PAGE 1 OF 10 ATMEL CORPORATION Tel:(408)441-0311 Fax:(408)436-4200 AT-28C256 CMOS EEPROM RELIABILITY DATA -150C DYNAMIC OPERATING LIFE TEST -CYCLE TEST -200C RETENTION BAKE -125C DYNAMIC OPERATING LIFE TEST (PLASTIC) -150C RETENTION BAKE (PLASTIC) -15 PSIG PRESSURE POT -85C/85% RELATIVE HUMIDITY OPERATING LIFE TEST -EXTENDED TEMPERATURE CYCLING -131°C/85% RELATIVE HUMIDITY HAST TEST This report was generated from AT-28C256 reliability testing. This data is applicable to the following device types due to same technology grouping as defined in MIL-M38535 Appendix A: AT-28C010 AT-28C040 OCTOBER 2008 2325 Orchard Parkway San Jose CA. 95131 PAGE 2 OF 10 AT-28C256 150C DYNAMIC OPERATING LIFE TEST LOT NUMBER 345-1 81077 81846 81411 83474 81442 83029 84130-2 82307 82624 84285 85663 97673 04692 05940 130909 133028 133382-2 232139B2 232139B 139420-2 3A0258-4 3A0258-1 3B0680 4A1283 4B1973 4C1251 5B0106 6C1587 6D1789 6D1660 6G3784 7L1517 7L6329 7B2000 7L6263 DATE CODE SAMPLE SIZE 8737 8830 8C8832 8831 8C8845 8C8830 8C8841 8850 8840 8837 8D8908 9A8922 9C8948 0D9043 1A9117 1C9142 1D9150 1D9151 2C9230 2C9232 2C9234 3A9310 3B9323 3B9329 4A9420 4B9431 4C9442 5B9526 6C9638 6D9701 6D9701 6G9708 7L9740 7L9732 7B9729 7L9729 TOTAL DEVICE HOURS BEST ESTIMATE 50C AMBIENT CONFIDENCE ESTIMATE TOTAL CKT-HRS(K) 77 77.0 77 77.0 78 78.0 77 77.0 78 78.0 77 77.0 78 78.0 94 94.0 78 78.0 77 77.0 78 78.0 77 77.0 77 77.0 77 77.0 77 77.0 27 27.0 78 78.0 78 78.0 77 77.0 27 27.0 77 77.0 80 80.0 77 77.0 157 157.0 80 200.0 80 80.0 320 800.0 79 79.0 79 79.0 80 80.0 79 79.0 155 155.0 59 59.0 80 80.0 80 80.0 80 80.0 FAILURE RATE NUMBER OF FAILURES 0 0 0 0 0 0 0 0 0 0 (6.5V) 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 3,706,000 DEVICE HOURS = 0.02% PER 1,000 HOURS EXTRAPOLATION TO 50C VIA ARRHENNIUS EQUATION AND ACTIVATION ENERGY OF 0.5eV = 0.0002% PER 1,000 HOURS (3 FITS) 60 = 0.0004% PER 1,000 HOURS 60% CONFIDENCE (4 FITS) 90 = 0.001% PER 1,000 HOURS 90% CONFIDENCE (9 FITS) PAGE 3 OF 10 AT-28C256 200C RETENTION BAKE 200C BAKE LOT NUMBER 82624 81845 83991 92490 97878 131374-1 130909 3B0680 4A1283 5A2526 5B0106 5B2247 6C1587 6D1789 6D1660 6D3784-1 7B2000 7L6329 7L6263 DATE CODE 8837 8836 8D8904 9C8933 9D9006 1B9128 1C9142 3B9329 4A9420 5A9523 5B9526 5B9531 6C9638 6D9701 6D9701 6D9708 7B9729 7L9732 7L9729 DEVICES WITH ALL ZEROES OR WITH ALL ONES SAMPLE SIZE @24 77 77 45 79 77 77 34 124 79 78 80 80 80 80 80 79 80 80 80 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 NUMBER OF FAILURES @168 @500 @1000Hrs 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 FAILURE RATE TOTAL DEVICE HOURS BEST ESTIMATE 1,466,000 DEVICE