E-02
-8.29E-02
-8.14E-02
-8.10E-02
-8.20E-02
-8.20E-02
-8.18E-02
-8.21E-02
-8.08E-02
-8.03E-02
200
-8.21E-02
-8.31E-02
-8.27E-02
-8.39E-02
-8.24E-02
-8.20E-02
-8.31E-02
-8.29E-02
-8.27E-02
-8.31E-02
-8.09E-02
-8.03E-02
-8.19E-02
4.64E-04
-8.09E-02
-8.28E-02
-7.50E-02
PASS
-8.19E-02
4.93E-04
-8.09E-02
-8.29E-02
-7.50E-02
PASS
-8.16E-02
4.95E-04
-8.06E-02
-8.26E-02
-7.50E-02
PASS
-8.15E-02
4.72E-04
-8.06E-02
-8.25E-02
-7.50E-02
PASS
-8.15E-02
5.14E-04
-8.04E-02
-8.25E-02
-7.50E-02
PASS
-8.15E-02
5.27E-04
-8.04E-02
-8.26E-02
-7.50E-02
PASS
-8.15E-02
5.08E-04
-8.05E-02
-8.26E-02
-7.50E-02
PASS
-8.16E-02
5.09E-04
-8.05E-02
-8.26E-02
-7.50E-02
PASS
-8.16E-02
5.24E-04
-8.05E-02
-8.27E-02
-7.50E-02
PASS
-8.18E-02
5.31E-04
-8.07E-02
-8.29E-02
-7.50E-02
PASS
-8.28E-02
5.43E-04
-8.17E-02
-8.39E-02
-7.50E-02
PASS
An ISO 9001:2008 and DSCC Certified Company
160
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
Specification MAX
Negative Short-Circuit Current @+/-5V #4 (A)
-7.40E-02
-7.50E-02
-7.60E-02
-7.70E-02
-7.80E-02
-7.90E-02
-8.00E-02
-8.10E-02
-8.20E-02
-8.30E-02
-8.40E-02
0
50
100
150
Total Dose (krad(Si))
Figure 5.78. Plot of Negative Short-Circuit Current @+/-5V #4 (A) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
161
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.78. Raw data for Negative Short-Circuit Current @+/-5V #4 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Short-Circuit Current @+/-5V #4 (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MAX
Status
0
-8.19E-02
-8.22E-02
-8.22E-02
-8.26E-02
-8.25E-02
-8.12E-02
-8.14E-02
-8.13E-02
-8.16E-02
-8.10E-02
-8.14E-02
-8.15E-02
10
-8.17E-02
-8.22E-02
-8.23E-02
-8.26E-02
-8.24E-02
-8.11E-02
-8.14E-02
-8.15E-02
-8.18E-02
-8.10E-02
-8.15E-02
-8.16E-02
20
-8.14E-02
-8.18E-02
-8.19E-02
-8.24E-02
-8.21E-02
-8.09E-02
-8.12E-02
-8.13E-02
-8.15E-02
-8.09E-02
-8.13E-02
-8.13E-02
30
-8.12E-02
-8.17E-02
-8.18E-02
-8.22E-02
-8.20E-02
-8.08E-02
-8.12E-02
-8.12E-02
-8.15E-02
-8.08E-02
-8.12E-02
-8.12E-02
40
-8.12E-02
-8.16E-02
-8.18E-02
-8.23E-02
-8.20E-02
-8.08E-02
-8.11E-02
-8.12E-02
-8.14E-02
-8.08E-02
-8.11E-02
-8.12E-02
50
-8.12E-02
-8.17E-02
-8.18E-02
-8.23E-02
-8.20E-02
-8.08E-02
-8.11E-02
-8.12E-02
-8.15E-02
-8.08E-02
-8.10E-02
-8.10E-02
60
-8.12E-02
-8.17E-02
-8.18E-02
-8.23E-02
-8.20E-02
-8.08E-02
-8.11E-02
-8.12E-02
-8.15E-02
-8.08E-02
-8.09E-02
-8.10E-02
70
-8.11E-02
-8.17E-02
-8.18E-02
-8.24E-02
-8.21E-02
-8.08E-02
-8.12E-02
-8.13E-02
-8.15E-02
-8.09E-02
-8.09E-02
-8.10E-02
75
-8.12E-02
-8.18E-02
-8.18E-02
-8.24E-02
-8.20E-02
-8.09E-02
-8.12E-02
-8.12E-02
-8.15E-02
-8.08E-02
-8.09E-02
-8.09E-02
100
-8.15E-02
-8.20E-02
-8.20E-02
-8.27E-02
-8.23E-02
-8.10E-02
-8.14E-02
-8.14E-02
-8.18E-02
-8.10E-02
-8.09E-02
-8.10E-02
200
-8.24E-02
-8.31E-02
-8.31E-02
-8.38E-02
-8.34E-02
-8.21E-02
-8.24E-02
-8.24E-02
-8.27E-02
-8.20E-02
-8.10E-02
-8.10E-02
-8.18E-02
5.84E-04
-8.06E-02
-8.30E-02
-7.50E-02
PASS
-8.18E-02
5.53E-04
-8.07E-02
-8.29E-02
-7.50E-02
PASS
-8.15E-02
5.03E-04
-8.05E-02
-8.26E-02
-7.50E-02
PASS
-8.14E-02
4.91E-04
-8.04E-02
-8.24E-02
-7.50E-02
PASS
-8.14E-02
4.99E-04
-8.04E-02
-8.24E-02
-7.50E-02
PASS
-8.14E-02
5.01E-04
-8.04E-02
-8.25E-02
-7.50E-02
PASS
-8.14E-02
5.10E-04
-8.04E-02
-8.25E-02
-7.50E-02
PASS
-8.15E-02
5.09E-04
-8.04E-02
-8.25E-02
-7.50E-02
PASS
-8.15E-02
5.17E-04
-8.04E-02
-8.25E-02
-7.50E-02
PASS
-8.17E-02
5.46E-04
-8.06E-02
-8.28E-02
-7.50E-02
PASS
-8.27E-02
5.80E-04
-8.15E-02
-8.39E-02
-7.50E-02
PASS
An ISO 9001:2008 and DSCC Certified Company
162
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
Specification MAX
1.80E-02
Positive Supply Current @5V (A)
1.60E-02
1.40E-02
1.20E-02
1.00E-02
8.00E-03
6.00E-03
4.00E-03
2.00E-03
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.79. Plot of Positive Supply Current @5V (A) versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
163
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.79. Raw data for Positive Supply Current @5V (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Supply Current @5V (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MAX
Status
0
1.32E-02
1.32E-02
1.34E-02
1.34E-02
1.36E-02
1.34E-02
1.31E-02
1.33E-02
1.31E-02
1.35E-02
1.32E-02
1.34E-02
10
1.31E-02
1.31E-02
1.32E-02
1.32E-02
1.34E-02
1.33E-02
1.29E-02
1.30E-02
1.29E-02
1.34E-02
1.31E-02
1.32E-02
20
1.30E-02
1.29E-02
1.32E-02
1.31E-02
1.33E-02
1.32E-02
1.28E-02
1.29E-02
1.28E-02
1.33E-02
1.31E-02
1.32E-02
30
1.29E-02
1.29E-02
1.31E-02
1.30E-02
1.32E-02
1.31E-02
1.27E-02
1.29E-02
1.28E-02
1.32E-02
1.31E-02
1.32E-02
40
1.28E-02
1.28E-02
1.30E-02
1.28E-02
1.31E-02
1.30E-02
1.26E-02
1.28E-02
1.27E-02
1.31E-02
1.31E-02
1.32E-02
50
1.27E-02
1.27E-02
1.29E-02
1.27E-02
1.29E-02
1.29E-02
1.25E-02
1.27E-02
1.26E-02
1.30E-02
1.31E-02
1.32E-02
60
1.26E-02
1.26E-02
1.28E-02
1.25E-02
1.28E-02
1.28E-02
1.24E-02
1.26E-02
1.25E-02
1.29E-02
1.31E-02
1.32E-02
70
1.25E-02
1.24E-02
1.27E-02
1.24E-02
1.27E-02
1.27E-02
1.23E-02
1.25E-02
1.24E-02
1.28E-02
1.31E-02
1.33E-02
75
1.25E-02
1.24E-02
1.27E-02
1.23E-02
1.27E-02
1.26E-02
1.23E-02
1.25E-02
1.24E-02
1.28E-02
1.32E-02
1.33E-02
100
1.23E-02
1.22E-02
1.25E-02
1.20E-02
1.24E-02
1.24E-02
1.20E-02
1.23E-02
1.21E-02
1.25E-02
1.31E-02
1.33E-02
200
1.10E-02
1.09E-02
1.12E-02
1.07E-02
1.12E-02
1.11E-02
1.08E-02
1.11E-02
1.09E-02
1.12E-02
1.32E-02
1.33E-02
1.33E-02
1.63E-04
1.37E-02
1.30E-02
1.60E-02
PASS
1.32E-02
1.77E-04
1.35E-02
1.28E-02
1.60E-02
PASS
1.31E-02
1.79E-04
1.34E-02
1.27E-02
1.60E-02
PASS
1.30E-02
1.73E-04
1.33E-02
1.26E-02
1.60E-02
PASS
1.29E-02
1.69E-04
1.32E-02
1.25E-02
1.60E-02
PASS
1.28E-02
1.64E-04
1.31E-02
1.24E-02
1.60E-02
PASS
1.27E-02
1.66E-04
1.30E-02
1.23E-02
1.60E-02
PASS
1.26E-02
1.65E-04
1.29E-02
1.22E-02
1.60E-02
PASS
1.25E-02
1.70E-04
1.29E-02
1.22E-02
1.60E-02
PASS
1.23E-02
1.85E-04
1.26E-02
1.19E-02
1.60E-02
PASS
1.10E-02
1.88E-04
1.14E-02
1.06E-02
1.60E-02
PASS
An ISO 9001:2008 and DSCC Certified Company
164
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
0.00E+00
Negative Supply Current @5V (A)
-2.00E-03
-4.00E-03
-6.00E-03
-8.00E-03
-1.00E-02
-1.20E-02
-1.40E-02
-1.60E-02
-1.80E-02
0
50
100
150
Total Dose (krad(Si))
Figure 5.80. Plot of Negative Supply Current @5V (A) versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
165
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.80. Raw data for Negative Supply Current @5V (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Supply Current @5V (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
-1.32E-02
-1.32E-02
-1.34E-02
-1.33E-02
-1.35E-02
-1.33E-02
-1.30E-02
-1.32E-02
-1.31E-02
-1.35E-02
-1.32E-02
-1.33E-02
10
-1.31E-02
-1.30E-02
-1.32E-02
-1.32E-02
-1.33E-02
-1.33E-02
-1.28E-02
-1.30E-02
-1.29E-02
-1.33E-02
-1.30E-02
-1.31E-02
20
-1.29E-02
-1.29E-02
-1.31E-02
-1.30E-02
-1.32E-02
-1.32E-02
-1.27E-02
-1.29E-02
-1.28E-02
-1.32E-02
-1.30E-02
-1.32E-02
30
-1.29E-02
-1.28E-02
-1.30E-02
-1.29E-02
-1.31E-02
-1.31E-02
-1.26E-02
-1.28E-02
-1.27E-02
-1.31E-02
-1.30E-02
-1.31E-02
40
-1.28E-02
-1.27E-02
-1.29E-02
-1.28E-02
-1.30E-02
-1.30E-02
-1.25E-02
-1.27E-02
-1.26E-02
-1.30E-02
-1.31E-02
-1.32E-02
50
-1.27E-02
-1.26E-02
-1.28E-02
-1.26E-02
-1.29E-02
-1.29E-02
-1.25E-02
-1.26E-02
-1.25E-02
-1.29E-02
-1.31E-02
-1.32E-02
60
-1.26E-02
-1.25E-02
-1.28E-02
-1.25E-02
-1.28E-02
-1.27E-02
-1.23E-02
-1.25E-02
-1.24E-02
-1.28E-02
-1.31E-02
-1.32E-02
70
-1.25E-02
-1.24E-02
-1.26E-02
-1.23E-02
-1.27E-02
-1.26E-02
-1.22E-02
-1.24E-02
-1.23E-02
-1.27E-02
-1.31E-02
-1.32E-02
75
-1.24E-02
-1.24E-02
-1.26E-02
-1.23E-02
-1.26E-02
-1.26E-02
-1.22E-02
-1.24E-02
-1.23E-02
-1.27E-02
-1.31E-02
-1.32E-02
100
-1.22E-02
-1.21E-02
-1.24E-02
-1.19E-02
-1.24E-02
-1.23E-02
-1.20E-02
-1.22E-02
-1.21E-02
-1.24E-02
-1.31E-02
-1.32E-02
200
-1.10E-02
-1.09E-02
-1.12E-02
-1.06E-02
-1.11E-02
-1.10E-02
-1.07E-02
-1.10E-02
-1.09E-02
-1.12E-02
-1.31E-02
-1.32E-02
-1.33E-02
1.65E-04
-1.29E-02
-1.36E-02
-1.60E-02
PASS
-1.31E-02
1.80E-04
-1.27E-02
-1.35E-02
-1.60E-02
PASS
-1.30E-02
1.78E-04
-1.26E-02
-1.34E-02
-1.60E-02
PASS
-1.29E-02
1.71E-04
-1.26E-02
-1.33E-02
-1.60E-02
PASS
-1.28E-02
1.71E-04
-1.25E-02
-1.32E-02
-1.60E-02
PASS
-1.27E-02
1.67E-04
-1.24E-02
-1.30E-02
-1.60E-02
PASS
-1.26E-02
1.67E-04
-1.22E-02
-1.29E-02
-1.60E-02
PASS
-1.25E-02
1.68E-04
-1.21E-02
-1.28E-02
-1.60E-02
PASS
-1.24E-02
1.71E-04
-1.21E-02
-1.28E-02
-1.60E-02
PASS
-1.22E-02
1.81E-04
-1.18E-02
-1.26E-02
-1.60E-02
PASS
-1.10E-02
1.84E-04
-1.06E-02
-1.13E-02
-1.60E-02
PASS
An ISO 9001:2008 and DSCC Certified Company
166
RLAT Report
10-326 100808 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
5.00E-03
Input Offset Voltage @5V #1 (V)
4.00E-03
3.00E-03
2.00E-03
1.00E-03
0.00E+00
-1.00E-03
-2.00E-03
-3.00E-03
-4.00E-03
-5.00E-03
0
50
100
150
Total Dose (krad(Si))
Figure 5.81. Plot of Input Offset Voltage @5V #1 (V) versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
167
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.81. Raw data for Input Offset Voltage @5V #1 (V) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage @5V #1 (V)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
-2.49E-04
-1.05E-04
-9.40E-05
-1.10E-03
-3.01E-04
-8.06E-04
-4.15E-04
-3.64E-04
-4.21E-04
-2.49E-04
-4.36E-04
-5.69E-04
10
-2.87E-04
-1.33E-04
-1.37E-04
-1.13E-03
-3.35E-04
-8.24E-04
-4.47E-04
-4.03E-04
-4.65E-04
-2.87E-04
-4.37E-04
-5.65E-04
20
-3.34E-04
-1.79E-04
-1.92E-04
-1.21E-03
-3.79E-04
-8.72E-04
-5.00E-04
-4.66E-04
-5.21E-04
-3.39E-04
-4.37E-04
-5.69E-04
30
-3.77E-04
-2.24E-04
-2.49E-04
-1.31E-03
-4.23E-04
-9.17E-04
-5.42E-04
-5.19E-04
-5.81E-04
-3.79E-04
-4.38E-04
-5.69E-04
40
-4.27E-04
-2.65E-04
-3.00E-04
-1.42E-03
-4.67E-04
-9.54E-04
-5.77E-04
-5.71E-04
-6.30E-04
-4.08E-04
-4.36E-04
-5.69E-04
50
-4.71E-04
-2.89E-04
-3.50E-04
-1.53E-03
-5.11E-04
-9.89E-04
-6.06E-04
-6.13E-04
-6.71E-04
-4.42E-04
-4.38E-04
-5.69E-04
60
-5.04E-04
-3.16E-04
-3.98E-04
-1.63E-03
-5.46E-04
-1.01E-03
-6.40E-04
-6.58E-04
-7.09E-04
-4.67E-04
-4.39E-04
-5.69E-04
70
-5.35E-04
-3.37E-04
-4.38E-04
-1.73E-03
-5.89E-04
-1.03E-03
-6.68E-04
-6.91E-04
-7.39E-04
-4.78E-04
-4.37E-04
-5.70E-04
75
-5.43E-04
-3.34E-04
-4.47E-04
-1.75E-03
-5.94E-04
-1.02E-03
-6.75E-04
-6.95E-04
-7.51E-04
-4.76E-04
-4.39E-04
-5.69E-04
100
-6.10E-04
-3.95E-04
-5.32E-04
-2.00E-03
-6.82E-04
-1.07E-03
-7.27E-04
-7.67E-04
-8.29E-04
-5.17E-04
-4.40E-04
-5.69E-04
200
-1.14E-03
-7.37E-04
-1.12E-03
-2.39E-03
-1.21E-03
-1.49E-03
-1.19E-03
-1.28E-03
-1.33E-03
-9.14E-04
-4.39E-04
-5.69E-04
-4.10E-04
3.14E-04
2.38E-04
-1.06E-03
-2.00E-03
PASS
2.00E-03
PASS
-4.45E-04
3.10E-04
1.96E-04
-1.09E-03
-2.50E-03
PASS
2.50E-03
PASS
-5.00E-04
3.19E-04
1.59E-04
-1.16E-03
-2.50E-03
PASS
2.50E-03
PASS
-5.53E-04
3.32E-04
1.33E-04
-1.24E-03
-2.50E-03
PASS
2.50E-03
PASS
-6.02E-04
3.47E-04
1.16E-04
-1.32E-03
-2.50E-03
PASS
2.50E-03
PASS
-6.47E-04
3.66E-04
1.09E-04
-1.40E-03
-4.50E-03
PASS
4.50E-03
PASS
-6.88E-04
3.82E-04
1.02E-04
-1.48E-03
-4.50E-03
PASS
4.50E-03
PASS
-7.23E-04
4.01E-04
1.05E-04
-1.55E-03
-4.50E-03
PASS
4.50E-03
PASS
-7.28E-04
4.06E-04
1.11E-04
-1.57E-03
-4.50E-03
PASS
4.50E-03
PASS
-8.13E-04
4.57E-04
1.31E-04
-1.76E-03
-4.50E-03
PASS
4.50E-03
PASS
-1.28E-03
4.43E-04
-3.64E-04
-2.19E-03
-4.50E-03
PASS
4.50E-03
PASS
An ISO 9001:2008 and DSCC Certified Company
168
RLAT Report
10-326 100808 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
5.00E-03
Input Offset Voltage @5V #2 (V)
4.00E-03
3.00E-03
2.00E-03
1.00E-03
0.00E+00
-1.00E-03
-2.00E-03
-3.00E-03
-4.00E-03
-5.00E-03
0
50
100
150
Total Dose (krad(Si))
Figure 5.82. Plot of Input Offset Voltage @5V #2 (V) versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
169
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.82. Raw data for Input Offset Voltage @5V #2 (V) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage @5V #2 (V)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
-1.92E-04
-8.19E-04
-3.01E-04
-3.88E-04
-3.90E-05
2.53E-04
-7.93E-04
-2.57E-04
-3.63E-04
-3.59E-04
-2.94E-04
-7.14E-04
10
-2.12E-04
-8.40E-04
-3.39E-04
-4.14E-04
-5.50E-05
2.11E-04
-8.20E-04
-2.78E-04
-3.95E-04
-4.59E-04
-2.87E-04
-7.09E-04
20
-2.34E-04
-8.79E-04
-4.00E-04
-4.76E-04
-8.70E-05
1.58E-04
-8.64E-04
-3.24E-04
-4.42E-04
-5.34E-04
-2.87E-04
-7.11E-04
30
-2.74E-04
-9.13E-04
-4.54E-04
-5.40E-04
-1.16E-04
1.03E-04
-9.05E-04
-3.77E-04
-4.96E-04
-5.97E-04
-2.87E-04
-7.07E-04
40
-3.09E-04
-9.33E-04
-5.09E-04
-6.30E-04
-1.33E-04
5.80E-05
-9.38E-04
-4.15E-04
-5.38E-04
-6.70E-04
-2.87E-04
-7.10E-04
50
-3.37E-04
-9.54E-04
-5.59E-04
-7.17E-04
-1.59E-04
1.90E-05
-9.60E-04
-4.42E-04
-5.69E-04
-7.20E-04
-2.87E-04
-7.11E-04
60
-3.56E-04
-9.67E-04
-6.06E-04
-8.12E-04
-1.77E-04
-1.10E-05
-9.98E-04
-4.66E-04
-6.02E-04
-7.73E-04
-2.88E-04
-7.11E-04
70
-3.79E-04
-9.75E-04
-6.30E-04
-9.05E-04
-1.94E-04
-4.50E-05
-1.02E-03
-4.89E-04
-6.30E-04
-8.25E-04
-2.90E-04
-7.11E-04
75
-3.80E-04
-9.75E-04
-6.42E-04
-9.30E-04
-1.95E-04
-4.40E-05
-1.02E-03
-4.92E-04
-6.34E-04
-8.39E-04
-2.90E-04
-7.11E-04
100
-4.36E-04
-1.01E-03
-7.19E-04
-1.15E-03
-2.41E-04
-1.19E-04
-1.07E-03
-5.50E-04
-7.04E-04
-9.41E-04
-2.90E-04
-7.11E-04
200
-8.54E-04
-1.31E-03
-1.28E-03
-1.67E-03
-5.91E-04
-5.33E-04
-1.45E-03
-9.58E-04
-1.19E-03
-1.62E-03
-2.89E-04
-7.12E-04
-3.26E-04
3.18E-04
3.30E-04
-9.82E-04
-2.00E-03
PASS
2.00E-03
PASS
-3.60E-04
3.17E-04
2.94E-04
-1.01E-03
-2.50E-03
PASS
2.50E-03
PASS
-4.08E-04
3.18E-04
2.49E-04
-1.07E-03
-2.50E-03
PASS
2.50E-03
PASS
-4.57E-04
3.17E-04
1.98E-04
-1.11E-03
-2.50E-03
PASS
2.50E-03
PASS
-5.02E-04
3.19E-04
1.57E-04
-1.16E-03
-2.50E-03
PASS
2.50E-03
PASS
-5.40E-04
3.20E-04
1.21E-04
-1.20E-03
-4.50E-03
PASS
4.50E-03
PASS
-5.77E-04
3.28E-04
9.97E-05
-1.25E-03
-4.50E-03
PASS
4.50E-03
PASS
-6.09E-04
3.33E-04
7.80E-05
-1.30E-03
-4.50E-03
PASS
4.50E-03
PASS
-6.15E-04
3.36E-04
7.89E-05
-1.31E-03
-4.50E-03
PASS
4.50E-03
PASS
-6.95E-04
3.56E-04
4.02E-05
-1.43E-03
-4.50E-03
PASS
4.50E-03
PASS
-1.15E-03
4.02E-04
-3.17E-04
-1.98E-03
-4.50E-03
PASS
4.50E-03
PASS
An ISO 9001:2008 and DSCC Certified Company
170
RLAT Report
10-326 100808 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
5.00E-03
Input Offset Voltage @5V #3 (V)
4.00E-03
3.00E-03
2.00E-03
1.00E-03
0.00E+00
-1.00E-03
-2.00E-03
-3.00E-03
-4.00E-03
-5.00E-03
0
50
100
150
Total Dose (krad(Si))
Figure 5.83. Plot of Input Offset Voltage @5V #3 (V) versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
171
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.83. Raw data for Input Offset Voltage @5V #3 (V) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage @5V #3 (V)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
-4.66E-04
-1.02E-03
-6.88E-04
-3.38E-04
-2.52E-04
-7.59E-04
-2.20E-05
-4.68E-04
-2.83E-04
-2.89E-04
-4.70E-05
-2.80E-04
10
-4.84E-04
-1.04E-03
-7.20E-04
-3.60E-04
-2.74E-04
-8.08E-04
-5.50E-05
-4.68E-04
-3.22E-04
-3.42E-04
-4.30E-05
-2.83E-04
20
-5.29E-04
-1.07E-03
-7.75E-04
-4.27E-04
-3.14E-04
-8.66E-04
-1.03E-04
-4.76E-04
-3.87E-04
-4.15E-04
-4.30E-05
-2.83E-04
30
-5.72E-04
-1.11E-03
-8.18E-04
-5.08E-04
-3.49E-04
-9.24E-04
-1.47E-04
-4.87E-04
-4.53E-04
-4.72E-04
-4.40E-05
-2.84E-04
40
-6.13E-04
-1.14E-03
-8.70E-04
-5.98E-04
-3.81E-04
-9.81E-04
-1.94E-04
-5.00E-04
-5.17E-04
-5.33E-04
-4.50E-05
-2.85E-04
50
-6.42E-04
-1.16E-03
-9.06E-04
-6.82E-04
-4.02E-04
-1.02E-03
-2.28E-04
-5.04E-04
-5.62E-04
-5.88E-04
-4.50E-05
-2.83E-04
60
-6.75E-04
-1.18E-03
-9.34E-04
-7.67E-04
-4.19E-04
-1.06E-03
-2.69E-04
-5.19E-04
-5.99E-04
-6.38E-04
-4.70E-05
-2.83E-04
70
-6.91E-04
-1.19E-03
-9.72E-04
-8.49E-04
-4.26E-04
-1.09E-03
-2.97E-04
-5.23E-04
-6.50E-04
-6.77E-04
-4.70E-05
-2.79E-04
75
-7.00E-04
-1.18E-03
-9.74E-04
-8.74E-04
-4.20E-04
-1.09E-03
-3.06E-04
-5.26E-04
-6.61E-04
-6.87E-04
-4.40E-05
-2.83E-04
100
-7.64E-04
-1.24E-03
-1.04E-03
-1.09E-03
-4.64E-04
-1.17E-03
-3.87E-04
-5.51E-04
-7.71E-04
-7.91E-04
-4.70E-05
-2.82E-04
200
-1.23E-03
-1.50E-03
-1.50E-03
-1.49E-03
-8.06E-04
-1.67E-03
-8.95E-04
-8.23E-04
-1.42E-03
-1.43E-03
-4.70E-05
-2.81E-04
-4.59E-04
2.92E-04
1.44E-04
-1.06E-03
-2.00E-03
PASS
2.00E-03
PASS
-4.87E-04
2.90E-04
1.11E-04
-1.08E-03
-2.50E-03
PASS
2.50E-03
PASS
-5.37E-04
2.88E-04
5.74E-05
-1.13E-03
-2.50E-03
PASS
2.50E-03
PASS
-5.84E-04
2.87E-04
8.07E-06
-1.18E-03
-2.50E-03
PASS
2.50E-03
PASS
-6.32E-04
2.85E-04
-4.42E-05
-1.22E-03
-2.50E-03
PASS
2.50E-03
PASS
-6.70E-04
2.86E-04
-7.99E-05
-1.26E-03
-4.50E-03
PASS
4.50E-03
PASS
-7.06E-04
2.85E-04
-1.18E-04
-1.29E-03
-4.50E-03
PASS
4.50E-03
PASS
-7.36E-04
2.87E-04
-1.43E-04
-1.33E-03
-4.50E-03
PASS
4.50E-03
PASS
-7.42E-04
2.87E-04
-1.50E-04
-1.33E-03
-4.50E-03
PASS
4.50E-03
PASS
-8.26E-04
2.99E-04
-2.08E-04
-1.44E-03
-4.50E-03
PASS
4.50E-03
PASS
-1.28E-03
3.20E-04
-6.16E-04
-1.94E-03
-4.50E-03
PASS
4.50E-03
PASS
An ISO 9001:2008 and DSCC Certified Company
172
RLAT Report
10-326 100808 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
5.00E-03
Input Offset Voltage @5V #4 (V)
4.00E-03
3.00E-03
2.00E-03
1.00E-03
0.00E+00
-1.00E-03
-2.00E-03
-3.00E-03
-4.00E-03
-5.00E-03
0
50
100
150
Total Dose (krad(Si))
Figure 5.84. Plot of Input Offset Voltage @5V #4 (V) versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
173
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.84. Raw data for Input Offset Voltage @5V #4 (V) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage @5V #4 (V)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
-1.06E-03
-2.44E-04
-2.19E-04
-4.35E-04
-9.45E-04
-1.59E-04
-3.15E-04
-9.86E-04
-1.92E-04
-7.50E-05
2.78E-04
-3.31E-04
10
-1.08E-03
-2.79E-04
-2.70E-04
-4.87E-04
-9.71E-04
-1.72E-04
-3.55E-04
-1.01E-03
-2.32E-04
-1.19E-04
2.74E-04
-3.30E-04
20
-1.13E-03
-3.30E-04
-3.40E-04
-5.73E-04
-1.02E-03
-1.96E-04
-4.06E-04
-1.05E-03
-2.94E-04
-1.84E-04
2.77E-04
-3.30E-04
30
-1.17E-03
-3.68E-04
-4.04E-04
-6.58E-04
-1.06E-03
-2.23E-04
-4.52E-04
-1.09E-03
-3.54E-04
-2.36E-04
2.76E-04
-3.31E-04
40
-1.22E-03
-4.10E-04
-4.71E-04
-7.66E-04
-1.11E-03
-2.66E-04
-5.00E-04
-1.13E-03
-4.10E-04
-2.74E-04
2.77E-04
-3.31E-04
50
-1.25E-03
-4.41E-04
-5.38E-04
-8.73E-04
-1.16E-03
-2.96E-04
-5.30E-04
-1.14E-03
-4.40E-04
-3.01E-04
2.77E-04
-3.30E-04
60
-1.28E-03
-4.65E-04
-5.89E-04
-9.63E-04
-1.19E-03
-3.23E-04
-5.73E-04
-1.17E-03
-4.70E-04
-3.24E-04
2.77E-04
-3.32E-04
70
-1.30E-03
-4.81E-04
-6.52E-04
-1.06E-03
-1.24E-03
-3.42E-04
-5.93E-04
-1.19E-03
-5.00E-04
-3.48E-04
2.77E-04
-3.31E-04
75
-1.31E-03
-4.80E-04
-6.66E-04
-1.09E-03
-1.24E-03
-3.41E-04
-5.90E-04
-1.19E-03
-5.01E-04
-3.47E-04
2.78E-04
-3.34E-04
100
-1.36E-03
-5.40E-04
-7.57E-04
-1.33E-03
-1.34E-03
-3.85E-04
-6.51E-04
-1.24E-03
-5.68E-04
-4.03E-04
2.77E-04
-3.34E-04
200
-1.72E-03
-9.84E-04
-1.41E-03
-1.77E-03
-1.91E-03
-7.72E-04
-1.11E-03
-1.65E-03
-1.02E-03
-8.38E-04
2.77E-04
-3.32E-04
-4.63E-04
3.82E-04
3.25E-04
-1.25E-03
-2.00E-03
PASS
2.00E-03
PASS
-4.98E-04
3.76E-04
2.78E-04
-1.27E-03
-2.50E-03
PASS
2.50E-03
PASS
-5.52E-04
3.72E-04
2.15E-04
-1.32E-03
-2.50E-03
PASS
2.50E-03
PASS
-6.02E-04
3.71E-04
1.63E-04
-1.37E-03
-2.50E-03
PASS
2.50E-03
PASS
-6.56E-04
3.71E-04
1.10E-04
-1.42E-03
-2.50E-03
PASS
2.50E-03
PASS
-6.97E-04
3.73E-04
7.32E-05
-1.47E-03
-4.50E-03
PASS
4.50E-03
PASS
-7.35E-04
3.76E-04
4.25E-05
-1.51E-03
-4.50E-03
PASS
4.50E-03
PASS
-7.70E-04
3.83E-04
2.13E-05
-1.56E-03
-4.50E-03
PASS
4.50E-03
PASS
-7.75E-04
3.87E-04
2.41E-05
-1.57E-03
-4.50E-03
PASS
4.50E-03
PASS
-8.57E-04
4.10E-04
-9.33E-06
-1.70E-03
-4.50E-03
PASS
4.50E-03
PASS
-1.32E-03
4.22E-04
-4.45E-04
-2.19E-03
-4.50E-03
PASS
4.50E-03
PASS
An ISO 9001:2008 and DSCC Certified Company
174
RLAT Report
10-326 100808 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
2.00E-06
Input Offset Current @5V #1 (A)
1.50E-06
1.00E-06
5.00E-07
0.00E+00
-5.00E-07
-1.00E-06
-1.50E-06
-2.00E-06
0
50
100
150
Total Dose (krad(Si))
Figure 5.85. Plot of Input Offset Current @5V #1 (A) versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
175
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.85. Raw data for Input Offset Current @5V #1 (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Current @5V #1 (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
-3.00E-08
2.00E-08
3.00E-08
1.00E-08
-2.00E-08
0.00E+00
0.00E+00
0.00E+00
3.00E-08
2.00E-08
0.00E+00
0.00E+00
10
-3.00E-08
4.00E-08
5.00E-08
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
5.00E-08
3.00E-08
0.00E+00
0.00E+00
20
-3.00E-08
6.00E-08
6.00E-08
1.00E-08
0.00E+00
0.00E+00
0.00E+00
0.00E+00
7.00E-08
6.00E-08
0.00E+00
0.00E+00
30
-4.00E-08
8.00E-08
8.00E-08
2.00E-08
0.00E+00
-1.00E-08
0.00E+00
0.00E+00
1.00E-07
7.00E-08
0.00E+00
0.00E+00
40
-5.00E-08
1.00E-07
1.00E-07
3.00E-08
0.00E+00
-2.00E-08
0.00E+00
1.00E-08
1.10E-07
1.00E-07
0.00E+00
0.00E+00
50
-7.00E-08
1.10E-07
1.20E-07
3.00E-08
0.00E+00
-2.00E-08
-2.00E-08
0.00E+00
1.40E-07
1.10E-07
0.00E+00
0.00E+00
60
-8.00E-08
1.30E-07
1.40E-07
4.00E-08
0.00E+00
-3.00E-08
-2.00E-08
0.00E+00
1.60E-07
1.30E-07
0.00E+00
0.00E+00
70
-9.00E-08
1.40E-07
1.50E-07
5.00E-08
0.00E+00
-3.00E-08
-2.00E-08
0.00E+00
1.80E-07
1.50E-07
0.00E+00
0.00E+00
75
-9.00E-08
1.60E-07
1.60E-07
6.00E-08
0.00E+00
-3.00E-08
-2.00E-08
2.00E-08
1.90E-07
1.60E-07
0.00E+00
0.00E+00
100
-1.00E-07
1.80E-07
2.00E-07
1.00E-07
0.00E+00
-3.00E-08
-2.00E-08
3.00E-08
2.30E-07
2.00E-07
0.00E+00
0.00E+00
200
-2.40E-07
2.70E-07
3.30E-07
7.00E-08
-7.00E-08
-1.20E-07
-1.10E-07
1.00E-08
4.10E-07
3.20E-07
0.00E+00
0.00E+00
6.00E-09
2.01E-08
4.75E-08
-3.55E-08
-4.00E-07
PASS
4.00E-07
PASS
1.40E-08
2.67E-08
6.92E-08
-4.12E-08
-5.00E-07
PASS
5.00E-07
PASS
2.30E-08
3.56E-08
9.65E-08
-5.05E-08
-5.00E-07
PASS
5.00E-07
PASS
3.00E-08
4.81E-08
1.29E-07
-6.93E-08
-5.00E-07
PASS
5.00E-07
PASS
3.80E-08
5.92E-08
1.60E-07
-8.43E-08
-5.00E-07
PASS
5.00E-07
PASS
4.00E-08
7.36E-08
1.92E-07
-1.12E-07
-7.50E-07
PASS
7.50E-07
PASS
4.70E-08
8.58E-08
2.24E-07
-1.30E-07
-7.50E-07
PASS
7.50E-07
PASS
5.30E-08
9.48E-08
2.49E-07
-1.43E-07
-7.50E-07
PASS
7.50E-07
PASS
6.10E-08
9.95E-08
2.66E-07
-1.44E-07
-7.50E-07
PASS
7.50E-07
PASS
7.90E-08
1.18E-07
3.22E-07
-1.64E-07
-1.00E-06
PASS
1.00E-06
PASS
8.70E-08
2.29E-07
5.59E-07
-3.85E-07
-1.50E-06
PASS
1.50E-06
PASS
An ISO 9001:2008 and DSCC Certified Company
176
RLAT Report
10-326 100808 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
2.00E-06
Input Offset Current @5V #2 (A)
1.50E-06
1.00E-06
5.00E-07
0.00E+00
-5.00E-07
-1.00E-06
-1.50E-06
-2.00E-06
0
50
100
150
Total Dose (krad(Si))
Figure 5.86. Plot of Input Offset Current @5V #2 (A) versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
177
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.86. Raw data for Input Offset Current @5V #2 (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Current @5V #2 (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
1.00E-08
-2.00E-08
2.00E-08
0.00E+00
-1.00E-08
2.00E-08
0.00E+00
-2.00E-08
0.00E+00
2.00E-08
3.00E-08
2.00E-08
10
1.00E-08
0.00E+00
4.00E-08
0.00E+00
0.00E+00
4.00E-08
2.00E-08
-1.00E-08
1.00E-08
0.00E+00
3.00E-08
2.00E-08
20
0.00E+00
1.00E-08
5.00E-08
2.00E-08
2.00E-08
5.00E-08
4.00E-08
1.00E-08
3.00E-08
0.00E+00
4.00E-08
2.00E-08
30
0.00E+00
3.00E-08
6.00E-08
5.00E-08
4.00E-08
7.00E-08
5.00E-08
3.00E-08
5.00E-08
0.00E+00
4.00E-08
2.00E-08
40
0.00E+00
5.00E-08
6.00E-08
7.00E-08
6.00E-08
9.00E-08
7.00E-08
5.00E-08
7.00E-08
-2.00E-08
4.00E-08
2.00E-08
50
0.00E+00
7.00E-08
7.00E-08
1.00E-07
7.00E-08
1.00E-07
8.00E-08
6.00E-08
9.00E-08
-3.00E-08
4.00E-08
2.00E-08
60
-1.00E-08
8.00E-08
8.00E-08
1.30E-07
1.00E-07
1.20E-07
1.00E-07
8.00E-08
1.00E-07
-4.00E-08
3.00E-08
2.00E-08
70
-1.00E-08
1.00E-07
9.00E-08
1.70E-07
1.10E-07
1.50E-07
1.10E-07
1.00E-07
1.20E-07
-4.00E-08
3.00E-08
2.00E-08
75
-2.00E-08
1.10E-07
9.00E-08
1.80E-07
1.20E-07
1.50E-07
1.20E-07
1.10E-07
1.30E-07
-4.00E-08
3.00E-08
2.00E-08
100
-2.00E-08
1.50E-07
1.10E-07
2.60E-07
1.60E-07
2.00E-07
1.50E-07
1.50E-07
1.70E-07
-6.00E-08
3.00E-08
2.00E-08
200
-1.40E-07
2.70E-07
2.00E-07
3.50E-07
2.70E-07
3.00E-07
2.50E-07
2.70E-07
2.90E-07
-1.90E-07
3.00E-08
2.00E-08
2.00E-09
1.55E-08
3.40E-08
-3.00E-08
-4.00E-07
PASS
4.00E-07
PASS
1.10E-08
1.73E-08
4.67E-08
-2.47E-08
-5.00E-07
PASS
5.00E-07
PASS
2.30E-08
1.89E-08
6.20E-08
-1.60E-08
-5.00E-07
PASS
5.00E-07
PASS
3.80E-08
2.35E-08
8.65E-08
-1.05E-08
-5.00E-07
PASS
5.00E-07
PASS
5.00E-08
3.40E-08
1.20E-07
-2.02E-08
-5.00E-07
PASS
5.00E-07
PASS
6.10E-08
4.28E-08
1.49E-07
-2.74E-08
-7.50E-07
PASS
7.50E-07
PASS
7.40E-08
5.52E-08
1.88E-07
-4.00E-08
-7.50E-07
PASS
7.50E-07
PASS
9.00E-08
6.57E-08
2.26E-07
-4.56E-08
-7.50E-07
PASS
7.50E-07
PASS
9.50E-08
7.04E-08
2.40E-07
-5.04E-08
-7.50E-07
PASS
7.50E-07
PASS
1.27E-07
9.68E-08
3.27E-07
-7.30E-08
-1.00E-06
PASS
1.00E-06
PASS
1.87E-07
1.90E-07
5.79E-07
-2.05E-07
-1.50E-06
PASS
1.50E-06
PASS
An ISO 9001:2008 and DSCC Certified Company
178
RLAT Report
10-326 100808 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
2.00E-06
Input Offset Current @5V #3 (A)
1.50E-06
1.00E-06
5.00E-07
0.00E+00
-5.00E-07
-1.00E-06
-1.50E-06
-2.00E-06
0
50
100
150
Total Dose (krad(Si))
Figure 5.87. Plot of Input Offset Current @5V #3 (A) versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
179
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.87. Raw data for Input Offset Current @5V #3 (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Current @5V #3 (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
-2.00E-08
-3.00E-08
3.00E-08
0.00E+00
0.00E+00
-2.00E-08
0.00E+00
0.00E+00
0.00E+00
-1.00E-08
1.00E-08
0.00E+00
10
-2.00E-08
-1.00E-08
4.00E-08
1.00E-08
1.00E-08
-2.00E-08
2.00E-08
-1.00E-08
-1.00E-08
-1.00E-08
2.00E-08
0.00E+00
20
-2.00E-08
0.00E+00
6.00E-08
3.00E-08
3.00E-08
-2.00E-08
4.00E-08
-2.00E-08
-1.00E-08
-2.00E-08
1.00E-08
0.00E+00
30
-2.00E-08
2.00E-08
8.00E-08
6.00E-08
5.00E-08
-3.00E-08
6.00E-08
-2.00E-08
-2.00E-08
