TID LDR RH117H W10905063.1 W10 Total Ionization Dose (TID) Test Results of the RH117H Positive Adjustable Regulator @ Low Dose Rate (LDR) LDR = 10 mrads(Si)/s 18 December 2014 Duc Nguyen, Sana Rezgui Acknowledgements The authors would like to thank the Product Engineering and Design S-Power groups from Linear Technology for their help with the board design and assembly as well as the data collection pre- and post-irradiations. Special thanks are also for Thomas Shepherd from Defense Microelectronics Activity (DMEA) for the extensive work for board setup and continuous dosimetry monitoring throughout the ELDRS tests. P a g e 1 | 42 LINEAR TECHNOLOGY CORPORATION TID LDR RH117H W10905063.1 W10 TID LDR Testing of the RH117H Positive Adjustable Regulator Part Type Tested: RH117H Positive Adjustable Regulator Traceability Information: Fab Lot # W10905063.1; Assembly Lot # 755614; Wafer # 10. See photograph of unit under test in Appendix A. Quantity of Units: 12 units received, 2 units for control, 5 units for biased irradiation, and 5 units for unbiased irradiation. Serial numbers 770-774 had all pins tied to ground during irradiation. Serial numbers 765-769 were biased during irradiation. Serial numbers 723 and 724 were used as control. See Appendix B for the radiation bias connection tables. Radiation and Electrical Test Increments: Ionizing radiation with the following electrical test increments: 11 Krads(Si), 22 Krads(Si), 31 Krads(Si), 50 Krads(Si). Radiation dose: 10 mrads(Si)/sec. Radiation Test Standard: MIL-STD-883 TM1019.9 Condition D. Test Hardware and Software: LTX pre- and post-irradiation test program EQ2CR117H.01. Facility and Radiation Source: Defense Micro Electronic Activity (DMEA) and Cobalt-60. Irradiation and Test Temperature: Room temperature controlled to 24°C±6°C per MIL-STD-883 and MIL-STD-750. SUMMARY ALL 12 PARTS PASSED THE ELECTRICAL TEST LIMITS AS SPECIFIED IN THE DATASHEET AFTER EACH IRRADIATION INCREMENT. ADDITIONAL INFORMATION CAN BE PROVIDED PER REQUEST. P a g e 2 | 42 LINEAR TECHNOLOGY CORPORATION TID LDR RH117H W10905063.1 W10 1.0 Overview and Background Among other radiation effects, Total Ionizing Dose (TID) may affect electrical characteristics, causing parametric and/or functional failures in integrated circuits. During gamma-irradiations, TID-induced and transported electron-hole pairs may result in charge trapping in a transistor’s dielectrics and interface regions, affecting the device’s basic features. Such effects warrant testing and monitoring of circuits to TID, after which annealing and/or Time Dependent Effects (TDE) may take place, depending on the circuit’s design and process technology. Hence the requirement per Condition D (for low-dose rates ranging from less than or equal to 10 mrads(Si)/sec) in TM1019, MIL-STD-883 is to not exceed the allowed time of one hour from the end of an incremented irradiation and an electrical test. Additionally, the total time from the end of one incremental irradiation to the start of the next incremental step should be less than two hours. 2.0 Radiation Facility and Test Equipment The samples were irradiated at Defense Micro-Electronics Activity (DMEA) facility in Sacramento, California. DMEA utilizes J.L. Shepherd model 81-22/484 to provide the dose-rate of 10 mrads(Si)/s. A special design screw-driven automatic cart inside the exposure tunnel positions the Device-Under-Test (DUT) precisely and repeatedly from the source to attain optimal rate verified by ion chamber detectors. See Appendix C for the certificate of dosimetry. 3.0 Test Conditions The 10 samples were placed in a lead/aluminum container and aligned with the radiation source, Cobalt-60, at DMEA facility in Sacramento, California. During irradiation, five units were biased at +/- 15V and other five had all pads grounded. The devices were irradiated up to 50 Krad(Si) with increments of 10, 22, 31 Krads(Si). After each irradiation, the samples were transported in dry ice to Linear Technology testing facility. Testing was performed on the two control units to confirm the operation of the test system prior to the electrical testing of the 12 units (10 irradiated and 2 control). The criteria to pass the