MC9S12VR-Family Reference Manual S12 MagniV Microcontrollers MC9S12VRRM Rev. 4.2 8-February-2016 nxp.com To provide the most up-to-date information, the revision of our documents on the World Wide Web will be the most current. Your printed copy may be an earlier revision. To verify you have the latest information available, refer to: http://nxp.com/ A full list of family members and options is included in the device overview section. The following revision history table summarizes changes contained in this document. This document contains information for all constituent modules, with the exception of the CPU. For CPU information please refer to CPU12-1 in the CPU12 & CPU12X Reference Manual. Revision History Date Revision Level 06-July-2015 Rev 4.0 Draft C • • • • 27-August-2015 Rev 4.0 • Updated S12HSDRVV3 21-December-2015 Rev 4.1 • Changed VDDX low voltage reset assert level from min 2.97V to 2.95V. see Table B-1 item 7b 8-February-2016 Rev 4.2 • Replaced Freescale logo by NXP logo Description Removed electrical parameter classification Changed BATS low voltage warning levels in Table I-2 NUM 1,5 and 6 Removed 32QFN package Added thermal specs for S12VR32 NXP Semiconductor reserves the right to make changes without further notice to any products herein. NXP Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does NXP Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation consequential or incidental damages. “Typical” parameters that may be provided in NXP Semiconductor data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals”, must be validated for each customer application by customer’s technical experts. NXP Semiconductor does not convey any license under its patent rights nor the rights of others. NXP Semiconductor products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications intended to support or sustain life, or for any other application in which the failure of the NXP Semiconductor product could create a situation where personal injury or death may occur. Should Buyer purchase or use NXP Semiconductor products for any such unintended or unauthorized application, Buyer shall indemnify and hold NXP Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that NXP Semiconductor was negligent regarding the design or manufacture of the part. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 2 Chapter 1 Device Overview MC9S12VR-Family . . . . . . . . . . . . . . . . . . . . . . . . . 23 Chapter 2 Port Integration Module (S12VRPIMV3) . . . . . . . . . . . . . . . . . . . . . . 55 Chapter 3 S12G Memory Map Controller (S12GMMCV1) . . . . . . . . . . . . . . . 119 Chapter 4 133 S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) Chapter 5 Background Debug Module (S12SBDMV1) . . . . . . . . . . . . . . . . . . . 195 Chapter 6 S12S Debug Module (S12DBGV2) . . . . . . . . . . . . . . . . . . . . . . . . . . . 219 Chapter 7 Interrupt Module (S12SINTV1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 263 Chapter 8 Analog-to-Digital Converter (ADC12B6CV2) . . . . . . . . . . . . . . . . . 271 Chapter 9 Pulse-Width Modulator (S12PWM8B8CV2) . . . . . . . . . . . . . . . . . . 295 Chapter 10 Serial Communication Interface (S12SCIV6). . . . . . . . . . . . . . . . . . 325 Chapter 11 Serial Peripheral Interface (S12SPIV5) for S12VR64 . . . . . . . . . . . 365 Chapter 12 Timer Module (TIM16B4CV3) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 391 Chapter 13 High-Side Drivers - HSDRV (S12HSDRVV2) for S12VR64 . . . . . . 409 Chapter 14 High-Side Driver - HSDRV1C (HSDRV1CV3) for S12VR32 . . . . . 419 Chapter 15 Low-Side Drivers - LSDRV (S12LSDRV1). . . . . . . . . . . . . . . . . . . . 429 Chapter 16 LIN Physical Layer (S12LINPHYV2) . . . . . . . . . . . . . . . . . . . . . . . . 441 Chapter 17 Supply Voltage Sensor - (BATSV2) . . . . . . . . . . . . . . . . . . . . . . . . . . 463 Chapter 18 64 KByte Flash Module (S12FTMRG64K512V1) for S12VR64 . . . 475 Chapter 19 32 KByte Flash Module (S12FTMRG32K128V1) for S12VR32 . . . 525 Appendix A MCU Electrical Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 575 Appendix B VREG Electrical Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 591 Appendix C ATD Electrical Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 593 Appendix D HSDRV Electrical Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . 599 Appendix E PLL Electrical Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 603 Appendix F IRC Electrical Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 607 Appendix G LINPHY Electrical Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . 609 Appendix H LSDRV Electrical Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . 613 MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 3 Appendix I BATS Electrical Specifications. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 615 Appendix J PIM Electrical Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 619 Appendix K SPI Electrical Specifications for S12VR64 . . . . . . . . . . . . . . . . . . . . 621 Appendix L XOSCLCP Electrical Specifications . . . . . . . . . . . . . . . . . . . . . . . . . 627 Appendix M FTMRG Electrical Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . 629 Appendix N Package Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 633 Appendix O Ordering Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 639 Appendix P Detailed Register Address Map . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 641 MC9S12VR Family Reference Manual, Rev. 4.2 4 NXP Semiconductor Chapter 1 Device Overview MC9S12VR-Family 1.1 1.2 Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24 1.2.1 MC9S12VR-Family Member Comparison . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24 1.3 Chip-Level Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25 1.4 Module Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26 1.4.1 HCS12 16-Bit Central Processor Unit (CPU) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26 1.4.2 On-Chip Flash with ECC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26 1.4.3 On-Chip SRAM . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26 1.4.4 Main External Oscillator (XOSCLCP) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27 1.4.5 Internal RC Oscillator (IRC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27 1.4.6 Internal Phase-Locked Loop (IPLL) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27 1.4.7 Clock and Power Management Unit (CPMU) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27 1.4.8 System Integrity Support . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27 1.4.9 Timer (TIM) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28 1.4.10 Pulse Width Modulation Module (PWM) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28 1.4.11 LIN physical layer transceiver (LINPHY) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28 1.4.12 Serial Peripheral Interface Module (SPI) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28 1.4.13 Serial Communication Interface Module (SCI) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29 1.4.14 Analog-to-Digital Converter Module (ATD) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29 1.4.15 Supply Voltage Sense (BATS) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29 1.4.16 On-Chip Voltage Regulator system (VREG) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29 1.4.17 Low-side drivers (LSDRV) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 1.4.18 High-side drivers (HSDRV) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 1.4.19 Background Debug (BDM) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 1.4.20 Debugger (DBG) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 1.5 Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31 1.6 Family Memory Map . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32 1.6.1 Part ID Assignments . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35 1.7 Signal Description and Device Pinouts . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35 1.7.1 Pin Assignment Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35 1.7.2 Detailed Signal Descriptions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36 1.7.3 Power Supply Pins . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39 1.7.4 Device Pinouts . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40 1.7.5 Pinout 48-pin LQFP . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41 1.7.6 Pinout 32-pin LQFP . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42 1.8 Modes of Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46 1.8.1 Chip Configuration Summary . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46 1.8.2 Low Power Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46 1.9 Security . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47 1.10 Resets and Interrupts . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47 1.10.1 Resets . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47 1.10.2 Interrupt Vectors . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 48 1.10.3 Effects of Reset . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 50 MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 5 1.11 Module Device level Dependencies . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 50 1.11.1 CPMU Differences between Maskset N59H (MC9S12VR64/48) and N11N (MC9S12VR32/16) 50 1.11.2 API external clock output (API_EXTCLK) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 51 1.11.3 COP Configuration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 51 1.11.4 CPMU High Temperature Trimming . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 51 1.11.5 Flash IFR Mapping . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 52 1.11.6 ADC External Trigger Input Connection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 52 1.11.7 ADC Special Conversion Channels . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 52 1.12 Application Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 53 1.12.1 ADC Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 53 Chapter 2 Port Integration Module (S12VRPIMV3) 2.1 2.2 2.3 Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 55 2.1.1 Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 55 2.1.2 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 56 External Signal Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 57 Memory Map and Register Definition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 60 2.3.1 Register Map . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 61 2.3.2 Register Descriptions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 64 2.3.3 Port E Data Register (PORTE) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 66 2.3.4 Port E Data Direction Register (DDRE) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 66 2.3.5 Port E, BKGD pin Pull Control Register (PUCR) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 67 2.3.6 ECLK Control Register (ECLKCTL) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 67 2.3.7 PIM Miscellaneous Register (PIMMISC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 68 2.3.8 IRQ Control Register (IRQCR) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 68 2.3.9 Reserved Register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 69 2.3.10 Reserved Register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 69 2.3.11 Port T Data Register (PTT) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 70 2.3.12 Port T Input Register (PTIT) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 71 2.3.13 Port T Data Direction Register (DDRT) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 71 2.3.14 Port T Pull Device Enable Register (PERT) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 72 2.3.15 Port T Polarity Select Register (PPST) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 73 2.3.16 Module Routing Register 0 (MODRR0) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 73 2.3.17 Module Routing Register 1 (MODRR1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 75 2.3.18 Reserved Register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 75 2.3.19 Port S Data Register (PTS) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 76 2.3.20 Port S Input Register (PTIS) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 78 2.3.21 Port S Data Direction Register (DDRS) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 79 2.3.22 Port S Pull Device Enable Register (PERS) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 80 2.3.23 Port S Polarity Select Register (PPSS) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 81 2.3.24 Port S Wired-Or Mode Register (WOMS) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 82 2.3.25 Module Routing Register 2 (MODRR2) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 83 2.3.26 Port P Data Register (PTP) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 86 MC9S12VR Family Reference Manual, Rev. 4.2 6 NXP Semiconductor 2.4 2.5 2.3.27 Port P Input Register (PTIP) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 88 2.3.28 Port P Data Direction Register (DDRP) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 89 2.3.29 Port P Reduced Drive Register (RDRP) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 90 2.3.30 Port P Pull Device Enable Register (PERP) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 91 2.3.31 Port P Polarity Select Register (PPSP) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 92 2.3.32 Port P Interrupt Enable Register (PIEP) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 93 2.3.33 Port P Interrupt Flag Register (PIFP) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 94 2.3.34 Port L Input Register (PTIL) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 95 2.3.35 Port L Digital Input Enable Register (DIENL) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 95 2.3.36 Port L Analog Access Register (PTAL) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 96 2.3.37 Port L Input Divider Ratio Selection Register (PIRL) . . . . . . . . . . . . . . . . . . . . . . . . . . 98 2.3.38 Port L Polarity Select Register (PPSL) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 98 2.3.39 Port L Interrupt Enable Register (PIEL) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 99 2.3.40 Port L Interrupt Flag Register (PIFL) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 99 2.3.41 Port AD Data Register (PT1AD) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 100 2.3.42 Port AD Input Register (PTI1AD) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 101 2.3.43 Port AD Data Direction Register (DDR1AD) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 102 2.3.44 Port AD Pull Enable Register (PER1AD) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 103 2.3.45 Port AD Polarity Select Register (PPS1AD) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 104 2.3.46 Port AD Interrupt Enable Register (PIE1AD) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 105 2.3.47 Port AD Interrupt Flag Register (PIF1AD) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 106 Functional Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 106 2.4.1 General . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 106 2.4.2 Registers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 106 2.4.3 Pins and Ports . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 109 2.4.4 Interrupts . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 112 Initialization and Application Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 114 2.5.1 Port Data and Data Direction Register writes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 114 2.5.2 ADC External Triggers ETRIG1-0 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 114 2.5.3 Over-Current Protection on EVDD . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 115 2.5.4 Open Input Detection on HVI Pins . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 115 Chapter 3 S12G Memory Map Controller (S12GMMCV1) 3.1 3.2 3.3 3.4 Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 119 3.1.1 Glossary . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 119 3.1.2 Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 119 3.1.3 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 120 3.1.4 Modes of Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 120 3.1.5 Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 120 External Signal Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 121 Memory Map and Registers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 121 3.3.1 Module Memory Map . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 121 3.3.2 Register Descriptions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 122 Functional Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 126 MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 7 3.4.1 MCU Operating Modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 126 3.4.2 Memory Map Scheme . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 126 3.4.3 Unimplemented and Reserved Address Ranges . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 130 3.4.4 Prioritization of Memory Accesses . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 131 3.4.5 Interrupts . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 131 Chapter 4 S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) 4.1 4.2 4.3 4.4 4.5 4.6 4.7 Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 133 4.1.1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 134 4.1.2 Modes of Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 136 4.1.3 S12CPMU_UHV_V8 Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 139 Signal Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 141 4.2.1 RESET . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 141 4.2.2 EXTAL and XTAL . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 141 4.2.3 VSUP — Regulator Power Input Pin . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 141 4.2.4 VDDA, VSSA — Regulator Reference Supply Pins . . . . . . . . . . . . . . . . . . . . . . . . . . 141 4.2.5 VDDX, VSSX— Pad Supply Pins . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 141 4.2.6 VSS— Ground Pin . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 142 4.2.7 API_EXTCLK — API external clock output pin . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 142 4.2.8 VDD— Internal Regulator Output Supply (Core Logic) . . . . . . . . . . . . . . . . . . . . . . . . 142 4.2.9 VDDF— Internal Regulator Output Supply (NVM Logic) . . . . . . . . . . . . . . . . . . . . . . 142 4.2.10 TEMPSENSE — Internal Temperature Sensor Output Voltage . . . . . . . . . . . . . . . . . . 142 Memory Map and Registers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 143 4.3.1 Module Memory Map . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 143 4.3.2 Register Descriptions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 145 Functional Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 179 4.4.1 Phase Locked Loop with Internal Filter (PLL) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 179 4.4.2 Startup from Reset . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 181 4.4.3 Stop Mode using PLLCLK as source of the Bus Clock . . . . . . . . . . . . . . . . . . . . . . . . 182 4.4.4 Full Stop Mode using Oscillator Clock as source of the Bus Clock . . . . . . . . . . . . . . . 182 4.4.5 External Oscillator . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 184 4.4.6 System Clock Configurations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 185 Resets . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 186 4.5.1 General . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 186 4.5.2 Description of Reset Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 187 4.5.3 Oscillator Clock Monitor Reset . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 188 4.5.4 PLL Clock Monitor Reset . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 188 4.5.5 Power-On Reset (POR) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 190 4.5.6 Low-Voltage Reset (LVR) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 190 Interrupts . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 190 4.6.1 Description of Interrupt Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 191 Initialization/Application Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 192 4.7.1 General Initialization information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 192 4.7.2 Application information for COP and API usage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 193 MC9S12VR Family Reference Manual, Rev. 4.2 8 NXP Semiconductor Chapter 5 Background Debug Module (S12SBDMV1) 5.1 5.2 5.3 5.4 Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 195 5.1.1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 195 5.1.2 Modes of Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 196 5.1.3 Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 197 External Signal Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 197 Memory Map and Register Definition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 197 5.3.1 Module Memory Map . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 197 5.3.2 Register Descriptions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 198 5.3.3 Family ID Assignment . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 201 Functional Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 201 5.4.1 Security . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 202 5.4.2 Enabling and Activating BDM . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 202 5.4.3 BDM Hardware Commands . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 203 5.4.4 Standard BDM Firmware Commands . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 204 5.4.5 BDM Command Structure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 205 5.4.6 BDM Serial Interface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 207 5.4.7 Serial Interface Hardware Handshake Protocol . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 210 5.4.8 Hardware Handshake Abort Procedure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 212 5.4.9 SYNC — Request Timed Reference Pulse . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 215 5.4.10 Instruction Tracing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 215 5.4.11 Serial Communication Time Out . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 216 Chapter 6 S12S Debug Module (S12DBGV2) 6.1 6.2 6.3 6.4 Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 219 6.1.1 Glossary Of Terms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 219 6.1.2 Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 220 6.1.3 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 220 6.1.4 Modes of Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 221 6.1.5 Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 221 External Signal Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 222 Memory Map and Registers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 222 6.3.1 Module Memory Map . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 222 6.3.2 Register Descriptions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 223 Functional Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 240 6.4.1 S12DBGV2 Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 240 6.4.2 Comparator Modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 241 6.4.3 Match Modes (Forced or Tagged) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 245 6.4.4 State Sequence Control . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 246 6.4.5 Trace Buffer Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 247 6.4.6 Tagging . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 253 6.4.7 Breakpoints . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 254 MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 9 6.5 Application Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 256 6.5.1 State Machine scenarios . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 256 6.5.2 Scenario 1 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 256 6.5.3 Scenario 2 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 256 6.5.4 Scenario 3 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 257 6.5.5 Scenario 4 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 257 6.5.6 Scenario 5 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 259 6.5.7 Scenario 6 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 259 6.5.8 Scenario 7 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 259 6.5.9 Scenario 8 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 260 6.5.10 Scenario 9 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 260 6.5.11 Scenario 10 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 260 Chapter 7 Interrupt Module (S12SINTV1) 7.1 7.2 7.3 7.4 7.5 Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 263 7.1.1 Glossary . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 263 7.1.2 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 263 7.1.3 Modes of Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 264 7.1.4 Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 264 External Signal Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 265 Memory Map and Register Definition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 265 7.3.1 Register Descriptions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 265 Functional Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 266 7.4.1 S12S Exception Requests . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 266 7.4.2 Interrupt Prioritization . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 266 7.4.3 Reset Exception Requests . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 267 7.4.4 Exception Priority . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 267 Initialization/Application Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 268 7.5.1 Initialization . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 268 7.5.2 Interrupt Nesting . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 268 7.5.3 Wake Up from Stop or Wait Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 268 Chapter 8 Analog-to-Digital Converter (ADC12B6CV2) 8.1 8.2 8.3 Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 271 8.1.1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 271 8.1.2 Modes of Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 272 8.1.3 Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 273 Signal Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 274 8.2.1 Detailed Signal Descriptions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 274 Memory Map and Register Definition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 274 8.3.1 Module Memory Map . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 274 8.3.2 Register Descriptions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 276 MC9S12VR Family Reference Manual, Rev. 4.2 10 NXP Semiconductor 8.4 8.5 8.6 Functional Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 291 8.4.1 Analog Sub-Block . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 291 8.4.2 Digital Sub-Block . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 291 Resets . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 293 Interrupts . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 293 Chapter 9 Pulse-Width Modulator (S12PWM8B8CV2) 9.1 9.2 9.3 9.4 9.5 9.6 Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 295 9.1.1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 295 9.1.2 Modes of Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 295 9.1.3 Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 296 External Signal Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 296 9.2.1 PWM7 - PWM0 — PWM Channel 7 - 0 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 297 Memory Map and Register Definition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 297 9.3.1 Module Memory Map . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 297 9.3.2 Register Descriptions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 297 Functional Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 311 9.4.1 PWM Clock Select . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 311 9.4.2 PWM Channel Timers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 315 Resets . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 323 Interrupts . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 324 Chapter 10 Serial Communication Interface (S12SCIV6) 10.1 Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 325 10.1.1 Glossary . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 325 10.1.2 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 326 10.1.3 Modes of Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 326 10.1.4 Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 327 10.2 External Signal Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 328 10.2.1 TXD — Transmit Pin . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 328 10.2.2 RXD — Receive Pin . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 328 10.3 Memory Map and Register Definition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 328 10.3.1 Module Memory Map and Register Definition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 328 10.3.2 Register Descriptions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 329 10.4 Functional Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 341 10.4.1 Infrared Interface Submodule . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 342 10.4.2 LIN Support . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 342 10.4.3 Data Format . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 343 10.4.4 Baud Rate Generation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 344 10.4.5 Transmitter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 345 10.4.6 Receiver . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 350 10.4.7 Single-Wire Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 358 MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 11 10.4.8 Loop Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 359 10.5 Initialization/Application Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 359 10.5.1 Reset Initialization . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 359 10.5.2 Modes of Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 360 10.5.3 Interrupt Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 360 10.5.4 Recovery from Wait Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 363 10.5.5 Recovery from Stop Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 363 Chapter 11 Serial Peripheral Interface (S12SPIV5) for S12VR64 11.1 Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 365 11.1.1 Glossary of Terms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 365 11.1.2 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 365 11.1.3 Modes of Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 365 11.1.4 Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 366 11.2 External Signal Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 367 11.2.1 MOSI — Master Out/Slave In Pin . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 367 11.2.2 MISO — Master In/Slave Out Pin . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 367 11.2.3 SS — Slave Select Pin . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 368 11.2.4 SCK — Serial Clock Pin . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 368 11.3 Memory Map and Register Definition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 368 11.3.1 Module Memory Map . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 368 11.3.2 Register Descriptions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 369 11.4 Functional Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 377 11.4.1 Master Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 378 11.4.2 Slave Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 379 11.4.3 Transmission Formats . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 380 11.4.4 SPI Baud Rate Generation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 385 11.4.5 Special Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 386 11.4.6 Error Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 387 11.4.7 Low Power Mode Options . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 388 Chapter 12 Timer Module (TIM16B4CV3) 12.1 Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 391 12.1.1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 391 12.1.2 Modes of Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 392 12.1.3 Block Diagrams . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 392 12.2 External Signal Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 393 12.2.1 IOC3 - IOC0 — Input Capture and Output Compare Channel 3-0 . . . . . . . . . . . . . . . . 393 12.3 Memory Map and Register Definition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 393 12.3.1 Module Memory Map . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 393 12.3.2 Register Descriptions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 393 12.4 Functional Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 404 MC9S12VR Family Reference Manual, Rev. 4.2 12 NXP Semiconductor 12.4.1 Prescaler . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 405 12.4.2 Input Capture . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 406 12.4.3 Output Compare . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 406 12.5 Resets . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 407 12.6 Interrupts . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 407 12.6.1 Channel [3:0] Interrupt (C[3:0]F) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 407 12.6.2 Timer Overflow Interrupt (TOF) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 407 Chapter 13 High-Side Drivers - HSDRV (S12HSDRVV2) for S12VR64 13.1 Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 409 13.1.1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 409 13.1.2 Modes of Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 409 13.1.3 Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 410 13.2 External Signal Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 411 13.2.1 HS0, HS1— High Side Driver Pins . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 411 13.2.2 VSUPHS — High Side Driver Power Pin . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 411 13.3 Memory Map and Register Definition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 411 13.3.1 Module Memory Map . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 411 13.3.2 Register Definition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 413 13.3.3 Port HS Data Register (HSDR) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 413 13.3.4 HSDRV Configuration Register (HSCR) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 414 13.3.5 Reserved Register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 415 13.3.6 HSDRV Interrupt Enable Register (HSIE) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 416 13.3.7 HSDRV Interrupt Flag Register (HSIF) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 417 13.4 Functional Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 418 13.4.1 General . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 418 13.4.2 Over-Current Shutdown . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 418 13.4.3 Interrupts . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 418 Chapter 14 High-Side Driver - HSDRV1C (HSDRV1CV3) for S12VR32 14.1 Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 419 14.1.1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 419 14.1.2 Modes of Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 419 14.1.3 Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 420 14.2 External Signal Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 420 14.2.1 HS[0] — High Side Driver Pin . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 420 14.2.2 VSUPHS — High Side Driver Power Pin . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 420 14.3 Memory Map and Register Definition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 421 14.3.1 Module Memory Map . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 421 14.3.2 Register Definition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 422 14.3.3 Port HS Data Register (HSDR) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 422 14.3.4 HSDRV1C Configuration Register (HSCR) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 422 MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 13 14.3.5 HSDRV1C Slew Rate Control Register (HSSLR) . . . . . . . . . . . . . . . . . . . . . . . . . . . . 424 14.3.6 Reserved Register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 424 14.3.7 HSDRV1C Status Register (HSSR) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 425 14.3.8 HSDRV1C Interrupt Enable Register (HSIE) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 426 14.3.9 HSDRV1C Interrupt Flag Register (HSIF) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 427 14.4 Functional Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 427 14.4.1 General . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 427 14.4.2 Open Load Detection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 427 14.4.3 Over-Current Shutdown . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 428 14.4.4 Interrupts . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 428 Chapter 15 Low-Side Drivers - LSDRV (S12LSDRV1) 15.1 Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 429 15.1.1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 429 15.1.2 Modes of Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 430 15.1.3 Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 430 15.2 External Signal Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 431 15.2.1 LS0, LS1— Low Side Driver Pins . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 431 15.2.2 LSGND — Low Side Driver Ground Pin . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 431 15.3 Memory Map and Register Definition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 431 15.3.1 Module Memory Map . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 431 15.3.2 Register Definition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 433 15.3.3 Port LS Data Register (LSDR) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 433 15.3.4 LSDRV Configuration Register (LSCR) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 434 15.3.5 LSDRV Status Register (LSSR) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 435 15.3.6 LSDRV Interrupt Enable Register (LSIE) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 436 15.3.7 LSDRV Interrupt Flag Register (LSIF) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 437 15.4 Functional Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 438 15.4.1 General . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 438 15.4.2 Open-Load Detection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 438 15.4.3 Over-Current Detection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 438 15.4.4 Interrupts . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 438 Chapter 16 LIN Physical Layer (S12LINPHYV2) 16.1 Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 441 16.1.1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 441 16.1.2 Modes of Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 442 16.1.3 Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 442 16.2 External Signal Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 444 16.2.1 LIN — LIN Bus Pin . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 444 16.2.2 LGND — LIN Ground Pin . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 444 16.2.3 VLINSUP — Positive Power Supply . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 444 MC9S12VR Family Reference Manual, Rev. 4.2 14 NXP Semiconductor 16.2.4 LPTxD — LIN Transmit Pin . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 444 16.2.5 LPRxD — LIN Receive Pin . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 444 16.3 Memory Map and Register Definition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 445 16.3.1 Module Memory Map . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 445 16.3.2 Register Descriptions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 446 16.4 Functional Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 453 16.4.1 General . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 453 16.4.2 Slew Rate and LIN Mode Selection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 453 16.4.3 Modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 454 16.4.4 Interrupts . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 457 16.5 Application Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 460 16.5.1 Module Initialization . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 460 16.5.2 Interrupt handling in Interrupt Service Routine (ISR) . . . . . . . . . . . . . . . . . . . . . . . . . . 460 Chapter 17 Supply Voltage Sensor - (BATSV2) 17.1 Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 463 17.1.1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 463 17.1.2 Modes of Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 463 17.1.3 Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 464 17.2 External Signal Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 464 17.2.1 VSENSE — Supply (Battery) Voltage Sense Pin . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 464 17.2.2 VSUP — Voltage Supply Pin . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 465 17.3 Memory Map and Register Definition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 465 17.3.1 Register Summary . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 465 17.3.2 Register Descriptions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 466 17.4 Functional Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 471 17.4.1 General . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 471 17.4.2 Interrupts . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 472 Chapter 18 64 KByte Flash Module (S12FTMRG64K512V1) for S12VR64 18.1 Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 476 18.1.1 Glossary . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 476 18.1.2 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 477 18.1.3 Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 478 18.2 External Signal Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 478 18.3 Memory Map and Registers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 479 18.3.1 Module Memory Map . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 479 18.3.2 Register Descriptions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 483 18.4 Functional Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 502 18.4.1 Modes of Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 502 18.4.2 IFR Version ID Word . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 502 18.4.3 Internal NVM resource (NVMRES) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 502 MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 15 18.4.4 Flash Command Operations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 502 18.4.5 Allowed Simultaneous P-Flash and EEPROM Operations . . . . . . . . . . . . . . . . . . . . . . 507 18.4.6 Flash Command Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 508 18.4.7 Interrupts . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 521 18.4.8 Wait Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 522 18.4.9 Stop Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 522 18.5 Security . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 522 18.5.1 Unsecuring the MCU using Backdoor Key Access . . . . . . . . . . . . . . . . . . . . . . . . . . . . 523 18.5.2 Unsecuring the MCU in Special Single Chip Mode using BDM . . . . . . . . . . . . . . . . . 524 18.5.3 Mode and Security Effects on Flash Command Availability . . . . . . . . . . . . . . . . . . . . . 524 18.6 Initialization . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 524 Chapter 19 32 KByte Flash Module (S12FTMRG32K128V1) for S12VR32 19.1 Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 526 19.1.1 Glossary . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 526 19.1.2 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 527 19.1.3 Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 528 19.2 External Signal Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 528 19.3 Memory Map and Registers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 529 19.3.1 Module Memory Map . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 529 19.3.2 Register Descriptions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 532 19.4 Functional Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 550 19.4.1 Modes of Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 550 19.4.2 IFR Version ID Word . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 551 19.4.3 Internal NVM resource (NVMRES) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 551 19.4.4 Flash Command Operations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 551 19.4.5 Allowed Simultaneous P-Flash and EEPROM Operations . . . . . . . . . . . . . . . . . . . . . . 556 19.4.6 Flash Command Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 557 19.4.7 Interrupts . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 570 19.4.8 Wait Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 571 19.4.9 Stop Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 571 19.5 Security . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 571 19.5.1 Unsecuring the MCU using Backdoor Key Access . . . . . . . . . . . . . . . . . . . . . . . . . . . . 572 19.5.2 Unsecuring the MCU in Special Single Chip Mode using BDM . . . . . . . . . . . . . . . . . 573 19.5.3 Mode and Security Effects on Flash Command Availability . . . . . . . . . . . . . . . . . . . . . 573 19.6 Initialization . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 573 Appendix A MCU Electrical Specifications A.1 General A.1.1 A.1.2 A.1.3 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 575 Pins . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 576 Current Injection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 577 Absolute Maximum Ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 577 MC9S12VR Family Reference Manual, Rev. 4.2 16 NXP Semiconductor A.1.4 A.1.5 A.1.6 A.1.7 A.1.8 ESD Protection and Latch-up Immunity . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 579 Operating Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 581 Power Dissipation and Thermal Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 581 I/O Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 586 Supply Currents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 587 Appendix B VREG Electrical Specifications Appendix C ATD Electrical Specifications C.1 ATD Operating Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 593 C.2 Factors Influencing Accuracy . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 593 C.2.1 Port AD Output Drivers Switching. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 593 C.2.2 Source Resistance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 594 C.2.3 Source Capacitance. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 594 C.2.4 Current Injection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 594 C.3 ATD Accuracy . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 595 C.3.1 ATD Accuracy Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 595 C.3.2 ATD Analog Input Parasitics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 598 Appendix D HSDRV Electrical Specifications D.1 Operating Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 599 D.2 Static Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 599 D.3 Dynamic Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 601 Appendix E PLL Electrical Specifications E.1 Reset, Oscillator and PLL . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 603 E.1.1 Phase Locked Loop. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 603 Appendix F IRC Electrical Specifications Appendix GLINPHY Electrical Specifications G.1 Maximum Ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 609 G.2 Static Electrical Characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 609 G.3 Dynamic Electrical Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 610 Appendix H LSDRV Electrical Specifications H.1 Static Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 613 MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 17 H.2 Dynamic Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 614 Appendix I BATS Electrical Specifications I.1 I.2 I.3 Maximum Ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 615 Static Electrical Characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 616 Dynamic Electrical Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 617 Appendix J PIM Electrical Specifications J.1 J.2 High-Voltage Inputs (HVI) Electrical Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 619 Pin Interrupt Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 620 Appendix K SPI Electrical Specifications for S12VR64 K.1 Timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 621 K.1.1 Master Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 621 K.1.2 Slave Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 623 Appendix L XOSCLCP Electrical Specifications Appendix M FTMRG Electrical Specifications M.1 Timing Parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 629 M.1.1 NVM Reliability Parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 632 M.1.2 NVM Factory Shipping Condition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 632 Appendix N Package Information Appendix O Ordering Information Appendix P Detailed Register Address Map P.1 P.2 P.3 P.4 P.5 P.6 P.7 0x0000-0x0009 Port Integration Module (PIM) Map 1 of 4 . . . . . . . . . . . . . . . . . . . . . . . . . . . . 641 0x000A-0x000B Module Mapping Conrol (MMC) Map 1 of 2 . . . . . . . . . . . . . . . . . . . . . . . . . . 641 0x000C-0x000D Port Integration Module (PIM) Map 2 of 4. . . . . . . . . . . . . . . . . . . . . . . . . . . . 641 0x000E-0x000F Reserved . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 641 0x0010-0x0017 Module Mapping Control (MMC) Map 2 of 2 . . . . . . . . . . . . . . . . . . . . . . . . . . 642 0x0018-0x0019 Reserved . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 642 0x001A-0x001B Part ID Registers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 642 MC9S12VR Family Reference Manual, Rev. 4.2 18 NXP Semiconductor P.8 P.9 P.10 P.11 P.12 P.13 P.14 P.15 P.16 P.17 P.18 P.19 P.20 P.21 P.22 P.23 P.24 P.25 P.26 P.27 P.28 P.29 P.30 P.31 P.32 P.33 P.34 0x001C-0x001F Port Intergartion Module (PIM) Map 3 of 4 . . . . . . . . . . . . . . . . . . . . . . . . . . . 643 0x0020-0x002F Debug Module (S12SDBG) Map . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 643 0x0030-0x0033 Reserved . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 644 0x0034-0x003F Clock Reset and Power Management (CPMU) Map . . . . . . . . . . . . . . . . . . . . . 644 0x0040-0x006F Timer Module (TIM) Map . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 645 0x0070-0x009F Analog to Digital Converter 10-Bit 6-Channel (ATD) Map . . . . . . . . . . . . . . . 646 0x00A0-0x00C7 Pulse Width Modulator 6-Channels (PWM) Map. . . . . . . . . . . . . . . . . . . . . . . 648 0x00C8-0x00CF Serial Communication Interface (SCI0) Map . . . . . . . . . . . . . . . . . . . . . . . . . . 650 0x00D0-0x00D7 Serial Communication Interface (SCI1) Map . . . . . . . . . . . . . . . . . . . . . . . . . . 651 0x00D8-0x00DF Serial Peripheral Interface (SPI) Map. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 651 0x00E0-0x00FF Reserved. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 652 0x0100-0x0113 NVM Contol Register (FTMRG) Map . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 652 0x0114-0x011F Reserved . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 653 0x0120 Interrupt Vector Base Register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 653 0x0121-0x013F Reserved . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 653 0x0140-0x0147 High Side Drivers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 654 P.23.1 S12HSDRVV2 on MC9S12VR64/48. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 654 P.23.2 S12HSDRV1CV3 on MC9S12VR32/16 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 654 0x0150-0x0157 Reserved . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 655 0x0150-0x0157 Low Side Drivers (LSDRV) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 655 0x0158-0x015F Reserved . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 655 0x0160-0x0167 LIN Physical Layer (LINPHY). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 655 0x0168-0x016F Reserved . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 656 0x0170-0x0177 Supply Voltage Sense (BATS) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 656 0x0178-023F Reserved . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 656 0x0240 -0x027F Port Integration Module (PIM) Map 4 of 4 . . . . . . . . . . . . . . . . . . . . . . . . . . . . 657 0x0280-0x02EF Reserved . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 660 0x02F0-0x02FF Clock and Power Management Unit (CPMU) Map 2 of 2. . . . . . . . . . . . . . . . . 660 0x0300-0x03FF Reserved . