HEF4047B Monostable/astable multivibrator Rev. 5 — 16 December 2015 Product data sheet 1. General description The HEF4047B consists of a gatable astable multivibrator incorporating logic techniques to permit positive or negative edge-triggered monostable multivibrator action with retriggering and external counting options. Inputs include +TRIGGER, -TRIGGER, ASTABLE, ASTABLE, RETRIGGER and MR (master reset). Buffered outputs are O, O and OSCILLATOR OUTPUT. In all modes of operation an external capacitor (Ct) must be connected between CTC and RCTC, and an external resistor (Rt) must be connected between RTC and RCTC. A HIGH level on the ASTABLE input enables astable operation. The period of the square wave at O and O outputs is a function of the external components employed. ‘True’ input pulses on the ASTABLE or ‘complement’ pulses on the ASTABLE input, allow the circuit to be used as a gatable multivibrator. The OSCILLATOR OUTPUT period is half of the O output in the astable mode. However, a 50% duty factor is not guaranteed at this output. In the monostable mode, positive edge-triggering is accomplished by applying a leading-edge pulse to the +TRIGGER input and a LOW level to the TRIGGER input. For negative edge-triggering, a trailing-edge pulse is applied to the TRIGGER and a HIGH level to the +TRIGGER. Input pulses may be of any duration relative to the output pulse. The multivibrator can be retriggered (on the leading-edge only) by applying a common pulse to both the RETRIGGER and +TRIGGER inputs. In this mode, the output pulse remains HIGH as long as the input pulse period is shorter than the period determined by the RC components. An external count down option implements coupling O to an external ‘N’ counter and resetting the counter with the trigger pulse. The counter output pulse is fed back to the ASTABLE input and has a duration equal to N times the period of the multivibrator. A HIGH level on the MR input assures no output pulse during an ON-power condition. This input can also be activated to terminate the output pulse at any time. In the monostable mode, a HIGH level or power-ON reset pulse must be applied to MR, whenever VDD is applied. 2. Features and benefits 2.1 General Monostable (one-shot) or astable (free-running) operation True and complemented buffered outputs Only one external resistor and capacitor required HEF4047B NXP Semiconductors Monostable/astable multivibrator 2.2 Monostable multivibrator Positive- or negative-edge triggering Output pulse width independent of trigger pulse duration Retriggerable option for pulse-width expansion Long pulse width possible using small RC components with external counter provision Fast recovery time independent of pulse width Pulse-width accuracy maintained at duty cycles approaching 100% 2.3 Astable multivibrator Free-running or gatable operating modes 50% duty cycle Oscillator output available 3. Ordering information Table 1. Ordering information Type number HEF4047BT Package Name Description Version SO14 plastic small outline package; 14 leads; body width 3.9 mm SOT108-1 4. Functional diagram 5W &W $67$%/( $67$%/( 5&7& &7& 57& $67$%/( *$7( &21752/ 5(75,**(5 &21752/ $67$%/( 08/7, 9,%5$725 75,**(5 75,**(5 26&,//$725 287387 021267$%/( &21752/ )5(48(1&< ',9,'(5 · 5(75,**(5 2 2 05 DDD Fig 1. Functional diagram HEF4047B Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 5 — 16 December 2015 © NXP Semiconductors N.V. 2015. All rights reserved. 2 of 20 HEF4047B NXP Semiconductors Monostable/astable multivibrator 9'' 5&7& $67$%/( $67$%/( 75,**(5 &7& 75,**(5 2 ' 57& )) &3 26&,//$725 287387 &' &' 6' 966 6' 2 ' 2 ' )) )) 5(75,**(5 ' &3 &3 2 2 2 &3 2 &' 2 )) 2 &' &' &' 05 DDD (1) Special input protection that allows operating input voltages outside the supply voltage lines. Compared to the standard input protection pin 3 (RCTC) is more sensitive to static discharge; extra handling precautions are recommended. Fig 2. Logic diagram 5. Pinning information 5.1 Pinning &7& 9'' 57& 5&7& 5(75,**(5 $67$%/( +()% 2 $67$%/( 2 75,**(5 05 966 75,**(5 26&,//$725 287387 DDD Fig 3. Pin configuration HEF4047B Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 5 — 16 December 2015 © NXP Semiconductors N.V. 2015. All rights reserved. 