-2.00E-08
1.00E-08
0.00E+00
40
-2.00E-08
4.00E-08
1.00E-07
9.00E-08
7.00E-08
-4.00E-08
7.00E-08
-2.00E-08
-3.00E-08
-3.00E-08
2.00E-08
0.00E+00
50
-3.00E-08
5.00E-08
1.10E-07
1.20E-07
9.00E-08
-5.00E-08
9.00E-08
-3.00E-08
-4.00E-08
-4.00E-08
1.00E-08
0.00E+00
60
-3.00E-08
7.00E-08
1.30E-07
1.50E-07
1.10E-07
-6.00E-08
1.10E-07
-3.00E-08
-4.00E-08
-4.00E-08
2.00E-08
0.00E+00
70
-4.00E-08
9.00E-08
1.50E-07
1.80E-07
1.30E-07
-7.00E-08
1.30E-07
-4.00E-08
-5.00E-08
-5.00E-08
1.00E-08
0.00E+00
75
-3.00E-08
1.00E-07
1.60E-07
1.90E-07
1.30E-07
-7.00E-08
1.30E-07
-4.00E-08
-5.00E-08
-5.00E-08
1.00E-08
0.00E+00
100
-3.00E-08
1.30E-07
2.00E-07
2.70E-07
1.70E-07
-8.00E-08
1.60E-07
-4.00E-08
-6.00E-08
-6.00E-08
2.00E-08
0.00E+00
200
-1.10E-07
2.40E-07
3.10E-07
3.90E-07
2.70E-07
-2.10E-07
2.80E-07
-1.50E-07
-2.00E-07
-1.60E-07
1.00E-08
0.00E+00
-5.00E-09
1.65E-08
2.91E-08
-3.91E-08
-4.00E-07
PASS
4.00E-07
PASS
-3.31E-25
1.94E-08
4.01E-08
-4.01E-08
-5.00E-07
PASS
5.00E-07
PASS
7.00E-09
3.02E-08
6.94E-08
-5.54E-08
-5.00E-07
PASS
5.00E-07
PASS
1.60E-08
4.27E-08
1.04E-07
-7.23E-08
-5.00E-07
PASS
5.00E-07
PASS
2.30E-08
5.62E-08
1.39E-07
-9.30E-08
-5.00E-07
PASS
5.00E-07
PASS
2.70E-08
7.10E-08
1.74E-07
-1.20E-07
-7.50E-07
PASS
7.50E-07
PASS
3.70E-08
8.39E-08
2.10E-07
-1.36E-07
-7.50E-07
PASS
7.50E-07
PASS
4.30E-08
1.01E-07
2.51E-07
-1.65E-07
-7.50E-07
PASS
7.50E-07
PASS
4.70E-08
1.03E-07
2.60E-07
-1.66E-07
-7.50E-07
PASS
7.50E-07
PASS
6.60E-08
1.32E-07
3.39E-07
-2.07E-07
-1.00E-06
PASS
1.00E-06
PASS
6.60E-08
2.49E-07
5.80E-07
-4.48E-07
-1.50E-06
PASS
1.50E-06
PASS
An ISO 9001:2008 and DSCC Certified Company
180
RLAT Report
10-326 100808 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
2.00E-06
Input Offset Current @5V #4 (A)
1.50E-06
1.00E-06
5.00E-07
0.00E+00
-5.00E-07
-1.00E-06
-1.50E-06
-2.00E-06
0
50
100
150
Total Dose (krad(Si))
Figure 5.88. Plot of Input Offset Current @5V #4 (A) versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
181
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.88. Raw data for Input Offset Current @5V #4 (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Current @5V #4 (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
0.00E+00
0.00E+00
-1.00E-08
0.00E+00
1.00E-08
-2.00E-08
4.00E-08
3.00E-08
0.00E+00
-1.00E-08
0.00E+00
2.00E-08
10
0.00E+00
0.00E+00
-1.00E-08
-1.00E-08
2.00E-08
-2.00E-08
5.00E-08
6.00E-08
2.00E-08
0.00E+00
0.00E+00
2.00E-08
20
0.00E+00
0.00E+00
-1.00E-08
-2.00E-08
3.00E-08
-3.00E-08
6.00E-08
1.00E-07
4.00E-08
2.00E-08
0.00E+00
2.00E-08
30
-1.00E-08
0.00E+00
-1.00E-08
-3.00E-08
4.00E-08
-3.00E-08
7.00E-08
1.20E-07
6.00E-08
4.00E-08
0.00E+00
1.00E-08
40
-2.00E-08
0.00E+00
-2.00E-08
-3.00E-08
5.00E-08
-3.00E-08
8.00E-08
1.50E-07
7.00E-08
6.00E-08
0.00E+00
1.00E-08
50
-3.00E-08
0.00E+00
-3.00E-08
-4.00E-08
5.00E-08
-4.00E-08
8.00E-08
1.80E-07
9.00E-08
7.00E-08
0.00E+00
2.00E-08
60
-3.00E-08
-1.00E-08
-3.00E-08
-4.00E-08
6.00E-08
-4.00E-08
9.00E-08
2.10E-07
1.10E-07
9.00E-08
0.00E+00
1.00E-08
70
-3.00E-08
-2.00E-08
-3.00E-08
-5.00E-08
6.00E-08
-4.00E-08
1.00E-07
2.30E-07
1.20E-07
1.10E-07
0.00E+00
2.00E-08
75
-3.00E-08
-1.00E-08
-4.00E-08
-5.00E-08
7.00E-08
-4.00E-08
1.10E-07
2.50E-07
1.30E-07
1.20E-07
0.00E+00
1.00E-08
100
-3.00E-08
-2.00E-08
-3.00E-08
-3.00E-08
9.00E-08
-3.00E-08
1.30E-07
3.10E-07
1.70E-07
1.50E-07
0.00E+00
2.00E-08
200
-1.40E-07
-9.00E-08
-1.10E-07
-1.90E-07
1.00E-07
-1.10E-07
2.00E-07
6.10E-07
2.70E-07
2.40E-07
0.00E+00
2.00E-08
4.00E-09
1.84E-08
4.20E-08
-3.40E-08
-4.00E-07
PASS
4.00E-07
PASS
1.10E-08
2.64E-08
6.56E-08
-4.36E-08
-5.00E-07
PASS
5.00E-07
PASS
1.90E-08
3.98E-08
1.01E-07
-6.33E-08
-5.00E-07
PASS
5.00E-07
PASS
2.50E-08
4.93E-08
1.27E-07
-7.67E-08
-5.00E-07
PASS
5.00E-07
PASS
3.10E-08
6.05E-08
1.56E-07
-9.38E-08
-5.00E-07
PASS
5.00E-07
PASS
3.30E-08
7.33E-08
1.84E-07
-1.18E-07
-7.50E-07
PASS
7.50E-07
PASS
4.10E-08
8.45E-08
2.16E-07
-1.34E-07
-7.50E-07
PASS
7.50E-07
PASS
4.50E-08
9.37E-08
2.39E-07
-1.49E-07
-7.50E-07
PASS
7.50E-07
PASS
5.10E-08
1.01E-07
2.59E-07
-1.57E-07
-7.50E-07
PASS
7.50E-07
PASS
7.10E-08
1.18E-07
3.15E-07
-1.73E-07
-1.00E-06
PASS
1.00E-06
PASS
7.80E-08
2.54E-07
6.02E-07
-4.46E-07
-1.50E-06
PASS
1.50E-06
PASS
An ISO 9001:2008 and DSCC Certified Company
182
RLAT Report
10-326 100808 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
Positive Input Bias Current @5V #1 (A)
2.00E-05
1.50E-05
1.00E-05
5.00E-06
0.00E+00
-5.00E-06
-1.00E-05
-1.50E-05
-2.00E-05
0
50
100
150
Total Dose (krad(Si))
Figure 5.89. Plot of Positive Input Bias Current @5V #1 (A) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias and the black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
183
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.89. Raw data for Positive Input Bias Current @5V #1 (A) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Input Bias Current @5V #1 (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
5.30E-07
5.50E-07
4.70E-07
5.00E-07
4.60E-07
5.50E-07
5.80E-07
5.60E-07
5.60E-07
5.50E-07
4.90E-07
5.40E-07
10
5.00E-07
5.20E-07
4.40E-07
4.60E-07
4.30E-07
5.20E-07
5.50E-07
5.10E-07
5.30E-07
5.10E-07
4.90E-07
5.30E-07
20
4.70E-07
5.00E-07
4.20E-07
4.40E-07
4.10E-07
4.90E-07
5.20E-07
4.80E-07
5.10E-07
4.80E-07
4.90E-07
5.30E-07
30
4.50E-07
4.80E-07
4.00E-07
4.20E-07
4.00E-07
4.70E-07
5.00E-07
4.60E-07
5.00E-07
4.60E-07
4.90E-07
5.30E-07
40
4.20E-07
4.70E-07
3.90E-07
4.10E-07
3.90E-07
4.50E-07
4.90E-07
4.40E-07
4.90E-07
4.50E-07
4.90E-07
5.40E-07
50
4.00E-07
4.60E-07
3.80E-07
4.00E-07
3.90E-07
4.40E-07
4.80E-07
4.30E-07
4.80E-07
4.40E-07
4.90E-07
5.40E-07
60
3.90E-07
4.60E-07
3.70E-07
3.90E-07
3.90E-07
4.40E-07
4.70E-07
4.20E-07
4.80E-07
4.40E-07
4.90E-07
5.40E-07
70
3.70E-07
4.60E-07
3.70E-07
3.90E-07
3.90E-07
4.30E-07
4.70E-07
4.10E-07
4.90E-07
4.50E-07
4.90E-07
5.30E-07
75
3.70E-07
4.70E-07
3.80E-07
4.00E-07
4.00E-07
4.40E-07
4.70E-07
4.20E-07
4.90E-07
4.60E-07
4.90E-07
5.40E-07
100
3.50E-07
4.60E-07
3.70E-07
3.90E-07
4.00E-07
4.20E-07
4.60E-07
4.10E-07
4.90E-07
4.50E-07
4.90E-07
5.30E-07
200
6.00E-08
2.40E-07
1.40E-07
1.80E-07
2.40E-07
1.90E-07
2.40E-07
1.30E-07
3.40E-07
2.20E-07
4.90E-07
5.40E-07
5.31E-07
4.07E-08
6.15E-07
4.47E-07
-4.00E-06
PASS
4.00E-06
PASS
4.97E-07
4.00E-08
5.80E-07
4.14E-07
-5.00E-06
PASS
5.00E-06
PASS
4.72E-07
3.74E-08
5.49E-07
3.95E-07
-5.00E-06
PASS
5.00E-06
PASS
4.54E-07
3.69E-08
5.30E-07
3.78E-07
-5.00E-06
PASS
5.00E-06
PASS
4.40E-07
3.71E-08
5.17E-07
3.63E-07
-5.00E-06
PASS
5.00E-06
PASS
4.30E-07
3.65E-08
5.05E-07
3.55E-07
-7.50E-06
PASS
7.50E-06
PASS
4.25E-07
3.87E-08
5.05E-07
3.45E-07
-7.50E-06
PASS
7.50E-06
PASS
4.23E-07
4.32E-08
5.12E-07
3.34E-07
-7.50E-06
PASS
7.50E-06
PASS
4.30E-07
4.19E-08
5.17E-07
3.43E-07
-7.50E-06
PASS
7.50E-06
PASS
4.20E-07
4.45E-08
5.12E-07
3.28E-07
-1.00E-05
PASS
1.00E-05
PASS
1.98E-07
7.70E-08
3.57E-07
3.90E-08
-1.50E-05
PASS
1.50E-05
PASS
An ISO 9001:2008 and DSCC Certified Company
184
RLAT Report
10-326 100808 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
Positive Input Bias Current @5V #2 (A)
2.00E-05
1.50E-05
1.00E-05
5.00E-06
0.00E+00
-5.00E-06
-1.00E-05
-1.50E-05
-2.00E-05
0
50
100
150
Total Dose (krad(Si))
Figure 5.90. Plot of Positive Input Bias Current @5V #2 (A) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias and the black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
185
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.90. Raw data for Positive Input Bias Current @5V #2 (A) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Input Bias Current @5V #2 (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
5.40E-07
5.10E-07
5.80E-07
4.20E-07
5.00E-07
5.60E-07
5.10E-07
5.10E-07
4.90E-07
4.70E-07
6.00E-07
5.80E-07
10
5.10E-07
4.80E-07
5.50E-07
3.90E-07
4.60E-07
5.20E-07
4.70E-07
4.70E-07
4.50E-07
4.20E-07
5.90E-07
5.70E-07
20
4.90E-07
4.50E-07
5.50E-07
3.60E-07
4.30E-07
4.80E-07
4.40E-07
4.40E-07
4.30E-07
4.00E-07
5.90E-07
5.70E-07
30
4.80E-07
4.30E-07
5.40E-07
3.40E-07
4.20E-07
4.60E-07
4.20E-07
4.30E-07
4.00E-07
3.80E-07
5.90E-07
5.70E-07
40
4.70E-07
4.20E-07
5.40E-07
3.30E-07
4.00E-07
4.30E-07
4.10E-07
4.10E-07
3.90E-07
3.70E-07
5.90E-07
5.80E-07
50
4.60E-07
4.10E-07
5.40E-07
3.20E-07
3.90E-07
4.10E-07
4.00E-07
4.00E-07
3.80E-07
3.50E-07
5.90E-07
5.70E-07
60
4.50E-07
4.00E-07
5.50E-07
3.10E-07
4.00E-07
4.00E-07
3.90E-07
3.90E-07
3.70E-07
3.40E-07
5.90E-07
5.70E-07
70
4.50E-07
4.00E-07
5.50E-07
3.10E-07
3.90E-07
3.90E-07
3.80E-07
3.80E-07
3.70E-07
3.40E-07
5.90E-07
5.70E-07
75
4.60E-07
4.00E-07
5.60E-07
3.20E-07
4.00E-07
3.90E-07
3.90E-07
3.80E-07
3.70E-07
3.40E-07
5.90E-07
5.80E-07
100
4.40E-07
3.90E-07
5.70E-07
3.10E-07
4.00E-07
3.60E-07
3.80E-07
3.70E-07
3.60E-07
3.30E-07
5.90E-07
5.80E-07
200
2.50E-07
1.50E-07
5.30E-07
9.00E-08
1.80E-07
3.00E-08
1.20E-07
1.00E-07
1.10E-07
8.00E-08
5.90E-07
5.70E-07
5.09E-07
4.53E-08
6.03E-07
4.15E-07
-4.00E-06
PASS
4.00E-06
PASS
4.72E-07
4.71E-08
5.69E-07
3.75E-07
-5.00E-06
PASS
5.00E-06
PASS
4.47E-07
5.17E-08
5.54E-07
3.40E-07
-5.00E-06
PASS
5.00E-06
PASS
4.30E-07
5.50E-08
5.44E-07
3.16E-07
-5.00E-06
PASS
5.00E-06
PASS
4.17E-07
5.68E-08
5.34E-07
3.00E-07
-5.00E-06
PASS
5.00E-06
PASS
4.06E-07
6.00E-08
5.30E-07
2.82E-07
-7.50E-06
PASS
7.50E-06
PASS
4.00E-07
6.48E-08
5.34E-07
2.66E-07
-7.50E-06
PASS
7.50E-06
PASS
3.96E-07
6.54E-08
5.31E-07
2.61E-07
-7.50E-06
PASS
7.50E-06
PASS
4.01E-07
6.72E-08
5.40E-07
2.62E-07
-7.50E-06
PASS
7.50E-06
PASS
3.91E-07
7.25E-08
5.41E-07
2.41E-07
-1.00E-05
PASS
1.00E-05
PASS
1.64E-07
1.42E-07
4.57E-07
-1.29E-07
-1.50E-05
PASS
1.50E-05
PASS
An ISO 9001:2008 and DSCC Certified Company
186
RLAT Report
10-326 100808 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
Positive Input Bias Current @5V #3 (A)
2.00E-05
1.50E-05
1.00E-05
5.00E-06
0.00E+00
-5.00E-06
-1.00E-05
-1.50E-05
-2.00E-05
0
50
100
150
Total Dose (krad(Si))
Figure 5.91. Plot of Positive Input Bias Current @5V #3 (A) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias and the black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
187
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.91. Raw data for Positive Input Bias Current @5V #3 (A) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Input Bias Current @5V #3 (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
5.50E-07
4.80E-07
5.80E-07
4.20E-07
5.10E-07
5.50E-07
5.20E-07
5.30E-07
5.00E-07
4.30E-07
5.50E-07
5.60E-07
10
5.10E-07
4.50E-07
5.50E-07
3.90E-07
4.70E-07
5.10E-07
4.80E-07
5.00E-07
4.60E-07
4.00E-07
5.50E-07
5.50E-07
20
4.90E-07
4.20E-07
5.30E-07
3.70E-07
4.50E-07
4.80E-07
4.50E-07
4.70E-07
4.40E-07
3.70E-07
5.50E-07
5.50E-07
30
4.70E-07
4.00E-07
5.10E-07
3.60E-07
4.30E-07
4.60E-07
4.30E-07
4.60E-07
4.20E-07
3.50E-07
5.50E-07
5.50E-07
40
4.60E-07
3.90E-07
4.90E-07
3.50E-07
4.20E-07
4.40E-07
4.20E-07
4.50E-07
4.10E-07
3.40E-07
5.50E-07
5.50E-07
50
4.50E-07
3.80E-07
4.80E-07
3.40E-07
4.10E-07
4.20E-07
4.10E-07
4.50E-07
4.00E-07
3.30E-07
5.50E-07
5.50E-07
60
4.40E-07
3.80E-07
4.80E-07
3.40E-07
4.10E-07
4.10E-07
4.00E-07
4.40E-07
4.00E-07
3.20E-07
5.50E-07
5.50E-07
70
4.40E-07
3.80E-07
4.70E-07
3.40E-07
4.10E-07
4.00E-07
4.00E-07
4.40E-07
4.00E-07
3.20E-07
5.50E-07
5.50E-07
75
4.40E-07
3.80E-07
4.80E-07
3.50E-07
4.20E-07
4.00E-07
4.10E-07
4.40E-07
4.00E-07
3.20E-07
5.50E-07
5.50E-07
100
4.30E-07
3.80E-07
4.80E-07
3.50E-07
4.20E-07
3.80E-07
3.90E-07
4.40E-07
3.90E-07
3.10E-07
5.50E-07
5.50E-07
200
2.20E-07
1.50E-07
2.50E-07
2.00E-07
2.00E-07
9.00E-08
1.50E-07
2.50E-07
1.70E-07
8.00E-08
5.50E-07
5.50E-07
5.07E-07
5.17E-08
6.14E-07
4.00E-07
-4.00E-06
PASS
4.00E-06
PASS
4.72E-07
4.98E-08
5.75E-07
3.69E-07
-5.00E-06
PASS
5.00E-06
PASS
4.47E-07
5.06E-08
5.51E-07
3.43E-07
-5.00E-06
PASS
5.00E-06
PASS
4.29E-07
4.95E-08
5.31E-07
3.27E-07
-5.00E-06
PASS
5.00E-06
PASS
4.17E-07
4.72E-08
5.14E-07
3.20E-07
-5.00E-06
PASS
5.00E-06
PASS
4.07E-07
4.76E-08
5.05E-07
3.09E-07
-7.50E-06
PASS
7.50E-06
PASS
4.02E-07
4.73E-08
5.00E-07
3.04E-07
-7.50E-06
PASS
7.50E-06
PASS
4.00E-07
4.55E-08
4.94E-07
3.06E-07
-7.50E-06
PASS
7.50E-06
PASS
4.04E-07
4.62E-08
4.99E-07
3.09E-07
-7.50E-06
PASS
7.50E-06
PASS
3.97E-07
4.81E-08
4.96E-07
2.98E-07
-1.00E-05
PASS
1.00E-05
PASS
1.76E-07
5.97E-08
2.99E-07
5.28E-08
-1.50E-05
PASS
1.50E-05
PASS
An ISO 9001:2008 and DSCC Certified Company
188
RLAT Report
10-326 100808 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
Positive Input Bias Current @5V #4 (A)
2.00E-05
1.50E-05
1.00E-05
5.00E-06
0.00E+00
-5.00E-06
-1.00E-05
-1.50E-05
-2.00E-05
0
50
100
150
Total Dose (krad(Si))
Figure 5.92. Plot of Positive Input Bias Current @5V #4 (A) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias and the black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
189
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.92. Raw data for Positive Input Bias Current @5V #4 (A) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Input Bias Current @5V #4 (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
5.30E-07
5.60E-07
4.70E-07
5.40E-07
4.90E-07
5.40E-07
5.90E-07
5.70E-07
5.50E-07
5.20E-07
5.40E-07
5.40E-07
10
4.90E-07
5.30E-07
4.40E-07
5.00E-07
4.60E-07
5.00E-07
5.50E-07
5.50E-07
5.00E-07
4.70E-07
5.30E-07
5.30E-07
20
4.60E-07
5.00E-07
4.10E-07
4.70E-07
4.30E-07
4.60E-07
5.20E-07
5.40E-07
4.70E-07
4.40E-07
5.30E-07
5.30E-07
30
4.30E-07
4.80E-07
4.00E-07
4.50E-07
4.20E-07
4.40E-07
5.10E-07
5.30E-07
4.40E-07
4.10E-07
5.30E-07
5.30E-07
40
4.10E-07
4.60E-07
3.80E-07
4.30E-07
4.10E-07
4.20E-07
5.00E-07
5.30E-07
4.20E-07
4.00E-07
5.30E-07
5.30E-07
50
4.00E-07
4.50E-07
3.70E-07
4.20E-07
4.00E-07
4.10E-07
4.90E-07
5.40E-07
4.10E-07
3.80E-07
5.30E-07
5.30E-07
60
3.80E-07
4.40E-07
3.60E-07
4.10E-07
4.00E-07
4.00E-07
4.80E-07
5.40E-07
4.00E-07
3.80E-07
5.30E-07
5.30E-07
70
3.70E-07
4.40E-07
3.50E-07
4.00E-07
3.90E-07
3.90E-07
4.80E-07
5.50E-07
3.90E-07
3.70E-07
5.30E-07
5.40E-07
75
3.80E-07
4.40E-07
3.60E-07
4.10E-07
4.00E-07
4.00E-07
4.80E-07
5.60E-07
4.00E-07
3.80E-07
5.40E-07
5.40E-07
100
3.50E-07
4.30E-07
3.40E-07
4.00E-07
4.00E-07
3.80E-07
4.70E-07
5.80E-07
3.80E-07
3.70E-07
5.30E-07
5.30E-07
200
5.00E-08
2.00E-07
1.00E-07
1.40E-07
2.10E-07
9.00E-08
2.40E-07
5.30E-07
1.00E-07
7.00E-08
5.30E-07
5.30E-07
5.36E-07
3.60E-08
6.10E-07
4.62E-07
-4.00E-06
PASS
4.00E-06
PASS
4.99E-07
3.67E-08
5.75E-07
4.23E-07
-5.00E-06
PASS
5.00E-06
PASS
4.70E-07
4.03E-08
5.53E-07
3.87E-07
-5.00E-06
PASS
5.00E-06
PASS
4.51E-07
4.28E-08
5.39E-07
3.63E-07
-5.00E-06
PASS
5.00E-06
PASS
4.36E-07
4.70E-08
5.33E-07
3.39E-07
-5.00E-06
PASS
5.00E-06
PASS
4.27E-07
5.25E-08
5.35E-07
3.19E-07
-7.50E-06
PASS
7.50E-06
PASS
4.19E-07
5.43E-08
5.31E-07
3.07E-07
-7.50E-06
PASS
7.50E-06
PASS
4.13E-07
6.09E-08
5.39E-07
2.87E-07
-7.50E-06
PASS
7.50E-06
PASS
4.21E-07
5.93E-08
5.44E-07
2.98E-07
-7.50E-06
PASS
7.50E-06
PASS
4.10E-07
7.07E-08
5.56E-07
2.64E-07
-1.00E-05
PASS
1.00E-05
PASS
1.73E-07
1.41E-07
4.64E-07
-1.18E-07
-1.50E-05
PASS
1.50E-05
PASS
An ISO 9001:2008 and DSCC Certified Company
190
RLAT Report
10-326 100808 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
Negative Input Bias Current @5V #1 (A)
2.00E-05
1.50E-05
1.00E-05
5.00E-06
0.00E+00
-5.00E-06
-1.00E-05
-1.50E-05
-2.00E-05
0
50
100
150
Total Dose (krad(Si))
Figure 5.93. Plot of Negative Input Bias Current @5V #1 (A) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias and the black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
191
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.93. Raw data for Negative Input Bias Current @5V #1 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Input Bias Current @5V #1 (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
5.60E-07
5.30E-07
4.50E-07
4.80E-07
4.80E-07
5.60E-07
5.80E-07
5.60E-07
5.40E-07
5.30E-07
4.90E-07
5.30E-07
10
5.30E-07
4.80E-07
4.00E-07
4.50E-07
4.40E-07
5.20E-07
5.40E-07
5.10E-07
4.80E-07
4.70E-07
4.90E-07
5.30E-07
20
5.10E-07
4.30E-07
3.50E-07
4.30E-07
4.20E-07
5.00E-07
5.20E-07
4.70E-07
4.40E-07
4.30E-07
4.90E-07
5.30E-07
30
4.90E-07
4.00E-07
3.20E-07
4.00E-07
4.00E-07
4.80E-07
5.10E-07
4.50E-07
4.00E-07
3.90E-07
4.90E-07
5.30E-07
40
4.80E-07
3.70E-07
2.90E-07
3.80E-07
4.00E-07
4.70E-07
5.00E-07
4.30E-07
3.70E-07
3.60E-07
4.90E-07
5.30E-07
50
4.70E-07
3.50E-07
2.60E-07
3.70E-07
4.00E-07
4.60E-07
4.90E-07
4.30E-07
3.50E-07
3.30E-07
4.90E-07
5.30E-07
60
4.60E-07
3.30E-07
2.40E-07
3.50E-07
4.00E-07
4.60E-07
4.90E-07
4.10E-07
3.30E-07
3.10E-07
4.90E-07
5.30E-07
70
4.60E-07
3.20E-07
2.20E-07
3.40E-07
4.00E-07
4.60E-07
4.90E-07
4.00E-07
3.10E-07
2.90E-07
4.90E-07
5.30E-07
75
4.70E-07
3.10E-07
2.10E-07
3.40E-07
4.00E-07
4.70E-07
4.90E-07
4.00E-07
3.10E-07
2.90E-07
4.90E-07
5.30E-07
100
4.50E-07
2.80E-07
1.70E-07
2.90E-07
4.00E-07
4.50E-07
4.80E-07
3.80E-07
2.60E-07
2.50E-07
4.90E-07
5.30E-07
200
3.00E-07
-3.00E-08
-1.80E-07
1.10E-07
3.10E-07
3.10E-07
3.50E-07
1.10E-07
-8.00E-08
-1.00E-07
4.90E-07
5.30E-07
5.27E-07
4.30E-08
6.16E-07
4.38E-07
-4.00E-06
PASS
4.00E-06
PASS
4.82E-07
4.42E-08
5.73E-07
3.91E-07
-5.00E-06
PASS
5.00E-06
PASS
4.50E-07
5.12E-08
5.56E-07
3.44E-07
-5.00E-06
PASS
5.00E-06
PASS
4.24E-07
5.76E-08
5.43E-07
3.05E-07
-5.00E-06
PASS
5.00E-06
PASS
4.05E-07
6.49E-08
5.39E-07
2.71E-07
-5.00E-06
PASS
5.00E-06
PASS
3.91E-07
7.23E-08
5.40E-07
2.42E-07
-7.50E-06
PASS
7.50E-06
PASS
3.78E-07
7.93E-08
5.42E-07
2.14E-07
-7.50E-06
PASS
7.50E-06
PASS
3.69E-07
8.71E-08
5.49E-07
1.89E-07
-7.50E-06
PASS
7.50E-06
PASS
3.69E-07
9.21E-08
5.59E-07
1.79E-07
-7.50E-06
PASS
7.50E-06
PASS
3.41E-07
1.05E-07
5.57E-07
1.25E-07
-1.00E-05
PASS
1.00E-05
PASS
1.10E-07
1.99E-07
5.22E-07
-3.02E-07
-1.50E-05
PASS
1.50E-05
PASS
An ISO 9001:2008 and DSCC Certified Company
192
RLAT Report
10-326 100808 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
Negative Input Bias Current @5V #2 (A)
2.00E-05
1.50E-05
1.00E-05
5.00E-06
0.00E+00
-5.00E-06
-1.00E-05
-1.50E-05
-2.00E-05
0
50
100
150
Total Dose (krad(Si))
Figure 5.94. Plot of Negative Input Bias Current @5V #2 (A) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias and the black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
193
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.94. Raw data for Negative Input Bias Current @5V #2 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Input Bias Current @5V #2 (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
5.30E-07
5.40E-07
5.60E-07
4.30E-07
5.10E-07
5.40E-07
5.00E-07
5.40E-07
5.00E-07
4.50E-07
5.60E-07
5.60E-07
10
5.00E-07
4.90E-07
5.20E-07
3.90E-07
4.60E-07
4.80E-07
4.50E-07
4.80E-07
4.40E-07
4.20E-07
5.60E-07
5.50E-07
20
4.90E-07
4.40E-07
5.00E-07
3.40E-07
4.20E-07
4.30E-07
4.00E-07
4.40E-07
3.90E-07
4.00E-07
5.60E-07
5.50E-07
30
4.80E-07
4.00E-07
4.80E-07
2.90E-07
3.80E-07
3.80E-07
3.70E-07
4.00E-07
3.60E-07
3.90E-07
5.60E-07
5.50E-07
40
4.70E-07
3.70E-07
4.70E-07
2.60E-07
3.50E-07
3.40E-07
3.40E-07
3.60E-07
3.20E-07
3.80E-07
5.60E-07
5.50E-07
50
4.70E-07
3.40E-07
4.70E-07
2.20E-07
3.20E-07
3.10E-07
3.20E-07
3.40E-07
2.90E-07
3.80E-07
5.60E-07
5.50E-07
60
4.60E-07
3.20E-07
4.70E-07
1.80E-07
3.00E-07
2.80E-07
2.90E-07
3.00E-07
2.70E-07
3.80E-07
5.60E-07
5.50E-07
70
4.70E-07
3.00E-07
4.70E-07
1.50E-07
2.80E-07
2.40E-07
2.70E-07
2.80E-07
2.50E-07
3.80E-07
5.60E-07
5.50E-07
75
4.70E-07
2.90E-07
4.70E-07
1.30E-07
2.80E-07
2.30E-07
2.70E-07
2.70E-07
2.50E-07
3.90E-07
5.60E-07
5.50E-07
100
4.70E-07
2.50E-07
4.60E-07
5.00E-08
2.40E-07
1.70E-07
2.30E-07
2.20E-07
1.90E-07
3.90E-07
5.60E-07
5.50E-07
200
3.90E-07
-1.10E-07
3.30E-07
-2.70E-07
-9.00E-08
-2.70E-07
-1.30E-07
-1.80E-07
-1.80E-07
2.70E-07
5.60E-07
5.50E-07
5.10E-07
4.19E-08
5.97E-07
4.23E-07
-4.00E-06
PASS
4.00E-06
PASS
4.63E-07
3.92E-08
5.44E-07
3.82E-07
-5.00E-06
PASS
5.00E-06
PASS
4.25E-07
4.72E-08
5.22E-07
3.28E-07
-5.00E-06
PASS
5.00E-06
PASS
3.93E-07
5.56E-08
5.08E-07
2.78E-07
-5.00E-06
PASS
5.00E-06
PASS
3.66E-07
6.40E-08
4.98E-07
2.34E-07
-5.00E-06
PASS
5.00E-06
PASS
3.46E-07
7.72E-08
5.05E-07
1.87E-07
-7.50E-06
PASS
7.50E-06
PASS
3.25E-07
8.87E-08
5.08E-07
1.42E-07
-7.50E-06
PASS
7.50E-06
PASS
3.09E-07
1.02E-07
5.20E-07
9.83E-08
-7.50E-06
PASS
7.50E-06
PASS
3.05E-07
1.08E-07
5.27E-07
8.28E-08
-7.50E-06
PASS
7.50E-06
PASS
2.67E-07
1.34E-07
5.43E-07
-8.86E-09
-1.00E-05
PASS
1.00E-05
PASS
-2.40E-08
2.53E-07
4.98E-07
-5.46E-07
-1.50E-05
PASS
1.50E-05
PASS
An ISO 9001:2008 and DSCC Certified Company
194
RLAT Report
10-326 100808 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
Negative Input Bias Current @5V #3 (A)
2.00E-05
1.50E-05
1.00E-05
5.00E-06
0.00E+00
-5.00E-06
-1.00E-05
-1.50E-05
-2.00E-05
0
50
100
150
Total Dose (krad(Si))
Figure 5.95. Plot of Negative Input Bias Current @5V #3 (A) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias and the black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
195
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.95. Raw data for Negative Input Bias Current @5V #3 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Input Bias Current @5V #3 (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
5.70E-07
5.10E-07
5.60E-07
4.10E-07
5.10E-07
5.60E-07
5.10E-07
5.40E-07
5.00E-07
4.40E-07
5.40E-07
5.50E-07
10
5.40E-07
4.60E-07
5.10E-07
3.80E-07
4.60E-07
5.30E-07
4.60E-07
5.10E-07
4.70E-07
4.10E-07
5.30E-07
5.50E-07
20
5.10E-07
4.20E-07
4.60E-07
3.40E-07
4.10E-07
5.10E-07
4.10E-07
4.90E-07
4.60E-07
3.90E-07
5.40E-07
5.50E-07
30
4.90E-07
3.80E-07
4.30E-07
3.00E-07
3.80E-07
4.90E-07
3.80E-07
4.90E-07
4.40E-07
3.70E-07
5.30E-07
5.50E-07
40
4.90E-07
3.50E-07
3.90E-07
2.60E-07
3.50E-07
4.80E-07
3.50E-07
4.80E-07
4.40E-07
3.70E-07
5.30E-07
5.50E-07
50
4.80E-07
3.30E-07
3.70E-07
2.30E-07
3.30E-07
4.70E-07
3.20E-07
4.80E-07
4.40E-07
3.60E-07
5.40E-07
5.50E-07
60
4.80E-07
3.10E-07
3.50E-07
1.90E-07
3.10E-07
4.70E-07
2.90E-07
4.70E-07
4.40E-07
3.60E-07
5.40E-07
5.50E-07
70
4.80E-07
2.90E-07
3.30E-07
1.70E-07
2.90E-07
4.70E-07
2.70E-07
4.80E-07
4.40E-07
3.60E-07
5.30E-07
5.50E-07
75
4.80E-07
2.80E-07
3.20E-07
1.50E-07
2.90E-07
4.80E-07
2.70E-07
4.90E-07
4.60E-07
3.70E-07
5.40E-07
5.50E-07
100
4.70E-07
2.40E-07
2.80E-07
7.00E-08
2.50E-07
4.60E-07
2.30E-07
4.80E-07
4.50E-07
3.60E-07
5.40E-07
5.50E-07
200
3.30E-07
-9.00E-08
-6.00E-08
-1.80E-07
-7.00E-08
3.10E-07
-1.30E-07
4.00E-07
3.70E-07
2.40E-07
5.40E-07
5.50E-07
5.11E-07
5.22E-08
6.19E-07
4.03E-07
-4.00E-06
PASS
4.00E-06
PASS
4.73E-07
5.12E-08
5.79E-07
3.67E-07
-5.00E-06
PASS
5.00E-06
PASS
4.40E-07
5.56E-08
5.55E-07
3.25E-07
-5.00E-06
PASS
5.00E-06
PASS
4.15E-07
6.38E-08
5.47E-07
2.83E-07
-5.00E-06
PASS
5.00E-06
PASS
3.96E-07
7.49E-08
5.51E-07
2.41E-07
-5.00E-06
PASS
5.00E-06
PASS
3.81E-07
8.39E-08
5.54E-07
2.08E-07
-7.50E-06
PASS
7.50E-06
PASS
3.67E-07
9.63E-08
5.66E-07
1.68E-07
-7.50E-06
PASS
7.50E-06
PASS
3.58E-07
1.07E-07
5.78E-07
1.38E-07
-7.50E-06
PASS
7.50E-06
PASS
3.59E-07
1.16E-07
5.98E-07
1.20E-07
-7.50E-06
PASS
7.50E-06
PASS
3.29E-07
1.37E-07
6.12E-07
4.61E-08
-1.00E-05
PASS
1.00E-05
PASS
1.12E-07
2.36E-07
5.99E-07
-3.75E-07
-1.50E-05
PASS
1.50E-05
PASS
An ISO 9001:2008 and DSCC Certified Company
196
RLAT Report
10-326 100808 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
Negative Input Bias Current @5V #4 (A)
2.00E-05
1.50E-05
1.00E-05
5.00E-06
0.00E+00
-5.00E-06
-1.00E-05
-1.50E-05
-2.00E-05
0
50
100
150
Total Dose (krad(Si))
Figure 5.96. Plot of Negative Input Bias Current @5V #4 (A) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias and the black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
197
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.96. Raw data for Negative Input Bias Current @5V #4 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Input Bias Current @5V #4 (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
5.40E-07
5.50E-07
4.80E-07
5.40E-07
4.80E-07
5.70E-07
5.50E-07
5.40E-07
5.40E-07
5.30E-07
5.30E-07
5.20E-07
10
5.00E-07
5.20E-07
4.50E-07
5.10E-07
4.30E-07
5.20E-07
5.00E-07
4.90E-07
4.80E-07
4.70E-07
5.30E-07
5.20E-07
20
4.70E-07
4.90E-07
4.30E-07
4.90E-07
4.00E-07
4.90E-07
4.70E-07
4.40E-07
4.30E-07
4.20E-07
5.30E-07
5.20E-07
30
4.50E-07
4.80E-07
4.10E-07
4.80E-07
3.80E-07
4.70E-07
4.40E-07
4.10E-07
3.90E-07
3.80E-07
5.30E-07
5.20E-07
40
4.30E-07
4.70E-07
4.00E-07
4.70E-07
3.60E-07
4.60E-07
4.20E-07
3.80E-07
3.50E-07
3.40E-07
5.30E-07
5.20E-07
50
4.20E-07
4.60E-07
3.90E-07
4.60E-07
3.50E-07
4.50E-07
4.10E-07
3.60E-07
3.20E-07
3.10E-07
5.30E-07
5.20E-07
60
4.20E-07
4.60E-07
3.90E-07
4.50E-07
3.40E-07
4.40E-07
3.90E-07
3.40E-07
3.00E-07
2.90E-07
5.30E-07
5.20E-07
70
4.10E-07
4.50E-07
3.90E-07
4.50E-07
3.40E-07
4.40E-07
3.70E-07
3.20E-07
2.70E-07
2.70E-07
5.30E-07
5.20E-07
75
4.10E-07
4.60E-07
3.90E-07
4.60E-07
3.30E-07
4.30E-07
3.70E-07
3.20E-07
2.70E-07
2.60E-07
5.30E-07
5.20E-07
100
3.90E-07
4.40E-07
3.70E-07
4.30E-07
3.10E-07
4.10E-07
3.40E-07
2.70E-07
2.10E-07
2.10E-07
5.30E-07
5.20E-07
200
1.90E-07
3.00E-07
2.10E-07
3.30E-07
1.10E-07
2.00E-07
5.00E-08
-9.00E-08
-1.80E-07
-1.70E-07
5.30E-07
5.20E-07
5.32E-07
2.94E-08
5.93E-07
4.71E-07
-4.00E-06
PASS
4.00E-06
PASS
4.87E-07
2.98E-08
5.49E-07
4.25E-07
-5.00E-06
PASS
5.00E-06
PASS
4.53E-07
3.30E-08
5.21E-07
3.85E-07
-5.00E-06
PASS
5.00E-06
PASS
4.29E-07
4.01E-08
5.12E-07
3.46E-07
-5.00E-06
PASS
5.00E-06
PASS
4.08E-07
4.96E-08
5.10E-07
3.06E-07
-5.00E-06
PASS
5.00E-06
PASS
3.93E-07
5.62E-08
5.09E-07
2.77E-07
-7.50E-06
PASS
7.50E-06
PASS
3.82E-07
6.18E-08
5.10E-07
2.54E-07
-7.50E-06
PASS
7.50E-06
PASS
3.71E-07
6.92E-08
5.14E-07
2.28E-07
-7.50E-06
PASS
7.50E-06
PASS
3.70E-07
7.30E-08
5.21E-07
2.19E-07
-7.50E-06
PASS
7.50E-06
PASS
3.38E-07
8.56E-08
5.15E-07
1.61E-07
-1.00E-05
PASS
1.00E-05
PASS
9.50E-08
1.86E-07
4.80E-07
-2.90E-07
-1.50E-05
PASS
1.50E-05
PASS
An ISO 9001:2008 and DSCC Certified Company
198
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Common Mode Rejection Ratio @5V #1 (dB)