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 661 MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 19 MC9S12VR Family Reference Manual, Rev. 4.2 20 NXP Semiconductor Chapter 1 Device Overview MC9S12VR-Family Revision History Version Number Revision Date Rev 3.4 30-January-2014 • Corrected Figure 1-4 32LQFP pinout pin 5 Rev 4.0 Initial Draft 3-February-2014 • Added MC9S12VR16 & MC9S12VR32 to Table 1-1 • Added MC9S12VR16 & MC9S12VR32 maskset N11N to Table 1-3 • Added CPMU differences between masksets N11N & N59H Draft A 2-April-2014 Draft B 24-February-2015 1.1 Description of Changes • Added 32QFN package • Included feedback from shared review Introduction The MC9S12VR-Family is an optimized automotive 16-bit microcontroller product line focused on low-cost, high-performance, and low pin-count. This family integrates an S12 microcontroller with a LIN Physical interface, a 5V regulator system to supply the microcontroller, and analog blocks to control other elements of the system which operate at vehicle battery level (e.g. relay drivers, high-side driver outputs, wake up inputs). The MC9S12VR-Family is targeted at generic automotive applications requiring single node LIN communications. Typical examples of these applications include window lift modules, seat modules and sun-roof modules to name a few. The MC9S12VR-Family uses many of the same features found on the MC9S12G family, including error correction code (ECC) on flash memory, EEPROM for diagnostic or data storage, a fast analog-to-digital converter (ADC) and a frequency modulated phase locked loop (IPLL) that improves the EMC performance. The MC9S12VR-Family delivers an optimized solution with the integration of several key system components into a single device, optimizing system architecture and achieving significant space savings. The MC9S12VR-Family delivers all the advantages and efficiencies of a 16-bit MCU while retaining the low cost, power consumption, EMC, and code-size efficiency advantages currently enjoyed by users of NXP’s existing 8-bit and 16-bit MCU families. Like the MC9S12XS family, the MC9S12VR-Family runs 16-bit wide accesses without wait states for all peripherals and memories. Misaligned single cycle 16-bit RAM access is not supported. The MC9S12VR-Family is available in 32-pin and 48-pin LQFP. In addition to the I/O ports available in each module, further I/O ports are available with interrupt capability allowing wake-up from stop or wait modes. The MC9S12VR-Family is a general-purpose family of devices created with relay based motor control in mind and is suitable for a range of applications, including: • • • Window lift modules Door modules Seat controllers MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 21 Device Overview MC9S12VR-Family • • 1.2 Smart actuators Sun roof modules Features This section describes the key features of the MC9S12VR-Family. 1.2.1 MC9S12VR-Family Member Comparison Table 1-1 provides a summary of different members of the MC9S12VR-Family and their features. This information is intended to provide an understanding of the range of functionality offered by this microcontroller family. Table 1-1. MC9S12VR - Family Feature MC9S12VR16 MC9S12VR32 Package MC9S12VR48 EEPROM (ECC) MC9S12VR48 32 LQFP HCS12 16 Kbytes 32 Kbytes 48 Kbytes 64 Kbytes 128 Bytes 48 Kbytes 2 Kbytes LIN physical layer 1 SPI — 1 SCI 1 2 Timer 4ch x 16-bit PWM 8ch x 8-bit or 4ch x 16-bit 2 6 Frequency modulated PLL Yes Internal 1 MHz RC oscillator Yes Autonomous window watchdog 1 Low-side drivers (protected for inductive loads) 2 High-side drivers 1 High voltage Inputs General purpose I/Os (5V) 64 Kbytes 512 Bytes RAM 10-bit ADC channels MC9S12VR64 48 LQFP CPU Flash memory (ECC) MC9S12VR64 2 4 16 28 Direct battery sense pin 1 Supply voltage sense 1 MC9S12VR Family Reference Manual, Rev. 4.2 22 NXP Semiconductor Device Overview MC9S12VR-Family Feature MC9S12VR16 MC9S12VR32 Chip temperature sensor MC9S12VR48 MC9S12VR64 MC9S12VR64 1 Supply voltage VSUP = 6V – 18 V (normal operation) up to 40V (protected operation) EVDD output current 20mA @ 5V Maximum execution speed 25 MHz 1.3 MC9S12VR48 Chip-Level Features On-chip modules available within the family include the following features: • HCS12 CPU core • 64, 48, 32 or 16 Kbyte on-chip flash with ECC • 512 or 128 byte EEPROM with ECC • 2 Kbyte on-chip SRAM • Phase locked loop (IPLL) frequency multiplier with internal filter • 1 MHz internal RC oscillator with +/-1.3% accuracy over rated temperature range • 4-20 MHz amplitude controlled pierce oscillator • Internal COP (watchdog) module (with separate clock source) • Timer module (TIM) supporting input/output channels that provide a range of 16-bit input capture, output compare and counter (up to 4 channels) • Pulse width modulation (PWM) module (up to 8 x 8-bit channels) • 10-bit resolution successive approximation analog-to-digital converter (ADC) with up to 6 channels available on external pins • One serial peripheral interface (SPI) module • One serial communication interface (SCI) module supporting LIN communications (with RX connected to a timer channel for internal oscillator calibration purposes, if desired) • Up to one additional SCI (not connected to LIN physical layer) • One on-chip LIN physical layer transceiver fully compliant with the LIN 2.2 standard & SAE J2602-2 LIN standard • On-chip voltage regulator (VREG) for regulation of input supply and all internal voltages • Autonomous periodic interrupt (API) (combination with cyclic, watchdog) • Two protected low-side outputs to drive inductive loads • Up to two protected high-side outputs • 4 high-voltage inputs with wake-up capability and readable internally on ADC • Up to two 10mA high-current outputs • 20mA high-current output for use as Hall sensor supply • Battery voltage sense with low battery warning, internally reverse battery protected • Chip temperature sensor MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 23 Device Overview MC9S12VR-Family 1.4 Module Features The following sections provide more details of the modules implemented on the MC9S12VR-Family. 1.4.1 HCS12 16-Bit Central Processor Unit (CPU) The HCS12 CPU is a high-speed, 16-bit processing unit that has a programming model identical to that of the industry standard M68HC11 central processor unit (CPU). • Full 16-bit data paths supports efficient arithmetic operation and high-speed math execution • Supports instructions with odd byte counts, including many single-byte instructions. This allows much more efficient use of ROM space. • Extensive set of indexed addressing capabilities, including: — Using the stack pointer as an indexing register in all indexed operations — Using the program counter as an indexing register in all but auto increment/decrement mode — Accumulator offsets using A, B, or D accumulators — Automatic index predecrement, preincrement, postdecrement, and postincrement (by –8 to +8) 1.4.2 On-Chip Flash with ECC On-chip flash memory on the MC9S12VR features the following: • 64, 48, 32 or 16 Kbyte of program flash memory — Automated program and erase algorithm — Protection scheme to prevent accidental program or erase • 512 or 128 Byte EEPROM — 16 data bits plus 6 syndrome ECC (error correction code) bits allow single bit error correction and double fault detection — Erase sector size 4 bytes — Automated program and erase algorithm — User margin level setting for reads 1.4.3 • On-Chip SRAM 2 Kbytes of general-purpose RAM MC9S12VR Family Reference Manual, Rev. 4.2 24 NXP Semiconductor Device Overview MC9S12VR-Family 1.4.4 • 1.4.5 • 1.4.6 • 1.4.7 • • • 1.4.8 • • • • Main External Oscillator (XOSCLCP) Loop control Pierce oscillator using 4 MHz to 20 MHz crystal — Current gain control on amplitude output — Signal with low harmonic distortion — Low power — Good noise immunity — Eliminates need for external current limiting resistor — Transconductance sized for optimum start-up margin for typical crystals — Oscillator pins shared with GPIO functionality Internal RC Oscillator (IRC) Factory trimmed internal reference clock — 1 MHz internal RC oscillator with 1.3% accuracy over rated temperature range Internal Phase-Locked Loop (IPLL) Phase-locked-loop clock frequency multiplier — No external components required — Reference divider and multiplier allow large variety of clock rates — Automatic bandwidth control mode for low-jitter operation — Automatic frequency lock detector — Configurable option to spread spectrum for reduced EMC radiation (frequency modulation) — Reference clock sources: – Internal 1 MHz RC oscillator (IRC) Clock and Power Management Unit (CPMU) Real time interrupt (RTI) Clock monitor (CM) System reset generation System Integrity Support Power-on reset (POR) Illegal address detection with reset Low-voltage detection with interrupt or reset Computer operating properly (COP) watchdog with option to run on internal RC oscillator — Configurable as window COP for enhanced failure detection — Can be initialized out of reset using option bits located in flash memory MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 25 Device Overview MC9S12VR-Family • 1.4.9 • • 1.4.10 • 1.4.11 • • • • • • • • • • • 1.4.12 • • • • • • Clock monitor supervising the correct function of the oscillator Timer (TIM) Up to 4 x 16-bit channels for input capture or output compare 16-bit free-running counter with 8-bit precision prescaler Pulse Width Modulation Module (PWM) Up to eight 8-bit channels or reconfigurable four 16-bit channel PWM resolution — Programmable period and duty cycle per channel — Center-aligned or left-aligned outputs — Programmable clock select logic with a wide range of frequencies LIN physical layer transceiver (LINPHY) Compliant with LIN Physical Layer 2.2 specification. Compliant with the SAE J2602-2 LIN standard. Standby mode with glitch-filtered wake-up. Slew rate selection optimized for the baud rates: 10.4kBit/s, 20kBit/s and Fast Mode (up to 250kBit/s). Switchable 34k/330k pull-ups (in shutdown mode, 330konly Current limitation for LIN Bus pin falling edge. Over-current protection. LIN TxD-dominant timeout feature monitoring the LPTxD signal. Automatic transmitter shutdown in case of an over-current or TxD-dominant timeout. Fulfills the OEM “Hardware Requirements for LIN (CAN and FlexRay) Interfaces in Automotive Applications” v1.3. Internal connection to one SCI routable to external pins Serial Peripheral Interface Module (SPI) Configurable 8- or 16-bit data size Full-duplex or single-wire bidirectional Double-buffered transmit and receive Master or slave MSB-first or LSB-first shifting Serial clock phase and polarity options MC9S12VR Family Reference Manual, Rev. 4.2 26 NXP Semiconductor Device Overview MC9S12VR-Family 1.4.13 • • • • • • • • 1.4.14 Serial Communication Interface Module (SCI) Full-duplex or single-wire operation Standard mark/space non-return-to-zero (NRZ) format Selectable IrDA 1.4 return-to-zero-inverted (RZI) format with programmable pulse widths 16-bit baud rate selection Programmable character length Programmable polarity for transmitter and receiver Active edge receive wake-up Break detect and transmit collision detect supporting LIN Analog-to-Digital Converter Module (ATD) • Up to 6-channel, 10-bit analog-to-digital converter — 8-/10-bit resolution — 3 us, 10-bit single conversion time — Left or right justified result data — Internal oscillator for conversion in stop modes — Continuous conversion mode — Multiple channel scans • Pins can also be used as digital I/O • Up to 6 pins can be used as keyboard wake-up interrupt (KWI) • Internal voltages monitored with the ATD module — VSUP, VSENSE, chip temperature sensor, high voltage inputs,VRH, VRL, VDDF 1.4.15 • • 1.4.16 • • Supply Voltage Sense (BATS) VSENSE & VSUP pin low or a high voltage interrupt VSENSE & VSUP pin can be routed via an internal divider to the internal ADC On-Chip Voltage Regulator system (VREG) Voltage regulator — Linear voltage regulator directly supplied by VSUP (protected VBAT) — Low-voltage detect with low-voltage interrupt on VSUP — Capable of supplying both the MCU internally and providing additional external current (approximately 20mA) to supply other components within the electronic control unit. — Over-temperature interrupt Internal Voltage regulator — Linear voltage regulator with bandgap reference — Low-voltage detect with low-voltage interrupt on VDDA MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 27 Device Overview MC9S12VR-Family — Power-on reset (POR) circuit — Low-voltage reset (LVR) 1.4.17 • • • • • • 2x low-side drivers targeted for up to approximately 150mA current capability. Internal timer or PWM channels can be routed to control the low-side drivers Open-load detection Over-current protection with shutdown and interrupt Active clamp (for driving relays) Recirculation detection 1.4.18 • • • • • • • Background Debug (BDM) Background debug module (BDM) with single-wire interface — Non-intrusive memory access commands — Supports in-circuit programming of on-chip nonvolatile memory 1.4.20 • • High-side drivers (HSDRV) 2 High-side drivers targeted for up to approximately 50mA current capability Internal timer or PWM channels can be routed to control the high-side drivers Over-current protection with shutdown and interrupt Slew rate control on MC9S12VR32/16 (maskset N11N) 1.4.19 • Low-side drivers (LSDRV) Debugger (DBG) Trace buffer with depth of 64 entries Three comparators (A, B and C) — Access address comparisons with optional data comparisons — Program counter comparisons — Exact address or address range comparisons Two types of comparator matches — Tagged This matches just before a specific instruction begins execution — Force This is valid on the first instruction boundary after a match occurs Four trace modes Four stage state sequencer MC9S12VR Family Reference Manual, Rev. 4.2 28 NXP Semiconductor Device Overview MC9S12VR-Family 1.5 Block Diagram Figure 1-1. MC9S12VR Block Diagram VSUP VSS Voltage Regulator Input: 6V – 18V CPU12-V1 AN[5:0] IOC0 IOC1 IOC2 IOC3 TIM 16-bit 4 channel Timer PWM BKGD PTE PE0 PE1 RESET TEST Single-wire Background Debug Module EXTAL Low Power Pierce XTAL Oscillator Debug Module 3 comparators 64 Byte Trace Buffer Clock Monitor COP Watchdog Real Time Interrupt Auton. Periodic Int. PLL with Frequency Modulation option Internal RC Oscillator Reset Generation and Test Entry Interrupt Module 8-bit 8 channel Pulse Width Modulator PWM[7:6] see Pinout SCI1 Asynchronous Serial IF SCI0 Asynchronous Serial IF SPI0 PTL Synchronous Serial IF PL0 PL1 PL2 PL3 LIN LIN LGND 5V IO Supply Output VDDX1/VSSX1 VDDX2/VSSX2 HSDRV 0 & 1 High Side Driver LSDRV 0 & 1 LINPHY LGND LIN Physical Low Side Driver BATS Battery Sensor PWM0 PWM1 PWM2 PWM3 PWM4 PWM5 RXD TXD RXD TXD MISO MOSI SCK SS HS0 HS1 VSUPHS LS0 LS1 LSGND VSENSE PTAD 10-bit 6 channel Analog-Digital Converter PAD[5:0] PTT 128/512 bytes EEPROM with ECC VDDA VSSA PT0 PT1 PT2 PT3 PTP 2K bytes RAM ADC PP0 PP1 PP2 / EVDD PP3 PP4 PP5 PS0 PS1 PTS 16/32/48/64K bytes Flash with ECC PS2 PS3 PS4 PS5 HS0 HS1 VSUPHS LS0 LS1 LSGND VSENSE Block Diagram shows the maximum configuration! Not all pins or all peripherals are available on all devices and packages. Rerouting options are not shown. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 29 Device Overview MC9S12VR-Family 1.6 Family Memory Map Table 1-2 shows the MC9S12VR-Family register memory map. Table 1-2. Device Register Memory Map Address Module Size (Bytes) 0x0000–0x0009 PIM (port integration module) 10 0x000A–0x000B MMC (memory map control) 2 0x000C–0x000D PIM (port integration module) 2 0x000E–0x000F Reserved 2 0x0010–0x0017 MMC (memory map control) 8 0x0018–0x0019 Reserved 2 0x001A–0x001B Device ID register 2 0x001C–0x001F PIM (port integration module) 4 0x0020–0x002F DBG (debug module) 16 0x0030–0x0033 Reserved 4 0x0034–0x003F CPMU (clock and power management) 12 0x0040–0x006F TIM (timer module <= 4channels) 48 0x0070–0x009F ADC (analog to digital converter <= 6 channels) 48 0x00A0–0x00C7 PWM (pulse-width modulator <= 2channels) 40 0x00C8–0x00CF SCI0 (serial communication interface) 8 0x00D0–0x00D7 SCI1 (serial communication interface) 8 0x00D8–0x00DF SPI (serial peripheral interface) 8 0x00E0–0x00FF Reserved 32 0x0100–0x0113 FTMRG control registers 20 0x0114–0x011F Reserved 12 INT (interrupt module) 1 0x0121–0x013F Reserved 31 0x0140-0x0147 HSDRV (high-side driver) 8 0x0148-0x014F Reserved 8 0x0150-0x0157 LSDRV (low-side driver) 8 0x0158-0x015F Reserved 8 0x0160-0x0167 LINPHY (LIN physical layer) 8 0x0168-0x016F Reserved 8 0x0170-0x0177 BATS (Supply Voltage Sense) 8 0x0178–0x023F Reserved 200 0x0240–0x027F PIM (port integration module) 64 0x0120 MC9S12VR Family Reference Manual, Rev. 4.2 30 NXP Semiconductor Device Overview MC9S12VR-Family Address Size (Bytes) Module 0x0280–0x02EF Reserved 112 0x02F0–0x02FF CPMU (clock and power management) 16 0x0300–0x03FF Reserved 256 NOTE Reserved register space shown in Table 1-2 is not allocated to any module. This register space is reserved for future use. Writing to these locations has no effect. Read access to these locations returns zero. Figure 1-2 shows MC9S12VR-Family CPU and BDM local address translation to the global memory map as a graphical representation. The whole 256K global memory space is visible through the P-Flash window located in the 64k local memory map located at 0x8000 - 0xBFFF using the PPAGE register. Table 1-3. MC9S12VR - Family Memory Address Ranges Device Memory Size Address MC9S12VR16 SRAM 2K 0x3800-0x3FFF EEPROM 128 Bytes 0x0400-0x047F Flash 16K Page F SRAM 2K 0x3800-0x3FFF EEPROM 128 Bytes 0x0400-0x047F Flash 32K Page E and F SRAM 2K 0x3800-0x3FFF EEPROM 512 Bytes 0x0400-0x05FF Flash 48K Page D, E and F SRAM 2K 0x3800-0x3FFF EEPROM 512 Bytes 0x0400-0x05FF Flash 64K Page C, D, E and F MC9S12VR32 MC9S12VR48 MC9S12VR64 MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 31 Device Overview MC9S12VR-Family 0x0000 0x0400 0x0600 0x3800 Local CPU and BDM Memory Map Global Memory Map Register Space Register Space EEPROM EEPROM Flash Space Unimplemented Page 0xC RAM 0x0_0000 0x0_0400 RAM 0x4000 NVMRES=1 Page 0xD Internal NVM Resources Paging Window Unimplemented Flash Space 0x0_4000 0x8000 0x0_8000 Page 0x2 0x3_0000 0xC000 Flash Space Flash Space Page 0xF Page 0xC 0x3_4000 0xFFFF Flash Space Page 0xD 0x3_8000 Flash Space Page 0xE 0x3_C000 Flash Space Page 0xF 0x3_FFFF Figure 1-2. MC9S12VR-Family Global Memory Map. MC9S12VR Family Reference Manual, Rev. 4.2 32 NXP Semiconductor Device Overview MC9S12VR-Family 1.6.1 Part ID Assignments The part ID is located in two 8-bit registers PARTIDH and PARTIDL (addresses 0x001A and 0x001B). The read-only value is a unique part ID for each revision of the chip. Table 1-4 shows the assigned part ID number and mask set number. Table 1-4. Assigned Part ID Numbers 1.7 Device Mask Set Number Part ID MC9S12VR16 N11N $3380 MC9S12VR32 N11N $3380 MC9S12VR48 N59H $3290 MC9S12VR64 N59H $3290 Signal Description and Device Pinouts This section describes signals that connect off-chip. It includes a pinout diagram, a table of signal properties, and detailed discussion of signals. It is built from the signal description sections of the individual IP blocks on the device. 1.7.1 Pin Assignment Overview Table 1-5 provides a summary of which ports are available for 32-pin and 48-pin package option. Table 1-5. Port Availability by Package Option Port 32 LQFP 48 LQFP Port AD PAD[1:0] PAD[5:0] Port E PE[1:0] PE[1:0] Port P PP[2:1] PP[5:0] Port S PS[3:2] PS[5:0] Port T PT[3:0] PT[3:0] Port L PL[3:0] PL[3:0] sum of ports 16 28 I/O power pairs VDDX/VSSX 1/1 2/2 NOTE To avoid current drawn from floating inputs, all non-bonded pins should be configured as output or configured as input with a pull up or pull down device enabled MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 33 Device Overview MC9S12VR-Family 1.7.2 Detailed Signal Descriptions This section describes the signal properties. 1.7.2.1 RESET — External Reset Signal The RESET signal is an active low bidirectional control signal. It acts as an input to initialize the MCU to a known start-up state, and an output when an internal MCU function causes a reset. The RESET pin has an internal pull-up device. 1.7.2.2 TEST — Test Pin This input only pin is reserved for factory test. This pin has an internal pull-down device. NOTE The TEST pin must be tied to ground in all applications. 1.7.2.3 BKGD / MODC — Background Debug Signal The BKGD/MODC pin is used as a pseudo-open-drain pin for the background debug communication. It is used as a MCU operating mode select pin during reset. The state of this pin is latched to the MODC bit at the rising edge of RESET. The BKGD pin has an internal pull-up device. 1.7.2.4 PAD[5:0] / KWAD[5:0] — Port AD Input Signals of ADC PAD[5:0] are general-purpose input or output signals. The signals can be configured on per signal basis as interrupt inputs with wake-up capability (KWAD[5:0]).These signals can have a pull-up or pull-down device selected and enabled on per signal basis. Out of reset the pull devices are disabled. 1.7.2.5 PE[1:0] — Port E I/O Signals PE[1:0] are general-purpose input or output signals. The signals can have pull-down device, enabled by a single control bit for this signal group. Out of reset the pull-down devices are enabled. 1.7.2.6 PP[5:0] / KWP[5:0] — Port P I/O Signals PP[5:0] are general-purpose input or output signals. The signals can be configured on per signal basis as interrupt inputs with wake-up capability (KWP[5:0]). PP[2] has a high current drive strength and an over-current interrupt feature. They can have a pull-up or pull-down device selected and enabled on per signal basis. Out of reset the pull devices are disabled. 1.7.2.7 PS[5:0] — Port S I/O Signals PS[5:0] are general-purpose input or output signals. They can have a pull-up or pull-down device selected and enabled on per signal basis. Out of reset the pull-up devices are enabled. MC9S12VR Family Reference Manual, Rev. 4.2 34 NXP Semiconductor Device Overview MC9S12VR-Family 1.7.2.8 PT[3:0] — Port T I/O Signals PT[3:0] are general-purpose input or output signals. They can have a pull-up or pull-down device selected and enabled on per signal basis. Out of reset the pull devices are disabled. 1.7.2.9 PL[3:0] / KWL[3:0] — Port L Input Signals PL[3:0] are high voltage input ports. The signals can be configured on per signal basis as interrupt inputs with wake-up capability (KWL[3:0]). 1.7.2.10 LIN — LIN Physical Layer Signal This pad is connected to the single-wire LIN data bus. 1.7.2.11 HS[1:0] — High-Side Drivers Output Signals Outputs of the two high-side drivers intended to drive incandescent bulbs or LEDs. 1.7.2.12 LS[1:0] — Low-Side Drivers Output Signals Outputs of the two low-side drivers intended to drive inductive loads (relays). 1.7.2.13 VSENSE — Voltage Sensor Input This pin can be connected to the supply (Battery) line for voltage measurements. The voltage present at this input is scaled down by an internal voltage divider, and can be routed to the internal ADC via an analog multiplexer. The pin itself is protected against reverse battery connections. To protect the pin from external fast transients an external resistor is needed. 1.7.2.14 AN[5:0] — ADC Input Signals AN[5:0] are the analog inputs of the Analog-to-Digital Converter. 1.7.2.15 SPI Signals 1.7.2.15.1 SS Signal This signal is associated with the slave select SS functionality of the serial peripheral interface SPI. 1.7.2.15.2 SCK Signal This signal is associated with the serial clock SCK functionality of the serial peripheral interface SPI. 1.7.2.15.3 MISO Signal This signal is associated with the MISO functionality of the serial peripheral interface SPI. This signal acts as master input during master mode or as slave output during slave mode. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 35 Device Overview MC9S12VR-Family 1.7.2.15.4 MOSI Signal This signal is associated with the MOSI functionality of the serial peripheral interface SPI. This signal acts as master output during master mode or as slave input during slave mode 1.7.2.16 1.7.2.16.1 LINPHY Signals VLINSUP — Positive Power Supply This is the power supply to the LINPHY. The VLINSUP is connected to VSUP. 1.7.2.16.2 LPTXD Signal This signal is the LINPHY transmit input. See Figure 2-22 1.7.2.16.3 LPRXD Signal This signal is the LINPHY receive output. See Figure 2-22 1.7.2.17 1.7.2.17.1 SCI Signals RXD[1:0] Signals Those signals are associated with the receive functionality of the serial communication interfaces SCI1-0. 1.7.2.17.2 TXD[1:0] Signals Those signals are associated with the transmit functionality of the serial communication interfaces SCI1-0. 1.7.2.18 PWM[7:0] Signals The signals PWM[7:0] are associated with the PWM module outputs. 1.7.2.19 1.7.2.19.1 Internal Clock outputs ECLK This signal is associated with the output of the divided bus clock (ECLK). NOTE This feature is only intended for debug purposes at room temperature. It must not be used for clocking external devices in an application. 1.7.2.20 ETRIG[1:0] These signals are inputs to the Analog-to-Digital Converter. Their purpose is to trigger ADC conversions. MC9S12VR Family Reference Manual, Rev. 4.2 36 NXP Semiconductor Device Overview MC9S12VR-Family 1.7.2.21 IOC[3:0] Signals The signals IOC[3:0] are associated with the input capture or output compare functionality of the timer (TIM) module. 1.7.3 Power Supply Pins MC9S12VR-Family power and ground pins are described below. Because fast signal transitions place high, short-duration current demands on the power supply, use bypass capacitors with high-frequency characteristics and place them as close to the MCU as possible. NOTE All ground pins must be connected together in the application. 1.7.3.1 VDDX1, VDDX2, VSSX1, VSSX2 — Power Pins and Ground Pins VDDX1 and VDDX2 are the 5V power supply output for the I/O drivers. This voltage is generated by the on chip voltage regulator. Bypass requirements on VDDX1 and VDDX2 pins depend on how heavily the MCU pins are loaded. All VDDX pins are connected together internally. All VSSX pins are connected together internally. NOTE Not all power and ground pins are available on all packages. Refer to pinout section for further details. 1.7.3.2 VDDA, VSSA — Power Supply Pins for ADC These are the power supply and ground input pins for the analog-to-digital converter and the voltage regulator. NOTE The reference voltages VRH and VRL mentioned in Appendix C, “ATD Electrical Specifications are internally connected to VDDA and VSSA. 1.7.3.3 VSS — Core Ground Pin The voltage supply of nominally 1.8V is generated by the internal voltage regulator. The return current path is through the VSS pin. 1.7.3.4 LGND — LINPHY Ground Pin LGND is the the ground pin for the LIN physical layer LINPHY. 1.7.3.5 LSGND — Ground Pin for Low-Side Drivers LSGND is the shared ground pin for the low-side drivers. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 37 Device Overview MC9S12VR-Family 1.7.3.6 VSUP — Voltage Supply Pin for Voltage Regulator VSUP is the 12V/18V shared supply voltage pin for the on chip voltage regulator. 1.7.3.7 VSUPHS — Voltage Supply Pin for High-Side Drivers VSUPHS is the 12V/18V shared supply voltage pin for the high-side drivers. 1.7.3.8 Power and Ground Connection Summary Table 1-6. Power and Ground Connection Summary Mnemonic Nominal Voltage VSS 0V Ground pin for 1.8V core supply voltage generated by on chip voltage regulator VDDX1 5.0 V 5V power supply output for I/O drivers generated by on chip voltage regulator VSSX1 0V VDDX2 5.0 V VSSX2 0V VDDA 5.0 V VSSA 0V Ground pin for VDDA analog supply LGND 0V Ground pin for LIN physical LSGND 0V Ground pin for low-side driver VSUP 12V/18V External power supply for voltage regulator VSUPHS 12V/18V External power supply for high-side driver 1.7.4 Description Ground pin for I/O drivers 5V power supply output for I/O drivers generated by on chip voltage regulator Ground pin for I/O drivers External power supply for the analog-to-digital converter and for the reference circuit of the internal voltage regulator Device Pinouts MC9S12VR-Family is available in 48-pin package and 32-pin package. Signals in parentheses in Figure 1-3. and Figure 1-4. denote alternative module routing options. MC9S12VR Family Reference Manual, Rev. 4.2 38 NXP Semiconductor Device Overview MC9S12VR-Family Pinout 48-pin LQFP 48 47 46 45 44 43 42 41 40 39 38 37 PS1 / (TXD0) / (LPDR1) / TXD1 PS0 / (RXD0) / RXD1 PT3 / IOC3 / (LPTXD) / (SS) PT2 / IOC2 / (LPRXD) / (SCK) PT1 / IOC1 / PWM7 / (TXD0) / (LPDR) PT0 / IOC0 / PWM6 / (RXD0) PAD0 / KWAD0 / AN0 PAD1 / KWAD1 / AN1 PAD2 / KWAD2 / AN2 PAD3 / KWAD3 / AN3 VDDA VSSA 1.7.5 1 2 3 4 5 6 7 8 9 10 11 12 MC9S12VR 48-pin LQFP 36 35 34 33 32 31 30 29 28 27 26 25 PAD4 / KWAD4 / AN4 PAD5 / KWAD5 / AN5 PL3 / HVI3 / KWL3 PL2 / HVI2 / KWL2 PL1 / HVI1 / KWL1 PL0 / HVI0 / KWL0 VSENSE HS1 / (OC3) / (PWM1) / (PWM4) VSSX2 HS0 / (OC2) / (PWM3) VSUPHS VSUP TEST RESET PWM3 / KWP3 / PP3 PWM4 / (ETRIG0) / KWP4 / PP4 PWM5 / (ETRIG1) / IRQ / KWP5 / PP5 VSS EXTAL / PE0 XTAL / PE1 VDDX2 PWM0 / KWP0 / PP0 XIRQ / PWM1 / KWP1 / PP1 PWM2 / EVDD / KWP2 / PP2 13 14 15 16 17 18 19 20 21 22 23 24 LGND LIN (PWM5) / (PWM6) / (OC0) / LS0 LSGND (PWM7) / (OC1) / LS1 VSSX1 VDDX1 API_EXTCLK / MISO / (RXD1) / (PWM4) / (ETRIG0) / PS2 ECLK / MOSI / (TXD1) / (PWM5) / (ETRIG1) / PS3 SCK / PS4 SS / PS5 MODC / BKGD Figure 1-3. MC9S12VR 48-pin LQFP pinout MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 39 Device Overview MC9S12VR-Family Pinout 32-pin LQFP 1 32 31 30 29 28 27 26 25 PT3 / IOC3 / (LPTXD) / (SS) PT2 / IOC2 / (LPRXD) / (SCK) PT1 / IOC1 / PWM7 / (TXD0) / (LPDR1) PT0 / IOC0 / PWM6 / (RXD0) PAD0 / KWAD0 / AN0 PAD1 / KWAD1 / AN1 VDDA VSSA 1.7.6 1 2 3 4 5 6 7 8 MC9S12VR 32-pin LQFP 24 23 22 21 20 19 18 17 PL3 / HVI3 / KWL3 PL2 / HVI2 / KWL2 PL1 / HVI1 / KWL1 PL0 / HVI0 / KWL0 VSENSE VSSX2 HS0 / (OC2) / (PWM3) VSUP TEST RESET VSS EXTAL / PE0 XTAL / PE1 VDDX2 XIRQ / PWM1 / KWP1 / PP1 PWM2 / EVDD / KWP2 / PP2 9 10 11 12 13 14 15 16 LGND LIN (PWM5) / (PWM6) / (OC0) / LS0 LSGND PWM7 / (OC1) / LS1 API_EXTCLK / MISO / (RXD1) / (PWM4) / (ETRIG0) / PS2 ECLK / MOSI / (TXD1) / (PWM5) / (ETRIG1) / PS3 MODC / BKGD Figure 1-4. MC9S12VR 32-pin LQFP pinout 1. SPI and SCI1 functionality on PS2, PS3, PT2 and PT3 is not available on MC9S12VR32/16. MC9S12VR Family Reference Manual, Rev. 4.2 40 NXP Semiconductor Device Overview MC9S12VR-Family Table 1-7. Pin Summary LQFP Function 48 32 1 Pin 1th Func. 2nd Func. 3rd Func. 4th Func. 5th Func. 1 1 LGND — — — — — 2 2 LIN — — — — 2 Power Supply Internal Pull Resistor CTRL Reset State — — — — — — — 3 3 LS0 OC0 PWM5 PWM6 — — — — — 4 4 LSGND — — — — — — — — 5 5 LS1 OC13 PWM7 — — — — — — 6 — VSSX1 — — — — — — — — 7 — VDDX1 — — — — — VDDX — — 8 6 PS2 ETRIG0 PWM4 RXD1 MISO API_ EXTCK VDDX PERS/PPSS 9 7 PS3 ETRIG1 PWM5 TXD1 MOSI ECLK VDDX PERS/PPSS Up 10 — PS4 SCK — — — — VDDX PERS/PPSS Up 11 — PS5 SS — — — — VDDX PERS/PPSS Up 12 8 BKGD MODC — — — — VDDX PUCR/BKPUE Up 13 9 TEST — — — — — N.A RESET pin Down 14 10 RESET — — — — — VDDX TEST pin Up 15 — PP3 KWP3 PWM3 — — — VDDX PERP/PPSP Disabled 16 — PP4 KWP4 ETRIG0 PWM4 — — VDDX PERP/PPSP Disabled 17 — PP5 KWP5 ETRIG1 PWM5 IRQ — VDDX PERP/PPSP Disabled 18 11 VSS — — — — — — — — 19 12 PE0 EXTAL — — — — VDDX PUCR/PUPEE Down 20 13 PE1 XTAL — — — — VDDX PUCR/PUPEE Down 21 14 VDDX2 — — — — — — — — 22 — PP0 KWP0 PWM0 — — — VDDX PERP/PPSP Disabled 23 15 PP1 KWP1 PWM1 XIRQ — — VDDX PERP/PPSP Disabled 24 16 PP2 KWP2 EVDD PWM2 — — VDDX PERP/PPSP Disabled 25 17 VSUP — — — — — — — — 26 — VSUPH S — — — — — — — — 27 18 HS0 OC24 PWM3 — — — VSUPHS — — Up MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 41 Device Overview MC9S12VR-Family LQFP Function 48 32 1 Pin 1th Func. 2nd Func. 3rd Func. 4th Func. 5th Func. 28 19 VSSX2 — — — — — 29 — HS1 OC35 PWM1 PWM4 — 30 20 VSENS E — — — 31 21 PL0 HVI0 KWL0 32 22 PL1 HVI1 33 23 PL2 34 24 35 Power Supply Internal Pull Resistor CTRL Reset State — — — — VSUPHS — — — — — — — — — — VDDX — — KWL1 — — — VDDX — — HVI2 KWL2 — — — VDDX — — PL3 HVI3 KWL3 — — — VDDX — — — PAD5 KWAD 5 AN5 — — — VDDA PER1AD/ PPS1AD Disabled 36 — PAD4 KWAD 4 AN4 — — — VDDA PER1AD/ PPS1AD Disabled 37 25 VSSA — — — — — — — — 38 26 VDDA — — — — — — — — 39 — PAD3 KWAD 3 AN3 — — — VDDA PER1AD/ PPS1AD Disabled 40 — PAD2 KWAD 2 AN2 — — — VDDA PER1AD/ PPS1AD Disabled 41 27 PAD1 KWAD 1 AN1 — — — VDDA PER1AD/ PPS1AD Disabled 42 28 PAD0 KWAD 0 AN0 — — — VDDA PER1AD/ PPS1AD Disabled 43 29 PT0 IOC0 PWM6 RXD0 — — VDDX PERT/PPST Disabled 44 30 PT1 IOC1 PWM7 TXD0 LPDR1 — VDDX PERT/PPST Disabled 45 31 PT2 IOC2 LPRXD SCK — — VDDX PERT/PPST Disabled 46 32 PT3 IOC3 LPTXD SS — — VDDX PERT/PPST Disabled 47 — PS0 RXD0 RXD1 — — — VDDX PERS/PPSS Up 48 — PS1 TXD0 LPDR1 TXD1 — — VDDX PERS/PPSS Up 1 SPI and SCI1 functionality on PS2, PS3, PT2 and PT3 not available on MC9S12VR16/32 Timer Output Compare Channel 0 3 Timer Output Compare Channel 1 4 Timer Output Compare Channel 2 5 Timer Output Compare Channel 3 2 MC9S12VR Family Reference Manual, Rev. 4.2 42 NXP Semiconductor Device Overview MC9S12VR-Family MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 43 Device Overview MC9S12VR-Family 1.8 Modes of Operation The MCU can operate in different modes. These are described in 1.8.1 Chip Configuration Summary. The MCU can operate in different power modes to facilitate power saving when full system performance is not required. These are described in 1.8.2 Low Power Operation. Some modules feature a software programmable option to freeze the module status whilst the background debug module is active to facilitate debugging. 1.8.1 Chip Configuration Summary The different modes and the security state of the MCU affect the debug features (enabled or disabled). The operating mode out of reset is determined by the state of the MODC signal during reset (see Table 1-8). The MODC bit in the MODE register shows the current operating mode and provides limited mode switching during operation. The state of the MODC signal is latched into this bit on the rising edge of RESET. Table 1-8. Chip Modes Chip Modes 1.8.1.1 MODC Normal single chip 1 Special single chip 0 Normal Single-Chip Mode This mode is intended for normal device operation. The opcode from the on-chip memory is being executed after reset (requires the reset vector to be programmed correctly). The processor program is executed from internal memory. 1.8.1.2 Special Single-Chip Mode This mode is used for debugging single-chip operation, boot-strapping, or security related operations. The background debug module BDM is active in this mode. The CPU executes a monitor program located in an on-chip ROM. BDM firmware waits for additional serial commands through the BKGD pin. 1.8.2 Low Power Operation The MC9S12VR-Family has two dynamic-power modes (run and wait) and two static low-power modes stop and pseudo stop). For a detailed description refer to Section Chapter 1 S12 Clock, Reset and Power Management Unit (S12CPMU_UHV). • Dynamic power mode: Run — Run mode is the main full performance operating mode with the entire device clocked. The user can configure the device operating speed through selection of the clock source and the phase locked loop (PLL) frequency. To save power, unused peripherals must not be enabled. MC9S12VR Family Reference Manual, Rev. 4.2 44 NXP Semiconductor Device Overview MC9S12VR-Family • • • 1.9 Dynamic power mode: Wait — This mode is entered when the CPU executes the WAI instruction. In this mode the CPU will not execute instructions. The internal CPU clock is switched off. All peripherals can be active in system wait mode. For further power consumption the peripherals can individually turn off their local clocks. Asserting RESET, XIRQ, IRQ, or any other interrupt that is not masked ends system wait mode. Static power mode Pseudo-stop: — In this mode the system clocks are stopped but the oscillator is still running and the real time interrupt (RTI) and watchdog (COP), Autonomous Periodic Interrupt (API) and ATD modules may be enabled. Other peripherals are turned off. This mode consumes more current than system STOP mode but, as the oscillator continues to run, the full speed wake up time from this mode is significantly shorter. Static power mode: Stop — The oscillator is stopped in this mode. By default, all clocks are switched off and all counters and dividers remain frozen. The autonomous periodic interrupt (API), key wake-up and the SCI modules may be enabled to wake the device. Security The MCU security mechanism prevents unauthorized access to the Flash memory. Refer to Section 5.4.1 Security and Section 18.5 Security. 1.10 Resets and Interrupts Consult the S12 CPU manual and the S12SINT section for information on exception processing. 1.10.1 Resets Table 1-9. lists all Reset sources and the vector locations. Resets are explained in detail in the Chapter 4, “S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8)”. Table 1-9. Reset Sources and Vector Locations Vector Address Reset Source CCR Mask Local Enable $FFFE Power-On Reset (POR) None None $FFFE Low Voltage Reset (LVR) None None $FFFE External pin RESET None None $FFFE Illegal Address Reset None None $FFFC Clock monitor reset None OSCE Bit in CPMUOSC register MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 45 Device Overview MC9S12VR-Family 1.10.2 Vector Address Reset Source CCR Mask Local Enable $FFFA COP watchdog reset None CR[2:0] in CPMUCOP register Interrupt Vectors Table 1-10 lists all interrupt sources and vectors in the default order of priority. The interrupt module (see Chapter 7, “Interrupt Module (S12SINTV1)”) provides an interrupt vector base register (IVBR) to relocate the vectors. Table 1-10. Interrupt Vector Locations (Sheet 1 of 3) Vector Address Interrupt Source CCR Mask Local Enable Vector base + $F8 Unimplemented instruction trap None None - - Vector base+ $F6 SWI None None - - Vector base+ $F4 XIRQ X Bit None Yes Yes Vector base+ $F2 IRQ I bit IRQCR (IRQEN) Yes Yes Vector base+ $F0 RTI time-out interrupt I bit CPMUINT (RTIE) see Section 4.1.2.3 Stop Mode YES Vector base+ $EE TIM timer channel 0 I bit TIE (C0I) No Yes Vector base + $EC TIM timer channel 1 I bit TIE (C1I) No Yes Vector base+ $EA TIM timer channel 2 I bit TIE (C2I) No Yes Vector base+ $E8 TIM timer channel 3 I bit TIE (C3I) No Yes TSCR2(TOF) No Yes Vector base+ $E6 to Vector base + $E0 Vector base+ $DE Wake up Wake up from STOP from WAIT Reserved TIM timer overflow I bit Vector base+ $DC to Vector base + $DA Reserved Vector base + $D8 SPI I bit SPICR1 (SPIE, SPTIE) No Yes Vector base+ $D6 SCI0 I bit SCI0CR2 (TIE, TCIE, RIE, ILIE) SCI0ACR1 (RXEDGIE, BERRIE, BKDIE) RXEDGIF only Yes MC9S12VR Family Reference Manual, Rev. 4.2 46 NXP Semiconductor Device Overview MC9S12VR-Family Table 1-10. Interrupt Vector Locations (Sheet 2 of 3) Wake up Wake up from STOP from WAIT Vector Address Interrupt Source CCR Mask Vector base + $D4 SCI1 I bit SCI1CR2 (TIE, TCIE, RIE, ILIE) SCI1ACR1 (RXEDGIE, BERRIE, BKDIE) RXEDGIF only Yes Vector base + $D2 ADC I bit ATDCTL2 (ASCIE) No Yes Yes Yes Reserved Vector base + $D0 Vector base + $CE Local Enable Port L I bit Vector base + $CC to Vector base + $CA PIEL (PIEL3-PIEL0) Reserved Vector base + $C8 Oscillator status interrupt I bit CPMUINT (OSCIE) No Yes Vector base + $C6 PLL lock interrupt I bit CPMUINT (LOCKIE) No Yes Vector base + $C4 to Vector base + $BC Reserved Vector base + $BA FLASH error I bit FERCNFG (SFDIE, DFDIE) No No Vector base + $B8 FLASH command I bit FCNFG (CCIE) No Yes Vector base + $B6 to Vector base + $B0 Reserved Vector base + $AE HSDRV over-current interrupt I bit HSIE (HSERR) Vector base + $AC LSDRV over-current interrupt I bit LSIE (LSERR) No Yes Vector base + $AA LINPHY over-current interrupt or Txd-dominant timeout interrupt I bit LPIE (LPDTIE & LPOCIE) No Yes Vector base + $A8 BATS low & high battery voltage interrupt I bit BATIE (BVHIE,BVLIE) No Yes Vector base + $A6 to Vector base + $90 No Yes Reserved Vector base + $8E Port P interrupt I bit PIEP (PIEP5-PIEP3, PIEP1-PIEP0) Yes Yes Vector base+ $8C Port P2 (EVDD Hall Sensor Supply) over-current interrupt I bit PIEP (OCIE) No Yes Vector base + $8A Low-voltage interrupt (LVI) I bit CPMUCTRL (LVIE) No Yes Vector base + $88 Autonomous periodical interrupt (API) I bit CPMUAPICTRL (APIE) Yes Yes Vector base + $86 High temperature interrupt I bit CPMUHTCTL(HTIE) No Yes Vector base + $84 ADC compare interrupt I bit ATDCTL2 (ACMPIE) No Yes Vector base + $82 Port AD interrupt I bit PIE1AD(PIE1AD5-PIE1AD0) Yes Yes MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 47 Device Overview MC9S12VR-Family Table 1-10. Interrupt Vector Locations (Sheet 3 of 3) Vector Address Interrupt Source CCR Mask Local Enable Vector base + $80 Spurious interrupt — None 1.10.3 Wake up Wake up from STOP from WAIT - - Effects of Reset When a reset occurs, MCU registers and control bits are initialized. Refer to the respective block sections for register reset states. On each reset, the Flash module executes a reset sequence to load Flash configuration registers. 1.10.3.1 Flash Configuration Reset Sequence Phase On each reset, the Flash module will hold CPU activity while loading Flash module registers from the Flash memory. If double faults are detected in the reset phase, Flash module protection and security may be active on leaving reset. This is explained in more detail in the Flash module Section 18.1, “Introduction”. 1.10.3.2 Reset While Flash Command Active If a reset occurs while any Flash command is in progress, that command will be immediately aborted. The state of the word being programmed or the sector/block being erased is not guaranteed. 1.10.3.3 I/O Pins Refer to the PIM section for reset configurations of all peripheral module ports. 1.10.3.4 RAM The RAM arrays are not initialized out of reset. 1.11 Module Device level Dependencies 1.11.1 CPMU Differences between Maskset N59H (MC9S12VR64/48) and N11N (MC9S12VR32/16) The following features described in the CPMU section (CPMU V8) are only available on Maskset N11N: • Full swing pierce oscillator OSCMOD bit in CPMUOSC2 register. See Section 4.3.2.24 S12CPMU_UHV_V8 Oscillator Register 2 (CPMUOSC2) • Oscillator clock monitor reset configuration OMRE bit in CPMUOSC2 register. See Section 4.3.2.24 S12CPMU_UHV_V8 Oscillator Register 2 (CPMUOSC2) • PLL clock monitor reset PMRF flag in CPMUINT register. See Section 4.3.2.5 S12CPMU_UHV_V8 Interrupt Enable Register (CPMUINT) MC9S12VR Family Reference Manual, Rev. 4.2 48 NXP Semiconductor Device Overview MC9S12VR-Family 1.11.2 API external clock output (API_EXTCLK) The API_EXTCLK option which is described 4.3.2.15 Autonomous Periodical Interrupt Control Register (CPMUAPICTL) is available on PS2 on S12VR-Family. 1.11.3 COP Configuration The COP time-out rate bits CR[2:0] and the WCOP bit in the CPMUCOP register at address 0x003C are loaded from the Flash configuration field byte at global address 0x3_FF0E during the reset sequence. See Table 1-11 and Table 1-12 for coding. Table 1-11. Initial COP Rate Configuration NV[2:0] in FOPT Register CR[2:0] in COPCTL Register 000 111 001 110 010 101 011 100 100 011 101 010 110 001 111 000 Table 1-12. Initial WCOP Configuration 1.11.4 NV[3] in FOPT Register WCOP in COPCTL Register 1 0 0 1 CPMU High Temperature Trimming The value loaded from the flash into the CPMUHTTR register is a default value for the device family. There is no device specific trimming carried out during production. The specified VHT value is a typical value that is part dependent and should thus be calibrated. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 49 Device Overview MC9S12VR-Family 1.11.5 Flash IFR Mapping Table 1-13. Flash IFR Mapping Target IFR Byte Address F E D C B A 9 8 0x40BA - 0x40BB 6 5 4 3 2 1 0 ADC Bandgap Reference1 0x405A - 0x405B 0x40B8 - 0x40B9 7 ACLKTR[5:0]2 TCTRIM[4:0]4 HTTR[3:0]3 IRCTRIM[9:0]4 1 see Section 1.12.1 ADC Calibration see Section 4.3.2.16 Autonomous Clock Trimming Register (CPMUACLKTR) 3 see Section 4.3.2.19 High Temperature Trimming Register (CPMUHTTR) 4 see Section 4.3.2.20 S12CPMU_UHV_V8 IRC1M Trim Registers (CPMUIRCTRIMH / CPMUIRCTRIML) 2 1.11.6 ADC External Trigger Input Connection The ADC module includes external trigger inputs ETRIG0, ETRIG1, ETRIG2, and ETRIG3. The external trigger allows the user to synchronize ADC conversion to external trigger events. On MC9S12VR64/48 ETRIG0 is connected to PP0 / PWM0 and ETRIG1 is connected to PP1 / PWM1. ETRIG2 and ETRIG3 are not used. ETRIG0 can be routed to PS2 and ETRIG1 can be routed to PS3. On MC9S12VR32/16 ETRIG0 is connected to PS2 and ETRIG1 is connected to PS3. 1.11.7 ADC Special Conversion Channels Whenever the ADC’s Special Channel Conversion Bit (SC) in 8.3.2.6 ATD Control Register 5 (ATDCTL5) is set, it is capable of running conversion on a number of internal channels. Table 1-14 lists the internal sources which are connected to these special conversion channels. MC9S12VR Family Reference Manual, Rev. 4.2 50 NXP Semiconductor Device Overview MC9S12VR-Family Table 1-14. Usage of ADC Special Conversion Channels ATDCTL5 Register Bits 1.12 1.12.1 Usage SC CD CC CB CA ADC Channel 1 0 0 0 1 Internal_7 Bandgap Voltage VBG or Chip temperature sensor VHT see Section 4.3.2.13 High Temperature Control Register (CPMUHTCTL) 1 0 0 1 0 Internal_0 Flash Supply Voltage VDDF 1 1 0 1 0 Internal_4 VSENSE or VSUP selectable in BATS module see Section 17.1.1 Features 1 1 0 1 1 Internal_5 High voltage inputs Port L see Section 2.3.36 Port L Analog Access Register (PTAL) Application Information ADC Calibration MCUs of the MC9S12VR-Family are able to measure the internal bandgap reference voltage VBG with the analog digital converter. (see Table 1-14) VBG is a constant voltage with a narrow distribution over temperature and external voltage supply. The ADC conversion result of VBG is provided at address 0x0_405A/0x0_405B in the NVM IFR for reference. The measurement conditions of the reference conversion are listed in Table 1-15. By measuring the voltage VBG and comparing the result to the reference value in the IFR it is possible to determine the reference voltage of the ADC VRH in the application environment: StoredReference V RH = ------------------------------------------------------- 5V ConvertedReference The exact absolute value of an analog conversion can be determined as follows: StoredReference 5V Result = ConvertedADInput -----------------------------------------------------------------nConvertedReference 2 With: ConvertedADInput: ConvertedReference: StoredReference: n: Result of the analog to digital conversion of the desired pin Result of channel “Internal_7” conversion Value in IFR location 0x0_405A/0x0_405B ADC resolution (10 bit) MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 51 Device Overview MC9S12VR-Family CAUTION The ADC’s reference voltage VRH must must remain at a constant level throughout the conversion process. The reference voltage VBG is measured under the conditions shown in Table 1-15.. The value stored in the IFR is the average of eight consecutive conversions at TJ=150oC and eight consecutive conversions at TJ=-40oC. Table 1-15. Measurement Conditions for VBG ADC Conversion1 Description Symbol Value Unit Regulator supply voltage VSUP 5 V I/O supply voltage VDDX 5 V Analog supply voltage VDDA 5 V ADC clock fadcclk 6.25 MHz ADC sample time tsmp 4 ADC clock cycles Bus frequency fbus 25 MHz Junction temperature Tj -40 .. 150 Code execution 1 o C from RAM Voltage Regulator bypassed , VDDX and VDDA supplied from tester MC9S12VR Family Reference Manual, Rev. 4.2 52 NXP Semiconductor Chapter 2 Port Integration Module (S12VRPIMV3) Table 2-1. Revision History Rev. No. (Item No.) Date (Submitted Sections Affected By) Substantial Change(s) V03.00 20 Nov 2013 V03.01 04 Dec 2013 Table 2-1 V03.02 27 Jan 2014 Table 2-1 2.4.4.3/2-112 V03.03 04 Feb 2014 2.4.3.6.2/2-109 Table 2-49 V03.04 21 Feb 2014 2.3.21/2-77 • Added API_EXTCLK to DDRS2 bit description V03.05 24 Apr 2014 2.3.10/2-67 • Internal updates • 2.1 2.1.1 • Added S12VR32/16 specification • Added API_EXTCLK • Improved high-current output pin description • Corrected HVI digital input enable out of reset statement • Shortened table contents Introduction Overview The S12VR port integration module (PIM) establishes the interface between the peripheral modules and the I/O pins for all ports. It controls the electrical pin properties as well as the signal prioritization and multiplexing on shared pins. This section covers: For S12VR64/48: • 2-pin port E associated with the external oscillator • 4-pin port T associated with 4 TIM channels and 2 PWM channels • 6-pin port S associated with 2 SCI and 1 SPI • 6-pin port P with pin interrupts and wakeup function; associated with — IRQ, XIRQ interrupt inputs — Six PWM channels with two of those capable of driving up to 10 mA — One output with over-current protection and interrupt capable of supplying up to 20 mA to external devices such as Hall sensors MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 53 Port Integration Module (S12VRPIMV3) • • 6-pin port AD with pin interrupts and wakeup function; associated with 6 ADC channels 4-pin port L with pin interrupts and wakeup function; associated with 4 high-voltage inputs for digital or analog use with optional voltage divider bypass and open input detection For S12VR32/16: • 2-pin port E associated with the external oscillator • 4-pin port T associated with 4 TIM channels and 2 PWM channels • 2-pin port S associated with 1 SCI • 2-pin port P with pin interrupts and wakeup function; associated with — XIRQ interrupt input — 2 PWM channels with one of those capable of driving up to 10 mA — One output with over-current protection and interrupt capable of supplying up to 20 mA to external devices such as Hall sensors • 2-pin port AD with pin interrupts and wakeup function; associated with 2 ADC channels • 4-pin port L with pin interrupts and wakeup function; associated with 4 high-voltage inputs for digital or analog use with optional voltage divider bypass and open input detection Most I/O pins can be configured by register bits to select data direction and to enable and select pullup or pulldown devices. 