low dose-rate test is that five samples irradiated under electrical bias must pass the datasheet limits. If any of the tested parameters of these five units do not meet the required limits then a failure-analysis of the part should be conducted and if valid the lot will be scrapped. P a g e 3 | 42 LINEAR TECHNOLOGY CORPORATION TID LDR RH117H W10905063.1 W10 4.0 Tested Parameters The following parameters were measured pre- and post-irradiations: - VREF (V) @ 10mA ≤ IOUT ≤ IMAX, 3V ≤ (VIN – VOUT) ≤ 40V Line Regulation (%/V) @ ILOAD = 10mA, 3V ≤ (VIN – VOUT) ≤ 40V Load Regulation (mV) @ VOUT ≤ 5V, 10mA ≤ IOUT ≤ IMAX Load Regulation (%) @ VOUT ≥ 5V, 10mA ≤ IOUT ≤ IMAX Adjust Pin Current (uA) Adjust Pin Current Change (uA) @ 10mA ≤ IOUT ≤ IMAX Adjust Pin Current Change (uA) @ 3V ≤ (VIN – VOUT) ≤ 40V Minimum Load Current (mA) @ (VIN – VOUT) = 40V Current Limit (A) @ (VIN – VOUT) ≤ 5V Current Limit (A) @ (VIN – VOUT) = 40V Appendix D details the test conditions, minimum and maximum values at different accumulated doses. P a g e 4 | 42 LINEAR TECHNOLOGY CORPORATION TID LDR RH117H W10905063.1 W10 5.0 Test Results All ten samples passed the post-irradiation electrical tests. All measurements of the ten listed parameters in section 4.0 are within the specification limits. The used statistics in this report are based on the tolerance limits, which are bounds to gage the quality of the manufactured products. It assumes that if the quality of the items is normally distributed with known mean and known standard deviation, the two-sided tolerance limits can be calculated as follows: +KTL = mean + (KTL) (standard deviation) -KTL = mean - (KTL) (standard deviation) Where +KTL is the upper tolerance limit and -KTL is the lower tolerance limit. These tolerance limits are defined in a table of inverse normal probability distribution. However, in most cases, mean and standard deviations are unknown and therefore it is practical to estimate both of them from a sample. Hence the tolerance limit depends greatly on the sample size. The Ps90%/90% KTL factor for a lot quality P of 0.9, confidence C of 0.9 with a sample size of 5, can be found from the tabulated table (MIL-HDBK-814, page 94, table IX-B). The KTL factor in this report is 2.742. In the plots, the dotted lines with diamond markers are the average of the measured data points of five samples irradiated under electrical bias while the dashed lines with X-markers are the average of measured data points of five units irradiated with all pins tied to ground. The solid lines with triangle markers are the 90%/90% minimum and maximum determined from the calculation of the KTL on the samples irradiated in the biased setup. The solid lines with square symbols are the 90%/90% minimum and maximum determined from the calculation of the KTL on the five samples irradiated with all pins grounded. The orange solid lines with circle markers are the specification limits. The 11 Krads(Si) test limits are taken from the Linear Technology datasheet’s 10 Krads(Si) specification limits. The 22 Krads(Si) test limits are taken from the Linear Technology datasheet’s 20 Krads(Si) specification limits. P a g e 5 | 42 LINEAR TECHNOLOGY CORPORATION TID LDR RH117H W10905063.1 W10 VREF (V) @ 3V≤ VIN - VOUT ≤40V, 10mA≤ IL ≤ 0.5A 1.32 1.30 Specification MAX Ps90%/90% (+KTL) Biased 1.28 Ps90%/90% (+KTL) All GND'd 1.26 Average All GND'd Ps90%/90% (-KTL) All GND'd 1.24 Average Biased 1.22 Ps90%/90% (-KTL) Biased Specification MIN 1.20 1.18 0 10 20 30 40 50 60 Total Dose (Krads(Si)) Figure 5.1 Plot of Reference Voltage versus Total Dose P a g e 6 | 42 LINEAR TECHNOLOGY CORPORATION TID LDR RH117H W10905063.1 W10 Table 5.1: Raw data for reference voltage at full load versus total dose including the statistical calculations, minimum specification, maximum specification, and the status of the test (PASS/FAIL) under the orange headers) Parameter VREF @ 3V≤VI-VO≤40V,10mA≤IL≤0.5A Units (V) 770 All GND'd Irradiation 771 All GND'd Irradiation 772 All GND'd Irradiation 773 All GND'd Irradiation 774 All GND'd Irradiation 765 Biased Irradiation 766 Biased Irradiation 767 Biased Irradiation 768 Biased Irradiation 769 Biased Irradiation 723 Control Unit 