1.00E+02
9.00E+01
8.00E+01
7.00E+01
6.00E+01
5.00E+01
4.00E+01
3.00E+01
2.00E+01
1.00E+01
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.97. Plot of Common Mode Rejection Ratio @5V #1 (dB) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
199
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.97. Raw data for Common Mode Rejection Ratio @5V #1 (dB) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Common Mode Rejection Ratio @5V #1 (dB)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
9.36E+01
9.54E+01
9.29E+01
9.44E+01
9.26E+01
9.42E+01
9.27E+01
9.36E+01
9.33E+01
9.39E+01
9.38E+01
9.23E+01
10
9.12E+01
9.42E+01
9.00E+01
9.40E+01
9.17E+01
9.27E+01
9.07E+01
9.09E+01
9.13E+01
9.30E+01
9.38E+01
9.24E+01
20
9.15E+01
9.39E+01
9.06E+01
9.39E+01
9.16E+01
9.28E+01
9.11E+01
9.16E+01
9.16E+01
9.27E+01
9.38E+01
9.23E+01
30
9.19E+01
9.38E+01
9.12E+01
9.37E+01
9.17E+01
9.30E+01
9.15E+01
9.22E+01
9.21E+01
9.28E+01
9.38E+01
9.24E+01
40
9.24E+01
9.40E+01
9.16E+01
9.37E+01
9.17E+01
9.32E+01
9.17E+01
9.25E+01
9.24E+01
9.29E+01
9.38E+01
9.24E+01
50
9.27E+01
9.41E+01
9.20E+01
9.34E+01
9.17E+01
9.34E+01
9.19E+01
9.27E+01
9.25E+01
9.29E+01
9.37E+01
9.23E+01
60
9.28E+01
9.42E+01
9.18E+01
9.32E+01
9.16E+01
9.34E+01
9.20E+01
9.26E+01
9.26E+01
9.29E+01
9.37E+01
9.22E+01
70
9.28E+01
9.41E+01
9.19E+01
9.32E+01
9.16E+01
9.34E+01
9.20E+01
9.26E+01
9.25E+01
9.28E+01
9.38E+01
9.23E+01
75
9.27E+01
9.40E+01
9.19E+01
9.30E+01
9.17E+01
9.32E+01
9.20E+01
9.25E+01
9.25E+01
9.27E+01
9.38E+01
9.24E+01
100
9.28E+01
9.39E+01
9.19E+01
9.26E+01
9.14E+01
9.32E+01
9.19E+01
9.25E+01
9.24E+01
9.25E+01
9.38E+01
9.23E+01
200
9.14E+01
9.21E+01
9.04E+01
9.15E+01
9.01E+01
9.17E+01
9.08E+01
9.08E+01
9.09E+01
9.08E+01
9.37E+01
9.23E+01
9.37E+01
8.68E-01
9.54E+01
9.19E+01
7.30E+01
PASS
9.20E+01
1.43E+00
9.49E+01
8.90E+01
7.10E+01
PASS
9.21E+01
1.14E+00
9.45E+01
8.98E+01
7.10E+01
PASS
9.24E+01
9.17E-01
9.43E+01
9.05E+01
7.10E+01
PASS
9.26E+01
8.38E-01
9.43E+01
9.09E+01
7.10E+01
PASS
9.27E+01
7.45E-01
9.42E+01
9.12E+01
6.00E+01
PASS
9.27E+01
7.72E-01
9.43E+01
9.11E+01
6.00E+01
PASS
9.27E+01
7.53E-01
9.42E+01
9.11E+01
6.00E+01
PASS
9.26E+01
6.98E-01
9.41E+01
9.12E+01
6.00E+01
PASS
9.25E+01
7.03E-01
9.39E+01
9.10E+01
6.00E+01
PASS
9.10E+01
6.05E-01
9.23E+01
8.98E+01
6.00E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
200
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Common Mode Rejection Ratio @5V #2 (dB)
1.00E+02
9.00E+01
8.00E+01
7.00E+01
6.00E+01
5.00E+01
4.00E+01
3.00E+01
2.00E+01
1.00E+01
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.98. Plot of Common Mode Rejection Ratio @5V #2 (dB) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
201
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.98. Raw data for Common Mode Rejection Ratio @5V #2 (dB) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Common Mode Rejection Ratio @5V #2 (dB)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
9.38E+01
9.20E+01
9.22E+01
9.41E+01
9.46E+01
9.26E+01
9.27E+01
9.36E+01
9.31E+01
9.24E+01
9.38E+01
9.30E+01
10
9.25E+01
9.02E+01
8.87E+01
9.39E+01
9.30E+01
8.99E+01
9.12E+01
9.14E+01
9.13E+01
8.81E+01
9.38E+01
9.30E+01
20
9.23E+01
9.03E+01
8.98E+01
9.38E+01
9.29E+01
9.06E+01
9.11E+01
9.16E+01
9.14E+01
9.02E+01
9.38E+01
9.30E+01
30
9.23E+01
9.06E+01
9.07E+01
9.35E+01
9.32E+01
9.12E+01
9.15E+01
9.20E+01
9.18E+01
9.17E+01
9.37E+01
9.30E+01
40
9.25E+01
9.10E+01
9.14E+01
9.35E+01
9.34E+01
9.16E+01
9.17E+01
9.23E+01
9.21E+01
9.24E+01
9.37E+01
9.31E+01
50
9.27E+01
9.11E+01
9.18E+01
9.33E+01
9.34E+01
9.18E+01
9.19E+01
9.25E+01
9.22E+01
9.26E+01
9.38E+01
9.30E+01
60
9.29E+01
9.12E+01
9.19E+01
9.30E+01
9.35E+01
9.18E+01
9.19E+01
9.26E+01
9.23E+01
9.27E+01
9.38E+01
9.30E+01
70
9.28E+01
9.12E+01
9.19E+01
9.30E+01
9.35E+01
9.19E+01
9.18E+01
9.26E+01
9.22E+01
9.27E+01
9.37E+01
9.30E+01
75
9.27E+01
9.12E+01
9.18E+01
9.29E+01
9.35E+01
9.17E+01
9.18E+01
9.25E+01
9.22E+01
9.27E+01
9.38E+01
9.31E+01
100
9.29E+01
9.11E+01
9.19E+01
9.26E+01
9.34E+01
9.17E+01
9.17E+01
9.24E+01
9.21E+01
9.26E+01
9.37E+01
9.31E+01
200
9.14E+01
8.98E+01
9.08E+01
9.12E+01
9.16E+01
9.04E+01
9.04E+01
9.09E+01
9.07E+01
9.14E+01
9.38E+01
9.31E+01
9.31E+01
8.76E-01
9.49E+01
9.13E+01
7.30E+01
PASS
9.10E+01
1.82E+00
9.48E+01
8.72E+01
7.10E+01
PASS
9.14E+01
1.27E+00
9.40E+01
8.88E+01
7.10E+01
PASS
9.18E+01
9.71E-01
9.39E+01
8.98E+01
7.10E+01
PASS
9.22E+01
8.16E-01
9.39E+01
9.05E+01
7.10E+01
PASS
9.23E+01
7.28E-01
9.38E+01
9.08E+01
6.00E+01
PASS
9.24E+01
6.94E-01
9.38E+01
9.09E+01
6.00E+01
PASS
9.24E+01
6.82E-01
9.38E+01
9.10E+01
6.00E+01
PASS
9.23E+01
6.85E-01
9.37E+01
9.09E+01
6.00E+01
PASS
9.22E+01
6.58E-01
9.36E+01
9.09E+01
6.00E+01
PASS
9.09E+01
5.61E-01
9.20E+01
8.97E+01
6.00E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
202
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Common Mode Rejection Ratio @5V #3 (dB)
1.00E+02
9.00E+01
8.00E+01
7.00E+01
6.00E+01
5.00E+01
4.00E+01
3.00E+01
2.00E+01
1.00E+01
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.99. Plot of Common Mode Rejection Ratio @5V #3 (dB) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
203
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.99. Raw data for Common Mode Rejection Ratio @5V #3 (dB) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Common Mode Rejection Ratio @5V #3 (dB)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
9.40E+01
9.31E+01
9.33E+01
9.34E+01
9.36E+01
9.22E+01
9.42E+01
9.23E+01
9.32E+01
9.30E+01
9.34E+01
9.48E+01
10
9.23E+01
9.11E+01
9.16E+01
9.32E+01
9.25E+01
8.86E+01
9.19E+01
8.86E+01
8.97E+01
8.99E+01
9.33E+01
9.48E+01
20
9.24E+01
9.14E+01
9.18E+01
9.31E+01
9.24E+01
9.04E+01
9.21E+01
8.98E+01
9.08E+01
9.10E+01
9.34E+01
9.48E+01
30
9.26E+01
9.17E+01
9.21E+01
9.31E+01
9.25E+01
9.18E+01
9.26E+01
9.10E+01
9.18E+01
9.18E+01
9.34E+01
9.48E+01
40
9.30E+01
9.20E+01
9.23E+01
9.28E+01
9.26E+01
9.25E+01
9.29E+01
9.17E+01
9.24E+01
9.21E+01
9.34E+01
9.47E+01
50
9.31E+01
9.22E+01
9.25E+01
9.28E+01
9.26E+01
9.29E+01
9.31E+01
9.19E+01
9.26E+01
9.22E+01
9.35E+01
9.48E+01
60
9.32E+01
9.22E+01
9.25E+01
9.27E+01
9.26E+01
9.30E+01
9.33E+01
9.22E+01
9.27E+01
9.24E+01
9.33E+01
9.48E+01
70
9.32E+01
9.22E+01
9.23E+01
9.24E+01
9.25E+01
9.30E+01
9.31E+01
9.22E+01
9.28E+01
9.22E+01
9.34E+01
9.48E+01
75
9.31E+01
9.21E+01
9.23E+01
9.24E+01
9.24E+01
9.30E+01
9.31E+01
9.22E+01
9.28E+01
9.22E+01
9.34E+01
9.47E+01
100
9.31E+01
9.20E+01
9.21E+01
9.21E+01
9.23E+01
9.30E+01
9.30E+01
9.22E+01
9.28E+01
9.23E+01
9.35E+01
9.48E+01
200
9.14E+01
9.06E+01
9.06E+01
9.09E+01
9.10E+01
9.13E+01
9.15E+01
9.08E+01
9.14E+01
9.09E+01
9.33E+01
9.48E+01
9.32E+01
6.38E-01
9.45E+01
9.19E+01
7.30E+01
PASS
9.09E+01
1.64E+00
9.43E+01
8.76E+01
7.10E+01
PASS
9.15E+01
1.03E+00
9.36E+01
8.94E+01
7.10E+01
PASS
9.21E+01
6.05E-01
9.33E+01
9.08E+01
7.10E+01
PASS
9.24E+01
4.37E-01
9.33E+01
9.15E+01
7.10E+01
PASS
9.26E+01
3.96E-01
9.34E+01
9.18E+01
6.00E+01
PASS
9.27E+01
3.87E-01
9.35E+01
9.19E+01
6.00E+01
PASS
9.26E+01
4.08E-01
9.34E+01
9.18E+01
6.00E+01
PASS
9.26E+01
4.01E-01
9.34E+01
9.17E+01
6.00E+01
PASS
9.25E+01
4.42E-01
9.34E+01
9.16E+01
6.00E+01
PASS
9.10E+01
3.58E-01
9.18E+01
9.03E+01
6.00E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
204
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Common Mode Rejection Ratio @5V #4 (dB)
1.00E+02
9.00E+01
8.00E+01
7.00E+01
6.00E+01
5.00E+01
4.00E+01
3.00E+01
2.00E+01
1.00E+01
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.100. Plot of Common Mode Rejection Ratio @5V #4 (dB) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
205
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.100. Raw data for Common Mode Rejection Ratio @5V #4 (dB) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Common Mode Rejection Ratio @5V #4 (dB)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
9.28E+01
9.36E+01
9.38E+01
9.45E+01
9.32E+01
9.30E+01
9.38E+01
9.35E+01
9.40E+01
9.32E+01
9.45E+01
9.38E+01
10
9.01E+01
9.16E+01
8.96E+01
9.44E+01
9.18E+01
9.13E+01
9.28E+01
9.14E+01
9.15E+01
9.20E+01
9.45E+01
9.39E+01
20
9.07E+01
9.17E+01
9.08E+01
9.42E+01
9.20E+01
9.15E+01
9.26E+01
9.17E+01
9.20E+01
9.20E+01
9.45E+01
9.39E+01
30
9.13E+01
9.20E+01
9.17E+01
9.41E+01
9.23E+01
9.19E+01
9.27E+01
9.22E+01
9.27E+01
9.21E+01
9.44E+01
9.39E+01
40
9.19E+01
9.25E+01
9.25E+01
9.40E+01
9.24E+01
9.19E+01
9.29E+01
9.25E+01
9.29E+01
9.23E+01
9.45E+01
9.39E+01
50
9.22E+01
9.27E+01
9.31E+01
9.39E+01
9.24E+01
9.21E+01
9.29E+01
9.26E+01
9.30E+01
9.23E+01
9.45E+01
9.38E+01
60
9.23E+01
9.28E+01
9.31E+01
9.37E+01
9.24E+01
9.21E+01
9.30E+01
9.27E+01
9.31E+01
9.23E+01
9.45E+01
9.38E+01
70
9.22E+01
9.28E+01
9.31E+01
9.34E+01
9.23E+01
9.21E+01
9.30E+01
9.27E+01
9.32E+01
9.23E+01
9.46E+01
9.39E+01
75
9.22E+01
9.27E+01
9.31E+01
9.33E+01
9.23E+01
9.21E+01
9.31E+01
9.26E+01
9.29E+01
9.21E+01
9.45E+01
9.39E+01
100
9.23E+01
9.27E+01
9.32E+01
9.32E+01
9.23E+01
9.19E+01
9.30E+01
9.26E+01
9.28E+01
9.19E+01
9.45E+01
9.39E+01
200
9.10E+01
9.13E+01
9.16E+01
9.19E+01
9.09E+01
9.04E+01
9.14E+01
9.11E+01
9.13E+01
9.05E+01
9.44E+01
9.39E+01
9.35E+01
5.27E-01
9.46E+01
9.25E+01
7.30E+01
PASS
9.16E+01
1.33E+00
9.44E+01
8.89E+01
7.10E+01
PASS
9.19E+01
9.91E-01
9.40E+01
8.99E+01
7.10E+01
PASS
9.23E+01
7.54E-01
9.38E+01
9.07E+01
7.10E+01
PASS
9.26E+01
5.99E-01
9.38E+01
9.13E+01
7.10E+01
PASS
9.27E+01
5.44E-01
9.38E+01
9.16E+01
6.00E+01
PASS
9.28E+01
4.95E-01
9.38E+01
9.17E+01
6.00E+01
PASS
9.27E+01
4.73E-01
9.37E+01
9.17E+01
6.00E+01
PASS
9.26E+01
4.55E-01
9.36E+01
9.17E+01
6.00E+01
PASS
9.26E+01
4.71E-01
9.36E+01
9.16E+01
6.00E+01
PASS
9.12E+01
4.60E-01
9.21E+01
9.02E+01
6.00E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
206
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Large Signal Voltage Gain @5V RL=500 #1 (V/mV)
2.50E+00
2.00E+00
1.50E+00
1.00E+00
5.00E-01
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.101. Plot of Large Signal Voltage Gain @5V RL=500 #1 (V/mV) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias and the
black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
207
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.101. Raw data for Large Signal Voltage Gain @5V RL=500 #1 (V/mV) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Large Signal Voltage Gain @5V RL=500 #1 (V/mV)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
2.10E+00
2.10E+00
2.00E+00
2.10E+00
2.10E+00
2.10E+00
2.10E+00
2.10E+00
2.10E+00
2.20E+00
2.20E+00
2.00E+00
10
2.10E+00
2.00E+00
2.00E+00
2.10E+00
2.10E+00
2.10E+00
2.10E+00
2.10E+00
2.10E+00
2.10E+00
2.20E+00
2.00E+00
20
2.10E+00
2.00E+00
2.00E+00
2.10E+00
2.10E+00
2.00E+00
2.10E+00
2.00E+00
2.00E+00
2.10E+00
2.20E+00
2.00E+00
30
2.10E+00
2.00E+00
1.90E+00
2.10E+00
2.10E+00
2.00E+00
2.10E+00
2.00E+00
2.00E+00
2.10E+00
2.20E+00
2.00E+00
40
2.00E+00
2.00E+00
1.90E+00
2.00E+00
2.00E+00
2.00E+00
2.00E+00
2.00E+00
2.00E+00
2.00E+00
2.20E+00
2.00E+00
50
2.00E+00
1.90E+00
1.90E+00
2.00E+00
2.00E+00
2.00E+00
2.00E+00
2.00E+00
2.00E+00
2.00E+00
2.20E+00
2.00E+00
60
2.00E+00
1.90E+00
1.90E+00
2.00E+00
2.00E+00
2.00E+00
2.00E+00
1.90E+00
1.90E+00
2.00E+00
2.20E+00
2.00E+00
70
2.00E+00
1.90E+00
1.90E+00
1.90E+00
2.00E+00
1.90E+00
2.00E+00
1.90E+00
1.90E+00
1.90E+00
2.20E+00
2.00E+00
75
2.00E+00
1.90E+00
1.90E+00
1.90E+00
2.00E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
2.20E+00
2.00E+00
100
1.90E+00
1.80E+00
1.80E+00
1.90E+00
1.90E+00
1.80E+00
1.90E+00
1.80E+00
1.80E+00
1.90E+00
2.20E+00
2.00E+00
200
1.70E+00
1.60E+00
1.60E+00
1.70E+00
1.70E+00
1.70E+00
1.70E+00
1.60E+00
1.60E+00
1.70E+00
2.20E+00
2.00E+00
2.10E+00
4.71E-02
2.20E+00
2.00E+00
1.00E+00
PASS
2.08E+00
4.22E-02
2.17E+00
1.99E+00
9.00E-01
PASS
2.05E+00
5.27E-02
2.16E+00
1.94E+00
8.00E-01
PASS
2.04E+00
6.99E-02
2.18E+00
1.90E+00
8.00E-01
PASS
1.99E+00
3.16E-02
2.06E+00
1.92E+00
8.00E-01
PASS
1.98E+00
4.22E-02
2.07E+00
1.89E+00
6.00E-01
PASS
1.96E+00
5.16E-02
2.07E+00
1.85E+00
6.00E-01
PASS
1.93E+00
4.83E-02
2.03E+00
1.83E+00
6.00E-01
PASS
1.92E+00
4.22E-02
2.01E+00
1.83E+00
6.00E-01
PASS
1.85E+00
5.27E-02
1.96E+00
1.74E+00
5.00E-01
PASS
1.66E+00
5.16E-02
1.77E+00
1.55E+00
4.00E-01
PASS
An ISO 9001:2008 and DSCC Certified Company
208
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Large Signal Voltage Gain @5V RL=500 #2 (V/mV)
2.50E+00
2.00E+00
1.50E+00
1.00E+00
5.00E-01
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.102. Plot of Large Signal Voltage Gain @5V RL=500 #2 (V/mV) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias and the
black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
209
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.102. Raw data for Large Signal Voltage Gain @5V RL=500 #2 (V/mV) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Large Signal Voltage Gain @5V RL=500 #2 (V/mV)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
2.10E+00
2.00E+00
2.10E+00
2.20E+00
2.20E+00
2.00E+00
2.00E+00
2.00E+00
1.90E+00
2.00E+00
2.20E+00
2.10E+00
10
2.10E+00
1.90E+00
2.10E+00
2.20E+00
2.20E+00
2.00E+00
2.00E+00
1.90E+00
1.90E+00
2.00E+00
2.10E+00
2.10E+00
20
2.10E+00
1.90E+00
2.00E+00
2.10E+00
2.10E+00
2.00E+00
2.00E+00
1.90E+00
1.90E+00
2.00E+00
2.10E+00
2.10E+00
30
2.10E+00
1.90E+00
2.00E+00
2.10E+00
2.10E+00
2.00E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
2.10E+00
2.10E+00
40
2.00E+00
1.90E+00
2.00E+00
2.10E+00
2.10E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
2.10E+00
2.10E+00
50
2.00E+00
1.90E+00
1.90E+00
2.00E+00
2.00E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
2.10E+00
2.10E+00
60
2.00E+00
1.90E+00
1.90E+00
2.00E+00
2.00E+00
1.90E+00
1.90E+00
1.80E+00
1.90E+00
1.90E+00
2.20E+00
2.10E+00
70
2.00E+00
1.90E+00
1.90E+00
2.00E+00
2.00E+00
1.90E+00
1.90E+00
1.80E+00
1.90E+00
1.80E+00
2.10E+00
2.10E+00
75
1.90E+00
1.80E+00
1.90E+00
2.00E+00
2.00E+00
1.90E+00
1.80E+00
1.80E+00
1.90E+00
1.80E+00
2.10E+00
2.10E+00
100
1.90E+00
1.80E+00
1.80E+00
1.90E+00
1.90E+00
1.80E+00
1.80E+00
1.80E+00
1.80E+00
1.80E+00
2.20E+00
2.10E+00
200
1.70E+00
1.60E+00
1.70E+00
1.70E+00
1.70E+00
1.60E+00
1.60E+00
1.60E+00
1.60E+00
1.60E+00
2.10E+00
2.10E+00
2.05E+00
9.72E-02
2.25E+00
1.85E+00
1.00E+00
PASS
2.03E+00
1.16E-01
2.27E+00
1.79E+00
9.00E-01
PASS
2.00E+00
8.16E-02
2.17E+00
1.83E+00
8.00E-01
PASS
1.98E+00
9.19E-02
2.17E+00
1.79E+00
8.00E-01
PASS
1.96E+00
8.43E-02
2.13E+00
1.79E+00
8.00E-01
PASS
1.93E+00
4.83E-02
2.03E+00
1.83E+00
6.00E-01
PASS
1.92E+00
6.32E-02
2.05E+00
1.79E+00
6.00E-01
PASS
1.91E+00
7.38E-02
2.06E+00
1.76E+00
6.00E-01
PASS
1.88E+00
7.89E-02
2.04E+00
1.72E+00
6.00E-01
PASS
1.83E+00
4.83E-02
1.93E+00
1.73E+00
5.00E-01
PASS
1.64E+00
5.16E-02
1.75E+00
1.53E+00
4.00E-01
PASS
An ISO 9001:2008 and DSCC Certified Company
210
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Large Signal Voltage Gain @5V RL=500 #3 (V/mV)
2.50E+00
2.00E+00
1.50E+00
1.00E+00
5.00E-01
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.103. Plot of Large Signal Voltage Gain @5V RL=500 #3 (V/mV) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias and the
black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
211
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.103. Raw data for Large Signal Voltage Gain @5V RL=500 #3 (V/mV) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Large Signal Voltage Gain @5V RL=500 #3 (V/mV)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
2.20E+00
2.00E+00
2.10E+00
2.20E+00
2.20E+00
2.10E+00
2.10E+00
2.00E+00
2.10E+00
2.10E+00
2.10E+00
2.10E+00
10
2.10E+00
2.00E+00
2.10E+00
2.20E+00
2.20E+00
2.10E+00
2.10E+00
1.90E+00
2.10E+00
2.00E+00
2.10E+00
2.10E+00
20
2.10E+00
2.00E+00
2.00E+00
2.20E+00
2.10E+00
2.00E+00
2.00E+00
1.90E+00
2.00E+00
2.00E+00
2.10E+00
2.10E+00
30
2.10E+00
2.00E+00
2.00E+00
2.20E+00
2.10E+00
2.00E+00
2.00E+00
1.90E+00
2.00E+00
2.00E+00
2.10E+00
2.10E+00
40
2.10E+00
1.90E+00
2.00E+00
2.10E+00
2.10E+00
2.00E+00
2.00E+00
1.90E+00
2.00E+00
1.90E+00
2.10E+00
2.10E+00
50
2.00E+00
1.90E+00
2.00E+00
2.10E+00
2.00E+00
2.00E+00
1.90E+00
1.80E+00
2.00E+00
1.90E+00
2.10E+00
2.10E+00
60
2.00E+00
1.90E+00
1.90E+00
2.00E+00
2.00E+00
1.90E+00
1.90E+00
1.80E+00
1.90E+00
1.90E+00
2.10E+00
2.10E+00
70
2.00E+00
1.90E+00
1.90E+00
2.00E+00
2.00E+00
1.90E+00
1.90E+00
1.80E+00
1.90E+00
1.90E+00
2.10E+00
2.10E+00
75
2.00E+00
1.80E+00
1.90E+00
2.00E+00
2.00E+00
1.90E+00
1.90E+00
1.80E+00
1.90E+00
1.90E+00
2.10E+00
2.10E+00
100
1.90E+00
1.80E+00
1.80E+00
1.90E+00
1.90E+00
1.80E+00
1.80E+00
1.80E+00
1.90E+00
1.80E+00
2.10E+00
2.10E+00
200
1.70E+00
1.60E+00
1.60E+00
1.70E+00
1.70E+00
1.70E+00
1.70E+00
1.60E+00
1.70E+00
1.60E+00
2.10E+00
2.10E+00
2.11E+00
7.38E-02
2.26E+00
1.96E+00
1.00E+00
PASS
2.08E+00
9.19E-02
2.27E+00
1.89E+00
9.00E-01
PASS
2.03E+00
8.23E-02
2.20E+00
1.86E+00
8.00E-01
PASS
2.03E+00
8.23E-02
2.20E+00
1.86E+00
8.00E-01
PASS
2.00E+00
8.16E-02
2.17E+00
1.83E+00
8.00E-01
PASS
1.96E+00
8.43E-02
2.13E+00
1.79E+00
6.00E-01
PASS
1.92E+00
6.32E-02
2.05E+00
1.79E+00
6.00E-01
PASS
1.92E+00
6.32E-02
2.05E+00
1.79E+00
6.00E-01
PASS
1.91E+00
7.38E-02
2.06E+00
1.76E+00
6.00E-01
PASS
1.84E+00
5.16E-02
1.95E+00
1.73E+00
5.00E-01
PASS
1.66E+00
5.16E-02
1.77E+00
1.55E+00
4.00E-01
PASS
An ISO 9001:2008 and DSCC Certified Company
212
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Large Signal Voltage Gain @5V RL=500 #4 (V/mV)
2.50E+00
2.00E+00
1.50E+00
1.00E+00
5.00E-01
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.104. Plot of Large Signal Voltage Gain @5V RL=500 #4 (V/mV) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias and the
black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
213
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.104. Raw data for Large Signal Voltage Gain @5V RL=500 #4 (V/mV) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Large Signal Voltage Gain @5V RL=500 #4 (V/mV)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
2.10E+00
2.10E+00
2.10E+00
2.00E+00
2.00E+00
2.10E+00
2.10E+00
2.10E+00
2.10E+00
2.10E+00
2.10E+00
2.00E+00
10
2.10E+00
2.00E+00
2.10E+00
2.00E+00
2.00E+00
2.10E+00
2.10E+00
2.10E+00
2.00E+00
2.10E+00
2.10E+00
2.00E+00
20
2.00E+00
2.00E+00
2.00E+00
2.00E+00
2.00E+00
2.00E+00
2.00E+00
2.00E+00
2.00E+00
2.00E+00
2.10E+00
2.00E+00
30
2.00E+00
2.00E+00
2.00E+00
2.00E+00
2.00E+00
2.00E+00
2.00E+00
2.00E+00
2.00E+00
2.00E+00
2.10E+00
2.00E+00
40
2.00E+00
2.00E+00
2.00E+00
2.00E+00
2.00E+00
2.00E+00
2.00E+00
2.00E+00
1.90E+00
2.00E+00
2.10E+00
2.00E+00
50
2.00E+00
1.90E+00
2.00E+00
1.90E+00
1.90E+00
2.00E+00
2.00E+00
1.90E+00
1.90E+00
1.90E+00
2.10E+00
2.00E+00
60
1.90E+00
1.90E+00
2.00E+00
1.90E+00
1.90E+00
1.90E+00
2.00E+00
1.90E+00
1.90E+00
1.90E+00
2.10E+00
2.00E+00
70
1.90E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
2.10E+00
2.00E+00
75
1.90E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
2.10E+00
2.00E+00
100
1.80E+00
1.80E+00
1.90E+00
1.80E+00
1.80E+00
1.90E+00
1.90E+00
1.80E+00
1.80E+00
1.80E+00
2.10E+00
2.00E+00
200
1.70E+00
1.60E+00
1.70E+00
1.60E+00
1.70E+00
1.70E+00
1.70E+00
1.60E+00
1.60E+00
1.60E+00
2.10E+00
2.00E+00
2.08E+00
4.22E-02
2.17E+00
1.99E+00
1.00E+00
PASS
2.06E+00
5.16E-02
2.17E+00
1.95E+00
9.00E-01
PASS
2.00E+00
0.00E+00
2.00E+00
2.00E+00
8.00E-01
PASS
2.00E+00
0.00E+00
2.00E+00
2.00E+00
8.00E-01
PASS
1.99E+00
3.16E-02
2.06E+00
1.92E+00
8.00E-01
PASS
1.94E+00
5.16E-02
2.05E+00
1.83E+00
6.00E-01
PASS
1.92E+00
4.22E-02
2.01E+00
1.83E+00
6.00E-01
PASS
1.90E+00
0.00E+00
1.90E+00
1.90E+00
6.00E-01
PASS
1.90E+00
0.00E+00
1.90E+00
1.90E+00
6.00E-01
PASS
1.83E+00
4.83E-02
1.93E+00
1.73E+00
5.00E-01
PASS
1.65E+00
5.27E-02
1.76E+00
1.54E+00
4.00E-01
PASS
An ISO 9001:2008 and DSCC Certified Company
214
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Large Signal Voltage Gain @5V RL=100 #1 (V/mV)
1.80E+00
1.60E+00
1.40E+00
1.20E+00
1.00E+00
8.00E-01
6.00E-01
4.00E-01
2.00E-01
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.105. Plot of Large Signal Voltage Gain @5V RL=100 #1 (V/mV) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias and the
black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
215
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.105. Raw data for Large Signal Voltage Gain @5V RL=100 #1 (V/mV) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Large Signal Voltage Gain @5V RL=100 #1 (V/mV)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
1.50E+00
1.70E+00
1.60E+00
1.60E+00
1.60E+00
1.70E+00
1.70E+00
1.60E+00
1.60E+00
1.70E+00
1.70E+00
1.60E+00
10
1.60E+00
1.60E+00
1.50E+00
1.70E+00
1.60E+00
1.60E+00
1.60E+00
1.60E+00
1.60E+00
1.60E+00
1.70E+00
1.60E+00
20
1.60E+00
1.50E+00
1.50E+00
1.70E+00
1.60E+00
1.60E+00
1.60E+00
1.60E+00
1.60E+00
1.60E+00
1.70E+00
1.60E+00
30
1.60E+00
1.50E+00
1.50E+00
1.60E+00
1.60E+00
1.50E+00
1.60E+00
1.50E+00
1.50E+00
1.60E+00
1.70E+00
1.60E+00
40
1.60E+00
1.50E+00
1.50E+00
1.60E+00
1.60E+00
1.50E+00
1.60E+00
1.50E+00
1.50E+00
1.60E+00
1.70E+00
1.60E+00
50
1.50E+00
1.50E+00
1.50E+00
1.60E+00
1.60E+00
1.50E+00
1.50E+00
1.50E+00
1.50E+00
1.50E+00
1.70E+00
1.60E+00
60
1.50E+00
1.50E+00
1.50E+00
1.50E+00
1.60E+00
1.50E+00
1.50E+00
1.50E+00
1.50E+00
1.50E+00
1.70E+00
1.60E+00
70
1.50E+00
1.40E+00
1.40E+00
1.50E+00
1.50E+00
1.50E+00
1.50E+00
1.50E+00
1.50E+00
1.50E+00
1.70E+00
1.60E+00
75
1.50E+00
1.40E+00
1.40E+00
1.50E+00
1.50E+00
1.50E+00
1.50E+00
1.50E+00
1.50E+00
1.50E+00
1.70E+00
1.60E+00
100
1.50E+00
1.40E+00
1.40E+00
1.40E+00
1.50E+00
1.40E+00
1.40E+00
1.40E+00
1.40E+00
1.40E+00
1.70E+00
1.60E+00
200
1.30E+00
1.20E+00
1.20E+00
1.20E+00
1.30E+00
1.20E+00
1.30E+00
1.20E+00
1.20E+00
1.20E+00
1.70E+00
1.60E+00
1.63E+00
6.75E-02
1.77E+00
1.49E+00
7.00E-01
PASS
1.60E+00
4.71E-02
1.70E+00
1.50E+00
6.00E-01
PASS
1.59E+00
5.68E-02
1.71E+00
1.47E+00
5.50E-01
PASS
1.55E+00
5.27E-02
1.66E+00
1.44E+00
5.50E-01
PASS
1.55E+00
5.27E-02
1.66E+00
1.44E+00
5.50E-01
PASS
1.52E+00
4.22E-02
1.61E+00
1.43E+00
4.50E-01
PASS
1.51E+00
3.16E-02
1.58E+00
1.44E+00
4.50E-01
PASS
1.48E+00
4.22E-02
1.57E+00
1.39E+00
4.50E-01
PASS
1.48E+00
4.22E-02
1.57E+00
1.39E+00
4.50E-01
PASS
1.42E+00
4.22E-02
1.51E+00
1.33E+00
4.00E-01
PASS
1.23E+00
4.83E-02
1.33E+00
1.13E+00
3.50E-01
PASS
An ISO 9001:2008 and DSCC Certified Company
216
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Large Signal Voltage Gain @5V RL=100 #2 (V/mV)
1.80E+00
1.60E+00
1.40E+00
1.20E+00
1.00E+00
8.00E-01
6.00E-01
4.00E-01
2.00E-01
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.106. Plot of Large Signal Voltage Gain @5V RL=100 #2 (V/mV) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias and the
black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
217
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.106. Raw data for Large Signal Voltage Gain @5V RL=100 #2 (V/mV) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Large Signal Voltage Gain @5V RL=100 #2 (V/mV)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
1.70E+00
1.50E+00
1.60E+00
1.70E+00
1.70E+00
1.50E+00
1.60E+00
1.60E+00
1.50E+00
1.50E+00
1.70E+00
1.70E+00
10
1.60E+00
1.40E+00
1.60E+00
1.70E+00
1.70E+00
1.50E+00
1.50E+00
1.50E+00
1.40E+00
1.50E+00
1.70E+00
1.70E+00
20
1.60E+00
1.40E+00
1.60E+00
1.70E+00
1.70E+00
1.50E+00
1.50E+00
1.50E+00
1.40E+00
1.50E+00
1.70E+00
1.70E+00
30
1.60E+00
1.40E+00
1.50E+00
1.70E+00
1.60E+00
1.50E+00
1.50E+00
1.40E+00
1.50E+00
1.50E+00
1.70E+00
1.70E+00
40
1.50E+00
1.50E+00
1.50E+00
1.70E+00
1.60E+00
1.50E+00
1.50E+00
1.40E+00
1.50E+00
1.50E+00
1.70E+00
1.70E+00
50
1.50E+00
1.50E+00
1.50E+00
1.60E+00
1.60E+00
1.50E+00
1.40E+00
1.40E+00
1.50E+00
1.50E+00
1.70E+00
1.70E+00
60
1.50E+00
1.40E+00
1.50E+00
1.60E+00
1.60E+00
1.50E+00
1.40E+00
1.40E+00
1.50E+00
1.50E+00
1.70E+00
1.70E+00
70
1.50E+00
1.40E+00
1.50E+00
1.60E+00
1.50E+00
1.40E+00
1.40E+00
1.40E+00
1.40E+00
1.40E+00
1.70E+00
1.70E+00
75
1.50E+00
1.40E+00
1.50E+00
1.60E+00
1.50E+00
1.40E+00
1.40E+00
1.40E+00
1.40E+00
1.40E+00
1.70E+00
1.70E+00
100
1.40E+00
1.40E+00
1.40E+00
1.50E+00
1.50E+00
1.40E+00
1.40E+00
1.30E+00
1.40E+00
1.40E+00
1.70E+00
1.70E+00
200
1.30E+00
1.20E+00
1.30E+00
1.30E+00
1.30E+00
1.20E+00
1.20E+00
1.20E+00
1.20E+00
1.20E+00
1.70E+00
1.70E+00
1.59E+00
8.76E-02
1.77E+00
1.41E+00
7.00E-01
PASS
1.54E+00
1.07E-01
1.76E+00
1.32E+00
6.00E-01
PASS
1.54E+00
1.07E-01
1.76E+00
1.32E+00
5.50E-01
PASS
1.52E+00
9.19E-02
1.71E+00
1.33E+00
5.50E-01
PASS
1.52E+00
7.89E-02
1.68E+00
1.36E+00
5.50E-01
PASS
1.50E+00
6.67E-02
1.64E+00
1.36E+00
4.50E-01
PASS
1.49E+00
7.38E-02
1.64E+00
1.34E+00
4.50E-01
PASS
1.45E+00
7.07E-02
1.60E+00
1.30E+00
4.50E-01
PASS
1.45E+00
7.07E-02
1.60E+00
1.30E+00
4.50E-01
PASS
1.41E+00
5.68E-02
1.53E+00
1.29E+00
4.00E-01
PASS
1.24E+00
5.16E-02
1.35E+00
1.13E+00
3.50E-01
PASS
An ISO 9001:2008 and DSCC Certified Company
218
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Large Signal Voltage Gain @5V RL=100 #3 (V/mV)
1.80E+00
1.60E+00
1.40E+00
1.20E+00
1.00E+00
8.00E-01
6.00E-01
4.00E-01
2.00E-01
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.107. Plot of Large Signal Voltage Gain @5V RL=100 #3 (V/mV) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias and the
black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
219
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.107. Raw data for Large Signal Voltage Gain @5V RL=100 #3 (V/mV) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Large Signal Voltage Gain @5V RL=100 #3 (V/mV)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
1.70E+00
1.60E+00
1.60E+00
1.80E+00
1.70E+00
1.50E+00
1.60E+00
1.50E+00
1.70E+00
1.60E+00
1.60E+00
1.60E+00
10
1.60E+00
1.50E+00
1.60E+00
1.80E+00
1.70E+00
1.60E+00
1.60E+00
1.50E+00
1.60E+00
1.60E+00
1.60E+00
1.60E+00
20
1.60E+00
1.50E+00
1.60E+00
1.80E+00
1.70E+00
1.60E+00
1.50E+00
1.50E+00
1.60E+00
1.50E+00
1.60E+00
1.60E+00
30
1.60E+00
1.50E+00
1.50E+00