3 of 20 HEF4047B NXP Semiconductors Monostable/astable multivibrator 5.2 Pin description Table 2. Pin description Symbol Pin Description CTC 1 external capacitor connection RTC 2 external resistor connection RCTC 3 external capacitor/resistor connection ASTABLE 4 input ASTABLE 5 input TRIGGER 6 input VSS 7 ground supply voltage +TRIGGER 8 input MR 9 master reset input O 10 output O 11 output RETRIGGER 12 input OSCILLATOR OUTPUT 13 oscillator output VDD 14 supply voltage 6. Limiting values Table 3. Limiting values In accordance with the Absolute Maximum Rating System (IEC 60134). Symbol Parameter VDD supply voltage Conditions IIK input clamping current VI input voltage IOK output clamping current - 10 mA II/O input/output current - 10 mA IDD supply current - 50 mA Tstg storage temperature 65 +150 C Tamb ambient temperature 40 +85 C Ptot total power dissipation - 500 mW - 100 mW VI < 0.5 V or VI > VDD + 0.5 V VO < 0.5 V or VO > VDD + 0.5 V [1] power dissipation Max Unit +18 V - 10 mA 0.5 VDD + 0.5 V Tamb = 40 C to +85 C SO14 package P Min 0.5 per output [1] For SO14 package: Ptot derates linearly with 8 mW/K above 70 C. HEF4047B Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 5 — 16 December 2015 © NXP Semiconductors N.V. 2015. All rights reserved. 4 of 20 HEF4047B NXP Semiconductors Monostable/astable multivibrator 7. Recommended operating conditions Table 4. Operating conditions Symbol Parameter VDD VI Conditions Min Max Unit supply voltage 3 15 V input voltage 0 VDD V Tamb ambient temperature in free air 40 +85 C t/V input transition rise and fall rate VDD = 5 V - 3.75 s/V VDD = 10 V - 0.5 s/V VDD = 15 V - 0.08 s/V 8. Static characteristics Table 5. Static characteristics VSS = 0 V; VI = VSS or VDD unless otherwise specified. Symbol Parameter VIH VIL VOH VOL IOH IOL HIGH-level input voltage LOW-level input voltage Conditions IO < 1 A IO < 1 A HIGH-level output voltage IO < 1 A IDD CI Tamb = 40 C Tamb = 85 C Unit Max Min Max Min Max 5V 3.5 - 3.5 - 3.5 - V 10 V 7.0 - 7.0 - 7.0 - V 15 V 11.0 - 11.0 - 11.0 - V 5V - 1.5 - 1.5 - 1.5 V 10 V - 3.0 - 3.0 - 3.0 V 15 V - 4.0 - 4.0 - 4.0 V 5V 4.95 - 4.95 - 4.95 - V 10 V 9.95 - 9.95 - 9.95 - V 15 V 14.95 - 14.95 - 14.95 - V 5V - 0.05 - 0.05 - 0.05 V 10 V - 0.05 - 0.05 - 0.05 V 15 V - 0.05 - 0.05 - 0.05 V HIGH-level output current VO = 2.5 V 5V - 1.7 - 1.4 - 1.1 mA VO = 4.6 V 5V - 0.52 - 0.44 - 0.36 mA VO = 9.5 V 10 V - 1.3 - 1.1 - 0.9 mA VO = 13.5 V 15 V - 3.6 - 3.0 - 2.4 mA VO = 0.4 V 5V 0.52 - 0.44 - 0.36 - mA VO = 0.5 V 10 V 1.3 - 1.1 - 0.9 - mA LOW-level output voltage LOW-level output current IO < 1 A VO = 1.5 V II Tamb = 25 C Min VDD 15 V 3.6 - 3.0 - 2.4 - mA 15 V - 0.3 - 0.3 - 1.0 A 15 V output transistor OFF; pin 3 at VDD or VSS - 0.3 - 0.3 - 1.0 A IO = 0 A 5V - 20 - 20 - 150 A 10 V - 40 - 40 - 300 A 15 V - 80 - 80 - 600 A - - - - 7.5 - - pF input leakage current supply current input capacitance HEF4047B Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 5 — 16 December 2015 © NXP Semiconductors N.V. 2015. All rights reserved. 5 of 20 HEF4047B NXP Semiconductors Monostable/astable multivibrator 9. Dynamic characteristics Table 6. Dynamic characteristics VSS = 0 V; Tamb = 25 C; for test circuit and waveform, see Figure 4 and Figure 5; unless otherwise specified. Symbol tPHL tPLH tPHL Parameter Conditions VDD Extrapolation formula Min Typ Max Unit 5V [1] 68 ns + (0.55 ns/pF)CL - 95 190 ns 10 V [1] 43 ns + (0.23 ns/pF)CL - 45 90 ns 15 V [1] 22 ns + (0.16 ns/pF)CL - 30 60 ns LOW to HIGH ASTABLE, ASTABLE propagation delay to OSCILLATOR OUTPUT 5V [1] 58 ns + (0.55 ns/pF)CL - 85 170 ns 29 ns + (0.23 ns/pF)CL - 40 80 ns 22 ns + (0.16 ns/pF)CL - 30 60 ns HIGH to LOW ASTABLE, ASTABLE propagation delay to O, O 5V 123 ns + (0.55 ns/pF)CL - 150 300 ns 54 ns + (0.23 ns/pF)CL - 65 130 ns 42 ns + (0.16 ns/pF)CL - 50 100 ns HIGH to LOW ASTABLE, ASTABLE propagation delay to OSCILLATOR OUTPUT 10 V 15 V [1] 10 V 15 V tPLH LOW to HIGH ASTABLE, ASTABLE propagation delay to O, O 5V [1] 103 ns + (0.55 ns/pF)CL - 130 260 ns 49 ns + (0.23 ns/pF)CL - 60 120 ns 37 ns + (0.16 ns/pF)CL - 45 90 ns 133 ns + (0.55 ns/pF)CL - 160 320 ns 10 V 54 ns + (0.23 ns/pF)CL - 65 130 ns 15 V 42 ns + (0.16 ns/pF)CL - 50 100 ns 128 ns + (0.55 ns/pF)CL - 155 310 ns 54 ns + (0.23 