View detail for AT28C256 Reliability Qualification Report

PAGE 1 OF 10
ATMEL CORPORATION
Tel:(408)441-0311
Fax:(408)436-4200
AT-28C256 CMOS EEPROM RELIABILITY DATA
-150C DYNAMIC OPERATING LIFE TEST
-CYCLE TEST
-200C RETENTION BAKE
-125C DYNAMIC OPERATING LIFE TEST (PLASTIC)
-150C RETENTION BAKE (PLASTIC)
-15 PSIG PRESSURE POT
-85C/85% RELATIVE HUMIDITY OPERATING LIFE TEST
-EXTENDED TEMPERATURE CYCLING
-131°C/85% RELATIVE HUMIDITY HAST TEST
This report was generated from AT-28C256 reliability testing.
This data is applicable to the following device types due to same
technology grouping as defined in MIL-M38535 Appendix A:
AT-28C010
AT-28C040
OCTOBER 2008
2325 Orchard Parkway San Jose CA. 95131
PAGE 2 OF 10
AT-28C256
150C DYNAMIC OPERATING LIFE TEST
LOT
NUMBER
345-1
81077
81846
81411
83474
81442
83029
84130-2
82307
82624
84285
85663
97673
04692
05940
130909
133028
133382-2
232139B2
232139B
139420-2
3A0258-4
3A0258-1
3B0680
4A1283
4B1973
4C1251
5B0106
6C1587
6D1789
6D1660
6G3784
7L1517
7L6329
7B2000
7L6263
DATE
CODE
SAMPLE
SIZE
8737
8830
8C8832
8831
8C8845
8C8830
8C8841
8850
8840
8837
8D8908
9A8922
9C8948
0D9043
1A9117
1C9142
1D9150
1D9151
2C9230
2C9232
2C9234
3A9310
3B9323
3B9329
4A9420
4B9431
4C9442
5B9526
6C9638
6D9701
6D9701
6G9708
7L9740
7L9732
7B9729
7L9729
TOTAL DEVICE HOURS
BEST ESTIMATE
50C AMBIENT
CONFIDENCE ESTIMATE
TOTAL
CKT-HRS(K)
77
77.0
77
77.0
78
78.0
77
77.0
78
78.0
77
77.0
78
78.0
94
94.0
78
78.0
77
77.0
78
78.0
77
77.0
77
77.0
77
77.0
77
77.0
27
27.0
78
78.0
78
78.0
77
77.0
27
27.0
77
77.0
80
80.0
77
77.0
157
157.0
80
200.0
80
80.0
320
800.0
79
79.0
79
79.0
80
80.0
79
79.0
155
155.0
59
59.0
80
80.0
80
80.0
80
80.0
FAILURE RATE




NUMBER
OF FAILURES
0
0
0
0
0
0
0
0
0
0 (6.5V)
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
3,706,000 DEVICE HOURS
= 0.02% PER 1,000 HOURS
EXTRAPOLATION TO 50C VIA ARRHENNIUS
EQUATION AND ACTIVATION ENERGY OF 0.5eV
= 0.0002% PER 1,000 HOURS (3 FITS)
60 = 0.0004% PER 1,000 HOURS
60% CONFIDENCE (4 FITS)
90 = 0.001% PER 1,000 HOURS
90% CONFIDENCE (9 FITS)
PAGE 3 OF 10
AT-28C256
200C RETENTION BAKE
200C BAKE
LOT
NUMBER
82624
81845
83991
92490
97878
131374-1
130909
3B0680
4A1283
5A2526
5B0106
5B2247
6C1587
6D1789
6D1660
6D3784-1
7B2000
7L6329
7L6263
DATE
CODE
8837
8836
8D8904
9C8933
9D9006
1B9128
1C9142
3B9329
4A9420
5A9523
5B9526
5B9531
6C9638
6D9701
6D9701
6D9708
7B9729
7L9732
7L9729
DEVICES WITH ALL ZEROES OR WITH ALL ONES
SAMPLE
SIZE
@24
77
77
45
79
77
77
34
124
79
78
80
80
80
80
80
79
80
80
80
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
NUMBER OF FAILURES
@168
@500
@1000Hrs
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
FAILURE RATE
TOTAL DEVICE HOURS
BEST ESTIMATE
1,466,000 DEVICE HOURS

= 0.05% PER 1000 HOURS

EXTRAPOLATION TO 50C VIA ARRHENNIUS
EQUATION AND ACTIVATION ENERGY OF 0.5eV
= 0.0002% 1000 HOURS (2 FITS)
50C AMBIENT
CONFIDENCE ESTIMATE