724 Control Unit All GND'd Irradiation Statistics Average All GND'd Std Dev All GND'd Ps90%/90% (+KTL) All GND'd Ps90%/90% (-KTL) All GND'd Biased Irradiation Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status (Measurements) All GND'd Status (Measurements) Biased Specification MAX Status (Measurements) All GND'd Status (Measurements) Biased Total Dose (Krads(Si)) @ 10 mrads/s 0 1.24362 1.24113 1.24475 1.24414 1.24348 1.24666 1.24505 1.24316 1.24479 1.24916 1.25226 1.24825 11 1.24211 1.24065 1.24463 1.24379 1.24249 1.24440 1.24220 1.24004 1.24149 1.24776 1.25333 1.24865 22 1.24137 1.23968 1.24373 1.24315 1.24187 1.24359 1.24121 1.23840 1.23871 1.24625 1.25312 1.24943 31 1.24009 1.23827 1.24261 1.24222 1.24062 1.24123 1.23713 1.23483 1.23422 1.24336 1.25284 1.24945 50 1.23767 1.23588 1.24024 1.23951 1.23813 1.23416 1.22869 1.22645 1.22438 1.23707 1.25331 1.24909 1.24343 0.00138 1.24720 1.23965 1.24273 0.00154 1.24696 1.23850 1.24196 0.00159 1.24632 1.23760 1.24076 0.00175 1.24555 1.23597 1.23828 0.00170 1.24293 1.23363 1.24576 0.00227 1.25199 1.23954 1.20 PASS PASS 1.30 PASS PASS 1.24318 0.00301 1.25142 1.23493 1.20 PASS PASS 1.30 PASS PASS 1.24163 0.00333 1.25076 1.23250 1.20 PASS PASS 1.30 PASS PASS 1.23815 0.00400 1.24913 1.22717 1.23015 0.00532 1.24472 1.21558 1.20 PASS PASS 1.30 PASS PASS Status (-KTL) All GND'd Status (+KTL) All GND'd PASS PASS PASS PASS PASS PASS PASS PASS Status (-KTL) Biased Status (+KTL) Biased PASS PASS PASS PASS PASS PASS PASS PASS P a g e 7 | 42 LINEAR TECHNOLOGY CORPORATION TID LDR RH117H W10905063.1 W10 Line Reg. (%/V) @ 3V≤ VIN - VOUT ≤40V, IL = 10mA 0.023 Specification MAX 0.018 Ps90%/90% (+KTL) All GND'd Ps90%/90% (+KTL) Biased 0.013 Average All GND'd 0.008 Average Biased Ps90%/90% (-KTL) All GND'd 0.003 Ps90%/90% (-KTL) Biased -0.002 0 10 20 30 40 50 60 Total Dose (Krads(Si)) Figure 5.2: Plot of Line Regulation versus Total Dose P a g e 8 | 42 LINEAR TECHNOLOGY CORPORATION TID LDR RH117H W10905063.1 W10 Table 5.2: Raw data for line regulation versus total dose including the statistical calculations, maximum specification, and the status of the test (PASS/FAIL under the second orange header) Parameter Line Reg. @ 3V≤VI-VO≤40V,IL =10mA Units (%/V) 770 All GND'd Irradiation 771 All GND'd Irradiation 772 All GND'd Irradiation 773 All GND'd Irradiation 774 All GND'd Irradiation 765 Biased Irradiation 766 Biased Irradiation 767 Biased Irradiation 768 Biased Irradiation 769 Biased Irradiation 723 Control Unit 724 Control Unit All GND'd Irradiation Statistics Average All GND'd Std Dev All GND'd Ps90%/90% (+KTL) All GND'd Ps90%/90% (-KTL) All GND'd Biased Irradiation Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status (Measurements) All GND'd Status (Measurements) Biased Specification MAX Status (Measurements) All GND'd Status (Measurements) Biased Total Dose (Krads(Si)) @ 10 mrads/s 0 0.001013 0.001265 0.000953 0.000868 0.001197 0.000824 0.001258 0.001239 0.001058 0.001301 0.001150 0.000967 11 0.000937 0.001325 0.000914 0.001083 0.001299 0.001123 0.001020 0.001240 0.001147 0.001410 0.001406 0.001284 22 0.001136 0.001412 0.001095 0.000995 0.001306 0.001219 0.001326 0.001536 0.001656 0.001467 0.001316 0.001132 31 0.001411 0.001597 0.000325 0.001263 0.001471 0.001325 0.001436 0.001455 0.001564 0.000574 0.001312 0.001274 50 0.001518 0.001292 0.001245 0.001164 0.001496 0.001251 0.001530 0.001511 0.001850 0.001499 0.001092 0.001010 0.001059 0.000167 0.001517 0.000601 0.001112 0.000194 0.001644 0.000579 0.001189 0.001213 0.000168 0.000511 0.001650 0.002614 0.000728 -0.000187 0.001343 0.000157 0.001773 0.000912 0.001136 0.000198 0.001678 0.000594 0.001188 0.000147 0.001590 0.000786 0.001441 0.000172 0.001913 0.000969 0.001528 0.000213 0.002112 0.000944 0.02 PASS PASS 0.02 PASS PASS 0.02 PASS PASS 0.02 PASS PASS Status (-KTL) All GND'd Status (+KTL) All GND'd PASS PASS PASS PASS Status (-KTL) Biased Status (+KTL) Biased PASS PASS PASS PASS 0.001271 0.000399 0.002364 0.000177 P a g e 9 | 42 LINEAR TECHNOLOGY CORPORATION TID LDR RH117H W10905063.1 W10 Load Reg. (mV) @ 10mA≤IL ≤0.5A, VOUT ≤ 5V 55.00 Specification MAX 45.00 Ps90%/90% (+KTL) All GND'd 35.00 Ps90%/90% (+KTL) Biased 25.00 Average All GND'd Average