ns/pF)CL - 65 130 ns 42 ns + (0.16 ns/pF)CL - 50 100 ns 38 ns + (0.55 ns/pF)CL - 65 130 ns 19 ns + (0.23 ns/pF)CL - 30 60 ns 17 ns + (0.16 ns/pF)CL - 25 50 ns 10 V 15 V tPHL tPLH HIGH to LOW +/TRIGGER to O, O propagation delay 5V LOW to HIGH +/TRIGGER to O, O propagation delay 5V HIGH to LOW +TRIGGER, propagation delay RETRIGGER to O 5V [1] [1] 10 V 15 V tPHL [1] 10 V 15 V tPLH LOW to HIGH +TRIGGER, propagation delay RETRIGGER to O 5V [1] 68 ns + (0.55 ns/pF)CL - 95 190 ns 29 ns + (0.23 ns/pF)CL - 40 80 ns 22 ns + (0.16 ns/pF)CL - 30 60 ns 83 ns + (0.55 ns/pF)CL - 100 200 ns 10 V 34 ns + (0.23 ns/pF)CL - 45 90 ns 15 V 27 ns + (0.16 ns/pF)CL - 35 70 ns 83 ns + (0.55 ns/pF)CL - 100 200 ns 34 ns + (0.23 ns/pF)CL - 45 90 ns 27 ns + (0.16 ns/pF)CL - 35 70 ns 10 ns + (1.0 ns/pF)CL - 60 120 ns 9 ns + (0.42 ns/pF)CL - 30 60 ns 6 ns + (0.28 ns/pF)CL - 20 40 ns 10 V 15 V tPHL tPLH HIGH to LOW MR to O propagation delay 5V LOW to HIGH MR to O propagation delay 5V HIGH to LOW output transition time 5V [1] [1] 10 V 15 V tTHL tTLH LOW to HIGH output transition time HEF4047B Product data sheet [1] 10 V 15 V 5V [1] 10 ns + (1.0 ns/pF)CL - 60 120 ns 10 V 9 ns + (0.42 ns/pF)CL - 30 60 ns 15 V 6 ns + (0.28 ns/pF)CL - 20 40 ns All information provided in this document is subject to legal disclaimers. Rev. 5 — 16 December 2015 © NXP Semiconductors N.V. 2015. All rights reserved. 6 of 20 HEF4047B NXP Semiconductors Monostable/astable multivibrator Table 6. Dynamic characteristics …continued VSS = 0 V; Tamb = 25 C; for test circuit and waveform, see Figure 4 and Figure 5; unless otherwise specified. Symbol Parameter Conditions VDD Extrapolation formula Min Typ Max tW pulse width any input except MR 5V - 220 110 - ns 10 V - 100 50 - ns 15 V - 70 35 - ns 5V - 60 30 - ns 10 V - 30 15 - ns 15 V - 20 10 - ns MR HIGH [1] Unit The typical values of the propagation delay and transition times are calculated from the extrapolation formulas shown (CL in pF). 10. Waveforms WU 9, 90 LQSXW 9 WI W: W3+/ 92+ W3/+ 90 RXWSXW 92/ W7+/ W7/+ DDD Measurement points are given in Table 7. Logic levels: VOL and VOH are typical output voltage levels that occur with the output load. Fig 4. input to output propagation delays, output transition time and pulse width Table 7. Measurement points Supply voltage Input Output VDD VM VM 5 V to 15 V 0.5VDD 0.5VDD HEF4047B Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 5 — 16 December 2015 © NXP Semiconductors N.V. 2015. All rights reserved. 7 of 20 HEF4047B NXP Semiconductors Monostable/astable multivibrator W: 9, QHJDWLYH SXOVH 90 90 9 WI WU WU WI 9, SRVLWLYH SXOVH 90 90 9 W: DDM a. Input waveform 9(;7 9'' 9, * 5/ 92 '87 57 &/ DDM b. Test circuit Test and measurement data is given in Table 8. Definitions test circuit: DUT = Device Under Test. RT = Termination resistance should be equal to output impedance Zo of the pulse generator. CL = Load capacitance including jig and probe capacitance. Fig 5. Test circuit for measuring switching times Table 8. Test data Supply voltage 5 V to 15 V Input Load VEXT VI tr, tf CL RL tPLH, tPHL VDD 20 ns 50 pF 1 k open 11. Application information Table 9. Functional connections [1] Function Pins connected to Output pulse from pins Output period or pulse width at pins 10, 11; tA = 4.40 RtCt at pin 13: tA = 2.20 RtCt VDD VSS input pulse 4, 5, 6, 14 7, 8, 9, 12 - 10, 11, 13 4, 6, 14 7, 8, 9, 12 5 10, 11, 13 6, 14 5, 7, 8, 9, 12 4 10, 11, 13 Astable multivibrator Free running True gating Complement gating HEF4047B Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 5 — 16 December 2015 © NXP Semiconductors N.V. 2015. All rights reserved. 8 of 20 HEF4047B NXP Semiconductors Monostable/astable multivibrator Functional connections …continued[1] Table 9. Function Pins connected to Output pulse from pins Output period or pulse width 8 10, 11 5, 7, 9, 12 6 10, 11 at pins 10, 11; tM = 2.48 RtCt 5, 6, 7, 9 8, 12 10, 11 5, 6, 7, 8, 9, 12 - 10, 11 VDD VSS input pulse Positive edge-triggering 4, 14 5, 6, 7, 9, 12 Negative edge-triggering 4, 8, 14 4, 14 14 Monostable multivibrator Retriggerable External countdown[2] [1] In all cases, external resistor between pins 2 and 3, external capacitor between pins 1 and 3. [2] Input pulse to RESET of external counting chip: external counting chip output to pin 4. 