1.70E+00
1.60E+00
1.50E+00
1.50E+00
1.40E+00
1.50E+00
1.50E+00
1.60E+00
1.60E+00
40
1.60E+00
1.50E+00
1.50E+00
1.70E+00
1.60E+00
1.50E+00
1.50E+00
1.40E+00
1.50E+00
1.50E+00
1.60E+00
1.60E+00
50
1.60E+00
1.50E+00
1.50E+00
1.70E+00
1.60E+00
1.50E+00
1.50E+00
1.40E+00
1.50E+00
1.50E+00
1.60E+00
1.60E+00
60
1.50E+00
1.40E+00
1.50E+00
1.60E+00
1.60E+00
1.50E+00
1.50E+00
1.40E+00
1.50E+00
1.50E+00
1.60E+00
1.60E+00
70
1.50E+00
1.40E+00
1.50E+00
1.60E+00
1.50E+00
1.50E+00
1.50E+00
1.40E+00
1.50E+00
1.50E+00
1.60E+00
1.60E+00
75
1.50E+00
1.40E+00
1.50E+00
1.60E+00
1.50E+00
1.50E+00
1.40E+00
1.40E+00
1.50E+00
1.50E+00
1.60E+00
1.60E+00
100
1.40E+00
1.40E+00
1.40E+00
1.50E+00
1.50E+00
1.40E+00
1.40E+00
1.40E+00
1.40E+00
1.40E+00
1.60E+00
1.60E+00
200
1.30E+00
1.20E+00
1.20E+00
1.30E+00
1.30E+00
1.20E+00
1.20E+00
1.20E+00
1.30E+00
1.20E+00
1.60E+00
1.60E+00
1.63E+00
9.49E-02
1.83E+00
1.43E+00
7.00E-01
PASS
1.61E+00
8.76E-02
1.79E+00
1.43E+00
6.00E-01
PASS
1.59E+00
9.94E-02
1.80E+00
1.38E+00
5.50E-01
PASS
1.53E+00
8.23E-02
1.70E+00
1.36E+00
5.50E-01
PASS
1.53E+00
8.23E-02
1.70E+00
1.36E+00
5.50E-01
PASS
1.53E+00
8.23E-02
1.70E+00
1.36E+00
4.50E-01
PASS
1.50E+00
6.67E-02
1.64E+00
1.36E+00
4.50E-01
PASS
1.49E+00
5.68E-02
1.61E+00
1.37E+00
4.50E-01
PASS
1.48E+00
6.32E-02
1.61E+00
1.35E+00
4.50E-01
PASS
1.42E+00
4.22E-02
1.51E+00
1.33E+00
4.00E-01
PASS
1.24E+00
5.16E-02
1.35E+00
1.13E+00
3.50E-01
PASS
An ISO 9001:2008 and DSCC Certified Company
220
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Large Signal Voltage Gain @5V RL=100 #4 (V/mV)
1.80E+00
1.60E+00
1.40E+00
1.20E+00
1.00E+00
8.00E-01
6.00E-01
4.00E-01
2.00E-01
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.108. Plot of Large Signal Voltage Gain @5V RL=100 #4 (V/mV) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias and the
black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
221
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.108. Raw data for Large Signal Voltage Gain @5V RL=100 #4 (V/mV) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Large Signal Voltage Gain @5V RL=100 #4 (V/mV)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
1.60E+00
1.60E+00
1.70E+00
1.50E+00
1.60E+00
1.70E+00
1.70E+00
1.60E+00
1.60E+00
1.70E+00
1.70E+00
1.60E+00
10
1.60E+00
1.60E+00
1.60E+00
1.60E+00
1.60E+00
1.60E+00
1.60E+00
1.60E+00
1.60E+00
1.60E+00
1.70E+00
1.60E+00
20
1.60E+00
1.50E+00
1.60E+00
1.60E+00
1.60E+00
1.60E+00
1.60E+00
1.50E+00
1.50E+00
1.60E+00
1.70E+00
1.60E+00
30
1.50E+00
1.50E+00
1.50E+00
1.60E+00
1.50E+00
1.50E+00
1.60E+00
1.50E+00
1.50E+00
1.50E+00
1.70E+00
1.60E+00
40
1.50E+00
1.50E+00
1.50E+00
1.50E+00
1.50E+00
1.50E+00
1.50E+00
1.50E+00
1.50E+00
1.50E+00
1.70E+00
1.60E+00
50
1.50E+00
1.50E+00
1.50E+00
1.50E+00
1.50E+00
1.50E+00
1.50E+00
1.50E+00
1.50E+00
1.50E+00
1.70E+00
1.60E+00
60
1.50E+00
1.50E+00
1.50E+00
1.50E+00
1.50E+00
1.50E+00
1.50E+00
1.50E+00
1.50E+00
1.50E+00
1.70E+00
1.60E+00
70
1.50E+00
1.40E+00
1.50E+00
1.50E+00
1.50E+00
1.50E+00
1.50E+00
1.40E+00
1.40E+00
1.40E+00
1.70E+00
1.60E+00
75
1.50E+00
1.40E+00
1.50E+00
1.40E+00
1.50E+00
1.50E+00
1.50E+00
1.40E+00
1.40E+00
1.40E+00
1.70E+00
1.60E+00
100
1.40E+00
1.40E+00
1.50E+00
1.40E+00
1.40E+00
1.40E+00
1.40E+00
1.40E+00
1.40E+00
1.40E+00
1.70E+00
1.60E+00
200
1.20E+00
1.20E+00
1.30E+00
1.20E+00
1.30E+00
1.20E+00
1.30E+00
1.20E+00
1.20E+00
1.20E+00
1.70E+00
1.60E+00
1.63E+00
6.75E-02
1.77E+00
1.49E+00
7.00E-01
PASS
1.60E+00
2.34E-16
1.60E+00
1.60E+00
6.00E-01
PASS
1.57E+00
4.83E-02
1.67E+00
1.47E+00
5.50E-01
PASS
1.52E+00
4.22E-02
1.61E+00
1.43E+00
5.50E-01
PASS
1.50E+00
0.00E+00
1.50E+00
1.50E+00
5.50E-01
PASS
1.50E+00
0.00E+00
1.50E+00
1.50E+00
4.50E-01
PASS
1.50E+00
0.00E+00
1.50E+00
1.50E+00
4.50E-01
PASS
1.46E+00
5.16E-02
1.57E+00
1.35E+00
4.50E-01
PASS
1.45E+00
5.27E-02
1.56E+00
1.34E+00
4.50E-01
PASS
1.41E+00
3.16E-02
1.48E+00
1.34E+00
4.00E-01
PASS
1.23E+00
4.83E-02
1.33E+00
1.13E+00
3.50E-01
PASS
An ISO 9001:2008 and DSCC Certified Company
222
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Channel Separation @5V 1:2 (dB)
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.109. Plot of Channel Separation @5V 1:2 (dB) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias and the black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
223
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.109. Raw data for Channel Separation @5V 1:2 (dB) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Channel Separation @5V 1:2 (dB)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
1.08E+02
1.02E+02
1.55E+02
1.18E+02
9.80E+01
1.11E+02
9.63E+01
1.07E+02
1.04E+02
1.03E+02
1.11E+02
1.06E+02
10
1.17E+02
1.18E+02
1.04E+02
1.14E+02
1.04E+02
1.13E+02
1.10E+02
1.10E+02
1.13E+02
1.10E+02
1.10E+02
1.01E+02
20
1.09E+02
1.05E+02
1.03E+02
1.04E+02
1.10E+02
9.93E+01
1.05E+02
1.03E+02
9.75E+01
9.70E+01
1.14E+02
1.13E+02
30
1.11E+02
9.41E+01
1.10E+02
1.03E+02
1.08E+02
1.08E+02
9.67E+01
1.02E+02
1.16E+02
1.10E+02
1.09E+02
1.30E+02
40
9.50E+01
1.19E+02
9.66E+01
1.06E+02
1.05E+02
9.74E+01
1.07E+02
9.66E+01
1.06E+02
1.15E+02
1.10E+02
1.18E+02
50
1.26E+02
1.07E+02
1.28E+02
1.07E+02
1.13E+02
1.04E+02
1.02E+02
1.02E+02
1.07E+02
1.26E+02
1.47E+02
1.17E+02
60
1.05E+02
1.04E+02
1.01E+02
1.08E+02
9.95E+01
1.02E+02
1.04E+02
1.09E+02
1.09E+02
1.02E+02
1.09E+02
1.07E+02
70
1.18E+02
1.09E+02
9.96E+01
1.06E+02
9.89E+01
1.12E+02
1.03E+02
9.94E+01
9.62E+01
1.08E+02
1.17E+02
1.02E+02
75
1.12E+02
1.07E+02
1.13E+02
9.84E+01
1.07E+02
1.06E+02
9.92E+01
1.08E+02
1.13E+02
1.02E+02
1.20E+02
1.05E+02
100
1.13E+02
9.69E+01
1.16E+02
1.09E+02
9.64E+01
1.15E+02
1.11E+02
1.30E+02
1.03E+02
9.47E+01
1.02E+02
1.11E+02
200
9.72E+01
1.02E+02
1.18E+02
1.05E+02
1.05E+02
9.94E+01
1.09E+02
1.23E+02
9.74E+01
9.56E+01
1.07E+02
1.05E+02
1.10E+02
1.70E+01
1.45E+02
7.51E+01
8.10E+01
PASS
1.11E+02
4.66E+00
1.21E+02
1.02E+02
8.10E+01
PASS
1.03E+02
4.43E+00
1.12E+02
9.40E+01
8.10E+01
PASS
1.06E+02
6.80E+00
1.20E+02
9.18E+01
8.10E+01
PASS
1.04E+02
8.09E+00
1.21E+02
8.76E+01
8.10E+01
PASS
1.12E+02
1.06E+01
1.34E+02
9.01E+01
8.10E+01
PASS
1.04E+02
3.44E+00
1.11E+02
9.73E+01
8.10E+01
PASS
1.05E+02
6.78E+00
1.19E+02
9.10E+01
8.10E+01
PASS
1.06E+02
5.29E+00
1.17E+02
9.55E+01
8.10E+01
PASS
1.09E+02
1.11E+01
1.32E+02
8.57E+01
8.10E+01
PASS
1.05E+02
9.22E+00
1.24E+02
8.61E+01
8.10E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
224
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Channel Separation @5V 1:3 (dB)
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.110. Plot of Channel Separation @5V 1:3 (dB) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias and the black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
225
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.110. Raw data for Channel Separation @5V 1:3 (dB) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Channel Separation @5V 1:3 (dB)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
1.16E+02
1.08E+02
1.08E+02
1.18E+02
1.17E+02
1.03E+02
9.79E+01
1.35E+02
1.06E+02
1.28E+02
1.14E+02
1.10E+02
10
1.20E+02
1.13E+02
1.07E+02
1.04E+02
1.07E+02
1.02E+02
1.02E+02
9.80E+01
1.02E+02
1.06E+02
1.08E+02
1.13E+02
20
9.27E+01
1.10E+02
1.09E+02
1.12E+02
1.15E+02
1.04E+02
9.99E+01
1.12E+02
1.04E+02
1.03E+02
1.06E+02
1.23E+02
30
1.07E+02
1.05E+02
1.09E+02
1.06E+02
1.03E+02
1.16E+02
1.05E+02
1.26E+02
1.26E+02
1.04E+02
1.04E+02
9.89E+01
40
9.88E+01
1.03E+02
1.04E+02
1.02E+02
1.08E+02
1.02E+02
1.00E+02
1.06E+02
9.75E+01
9.90E+01
1.18E+02
1.10E+02
50
1.05E+02
1.14E+02
1.02E+02
1.07E+02
1.09E+02
1.03E+02
1.04E+02
1.03E+02
1.04E+02
1.12E+02
1.10E+02
9.73E+01
60
1.14E+02
1.03E+02
1.04E+02
1.06E+02
1.18E+02
1.10E+02
9.83E+01
1.14E+02
1.08E+02
1.01E+02
1.01E+02
9.72E+01
70
1.06E+02
1.25E+02
1.23E+02
1.03E+02
1.20E+02
9.90E+01
1.16E+02
1.02E+02
1.05E+02
1.05E+02
1.09E+02
9.78E+01
75
1.16E+02
1.02E+02
1.16E+02
1.12E+02
1.08E+02
1.09E+02
1.00E+02
1.04E+02
1.02E+02
1.05E+02
1.05E+02
1.14E+02
100
1.26E+02
1.15E+02
1.02E+02
9.32E+01
1.22E+02
1.08E+02
9.90E+01
1.06E+02
1.24E+02
1.08E+02
1.04E+02
1.06E+02
200
9.83E+01
9.88E+01
1.03E+02
9.35E+01
9.88E+01
1.11E+02
1.06E+02
1.12E+02
1.08E+02
1.05E+02
1.01E+02
1.09E+02
1.14E+02
1.14E+01
1.37E+02
9.01E+01
8.10E+01
PASS
1.06E+02
6.34E+00
1.19E+02
9.29E+01
8.10E+01
PASS
1.06E+02
6.85E+00
1.20E+02
9.20E+01
8.10E+01
PASS
1.11E+02
8.94E+00
1.29E+02
9.22E+01
8.10E+01
PASS
1.02E+02
3.21E+00
1.08E+02
9.52E+01
8.10E+01
PASS
1.06E+02
4.02E+00
1.15E+02
9.80E+01
8.10E+01
PASS
1.08E+02
6.27E+00
1.21E+02
9.46E+01
8.10E+01
PASS
1.10E+02
9.59E+00
1.30E+02
9.04E+01
8.10E+01
PASS
1.07E+02
5.79E+00
1.19E+02
9.54E+01
8.10E+01
PASS
1.10E+02
1.12E+01
1.33E+02
8.71E+01
8.10E+01
PASS
1.03E+02
5.98E+00
1.16E+02
9.10E+01
8.10E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
226
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Channel Separation @5V 1:4 (dB)
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.111. Plot of Channel Separation @5V 1:4 (dB) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias and the black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
227
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.111. Raw data for Channel Separation @5V 1:4 (dB) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Channel Separation @5V 1:4 (dB)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
1.11E+02
1.22E+02
1.02E+02
1.15E+02
1.15E+02
1.05E+02
1.03E+02
9.94E+01
9.97E+01
1.09E+02
1.03E+02
1.01E+02
10
1.01E+02
1.23E+02
1.04E+02
1.09E+02
1.01E+02
1.08E+02
1.07E+02
1.04E+02
1.03E+02
9.75E+01
1.04E+02
9.53E+01
20
1.21E+02
1.02E+02
1.04E+02
1.11E+02
1.24E+02
1.00E+02
1.20E+02
1.03E+02
1.26E+02
1.03E+02
9.76E+01
1.09E+02
30
1.11E+02
1.01E+02
1.16E+02
1.01E+02
1.13E+02
1.28E+02
1.02E+02
1.07E+02
1.02E+02
1.00E+02
1.16E+02
1.02E+02
40
1.01E+02
9.64E+01
1.15E+02
9.91E+01
1.20E+02
1.09E+02
1.13E+02
1.05E+02
1.02E+02
9.58E+01
1.08E+02
1.36E+02
50
1.08E+02
1.11E+02
1.01E+02
9.96E+01
1.05E+02
1.07E+02
1.05E+02
1.01E+02
1.07E+02
9.58E+01
1.08E+02
9.48E+01
60
1.04E+02
1.08E+02
9.91E+01
1.13E+02
1.08E+02
1.19E+02
1.04E+02
1.11E+02
1.05E+02
1.04E+02
1.01E+02
1.14E+02
70
9.81E+01
9.38E+01
1.15E+02
9.90E+01
1.04E+02
9.56E+01
1.07E+02
9.58E+01
1.02E+02
1.10E+02
1.02E+02
1.17E+02
75
9.69E+01
9.96E+01
1.10E+02
1.19E+02
9.94E+01
1.08E+02
1.00E+02
9.64E+01
1.18E+02
1.08E+02
1.03E+02
1.04E+02
100
1.13E+02
9.38E+01
9.61E+01
1.12E+02
1.06E+02
1.04E+02
1.01E+02
1.13E+02
1.17E+02
1.07E+02
1.03E+02
9.98E+01
200
1.12E+02
1.02E+02
1.17E+02
1.23E+02
1.07E+02
1.13E+02
1.02E+02
1.10E+02
1.09E+02
1.00E+02
1.59E+02
1.01E+02
1.08E+02
7.43E+00
1.23E+02
9.26E+01
8.10E+01
PASS
1.06E+02
6.94E+00
1.20E+02
9.14E+01
8.10E+01
PASS
1.12E+02
1.04E+01
1.33E+02
9.01E+01
8.10E+01
PASS
1.08E+02
9.06E+00
1.27E+02
8.94E+01
8.10E+01
PASS
1.06E+02
8.32E+00
1.23E+02
8.84E+01
8.10E+01
PASS
1.04E+02
4.64E+00
1.14E+02
9.44E+01
8.10E+01
PASS
1.07E+02
5.79E+00
1.19E+02
9.55E+01
8.10E+01
PASS
1.02E+02
6.84E+00
1.16E+02
8.78E+01
8.10E+01
PASS
1.06E+02
8.34E+00
1.23E+02
8.84E+01
8.10E+01
PASS
1.06E+02
7.66E+00
1.22E+02
9.04E+01
8.10E+01
PASS
1.09E+02
7.12E+00
1.24E+02
9.46E+01
8.10E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
228
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Channel Separation @5V 2:1 (dB)
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.112. Plot of Channel Separation @5V 2:1 (dB) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias and the black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
229
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.112. Raw data for Channel Separation @5V 2:1 (dB) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Channel Separation @5V 2:1 (dB)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
1.09E+02
1.26E+02
1.14E+02
1.08E+02
1.16E+02
1.10E+02
9.77E+01
1.08E+02
1.00E+02
1.06E+02
1.12E+02
1.21E+02
10
1.26E+02
9.98E+01
9.80E+01
1.14E+02
1.04E+02
1.24E+02
1.02E+02
1.04E+02
1.07E+02
1.07E+02
1.03E+02
1.09E+02
20
1.36E+02
1.00E+02
9.90E+01
1.00E+02
1.14E+02
1.02E+02
1.08E+02
1.18E+02
1.05E+02
1.03E+02
1.50E+02
1.09E+02
30
1.23E+02
1.04E+02
1.12E+02
9.68E+01
1.14E+02
9.97E+01
1.20E+02
1.17E+02
1.08E+02
9.76E+01
9.85E+01
1.01E+02
40
1.13E+02
1.01E+02
1.10E+02
1.08E+02
1.09E+02
9.81E+01
9.80E+01
1.30E+02
1.06E+02
1.10E+02
9.63E+01
1.02E+02
50
1.12E+02
1.05E+02
1.09E+02
1.05E+02
1.01E+02
1.09E+02
1.04E+02
1.01E+02
1.06E+02
1.14E+02
1.21E+02
1.05E+02
60
1.06E+02
1.15E+02
1.13E+02
1.08E+02
1.11E+02
1.12E+02
1.10E+02
1.01E+02
1.03E+02
1.55E+02
1.23E+02
1.08E+02
70
1.17E+02
1.08E+02
1.07E+02
1.04E+02
1.00E+02
1.24E+02
1.16E+02
1.07E+02
1.42E+02
1.03E+02
1.14E+02
1.01E+02
75
1.07E+02
1.00E+02
1.06E+02
1.05E+02
1.02E+02
1.05E+02
1.24E+02
1.14E+02
9.49E+01
1.02E+02
1.03E+02
1.06E+02
100
9.81E+01
1.25E+02
9.98E+01
9.91E+01
1.28E+02
1.03E+02
1.07E+02
1.02E+02
1.13E+02
1.17E+02
1.16E+02
1.11E+02
200
1.12E+02
9.80E+01
9.81E+01
1.01E+02
1.13E+02
1.01E+02
1.12E+02
9.57E+01
1.06E+02
1.02E+02
1.13E+02
1.05E+02
1.09E+02
7.98E+00
1.26E+02
9.29E+01
8.10E+01
PASS
1.09E+02
9.56E+00
1.28E+02
8.88E+01
8.10E+01
PASS
1.09E+02
1.16E+01
1.32E+02
8.46E+01
8.10E+01
PASS
1.09E+02
9.47E+00
1.29E+02
8.97E+01
8.10E+01
PASS
1.08E+02
9.26E+00
1.27E+02
8.92E+01
8.10E+01
PASS
1.07E+02
4.32E+00
1.16E+02
9.77E+01
8.10E+01
PASS
1.13E+02
1.54E+01
1.45E+02
8.16E+01
8.10E+01
PASS
1.13E+02
1.26E+01
1.39E+02
8.68E+01
8.10E+01
PASS
1.06E+02
8.05E+00
1.22E+02
8.92E+01
8.10E+01
PASS
1.09E+02
1.08E+01
1.31E+02
8.67E+01
8.10E+01
PASS
1.04E+02
6.47E+00
1.17E+02
9.06E+01
8.10E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
230
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Channel Separation @5V 2:3 (dB)
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.113. Plot of Channel Separation @5V 2:3 (dB) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias and the black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
231
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.113. Raw data for Channel Separation @5V 2:3 (dB) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Channel Separation @5V 2:3 (dB)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
1.04E+02
1.03E+02
1.02E+02
1.06E+02
1.03E+02
1.07E+02
9.66E+01
1.07E+02
1.32E+02
9.58E+01
1.21E+02
9.85E+01
10
1.13E+02
1.12E+02
1.08E+02
9.69E+01
1.14E+02
1.00E+02
1.08E+02
1.20E+02
1.13E+02
1.09E+02
1.07E+02
1.25E+02
20
1.13E+02
9.88E+01
1.06E+02
9.79E+01
9.66E+01
9.64E+01
1.09E+02
1.12E+02
1.00E+02
1.00E+02
1.16E+02
1.19E+02
30
1.12E+02
1.04E+02
1.02E+02
1.03E+02
1.06E+02
1.05E+02
1.15E+02
1.21E+02
1.12E+02
1.02E+02
1.18E+02
1.09E+02
40
1.01E+02
9.99E+01
9.82E+01
1.27E+02
1.07E+02
1.08E+02
1.16E+02
1.14E+02
1.00E+02
1.05E+02
9.57E+01
1.10E+02
50
9.82E+01
1.07E+02
1.26E+02
1.16E+02
1.05E+02
1.08E+02
1.00E+02
1.18E+02
1.02E+02
9.73E+01
1.09E+02
1.35E+02
60
1.01E+02
1.06E+02
1.07E+02
1.17E+02
9.70E+01
1.10E+02
1.01E+02
1.04E+02
9.62E+01
9.81E+01
1.23E+02
1.39E+02
70
1.03E+02
1.12E+02
1.10E+02
1.11E+02
9.86E+01
1.00E+02
1.02E+02
1.06E+02
1.07E+02
9.60E+01
1.29E+02
1.17E+02
75
1.13E+02
1.04E+02
1.03E+02
1.16E+02
9.92E+01
1.20E+02
9.93E+01
1.17E+02
9.93E+01
1.06E+02
1.22E+02
1.06E+02
100
1.00E+02
1.15E+02
1.13E+02
1.20E+02
1.02E+02
1.12E+02
1.01E+02
1.29E+02
1.13E+02
9.49E+01
9.71E+01
1.36E+02
200
1.03E+02
9.51E+01
1.04E+02
9.76E+01
1.15E+02
1.08E+02
1.34E+02
1.09E+02
1.09E+02
1.10E+02
1.01E+02
1.01E+02
1.06E+02
9.94E+00
1.26E+02
8.51E+01
8.10E+01
PASS
1.09E+02
6.72E+00
1.23E+02
9.54E+01
8.10E+01
PASS
1.03E+02
6.35E+00
1.16E+02
8.99E+01
8.10E+01
PASS
1.08E+02
6.37E+00
1.21E+02
9.51E+01
8.10E+01
PASS
1.07E+02
9.06E+00
1.26E+02
8.87E+01
8.10E+01
PASS
1.08E+02
9.50E+00
1.27E+02
8.82E+01
8.10E+01
PASS
1.04E+02
6.44E+00
1.17E+02
9.04E+01
8.10E+01
PASS
1.05E+02
5.48E+00
1.16E+02
9.32E+01
8.10E+01
PASS
1.08E+02
8.11E+00
1.25E+02
9.10E+01
8.10E+01
PASS
1.10E+02
1.03E+01
1.31E+02
8.85E+01
8.10E+01
PASS
1.08E+02
1.06E+01
1.30E+02
8.64E+01
8.10E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
232
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
1.40E+02
Channel Separation @5V 2:4 (dB)
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.114. Plot of Channel Separation @5V 2:4 (dB) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias and the black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
233
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.114. Raw data for Channel Separation @5V 2:4 (dB) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Channel Separation @5V 2:4 (dB)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
1.01E+02
1.39E+02
1.03E+02
1.02E+02
1.04E+02
1.13E+02
1.01E+02
1.27E+02
1.03E+02
1.17E+02
1.34E+02
1.08E+02
10
1.07E+02
1.01E+02
1.17E+02
9.38E+01
1.07E+02
1.13E+02
1.26E+02
1.02E+02
1.14E+02
1.04E+02
1.11E+02
1.01E+02
20
1.19E+02
1.02E+02
1.02E+02
1.34E+02
9.84E+01
1.13E+02
1.05E+02
1.15E+02
9.71E+01
1.12E+02
9.95E+01
1.07E+02
30
1.06E+02
1.11E+02
9.83E+01
1.04E+02
9.85E+01
1.42E+02
1.43E+02
1.20E+02
1.07E+02
1.10E+02
1.14E+02
1.29E+02
40
1.19E+02
1.24E+02
1.29E+02
1.07E+02
9.80E+01
1.34E+02
1.06E+02
1.02E+02
1.24E+02
1.06E+02
9.72E+01
1.05E+02
50
1.17E+02
1.16E+02
1.15E+02
1.01E+02
1.12E+02
1.15E+02
1.10E+02
1.09E+02
9.29E+01
1.07E+02
9.86E+01
1.03E+02
60
1.02E+02
1.01E+02
1.06E+02
1.02E+02
1.10E+02
9.89E+01
1.07E+02
1.07E+02
9.68E+01
9.98E+01
1.09E+02
1.08E+02
70
1.01E+02
1.12E+02
1.10E+02
1.01E+02
1.20E+02
1.09E+02
9.83E+01
9.80E+01
1.00E+02
1.11E+02
1.11E+02
9.68E+01
75
9.33E+01
1.13E+02
1.01E+02
1.00E+02
9.94E+01
1.18E+02
1.24E+02
1.06E+02
1.11E+02
1.15E+02
1.07E+02
9.76E+01
100
1.07E+02
9.64E+01
1.00E+02
9.68E+01
9.86E+01
1.02E+02
1.12E+02
1.24E+02
1.04E+02
1.06E+02
9.93E+01
1.12E+02
200
1.30E+02
9.87E+01
1.21E+02
1.22E+02
1.27E+02
1.04E+02
1.07E+02
9.99E+01
9.86E+01
1.26E+02
1.00E+02
1.11E+02
1.11E+02
1.31E+01
1.38E+02
8.40E+01
8.10E+01
PASS
1.08E+02
9.30E+00
1.28E+02
8.92E+01
8.10E+01
PASS
1.10E+02
1.13E+01
1.33E+02
8.63E+01
8.10E+01
PASS
1.14E+02
1.64E+01
1.48E+02
8.00E+01
8.10E+01
PASS
1.15E+02
1.25E+01
1.41E+02
8.89E+01
8.10E+01
PASS
1.09E+02
7.69E+00
1.25E+02
9.36E+01
8.10E+01
PASS
1.03E+02
4.21E+00
1.12E+02
9.43E+01
8.10E+01
PASS
1.06E+02
7.42E+00
1.21E+02
9.07E+01
8.10E+01
PASS
1.08E+02
9.59E+00
1.28E+02
8.82E+01
8.10E+01
PASS
1.05E+02
8.38E+00
1.22E+02
8.75E+01
8.10E+01
PASS
1.13E+02
1.30E+01
1.40E+02
8.67E+01
8.10E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
234
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
1.40E+02
Channel Separation @5V 3:1 (dB)
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.115. Plot of Channel Separation @5V 3:1 (dB) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias and the black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
235
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.115. Raw data for Channel Separation @5V 3:1 (dB) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Channel Separation @5V 3:1 (dB)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
1.09E+02
1.14E+02
1.24E+02
1.18E+02
1.39E+02
1.15E+02
1.11E+02
1.10E+02
1.06E+02
1.01E+02
1.05E+02
9.59E+01
10
1.07E+02
1.14E+02
1.10E+02
1.12E+02
1.04E+02
1.03E+02
1.03E+02
1.28E+02
9.92E+01
1.19E+02
9.56E+01
1.01E+02
20
1.14E+02
1.03E+02
9.47E+01
1.07E+02
9.96E+01
9.92E+01
1.20E+02
9.69E+01
1.00E+02
1.05E+02
1.07E+02
1.04E+02
30
9.93E+01
9.82E+01
9.66E+01
1.05E+02
1.27E+02
1.06E+02
1.02E+02
1.00E+02
1.07E+02
1.22E+02
1.13E+02
1.02E+02
40
9.91E+01
1.01E+02
1.12E+02
1.18E+02
9.39E+01
1.29E+02
9.69E+01
1.16E+02
9.63E+01
1.03E+02
9.86E+01
1.08E+02
50
1.02E+02
1.16E+02
1.02E+02
1.13E+02
1.10E+02
1.00E+02
1.07E+02
1.04E+02
1.10E+02
1.02E+02
1.08E+02
1.11E+02
60
9.70E+01
1.34E+02
1.20E+02
9.37E+01
1.04E+02
1.06E+02
9.84E+01
1.04E+02
1.12E+02
1.28E+02
1.00E+02
1.14E+02
70
1.04E+02
9.66E+01
1.02E+02
1.09E+02
1.04E+02
1.03E+02
1.09E+02
1.07E+02
1.06E+02
1.03E+02
9.70E+01
1.06E+02
75
1.02E+02
1.10E+02
1.01E+02
9.45E+01
1.02E+02
9.78E+01
9.61E+01
1.06E+02
1.03E+02
1.12E+02
9.92E+01
1.09E+02
100
1.31E+02
1.16E+02
1.00E+02
1.04E+02
9.95E+01
1.01E+02
1.08E+02
1.17E+02
1.03E+02
1.17E+02
1.05E+02
1.10E+02
200
1.34E+02
9.53E+01
1.09E+02
9.92E+01
9.38E+01
9.33E+01
1.01E+02
9.99E+01
9.79E+01
1.15E+02
9.76E+01
1.01E+02
1.15E+02
1.08E+01
1.37E+02
9.22E+01
8.10E+01
PASS
1.10E+02
8.75E+00
1.28E+02
9.18E+01
8.10E+01
PASS
1.04E+02
7.82E+00
1.20E+02
8.77E+01
8.10E+01
PASS
1.06E+02
1.04E+01
1.28E+02
8.49E+01
8.10E+01
PASS
1.06E+02
1.15E+01
1.30E+02
8.26E+01
8.10E+01
PASS
1.07E+02
5.52E+00
1.18E+02
9.53E+01
8.10E+01
PASS
1.10E+02
1.36E+01
1.38E+02
8.16E+01
8.10E+01
PASS
1.04E+02
3.64E+00
1.12E+02
9.68E+01
8.10E+01
PASS
1.02E+02
5.72E+00
1.14E+02
9.06E+01
8.10E+01
PASS
1.10E+02
1.03E+01
1.31E+02
8.83E+01
8.10E+01
PASS
1.04E+02
1.26E+01
1.30E+02
7.77E+01
8.10E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
236
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Channel Separation @5V 3:2 (dB)
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.116. Plot of Channel Separation @5V 3:2 (dB) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias and the black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
237
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.116. Raw data for Channel Separation @5V 3:2 (dB) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Channel Separation @5V 3:2 (dB)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
1.07E+02
1.14E+02
9.98E+01
1.17E+02
1.03E+02
1.04E+02
1.02E+02
9.87E+01
1.03E+02
1.08E+02
1.02E+02
9.99E+01
10
1.01E+02
1.07E+02
1.03E+02
1.13E+02
1.09E+02
1.16E+02
1.09E+02
1.04E+02
1.13E+02
1.21E+02
1.11E+02
1.00E+02
20
9.81E+01
1.12E+02
1.09E+02
1.02E+02
1.10E+02
1.09E+02
1.06E+02
1.01E+02
1.08E+02
1.20E+02
1.01E+02
1.11E+02
30
1.20E+02
1.03E+02
1.04E+02
1.10E+02
1.08E+02
1.00E+02
1.08E+02
1.01E+02
1.09E+02
1.01E+02
1.14E+02
1.25E+02
40
9.95E+01
9.42E+01
9.76E+01
1.14E+02
1.04E+02
9.83E+01
1.09E+02
1.22E+02
1.01E+02
1.06E+02
1.05E+02
9.70E+01
50
1.07E+02
1.16E+02
1.09E+02
1.36E+02
1.15E+02
1.05E+02
1.02E+02
1.37E+02
9.98E+01
1.04E+02
1.03E+02
1.15E+02
60
9.41E+01
1.02E+02
1.11E+02
1.03E+02
1.01E+02
1.12E+02
9.52E+01
1.06E+02
9.21E+01
1.02E+02
1.07E+02
1.03E+02
70
1.03E+02
1.07E+02
9.50E+01
1.21E+02
1.08E+02
1.07E+02
1.10E+02
1.01E+02
9.98E+01
1.02E+02
9.55E+01
1.10E+02
75
1.06E+02
1.05E+02
1.01E+02
1.14E+02
1.02E+02
1.13E+02
1.11E+02
1.02E+02
9.66E+01
9.85E+01
1.15E+02
9.83E+01
100
1.22E+02
1.19E+02
1.09E+02
1.10E+02
1.11E+02
1.08E+02
1.30E+02
9.63E+01
1.11E+02
1.19E+02
1.04E+02
1.16E+02
200
1.02E+02
1.03E+02
1.28E+02
1.42E+02
1.12E+02
1.04E+02
1.11E+02
1.00E+02
1.06E+02
1.18E+02
1.04E+02
1.07E+02
1.06E+02
5.90E+00
1.18E+02
9.35E+01
8.10E+01
PASS
1.10E+02
6.25E+00
1.23E+02
9.67E+01
8.10E+01
PASS
1.07E+02
6.10E+00
1.20E+02
9.47E+01
8.10E+01
PASS
1.06E+02
6.10E+00
1.19E+02
9.38E+01
8.10E+01
PASS
1.05E+02
8.42E+00
1.22E+02
8.71E+01
8.10E+01
PASS
1.13E+02
1.34E+01
1.41E+02
8.55E+01
8.10E+01
PASS
1.02E+02
6.80E+00
1.16E+02
8.78E+01
8.10E+01
PASS
1.05E+02
7.06E+00
1.20E+02
9.08E+01
8.10E+01
PASS
1.05E+02
6.10E+00
1.17E+02
9.22E+01
8.10E+01
PASS
1.13E+02
9.28E+00
1.32E+02
9.41E+01
8.10E+01
PASS
1.13E+02
1.33E+01
1.40E+02
8.50E+01
8.10E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
238
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
1.40E+02
Channel Separation @5V 3:4 (dB)
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.117. Plot of Channel Separation @5V 3:4 (dB) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias and the black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
239
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.117. Raw data for Channel Separation @5V 3:4 (dB) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Channel Separation @5V 3:4 (dB)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
1.16E+02
9.82E+01
1.15E+02
1.14E+02
1.09E+02
1.08E+02
9.80E+01
1.02E+02
1.05E+02
1.00E+02
1.06E+02
1.15E+02
10
1.02E+02
1.18E+02
1.01E+02
1.10E+02
1.02E+02
1.07E+02
1.02E+02
1.13E+02
1.18E+02
1.07E+02
1.06E+02
9.55E+01
20
1.13E+02
1.25E+02
9.89E+01
1.19E+02
1.06E+02
9.79E+01
1.06E+02
1.02E+02
1.04E+02
1.13E+02
1.23E+02
1.02E+02
30
1.15E+02
1.04E+02
9.93E+01
1.27E+02
1.06E+02
1.21E+02
1.10E+02
9.67E+01
1.05E+02
1.08E+02
9.27E+01
1.23E+02
40
1.58E+02
1.23E+02
1.14E+02
1.01E+02
1.49E+02
1.20E+02
1.06E+02
1.16E+02
1.09E+02
1.14E+02
1.04E+02
1.05E+02
50
1.15E+02
9.91E+01
1.11E+02
1.04E+02
1.02E+02
1.09E+02
1.13E+02
9.90E+01
1.06E+02
1.08E+02
9.43E+01
1.17E+02
60
1.20E+02
1.02E+02
1.31E+02
9.97E+01
1.18E+02
1.09E+02
1.31E+02
1.38E+02
9.42E+01
1.42E+02
1.15E+02
1.12E+02
70
9.82E+01
1.10E+02
1.04E+02
9.97E+01
1.16E+02
1.01E+02
1.07E+02
1.01E+02
1.03E+02
1.07E+02
1.06E+02
9.90E+01
75
1.02E+02
1.05E+02
1.13E+02
9.87E+01
1.01E+02
1.06E+02
1.13E+02
9.65E+01
1.05E+02
9.70E+01
1.13E+02
1.34E+02
100
9.75E+01
1.37E+02
1.02E+02
1.01E+02
1.26E+02
1.03E+02
9.96E+01
1.25E+02
1.04E+02
1.03E+02
1.35E+02
1.03E+02
200
1.10E+02
9.34E+01
1.31E+02
9.50E+01
1.01E+02
1.13E+02
1.03E+02
1.14E+02
1.11E+02
1.06E+02
9.88E+01
1.17E+02
1.06E+02
6.93E+00
1.21E+02
9.21E+01
8.10E+01
PASS
1.08E+02
6.63E+00
1.22E+02
9.43E+01
8.10E+01
PASS
1.08E+02
8.69E+00
1.26E+02
9.05E+01
8.10E+01
PASS
1.09E+02
9.49E+00
1.29E+02
8.96E+01
8.10E+01
PASS
1.21E+02
1.84E+01
1.59E+02
8.30E+01
8.10E+01
PASS
1.07E+02
5.54E+00
1.18E+02
9.51E+01
8.10E+01
PASS
1.19E+02
1.69E+01
1.53E+02
8.37E+01
8.10E+01
PASS
1.05E+02
5.43E+00
1.16E+02
9.35E+01
8.10E+01
PASS
1.04E+02
5.83E+00
1.16E+02
9.17E+01
8.10E+01
PASS
1.10E+02
1.38E+01
1.38E+02
8.11E+01
8.10E+01
PASS
1.08E+02
1.08E+01
1.30E+02
8.53E+01
8.10E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
240
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Channel Separation @5V 4:1 (dB)
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.118. Plot of Channel Separation @5V 4:1 (dB) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias and the black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