Biased 15.00 Ps90%/90% (-KTL) All GND'd 5.00 Ps90%/90% (-KTL) Biased -5.00 0 10 20 30 40 50 60 Total Dose (Krads(Si)) Figure 5.3: Plot of Load Regulation (VOUT ≤ 5V) versus Total Dose P a g e 10 | 42 LINEAR TECHNOLOGY CORPORATION TID LDR RH117H W10905063.1 W10 Table 5.3: Raw data for load regulation (VOUT ≤ 5V) versus total dose including the statistical calculations, maximum specification, and the status of the test (PASS/FAIL). Parameter Load Reg @ 10mA≤IL ≤0.5A,VO ≤ 5V Units (mV) 770 All GND'd Irradiation 771 All GND'd Irradiation 772 All GND'd Irradiation 773 All GND'd Irradiation 774 All GND'd Irradiation 765 Biased Irradiation 766 Biased Irradiation 767 Biased Irradiation 768 Biased Irradiation 769 Biased Irradiation 723 Control Unit 724 Control Unit All GND'd Irradiation Statistics Average All GND'd Std Dev All GND'd Ps90%/90% (+KTL) All GND'd Ps90%/90% (-KTL) All GND'd Biased Irradiation Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status (Measurements) All GND'd Status (Measurements) Biased Specification MAX Status (Measurements) All GND'd Status (Measurements) Biased Total Dose (Krads(Si)) @ 10 mrads/s 0 0.29278 0.99945 1.24645 0.19741 0.98991 0.79727 0.05341 0.11063 -0.14496 0.58746 0.49019 0.96989 11 0.92793 0.40722 0.84782 0.15354 1.24455 1.46484 0.67902 0.64278 0.85735 0.52547 -0.08106 1.09196 22 1.13964 0.69332 0.95177 0.16022 1.18637 1.23787 0.69141 1.06525 1.09386 0.47779 0.09441 0.43011 31 1.40762 1.16730 1.50108 0.19741 1.36852 1.49250 1.06335 1.13964 1.25504 0.69237 0.39101 0.37766 50 1.32656 0.95463 1.81294 0.55408 1.63174 1.91784 0.98419 1.53732 1.39427 0.77343 -0.20885 0.73624 0.74520 0.46919 2.03171 -0.54131 0.71621 0.43398 1.90618 -0.47376 0.82626 0.41980 1.97735 -0.32483 1.12839 0.53450 2.59399 -0.33722 1.25599 0.50986 2.65404 -0.14206 0.28076 0.39456 1.36266 -0.80113 0.83389 0.37225 1.85461 -0.18682 0.91324 0.31620 1.78027 0.04621 1.12858 0.29287 1.93162 0.32553 1.32141 0.45323 2.56416 0.07867 15 PASS PASS 36 PASS PASS 42 PASS PASS 48 PASS PASS Status (-KTL) All GND'd Status (+KTL) All GND'd PASS PASS PASS PASS Status (-KTL) Biased Status (+KTL) Biased PASS PASS PASS PASS P a g e 11 | 42 LINEAR TECHNOLOGY CORPORATION TID LDR RH117H W10905063.1 W10 Load Reg (%) @ 10mA≤IL≤0.5A,VOUT ≥ 5V 1.20 1.00 Specification MAX 0.80 Ps90%/90% (+KTL) All GND'd Ps90%/90% (+KTL) Biased 0.60 Average Biased 0.40 Average All GND'd 0.20 Ps90%/90% (-KTL) Biased 0.00 Ps90%/90% (-KTL) All GND'd -0.20 0 10 20 30 40 50 60 Total Dose (Krads(Si)) Figure 5.4: Plot of Load Regulation (VOUT ≥ 5V) versus Total Dose P a g e 12 | 42 LINEAR TECHNOLOGY CORPORATION TID LDR RH117H W10905063.1 W10 Table 5.4: Raw data for line regulation (VOUT ≥ 5V) versus total dose including the statistical calculations, maximum specification, and the status of the test (PASS/FAIL). Parameter Load Reg @ 10mA≤IL ≤0.5A, VO≥5V Units (%) 770 All GND'd Irradiation 771 All GND'd Irradiation 772 All GND'd Irradiation 773 All GND'd Irradiation 774 All GND'd Irradiation 765 Biased Irradiation 766 Biased Irradiation 767 Biased Irradiation 768 Biased Irradiation 769 Biased Irradiation 723 Control Unit 724 Control Unit All GND'd Irradiation Statistics Average All GND'd Std Dev All GND'd Ps90%/90% (+KTL) All GND'd Ps90%/90% (-KTL) All GND'd Biased Irradiation Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status (Measurements) All GND'd Status (Measurements) Biased Specification MAX Status (Measurements) All GND'd Status (Measurements) Biased Total Dose (Krads(Si)) @ 10 mrads/s 0 0.02354 0.08046 0.10004 0.01586 0.07954 0.06391 0.00429 0.00890 -0.01165 0.04701 0.03913 0.07764 11 0.07465 0.03281 0.06807 0.01234 0.10007 0.11758 0.05463 0.05181 0.06901 0.04210 -0.00647 0.08737 22 0.09172 0.05590 0.07647 0.01289 0.09544 0.09944 0.05567 0.08594 0.08823 0.03832 0.00753 0.03441 31 0.11338 0.09418 0.12066 0.01589 0.11019 0.12010 0.08588 0.09221 0.10158 0.05565 0.03120 0.03022 50 0.10707 0.07718 0.14596 0.04468 0.13162 0.15516 0.08004 0.12519 0.11375 0.06248 -0.01667 0.05891 0.05989 0.03769 0.16323 -0.04345 0.05759 0.03488 0.15323 -0.03805 0.06648 0.03376 0.15906 -0.02610 0.09086 0.04301 0.20880 -0.02708 0.10130 0.04103 0.21381 -0.01121 0.02249 0.03162 0.10918 -0.06420 0.06702 