11.1 Astable mode design information 11.1.1 Unit-to-unit transfer voltage variations The following analysis presents worst case variations from unit-to-unit as a function of transfer voltage (VTR) shift for free running (astable) operation. 26&,//$725 287387SLQ W W W W 2287387 SLQ W $ W $ W$ DDD Fig 6. Astable mode waveforms V TR t 1 = – R t C t In -------------------------V DD + V TR (1) V DD – V TR t 2 = – R t C t In ---------------------------2V DD – V TR (2) V TR V DD – V TR t A = 2 t 1 + t 2 = – 2R t C t In ---------------------------------------------------------------- V DD + V TR 2V DD – V TR (3) , where tA = astable mode pulse width; see Table 10. Table 10. Values for astable mode pulse width (tA) VTR Min VDD = 5 V or 10 V VDD = 15 V [1] HEF4047B Product data sheet 0.3 VDD 4V tA Typ 0.5 VDD Max 0.7 VDD 0.5 VDD 11 V Min Typ[1] Max 4.71 RtCt 4.40 RtCt 4.71 RtCt 4.84 RtCt 4.40 RtCt 4.84 RtCt Therefore if tA = 4.40 RtCt is used, the maximum variation is (+7.0%; 0.0%) at 10 V. All information provided in this document is subject to legal disclaimers. Rev. 5 — 16 December 2015 © NXP Semiconductors N.V. 2015. All rights reserved. 9 of 20 HEF4047B NXP Semiconductors Monostable/astable multivibrator 11.1.2 Variations due to changes in VDD In addition to variations from unit-to-unit, the astable period may vary as a function of frequency with respect to VDD. Typical variations are presented graphically in Figure 7 and Figure 8 with 10 V as a reference. DDD SHULRGDFFXUDF\ IRU2DQG2 9''9 (1) Tamb = 25 C; fo = 10 kHz; Ct = 100 pF; Rt = 220 k. (2) Tamb = 25 C; fo = 5 kHz; Ct = 100 pF; Rt = 470 k. (3) Tamb = 25 C; fo = 1 kHz; Ct = 1000 pF; Rt = 220 k. Fig 7. Typical O and O period accuracy as a function of supply voltage; astable mode. DDD SHULRGDFFXUDF\ IRU2DQG2 9''9 (1) Tamb = 25 C; fo = 500 kHz; Ct = 10 pF; Rt = 47 k. (2) Tamb = 25 C; fo = 225 kHz; Ct = 100 pF; Rt = 10 k. (3) Tamb = 25 C; fo = 100 kHz; Ct = 100 pF; Rt = 22 k. (4) Tamb = 25 C; fo = 50 kHz; Ct = 100 pF; Rt = 47 k. Fig 8. HEF4047B Product data sheet Typical O and O period accuracy as a function of supply voltage; astable mode. All information provided in this document is subject to legal disclaimers. Rev. 5 — 16 December 2015 © NXP Semiconductors N.V. 2015. All rights reserved. 10 of 20 HEF4047B NXP Semiconductors Monostable/astable multivibrator 11.2 Monostable mode design information The following analysis presents worst case variations from unit-to-unit as a function of transfer voltage (VTR) shift for one-shot (monostable) operation. 75,**(5 SLQ 26&,//$725 287387SLQ W W W W 2287387 SLQ W0 W0 DDD Fig 9. Monostable waveforms. V TR t 1' = – R t C t In ------------2V DD (4) t M = t 1' + t 2 (5) V TR V DD – V TR t M = – R t C t In --------------------------------------------------- 2V DD – V TR 2V DD (6) , where tM = monostable mode pulse width; see table Table 11. Table 11. Values for monostable mode pulse width (tM) VTR Min VDD = 5 V or 10 V VDD = 15 V [1] HEF4047B Product data sheet 0.3 VDD 4V tM Typ 0.5 VDD Max 0.7 VDD 0.5 VDD 11 V Min Typ[1] Max 2.78 RtCt 2.48 RtCt 2.52 RtCt 2.88 RtCt 2.48 RtCt 2.56 RtCt In the astable mode, the first positive half cycle has a duration of tM: succeeding durations are 1⁄2 tA. Therefore if tM = 2.48 RtCt is used, the maximum variation is (+12%; 0.0%) at 10 V. All information provided in this document is subject to legal disclaimers. Rev. 5 — 16 December 2015 © NXP Semiconductors N.V. 2015. All rights reserved. 11 of 20 HEF4047B NXP Semiconductors Monostable/astable multivibrator 11.2.1 Retrigger mode operation The HEF4047B can be used in the retrigger mode to extend the output pulse duration. It can also be used to compare the frequency of an input signal with the frequency of the internal oscillator. In the retrigger mode, the input pulse is applied to pins 8 and 12, and the output is taken from pin 10 or 11. Normal monostable action is obtained when one retrigger pulse is applied (see Figure 10). Extended pulse duration is obtained when more than one pulse is applied. For two input pulses, t RE = t 1' + t 1 + 2t 2 . For more than two pulses, tRE (output O), terminates at some variable time, tD, after the termination of the last retrigger pulse. tD is variable because tRE (output O) terminates after the second positive edge of the oscillator output appears at flip-flop 4. 