60 = 0.0003% PER 1000 HOURS
60% CONFIDENCE (2 FITS)
90 = 0.0006% PER 1000 HOURS
90% CONFIDENCE (5 FITS)
PAGE 4 OF 10
Data cycling followed by 200C bakes were performed to determine the device
endurance. Each address was byte cycled through all addresses. The parts
were baked and then verified. The results of the cycling tests are shown
below. No device failures have been found.
CYCLE TEST RESULTS OF AT-28C256
LOT
NUMBER
DATE
CODE
SAMPLE
SIZE
NO. OF
BYTE CYCLE
NO. OF
FAILURES
BAKE
TEMP
BAKE
TIME
80844
8831
80
10,000
0
200C
24 Hrs
81077
8830
77
10,000
0
200C
176 Hrs
84285
8D8908
77
100,000
0
200C
176 Hrs
81900
9B8930
77
100,000
0
200C
176 Hrs
97673
9C8948
73
100,000
0
200C
176 Hrs
03134
0D9046
77
100,000
0
200C
176 Hrs
6D1789
6D9701
86
100,000
0
150C
176 Hrs
7D2729
7D9816
64
10,000
0
150°C
176 Hrs
8B0847L
8B9908
50
10,000
0
150°C
176 Hrs
PAGE 5 OF 10
AT-28C256
PLASTIC PACKAGE
125C DYNAMIC OPERATING LIFE TEST
LOT
NUMBER
92750
94738
97964
90961
3A0258
4B2335
6D1549
6D3784
7D1856
7D2729
8A3027-1
8H0730-3
8B0847
8B0844-1
9J1925
1G4848
2E2987
1C0960-3
3E5909
3G2705-1
3H0193
3H1593
4E7098
6F6500A
8F5444-1
DATE
CODE
SAMPLE
SIZE
TOTAL
CKT-HRS(K)
NUMBER
OF FAILURES
350
77
75
77
77
620
80
499
613
300
100
100
200
100
100
100
100
100
100
100
100
100
100
100
77
100
350.0
77.0
75.0
77.0
77.0
720.0
80.0
499.0
613.0
300.0
100.0
100.0
200.0
100.0
100.0
100.0
100.0
100.0
100.0
100.0
100.0
100.0
100.0
100.0
77.0
100.0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
9A8940
9C8933
9C9001
9D9004
0A9013
3A9315
4C9440
6D9703
6D9709
7D9814
7D9816
8A9832
8H9839
8B9908
8B9901
9J0002
1G0136
2E0232
1C0302
3E0323
3G0338
3H0336
3H0424
4E0423
6F0618
8F0818
FAILURES RATE
TOTAL DEVICE HOURS
BEST ESTIMATE
5,545,000 DEVICE HOURS

50C AMBIENT

CONFIDENCE ESTIMATE


= 0.01% PER 1,000 HOURS
EXTRAPOLATION TO 50C VIA ARRHENNIUS
EQUATION AND ACTIVATION ENERGY OF 0.5eV
= 0.0005% PER 1,000 HOURS (4 FITS)
60 = 0.001% PER 1,000 HOURS
60 CONFIDENCE (6 FITS)
90 = 0.002% PER 1,000 HOURS
90% CONFIDENCE (14 FITS)
PAGE 6 OF 10
AT-28C256
PLASTIC PACKAGE
150C RETENTION BAKE
LOT
NUMBER
3A0258
4B2335
7C2459A
7D1856
7D2729
8A3027-1
8H0730-3
8B0844-1
8B0847
9J1925
1G4848
2E2987
1C0960-3
3E5905
3G2705-1
3H0193
3H1593
4E7098-12
6F6500A
DATE
CODE
3A9315
4C9440
7C9746
7D9814
7D9816
8A9832
8H9839
8B9901
8B9908
9J0002
1G0136
2E0232
1C0302
3E0323
3G0338
3H0336
3H0424
4E0423
6F0618
PACKAGE
TYPE
28
28
28
28
32
32
28
28
32
28
28
32
28
32
28
32
28
32
28
SAMPLE
SIZE
PDIP
TSOP
TSOP
TSOP
PLCC
PLCC
PDIP
TSOP
PLCC
TSOP
TSOP
PLCC
SOIC
PLCC
SOIC
PLCC
SOIC
PLCC
PDIP
148
77
80
50
100
100
300
100
50
50
50
50
200
50
100
100
50
50
77
TOTAL
CKT-HRS(K)
NUMBER
OF FAILURES
148.0
77.0
80.0
50.0
100.O
100.0
300.0
100.0
50.0
50.0
50.0
50.0
200.0
50.0
100.0
100.0
50.0
50.0
77.0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
FAILURE RATE
TOTAL DEVICE HOURS
BEST ESTIMATE
1,782,000 DEVICE HOURS