0.02986 0.14889 -0.01485 0.07352 0.02549 0.14343 0.00362 0.09108 0.02364 0.15591 0.02626 0.10732 0.03675 0.20810 0.00654 0.30 PASS PASS 0.72 PASS PASS 0.84 PASS PASS 0.96 PASS PASS Status (-KTL) All GND'd Status (+KTL) All GND'd PASS PASS PASS PASS Status (-KTL) Biased Status (+KTL) Biased PASS PASS PASS PASS P a g e 13 | 42 LINEAR TECHNOLOGY CORPORATION TID LDR RH117H W10905063.1 W10 110 Specification MAX Adjust Pin Current (uA) 100 90 Ps90%/90% (+KTL) All GND'd 80 Ps90%/90% (+KTL) Biased 70 Average All GND'd 60 Average Biased 50 Ps90%/90% (-KTL) All GND'd 40 Ps90%/90% (-KTL) Biased 30 0 10 20 30 40 50 60 Total Dose (Krads(Si)) Figure 5.5: Plot of Adjust Pin Current versus Total Dose P a g e 14 | 42 LINEAR TECHNOLOGY CORPORATION TID LDR RH117H W10905063.1 W10 Table 5.5: Raw data for adjust pin current versus total dose including the statistical calculations, minimum specification, and the status of the test (PASS/FAIL) Parameter Units 770 771 772 773 774 765 766 767 768 769 723 724 Adjust Pin Current (uA) All GND'd Irradiation All GND'd Irradiation All GND'd Irradiation All GND'd Irradiation All GND'd Irradiation Biased Irradiation Biased Irradiation Biased Irradiation Biased Irradiation Biased Irradiation Control Unit Control Unit All GND'd Irradiation Statistics Average All GND'd Std Dev All GND'd Ps90%/90% (+KTL) All GND'd Ps90%/90% (-KTL) All GND'd Biased Irradiation Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status (Measurements) All GND'd Status (Measurements) Biased Specification MAX Status (Measurements) All GND'd Status (Measurements) Biased Total Dose (Krads(Si)) @ 10 mrads/s 0 11 22 31 50 37.08567 36.99123 36.84251 36.90289 36.85178 38.93988 38.76894 38.66531 38.50042 38.41770 37.16185 37.07067 36.85321 36.94807 36.73279 36.91572 36.80050 36.78321 36.69865 36.48647 38.71296 38.67036 38.40386 38.40662 38.06429 36.79207 36.75817 36.29581 36.14735 35.55716 38.10320 38.18554 37.15717 37.48630 36.62807 39.12902 39.10086 38.43596 38.30571 37.76563 39.13496 38.72780 38.61774 38.29262 37.60857 38.20905 37.94770 37.76065 37.81404 37.05524 38.21854 38.24239 37.84626 38.16810 37.84653 37.95937 37.92437 37.37463 37.79620 37.47648 37.76322 0.97795 40.44474 35.08169 37.66034 0.97261 40.32724 34.99344 37.50962 0.94059 40.08873 34.93051 37.49133 0.88399 39.91523 35.06743 37.31061 0.86852 39.69208 34.92913 38.27366 0.96201 40.91148 35.63584 38.14401 0.89683 40.60311 35.68492 37.65347 0.95435 40.27030 35.03663 37.60920 0.88688 40.04104 35.17737 36.92293 0.88742 39.35623 34.48964 100 PASS PASS 100 PASS PASS 100 PASS PASS 100 PASS PASS Status (-KTL) All GND'd Status (+KTL) All GND'd PASS PASS PASS PASS Status (-KTL) Biased Status (+KTL) Biased PASS PASS PASS PASS P a g e 15 | 42 LINEAR TECHNOLOGY CORPORATION TID LDR RH117H W10905063.1 W10 Adjust Pin Current Change (uA) @ 10mA≤ IL ≤ 0.5A 6.00 5.00 Specification MAX Ps90%/90% (+KTL) All GND'd 4.00 Ps90%/90% (+KTL) Biased 3.00 Average All GND'd 2.00 Average Biased 1.00 Ps90%/90% (-KTL) All GND'd 0.00 Ps90%/90% (-KTL) Biased -1.00 0 10 20 30 40 50 60 Total Dose (Krads(Si)) Figure 5.6: Plot of Adjust Pin Current Change @ 10mA ≤ IL ≤ 0.5A versus Total Dose P a g e 16 | 42 LINEAR TECHNOLOGY CORPORATION TID LDR RH117H W10905063.1 W10 Table 5.6: Raw data for adjust pin current change @ 10mA ≤ IL ≤ 0.5A versus total dose including the statistical calculations, minimum specification, and the status of the test (PASS/FAIL) Total Dose (Krads(Si)) @ 10 mrads/s Parameter Adj. Pin I Change @ 10mA ≤ IL ≤0.5A Units (uA) 0 11 22 31 770 All GND'd Irradiation 0.00000 -0.00359 -0.01190 -0.00476 771 All GND'd Irradiation 0.01780 -0.01839 -0.02379 -0.01071 772 All GND'd Irradiation 0.00712 0.02273 -0.01887 0.00000 773 All GND'd Irradiation 0.02375 -0.02679 0.01665 0.02855 774 All GND'd Irradiation 0.00237 0.04069 0.03329 -0.02734 765 Biased Irradiation 0.00000 0.05073 -0.03686 -0.02379 766 Biased Irradiation 0.04866 -0.03516 0.00357 -0.05351 767 Biased Irradiation 0.00119 -0.02392 -0.01308 0.00000 768 Biased Irradiation 0.03204 0.03829 0.02973 0.01071 769 Biased Irradiation -0.00972 -0.03351 0.02023 -0.01665 723 Control Unit 0.03820 0.02394 0.01071 -0.01784 724 Control Unit 0.01781 0.04069 -0.03210 -0.00119 