75,**(5 5(75,**(5 SLQV 26&,//$725 287387SLQ W W W W W W 2287387 SLQ W5( W5( W' W5( DDD Fig 10. Retrigger mode waveforms. 11.2.2 External counter option The use of external counting circuitry extends time tM by any amount. Advantages include digitally controlled pulse duration, small timing capacitors for long time periods, and extremely fast recovery time. A typical implementation is shown in Figure 11. The pulse duration at the output is: t ext = N – 1 t A + t M + 1/2 t A (7) Where text = pulse duration of the circuitry, and N is the number of counts used. HEF4047B Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 5 — 16 December 2015 © NXP Semiconductors N.V. 2015. All rights reserved. 12 of 20 HEF4047B NXP Semiconductors Monostable/astable multivibrator $67$%/( +()% 2 &3 +()% 2 RSWLRQDO EXIIHU RXWSXW 05 LQSXW SXOVH WH[W DDD Fig 11. Implementation of external counter option. 11.2.3 Timing component limitations The capacitor used in the circuit should be non-polarized and have low leakage (that is the parallel resistance of the capacitor should be an order of magnitude greater than the external resistor used). There is no upper or lower limit for either Rt or Ct value to maintain oscillation. However, for accuracy, Ct must be much larger than the inherent stray capacitance in the system (unless this capacitance can be measured and taken into account). Rt must be much larger than the LOCMOS ‘ON’ resistance in series with it, which typically is hundreds of ohms. The recommended values for Rt and Ct to comply with previously calculated formulae without trimming should be: – Ct 100 pF, up to any practical value – 10 k Rt 1 M 11.2.4 Power consumption In the standby mode (monostable or astable), power dissipation is a function of leakage current in the circuit. For dynamic operation, the power required to charge the external timing capacitor Ct is shown in the following formulae: Astable mode: 2 f at output pin 13 (8) 2 f at output pins 10 and 11 (9) P = 2 Ct V f P = 4 Ct V f Monostable mode: 2 2.9 C t V duty cycle P = --------------------------------------------------------T f at output pins 10 and 11 (10) Because the power dissipation does not depend on Rt, a design for minimum power dissipation would be a small value of Ct. The value of R would depend on the desired period (within the limitations discussed previously). Typical power consumption in astable mode is shown in Figure 12, Figure 13 and Figure 14. HEF4047B Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 5 — 16 December 2015 © NXP Semiconductors N.V. 2015. All rights reserved. 13 of 20 HEF4047B NXP Semiconductors Monostable/astable multivibrator DDD 3 : I+] VDD = 5 V. (1) Ct = 100 nF. (2) Ct = 10 nF. (3) Ct = 1 nF. (4) Ct = 100 pF. (5) Ct = 10 pF. Fig 12. Power consumption as a function of the output frequency at O or O; astable mode. DDD 3 : I+] VDD = 10 V. (1) Ct = 100 nF. (2) Ct = 10 nF. (3) Ct = 1 nF. (4) Ct = 100 pF. (5) Ct = 10 pF. Fig 13. Power consumption as a function of the output frequency at O or O; astable mode. HEF4047B Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 5 — 16 December 2015 © NXP Semiconductors N.V. 2015. All rights reserved. 14 of 20 HEF4047B NXP Semiconductors Monostable/astable multivibrator DDD 3 : I+] VDD = 15 V. (1) Ct = 100 nF. (2) Ct = 10 nF. (3) Ct = 1 nF. (4) Ct = 100 pF. (5) Ct = 10 pF. Fig 14. Power consumption as a function of the output frequency at O or O; astable mode. HEF4047B Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 5 — 16 December 2015 © NXP Semiconductors N.V. 2015. All rights reserved. 15 of 20 HEF4047B NXP Semiconductors Monostable/astable multivibrator 12. Package outline 62SODVWLFVPDOORXWOLQHSDFNDJHOHDGVERG\ZLGWKPP 627 ' ( $ ; F \ +( Y 0 $ = 4 $ $ $ $ SLQLQGH[ ș /S / H GHWDLO; Z 0 ES PP VFDOH ',0(16,216LQFKGLPHQVLRQVDUHGHULYHGIURPWKHRULJLQDOPPGLPHQVLRQV 81,7 $ PD[ $ $ $ ES F ' ( H +( / /S 4 Y Z \ = PP LQFKHV ș R R 1RWH 3ODVWLFRUPHWDOSURWUXVLRQVRIPPLQFKPD[LPXPSHUVLGHDUHQRWLQFOXGHG 5()(5(1&(6 287/,1( 9(56,21 ,(& -('(& 627 ( 06 -(,7$ (8523($1 352-(&7,21 ,668('$7( Fig 15. Package outline SOT108-1 (SO14) HEF4047B Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 5 — 16 December 2015 © NXP Semiconductors N.V. 2015. All rights reserved. 