241
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.118. Raw data for Channel Separation @5V 4:1 (dB) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Channel Separation @5V 4:1 (dB)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
1.05E+02
9.88E+01
1.01E+02
1.09E+02
1.13E+02
1.28E+02
1.02E+02
1.01E+02
1.05E+02
9.96E+01
1.02E+02
1.09E+02
10
9.84E+01
1.12E+02
1.09E+02
1.07E+02
1.10E+02
9.92E+01
1.02E+02
1.04E+02
1.11E+02
1.03E+02
1.12E+02
1.09E+02
20
1.10E+02
1.01E+02
1.02E+02
1.05E+02
1.15E+02
1.08E+02
1.14E+02
1.05E+02
1.32E+02
9.37E+01
1.19E+02
1.24E+02
30
9.83E+01
9.99E+01
1.10E+02
1.17E+02
1.03E+02
1.05E+02
1.13E+02
1.20E+02
1.06E+02
1.07E+02
1.17E+02
1.07E+02
40
1.09E+02
1.03E+02
1.15E+02
9.69E+01
1.22E+02
9.71E+01
1.07E+02
1.07E+02
1.06E+02
9.81E+01
1.01E+02
1.14E+02
50
1.06E+02
1.03E+02
1.00E+02
1.19E+02
1.13E+02
1.12E+02
1.01E+02
9.63E+01
1.07E+02
1.05E+02
1.29E+02
1.12E+02
60
1.02E+02
9.91E+01
1.06E+02
1.13E+02
9.64E+01
1.12E+02
9.79E+01
1.16E+02
9.90E+01
9.06E+01
1.02E+02
1.13E+02
70
1.11E+02
1.02E+02
9.92E+01
1.06E+02
1.10E+02
1.04E+02
1.08E+02
1.09E+02
1.00E+02
1.01E+02
1.24E+02
1.15E+02
75
9.72E+01
1.02E+02
1.15E+02
1.25E+02
1.10E+02
9.31E+01
1.01E+02
1.09E+02
9.55E+01
1.13E+02
9.76E+01
1.22E+02
100
9.78E+01
1.05E+02
9.47E+01
9.85E+01
1.01E+02
1.17E+02
1.03E+02
1.06E+02
1.05E+02
1.06E+02
9.76E+01
1.14E+02
200
1.12E+02
1.14E+02
1.01E+02
1.06E+02
1.01E+02
1.02E+02
1.28E+02
1.01E+02
1.06E+02
1.05E+02
1.15E+02
9.73E+01
1.06E+02
8.86E+00
1.24E+02
8.79E+01
8.10E+01
PASS
1.06E+02
4.97E+00
1.16E+02
9.52E+01
8.10E+01
PASS
1.08E+02
1.02E+01
1.30E+02
8.73E+01
8.10E+01
PASS
1.08E+02
7.09E+00
1.22E+02
9.31E+01
8.10E+01
PASS
1.06E+02
7.97E+00
1.23E+02
8.96E+01
8.10E+01
PASS
1.06E+02
6.77E+00
1.20E+02
9.21E+01
8.10E+01
PASS
1.03E+02
8.22E+00
1.20E+02
8.61E+01
8.10E+01
PASS
1.05E+02
4.39E+00
1.14E+02
9.59E+01
8.10E+01
PASS
1.06E+02
1.00E+01
1.27E+02
8.54E+01
8.10E+01
PASS
1.03E+02
6.16E+00
1.16E+02
9.07E+01
8.10E+01
PASS
1.08E+02
8.47E+00
1.25E+02
9.01E+01
8.10E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
242
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Channel Separation @5V 4:2 (dB)
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.119. Plot of Channel Separation @5V 4:2 (dB) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias and the black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
243
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.119. Raw data for Channel Separation @5V 4:2 (dB) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Channel Separation @5V 4:2 (dB)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
1.06E+02
1.25E+02
1.15E+02
1.02E+02
1.04E+02
1.07E+02
1.00E+02
1.09E+02
1.02E+02
1.07E+02
1.04E+02
1.06E+02
10
1.04E+02
1.03E+02
1.09E+02
1.26E+02
1.20E+02
1.19E+02
1.07E+02
1.02E+02
1.03E+02
1.15E+02
1.00E+02
1.00E+02
20
1.08E+02
1.05E+02
1.16E+02
1.20E+02
1.04E+02
1.06E+02
1.03E+02
1.13E+02
1.24E+02
1.16E+02
1.13E+02
1.17E+02
30
1.03E+02
1.08E+02
1.03E+02
1.03E+02
1.18E+02
9.45E+01
1.01E+02
1.05E+02
1.08E+02
1.09E+02
1.04E+02
1.01E+02
40
1.04E+02
1.08E+02
9.68E+01
1.06E+02
1.23E+02
9.40E+01
1.05E+02
1.18E+02
1.00E+02
1.04E+02
1.05E+02
1.04E+02
50
1.13E+02
1.09E+02
1.43E+02
1.05E+02
1.24E+02
1.07E+02
1.11E+02
1.08E+02
9.98E+01
1.05E+02
1.15E+02
1.20E+02
60
1.67E+02
9.78E+01
1.03E+02
1.22E+02
1.12E+02
9.54E+01
1.04E+02
1.11E+02
1.00E+02
1.05E+02
1.12E+02
1.14E+02
70
1.05E+02
1.13E+02
9.98E+01
1.02E+02
1.01E+02
1.03E+02
1.08E+02
1.14E+02
1.15E+02
9.84E+01
1.05E+02
1.02E+02
75
1.14E+02
9.68E+01
1.10E+02
9.98E+01
1.13E+02
1.26E+02
1.03E+02
1.02E+02
1.12E+02
1.16E+02
1.06E+02
1.16E+02
100
1.04E+02
1.09E+02
1.06E+02
1.01E+02
9.47E+01
9.91E+01
1.13E+02
1.11E+02
1.05E+02
1.06E+02
1.04E+02
9.90E+01
200
9.44E+01
9.98E+01
1.04E+02
1.05E+02
1.08E+02
1.17E+02
1.17E+02
1.11E+02
9.51E+01
1.01E+02
1.01E+02
1.23E+02
1.08E+02
7.40E+00
1.23E+02
9.25E+01
8.10E+01
PASS
1.11E+02
8.65E+00
1.29E+02
9.28E+01
8.10E+01
PASS
1.12E+02
7.24E+00
1.26E+02
9.66E+01
8.10E+01
PASS
1.05E+02
6.17E+00
1.18E+02
9.26E+01
8.10E+01
PASS
1.06E+02
8.81E+00
1.24E+02
8.75E+01
8.10E+01
PASS
1.12E+02
1.25E+01
1.38E+02
8.66E+01
8.10E+01
PASS
1.12E+02
2.09E+01
1.55E+02
6.86E+01
8.10E+01
PASS
1.06E+02
6.11E+00
1.18E+02
9.33E+01
8.10E+01
PASS
1.09E+02
8.77E+00
1.27E+02
9.11E+01
8.10E+01
PASS
1.05E+02
5.53E+00
1.16E+02
9.34E+01
8.10E+01
PASS
1.05E+02
8.09E+00
1.22E+02
8.86E+01
8.10E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
244
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Channel Separation @5V 4:3 (dB)
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.120. Plot of Channel Separation @5V 4:3 (dB) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias and the black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
245
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.120. Raw data for Channel Separation @5V 4:3 (dB) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Channel Separation @5V 4:3 (dB)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
1.10E+02
1.19E+02
1.26E+02
9.75E+01
1.09E+02
1.00E+02
1.24E+02
1.22E+02
1.11E+02
1.05E+02
1.27E+02
1.35E+02
10
1.08E+02
1.25E+02
9.97E+01
1.04E+02
1.03E+02
1.33E+02
1.01E+02
9.88E+01
1.03E+02
9.82E+01
1.09E+02
9.73E+01
20
9.92E+01
1.16E+02
1.01E+02
1.10E+02
1.04E+02
1.23E+02
9.74E+01
1.03E+02
1.05E+02
1.04E+02
1.17E+02
1.29E+02
30
1.05E+02
1.09E+02
1.04E+02
1.09E+02
1.41E+02
9.77E+01
1.09E+02
1.01E+02
1.38E+02
1.08E+02
1.15E+02
1.03E+02
40
9.91E+01
9.71E+01
1.07E+02
9.88E+01
1.03E+02
1.03E+02
1.08E+02
1.06E+02
1.17E+02
1.04E+02
1.15E+02
1.04E+02
50
1.07E+02
1.01E+02
1.03E+02
9.77E+01
1.13E+02
1.03E+02
1.03E+02
1.08E+02
1.10E+02
1.13E+02
1.20E+02
1.41E+02
60
1.07E+02
1.00E+02
1.08E+02
9.42E+01
1.08E+02
1.01E+02
1.28E+02
1.15E+02
1.13E+02
9.33E+01
1.08E+02
9.83E+01
70
1.13E+02
1.05E+02
1.03E+02
1.18E+02
1.09E+02
1.11E+02
1.02E+02
1.34E+02
1.10E+02
1.12E+02
1.17E+02
1.15E+02
75
1.13E+02
9.66E+01
1.05E+02
1.13E+02
1.07E+02
1.07E+02
9.78E+01
1.15E+02
1.02E+02
1.01E+02
1.02E+02
9.88E+01
100
1.01E+02
1.02E+02
1.04E+02
9.96E+01
8.91E+01
1.09E+02
1.16E+02
1.10E+02
1.08E+02
1.07E+02
1.05E+02
1.02E+02
200
9.89E+01
9.19E+01
1.05E+02
1.46E+02
1.04E+02
1.02E+02
1.12E+02
1.06E+02
1.04E+02
1.29E+02
1.12E+02
1.12E+02
1.12E+02
9.86E+00
1.32E+02
9.17E+01
8.10E+01
PASS
1.07E+02
1.20E+01
1.32E+02
8.25E+01
8.10E+01
PASS
1.06E+02
7.94E+00
1.23E+02
8.98E+01
8.10E+01
PASS
1.12E+02
1.51E+01
1.43E+02
8.11E+01
8.10E+01
PASS
1.04E+02
5.76E+00
1.16E+02
9.24E+01
8.10E+01
PASS
1.06E+02
5.15E+00
1.16E+02
9.52E+01
8.10E+01
PASS
1.07E+02
1.05E+01
1.28E+02
8.51E+01
8.10E+01
PASS
1.12E+02
9.44E+00
1.31E+02
9.20E+01
8.10E+01
PASS
1.06E+02
6.37E+00
1.19E+02
9.25E+01
8.10E+01
PASS
1.04E+02
7.28E+00
1.19E+02
8.94E+01
8.10E+01
PASS
1.10E+02
1.58E+01
1.43E+02
7.72E+01
8.10E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
246
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Output Voltage Swing High @5V RL=500 #1 (V)
4.20E+00
4.10E+00
4.00E+00
3.90E+00
3.80E+00
3.70E+00
3.60E+00
3.50E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.121. Plot of Output Voltage Swing High @5V RL=500 #1 (V) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
247
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.121. Raw data for Output Voltage Swing High @5V RL=500 #1 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High @5V RL=500 #1 (V)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
4.11E+00
4.11E+00
4.12E+00
4.12E+00
4.11E+00
4.11E+00
4.11E+00
4.12E+00
4.11E+00
4.11E+00
4.11E+00
4.12E+00
10
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.10E+00
4.11E+00
4.11E+00
20
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.10E+00
4.11E+00
4.11E+00
30
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
40
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
50
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
60
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
70
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
75
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
100
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.10E+00
4.10E+00
4.11E+00
4.11E+00
4.10E+00
4.11E+00
4.11E+00
200
4.10E+00
4.10E+00
4.10E+00
4.10E+00
4.10E+00
4.10E+00
4.10E+00
4.10E+00
4.10E+00
4.10E+00
4.11E+00
4.11E+00
4.11E+00
2.85E-03
4.12E+00
4.11E+00
3.90E+00
PASS
4.11E+00
3.35E-03
4.11E+00
4.10E+00
3.90E+00
PASS
4.11E+00
3.34E-03
4.11E+00
4.10E+00
3.90E+00
PASS
4.11E+00
3.14E-03
4.11E+00
4.10E+00
3.90E+00
PASS
4.11E+00
2.69E-03
4.11E+00
4.10E+00
3.90E+00
PASS
4.11E+00
2.46E-03
4.11E+00
4.10E+00
3.80E+00
PASS
4.11E+00
2.55E-03
4.11E+00
4.10E+00
3.80E+00
PASS
4.11E+00
2.25E-03
4.11E+00
4.10E+00
3.80E+00
PASS
4.11E+00
2.62E-03
4.11E+00
4.10E+00
3.80E+00
PASS
4.11E+00
2.22E-03
4.11E+00
4.10E+00
3.70E+00
PASS
4.10E+00
2.08E-03
4.10E+00
4.09E+00
3.60E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
248
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Output Voltage Swing High @5V RL=500 #2 (V)
4.20E+00
4.10E+00
4.00E+00
3.90E+00
3.80E+00
3.70E+00
3.60E+00
3.50E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.122. Plot of Output Voltage Swing High @5V RL=500 #2 (V) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
249
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.122. Raw data for Output Voltage Swing High @5V RL=500 #2 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High @5V RL=500 #2 (V)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
10
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.10E+00
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
20
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.10E+00
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
30
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
40
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
50
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
60
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
70
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
75
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
100
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.10E+00
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
200
4.09E+00
4.10E+00
4.10E+00
4.11E+00
4.10E+00
4.10E+00
4.10E+00
4.10E+00
4.10E+00
4.10E+00
4.11E+00
4.11E+00
4.11E+00
2.69E-03
4.12E+00
4.11E+00
3.90E+00
PASS
4.11E+00
3.14E-03
4.11E+00
4.10E+00
3.90E+00
PASS
4.11E+00
3.41E-03
4.11E+00
4.10E+00
3.90E+00
PASS
4.11E+00
3.24E-03
4.11E+00
4.10E+00
3.90E+00
PASS
4.11E+00
3.03E-03
4.11E+00
4.10E+00
3.90E+00
PASS
4.11E+00
2.91E-03
4.11E+00
4.10E+00
3.80E+00
PASS
4.11E+00
2.78E-03
4.11E+00
4.10E+00
3.80E+00
PASS
4.11E+00
2.88E-03
4.11E+00
4.10E+00
3.80E+00
PASS
4.11E+00
2.98E-03
4.11E+00
4.10E+00
3.80E+00
PASS
4.11E+00
2.78E-03
4.11E+00
4.10E+00
3.70E+00
PASS
4.10E+00
2.82E-03
4.11E+00
4.09E+00
3.60E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
250
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Output Voltage Swing High @5V RL=500 #3 (V)
4.20E+00
4.10E+00
4.00E+00
3.90E+00
3.80E+00
3.70E+00
3.60E+00
3.50E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.123. Plot of Output Voltage Swing High @5V RL=500 #3 (V) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
251
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.123. Raw data for Output Voltage Swing High @5V RL=500 #3 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High @5V RL=500 #3 (V)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
4.11E+00
4.11E+00
4.11E+00
4.12E+00
4.11E+00
4.11E+00
4.12E+00
4.11E+00
4.12E+00
4.12E+00
4.11E+00
4.11E+00
10
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
20
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
30
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
40
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
50
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
60
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
70
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
75
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
100
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
200
4.10E+00
4.10E+00
4.10E+00
4.10E+00
4.10E+00
4.10E+00
4.10E+00
4.10E+00
4.10E+00
4.10E+00
4.11E+00
4.11E+00
4.11E+00
2.41E-03
4.12E+00
4.11E+00
3.90E+00
PASS
4.11E+00
3.33E-03
4.12E+00
4.10E+00
3.90E+00
PASS
4.11E+00
3.07E-03
4.11E+00
4.10E+00
3.90E+00
PASS
4.11E+00
3.03E-03
4.11E+00
4.10E+00
3.90E+00
PASS
4.11E+00
2.86E-03
4.11E+00
4.10E+00
3.90E+00
PASS
4.11E+00
2.91E-03
4.11E+00
4.10E+00
3.80E+00
PASS
4.11E+00
2.69E-03
4.11E+00
4.10E+00
3.80E+00
PASS
4.11E+00
2.41E-03
4.11E+00
4.10E+00
3.80E+00
PASS
4.11E+00
2.40E-03
4.11E+00
4.10E+00
3.80E+00
PASS
4.11E+00
2.41E-03
4.11E+00
4.10E+00
3.70E+00
PASS
4.10E+00
2.46E-03
4.10E+00
4.09E+00
3.60E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
252
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Output Voltage Swing High @5V RL=500 #4 (V)
4.20E+00
4.10E+00
4.00E+00
3.90E+00
3.80E+00
3.70E+00
3.60E+00
3.50E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.124. Plot of Output Voltage Swing High @5V RL=500 #4 (V) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
253
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.124. Raw data for Output Voltage Swing High @5V RL=500 #4 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High @5V RL=500 #4 (V)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.12E+00
4.11E+00
4.11E+00
4.11E+00
4.12E+00
10
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.10E+00
4.11E+00
4.11E+00
20
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.10E+00
4.11E+00
4.11E+00
30
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.10E+00
4.11E+00
4.11E+00
40
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.10E+00
4.11E+00
4.11E+00
50
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.10E+00
4.11E+00
4.11E+00
60
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.10E+00
4.11E+00
4.11E+00
70
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.10E+00
4.11E+00
4.11E+00
75
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.10E+00
4.11E+00
4.11E+00
100
4.10E+00
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.10E+00
4.11E+00
4.11E+00
200
4.10E+00
4.10E+00
4.10E+00
4.10E+00
4.10E+00
4.10E+00
4.10E+00
4.10E+00
4.10E+00
4.10E+00
4.11E+00
4.11E+00
4.11E+00
2.49E-03
4.12E+00
4.11E+00
3.90E+00
PASS
4.11E+00
2.88E-03
4.11E+00
4.10E+00
3.90E+00
PASS
4.11E+00
3.12E-03
4.11E+00
4.10E+00
3.90E+00
PASS
4.11E+00
3.16E-03
4.11E+00
4.10E+00
3.90E+00
PASS
4.11E+00
2.99E-03
4.11E+00
4.10E+00
3.90E+00
PASS
4.11E+00
2.62E-03
4.11E+00
4.10E+00
3.80E+00
PASS
4.11E+00
2.69E-03
4.11E+00
4.10E+00
3.80E+00
PASS
4.11E+00
2.45E-03
4.11E+00
4.10E+00
3.80E+00
PASS
4.11E+00
2.40E-03
4.11E+00
4.10E+00
3.80E+00
PASS
4.11E+00
2.54E-03
4.11E+00
4.10E+00
3.70E+00
PASS
4.10E+00
2.91E-03
4.10E+00
4.09E+00
3.60E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
254
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Output Voltage Swing High @5V RL=100 #1 (V)
4.00E+00
3.90E+00
3.80E+00
3.70E+00
3.60E+00
3.50E+00
3.40E+00
3.30E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.125. Plot of Output Voltage Swing High @5V RL=100 #1 (V) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
255
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.125. Raw data for Output Voltage Swing High @5V RL=100 #1 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High @5V RL=100 #1 (V)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
3.93E+00
3.93E+00
3.94E+00
3.93E+00
3.94E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
10
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
20
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.92E+00
3.93E+00
3.93E+00
30
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
40
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.92E+00
3.93E+00
3.93E+00
50
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.92E+00
3.93E+00
3.93E+00
3.92E+00
3.93E+00
3.93E+00
60
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.92E+00
3.93E+00
3.93E+00
3.92E+00
3.93E+00
3.93E+00
70
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.92E+00
3.93E+00
3.93E+00
3.92E+00
3.93E+00
3.93E+00
75
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.92E+00
3.92E+00
3.93E+00
3.93E+00
3.92E+00
3.93E+00
3.93E+00
100
3.92E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.92E+00
3.92E+00
3.93E+00
3.93E+00
3.92E+00
3.93E+00
3.93E+00
200
3.92E+00
3.92E+00
3.92E+00
3.92E+00
3.92E+00
3.92E+00
3.92E+00
3.92E+00
3.92E+00
3.92E+00
3.93E+00
3.93E+00
3.93E+00
2.88E-03
3.94E+00
3.93E+00
3.70E+00
PASS
3.93E+00
2.96E-03
3.93E+00
3.92E+00
3.70E+00
PASS
3.93E+00
3.06E-03
3.93E+00
3.92E+00
3.65E+00
PASS
3.93E+00
3.03E-03
3.93E+00
3.92E+00
3.65E+00
PASS
3.93E+00
2.72E-03
3.93E+00
3.92E+00
3.65E+00
PASS
3.93E+00
2.79E-03
3.93E+00
3.92E+00
3.55E+00
PASS
3.93E+00
2.62E-03
3.93E+00
3.92E+00
3.55E+00
PASS
3.93E+00
2.62E-03
3.93E+00
3.92E+00
3.55E+00
PASS
3.93E+00
2.83E-03
3.93E+00
3.92E+00
3.55E+00
PASS
3.93E+00
2.58E-03
3.93E+00
3.92E+00
3.45E+00
PASS
3.92E+00
2.32E-03
3.93E+00
3.92E+00
3.40E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
256
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Output Voltage Swing High @5V RL=100 #2 (V)
4.00E+00
3.90E+00
3.80E+00
3.70E+00
3.60E+00
3.50E+00
3.40E+00
3.30E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.126. Plot of Output Voltage Swing High @5V RL=100 #2 (V) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
257
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.126. Raw data for Output Voltage Swing High @5V RL=100 #2 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High @5V RL=100 #2 (V)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
3.93E+00
3.93E+00
3.93E+00
3.94E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.94E+00
3.93E+00
3.93E+00
10
3.92E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
20
3.92E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
30
3.92E+00
3.93E+00
3.93E+00
3.94E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
40
3.92E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
50
3.92E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
60
3.92E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
70
3.92E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
75
3.92E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
100
3.92E+00
3.92E+00
3.93E+00
3.93E+00
3.93E+00
3.92E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
200
3.92E+00
3.92E+00
3.92E+00
3.93E+00
3.92E+00
3.92E+00
3.92E+00
3.92E+00
3.92E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
2.84E-03
3.94E+00
3.93E+00
3.70E+00
PASS
3.93E+00
3.14E-03
3.93E+00
3.92E+00
3.70E+00
PASS
3.93E+00
3.24E-03
3.93E+00
3.92E+00
3.65E+00
PASS
3.93E+00
3.51E-03
3.94E+00
3.92E+00
3.65E+00
PASS
3.93E+00
3.39E-03
3.93E+00
3.92E+00
3.65E+00
PASS
3.93E+00
3.13E-03
3.93E+00
3.92E+00
3.55E+00
PASS
3.93E+00
3.03E-03
3.93E+00
3.92E+00
3.55E+00
PASS
3.93E+00
3.25E-03
3.93E+00
3.92E+00
3.55E+00
PASS
3.93E+00
3.19E-03
3.93E+00
3.92E+00
3.55E+00
PASS
3.93E+00
3.30E-03
3.93E+00
3.92E+00
3.45E+00
PASS
3.92E+00
3.28E-03
3.93E+00
3.91E+00
3.40E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
258
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Output Voltage Swing High @5V RL=100 #3 (V)
4.00E+00
3.90E+00
3.80E+00
3.70E+00
3.60E+00
3.50E+00
3.40E+00
3.30E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.127. Plot of Output Voltage Swing High @5V RL=100 #3 (V) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
259
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.127. Raw data for Output Voltage Swing High @5V RL=100 #3 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High @5V RL=100 #3 (V)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
3.93E+00
3.93E+00
3.93E+00
3.94E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.94E+00
3.93E+00
3.93E+00
10
3.92E+00
3.93E+00
3.93E+00
3.94E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.94E+00
3.93E+00
3.93E+00
20
3.92E+00
3.93E+00
3.93E+00
3.94E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
30
3.92E+00
3.93E+00
3.93E+00
3.94E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
40
3.92E+00
3.93E+00
3.93E+00
3.94E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
50
3.92E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
60
3.92E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
70
3.92E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
75
3.92E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
100
3.92E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.92E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
200
3.92E+00
3.92E+00
3.92E+00
3.93E+00
3.92E+00
3.92E+00
3.92E+00
3.92E+00
3.92E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.53E-03
3.94E+00
3.93E+00
3.70E+00
PASS
3.93E+00
3.68E-03
3.94E+00
3.92E+00
3.70E+00
PASS
3.93E+00
3.77E-03
3.94E+00
3.92E+00
3.65E+00
PASS
3.93E+00
3.57E-03
3.94E+00
3.92E+00
3.65E+00
PASS
3.93E+00
3.41E-03
3.94E+00
3.92E+00
3.65E+00
PASS
3.93E+00
3.27E-03
3.93E+00
3.92E+00
3.55E+00
PASS
3.93E+00
3.11E-03
3.93E+00
3.92E+00
3.55E+00
PASS
3.93E+00
3.35E-03
3.93E+00
3.92E+00
3.55E+00
PASS
3.93E+00
3.02E-03
3.93E+00
3.92E+00
3.55E+00
PASS
3.93E+00
3.03E-03
3.93E+00
3.92E+00
3.45E+00
PASS
3.92E+00
2.81E-03
3.93E+00
3.92E+00
3.40E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
260
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Output Voltage Swing High @5V RL=100 #4 (V)
4.00E+00
3.90E+00
3.80E+00
3.70E+00
3.60E+00
3.50E+00
3.40E+00
3.30E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.128. Plot of Output Voltage Swing High @5V RL=100 #4 (V) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
261
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.128. Raw data for Output Voltage Swing High @5V RL=100 #4 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High @5V RL=100 #4 (V)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
10
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
20
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
30
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
40
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
50
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.92E+00
3.93E+00
3.93E+00
60
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.92E+00
3.93E+00
3.93E+00
70
3.92E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.92E+00
3.93E+00
3.93E+00
3.93E+00
3.92E+00
3.93E+00
3.93E+00
75
3.92E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.92E+00
3.93E+00
3.93E+00
3.93E+00
3.92E+00
3.93E+00
3.93E+00
100
3.92E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.92E+00
3.92E+00
3.93E+00
3.93E+00
3.92E+00
3.93E+00
3.93E+00
200
3.92E+00
3.92E+00
3.92E+00
3.92E+00
3.92E+00
3.92E+00
3.92E+00
3.92E+00
3.92E+00
3.92E+00
3.93E+00
3.93E+00
3.93E+00
1.79E-03
3.93E+00
3.93E+00
3.70E+00
PASS
3.93E+00
1.75E-03
3.93E+00
3.92E+00
3.70E+00
PASS
3.93E+00
2.15E-03
3.93E+00
3.92E+00
3.65E+00
PASS
3.93E+00
1.96E-03
3.93E+00
3.92E+00
3.65E+00
PASS
3.93E+00
2.17E-03
3.93E+00
3.92E+00
3.65E+00
PASS
3.93E+00
2.11E-03
3.93E+00
3.92E+00
3.55E+00
PASS
3.93E+00
2.16E-03
3.93E+00
3.92E+00
3.55E+00
PASS
3.93E+00
2.16E-03
3.93E+00
3.92E+00
3.55E+00
PASS
3.93E+00
2.16E-03
3.93E+00
3.92E+00
3.55E+00
PASS
3.93E+00
2.05E-03
3.93E+00
3.92E+00
3.45E+00
PASS
3.92E+00
2.21E-03
3.92E+00
3.92E+00
3.40E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
262
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
Specification MAX
Output Voltage Swing Low @5V RL=500 #1 (V)
1.40E+00
1.20E+00
1.00E+00
8.00E-01
6.00E-01
4.00E-01
2.00E-01
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.129. Plot of Output Voltage Swing Low @5V RL=500 #1 (V) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
263
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.129. Raw data for Output Voltage Swing Low @5V RL=500 #1 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low @5V RL=500 #1 (V)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MAX
Status
0
8.90E-01
8.90E-01
8.87E-01
8.86E-01
8.86E-01
8.89E-01
8.89E-01
8.86E-01
8.86E-01
8.90E-01
8.87E-01
8.92E-01
10
8.94E-01
8.96E-01
8.94E-01
8.90E-01
8.93E-01
8.96E-01
8.95E-01
8.93E-01
8.93E-01
8.96E-01
8.89E-01
8.95E-01
20
8.96E-01
8.99E-01
8.97E-01
8.92E-01
8.95E-01
8.99E-01
8.97E-01
8.96E-01
8.96E-01
8.99E-01
8.89E-01
8.95E-01
30
8.98E-01
9.01E-01
8.98E-01
8.92E-01
8.96E-01
8.99E-01
8.99E-01
8.97E-01
8.98E-01
9.01E-01
8.89E-01
8.94E-01
40
8.99E-01
9.01E-01
9.00E-01
8.94E-01
8.96E-01
9.00E-01
8.99E-01
8.98E-01
8.99E-01
9.02E-01
8.89E-01
8.94E-01
50
8.99E-01
9.02E-01
9.00E-01
8.96E-01
8.96E-01
9.01E-01
9.00E-01
8.99E-01
8.99E-01
9.04E-01
8.89E-01
8.94E-01
60
9.00E-01
9.03E-01
9.01E-01
8.96E-01
8.97E-01
9.01E-01
9.00E-01
9.00E-01
9.00E-01
9.04E-01
8.89E-01
8.94E-01
70
9.00E-01
9.03E-01
9.02E-01
8.98E-01
8.97E-01
9.02E-01
9.00E-01
9.00E-01
9.01E-01
9.06E-01
8.88E-01
8.94E-01
75
9.01E-01
9.04E-01
9.02E-01
8.99E-01
8.97E-01
9.02E-01
9.01E-01
9.00E-01
9.01E-01
9.06E-01
8.89E-01
8.94E-01
100
9.02E-01
9.06E-01
9.05E-01
9.01E-01
8.99E-01
9.03E-01
9.03E-01
9.03E-01
9.04E-01
9.08E-01
8.89E-01
8.94E-01
200
9.04E-01
9.10E-01
9.10E-01
9.07E-01
9.03E-01
9.06E-01
9.06E-01
9.08E-01
9.11E-01
9.13E-01
8.88E-01
8.93E-01
8.88E-01
1.85E-03
8.92E-01
8.84E-01
1.10E+00
PASS
8.94E-01
1.89E-03
8.98E-01
8.90E-01
1.10E+00
PASS
8.97E-01
2.17E-03
9.01E-01
8.92E-01
1.10E+00
PASS
8.98E-01
2.60E-03
9.03E-01
8.93E-01
1.10E+00
PASS
8.99E-01
2.35E-03
9.04E-01
8.94E-01
1.10E+00
PASS
9.00E-01
2.46E-03
9.05E-01
8.95E-01
1.15E+00
PASS
9.00E-01
2.39E-03
9.05E-01
8.95E-01
1.15E+00
PASS
9.01E-01