All GND'd Irradiation Statistics Average All GND'd 0.01021 0.00293 -0.00093 -0.00285 Std Dev All GND'd 0.01020 0.02828 0.02473 0.02037 Ps90%/90% (+KTL) All GND'd 0.03817 0.08046 0.06687 0.05300 Ps90%/90% (-KTL) All GND'd -0.01776 -0.07461 -0.06872 -0.05870 Biased Irradiation Statistics Average Biased 0.01444 -0.00072 0.00072 -0.01665 Std Dev Biased 0.02474 0.04174 0.02661 0.02467 Ps90%/90% (+KTL) Biased 0.08228 0.11373 0.07369 0.05101 Ps90%/90% (-KTL) Biased -0.05341 -0.11516 -0.07226 -0.08430 Specification MIN Status (Measurements) All GND'd Status (Measurements) Biased Specification MAX 5 5 5 Status (Measurements) All GND'd PASS PASS PASS Status (Measurements) Biased PASS PASS PASS 50 -0.00237 0.00000 -0.08686 0.00000 -0.04879 -0.06187 -0.06783 -0.05592 0.01786 -0.05474 0.01308 -0.02618 -0.02760 0.03912 0.07966 -0.13487 -0.04450 0.03525 0.05215 -0.14115 5 PASS PASS Status (-KTL) All GND'd Status (+KTL) All GND'd PASS PASS PASS PASS Status (-KTL) Biased Status (+KTL) Biased PASS PASS PASS PASS P a g e 17 | 42 LINEAR TECHNOLOGY CORPORATION TID LDR RH117H W10905063.1 W10 Adj. Pin I Change (uA) @ 2.5V≤ VIN - VOUT ≤ 40V, IL = 10mA 6.00 5.00 Specification MAX Ps90%/90% (+KTL) Biased 4.00 Ps90%/90% (+KTL) All GND'd 3.00 Average All GND'd 2.00 Average Biased 1.00 Ps90%/90% (-KTL) All GND'd Ps90%/90% (-KTL) Biased 0.00 0 10 20 30 40 50 60 Total Dose (Krads(Si)) Figure 5.7: Plot of Adjust Pin Current Change @ 2.5V ≤ VIN – VOUT ≤ 40V versus Total Dose P a g e 18 | 42 LINEAR TECHNOLOGY CORPORATION TID LDR RH117H W10905063.1 W10 Table 5.7: Raw data table for adjust pin current change @ 2.5V ≤ VIN – VOUT ≤ 40V versus total dose including the statistical calculations, maximum specification, and the status of the test (PASS/FAIL) Parameter Delta Adj. I @ 2.5V≤VI-VO≤40V,IL=10mA Units (uA) 770 All GND'd Irradiation 771 All GND'd Irradiation 772 All GND'd Irradiation 773 All GND'd Irradiation 774 All GND'd Irradiation 765 Biased Irradiation 766 Biased Irradiation 767 Biased Irradiation 768 Biased Irradiation 769 Biased Irradiation 723 Control Unit 724 Control Unit All GND'd Irradiation Statistics Average All GND'd Std Dev All GND'd Ps90%/90% (+KTL) All GND'd Ps90%/90% (-KTL) All GND'd Biased Irradiation Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status (Measurements) All GND'd Status (Measurements) Biased Specification MAX Status (Measurements) All GND'd Status (Measurements) Biased Total Dose (Krads(Si)) @ 10 mrads/s 0 0.07618 0.08686 0.05816 0.07004 0.10467 0.07381 0.06765 0.06885 0.10920 0.05103 0.06647 0.07240 11 0.09978 0.13043 0.07778 0.10052 0.09619 0.05550 0.08616 0.06627 0.09738 0.11892 0.08063 0.05146 22 0.09974 0.10448 0.09974 0.09379 0.11400 0.13423 0.10926 0.09498 0.10584 0.10464 0.14731 0.13794 31 0.04756 0.10582 0.05827 0.07611 0.09974 0.07015 0.09022 0.10924 0.08070 0.07611 0.09751 0.08443 50 0.10114 0.07139 0.08567 0.08568 0.06307 0.06783 0.08686 0.09163 0.12375 0.05950 0.06783 0.08567 0.07918 0.01763 0.12752 0.03085 0.10094 0.01891 0.15279 0.04909 0.10235 0.00754 0.12302 0.08168 0.07750 0.02532 0.14694 0.00806 0.08139 0.01468 0.12165 0.04113 0.07411 0.02141 0.13281 0.01541 0.08485 0.02513 0.15375 0.01594 0.10979 0.01465 0.14997 0.06961 0.08529 0.01527 0.12715 0.04342 0.08591 0.02495 0.15433 0.01750 5 PASS PASS 5 PASS PASS 5 PASS PASS 5 PASS PASS Status (-KTL) All GND'd Status (+KTL) All GND'd PASS PASS PASS PASS Status (-KTL) Biased Status (+KTL) Biased PASS PASS PASS PASS P a g e 19 | 42 LINEAR TECHNOLOGY CORPORATION TID LDR RH117H W10905063.1 W10 Min. Load Current (mA) @ VIN - VOUT = 40V 5.50 5.00 Specification MAX 4.50 Ps90%/90% (+KTL) Biased 4.00 Ps90%/90% (+KTL) All GND'd 3.50 Average All GND'd 3.00 Average Biased 2.50 2.00 Ps90%/90% (-KTL) All GND'd 1.50 Ps90%/90% (-KTL) Biased 1.00 0 10 20 30 40 50 60 Total Dose (Krads(Si)) Figure 5.8: Plot of Minimum Load Current versus Total Dose P a g e 20 | 42 LINEAR TECHNOLOGY CORPORATION TID LDR RH117H W10905063.1 W10 Table 5.8: Raw data table for minimum load current versus total dose including the statistical calculations, maximum specification, and the status of the test (PASS/FAIL) Parameter Min. Load Current @ VI - VO = 40V Units (mA) 770 All GND'd Irradiation 771 All GND'd