16 of 20 HEF4047B NXP Semiconductors Monostable/astable multivibrator 13. Abbreviations Table 12. Abbreviations Acronym Description DUT Device Under Test 14. Revision history Table 13. Revision history Document ID Release date Data sheet status Change notice Supersedes HEF4047B v.5 20151216 Product data sheet - HEF4047B v.4 Modifications: HEF4047B v.4 Modifications: HEF4047B_CVN_3 HEF4047B Product data sheet • Type number HEF4047BP (SOT27-1) removed. 20140915 Product data sheet - HEF4047B_CVN_3 • The format of this data sheet has been redesigned to comply with the new identity guidelines of NXP Semiconductors. • Legal texts have been adapted to the new company name where appropriate. 19950101 Product specification - All information provided in this document is subject to legal disclaimers. Rev. 5 — 16 December 2015 - © NXP Semiconductors N.V. 2015. All rights reserved. 17 of 20 HEF4047B NXP Semiconductors Monostable/astable multivibrator 15. Legal information 15.1 Data sheet status Document status[1][2] Product status[3] Definition Objective [short] data sheet Development This document contains data from the objective specification for product development. Preliminary [short] data sheet Qualification This document contains data from the preliminary specification. Product [short] data sheet Production This document contains the product specification. [1] Please consult the most recently issued document before initiating or completing a design. [2] The term ‘short data sheet’ is explained in section “Definitions”. [3] The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status information is available on the Internet at URL http://www.nxp.com. 15.2 Definitions Draft — The document is a draft version only. The content is still under internal review and subject to formal approval, which may result in modifications or additions. NXP Semiconductors does not give any representations or warranties as to the accuracy or completeness of information included herein and shall have no liability for the consequences of use of such information. Short data sheet — A short data sheet is an extract from a full data sheet with the same product type number(s) and title. A short data sheet is intended for quick reference only and should not be relied upon to contain detailed and full information. For detailed and full information see the relevant full data sheet, which is available on request via the local NXP Semiconductors sales office. In case of any inconsistency or conflict with the short data sheet, the full data sheet shall prevail. Product specification — The information and data provided in a Product data sheet shall define the specification of the product as agreed between NXP Semiconductors and its customer, unless NXP Semiconductors and customer have explicitly agreed otherwise in writing. In no event however, shall an agreement be valid in which the NXP Semiconductors product is deemed to offer functions and qualities beyond those described in the Product data sheet. 15.3 Disclaimers Limited warranty and liability — Information in this document is believed to be accurate and reliable. However, NXP Semiconductors does not give any representations or warranties, expressed or implied, as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP Semiconductors takes no responsibility for the content in this document if provided by an information source outside of NXP Semiconductors. In no event shall NXP Semiconductors be liable for any indirect, incidental, punitive, special or consequential damages (including - without limitation - lost profits, lost savings, business interruption, costs related to the removal or replacement of any products or rework charges) whether or not such damages are based on tort (including negligence), warranty, breach of contract or any other legal theory. Notwithstanding any damages that customer might incur for any reason whatsoever, NXP Semiconductors’ aggregate and cumulative liability towards customer for the products described herein shall be limited in accordance with the Terms and conditions of commercial sale of NXP Semiconductors. Right