2.1.2 Features The PIM includes these distinctive registers: • Data registers and data direction registers for Ports E, T, S, P and AD when used as general-purpose I/O • Control registers to enable/disable pull devices and select pullups/pulldowns on Ports T, S, P, AD on per-pin basis • Single control register to enable/disable pullups on Port E on per-port basis and on BKGD pin • Control registers to enable/disable open-drain (wired-or) mode on Port S • Control register to enable/disable reduced output drive on Port P high-current pins • Interrupt flag register for pin interrupts on Port P, L and AD • Control register to configure IRQ pin operation • Control register to enable ECLK clock output • Routing registers to support module port relocation and control internal module routings: — PWM and ETRIG to alternative pins — SPI SS and SCK to alternative pins (S12VR64/48 only) — SCI1 to alternative pins (S12VR64/48 only) — HSDRV and LSDRV control selection from PWM, TIM or related register bit — Various SCI0-LINPHY routing options supporting standalone use and conformance testing — Optional LINPHY to TIM link MC9S12VR Family Reference Manual, Rev. 4.2 54 NXP Semiconductor Port Integration Module (S12VRPIMV3) — Optional HVI to ADC link A standard port pin has the following minimum features: • Input/output selection • 5 V output drive • 5 V digital and analog input • Input with selectable pullup or pulldown device Optional features supported on dedicated pins: • Two selectable output drive strengths • Open drain for wired-or connections • Interrupt input with glitch filtering • High-voltage input • 10 mA high-current output • 20 mA high-current output with over-current protection for use as Hall sensor supply 2.2 External Signal Description This section lists and describes the signals that do connect off-chip. Table 2-2 shows all the pins and their functions that are controlled by the PIM. Routing options are denoted in parenthesis. NOTE If there is more than one function associated with a pin, the output priority is indicated by the position in the table from top (highest priority) to bottom (lowest priority). Table 2-2. Pin Functions and Priorities1 Port Pin Name Pin Function & Priority1 I/O - BKGD MODC2 I BKGD E PE1 XTAL PE0 EXTAL PTE[1] PTE[0] Description MODC input during RESET Pin Function after Reset BKGD I/O BDM communication pin - CPMU OSC signal GPIO I/O General-purpose - CPMU OSC signal I/O General-purpose MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 55 Port Integration Module (S12VRPIMV3) Port Pin Name Pin Function & Priority1 T PT3 (SS) (LPTXD) IOC3 PT2 I/O SPI slave select I I/O SPI serial clock (LPDR1) (TXD0) PWM7 IOC1 PTT[1] (RXD0) PWM6 IOC0 PTT[0] GPIO I/O TIM channel 3 (SCK) IOC2 Pin Function after Reset LINPHY transmit pin I/O General-purpose PTT[2] PT0 Description PTT[3] (LPRXD) PT1 I/O O LINPHY receive pin I/O TIM channel 2 I/O General-purpose O LINPHY register LPDR[LPDR1] I/O Serial Communication Interface 0 transmit pin O Pulse Width Modulator channel 7 I/O TIM channel 1 I/O General-purpose I Serial Communication Interface 0 receive pin O Pulse Width Modulator channel 6 I/O TIM channel 0 I/O General-purpose 1. Signals in bold underlined are only available on S12VR64/48. MC9S12VR Family Reference Manual, Rev. 4.2 56 NXP Semiconductor Port Integration Module (S12VRPIMV3) Port Pin Name Pin Function & Priority1 S PS5 SS PTS[5] PS4 SCK PTS[4] PS3 ECLK MOSI (TXD1) I/O General-purpose O Free running clock I/O SPI master out / slave in I/O Serial Communication Interface 1 transmit pin I ADC external trigger input I/O General-purpose O CPMU API external clock output I/O SPI master in / slave out (RXD1) I Serial Communication Interface 1 receive pin (PWM4) O Pulse Width Modulator channel 4 I ADC external trigger input PTS[2] I/O General-purpose TXD1 I/O Serial Communication Interface 1 transmit pin (LPDR1) O LINPHY register LPDR[LPDR1] (TXD0) I/O Serial Communication Interface 0 transmit pin PTS[1] I/O General-purpose RXD1 I Serial Communication Interface 1 receive pin (RXD0) I Serial Communication Interface 0 receive pin PTS[0] GPIO I/O SPI serial clock (ETRIG1) API_EXTCLK Pin Function after Reset I/O General-purpose Pulse Width Modulator channel 5 (ETRIG0) PS0 I/O SPI slave select O MISO PS1 Description (PWM5) PTS[3] PS2 I/O I/O General-purpose MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 57 Port Integration Module (S12VRPIMV3) Port Pin Name Pin Function & Priority1 I/O P PP5 IRQ I Maskable level- or falling edge-sensitive interrupt PWM5 O Pulse Width Modulator channel 5 I ADC external trigger input ETRIG1 PTP[5]/ KWP[5] PP4 PWM4 ETRIG0 PTP[4]/ KWP[4] PP3 PWM3 PTP[3]/ KWP[3] PP23 PWM2 PTP[2]/ KWP[2]/ EVDD PP14 PP04 GPIO I/O General-purpose; with pin interrupt and wakeup O Pulse Width Modulator channel 4 I ADC external trigger input I/O General-purpose; with pin interrupt and wakeup O Pulse Width Modulator channel 3 I/O General-purpose; with pin interrupt and wakeup O Pulse Width Modulator channel 2 I/O General-purpose; with pin interrupt and wakeup XIRQ I Non-maskable level-sensitive interrupt PWM1 O Pulse Width Modulator channel 1 PTP[1]/ KWP[1] I/O General-purpose; with interrupt and wakeup PWM0 O PTP[0]/ KWP[0] Pin Function after Reset Description Pulse Width Modulator channel 0 I/O General-purpose; with interrupt and wakeup L PL3-0 PTL[3:0]/ KWL[3:0] I General-purpose high-voltage input (HVI); with interrupt and wakeup; optional ADC link AD PAD5-2 AN[5:2] I ADC analog PTAD[5:2]/ KWAD[5:2] PAD1-0 AN[1:0] PTAD[1:0]/ KWAD[1:0] GPI (HVI) GPIO I/O General-purpose; with interrupt and wakeup I ADC analog I/O General-purpose; with interrupt and wakeup 1 Signals in parentheses denote alternative module routing pins. Signals in bold underlined are only available on S12VR64/48. Function active when RESET asserted 3 High current capable high-side output (20mA) with over-current interrupt and protection for all sources (see 2.4.4.3/2-112) 4 High-current capable output (10 mA) 2 2.3 Memory Map and Register Definition This section provides a detailed description of all PIM registers. MC9S12VR Family Reference Manual, Rev. 4.2 58 NXP Semiconductor Port Integration Module (S12VRPIMV3) 2.3.1 Register Map Global Address Register Name1 0x0000– 0x0007 Reserved 0x0008 PORTE 0x0009 DDRE 0x000A– 0x000B Non-PIM Address Range 0x000C PUCR 0x000D Reserved 0x000E– 0x001B Non-PIM Address Range 0x001C ECLKCTL 0x001D PIMMISC 0x001E IRQCR 0x001F Reserved 0x0020– 0x023F Non-PIM Address Range 0x0240 PTT 0x0241 PTIT 0x0242 DDRT R Bit 7 6 5 4 3 2 1 Bit 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 PE1 PE0 0 0 0 0 0 0 DDRE1 DDRE0 W R W R W R Non-PIM Address Range W R 0 BKPUE W R 0 0 0 0 PDPEE 0 0 0 0 0 0 0 0 0 W R Non-PIM Address Range W R W R W R W R W NECLK OCPE 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 Reserved Reserved Reserved Reserved Reserved Reserved PTT3 PTT2 PTT1 PTT0 PTIT3 PTIT2 PTIT1 PTIT0 DDRT3 DDRT2 DDRT1 DDRT0 IRQE IRQEN Reserved Reserved R Non-PIM Address Range W R 0 0 0 0 0 0 0 0 0 0 0 0 W R W R W MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 59 Port Integration Module (S12VRPIMV3) Global Address Register Name1 0x0243 Reserved 0x0244 PERT 0x0245 PPST 0x0246 MODRR0 0x0247 MODRR1 0x0248 PTS 0x0249 PTIS 0x024A DDRS 0x024B Reserved 0x024C PERS 0x024D PPSS 0x024E WOMS 0x024F MODRR2 0x0250– 0x0257 Reserved 0x0258 PTP 0x0259 PTIP R Bit 7 6 5 4 3 2 1 Bit 0 0 0 0 0 0 0 0 0 0 0 0 0 PERT3 PERT2 PERT1 PERT0 0 0 0 0 PPST3 PPST2 PPST1 PPST0 W R W R W R W R MODRR07 MODRR06 MODRR05 MODRR04 MODRR03 MODRR02 MODRR01 MODRR00 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 W R W R MODRR15 MODRR14 0 0 0 0 PTS5 PTS4 PTS3 PTS2 PTS1 PTS0 PTIS5 PTIS4 PTIS3 PTIS2 PTIS1 PTIS0 DDRS5 DDRS4 DDRS3 DDRS2 DDRS1 DDRS0 0 0 0 0 0 0 PERS5 PERS4 PERS3 PERS2 PERS1 PERS0 PPSS5 PPSS4 PPSS3 PPSS2 PPSS1 PPSS0 WOMS5 WOMS4 WOMS3 WOMS2 WOMS1 WOMS0 W R W R W R W R W R W R W R MODRR27 0 0 0 0 0 0 0 MODRR25 MODRR24 MODRR23 MODRR22 MODRR21 MODRR20 0 0 0 0 0 0 PTP5 PTP4 PTP3 PTP2 PTP1 PTP0 PTIP5 PTIP4 PTIP3 PTIP2 PTIP1 PTIP0 W R W R W MC9S12VR Family Reference Manual, Rev. 4.2 60 NXP Semiconductor Port Integration Module (S12VRPIMV3) Global Address Register Name1 0x025A DDRP 0x025B RDRP 0x025C PERP 0x025D PPSP 0x025E PIEP 0x025F PIFP 0x0260– 0x0268 Reserved 0x0269 PTIL 0x026A DIENL 0x026B PTAL 0x026C PIRL 0x026D PPSL 0x026E PIEL 0x026F R 0x0270 Reserved 0x0271 PT1AD 6 0 0 0 0 0 0 0 0 W R 5 4 3 2 1 Bit 0 DDRP5 DDRP4 DDRP3 DDRP2 DDRP1 DDRP0 0 0 0 RDRP2 RDRP1 RDRP0 PERP5 PERP4 PERP3 PERP2 PERP1 PERP0 PPSP5 PPSP4 PPSP3 PPSP2 PPSP1 PPSP0 PIEP5 PIEP4 PIEP3 PIEP2 PIEP1 PIEP0 PIFP5 PIFP4 PIFP3 PIFP2 PIFP1 PIFP0 W R W R W R W R W R OCIE OCIF 0 0 0 0 0 0 0 0 0 0 0 0 0 0 PTIL3 PTIL2 PTIL1 PTIL0 0 0 0 0 DIENL3 DIENL2 DIENL1 DIENL0 PTTEL PTPSL PTABYPL PTADIRL PTAL1 PTAL0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 PT1AD5 W R W R W R W R R PIRL1 PIRL0 PPSL3 PPSL2 PPSL1 PPSL0 PIEL3 PIEL2 PIEL1 PIEL0 PIFL3 PIFL2 PIFL1 PIFL0 0 0 0 0 0 PT1AD4 PT1AD3 PT1AD2 PT1AD1 PT1AD0 W W R 0 PIRL2 W R PTAENL PIRL3 W R PIFL Bit 7 W R W MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 61 Port Integration Module (S12VRPIMV3) Global Address Register Name1 0x0272 Reserved 0x0273 PTI1AD 0x0274 Reserved 0x0275 DDR1AD 0x0276– 0x0278 Reserved 0x0279 PER1AD 0x027A Reserved 0x027B PPS1AD 0x027C Reserved 0x027D PIE1AD 0x027E Reserved 0x027F PIF1AD R Bit 7 6 5 4 3 2 1 Bit 0 0 0 0 0 0 0 0 0 0 0 PTI1AD5 PTI1AD4 PTI1AD3 PTI1AD2 PTI1AD1 PTI1AD0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 W R W R W R W R DDR1AD5 DDR1AD4 DDR1AD3 DDR1AD2 DDR1AD1 DDR1AD0 0 0 0 0 0 0 PER1AD1 PER1AD0 W R W R PER1AD5 PER1AD4 PER1AD3 PER1AD2 0 0 0 0 0 0 PPS1AD5 PPS1AD4 PPS1AD3 PPS1AD2 PPS1AD1 PPS1AD0 0 0 0 0 0 0 PIE1AD5 PIE1AD4 PIE1AD3 PIE1AD2 PIE1AD1 PIE1AD0 0 0 0 0 0 0 PIF1AD5 PIF1AD4 PIF1AD3 PIF1AD2 PIF1AD1 PIF1AD0 W R W R W R W R W R W = Unimplemented 1 Registers in bold underlinded are only available in S12VR64/48. On S12VR32/16 these locations read 0 and write is unimplemented. 2.3.2 Register Descriptions The following table summarizes the effect of the various configuration bits, that is data direction (DDR), output level (PORT/PT), pull enable (PER), pull select (PPS), interrupt enable (PIE) on the pin function, pull device and interrupt activity. MC9S12VR Family Reference Manual, Rev. 4.2 62 NXP Semiconductor Port Integration Module (S12VRPIMV3) The configuration bit PPS is used for two purposes: 1. Configure the sensitive interrupt edge (rising or falling), if interrupt is enabled. 2. Select either a pullup or pulldown device if PER is active. Table 2-3. Pin Configuration Summary1 1 2 DDR PORT PT PER PPS1 PIE2 0 x 0 x 0 Input Disabled Disabled 0 x 1 0 0 Input Pullup Disabled 0 x 1 1 0 Input Pulldown Disabled 0 x 0 0 1 Input Disabled Falling edge 0 x 0 1 1 Input Disabled Rising edge 0 x 1 0 1 Input Pullup Falling edge 0 x 1 1 1 Input Pulldown Rising edge 1 0 x x 0 Output, drive to 0 Disabled Disabled 1 1 x x 0 Output, drive to 1 Disabled Disabled 1 0 x 0 1 Output, drive to 0 Disabled Falling edge 1 1 x 1 1 Output, drive to 1 Disabled Rising edge Function Pull Device Interrupt Always “0” on Port E Applicable only on Port P and AD • • • NOTE All register bits in this module are completely synchronous to internal clocks during a register read. Figure of port data registers also display the alternative functions if applicable on the related pin as defined in Table 2-2. Names in parentheses denote the availability of the function when using a specific routing option. Figures of module routing registers also display the module instance or module channel associated with the related routing bit. 1. Not applicable for Port L. Refer to register descriptions. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 63 Port Integration Module (S12VRPIMV3) 2.3.3 Port E Data Register (PORTE) Access: User read/write1 Address 0x0008 7 6 5 4 3 2 0 0 0 0 0 0 Altern. Function — — — — — Reset 0 0 0 0 0 R 1 0 PE1 PE0 — XTAL EXTAL 0 0 0 W Figure 2-1. Port E Data Register (PORTE) 1 Read: Anytime. The data source is depending on the data direction value. Write: Anytime Table 2-4. PORTE Register Field Descriptions Field Description 1 PE PorT data register port E — General-purpose input/output data, CPMU OSC XTAL signal If the CPMU OSC function is active this pin is used as XTAL signal and the pulldown device is disabled. When not used with the alternative function, this pin can be used as general-purpose I/O. In general-purpose output mode the register bit is driven to the pin. If the associated data direction bit of this pin is set to 1, a read returns the value of the port register, otherwise the synchronized pin input state is read. • The CPMU OSC function takes precedence over the general purpose I/O function if enabled. 0 PE PorT data register port E — General-purpose input/output data, CPMU OSC EXTAL signal If the CPMU OSC function is active this pin is used as EXTAL signal and the pulldown device is disabled. When not used with the alternative function, this pin can be used as general-purpose I/O. In general-purpose output mode the register bit is driven to the pin. If the associated data direction bit of this pin is set to 1, a read returns the value of the port register, otherwise the synchronized pin input state is read. • The CPMU OSC function takes precedence over the general purpose I/O function if enabled. 2.3.4 Port E Data Direction Register (DDRE) Access: User read/write1 Address 0x0009 R 7 6 5 4 3 2 0 0 0 0 0 0 0 0 0 0 0 0 W Reset 1 0 DDRE1 DDRE0 0 0 Figure 2-2. Port E Data Direction Register (DDRE) 1 Read: Anytime Write: Anytime MC9S12VR Family Reference Manual, Rev. 4.2 64 NXP Semiconductor Port Integration Module (S12VRPIMV3) Table 2-5. DDRE Register Field Descriptions Field 1-0 DDRE Description Data Direction Register port E — This bit determines whether the associated pin is an input or output. 1 Associated pin is configured as output 0 Associated pin is configured as input 2.3.5 Port E, BKGD pin Pull Control Register (PUCR) Access: User read/write1 Address 0x000C 7 R 0 W Reset 0 6 BKPUE 1 5 0 0 4 PDPEE 1 3 2 1 0 0 0 0 0 0 0 0 0 Figure 2-3. Port E, BKGD pin Pull Control Register (PUCR) 1 Read:Anytime Write:Anytime, except BKPUE, which is writable in special mode only Table 2-6. PUCR Register Field Descriptions Field Description 6 BKPUE BKGD pin Pullup Enable — Activate pullup device on pin This bit configures whether a pullup device is activated, if the pin is used as input. If a pin is used as output this bit has no effect. 1 Pullup device enabled 0 Pullup device disabled 4 PDPEE Pull-Down Port E Enable — Activate pulldown devices on all port input pins This bit configures whether a pulldown device is activated on all associated port input pins. If a pin is used as output or used with the CPMU OSC function this bit has no effect. Out of reset the pulldown devices are enabled. 1 Pulldown devices enabled 0 Pulldown devices disabled 2.3.6 ECLK Control Register (ECLKCTL) Access: User read/write1 Address 0x001C 7 R W NECLK Reset 1 6 5 4 3 2 1 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 Figure 2-4. ECLK Control Register (ECLKCTL) 1 Read: Anytime Write: Anytime MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 65 Port Integration Module (S12VRPIMV3) Table 2-7. ECLKCTL Register Field Descriptions Field Description 7 NECLK No ECLK — Disable ECLK output This bit controls the availability of a free-running clock on the ECLK pin. This clock has a fixed rate equivalent to the internal bus clock. 1 ECLK disabled 0 ECLK enabled 2.3.7 PIM Miscellaneous Register (PIMMISC) Access: User read/write1 Address 0x001D 7 R W OCPE Reset 0 6 5 4 3 2 1 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 Figure 2-5. PIM Miscellaneous Register (PIMMISC) 1 Read: Anytime Write: Anytime Table 2-8. PIMMISC Register Field Descriptions Field 7 OCPE Description Over-Current Protection Enable— Activate over-current detector on PP2 Refer to Section 2.5.3, “Over-Current Protection on EVDD” 1 PP2 over-current detector enabled 0 PP2 over-current detector disabled IRQ Control Register (IRQCR)1 2.3.8 Access: User read/write1 Address 0x001E (S12VR64/48) 7 R W Reset 6 IRQE IRQEN 0 0 5 4 3 2 1 0 0 0 0 0 0 0 0 0 0 0 0 0 Figure 2-6. IRQ Control Register (IRQCR) 1 Read: Anytime Write: IRQE: Once in normal mode, anytime in special mode IRQEN: Anytime 1. This register is applicable for S12VR64 and S12VR48 in 48 pin package MC9S12VR Family Reference Manual, Rev. 4.2 66 NXP Semiconductor Port Integration Module (S12VRPIMV3) Table 2-9. IRQCR Register Field Descriptions Field Description 7 IRQE IRQ select Edge sensitive only — 1 IRQ pin configured to respond only to falling edges. Falling edges on the IRQ pin will be detected anytime IRQE=1 and will be cleared only upon a reset or the servicing of the IRQ interrupt. 0 IRQ pin configured for low level recognition 6 IRQEN 2.3.9 IRQ ENable — 1 IRQ pin is connected to interrupt logic 0 IRQ pin is disconnected from interrupt logic Reserved Register Access: User read/write1 Address 0x001E (S12VR32/16) R 7 6 5 4 3 2 1 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 W Reset Figure 2-7. Reserved Register 1 Read: Anytime Write:Never 2.3.10 Reserved Register Access: User read/write1 Address 0x001F R W Reset 7 6 5 4 3 2 1 0 Reserved Reserved Reserved Reserved Reserved Reserved Reserved Reserved x x x x x x x x Figure 2-8. Reserved Register 1 Read: Anytime Write: Only in special mode NOTE These reserved registers are designed for factory test purposes only and are not intended for general user access. Writing to these registers when in special modes can alter the module’s functionality. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 67 Port Integration Module (S12VRPIMV3) 2.3.11 Port T Data Register (PTT) Access: User read/write1 Address 0x0240 R 7 6 5 4 3 2 1 0 0 0 0 0 PTT3 PTT2 PTT1 PTT0 — — — — (SS) (SCK) PWM72 PWM62 — — — — (LPTXD) (LPRXD) (TXD0) (RXD0) — — — — — — (LPDR1) — — — — — IOC33 IOC24 IOC15 IOC05 0 0 0 0 0 0 0 0 W Altern. Function Reset Figure 2-9. Port T Data Register (PTT) 1 2 3 4 5 Read: Anytime. The data source is depending on the data direction value. Write: Anytime PWM function available on this pin only if not used with a routed HSDRV or LSDRV function. Refer to Section 2.3.16, “Module Routing Register 0 (MODRR0)” TIM output compare function available on this pin only if not used with routed HSDRV. Refer to Section 2.3.16, “Module Routing Register 0 (MODRR0)”. TIM input capture function available on this pin only if not used with LPRXD. Refer to Section 2.3.25, “Module Routing Register 2 (MODRR2)”. TIM output compare function available on this pin only if not used with routed HSDRV. Refer to Section 2.3.16, “Module Routing Register 0 (MODRR0)” TIM output compare function available on this pin only if not used with routed LSDRV. Refer to Section 2.3.16, “Module Routing Register 0 (MODRR0)” Table 2-10. PTT Register Field Descriptions Field Description 3-2 PTT PorT data register port T — General-purpose input/output data, SPI SS and SCK, TIM input/output, routed LINPHY When not used with the alternative function, the associated pin can be used as general-purpose I/O. In general-purpose output mode the register bit value is driven to the pin. If the associated data direction bit is set to 1, a read returns the value of the port register bit, otherwise the synchronized pin input state is read. • The routed SPI takes precedence over the routed LINPHY function, TIM output function and the general-purpose I/O function if enabled. • The routed LINPHY function takes precedence over the TIM output function and the general-purpose I/O function if the related channel is enabled. • The TIM function takes precedence over the general-purpose I/O function. MC9S12VR Family Reference Manual, Rev. 4.2 68 NXP Semiconductor Port Integration Module (S12VRPIMV3) Table 2-10. PTT Register Field Descriptions (continued) Field Description 1 PTT PorT data register port T — General-purpose input/output data, TIM input/output, routed SCI0, LPDR[LPDR1] When not used with the alternative function, the associated pin can be used as general-purpose I/O. In general-purpose output mode the register bit value is driven to the pin. If the associated data direction bit is set to 1, a read returns the value of the port register bit, otherwise the synchronized pin input state is read. • The routed SCI0 or LPDR[LPDR1] takes precedence over the TIM output function and the general-purpose I/O function if enabled. • The TIM function takes precedence over the general-purpose I/O function if enabled. 0 PTT PorT data register port T — General-purpose input/output data, TIM input/output, routed SCI0 When not used with the alternative function, the associated pin can be used as general-purpose I/O. In general-purpose output mode the register bit value is driven to the pin. If the associated data direction bit is set to 1, a read returns the value of the port register bit, otherwise the synchronized pin input state is read. • The routed SCI0 takes precedence over the TIM output function and the general-purpose I/O function if enabled. • The TIM function takes precedence over the general-purpose I/O function if enabled. 2.3.12 Port T Input Register (PTIT) Access: User read only1 Address 0x0241 R 7 6 5 4 3 2 1 0 0 0 0 0 PTIT3 PTIT2 PTIT1 PTIT0 0 0 0 0 0 0 0 0 W Reset Figure 2-10. Port T Input Register (PTIT) 1 Read: Anytime Write:Never Table 2-11. PTIT Register Field Descriptions Field 3-0 PTIT 2.3.13 Description PorT Input data register port T — A read always returns the synchronized input state of the associated pin. It can be used to detect overload or short circuit conditions on output pins. Port T Data Direction Register (DDRT) Access: User read/write1 Address 0x0242 R 7 6 5 4 0 0 0 0 0 0 0 0 W Reset 3 2 1 0 DDRT3 DDRT2 DDRT1 DDRT0 0 0 0 0 Figure 2-11. Port T Data Direction Register (DDRT) MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 69 Port Integration Module (S12VRPIMV3) 1 Read: Anytime Write: Anytime Table 2-12. DDRT Register Field Descriptions Field Description 3 DDRT Data Direction Register port T — This bit determines whether the pin is an input or output Depending on the configuration of the enabled SPI the I/O state will be forced to be input or output. The enabled routed LINPHY forces the I/O state to be an input (LPTXD). Else the TIM forces the I/O state to be an output for a TIM port associated with an enabled TIM output compare. In these cases the data direction bit will not change. 1 Associated pin is configured as output 0 Associated pin is configured as input 2 DDRT Data Direction Register port T — This bit determines whether the pin is an input or output. Depending on the configuration of the enabled SPI the I/O state will be forced to be input or output. The enabled routed LINPHY forces the I/O state to be an output (LPRXD). Else the TIM forces the I/O state to be an output for a TIM port associated with an enabled TIM output compare. In these cases the data direction bit will not change. 1 Associated pin is configured as output 0 Associated pin is configured as input 1-0 DDRT Data Direction Register port T — This bit determines whether the pin is an input or output. Depending on the configuration of the enabled routed SCI0 the I/O state will be forced to be input or output. The enabled routed LINPHY forces the I/O state to be an output (LPDR[LPDR1]). Else the TIM forces the I/O state to be an output for a TIM port associated with an enabled TIM output compare. In these cases the data direction bit will not change. 1 Associated pin is configured as output 0 Associated pin is configured as input 2.3.14 Port T Pull Device Enable Register (PERT) Access: User read/write1 Address 0x0244 R 7 6 5 4 0 0 0 0 0 0 0 0 W Reset 3 2 1 0 PERT3 PERT2 PERT1 PERT0 0 0 0 0 Figure 2-12. Port T Pull Device Enable Register (PERT) 1 Read: Anytime Write: Anytime Table 2-13. PERT Register Field Descriptions Field Description 3-0 PERT Pull device Enable Register port T — Enable pull device on input pin This bit controls whether a pull device on the associated port input pin is active. If a pin is used as output this bit has no effect. The polarity is selected by the related polarity select register bit. 1 Pull device enabled 0 Pull device disabled MC9S12VR Family Reference Manual, Rev. 4.2 70 NXP Semiconductor Port Integration Module (S12VRPIMV3) 2.3.15 Port T Polarity Select Register (PPST) Access: User read/write1 Address 0x0245 R 7 6 5 4 0 0 0 0 0 0 0 0 W Reset 3 2 1 0 PPST3 PPST2 PPST1 PPST0 0 0 0 0 Figure 2-13. Port T Polarity Select Register (PPST) 1 Read: Anytime Write: Anytime Table 2-14. PPST Register Field Descriptions Field 3-0 PPST 2.3.16 Description Pull device Polarity Select register port T — Configure pull device polarity on input pin This bit selects a pullup or a pulldown device if enabled on the associated port input pin. 1 A pulldown device is selected 0 A pullup device is selected Module Routing Register 0 (MODRR0) Access: User read/write1 Address 0x0246 (S12VR64/48) R W 7 6 5 4 3 2 1 0 MODRR07 MODRR06 MODRR05 MODRR04 MODRR03 MODRR02 MODRR01 MODRR00 Routing Option Reset HS1 HS0 0 0 0 LS1 0 LS0 0 0 0 0 Figure 2-14. Module Routing Register 0 (MODRR0 - S12VR64/48) 1 Read: Anytime Write: Once in normal, anytime in special mode Access: User read/write1 Address 0x0246 (S12VR32/16) R 7 6 0 0 W Routing Option Reset 5 4 3 2 1 0 MODRR05 MODRR04 MODRR03 MODRR02 MODRR01 MODRR00 — 0 HS0 0 0 LS1 0 0 LS0 0 0 0 Figure 2-15. Module Routing Register 0 (MODRR0 - S12VR32/16) MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 71 Port Integration Module (S12VRPIMV3) 1 Read: Anytime Write: Once in normal, anytime in special mode Table 2-15. Module Routing Register 0 Field Descriptions Field Description 7-6 MODRR0 MODule Routing Register 0 — HS1 This register controls the routing of PWM and TIM channels to pin HS1 of HSDRV module. By default the pin is controlled by the related HSDRV port register bit. 11 PWM channel 1 routed to HS1 if enabled 10 PWM channel 4 routed to HS1 if enabled 01 TIM output compare channel 3 routed to HS1 if enabled 00 HS1 controlled by register bit HSDR[HSDR1]. Refer to HSDRV section. 5-4 MODRR0 MODule Routing Register 0 — HS0 This register controls the routing of PWM and TIM channels to pin HS0 of HSDRV module. By default the pin is controlled by the related HSDRV port register bit. 11 PWM channel 3 routed to HS0 if enabled 10 PWM channel 3 routed to HS0 if enabled 01 TIM output compare channel 2 routed to HS0 if enabled 00 HS0 controlled by register bit HSDR[HSDR0]. Refer to HSDRV section. 3-2 MODRR0 MODule Routing Register 0 — LS1 This register controls the routing of PWM and TIM channels to pin LS1 of LSDRV module. By default the pin is controlled by the related LSDRV port register bit. 11 PWM channel 7 routed to LS1 if enabled 10 PWM channel 7 routed to LS1 if enabled 01 TIM output compare channel 1 routed to LS1 if enabled 00 LS1 controlled by register bit LSDR[LSDR1]. Refer to LSDRV section. 1-0 MODRR0 MODule Routing Register 0 — LS0 This register controls the routing of PWM and TIM channels to pin LS0 of LSDRV module. By default the pin is controlled by the related LSDRV port register bit. 11 PWM channel 5 routed to LS0 if enabled 10 PWM channel 6 routed to LS0 if enabled 01 TIM output compare channel 0 routed to LS0 if enabled 00 LS0 controlled by register bit LSDR[LSDR0]. Refer to LSDRV section. MC9S12VR Family Reference Manual, Rev. 4.2 72 NXP Semiconductor Port Integration Module (S12VRPIMV3) 2.3.17 Module Routing Register 1 (MODRR1) Access: User read/write1 Address 0x0247(S12VR64/48) 7 6 0 0 Routing Option — Reset 0 R 5 4 MODRR15 MODRR14 — PWM5 ETRIG1 0 0 W 3 2 1 0 0 0 0 0 PWM4 ETRIG0 — — — — 0 0 0 0 0 Figure 2-16. Module Routing Register 1 (MODRR1) 1 Read: Anytime Write: Once in normal, anytime in special mode Table 2-16. Module Routing Register 1 Field Descriptions Field Description 5 MODRR1 MODule Routing Register 1 — PWM5, ETRIG1 1 PWM channel 5 on PS3; ETRIG1 on PS3 0 PWM channel 5 on PP5; ETRIG1 on PP5 4 MODRR1 MODule Routing Register 1 — PWM4, ETRIG0 1 PWM channel 4 on PS2; ETRIG0 on PS2 0 PWM channel 4 on PP4; ETRIG0 on PP4 2.3.18 Reserved Register Access: User read/write1 Address 0x0247 (S12VR32/16) R 7 6 5 4 3 2 1 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 W Reset Figure 2-17. Reserved Register 1 Read: Anytime Write:Never MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 73 Port Integration Module (S12VRPIMV3) 2.3.19 Port S Data Register (PTS) Access: User read/write1 Address 0x0248 (S12VR64/48) R 7 6 5 4 3 2 1 0 0 0 PTS5 PTS4 PTS3 PTS2 PTS1 PTS0 — — — — ECLK — — — — — SS SCK MOSI MISO — — — — — — (TXD1) (RXD1) TXD1 RXD1 2 W Altern. Function Reset — — — — (PWM52 ) (PWM4 ) (LPDR1) — — — — — (ETRIG1) (ETRIG0) (TXD0) (RXD0) 0 0 0 0 0 0 0 0 Figure 2-18. Port S Data Register (PTS - S12VR64/48) 1 Read: Anytime. The data source is depending on the data direction value. Write: Anytime 2 PWM function available on this pin only if not used with a routed HSDRV or LSDRV function. Refer to Section 2.3.16, “Module Routing Register 0 (MODRR0)” Access: User read/write1 Address 0x0248 (S12VR32/16) R 7 6 5 4 3 2 1 0 0 0 0 0 PTS3 PTS2 0 0 — — — — ECLK — — — — — — — MOSI MISO — — — — — — (TXD1) (RXD1) — — (PWM42) — — W Altern. Function Reset — — — — (PWM52) — — — — (ETRIG1) (ETRIG0) — — 0 0 0 0 0 0 0 0 Figure 2-19. Port S Data Register (PTS - S12VR32/16) 1 Read: Anytime. The data source is depending on the data direction value. Write: Anytime 2 PWM function available on this pin only if not used with a routed HSDRV or LSDRV function. Refer to Section 2.3.16, “Module Routing Register 0 (MODRR0)” MC9S12VR Family Reference Manual, Rev. 4.2 74 NXP Semiconductor Port Integration Module (S12VRPIMV3) Table 2-17. PTS Register Field Descriptions Field Description 5 PTS PorT data register port S — General-purpose input/output data, SPI SS When not used with the alternative function, the associated pin can be used as general-purpose I/O. In general-purpose output mode the register bit value is driven to the pin. If the associated data direction bit is set to 1, a read returns the value of the port register bit, otherwise the synchronized pin input state is read. • The SPI function takes precedence over the general-purpose I/O function if enabled. 4 PTS PorT data register port S — General-purpose input/output data, SPI SCK When not used with the alternative function, the associated pin can be used as general-purpose I/O. In general-purpose output mode the register bit value is driven to the pin. If the associated data direction bit is set to 1, a read returns the value of the port register bit, otherwise the synchronized pin input state is read. • The SPI function takes precedence over the general-purpose I/O function if enabled. 3 PTS PorT data register port S — General-purpose input/output data, ECLK, SPI MOSI, routed SCI1, routed PWM, routed ETRIG When not used with the alternative function, the associated pin can be used as general-purpose I/O. In general-purpose output mode the register bit value is driven to the pin. If the associated data direction bit is set to 1, a read returns the value of the port register bit, otherwise the synchronized pin input state is read. • The ECLK output function takes precedence over the SPI, routed SCI1 and PWM and the general purpose I/O function if enabled. • The SPI function takes precedence over the routed SCI1, routed PWM and the general purpose I/O function if enabled. • The routed SCI1 function takes precedence over the PWM and general-purpose I/O function if enabled. • The routed PWM function takes precedence over the general-purpose I/O function if enabled. 2 PTS PorT data register port S — General-purpose input/output data, SPI MISO, routed SCI1, routed PWM, routed ETRIG When not used with the alternative function, the associated pin can be used as general-purpose I/O. In general-purpose output mode the register bit value is driven to the pin. If the associated data direction bit is set to 1, a read returns the value of the port register bit, otherwise the synchronized pin input state is read. • The SPI function takes precedence over the routed SCI1, routed PWM and the general purpose I/O function if enabled. • The routed SCI1 function takes precedence over the routed PWM and the general-purpose I/O function if enabled. • The routed PWM function takes precedence over the general-purpose I/O function if enabled. 1 PTS PorT data register port S — General-purpose input/output data, SCI1, routed SCI0 or LPDR[LPDR1] When not used with the alternative function, the associated pin can be used as general-purpose I/O. In general-purpose output mode the register bit value is driven to the pin. If the associated data direction bit is set to 1, a read returns the value of the port register bit, otherwise the synchronized pin input state is read. • The SCI1 function takes precedence over the routed SCI0 or LPDR[LPDR1] function and the general-purpose I/O function if enabled. • The routed SCI0 or LPDR[LPDR1] function takes precedence over the general-purpose I/O function if enabled. 0 PTS PorT data register port S — General-purpose input/output data, SCI1, routed SCI0 When not used with the alternative function, the associated pin can be used as general-purpose I/O. In general-purpose output mode the register bit value is driven to the pin. If the associated data direction bit is set to 1, a read returns the value of the port register bit, otherwise the synchronized pin input state is read. • The SCI1 function takes precedence over the routed SCI0 function and the general-purpose I/O function if enabled. • The routed SCI0 function takes precedence over the general-purpose I/O function if enabled. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 75 Port Integration Module (S12VRPIMV3) 2.3.20 Port S Input Register (PTIS) Access: User read only1 Address 0x0249 (S12VR64/48) R 7 6 5 4 3 2 1 0 0 0 PTIS5 PTIS4 PTIS3 PTIS2 PTIS1 PTIS0 0 0 0 0 0 0 0 0 W Reset Figure 2-20. Port S Input Register (PTIS - S12VR64/48) 1 Read: Anytime Write:Never Access: User read only1 Address 0x0249 (S12VR32/16) R 7 6 5 4 3 2 1 0 0 0 0 0 PTIS3 PTIS2 0 0 0 0 0 0 0 0 0 0 W Reset Figure 2-21. Port S Input Register (PTIS - S12VR32/16) 1 Read: Anytime Write:Never Table 2-18. PTIS Register Field Descriptions Field 5-0 PTIS Description PorT Input data register port S — A read always returns the synchronized input state of the associated pin. It can be used to detect overload or short circuit conditions on output pins. MC9S12VR Family Reference Manual, Rev. 4.2 76 NXP Semiconductor Port Integration Module (S12VRPIMV3) 2.3.21 Port S Data Direction Register (DDRS) Access: User read/write1 Address 0x024A (S12VR64/48) R 7 6 0 0 0 0 W Reset 5 4 3 2 1 0 DDRS5 DDRS4 DDRS3 DDRS2 DDRS1 DDRS0 0 0 0 0 0 0 Figure 2-22. Port S Data Direction Register (DDRS - S12VR64/48) 1 Read: Anytime Write: Anytime Access: User read/write1 Address 0x024A (S12VR32/16) R 7 6 5 4 0 0 0 0 0 0 0 0 W Reset 3 2 DDRS3 DDRS2 0 0 1 0 0 0 0 0 Figure 2-23. Port S Data Direction Register (DDRS - S12VR32/16) 1 Read: Anytime Write: Anytime Table 2-19. DDRS Register Field Descriptions Field Description 5 DDRS Data Direction Register port S — This bit determines whether the associated pin is an input or output. Depending on the configuration of the enabled SPI the I/O state will be forced to be input or output. In this case the data direction bit will not change. 1 Associated pin is configured as output 0 Associated pin is configured as input 4 DDRS Data Direction Register port S — This bit determines whether the associated pin is an input or output. Depending on the configuration of the enabled SPI the I/O state will be forced to be input or output. In this case the data direction bit will not change. 1 Associated pin is configured as output 0 Associated pin is configured as input 3 DDRS Data Direction Register port S — This bit determines whether the associated pin is an input or output. The ECLK output function, routed SCI1 and routed PWM function forces the I/O state to output if enabled. Depending on the configuration of the enabled SPI the I/O state will be forced to be input or output. In these cases the data direction bit will not change. The routed ETRIG function has no effect on the I/O state. 1 Associated pin is configured as output 0 Associated pin is configured as input MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 77 Port Integration Module (S12VRPIMV3) Table 2-19. DDRS Register Field Descriptions (continued) Field Description 2 DDRS Data Direction Register port S — This bit determines whether the associated pin is an input or output. The enabled API_EXTCLK function forces the I/O state to output. Depending on the configuration of the enabled SPI the I/O state will be forced to be input or output. The routed SCI1 function forces the I/O state to input if enabled. The routed PWM function forces the I/O state to output if enabled. In these cases the data direction bit will not change. The routed ETRIG function has no effect on the I/O state. 1 Associated pin is configured as output 0 Associated pin is configured as input 1 DDRS Data Direction Register port S — This bit determines whether the associated pin is an input or output. Depending on the configuration of the enabled SCI the I/O state will be forced to be input or output. The enabled routed LINPHY forces the I/O state to be an output (LPDR[LPDR1]). In these cases the data direction bit will not change. 1 Associated pin is configured as output 0 Associated pin is configured as input 0 DDRS Data Direction Register port S — This bit determines whether the associated pin is an input or output. Depending on the configuration of the enabled SCI the I/O state will be forced to be input or output. In this case the data direction bit will not change. 1 Associated pin is configured as output 0 Associated pin is configured as input 2.3.22 Port S Pull Device Enable Register (PERS) Access: User read/write1 Address 0x024C (S12VR64/48) R 7 6 0 0 0 0 W Reset 5 4 3 2 1 0 PERS5 PERS4 PERS3 PERS2 PERS1 PERS0 1 1 1 1 1 1 Figure 2-24. Port S Pull Device Enable Register (PERS - S12VR64/48) 1 Read: Anytime Write: Anytime Access: User read/write1 Address 0x024C (S12VR32/16) R 7 6 5 4 0 0 0 0 0 0 0 0 W Reset 3 2 PERS3 PERS2 1 1 1 0 0 0 0 0 Figure 2-25. Port S Pull Device Enable Register (PERS - S12VR32/16) 1 Read: Anytime Write: Anytime MC9S12VR Family Reference Manual, Rev. 4.2 78 NXP Semiconductor Port Integration Module (S12VRPIMV3) Table 2-20. PERS Register Field Descriptions Field Description 5-0 PERS Pull device Enable Register port S — Enable pull device on input pin or wired-or output pin This bit controls whether a pull device on the associated port input pin is active. If a pin is used as output this bit has only effect if used in wired-or mode. The polarity is selected by the related polarity select register bit. 1 Pull device enabled 0 Pull device disabled 2.3.23 Port S Polarity Select Register (PPSS) Access: User read/write1 Address 0x024D (S12VR64/48) R 7 6 0 0 0 0 W Reset 5 4 3 2 1 0 PPSS5 PPSS4 PPSS3 PPSS2 PPSS1 PPSS0 0 0 0 0 0 0 Figure 2-26. Port S Polarity Select Register (PPSS - S12VR64/48) 1 Read: Anytime Write: Anytime Access: User read/write1 Address 0x024D (S12VR32/16) R 7 6 5 4 0 0 0 0 0 0 0 0 W Reset 3 2 PPSS3 PPSS2 0 0 1 0 0 0 0 0 Figure 2-27. Port S Polarity Select Register (PPSS - S12VR32/16) 1 Read: Anytime Write: Anytime Table 2-21. PPSS Register Field Descriptions Field 5-0 PPSS Description Pull device Polarity Select register port S — Configure pull device polarity on input pin This bit selects a pullup or a pulldown device if enabled on the associated port input pin. 1 A pulldown device is selected 0 A pullup device is selected MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 79 Port Integration Module (S12VRPIMV3) 2.3.24 Port S Wired-Or Mode Register (WOMS) Access: User read/write1 Address 0x024E (S12VR64/48) R 7 6 0 0 0 0 W Reset 5 4 3 2 1 0 WOMS5 WOMS4 WOMS3 WOMS2 WOMS1 WOMS0 0 0 0 0 0 0 Figure 2-28. Port S Wired-Or Mode Register (WOMS - S12VR64/48) 1 Read: Anytime Write: Anytime Access: User read/write1 Address 0x024E (S12VR32/16) R 7 6 5 4 0 0 0 0 0 0 0 0 W Reset 3 2 WOMS3 WOMS2 0 0 1 0 0 0 0 0 Figure 2-29. Port S Wired-Or Mode Register (WOMS - S12VR32/16) 1 Read: Anytime Write: Anytime Table 2-22. WOMS Register Field Descriptions Field Description 5-0 WOMS Wired-Or Mode register port S — Enable open-drain functionality on output pin This bit configures an output pin as wired-or (open-drain) or push-pull. In wired-or mode a logic “0” is driven active-low while a logic “1” remains undriven. This allows a multipoint connection of several serial modules. The bit has no influence on pins used as input. 1 Output buffer operates as open-drain output 0 Output buffer operates as push-pull output MC9S12VR Family Reference Manual, Rev. 4.2 80 NXP Semiconductor Port Integration Module (S12VRPIMV3) 2.3.25 Module Routing Register 2 (MODRR2) Access: User read/write1 Address 0x024F (S12VR64/48) 7 R W Routing Option Reset 6 0 MODRR27 5 4 3 2 1 0 MODRR25 MODRR24 MODRR23 MODRR22 MODRR21 MODRR20 LPRXD to TIM — SPI SS and SCK SCI1 0 0 0 0 SCI0-to-LINPHY interface 0 0 0 0 Figure 2-30. Module Routing Register 2 (MODRR2 - S12VR64/48) 1 Read: Anytime Write: Once in normal, anytime in special mode Access: User read/write1 Address 0x024F (S12VR32/16) 7 R W Routing Option Reset 6 5 4 3 0 0 0 0 LPRXD to TIM — — — — 0 0 0 0 0 MODRR27 2 1 0 MODRR22 MODRR21 MODRR20 SCI0-to-LINPHY interface 0 0 0 Figure 2-31. Module Routing Register 2 (MODRR2 - S12VR32/16) 1 Read: Anytime Write: Once in normal, anytime in special mode Table 2-23. Module Routing Register 2 Field Descriptions Field Description 7 MODule Routing Register 2 — TIM routing MODRR2 1 TIM input capture channel 3 is connected to LPRXD 0 TIM input capture channel 3 is connected to PT3 5 MODule Routing Register 2 — SPI SS and SCK routing MODRR2 1 SS on PT3; SCK on PT2 0 SS on PS5; SCK on PS4 4 MODule Routing Register 2 — SCI1 routing MODRR2 1 TXD1 on PS3; RXD1 on PS2 0 TXD1 on PS1; RXD1 on PS0 3-0 MODule Routing Register 2 — SCI0-to-LINPHY routing MODRR2 Selection of SCI0-to-LINPHY interface routing options to support probing and conformance testing. Refer to Figure 2-32 for an illustration and Table 2-24 for preferred settings. SCI0 must be enabled for TXD0 routing to take effect on pins. LINPHY must be enabled for LPRXD and LPDR[LPDR1] routings to take effect on pins. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 81 Port Integration Module (S12VRPIMV3) MODRR20 MODRR21 MODRR22 MODRR23 0 0 1 1 PS1 / TXD0 / LPDR1 PT1 / TXD0 / LPDR1 PT3 / LPTXD 1 TXD0 0 0 LPTXD 1 LPDR1 SCI0 TIM input capture channel 3 MODRR27 0 1 0 RXD0 LIN LINPHY IOC3 LPRXD 1 0 1 PT2 / LPRXD 0 1 PS0 / RXD0 PT0 / RXD0 Figure 2-32. SCI0-to-LINPHY Routing Options Illustration Table 2-24. Preferred Interface Configurations MODRR2[3:0] 0000 0001 Signal Routing Description Default setting: SCI0 connects to LINPHY, interface internal only Direct control setting: LPDR[LPDR1] register bit controls LPTXD, interface internal only MC9S12VR Family Reference Manual, Rev. 4.2 82 NXP Semiconductor Port Integration Module (S12VRPIMV3) MODRR2[3:0] Signal Routing 1100 1110 Description Probe setting: Conformance test setting: SCI0 connects to LINPHY, interface accessible on 2 external pins Interface opened and all 4 signals routed externally NOTE For standalone usage of SCI0 on external pins set MODRR2[3:0]=0b1110 and disable the LINPHY (LPCR[LPE]=0). This releases PT2 and PT3 to other associated functions and maintains TXD0 and RXD0 signals on PT1 and PT0, respectively, if no other function with higher priority takes precedence. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 83 Port Integration Module (S12VRPIMV3) 2.3.26 Port P Data Register (PTP) Access: User read/write1 Address 0x0258 (S12VR64/48) R 7 6 5 4 3 2 1 0 0 0 PTP5 PTP4 PTP3 PTP2 PTP1 PTP0 — — PWM523 PWM423 PWM32 PWM2 PWM12 PWM0 — — IRQ — — EVDD XIRQ — — — ETRIG1 ETRIG0 — — — — 0 0 0 0 0 0 0 0 W Altern. Function Reset Figure 2-33. Port P Data Register (PTP - S12VR64/48) 1 Read: Anytime. The data source is depending on the data direction value. Write: Anytime 2 PWM function available on this pin only if not used with a routed HSDRV or LSDRV function. Refer to Section 2.3.16, “Module Routing Register 0 (MODRR0)” 3 PWM function available on this pin only if not routed to port S. Refer to Section 2.3.17, “Module Routing Register 1 (MODRR1)” Access: User read/write1 Address 0x0258 (S12VR32/16) 7 6 5 4 3 0 0 0 0 0 Altern. Function — — — — — — — Reset 0 0 0 R 2 1 PTP2 PTP1 — PWM2 PWM12 — — — EVDD XIRQ — 0 0 0 0 0 W 0 0 Figure 2-34. Port P Data Register (PTP - S12VR32/16) 1 Read: Anytime. The data source is depending on the data direction value. Write: Anytime MC9S12VR Family Reference Manual, Rev. 4.2 84 NXP Semiconductor Port Integration Module (S12VRPIMV3) Table 2-25. PTP Register Field Descriptions Field Description 5 PTP PorT data register port P — General-purpose input/output data, PWM output, ETRIG input, pin interrupt input/output, IRQ input The IRQ signal is mapped to this pin when used with the IRQ interrupt function. If enabled (IRQCR[IRQEN]=1) the I/O state of the pin is forced to be an input. When not used with the alternative function, the associated pin can be used as general-purpose I/O. In general-purpose output mode the register bit value is driven to the pin. If the associated data direction bit is set to 1, a read returns the value of the port register bit, otherwise the synchronized pin input state is read. • The IRQ function takes precedence over the PWM and the general-purpose I/O function if enabled. • The PWM function takes precedence over the general-purpose I/O function if the related channel is enabled. • Pin interrupts can be generated if enabled in input or output mode. • The ETRIG function has no effect on the I/O state. 4 PTP PorT data register port P — General-purpose input/output data, PWM output, ETRIG input, pin interrupt input/output The associated pin can be used as general-purpose I/O. In general-purpose output mode the register bit value is driven to the pin. If the associated data direction bit is set to 1, a read returns the value of the port register bit, otherwise the synchronized pin input state is read. • The PWM function takes precedence over the general-purpose I/O function if the related channel is enabled. • Pin interrupts can be generated if enabled in input or output mode. • The ETRIG function has no effect on the I/O state. 3 PTP PorT data register port P — General-purpose input/output data, PWM output, pin interrupt input/output The associated pin can be used as general-purpose I/O. In general-purpose output mode the register bit value is driven to the pin. If the associated data direction bit is set to 1, a read returns the value of the port register bit, otherwise the synchronized pin input state is read. • The PWM function takes precedence over the general-purpose I/O function if the related channel is enabled. • Pin interrupts can be generated if enabled in input or output mode. 2 PTP PorT data register port P — General-purpose input/output data, PWM output, switchable high-current capable external supply with over-current protection (EVDD) The associated pin can be used as general-purpose I/O or as a supply for external devices such as Hall sensors (see Section 2.5.3, “Over-Current Protection on EVDD”. In output mode the register bit value is driven to the pin. If the associated data direction bit is set to 1, a read returns the value of the port register bit, otherwise the synchronized pin input state is read. • The PWM function takes precedence over the general-purpose I/O function if the related channel is enabled. • Pin interrupts can be generated if enabled in input or output mode. • An over-current interrupt can be generated if enabled. Refer to Section 2.4.4.3, “Over-Current Interrupt and Protection” MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 85 Port Integration Module (S12VRPIMV3) Table 2-25. PTP Register Field Descriptions (continued) Field Description 1 PTP PorT data register port P — General-purpose input/output data, PWM output, pin interrupt input/output, XIRQ input The XIRQ signal is mapped to this pin when used with the XIRQ interrupt function. The interrupt is enabled by clearing the X mask bit in the CPU Condition Code register. The I/O state of the pin is forced to input level upon the first clearing of the X bit and held in this state even if the bit is set again. A stop or wait recovery with the X bit set (refer to CPU12/CPU12X Reference Manual) is not available. When not used with the alternative function, the associated pin can be used as general-purpose I/O. In general-purpose output mode the register bit value is driven to the pin. If the associated data direction bit is set to 1, a read returns the value of the port register bit, otherwise the synchronized pin input state is read. • The XIRQ function takes precedence over the PWM and the general-purpose I/O function if enabled. • The PWM function takes precedence over the general-purpose I/O function if the related channel is enabled. • Pin interrupts can be generated if enabled in input or output mode. 0 PTP PorT data register port P — General-purpose input/output data, PWM output, pin interrupt input/output When not used with the alternative function, the associated pin can be used as general-purpose I/O. In general-purpose output mode the register bit value is driven to the pin. If the associated data direction bit is set to 1, a read returns the value of the port register bit, otherwise the synchronized pin input state is read. • The PWM function takes precedence over the general-purpose I/O function if the related channel is enabled. • Pin interrupts can be generated if enabled in input or output mode. 2.3.27 Port P Input Register (PTIP) Access: User read only1 Address 0x0259 (S12VR64/48) R 7 6 5 4 3 2 1 0 0 0 PTIP5 PTIP4 PTIP3 PTIP2 PTIP1 PTIP0 0 0 0 0 0 0 0 0 W Reset Figure 2-35. Port P Input Register (PTIP - S12VR64/48) 1 Read: Anytime Write:Never Access: User read only1 Address 0x0259 (S12VR32/16) R 7 6 5 4 3 2 1 0 0 0 0 0 0 PTIP2 PTIP1 0 0 0 0 0 0 0 0 0 W Reset Figure 2-36. Port P Input Register (PTIP - S12VR32/16) 1 Read: Anytime Write:Never MC9S12VR Family Reference Manual, Rev. 4.2 86 NXP Semiconductor Port Integration Module (S12VRPIMV3) Table 2-26. PTIP Register Field Descriptions Field 5-0 PTIP 2.3.28 Description PorT Input data register port P — A read always returns the synchronized input state of the associated pin. It can be used to detect overload or short circuit conditions on output pins. Port P Data Direction Register (DDRP) Access: User read/write1 Address 0x025A (S12VR64/48) R 7 6 0 0 0 0 W Reset 5 4 3 2 1 0 DDRP5 DDRP4 DDRP3 DDRP2 DDRP1 DDRP0 0 0 0 0 0 0 Figure 2-37. Port P Data Direction Register (DDRP - S12VR64/48) 1 Read: Anytime Write: Anytime Access: User read/write1 Address 0x025A (S12VR32/16) R 7 6 5 4 3 0 0 0 0 0 0 0 0 0 0 W Reset 2 1 DDRP2 DDRP1 0 0 0 0 0 Figure 2-38. Port P Data Direction Register (DDRP - S12VR32/16) 1 Read: Anytime Write: Anytime Table 2-27. DDRP Register Field Descriptions Field Description 5 DDRP Data Direction Register port P — This bit determines whether the associated pin is an input or output. The enabled IRQ function forces the I/O state to be an input if enabled. In this case the data direction bit will not change. 1 Associated pin is configured as output 0 Associated pin is configured as input 4-2 DDRP Data Direction Register port P — This bit determines whether the associated pin is an input or output. 1 Associated pin is configured as output 0 Associated pin is configured as input MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 87 Port Integration Module (S12VRPIMV3) Table 2-27. DDRP Register Field Descriptions (continued) Field Description 1 DDRP Data Direction Register port P — This bit determines whether the associated pin is an input or output. The I/O state of the pin is forced to input level upon the first clearing of the X bit and held in this state even if the bit is set again. The PWM forces the I/O state to be an output for an enabled channel. In this case the data direction bit will not change. 1 Associated pin is configured as output 0 Associated pin is configured as input 0 DDRP Data Direction Register port P — This bit determines whether the associated pin is an input or output. The PWM forces the I/O state to be an output for an enabled channel. In this case the data direction bit will not change. 1 Associated pin is configured as output 0 Associated pin is configured as input 2.3.29 Port P Reduced Drive Register (RDRP) Access: User read/write1 Address 0x025B (S12VR64/48) R 7 6 5 4 3 0 0 0 0 0 0 0 0 0 0 W Reset 2 1 0 RDRP2 RDRP1 RDRP0 0 0 0 Figure 2-39. Port P Reduced Drive Register (RDRP - S12VR64/48) 1 Read: Anytime Write: Anytime Access: User read/write1 Address 0x025B (S12VR32/16) R 7 6 5 4 3 0 0 0 0 0 0 0 0 0 0 W Reset 2 1 0 RDRP2 RDRP1 0 0 0 0 Figure 2-40. Port P Reduced Drive Register (RDRP - S12VR32/16) 1 Read: Anytime Write: Anytime MC9S12VR Family Reference Manual, Rev. 4.2 88 NXP Semiconductor Port Integration Module (S12VRPIMV3) Table 2-28. RDRP Register Field Descriptions Field Description 2 RDRP Reduced Drive Register port P — Select reduced drive for output pin This bit configures the drive strength of the associated output pin as either full or reduced. If a pin is used as input this bit has no effect. The reduced drive function is independent of which function is being used on a particular pin. 1 Reduced drive selected (approx. 1/10 of the full drive strength) 0 Full drive strength enabled 1-0 RDRP Reduced Drive Register port P — Select reduced drive for output pin This bit configures the drive strength of the associated output pin as either full or reduced. If a pin is used as input this bit has no effect. The reduced drive function is independent of which function is being used on a particular pin. 1 Reduced drive selected (approx. 1/5 of the full drive strength) 0 Full drive strength enabled 2.3.30 Port P Pull Device Enable Register (PERP) Access: User read/write1 Address 0x025C (S12VR64/48) R 7 6 0 0 0 0 W Reset 5 4 3 2 1 0 PERP5 PERP4 PERP3 PERP2 PERP1 PERP0 0 0 0 0 0 0 Figure 2-41. Port P Pull Device Enable Register (PERP - S12VR64/48) 1 Read: Anytime Write: Anytime Access: User read/write1 Address 0x025C (S12VR32/16) R 7 6 5 4 3 0 0 0 0 0 0 0 0 0 0 W Reset 2 1 PERP2 PERP1 0 0 0 0 0 Figure 2-42. Port P Pull Device Enable Register (PERP - S12VR32/16) 1 Read: Anytime Write: Anytime Table 2-29. PERP Register Field Descriptions Field Description 5-0 PERP Pull device Enable Register port P — Enable pull device on input pin This bit controls whether a pull device on the associated port input pin is active. If a pin is used as output this bit has no effect. The polarity is selected by the related polarity select register bit. 1 Pull device enabled 0 Pull device disabled MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 89 Port Integration Module (S12VRPIMV3) 2.3.31 Port P Polarity Select Register (PPSP) Access: User read/write1 Address 0x025D (S12VR64/48) R 7 6 0 0 0 0 W Reset 5 4 3 2 1 0 PPSP5 PPSP4 PPSP3 PPSP2 PPSP1 PPSP0 0 0 0 0 0 0 Figure 2-43. Port P Polarity Select Register (PPSP - S12VR64/48) 1 Read: Anytime Write: Anytime Access: User read/write1 Address 0x025D (S12VR32/16) R 7 6 5 4 3 0 0 0 0 0 0 0 0 0 0 W Reset 2 1 0 PPSP2 PPSP1 0 0 0 0 Figure 2-44. Port P Polarity Select Register (PPSP - S12VR32/16) 1 Read: Anytime Write: Anytime Table 2-30. PPSP Register Field Descriptions Field 5-0 PPSP Description Pull device Polarity Select register port P — Configure pull device polarity and pin interrupt edge polarity on input pin This bit selects a pullup or a pulldown device if enabled on the associated port input pin. This bit also selects the polarity of the active pin interrupt edge. 1 A pulldown device is selected; rising edge selected 0 A pullup device is selected; falling edge selected MC9S12VR Family Reference Manual, Rev. 4.2 90 NXP Semiconductor Port Integration Module (S12VRPIMV3) 2.3.32 Port P Interrupt Enable Register (PIEP) Access: User read/write1 Address 0x025E (S12VR64/48) 7 R W 6 0 OCIE Reset 0 0 5 4 3 2 1 0 PIEP5 PIEP4 PIEP3 PIEP2 PIEP1 PIEP0 0 0 0 0 0 0 Figure 2-45. Port P Interrupt Enable Register (PIEP - S12VR64/48) 1 Read: Anytime Write: Anytime Read: Anytime. Access: User read/write1 Address 0x025E (S12VR32/16) 7 R W OCIE Reset 0 6 5 4 3 0 0 0 0 0 0 0 0 2 1 PIEP2 PIEP1 0 0 0 0 0 Figure 2-46. Port P Interrupt Enable Register (PIEP - S12VR32/16) 1 Read: Anytime Write: Anytime Table 2-31. PIEP Register Field Descriptions Field Description 7 OCIE Over-Current Interrupt Enable register port P — This bit enables or disables the over-current interrupt on PP2. 1 PP2 over-current interrupt enabled 0 PP2 over-current interrupt disabled (interrupt flag masked) 5-0 PIEP Pin Interrupt Enable register port P — This bit enables or disables the edge sensitive pin interrupt on the associated pin. An interrupt can be generated if the pin is operating in input or output mode when in use with the general-purpose or related peripheral function. 1 Interrupt is enabled 0 Interrupt is disabled (interrupt flag masked) MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 91 Port Integration Module (S12VRPIMV3) 2.3.33 Port P Interrupt Flag Register (PIFP) Access: User read/write1 Address 0x025F (S12VR64/48) 7 R W Reset 6 0 OCIF 0 0 5 4 3 2 1 0 PIFP5 PIFP4 PIFP3 PIFP2 PIFP1 PIFP0 0 0 0 0 0 0 Figure 2-47. Port P Interrupt Flag Register (PIFP - S12VR64/48) 1 Read: Anytime Write: Anytime, write 1 to clear Access: User read/write1 Address 0x025F (S12VR32/16) 7 R W Reset OCIF 0 6 5 4 3 0 0 0 0 0 0 0 0 2 1 0 PIFP2 PIFP1 0 0 0 0 Figure 2-48. Port P Interrupt Flag Register (PIFP - S12VR32/16) 1 Read: Anytime Write: Anytime, write 1 to clear Table 2-32. PIFP Register Field Descriptions Field Description 7 OCIF Over-Current Interrupt Flag register port P — This flag asserts if an over-current condition is detected on PP2 (Section 2.4.4.3, “Over-Current Interrupt and Protection”). 1 PP2 Over-current event occurred 0 No PP2 over-current event occurred 5-0 PIFP Pin Interrupt Flag register port P — This flag asserts after a valid active edge was detected on the related pin (Section 2.4.4, “Interrupts”). This can be a rising or a falling edge based on the state of the polarity select register. An interrupt will occur if the associated interrupt enable bit is set. 1 Active edge on the associated bit has occurred 0 No active edge occurred MC9S12VR Family Reference Manual, Rev. 4.2 92 NXP Semiconductor Port Integration Module (S12VRPIMV3) 2.3.34 Port L Input Register (PTIL) Access: User read only1 Address 0x0269 R 7 6 5 4 3 2 1 0 0 0 0 0 PTIL3 PTIL2 PTIL1 PTIL0 0 0 0 0 0 0 0 0 W Reset Figure 2-49. Port L Input Register (PTIL) 1 Read: Anytime Write: No Write Table 2-33. PTIL - Register Field Descriptions 1 Field Description 3-0 PTIL PorT Input data register port L — A read returns the synchronized input state if the associated pin is used in digital mode, that is the related DIENL bit is set to 1 and the pin is not used in analog mode (PTAL[PTAENL]=0). See Section 2.3.36, “Port L Analog Access Register (PTAL)”. A one is read in any other case1. Refer to PTTEL bit description in Section 2.3.36, “Port L Analog Access Register (PTAL) for an override condition. 