Irradiation 772 All GND'd Irradiation 773 All GND'd Irradiation 774 All GND'd Irradiation 765 Biased Irradiation 766 Biased Irradiation 767 Biased Irradiation 768 Biased Irradiation 769 Biased Irradiation 723 Control Unit 724 Control Unit All GND'd Irradiation Statistics Average All GND'd Std Dev All GND'd Ps90%/90% (+KTL) All GND'd Ps90%/90% (-KTL) All GND'd Biased Irradiation Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status (Measurements) All GND'd Status (Measurements) Biased Specification MAX Status (Measurements) All GND'd Status (Measurements) Biased Total Dose (Krads(Si)) @ 10 mrads/s 0 1.72664 1.87605 1.66874 1.66432 1.78264 1.58402 1.81258 1.76009 1.84115 1.63019 1.91924 1.61023 11 1.74779 1.89191 1.68207 1.67637 1.78494 1.59762 1.79877 1.73304 1.88176 1.62930 1.92592 1.62165 22 1.74851 1.88427 1.68821 1.66064 1.79360 1.64130 1.90818 1.80517 1.88495 1.64639 1.95288 1.66574 31 1.75266 1.89643 1.68689 1.66808 1.79570 1.64494 1.86582 1.79631 1.89643 1.62460 1.92650 1.62460 50 1.78722 1.91652 1.73774 1.69741 1.85362 1.65791 1.88541 1.79697 1.89517 1.66081 1.95182 1.64815 1.74368 0.08838 1.98601 1.50134 1.75661 0.08829 1.99871 1.51452 1.75504 0.08889 1.99878 1.51131 1.75995 0.09184 2.01177 1.50813 1.79850 0.08804 2.03991 1.55708 1.72560 0.11320 2.03600 1.41521 1.72810 0.11770 2.05084 1.40536 1.77720 0.12760 2.12708 1.42732 1.76562 0.12505 2.10850 1.42274 1.77926 0.11594 2.09718 1.46134 5 PASS PASS 5 PASS PASS 5 PASS PASS 5 PASS PASS Status (-KTL) All GND'd Status (+KTL) All GND'd PASS PASS PASS PASS Status (-KTL) Biased Status (+KTL) Biased PASS PASS PASS PASS P a g e 21 | 42 LINEAR TECHNOLOGY CORPORATION TID LDR RH117H W10905063.1 W10 Current Limit (mA) @ VIN - VOUT = 15V 1300 1200 Ps90%/90% (+KTL) Biased 1100 Ps90%/90% (+KTL) All GND'd 1000 Average All GND'd 900 Average Biased 800 Ps90%/90% (-KTL) All GND'd 700 600 Ps90%/90% (-KTL) Biased 500 Specification MIN 400 0 10 20 30 40 50 60 Total Dose (Krads(Si)) Figure 5.9: Plot of Current Limit @ VIN – VOUT = 15V versus Total Dose P a g e 22 | 42 LINEAR TECHNOLOGY CORPORATION TID LDR RH117H W10905063.1 W10 Table 5.9: Raw data table for current limit @ VIN – VOUT ≤ 15V versus total dose including the statistical calculations, maximum specification, and the status of the test (PASS/FAIL) Parameter Units 770 771 772 773 774 765 766 767 768 769 723 724 Current Limit @ VIN - VOUT = 15V (mA) All GND'd Irradiation All GND'd Irradiation All GND'd Irradiation All GND'd Irradiation All GND'd Irradiation Biased Irradiation Biased Irradiation Biased Irradiation Biased Irradiation Biased Irradiation Control Unit Control Unit All GND'd Irradiation Statistics Average All GND'd Std Dev All GND'd Ps90%/90% (+KTL) All GND'd Ps90%/90% (-KTL) All GND'd Biased Irradiation Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status (Measurements) All GND'd Status (Measurements) Biased Specification MAX Status (Measurements) All GND'd Status (Measurements) Biased Total Dose (Krads(Si)) @ 10 mrads/s 0 1013.014 1046.276 979.865 1007.659 1021.238 950.679 1035.005 985.983 1002.033 978.490 1064.786 989.091 11 1028.922 1060.274 995.167 1022.344 1037.271 969.705 1064.150 1006.035 1023.570 996.391 1062.098 987.601 22 1051.368 1082.367 1014.619 1042.090 1056.048 992.947 1082.638 1027.116 1051.510 1019.332 1063.190 988.392 31 1062.774 1089.179 1025.464 1051.096 1065.340 1006.041 1102.503 1041.761 1064.958 1033.859 1065.885 991.226 50 1093.904 1116.890 1050.642 1075.502 1090.834 1032.232 1133.448 1070.479 1096.445 1059.713 1076.303 999.435 1013.610 23.978 1079.357 947.864 1028.796 23.639 1093.614 963.977 1049.298 24.485 1116.435 982.161 1058.771 23.195 1122.372 995.169 1085.554 24.492 1152.712 1018.397 990.438 31.081 1075.661 905.214 500 PASS PASS 1011.970 35.077 1108.151 915.789 500 PASS PASS 1034.709 33.977 1127.872 941.545 500 PASS PASS 1049.824 36.197 1149.077 950.572 1078.463 38.403 1183.766 973.161 500 PASS PASS Status (-KTL) All GND'd Status (+KTL) All GND'd PASS PASS PASS PASS Status (-KTL) Biased Status (+KTL) Biased PASS PASS PASS PASS P a g e 23 | 42 LINEAR TECHNOLOGY CORPORATION TID LDR RH117H W10905063.1 W10 Current Limit (mA) @ VIN - VOUT = 40V 390 Ps90%/90% (+KTL) Biased 340 Ps90%/90% (+KTL) All GND'd 