to make changes — NXP Semiconductors reserves the right to make changes to information published in this document, including without limitation specifications and product descriptions, at any time and without notice. This document supersedes and replaces all information supplied prior to the publication hereof. HEF4047B Product data sheet Suitability for use — NXP Semiconductors products are not designed, authorized or warranted to be suitable for use in life support, life-critical or safety-critical systems or equipment, nor in applications where failure or malfunction of an NXP Semiconductors product can reasonably be expected to result in personal injury, death or severe property or environmental damage. NXP Semiconductors and its suppliers accept no liability for inclusion and/or use of NXP Semiconductors products in such equipment or applications and therefore such inclusion and/or use is at the customer’s own risk. Applications — Applications that are described herein for any of these products are for illustrative purposes only. NXP Semiconductors makes no representation or warranty that such applications will be suitable for the specified use without further testing or modification. Customers are responsible for the design and operation of their applications and products using NXP Semiconductors products, and NXP Semiconductors accepts no liability for any assistance with applications or customer product design. It is customer’s sole responsibility to determine whether the NXP Semiconductors product is suitable and fit for the customer’s applications and products planned, as well as for the planned application and use of customer’s third party customer(s). Customers should provide appropriate design and operating safeguards to minimize the risks associated with their applications and products. NXP Semiconductors does not accept any liability related to any default, damage, costs or problem which is based on any weakness or default in the customer’s applications or products, or the application or use by customer’s third party customer(s). Customer is responsible for doing all necessary testing for the customer’s applications and products using NXP Semiconductors products in order to avoid a default of the applications and the products or of the application or use by customer’s third party customer(s). NXP does not accept any liability in this respect. Limiting values — Stress above one or more limiting values (as defined in the Absolute Maximum Ratings System of IEC 60134) will cause permanent damage to the device. Limiting values are stress ratings only and (proper) operation of the device at these or any other conditions above those given in the Recommended operating conditions section (if present) or the Characteristics sections of this document is not warranted. Constant or repeated exposure to limiting values will permanently and irreversibly affect the quality and reliability of the device. Terms and conditions of commercial sale — NXP Semiconductors products are sold subject to the general terms and conditions of commercial sale, as published at http://www.nxp.com/profile/terms, unless otherwise agreed in a valid written individual agreement. In case an individual agreement is concluded only the terms and conditions of the respective agreement shall apply. NXP Semiconductors hereby expressly objects to applying the customer’s general terms and conditions with regard to the purchase of NXP Semiconductors products by customer. No offer to sell or license — Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights. All information provided in this document is subject to legal disclaimers. Rev. 5 — 16 December 2015 © NXP Semiconductors N.V. 2015. All rights reserved. 