2.56E-03
9.06E-01
8.96E-01
1.15E+00
PASS
9.01E-01
2.50E-03
9.06E-01
8.96E-01
1.15E+00
PASS
9.03E-01
2.55E-03
9.09E-01
8.98E-01
1.20E+00
PASS
9.08E-01
3.19E-03
9.14E-01
9.01E-01
1.30E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
264
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
Specification MAX
Output Voltage Swing Low @5V RL=500 #2 (V)
1.40E+00
1.20E+00
1.00E+00
8.00E-01
6.00E-01
4.00E-01
2.00E-01
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.130. Plot of Output Voltage Swing Low @5V RL=500 #2 (V) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
265
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.130. Raw data for Output Voltage Swing Low @5V RL=500 #2 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low @5V RL=500 #2 (V)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MAX
Status
0
8.92E-01
8.92E-01
8.88E-01
8.86E-01
8.89E-01
8.90E-01
8.89E-01
8.87E-01
8.92E-01
8.86E-01
8.88E-01
8.92E-01
10
8.97E-01
8.98E-01
8.93E-01
8.89E-01
8.95E-01
8.97E-01
8.96E-01
8.93E-01
8.97E-01
8.92E-01
8.91E-01
8.94E-01
20
9.00E-01
9.00E-01
8.97E-01
8.91E-01
8.97E-01
8.99E-01
8.98E-01
8.97E-01
9.00E-01
8.94E-01
8.91E-01
8.94E-01
30
9.01E-01
9.01E-01
8.98E-01
8.93E-01
8.99E-01
9.02E-01
9.00E-01
8.98E-01
9.00E-01
8.95E-01
8.90E-01
8.94E-01
40
9.01E-01
9.01E-01
8.99E-01
8.94E-01
9.00E-01
9.03E-01
9.01E-01
8.99E-01
9.00E-01
8.96E-01
8.90E-01
8.94E-01
50
9.02E-01
9.02E-01
9.00E-01
8.95E-01
9.01E-01
9.04E-01
9.01E-01
8.99E-01
9.01E-01
8.97E-01
8.90E-01
8.94E-01
60
9.02E-01
9.02E-01
9.00E-01
8.97E-01
9.02E-01
9.04E-01
9.02E-01
9.00E-01
9.00E-01
8.97E-01
8.90E-01
8.93E-01
70
9.03E-01
9.03E-01
9.01E-01
8.98E-01
9.03E-01
9.05E-01
9.02E-01
9.01E-01
9.01E-01
8.97E-01
8.90E-01
8.93E-01
75
9.02E-01
9.03E-01
9.01E-01
8.99E-01
9.03E-01
9.06E-01
9.03E-01
9.02E-01
9.02E-01
8.97E-01
8.90E-01
8.94E-01
100
9.04E-01
9.05E-01
9.04E-01
9.02E-01
9.05E-01
9.08E-01
9.05E-01
9.03E-01
9.03E-01
8.98E-01
8.90E-01
8.93E-01
200
9.06E-01
9.12E-01
9.09E-01
9.10E-01
9.11E-01
9.13E-01
9.11E-01
9.10E-01
9.09E-01
9.02E-01
8.90E-01
8.93E-01
8.89E-01
2.38E-03
8.94E-01
8.84E-01
1.10E+00
PASS
8.95E-01
2.87E-03
9.01E-01
8.89E-01
1.10E+00
PASS
8.97E-01
2.91E-03
9.03E-01
8.91E-01
1.10E+00
PASS
8.99E-01
2.83E-03
9.05E-01
8.93E-01
1.10E+00
PASS
8.99E-01
2.63E-03
9.05E-01
8.94E-01
1.10E+00
PASS
9.00E-01
2.62E-03
9.06E-01
8.95E-01
1.15E+00
PASS
9.01E-01
2.27E-03
9.05E-01
8.96E-01
1.15E+00
PASS
9.01E-01
2.41E-03
9.06E-01
8.96E-01
1.15E+00
PASS
9.02E-01
2.44E-03
9.07E-01
8.97E-01
1.15E+00
PASS
9.04E-01
2.58E-03
9.09E-01
8.98E-01
1.20E+00
PASS
9.09E-01
3.20E-03
9.16E-01
9.03E-01
1.30E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
266
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
Specification MAX
Output Voltage Swing Low @5V RL=500 #3 (V)
1.40E+00
1.20E+00
1.00E+00
8.00E-01
6.00E-01
4.00E-01
2.00E-01
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.131. Plot of Output Voltage Swing Low @5V RL=500 #3 (V) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
267
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.131. Raw data for Output Voltage Swing Low @5V RL=500 #3 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low @5V RL=500 #3 (V)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MAX
Status
0
8.92E-01
8.90E-01
8.88E-01
8.85E-01
8.89E-01
8.91E-01
8.86E-01
8.88E-01
8.87E-01
8.85E-01
8.88E-01
8.92E-01
10
8.98E-01
8.97E-01
8.95E-01
8.89E-01
8.96E-01
8.97E-01
8.93E-01
8.94E-01
8.93E-01
8.91E-01
8.90E-01
8.95E-01
20
9.00E-01
9.00E-01
8.98E-01
8.91E-01
8.98E-01
8.99E-01
8.96E-01
8.97E-01
8.96E-01
8.93E-01
8.90E-01
8.94E-01
30
9.00E-01
9.01E-01
8.99E-01
8.92E-01
9.00E-01
9.01E-01
8.97E-01
8.98E-01
8.97E-01
8.95E-01
8.90E-01
8.94E-01
40
9.01E-01
9.01E-01
9.00E-01
8.94E-01
9.00E-01
9.01E-01
8.98E-01
8.98E-01
8.98E-01
8.95E-01
8.90E-01
8.94E-01
50
9.01E-01
9.03E-01
9.02E-01
8.95E-01
9.02E-01
9.02E-01
8.99E-01
8.99E-01
8.98E-01
8.96E-01
8.90E-01
8.94E-01
60
9.01E-01
9.03E-01
9.02E-01
8.96E-01
9.02E-01
9.02E-01
8.99E-01
8.98E-01
8.98E-01
8.96E-01
8.89E-01
8.94E-01
70
9.01E-01
9.04E-01
9.02E-01
8.98E-01
9.03E-01
9.02E-01
8.99E-01
8.98E-01
8.99E-01
8.96E-01
8.89E-01
8.93E-01
75
9.02E-01
9.04E-01
9.03E-01
8.99E-01
9.04E-01
9.03E-01
9.00E-01
8.99E-01
8.99E-01
8.97E-01
8.89E-01
8.93E-01
100
9.04E-01
9.07E-01
9.05E-01
9.02E-01
9.06E-01
9.04E-01
9.01E-01
9.00E-01
9.01E-01
8.98E-01
8.90E-01
8.93E-01
200
9.08E-01
9.12E-01
9.11E-01
9.09E-01
9.12E-01
9.07E-01
9.07E-01
9.02E-01
9.04E-01
9.03E-01
8.89E-01
8.94E-01
8.88E-01
2.42E-03
8.93E-01
8.83E-01
1.10E+00
PASS
8.94E-01
2.87E-03
9.00E-01
8.88E-01
1.10E+00
PASS
8.97E-01
2.94E-03
9.03E-01
8.91E-01
1.10E+00
PASS
8.98E-01
2.87E-03
9.04E-01
8.92E-01
1.10E+00
PASS
8.99E-01
2.50E-03
9.04E-01
8.93E-01
1.10E+00
PASS
9.00E-01
2.75E-03
9.05E-01
8.94E-01
1.15E+00
PASS
9.00E-01
2.63E-03
9.05E-01
8.94E-01
1.15E+00
PASS
9.00E-01
2.57E-03
9.06E-01
8.95E-01
1.15E+00
PASS
9.01E-01
2.49E-03
9.06E-01
8.96E-01
1.15E+00
PASS
9.03E-01
2.86E-03
9.09E-01
8.97E-01
1.20E+00
PASS
9.08E-01
3.63E-03
9.15E-01
9.00E-01
1.30E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
268
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
Specification MAX
Output Voltage Swing Low @5V RL=500 #4 (V)
1.40E+00
1.20E+00
1.00E+00
8.00E-01
6.00E-01
4.00E-01
2.00E-01
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.132. Plot of Output Voltage Swing Low @5V RL=500 #4 (V) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
269
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.132. Raw data for Output Voltage Swing Low @5V RL=500 #4 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low @5V RL=500 #4 (V)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MAX
Status
0
8.94E-01
8.89E-01
8.87E-01
8.85E-01
8.87E-01
8.90E-01
8.90E-01
8.88E-01
8.87E-01
8.92E-01
8.88E-01
8.90E-01
10
8.98E-01
8.95E-01
8.93E-01
8.88E-01
8.92E-01
8.96E-01
8.97E-01
8.95E-01
8.93E-01
8.97E-01
8.90E-01
8.92E-01
20
9.00E-01
8.98E-01
8.96E-01
8.90E-01
8.95E-01
8.98E-01
9.00E-01
8.98E-01
8.96E-01
9.02E-01
8.90E-01
8.92E-01
30
9.02E-01
8.98E-01
8.97E-01
8.90E-01
8.97E-01
8.99E-01
9.01E-01
9.00E-01
8.98E-01
9.04E-01
8.90E-01
8.92E-01
40
9.03E-01
8.99E-01
8.98E-01
8.92E-01
8.98E-01
9.00E-01
9.02E-01
9.01E-01
8.99E-01
9.04E-01
8.90E-01
8.92E-01
50
9.04E-01
9.00E-01
8.98E-01
8.93E-01
8.98E-01
9.01E-01
9.02E-01
9.02E-01
9.00E-01
9.04E-01
8.89E-01
8.91E-01
60
9.04E-01
9.00E-01
8.98E-01
8.94E-01
8.99E-01
9.01E-01
9.03E-01
9.03E-01
9.01E-01
9.06E-01
8.89E-01
8.91E-01
70
9.04E-01
9.01E-01
8.99E-01
8.95E-01
8.99E-01
9.01E-01
9.04E-01
9.04E-01
9.01E-01
9.06E-01
8.89E-01
8.91E-01
75
9.05E-01
9.02E-01
9.00E-01
8.96E-01
9.00E-01
9.02E-01
9.05E-01
9.05E-01
9.01E-01
9.07E-01
8.89E-01
8.91E-01
100
9.06E-01
9.03E-01
9.02E-01
8.99E-01
9.01E-01
9.03E-01
9.06E-01
9.07E-01
9.04E-01
9.09E-01
8.89E-01
8.91E-01
200
9.08E-01
9.06E-01
9.05E-01
9.03E-01
9.07E-01
9.06E-01
9.11E-01
9.16E-01
9.10E-01
9.14E-01
8.89E-01
8.91E-01
8.89E-01
2.69E-03
8.94E-01
8.83E-01
1.10E+00
PASS
8.94E-01
2.99E-03
9.01E-01
8.88E-01
1.10E+00
PASS
8.97E-01
3.33E-03
9.04E-01
8.90E-01
1.10E+00
PASS
8.99E-01
3.78E-03
9.06E-01
8.91E-01
1.10E+00
PASS
9.00E-01
3.37E-03
9.07E-01
8.93E-01
1.10E+00
PASS
9.00E-01
3.29E-03
9.07E-01
8.93E-01
1.15E+00
PASS
9.01E-01
3.41E-03
9.08E-01
8.94E-01
1.15E+00
PASS
9.01E-01
3.24E-03
9.08E-01
8.95E-01
1.15E+00
PASS
9.02E-01
3.27E-03
9.09E-01
8.96E-01
1.15E+00
PASS
9.04E-01
3.02E-03
9.10E-01
8.98E-01
1.20E+00
PASS
9.09E-01
4.12E-03
9.17E-01
9.00E-01
1.30E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
270
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
Specification MAX
Output Voltage Swing Low @5V RL=100 #1 (V)
1.60E+00
1.40E+00
1.20E+00
1.00E+00
8.00E-01
6.00E-01
4.00E-01
2.00E-01
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.133. Plot of Output Voltage Swing Low @5V RL=100 #1 (V) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
271
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.133. Raw data for Output Voltage Swing Low @5V RL=100 #1 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low @5V RL=100 #1 (V)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MAX
Status
0
1.08E+00
1.08E+00
1.07E+00
1.07E+00
1.07E+00
1.08E+00
1.08E+00
1.07E+00
1.07E+00
1.08E+00
1.07E+00
1.08E+00
10
1.08E+00
1.08E+00
1.08E+00
1.07E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
20
1.08E+00
1.08E+00
1.08E+00
1.07E+00
1.08E+00
1.08E+00
1.09E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
30
1.08E+00
1.08E+00
1.08E+00
1.07E+00
1.08E+00
1.08E+00
1.09E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
40
1.08E+00
1.08E+00
1.08E+00
1.07E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
50
1.08E+00
1.08E+00
1.08E+00
1.07E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
60
1.08E+00
1.08E+00
1.08E+00
1.07E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
70
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.09E+00
1.08E+00
1.08E+00
75
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.09E+00
1.08E+00
1.08E+00
100
1.08E+00
1.09E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.09E+00
1.09E+00
1.08E+00
1.09E+00
1.08E+00
1.08E+00
200
1.09E+00
1.09E+00
1.09E+00
1.09E+00
1.08E+00
1.09E+00
1.09E+00
1.09E+00
1.09E+00
1.09E+00
1.07E+00
1.08E+00
1.07E+00
2.45E-03
1.08E+00
1.07E+00
1.30E+00
PASS
1.08E+00
3.47E-03
1.09E+00
1.07E+00
1.30E+00
PASS
1.08E+00
4.14E-03
1.09E+00
1.07E+00
1.35E+00
PASS
1.08E+00
4.17E-03
1.09E+00
1.07E+00
1.35E+00
PASS
1.08E+00
4.02E-03
1.09E+00
1.07E+00
1.35E+00
PASS
1.08E+00
3.60E-03
1.09E+00
1.07E+00
1.40E+00
PASS
1.08E+00
3.47E-03
1.09E+00
1.07E+00
1.40E+00
PASS
1.08E+00
3.20E-03
1.09E+00
1.07E+00
1.40E+00
PASS
1.08E+00
3.37E-03
1.09E+00
1.07E+00
1.40E+00
PASS
1.08E+00
3.27E-03
1.09E+00
1.08E+00
1.45E+00
PASS
1.09E+00
3.52E-03
1.10E+00
1.08E+00
1.50E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
272
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
Specification MAX
Output Voltage Swing Low @5V RL=100 #2 (V)
1.60E+00
1.40E+00
1.20E+00
1.00E+00
8.00E-01
6.00E-01
4.00E-01
2.00E-01
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.134. Plot of Output Voltage Swing Low @5V RL=100 #2 (V) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
273
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.134. Raw data for Output Voltage Swing Low @5V RL=100 #2 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low @5V RL=100 #2 (V)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MAX
Status
0
1.08E+00
1.08E+00
1.07E+00
1.07E+00
1.07E+00
1.08E+00
1.08E+00
1.07E+00
1.08E+00
1.07E+00
1.08E+00
1.08E+00
10
1.09E+00
1.09E+00
1.08E+00
1.07E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.09E+00
1.07E+00
1.08E+00
1.08E+00
20
1.09E+00
1.09E+00
1.08E+00
1.07E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.09E+00
1.08E+00
1.08E+00
1.08E+00
30
1.09E+00
1.08E+00
1.08E+00
1.07E+00
1.08E+00
1.09E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
40
1.09E+00
1.08E+00
1.08E+00
1.07E+00
1.08E+00
1.09E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
50
1.09E+00
1.08E+00
1.08E+00
1.07E+00
1.08E+00
1.09E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
60
1.09E+00
1.08E+00
1.08E+00
1.07E+00
1.08E+00
1.09E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
70
1.09E+00
1.08E+00
1.08E+00
1.07E+00
1.08E+00
1.09E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
75
1.09E+00
1.08E+00
1.08E+00
1.07E+00
1.08E+00
1.09E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
100
1.09E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.09E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
200
1.09E+00
1.09E+00
1.09E+00
1.09E+00
1.09E+00
1.09E+00
1.09E+00
1.09E+00
1.09E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
4.50E-03
1.08E+00
1.07E+00
1.30E+00
PASS
1.08E+00
5.30E-03
1.09E+00
1.07E+00
1.30E+00
PASS
1.08E+00
5.33E-03
1.09E+00
1.07E+00
1.35E+00
PASS
1.08E+00
5.13E-03
1.09E+00
1.07E+00
1.35E+00
PASS
1.08E+00
4.79E-03
1.09E+00
1.07E+00
1.35E+00
PASS
1.08E+00
4.42E-03
1.09E+00
1.07E+00
1.40E+00
PASS
1.08E+00
4.24E-03
1.09E+00
1.07E+00
1.40E+00
PASS
1.08E+00
3.79E-03
1.09E+00
1.07E+00
1.40E+00
PASS
1.08E+00
4.10E-03
1.09E+00
1.07E+00
1.40E+00
PASS
1.08E+00
3.63E-03
1.09E+00
1.07E+00
1.45E+00
PASS
1.09E+00
3.75E-03
1.10E+00
1.08E+00
1.50E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
274
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
Specification MAX
Output Voltage Swing Low @5V RL=100 #3 (V)
1.60E+00
1.40E+00
1.20E+00
1.00E+00
8.00E-01
6.00E-01
4.00E-01
2.00E-01
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.135. Plot of Output Voltage Swing Low @5V RL=100 #3 (V) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
275
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.135. Raw data for Output Voltage Swing Low @5V RL=100 #3 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low @5V RL=100 #3 (V)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MAX
Status
0
1.08E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.08E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.08E+00
10
1.09E+00
1.08E+00
1.08E+00
1.07E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.07E+00
1.08E+00
1.08E+00
20
1.09E+00
1.08E+00
1.08E+00
1.07E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
30
1.09E+00
1.08E+00
1.08E+00
1.07E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
40
1.09E+00
1.08E+00
1.08E+00
1.07E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
50
1.09E+00
1.08E+00
1.08E+00
1.07E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
60
1.09E+00
1.08E+00
1.08E+00
1.07E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.07E+00
1.08E+00
1.08E+00
70
1.09E+00
1.08E+00
1.08E+00
1.07E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.07E+00
1.07E+00
1.08E+00
75
1.09E+00
1.08E+00
1.08E+00
1.07E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.07E+00
1.08E+00
1.08E+00
100
1.09E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
200
1.09E+00
1.09E+00
1.09E+00
1.08E+00
1.09E+00
1.09E+00
1.09E+00
1.08E+00
1.09E+00
1.08E+00
1.07E+00
1.08E+00
1.07E+00
3.77E-03
1.08E+00
1.07E+00
1.30E+00
PASS
1.08E+00
5.28E-03
1.09E+00
1.07E+00
1.30E+00
PASS
1.08E+00
5.42E-03
1.09E+00
1.07E+00
1.35E+00
PASS
1.08E+00
5.52E-03
1.09E+00
1.07E+00
1.35E+00
PASS
1.08E+00
4.80E-03
1.09E+00
1.07E+00
1.35E+00
PASS
1.08E+00
4.48E-03
1.09E+00
1.07E+00
1.40E+00
PASS
1.08E+00
4.21E-03
1.09E+00
1.07E+00
1.40E+00
PASS
1.08E+00
4.01E-03
1.09E+00
1.07E+00
1.40E+00
PASS
1.08E+00
3.89E-03
1.09E+00
1.07E+00
1.40E+00
PASS
1.08E+00
3.98E-03
1.09E+00
1.07E+00
1.45E+00
PASS
1.09E+00
4.01E-03
1.10E+00
1.08E+00
1.50E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
276
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
Specification MAX
Output Voltage Swing Low @5V RL=100 #4 (V)
1.60E+00
1.40E+00
1.20E+00
1.00E+00
8.00E-01
6.00E-01
4.00E-01
2.00E-01
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.136. Plot of Output Voltage Swing Low @5V RL=100 #4 (V) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
277
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.136. Raw data for Output Voltage Swing Low @5V RL=100 #4 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low @5V RL=100 #4 (V)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MAX
Status
0
1.08E+00
1.08E+00
1.07E+00
1.07E+00
1.07E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.07E+00
1.08E+00
10
1.08E+00
1.08E+00
1.08E+00
1.07E+00
1.07E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
20
1.08E+00
1.08E+00
1.08E+00
1.07E+00
1.08E+00
1.08E+00
1.09E+00
1.08E+00
1.08E+00
1.09E+00
1.08E+00
1.08E+00
30
1.08E+00
1.08E+00
1.08E+00
1.07E+00
1.08E+00
1.09E+00
1.09E+00
1.08E+00
1.08E+00
1.09E+00
1.07E+00
1.08E+00
40
1.08E+00
1.08E+00
1.08E+00
1.07E+00
1.08E+00
1.09E+00
1.09E+00
1.08E+00
1.08E+00
1.09E+00
1.08E+00
1.08E+00
50
1.08E+00
1.08E+00
1.08E+00
1.07E+00
1.08E+00
1.09E+00
1.09E+00
1.08E+00
1.08E+00
1.09E+00
1.08E+00
1.08E+00
60
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.09E+00
1.09E+00
1.08E+00
1.08E+00
1.09E+00
1.07E+00
1.08E+00
70
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.09E+00
1.08E+00
1.08E+00
1.09E+00
1.07E+00
1.08E+00
75
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.09E+00
1.09E+00
1.08E+00
1.09E+00
1.08E+00
1.08E+00
100
1.09E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.09E+00
1.09E+00
1.09E+00
1.08E+00
1.09E+00
1.07E+00
1.08E+00
200
1.09E+00
1.09E+00
1.09E+00
1.09E+00
1.09E+00
1.09E+00
1.09E+00
1.09E+00
1.09E+00
1.09E+00
1.07E+00
1.08E+00
1.07E+00
2.54E-03
1.08E+00
1.07E+00
1.30E+00
PASS
1.08E+00
3.63E-03
1.09E+00
1.07E+00
1.30E+00
PASS
1.08E+00
4.31E-03
1.09E+00
1.07E+00
1.35E+00
PASS
1.08E+00
4.43E-03
1.09E+00
1.07E+00
1.35E+00
PASS
1.08E+00
4.24E-03
1.09E+00
1.07E+00
1.35E+00
PASS
1.08E+00
3.86E-03
1.09E+00
1.07E+00
1.40E+00
PASS
1.08E+00
3.60E-03
1.09E+00
1.07E+00
1.40E+00
PASS
1.08E+00
3.47E-03
1.09E+00
1.07E+00
1.40E+00
PASS
1.08E+00
3.45E-03
1.09E+00
1.07E+00
1.40E+00
PASS
1.08E+00
3.49E-03
1.09E+00
1.08E+00
1.45E+00
PASS
1.09E+00
3.48E-03
1.10E+00
1.08E+00
1.50E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
278
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Maximum Output Source Current @5V #1 (A)
4.50E-02
4.00E-02
3.50E-02
3.00E-02
2.50E-02
2.00E-02
1.50E-02
1.00E-02
5.00E-03
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.137. Plot of Maximum Output Source Current @5V #1 (A) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
279
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.137. Raw data for Maximum Output Source Current @5V #1 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Maximum Output Source Current @5V #1 (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
3.93E-02
4.02E-02
4.07E-02
4.09E-02
4.12E-02
3.95E-02
3.94E-02
3.97E-02
3.99E-02
3.94E-02
4.01E-02
4.02E-02
10
3.90E-02
3.98E-02
4.02E-02
4.06E-02
4.09E-02
3.91E-02
3.90E-02
3.94E-02
3.96E-02
3.90E-02
3.99E-02
4.00E-02
20
3.90E-02
3.97E-02
4.02E-02
4.06E-02
4.08E-02
3.91E-02
3.89E-02
3.94E-02
3.95E-02
3.90E-02
3.99E-02
4.00E-02
30
3.90E-02
3.96E-02
4.02E-02
4.06E-02
4.08E-02
3.91E-02
3.89E-02
3.94E-02
3.95E-02
3.90E-02
3.99E-02
4.00E-02
40
3.90E-02
3.96E-02
4.02E-02
4.05E-02
4.08E-02
3.90E-02
3.89E-02
3.94E-02
3.95E-02
3.90E-02
3.99E-02
4.01E-02
50
3.90E-02
3.96E-02
4.02E-02
4.05E-02
4.07E-02
3.90E-02
3.89E-02
3.93E-02
3.95E-02
3.90E-02
3.99E-02
4.01E-02
60
3.90E-02
3.96E-02
4.01E-02
4.04E-02
4.07E-02
3.90E-02
3.88E-02
3.93E-02
3.95E-02
3.90E-02
4.00E-02
4.01E-02
70
3.90E-02
3.95E-02
4.01E-02
4.02E-02
4.06E-02
3.89E-02
3.88E-02
3.92E-02
3.95E-02
3.89E-02
4.00E-02
4.01E-02
75
3.90E-02
3.95E-02
4.01E-02
4.04E-02
4.07E-02
3.89E-02
3.88E-02
3.93E-02
3.95E-02
3.89E-02
4.00E-02
4.01E-02
100
3.89E-02
3.94E-02
4.00E-02
4.01E-02
4.05E-02
3.88E-02
3.87E-02
3.91E-02
3.94E-02
3.88E-02
4.00E-02
4.01E-02
200
3.83E-02
3.88E-02
3.95E-02
3.94E-02
3.98E-02
3.83E-02
3.79E-02
3.86E-02
3.89E-02
3.83E-02
4.00E-02
4.01E-02
4.00E-02
6.99E-04
4.15E-02
3.86E-02
2.50E-02
PASS
3.97E-02
6.97E-04
4.11E-02
3.82E-02
2.50E-02
PASS
3.96E-02
6.97E-04
4.11E-02
3.82E-02
2.50E-02
PASS
3.96E-02
7.01E-04
4.11E-02
3.82E-02
2.50E-02
PASS
3.96E-02
6.86E-04
4.10E-02
3.82E-02
2.50E-02
PASS
3.96E-02
6.60E-04
4.10E-02
3.82E-02
2.50E-02
PASS
3.95E-02
6.67E-04
4.09E-02
3.82E-02
2.50E-02
PASS
3.95E-02
6.36E-04
4.08E-02
3.82E-02
2.50E-02
PASS
3.95E-02
6.71E-04
4.09E-02
3.81E-02
2.50E-02
PASS
3.94E-02
6.36E-04
4.07E-02
3.81E-02
2.50E-02
PASS
3.88E-02
6.19E-04
4.01E-02
3.75E-02
2.50E-02
PASS
An ISO 9001:2008 and DSCC Certified Company
280
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Maximum Output Source Current @5V #2 (A)
4.50E-02
4.00E-02
3.50E-02
3.00E-02
2.50E-02
2.00E-02
1.50E-02
1.00E-02
5.00E-03
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.138. Plot of Maximum Output Source Current @5V #2 (A) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
281
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.138. Raw data for Maximum Output Source Current @5V #2 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Maximum Output Source Current @5V #2 (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
3.91E-02
4.00E-02
3.99E-02
4.13E-02
4.00E-02
3.93E-02
4.00E-02
4.02E-02
4.02E-02
4.11E-02
3.96E-02
3.92E-02
10
3.89E-02
3.96E-02
3.96E-02
4.11E-02
3.98E-02
3.90E-02
3.96E-02
3.99E-02
3.99E-02
4.08E-02
3.94E-02
3.90E-02
20
3.88E-02
3.96E-02
3.95E-02
4.11E-02
3.96E-02
3.90E-02
3.96E-02
3.98E-02
3.98E-02
4.07E-02
3.95E-02
3.90E-02
30
3.88E-02
3.96E-02
3.95E-02
4.11E-02
3.96E-02
3.90E-02
3.95E-02
3.97E-02
3.99E-02
4.07E-02
3.95E-02
3.90E-02
40
3.87E-02
3.95E-02
3.95E-02
4.11E-02
3.96E-02
3.90E-02
3.95E-02
3.98E-02
3.98E-02
4.07E-02
3.95E-02
3.91E-02
50
3.87E-02
3.95E-02
3.95E-02
4.11E-02
3.96E-02
3.90E-02
3.95E-02
3.97E-02
3.98E-02
4.07E-02
3.95E-02
3.90E-02
60
3.87E-02
3.95E-02
3.95E-02
4.10E-02
3.95E-02
3.90E-02
3.95E-02
3.97E-02
3.97E-02
4.06E-02
3.95E-02
3.91E-02
70
3.85E-02
3.95E-02
3.95E-02
4.10E-02
3.95E-02
3.89E-02
3.94E-02
3.96E-02
3.97E-02
4.06E-02
3.95E-02
3.91E-02
75
3.85E-02
3.95E-02
3.95E-02
4.10E-02
3.95E-02
3.89E-02
3.94E-02
3.96E-02
3.98E-02
4.06E-02
3.95E-02
3.92E-02
100
3.84E-02
3.93E-02
3.94E-02
4.08E-02
3.94E-02
3.88E-02
3.93E-02
3.95E-02
3.96E-02
4.04E-02
3.95E-02
3.91E-02
200
3.78E-02
3.88E-02
3.89E-02
4.04E-02
3.89E-02
3.84E-02
3.88E-02
3.90E-02
3.91E-02
3.98E-02
3.95E-02
3.91E-02
4.01E-02
6.83E-04
4.15E-02
3.87E-02
2.50E-02
PASS
3.98E-02
6.72E-04
4.12E-02
3.84E-02
2.50E-02
PASS
3.98E-02
6.92E-04
4.12E-02
3.83E-02
2.50E-02
PASS
3.97E-02
6.95E-04
4.12E-02
3.83E-02
2.50E-02
PASS
3.97E-02
7.17E-04
4.12E-02
3.82E-02
2.50E-02
PASS
3.97E-02
7.14E-04
4.12E-02
3.82E-02
2.50E-02
PASS
3.97E-02
6.76E-04
4.11E-02
3.83E-02
2.50E-02
PASS
3.96E-02
7.10E-04
4.11E-02
3.82E-02
2.50E-02
PASS
3.96E-02
7.13E-04
4.11E-02
3.82E-02
2.50E-02
PASS
3.95E-02
7.01E-04
4.10E-02
3.81E-02
2.50E-02
PASS
3.90E-02
6.92E-04
4.04E-02
3.76E-02
2.50E-02
PASS
An ISO 9001:2008 and DSCC Certified Company
282
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Maximum Output Source Current @5V #3 (A)
4.50E-02
4.00E-02
3.50E-02
3.00E-02
2.50E-02
2.00E-02
1.50E-02
1.00E-02
5.00E-03
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.139. Plot of Maximum Output Source Current @5V #3 (A) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
283
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.139. Raw data for Maximum Output Source Current @5V #3 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Maximum Output Source Current @5V #3 (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
3.91E-02
4.02E-02
4.01E-02
4.18E-02
4.01E-02
3.94E-02
4.02E-02
4.05E-02
4.04E-02
4.13E-02
3.99E-02
3.92E-02
10
3.89E-02
3.99E-02
3.98E-02
4.15E-02
3.98E-02
3.92E-02
3.99E-02
4.00E-02
4.00E-02
4.10E-02
3.96E-02
3.90E-02
20
3.88E-02
3.97E-02
3.97E-02
4.14E-02
3.97E-02
3.92E-02
3.98E-02
4.00E-02
3.99E-02
4.10E-02
3.96E-02
3.90E-02
30
3.88E-02
3.97E-02
3.97E-02
4.14E-02
3.97E-02
3.91E-02
3.97E-02
4.00E-02
3.99E-02
4.08E-02
3.96E-02
3.90E-02
40
3.88E-02
3.98E-02
3.96E-02
4.13E-02
3.96E-02
3.91E-02
3.98E-02
4.00E-02
3.99E-02
4.08E-02
3.96E-02
3.90E-02
50
3.87E-02
3.97E-02
3.96E-02
4.13E-02
3.96E-02
3.91E-02
3.98E-02
4.00E-02
3.99E-02
4.08E-02
3.97E-02
3.90E-02
60
3.87E-02
3.96E-02
3.96E-02
4.12E-02
3.96E-02
3.90E-02
3.97E-02
3.99E-02
3.98E-02
4.07E-02
3.97E-02
3.90E-02
70
3.87E-02
3.96E-02
3.96E-02
4.12E-02
3.96E-02
3.90E-02
3.96E-02
3.99E-02
3.97E-02
4.07E-02
3.97E-02
3.90E-02
75
3.87E-02
3.96E-02
3.95E-02
4.12E-02
3.95E-02
3.90E-02
3.96E-02
3.99E-02
3.98E-02
4.07E-02
3.97E-02
3.91E-02
100
3.85E-02
3.95E-02
3.95E-02
4.10E-02
3.95E-02
3.88E-02
3.95E-02
3.98E-02
3.96E-02
4.05E-02
3.98E-02
3.90E-02
200
3.81E-02
3.89E-02
3.89E-02
4.04E-02
3.90E-02
3.83E-02
3.90E-02
3.92E-02
3.90E-02
3.99E-02
3.98E-02
3.90E-02
4.03E-02
7.76E-04
4.19E-02
3.87E-02
2.50E-02
PASS
4.00E-02
7.47E-04
4.15E-02
3.84E-02
2.50E-02
PASS
3.99E-02
7.78E-04
4.15E-02
3.83E-02
2.50E-02
PASS
3.99E-02
7.63E-04
4.15E-02
3.83E-02
2.50E-02
PASS
3.99E-02
7.41E-04
4.14E-02
3.83E-02
2.50E-02
PASS
3.98E-02
7.71E-04
4.14E-02
3.83E-02
2.50E-02
PASS
3.98E-02
7.40E-04
4.13E-02
3.83E-02
2.50E-02
PASS
3.98E-02
7.36E-04
4.13E-02
3.82E-02
2.50E-02
PASS
3.98E-02
7.40E-04
4.13E-02
3.82E-02
2.50E-02
PASS
3.96E-02
7.08E-04
4.11E-02
3.81E-02
2.50E-02
PASS
3.91E-02
6.68E-04
4.04E-02
3.77E-02
2.50E-02
PASS
An ISO 9001:2008 and DSCC Certified Company
284
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Maximum Output Source Current @5V #4 (A)
4.50E-02
4.00E-02
3.50E-02
3.00E-02
2.50E-02
2.00E-02
1.50E-02
1.00E-02
5.00E-03
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.140. Plot of Maximum Output Source Current @5V #4 (A) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
285
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.140. Raw data for Maximum Output Source Current @5V #4 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Maximum Output Source Current @5V #4 (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
3.95E-02
4.01E-02
4.05E-02
4.06E-02
4.10E-02
3.96E-02
3.95E-02
3.97E-02
4.00E-02
3.95E-02
4.01E-02
4.04E-02
10
3.93E-02
3.98E-02
4.01E-02
4.04E-02
4.07E-02
3.93E-02
3.93E-02
3.95E-02
3.96E-02
3.92E-02
3.99E-02
4.00E-02
20
3.93E-02
3.97E-02
4.01E-02
4.04E-02
4.06E-02
3.92E-02
3.91E-02
3.95E-02
3.96E-02
3.91E-02
3.99E-02
4.01E-02
30
3.92E-02
3.97E-02
4.01E-02
4.03E-02
4.06E-02
3.91E-02
3.91E-02
3.94E-02
3.96E-02
3.91E-02
3.99E-02
4.01E-02
40
3.91E-02
3.96E-02
4.01E-02
4.02E-02
4.06E-02
3.91E-02
3.91E-02
3.94E-02
3.95E-02
3.90E-02
4.00E-02
4.01E-02
50
3.91E-02
3.96E-02
4.01E-02
4.01E-02
4.05E-02
3.90E-02
3.92E-02
3.94E-02
3.95E-02
3.90E-02
4.00E-02
4.01E-02
60
3.91E-02
3.96E-02
4.00E-02
4.01E-02
4.05E-02
3.90E-02
3.90E-02
3.94E-02