HOURS = 0.05% PER 1000 HOURS EXTRAPOLATION TO 50C VIA ARRHENNIUS EQUATION AND ACTIVATION ENERGY OF 0.5eV = 0.0002% 1000 HOURS (2 FITS) 50C AMBIENT CONFIDENCE ESTIMATE 60 = 0.0003% PER 1000 HOURS 60% CONFIDENCE (2 FITS) 90 = 0.0006% PER 1000 HOURS 90% CONFIDENCE (5 FITS) PAGE 4 OF 10 Data cycling followed by 200C bakes were performed to determine the device endurance. Each address was byte cycled through all addresses. The parts were baked and then verified. The results of the cycling tests are shown below. No device failures have been found. CYCLE TEST RESULTS OF AT-28C256 LOT NUMBER DATE CODE SAMPLE SIZE NO. OF BYTE CYCLE NO. OF FAILURES BAKE TEMP BAKE TIME 80844 8831 80 10,000 0 200C 24 Hrs 81077 8830 77 10,000 0 200C 176 Hrs 84285 8D8908 77 100,000 0 200C 176 Hrs 81900 9B8930 77 100,000 0 200C 176 Hrs 97673 9C8948 73 100,000 0 200C 176 Hrs 03134 0D9046 77 100,000 0 200C 176 Hrs 6D1789 6D9701 86 100,000 0 150C 176 Hrs 7D2729 7D9816 64 10,000 0 150°C 176 Hrs 8B0847L 8B9908 50 10,000 0 150°C 176 Hrs PAGE 5 OF 10 AT-28C256 PLASTIC PACKAGE 125C DYNAMIC OPERATING LIFE TEST LOT NUMBER 92750 94738 97964 90961 3A0258 4B2335 6D1549 6D3784 7D1856 7D2729 8A3027-1 8H0730-3 8B0847 8B0844-1 9J1925 1G4848 2E2987 1C0960-3 3E5909 3G2705-1 3H0193 3H1593 4E7098 6F6500A 8F5444-1 DATE CODE SAMPLE SIZE TOTAL CKT-HRS(K) NUMBER OF FAILURES 350 77 75 77 77 620 80 499 613 300 100 100 200 100 100 100 100 100 100 100 100 100 100 100 77 100 350.0 77.0 75.0 77.0 77.0 720.0 80.0 499.0 613.0 300.0 100.0 100.0 200.0 100.0 100.0 100.0 100.0 100.0 100.0 100.0 100.0 100.0 100.0 100.0 77.0 100.0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 9A8940 9C8933 9C9001 9D9004 0A9013 3A9315 4C9440 6D9703 6D9709 7D9814 7D9816 8A9832 8H9839 8B9908 8B9901 9J0002 1G0136 2E0232 1C0302 3E0323 3G0338 3H0336 3H0424 4E0423 6F0618 8F0818 FAILURES RATE TOTAL DEVICE HOURS BEST ESTIMATE 5,545,000 DEVICE HOURS 50C AMBIENT CONFIDENCE ESTIMATE = 0.01% PER 1,000 HOURS EXTRAPOLATION TO 50C VIA ARRHENNIUS EQUATION AND ACTIVATION ENERGY OF 0.5eV = 0.0005% PER 1,000 HOURS (4 FITS) 60 = 0.001% PER 1,000 HOURS 60 CONFIDENCE (6 FITS) 90 = 0.002% PER 1,000 HOURS 90% CONFIDENCE (14 FITS) PAGE 6 OF 10 AT-28C256 PLASTIC PACKAGE 150C RETENTION BAKE LOT NUMBER 3A0258 4B2335 7C2459A 7D1856 7D2729 8A3027-1 8H0730-3 8B0844-1 8B0847 9J1925 1G4848 2E2987 1C0960-3 3E5905 3G2705-1 3H0193 3H1593 4E7098-12 6F6500A DATE CODE 3A9315 4C9440 7C9746 7D9814 7D9816 8A9832 8H9839 8B9901 8B9908 9J0002 1G0136 2E0232 1C0302 3E0323 3G0338 3H0336 3H0424 4E0423 6F0618 PACKAGE TYPE 28 28 28 28 32 32 28 28 32 28 28 32 28 32 28 32 28 32 28 SAMPLE SIZE PDIP TSOP TSOP TSOP PLCC PLCC