18 of 20 HEF4047B NXP Semiconductors Monostable/astable multivibrator Export control — This document as well as the item(s) described herein may be subject to export control regulations. Export might require a prior authorization from competent authorities. Non-automotive qualified products — Unless this data sheet expressly states that this specific NXP Semiconductors product is automotive qualified, the product is not suitable for automotive use. It is neither qualified nor tested in accordance with automotive testing or application requirements. NXP Semiconductors accepts no liability for inclusion and/or use of non-automotive qualified products in automotive equipment or applications. In the event that customer uses the product for design-in and use in automotive applications to automotive specifications and standards, customer (a) shall use the product without NXP Semiconductors’ warranty of the product for such automotive applications, use and specifications, and (b) whenever customer uses the product for automotive applications beyond NXP Semiconductors’ specifications such use shall be solely at customer’s own risk, and (c) customer fully indemnifies NXP Semiconductors for any liability, damages or failed product claims resulting from customer design and use of the product for automotive applications beyond NXP Semiconductors’ standard warranty and NXP Semiconductors’ product specifications. Translations — A non-English (translated) version of a document is for reference only. The English version shall prevail in case of any discrepancy between the translated and English versions. 15.4 Trademarks Notice: All referenced brands, product names, service names and trademarks are the property of their respective owners. 16. Contact information For more information, please visit: http://www.nxp.com For sales office addresses, please send an email to: [email protected] HEF4047B Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 5 — 16 December 2015 © NXP Semiconductors N.V. 2015. All rights reserved. 19 of 20 HEF4047B NXP Semiconductors Monostable/astable multivibrator 17. Contents 1 2 2.1 2.2 2.3 3 4 5 5.1 5.2 6 7 8 9 10 11 11.1 11.1.1 11.1.2 11.2 11.2.1 11.2.2 11.2.3 11.2.4 12 13 14 15 15.1 15.2 15.3 15.4 16 17 General description . . . . . . . . . . . . . . . . . . . . . . 1 Features and benefits . . . . . . . . . . . . . . . . . . . . 1 General . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 Monostable multivibrator. . . . . . . . . . . . . . . . . . 2 Astable multivibrator . . . . . . . . . . . . . . . . . . . . . 2 Ordering information . . . . . . . . . . . . . . . . . . . . . 2 Functional diagram . . . . . . . . . . . . . . . . . . . . . . 2 Pinning information . . . . . . . . . . . . . . . . . . . . . . 3 Pinning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3 Pin description . . . . . . . . . . . . . . . . . . . . . . . . . 4 Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . . 4 Recommended operating conditions. . . . . . . . 5 Static characteristics. . . . . . . . . . . . . . . . . . . . . 5 Dynamic characteristics . . . . . . . . . . . . . . . . . . 6 Waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 Application information. . . . . . . . . . . . . . . . . . . 8 Astable mode design information . . . . . . . . . . . 9 Unit-to-unit transfer voltage variations . . . . . . . 9 Variations due to changes in VDD . . . . . . . . . . 10 Monostable mode design information. . . . . . . 11 Retrigger mode operation . . . . . . . . . . . . . . . . 12 External counter option. . . . . . . . . . . . . . . . . . 12 Timing component limitations . . . . . . . . . . . . . 13 Power consumption . . . . . . . . . . . . . . . . . . . . 13 Package outline . . . . . . . . . . . . . . . . . . . . . . . . 16 Abbreviations . . . . . . . . . . . . . . . . . . . . . . . . . . 17 Revision history . . . . . . . . . . . . . . . . . . . . . . . . 17 Legal information. . . . . . . . . . . . . . . . . . . . . . . 18 Data sheet status . . . . . . . . . . . . . . . . . . . . . . 18 Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 Disclaimers . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 Trademarks. . . . . . . . . . . . . . . . . . . . . . . . . . . 19 Contact information. . . . . . . . . . . . . . . . . . . . . 19 Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 Please be aware that important notices concerning this document and the product(s) described herein, have been included in section ‘Legal information’. © NXP Semiconductors N.V. 2015. All rights reserved. For more information, please visit: http://www.nxp.com For sales office addresses, please send an email to: [email protected] Date of release: 16 December 2015 Document identifier: HEF4047B