2.3.35 Port L Digital Input Enable Register (DIENL) Access: User read/write1 Address 0x26A R 7 6 5 4 0 0 0 0 0 0 0 0 W Reset 3 2 1 0 DIENL3 DIENL2 DIENL1 DIENL0 0 0 0 0 Figure 2-50. Port L Digital Input Enable Register (DIENL) 1 Read: Anytime Write: Anytime Table 2-34. DIENL Register Field Descriptions 1 Field Description 3-0 DIENL Digital Input ENable port L — Input buffer control This bit controls the HVI digital input function. If set to 1 the input buffers are enabled and the pin can be used with the digital function. If the analog input function is enabled (PTAL[PTAENL]=1) the input buffer of the selected HVI pin is forced off1 in run mode and is released to be active in stop mode only if DIENL=1. 1 Associated pin digital input is enabled if not used as analog input in run mode1 0 Associated pin digital input is disabled1 Refer to PTTEL bit description in Section 2.3.36, “Port L Analog Access Register (PTAL) for an override condition. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 93 Port Integration Module (S12VRPIMV3) 2.3.36 Port L Analog Access Register (PTAL) Access: User read/write1 Address 0x026B R W 7 6 5 4 3 PTTEL PTPSL PTABYPL PTADIRL PTAENL 0 0 0 0 0 Reset 2 0 0 1 0 PTAL1 PTAL0 0 0 Figure 2-51. Port L Analog Access Register (PTAL) 1 Read: Anytime Write: Anytime Table 2-35. PTAL Register Field Descriptions Field Description 7 PTTEL PorT Test Enable port L — This bit forces the input buffer of the selected HVI pin (PTAL[1:0]) to be active while using the analog function to support open input detection in run mode. Refer to Section 2.5.4, “Open Input Detection on HVI Pins”). In stop mode this bit has no effect. Note: In direct input connection (PTAL[PTADIRL]=1) the digital input buffer is not enabled. 1 Input buffer enabled when used with analog function and not in direct mode (PTAL[PTADIRL]=0) 0 Input buffer disabled when used with analog function 6 PTPSL PorT Pull Select port L — This bit selects a pull device on the selected HVI pin (PTAL[1:0]) in analog mode for open input detection. By default a pulldown device is active as part of the input voltage divider. If set to 1 and PTTEL=1 and not in stop mode a pullup to a level close to VDDX takes effect and overrides the weak pulldown device. Refer to Section 2.5.4, “Open Input Detection on HVI Pins”). 1 Pullup enabled 0 Pulldown enabled 5 PTABYPL PorT ADC connection BYPass port L — This bit bypasses and powers down the impedance converter stage in the signal path from the analog input pin to the ADC channel input. This bit takes effect only if using direct input connection to the ADC channel (PTADIRL=1). 1 Bypass impedance converter in ADC channel signal path 0 Use impedance converter in ADC channel signal path 4 PTADIRL PorT ADC DIRect connection port L — This bit connects the selected analog input signal (PTAL[1:0]) directly to the ADC channel bypassing the voltage divider. This bit takes effect only in analog mode (PTAENL=1). 1 Input pin directly connected to ADC channel 0 Input voltage divider active on analog input to ADC channel 3 PTAENL PorT ADC connection ENable port L — This bit enables the analog signal link of an HVI pin selected by PTAL[1:0] to an ADC channel. If set to 1 the analog input function takes precedence over the digital input in run mode by forcing off the input buffers if not overridden by PTTEL=1. 1 Selected pin by PTAL[1:0] is connected to ADC channel 0 No Port L pin is connected to ADC 1-0 PTAL PorT ADC connection selector port L — These selector bits choose the HVI pin connecting to an ADC channel if enabled (PTAENL=1). Refer to Table 2-36 for details. MC9S12VR Family Reference Manual, Rev. 4.2 94 NXP Semiconductor Port Integration Module (S12VRPIMV3) NOTE When enabling the resistor paths to ground by setting PTAL[PTAENL]=1 or by changing PTAL[PTAL1:PTAL0], a settling time of tUNC_HVI + two bus cycles must be considered to let internal nodes be loaded with correct values. Table 2-36. HVI pin connected to ADC channel 1 PTAL[PTAL1 ] PTAL[PTAL0 ] HVI pin connected to ADC1 0 0 HVI0 0 1 HVI1 1 0 HVI2 1 1 HVI3 Refer to device overview section for channel assignment MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 95 Port Integration Module (S12VRPIMV3) 2.3.37 Port L Input Divider Ratio Selection Register (PIRL) Access: User read/write1 Address 0x026C R 7 6 5 4 0 0 0 0 0 0 0 0 W Reset 3 2 1 0 PIRL3 PIRL2 PIRL1 PIRL0 0 0 0 0 Figure 2-52. Port L Input Divider Ratio Selection Register (PIRL) 1 Read: Anytime Write: Anytime Table 2-37. PIRL Register Field Descriptions Field Description 3-0 PIRL 2.3.38 Port L Input Divider Ratio Select — This bit selects one of two voltage divider ratios for the associated high-voltage input pin in analog mode. 1 RatioL_HVI selected 0 RatioH_HVI selected Port L Polarity Select Register (PPSL) Access: User read/write1 Address 0x026D R 7 6 5 4 0 0 0 0 0 0 0 0 W Reset 3 2 1 0 PPSL3 PPSL2 PPSL1 PPSL0 0 0 0 0 Figure 2-53. Port L Polarity Select Register (PPSL) 1 Read: Anytime Write: Anytime Table 2-38. PPSL Register Field Descriptions Field 3-0 PPSL Description Pin interrupt Polarity Select register port L — This bit selects the polarity of the active pin interrupt edge. 1 Rising edge selected 0 Falling edge selected MC9S12VR Family Reference Manual, Rev. 4.2 96 NXP Semiconductor Port Integration Module (S12VRPIMV3) 2.3.39 Port L Interrupt Enable Register (PIEL) Access: User read/write1 Address 0x026E R 7 6 5 4 0 0 0 0 0 0 0 0 W Reset 3 2 1 0 PIEL3 PIEL2 PIEL1 PIEL0 0 0 0 0 Figure 2-54. Port L Interrupt Enable Register (PIEL) 1 Read: Anytime Write: Anytime Table 2-39. PIEL Register Field Descriptions Field Description 3-0 PIEL 2.3.40 Pin Interrupt Enable register port L — This bit enables or disables the edge sensitive pin interrupt on the associated pin. For wakeup from stop mode this bit must be set. 1 Interrupt is enabled 0 Interrupt is disabled (interrupt flag masked) Port L Interrupt Flag Register (PIFL) Access: User read/write1 Address 0x026F R 7 6 5 4 0 0 0 0 0 0 0 0 W Reset 3 2 1 0 PIFL3 PIFL2 PIFL1 PIFL0 0 0 0 0 Figure 2-55. Port L Interrupt Flag Register (PIFL) 1 Read: Anytime Write: Anytime, write 1 to clear Table 2-40. PIFL Register Field Descriptions Field Description 3-0 PIFL Pin Interrupt Flag register port L — This flag asserts after a valid active edge was detected on the related pin (Section 2.4.4, “Interrupts”). This can be a rising or a falling edge based on the state of the polarity select register. An interrupt will occur if the associated interrupt enable bit is set. 1 Active edge on the associated bit has occurred 0 No active edge occurred MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 97 Port Integration Module (S12VRPIMV3) 2.3.41 Port AD Data Register (PT1AD) Access: User read/write1 Address 0x0271 (S12VR64/48) 7 6 0 0 Altern. Function — Reset 0 R 5 4 3 2 1 0 PT1AD5 PT1AD4 PT1AD3 PT1AD2 PT1AD1 PT1AD0 — AN5 AN4 AN3 AN2 AN1 AN0 0 0 0 0 0 0 0 W Figure 2-56. Port AD Data Register (PT1AD - S12VR64/48) 1 Read: Anytime. The data source is depending on the data direction value. Write: Anytime Access: User read/write1 Address 0x0271 (S12VR32/16) 7 6 5 4 3 2 0 0 0 0 0 0 Altern. Function — — — — — Reset 0 0 0 0 0 R 1 0 PT1AD1 PT1AD0 — AN1 AN0 0 0 0 W Figure 2-57. Port AD Data Register (PT1AD - S12VR32/16) 1 Read: Anytime. The data source is depending on the data direction value. Write: Anytime Table 2-41. PT1AD Register Field Descriptions Field Description 5-0 PT1AD PorT data register 1 port AD — General-purpose input/output data, ADC AN analog input When not used with the alternative function, the associated pin can be used as general-purpose I/O. In general-purpose output mode the register bit value is driven to the pin. If the associated data direction bit set to 1, a read returns the value of the port register bit. If the data direction bit is set to 0 and the ADC Digital Input Enable Register (ATDDIEN) is set to 1 the synchronized pin input state is read. MC9S12VR Family Reference Manual, Rev. 4.2 98 NXP Semiconductor Port Integration Module (S12VRPIMV3) 2.3.42 Port AD Input Register (PTI1AD) Access: User read only1 Address 0x0273 (S12VR64/48) R 7 6 5 4 3 2 1 0 0 0 PTI1AD5 PTI1AD4 PTI1AD3 PTI1AD2 PTI1AD1 PTI1AD0 0 0 0 0 0 0 0 0 W Reset u = Unaffected by reset Figure 2-58. Port P Input Register (PTI1AD - S12VR64/48) 1 Read: Anytime Write:Never Access: User read only1 Address 0x0273 (S12VR32/16) R 7 6 5 4 3 2 1 0 0 0 0 0 0 0 PTI1AD1 PTI1AD0 0 0 0 0 0 0 0 0 W Reset u = Unaffected by reset Figure 2-59. Port P Input Register (PTI1AD - S12VR32/16) 1 Read: Anytime Write:Never Table 2-42. PTI1AD Register Field Descriptions Field Description 5-0 PTI1AD PorT Input data register 1 port AD — A read always returns the synchronized input state of the associated pin if the ADC Digital Input Enable Register (ATDDIEN) is set to 1. Else a logic 1 is read. It can be used to detect overload or short circuit conditions on output pins. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 99 Port Integration Module (S12VRPIMV3) 2.3.43 Port AD Data Direction Register (DDR1AD) Access: User read/write1 Address 0x0275 (S12VR64/48) R 7 6 0 0 0 0 W Reset 5 4 3 2 1 0 DDR1AD5 DDR1AD4 DDR1AD3 DDR1AD2 DDR1AD1 DDR1AD0 0 0 0 0 0 0 Figure 2-60. Port AD Data Direction Register (DDR1AD - S12VR64/48) 1 Read: Anytime Write: Anytime Access: User read/write1 Address 0x0275 (S12VR32/16) R 7 6 5 4 3 2 0 0 0 0 0 0 0 0 0 0 0 0 W Reset 1 0 DDR1AD1 DDR1AD0 0 0 Figure 2-61. Port AD Data Direction Register (DDR1AD - S12VR32/16) 1 Read: Anytime Write: Anytime Table 2-43. DDR1AD Register Field Descriptions Field 5-0 DDR1AD Description Data Direction Register 1 port AD — This bit determines whether the associated pin is an input or output. To use the digital input function the ADC Digital Input Enable Register (ATDDIEN) has to be set to logic level “1”. 1 Associated pin is configured as output 0 Associated pin is configured as input MC9S12VR Family Reference Manual, Rev. 4.2 100 NXP Semiconductor Port Integration Module (S12VRPIMV3) 2.3.44 Port AD Pull Enable Register (PER1AD) Access: User read/write1 Address 0x0279 (S12VR64/48) R 7 6 0 0 0 0 W Reset 5 4 3 2 1 0 PER1AD5 PER1AD4 PER1AD3 PER1AD2 PER1AD1 PER1AD0 0 0 0 0 0 0 Figure 2-62. Port AD Pullup Enable Register (PER1AD - S12VR64/48) 1 Read: Anytime Write: Anytime Access: User read/write1 Address 0x0279 (S12VR32/16) R 7 6 5 4 3 2 0 0 0 0 0 0 0 0 0 0 0 0 W Reset 1 0 PER1AD1 PER1AD0 0 0 Figure 2-63. Port AD Pullup Enable Register (PER1AD - S12VR32/16) 1 Read: Anytime Write: Anytime Table 2-44. PER1AD Register Field Descriptions Field Description 5-0 PER1AD Pull device Enable Register 1 port AD — Enable pull device on input pin This bit controls whether a pull device on the associated port input pin is active. If a pin is used as output this bit has no effect. The polarity is selected by the related polarity select register bit. 1 Pull device enabled 0 Pull device disabled MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 101 Port Integration Module (S12VRPIMV3) 2.3.45 Port AD Polarity Select Register (PPS1AD) Access: User read/write1 Address 0x027B (S12VR64/48) R 7 6 0 0 0 0 W Reset 5 4 3 2 1 0 PPS1AD5 PPS1AD4 PPS1AD3 PPS1AD2 PPS1AD1 PPS1AD0 0 0 0 0 0 0 Figure 2-64. Port AD Polarity Select Register (PPS1AD - S12VR64/48) 1 Read: Anytime Write: Anytime Access: User read/write1 Address 0x027B (S12VR32/16) R 7 6 5 4 3 2 0 0 0 0 0 0 0 0 0 0 0 0 W Reset 1 0 PPS1AD1 PPS1AD0 0 0 Figure 2-65. Port AD Polarity Select Register (PPS1AD - S12VR32/16) 1 Read: Anytime Write: Anytime Table 2-45. PPS1AD Register Field Descriptions Field Description 5-0 PPS1AD Pull device Polarity Select register 1 port AD — Configure pull device polarity and pin interrupt edge polarity on input pin This bit selects a pullup or a pulldown device if enabled on the associated port input pin. This bit also selects the polarity of the active pin interrupt edge. 1 A pulldown device is selected; rising edge selected 0 A pullup device is selected; falling edge selected MC9S12VR Family Reference Manual, Rev. 4.2 102 NXP Semiconductor Port Integration Module (S12VRPIMV3) 2.3.46 Port AD Interrupt Enable Register (PIE1AD) Access: User read/write1 Address 0x027D (S12VR64/48) R 7 6 0 0 0 0 W Reset 5 4 3 2 1 0 PIE1AD5 PIE1AD4 PIE1AD3 PIE1AD2 PIE1AD1 PIE1AD0 0 0 0 0 0 0 Figure 2-66. Port AD Interrupt Enable Register (PIE1AD - S12VR64/48) 1 Read: Anytime Write: Anytime Read: Anytime. Access: User read/write1 Address 0x027D (S12VR32/16) R 7 6 5 4 3 2 0 0 0 0 0 0 0 0 0 0 0 0 W Reset 1 0 PIE1AD1 PIE1AD0 0 0 Figure 2-67. Port AD Interrupt Enable Register (PIE1AD - S12VR32/16) 1 Read: Anytime Write: Anytime Table 2-46. PIE1AD Register Field Descriptions Field 5-0 PIE1AD Description Pin Interrupt Enable register 1 port AD — This bit enables or disables the edge sensitive pin interrupt on the associated pin. An interrupt can be generated if the pin is operating in input or output mode when in use with the general-purpose or related peripheral function. For wakeup from stop mode this bit must be set to allow activating the RC oscillator. 1 Interrupt is enabled 0 Interrupt is disabled (interrupt flag masked) MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 103 Port Integration Module (S12VRPIMV3) 2.3.47 Port AD Interrupt Flag Register (PIF1AD) Access: User read/write1 Address 0x027F (S12VR64/48) R 7 6 0 0 0 0 W Reset 5 4 3 2 1 0 PIF1AD5 PIF1AD4 PIF1AD3 PIF1AD2 PIF1AD1 PIF1AD0 0 0 0 0 0 0 Figure 2-68. Port AD Interrupt Flag Register (PIF1AD - S12VR64/48) 1 Read: Anytime Write: Anytime, write 1 to clear Access: User read/write1 Address 0x027F (S12VR32/16) R 7 6 5 4 3 2 0 0 0 0 0 0 0 0 0 0 0 0 W Reset 1 0 PIF1AD1 PIF1AD0 0 0 Figure 2-69. Port AD Interrupt Flag Register (PIF1AD - S12VR32/16) 1 Read: Anytime Write: Anytime, write 1 to clear Table 2-47. PIF1AD Register Field Descriptions Field Description 5-0 PIF1AD Pin Interrupt Flag register 1 port AD — This flag asserts after a valid active edge was detected on the related pin (Section 2.4.4, “Interrupts”). This can be a rising or a falling edge based on the state of the polarity select register. An interrupt will occur if the associated interrupt enable bit is set. 1 Active edge on the associated bit has occurred 0 No active edge occurred 2.4 2.4.1 Functional Description General Each pin except BKGD and port L pins can act as general-purpose I/O. In addition each pin can act as an output or input of a peripheral module. 2.4.2 Registers Table 2-48 lists the configuration registers which are available on each port. These registers except the pin input and routing registers can be written at any time, however a specific configuration might not become active. MC9S12VR Family Reference Manual, Rev. 4.2 104 NXP Semiconductor Port Integration Module (S12VRPIMV3) For example selecting a pullup device: This device does not become active while the port is used as a push-pull output. Table 2-48. Register availability per port1 1 2 Port Data Input Data Direction Reduced Drive Pull Enable Polarity Select WiredOr Mode Interrupt Enable Interrupt Flag Routing E yes - yes - yes - - - - - T yes yes yes - yes yes - - - yes S yes yes yes - yes yes yes - - yes P yes yes yes yes yes yes - yes yes - L - yes yes2 - - yes - yes yes - AD yes yes yes - yes yes - yes yes - Each cell represents one register with individual configuration bits Input buffer control only 2.4.2.1 Data register (PTx) This register holds the value driven out to the pin if the pin is used as a general-purpose I/O. Writing to this register has only an effect on the pin if the pin is used as general-purpose output. When reading this address, the synchronized state of the pin is returned if the associated data direction register bit is set to “0”. If the data direction register bits are set to logic level “1”, the contents of the data register is returned. This is independent of any other configuration (Figure 2-70). 2.4.2.2 Input register (PTIx) This register is read-only and always returns the synchronized state of the pin (Figure 2-70). 2.4.2.3 Data direction register (DDRx) This register defines whether the pin is used as an general-purpose input or an output. If a peripheral module controls the pin the contents of the data direction register is ignored (Figure 2-70). Independent of the pin usage with a peripheral module this register determines the source of data when reading the associated data register address (2.4.2.1/2-105). NOTE Due to internal synchronization circuits, it can take up to 2 bus clock cycles until the correct value is read on port data or port input registers, when changing the data direction register. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 105 Port Integration Module (S12VRPIMV3) PTI 0 1 PT 0 PIN 1 DDR 0 1 Module data out output enable module enable Figure 2-70. Illustration of I/O pin functionality 2.4.2.4 Reduced drive register (RDRx) If the pin is used as an output this register allows the configuration of the drive strength independent of the use with a peripheral module. 2.4.2.5 Pull device enable register (PERx) This register turns on a pullup or pulldown device on the related pins determined by the associated polarity select register (2.4.2.6/2-106). The pull device becomes active only if the pin is used as an input or as a wired-or output. Some peripheral module only allow certain configurations of pull devices to become active. Refer to the respective bit descriptions. 2.4.2.6 Polarity select register (PPSx) This register selects either a pullup or pulldown device if enabled. It becomes only active if the pin is used as an input. A pullup device can be activated if the pin is used as a wired-or output. 2.4.2.7 Wired-or mode register (WOMx) If the pin is used as an output this register turns off the active-high drive. This allows wired-or type connections of outputs. MC9S12VR Family Reference Manual, Rev. 4.2 106 NXP Semiconductor Port Integration Module (S12VRPIMV3) 2.4.2.8 Interrupt enable register (PIEx) If the pin is used as an interrupt input this register serves as a mask to the interrupt flag to enable/disable the interrupt. 2.4.2.9 Interrupt flag register (PIFx) If the pin is used as an interrupt input this register holds the interrupt flag after a valid pin event. 2.4.2.10 Module routing register (MODRRx) Routing registers allow software re-configuration of specific peripheral inputs and outputs: • MODRR0 selects the driving source of the HSDRV and LSDRV pins • MODRR1 selects optional pins for PWM channels and ETRIG inputs (S12VR64/48 only) • MODRR2 supports options to test the internal SCI-LINPHY interface signals 2.4.3 Pins and Ports NOTE Please refer to the device pinout section to determine the pin availability in the different package options. 2.4.3.1 BKGD pin The BKGD pin is associated with the BDM module. During reset, the BKGD pin is used as MODC input. 2.4.3.2 Port E This port is associated with the CPMU OSC. Port E pins PE1-0 can be used for general-purpose or with the CPMU OSC module. 2.4.3.3 Port T This port is associated with TIM, routed SCI-LINPHY interface and routed SPI. Port T pins can be used for either general-purpose I/O or with the channels of the standard TIM, SPI, or SCI and LINPHY subsystems. 2.4.3.4 Port S This port is associated with the API_EXTCLK, ECLK, SPI, SCI1, routed SCI0, routed PWM channels and ETRIG inputs. Port S pins can be used either for general-purpose I/O, or with the ECLK, SPI, SCI, and PWM subsystems. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 107 Port Integration Module (S12VRPIMV3) 2.4.3.5 Port P Port P pins can be used for either general-purpose I/O, IRQ and XIRQ or with the PWM subsystem. All pins feature pin interrupt functionality. PP2 has an increased current capability to drive up to 20 mA to supply external devices for external Hall sensors. An over-current protection is available. PP1 and PP0 have an increased current capability to drive up to 10 mA. PP4 and PP5 support ETRIG functionality. PP5 can be used for either general-purpose input or as the level- or falling edge-sensitive IRQ interrupt input. IRQ will be enabled by setting the IRQCR[IRQEN] configuration bit (2.3.8/2-66) and clearing the I-bit in the CPU condition code register. It is inhibited at reset so this pin is initially configured as a simple input with a pullup. PP0 can be used for either general-purpose input or as the level-sensitive XIRQ interrupt input. XIRQ can be enabled by clearing the X-bit in the CPU condition code register. It is inhibited at reset so this pin is initially configured as a high-impedance input with a pullup. 2.4.3.6 Port L Port L provides four high-voltage inputs (HVI) with the following features: • Input voltage proof up to VHVIx • Digital input function with pin interrupt and wakeup from stop capability • Analog input function with selectable divider ratio routable to ADC channel. Optional direct input bypassing voltage divider and impedance converter. Capable to wakeup from stop (pin interrupts in run mode not available). Open input detection. MC9S12VR Family Reference Manual, Rev. 4.2 108 NXP Semiconductor Port Integration Module (S12VRPIMV3) Figure 2-71 shows a block diagram of the HVI. VHVI REXT_HVI 10K HVIx ANALOG[x] = PTAENL & PTAL[1:0] 40K Input Buffer PTIL[x] (DIENL[x] & (ANALOG[x] | STOP)) | (ANALOG[x] & PTADIRL & PTTEL & STOP) 500K ANALOG[x] & STOP & PTADIRL ANALOG[x] VDDX & PTTEL & PTPSL & STOP ANALOG[x] & STOP & PTADIRL Impedance Converter ADC ANALOG[x] & STOP & PTADIRL 110K PIRL[x] (other inputs) 440K PTAENL & PTADIRL & PTABYPL Figure 2-71. HVI Block Diagram Voltages up to VHVIx can be applied to all HVI pins. Internal voltage dividers scale the input signals down to logic level. There are two modes, digital and analog, where these signals can be processed. 2.4.3.6.1 Digital Mode Operation In digital mode the input buffers are enabled (DIENL[x]=1 & PTAL[PTAENL]=0). The synchronized pin input state determined at threshold level VTH_HVI can be read in register PTIL. Interrupt flags (PIFL) are set on input transitions if enabled (PIEL[x]=1) and configured for the related edge polarity (PPSL). Wakeup from stop mode is supported. 2.4.3.6.2 Analog Mode Operation In analog mode (PTAL[PTAENL]=1) the voltage applied to a selectable pin (PTAL[PTAL1:PTAL0]) can be measured on an internal ADC channel (refer to device overview section for channel assignment). One of two input divider ratios (RatioH_HVI, RatioL_HVI) can be chosen on each analog input (PIRL[x]) or the MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 109 Port Integration Module (S12VRPIMV3) voltage divider can be bypassed (PTAL[PTADIRL]=1). Additionally in latter case the impedance converter in the ADC signal path can be configured to be used or bypassed in direct input mode (PTAL[PTABYPL]). Out of reset the digital input buffer of the selected pin is disabled to avoid shoot-through current. Pin interrupts can only be generated if DIENL[x]=1. In stop mode the digital input buffer is enabled if DIENL[x]=1 or if the PTAL[PTTEL] bit is set to support wakeup functionality. Table 2-49 shows the HVI input configuration depending on register bits and operation mode. Table 2-49. HVI Input Configurations Mode DIENL PTAENL Run/Wait 0 0 off off 0 1 off1 enabled 1 0 enabled off 1 1 off1 enabled 0 X off off If PTAL[PTTEL] is set: input enabled, wakeup from stop supported. If PTAL[PTTEL] is cleared: input disabled, wakeup from stop not supported. 1 X enabled off Digital input, wakeup from stop supported Stop 1 Digital Input Analog Input Resulting Function Input disabled (Reset) Analog input, interrupt not supported Digital input, interrupt supported Analog input, interrupt not supported Enabled if (PTAL[PTTEL]=1 & PTAL[PTADIRL]=0) NOTE An external resistor REXT_HVI must always be connected to the high-voltage inputs to protect the device pins from fast transients and to achieve the specified pin input divider ratios when using the HVI in analog mode. 2.4.3.7 Port AD This port is associated with the ADC. Port AD pins can be used for either general-purpose I/O, or with the ADC subsystem. 2.4.4 Interrupts This section describes the interrupts generated by the PIM and their individual sources. Vector addresses and interrupt priorities are defined at MCU level. Table 2-50. PIM Interrupt Sources Local Enable (S12VR64/48) Module Interrupt Sources XIRQ None Local Enable (S12VR32/16) None MC9S12VR Family Reference Manual, Rev. 4.2 110 NXP Semiconductor Port Integration Module (S12VRPIMV3) Table 2-50. PIM Interrupt Sources Local Enable (S12VR64/48) Module Interrupt Sources Local Enable (S12VR32/16) IRQ1 IRQCR[IRQEN] N/A Port P pin interrupt PIEP[PIEP5-PIEP0] PIEP[PIEP2-PIEP1] Port L pin interrupt PIEL[PIEL3-PIEL0] PIEL[PIEL3-PIEL0] Port AD pin interrupt PIE1AD[PIE1AD5-PIE1AD0] PIE1AD[PIE1AD1-PIE1AD0] Port P over-current PIEP[OCIE] PIEP[OCIE] 1 S12VR64/48 only 2.4.4.1 XIRQ, IRQ Interrupts The XIRQ pin allows requesting non-maskable interrupts after reset initialization. During reset, the X bit in the condition code register is set and any interrupts are masked until software enables them. The IRQ pin allows requesting asynchronous interrupts (S12VR64/48 only). The interrupt input is disabled out of reset. To enable the interrupt the IRQCR[IRQEN] bit must be set and the I bit cleared in the condition code register. The interrupt can be configured for level-sensitive or falling-edge-sensitive triggering. If IRQCR[IRQEN] is cleared while an interrupt is pending, the request will deassert. Both interrupts are capable to wake-up the device from stop mode. Means for glitch filtering are not provided on these pins. 2.4.4.2 Pin Interrupts and Wakeup Ports P, L and AD offer pin interrupt capability. The related interrupt enable (PIE) as well as the sensitivity to rising or falling edges (PPS) can be individually configured on per-pin basis. All bits/pins in a port share the same interrupt vector. Interrupts can be used with the pins configured as inputs or outputs. An interrupt is generated when a bit in the port interrupt flag (PIF) and its corresponding port interrupt enable (PIE) are both set. The pin interrupt feature is also capable to wake up the CPU when it is in stop or wait mode. A digital filter on each pin prevents short pulses from generating an interrupt. A valid edge on an input is detected if 4 consecutive samples of a passive level are followed by 4 consecutive samples of an active level. Else the sampling logic is restarted. In run and wait mode the filters are continuously clocked by the bus clock. Pulses with a duration of tPULSE < nP_MASK/fbus are assuredly filtered out while pulses with a duration of tPULSE > nP_PASS/fbus guarantee a pin interrupt. In stop mode the clock is generated by an RC-oscillator. The minimum pulse length varies over process conditions, temperature and voltage (Figure 2-72). Pulses with a duration of tPULSE < tP_MASK are assuredly filtered out while pulses with a duration of tPULSE > tP_PASS guarantee a wakeup event. Please refer to the appendix table “Pin Interrupt Characteristics” for pulse length limits. To maximize current saving the RC oscillator is active only if the following condition is true on any individual pin: MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 111 Port Integration Module (S12VRPIMV3) Sample count <= 4 (at active or passive level) and interrupt enabled (PIE[x]=1) and interrupt flag not set (PIF[x]=0). Glitch, filtered out, no interrupt flag set Valid pulse, interrupt flag set uncertain tPULSE(min) tPULSE(max) Figure 2-72. Interrupt Glitch Filter (here: active low level selected) 2.4.4.3 Over-Current Interrupt and Protection In case of an over-current condition on PP2 (see Section 2.5.3, “Over-Current Protection on EVDD”) the over-current interrupt flag PIFP[OCIF] asserts. This flag generates an interrupt if the enable bit PIEP[OCIE] is set. An asserted flag immediately forces the output independent of its driving source (PWM or port register bit) low to protect the device. The flag must be cleared to re-enable the driver. 2.5 2.5.1 Initialization and Application Information Port Data and Data Direction Register writes It is not recommended to write PORT[x]/PT[x] and DDR[x] in a word access. When changing the register pins from inputs to outputs, the data may have extra transitions during the write access. Initialize the port data register before enabling the outputs. 2.5.2 ADC External Triggers ETRIG1-0 The ADC external trigger inputs ETRIG1-0 allow the synchronization of conversions to external trigger events if selected as trigger source (for details refer to ATDCTL1[ETRIGSEL] and ATDCTL1[ETRIGCH] configuration bits in ADC section). These signals are related to PWM channels 5-4 to support periodic trigger applications with the ADC. Other pin functions can also be used as triggers. If a PWM channel is routed to an alternative pin, the ETRIG input function will follow the relocation accordingly. MC9S12VR Family Reference Manual, Rev. 4.2 112 NXP Semiconductor Port Integration Module (S12VRPIMV3) If the related PWM channel is enabled and not routed for internal use, the PWM signal as seen on the pin will drive the ETRIG input. Else the ETRIG function will be triggered by other functions on the pin including general-purpose input. 2.5.3 Over-Current Protection on EVDD Pin PP2 can be used as general-purpose I/O or due to its increased current capability in output mode as a switchable external power supply pin (EVDD) for external devices like Hall sensors. An over-current monitor is implemented to protect the controller from short circuits or excess currents on the output which can only arise if the pin is configured for full drive. Although the full drive current is available on the high and low side, the protection is only available if the pin is driven high (PTP[PTP2]=1). This is also true if using the pin with the PWM. To power up the over-current monitor set PIMMISC[OCPE]=1. In stop mode the over-current monitor is disabled for power saving. The increased current capability cannot be maintained to supply the external device. Therefore when using the pin as power supply the external load must be powered down prior to entering stop mode by setting PTP[PTP2]=0. An over-current condition is detected if the output current level exceeds the threshold IOCD in run mode. The output driver is immediately forced low and the over-current interrupt flag PIFP[OCIF] asserts. Refer to Section 2.4.4.3, “Over-Current Interrupt and Protection”. 2.5.4 Open Input Detection on HVI Pins The connection of an external pull device on any port L high-voltage input can be validated by using the built-in pull functionality of the HVI pins. Depending on the application type an external pulldown circuit can be detected with the internal pullup device whereas an external pullup circuit can be detected with the internal pulldown device which is part of the input voltage divider. Note that the following procedures make use of a function that overrides the automatic disable mechanism of the digital input buffers when using the inputs in analog mode. Make sure to switch off the override function when using an input in analog mode after the check has been completed. External pulldown device (Figure 2-73): 1. Enable analog function on HVIx in non-direct mode (PTAL[PTAENL]=1, PTAL[PTADIRL]=0, PTAL[PTAL1:PTAL0]=x, where x is 0, 1, 2, or 3) 2. Select internal pullup device on selected HVI (PTAL[PTPSL]=1) 3. Enable function to force input buffer active on selected HVI in analog mode (PTAL[PTTEL]=1) 4. Verify PTILx=0 for a connected external pulldown device; read PTILx=1 for an open input MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 113 Port Integration Module (S12VRPIMV3) VDDX 500K min. 1/10 * VDDX 110K / 550K Digital in 40K PIRL=0 / PIRL=1 HVIx 10K HV Supply Figure 2-73. Digital Input Read with Pullup Enabled External pullup device (Figure 2-74): 1. Enable analog function on HVIx in non-direct mode (PTAL[PTAENL]=1, PTAL[PTADIRL]=0, PTAL[PTAL1:PTAL0]=x, where x is 0, 1, 2, or 3) 2. Select internal pulldown device on selected HVI (PTAL[PTPSL]=0) 3. Enable function to force input buffer active on selected HVI in analog mode (PTAL[PTTEL]=1) 4. Verify PTILx=1 for a connected external pullup device; read PTILx=0 for an open input HV Supply 10K HVIx 40K max. 10/11 * VHVI (PIRL=0) max. 21/22 * VHVI (PIRL=1) Digital in 610K / 1050K PIRL=0 / PIRL=1 Figure 2-74. Digital Input Read with Pulldown Enabled MC9S12VR Family Reference Manual, Rev. 4.2 114 NXP Semiconductor Port Integration Module (S12VRPIMV3) MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 115 Port Integration Module (S12VRPIMV3) MC9S12VR Family Reference Manual, Rev. 4.2 116 NXP Semiconductor Chapter 3 S12G Memory Map Controller (S12GMMCV1) Table 3-1. Revision History Table Rev. No. (Item No.) Date (Submitted Sections Affected By) Substantial Change(s) 01.02 20-May 2010 Updates for S12VR48 and S12VR64 01.03 14-Feb 2014 Added S12VR32 3.1 Introduction The S12GMMC module controls the access to all internal memories and peripherals for the CPU12 and S12SBDM module. It regulates access priorities and determines the address mapping of the on-chip resources. Figure 3-1 shows a block diagram of the S12GMMC module. 3.1.1 Glossary Table 3-2. Glossary Of Terms Term Definition Local Addresses Address within the CPU12’s Local Address Map (Figure 3-11) Global Address Address within the Global Address Map (Figure 3-11) Aligned Bus Access Bus access to an even address. Misaligned Bus Access Bus access to an odd address. NS Normal Single-Chip Mode SS Special Single-Chip Mode Unimplemented Address Ranges Address ranges which are not mapped to any on-chip resource. NVM Non-volatile Memory; Flash or EEPROM IFR NVM Information Row. Refer to FTMRG Block Guide 3.1.2 Overview The S12GMMC connects the CPU12’s and the S12SBDM’s bus interfaces to the MCU’s on-chip resources (memories and peripherals). It arbitrates the bus accesses and determines all of the MCU’s memory maps. Furthermore, the S12GMMC is responsible for constraining memory accesses on secured devices and for selecting the MCU’s functional mode. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 117 S12G Memory Map Controller (S12GMMCV1) 3.1.3 Features The main features of this block are: • Paging capability to support a global 256 KByte memory address space • Bus arbitration between the masters CPU12, S12SBDM to different resources. • MCU operation mode control • MCU security control • Generation of system reset when CPU12 accesses an unimplemented address (i.e., an address which does not belong to any of the on-chip modules) in single-chip modes 3.1.4 Modes of Operation The S12GMMC selects the MCU’s functional mode. It also determines the devices behavior in secured and unsecured state. 3.1.4.1 Functional Modes Two functional modes are implemented on devices of the S12VR product family: • Normal Single Chip (NS) The mode used for running applications. • Special Single Chip Mode (SS) A debug mode which causes the device to enter BDM Active Mode after each reset. Peripherals may also provide special debug features in this mode. 3.1.4.2 Security S12VR devices can be secured to prohibit external access to the on-chip flash. The S12GMMC module determines the access permissions to the on-chip memories in secured and unsecured state. 3.1.5 Block Diagram Figure 3-1 shows a block diagram of the S12GMMC. MC9S12VR Family Reference Manual, Rev. 4.2 118 NXP Semiconductor S12G Memory Map Controller (S12GMMCV1) CPU BDM MMC Address Decoder & Priority DBG Target Bus Controller EEPROM Flash RAM Peripherals Figure 3-1. S12GMMC Block Diagram 3.2 External Signal Description The S12GMMC uses two external pins to determine the devices operating mode: RESET and MODC (Figure 3-3) See Device User Guide (DUG) for the mapping of these signals to device pins. Table 3-3. External System Pins Associated With S12GMMC Pin Name Pin Functions RESET (See Section Device Overview) RESET MODC (See Section Device Overview) MODC 3.3 3.3.1 Description The RESET pin is used the select the MCU’s operating mode. The MODC pin is captured at the rising edge of the RESET pin. The captured value determines the MCU’s operating mode. Memory Map and Registers Module Memory Map A summary of the registers associated with the S12GMMC block is shown in Figure 3-2. Detailed descriptions of the registers and bits are given in the subsections that follow. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 119 S12G Memory Map Controller (S12GMMCV1) Address Register Name 0x000A Reserved R Bit 7 6 5 4 3 2 1 Bit 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 DP15 DP14 DP13 DP12 DP11 DP10 DP9 DP8 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 PIX3 PIX2 PIX1 PIX0 0 0 0 0 0 0 0 0 W 0x000B MODE R MODC W 0x0010 Reserved R W 0x0011 DIRECT R W 0x0012 Reserved R W 0x0013 MMCCTL1 R W 0x0014 Reserved R NVMRES W 0x0015 PPAGE R W 0x00160x0017 Reserved R W = Unimplemented or Reserved Figure 3-2. MMC Register Summary 3.3.2 Register Descriptions This section consists of the S12GMMC control register descriptions in address order. 3.3.2.1 Mode Register (MODE) Address: 0x000B 7 R W Reset MODC MODC1 6 5 4 3 2 1 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 1. External signal (see Table 3-3). = Unimplemented or Reserved Figure 3-3. Mode Register (MODE) MC9S12VR Family Reference Manual, Rev. 4.2 120 NXP Semiconductor S12G Memory Map Controller (S12GMMCV1) Read: Anytime. Write: Only if a transition is allowed (see Figure 3-4). The MODC bit of the MODE register is used to select the MCU’s operating mode. Table 3-4. MODE Field Descriptions Field 7 MODC Description Mode Select Bit — This bit controls the current operating mode during RESET high (inactive). The external mode pin MODC determines the operating mode during RESET low (active). The state of the pin is registered into the respective register bit after the RESET signal goes inactive (see Figure 3-4). Write restrictions exist to disallow transitions between certain modes. Figure 3-4 illustrates all allowed mode changes. Attempting non authorized transitions will not change the MODE bit, but it will block further writes to the register bit except in special modes. Write accesses to the MODE register are blocked when the device is secured. RESET 1 0 Normal Single-Chip (NS) 1 Special Single-Chip (SS) 1 0 Figure 3-4. Mode Transition Diagram when MCU is Unsecured 3.3.2.2 Direct Page Register (DIRECT) Address: 0x0011 R W Reset 7 6 5 4 3 2 1 0 DP15 DP14 DP13 DP12 DP11 DP10 DP9 DP8 0 0 0 0 0 0 0 0 Figure 3-5. Direct Register (DIRECT) Read: Anytime Write: anytime in special SS, write-once in NS. This register determines the position of the 256 Byte direct page within the memory map.It is valid for both global and local mapping scheme. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 121 S12G Memory Map Controller (S12GMMCV1) Table 3-5. DIRECT Field Descriptions Field Description 7–0 DP[15:8] Direct Page Index Bits 15–8 — These bits are used by the CPU when performing accesses using the direct addressing mode. These register bits form bits [15:8] of the local address (see Figure 3-6). Bit15 Bit8 Bit0 Bit7 DP [15:8] CPU Address [15:0] Figure 3-6. DIRECT Address Mapping Example 3-1. This example demonstrates usage of the Direct Addressing Mode MOVB #$04,DIRECT LDY <$12 3.3.2.3 ;Set DIRECT register to 0x04. From this point on, all memory ;accesses using direct addressing mode will be in the local ;address range from 0x0400 to 0x04FF. ;Load the Y index register from 0x0412 (direct access). MMC Control Register (MMCCTL1) Address: 0x0013 R 7 6 5 4 3 2 1 0 0 0 0 0 0 0 0 0 0 0 0 0 0 W Reset 0 NVMRES 0 = Unimplemented or Reserved Figure 3-7. MMC Control Register (MMCCTL1) Read: Anytime. Write: Anytime. The NVMRES bit maps 16k of internal NVM resources (see Section FTMRG) to the global address space 0x04000 to 0x07FFF. Table 3-6. MODE Field Descriptions Field 0 NVMRES Description Map internal NVM resources into the global memory map Write: Anytime This bit maps internal NVM resources into the global address space. 0 Program flash is mapped to the global address range from 0x04000 to 0x07FFF. 1 NVM resources are mapped to the global address range from 0x04000 to 0x07FFF. MC9S12VR Family Reference Manual, Rev. 4.2 122 NXP Semiconductor S12G Memory Map Controller (S12GMMCV1) 3.3.2.4 Program Page Index Register (PPAGE) Address: 0x0015 R 7 6 5 4 0 0 0 0 0 0 0 0 W Reset 3 2 1 0 PIX3 PIX2 PIX1 PIX0 1 1 1 0 Figure 3-8. Program Page Index Register (PPAGE) Read: Anytime Write: Anytime The four index bits of the PPAGE register select a 16K page in the global memory map (Figure 3-11). The selected 16K page is mapped into the paging window ranging from local address 0x8000 to 0xBFFF. Figure 3-9 illustrates the translation from local to global addresses for accesses to the paging window. The CPU has special access to read and write this register directly during execution of CALL and RTC instructions. Global Address [17:0] Bit17 Bit0 Bit14 Bit13 PPAGE Register [3:0] Address [13:0] Address: CPU Local Address or BDM Local Address Figure 3-9. PPAGE Address Mapping NOTE Writes to this register using the special access of the CALL and RTC instructions will be complete before the end of the instruction execution. Table 3-7. PPAGE Field Descriptions Field 3–0 PIX[3:0] Description Program Page Index Bits 3–0 — These page index bits are used to select which of the 256 flash array pages is to be accessed in the Program Page Window. The fixed 16KB page from 0x0000 to 0x3FFF is the page number 0xC. Parts of this page are covered by Registers, EEPROM and RAM space. See SoC Guide for details. The fixed 16KB page from 0x4000–0x7FFF is the page number 0xD. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 123 S12G Memory Map Controller (S12GMMCV1) The reset value of 0xE ensures that there is linear Flash space available between addresses 0x0000 and 0xFFFF out of reset. The fixed 16KB page from 0xC000-0xFFFF is the page number 0xF. 3.4 Functional Description The S12GMMC block performs several basic functions of the S12VR sub-system operation: MCU operation modes, priority control, address mapping, select signal generation and access limitations for the system. Each aspect is described in the following subsections. 3.4.1 • • MCU Operating Modes Normal single chip mode This is the operation mode for running application code. There is no external bus in this mode. Special single chip mode This mode is generally used for debugging operation, boot-strapping or security related operations. The active background debug mode is in control of the CPU code execution and the BDM firmware is waiting for serial commands sent through the BKGD pin. 3.4.2 3.4.2.1 Memory Map Scheme CPU and BDM Memory Map Scheme The BDM firmware lookup tables and BDM register memory locations share addresses with other modules; however they are not visible in the memory map during user’s code execution. The BDM memory resources are enabled only during the READ_BD and WRITE_BD access cycles to distinguish between accesses to the BDM memory area and accesses to the other modules. (Refer to BDM Block Guide for further details). When the MCU enters active BDM mode, the BDM firmware lookup tables and the BDM registers become visible in the local memory map in the range 0xFF00-0xFFFF (global address 0x3_FF00 0x3_FFFF) and the CPU begins execution of firmware commands or the BDM begins execution of hardware commands. The resources which share memory space with the BDM module will not be visible in the memory map during active BDM mode. Please note that after the MCU enters active BDM mode the BDM firmware lookup tables and the BDM registers will also be visible between addresses 0xBF00 and 0xBFFF if the PPAGE register contains value of 0x0F. 3.4.2.1.1 Expansion of the Local Address Map Expansion of the CPU Local Address Map The program page index register in S12GMMC allows accessing up to 256KB of address space in the global memory map by using the four index bits (PPAGE[3:0]) to page 16x16 KB blocks into the program page window located from address 0x8000 to address 0xBFFF in the local CPU memory map. MC9S12VR Family Reference Manual, Rev. 4.2 124 NXP Semiconductor S12G Memory Map Controller (S12GMMCV1) The page value for the program page window is stored in the PPAGE register. The value of the PPAGE register can be read or written by normal memory accesses as well as by the CALL and RTC instructions. Control registers, vector space and parts of the on-chip memories are located in unpaged portions of the 64KB local CPU address space. The starting address of an interrupt service routine must be located in unpaged memory unless the user is certain that the PPAGE register will be set to the appropriate value when the service routine is called. However an interrupt service routine can call other routines that are in paged memory. The upper 16KB block of the local CPU memory space (0xC000–0xFFFF) is unpaged. It is recommended that all reset and interrupt vectors point to locations in this area or to the other unmapped pages sections of the local CPU memory map. Expansion of the BDM Local Address Map PPAGE and BDMPPR register is also used for the expansion of the BDM local address to the global address. These registers can be read and written by the BDM. The BDM expansion scheme is the same as the CPU expansion scheme. The four BDMPPR Program Page index bits allow access to the full 256KB address map that can be accessed with 18 address bits. The BDM program page index register (BDMPPR) is used only when the feature is enabled in BDM and, in the case the CPU is executing a firmware command which uses CPU instructions, or by a BDM hardware commands. See the BDM Block Guide for further details. (see Figure 3-10). MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 125 S12G Memory Map Controller (S12GMMCV1) BDM HARDWARE COMMAND Global Address [17:0] Bit17 Bit0 Bit14 Bit13 BDMPPR Register [3:0] BDM Local Address [13:0] BDM FIRMWARE COMMAND Global Address [17:0] Bit17 Bit0 Bit14 Bit13 BDMPPR Register [3:0] CPU Local Address [13:0] Figure 3-10. MC9S12VR Family Reference Manual, Rev. 4.2 126 NXP Semiconductor S12G Memory Map Controller (S12GMMCV1) 0x0000 0x0400 Local CPU and BDM Memory Map Global Memory Map Register Space Register Space EEPROM EEPROM Flash Space Unimplemented Page 0xC RAM 0x0_0000 0x0_0400 RAM 0x4000 NVMRES=0 Flash Space Flash Space Page 0xD Page 0x1 NVMRES=1 0x0_4000 Internal NVM Resources 0x0_8000 0x8000 Paging Window Flash Space Page 0x2 0x3_0000 0xC000 Flash Space Flash Space Page 0xF Page 0xC 0x3_4000 0xFFFF Flash Space Page 0xD 0x3_8000 Flash Space Page 0xE 0x3_C000 Flash Space Page 0xF 0x3_FFFF Figure 3-11. Local to Global Address Mapping MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 127 S12G Memory Map Controller (S12GMMCV1) 3.4.3 Unimplemented and Reserved Address Ranges The S12GMMC is capable of mapping up 64K of flash, 512 bytes of EEPROM and 2K of RAM into the global memory map. Smaller devices of the S12VR-family do not utilize all of the available address space. Address ranges which are not associated with one of the on-chip memories fall into two categories: Unimplemented addresses and reserved addresses. Unimplemented addresses are not mapped to any of the on-chip memories. The S12GMMC is aware that accesses to these address location have no destination and triggers a system reset (illegal address reset) whenever they are attempted by the CPU. The BDM is not able to trigger illegal address resets. Reserved addresses are associated with a memory block on the device, even though the memory block does not contain the resources to fill the address space. The S12GMMC is not aware that the associated memory does not physically exist. It does not trigger an illegal address reset when accesses to reserved locations are attempted. Table 3-9 shows the global address ranges of all members of the S12VR-family. Table 3-9. Global Address Ranges S12VR16 S12VR32 0x000000x003FF 0x004000x0047F S12VR48 Register Space 128b 128b 512b 0x004800x005FF 0x008000x037FF 0x038000x03FFF S12VR64 512b EEPROM Unimplemented 2k 2k 2k 2k Internal NVM Resources (for details refer to section FTMRG) 0x040000x07FFF (NVMRES =1) 0x040000x07FFF (NVMRES =0) 0x080000x30000 Unimplemented 0x300000x33FFF Reserved 0x340000x37FFF 0x380000x3BFFF 0x3C0000x3FFFF Reserved 16k Flash 32k 48k 64k MC9S12VR Family Reference Manual, Rev. 4.2 128 NXP Semiconductor S12G Memory Map Controller (S12GMMCV1) 3.4.4 Prioritization of Memory Accesses On S12VR devices, the CPU and the BDM are not able to access the memory in parallel. An arbitration occurs whenever both modules attempt a memory access at the same time. CPU accesses are handled with higher priority than BDM accesses unless the BDM module has been stalled for more then 128 bus cycles. In this case the pending BDM access will be processed immediately. 3.4.5 Interrupts The S12GMMC does not generate any interrupts. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 129 S12G Memory Map Controller (S12GMMCV1) MC9S12VR Family Reference Manual, Rev. 4.2 130 NXP Semiconductor Chapter 4 S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) Table 4-1. Revision Rev. No. (Item No) V08.00 V08.01 V08.02 V08.03 4.1 Date (Submitted By) 27. Jan. 14 30. Jan. 14 26. March 14 21 Oct. 2014 Sections Affected History Substantial Change(s) • Added full swing pierce oscillator (OSCMOD bit in CPMUOSC2 register). Added drawing in Block Diagram. • Added oscillator clock monitor reset to be configured with OMRE bit (CPMUOSC2 register). Added drawing in Block Diagram. • Added PLL clock monitor reset and PMRF flag in CPMUINT register. Added drawing in Block Diagram. • changed all “ATD” references to “ADC” • Added statement to clarify RTI and COP in freeze mode • • • • • • • Improved Figure: Start up of clock system after Reset Improved Figure: Full stop mode using Oscillator Improved Figure: Enabling the external oscillator Improved Table: Trimming effect of ACLKTR Improved Table: Trimming effect of HTTR Register Description for CPMUHTCTL: Added note on how to compute VHT • Functional Description PBE Mode: Added Note that the clock system might stall if osc monitor reset disabled (OMRE=0) • Introduction This specification describes the function of the Clock, Reset and Power Management Unit (S12CPMU_UHV_V8). • The Pierce oscillator (XOSCLCP) provides a robust, low-noise and low-power external clock source. It is designed for optimal start-up margin with typical crystal oscillators. • The Voltage regulator (VREGAUTO) operates from the range 6V to 18V. It provides all the required chip internal voltages and voltage monitors. • The Phase Locked Loop (PLL) provides a highly accurate frequency multiplier with internal filter. • The Internal Reference Clock (IRC1M) provides a 1MHz internal clock. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 131 S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) 4.1.1 Features The Pierce Oscillator (XOSCLCP) contains circuitry to dynamically control current gain in the output amplitude. This ensures a signal with low harmonic distortion, low power and good noise immunity. • Supports crystals or resonators from 4MHz to 20MHz. • High noise immunity due to input hysteresis and spike filtering. • Low RF emissions with peak-to-peak swing limited dynamically • Transconductance (gm) sized for optimum start-up margin for typical crystals • Dynamic gain control eliminates the need for external current limiting resistor • Integrated resistor eliminates the need for external bias resistor • Low power consumption: Operates from internal 1.8V (nominal) supply, Amplitude control limits power • Optional oscillator clock monitor reset • Optional full swing mode for higher immunity against noise injection on the cost of higher power consumption and increased emission The Voltage Regulator (VREGAUTO) has the following features: • Input voltage range from 6 to 18V (nominal operating range) • Low-voltage detect (LVD) with low-voltage interrupt (LVI) • Power-on reset (POR) • Low-voltage reset (LVR) • On Chip Temperature Sensor and Bandgap Voltage measurement via internal ADC channel. • High temperature interrupt • Voltage Regulator providing Full Performance Mode (FPM) and Reduced Performance Mode (RPM) The Phase Locked Loop (PLL) has the following features: • Highly accurate and phase locked frequency multiplier • Configurable internal filter for best stability and lock time • Frequency modulation for defined jitter and reduced emission • Automatic frequency lock detector • Interrupt request on entry or exit from locked condition • Reference clock either external (crystal) or internal square wave (1MHz IRC1M) based. • PLL clock monitor reset • PLL stability is sufficient for LIN communication in slave mode, even if using IRC1M as reference clock The Internal Reference Clock (IRC1M) has the following features: • Frequency trimming (A factory trim value for 1MHz is loaded from Flash Memory into the IRCTRIM register after reset, which can be overwritten by application if required) MC9S12VR Family Reference Manual, Rev. 4.2 132 NXP Semiconductor S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) • Temperature Coefficient (TC) trimming. (A factory trim value is loaded from Flash Memory into the IRCTRIM register to turn off TC trimming after reset. Application can trim the TC if required by overwriting the IRCTRIM register). Other features of the S12CPMU_UHV_V8 include • Autonomous periodical interrupt (API) • Bus Clock Generator — Clock switch to select either PLLCLK or external crystal/resonator based Bus Clock — PLLCLK divider to adjust system speed • System Reset generation from the following possible sources: — Power-on reset (POR) — Low-voltage reset (LVR) — Illegal address access — COP time-out — Loss of PLL clock (PLL clock monitor fail) — Loss of oscillation (Oscillator clock monitor fail) — External pin RESET MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 133 S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) 4.1.2 Modes of Operation This subsection lists and briefly describes all operating modes supported by the S12CPMU_UHV_V8. 