= 0.04% PER 1,000 HOURS

EXTRAPOLATION TO 50C VIA ARRHENNIUS
EQUATION AND ACTIVATION ENERGY OF 0.5eV
= 0.0006% PER 1,000 HOURS (6 FITS)
50C AMBIENT
CONFIDENCE ESTIMATE


60 = 0.0008% PER 1,000 HOURS
60% CONFIDENCE (7 FITS)
90 = 0.002% PER 1,000 HOURS
90% CONFIDENCE (18 FITS)
PAGE 7 OF 10
AT-28C256
PLASTIC PACKAGE
PRESSURE POT TEST
DATE
CODE
PKG
TYPE
SAMPLE
SIZE
NUMBER OF FAILURES
AT INDICATED HOURS
(24)
8828
8C8839
9D9002
0A9013
1A9117
3A9314
3A9315
3B9336
4B9436
7C9746
7D9814
7D9816
8A9832
8B0844-1
8B0847
9J0002
1G0136
2E0232
1C0302
3E0319
3E0320
3E0323
3G0338
3H0336
3H0424
4E0423
8F0818
32
28
32
28
32
32
28
32
28
28
28
32
32
28
32
28
28
32
28
32
32
32
28
32
28
32
32
PLCC
PDIP
PLCC
PDIP
PLCC
PLCC
PDIP
PLCC
TSOP
TSOP
TSOP
PLCC
PLCC
TSOP
PLCC
TSOP
TSOP
PLCC
SOIC
PLCC
PLCC
PLCC
SOIC
PLCC
SOIC
PLCC
PLCC
50
42
45
45
45
45
45
45
123
150
50
50
50
49
50
50
50
50
50
44
50
50
77
77
50
50
77
0
0
1
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
(48)
(72)
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
(96)
0
0
0 (LEAKAGE)
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
PAGE 8 OF 10
AT-28C256
PLASTIC PACKAGE
85C/85% RELATIVE HUMIDITY OPERATING LIFE TEST
LOT
NUMBER
DATE
CODE
PKG
TYPE
SAMPLE
SIZE
NUMBER OF FAILURES
AT INDICATED HOURS
(168)
(500)
(1000)
3A0258
3B9323
32 PLCC
45
0
0
0
4B2335
4B9436
28 TSOP
77
0
0
0
6D2033
6D9703
32 PLCC
100
0
0
0
PAGE 9 OF 10
AT-28C256
PLASTIC PACKAGE
EXTENDED TEMPERATURE CYCLE
-65C to +150CPLCC/TSOP/SOIC/PDIP
-55°C to +125°C CBGA
DATE
CODE
PKG
TYPE
SAMPLE
SIZE
NUMBER
OF CYCLES
NUMBER
OF FAILURES
6D9703
32 PLCC
80
1000
0
7D9814
28 TSOP
50
1000
0
7D9816
32 PLCC
50
1000
0
8A9832
32 PLCC
50
1000
0
9J0002
28 TSOP
50
1000
0
1J0136
28 TSOP
50
1000
0
2E0232
32 PLCC
50
1000
0
1C0302
28 SOIC
50
1000
0
3E0319
32 PLCC
100
1000
0
3E0323
32 PLCC
100
1000
0
3G0338
28 SOIC
77
1000
0
3H0336
32 PLCC
77
1000
0
3H0424
28 SOIC
50
1000
0
4E0423
32 PLCC
50
1000
0
PAGE 10 OF 10
AT-28C256
PLASTIC PACKAGE
131°C/85% RELATIVE HUMIDITY HAST TEST
DATE
CODE
PKG
TYPE
SAMPLE
SIZE
NUMBER
OF HOURS
NUMBER
OF FAILURES
1G0136
28 TSOP
50
100
0
2E0232
32 PLCC
50
100
0
1C0302
28 SOIC
50
100
0
3E0323
32 PLCC
50
100
0
3H0336
32 PLCC
77
100
0
3H0424
28 SOIC
50
100
0
4E0423
32 PLCC
50
100
0
8F0818
32 PLCC
77
96
0