PDIP TSOP PLCC TSOP TSOP PLCC SOIC PLCC SOIC PLCC SOIC PLCC PDIP 148 77 80 50 100 100 300 100 50 50 50 50 200 50 100 100 50 50 77 TOTAL CKT-HRS(K) NUMBER OF FAILURES 148.0 77.0 80.0 50.0 100.O 100.0 300.0 100.0 50.0 50.0 50.0 50.0 200.0 50.0 100.0 100.0 50.0 50.0 77.0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 FAILURE RATE TOTAL DEVICE HOURS BEST ESTIMATE 1,782,000 DEVICE HOURS = 0.04% PER 1,000 HOURS EXTRAPOLATION TO 50C VIA ARRHENNIUS EQUATION AND ACTIVATION ENERGY OF 0.5eV = 0.0006% PER 1,000 HOURS (6 FITS) 50C AMBIENT CONFIDENCE ESTIMATE 60 = 0.0008% PER 1,000 HOURS 60% CONFIDENCE (7 FITS) 90 = 0.002% PER 1,000 HOURS 90% CONFIDENCE (18 FITS) PAGE 7 OF 10 AT-28C256 PLASTIC PACKAGE PRESSURE POT TEST DATE CODE PKG TYPE SAMPLE SIZE NUMBER OF FAILURES AT INDICATED HOURS (24) 8828 8C8839 9D9002 0A9013 1A9117 3A9314 3A9315 3B9336 4B9436 7C9746 7D9814 7D9816 8A9832 8B0844-1 8B0847 9J0002 1G0136 2E0232 1C0302 3E0319 3E0320 3E0323 3G0338 3H0336 3H0424 4E0423 8F0818 32 28 32 28 32 32 28 32 28 28 28 32 32 28 32 28 28 32 28 32 32 32 28 32 28 32 32 PLCC PDIP PLCC PDIP PLCC PLCC PDIP PLCC TSOP TSOP TSOP PLCC PLCC TSOP PLCC TSOP TSOP PLCC SOIC PLCC PLCC PLCC SOIC PLCC SOIC PLCC PLCC 50 42 45 45 45 45 45 45 123 150 50 50 50 49 50 50 50 50 50 44 50 50 77 77 50 50 77 0 0 1 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 (48) (72) 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 (96) 0 0 0 (LEAKAGE) 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 PAGE 8 OF 10 AT-28C256 PLASTIC PACKAGE 85C/85% RELATIVE HUMIDITY OPERATING LIFE TEST LOT NUMBER DATE CODE PKG TYPE SAMPLE SIZE NUMBER OF FAILURES AT INDICATED HOURS (168) (500) (1000) 3A0258 3B9323 32 PLCC 45 0 0 0 4B2335 4B9436 28 TSOP 77 0 0 0 6D2033 6D9703 32 PLCC 100 0 0 0 PAGE 9 OF 10 AT-28C256 PLASTIC PACKAGE EXTENDED TEMPERATURE CYCLE -65C to +150CPLCC/TSOP/SOIC/PDIP -55°C to +125°C CBGA DATE CODE PKG TYPE SAMPLE SIZE NUMBER OF CYCLES NUMBER OF FAILURES 6D9703 32 PLCC 80 1000 0 7D9814 28 TSOP 50 1000 0 7D9816 32 PLCC 50 1000 0 8A9832 32 PLCC 50 1000 0 9J0002 28 TSOP 50 1000 0 1J0136 28 TSOP 50 1000 0 2E0232 32 PLCC 50 1000 0 1C0302 28 SOIC 50 1000 0 3E0319 32 PLCC 100 1000 0 3E0323 32 PLCC 100 1000 0 3G0338 28 SOIC 77 1000 0 3H0336 32 PLCC 77 1000 0 3H0424 28 SOIC 50 1000 0 4E0423 32 PLCC 50 1000 0 PAGE 10 OF 10 AT-28C256 PLASTIC PACKAGE 131°C/85% RELATIVE HUMIDITY HAST TEST DATE CODE PKG TYPE SAMPLE SIZE NUMBER OF HOURS NUMBER OF FAILURES 1G0136 28 TSOP 50 100 0 2E0232 32 PLCC 50 100 0 1C0302 28 SOIC 50 100 0 3E0323 32 PLCC 50 100 0 3H0336 32 PLCC 77 100 0 3H0424 28 SOIC 50 100 0 4E0423 32 PLCC 50 100 0 8F0818 32 PLCC 77 96 0