4.1.2.1 Run Mode The voltage regulator is in Full Performance Mode (FPM). NOTE The voltage regulator is active, providing the nominal supply voltages with full current sourcing capability (see also Appendix for VREG electrical parameters). The features ACLK clock source, Low Voltage Interrupt (LVI), Low Voltage Reset (LVR) and Power-On Reset (POR) are available. The Phase Locked Loop (PLL) is on. The Internal Reference Clock (IRC1M) is on. The API is available. • • • PLL Engaged Internal (PEI) — This is the default mode after System Reset and Power-On Reset. — The Bus Clock is based on the PLLCLK. — After reset the PLL is configured for 50MHz VCOCLK operation Post divider is 0x03, so PLLCLK is VCOCLK divided by 4, that is 12.5MHz and Bus Clock is 6.25MHz. The PLL can be re-configured for other bus frequencies. — The reference clock for the PLL (REFCLK) is based on internal reference clock IRC1M PLL Engaged External (PEE) — The Bus Clock is based on the PLLCLK. — This mode can be entered from default mode PEI by performing the following steps: – Configure the PLL for desired bus frequency. – Program the reference divider (REFDIV[3:0] bits) to divide down oscillator frequency if necessary. – Enable the external oscillator (OSCE bit) – Wait for oscillator to start up (UPOSC=1) and PLL to lock (LOCK=1) PLL Bypassed External (PBE) — The Bus Clock is based on the Oscillator Clock (OSCCLK). — The PLLCLK is always on to qualify the external oscillator clock. Therefore it is necessary to make sure a valid PLL configuration is used for the selected oscillator frequency. — This mode can be entered from default mode PEI by performing the following steps: – Make sure the PLL configuration is valid for the selected oscillator frequency. MC9S12VR Family Reference Manual, Rev. 4.2 134 NXP Semiconductor S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) – Enable the external oscillator (OSCE bit) – Wait for oscillator to start up (UPOSC=1) – Select the Oscillator Clock (OSCCLK) as source of the Bus Clock (PLLSEL=0). — The PLLCLK is on and used to qualify the external oscillator clock. 4.1.2.2 Wait Mode For S12CPMU_UHV_V8 Wait Mode is the same as Run Mode. 4.1.2.3 Stop Mode This mode is entered by executing the CPU STOP instruction. The voltage regulator is in Reduced Performance Mode (RPM). NOTE The voltage regulator output voltage may degrade to a lower value than in Full Performance Mode (FPM), additionally the current sourcing capability is substantially reduced (see also Appendix for VREG electrical parameters). Only clock source ACLK is available and the Power On Reset (POR) circuitry is functional. The Low Voltage Interrupt (LVI) and Low Voltage Reset (LVR) are disabled. The API is available. The Phase Locked Loop (PLL) is off. The Internal Reference Clock (IRC1M) is off. Core Clock, Bus Clock and BDM Clock are stopped. Depending on the setting of the PSTP and the OSCE bit, Stop Mode can be differentiated between Full Stop Mode (PSTP = 0 or OSCE=0) and Pseudo Stop Mode (PSTP = 1 and OSCE=1). In addition, the behavior of the COP in each mode will change based on the clocking method selected by COPOSCSEL[1:0]. • Full Stop Mode (PSTP = 0 or OSCE=0) External oscillator (XOSCLCP) is disabled. — If COPOSCSEL1=0: The COP and RTI counters halt during Full Stop Mode. After wake-up from Full Stop Mode the Core Clock and Bus Clock are running on PLLCLK (PLLSEL=1). COP and RTI are running on IRCCLK (COPOSCSEL0=0, RTIOSCSEL=0). — If COPOSCSEL1=1: The clock for the COP is derived from ACLK (trimmable internal RC-Oscillator clock). During Full Stop Mode the ACLK for the COP can be stopped (COP static) or running (COP active) depending on the setting of bit CSAD. When bit CSAD is set the ACLK clock source for the COP is stopped during Full Stop Mode and COP continues to operate after exit from Full Stop MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 135 S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) • Mode. For this COP configuration (ACLK clock source, CSAD set) a latency time (please refer to CSAD bit description for details) occurs when entering or exiting (Full, Pseudo) Stop Mode. When bit CSAD is clear the ACLK clock source is on for the COP during Full Stop Mode and COP is operating. During Full Stop Mode the RTI counter halts. After wake-up from Full Stop Mode the Core Clock and Bus Clock are running on PLLCLK (PLLSEL=1). The COP runs on ACLK and RTI is running on IRCCLK (COPOSCSEL0=0, RTIOSCSEL=0). Pseudo Stop Mode (PSTP = 1 and OSCE=1) External oscillator (XOSCLCP) continues to run. — If COPOSCSEL1=0: If the respective enable bits are set (PCE=1 and PRE=1) the COP and RTI will continue to run with a clock derived from the oscillator clock. The clock configuration bits PLLSEL, COPOSCSEL0, RTIOSCSEL are unchanged. — If COPOSCSEL1=1: If the respective enable bit for the RTI is set (PRE=1) the RTI will continue to run with a clock derived from the oscillator clock. The clock for the COP is derived from ACLK (trimmable internal RC-Oscillator clock). During Pseudo Stop Mode the ACLK for the COP can be stopped (COP static) or running (COP active) depending on the setting of bit CSAD. When bit CSAD is set the ACLK for the COP is stopped during Pseudo Stop Mode and COP continues to operate after exit from Pseudo Stop Mode. For this COP configuration (ACLK clock source, CSAD set) a latency time (please refer to CSAD bit description for details) occurs when entering or exiting (Pseudo, Full) Stop Mode. When bit CSAD is clear the ACLK clock source is on for the COP during Pseudo Stop Mode and COP is operating. The clock configuration bits PLLSEL, COPOSCSEL0, RTIOSCSEL are unchanged. NOTE When starting up the external oscillator (either by programming OSCE bit to 1 or on exit from Full Stop Mode with OSCE bit already 1) the software must wait for a minimum time equivalent to the startup-time of the external oscillator tUPOSC before entering Pseudo Stop Mode. 4.1.2.4 Freeze Mode (BDM active) For S12CPMU_UHV_V8 Freeze Mode is the same as Run Mode except for RTI and COP which can be frozen in Active BDM Mode with the RSBCK bit in the CPMUCOP register. After exiting BDM Mode RTI and COP will resume its operations starting from this frozen status. Additionally the COP can be forced to the maximum time-out period in Active BDM Mode. For details please see also the RSBCK and CR[2:0] bit description field of Table 4-13 in Section 4.3.2.9, “S12CPMU_UHV_V8 COP Control Register (CPMUCOP) MC9S12VR Family Reference Manual, Rev. 4.2 136 NXP Semiconductor S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) 4.1.3 S12CPMU_UHV_V8 Block Diagram VSUP Illegal Address Access vsup monitor VDD, VDDF (core supplies) Low Voltage Detect VDDA Low Voltage Detect VDDX ADC VDDA VSSA VDDX VSSX VSS Voltage Regulator 6V to 18V Power-On Detect (VREGAUTO) MMC ILAF LVIE Low Voltage Interrupt LVDS LVRF S12CPMU_UHV COP time-out PORF PMRF OSC monitor fail PLL monitor fail RESET OMRE Clock Monitor OSCCLK_LCP EXTAL Loop Controlled REFDIV[3:0] Pierce XTAL Oscillator (XOSCLCP) Reference 4MHz-20MHz Divider PSTP UPOSC IRCTRIM[9:0] ECLK2X (Core Clock) Post Divider 1,2,.32 divide by 4 OSCE Phase locked Loop with internal Filter (PLL) PLLCLK ECLK divide by 2 (Bus Clock) HTDS LOCKIE Bus Clock ACLK Divide by 2*(SYNDIV+1) CSAD divide by 2 COPOSCSEL1 IRCCLK SYNDIV[5:0] COPCLK COP Watchdog OSCCLK COPOSCSEL0 UPOSC=0 clears divide by 2 Autonomous API_EXTCLK Periodic Interrupt (API) APICLK APIE RTIE COP time-out to Reset Generator IRCCLK CPMUCOP PLL lock Interrupt ACLK RC Osc. RTICLK PCE HT Interrupt HTIE High Temperature Sense VCOFRQ[1:0] UPOSC BDM Clock divide by 8 VCOCLK REFFRQ[1:0] LOCK PLLSEL POSTDIV[4:0] Internal Reference Clock (IRC1M) REFCLK FBCLK Oscillator status Interrupt OSCIE UPOSC=0 sets PLLSEL bit OSCCLK OSCMOD Lock detect Power-On Reset System Reset Reset Generator OSCCLK RTIOSCSEL API Interrupt RTI Interrupt Real Time Interrupt (RTI) PRE CPMURTI Figure 4-1. Block diagram of S12CPMU_UHV_V8 MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 137 S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) Figure 4-2 shows a block diagram of the XOSCLCP. OSCCLK_LCP OSC monitor fail Clock Monitor Peak Detector Gain Control VDD = 1.8 V VSS Rf Quartz Crystals EXTAL or Ceramic Resonators XTAL C1 C2 VSS VSS Figure 4-2. XOSCLCP Block Diagram MC9S12VR Family Reference Manual, Rev. 4.2 138 NXP Semiconductor S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) 4.2 Signal Description This section lists and describes the signals that connect off chip as well as internal supply nodes and special signals. 4.2.1 RESET Pin RESET is an active-low bidirectional pin. As an input it initializes the MCU asynchronously to a known start-up state. As an open-drain output it indicates that an MCU-internal reset has been triggered. 4.2.2 EXTAL and XTAL These pins provide the interface for a crystal to control the internal clock generator circuitry. EXTAL is the input to the crystal oscillator amplifier. XTAL is the output of the crystal oscillator amplifier. If XOSCLCP is enabled, the MCU internal OSCCLK_LCP is derived from the EXTAL input frequency. If OSCE=0, the EXTAL pin is pulled down by an internal resistor of approximately 200 k and the XTAL pin is pulled down by an internal resistor of approximately 700 k. NOTE NXP recommends an evaluation of the application board and chosen resonator or crystal by the resonator or crystal supplier. The loop controlled circuit (XOSCLCP) is not suited for overtone resonators and crystals. 4.2.3 VSUP — Regulator Power Input Pin Pin VSUP is the power input of VREGAUTO. All currents sourced into the regulator loads flow through this pin. An appropriate reverse battery protection network consisting of a diode and capacitors is recommended. 4.2.4 VDDA, VSSA — Regulator Reference Supply Pins Pins VDDA and VSSA,are used to supply the analog parts of the regulator. Internal precision reference circuits are supplied from these signals. A local decoupling capacitor between VDDA and VSSA according to the electrical specification is required. Additionally a bigger tank capacitor is required on the 5 Volt supply network as well to ensure Voltage regulator stability. VDDA has to be connected externally to VDDX. 4.2.5 VDDX, VSSX— Pad Supply Pins This supply domain is monitored by the Low Voltage Reset circuit. A local decoupling capacitor between VDDX and VSSX according to the electrical specification is required. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 139 S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) VDDX has to be connected externally to VDDA. 4.2.6 VSS— Ground Pin VSS is the ground pin for the core logic. On the board VSSX, VSSA and VSS need to be connected together to the application ground. 4.2.7 API_EXTCLK — API external clock output pin This pin provides the signal selected via APIES and is enabled with APIEA bit. See the device specification if this clock output is available on this device and to which pin it might be connects. 4.2.8 VDD— Internal Regulator Output Supply (Core Logic) Node VDD is a device internal supply output of the voltage regulator that provides the power supply for the core logic. This supply domain is monitored by the Low Voltage Reset circuit. 4.2.9 VDDF— Internal Regulator Output Supply (NVM Logic) Node VDDF is a device internal supply output of the voltage regulator that provides the power supply for the NVM logic. This supply domain is monitored by the Low Voltage Reset circuit. 4.2.10 TEMPSENSE — Internal Temperature Sensor Output Voltage Depending on the VSEL setting either the voltage level generated by the temperature sensor or the VREG bandgap voltage is driven to a special channel input of the ADC Converter. See device level specification for connectivity of ADC special channels. MC9S12VR Family Reference Manual, Rev. 4.2 140 NXP Semiconductor S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) 4.3 Memory Map and Registers This section provides a detailed description of all registers accessible in the S12CPMU_UHV_V8. 4.3.1 Module Memory Map The S12CPMU_UHV_V8 registers are shown in Figure 4-3. Address Name Bit 7 0x0034 CPMU SYNR 0x0035 CPMU REFDIV W 0x0036 CPMU POSTDIV W 0x0037 CPMUFLG 0x0038 CPMUINT 0x0039 CPMUCLKS 0x003A CPMUPLL 0x003B CPMURTI 0x003C CPMUCOP 0x003D RESERVED CPMUTEST0 W 0x003E RESERVED CPMUTEST1 W 0x003F CPMU ARMCOP 0x02F0 CPMU HTCTL W 0x02F1 CPMU LVCTL W 0x02F2 CPMU APICTL W R W R R 6 5 4 VCOFRQ[1:0] REFFRQ[1:0] 0 0 0 0 RTIF PORF LVRF 0 0 PLLSEL PSTP CSAD COP OSCSEL1 0 0 FM1 FM0 RTDEC RTR6 RTR5 WCOP RSBCK 0 0 0 0 R W R 1 Bit 0 REFDIV[3:0] POSTDIV[4:0] LOCKIF ILAF 0 0 PRE OSCIF UPOSC PMRF PCE RTI OSCSEL COP OSCSEL0 0 0 0 0 RTR4 RTR3 RTR2 RTR1 RTR0 0 0 CR2 CR1 CR0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 W Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 Bit 0 R 0 0 HTIE HTIF 0 0 0 LVIE LVIF 0 0 APIE APIF R W R W R W R W R R R R APICLK LOCKIE LOCK OSCIE W RTIE 2 SYNDIV[5:0] 0 R 3 WRTMASK 0 VSEL HTE HTDS 0 0 LVDS APIES APIEA APIFE = Unimplemented or Reserved Figure 4-3. CPMU Register Summary1 MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 141 S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) Address Name 0x02F3 CPMUACLKTR R W R 0x02F4 CPMUAPIRH 0x02F5 CPMUAPIRL 0x02F6 RESERVED CPMUTEST3 0x02F7 CPMUHTTR 0x02F8 CPMU IRCTRIMH W 0x02F9 CPMU IRCTRIML W 0x02FA CPMUOSC 0x02FB CPMUPROT 0x02FC RESERVED CPMUTEST2 0x02FD RESERVED 0x02FE CPMUOSC2 W R W R Bit 7 6 5 4 3 ACLKTR5 ACLKTR4 ACLKTR3 APIR15 APIR14 APIR13 APIR12 APIR11 APIR7 APIR6 APIR5 APIR4 0 0 0 0 0 0 0 2 1 Bit 0 0 0 APIR10 APIR9 APIR8 APIR3 APIR2 APIR1 APIR0 0 0 0 0 HTTR3 HTTR2 HTTR1 HTTR0 ACLKTR2 ACLKTR1 ACLKTR0 W R W HTOE R R R W R 0 TCTRIM[4:0] IRCTRIM[9:8] IRCTRIM[7:0] 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 OMRE OSCMOD OSCE W R 0 PROT W R W R W = Unimplemented or Reserved Figure 4-3. CPMU Register Summary1 1 Registers in bold underlined are only available on S12VR32/16. On S12VR64/48 these locations read 0 and write is not implemented. MC9S12VR Family Reference Manual, Rev. 4.2 142 NXP Semiconductor S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) 4.3.2 Register Descriptions This section describes all the S12CPMU_UHV_V8 registers and their individual bits. Address order is as listed in Figure 4-3 4.3.2.1 S12CPMU_UHV_V8 Synthesizer Register (CPMUSYNR) The CPMUSYNR register controls the multiplication factor of the PLL and selects the VCO frequency range. 0x0034 7 R W Reset 6 5 4 3 VCOFRQ[1:0] 0 2 1 0 0 0 0 SYNDIV[5:0] 1 0 1 1 Figure 4-4. S12CPMU_UHV_V8 Synthesizer Register (CPMUSYNR) Read: Anytime Write: If PROT=0 (CPMUPROT register) and PLLSEL=1 (CPMUCLKS register), then write anytime. Else write has no effect. NOTE Writing to this register clears the LOCK and UPOSC status bits. If PLL has locked (LOCK=1) f VCO = 2 f REF SYNDIV + 1 NOTE fVCO must be within the specified VCO frequency lock range. Bus frequency fbus must not exceed the specified maximum. The VCOFRQ[1:0] bits are used to configure the VCO gain for optimal stability and lock time. For correct PLL operation the VCOFRQ[1:0] bits have to be selected according to the actual target VCOCLK frequency as shown in Table 4-2. Setting the VCOFRQ[1:0] bits incorrectly can result in a non functional PLL (no locking and/or insufficient stability). Table 4-2. VCO Clock Frequency Selection VCOCLK Frequency Ranges VCOFRQ[1:0] 32MHz <= fVCO<= 48MHz 00 48MHz < fVCO<= 50MHz 01 Reserved 10 Reserved 11 MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 143 S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) 4.3.2.2 S12CPMU_UHV_V8 Reference Divider Register (CPMUREFDIV) The CPMUREFDIV register provides a finer granularity for the PLL multiplier steps when using the external oscillator as reference. 0x0035 7 R REFFRQ[1:0] W Reset 6 0 0 5 4 0 0 0 0 3 2 1 0 1 1 REFDIV[3:0] 1 1 Figure 4-5. S12CPMU_UHV_V8 Reference Divider Register (CPMUREFDIV) Read: Anytime Write: If PROT=0 (CPMUPROT register) and PLLSEL=1 (CPMUCLKS register), then write anytime. Else write has no effect. NOTE Write to this register clears the LOCK and UPOSC status bits. If XOSCLCP is enabled (OSCE=1) f OSC f REF = ------------------------------------ REFDIV + 1 If XOSCLCP is disabled (OSCE=0) f REF = f IRC1M The REFFRQ[1:0] bits are used to configure the internal PLL filter for optimal stability and lock time. For correct PLL operation the REFFRQ[1:0] bits have to be selected according to the actual REFCLK frequency as shown in Table 4-3. If IRC1M is selected as REFCLK (OSCE=0) the PLL filter is fixed configured for the 1MHz <= fREF <= 2MHz range. The bits can still be written but will have no effect on the PLL filter configuration. For OSCE=1, setting the REFFRQ[1:0] bits incorrectly can result in a non functional PLL (no locking and/or insufficient stability). Table 4-3. Reference Clock Frequency Selection if OSC_LCP is enabled REFCLK Frequency Ranges (OSCE=1) REFFRQ[1:0] 1MHz <= fREF <= 2MHz 00 2MHz < fREF <= 6MHz 01 6MHz < fREF <= 12MHz 10 fREF >12MHz 11 MC9S12VR Family Reference Manual, Rev. 4.2 144 NXP Semiconductor S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) 4.3.2.3 S12CPMU_UHV_V8 Post Divider Register (CPMUPOSTDIV) The POSTDIV register controls the frequency ratio between the VCOCLK and the PLLCLK. 0x0036 R 7 6 5 0 0 0 0 0 0 4 3 1 0 1 1 2 1 0 ILAF OSCIF Note 3 0 POSTDIV[4:0] W Reset 2 0 0 0 = Unimplemented or Reserved Figure 4-6. S12CPMU_UHV_V8 Post Divider Register (CPMUPOSTDIV) Read: Anytime Write: If PLLSEL=1 write anytime, else write has no effect If PLL is locked (LOCK=1) f VCO f PLL = ---------------------------------------- POSTDIV + 1 If PLL is not locked (LOCK=0) f VCO f PLL = --------------4 If PLL is selected (PLLSEL=1) f PLL f bus = ------------2 4.3.2.4 S12CPMU_UHV_V8 Flags Register (CPMUFLG) This register provides S12CPMU_UHV_V8 status bits and flags. 0x0037 R W Reset 7 6 5 4 RTIF PORF LVRF LOCKIF 0 Note 1 Note 2 0 3 LOCK 0 UPOSC 0 1. PORF is set to 1 when a power on reset occurs. Unaffected by System Reset. 2. LVRF is set to 1 when a low voltage reset occurs. Unaffected by System Reset. Set by power on reset. 3. ILAF is set to 1 when an illegal address reset occurs. Unaffected by System Reset. Cleared by power on reset. = Unimplemented or Reserved Figure 4-7. S12CPMU_UHV_V8 Flags Register (CPMUFLG) Read: Anytime Write: Refer to each bit for individual write conditions MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 145 S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) Table 4-4. CPMUFLG Field Descriptions Field Description 7 RTIF Real Time Interrupt Flag — RTIF is set to 1 at the end of the RTI period. This flag can only be cleared by writing a 1. Writing a 0 has no effect. If enabled (RTIE=1), RTIF causes an interrupt request. 0 RTI time-out has not yet occurred. 1 RTI time-out has occurred. 6 PORF Power on Reset Flag — PORF is set to 1 when a power on reset occurs. This flag can only be cleared by writing a 1. Writing a 0 has no effect. 0 Power on reset has not occurred. 1 Power on reset has occurred. 5 LVRF Low Voltage Reset Flag — LVRF is set to 1 when a low voltage reset occurs. This flag can only be cleared by writing a 1. Writing a 0 has no effect. 0 Low voltage reset has not occurred. 1 Low voltage reset has occurred. 4 LOCKIF PLL Lock Interrupt Flag — LOCKIF is set to 1 when LOCK status bit changes. This flag can only be cleared by writing a 1. Writing a 0 has no effect.If enabled (LOCKIE=1), LOCKIF causes an interrupt request. 0 No change in LOCK bit. 1 LOCK bit has changed. 3 LOCK Lock Status Bit — LOCK reflects the current state of PLL lock condition. Writes have no effect.While PLL is unlocked (LOCK=0) fPLL is fVCO / 4 to protect the system from high core clock frequencies during the PLL stabilization time tlock. 0 VCOCLK is not within the desired tolerance of the target frequency. fPLL = fVCO/4. 1 VCOCLK is within the desired tolerance of the target frequency. fPLL = fVCO/(POSTDIV+1). 2 ILAF Illegal Address Reset Flag — ILAF is set to 1 when an illegal address reset occurs.Refer to MMC chapter for details.This flag can only be cleared by writing a 1. Writing a 0 has no effect. 0 Illegal address reset has not occurred. 1 Illegal address reset has occurred. 1 OSCIF Oscillator Interrupt Flag — OSCIF is set to 1 when UPOSC status bit changes. This flag can only be cleared by writing a 1. Writing a 0 has no effect.If enabled (OSCIE=1), OSCIF causes an interrupt request. 0 No change in UPOSC bit. 1 UPOSC bit has changed. 0 UPOSC Oscillator Status Bit — UPOSC reflects the status of the oscillator. Writes have no effect. Entering Full Stop Mode UPOSC is cleared. 0 The oscillator is off or oscillation is not qualified by the PLL. 1 The oscillator is qualified by the PLL. MC9S12VR Family Reference Manual, Rev. 4.2 146 NXP Semiconductor S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) 4.3.2.5 S12CPMU_UHV_V8 Interrupt Enable Register (CPMUINT) This register enables S12CPMU_UHV_V8 interrupt requests. 0x0038 7 R W Reset RTIE 0 6 5 0 0 0 0 4 LOCKIE 0 3 2 0 0 0 0 1 0 OSCIE PMRF1 0 Note 22 1. PMRF is set to 1 when a PLL clock monitor reset occurs. Unaffected by System Reset. Cleared by power on reset. = Unimplemented or Reserved Figure 4-8. S12CPMU_UHV_V8 Interrupt Enable Register (CPMUINT) 1 PLL clock monitor reset flag PMRF is available only on S12VR32/16. On S12VR64/48 this bit reads 0 and write is not implemented. 2 PMRF is set to 1 when a PLL clock monitor reset occurs. Unaffected by system reset. Cleared by power on reset. Read: Anytime Write: Anytime Table 4-5. CPMUINT Field Descriptions Field 7 RTIE 4 LOCKIE Description Real Time Interrupt Enable Bit 0 Interrupt requests from RTI are disabled. 1 Interrupt will be requested whenever RTIF is set. PLL Lock Interrupt Enable Bit 0 PLL LOCK interrupt requests are disabled. 1 Interrupt will be requested whenever LOCKIF is set. 1 OSCIE Oscillator Corrupt Interrupt Enable Bit 0 Oscillator Corrupt interrupt requests are disabled. 1 Interrupt will be requested whenever OSCIF is set. 0 PMRF PLL Clock Monitor Reset Flag — PMRF is set to 1 when a loss of PLL clock occurs. This flag can only be cleared by writing a 1. Writing a 0 has no effect. 0 Loss of PLL clock reset has not occurred. 1 Loss of PLL clock reset has occurred. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 147 S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) 4.3.2.6 S12CPMU_UHV_V8 Clock Select Register (CPMUCLKS) This register controls S12CPMU_UHV_V8 clock selection. 0x0039 R W Reset 7 6 5 4 3 2 1 0 PLLSEL PSTP CSAD COP OSCSEL1 PRE PCE RTI OSCSEL COP OSCSEL0 1 0 0 0 0 0 0 0 = Unimplemented or Reserved Figure 4-9. S12CPMU_UHV_V8 Clock Select Register (CPMUCLKS) Read: Anytime Write: 5. 6. 7. 8. 9. Only possible if PROT=0 (CPMUPROT register) in all MCU Modes (Normal and Special Mode). All bits in Special Mode (if PROT=0). PLLSEL, PSTP, PRE, PCE, RTIOSCSEL: In Normal Mode (if PROT=0). CSAD: In Normal Mode (if PROT=0) until CPMUCOP write once has taken place. COPOSCSEL0: In Normal Mode (if PROT=0) until CPMUCOP write once has taken place. If COPOSCSEL0 was cleared by UPOSC=0 (entering Full Stop Mode with COPOSCSEL0=1 or insufficient OSCCLK quality), then COPOSCSEL0 can be set once again. 10. COPOSCSEL1: In Normal Mode (if PROT=0) until CPMUCOP write once has taken place. COPOSCSEL1 will not be cleared by UPOSC=0 (entering Full Stop Mode with COPOSCSEL1=1 or insufficient OSCCLK quality if OSCCLK is used as clock source for other clock domains: for instance core clock etc.). NOTE After writing CPMUCLKS register, it is strongly recommended to read back CPMUCLKS register to make sure that write of PLLSEL, RTIOSCSEL and COPOSCSEL was successful. NOTE When using the external oscillator (OSCE=1) as system clock (write PLLSEL = 0) it is highly recommended to enable the oscillator clock monitor reset feature (write OMRE = 1 in CPMUOSC2 register). If the oscillator monitor reset feature is disabled (OMRE = 0) and the external oscillator clock is used as system clock, the system might stall in case of loss of oscillation. MC9S12VR Family Reference Manual, Rev. 4.2 148 NXP Semiconductor S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) Table 4-6. CPMUCLKS Descriptions Field 7 PLLSEL Description PLL Select Bit This bit selects the PLLCLK as source of the System Clocks (Core Clock and Bus Clock). PLLSEL can only be set to 0, if UPOSC=1. UPOSC= 0 sets the PLLSEL bit. Entering Full Stop Mode sets the PLLSEL bit. 0 System clocks are derived from OSCCLK if oscillator is up (UPOSC=1, fbus = fosc / 2). 1 System clocks are derived from PLLCLK, fbus = fPLL / 2. 6 PSTP Pseudo Stop Bit This bit controls the functionality of the oscillator during Stop Mode. 0 Oscillator is disabled in Stop Mode (Full Stop Mode). 1 Oscillator continues to run in Stop Mode (Pseudo Stop Mode), option to run RTI and COP. Note: Pseudo Stop Mode allows for faster STOP recovery and reduces the mechanical stress and aging of the resonator in case of frequent STOP conditions at the expense of a slightly increased power consumption. Note: When starting up the external oscillator (either by programming OSCE bit to 1 or on exit from Full Stop Mode with OSCE bit already 1) the software must wait for a minimum time equivalent to the startup-time of the external oscillator tUPOSC before entering Pseudo Stop Mode. 5 CSAD COP in Stop Mode ACLK Disable — If this bit is set the ACLK for the COP in Stop Mode is disabled. Hence the COP is static while in Stop Mode and continues to operate after exit from Stop Mode. For CSAD = 1 and COP is running on ACLK (COPOSCSEL1 = 1) the following applies: Due to clock domain crossing synchronization there is a latency time of 2 ACLK cycles to enter Stop Mode. After exit from STOP mode (when interrupt service routine is entered) the software has to wait for 2 ACLK cycles before it is allowed to enter Stop mode again (STOP instruction). It is absolutely forbidden to enter Stop Mode before this time of 2 ACLK cycles has elapsed. 0 COP running in Stop Mode (ACLK for COP enabled in Stop Mode). 1 COP stopped in Stop Mode (ACLK for COP disabled in Stop Mode) 4 COP OSCSEL1 COP Clock Select 1 — COPOSCSEL0 and COPOSCSEL1 combined determine the clock source to the COP (see also Table 4-7). If COPOSCSEL1 = 1, COPOSCSEL0 has no effect regarding clock select and changing the COPOSCSEL0 bit does not re-start the COP time-out period. COPOSCSEL1 selects the clock source to the COP to be either ACLK (derived from trimmable internal RC-Oscillator) or clock selected via COPOSCSEL0 (IRCCLK or OSCCLK). Changing the COPOSCSEL1 bit re-starts the COP time-out period. COPOSCSEL1 can be set independent from value of UPOSC. UPOSC= 0 does not clear the COPOSCSEL1 bit. 0 COP clock source defined by COPOSCSEL0 1 COP clock source is ACLK derived from a trimmable internal RC-Oscillator 3 PRE RTI Enable During Pseudo Stop Bit — PRE enables the RTI during Pseudo Stop Mode. 0 RTI stops running during Pseudo Stop Mode. 1 RTI continues running during Pseudo Stop Mode if RTIOSCSEL=1. Note: If PRE=0 or RTIOSCSEL=0 then the RTI will go static while Stop Mode is active. The RTI counter will not be reset. 2 PCE COP Enable During Pseudo Stop Bit — PCE enables the COP during Pseudo Stop Mode. 0 COP stops running during Pseudo Stop Mode 1 COP continues running during Pseudo Stop Mode if COPOSCSEL=1 Note: If PCE=0 or COPOSCSEL=0 then the COP will go static while Stop Mode is active. The COP counter will not be reset. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 149 S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) Table 4-6. CPMUCLKS Descriptions (continued) Field Description 1 RTI Clock Select— RTIOSCSEL selects the clock source to the RTI. Either IRCCLK or OSCCLK. Changing the RTIOSCSEL RTIOSCSEL bit re-starts the RTI time-out period. RTIOSCSEL can only be set to 1, if UPOSC=1. UPOSC= 0 clears the RTIOSCSEL bit. 0 RTI clock source is IRCCLK. 1 RTI clock source is OSCCLK. 0 COP OSCSEL0 COP Clock Select 0 — COPOSCSEL0 and COPOSCSEL1 combined determine the clock source to the COP (see also Table 4-7) If COPOSCSEL1 = 1, COPOSCSEL0 has no effect regarding clock select and changing the COPOSCSEL0 bit does not re-start the COP time-out period. When COPOSCSEL1=0,COPOSCSEL0 selects the clock source to the COP to be either IRCCLK or OSCCLK. Changing the COPOSCSEL0 bit re-starts the COP time-out period. COPOSCSEL0 can only be set to 1, if UPOSC=1. UPOSC= 0 clears the COPOSCSEL0 bit. 0 COP clock source is IRCCLK. 1 COP clock source is OSCCLK Table 4-7. COPOSCSEL1, COPOSCSEL0 clock source select description COPOSCSEL1 COPOSCSEL0 COP clock source 0 0 IRCCLK 0 1 OSCCLK 1 x ACLK MC9S12VR Family Reference Manual, Rev. 4.2 150 NXP Semiconductor S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) 4.3.2.7 S12CPMU_UHV_V8 PLL Control Register (CPMUPLL) This register controls the PLL functionality. 0x003A R 7 6 0 0 0 0 W Reset 5 4 FM1 FM0 0 0 3 2 1 0 0 0 0 0 0 0 0 0 Figure 4-10. S12CPMU_UHV_V8 PLL Control Register (CPMUPLL) Read: Anytime Write: Anytime if PROT=0 (CPMUPROT register) and PLLSEL=1 (CPMUCLKS register). Else write has no effect. NOTE Write to this register clears the LOCK and UPOSC status bits. NOTE Care should be taken to ensure that the bus frequency does not exceed the specified maximum when frequency modulation is enabled. Table 4-8. CPMUPLL Field Descriptions Field 5, 4 FM1, FM0 Description PLL Frequency Modulation Enable Bits — FM1 and FM0 enable frequency modulation on the VCOCLK. This is to reduce noise emission. The modulation frequency is fref divided by 16. See Table 4-9 for coding. Table 4-9. FM Amplitude selection FM1 FM0 FM Amplitude / fVCO Variation 0 0 FM off 0 1 1% 1 0 2% 1 1 4% MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 151 S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) 4.3.2.8 S12CPMU_UHV_V8 RTI Control Register (CPMURTI) This register selects the time-out period for the Real Time Interrupt. The clock source for the RTI is either IRCCLK or OSCCLK depending on the setting of the RTIOSCSEL bit. In Stop Mode with PSTP=1 (Pseudo Stop Mode) and RTIOSCSEL=1 the RTI continues to run, else the RTI counter halts in Stop Mode. 0x003B R W Reset 7 6 5 4 3 2 1 0 RTDEC RTR6 RTR5 RTR4 RTR3 RTR2 RTR1 RTR0 0 0 0 0 0 0 0 0 Figure 4-11. S12CPMU_UHV_V8 RTI Control Register (CPMURTI) Read: Anytime Write: Anytime NOTE A write to this register starts the RTI time-out period. A change of the RTIOSCSEL bit (writing a different value or loosing UPOSC status) re-starts the RTI time-out period. Table 4-10. CPMURTI Field Descriptions Field 7 RTDEC Description Decimal or Binary Divider Select Bit — RTDEC selects decimal or binary based prescaler values. 0 Binary based divider value. See Table 4-11 1 Decimal based divider value. See Table 4-12 6–4 RTR[6:4] Real Time Interrupt Prescale Rate Select Bits — These bits select the prescale rate for the RTI.See Table 4-11 and Table 4-12. 3–0 RTR[3:0] Real Time Interrupt Modulus Counter Select Bits — These bits select the modulus counter target value to provide additional granularity.Table 4-11 and Table 4-12 show all possible divide values selectable by the CPMURTI register. MC9S12VR Family Reference Manual, Rev. 4.2 152 NXP Semiconductor S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) Table 4-11. RTI Frequency Divide Rates for RTDEC = 0 RTR[6:4] = RTR[3:0] 1 000 (OFF) 001 (210) 010 (211) 011 (212) 100 (213) 101 (214) 110 (215) 111 (216) 0000 (1) OFF1 210 211 212 213 214 215 216 0001 (2) OFF 2x210 2x211 2x212 2x213 2x214 2x215 2x216 0010 (3) OFF 3x210 3x211 3x212 3x213 3x214 3x215 3x216 0011 (4) OFF 4x210 4x211 4x212 4x213 4x214 4x215 4x216 0100 (5) OFF 5x210 5x211 5x212 5x213 5x214 5x215 5x216 0101 (6) OFF 6x210 6x211 6x212 6x213 6x214 6x215 6x216 0110 (7) OFF 7x210 7x211 7x212 7x213 7x214 7x215 7x216 0111 (8) OFF 8x210 8x211 8x212 8x213 8x214 8x215 8x216 1000 (9) OFF 9x210 9x211 9x212 9x213 9x214 9x215 9x216 1001 (10) OFF 10x210 10x211 10x212 10x213 10x214 10x215 10x216 1010 (11) OFF 11x210 11x211 11x212 11x213 11x214 11x215 11x216 1011 (12) OFF 12x210 12x211 12x212 12x213 12x214 12x215 12x216 1100 (13) OFF 13x210 13x211 13x212 13x213 13x214 13x215 13x216 1101 (14) OFF 14x210 14x211 14x212 14x213 14x214 14x215 14x216 1110 (15) OFF 15x210 15x211 15x212 15x213 15x214 15x215 15x216 1111 (16) OFF 16x210 16x211 16x212 16x213 16x214 16x215 16x216 Denotes the default value out of reset.This value should be used to disable the RTI to ensure future backwards compatibility. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 153 S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) Table 4-12. RTI Frequency Divide Rates for RTDEC=1 RTR[6:4] = RTR[3:0] 000 (1x103) 001 (2x103) 010 (5x103) 011 (10x103) 100 (20x103) 101 (50x103) 110 (100x103) 111 (200x103) 0000 (1) 1x103 2x103 5x103 10x103 20x103 50x103 100x103 200x103 0001 (2) 2x103 4x103 10x103 20x103 40x103 100x103 200x103 400x103 0010 (3) 3x103 6x103 15x103 30x103 60x103 150x103 300x103 600x103 0011 (4) 4x103 8x103 20x103 40x103 80x103 200x103 400x103 800x103 0100 (5) 5x103 10x103 25x103 50x103 100x103 250x103 500x103 1x106 0101 (6) 6x103 12x103 30x103 60x103 120x103 300x103 600x103 1.2x106 0110 (7) 7x103 14x103 35x103 70x103 140x103 350x103 700x103 1.4x106 0111 (8) 8x103 16x103 40x103 80x103 160x103 400x103 800x103 1.6x106 1000 (9) 9x103 18x103 45x103 90x103 180x103 450x103 900x103 1.8x106 1001 (10) 10 x103 20x103 50x103 100x103 200x103 500x103 1x106 2x106 1010 (11) 11 x103 22x103 55x103 110x103 220x103 550x103 1.1x106 2.2x106 1011 (12) 12x103 24x103 60x103 120x103 240x103 600x103 1.2x106 2.4x106 1100 (13) 13x103 26x103 65x103 130x103 260x103 650x103 1.3x106 2.6x106 1101 (14) 14x103 28x103 70x103 140x103 280x103 700x103 1.4x106 2.8x106 1110 (15) 15x103 30x103 75x103 150x103 300x103 750x103 1.5x106 3x106 1111 (16) 16x103 32x103 80x103 160x103 320x103 800x103 1.6x106 3.2x106 MC9S12VR Family Reference Manual, Rev. 4.2 154 NXP Semiconductor S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) 4.3.2.9 S12CPMU_UHV_V8 COP Control Register (CPMUCOP) This register controls the COP (Computer Operating Properly) watchdog. The clock source for the COP is either ACLK, IRCCLK or OSCCLK depending on the setting of the COPOSCSEL0 and COPOSCSEL1 bit (see also Table 4-7). In Stop Mode with PSTP=1 (Pseudo Stop Mode), COPOSCSEL0=1 and COPOSCEL1=0 and PCE=1 the COP continues to run, else the COP counter halts in Stop Mode with COPOSCSEL1 =0. In Full Stop Mode and Pseudo Stop Mode with COPOSCSEL1=1 the COP continues to run. 0x003C R W Reset 7 6 WCOP RSBCK F 0 5 4 3 0 0 0 0 0 WRTMASK 0 2 1 0 CR2 CR1 CR0 F F F After de-assert of System Reset the values are automatically loaded from the Flash memory. See Device specification for details. = Unimplemented or Reserved Figure 4-12. S12CPMU_UHV_V8 COP Control Register (CPMUCOP) Read: Anytime Write: 1. RSBCK: Anytime in Special Mode; write to “1” but not to “0” in Normal Mode 2. WCOP, CR2, CR1, CR0: — Anytime in Special Mode, when WRTMASK is 0, otherwise it has no effect — Write once in Normal Mode, when WRTMASK is 0, otherwise it has no effect. – Writing CR[2:0] to “000” has no effect, but counts for the “write once” condition. – Writing WCOP to “0” has no effect, but counts for the “write once” condition. When a non-zero value is loaded from Flash to CR[2:0] the COP time-out period is started. A change of the COPOSCSEL0 or COPOSCSEL1 bit (writing a different value) or loosing UPOSC status while COPOSCSEL1 is clear and COPOSCSEL0 is set, re-starts the COP time-out period. In Normal Mode the COP time-out period is restarted if either of these conditions is true: 1. Writing a non-zero value to CR[2:0] (anytime in special mode, once in normal mode) with WRTMASK = 0. 2. Writing WCOP bit (anytime in Special Mode, once in Normal Mode) with WRTMASK = 0. 3. Changing RSBCK bit from “0” to “1”. In Special Mode, any write access to CPMUCOP register restarts the COP time-out period. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 155 S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) Table 4-13. CPMUCOP Field Descriptions Field Description 7 WCOP Window COP Mode Bit — When set, a write to the CPMUARMCOP register must occur in the last 25% of the selected period.A write during the first 75% of the selected period generates a COP reset.As long as all writes occur during this window, $55 can be written as often as desired.Once $AA is written after the $55, the time-out logic restarts and the user must wait until the next window before writing to CPMUARMCOP. Table 4-14 shows the duration of this window for the seven available COP rates. 0 Normal COP operation 1 Window COP operation 6 RSBCK COP and RTI Stop in Active BDM Mode Bit 0 Allows the COP and RTI to keep running in Active BDM mode. 1 Stops the COP and RTI counters whenever the part is in Active BDM mode. 5 WRTMASK Write Mask for WCOP and CR[2:0] Bit — This write-only bit serves as a mask for the WCOP and CR[2:0] bits while writing the CPMUCOP register. It is intended for BDM writing the RSBCK without changing the content of WCOP and CR[2:0]. 0 Write of WCOP and CR[2:0] has an effect with this write of CPMUCOP 1 Write of WCOP and CR[2:0] has no effect with this write of CPMUCOP. (Does not count for “write once”.) 2–0 CR[2:0] COP Watchdog Timer Rate Select — These bits select the COP time-out rate (see Table 4-14 and Table 4-15). Writing a nonzero value to CR[2:0] enables the COP counter and starts the time-out period.A COP counter time-out causes a System Reset.This can be avoided by periodically (before time-out) initializing the COP counter via the CPMUARMCOP register. While all of the following four conditions are true the CR[2:0], WCOP bits are ignored and the COP operates at highest time-out period (2 24 cycles) in normal COP mode (Window COP mode disabled): 1) COP is enabled (CR[2:0] is not 000) 2) BDM mode active 3) RSBCK = 0 4) Operation in Special Mode Table 4-14. COP Watchdog Rates if COPOSCSEL1=0. (default out of reset) CR2 CR1 CR0 COPCLK Cycles to time-out (COPCLK is either IRCCLK or OSCCLK depending on the COPOSCSEL0 bit) 0 0 0 COP disabled 0 0 1 2 14 0 1 0 2 16 0 1 1 2 18 1 0 0 2 20 1 0 1 2 22 1 1 0 2 23 1 1 1 2 24 MC9S12VR Family Reference Manual, Rev. 4.2 156 NXP Semiconductor S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) Table 4-15. COP Watchdog Rates if COPOSCSEL1=1. CR2 CR1 CR0 COPCLK Cycles to time-out (COPCLK is ACLK divided by 2) 0 0 0 COP disabled 0 0 1 27 0 1 0 29 0 1 1 2 11 1 0 0 2 13 1 0 1 2 15 1 1 0 2 16 1 1 1 2 17 MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 157 S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) 4.3.2.10 Reserved Register CPMUTEST0 NOTE This reserved register is designed for factory test purposes only, and is not intended for general user access. Writing to this register when in Special Mode can alter the S12CPMU_UHV_V8’s functionality. 0x003D R 7 6 5 4 3 2 1 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 W Reset = Unimplemented or Reserved Figure 4-13. Reserved Register (CPMUTEST0) Read: Anytime Write: Only in Special Mode 4.3.2.11 Reserved Register CPMUTEST1 NOTE This reserved register is designed for factory test purposes only, and is not intended for general user access. Writing to this register when in Special Mode can alter the S12CPMU_UHV_V8’s functionality. 0x003E R 7 6 5 4 3 2 1 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 W Reset = Unimplemented or Reserved Figure 4-14. Reserved Register (CPMUTEST1) Read: Anytime Write: Only in Special Mode MC9S12VR Family Reference Manual, Rev. 4.2 158 NXP Semiconductor S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) 4.3.2.12 S12CPMU_UHV_V8 COP Timer Arm/Reset Register (CPMUARMCOP) This register is used to restart the COP time-out period. 0x003F R 7 6 5 4 3 2 1 0 0 0 0 0 0 0 0 0 W ARMCOP-Bit ARMCOP-Bit ARMCOP-Bit ARMCOP-Bit ARMCOP-Bit ARMCOP-Bit ARMCOP-Bit ARMCOP-Bit 7 6 5 4 3 2 1 0 Reset 0 0 0 0 0 0 0 0 Figure 4-15. S12CPMU_UHV_V8 CPMUARMCOP Register Read: Always reads $00 Write: Anytime When the COP is disabled (CR[2:0] = “000”) writing to this register has no effect. When the COP is enabled by setting CR[2:0] nonzero, the following applies: Writing any value other than $55 or $AA causes a COP reset. To restart the COP time-out period write $55 followed by a write of $AA. These writes do not need to occur back-to-back, but the sequence ($55, $AA) must be completed prior to COP end of time-out period to avoid a COP reset. Sequences of $55 writes are allowed. When the WCOP bit is set, $55 and $AA writes must be done in the last 25% of the selected time-out period; writing any value in the first 75% of the selected period will cause a COP reset. 4.3.2.13 High Temperature Control Register (CPMUHTCTL) The CPMUHTCTL register configures the temperature sense features. 0x02F0 R 7 6 0 0 W Reset 0 0 5 VSEL 0 4 0 0 3 HTE 0 2 HTDS 0 1 0 HTIE HTIF 0 0 = Unimplemented or Reserved Figure 4-16. High Temperature Control Register (CPMUHTCTL) Read: Anytime Write: VSEL, HTE, HTIE and HTIF are write anytime, HTDS is read only MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 159 S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) Table 4-16. CPMUHTCTL Field Descriptions Field Description 5 VSEL Voltage Access Select Bit — If set, the bandgap reference voltage VBG can be accessed internally (i.e. multiplexed to an internal Analog to Digital Converter channel). If not set, the die temperature proportional voltage VHT of the temperature sensor can be accessed internally.See device level specification for connectivity. For any of these access the HTE bit must be set. 0 An internal temperature proportional voltage VHT can be accessed internally. 1 Bandgap reference voltage VBG can be accessed internally. 3 HTE High Temperature Sensor/Bandgap Voltage Enable Bit — This bit enables the high temperature sensor and bandgap voltage amplifier. 0 The temperature sensor and bandgap voltage amplifier is disabled. 1 The temperature sensor and bandgap voltage amplifier is enabled. 2 HTDS High Temperature Detect Status Bit — This read-only status bit reflects the temperature status.Writes have no effect. 0 Junction Temperature is below level THTID or RPM. 1 Junction Temperature is above level THTIA and FPM. 1 HTIE High Temperature Interrupt Enable Bit 0 Interrupt request is disabled. 1 Interrupt will be requested whenever HTIF is set. 0 HTIF High Temperature Interrupt Flag — HTIF — High Temperature Interrupt Flag HTIF is set to 1 when HTDS status bit changes.This flag can only be cleared by writing a 1. Writing a 0 has no effect. If enabled (HTIE=1), HTIF causes an interrupt request. 0 No change in HTDS bit. 1 HTDS bit has changed. NOTE The voltage at the temperature sensor can be computed as follows: VHT(temp) = VHT(150) - (150 - temp) * dVHT Figure 4-17. Voltage Access Select VBG Ref VSEL TEMPSENSE ADC Channel C HTD MC9S12VR Family Reference Manual, Rev. 4.2 160 NXP Semiconductor S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) 4.3.2.14 Low Voltage Control Register (CPMULVCTL) The CPMULVCTL register allows the configuration of the low-voltage detect features. 0x02F1 R 7 6 5 4 3 2 0 0 0 0 0 LVDS 0 0 0 0 0 U W Reset 1 0 LVIE LVIF 0 U The Reset state of LVDS and LVIF depends on the external supplied VDDA level = Unimplemented or Reserved Figure 4-18. Low Voltage Control Register (CPMULVCTL) Read: Anytime Write: LVIE and LVIF are write anytime, LVDS is read only Table 4-17. CPMULVCTL Field Descriptions Field Description 2 LVDS Low-Voltage Detect Status Bit — This read-only status bit reflects the voltage level on VDDA.Writes have no effect. 0 Input voltage VDDA is above level VLVID or RPM. 1 Input voltage VDDA is below level VLVIA and FPM. 1 LVIE Low-Voltage Interrupt Enable Bit 0 Interrupt request is disabled. 1 Interrupt will be requested whenever LVIF is set. 0 LVIF Low-Voltage Interrupt Flag — LVIF is set to 1 when LVDS status bit changes. This flag can only be cleared by writing a 1.Writing a 0 has no effect. If enabled (LVIE = 1), LVIF causes an interrupt request. 0 No change in LVDS bit. 1 LVDS bit has changed. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 161 S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) 4.3.2.15 Autonomous Periodical Interrupt Control Register (CPMUAPICTL) The CPMUAPICTL register allows the configuration of the autonomous periodical interrupt features. 0x02F2 7 R W Reset APICLK 0 6 5 0 0 0 0 4 3 2 1 0 APIES APIEA APIFE APIE APIF 0 0 0 0 0 = Unimplemented or Reserved Figure 4-19. Autonomous Periodical Interrupt Control Register (CPMUAPICTL) Read: Anytime Write: Anytime Table 4-18. CPMUAPICTL Field Descriptions Field Description 7 APICLK Autonomous Periodical Interrupt Clock Select Bit — Selects the clock source for the API. Writable only if APIFE = 0. APICLK cannot be changed if APIFE is set by the same write operation. 0 Autonomous Clock (ACLK) used as source. 1 Bus Clock used as source. 4 APIES Autonomous Periodical Interrupt External Select Bit — Selects the waveform at the external pin API_EXTCLK as shown in Figure 4-20. See device level specification for connectivity of API_EXTCLK pin. 0 If APIEA and APIFE are set, at the external pin API_EXTCLK periodic high pulses are visible at the end of every selected period with the size of half of the minimum period (APIR=0x0000 in Table 4-22). 1 If APIEA and APIFE are set, at the external pin API_EXTCLK a clock is visible with 2 times the selected API Period. 3 APIEA Autonomous Periodical Interrupt External Access Enable Bit — If set, the waveform selected by bit APIES can be accessed externally. See device level specification for connectivity. 0 Waveform selected by APIES can not be accessed externally. 1 Waveform selected by APIES can be accessed externally, if APIFE is set. 2 APIFE Autonomous Periodical Interrupt Feature Enable Bit — Enables the API feature and starts the API timer when set. 0 Autonomous periodical interrupt is disabled. 1 Autonomous periodical interrupt is enabled and timer starts running. 1 APIE Autonomous Periodical Interrupt Enable Bit 0 API interrupt request is disabled. 1 API interrupt will be requested whenever APIF is set. 0 APIF Autonomous Periodical Interrupt Flag — APIF is set to 1 when the in the API configured time has elapsed. This flag can only be cleared by writing a 1.Writing a 0 has no effect. If enabled (APIE = 1), APIF causes an interrupt request. 0 API time-out has not yet occurred. 1 API time-out has occurred. MC9S12VR Family Reference Manual, Rev. 4.2 162 NXP Semiconductor S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) Figure 4-20. Waveform selected on API_EXTCLK pin (APIEA=1, APIFE=1) API min. period / 2 APIES=0 API period APIES=1 MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 163 S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) 4.3.2.16 Autonomous Clock Trimming Register (CPMUACLKTR) The CPMUACLKTR register configures the trimming of the Autonomous Clock (ACLK - trimmable internal RC-Oscillator) which can be selected as clock source for some CPMU features. 0x02F3 7 R W Reset 6 5 4 3 2 ACLKTR5 ACLKTR4 ACLKTR3 ACLKTR2 ACLKTR1 ACLKTR0 F F F F F F 1 0 0 0 0 0 After de-assert of System Reset a value is automatically loaded from the Flash memory. Figure 4-21. Autonomous Clock Trimming Register (CPMUACLKTR) Read: Anytime Write: Anytime Table 4-19. CPMUACLKTR Field Descriptions Field Description 7–2 Autonomous Clock Period Trimming Bits — See Table 4-20 for trimming effects. The ACLKTR[5:0] value represents ACLKTR[5:0] a signed number influencing the ACLK period time. Table 4-20. Trimming Effect of ACLKTR[5:0] ACLKTR[5:0] Decimal ACLK frequency 100000 -32 lowest 100001 -31 increasing .... 111111 -1 000000 0 000001 +1 mid increasing .... 011110 +30 011111 +31 highest MC9S12VR Family Reference Manual, Rev. 4.2 164 NXP Semiconductor S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) 4.3.2.17 Autonomous Periodical Interrupt Rate High and Low Register (CPMUAPIRH / CPMUAPIRL) The CPMUAPIRH and CPMUAPIRL registers allow the configuration of the autonomous periodical interrupt rate. 0x02F4 R W Reset 7 6 5 4 3 2 1 0 APIR15 APIR14 APIR13 APIR12 APIR11 APIR10 APIR9 APIR8 0 0 0 0 0 0 0 0 = Unimplemented or Reserved Figure 4-22. Autonomous Periodical Interrupt Rate High Register (CPMUAPIRH) 0x02F5 R W Reset 7 6 5 4 3 2 1 0 APIR7 APIR6 APIR5 APIR4 APIR3 APIR2 APIR1 APIR0 0 0 0 0 0 0 0 0 Figure 4-23. Autonomous Periodical Interrupt Rate Low Register (CPMUAPIRL) Read: Anytime Write: Anytime if APIFE=0, Else writes have no effect. Table 4-21. CPMUAPIRH / CPMUAPIRL Field Descriptions Field 15-0 APIR[15:0] Description Autonomous Periodical Interrupt Rate Bits — These bits define the time-out period of the API. See Table 4-22 for details of the effect of the autonomous periodical interrupt rate bits. The period can be calculated as follows depending on logical value of the APICLK bit: APICLK=0: Period = 2*(APIR[15:0] + 1) * (ACLK Clock Period * 2) APICLK=1: Period = 2*(APIR[15:0] + 1) * Bus Clock Period NOTE For APICLK bit clear the first time-out period of the API will show a latency time between two to three fACLK cycles due to synchronous clock gate release when the API feature gets enabled (APIFE bit set). MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 165 S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) Table 4-22. Selectable Autonomous Periodical Interrupt Periods 1 APICLK APIR[15:0] Selected Period 0 0000 0.2 ms1 0 0001 0.4 ms1 0 0002 0.6 ms1 0 0003 0.8 ms1 0 0004 1.0 ms1 0 0005 1.2 ms1 0 ..... ..... 0 FFFD 13106.8 ms1 0 FFFE 13107.0 ms1 0 FFFF 13107.2 ms1 1 0000 2 * Bus Clock period 1 0001 4 * Bus Clock period 1 0002 6 * Bus Clock period 1 0003 8 * Bus Clock period 1 0004 10 * Bus Clock period 1 0005 12 * Bus Clock period 1 ..... ..... 1 FFFD 131068 * Bus Clock period 1 FFFE 131070 * Bus Clock period 1 FFFF 131072 * Bus Clock period When fACLK is trimmed to 20kHz. MC9S12VR Family Reference Manual, Rev. 4.2 166 NXP Semiconductor S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) 4.3.2.18 Reserved Register CPMUTEST3 NOTE This reserved register is designed for factory test purposes only, and is not intended for general user access. Writing to this register when in Special Mode can alter the S12CPMU_UHV_V8’s functionality. 0x02F6 R 7 6 5 4 3 2 1 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 W Reset = Unimplemented or Reserved Figure 4-24. Reserved Register (CPMUTEST3) Read: Anytime Write: Only in Special Mode MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 167 S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) 4.3.2.19 High Temperature Trimming Register (CPMUHTTR) The CPMUHTTR register configures the trimming of the S12CPMU_UHV_V8 temperature sense. 0x02F7 7 R W Reset HTOE 0 6 5 4 0 0 0 0 0 0 3 2 1 0 HTTR3 HTTR2 HTTR1 HTTR0 F F F F After de-assert of System Reset a trim value is automatically loaded from the Flash memory. See Device specification for details. = Unimplemented or Reserved Figure 4-25. High Temperature Trimming Register (CPMUHTTR) Read: Anytime Write: Anytime Table 4-24. CPMUHTTR Field Descriptions Field 7 HTOE 3–0 HTTR[3:0] Description High Temperature Offset Enable Bit — If set the temperature sense offset is enabled. 0 The temperature sense offset is disabled. HTTR[3:0] bits don’t care. 1 The temperature sense offset is enabled. HTTR[3:0] select the temperature offset. High Temperature Trimming Bits — See Table 4-25 for trimming effects. Table 4-25. Trimming Effect of HTTR HTTR[3:0] Temperature sensor voltage VHT Interrupt threshold temperatures THTIA and THTID 0000 lowest highest increasing decreasing highest lowest 0001 .... 1110 1111 MC9S12VR Family Reference Manual, Rev. 4.2 168 NXP Semiconductor S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) 4.3.2.20 S12CPMU_UHV_V8 IRC1M Trim Registers (CPMUIRCTRIMH / CPMUIRCTRIML) 0x02F8 15 14 R 12 11 F F F 10 0 TCTRIM[4:0] W Reset 13 F F 0 9 8 IRCTRIM[9:8] F F After de-assert of System Reset a factory programmed trim value is automatically loaded from the Flash memory to provide trimmed Internal Reference Frequency fIRC1M_TRIM. Figure 4-26. S12CPMU_UHV_V8 IRC1M Trim High Register (CPMUIRCTRIMH) 0x02F9 7 6 5 R 3 2 1 0 F F F IRCTRIM[7:0] W Reset 4 F F F F F After de-assert of System Reset a factory programmed trim value is automatically loaded from the Flash memory to provide trimmed Internal Reference Frequency fIRC1M_TRIM. Figure 4-27. S12CPMU_UHV_V8 IRC1M Trim Low Register (CPMUIRCTRIML) Read: Anytime Write: Anytime if PROT=0 (CPMUPROT register). Else write has no effect NOTE Writes to these registers while PLLSEL=1 clears the LOCK and UPOSC status bits. Table 4-26. CPMUIRCTRIMH/L Field Descriptions Field Description 15-11 IRC1M temperature coefficient Trim Bits TCTRIM[4:0] Trim bits for the Temperature Coefficient (TC) of the IRC1M frequency. Table 4-27 shows the influence of the bits TCTRIM[4:0] on the relationship between frequency and temperature. Figure 4-29 shows an approximate TC variation, relative to the nominal TC of the IRC1M (i.e. for TCTRIM[4:0]=0x00000 or 0x10000). 9-0 IRC1M Frequency Trim Bits — Trim bits for Internal Reference Clock IRCTRIM[9:0] After System Reset the factory programmed trim value is automatically loaded into these registers, resulting in a Internal Reference Frequency fIRC1M_TRIM.See device electrical characteristics for value of fIRC1M_TRIM. The frequency trimming consists of two different trimming methods: A rough trimming controlled by bits IRCTRIM[9:6] can be done with frequency leaps of about 6% in average. A fine trimming controlled by bits IRCTRIM[5:0] can be done with frequency leaps of about 0.3% (this trimming determines the precision of the frequency setting of 0.15%, i.e. 0.3% is the distance between two trimming values). Figure 4-28 shows the relationship between the trim bits and the resulting IRC1M frequency. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 169 S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) IRC1M frequency (IRCCLK) IRCTRIM[9:6] 1.5MHz IRCTRIM[5:0] ...... 1MHz 600KHz IRCTRIM[9:0] $000 $3FF Figure 4-28. IRC1M Frequency Trimming Diagram MC9S12VR Family Reference Manual, Rev. 4.2 170 NXP Semiconductor S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) frequency T ] [4:0 M RI CT 111 x11 0 = 0x11111 ... 0x10101 0x10100 0x10011 0x10010 0x10001 TC increases TCTRIM[4:0] = 0x10000 or 0x00000 (nominal TC) TCT R - 40C IM[ 4:0 ]=0 x01 111 0x00001 0x00010 0x00011 0x00100 0x00101 ... 