3.95E-02
3.90E-02
4.00E-02
4.01E-02
70
3.90E-02
3.95E-02
4.00E-02
4.00E-02
4.04E-02
3.89E-02
3.90E-02
3.94E-02
3.94E-02
3.89E-02
4.00E-02
4.01E-02
75
3.90E-02
3.95E-02
4.00E-02
4.00E-02
4.04E-02
3.89E-02
3.90E-02
3.94E-02
3.94E-02
3.89E-02
4.00E-02
4.01E-02
100
3.89E-02
3.94E-02
3.99E-02
3.98E-02
4.02E-02
3.88E-02
3.89E-02
3.93E-02
3.93E-02
3.88E-02
4.00E-02
4.01E-02
200
3.83E-02
3.88E-02
3.94E-02
3.90E-02
3.96E-02
3.81E-02
3.84E-02
3.89E-02
3.88E-02
3.82E-02
4.00E-02
4.02E-02
4.00E-02
5.17E-04
4.11E-02
3.89E-02
2.50E-02
PASS
3.97E-02
5.30E-04
4.08E-02
3.86E-02
2.50E-02
PASS
3.97E-02
5.31E-04
4.08E-02
3.86E-02
2.50E-02
PASS
3.96E-02
5.42E-04
4.07E-02
3.85E-02
2.50E-02
PASS
3.96E-02
5.44E-04
4.07E-02
3.85E-02
2.50E-02
PASS
3.96E-02
5.22E-04
4.06E-02
3.85E-02
2.50E-02
PASS
3.95E-02
5.26E-04
4.06E-02
3.84E-02
2.50E-02
PASS
3.95E-02
5.20E-04
4.05E-02
3.84E-02
2.50E-02
PASS
3.95E-02
5.14E-04
4.05E-02
3.84E-02
2.50E-02
PASS
3.93E-02
5.10E-04
4.04E-02
3.83E-02
2.50E-02
PASS
3.87E-02
5.18E-04
3.98E-02
3.77E-02
2.50E-02
PASS
An ISO 9001:2008 and DSCC Certified Company
286
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
Specification MAX
Maximum Output Sink Current @5V #1 (A)
0.00E+00
-5.00E-03
-1.00E-02
-1.50E-02
-2.00E-02
-2.50E-02
-3.00E-02
-3.50E-02
-4.00E-02
0
50
100
150
Total Dose (krad(Si))
Figure 5.141. Plot of Maximum Output Sink Current @5V #1 (A) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
287
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.141. Raw data for Maximum Output Sink Current @5V #1 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Maximum Output Sink Current @5V #1 (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MAX
Status
0
-3.59E-02
-3.60E-02
-3.65E-02
-3.68E-02
-3.72E-02
-3.59E-02
-3.57E-02
-3.59E-02
-3.61E-02
-3.59E-02
-3.62E-02
-3.60E-02
10
-3.56E-02
-3.53E-02
-3.59E-02
-3.69E-02
-3.67E-02
-3.51E-02
-3.51E-02
-3.52E-02
-3.54E-02
-3.54E-02
-3.60E-02
-3.59E-02
20
-3.54E-02
-3.50E-02
-3.57E-02
-3.68E-02
-3.65E-02
-3.48E-02
-3.47E-02
-3.49E-02
-3.51E-02
-3.51E-02
-3.60E-02
-3.59E-02
30
-3.52E-02
-3.50E-02
-3.56E-02
-3.68E-02
-3.65E-02
-3.49E-02
-3.46E-02
-3.48E-02
-3.51E-02
-3.50E-02
-3.61E-02
-3.59E-02
40
-3.52E-02
-3.51E-02
-3.57E-02
-3.68E-02
-3.68E-02
-3.50E-02
-3.47E-02
-3.49E-02
-3.51E-02
-3.50E-02
-3.62E-02
-3.59E-02
50
-3.53E-02
-3.53E-02
-3.59E-02
-3.68E-02
-3.69E-02
-3.51E-02
-3.48E-02
-3.51E-02
-3.53E-02
-3.51E-02
-3.63E-02
-3.61E-02
60
-3.53E-02
-3.53E-02
-3.59E-02
-3.66E-02
-3.69E-02
-3.51E-02
-3.48E-02
-3.51E-02
-3.53E-02
-3.51E-02
-3.63E-02
-3.61E-02
70
-3.52E-02
-3.52E-02
-3.58E-02
-3.63E-02
-3.68E-02
-3.50E-02
-3.47E-02
-3.49E-02
-3.52E-02
-3.48E-02
-3.62E-02
-3.60E-02
75
-3.53E-02
-3.53E-02
-3.59E-02
-3.65E-02
-3.69E-02
-3.51E-02
-3.48E-02
-3.50E-02
-3.52E-02
-3.50E-02
-3.63E-02
-3.62E-02
100
-3.51E-02
-3.50E-02
-3.57E-02
-3.60E-02
-3.66E-02
-3.49E-02
-3.46E-02
-3.47E-02
-3.50E-02
-3.46E-02
-3.62E-02
-3.60E-02
200
-3.45E-02
-3.42E-02
-3.50E-02
-3.50E-02
-3.59E-02
-3.42E-02
-3.37E-02
-3.38E-02
-3.41E-02
-3.36E-02
-3.62E-02
-3.60E-02
-3.62E-02
4.71E-04
-3.52E-02
-3.72E-02
-2.50E-02
PASS
-3.56E-02
6.51E-04
-3.43E-02
-3.70E-02
-2.50E-02
PASS
-3.54E-02
7.23E-04
-3.39E-02
-3.69E-02
-2.50E-02
PASS
-3.53E-02
7.46E-04
-3.38E-02
-3.69E-02
-2.50E-02
PASS
-3.54E-02
7.47E-04
-3.39E-02
-3.70E-02
-2.50E-02
PASS
-3.56E-02
7.27E-04
-3.41E-02
-3.71E-02
-2.50E-02
PASS
-3.55E-02
7.02E-04
-3.41E-02
-3.70E-02
-2.50E-02
PASS
-3.54E-02
6.80E-04
-3.40E-02
-3.68E-02
-2.50E-02
PASS
-3.55E-02
7.09E-04
-3.40E-02
-3.70E-02
-2.50E-02
PASS
-3.52E-02
6.83E-04
-3.38E-02
-3.66E-02
-2.50E-02
PASS
-3.44E-02
7.14E-04
-3.29E-02
-3.59E-02
-2.50E-02
PASS
An ISO 9001:2008 and DSCC Certified Company
288
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
Specification MAX
Maximum Output Sink Current @5V #2 (A)
0.00E+00
-5.00E-03
-1.00E-02
-1.50E-02
-2.00E-02
-2.50E-02
-3.00E-02
-3.50E-02
-4.00E-02
0
50
100
150
Total Dose (krad(Si))
Figure 5.142. Plot of Maximum Output Sink Current @5V #2 (A) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
289
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.142. Raw data for Maximum Output Sink Current @5V #2 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Maximum Output Sink Current @5V #2 (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MAX
Status
0
-3.53E-02
-3.53E-02
-3.62E-02
-3.76E-02
-3.64E-02
-3.56E-02
-3.59E-02
-3.62E-02
-3.51E-02
-3.71E-02
-3.58E-02
-3.54E-02
10
-3.46E-02
-3.48E-02
-3.57E-02
-3.76E-02
-3.60E-02
-3.52E-02
-3.53E-02
-3.57E-02
-3.50E-02
-3.68E-02
-3.57E-02
-3.54E-02
20
-3.43E-02
-3.48E-02
-3.53E-02
-3.75E-02
-3.57E-02
-3.51E-02
-3.51E-02
-3.54E-02
-3.50E-02
-3.67E-02
-3.57E-02
-3.54E-02
30
-3.43E-02
-3.50E-02
-3.52E-02
-3.75E-02
-3.56E-02
-3.48E-02
-3.51E-02
-3.54E-02
-3.51E-02
-3.66E-02
-3.58E-02
-3.54E-02
40
-3.44E-02
-3.52E-02
-3.53E-02
-3.74E-02
-3.56E-02
-3.48E-02
-3.51E-02
-3.55E-02
-3.53E-02
-3.66E-02
-3.58E-02
-3.54E-02
50
-3.45E-02
-3.54E-02
-3.54E-02
-3.75E-02
-3.57E-02
-3.50E-02
-3.53E-02
-3.57E-02
-3.55E-02
-3.68E-02
-3.59E-02
-3.56E-02
60
-3.46E-02
-3.54E-02
-3.54E-02
-3.74E-02
-3.57E-02
-3.50E-02
-3.54E-02
-3.58E-02
-3.56E-02
-3.69E-02
-3.59E-02
-3.56E-02
70
-3.45E-02
-3.53E-02
-3.54E-02
-3.71E-02
-3.56E-02
-3.48E-02
-3.53E-02
-3.56E-02
-3.54E-02
-3.68E-02
-3.58E-02
-3.55E-02
75
-3.46E-02
-3.54E-02
-3.55E-02
-3.71E-02
-3.56E-02
-3.48E-02
-3.53E-02
-3.57E-02
-3.56E-02
-3.69E-02
-3.59E-02
-3.56E-02
100
-3.44E-02
-3.52E-02
-3.53E-02
-3.68E-02
-3.54E-02
-3.46E-02
-3.52E-02
-3.56E-02
-3.54E-02
-3.68E-02
-3.58E-02
-3.55E-02
200
-3.37E-02
-3.43E-02
-3.45E-02
-3.58E-02
-3.46E-02
-3.37E-02
-3.45E-02
-3.49E-02
-3.46E-02
-3.63E-02
-3.58E-02
-3.54E-02
-3.61E-02
8.12E-04
-3.44E-02
-3.78E-02
-2.50E-02
PASS
-3.57E-02
9.38E-04
-3.37E-02
-3.76E-02
-2.50E-02
PASS
-3.55E-02
9.35E-04
-3.36E-02
-3.74E-02
-2.50E-02
PASS
-3.55E-02
9.25E-04
-3.35E-02
-3.74E-02
-2.50E-02
PASS
-3.55E-02
8.75E-04
-3.37E-02
-3.73E-02
-2.50E-02
PASS
-3.57E-02
8.67E-04
-3.39E-02
-3.75E-02
-2.50E-02
PASS
-3.57E-02
8.40E-04
-3.40E-02
-3.74E-02
-2.50E-02
PASS
-3.56E-02
8.12E-04
-3.39E-02
-3.72E-02
-2.50E-02
PASS
-3.57E-02
7.99E-04
-3.40E-02
-3.73E-02
-2.50E-02
PASS
-3.55E-02
7.90E-04
-3.38E-02
-3.71E-02
-2.50E-02
PASS
-3.47E-02
8.05E-04
-3.30E-02
-3.64E-02
-2.50E-02
PASS
An ISO 9001:2008 and DSCC Certified Company
290
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
Specification MAX
Maximum Output Sink Current @5V #3 (A)
0.00E+00
-5.00E-03
-1.00E-02
-1.50E-02
-2.00E-02
-2.50E-02
-3.00E-02
-3.50E-02
-4.00E-02
0
50
100
150
Total Dose (krad(Si))
Figure 5.143. Plot of Maximum Output Sink Current @5V #3 (A) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
291
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.143. Raw data for Maximum Output Sink Current @5V #3 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Maximum Output Sink Current @5V #3 (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MAX
Status
0
-3.50E-02
-3.63E-02
-3.62E-02
-3.79E-02
-3.65E-02
-3.57E-02
-3.62E-02
-3.64E-02
-3.64E-02
-3.74E-02
-3.62E-02
-3.57E-02
10
-3.42E-02
-3.56E-02
-3.56E-02
-3.80E-02
-3.59E-02
-3.53E-02
-3.54E-02
-3.59E-02
-3.58E-02
-3.69E-02
-3.62E-02
-3.56E-02
20
-3.41E-02
-3.53E-02
-3.52E-02
-3.79E-02
-3.57E-02
-3.52E-02
-3.52E-02
-3.57E-02
-3.56E-02
-3.68E-02
-3.62E-02
-3.57E-02
30
-3.42E-02
-3.53E-02
-3.52E-02
-3.79E-02
-3.56E-02
-3.51E-02
-3.51E-02
-3.56E-02
-3.56E-02
-3.68E-02
-3.62E-02
-3.57E-02
40
-3.45E-02
-3.54E-02
-3.53E-02
-3.78E-02
-3.57E-02
-3.51E-02
-3.52E-02
-3.57E-02
-3.56E-02
-3.68E-02
-3.62E-02
-3.57E-02
50
-3.46E-02
-3.56E-02
-3.55E-02
-3.79E-02
-3.58E-02
-3.53E-02
-3.53E-02
-3.58E-02
-3.58E-02
-3.70E-02
-3.63E-02
-3.58E-02
60
-3.47E-02
-3.56E-02
-3.54E-02
-3.77E-02
-3.57E-02
-3.53E-02
-3.54E-02
-3.59E-02
-3.58E-02
-3.71E-02
-3.63E-02
-3.58E-02
70
-3.45E-02
-3.54E-02
-3.53E-02
-3.75E-02
-3.56E-02
-3.52E-02
-3.53E-02
-3.58E-02
-3.57E-02
-3.70E-02
-3.62E-02
-3.57E-02
75
-3.46E-02
-3.56E-02
-3.54E-02
-3.75E-02
-3.57E-02
-3.53E-02
-3.54E-02
-3.59E-02
-3.58E-02
-3.71E-02
-3.63E-02
-3.58E-02
100
-3.43E-02
-3.53E-02
-3.52E-02
-3.71E-02
-3.54E-02
-3.51E-02
-3.52E-02
-3.58E-02
-3.57E-02
-3.69E-02
-3.62E-02
-3.57E-02
200
-3.36E-02
-3.46E-02
-3.42E-02
-3.62E-02
-3.45E-02
-3.45E-02
-3.45E-02
-3.54E-02
-3.51E-02
-3.64E-02
-3.63E-02
-3.57E-02
-3.64E-02
8.02E-04
-3.47E-02
-3.80E-02
-2.50E-02
PASS
-3.59E-02
9.90E-04
-3.38E-02
-3.79E-02
-2.50E-02
PASS
-3.57E-02
1.01E-03
-3.36E-02
-3.77E-02
-2.50E-02
PASS
-3.56E-02
1.01E-03
-3.35E-02
-3.77E-02
-2.50E-02
PASS
-3.57E-02
9.30E-04
-3.38E-02
-3.76E-02
-2.50E-02
PASS
-3.59E-02
9.30E-04
-3.39E-02
-3.78E-02
-2.50E-02
PASS
-3.59E-02
9.04E-04
-3.40E-02
-3.77E-02
-2.50E-02
PASS
-3.57E-02
8.85E-04
-3.39E-02
-3.76E-02
-2.50E-02
PASS
-3.58E-02
8.70E-04
-3.41E-02
-3.76E-02
-2.50E-02
PASS
-3.56E-02
8.44E-04
-3.39E-02
-3.73E-02
-2.50E-02
PASS
-3.49E-02
8.87E-04
-3.31E-02
-3.67E-02
-2.50E-02
PASS
An ISO 9001:2008 and DSCC Certified Company
292
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
Specification MAX
Maximum Output Sink Current @5V #4 (A)
0.00E+00
-5.00E-03
-1.00E-02
-1.50E-02
-2.00E-02
-2.50E-02
-3.00E-02
-3.50E-02
-4.00E-02
0
50
100
150
Total Dose (krad(Si))
Figure 5.144. Plot of Maximum Output Sink Current @5V #4 (A) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
293
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.144. Raw data for Maximum Output Sink Current @5V #4 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Maximum Output Sink Current @5V #4 (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MAX
Status
0
-3.59E-02
-3.62E-02
-3.65E-02
-3.67E-02
-3.71E-02
-3.59E-02
-3.57E-02
-3.58E-02
-3.59E-02
-3.59E-02
-3.64E-02
-3.57E-02
10
-3.56E-02
-3.54E-02
-3.61E-02
-3.68E-02
-3.68E-02
-3.52E-02
-3.50E-02
-3.51E-02
-3.54E-02
-3.52E-02
-3.64E-02
-3.57E-02
20
-3.52E-02
-3.52E-02
-3.58E-02
-3.67E-02
-3.65E-02
-3.49E-02
-3.46E-02
-3.48E-02
-3.51E-02
-3.49E-02
-3.64E-02
-3.57E-02
30
-3.51E-02
-3.52E-02
-3.57E-02
-3.67E-02
-3.64E-02
-3.48E-02
-3.45E-02
-3.47E-02
-3.50E-02
-3.48E-02
-3.64E-02
-3.57E-02
40
-3.51E-02
-3.53E-02
-3.58E-02
-3.67E-02
-3.64E-02
-3.48E-02
-3.46E-02
-3.47E-02
-3.50E-02
-3.50E-02
-3.64E-02
-3.57E-02
50
-3.53E-02
-3.54E-02
-3.61E-02
-3.67E-02
-3.66E-02
-3.49E-02
-3.47E-02
-3.50E-02
-3.52E-02
-3.51E-02
-3.65E-02
-3.58E-02
60
-3.53E-02
-3.54E-02
-3.62E-02
-3.65E-02
-3.65E-02
-3.49E-02
-3.47E-02
-3.49E-02
-3.52E-02
-3.50E-02
-3.65E-02
-3.58E-02
70
-3.52E-02
-3.53E-02
-3.59E-02
-3.63E-02
-3.64E-02
-3.48E-02
-3.46E-02
-3.48E-02
-3.51E-02
-3.49E-02
-3.64E-02
-3.57E-02
75
-3.53E-02
-3.55E-02
-3.61E-02
-3.64E-02
-3.65E-02
-3.50E-02
-3.47E-02
-3.48E-02
-3.52E-02
-3.50E-02
-3.65E-02
-3.58E-02
100
-3.51E-02
-3.52E-02
-3.59E-02
-3.61E-02
-3.63E-02
-3.47E-02
-3.45E-02
-3.46E-02
-3.50E-02
-3.46E-02
-3.64E-02
-3.57E-02
200
-3.45E-02
-3.46E-02
-3.54E-02
-3.51E-02
-3.54E-02
-3.40E-02
-3.36E-02
-3.35E-02
-3.42E-02
-3.37E-02
-3.64E-02
-3.57E-02
-3.62E-02
4.69E-04
-3.52E-02
-3.71E-02
-2.50E-02
PASS
-3.57E-02
6.67E-04
-3.43E-02
-3.70E-02
-2.50E-02
PASS
-3.54E-02
7.32E-04
-3.39E-02
-3.69E-02
-2.50E-02
PASS
-3.53E-02
7.39E-04
-3.38E-02
-3.68E-02
-2.50E-02
PASS
-3.53E-02
7.22E-04
-3.38E-02
-3.68E-02
-2.50E-02
PASS
-3.55E-02
7.06E-04
-3.40E-02
-3.70E-02
-2.50E-02
PASS
-3.55E-02
6.79E-04
-3.41E-02
-3.69E-02
-2.50E-02
PASS
-3.53E-02
6.49E-04
-3.40E-02
-3.67E-02
-2.50E-02
PASS
-3.55E-02
6.68E-04
-3.41E-02
-3.68E-02
-2.50E-02
PASS
-3.52E-02
6.66E-04
-3.38E-02
-3.66E-02
-2.50E-02
PASS
-3.44E-02
7.28E-04
-3.29E-02
-3.59E-02
-2.50E-02
PASS
An ISO 9001:2008 and DSCC Certified Company
294
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Positive Short-Circuit Current @5V #1 (A)
9.00E-02
8.00E-02
7.00E-02
6.00E-02
5.00E-02
4.00E-02
3.00E-02
2.00E-02
1.00E-02
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.145. Plot of Positive Short-Circuit Current @5V #1 (A) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
295
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.145. Raw data for Positive Short-Circuit Current @5V #1 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Short-Circuit Current @5V #1 (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
8.28E-02
8.42E-02
8.48E-02
8.65E-02
8.68E-02
8.27E-02
8.26E-02
8.35E-02
8.40E-02
8.27E-02
8.41E-02
8.45E-02
10
8.28E-02
8.44E-02
8.49E-02
8.67E-02
8.69E-02
8.28E-02
8.27E-02
8.37E-02
8.42E-02
8.28E-02
8.43E-02
8.47E-02
20
8.28E-02
8.43E-02
8.49E-02
8.66E-02
8.69E-02
8.28E-02
8.27E-02
8.36E-02
8.41E-02
8.28E-02
8.43E-02
8.47E-02
30
8.27E-02
8.42E-02
8.48E-02
8.64E-02
8.68E-02
8.27E-02
8.25E-02
8.36E-02
8.41E-02
8.27E-02
8.43E-02
8.47E-02
40
8.26E-02
8.41E-02
8.47E-02
8.64E-02
8.67E-02
8.27E-02
8.25E-02
8.35E-02
8.40E-02
8.26E-02
8.43E-02
8.47E-02
50
8.26E-02
8.41E-02
8.47E-02
8.63E-02
8.67E-02
8.27E-02
8.24E-02
8.35E-02
8.40E-02
8.26E-02
8.43E-02
8.47E-02
60
8.26E-02
8.40E-02
8.46E-02
8.63E-02
8.66E-02
8.26E-02
8.24E-02
8.34E-02
8.39E-02
8.25E-02
8.42E-02
8.47E-02
70
8.25E-02
8.39E-02
8.46E-02
8.62E-02
8.65E-02
8.25E-02
8.23E-02
8.34E-02
8.39E-02
8.24E-02
8.42E-02
8.46E-02
75
8.25E-02
8.39E-02
8.45E-02
8.62E-02
8.66E-02
8.25E-02
8.23E-02
8.33E-02
8.39E-02
8.24E-02
8.43E-02
8.47E-02
100
8.24E-02
8.38E-02
8.44E-02
8.61E-02
8.64E-02
8.24E-02
8.22E-02
8.33E-02
8.38E-02
8.23E-02
8.42E-02
8.47E-02
200
8.22E-02
8.34E-02
8.41E-02
8.57E-02
8.61E-02
8.22E-02
8.18E-02
8.29E-02
8.34E-02
8.21E-02
8.42E-02
8.46E-02
8.41E-02
1.57E-03
8.73E-02
8.08E-02
5.50E-02
PASS
8.42E-02
1.58E-03
8.74E-02
8.09E-02
5.50E-02
PASS
8.41E-02
1.55E-03
8.73E-02
8.09E-02
5.50E-02
PASS
8.40E-02
1.56E-03
8.72E-02
8.08E-02
5.50E-02
PASS
8.40E-02
1.55E-03
8.72E-02
8.08E-02
5.50E-02
PASS
8.40E-02
1.55E-03
8.72E-02
8.08E-02
5.50E-02
PASS
8.39E-02
1.55E-03
8.71E-02
8.07E-02
5.50E-02
PASS
8.38E-02
1.55E-03
8.70E-02
8.06E-02
5.50E-02
PASS
8.38E-02
1.55E-03
8.70E-02
8.06E-02
5.50E-02
PASS
8.37E-02
1.53E-03
8.69E-02
8.05E-02
5.50E-02
PASS
8.34E-02
1.51E-03
8.65E-02
8.03E-02
5.50E-02
PASS
An ISO 9001:2008 and DSCC Certified Company
296
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Positive Short-Circuit Current @5V #2 (A)
9.00E-02
8.00E-02
7.00E-02
6.00E-02
5.00E-02
4.00E-02
3.00E-02
2.00E-02
1.00E-02
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.146. Plot of Positive Short-Circuit Current @5V #2 (A) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
297
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.146. Raw data for Positive Short-Circuit Current @5V #2 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Short-Circuit Current @5V #2 (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
8.24E-02
8.44E-02
8.37E-02
8.72E-02
8.39E-02
8.27E-02
8.42E-02
8.48E-02
8.45E-02
8.66E-02
8.33E-02
8.23E-02
10
8.24E-02
8.45E-02
8.39E-02
8.73E-02
8.40E-02
8.28E-02
8.43E-02
8.50E-02
8.47E-02
8.67E-02
8.35E-02
8.25E-02
20
8.24E-02
8.44E-02
8.38E-02
8.73E-02
8.39E-02
8.27E-02
8.42E-02
8.49E-02
8.46E-02
8.67E-02
8.35E-02
8.26E-02
30
8.23E-02
8.43E-02
8.37E-02
8.72E-02
8.38E-02
8.26E-02
8.41E-02
8.48E-02
8.46E-02
8.66E-02
8.35E-02
8.25E-02
40
8.23E-02
8.42E-02
8.37E-02
8.72E-02
8.37E-02
8.25E-02
8.41E-02
8.47E-02
8.45E-02
8.65E-02
8.35E-02
8.25E-02
50
8.22E-02
8.42E-02
8.37E-02
8.72E-02
8.37E-02
8.26E-02
8.40E-02
8.47E-02
8.45E-02
8.65E-02
8.35E-02
8.25E-02
60
8.21E-02
8.41E-02
8.36E-02
8.71E-02
8.36E-02
8.24E-02
8.40E-02
8.46E-02
8.44E-02
8.64E-02
8.35E-02
8.25E-02
70
8.20E-02
8.40E-02
8.35E-02
8.71E-02
8.35E-02
8.24E-02
8.39E-02
8.46E-02
8.44E-02
8.64E-02
8.34E-02
8.25E-02
75
8.21E-02
8.40E-02
8.35E-02
8.71E-02
8.35E-02
8.24E-02
8.39E-02
8.46E-02
8.44E-02
8.64E-02
8.35E-02
8.25E-02
100
8.19E-02
8.39E-02
8.34E-02
8.70E-02
8.34E-02
8.22E-02
8.38E-02
8.45E-02
8.42E-02
8.63E-02
8.35E-02
8.25E-02
200
8.16E-02
8.35E-02
8.32E-02
8.68E-02
8.30E-02
8.20E-02
8.35E-02
8.41E-02
8.40E-02
8.59E-02
8.34E-02
8.24E-02
8.44E-02
1.52E-03
8.76E-02
8.13E-02
5.50E-02
PASS
8.46E-02
1.52E-03
8.77E-02
8.14E-02
5.50E-02
PASS
8.45E-02
1.54E-03
8.77E-02
8.13E-02
5.50E-02
PASS
8.44E-02
1.54E-03
8.76E-02
8.12E-02
5.50E-02
PASS
8.43E-02
1.55E-03
8.75E-02
8.12E-02
5.50E-02
PASS
8.43E-02
1.55E-03
8.75E-02
8.11E-02
5.50E-02
PASS
8.42E-02
1.56E-03
8.75E-02
8.10E-02
5.50E-02
PASS
8.42E-02
1.56E-03
8.74E-02
8.10E-02
5.50E-02
PASS
8.42E-02
1.56E-03
8.74E-02
8.10E-02
5.50E-02
PASS
8.41E-02
1.59E-03
8.73E-02
8.08E-02
5.50E-02
PASS
8.38E-02
1.60E-03
8.71E-02
8.05E-02
5.50E-02
PASS
An ISO 9001:2008 and DSCC Certified Company
298
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Positive Short-Circuit Current @5V #3 (A)
9.00E-02
8.00E-02
7.00E-02
6.00E-02
5.00E-02
4.00E-02
3.00E-02
2.00E-02
1.00E-02
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.147. Plot of Positive Short-Circuit Current @5V #3 (A) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
299
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.147. Raw data for Positive Short-Circuit Current @5V #3 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Short-Circuit Current @5V #3 (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
8.23E-02
8.45E-02
8.39E-02
8.74E-02
8.35E-02
8.25E-02
8.46E-02
8.48E-02
8.45E-02
8.65E-02
8.34E-02
8.21E-02
10
8.23E-02
8.46E-02
8.40E-02
8.75E-02
8.36E-02
8.27E-02
8.47E-02
8.51E-02
8.46E-02
8.66E-02
8.36E-02
8.23E-02
20
8.23E-02
8.45E-02
8.40E-02
8.74E-02
8.36E-02
8.25E-02
8.47E-02
8.50E-02
8.46E-02
8.66E-02
8.36E-02
8.23E-02
30
8.22E-02
8.44E-02
8.39E-02
8.73E-02
8.35E-02
8.25E-02
8.46E-02
8.50E-02
8.45E-02
8.64E-02
8.36E-02
8.23E-02
40
8.22E-02
8.44E-02
8.39E-02
8.73E-02
8.34E-02
8.24E-02
8.45E-02
8.49E-02
8.44E-02
8.64E-02
8.36E-02
8.23E-02
50
8.21E-02
8.43E-02
8.38E-02
8.72E-02
8.34E-02
8.24E-02
8.45E-02
8.49E-02
8.44E-02
8.63E-02
8.36E-02
8.22E-02
60
8.21E-02
8.42E-02
8.38E-02
8.71E-02
8.33E-02
8.23E-02
8.44E-02
8.48E-02
8.44E-02
8.63E-02
8.36E-02
8.22E-02
70
8.20E-02
8.41E-02
8.37E-02
8.70E-02
8.33E-02
8.22E-02
8.44E-02
8.47E-02
8.43E-02
8.62E-02
8.35E-02
8.22E-02
75
8.20E-02
8.41E-02
8.37E-02
8.70E-02
8.33E-02
8.22E-02
8.44E-02
8.47E-02
8.44E-02
8.62E-02
8.35E-02
8.22E-02
100
8.19E-02
8.40E-02
8.35E-02
8.69E-02
8.32E-02
8.21E-02
8.42E-02
8.46E-02
8.42E-02
8.61E-02
8.35E-02
8.22E-02
200
8.16E-02
8.36E-02
8.32E-02
8.66E-02
8.29E-02
8.17E-02
8.39E-02
8.44E-02
8.39E-02
8.57E-02
8.35E-02
8.22E-02
8.45E-02
1.58E-03
8.77E-02
8.12E-02
5.50E-02
PASS
8.46E-02
1.60E-03
8.79E-02
8.13E-02
5.50E-02
PASS
8.45E-02
1.59E-03
8.78E-02
8.12E-02
5.50E-02
PASS
8.44E-02
1.57E-03
8.77E-02
8.12E-02
5.50E-02
PASS
8.44E-02
1.58E-03
8.76E-02
8.11E-02
5.50E-02
PASS
8.43E-02
1.57E-03
8.76E-02
8.11E-02
5.50E-02
PASS
8.43E-02
1.59E-03
8.75E-02
8.10E-02
5.50E-02
PASS
8.42E-02
1.58E-03
8.74E-02
8.09E-02
5.50E-02
PASS
8.42E-02
1.59E-03
8.75E-02
8.09E-02
5.50E-02
PASS
8.41E-02
1.58E-03
8.73E-02
8.08E-02
5.50E-02
PASS
8.37E-02
1.57E-03
8.70E-02
8.05E-02
5.50E-02
PASS
An ISO 9001:2008 and DSCC Certified Company
300
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Specification MIN
Positive Short-Circuit Current @5V #4 (A)
9.00E-02
8.00E-02
7.00E-02
6.00E-02
5.00E-02
4.00E-02
3.00E-02
2.00E-02
1.00E-02
0.00E+00
0
50
100
150
Total Dose (krad(Si))
Figure 5.148. Plot of Positive Short-Circuit Current @5V #4 (A) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
301
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.148. Raw data for Positive Short-Circuit Current @5V #4 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Short-Circuit Current @5V #4 (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
8.29E-02
8.41E-02
8.47E-02
8.63E-02
8.65E-02
8.28E-02
8.28E-02
8.34E-02
8.39E-02
8.26E-02
8.41E-02
8.46E-02
10
8.29E-02
8.43E-02
8.49E-02
8.64E-02
8.67E-02
8.29E-02
8.29E-02
8.36E-02
8.40E-02
8.27E-02
8.43E-02
8.48E-02
20
8.29E-02
8.42E-02
8.49E-02
8.63E-02
8.66E-02
8.29E-02
8.29E-02
8.36E-02
8.40E-02
8.27E-02
8.43E-02
8.48E-02
30
8.28E-02
8.41E-02
8.48E-02
8.62E-02
8.65E-02
8.28E-02
8.28E-02
8.35E-02
8.39E-02
8.25E-02
8.43E-02
8.47E-02
40
8.27E-02
8.41E-02
8.47E-02
8.62E-02
8.64E-02
8.27E-02
8.27E-02
8.35E-02
8.38E-02
8.24E-02
8.42E-02
8.47E-02
50
8.27E-02
8.40E-02
8.47E-02
8.61E-02
8.64E-02
8.27E-02
8.27E-02
8.34E-02
8.38E-02
8.24E-02
8.43E-02
8.47E-02
60
8.26E-02
8.39E-02
8.47E-02
8.61E-02
8.63E-02
8.26E-02
8.27E-02
8.34E-02
8.36E-02
8.23E-02
8.42E-02
8.47E-02
70
8.25E-02
8.39E-02
8.46E-02
8.59E-02
8.63E-02
8.25E-02
8.26E-02
8.33E-02
8.36E-02
8.22E-02
8.42E-02
8.47E-02
75
8.25E-02
8.39E-02
8.46E-02
8.60E-02
8.63E-02
8.25E-02
8.26E-02
8.33E-02
8.37E-02
8.22E-02
8.43E-02
8.47E-02
100
8.24E-02
8.38E-02
8.45E-02
8.58E-02
8.62E-02
8.23E-02
8.24E-02
8.32E-02
8.35E-02
8.21E-02
8.42E-02
8.47E-02
200
8.21E-02
8.35E-02
8.43E-02
8.55E-02
8.58E-02
8.20E-02
8.22E-02
8.29E-02
8.31E-02
8.17E-02
8.42E-02
8.47E-02
8.40E-02
1.45E-03
8.70E-02
8.10E-02
5.50E-02
PASS
8.41E-02
1.46E-03
8.71E-02
8.11E-02
5.50E-02
PASS
8.41E-02
1.43E-03
8.71E-02
8.12E-02
5.50E-02
PASS
8.40E-02
1.44E-03
8.70E-02
8.10E-02
5.50E-02
PASS
8.39E-02
1.45E-03
8.69E-02
8.09E-02
5.50E-02
PASS
8.39E-02
1.45E-03
8.69E-02
8.09E-02
5.50E-02
PASS
8.38E-02
1.46E-03
8.68E-02
8.08E-02
5.50E-02
PASS
8.37E-02
1.45E-03
8.67E-02
8.07E-02
5.50E-02
PASS
8.38E-02
1.46E-03
8.68E-02
8.07E-02
5.50E-02
PASS
8.36E-02
1.47E-03
8.66E-02
8.06E-02
5.50E-02
PASS
8.33E-02
1.47E-03
8.63E-02
8.03E-02
5.50E-02
PASS
An ISO 9001:2008 and DSCC Certified Company
302
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
Specification MAX
Negative Short-Circuit Current @5V #1 (A)
0.00E+00
-1.00E-02
-2.00E-02
-3.00E-02
-4.00E-02
-5.00E-02
-6.00E-02
-7.00E-02
-8.00E-02
0
50
100
150
Total Dose (krad(Si))
Figure 5.149. Plot of Negative Short-Circuit Current @5V #1 (A) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
303
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.149. Raw data for Negative Short-Circuit Current @5V #1 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Short-Circuit Current @5V #1 (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MAX
Status
0
-7.50E-02
-7.59E-02
-7.69E-02
-7.84E-02
-7.88E-02
-7.48E-02
-7.47E-02
-7.53E-02
-7.61E-02
-7.48E-02
-7.63E-02
-7.63E-02
10
-7.50E-02
-7.60E-02
-7.69E-02
-7.85E-02
-7.89E-02
-7.49E-02
-7.49E-02
-7.55E-02
-7.62E-02
-7.50E-02
-7.65E-02
-7.64E-02
20
-7.50E-02
-7.59E-02
-7.69E-02
-7.84E-02
-7.87E-02
-7.49E-02
-7.47E-02
-7.54E-02
-7.61E-02
-7.50E-02
-7.65E-02
-7.64E-02
30
-7.49E-02
-7.58E-02
-7.68E-02
-7.83E-02
-7.87E-02
-7.47E-02
-7.46E-02
-7.53E-02
-7.61E-02
-7.49E-02
-7.65E-02
-7.64E-02
40
-7.48E-02
-7.58E-02
-7.68E-02
-7.81E-02
-7.86E-02
-7.47E-02
-7.46E-02
-7.52E-02
-7.60E-02
-7.48E-02
-7.65E-02
-7.64E-02
50
-7.49E-02
-7.57E-02
-7.68E-02
-7.81E-02
-7.86E-02
-7.48E-02
-7.45E-02
-7.52E-02
-7.60E-02
-7.47E-02
-7.66E-02
-7.64E-02
60
-7.48E-02
-7.57E-02
-7.67E-02
-7.80E-02
-7.86E-02
-7.47E-02
-7.45E-02
-7.51E-02
-7.59E-02
-7.47E-02
-7.65E-02
-7.64E-02
70
-7.47E-02
-7.57E-02
-7.67E-02
-7.79E-02
-7.85E-02
-7.46E-02
-7.44E-02
-7.50E-02
-7.58E-02
-7.46E-02
-7.65E-02
-7.64E-02
75
-7.48E-02
-7.56E-02
-7.67E-02
-7.79E-02
-7.84E-02
-7.46E-02
-7.44E-02
-7.50E-02
-7.58E-02
-7.46E-02
-7.66E-02
-7.64E-02
100
-7.46E-02
-7.55E-02
-7.65E-02
-7.78E-02
-7.83E-02
-7.45E-02
-7.43E-02
-7.48E-02
-7.57E-02
-7.45E-02
-7.66E-02
-7.64E-02
200
-7.44E-02
-7.52E-02
-7.62E-02
-7.73E-02
-7.79E-02
-7.41E-02
-7.39E-02
-7.44E-02
-7.53E-02
-7.41E-02
-7.65E-02
-7.64E-02
-7.61E-02
1.48E-03
-7.30E-02
-7.91E-02
-5.50E-02
PASS
-7.62E-02
1.48E-03
-7.31E-02
-7.92E-02
-5.50E-02
PASS
-7.61E-02
1.46E-03
-7.31E-02
-7.91E-02
-5.50E-02
PASS
-7.60E-02
1.47E-03
-7.30E-02
-7.90E-02
-5.50E-02
PASS
-7.60E-02
1.45E-03
-7.30E-02
-7.90E-02
-5.50E-02
PASS
-7.59E-02
1.47E-03
-7.29E-02
-7.90E-02
-5.50E-02
PASS
-7.59E-02
1.44E-03
-7.29E-02
-7.88E-02
-5.50E-02
PASS
-7.58E-02
1.45E-03
-7.28E-02
-7.88E-02
-5.50E-02
PASS
-7.58E-02
1.44E-03
-7.28E-02
-7.88E-02
-5.50E-02
PASS
-7.57E-02
1.43E-03
-7.27E-02
-7.86E-02
-5.50E-02
PASS
-7.53E-02
1.41E-03
-7.24E-02
-7.82E-02
-5.50E-02
PASS
An ISO 9001:2008 and DSCC Certified Company
304
RLAT Report
10-326 100808 R1.0
Average Biased
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
Specification MAX
Negative Short-Circuit Current @5V #2 (A)
0.00E+00
-1.00E-02
-2.00E-02
-3.00E-02
-4.00E-02
-5.00E-02
-6.00E-02
-7.00E-02
-8.00E-02
-9.00E-02
0
50
100
150
Total Dose (krad(Si))
Figure 5.150. Plot of Negative Short-Circuit Current @5V #2 (A) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
305
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table 5.150. Raw data for Negative Short-Circuit Current @5V #2 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Short-Circuit Current @5V #2 (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MAX
Status
0
-7.44E-02
-7.63E-02
-7.58E-02
-7.91E-02
-7.59E-02
-7.47E-02
-7.61E-02
-7.67E-02
-7.65E-02
-7.88E-02
-7.55E-02
-7.44E-02
10
-7.44E-02
-7.64E-02
-7.60E-02
-7.92E-02
-7.61E-02
-7.48E-02
-7.62E-02
-7.68E-02
-7.66E-02
-7.89E-02
-7.56E-02
-7.46E-02
20
-7.44E-02
-7.63E-02
-7.59E-02
-7.92E-02
-7.61E-02
-7.47E-02
-7.62E-02
-7.67E-02
-7.66E-02
-7.89E-02
-7.56E-02
-7.46E-02
30
-7.42E-02
-7.62E-02
-7.58E-02
-7.91E-02
-7.59E-02
-7.46E-02
-7.61E-02
-7.67E-02
-7.65E-02
-7.87E-02
-7.56E-02
-7.46E-02
40
-7.43E-02
-7.62E-02
-7.57E-02
-7.90E-02
-7.59E-02
-7.46E-02
-7.60E-02
-7.66E-02
-7.64E-02
-7.87E-02
-7.56E-02
-7.46E-02
50
-7.41E-02
-7.61E-02
-7.57E-02
-7.90E-02
-7.58E-02
-7.45E-02
-7.60E-02
-7.66E-02
-7.64E-02
-7.86E-02
-7.56E-02
-7.45E-02
60
-7.41E-02
-7.61E-02
-7.57E-02
-7.89E-02
-7.58E-02
-7.44E-02
-7.59E-02
-7.65E-02
-7.63E-02
-7.86E-02
-7.56E-02
-7.45E-02
70
-7.40E-02
-7.59E-02
-7.56E-02
-7.88E-02
-7.57E-02
-7.44E-02
-7.59E-02
-7.65E-02
-7.63E-02
-7.86E-02
-7.56E-02
-7.45E-02
75
-7.40E-02
-7.60E-02
-7.56E-02
-7.88E-02
-7.57E-02
-7.43E-02
-7.58E-02
-7.64E-02
-7.62E-02
-7.86E-02
-7.56E-02
