Final Product/Process Change Notification Document # : FPCN21060ZA Issue Date: 22 October 2015 Title of Change: Pd-coated Cu wire qualification on SOT23 transistor and Bias Resistor Transistor at ON Semiconductor, Leshan, China facility Proposed first ship date: 22 October 2016 or earlier upon customer approval Contact information: Contact your local ON Semiconductor Sales Office or <[email protected]> Samples: Contact your local ON Semiconductor Sales Office or <[email protected]> Additional Reliability Data: Contact your local ON Semiconductor Sales Office or <[email protected]> Type of notification: This is a Final Product/Process Change Notification (FPCN) sent to customers. FPCNs are issued 12 month prior to implementation of the change. ON Semiconductor will consider this change accepted, unless an inquiry is made in writing within 30 days of delivery of this notice. To do so, contact <[email protected]>. Change Part Identification: At the expiration of this FPCN devices will be assembled with Pd-coated Cu Wire at ON Semiconductor’s existing Leshan facility. Products assembled with Pd-coated Cu Wire from the ON Semiconductor facility will have a Finish Goods Date Code of WW39, 2016 or greater Change category: Wafer Fab Change Change Sub-Category(s): Manufacturing Site Change/Addition Manufacturing Process Change Sites Affected: All site(s) not applicable Assembly Change Test Change Other _______________ Material Change Product specific change Datasheet/Product Doc change Shipping/Packaging/Marking Other: _______________________ ON Semiconductor site(s) : ON Leshan, China External Foundry/Subcon site(s) Description and Purpose: ON Semiconductor is notifying customer of its use of Pd-coated Cu wire for their impacted devices at ON Semiconductor’s Leshan, China facility. Discrete products built with bipolar transistor are represented by this Process Change Notice. At the expiration of this PCN, these devices will be built with Pd-coated Cu wire at the same site. Datasheet specifications and product electrical performance remain unchanged. Full electrical characterization over temperature has been performed. Reliability Data Summary: SOT23 BCX19LT1G Test Specification Condition Interval Results HTRB JESD22-A108 Ta= 150°C, 80% max rated V 1008 hrs 0/252 HTSL JESD22-A103 Ta= 150C 1008 hrs 0/252 MIL-STD-750 Ta=+25°C, delta Tj=100°C (M1037) On/off = 2 min 15000 cyc 0/252 IOL AEC-Q101 TC JESD22-A104 Ta= - 65°C to +150°C 1000 cyc 0/252 HAST JESD22-A110 130°C, 85% RH, 18.8psig, bias 96 hrs 0/252 AC JESD22-A102 121°C, 100% RH, ~15psig, unbiased 96 hrs 0/252 RSH JESD22- B106 Ta = 265C, 10 sec TEM001092 Rev. E 0/90 Page 1 of 2 Final Product/Process Change Notification Document # : FPCN21060ZA Issue Date: 22 October 2015 SOT23 MMBT2907ALT1G Test Specification Condition Interval Results HTRB JESD22-A108 Ta= 150°C, 80% max rated V 1008 hrs 0/252 HTSL JESD22-A103 Ta= 150C 1008 hrs 0/252 MIL-STD-750 Ta=+25°C, delta Tj=100°C (M1037) On/off = 2 min 15000 cyc 0/252 IOL AEC-Q101 TC JESD22-A104 Ta= - 65°C to +150°C 1000 cyc 0/252 HAST JESD22-A110 130°C, 85% RH, 18.8psig, bias 96 hrs 0/252 AC JESD22-A102 121°C, 100% RH, ~15psig, unbiased 96 hrs 0/252 RSH JESD22- B106 Ta = 265C, 10 sec 0/90 Electrical Characteristic Summary: Three temperature characterization and ESD performance meet datasheet specification. Detail of Electrical characterization result is available upon request. List of Affected Standard Parts: TEM001092 Rev. E Part Number Qualification Vehicle NSVMMUN2235LT1G BCX19LT1G NSVMMUN2233LT3G BCX19LT1G NSVMMUN2135LT1G MMBT2907ALT1G NSVMMBT5401LT3G MMBT2907ALT1G NSVMMBT5088LT3G BCX19LT1G NSVMMBT5087LT1G MMBT2907ALT1G NSVBC857BLT3G MMBT2907ALT1G NSVBC850CLT1G BCX19LT1G NSVBC850BLT1G BCX19LT1G NSVBC847BLT3G BCX19LT1G NSVBC817-16LT1G BCX19LT1G NSVBCX17LT1G MMBT2907ALT1G NSVBCW68GLT1G MMBT2907ALT1G NSVBCW32LT1G BCX19LT1G NSVMMUN2230LT1G BCX19LT1G NSVMMUN2113LT3G MMBT2907ALT1G NSVMMUN2114LT3G MMBT2907ALT1G NSVMMBT5087LT3G MMBT2907ALT1G NSVMMBTA05LT1G BCX19LT1G Page 2 of 2