0x01111 TC decreases 150C temperature Figure 4-29. Influence of TCTRIM[4:0] on the Temperature Coefficient NOTE The frequency is not necessarily linear with the temperature (in most cases it will not be). The above diagram is meant only to give the direction (positive or negative) of the variation of the TC, relative to the nominal TC. Setting TCTRIM[4:0] at 0x00000 or 0x10000 does not mean that the temperature coefficient will be zero. These two combinations basically switch off the TC compensation module, which results in the nominal TC of the IRC1M. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 171 S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) Table 4-27. TC trimming of the frequency of the IRC1M at ambient temperature TCTRIM[4:0] IRC1M Indicative relative TC variation IRC1M indicative frequency drift for relative TC variation 00000 0 (nominal TC of the IRC) 0% 00001 -0.27% -0.5% 00010 -0.54% -0.9% 00011 -0.81% -1.3% 00100 -1.08% -1.7% 00101 -1.35% -2.0% 00110 -1.63% -2.2% 00111 -1.9% -2.5% 01000 -2.20% -3.0% 01001 -2.47% -3.4% 01010 -2.77% -3.9% 01011 -3.04 -4.3% 01100 -3.33% -4.7% 01101 -3.6% -5.1% 01110 -3.91% -5.6% 01111 -4.18% -5.9% 10000 0 (nominal TC of the IRC) 0% 10001 +0.27% +0.5% 10010 +0.54% +0.9% 10011 +0.81% +1.3% 10100 +1.07% +1.7% 10101 +1.34% +2.0% 10110 +1.59% +2.2% 10111 +1.86% +2.5% 11000 +2.11% +3.0% 11001 +2.38% +3.4% 11010 +2.62% +3.9% 11011 +2.89% +4.3% 11100 +3.12% +4.7% 11101 +3.39% +5.1% 11110 +3.62% +5.6% 11111 +3.89% +5.9% NOTE Since the IRC1M frequency is not a linear function of the temperature, but more like a parabola, the above relative variation is only an indication and should be considered with care. MC9S12VR Family Reference Manual, Rev. 4.2 172 NXP Semiconductor S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) Be aware that the output frequency varies with the TC trimming. A frequency trimming correction is therefore necessary. The values provided in Table 4-27 are typical values at ambient temperature which can vary from device to device. 4.3.2.21 S12CPMU_UHV_V8 Oscillator Register (CPMUOSC) This register configures the external oscillator (XOSCLCP). 0x02FA 7 R W Reset OSCE 0 6 5 4 3 2 1 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 Figure 4-30. S12CPMU_UHV_V8 Oscillator Register (CPMUOSC) Read: Anytime Write: Anytime if PROT=0 (CPMUPROT register) and PLLSEL=1 (CPMUCLKS register). Else write has no effect. NOTE. Write to this register clears the LOCK and UPOSC status bits. Table 4-28. CPMUOSC Field Descriptions Field Description 7 OSCE Oscillator Enable Bit — This bit enables the external oscillator (XOSCLCP). The UPOSC status bit in the CPMUFLG register indicates when the oscillation is stable and OSCCLK can be selected as source of the Bus Clock or source of the COP or RTI.If the oscillator clock monitor reset is enabled (OMRE = 1 in CPMUOSC2 register), then a loss of oscillation will lead to an oscillator clock monitor reset. 0 External oscillator is disabled. REFCLK for PLL is IRCCLK. 1 External oscillator is enabled. External oscillator is qualified by PLLCLK REFCLK for PLL is the external oscillator clock divided by REFDIV. If OSCE bit has been set (write “1”) then the EXTAL and XTAL pins are exclusively reserved for the oscillator and they can not be used anymore as general purpose I/O until the next system reset. Note: When starting up the external oscillator (either by programming OSCE bit to 1 or on exit from Full Stop Mode with OSCE bit already 1) the software must wait for a minimum time equivalent to the startup-time of the external oscillator tUPOSC before entering Pseudo Stop Mode. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 173 S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) 4.3.2.22 S12CPMU_UHV_V8 Protection Register (CPMUPROT) This register protects the clock configuration registers from accidental overwrite: CPMUSYNR, CPMUREFDIV, CPMUCLKS, CPMUPLL, CPMUIRCTRIMH/L, CPMUOSC and CPMUOSC2 0x02FB R 7 6 5 4 3 2 1 0 0 0 0 0 0 0 0 0 0 0 0 0 0 W Reset 0 PROT 0 Figure 4-31. S12CPMU_UHV_V8 Protection Register (CPMUPROT) Read: Anytime Write: Anytime Field Description PROT Clock Configuration Registers Protection Bit — This bit protects the clock configuration registers from accidental overwrite (see list of protected registers above): Writing 0x26 to the CPMUPROT register clears the PROT bit, other write accesses set the PROT bit. 0 Protection of clock configuration registers is disabled. 1 Protection of clock configuration registers is enabled. (see list of protected registers above). MC9S12VR Family Reference Manual, Rev. 4.2 174 NXP Semiconductor S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) 4.3.2.23 Reserved Register CPMUTEST2 NOTE This reserved register is designed for factory test purposes only, and is not intended for general user access. Writing to this register when in Special Mode can alter the S12CPMU_UHV_V8’s functionality. 0x02FC R 7 6 5 4 3 2 1 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 1 0 OMRE OSCMOD 0 0 W Reset = Unimplemented or Reserved Figure 4-32. Reserved Register CPMUTEST2 Read: Anytime Write: Only in Special Mode 4.3.2.24 S12CPMU_UHV_V8 Oscillator Register 2 (CPMUOSC2)1 This registers configures the external oscillator (XOSCLCP). Module Base + 0x02FE R 7 6 5 4 3 2 0 0 0 0 0 0 0 0 0 0 0 0 W Reset Figure 4-33. S12CPMU_UHV_V8 Oscillator Register 2 (CPMUOSC2) Read: Anytime Write: Anytime if PROT=0 (CPMUPROT register),PLLSEL=1 (CPMUCLKS register) and OSCE=0 (OSCCLK Enable Bit in CPMUOSC register). Else write has no effect. 1. CPMUOSC2 register is available only on S12VR32/16. On S12VR64/48 this location reads 0 and write is not implemented. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 175 S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) Table 4-29. CPMUOSC2 Field Descriptions Field 1 OMRE 0 OSCMOD Description This bit enables the oscillator clock monitor reset. 0 Oscillator clock monitor reset is disabled 1 Oscillator clock monitor reset is enabled 0 External oscillator configured for loop controlled mode (reduced amplitude on EXTAL and XTAL) 1 External oscillator configured for full swing mode (full swing amplitude on EXTAL and XTAL) MC9S12VR Family Reference Manual, Rev. 4.2 176 NXP Semiconductor S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) 4.4 4.4.1 Functional Description Phase Locked Loop with Internal Filter (PLL) The PLL is used to generate a high speed PLLCLK based on a low frequency REFCLK. The REFCLK is by default the IRCCLK which is trimmed to fIRC1M_TRIM=1MHz. If using the oscillator (OSCE=1) REFCLK will be based on OSCCLK. For increased flexibility, OSCCLK can be divided in a range of 1 to 16 to generate the reference frequency REFCLK using the REFDIV[3:0] bits. Based on the SYNDIV[5:0] bits the PLL generates the VCOCLK by multiplying the reference clock by a 2, 4, 6,... 126, 128. Based on the POSTDIV[4:0] bits the VCOCLK can be divided in a range of 1,2, 3, 4, 5, 6,... to 32 to generate the PLLCLK. If oscillator is enabled (OSCE=1) f OSC f REF = ------------------------------------ REFDIV + 1 If oscillator is disabled (OSCE=0) f REF = f IRC1M f VCO = 2 f REF SYNDIV + 1 If PLL is locked (LOCK=1) f VCO f PLL = ---------------------------------------- POSTDIV + 1 If PLL is not locked (LOCK=0) f VCO f PLL = --------------4 If PLL is selected (PLLSEL=1) f PLL f bus = ------------2 . NOTE Although it is possible to set the dividers to command a very high clock frequency, do not exceed the specified bus frequency limit for the MCU. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 177 S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) Several examples of PLL divider settings are shown in Table 4-30. The following rules help to achieve optimum stability and shortest lock time: • Use lowest possible fVCO / fREF ratio (SYNDIV value). • Use highest possible REFCLK frequency fREF. Table 4-30. Examples of PLL Divider Settings fosc REFDIV[3:0] fREF REFFRQ[1:0] SYNDIV[5:0] fVCO VCOFRQ[1:0] POSTDIV[4:0] fPLL fbus off $00 1MHz 00 $18 50MHz 01 $03 12.5MHz 6.25MHz off $00 1MHz 00 $18 50MHz 01 $00 50MHz 25MHz 4MHz $00 4MHz 01 $05 48MHz 00 $00 48MHz 24MHz The phase detector inside the PLL compares the feedback clock (FBCLK = VCOCLK/(SYNDIV+1)) with the reference clock (REFCLK = (IRC1M or OSCCLK)/(REFDIV+1)). Correction pulses are generated based on the phase difference between the two signals. The loop filter alters the DC voltage on the internal filter capacitor, based on the width and direction of the correction pulse which leads to a higher or lower VCO frequency. The user must select the range of the REFCLK frequency (REFFRQ[1:0] bits) and the range of the VCOCLK frequency (VCOFRQ[1:0] bits) to ensure that the correct PLL loop bandwidth is set. The lock detector compares the frequencies of the FBCLK and the REFCLK. Therefore the speed of the lock detector is directly proportional to the reference clock frequency. The circuit determines the lock condition based on this comparison. If PLL LOCK interrupt requests are enabled, the software can wait for an interrupt request and for instance check the LOCK bit. If interrupt requests are disabled, software can poll the LOCK bit continuously (during PLL start-up) or at periodic intervals. In either case, only when the LOCK bit is set, the VCOCLK will have stabilized to the programmed frequency. • The LOCK bit is a read-only indicator of the locked state of the PLL. • The LOCK bit is set when the VCO frequency is within the tolerance, Lock, and is cleared when the VCO frequency is out of the tolerance, unl. • Interrupt requests can occur if enabled (LOCKIE = 1) when the lock condition changes, toggling the LOCK bit. MC9S12VR Family Reference Manual, Rev. 4.2 178 NXP Semiconductor S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) 4.4.2 Startup from Reset An example for startup of the clock system from Reset is given in Figure 4-34. Figure 4-34. Startup of clock system after Reset 256 cycles fVCORST RESET Pin 512 cycles fVCORST System Reset PLLCLK = Core Clock 768 cycles fVCORST fVCORST )( Bus Clock = Core Clock/2 fPLL increasing fPLL=12.5MHz fPLL=50MHz fBUS increasing fBUS=6.25MHz fBUS=25MHz )( )( )( tlock LOCK SYNDIV $18 (default target fVCO=50MHz) POSTDIV $03 (default target fPLL=fVCO/4 = 12.5MHz) CPU reset state startup vector fetch, program execution $00 example change of POSTDIV nSTARTUP cycles fBUS Figure 4-35. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 179 S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) 4.4.3 Stop Mode using PLLCLK as source of the Bus Clock An example of what happens going into Stop Mode and exiting Stop Mode after an interrupt is shown in Figure 4-36. Disable PLL Lock interrupt (LOCKIE=0) before going into Stop Mode. Figure 4-36. Stop Mode using PLLCLK as source of the Bus Clock wakeup CPU execution interrupt STOP instruction continue execution tSTP_REC PLLCLK LOCK tlock Depending on the COP configuration there might be an additional significant latency time until COP is active again after exit from Stop Mode due to clock domain crossing synchronization. This latency time occurs if COP clock source is ACLK and the CSAD bit is set (please refer to CSAD bit description for details). 4.4.4 Full Stop Mode using Oscillator Clock as source of the Bus Clock An example of what happens going into Full Stop Mode and exiting Full Stop Mode after an interrupt is shown in Figure 4-37. Disable PLL Lock interrupt (LOCKIE=0) and oscillator status change interrupt (OSCIE=0) before going into Full Stop Mode. MC9S12VR Family Reference Manual, Rev. 4.2 180 NXP Semiconductor S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) Figure 4-37. Full Stop Mode using Oscillator Clock as source of the Bus Clock wake up CPU execution Core Clock PLLCLK interrupt STOP instruction continue execution tSTP_REC tlock crystal/resonator starts oscillating OSCCLK UPOSC tUPOSC select OSCCLK as Core/Bus Clock by writing PLLSEL to “0” PLLSEL automatically set when going into Full Stop Mode Depending on the COP configuration there might be a significant latency time until COP is active again after exit from Stop Mode due to clock domain crossing synchronization. This latency time occurs if COP clock source is ACLK and the CSAD bit is set (please refer to CSAD bit description for details). MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 181 S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) 4.4.5 4.4.5.1 External Oscillator Enabling the External Oscillator An example of how to use the oscillator as source of the Bus Clock is shown in Figure 4-38. Figure 4-38. Enabling the external oscillator enable external oscillator by writing OSCE bit to one. OSCE crystal/resonator starts oscillating OSCCLK UPOSC flag is set upon successful start of oscillation UPOSC tUPOSC select OSCCLK as Core/Bus Clock by writing PLLSEL to zero PLLSEL Core Clock based on PLL Clock based on OSCCLK MC9S12VR Family Reference Manual, Rev. 4.2 182 NXP Semiconductor S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) 4.4.6 4.4.6.1 System Clock Configurations PLL Engaged Internal Mode (PEI) This mode is the default mode after System Reset or Power-On Reset. The Bus Clock is based on the PLLCLK, the reference clock for the PLL is internally generated (IRC1M). The PLL is configured to 50 MHz VCOCLK with POSTDIV set to 0x03. If locked (LOCK=1) this results in a PLLCLK of 12.5 MHz and a Bus Clock of 6.25 MHz. The PLL can be re-configured to other bus frequencies. The clock sources for COP and RTI can be based on the internal reference clock generator (IRC1M) or the RC-Oscillator (ACLK). 4.4.6.2 PLL Engaged External Mode (PEE) In this mode, the Bus Clock is based on the PLLCLK as well (like PEI). The reference clock for the PLL is based on the external oscillator. The clock sources for COP and RTI can be based on the internal reference clock generator or on the external oscillator clock or the RC-Oscillator (ACLK). This mode can be entered from default mode PEI by performing the following steps: 1. Configure the PLL for desired bus frequency. 2. Enable the external Oscillator (OSCE bit). 3. Wait for oscillator to start-up and the PLL being locked (LOCK = 1) and (UPOSC =1). 4. Clear all flags in the CPMUFLG register to be able to detect any future status bit change. 5. Optionally status interrupts can be enabled (CPMUINT register). Loosing PLL lock status (LOCK=0) means loosing the oscillator status information as well (UPOSC=0). The impact of loosing the oscillator status (UPOSC=0) in PEE mode is as follows: • The PLLCLK is derived from the VCO clock (with its actual frequency) divided by four until the PLL locks again. Application software needs to be prepared to deal with the impact of loosing the oscillator status at any time. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 183 S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) 4.4.6.3 PLL Bypassed External Mode (PBE) In this mode, the Bus Clock frequency is half the external oscillator clock. The reference clock for the PLL is based on the external oscillator. The clock sources for COP and RTI can be based on the internal reference clock generator or on the external oscillator clock or the RC-Oscillator (ACLK). This mode can be entered from default mode PEI by performing the following steps: 1. Make sure the PLL configuration is valid. 2. Enable the external Oscillator (OSCE bit) 3. Wait for the oscillator to start-up and the PLL being locked (LOCK = 1) and (UPOSC =1) 4. Clear all flags in the CPMUFLG register to be able to detect any status bit change. 5. Optionally status interrupts can be enabled (CPMUINT register). 6. Select the Oscillator clock as source of the Bus Clock (PLLSEL=0) Loosing PLL lock status (LOCK=0) means loosing the oscillator status information as well (UPOSC=0). The impact of loosing the oscillator status (UPOSC=0) in PBE mode is as follows: • PLLSEL is set automatically and the Bus clock is switched back to the PLL clock. • The PLLCLK is derived from the VCO clock (with its actual frequency) divided by four until the PLL locks again. NOTEApplication software needs to be prepared to deal with the impact of loosing the oscillator status at any time. When using the oscillator clock as system clock (write PLLSEL = 0) it is highly recommended to enable the oscillator clock monitor reset feature (write OMRE = 1 in CPMUOSC2 register). If the oscillator monitor reset feature is disabled (OMRE = 0) and the oscillator clock is used as system clock, the system might stall in case of loss of oscillation. 4.5 4.5.1 Resets General All reset sources are listed in Table 4-31. Refer to MCU specification for related vector addresses and priorities. Table 4-31. Reset Summary Reset Source Local Enable Power-On Reset (POR) None Low Voltage Reset (LVR) None External pin RESET None Illegal Address Reset None MC9S12VR Family Reference Manual, Rev. 4.2 184 NXP Semiconductor S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) Table 4-31. Reset Summary 4.5.2 Reset Source Local Enable PLL Clock Monitor Reset None Oscillator Clock Monitor Reset OSCE=1 in CPMUOSC register and OMRE=1 in CPMUOSC2 register COP Reset CR[2:0] in CPMUCOP register Description of Reset Operation Upon detection of any reset of Table 4-31, an internal circuit drives the RESET pin low for 512 PLLCLK cycles. After 512 PLLCLK cycles the RESET pin is released. The reset generator of the S12CPMU_UHV_V8 waits for additional 256PLLCLK cycles and then samples the RESET pin to determine the originating source. Table 4-32 shows which vector will be fetched. Table 4-32. Reset Vector Selection Sampled RESET Pin (256 cycles after release) Oscillator monitor fail pending COP time-out pending 1 0 0 POR LVR Illegal Address Reset PLL Clock Monitor Reset External pin RESET 1 1 X Oscillator Clock Monitor Reset 1 0 1 COP Reset 0 X X POR LVR Illegal Address Reset PLL Clock Monitor Reset External pin RESET Vector Fetch NOTE While System Reset is asserted the PLLCLK runs with the frequency fVCORST. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 185 S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) The internal reset of the MCU remains asserted while the reset generator completes the 768 PLLCLK cycles long reset sequence. In case the RESET pin is externally driven low for more than these 768 PLLCLK cycles (External Reset), the internal reset remains asserted longer. Figure 4-39. RESET Timing RESET S12_CPMU drives RESET pin low fVCORST S12_CPMU releases RESET pin fVCORST ) ) PLLCLK ( ( 512 cycles ) ( 256 cycles possibly RESET driven low 4.5.3 Oscillator Clock Monitor Reset If the external oscillator is enabled (OSCE=1) and the oscillator clock monitor reset is enabled (OMRE=1), then in case of loss of oscillation or the oscillator frequency drops below the failure assert frequency fCMFA (see device electrical characteristics for values), the S12CPMU_UHV_V8 generates an Oscillator Clock Monitor Reset. In Full Stop Mode the external oscillator and the oscillator clock monitor are disabled. 4.5.4 PLL Clock Monitor Reset In case of loss of PLL clock oscillation or the PLL clock frequency is below the failure assert frequency fPMFA (see device electrical characteristics for values), the S12CPMU_UHV_V8 generates a PLL Clock Monitor Reset. In Full Stop Mode the PLL and the PLL clock monitor are disabled. 4.5.4.1 Computer Operating Properly Watchdog (COP) Reset The COP (free running watchdog timer) enables the user to check that a program is running and sequencing properly. When the COP is being used, software is responsible for keeping the COP from timing out. If the COP times out it is an indication that the software is no longer being executed in the intended sequence; thus COP reset is generated. The clock source for the COP is either ACLK, IRCCLK or OSCCLK depending on the setting of the COPOSCSEL0 and COPOSCSEL1 bit. MC9S12VR Family Reference Manual, Rev. 4.2 186 NXP Semiconductor S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) Depending on the COP configuration there might be a significant latency time until COP is active again after exit from Stop Mode due to clock domain crossing synchronization. This latency time occurs if COP clock source is ACLK and the CSAD bit is set (please refer to CSAD bit description for details). Table 4-33 gives an overview of the COP condition (run, static) in Stop Mode depending on legal configuration and status bit settings: Table 4-33. COP condition (run, static) in Stop Mode COPOSCSEL1 CSAD PSTP PCE COPOSCSEL0 OSCE UPOSC COP counter behavior in Stop Mode (clock source) 1 0 x x x x x Run (ACLK) 1 1 x x x x x Static (ACLK) 0 x 1 1 1 1 1 Run (OSCCLK) 0 x 1 1 0 0 x Static (IRCCLK) 0 x 1 1 0 1 x Static (IRCCLK) 0 x 1 0 0 x x Static (IRCCLK) 0 x 1 0 1 1 1 Static (OSCCLK) 0 x 0 1 1 1 1 Static (OSCCLK) 0 x 0 1 0 1 x Static (IRCCLK) 0 x 0 1 0 0 0 Static (IRCCLK) 0 x 0 0 1 1 1 Satic (OSCCLK) 0 x 0 0 0 1 1 Static (IRCCLK) 0 x 0 0 0 1 0 Static (IRCCLK) 0 x 0 0 0 0 0 Static (IRCCLK) Three control bits in the CPMUCOP register allow selection of seven COP time-out periods. When COP is enabled, the program must write $55 and $AA (in this order) to the CPMUARMCOP register during the selected time-out period. Once this is done, the COP time-out period is restarted. If the program fails to do this and the COP times out, a COP reset is generated. Also, if any value other than $55 or $AA is written, a COP reset is generated. Windowed COP operation is enabled by setting WCOP in the CPMUCOP register. In this mode, writes to the CPMUARMCOP register to clear the COP timer must occur in the last 25% of the selected time-out period. A premature write will immediately reset the part. In MCU Normal Mode the COP time-out period (CR[2:0]) and COP window (WCOP) setting can be automatically pre-loaded at reset release from NVM memory (if values are defined in the NVM by the application). By default the COP is off and no window COP feature is enabled after reset release via NVM memory. The COP control register CPMUCOP can be written once in an application in MCU Normal Mode to update the COP time-out period (CR[2:0]) and COP window (WCOP) setting loaded from NVM memory at reset release. Any value for the new COP time-out period and COP window setting is allowed MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 187 S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) except COP off value if the COP was enabled during pre-load via NVM memory. The COP clock source select bits can not be pre-loaded via NVM memory at reset release. The IRC clock is the default COP clock source out of reset. The COP clock source select bits (COPOSCSEL0/1) and ACLK clock control bit in Stop Mode (CSAD) can be modified until the CPMUCOP register write once has taken place. Therefore these control bits should be modified before the final COP time-out period and window COP setting is written. The CPMUCOP register access to modify the COP time-out period and window COP setting in MCU Normal Mode after reset release must be done with the WRTMASK bit cleared otherwise the update is ignored and this access does not count as the write once. 4.5.5 Power-On Reset (POR) The on-chip POR circuitry detects when the internal supply VDD drops below an appropriate voltage level. The POR is deasserted, if the internal supply VDD exceeds an appropriate voltage level (voltage levels not specified in this document because this internal supply is not visible on device pins). 4.5.6 Low-Voltage Reset (LVR) The on-chip LVR circuitry detects when one of the supply voltages VDD, VDDX and VDDF drops below an appropriate voltage level. If LVR is deasserted the MCU is fully operational at the specified maximum speed. The LVR assert and deassert levels for the supply voltage VDDX are VLVRXA and VLVRXD and are specified in the device Reference Manual. 4.6 Interrupts The interrupt/reset vectors requested by the S12CPMU_UHV_V8 are listed in Table 4-34. Refer to MCU specification for related vector addresses and priorities. Table 4-34. S12CPMU_UHV_V8 Interrupt Vectors Interrupt Source CCR Mask Local Enable RTI time-out interrupt I bit CPMUINT (RTIE) PLL lock interrupt I bit CPMUINT (LOCKIE) Oscillator status interrupt I bit CPMUINT (OSCIE) Low voltage interrupt I bit CPMULVCTL (LVIE) High temperature interrupt I bit CPMUHTCTL (HTIE) Autonomous Periodical Interrupt I bit CPMUAPICTL (APIE) MC9S12VR Family Reference Manual, Rev. 4.2 188 NXP Semiconductor S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) 4.6.1 4.6.1.1 Description of Interrupt Operation Real Time Interrupt (RTI) The clock source for the RTI is either IRCCLK or OSCCLK depending on the setting of the RTIOSCSEL bit. In Stop Mode with PSTP=1 (Pseudo Stop Mode), RTIOSCSEL=1 and PRE=1 the RTI continues to run, else the RTI counter halts in Stop Mode. The RTI can be used to generate hardware interrupts at a fixed periodic rate. If enabled (by setting RTIE=1), this interrupt will occur at the rate selected by the CPMURTI register. At the end of the RTI time-out period the RTIF flag is set to one and a new RTI time-out period starts immediately. A write to the CPMURTI register restarts the RTI time-out period. 4.6.1.2 PLL Lock Interrupt The S12CPMU_UHV_V8 generates a PLL Lock interrupt when the lock condition (LOCK status bit) of the PLL changes, either from a locked state to an unlocked state or vice versa. Lock interrupts are locally disabled by setting the LOCKIE bit to zero. The PLL Lock interrupt flag (LOCKIF) is set to1 when the lock condition has changed, and is cleared to 0 by writing a 1 to the LOCKIF bit. 4.6.1.3 Oscillator Status Interrupt When the OSCE bit is 0, then UPOSC stays 0. When OSCE=1 the UPOSC bit is set after the LOCK bit is set. Upon detection of a status change (UPOSC) the OSCIF flag is set. Going into Full Stop Mode or disabling the oscillator can also cause a status change of UPOSC. Any change in PLL configuration or any other event which causes the PLL lock status to be cleared leads to a loss of the oscillator status information as well (UPOSC=0). Oscillator status change interrupts are locally enabled with the OSCIE bit. NOTE Loosing the oscillator status (UPOSC=0) affects the clock configuration of the system1. This needs to be dealt with in application software. 4.6.1.4 Low-Voltage Interrupt (LVI) In FPM the input voltage VDDA is monitored. Whenever VDDA drops below level VLVIA, the status bit LVDS is set to 1. When VDDA rises above level VLVID the status bit LVDS is cleared to 0. An interrupt, indicated by flag LVIF = 1, is triggered by any change of the status bit LVDS if interrupt enable bit LVIE = 1. 1. For details please refer to “4.4.6 System Clock Configurations” MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 189 S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) 4.6.1.5 HTI - High Temperature Interrupt In FPM the junction temperature TJ is monitored. Whenever TJ exceeds level THTIA the status bit HTDS is set to 1. Vice versa, HTDS is reset to 0 when TJ get below level THTID. An interrupt, indicated by flag HTIF = 1, is triggered by any change of the status bit HTDS, if interrupt enable bit HTIE = 1. 4.6.1.6 Autonomous Periodical Interrupt (API) The API sub-block can generate periodical interrupts independent of the clock source of the MCU. To enable the timer, the bit APIFE needs to be set. The API timer is either clocked by the Autonomous Clock (ACLK - trimmable internal RC oscillator) or the Bus Clock. Timer operation will freeze when MCU clock source is selected and Bus Clock is turned off. The clock source can be selected with bit APICLK. APICLK can only be written when APIFE is not set. The APIR[15:0] bits determine the interrupt period. APIR[15:0] can only be written when APIFE is cleared. As soon as APIFE is set, the timer starts running for the period selected by APIR[15:0] bits. When the configured time has elapsed, the flag APIF is set. An interrupt, indicated by flag APIF = 1, is triggered if interrupt enable bit APIE = 1. The timer is re-started automatically again after it has set APIF. The procedure to change APICLK or APIR[15:0] is first to clear APIFE, then write to APICLK or APIR[15:0], and afterwards set APIFE. The API Trimming bits ACLKTR[5:0] must be set so the minimum period equals 0.2 ms if stable frequency is desired. See Table 4-20 for the trimming effect of ACLKTR. NOTE The first period after enabling the counter by APIFE might be reduced by API start up delay tsdel. It is possible to generate with the API a waveform at the external pin API_EXTCLK by setting APIFE and enabling the external access with setting APIEA. 4.7 4.7.1 Initialization/Application Information General Initialization information Usually applications run in MCU Normal Mode. It is recommended to write the CPMUCOP register in any case from the application program initialization routine after reset no matter if the COP is used in the application or not, even if a configuration is loaded via the flash memory after reset. By doing a “controlled” write access in MCU Normal Mode (with the right value for the application) the write once for the COP configuration bits (WCOP,CR[2:0]) takes place which protects these bits from further accidental change. In case of a program sequencing issue (code runaway) the COP configuration can not be accidentally modified anymore. MC9S12VR Family Reference Manual, Rev. 4.2 190 NXP Semiconductor S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) 4.7.2 Application information for COP and API usage In many applications the COP is used to check that the program is running and sequencing properly. Often the COP is kept running during Stop Mode and periodic wake-up events are needed to service the COP on time and maybe to check the system status. For such an application it is recommended to use the ACLK as clock source for both COP and API. This guarantees lowest possible IDD current during Stop Mode. Additionally it eases software implementation using the same clock source for both, COP and API. The Interrupt Service Routine (ISR) of the Autonomous Periodic Interrupt API should contain the write instruction to the CPMUARMCOP register. The value (byte) written is derived from the “main routine” (alternating sequence of $55 and $AA) of the application software. Using this method, then in the case of a runtime or program sequencing issue the application “main routine” is not executed properly anymore and the alternating values are not provided properly. Hence the COP is written at the correct time (due to independent API interrupt request) but the wrong value is written (alternating sequence of $55 and $AA is no longer maintained) which causes a COP reset. If the COP is stopped during any Stop Mode it is recommended to service the COP shortly before Stop Mode is entered. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 191 S12 Clock, Reset and Power Management Unit (S12CPMU_UHV_V8) MC9S12VR Family Reference Manual, Rev. 4.2 192 NXP Semiconductor Chapter 5 Background Debug Module (S12SBDMV1) Table 5-1. Revision History Revision Number Date Sections Affected 1.05 07.Dec.2010 Table 5-1 1.06 02.Mar.2011 5.3.2.2/5-199 5.2/5-195 1.07 27.Sep.2012 General 5.1 Summary of Changes Standardized format of revision history table header. Corrected BPAE bit description. Removed references to fixed VCO frequencies Changed references to device level. Introduction This section describes the functionality of the background debug module (BDM) sub-block of the HCS12S core platform. The background debug module (BDM) sub-block is a single-wire, background debug system implemented in on-chip hardware for minimal CPU intervention. All interfacing with the BDM is done via the BKGD pin. The BDM has enhanced capability for maintaining synchronization between the target and host while allowing more flexibility in clock rates. This includes a sync signal to determine the communication rate and a handshake signal to indicate when an operation is complete. The system is backwards compatible to the BDM of the S12 family with the following exceptions: • TAGGO command not supported by S12SBDM • External instruction tagging feature is part of the DBG module • S12SBDM register map and register content modified • Family ID readable from BDM ROM at global address 0x3_FF0F in active BDM (value for devices with HCS12S core is 0xC2) • Clock switch removed from BDM (CLKSW bit removed from BDMSTS register) 5.1.1 Features The BDM includes these distinctive features: • Single-wire communication with host development system • Enhanced capability for allowing more flexibility in clock rates • SYNC command to determine communication rate • GO_UNTIL command MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 193 Background Debug Module (S12SBDMV1) • • • • • • • • • 5.1.2 Hardware handshake protocol to increase the performance of the serial communication Active out of reset in special single chip mode Nine hardware commands using free cycles, if available, for minimal CPU intervention Hardware commands not requiring active BDM 14 firmware commands execute from the standard BDM firmware lookup table Software control of BDM operation during wait mode When secured, hardware commands are allowed to access the register space in special single chip mode, if the Flash erase tests fail. Family ID readable from BDM ROM at global address 0x3_FF0F in active BDM (value for devices with HCS12S core is 0xC2) BDM hardware commands are operational until system stop mode is entered Modes of Operation BDM is available in all operating modes but must be enabled before firmware commands are executed. Some systems may have a control bit that allows suspending the function during background debug mode. 5.1.2.1 Regular Run Modes All of these operations refer to the part in run mode and not being secured. The BDM does not provide controls to conserve power during run mode. • Normal modes General operation of the BDM is available and operates the same in all normal modes. • Special single chip mode In special single chip mode, background operation is enabled and active out of reset. This allows programming a system with blank memory. 5.1.2.2 Secure Mode Operation If the device is in secure mode, the operation of the BDM is reduced to a small subset of its regular run mode operation. Secure operation prevents access to Flash other than allowing erasure. For more information please see Section 5.4.1, “Security”. 5.1.2.3 Low-Power Modes The BDM can be used until stop mode is entered. When CPU is in wait mode all BDM firmware commands as well as the hardware BACKGROUND command cannot be used and are ignored. In this case the CPU can not enter BDM active mode, and only hardware read and write commands are available. Also the CPU can not enter a low power mode (stop or wait) during BDM active mode. In stop mode the BDM clocks are stopped. When BDM clocks are disabled and stop mode is exited, the BDM clocks will restart and BDM will have a soft reset (clearing the instruction register, any command in progress and disable the ACK function). The BDM is now ready to receive a new command. MC9S12VR Family Reference Manual, Rev. 4.2 194 NXP Semiconductor Background Debug Module (S12SBDMV1) 5.1.3 Block Diagram A block diagram of the BDM is shown in Figure 5-1. Host System Serial Interface BKGD Data 16-Bit Shift Register Control Register Block Address TRACE Instruction Code and Execution BDMACT Bus Interface and Control Logic Data Control Clocks ENBDM SDV Standard BDM Firmware LOOKUP TABLE UNSEC Secured BDM Firmware LOOKUP TABLE BDMSTS Register Figure 5-1. BDM Block Diagram 5.2 External Signal Description A single-wire interface pin called the background debug interface (BKGD) pin is used to communicate with the BDM system. During reset, this pin is a mode select input which selects between normal and special modes of operation. After reset, this pin becomes the dedicated serial interface pin for the background debug mode. The communication rate of this pin is always the BDM clock frequency defined at device level (refer to device overview section). When modifying the VCO clock please make sure that the communication rate is adapted accordingly and a communication time-out (BDM soft reset) has occurred. 5.3 5.3.1 Memory Map and Register Definition Module Memory Map Table 5-2 shows the BDM memory map when BDM is active. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 195 Background Debug Module (S12SBDMV1) Table 5-2. BDM Memory Map 5.3.2 Global Address Module Size (Bytes) 0x3_FF00–0x3_FF0B BDM registers 12 0x3_FF0C–0x3_FF0E BDM firmware ROM 3 0x3_FF0F Family ID (part of BDM firmware ROM) 1 0x3_FF10–0x3_FFFF BDM firmware ROM 240 Register Descriptions A summary of the registers associated with the BDM is shown in Figure 5-2. Registers are accessed by host-driven communications to the BDM hardware using READ_BD and WRITE_BD commands. Global Address Register Name 0x3_FF00 Reserved R Bit 7 6 5 4 3 2 1 Bit 0 X X X X X X 0 0 BDMACT 0 SDV TRACE 0 UNSEC 0 X X X X X X X X X X X X X X X X X X X X X X X X X X X X X X X X CCR7 CCR6 CCR5 CCR4 CCR3 CCR2 CCR1 CCR0 0 0 0 0 0 0 0 0 0 0 0 BPP3 BPP2 BPP1 BPP0 W 0x3_FF01 BDMSTS R W 0x3_FF02 Reserved R ENBDM W 0x3_FF03 Reserved R W 0x3_FF04 Reserved R W 0x3_FF05 Reserved R W 0x3_FF06 BDMCCR R W 0x3_FF07 Reserved R W 0x3_FF08 BDMPPR R W BPAE = Unimplemented, Reserved X = Indeterminate = Implemented (do not alter) 0 = Always read zero Figure 5-2. BDM Register Summary MC9S12VR Family Reference Manual, Rev. 4.2 196 NXP Semiconductor Background Debug Module (S12SBDMV1) Global Address Register Name 0x3_FF09 Reserved Bit 7 6 5 4 3 2 1 Bit 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 R W 0x3_FF0A Reserved R W 0x3_FF0B Reserved R W = Unimplemented, Reserved = Implemented (do not alter) = Indeterminate X 0 = Always read zero Figure 5-2. BDM Register Summary (continued) 5.3.2.1 BDM Status Register (BDMSTS) Register Global Address 0x3_FF01 7 R W ENBDM 6 5 4 3 2 1 0 BDMACT 0 SDV TRACE 0 UNSEC 0 Reset Special Single-Chip Mode 01 1 0 0 0 0 02 0 All Other Modes 0 0 0 0 0 0 0 0 = Unimplemented, Reserved 0 = Implemented (do not alter) = Always read zero 1 ENBDM is read as 1 by a debugging environment in special single chip mode when the device is not secured or secured but fully erased (Flash). This is because the ENBDM bit is set by the standard BDM firmware before a BDM command can be fully transmitted and executed. 2 UNSEC is read as 1 by a debugging environment in special single chip mode when the device is secured and fully erased, else it is 0 and can only be read if not secure (see also bit description). Figure 5-3. BDM Status Register (BDMSTS) Read: All modes through BDM operation when not secured Write: All modes through BDM operation when not secured, but subject to the following: — ENBDM should only be set via a BDM hardware command if the BDM firmware commands are needed. (This does not apply in special single chip mode). — BDMACT can only be set by BDM hardware upon entry into BDM. It can only be cleared by the standard BDM firmware lookup table upon exit from BDM active mode. — All other bits, while writable via BDM hardware or standard BDM firmware write commands, should only be altered by the BDM hardware or standard firmware lookup table as part of BDM command execution. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 197 Background Debug Module (S12SBDMV1) Table 5-3. BDMSTS Field Descriptions Field Description 7 ENBDM Enable BDM — This bit controls whether the BDM is enabled or disabled. When enabled, BDM can be made active to allow firmware commands to be executed. When disabled, BDM cannot be made active but BDM hardware commands are still allowed. 0 BDM disabled 1 BDM enabled Note: ENBDM is set out of reset in special single chip mode. In special single chip mode with the device secured, this bit will not be set until after the Flash erase verify tests are complete. 6 BDMACT BDM Active Status — This bit becomes set upon entering BDM. The standard BDM firmware lookup table is then enabled and put into the memory map. BDMACT is cleared by a carefully timed store instruction in the standard BDM firmware as part of the exit sequence to return to user code and remove the BDM memory from the map. 0 BDM not active 1 BDM active 4 SDV Shift Data Valid — This bit is set and cleared by the BDM hardware. It is set after data has been transmitted as part of a BDM firmware or hardware read command or after data has been received as part of a BDM firmware or hardware write command. It is cleared when the next BDM command has been received or BDM is exited. SDV is used by the standard BDM firmware to control program flow execution. 0 Data phase of command not complete 1 Data phase of command is complete 3 TRACE TRACE1 BDM Firmware Command is Being Executed — This bit gets set when a BDM TRACE1 firmware command is first recognized. It will stay set until BDM firmware is exited by one of the following BDM commands: GO or GO_UNTIL. 0 TRACE1 command is not being executed 1 TRACE1 command is being executed 1 UNSEC Unsecure — If the device is secured this bit is only writable in special single chip mode from the BDM secure firmware. It is in a zero state as secure mode is entered so that the secure BDM firmware lookup table is enabled and put into the memory map overlapping the standard BDM firmware lookup table. The secure BDM firmware lookup table verifies that the on-chip Flash is erased. This being the case, the UNSEC bit is set and the BDM program jumps to the start of the standard BDM firmware lookup table and the secure BDM firmware lookup table is turned off. If the erase test fails, the UNSEC bit will not be asserted. 0 System is in a secured mode. 1 System is in a unsecured mode. Note: When UNSEC is set, security is off and the user can change the state of the secure bits in the on-chip Flash EEPROM. Note that if the user does not change the state of the bits to “unsecured” mode, the system will be secured again when it is next taken out of reset.After reset this bit has no meaning or effect when the security byte in the Flash EEPROM is configured for unsecure mode. Register Global Address 0x3_FF06 7 6 5 4 3 2 1 0 CCR7 CCR6 CCR5 CCR4 CCR3 CCR2 CCR1 CCR0 Special Single-Chip Mode 1 1 0 0 1 0 0 0 All Other Modes 0 0 0 0 0 0 0 0 R W Reset Figure 5-4. BDM CCR Holding Register (BDMCCR) Read: All modes through BDM operation when not secured MC9S12VR Family Reference Manual, Rev. 4.2 198 NXP Semiconductor Background Debug Module (S12SBDMV1) Write: All modes through BDM operation when not secured NOTE When BDM is made active, the CPU stores the content of its CCR register in the BDMCCR register. However, out of special single-chip reset, the BDMCCR is set to 0xD8 and not 0xD0 which is the reset value of the CCR register in this CPU mode. Out of reset in all other modes the BDMCCR register is read zero. When entering background debug mode, the BDM CCR holding register is used to save the condition code register of the user’s program. It is also used for temporary storage in the standard BDM firmware mode. The BDM CCR holding register can be written to modify the CCR value. 5.3.2.2 BDM Program Page Index Register (BDMPPR) Register Global Address 0x3_FF08 7 R W Reset BPAE 0 6 5 4 0 0 0 0 0 0 3 2 1 0 BPP3 BPP2 BPP1 BPP0 0 0 0 0 = Unimplemented, Reserved Figure 5-5. BDM Program Page Register (BDMPPR) Read: All modes through BDM operation when not secured Write: All modes through BDM operation when not secured Table 5-4. BDMPPR Field Descriptions Field Description 7 BPAE BDM Program Page Access Enable Bit — BPAE enables program page access for BDM hardware and firmware read/write instructions The BDM hardware commands used to access the BDM registers (READ_BD and WRITE_BD) can not be used for program page accesses even if the BPAE bit is set. 0 BDM Program Paging disabled 1 BDM Program Paging enabled 3–0 BPP[3:0] 5.3.3 BDM Program Page Index Bits 3–0 — These bits define the selected program page. For more detailed information regarding the program page window scheme, please refer to the device MMC description. Family ID Assignment The family ID is an 8-bit value located in the BDM ROM in active BDM (at global address: 0x3_FF0F). The read-only value is a unique family ID which is 0xC2 for devices with an HCS12S core. 5.4 Functional Description The BDM receives and executes commands from a host via a single wire serial interface. There are two types of BDM commands: hardware and firmware commands. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 199 Background Debug Module (S12SBDMV1) Hardware commands are used to read and write target system memory locations and to enter active background debug mode, see Section 5.4.3, “BDM Hardware Commands”. Target system memory includes all memory that is accessible by the CPU. Firmware commands are used to read and write CPU resources and to exit from active background debug mode, see Section 5.4.4, “Standard BDM Firmware Commands”. The CPU resources referred to are the accumulator (D), X index register (X), Y index register (Y), stack pointer (SP), and program counter (PC). Hardware commands can be executed at any time and in any mode excluding a few exceptions as highlighted (see Section 5.4.3, “BDM Hardware Commands”) and in secure mode (see Section 5.4.1, “Security”). BDM firmware commands can only be executed when the system is not secure and is in active background debug mode (BDM). 5.4.1 Security If the user resets into special single chip mode with the system secured, a secured mode BDM firmware lookup table is brought into the map overlapping a portion of the standard BDM firmware lookup table. The secure BDM firmware verifies that the on-chip Flash EEPROM are erased. This being the case, the UNSEC and ENBDM bit will get set. The BDM program jumps to the start of the standard BDM firmware and the secured mode BDM firmware is turned off and all BDM commands are allowed. If the Flash does not verify as erased, the BDM firmware sets the ENBDM bit, without asserting UNSEC, and the firmware enters a loop. This causes the BDM hardware commands to become enabled, but does not enable the firmware commands. This allows the BDM hardware to be used to erase the Flash. BDM operation is not possible in any other mode than special single chip mode when the device is secured. The device can only be unsecured via BDM serial interface in special single chip mode. More information regarding security is provided in the security section of the device documentation. 5.4.2 Enabling and Activating BDM The system must be in active BDM to execute standard BDM firmware commands. BDM can be activated only after being enabled. BDM is enabled by setting the ENBDM bit in the BDM status (BDMSTS) register. The ENBDM bit is set by writing to the BDM status (BDMSTS) register, via the single-wire interface, using a hardware command such as WRITE_BD_BYTE. After being enabled, BDM is activated by one of the following1: • Hardware BACKGROUND command • CPU BGND instruction • Breakpoint force or tag mechanism2 When BDM is activated, the CPU finishes executing the current instruction and then begins executing the firmware in the standard BDM firmware lookup table. When BDM is activated by a breakpoint, the type of breakpoint used determines if BDM becomes active before or after execution of the next instruction. 1. BDM is enabled and active immediately out of special single-chip reset. 2. This method is provided by the S12S_DBG module. MC9S12VR Family Reference Manual, Rev. 4.2 200 NXP Semiconductor Background Debug Module (S12SBDMV1) NOTE If an attempt is made to activate BDM before being enabled, the CPU resumes normal instruction execution after a brief delay. If BDM is not enabled, any hardware BACKGROUND commands issued are ignored by the BDM and the CPU is not delayed. In active BDM, the BDM registers and standard BDM firmware lookup table are mapped to addresses 0x3_FF00 to 0x3_FFFF. BDM registers are mapped to addresses 0x3_FF00 to 0x3_FF0B. The BDM uses these registers which are readable anytime by the BDM. However, these registers are not readable by user programs. When BDM is activated while CPU executes code overlapping with BDM firmware space the saved program counter (PC) will be auto incremented by one from the BDM firmware, no matter what caused the entry into BDM active mode (BGND instruction, BACKGROUND command or breakpoints). In such a case the PC must be set to the next valid address via a WRITE_PC command before executing the GO command. 5.4.3 BDM Hardware Commands Hardware commands are used to read and write target system memory locations and to enter active background debug mode. Target system memory includes all memory that is accessible by the CPU such as on-chip RAM, Flash, I/O and control registers. Hardware commands are executed with minimal or no CPU intervention and do not require the system to be in active BDM for execution, although, they can still be executed in this mode. When executing a hardware command, the BDM sub-block waits for a free bus cycle so that the background access does not disturb the running application program. If a free cycle is not found within 128 clock cycles, the CPU is momentarily frozen so that the BDM can steal a cycle. When the BDM finds a free cycle, the operation does not intrude on normal CPU operation provided that it can be completed in a single cycle. However, if an operation requires multiple cycles the CPU is frozen until the operation is complete, even though the BDM found a free cycle. The BDM hardware commands are listed in Table 5-5. The READ_BD and WRITE_BD commands allow access to the BDM register locations. These locations are not normally in the system memory map but share addresses with the application in memory. To distinguish between physical memory locations that share the same address, BDM memory resources are enabled just for the READ_BD and WRITE_BD access cycle. This allows the BDM to access BDM locations unobtrusively, even if the addresses conflict with the application memory map. Table 5-5. Hardware Commands Opcode (hex) Data Description BACKGROUND 90 None Enter background mode if BDM is enabled. If enabled, an ACK will be issued when the part enters active background mode. ACK_ENABLE D5 None Enable Handshake. Issues an ACK pulse after the command is executed. ACK_DISABLE D6 None Disable Handshake. This command does not issue an ACK pulse. Command MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 201 Background Debug Module (S12SBDMV1) Table 5-5. Hardware Commands (continued) Command Opcode (hex) Data Description READ_BD_BYTE E4 16-bit address 16-bit data out Read from memory with standard BDM firmware lookup table in map. Odd address data on low byte; even address data on high byte. READ_BD_WORD EC 16-bit address 16-bit data out Read from memory with standard BDM firmware lookup table in map. Must be aligned access. READ_BYTE E0 16-bit address 16-bit data out Read from memory with standard BDM firmware lookup table out of map. Odd address data on low byte; even address data on high byte. READ_WORD E8 16-bit address 16-bit data out Read from memory with standard BDM firmware lookup table out of map. Must be aligned access. WRITE_BD_BYTE C4 16-bit address 16-bit data in Write to memory with standard BDM firmware lookup table in map. Odd address data on low byte; even address data on high byte. WRITE_BD_WORD CC 16-bit address 16-bit data in Write to memory with standard BDM firmware lookup table in map. Must be aligned access. WRITE_BYTE C0 16-bit address 16-bit data in Write to memory with standard BDM firmware lookup table out of map. Odd address data on low byte; even address data on high byte. WRITE_WORD C8 16-bit address 16-bit data in Write to memory with standard BDM firmware lookup table out of map. Must be aligned access. NOTE: If enabled, ACK will occur when data is ready for transmission for all BDM READ commands and will occur after the write is complete for all BDM WRITE commands. 5.4.4 Standard BDM Firmware Commands BDM firmware commands are used to access and manipulate CPU resources. The system must be in active BDM to execute standard BDM firmware commands, see Section 5.4.2, “Enabling and Activating BDM”. Normal instruction execution is suspended while the CPU executes the firmware located in the standard BDM firmware lookup table. The hardware command BACKGROUND is the usual way to activate BDM. As the system enters active BDM, the standard BDM firmware lookup table and BDM registers become visible in the on-chip memory map at 0x3_FF00–0x3_FFFF, and the CPU begins executing the standard BDM firmware. The standard BDM firmware watches for serial commands and executes them as they are received. The firmware commands are shown in Table 5-6. MC9S12VR Family Reference Manual, Rev. 4.2 202 NXP Semiconductor Background Debug Module (S12SBDMV1) Table 5-6. Firmware Commands Opcode (hex) Data READ_NEXT2 62 16-bit data out Increment X index register by 2 (X = X + 2), then read word X points to. READ_PC 63 16-bit data out Read program counter. READ_D 64 16-bit data out Read D accumulator. READ_X 65 16-bit data out Read X index register. READ_Y 66 16-bit data out Read Y index register. 67 16-bit data out Read stack pointer. WRITE_NEXT 42 16-bit data in Increment X index register by 2 (X = X + 2), then write word to location pointed to by X. WRITE_PC 43 16-bit data in Write program counter. WRITE_D 44 16-bit data in Write D accumulator. WRITE_X 45 16-bit data in Write X index register. WRITE_Y 46 16-bit data in Write Y index register. WRITE_SP 47 16-bit data in Write stack pointer. GO 08 none Go to user program. If enabled, ACK will occur when leaving active background mode. GO_UNTIL3 0C none Go to user program. If enabled, ACK will occur upon returning to active background mode. TRACE1 10 none Execute one user instruction then return to active BDM. If enabled, ACK will occur upon returning to active background mode. TAGGO -> GO 18 none (Previous enable tagging and go to user program.) This command will be deprecated and should not be used anymore. Opcode will be executed as a GO command. Command1 READ_SP 2 Description 1 If enabled, ACK will occur when data is ready for transmission for all BDM READ commands and will occur after the write is complete for all BDM WRITE commands. 2 When the firmware command READ_NEXT or WRITE_NEXT is used to access the BDM address space the BDM resources are accessed rather than user code. Writing BDM firmware is not possible. 