-7.45E-02
100
-7.39E-02
-7.58E-02
-7.55E-02
-7.86E-02
-7.56E-02
-7.42E-02
-7.58E-02
-7.64E-02
-7.62E-02
-7.85E-02
-7.56E-02
-7.45E-02
200
-7.35E-02
-7.55E-02
-7.52E-02
-7.82E-02
-7.52E-02
-7.38E-02
-7.55E-02
-7.61E-02
-7.57E-02
-7.81E-02
-7.56E-02
-7.45E-02
-7.64E-02
1.51E-03
-7.33E-02
-7.95E-02
-5.50E-02
PASS
-7.65E-02
1.52E-03
-7.34E-02
-7.97E-02
-5.50E-02
PASS
-7.65E-02
1.54E-03
-7.33E-02
-7.97E-02
-5.50E-02
PASS
-7.64E-02
1.54E-03
-7.32E-02
-7.96E-02
-5.50E-02
PASS
-7.63E-02
1.53E-03
-7.32E-02
-7.95E-02
-5.50E-02
PASS
-7.63E-02
1.54E-03
-7.31E-02
-7.95E-02
-5.50E-02
PASS
-7.62E-02
1.53E-03
-7.31E-02
-7.94E-02
-5.50E-02
PASS
-7.62E-02
1.56E-03
-7.29E-02
-7.94E-02
-5.50E-02
PASS
-7.61E-02
1.53E-03
-7.30E-02
-7.93E-02
-5.50E-02
PASS
-7.61E-02
1.54E-03
-7.29E-02
-7.92E-02
-5.50E-02
PASS
-7.57E-02
1.55E-03
-7.25E-02
-7.89E-02
-5.50E-02
PASS
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Ps90%/90% (+KTL) Biased
Specification MAX
Negative Short-Circuit Current @5V #3 (A)
0.00E+00
-1.00E-02
-2.00E-02
-3.00E-02
-4.00E-02
-5.00E-02
-6.00E-02
-7.00E-02
-8.00E-02
-9.00E-02
0
50
100
150
Total Dose (krad(Si))
Figure 5.151. Plot of Negative Short-Circuit Current @5V #3 (A) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
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Table 5.151. Raw data for Negative Short-Circuit Current @5V #3 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Short-Circuit Current @5V #3 (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MAX
Status
0
-7.44E-02
-7.63E-02
-7.60E-02
-7.96E-02
-7.58E-02
-7.47E-02
-7.65E-02
-7.68E-02
-7.65E-02
-7.90E-02
-7.58E-02
-7.44E-02
10
-7.44E-02
-7.64E-02
-7.61E-02
-7.97E-02
-7.59E-02
-7.49E-02
-7.67E-02
-7.69E-02
-7.67E-02
-7.91E-02
-7.60E-02
-7.46E-02
20
-7.44E-02
-7.64E-02
-7.61E-02
-7.97E-02
-7.58E-02
-7.49E-02
-7.66E-02
-7.69E-02
-7.66E-02
-7.90E-02
-7.61E-02
-7.46E-02
30
-7.42E-02
-7.63E-02
-7.59E-02
-7.95E-02
-7.57E-02
-7.47E-02
-7.66E-02
-7.68E-02
-7.65E-02
-7.89E-02
-7.60E-02
-7.45E-02
40
-7.41E-02
-7.63E-02
-7.60E-02
-7.95E-02
-7.57E-02
-7.46E-02
-7.64E-02
-7.68E-02
-7.64E-02
-7.89E-02
-7.60E-02
-7.46E-02
50
-7.41E-02
-7.62E-02
-7.58E-02
-7.94E-02
-7.56E-02
-7.46E-02
-7.65E-02
-7.67E-02
-7.64E-02
-7.89E-02
-7.60E-02
-7.45E-02
60
-7.40E-02
-7.62E-02
-7.58E-02
-7.93E-02
-7.56E-02
-7.46E-02
-7.64E-02
-7.67E-02
-7.64E-02
-7.87E-02
-7.59E-02
-7.45E-02
70
-7.39E-02
-7.61E-02
-7.57E-02
-7.92E-02
-7.55E-02
-7.45E-02
-7.63E-02
-7.67E-02
-7.63E-02
-7.87E-02
-7.59E-02
-7.45E-02
75
-7.39E-02
-7.61E-02
-7.57E-02
-7.92E-02
-7.55E-02
-7.45E-02
-7.63E-02
-7.67E-02
-7.63E-02
-7.88E-02
-7.60E-02
-7.45E-02
100
-7.38E-02
-7.59E-02
-7.56E-02
-7.91E-02
-7.53E-02
-7.44E-02
-7.63E-02
-7.65E-02
-7.62E-02
-7.86E-02
-7.60E-02
-7.45E-02
200
-7.34E-02
-7.56E-02
-7.52E-02
-7.86E-02
-7.49E-02
-7.40E-02
-7.59E-02
-7.62E-02
-7.59E-02
-7.83E-02
-7.59E-02
-7.45E-02
-7.66E-02
1.64E-03
-7.32E-02
-7.99E-02
-5.50E-02
PASS
-7.67E-02
1.65E-03
-7.33E-02
-8.01E-02
-5.50E-02
PASS
-7.66E-02
1.64E-03
-7.32E-02
-8.00E-02
-5.50E-02
PASS
-7.65E-02
1.63E-03
-7.32E-02
-7.99E-02
-5.50E-02
PASS
-7.65E-02
1.65E-03
-7.31E-02
-7.99E-02
-5.50E-02
PASS
-7.64E-02
1.64E-03
-7.30E-02
-7.98E-02
-5.50E-02
PASS
-7.64E-02
1.64E-03
-7.30E-02
-7.98E-02
-5.50E-02
PASS
-7.63E-02
1.65E-03
-7.29E-02
-7.97E-02
-5.50E-02
PASS
-7.63E-02
1.66E-03
-7.29E-02
-7.97E-02
-5.50E-02
PASS
-7.62E-02
1.66E-03
-7.27E-02
-7.96E-02
-5.50E-02
PASS
-7.58E-02
1.65E-03
-7.24E-02
-7.92E-02
-5.50E-02
PASS
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Ps90%/90% (+KTL) Biased
Specification MAX
Negative Short-Circuit Current @5V #4 (A)
0.00E+00
-1.00E-02
-2.00E-02
-3.00E-02
-4.00E-02
-5.00E-02
-6.00E-02
-7.00E-02
-8.00E-02
0
50
100
150
Total Dose (krad(Si))
Figure 5.152. Plot of Negative Short-Circuit Current @5V #4 (A) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias and the black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
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Table 5.152. Raw data for Negative Short-Circuit Current @5V #4 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Short-Circuit Current @5V #4 (A)
Device
1245
1246
1247
1248
1249
1250
1251
1261
1262
1263
1264
1265
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MAX
Status
0
-7.50E-02
-7.60E-02
-7.70E-02
-7.83E-02
-7.85E-02
-7.47E-02
-7.47E-02
-7.53E-02
-7.59E-02
-7.47E-02
-7.62E-02
-7.67E-02
10
-7.50E-02
-7.62E-02
-7.72E-02
-7.84E-02
-7.85E-02
-7.48E-02
-7.48E-02
-7.56E-02
-7.61E-02
-7.48E-02
-7.64E-02
-7.69E-02
20
-7.50E-02
-7.61E-02
-7.71E-02
-7.84E-02
-7.85E-02
-7.47E-02
-7.47E-02
-7.55E-02
-7.60E-02
-7.47E-02
-7.64E-02
-7.69E-02
30
-7.49E-02
-7.60E-02
-7.70E-02
-7.82E-02
-7.84E-02
-7.46E-02
-7.46E-02
-7.53E-02
-7.59E-02
-7.47E-02
-7.64E-02
-7.69E-02
40
-7.48E-02
-7.59E-02
-7.69E-02
-7.81E-02
-7.83E-02
-7.46E-02
-7.45E-02
-7.53E-02
-7.58E-02
-7.46E-02
-7.63E-02
-7.69E-02
50
-7.48E-02
-7.60E-02
-7.69E-02
-7.81E-02
-7.83E-02
-7.46E-02
-7.45E-02
-7.53E-02
-7.58E-02
-7.46E-02
-7.63E-02
-7.68E-02
60
-7.47E-02
-7.58E-02
-7.69E-02
-7.80E-02
-7.81E-02
-7.45E-02
-7.45E-02
-7.52E-02
-7.57E-02
-7.45E-02
-7.63E-02
-7.68E-02
70
-7.46E-02
-7.58E-02
-7.68E-02
-7.79E-02
-7.81E-02
-7.44E-02
-7.44E-02
-7.52E-02
-7.57E-02
-7.44E-02
-7.63E-02
-7.68E-02
75
-7.46E-02
-7.58E-02
-7.68E-02
-7.79E-02
-7.80E-02
-7.44E-02
-7.44E-02
-7.51E-02
-7.57E-02
-7.44E-02
-7.63E-02
-7.68E-02
100
-7.45E-02
-7.57E-02
-7.67E-02
-7.77E-02
-7.79E-02
-7.43E-02
-7.43E-02
-7.50E-02
-7.56E-02
-7.43E-02
-7.63E-02
-7.68E-02
200
-7.41E-02
-7.53E-02
-7.64E-02
-7.73E-02
-7.75E-02
-7.40E-02
-7.39E-02
-7.46E-02
-7.52E-02
-7.39E-02
-7.63E-02
-7.68E-02
-7.60E-02
1.45E-03
-7.30E-02
-7.90E-02
-5.50E-02
PASS
-7.61E-02
1.45E-03
-7.31E-02
-7.91E-02
-5.50E-02
PASS
-7.61E-02
1.46E-03
-7.31E-02
-7.91E-02
-5.50E-02
PASS
-7.60E-02
1.45E-03
-7.30E-02
-7.89E-02
-5.50E-02
PASS
-7.59E-02
1.43E-03
-7.29E-02
-7.88E-02
-5.50E-02
PASS
-7.59E-02
1.44E-03
-7.29E-02
-7.88E-02
-5.50E-02
PASS
-7.58E-02
1.43E-03
-7.29E-02
-7.87E-02
-5.50E-02
PASS
-7.57E-02
1.43E-03
-7.28E-02
-7.87E-02
-5.50E-02
PASS
-7.57E-02
1.42E-03
-7.28E-02
-7.87E-02
-5.50E-02
PASS
-7.56E-02
1.41E-03
-7.27E-02
-7.85E-02
-5.50E-02
PASS
-7.52E-02
1.40E-03
-7.23E-02
-7.81E-02
-5.50E-02
PASS
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6.0. Summary / Conclusions
The total ionizing dose testing described in this final report was performed using the facilities at
Radiation Assured Devices’ Longmire Laboratories in Colorado Springs, CO. The high dose rate total
ionizing dose (TID) source is a JLSA 84-21 irradiator modified to provide a panoramic exposure. The
Co-60 rods are held in the base of the irradiator heavily shielded by lead, during the radiation exposures
the rod is raised by an electronic timer/controller and the exposure is performed in air. The dose rate for
this irradiator in this configuration ranges from <1rad(Si)/s to a maximum of approximately
120rad(Si)/s, determined by the distance from the source.
The parametric data was obtained as read and record and all the raw data plus an attributes summary are
contained in a separate Excel file. The attributes data contains the average, standard deviation and the
average with the KTL values applied. The KTL value used in this work is 2.065 per MIL-HDBK-814
using one sided tolerance limits of 90/90 and a 10-piece sample size. The 90/90 KTL values were
selected to match the statistical levels specified in the MIL-PRF-38535 sampling plan for the
qualification of a radiation hardness assured (RHA) component. Note that the following criteria must be
met for a device to pass the RLAT: following the radiation exposure each of the 10 pieces irradiated
under electrical bias shall pass the specification value. If any of the 10 pieces irradiated under electrical
bias exceed the datasheet specifications, then the lot could be logged as a failure.
Based on this criterion the RH1814MW QUAD OP AMP (from the lot date code identified on the first
page of this test report) PASSED the RLAT to the maximum tested dose level of 200krad(Si) with all
parameters remaining within their datasheet specifications. The data shown in this report uses much
finer dose increments at the low dose levels to better understand the low total dose performance. In
previous tests (with larger dose increments) we have observed degradation of selected VOS, CMRR and
PSRR parameters with the units improving with total dose, passing at the 100krad(Si) and 200krad(Si)
dose levels. It appears that using relatively large dose increments can cause a low total dose “failure”
possible due to a slightly different radiation response of matching of OpAmp input transistors. The
LT1814 datasheet p.12 "Circuit Operation" discussion describes complementary NPN and PNP emitter
followers buffering input transistors. Uneven gamma-induced degradation of the various input
transistors could produce large voltage offsets, possibly recovering after significant charge saturation in
the oxides. Figures 5.1 through 5.152 show plots of all the measured parameters versus total ionizing
dose while Tables 5.1 – 5.152 show the corresponding raw data for each of these parameters.
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Appendix A: Photograph of device-under-test to show part markings
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Appendix B: TID Bias Connections
(Extracted from LINEAR TECHNOLOGY CORPORATION RH1814M Datasheet)
Biased Samples:
Pin
Function
Connection / Bias
1
OUT A
To Pin 2 via 10kΩ
2
-IN A
To Pin 1 via 10kΩ
3
+IN A
To 2.5V via 10kΩ Resistor
4
V+
To +5V using 0.1μF Decoupling to GND
5
+IN B
To 2.5V via 10kΩ Resistor
6
-IN B
To Pin 7 via 10kΩ
7
OUT B
To Pin 6 via 10kΩ
8
OUT C
To Pin 9 via 10kΩ
9
-IN C
To Pin 8 via 10kΩ
10
+IN C
To 2.5V via 10kΩ Resistor
11
V-
To -5V using 0.1μF Decoupling to GND
12
+IN D
To 2.5V via 10kΩ Resistor
13
-IN D
To Pin 14 via 10kΩ
14
OUT D
To Pin 13 via 10kΩ
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Figure B.1. Irradiation bias drawing for the units to be irradiated under electrical bias. This figure was extracted
from LINEAR TECHNOLOGY CORPORATION RH1814M Datasheet.
Figure B.2. W package drawing (for reference only). This figure was extracted from LINEAR TECHNOLOGY
CORPORATION RH1814M Datasheet.
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Appendix C: Electrical Test Parameters and Conditions
All electrical tests for this device are performed on one of Radiation Assured Device’s LTS2020 Test
Systems. The LTS2020 Test System is a programmable parametric tester that provides parameter
measurements for a variety of digital, analog and mixed signal products including voltage regulators,
voltage comparators, D to A and A to D converters. The LTS2020 Test System achieves accuracy and
sensitivity through the use of software self-calibration and an internal relay matrix with separate family
boards and custom personality adapter boards. The tester uses this relay matrix to connect the required
test circuits, select the appropriate voltage / current sources and establish the needed measurement loops
for all the tests performed. The tests will be conducted using the LTS-2101 Linear Family Board, LTS0600 Socket Assembly and the RH1814W BGSS-080826 DUT board. The measured parameters and
test conditions are shown in Tables C.1 and C.2.
A listing of the measurement precision/resolution for each parameter is shown in Tables C.3 and C.4.
The precision/resolution values were obtained either from test data or from the DAC resolution of the
LTS-2020. To generate the precision/resolution shown in Table C.2, one of the units-under-test was
tested repetitively (a total of 10-times with re-insertion between tests) to obtain the average test value
and standard deviation. Using this test data MIL-HDBK-814 90/90 KTL statistics were applied to the
measured standard deviation to generate the final measurement range. This value encompasses the
precision/resolution of all aspects of the test system, including the LTS2020 mainframe, family board,
socket assembly and DUT board as well as insertion error. In some cases, the measurement resolution is
limited by the internal DACs, which results in a measured standard deviation of zero. In these instances
the precision/resolution will be reported back as the LSB of the DAC.
Note that the testing and statistics used in this document are based on an “analysis of variables”
technique, which relies on small sample sizes to qualify much larger lot sizes (see MIL-HDBK-814, p.
91 for a discussion of statistical treatments). Not all measured parameters are well suited to this
approach due to inherent large variations. One such parameter is pre-irradiation Large Signal Voltage
Gain, where the device exhibits extreme sensitivity to input conditions, resulting in a very large standard
deviation. If necessary, larger samples sizes could be used to qualify these parameters using an
“attributes” approach.
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Table C.1. Measured parameters and test conditions for VS=±5V.
TEST DESCRIPTION
Positive Supply Current
Negative Supply Current
Input Offset Voltage (Op Amp 1-4)
Input Offset Current (Op Amp 1-4)
+ Input Bias Current (Op Amp 1-4)
- Input Bias Current (Op Amp 1-4)
CMRR (Op Amp 1-4)
PSRR (Op Amp 1-4)
Large Signal Voltage Gain RL=500 (Op Amp 1-4)
Large Signal Voltage Gain RL=100 (Op Amp 1-4)
Channel Separation (Op Amp 1-4, all permutations)
Output Voltage Swing High RL=500 (Op Amp 1-4)
Output Voltage Swing High RL=100 (Op Amp 1-4)
Output Voltage Swing Low RL=500 (Op Amp 1-4)
Output Voltage Swing Low RL=100 (Op Amp 1-4)
Maximum Output Source Current (Op Amp 1-4)
Maximum Output Sink Current (Op Amp 1-4)
Positive Short-Circuit Current (Op Amp 1-4)
Negative Short-Circuit Current (Op Amp 1-4)
TEST CONDITIONS
VS=±5V
VS=±5V
VS=±5V
VS=±5V
VS=±5V
VS=±5V
VS=±5V, VCM=±3.5V
VS=±2V to ±5.5V
RL=500Ω, VO=±3V
RL=100Ω, VO=±3V
RL=100Ω, VO=±3V
RL=500Ω, VOD=30mV, VS=±5V
RL=100Ω, VOD=30mV, VS=±5V
RL=500Ω, VOD=30mV, VS=±5V
RL=100Ω, VOD=30mV, VS=±5V
VO=3V, VOD=30mV, VS=±5V
VO=-3V, VOD=30mV, VS=±5V
VOD=1V, VS=±5V
VOD=1V, VS=±5V
An ISO 9001:2008 and DSCC Certified Company
316
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
Table C.2. Measured parameters and test conditions for VS=5V.
TEST DESCRIPTION
Positive Supply Current
Negative Supply Current
Input Offset Voltage (Op Amp 1-4)
Input Offset Current (Op Amp 1-4)
+ Input Bias Current (Op Amp 1-4)
- Input Bias Current (Op Amp 1-4)
CMRR (Op Amp 1-4)
Large Signal Voltage Gain RL=500 (Op Amp 1-4)
Large Signal Voltage Gain RL=100 (Op Amp 1-4)
Channel Separation (Op Amp 1-4, all permutations)
Output Voltage Swing High RL=500 (Op Amp 1-4)
Output Voltage Swing High RL=100 (Op Amp 1-4)
Output Voltage Swing Low RL=500 (Op Amp 1-4)
Output Voltage Swing Low RL=100 (Op Amp 1-4)
Maximum Output Source Current (Op Amp 1-4)
Maximum Output Sink Current (Op Amp 1-4)
Positive Short-Circuit Current (Op Amp 1-4)
Negative Short-Circuit Current (Op Amp 1-4)
TEST CONDITIONS
VS=5V
VS=5V
VS=5V
VS=5V
VS=5V
VS=5V
VS=5V, VCM=1.5V to 3.5V
RL=500Ω, VO=1.5 to 3.5V
RL=100Ω, VO=1.5 to 3.5V
RL=100Ω, VO=1.5 to 3.5V
RL=500Ω, VOD=30mV, VS=5V
RL=100Ω, VOD=30mV, VS=5V
RL=500Ω, VOD=30mV, VS=5V
RL=100Ω, VOD=30mV, VS=5V
VO=3.5V, VOD=30mV, VS=5V
VO=1.5V, VOD=30mV, VS=5V
VOD=1V, VS=5V
VOD=1V, VS=5V
An ISO 9001:2008 and DSCC Certified Company
317
RLAT Report
10-326 100808 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table C.3. Measured parameters, pre-irradiation specifications, and measurement resolutions
for VS=±5V.
Pre-Irradiation
Measurement
Specification
Resolution/Precision
Positive Supply Current
14.4mA
± 2.50E-04A
Negative Supply Current
-14.4mA
± 2.46E-04A
Input Offset Voltage (Op Amp 1-4)
±1.5mV
± 9.56E-06V
Input Offset Current (Op Amp 1-4)
±400nA
± 1.07E-08A
+ Input Bias Current (Op Amp 1-4)
± 9.97E-09A
±4µA
- Input Bias Current (Op Amp 1-4)
± 1.07E-08A
±4µA
CMRR (Op Amp 1-4)
75dB
± 1.27E-01dB
PSRR (Op Amp 1-4)
78dB
± 2.77E-01dB
Large Signal Voltage Gain RL=500 (Op Amp 1-4)
1.5V/mV
± 6.53E-02V/mV
Large Signal Voltage Gain RL=100 (Op Amp 1-4)
1V/mV
± 9.97E-02V/mV
Channel Separation (Op Amp 1-4, all permutations)
82dB
± 3.19E+01dB
Output Voltage Swing High RL=500 (Op Amp 1-4)
3.8V
± 4.29E-03V
Output Voltage Swing High RL=100 (Op Amp 1-4)
3.35V
± 2.76E-03V
Output Voltage Swing Low RL=500 (Op Amp 1-4)
-3.8V
± 3.34E-03V
Output Voltage Swing Low RL=100 (Op Amp 1-4)
-3.35V
± 3.34E-03V
Maximum Output Source Current (Op Amp 1-4)
40mA
± 2.49E-04A
Maximum Output Sink Current (Op Amp 1-4)
-40mA
± 1.46E-04A
Positive Short-Circuit Current (Op Amp 1-4)
75mA
± 4.04E-04V
Negative Short-Circuit Current (Op Amp 1-4)
-75mA
± 4.14E-04A
Measured Parameter
An ISO 9001:2008 and DSCC Certified Company
318
RLAT Report
10-326 100808 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table C.4. Measured parameters, pre-irradiation specifications, and measurement resolutions
for VS=5V.
Pre-Irradiation
Measurement
Specification
Resolution/Precision
Positive Supply Current
16mA
± 1.52E-04A
Negative Supply Current
-16mA
± 1.66E-04A
Input Offset Voltage (Op Amp 1-4)
±2mV
± 8.44E-06V
Input Offset Current (Op Amp 1-4)
±400nA
± 1.07E-08A
+ Input Bias Current (Op Amp 1-4)
± 8.79E-09A
±4µA
- Input Bias Current (Op Amp 1-4)
± 9.97E-09A
±4µA
CMRR (Op Amp 1-4)
73dB
± 2.84E-01dB
Large Signal Voltage Gain RL=500 (Op Amp 1-4)
1.0V/mV
± 2.00E-02V/mV
Large Signal Voltage Gain RL=100 (Op Amp 1-4)
0.7V/mV
± 8.71E-02V/mV
Channel Separation (Op Amp 1-4, all permutations)
81dB
± 2.74E+01dB
Output Voltage Swing High RL=500 (Op Amp 1-4)
3.9V
± 3.38E-03V
Output Voltage Swing High RL=100 (Op Amp 1-4)
3.7V
± 2.47E-03V
Output Voltage Swing Low RL=500 (Op Amp 1-4)
1.1V
± 2.19E-03V
Output Voltage Swing Low RL=100 (Op Amp 1-4)
1.3V
± 2.01E-03V
Maximum Output Source Current (Op Amp 1-4)
25mA
± 1.21E-04A
Maximum Output Sink Current (Op Amp 1-4)
-25mA
± 1.27E-04A
Positive Short-Circuit Current (Op Amp 1-4)
55mA
± 2.21E-04A
Negative Short-Circuit Current (Op Amp 1-4)
-55mA
± 1.64E-04A
Measured Parameter
An ISO 9001:2008 and DSCC Certified Company
319
RLAT Report
10-326 100808 R1.0
Appendix D: List of Figures Used in Section 5 (RLAT Test Results)
5.1
5.2
5.3
5.4
5.5
5.6
5.7
5.8
5.9
5.10
5.11
5.12
5.13
5.14
5.15
5.16
5.17
5.18
5.19
5.20
5.21
5.22
5.23
5.24
5.25
5.26
5.27
5.28
5.29
5.30
5.31
5.32
5.33
5.34
5.35
5.36
5.37
5.38
5.39
Positive Supply Current @+/-5V (A)
Negative Supply Current @+/-5V (A)
Input Offset Voltage @+/-5V #1 (V)
Input Offset Voltage @+/-5V #2 (V)
Input Offset Voltage @+/-5V #3 (V)
Input Offset Voltage @+/-5V #4 (V)
Input Offset Current @+/-5V #1 (A)
Input Offset Current @+/-5V #2 (A)
Input Offset Current @+/-5V #3 (A)
Input Offset Current @+/-5V #4 (A)
Positive Input Bias Current @+/-5V #1 (A)
Positive Input Bias Current @+/-5V #2 (A)
Positive Input Bias Current @+/-5V #3 (A)
Positive Input Bias Current @+/-5V #4 (A)
Negative Input Bias Current @+/-5V #1 (A)
Negative Input Bias Current @+/-5V #2 (A)
Negative Input Bias Current @+/-5V #3 (A)
Negative Input Bias Current @+/-5V #4 (A)
Common Mode Rejection Ratio @+/-5V #1 (dB)
Common Mode Rejection Ratio @+/-5V #2 (dB)
Common Mode Rejection Ratio @+/-5V #3 (dB)
Common Mode Rejection Ratio @+/-5V #4 (dB)
Power Supply Rejection Ratio #1 (dB)
Power Supply Rejection Ratio #2 (dB)
Power Supply Rejection Ratio #3 (dB)
Power Supply Rejection Ratio #4 (dB)
Large Signal Voltage Gain @+/-5V RL=500 #1 (V/mV)
Large Signal Voltage Gain @+/-5V RL=500 #2 (V/mV)
Large Signal Voltage Gain @+/-5V RL=500 #3 (V/mV)
Large Signal Voltage Gain @+/-5V RL=500 #4 (V/mV)
Large Signal Voltage Gain @+/-5V RL=100 #1 (V/mV)
Large Signal Voltage Gain @+/-5V RL=100 #2 (V/mV)
Large Signal Voltage Gain @+/-5V RL=100 #3 (V/mV)
Large Signal Voltage Gain @+/-5V RL=100 #4 (V/mV)
Channel Separation @+/-5V 1:2 (dB)
Channel Separation @+/-5V 1:3 (dB)
Channel Separation @+/-5V 1:4 (dB)
Channel Separation @+/-5V 2:1 (dB)
Channel Separation @+/-5V 2:3 (dB)
An ISO 9001:2008 and DSCC Certified Company
320
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
5.40
5.41
5.42
5.43
5.44
5.45
5.46
5.47
5.48
5.49
5.50
5.51
5.52
5.53
5.54
5.55
5.56
5.57
5.58
5.59
5.60
5.61
5.62
5.63
5.64
5.65
5.66
5.67
5.68
5.69
5.70
5.71
5.72
5.73
5.74
5.75
5.76
5.77
5.78
5.79
5.80
Channel Separation @+/-5V 2:4 (dB)
Channel Separation @+/-5V 3:1 (dB)
Channel Separation @+/-5V 3:2 (dB)
Channel Separation @+/-5V 3:4 (dB)
Channel Separation @+/-5V 4:1 (dB)
Channel Separation @+/-5V 4:2 (dB)
Channel Separation @+/-5V 4:3 (dB)
Output Voltage Swing High @+/-5V RL=500 #1 (V)
Output Voltage Swing High @+/-5V RL=500 #2 (V)
Output Voltage Swing High @+/-5V RL=500 #3 (V)
Output Voltage Swing High @+/-5V RL=500 #4 (V)
Output Voltage Swing High @+/-5V RL=100 #1 (V)
Output Voltage Swing High @+/-5V RL=100 #2 (V)
Output Voltage Swing High @+/-5V RL=100 #3 (V)
Output Voltage Swing High @+/-5V RL=100 #4 (V)
Output Voltage Swing Low @+/-5V RL=500 #1 (V)
Output Voltage Swing Low @+/-5V RL=500 #2 (V)
Output Voltage Swing Low @+/-5V RL=500 #3 (V)
Output Voltage Swing Low @+/-5V RL=500 #4 (V)
Output Voltage Swing Low @+/-5V RL=100 #1 (V)
Output Voltage Swing Low @+/-5V RL=100 #2 (V)
Output Voltage Swing Low @+/-5V RL=100 #3 (V)
Output Voltage Swing Low @+/-5V RL=100 #4 (V)
Maximum Output Source Current @+/-5V #1 (A)
Maximum Output Source Current @+/-5V #2 (A)
Maximum Output Source Current @+/-5V #3 (A)
Maximum Output Source Current @+/-5V #4 (A)
Maximum Output Sink Current @+/-5V #1 (A)
Maximum Output Sink Current @+/-5V #2 (A)
Maximum Output Sink Current @+/-5V #3 (A)
Maximum Output Sink Current @+/-5V #4 (A)
Positive Short-Circuit Current @+/-5V #1 (A)
Positive Short-Circuit Current @+/-5V #2 (A)
Positive Short-Circuit Current @+/-5V #3 (A)
Positive Short-Circuit Current @+/-5V #4 (A)
Negative Short-Circuit Current @+/-5V #1 (A)
Negative Short-Circuit Current @+/-5V #2 (A)
Negative Short-Circuit Current @+/-5V #3 (A)
Negative Short-Circuit Current @+/-5V #4 (A)
Positive Supply Current @5V (A)
Negative Supply Current @5V (A)
An ISO 9001:2008 and DSCC Certified Company
321
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
5.81
5.82
5.83
5.84
5.85
5.86
5.87
5.88
5.89
5.90
5.91
5.92
5.93
5.94
5.95
5.96
5.97
5.98
5.99
5.100
5.101
5.102
5.103
5.104
5.105
5.106
5.107
5.108
5.109
5.110
5.111
5.112
5.113
5.114
5.115
5.116
5.117
5.118
5.119
5.120
5.121
Input Offset Voltage @5V #1 (V)
Input Offset Voltage @5V #2 (V)
Input Offset Voltage @5V #3 (V)
Input Offset Voltage @5V #4 (V)
Input Offset Current @5V #1 (A)
Input Offset Current @5V #2 (A)
Input Offset Current @5V #3 (A)
Input Offset Current @5V #4 (A)
Positive Input Bias Current @5V #1 (A)
Positive Input Bias Current @5V #2 (A)
Positive Input Bias Current @5V #3 (A)
Positive Input Bias Current @5V #4 (A)
Negative Input Bias Current @5V #1 (A)
Negative Input Bias Current @5V #2 (A)
Negative Input Bias Current @5V #3 (A)
Negative Input Bias Current @5V #4 (A)
Common Mode Rejection Ratio @5V #1 (dB)
Common Mode Rejection Ratio @5V #2 (dB)
Common Mode Rejection Ratio @5V #3 (dB)
Common Mode Rejection Ratio @5V #4 (dB)
Large Signal Voltage Gain @5V RL=500 #1 (V/mV)
Large Signal Voltage Gain @5V RL=500 #2 (V/mV)
Large Signal Voltage Gain @5V RL=500 #3 (V/mV)
Large Signal Voltage Gain @5V RL=500 #4 (V/mV)
Large Signal Voltage Gain @5V RL=100 #1 (V/mV)
Large Signal Voltage Gain @5V RL=100 #2 (V/mV)
Large Signal Voltage Gain @5V RL=100 #3 (V/mV)
Large Signal Voltage Gain @5V RL=100 #4 (V/mV)
Channel Separation @5V 1:2 (dB)
Channel Separation @5V 1:3 (dB)
Channel Separation @5V 1:4 (dB)
Channel Separation @5V 2:1 (dB)
Channel Separation @5V 2:3 (dB)
Channel Separation @5V 2:4 (dB)
Channel Separation @5V 3:1 (dB)
Channel Separation @5V 3:2 (dB)
Channel Separation @5V 3:4 (dB)
Channel Separation @5V 4:1 (dB)
Channel Separation @5V 4:2 (dB)
Channel Separation @5V 4:3 (dB)
Output Voltage Swing High @5V RL=500 #1 (V)
An ISO 9001:2008 and DSCC Certified Company
322
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
10-326 100808 R1.0
5.122
5.123
5.124
5.125
5.126
5.127
5.128
5.129
5.130
5.131
5.132
5.133
5.134
5.135
5.136
5.137
5.138
5.139
5.140
5.141
5.142
5.143
5.144
5.145
5.146
5.147
5.148
5.149
5.150
5.151
5.152
Output Voltage Swing High @5V RL=500 #2 (V)
Output Voltage Swing High @5V RL=500 #3 (V)
Output Voltage Swing High @5V RL=500 #4 (V)
Output Voltage Swing High @5V RL=100 #1 (V)
Output Voltage Swing High @5V RL=100 #2 (V)
Output Voltage Swing High @5V RL=100 #3 (V)
Output Voltage Swing High @5V RL=100 #4 (V)
Output Voltage Swing Low @5V RL=500 #1 (V)
Output Voltage Swing Low @5V RL=500 #2 (V)
Output Voltage Swing Low @5V RL=500 #3 (V)
Output Voltage Swing Low @5V RL=500 #4 (V)
Output Voltage Swing Low @5V RL=100 #1 (V)
Output Voltage Swing Low @5V RL=100 #2 (V)
Output Voltage Swing Low @5V RL=100 #3 (V)
Output Voltage Swing Low @5V RL=100 #4 (V)
Maximum Output Source Current @5V #1 (A)
Maximum Output Source Current @5V #2 (A)
Maximum Output Source Current @5V #3 (A)
Maximum Output Source Current @5V #4 (A)
Maximum Output Sink Current @5V #1 (A)
Maximum Output Sink Current @5V #2 (A)
Maximum Output Sink Current @5V #3 (A)
Maximum Output Sink Current @5V #4 (A)
Positive Short-Circuit Current @5V #1 (A)
Positive Short-Circuit Current @5V #2 (A)
Positive Short-Circuit Current @5V #3 (A)
Positive Short-Circuit Current @5V #4 (A)
Negative Short-Circuit Current @5V #1 (A)
Negative Short-Circuit Current @5V #2 (A)
Negative Short-Circuit Current @5V #3 (A)
Negative Short-Circuit Current @5V #4 (A)
An ISO 9001:2008 and DSCC Certified Company
323
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800