290 Average All GND'd Average Biased 240 Ps90%/90% (-KTL) All GND'd 190 Ps90%/90% (-KTL) Biased Specification MIN 140 0 10 20 30 40 50 60 Total Dose (Krads(Si)) Figure 5.10: Plot of Current Limit @ VIN – VOUT = 40V versus Total Dose P a g e 24 | 42 LINEAR TECHNOLOGY CORPORATION TID LDR RH117H W10905063.1 W10 Table 5.10: Raw data table for current limit @ VIN – VOUT = 40V versus total dose including the statistical calculations, maximum specification, and the status of the test (PASS/FAIL) Parameter Units 770 771 772 773 774 765 766 767 768 769 723 724 Current Limit @ VIN - VOUT = 40V (mA) All GND'd Irradiation All GND'd Irradiation All GND'd Irradiation All GND'd Irradiation All GND'd Irradiation Biased Irradiation Biased Irradiation Biased Irradiation Biased Irradiation Biased Irradiation Control Unit Control Unit All GND'd Irradiation Statistics Average All GND'd Std Dev All GND'd Ps90%/90% (+KTL) All GND'd Ps90%/90% (-KTL) All GND'd Biased Irradiation Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status (Measurements) All GND'd Status (Measurements) Biased Specification MAX Status (Measurements) All GND'd Status (Measurements) Biased Total Dose (Krads(Si)) @ 10 mrads/s 0 254.206 250.041 235.144 250.977 241.498 225.145 239.931 235.202 239.132 223.863 248.412 226.792 11 270.295 264.817 250.307 265.612 257.305 247.262 274.710 261.588 264.652 247.160 246.006 224.162 22 298.146 291.857 274.999 292.070 282.183 273.760 296.587 285.321 296.672 273.094 251.739 229.397 31 310.452 300.902 284.472 301.150 291.510 287.155 315.097 299.116 309.913 286.693 255.429 233.226 50 327.904 314.118 298.346 312.279 303.295 297.544 328.244 311.661 325.098 295.588 247.790 225.552 246.373 7.840 267.870 224.876 261.667 7.874 283.258 240.076 287.851 9.181 313.025 262.677 297.697 9.976 325.051 270.343 311.188 11.363 342.345 280.032 232.655 7.666 253.676 211.634 150 PASS PASS 259.074 11.868 291.616 226.533 150 PASS PASS 285.087 11.604 316.906 253.268 150 PASS PASS 299.594 12.925 335.035 264.154 311.627 15.109 353.057 270.197 150 PASS PASS Status (-KTL) All GND'd Status (+KTL) All GND'd PASS PASS PASS PASS Status (-KTL) Biased Status (+KTL) Biased PASS PASS PASS PASS P a g e 25 | 42 LINEAR TECHNOLOGY CORPORATION TID LDR RH117H W10905063.1 W10 Appendix A Figure A1: Top View showing ID and Date Code Figure A2: Side View showing serial number P a g e 26 | 42 LINEAR TECHNOLOGY CORPORATION TID LDR RH117H W10905063.1 W10 Appendix B Radiation Bias Connection Tables PIN 1 2 3 Table B1: Biased Conditions FUNCTION INPUT ADJUST OUTPUT CONNECTION / BIAS +15V,to -15V via 0.1µF To -15V via 2KΩ To -15V via 61.9Ω PIN 1 2 3 Table B2: All GND’d FUNCTION INPUT ADJUST OUTPUT CONNECTION / BIAS Ground Ground Ground P a g e 27 | 42 LINEAR TECHNOLOGY CORPORATION TID LDR RH117H W10905063.1 W10 Figure B1: Total Dose Bias Circuit Figure B2: Pin-Out P a g e 28 | 42 LINEAR TECHNOLOGY CORPORATION TID LDR RH117H W10905063.1 W10 Figure B3: Bias Board (top view) Figure B4: Bias Board (bottom view) P a g e 29 | 42 LINEAR TECHNOLOGY CORPORATION TID LDR RH117H W10905063.1 W10 Appendix C P a g e 30 | 42 LINEAR TECHNOLOGY CORPORATION TID LDR RH117H W10905063.1 W10 P a g e 31 | 42 LINEAR TECHNOLOGY CORPORATION TID LDR RH117H W10905063.1 W10 P a g e 32 | 42 LINEAR TECHNOLOGY CORPORATION TID LDR RH117H W10905063.1 W10 P a g e 33 | 42 LINEAR TECHNOLOGY CORPORATION TID LDR RH117H W10905063.1 W10 P a g e 34 | 42 LINEAR TECHNOLOGY CORPORATION TID LDR RH117H W10905063.1 W10 P a g e 35 | 42 LINEAR TECHNOLOGY CORPORATION TID LDR RH117H W10905063.1 W10 P a g e 36 | 42 LINEAR TECHNOLOGY CORPORATION TID LDR RH117H W10905063.1 W10 P a g e 37 | 42 LINEAR TECHNOLOGY CORPORATION TID LDR RH117H W10905063.1 W10 P a g e 38 | 42 LINEAR TECHNOLOGY CORPORATION TID LDR RH117H W10905063.1 W10 P a g e 39 | 42 LINEAR TECHNOLOGY CORPORATION TID LDR RH117H W10905063.1 W10 P a g e 40 | 42 LINEAR TECHNOLOGY CORPORATION TID LDR RH117H W10905063.1 W10 Appendix D Table D1: Pre-Irradiation Electrical Characteristics of Device-Under-Test P a g e 41 | 42 LINEAR TECHNOLOGY CORPORATION TID LDR RH117H W10905063.1 W10 Table D2: Post-Irradiation Electrical Characteristics of Device-Under-Test P a g e 42 | 42 LINEAR TECHNOLOGY CORPORATION