3 System stop disables the ACK function and ignored commands will not have an ACK-pulse (e.g., CPU in stop or wait mode). The GO_UNTIL command will not get an Acknowledge if CPU executes the wait or stop instruction before the “UNTIL” condition (BDM active again) is reached (see Section 5.4.7, “Serial Interface Hardware Handshake Protocol” last note). 5.4.5 BDM Command Structure Hardware and firmware BDM commands start with an 8-bit opcode followed by a 16-bit address and/or a 16-bit data word, depending on the command. All the read commands return 16 bits of data despite the byte or word implication in the command name. 8-bit reads return 16-bits of data, only one byte of which contains valid data. If reading an even address, the valid data will appear in the MSB. If reading an odd address, the valid data will appear in the LSB. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 203 Background Debug Module (S12SBDMV1) 16-bit misaligned reads and writes are generally not allowed. If attempted by BDM hardware command, the BDM ignores the least significant bit of the address and assumes an even address from the remaining bits. For hardware data read commands, the external host must wait at least 150 bus clock cycles after sending the address before attempting to obtain the read data. This is to be certain that valid data is available in the BDM shift register, ready to be shifted out. For hardware write commands, the external host must wait 150 bus clock cycles after sending the data to be written before attempting to send a new command. This is to avoid disturbing the BDM shift register before the write has been completed. The 150 bus clock cycle delay in both cases includes the maximum 128 cycle delay that can be incurred as the BDM waits for a free cycle before stealing a cycle. For BDM firmware read commands, the external host should wait at least 48 bus clock cycles after sending the command opcode and before attempting to obtain the read data. The 48 cycle wait allows enough time for the requested data to be made available in the BDM shift register, ready to be shifted out. For BDM firmware write commands, the external host must wait 36 bus clock cycles after sending the data to be written before attempting to send a new command. This is to avoid disturbing the BDM shift register before the write has been completed. The external host should wait for at least for 76 bus clock cycles after a TRACE1 or GO command before starting any new serial command. This is to allow the CPU to exit gracefully from the standard BDM firmware lookup table and resume execution of the user code. Disturbing the BDM shift register prematurely may adversely affect the exit from the standard BDM firmware lookup table. NOTE If the bus rate of the target processor is unknown or could be changing, it is recommended that the ACK (acknowledge function) is used to indicate when an operation is complete. When using ACK, the delay times are automated. Figure 5-6 represents the BDM command structure. The command blocks illustrate a series of eight bit times starting with a falling edge. The bar across the top of the blocks indicates that the BKGD line idles in the high state. The time for an 8-bit command is 8 16 target clock cycles.1 1. Target clock cycles are cycles measured using the target MCU’s serial clock rate. See Section 5.4.6, “BDM Serial Interface” and Section 5.3.2.1, “BDM Status Register (BDMSTS)” for information on how serial clock rate is selected. MC9S12VR Family Reference Manual, Rev. 4.2 204 NXP Semiconductor Background Debug Module (S12SBDMV1) 8 Bits AT ~16 TC/Bit Hardware Read 16 Bits AT ~16 TC/Bit Command 150-BC Delay 16 Bits AT ~16 TC/Bit Address Data Next Command 150-BC Delay Hardware Write Command Address Data Next Command 48-BC DELAY Firmware Read Command Data Next Command 36-BC DELAY Firmware Write Command Data Next Command 76-BC Delay GO, TRACE Command Next Command BC = Bus Clock Cycles TC = Target Clock Cycles Figure 5-6. BDM Command Structure 5.4.6 BDM Serial Interface The BDM communicates with external devices serially via the BKGD pin. During reset, this pin is a mode select input which selects between normal and special modes of operation. After reset, this pin becomes the dedicated serial interface pin for the BDM. The BDM serial interface is timed based on the VCO clock (please refer to the CPMU Block Guide for more details), which gets divided by 8. This clock will be referred to as the target clock in the following explanation. The BDM serial interface uses a clocking scheme in which the external host generates a falling edge on the BKGD pin to indicate the start of each bit time. This falling edge is sent for every bit whether data is transmitted or received. Data is transferred most significant bit (MSB) first at 16 target clock cycles per bit. The interface times out if 512 clock cycles occur between falling edges from the host. The BKGD pin is a pseudo open-drain pin and has an weak on-chip active pull-up that is enabled at all times. It is assumed that there is an external pull-up and that drivers connected to BKGD do not typically drive the high level. Since R-C rise time could be unacceptably long, the target system and host provide brief driven-high (speedup) pulses to drive BKGD to a logic 1. The source of this speedup pulse is the host for transmit cases and the target for receive cases. The timing for host-to-target is shown in Figure 5-7 and that of target-to-host in Figure 5-8 and Figure 5-9. All four cases begin when the host drives the BKGD pin low to generate a falling edge. Since the host and target are operating from separate clocks, it can take the target system up to one full clock cycle to recognize this edge. The target measures delays from this perceived start of the bit time while the host measures delays from the point it actually drove BKGD low to start the bit up to one target clock cycle MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 205 Background Debug Module (S12SBDMV1) earlier. Synchronization between the host and target is established in this manner at the start of every bit time. Figure 5-7 shows an external host transmitting a logic 1 and transmitting a logic 0 to the BKGD pin of a target system. The host is asynchronous to the target, so there is up to a one clock-cycle delay from the host-generated falling edge to where the target recognizes this edge as the beginning of the bit time. Ten target clock cycles later, the target senses the bit level on the BKGD pin. Internal glitch detect logic requires the pin be driven high no later that eight target clock cycles after the falling edge for a logic 1 transmission. Since the host drives the high speedup pulses in these two cases, the rising edges look like digitally driven signals. BDM Clock (Target MCU) Host Transmit 1 Host Transmit 0 Perceived Start of Bit Time Target Senses Bit 10 Cycles Synchronization Uncertainty Earliest Start of Next Bit Figure 5-7. BDM Host-to-Target Serial Bit Timing The receive cases are more complicated. Figure 5-8 shows the host receiving a logic 1 from the target system. Since the host is asynchronous to the target, there is up to one clock-cycle delay from the host-generated falling edge on BKGD to the perceived start of the bit time in the target. The host holds the BKGD pin low long enough for the target to recognize it (at least two target clock cycles). The host must release the low drive before the target drives a brief high speedup pulse seven target clock cycles after the perceived start of the bit time. The host should sample the bit level about 10 target clock cycles after it started the bit time. MC9S12VR Family Reference Manual, Rev. 4.2 206 NXP Semiconductor Background Debug Module (S12SBDMV1) BDM Clock (Target MCU) Host Drive to BKGD Pin Target System Speedup Pulse Perceived Start of Bit Time High-Impedance High-Impedance High-Impedance R-C Rise BKGD Pin 10 Cycles 10 Cycles Earliest Start of Next Bit Host Samples BKGD Pin Figure 5-8. BDM Target-to-Host Serial Bit Timing (Logic 1) Figure 5-9 shows the host receiving a logic 0 from the target. Since the host is asynchronous to the target, there is up to a one clock-cycle delay from the host-generated falling edge on BKGD to the start of the bit time as perceived by the target. The host initiates the bit time but the target finishes it. Since the target wants the host to receive a logic 0, it drives the BKGD pin low for 13 target clock cycles then briefly drives it high to speed up the rising edge. The host samples the bit level about 10 target clock cycles after starting the bit time. BDM Clock (Target MCU) Host Drive to BKGD Pin High-Impedance Speedup Pulse Target System Drive and Speedup Pulse Perceived Start of Bit Time BKGD Pin 10 Cycles 10 Cycles Host Samples BKGD Pin Earliest Start of Next Bit Figure 5-9. BDM Target-to-Host Serial Bit Timing (Logic 0) MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 207 Background Debug Module (S12SBDMV1) 5.4.7 Serial Interface Hardware Handshake Protocol BDM commands that require CPU execution are ultimately treated at the MCU bus rate. Since the BDM clock source can be modified when changing the settings for the VCO frequency (CPMUSYNR), it is very helpful to provide a handshake protocol in which the host could determine when an issued command is executed by the CPU. The BDM clock frequency is always VCO frequency divided by 8. The alternative is to always wait the amount of time equal to the appropriate number of cycles at the slowest possible rate the clock could be running. This sub-section will describe the hardware handshake protocol. The hardware handshake protocol signals to the host controller when an issued command was successfully executed by the target. This protocol is implemented by a 16 serial clock cycle low pulse followed by a brief speedup pulse in the BKGD pin. This pulse is generated by the target MCU when a command, issued by the host, has been successfully executed (see Figure 5-10). This pulse is referred to as the ACK pulse. After the ACK pulse has finished: the host can start the bit retrieval if the last issued command was a read command, or start a new command if the last command was a write command or a control command (BACKGROUND, GO, GO_UNTIL or TRACE1). The ACK pulse is not issued earlier than 32 serial clock cycles after the BDM command was issued. The end of the BDM command is assumed to be the 16th tick of the last bit. This minimum delay assures enough time for the host to perceive the ACK pulse. Note also that, there is no upper limit for the delay between the command and the related ACK pulse, since the command execution depends upon the CPU bus, which in some cases could be very slow due to long accesses taking place.This protocol allows a great flexibility for the POD designers, since it does not rely on any accurate time measurement or short response time to any event in the serial communication. BDM Clock (Target MCU) Target Transmits ACK Pulse High-Impedance 32 Cycles 16 Cycles High-Impedance Speedup Pulse Minimum Delay From the BDM Command BKGD Pin Earliest Start of Next Bit 16th Tick of the Last Command Bit Figure 5-10. Target Acknowledge Pulse (ACK) NOTE If the ACK pulse was issued by the target, the host assumes the previous command was executed. If the CPU enters wait or stop prior to executing a hardware command, the ACK pulse will not be issued meaning that the BDM command was not executed. After entering wait or stop mode, the BDM command is no longer pending. MC9S12VR Family Reference Manual, Rev. 4.2 208 NXP Semiconductor Background Debug Module (S12SBDMV1) Figure 5-11 shows the ACK handshake protocol in a command level timing diagram. The READ_BYTE instruction is used as an example. First, the 8-bit instruction opcode is sent by the host, followed by the address of the memory location to be read. The target BDM decodes the instruction. A bus cycle is grabbed (free or stolen) by the BDM and it executes the READ_BYTE operation. Having retrieved the data, the BDM issues an ACK pulse to the host controller, indicating that the addressed byte is ready to be retrieved. After detecting the ACK pulse, the host initiates the byte retrieval process. Note that data is sent in the form of a word and the host needs to determine which is the appropriate byte based on whether the address was odd or even. Target BKGD Pin READ_BYTE Host Byte Address Host (2) Bytes are Retrieved New BDM Command Host Target Target BDM Issues the ACK Pulse (out of scale) BDM Decodes the Command BDM Executes the READ_BYTE Command Figure 5-11. Handshake Protocol at Command Level Differently from the normal bit transfer (where the host initiates the transmission), the serial interface ACK handshake pulse is initiated by the target MCU by issuing a negative edge in the BKGD pin. The hardware handshake protocol in Figure 5-10 specifies the timing when the BKGD pin is being driven, so the host should follow this timing constraint in order to avoid the risk of an electrical conflict in the BKGD pin. NOTE The only place the BKGD pin can have an electrical conflict is when one side is driving low and the other side is issuing a speedup pulse (high). Other “highs” are pulled rather than driven. However, at low rates the time of the speedup pulse can become lengthy and so the potential conflict time becomes longer as well. The ACK handshake protocol does not support nested ACK pulses. If a BDM command is not acknowledge by an ACK pulse, the host needs to abort the pending command first in order to be able to issue a new BDM command. When the CPU enters wait or stop while the host issues a hardware command (e.g., WRITE_BYTE), the target discards the incoming command due to the wait or stop being detected. Therefore, the command is not acknowledged by the target, which means that the ACK pulse will not be issued in this case. After a certain time the host (not aware of stop or wait) should decide to abort any possible pending ACK pulse in order to be sure a new command can be issued. Therefore, the protocol provides a mechanism in which a command, and its corresponding ACK, can be aborted. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 209 Background Debug Module (S12SBDMV1) NOTE The ACK pulse does not provide a time out. This means for the GO_UNTIL command that it can not be distinguished if a stop or wait has been executed (command discarded and ACK not issued) or if the “UNTIL” condition (BDM active) is just not reached yet. Hence in any case where the ACK pulse of a command is not issued the possible pending command should be aborted before issuing a new command. See the handshake abort procedure described in Section 5.4.8, “Hardware Handshake Abort Procedure”. 5.4.8 Hardware Handshake Abort Procedure The abort procedure is based on the SYNC command. In order to abort a command, which had not issued the corresponding ACK pulse, the host controller should generate a low pulse in the BKGD pin by driving it low for at least 128 serial clock cycles and then driving it high for one serial clock cycle, providing a speedup pulse. By detecting this long low pulse in the BKGD pin, the target executes the SYNC protocol, see Section 5.4.9, “SYNC — Request Timed Reference Pulse”, and assumes that the pending command and therefore the related ACK pulse, are being aborted. Therefore, after the SYNC protocol has been completed the host is free to issue new BDM commands. For BDM firmware READ or WRITE commands it can not be guaranteed that the pending command is aborted when issuing a SYNC before the corresponding ACK pulse. There is a short latency time from the time the READ or WRITE access begins until it is finished and the corresponding ACK pulse is issued. The latency time depends on the firmware READ or WRITE command that is issued and on the selected bus clock rate. When the SYNC command starts during this latency time the READ or WRITE command will not be aborted, but the corresponding ACK pulse will be aborted. A pending GO, TRACE1 or GO_UNTIL command can not be aborted. Only the corresponding ACK pulse can be aborted by the SYNC command. Although it is not recommended, the host could abort a pending BDM command by issuing a low pulse in the BKGD pin shorter than 128 serial clock cycles, which will not be interpreted as the SYNC command. The ACK is actually aborted when a negative edge is perceived by the target in the BKGD pin. The short abort pulse should have at least 4 clock cycles keeping the BKGD pin low, in order to allow the negative edge to be detected by the target. In this case, the target will not execute the SYNC protocol but the pending command will be aborted along with the ACK pulse. The potential problem with this abort procedure is when there is a conflict between the ACK pulse and the short abort pulse. In this case, the target may not perceive the abort pulse. The worst case is when the pending command is a read command (i.e., READ_BYTE). If the abort pulse is not perceived by the target the host will attempt to send a new command after the abort pulse was issued, while the target expects the host to retrieve the accessed memory byte. In this case, host and target will run out of synchronism. However, if the command to be aborted is not a read command the short abort pulse could be used. After a command is aborted the target assumes the next negative edge, after the abort pulse, is the first bit of a new BDM command. NOTE The details about the short abort pulse are being provided only as a reference for the reader to better understand the BDM internal behavior. It is not recommended that this procedure be used in a real application. MC9S12VR Family Reference Manual, Rev. 4.2 210 NXP Semiconductor Background Debug Module (S12SBDMV1) Since the host knows the target serial clock frequency, the SYNC command (used to abort a command) does not need to consider the lower possible target frequency. In this case, the host could issue a SYNC very close to the 128 serial clock cycles length. Providing a small overhead on the pulse length in order to assure the SYNC pulse will not be misinterpreted by the target. See Section 5.4.9, “SYNC — Request Timed Reference Pulse”. Figure 5-12 shows a SYNC command being issued after a READ_BYTE, which aborts the READ_BYTE command. Note that, after the command is aborted a new command could be issued by the host computer. READ_BYTE CMD is Aborted by the SYNC Request (Out of Scale) BKGD Pin READ_BYTE Host Memory Address SYNC Response From the Target (Out of Scale) READ_STATUS Target Host BDM Decode and Starts to Execute the READ_BYTE Command Target New BDM Command Host Target New BDM Command Figure 5-12. ACK Abort Procedure at the Command Level NOTE Figure 5-12 does not represent the signals in a true timing scale Figure 5-13 shows a conflict between the ACK pulse and the SYNC request pulse. This conflict could occur if a POD device is connected to the target BKGD pin and the target is already in debug active mode. Consider that the target CPU is executing a pending BDM command at the exact moment the POD is being connected to the BKGD pin. In this case, an ACK pulse is issued along with the SYNC command. In this case, there is an electrical conflict between the ACK speedup pulse and the SYNC pulse. Since this is not a probable situation, the protocol does not prevent this conflict from happening. At Least 128 Cycles BDM Clock (Target MCU) Target MCU Drives to BKGD Pin Host Drives SYNC To BKGD Pin ACK Pulse High-Impedance Host and Target Drive to BKGD Pin Electrical Conflict Speedup Pulse Host SYNC Request Pulse BKGD Pin 16 Cycles Figure 5-13. ACK Pulse and SYNC Request Conflict MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 211 Background Debug Module (S12SBDMV1) NOTE This information is being provided so that the MCU integrator will be aware that such a conflict could occur. The hardware handshake protocol is enabled by the ACK_ENABLE and disabled by the ACK_DISABLE BDM commands. This provides backwards compatibility with the existing POD devices which are not able to execute the hardware handshake protocol. It also allows for new POD devices, that support the hardware handshake protocol, to freely communicate with the target device. If desired, without the need for waiting for the ACK pulse. The commands are described as follows: • ACK_ENABLE — enables the hardware handshake protocol. The target will issue the ACK pulse when a CPU command is executed by the CPU. The ACK_ENABLE command itself also has the ACK pulse as a response. • ACK_DISABLE — disables the ACK pulse protocol. In this case, the host needs to use the worst case delay time at the appropriate places in the protocol. The default state of the BDM after reset is hardware handshake protocol disabled. All the read commands will ACK (if enabled) when the data bus cycle has completed and the data is then ready for reading out by the BKGD serial pin. All the write commands will ACK (if enabled) after the data has been received by the BDM through the BKGD serial pin and when the data bus cycle is complete. See Section 5.4.3, “BDM Hardware Commands” and Section 5.4.4, “Standard BDM Firmware Commands” for more information on the BDM commands. The ACK_ENABLE sends an ACK pulse when the command has been completed. This feature could be used by the host to evaluate if the target supports the hardware handshake protocol. If an ACK pulse is issued in response to this command, the host knows that the target supports the hardware handshake protocol. If the target does not support the hardware handshake protocol the ACK pulse is not issued. In this case, the ACK_ENABLE command is ignored by the target since it is not recognized as a valid command. The BACKGROUND command will issue an ACK pulse when the CPU changes from normal to background mode. The ACK pulse related to this command could be aborted using the SYNC command. The GO command will issue an ACK pulse when the CPU exits from background mode. The ACK pulse related to this command could be aborted using the SYNC command. The GO_UNTIL command is equivalent to a GO command with exception that the ACK pulse, in this case, is issued when the CPU enters into background mode. This command is an alternative to the GO command and should be used when the host wants to trace if a breakpoint match occurs and causes the CPU to enter active background mode. Note that the ACK is issued whenever the CPU enters BDM, which could be caused by a breakpoint match or by a BGND instruction being executed. The ACK pulse related to this command could be aborted using the SYNC command. The TRACE1 command has the related ACK pulse issued when the CPU enters background active mode after one instruction of the application program is executed. The ACK pulse related to this command could be aborted using the SYNC command. MC9S12VR Family Reference Manual, Rev. 4.2 212 NXP Semiconductor Background Debug Module (S12SBDMV1) 5.4.9 SYNC — Request Timed Reference Pulse The SYNC command is unlike other BDM commands because the host does not necessarily know the correct communication speed to use for BDM communications until after it has analyzed the response to the SYNC command. To issue a SYNC command, the host should perform the following steps: 1. Drive the BKGD pin low for at least 128 cycles at the lowest possible BDM serial communication frequency (The lowest serial communication frequency is determined by the settings for the VCO clock (CPMUSYNR). The BDM clock frequency is always VCO clock frequency divided by 8.) 2. Drive BKGD high for a brief speedup pulse to get a fast rise time (this speedup pulse is typically one cycle of the host clock.) 3. Remove all drive to the BKGD pin so it reverts to high impedance. 4. Listen to the BKGD pin for the sync response pulse. Upon detecting the SYNC request from the host, the target performs the following steps: 1. Discards any incomplete command received or bit retrieved. 2. Waits for BKGD to return to a logic one. 3. Delays 16 cycles to allow the host to stop driving the high speedup pulse. 4. Drives BKGD low for 128 cycles at the current BDM serial communication frequency. 5. Drives a one-cycle high speedup pulse to force a fast rise time on BKGD. 6. Removes all drive to the BKGD pin so it reverts to high impedance. The host measures the low time of this 128 cycle SYNC response pulse and determines the correct speed for subsequent BDM communications. Typically, the host can determine the correct communication speed within a few percent of the actual target speed and the communication protocol can easily tolerate speed errors of several percent. As soon as the SYNC request is detected by the target, any partially received command or bit retrieved is discarded. This is referred to as a soft-reset, equivalent to a time-out in the serial communication. After the SYNC response, the target will consider the next negative edge (issued by the host) as the start of a new BDM command or the start of new SYNC request. Another use of the SYNC command pulse is to abort a pending ACK pulse. The behavior is exactly the same as in a regular SYNC command. Note that one of the possible causes for a command to not be acknowledged by the target is a host-target synchronization problem. In this case, the command may not have been understood by the target and so an ACK response pulse will not be issued. 5.4.10 Instruction Tracing When a TRACE1 command is issued to the BDM in active BDM, the CPU exits the standard BDM firmware and executes a single instruction in the user code. Once this has occurred, the CPU is forced to return to the standard BDM firmware and the BDM is active and ready to receive a new command. If the TRACE1 command is issued again, the next user instruction will be executed. This facilitates stepping or tracing through the user code one instruction at a time. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 213 Background Debug Module (S12SBDMV1) If an interrupt is pending when a TRACE1 command is issued, the interrupt stacking operation occurs but no user instruction is executed. Once back in standard BDM firmware execution, the program counter points to the first instruction in the interrupt service routine. Be aware when tracing through the user code that the execution of the user code is done step by step but all peripherals are free running. Hence possible timing relations between CPU code execution and occurrence of events of other peripherals no longer exist. Do not trace the CPU instruction BGND used for soft breakpoints. Tracing over the BGND instruction will result in a return address pointing to BDM firmware address space. When tracing through user code which contains stop or wait instructions the following will happen when the stop or wait instruction is traced: The CPU enters stop or wait mode and the TRACE1 command can not be finished before leaving the low power mode. This is the case because BDM active mode can not be entered after CPU executed the stop instruction. However all BDM hardware commands except the BACKGROUND command are operational after tracing a stop or wait instruction and still being in stop or wait mode. If system stop mode is entered (all bus masters are in stop mode) no BDM command is operational. As soon as stop or wait mode is exited the CPU enters BDM active mode and the saved PC value points to the entry of the corresponding interrupt service routine. In case the handshake feature is enabled the corresponding ACK pulse of the TRACE1 command will be discarded when tracing a stop or wait instruction. Hence there is no ACK pulse when BDM active mode is entered as part of the TRACE1 command after CPU exited from stop or wait mode. All valid commands sent during CPU being in stop or wait mode or after CPU exited from stop or wait mode will have an ACK pulse. The handshake feature becomes disabled only when system stop mode has been reached. Hence after a system stop mode the handshake feature must be enabled again by sending the ACK_ENABLE command. 5.4.11 Serial Communication Time Out The host initiates a host-to-target serial transmission by generating a falling edge on the BKGD pin. If BKGD is kept low for more than 128 target clock cycles, the target understands that a SYNC command was issued. In this case, the target will keep waiting for a rising edge on BKGD in order to answer the SYNC request pulse. If the rising edge is not detected, the target will keep waiting forever without any time-out limit. Consider now the case where the host returns BKGD to logic one before 128 cycles. This is interpreted as a valid bit transmission, and not as a SYNC request. The target will keep waiting for another falling edge marking the start of a new bit. If, however, a new falling edge is not detected by the target within 512 clock cycles since the last falling edge, a time-out occurs and the current command is discarded without affecting memory or the operating mode of the MCU. This is referred to as a soft-reset. If a read command is issued but the data is not retrieved within 512 serial clock cycles, a soft-reset will occur causing the command to be disregarded. The data is not available for retrieval after the time-out has occurred. This is the expected behavior if the handshake protocol is not enabled. In order to allow the data to be retrieved even with a large clock frequency mismatch (between BDM and CPU) when the hardware MC9S12VR Family Reference Manual, Rev. 4.2 214 NXP Semiconductor Background Debug Module (S12SBDMV1) handshake protocol is enabled, the time out between a read command and the data retrieval is disabled. Therefore, the host could wait for more then 512 serial clock cycles and still be able to retrieve the data from an issued read command. However, once the handshake pulse (ACK pulse) is issued, the time-out feature is re-activated, meaning that the target will time out after 512 clock cycles. Therefore, the host needs to retrieve the data within a 512 serial clock cycles time frame after the ACK pulse had been issued. After that period, the read command is discarded and the data is no longer available for retrieval. Any negative edge in the BKGD pin after the time-out period is considered to be a new command or a SYNC request. Note that whenever a partially issued command, or partially retrieved data, has occurred the time out in the serial communication is active. This means that if a time frame higher than 512 serial clock cycles is observed between two consecutive negative edges and the command being issued or data being retrieved is not complete, a soft-reset will occur causing the partially received command or data retrieved to be disregarded. The next negative edge in the BKGD pin, after a soft-reset has occurred, is considered by the target as the start of a new BDM command, or the start of a SYNC request pulse. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 215 Background Debug Module (S12SBDMV1) MC9S12VR Family Reference Manual, Rev. 4.2 216 NXP Semiconductor Chapter 6 S12S Debug Module (S12DBGV2) Table 6-1. Revision History Revision Number Revision Date Sections Affected 02.08 09.MAY.2008 General Spelling corrections. Revision history format changed. 02.09 29.MAY.2008 6.4.5.4 Added note for end aligned, PurePC, rollover case. 02.10 27.SEP.2012 General Changed cross reference formats 6.1 Summary of Changes Introduction The S12DBGV2 module provides an on-chip trace buffer with flexible triggering capability to allow non-intrusive debug of application software. The S12DBGV2 module is optimized for S12SCPU debugging. Typically the S12DBGV2 module is used in conjunction with the S12SBDM module, whereby the user configures the S12DBGV2 module for a debugging session over the BDM interface. Once configured the S12DBGV2 module is armed and the device leaves BDM returning control to the user program, which is then monitored by the S12DBGV2 module. Alternatively the S12DBGV2 module can be configured over a serial interface using SWI routines. 6.1.1 Glossary Of Terms COF: Change Of Flow. Change in the program flow due to a conditional branch, indexed jump or interrupt BDM: Background Debug Mode S12SBDM: Background Debug Module DUG: Device User Guide, describing the features of the device into which the DBG is integrated WORD: 16-bit data entity Data Line: 20-bit data entity CPU: S12SCPU module DBG: S12SDBG module POR: Power On Reset MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 217 S12S Debug Module (S12DBGV2) Tag: Tags can be attached to CPU opcodes as they enter the instruction pipe. If the tagged opcode reaches the execution stage a tag hit occurs. 6.1.2 Overview The comparators monitor the bus activity of the CPU module. A match can initiate a state sequencer transition. On a transition to the Final State, bus tracing is triggered and/or a breakpoint can be generated. Independent of comparator matches a transition to Final State with associated tracing and breakpoint can be triggered immediately by writing to the TRIG control bit. The trace buffer is visible through a 2-byte window in the register address map and can be read out using standard 16-bit word reads. Tracing is disabled when the MCU system is secured. 6.1.3 • • • • • • Features Three comparators (A, B and C) — Comparators A compares the full address bus and full 16-bit data bus — Comparator A features a data bus mask register — Comparators B and C compare the full address bus only — Each comparator features selection of read or write access cycles — Comparator B allows selection of byte or word access cycles — Comparator matches can initiate state sequencer transitions Three comparator modes — Simple address/data comparator match mode — Inside address range mode, Addmin Address Addmax — Outside address range match mode, Address Addminor Address Addmax Two types of matches — Tagged — This matches just before a specific instruction begins execution — Force — This is valid on the first instruction boundary after a match occurs Two types of breakpoints — CPU breakpoint entering BDM on breakpoint (BDM) — CPU breakpoint executing SWI on breakpoint (SWI) Trigger mode independent of comparators — TRIG Immediate software trigger Four trace modes — Normal: change of flow (COF) PC information is stored (see Section 6.4.5.2.1, “Normal Mode) for change of flow definition. — Loop1: same as Normal but inhibits consecutive duplicate source address entries — Detail: address and data for all cycles except free cycles and opcode fetches are stored — Compressed Pure PC: all program counter addresses are stored MC9S12VR Family Reference Manual, Rev. 4.2 218 NXP Semiconductor S12S Debug Module (S12DBGV2) • 4-stage state sequencer for trace buffer control — Tracing session trigger linked to Final State of state sequencer — Begin and End alignment of tracing to trigger 6.1.4 Modes of Operation The DBG module can be used in all MCU functional modes. During BDM hardware accesses and whilst the BDM module is active, CPU monitoring is disabled. When the CPU enters active BDM Mode through a BACKGROUND command, the DBG module, if already armed, remains armed. The DBG module tracing is disabled if the MCU is secure, however, breakpoints can still be generated. Table 6-2. Mode Dependent Restriction Summary BDM Enable BDM Active MCU Secure Comparator Matches Enabled Breakpoints Possible Tagging Possible Tracing Possible x x 1 Yes Yes Yes No 0 0 0 Yes Only SWI Yes Yes 0 1 0 1 0 0 Yes Yes Yes Yes 1 1 0 No No No No 6.1.5 Active BDM not possible when not enabled Block Diagram TAGS TAGHITS BREAKPOINT REQUESTS TO CPU COMPARATOR A COMPARATOR B COMPARATOR C COMPARATOR MATCH CONTROL CPU BUS BUS INTERFACE SECURE MATCH0 MATCH1 TAG & MATCH CONTROL LOGIC TRANSITION STATE STATE SEQUENCER STATE MATCH2 TRACE CONTROL TRIGGER TRACE BUFFER READ TRACE DATA (DBG READ DATA BUS) Figure 6-1. Debug Module Block Diagram MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 219 S12S Debug Module (S12DBGV2) 6.2 External Signal Description There are no external signals associated with this module. 6.3 6.3.1 Memory Map and Registers Module Memory Map A summary of the registers associated with the DBG sub-block is shown in Figure 6-2. Detailed descriptions of the registers and bits are given in the subsections that follow. 2 3 4 Address Name Bit 7 6 5 0x0020 DBGC1 R W 0x0021 DBGSR 0x0022 ARM 0 TRIG 0 R W 1TBF 0 DBGTCR R W 0 0x0023 DBGC2 R W 0 0x0024 DBGTBH R W 0x0025 DBGTBL R W 0x0026 DBGCNT R 1 TBF W 0 0x0027 DBGSCRX 0 0 0 0 0x0027 DBGMFR R W R W 0 0 0 SZE SZ SZE SZ 0 0 0 0x0028 0x0028 0x0028 R W R DBGBCTL W R DBGCCTL W DBGACTL 4 3 BDM DBGBRK 0 0 0 0 0 0 0 0 0 0 Bit 15 Bit 14 Bit 13 Bit 12 Bit 11 Bit 10 Bit 9 Bit 8 Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 Bit 0 SC3 SC2 SC1 SC0 0 0 MC2 MC1 MC0 TAG BRK RW RWE NDB COMPE TAG BRK RW RWE TAG BRK RW RWE 0 0 0 0 0 TSOURCE 2 1 0 SSF2 Bit 0 COMRV SSF1 0 TRCMOD SSF0 TALIGN ABCM CNT 0x0029 DBGXAH R W 0x002A DBGXAM R W Bit 15 14 13 12 11 0x002B DBGXAL R W Bit 7 6 5 4 3 0 0 COMPE COMPE Bit 17 Bit 16 10 9 Bit 8 2 1 Bit 0 Figure 6-2. Quick Reference to DBG Registers MC9S12VR Family Reference Manual, Rev. 4.2 220 NXP Semiconductor S12S Debug Module (S12DBGV2) Address Name 0x002C DBGADH 0x002D 0x002E 2 3 4 6 5 4 3 2 1 Bit 0 R W Bit 15 14 13 12 11 10 9 Bit 8 DBGADL R W Bit 7 6 5 4 3 2 1 Bit 0 DBGADHM R W Bit 15 14 13 12 11 10 9 Bit 8 2 1 Bit 0 R Bit 7 6 5 4 3 W This bit is visible at DBGCNT[7] and DBGSR[7] This represents the contents if the Comparator A control register is blended into this address. This represents the contents if the Comparator B control register is blended into this address This represents the contents if the Comparator C control register is blended into this address 0x002F 1 Bit 7 DBGADLM Figure 6-2. Quick Reference to DBG Registers 6.3.2 Register Descriptions This section consists of the DBG control and trace buffer register descriptions in address order. Each comparator has a bank of registers that are visible through an 8-byte window between 0x0028 and 0x002F in the DBG module register address map. When ARM is set in DBGC1, the only bits in the DBG module registers that can be written are ARM, TRIG, and COMRV[1:0]. 6.3.2.1 Debug Control Register 1 (DBGC1) Address: 0x0020 7 R W Reset ARM 0 6 5 0 0 TRIG 0 0 4 3 BDM DBGBRK 0 0 2 1 0 0 0 COMRV 0 0 = Unimplemented or Reserved Figure 6-3. Debug Control Register (DBGC1) Read: Anytime Write: Bits 7, 1, 0 anytime Bit 6 can be written anytime but always reads back as 0. Bits 4:3 anytime DBG is not armed. NOTE When disarming the DBG by clearing ARM with software, the contents of bits[4:3] are not affected by the write, since up until the write operation, ARM = 1 preventing these bits from being written. These bits must be cleared using a second write if required. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 221 S12S Debug Module (S12DBGV2) Table 6-3. DBGC1 Field Descriptions Field Description 7 ARM Arm Bit — The ARM bit controls whether the DBG module is armed. This bit can be set and cleared by user software and is automatically cleared on completion of a debug session, or if a breakpoint is generated with tracing not enabled. On setting this bit the state sequencer enters State1. 0 Debugger disarmed 1 Debugger armed 6 TRIG Immediate Trigger Request Bit — This bit when written to 1 requests an immediate trigger independent of state sequencer status. When tracing is complete a forced breakpoint may be generated depending upon DBGBRK and BDM bit settings. This bit always reads back a 0. Writing a 0 to this bit has no effect. If the DBGTCR_TSOURCE bit is clear no tracing is carried out. If tracing has already commenced using BEGIN trigger alignment, it continues until the end of the tracing session as defined by the TALIGN bit, thus TRIG has no affect. In secure mode tracing is disabled and writing to this bit cannot initiate a tracing session. The session is ended by setting TRIG and ARM simultaneously. 0 Do not trigger until the state sequencer enters the Final State. 1 Trigger immediately 4 BDM Background Debug Mode Enable — This bit determines if a breakpoint causes the system to enter Background Debug Mode (BDM) or initiate a Software Interrupt (SWI). If this bit is set but the BDM is not enabled by the ENBDM bit in the BDM module, then breakpoints default to SWI. 0 Breakpoint to Software Interrupt if BDM inactive. Otherwise no breakpoint. 1 Breakpoint to BDM, if BDM enabled. Otherwise breakpoint to SWI 3 DBGBRK S12DBGV2 Breakpoint Enable Bit — The DBGBRK bit controls whether the debugger will request a breakpoint on reaching the state sequencer Final State. If tracing is enabled, the breakpoint is generated on completion of the tracing session. If tracing is not enabled, the breakpoint is generated immediately. 0 No Breakpoint generated 1 Breakpoint generated 1–0 COMRV Comparator Register Visibility Bits — These bits determine which bank of comparator register is visible in the 8-byte window of the S12SDBG module address map, located between 0x0028 to 0x002F. Furthermore these bits determine which register is visible at the address 0x0027. See Table 6-4. Table 6-4. COMRV Encoding 6.3.2.2 COMRV Visible Comparator Visible Register at 0x0027 00 Comparator A DBGSCR1 01 Comparator B DBGSCR2 10 Comparator C DBGSCR3 11 None DBGMFR Debug Status Register (DBGSR) MC9S12VR Family Reference Manual, Rev. 4.2 222 NXP Semiconductor S12S Debug Module (S12DBGV2) Address: 0x0021 R 7 6 5 4 3 2 1 0 TBF 0 0 0 0 SSF2 SSF1 SSF0 — 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 W Reset POR = Unimplemented or Reserved Figure 6-4. Debug Status Register (DBGSR) Read: Anytime Write: Never Table 6-5. DBGSR Field Descriptions Field Description 7 TBF Trace Buffer Full — The TBF bit indicates that the trace buffer has stored 64 or more lines of data since it was last armed. If this bit is set, then all 64 lines will be valid data, regardless of the value of DBGCNT bits. The TBF bit is cleared when ARM in DBGC1 is written to a one. The TBF is cleared by the power on reset initialization. Other system generated resets have no affect on this bit This bit is also visible at DBGCNT[7] 2–0 SSF[2:0] State Sequencer Flag Bits — The SSF bits indicate in which state the State Sequencer is currently in. During a debug session on each transition to a new state these bits are updated. If the debug session is ended by software clearing the ARM bit, then these bits retain their value to reflect the last state of the state sequencer before disarming. If a debug session is ended by an internal event, then the state sequencer returns to state0 and these bits are cleared to indicate that state0 was entered during the session. On arming the module the state sequencer enters state1 and these bits are forced to SSF[2:0] = 001. See Table 6-6. Table 6-6. SSF[2:0] — State Sequence Flag Bit Encoding SSF[2:0] Current State 000 State0 (disarmed) 001 State1 010 State2 011 State3 100 Final State 101,110,111 Reserved MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 223 S12S Debug Module (S12DBGV2) 6.3.2.3 Debug Trace Control Register (DBGTCR) Address: 0x0022 7 R 0 W Reset 6 TSOURCE 0 0 5 4 0 0 0 0 3 2 0 TRCMOD 0 1 0 0 TALIGN 0 0 Figure 6-5. Debug Trace Control Register (DBGTCR) Read: Anytime Write: Bit 6 only when DBG is neither secure nor armed.Bits 3,2,0 anytime the module is disarmed. Table 6-7. DBGTCR Field Descriptions Field Description 6 TSOURCE Trace Source Control Bit — The TSOURCE bit enables a tracing session given a trigger condition. If the MCU system is secured, this bit cannot be set and tracing is inhibited. This bit must be set to read the trace buffer. 0 Debug session without tracing requested 1 Debug session with tracing requested 3–2 TRCMOD Trace Mode Bits — See Section 6.4.5.2, “Trace Modes for detailed Trace Mode descriptions. In Normal Mode, change of flow information is stored. In Loop1 Mode, change of flow information is stored but redundant entries into trace memory are inhibited. In Detail Mode, address and data for all memory and register accesses is stored. In Compressed Pure PC mode the program counter value for each instruction executed is stored. See Table 6-8. 0 TALIGN Trigger Align Bit — This bit controls whether the trigger is aligned to the beginning or end of a tracing session. 0 Trigger at end of stored data 1 Trigger before storing data Table 6-8. TRCMOD Trace Mode Bit Encoding TRCMOD Description 00 Normal 01 Loop1 10 Detail 11 Compressed Pure PC MC9S12VR Family Reference Manual, Rev. 4.2 224 NXP Semiconductor S12S Debug Module (S12DBGV2) 6.3.2.4 Debug Control Register2 (DBGC2) Address: 0x0023 R 7 6 5 4 3 2 0 0 0 0 0 0 0 0 0 0 0 1 0 ABCM W Reset 0 0 0 = Unimplemented or Reserved Figure 6-6. Debug Control Register2 (DBGC2) Read: Anytime Write: Anytime the module is disarmed. This register configures the comparators for range matching. Table 6-9. DBGC2 Field Descriptions Field Description 1–0 ABCM[1:0] A and B Comparator Match Control — These bits determine the A and B comparator match mapping as described in Table 6-10. Table 6-10. ABCM Encoding 1 ABCM Description 00 Match0 mapped to comparator A match: Match1 mapped to comparator B match. 01 Match 0 mapped to comparator A/B inside range: Match1 disabled. 10 Match 0 mapped to comparator A/B outside range: Match1 disabled. 11 Reserved1 Currently defaults to Comparator A, Comparator B disabled 6.3.2.5 Address: Debug Trace Buffer Register (DBGTBH:DBGTBL) 0x0024, 0x0025 15 R W 14 13 12 11 10 Bit 15 Bit 14 Bit 13 Bit 12 Bit 11 Bit 10 9 8 7 6 5 4 3 2 1 0 Bit 9 Bit 8 Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 Bit 0 POR X X X X X X X X X X X X X X X X Other Resets — — — — — — — — — — — — — — — — Figure 6-7. Debug Trace Buffer Register (DBGTB) Read: Only when unlocked AND unsecured AND not armed AND TSOURCE set. Write: Aligned word writes when disarmed unlock the trace buffer for reading but do not affect trace buffer contents. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 225 S12S Debug Module (S12DBGV2) Table 6-11. DBGTB Field Descriptions Field Description 15–0 Bit[15:0] Trace Buffer Data Bits — The Trace Buffer Register is a window through which the 20-bit wide data lines of the Trace Buffer may be read 16 bits at a time. Each valid read of DBGTB increments an internal trace buffer pointer which points to the next address to be read. When the ARM bit is set the trace buffer is locked to prevent reading. The trace buffer can only be unlocked for reading by writing to DBGTB with an aligned word write when the module is disarmed. The DBGTB register can be read only as an aligned word, any byte reads or misaligned access of these registers return 0 and do not cause the trace buffer pointer to increment to the next trace buffer address. Similarly reads while the debugger is armed or with the TSOURCE bit clear, return 0 and do not affect the trace buffer pointer. The POR state is undefined. Other resets do not affect the trace buffer contents. MC9S12VR Family Reference Manual, Rev. 4.2 226 NXP Semiconductor S12S Debug Module (S12DBGV2) 6.3.2.6 Debug Count Register (DBGCNT) Address: 0x0026 R 7 6 TBF 0 — 0 — 0 5 4 3 2 1 0 — 0 — 0 — 0 CNT W Reset POR — 0 — 0 — 0 = Unimplemented or Reserved Figure 6-8. Debug Count Register (DBGCNT) Read: Anytime Write: Never Table 6-12. DBGCNT Field Descriptions Field Description 7 TBF Trace Buffer Full — The TBF bit indicates that the trace buffer has stored 64 or more lines of data since it was last armed. If this bit is set, then all 64 lines will be valid data, regardless of the value of DBGCNT bits. The TBF bit is cleared when ARM in DBGC1 is written to a one. The TBF is cleared by the power on reset initialization. Other system generated resets have no affect on this bit This bit is also visible at DBGSR[7] 5–0 CNT[5:0] Count Value — The CNT bits indicate the number of valid data 20-bit data lines stored in the Trace Buffer. Table 6-13 shows the correlation between the CNT bits and the number of valid data lines in the Trace Buffer. When the CNT rolls over to zero, the TBF bit in DBGSR is set and incrementing of CNT will continue in end-trigger mode. The DBGCNT register is cleared when ARM in DBGC1 is written to a one. The DBGCNT register is cleared by power-on-reset initialization but is not cleared by other system resets. Thus should a reset occur during a debug session, the DBGCNT register still indicates after the reset, the number of valid trace buffer entries stored before the reset occurred. The DBGCNT register is not decremented when reading from the trace buffer. Table 6-13. CNT Decoding Table TBF CNT[5:0] Description 0 000000 No data valid 0 000001 000010 000100 000110 .. 111111 1 line valid 2 lines valid 4 lines valid 6 lines valid .. 63 lines valid 1 000000 64 lines valid; if using Begin trigger alignment, ARM bit will be cleared and the tracing session ends. 1 000001 .. .. 111110 64 lines valid, oldest data has been overwritten by most recent data MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 227 S12S Debug Module (S12DBGV2) 6.3.2.7 Debug State Control Registers There is a dedicated control register for each of the state sequencer states 1 to 3 that determines if transitions from that state are allowed, depending upon comparator matches or tag hits, and defines the next state for the state sequencer following a match. The three debug state control registers are located at the same address in the register address map (0x0027). Each register can be accessed using the COMRV bits in DBGC1 to blend in the required register. The COMRV = 11 value blends in the match flag register (DBGMFR). Table 6-14. State Control Register Access Encoding COMRV Visible State Control Register 00 DBGSCR1 01 DBGSCR2 10 DBGSCR3 11 DBGMFR MC9S12VR Family Reference Manual, Rev. 4.2 228 NXP Semiconductor S12S Debug Module (S12DBGV2) 6.3.2.7.1 Debug State Control Register 1 (DBGSCR1) Address: 0x0027 R 7 6 5 4 0 0 0 0 0 0 0 W Reset 0 3 2 1 0 SC3 SC2 SC1 SC0 0 0 0 0 = Unimplemented or Reserved Figure 6-9. Debug State Control Register 1 (DBGSCR1) Read: If COMRV[1:0] = 00 Write: If COMRV[1:0] = 00 and DBG is not armed. This register is visible at 0x0027 only with COMRV[1:0] = 00. The state control register 1 selects the targeted next state whilst in State1. The matches refer to the match channels of the comparator match control logic as depicted in Figure 6-1 and described in Section 6.3.2.8.1, “Debug Comparator Control Register (DBGXCTL). Comparators must be enabled by setting the comparator enable bit in the associated DBGXCTL control register. Table 6-15. DBGSCR1 Field Descriptions Field 3–0 SC[3:0] Description These bits select the targeted next state whilst in State1, based upon the match event. Table 6-16. State1 Sequencer Next State Selection SC[3:0] Description (Unspecified matches have no effect) 0000 0001 0010 0011 0100 0101 0110 0111 1000 1001 1010 1011 1100 1101 1110 1111 Any match to Final State Match1 to State3 Match2 to State2 Match1 to State2 Match0 to State2....... Match1 to State3 Match1 to State3.........Match0 to Final State Match0 to State2....... Match2 to State3 Either Match0 or Match1 to State2 Reserved Match0 to State3 Reserved Reserved Reserved Either Match0 or Match2 to Final State........Match1 to State2 Reserved Reserved The priorities described in Table 6-36 dictate that in the case of simultaneous matches, a match leading to final state has priority followed by the match on the lower channel number (0,1,2). Thus with SC[3:0]=1101 a simultaneous match0/match1 transitions to final state. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 229 S12S Debug Module (S12DBGV2) 6.3.2.7.2 Debug State Control Register 2 (DBGSCR2) Address: 0x0027 R 7 6 5 4 0 0 0 0 0 0 0 W Reset 0 3 2 1 0 SC3 SC2 SC1 SC0 0 0 0 0 = Unimplemented or Reserved Figure 6-10. Debug State Control Register 2 (DBGSCR2) Read: If COMRV[1:0] = 01 Write: If COMRV[1:0] = 01 and DBG is not armed. This register is visible at 0x0027 only with COMRV[1:0] = 01. The state control register 2 selects the targeted next state whilst in State2. The matches refer to the match channels of the comparator match control logic as depicted in Figure 6-1 and described in Section 6.3.2.8.1, “Debug Comparator Control Register (DBGXCTL). Comparators must be enabled by setting the comparator enable bit in the associated DBGXCTL control register. Table 6-17. DBGSCR2 Field Descriptions Field 3–0 SC[3:0] Description These bits select the targeted next state whilst in State2, based upon the match event. Table 6-18. State2 —Sequencer Next State Selection SC[3:0] Description (Unspecified matches have no effect) 0000 0001 0010 0011 0100 0101 0110 0111 1000 1001 1010 1011 1100 1101 1110 1111 Match0 to State1....... Match2 to State3. Match1 to State3 Match2 to State3 Match1 to State3....... Match0 Final State Match1 to State1....... Match2 to State3. Match2 to Final State Match2 to State1..... Match0 to Final State Either Match0 or Match1 to Final State Reserved Reserved Reserved Reserved Either Match0 or Match1 to Final State........Match2 to State3 Reserved Reserved Either Match0 or Match1 to Final State........Match2 to State1 The priorities described in Table 6-36 dictate that in the case of simultaneous matches, a match leading to final state has priority followed by the match on the lower channel number (0,1,2). MC9S12VR Family Reference Manual, Rev. 4.2 230 NXP Semiconductor S12S Debug Module (S12DBGV2) 6.3.2.7.3 Debug State Control Register 3 (DBGSCR3) Address: 0x0027 R 7 6 5 4 0 0 0 0 0 0 0 W Reset 0 3 2 1 0 SC3 SC2 SC1 SC0 0 0 0 0 = Unimplemented or Reserved Figure 6-11. Debug State Control Register 3 (DBGSCR3) Read: If COMRV[1:0] = 10 Write: If COMRV[1:0] = 10 and DBG is not armed. This register is visible at 0x0027 only with COMRV[1:0] = 10. The state control register three selects the targeted next state whilst in State3. The matches refer to the match channels of the comparator match control logic as depicted in Figure 6-1 and described in Section 6.3.2.8.1, “Debug Comparator Control Register (DBGXCTL). Comparators must be enabled by setting the comparator enable bit in the associated DBGXCTL control register. Table 6-19. DBGSCR3 Field Descriptions Field 3–0 SC[3:0] Description These bits select the targeted next state whilst in State3, based upon the match event. Table 6-20. State3 — Sequencer Next State Selection SC[3:0] Description (Unspecified matches have no effect) 0000 0001 0010 0011 0100 0101 0110 0111 1000 1001 1010 1011 1100 1101 1110 1111 Match0 to State1 Match2 to State2........ Match1 to Final State Match0 to Final State....... Match1 to State1 Match1 to Final State....... Match2 to State1 Match1 to State2 Match1 to Final State Match2 to State2........ Match0 to Final State Match0 to Final State Reserved Reserved Either Match1 or Match2 to State1....... Match0 to Final State Reserved Reserved Either Match1 or Match2 to Final State....... Match0 to State1 Match0 to State2....... Match2 to Final State Reserved The priorities described in Table 6-36 dictate that in the case of simultaneous matches, a match leading to final state has priority followed by the match on the lower channel number (0,1,2). MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 231 S12S Debug Module (S12DBGV2) 6.3.2.7.4 Debug Match Flag Register (DBGMFR) Address: 0x0027 R 7 6 5 4 3 2 1 0 0 0 0 0 0 MC2 MC1 MC0 0 0 0 0 0 0 0 W Reset 0 = Unimplemented or Reserved Figure 6-12. Debug Match Flag Register (DBGMFR) Read: If COMRV[1:0] = 11 Write: Never DBGMFR is visible at 0x0027 only with COMRV[1:0] = 11. It features 3 flag bits each mapped directly to a channel. Should a match occur on the channel during the debug session, then the corresponding flag is set and remains set until the next time the module is armed by writing to the ARM bit. Thus the contents are retained after a debug session for evaluation purposes. These flags cannot be cleared by software, they are cleared only when arming the module. A set flag does not inhibit the setting of other flags. Once a flag is set, further comparator matches on the same channel in the same session have no affect on that flag. 6.3.2.8 Comparator Register Descriptions Each comparator has a bank of registers that are visible through an 8-byte window in the DBG module register address map. Comparator A consists of 8 register bytes (3 address bus compare registers, two data bus compare registers, two data bus mask registers and a control register). Comparator B consists of four register bytes (three address bus compare registers and a control register). Comparator C consists of four register bytes (three address bus compare registers and a control register). Each set of comparator registers can be accessed using the COMRV bits in the DBGC1 register. Unimplemented registers (e.g. Comparator B data bus and data bus masking) read as zero and cannot be written. The control register for comparator B differs from those of comparators A and C. Table 6-21. Comparator Register Layout 0x0028 CONTROL Read/Write Comparators A,B and C 0x0029 ADDRESS HIGH Read/Write Comparators A,B and C 0x002A ADDRESS MEDIUM Read/Write Comparators A,B and C 0x002B ADDRESS LOW Read/Write Comparators A,B and C 0x002C DATA HIGH COMPARATOR Read/Write Comparator A only 0x002D DATA LOW COMPARATOR Read/Write Comparator A only 0x002E DATA HIGH MASK Read/Write Comparator A only 0x002F DATA LOW MASK Read/Write Comparator A only 6.3.2.8.1 Debug Comparator Control Register (DBGXCTL) The contents of this register bits 7 and 6 differ depending upon which comparator registers are visible in the 8-byte window of the DBG module register address map. MC9S12VR Family Reference Manual, Rev. 4.2 232 NXP Semiconductor S12S Debug Module (S12DBGV2) Address: 0x0028 R W 7 6 5 4 3 2 1 0 SZE SZ TAG BRK RW RWE NDB COMPE 0 0 0 0 0 0 0 Reset 0 = Unimplemented or Reserved Figure 6-13. Debug Comparator Control Register DBGACTL (Comparator A) Address: 0x0028 7 R W 6 SZE Reset 0 5 4 3 2 SZ TAG BRK RW RWE 0 0 0 0 0 1 0 0 0 COMPE 0 = Unimplemented or Reserved Figure 6-14. Debug Comparator Control Register DBGBCTL (Comparator B) Address: 0x0028 R 7 6 0 0 W Reset 0 0 5 4 3 2 TAG BRK RW RWE 0 0 0 0 1 0 0 0 COMPE 0 = Unimplemented or Reserved Figure 6-15. Debug Comparator Control Register DBGCCTL (Comparator C) Read: DBGACTL if COMRV[1:0] = 00 DBGBCTL if COMRV[1:0] = 01 DBGCCTL if COMRV[1:0] = 10 Write: DBGACTL if COMRV[1:0] = 00 and DBG not armed DBGBCTL if COMRV[1:0] = 01 and DBG not armed DBGCCTL if COMRV[1:0] = 10 and DBG not armed Table 6-22. DBGXCTL Field Descriptions Field Description 7 SZE (Comparators A and B) Size Comparator Enable Bit — The SZE bit controls whether access size comparison is enabled for the associated comparator. This bit is ignored if the TAG bit in the same register is set. 0 Word/Byte access size is not used in comparison 1 Word/Byte access size is used in comparison 6 SZ (Comparators A and B) Size Comparator Value Bit — The SZ bit selects either word or byte access size in comparison for the associated comparator. This bit is ignored if the SZE bit is cleared or if the TAG bit in the same register is set. 0 Word access size is compared 1 Byte access size is compared MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 233 S12S Debug Module (S12DBGV2) Table 6-22. DBGXCTL Field Descriptions (continued) Field Description 5 TAG Tag Select— This bit controls whether the comparator match has immediate effect, causing an immediate state sequencer transition or tag the opcode at the matched address. Tagged opcodes trigger only if they reach the execution stage of the instruction queue. 0 Allow state sequencer transition immediately on match 1 On match, tag the opcode. If the opcode is about to be executed allow a state sequencer transition 4 BRK Break— This bit controls whether a comparator match terminates a debug session immediately, independent of state sequencer state. To generate an immediate breakpoint the module breakpoints must be enabled using the DBGC1 bit DBGBRK. 0 The debug session termination is dependent upon the state sequencer and trigger conditions. 1 A match on this channel terminates the debug session immediately; breakpoints if active are generated, tracing, if active, is terminated and the module disarmed. 3 RW Read/Write Comparator Value Bit — The RW bit controls whether read or write is used in compare for the associated comparator. The RW bit is not used if RWE = 0. This bit is ignored if the TAG bit in the same register is set. 0 Write cycle is matched1Read cycle is matched 2 RWE 1 NDB (Comparator A) 0 COMPE Read/Write Enable Bit — The RWE bit controls whether read or write comparison is enabled for the associated comparator.This bit is ignored if the TAG bit in the same register is set 0 Read/Write is not used in comparison 1 Read/Write is used in comparison Not Data Bus — The NDB bit controls whether the match occurs when the data bus matches the comparator register value or when the data bus differs from the register value. This bit is ignored if the TAG bit in the same register is set. This bit is only available for comparator A. 0 Match on data bus equivalence to comparator register contents 1 Match on data bus difference to comparator register contents Determines if comparator is enabled 0 The comparator is not enabled 1 The comparator is enabled Table 6-23 shows the effect for RWE and RW on the comparison conditions. These bits are ignored if the corresponding TAG bit is set since the match occurs based on the tagged opcode reaching the execution stage of the instruction queue. Table 6-23. Read or Write Comparison Logic Table RWE Bit RW Bit RW Signal Comment 0 x 0 RW not used in comparison 0 x 1 RW not used in comparison 1 0 0 Write data bus 1 0 1 No match 1 1 0 No match 1 1 1 Read data bus MC9S12VR Family Reference Manual, Rev. 4.2 234 NXP Semiconductor S12S Debug Module (S12DBGV2) 6.3.2.8.2 Debug Comparator Address High Register (DBGXAH) Address: 0x0029 R 7 6 5 4 3 2 0 0 0 0 0 0 0 0 0 0 0 W Reset 0 1 0 Bit 17 Bit 16 0 0 = Unimplemented or Reserved Figure 6-16. Debug Comparator Address High Register (DBGXAH) The DBGC1_COMRV bits determine which comparator address registers are visible in the 8-byte window from 0x0028 to 0x002F as shown in Section Table 6-24., “Comparator Address Register Visibility Table 6-24. Comparator Address Register Visibility COMRV Visible Comparator 00 DBGAAH, DBGAAM, DBGAAL 01 DBGBAH, DBGBAM, DBGBAL 10 DBGCAH, DBGCAM, DBGCAL 11 None Read: Anytime. See Table 6-24 for visible register encoding. Write: If DBG not armed. See Table 6-24 for visible register encoding. Table 6-25. DBGXAH Field Descriptions Field 1–0 Bit[17:16] Description Comparator Address High Compare Bits — The Comparator address high compare bits control whether the selected comparator compares the address bus bits [17:16] to a logic one or logic zero. 0 Compare corresponding address bit to a logic zero 1 Compare corresponding address bit to a logic one 6.3.2.8.3 Debug Comparator Address Mid Register (DBGXAM) Address: 0x002A R W Reset 7 6 5 4 3 2 1 0 Bit 15 Bit 14 Bit 13 Bit 12 Bit 11 Bit 10 Bit 9 Bit 8 0 0 0 0 0 0 0 0 Figure 6-17. Debug Comparator Address Mid Register (DBGXAM) Read: Anytime. See Table 6-24 for visible register encoding. Write: If DBG not armed. See Table 6-24 for visible register encoding. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 235 S12S Debug Module (S12DBGV2) Table 6-26. DBGXAM Field Descriptions Field 7–0 Bit[15:8] Description Comparator Address Mid Compare Bits — The Comparator address mid compare bits control whether the selected comparator compares the address bus bits [15:8] to a logic one or logic zero. 0 Compare corresponding address bit to a logic zero 1 Compare corresponding address bit to a logic one 6.3.2.8.4 Debug Comparator Address Low Register (DBGXAL) Address: 0x002B R W 7 6 5 4 3 2 1 0 Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 Bit 0 0 0 0 0 0 0 0 0 Reset Figure 6-18. Debug Comparator Address Low Register (DBGXAL) Read: Anytime. See Table 6-24 for visible register encoding. Write: If DBG not armed. See Table 6-24 for visible register encoding. Table 6-27. DBGXAL Field Descriptions Field 7–0 Bits[7:0] Description Comparator Address Low Compare Bits — The Comparator address low compare bits control whether the selected comparator compares the address bus bits [7:0] to a logic one or logic zero. 0 Compare corresponding address bit to a logic zero 1 Compare corresponding address bit to a logic one 6.3.2.8.5 Debug Comparator Data High Register (DBGADH) Address: 0x002C R W Reset 7 6 5 4 3 2 1 0 Bit 15 Bit 14 Bit 13 Bit 12 Bit 11 Bit 10 Bit 9 Bit 8 0 0 0 0 0 0 0 0 Figure 6-19. Debug Comparator Data High Register (DBGADH) Read: If COMRV[1:0] = 00 Write: If COMRV[1:0] = 00 and DBG not armed. MC9S12VR Family Reference Manual, Rev. 4.2 236 NXP Semiconductor S12S Debug Module (S12DBGV2) Table 6-28. DBGADH Field Descriptions Field Description 7–0 Bits[15:8] Comparator Data High Compare Bits— The Comparator data high compare bits control whether the selected comparator compares the data bus bits [15:8] to a logic one or logic zero. The comparator data compare bits are only used in comparison if the corresponding data mask bit is logic 1. This register is available only for comparator A. Data bus comparisons are only performed if the TAG bit in DBGACTL is clear. 0 Compare corresponding data bit to a logic zero 1 Compare corresponding data bit to a logic one 6.3.2.8.6 Debug Comparator Data Low Register (DBGADL) Address: 0x002D R W 7 6 5 4 3 2 1 0 Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 Bit 0 0 0 0 0 0 0 0 0 Reset Figure 6-20. Debug Comparator Data Low Register (DBGADL) Read: If COMRV[1:0] = 00 Write: If COMRV[1:0] = 00 and DBG not armed. Table 6-29. DBGADL Field Descriptions Field Description 7–0 Bits[7:0] Comparator Data Low Compare Bits — The Comparator data low compare bits control whether the selected comparator compares the data bus bits [7:0] to a logic one or logic zero. The comparator data compare bits are only used in comparison if the corresponding data mask bit is logic 1. This register is available only for comparator A. Data bus comparisons are only performed if the TAG bit in DBGACTL is clear 0 Compare corresponding data bit to a logic zero 1 Compare corresponding data bit to a logic one 6.3.2.8.7 Debug Comparator Data High Mask Register (DBGADHM) Address: 0x002E R W Reset 7 6 5 4 3 2 1 0 Bit 15 Bit 14 Bit 13 Bit 12 Bit 11 Bit 10 Bit 9 Bit 8 0 0 0 0 0 0 0 0 Figure 6-21. Debug Comparator Data High Mask Register (DBGADHM) Read: If COMRV[1:0] = 00 Write: If COMRV[1:0] = 00 and DBG not armed. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 237 S12S Debug Module (S12DBGV2) Table 6-30. DBGADHM Field Descriptions Field Description 7–0 Bits[15:8] Comparator Data High Mask Bits — The Comparator data high mask bits control whether the selected comparator compares the data bus bits [15:8] to the corresponding comparator data compare bits. Data bus comparisons are only performed if the TAG bit in DBGACTL is clear 0 Do not compare corresponding data bit Any value of corresponding data bit allows match. 1 Compare corresponding data bit 6.3.2.8.8 Debug Comparator Data Low Mask Register (DBGADLM) Address: 0x002F R W Reset 7 6 5 4 3 2 1 0 Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 Bit 0 0 0 0 0 0 0 0 0 Figure 6-22. Debug Comparator Data Low Mask Register (DBGADLM) Read: If COMRV[1:0] = 00 Write: If COMRV[1:0] = 00 and DBG not armed. Table 6-31. DBGADLM Field Descriptions Field 7–0 Bits[7:0] 6.4 Description Comparator Data Low Mask Bits — The Comparator data low mask bits control whether the selected comparator compares the data bus bits [7:0] to the corresponding comparator data compare bits. Data bus comparisons are only performed if the TAG bit in DBGACTL is clear 0 Do not compare corresponding data bit. Any value of corresponding data bit allows match 1 Compare corresponding data bit Functional Description This section provides a complete functional description of the DBG module. If the part is in secure mode, the DBG module can generate breakpoints but tracing is not possible. 6.4.1 S12DBGV2 Operation Arming the DBG module by setting ARM in DBGC1 allows triggering the state sequencer, storing of data in the trace buffer and generation of breakpoints to the CPU. The DBG module is made up of four main blocks, the comparators, control logic, the state sequencer, and the trace buffer. The comparators monitor the bus activity of the CPU. All comparators can be configured to monitor address bus activity. Comparator A can also be configured to monitor databus activity and mask out individual data bus bits during a compare. Comparators can be configured to use R/W and word/byte access qualification in the comparison. A match with a comparator register value can initiate a state sequencer transition to another state (see Figure 6-24). Either forced or tagged matches are possible. Using MC9S12VR Family Reference Manual, Rev. 4.2 238 NXP Semiconductor S12S Debug Module (S12DBGV2) a forced match, a state sequencer transition can occur immediately on a successful match of system busses and comparator registers. Whilst tagging, at a comparator match, the instruction opcode is tagged and only if the instruction reaches the execution stage of the instruction queue can a state sequencer transition occur. In the case of a transition to Final State, bus tracing is triggered and/or a breakpoint can be generated. A state sequencer transition to final state (with associated breakpoint, if enabled) can be initiated by writing to the TRIG bit in the DBGC1 control register. The trace buffer is visible through a 2-byte window in the register address map and must be read out using standard 16-bit word reads. TAGS TAGHITS BREAKPOINT REQUESTS TO CPU COMPARATOR A COMPARATOR B COMPARATOR C COMPARATOR MATCH CONTROL CPU BUS BUS INTERFACE SECURE MATCH0 MATCH1 TAG & MATCH CONTROL LOGIC TRANSITION STATE STATE SEQUENCER STATE MATCH2 TRACE CONTROL TRIGGER TRACE BUFFER READ TRACE DATA (DBG READ DATA BUS) Figure 6-23. DBG Overview 6.4.2 Comparator Modes The DBG contains three comparators, A, B and C. Each comparator compares the system address bus with the address stored in DBGXAH, DBGXAM, and DBGXAL. Furthermore, comparator A also compares the data buses to the data stored in DBGADH, DBGADL and allows masking of individual data bus bits. All comparators are disabled in BDM and during BDM accesses. The comparator match control logic (see Figure 6-23) configures comparators to monitor the buses for an exact address or an address range, whereby either an access inside or outside the specified range generates a match condition. The comparator configuration is controlled by the control register contents and the range control by the DBGC2 contents. A match can initiate a transition to another state sequencer state (see Section 6.4.4, “State Sequence Control”). The comparator control register also allows the type of access to be included in the comparison through the use of the RWE, RW, SZE, and SZ bits. The RWE bit controls whether read or write comparison is enabled for the associated comparator and the RW bit selects either a read or write access MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 239 S12S Debug Module (S12DBGV2) for a valid match. Similarly the SZE and SZ bits allow the size of access (word or byte) to be considered in the compare. Only comparators A and B feature SZE and SZ. The TAG bit in each comparator control register is used to determine the match condition. By setting TAG, the comparator qualifies a match with the output of opcode tracking logic and a state sequencer transition occurs when the tagged instruction reaches the CPU execution stage. Whilst tagging the RW, RWE, SZE, and SZ bits and the comparator data registers are ignored; the comparator address register must be loaded with the exact opcode address. If the TAG bit is clear (forced type match) a comparator match is generated when the selected address appears on the system address bus. If the selected address is an opcode address, the match is generated when the opcode is fetched from the memory, which precedes the instruction execution by an indefinite number of cycles due to instruction pipelining. For a comparator match of an opcode at an odd address when TAG = 0, the corresponding even address must be contained in the comparator register. Thus for an opcode at odd address (n), the comparator register must contain address (n–1). Once a successful comparator match has occurred, the condition that caused the original match is not verified again on subsequent matches. Thus if a particular data value is verified at a given address, this address may not still contain that data value when a subsequent match occurs. Match[0, 1, 2] map directly to Comparators [A, B, C] respectively, except in range modes (see Section 6.3.2.4, “Debug Control Register2 (DBGC2)). Comparator channel priority rules are described in the priority section (Section 6.4.3.4, “Channel Priorities). 6.4.2.1 Single Address Comparator Match With range comparisons disabled, the match condition is an exact equivalence of address bus with the value stored in the comparator address registers. Further qualification of the type of access (R/W, word/byte) and databus contents is possible, depending on comparator channel. 6.4.2.1.1 Comparator C Comparator C offers only address and direction (R/W) comparison. The exact address is compared, thus with the comparator address register loaded with address (n) a word access of address (n–1) also accesses (n) but does not cause a match. Table 6-32. Comparator C Access Considerations 1 Condition For Valid Match Comp C Address RWE RW Examples Read and write accesses of ADDR[n] ADDR[n]1 0 X LDAA ADDR[n] STAA #$BYTE ADDR[n] Write accesses of ADDR[n] ADDR[n] 1 0 STAA #$BYTE ADDR[n] Read accesses of ADDR[n] ADDR[n] 1 1 LDAA #$BYTE ADDR[n] A word access of ADDR[n-1] also accesses ADDR[n] but does not generate a match. The comparator address register must contain the exact address from the code. MC9S12VR Family Reference Manual, Rev. 4.2 240 NXP Semiconductor S12S Debug Module (S12DBGV2) 6.4.2.1.2 Comparator B Comparator B offers address, direction (R/W) and access size (word/byte) comparison. If the SZE bit is set the access size (word or byte) is compared with the SZ bit value such that only the specified size of access causes a match. Thus if configured for a byte access of a particular address, a word access covering the same address does not lead to match. Assuming the access direction is not qualified (RWE=0), for simplicity, the size access considerations are shown in Table 6-33. Table 6-33. Comparator B Access Size Considerations Condition For Valid Match 1 Comp B Address RWE SZE SZ8 Word and byte accesses of ADDR[n] ADDR[n] 1 Examples 0 0 X MOVB #$BYTE ADDR[n] MOVW #$WORD ADDR[n] Word accesses of ADDR[n] only ADDR[n] 0 1 0 MOVW #$WORD ADDR[n] LDD ADDR[n] Byte accesses of ADDR[n] only ADDR[n] 0 1 1 MOVB #$BYTE ADDR[n] LDAB ADDR[n] A word access of ADDR[n-1] also accesses ADDR[n] but does not generate a match. The comparator address register must contain the exact address from the code. Access direction can also be used to qualify a match for Comparator B in the same way as described for Comparator C in Table 6-32. 6.4.2.1.3 Comparator A Comparator A offers address, direction (R/W), access size (word/byte) and data bus comparison. Table 6-34 lists access considerations with data bus comparison. On word accesses the data byte of the lower address is mapped to DBGADH. Access direction can also be used to qualify a match for Comparator A in the same way as described for Comparator C in Table 6-32. Table 6-34. Comparator A Matches When Accessing ADDR[n] SZE SZ DBGADHM, DBGADLM Access DH=DBGADH, DL=DBGADL 0 X $0000 Byte Word No databus comparison 0 X $FF00 Byte, data(ADDR[n])=DH Word, data(ADDR[n])=DH, data(ADDR[n+1])=X Match data( ADDR[n]) 0 X $00FF Word, data(ADDR[n])=X, data(ADDR[n+1])=DL Match data( ADDR[n+1]) 0 X $00FF Byte, data(ADDR[n])=X, data(ADDR[n+1])=DL Possible unintended match 0 X $FFFF Word, data(ADDR[n])=DH, data(ADDR[n+1])=DL Match data( ADDR[n], ADDR[n+1]) Comment 0 X $FFFF Byte, data(ADDR[n])=DH, data(ADDR[n+1])=DL Possible unintended match 1 0 $0000 Word No databus comparison 1 0 $00FF Word, data(ADDR[n])=X, data(ADDR[n+1])=DL Match only data at ADDR[n+1] 1 0 $FF00 Word, data(ADDR[n])=DH, data(ADDR[n+1])=X Match only data at ADDR[n] 1 0 $FFFF Word, data(ADDR[n])=DH, data(ADDR[n+1])=DL Match data at ADDR[n] & ADDR[n+1] MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 241 S12S Debug Module (S12DBGV2) SZE SZ DBGADHM, DBGADLM 1 1 $0000 Byte No databus comparison 1 1 $FF00 Byte, data(ADDR[n])=DH Match data at ADDR[n] 6.4.2.1.4 Access DH=DBGADH, DL=DBGADL Comment Comparator A Data Bus Comparison NDB Dependency Comparator A features an NDB control bit, which allows data bus comparators to be configured to either trigger on equivalence or trigger on difference. This allows monitoring of a difference in the contents of an address location from an expected value. When matching on an equivalence (NDB=0), each individual data bus bit position can be masked out by clearing the corresponding mask bit (DBGADHM/DBGADLM) so that it is ignored in the comparison. A match occurs when all data bus bits with corresponding mask bits set are equivalent. If all mask register bits are clear, then a match is based on the address bus only, the data bus is ignored. When matching on a difference, mask bits can be cleared to ignore bit positions. A match occurs when any data bus bit with corresponding mask bit set is different. Clearing all mask bits, causes all bits to be ignored and prevents a match because no difference can be detected. In this case address bus equivalence does not cause a match. Table 6-35. NDB and MASK bit dependency 6.4.2.2 NDB DBGADHM[n] / DBGADLM[n] 0 0 Do not compare data bus bit. 0 1 Compare data bus bit. Match on equivalence. 1 0 Do not compare data bus bit. 1 1 Compare data bus bit. Match on difference. Comment Range Comparisons Using the AB comparator pair for a range comparison, the data bus can also be used for qualification by using the comparator A data registers. Furthermore the DBGACTL RW and RWE bits can be used to qualify the range comparison on either a read or a write access. The corresponding DBGBCTL bits are ignored. The SZE and SZ control bits are ignored in range mode. The comparator A TAG bit is used to tag range comparisons. The comparator B TAG bit is ignored in range modes. In order for a range comparison using comparators A and B, both COMPEA and COMPEB must be set; to disable range comparisons both must be cleared. The comparator A BRK bit is used to for the AB range, the comparator B BRK bit is ignored in range mode. When configured for range comparisons and tagging, the ranges are accurate only to word boundaries. 6.4.2.2.1 Inside Range (CompA_Addr address CompB_Addr) In the Inside Range comparator mode, comparator pair A and B can be configured for range comparisons. This configuration depends upon the control register (DBGC2). The match condition requires that a valid MC9S12VR Family Reference Manual, Rev. 4.2 242 NXP Semiconductor S12S Debug Module (S12DBGV2) match for both comparators happens on the same bus cycle. A match condition on only one comparator is not valid. An aligned word access which straddles the range boundary is valid only if the aligned address is inside the range. 6.4.2.2.2 Outside Range (address < CompA_Addr or address > CompB_Addr) In the Outside Range comparator mode, comparator pair A and B can be configured for range comparisons. A single match condition on either of the comparators is recognized as valid. An aligned word access which straddles the range boundary is valid only if the aligned address is outside the range. Outside range mode in combination with tagging can be used to detect if the opcode fetches are from an unexpected range. In forced match mode the outside range match would typically be activated at any interrupt vector fetch or register access. This can be avoided by setting the upper range limit to $3FFFF or lower range limit to $00000 respectively. 6.4.3 Match Modes (Forced or Tagged) Match modes are used as qualifiers for a state sequencer change of state. The Comparator control register TAG bits select the match mode. The modes are described in the following sections. 6.4.3.1 Forced Match When configured for forced matching, a comparator channel match can immediately initiate a transition to the next state sequencer state whereby the corresponding flags in DBGSR are set. The state control register for the current state determines the next state. Forced matches are typically generated 2-3 bus cycles after the final matching address bus cycle, independent of comparator RWE/RW settings. Furthermore since opcode fetches occur several cycles before the opcode execution a forced match of an opcode address typically precedes a tagged match at the same address. 6.4.3.2 Tagged Match If a CPU taghit occurs a transition to another state sequencer state is initiated and the corresponding DBGSR flags are set. For a comparator related taghit to occur, the DBG must first attach tags to instructions as they are fetched from memory. When the tagged instruction reaches the execution stage of the instruction queue a taghit is generated by the CPU. This can initiate a state sequencer transition. 6.4.3.3 Immediate Trigger Independent of comparator matches it is possible to initiate a tracing session and/or breakpoint by writing to the TRIG bit in DBGC1. If configured for begin aligned tracing, this triggers the state sequencer into the Final State, if configured for end alignment, setting the TRIG bit disarms the module, ending the session and issues a forced breakpoint request to the CPU. It is possible to set both TRIG and ARM simultaneously to generate an immediate trigger, independent of the current state of ARM. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 243 S12S Debug Module (S12DBGV2) 6.4.3.4 Channel Priorities In case of simultaneous matches the priority is resolved according to Table 6-36. The lower priority is suppressed. It is thus possible to miss a lower priority match if it occurs simultaneously with a higher priority. The priorities described in Table 6-36 dictate that in the case of simultaneous matches, the match pointing to final state has highest priority followed by the lower channel number (0,1,2). Table 6-36. Channel Priorities Priority Source Action Highest TRIG Enter Final State Channel pointing to Final State Transition to next state as defined by state control registers Match0 (force or tag hit) Transition to next state as defined by state control registers Match1 (force or tag hit) Transition to next state as defined by state control registers Match2 (force or tag hit) Transition to next state as defined by state control registers Lowest 6.4.4 State Sequence Control ARM = 0 State 0 (Disarmed) ARM = 1 State1 State2 ARM = 0 Session Complete (Disarm) Final State State3 ARM = 0 Figure 6-24. State Sequencer Diagram The state sequencer allows a defined sequence of events to provide a trigger point for tracing of data in the trace buffer. Once the DBG module has been armed by setting the ARM bit in the DBGC1 register, then state1 of the state sequencer is entered. Further transitions between the states are then controlled by the state control registers and channel matches. From Final State the only permitted transition is back to the disarmed state0. Transition between any of the states 1 to 3 is not restricted. Each transition updates the SSF[2:0] flags in DBGSR accordingly to indicate the current state. Alternatively writing to the TRIG bit in DBGSC1, provides an immediate trigger independent of comparator matches. Independent of the state sequencer, each comparator channel can be individually configured to generate an immediate breakpoint when a match occurs through the use of the BRK bits in the DBGxCTL registers. Thus it is possible to generate an immediate breakpoint on selected channels, whilst a state sequencer transition can be initiated by a match on other channels. If a debug session is ended by a match on a channel the state sequencer transitions through Final State for a clock cycle to state0. This is independent of tracing MC9S12VR Family Reference Manual, Rev. 4.2 244 NXP Semiconductor S12S Debug Module (S12DBGV2) and breakpoint activity, thus with tracing and breakpoints disabled, the state sequencer enters state0 and the debug module is disarmed. 6.4.4.1 Final State On entering Final State a trigger may be issued to the trace buffer according to the trace alignment control as defined by the TALIGN bit (see Section 6.3.2.3, “Debug Trace Control Register (DBGTCR)”). If the TSOURCE bit in DBGTCR is clear then the trace buffer is disabled and the transition to Final State can only generate a breakpoint request. In this case or upon completion of a tracing session when tracing is enabled, the ARM bit in the DBGC1 register is cleared, returning the module to the disarmed state0. If tracing is enabled a breakpoint request can occur at the end of the tracing session. If neither tracing nor breakpoints are enabled then when the final state is reached it returns automatically to state0 and the debug module is disarmed. 6.4.5 Trace Buffer Operation The trace buffer is a 64 lines deep by 20-bits wide RAM array. The DBG module stores trace information in the RAM array in a circular buffer format. The system accesses the RAM array through a register window (DBGTBH:DBGTBL) using 16-bit wide word accesses. After each complete 20-bit trace buffer line is read, an internal pointer into the RAM increments so that the next read receives fresh information. Data is stored in the format shown in Table 6-37 and Table 6-40. After each store the counter register DBGCNT is incremented. Tracing of CPU activity is disabled when the BDM is active. Reading the trace buffer whilst the DBG is armed returns invalid data and the trace buffer pointer is not incremented. 6.4.5.1 Trace Trigger Alignment Using the TALIGN bit (see Section 6.3.2.3, “Debug Trace Control Register (DBGTCR)) it is possible to align the trigger with the end or the beginning of a tracing session. If end alignment is selected, tracing begins when the ARM bit in DBGC1 is set and State1 is entered; the transition to Final State signals the end of the tracing session. Tracing with Begin-Trigger starts at the opcode of the trigger. Using end alignment or when the tracing is initiated by writing to the TRIG bit whilst configured for begin alignment, tracing starts in the second cycle after the DBGC1 write cycle. 6.4.5.1.1 Storing with Begin Trigger Alignment Storing with begin alignment, data is not stored in the Trace Buffer until the Final State is entered. Once the trigger condition is met the DBG module remains armed until 64 lines are stored in the Trace Buffer. If the trigger is at the address of the change-of-flow instruction the change of flow associated with the trigger is stored in the Trace Buffer. Using begin alignment together with tagging, if the tagged instruction is about to be executed then the trace is started. Upon completion of the tracing session the breakpoint is generated, thus the breakpoint does not occur at the tagged instruction boundary. 6.4.5.1.2 Storing with End Trigger Alignment Storing with end alignment, data is stored in the Trace Buffer until the Final State is entered, at which point the DBG module becomes disarmed and no more data is stored. If the trigger is at the address of a change MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 245 S12S Debug Module (S12DBGV2) of flow instruction, the trigger event is not stored in the Trace Buffer. If all trace buffer lines have been used before a trigger event occurrs then the trace continues at the first line, overwriting the oldest entries. 6.4.5.2 Trace Modes Four trace modes are available. The mode is selected using the TRCMOD bits in the DBGTCR register. Tracing is enabled using the TSOURCE bit in the DBGTCR register. The modes are described in the following subsections. 6.4.5.2.1 Normal Mode In Normal Mode, change of flow (COF) program counter (PC) addresses are stored. COF addresses are defined as follows: • Source address of taken conditional branches (long, short, bit-conditional, and loop primitives) • Destination address of indexed JMP, JSR, and CALL instruction • Destination address of RTI, RTS, and RTC instructions • Vector address of interrupts, except for BDM vectors LBRA, BRA, BSR, BGND as well as non-indexed JMP, JSR, and CALL instructions are not classified as change of flow and are not stored in the trace buffer. Stored information includes the full 18-bit address bus and information bits, which contains a source/destination bit to indicate whether the stored address was a source address or destination address. NOTE When a COF instruction with destination address is executed, the destination address is stored to the trace buffer on instruction completion, indicating the COF has taken place. If an interrupt occurs simultaneously then the next instruction carried out is actually from the interrupt service routine. The instruction at the destination address of the original program flow gets executed after the interrupt service routine. In the following example an IRQ interrupt occurs during execution of the indexed JMP at address MARK1. The BRN at the destination (SUB_1) is not executed until after the IRQ service routine but the destination address is entered into the trace buffer to indicate that the indexed JMP COF has taken place. MARK1 MARK2 LDX JMP NOP #SUB_1 0,X SUB_1 BRN * ADDR1 NOP DBNE A,PART5 LDAB STAB #$F0 VAR_C1 IRQ_ISR ; IRQ interrupt occurs during execution of this ; ; JMP Destination address TRACE BUFFER ENTRY 1 ; RTI Destination address TRACE BUFFER ENTRY 3 ; ; Source address TRACE BUFFER ENTRY 4 ; IRQ Vector $FFF2 = TRACE BUFFER ENTRY 2 MC9S12VR Family Reference Manual, Rev. 4.2 246 NXP Semiconductor S12S Debug Module (S12DBGV2) RTI ; The execution flow taking into account the IRQ is as follows MARK1 IRQ_ISR SUB_1 ADDR1 6.4.5.2.2 LDX JMP LDAB STAB RTI BRN NOP DBNE #SUB_1 0,X #$F0 VAR_C1 ; ; ; * ; ; A,PART5 Loop1 Mode Loop1 Mode, similarly to Normal Mode also stores only COF address information to the trace buffer, it however allows the filtering out of redundant information. The intent of Loop1 Mode is to prevent the Trace Buffer from being filled entirely with duplicate information from a looping construct such as delays using the DBNE instruction or polling loops using BRSET/BRCLR instructions. Immediately after address information is placed in the Trace Buffer, the DBG module writes this value into a background register. This prevents consecutive duplicate address entries in the Trace Buffer resulting from repeated branches. Loop1 Mode only inhibits consecutive duplicate source address entries that would typically be stored in most tight looping constructs. It does not inhibit repeated entries of destination addresses or vector addresses, since repeated entries of these would most likely indicate a bug in the user’s code that the DBG module is designed to help find. 6.4.5.2.3 Detail Mode In Detail Mode, address and data for all memory and register accesses is stored in the trace buffer. This mode is intended to supply additional information on indexed, indirect addressing modes where storing only the destination address would not provide all information required for a user to determine where the code is in error. This mode also features information bit storage to the trace buffer, for each address byte storage. The information bits indicate the size of access (word or byte) and the type of access (read or write). When tracing in Detail Mode, all cycles are traced except those when the CPU is either in a free or opcode fetch cycle. 6.4.5.2.4 Compressed Pure PC Mode In Compressed Pure PC Mode, the PC addresses of all executed opcodes, including illegal opcodes are stored. A compressed storage format is used to increase the effective depth of the trace buffer. This is achieved by storing the lower order bits each time and using 2 information bits to indicate if a 64 byte boundary has been crossed, in which case the full PC is stored. Each Trace Buffer row consists of 2 information bits and 18 PC address bits MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 247 S12S Debug Module (S12DBGV2) NOTE: When tracing is terminated using forced breakpoints, latency in breakpoint generation means that opcodes following the opcode causing the breakpoint can be stored to the trace buffer. The number of opcodes is dependent on program flow. This can be avoided by using tagged breakpoints. 6.4.5.3 Trace Buffer Organization (Normal, Loop1, Detail modes) ADRH, ADRM, ADRL denote address high, middle and low byte respectively. The numerical suffix refers to the tracing count. The information format for Loop1 and Normal modes is identical. In Detail mode, the address and data for each entry are stored on consecutive lines, thus the maximum number of entries is 32. In this case DBGCNT bits are incremented twice, once for the address line and once for the data line, on each trace buffer entry. In Detail mode CINF comprises of R/W and size access information (CRW and CSZ respectively). Single byte data accesses in Detail Mode are always stored to the low byte of the trace buffer (DATAL) and the high byte is cleared. When tracing word accesses, the byte at the lower address is always stored to trace buffer byte1 and the byte at the higher address is stored to byte0. Table 6-37. Trace Buffer Organization (Normal,Loop1,Detail modes) Entry 1 Detail Mode 8-bits 8-bits Field 2 Field 1 Field 0 CINF1,ADRH1 ADRM1 ADRL1 0 DATAH1 DATAL1 CINF2,ADRH2 ADRM2 ADRL2 0 DATAH2 DATAL2 Entry 1 PCH1 PCM1 PCL1 Entry 2 PCH2 PCM2 PCL2 Entry 2 Normal/Loop1 Modes 6.4.5.3.1 4-bits Entry Number Mode Information Bit Organization The format of the bits is dependent upon the active trace mode as described below. Field2 Bits in Detail Mode Bit 3 Bit 2 CSZ CRW Bit 1 Bit 0 ADDR[17] ADDR[16] Figure 6-25. Field2 Bits in Detail Mode In Detail Mode the CSZ and CRW bits indicate the type of access being made by the CPU. MC9S12VR Family Reference Manual, Rev. 4.2 248 NXP Semiconductor S12S Debug Module (S12DBGV2) Table 6-38. Field Descriptions Bit Description 3 CSZ Access Type Indicator— This bit indicates if the access was a byte or word size when tracing in Detail Mode 0 Word Access 1 Byte Access 2 CRW Read Write Indicator — This bit indicates if the corresponding stored address corresponds to a read or write access when tracing in Detail Mode. 0 Write Access 1 Read Access 1 ADDR[17] Address Bus bit 17— Corresponds to system address bus bit 17. 0 ADDR[16] Address Bus bit 16— Corresponds to system address bus bit 16. Field2 Bits in Normal and Loop1 Modes Bit 3 Bit 2 Bit 1 Bit 0 CSD CVA PC17 PC16 Figure 6-26. Information Bits PCH Table 6-39. PCH Field Descriptions Bit Description 3 CSD Source Destination Indicator — In Normal and Loop1 mode this bit indicates if the corresponding stored address is a source or destination address. This bit has no meaning in Compressed Pure PC mode. 0 Source Address 1 Destination Address 2 CVA Vector Indicator — In Normal and Loop1 mode this bit indicates if the corresponding stored address is a vector address. Vector addresses are destination addresses, thus if CVA is set, then the corresponding CSD is also set. This bit has no meaning in Compressed Pure PC mode. 0 Non-Vector Destination Address 1 Vector Destination Address 1 PC17 Program Counter bit 17— In Normal and Loop1 mode this bit corresponds to program counter bit 17. 0 PC16 Program Counter bit 16— In Normal and Loop1 mode this bit corresponds to program counter bit 16. 6.4.5.4 Trace Buffer Organization (Compressed Pure PC mode) Table 6-40. Trace Buffer Organization Example (Compressed PurePC mode) Mode Line Number 2-bits 6-bits 6-bits 6-bits Field 3 Field 2 Field 1 Field 0 MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 249 S12S Debug Module (S12DBGV2) Compressed Pure PC Mode Line 1 00 Line 2 11 PC4 PC3 PC2 Line 3 01 0 0 PC5 Line 4 00 Line 5 10 Line 6 00 PC1 (Initial 18-bit PC Base Address) PC6 (New 18-bit PC Base Address) 0 PC8 PC7 PC9 (New 18-bit PC Base Address) NOTE Configured for end aligned triggering in compressed PurePC mode, then after rollover it is possible that the oldest base address is overwritten. In this case all entries between the pointer and the next base address have lost their base address following rollover. For example in Table 6-40 if one line of rollover has occurred, Line 1, PC1, is overwritten with a new entry. Thus the entries on Lines 2 and 3 have lost their base address. For reconstruction of program flow the first base address following the pointer must be used, in the example, Line 4. The pointer points to the oldest entry, Line 2. Field3 Bits in Compressed Pure PC Modes Table 6-41. Compressed Pure PC Mode Field 3 Information Bit Encoding INF1 INF0 TRACE BUFFER ROW CONTENT 0 0 Base PC address TB[17:0] contains a full PC[17:0] value 0 1 Trace Buffer[5:0] contain incremental PC relative to base address zero value 1 0 Trace Buffer[11:0] contain next 2 incremental PCs relative to base address zero value 1 1 Trace Buffer[17:0] contain next 3 incremental PCs relative to base address zero value Each time that PC[17:6] differs from the previous base PC[17:6], then a new base address is stored. The base address zero value is the lowest address in the 64 address range The first line of the trace buffer always gets a base PC address, this applies also on rollover. 6.4.5.5 Reading Data from Trace Buffer The data stored in the Trace Buffer can be read provided the DBG module is not armed, is configured for tracing (TSOURCE bit is set) and the system not secured. When the ARM bit is written to 1 the trace buffer is locked to prevent reading. The trace buffer can only be unlocked for reading by a single aligned word write to DBGTB when the module is disarmed. The Trace Buffer can only be read through the DBGTB register using aligned word reads, any byte or misaligned reads return 0 and do not cause the trace buffer pointer to increment to the next trace buffer address. The Trace Buffer data is read out first-in first-out. By reading CNT in DBGCNT the number of valid lines can be determined. DBGCNT does not decrement as data is read. Whilst reading an internal pointer is used to determine the next line to be read. After a tracing session, the pointer points to the oldest data entry, thus if no rollover has occurred, the pointer points to line0, otherwise it points to the line with the oldest entry. In compressed Pure PC mode on rollover the line with the oldest MC9S12VR Family Reference Manual, Rev. 4.2 250 NXP Semiconductor S12S Debug Module (S12DBGV2) data entry may also contain newer data entries in fields 0 and 1. Thus if rollover is indicated by the TBF bit, the line status must be decoded using the INF bits in field3 of that line. If both INF bits are clear then the line contains only entries from before the last rollover. If INF0=1 then field 0 contains post rollover data but fields 1 and 2 contain pre rollover data. If INF1=1 then fields 0 and 1 contain post rollover data but field 2 contains pre rollover data. The pointer is initialized by each aligned write to DBGTBH to point to the oldest data again. This enables an interrupted trace buffer read sequence to be easily restarted from the oldest data entry. The least significant word of line is read out first. This corresponds to the fields 1 and 0 of Table 6-37. The next word read returns field 2 in the least significant bits [3:0] and “0” for bits [15:4]. Reading the Trace Buffer while the DBG module is armed returns invalid data and no shifting of the RAM pointer occurs. 6.4.5.6 Trace Buffer Reset State The Trace Buffer contents and DBGCNT bits are not initialized by a system reset. Thus should a system reset occur, the trace session information from immediately before the reset occurred can be read out and the number of valid lines in the trace buffer is indicated by DBGCNT. The internal pointer to the current trace buffer address is initialized by unlocking the trace buffer and points to the oldest valid data even if a reset occurred during the tracing session. To read the trace buffer after a reset, TSOURCE must be set, otherwise the trace buffer reads as all zeroes. Generally debugging occurrences of system resets is best handled using end trigger alignment since the reset may occur before the trace trigger, which in the begin trigger alignment case means no information would be stored in the trace buffer. The Trace Buffer contents and DBGCNT bits are undefined following a POR. NOTE An external pin RESET that occurs simultaneous to a trace buffer entry can, in very seldom cases, lead to either that entry being corrupted or the first entry of the session being corrupted. In such cases the other contents of the trace buffer still contain valid tracing information. The case occurs when the reset assertion coincides with the trace buffer entry clock edge. 6.4.6 Tagging A tag follows program information as it advances through the instruction queue. When a tagged instruction reaches the head of the queue a tag hit occurs and can initiate a state sequencer transition. Each comparator control register features a TAG bit, which controls whether the comparator match causes a state sequencer transition immediately or tags the opcode at the matched address. If a comparator is enabled for tagged comparisons, the address stored in the comparator match address registers must be an opcode address. Using Begin trigger together with tagging, if the tagged instruction is about to be executed then the transition to the next state sequencer state occurs. If the transition is to the Final State, tracing is started. Only upon completion of the tracing session can a breakpoint be generated. Using End alignment, when MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 251 S12S Debug Module (S12DBGV2) the tagged instruction is about to be executed and the next transition is to Final State then a breakpoint is generated immediately, before the tagged instruction is carried out. R/W monitoring, access size (SZ) monitoring and data bus monitoring are not useful if tagging is selected, since the tag is attached to the opcode at the matched address and is not dependent on the data bus nor on the type of access. Thus these bits are ignored if tagging is selected. When configured for range comparisons and tagging, the ranges are accurate only to word boundaries. Tagging is disabled when the BDM becomes active. 6.4.7 Breakpoints It is possible to generate breakpoints from channel transitions to final state or using software to write to the TRIG bit in the DBGC1 register. 6.4.7.1 Breakpoints From Comparator Channels Breakpoints can be generated when the state sequencer transitions to the Final State. If configured for tagging, then the breakpoint is generated when the tagged opcode reaches the execution stage of the instruction queue. If a tracing session is selected by the TSOURCE bit, breakpoints are requested when the tracing session has completed, thus if Begin aligned triggering is selected, the breakpoint is requested only on completion of the subsequent trace (see Table 6-42). If no tracing session is selected, breakpoints are requested immediately. If the BRK bit is set, then the associated breakpoint is generated immediately independent of tracing trigger alignment. Table 6-42. Breakpoint Setup For CPU Breakpoints BRK TALIGN DBGBRK Breakpoint Alignment 0 0 0 Fill Trace Buffer until trigger then disarm (no breakpoints) 0 0 1 Fill Trace Buffer until trigger, then breakpoint request occurs 0 1 0 Start Trace Buffer at trigger (no breakpoints) 0 1 1 Start Trace Buffer at trigger A breakpoint request occurs when Trace Buffer is full 1 x 1 Terminate tracing and generate breakpoint immediately on trigger 1 x 0 Terminate tracing immediately on trigger 6.4.7.2 Breakpoints Generated Via The TRIG Bit If a TRIG triggers occur, the Final State is entered whereby tracing trigger alignment is defined by the TALIGN bit. If a tracing session is selected by the TSOURCE bit, breakpoints are requested when the tracing session has completed, thus if Begin aligned triggering is selected, the breakpoint is requested only on completion of the subsequent trace (see Table 6-42). If no tracing session is selected, breakpoints are MC9S12VR Family Reference Manual, Rev. 4.2 252 NXP Semiconductor S12S Debug Module (S12DBGV2) requested immediately. TRIG breakpoints are possible with a single write to DBGC1, setting ARM and TRIG simultaneously. 6.4.7.3 Breakpoint Priorities If a TRIG trigger occurs after Begin aligned tracing has already started, then the TRIG no longer has an effect. When the associated tracing session is complete, the breakpoint occurs. Similarly if a TRIG is followed by a subsequent comparator channel match, it has no effect, since tracing has already started. If a forced SWI breakpoint coincides with a BGND in user code with BDM enabled, then the BDM is activated by the BGND and the breakpoint to SWI is suppressed. 6.4.7.3.1 DBG Breakpoint Priorities And BDM Interfacing Breakpoint operation is dependent on the state of the BDM module. If the BDM module is active, the CPU is executing out of BDM firmware, thus comparator matches and associated breakpoints are disabled. In addition, while executing a BDM TRACE command, tagging into BDM is disabled. If BDM is not active, the breakpoint gives priority to BDM requests over SWI requests if the breakpoint happens to coincide with a SWI instruction in user code. On returning from BDM, the SWI from user code gets executed. Table 6-43. Breakpoint Mapping Summary DBGBRK BDM Bit (DBGC1[4]) BDM Enabled BDM Active Breakpoint Mapping 0 X X X No Breakpoint 1 0 X 0 Breakpoint to SWI X X 1 1 No Breakpoint 1 1 0 X Breakpoint to SWI 1 1 1 0 Breakpoint to BDM BDM cannot be entered from a breakpoint unless the ENABLE bit is set in the BDM. If entry to BDM via a BGND instruction is attempted and the ENABLE bit in the BDM is cleared, the CPU actually executes the BDM firmware code, checks the ENABLE and returns if ENABLE is not set. If not serviced by the monitor then the breakpoint is re-asserted when the BDM returns to normal CPU flow. If the comparator register contents coincide with the SWI/BDM vector address then an SWI in user code could coincide with a DBG breakpoint. The CPU ensures that BDM requests have a higher priority than SWI requests. Returning from the BDM/SWI service routine care must be taken to avoid a repeated breakpoint at the same address. Should a tagged or forced breakpoint coincide with a BGND in user code, then the instruction that follows the BGND instruction is the first instruction executed when normal program execution resumes. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 253 S12S Debug Module (S12DBGV2) NOTE When program control returns from a tagged breakpoint using an RTI or BDM GO command without program counter modification it returns to the instruction whose tag generated the breakpoint. To avoid a repeated breakpoint at the same location reconfigure the DBG module in the SWI routine, if configured for an SWI breakpoint, or over the BDM interface by executing a TRACE command before the GO to increment the program flow past the tagged instruction. 6.5 6.5.1 Application Information State Machine scenarios Defining the state control registers as SCR1,SCR2, SCR3 and M0,M1,M2 as matches on channels 0,1,2 respectively. SCR encoding supported by S12SDBGV1 are shown in black. SCR encoding supported only in S12SDBGV2 are shown in red. For backwards compatibility the new scenarios use a 4th bit in each SCR register. Thus the existing encoding for SCRx[2:0] is not changed. 6.5.2 Scenario 1 A trigger is generated if a given sequence of 3 code events is executed. Figure 6-27. Scenario 1 SCR2=0010 SCR1=0011 State1 M1 SCR3=0111 M2 State2 State3 M0 Final State Scenario 1 is possible with S12SDBGV1 SCR encoding 6.5.3 Scenario 2 A trigger is generated if a given sequence of 2 code events is executed. Figure 6-28. Scenario 2a SCR2=0101 SCR1=0011 State1 M1 State2 M2 Final State MC9S12VR Family Reference Manual, Rev. 4.2 254 NXP Semiconductor S12S Debug Module (S12DBGV2) A trigger is generated if a given sequence of 2 code events is executed, whereby the first event is entry into a range (COMPA,COMPB configured for range mode). M1 is disabled in range modes. Figure 6-29. Scenario 2b SCR2=0101 SCR1=0111 State1 M01 M2 State2 Final State A trigger is generated if a given sequence of 2 code events is executed, whereby the second event is entry into a range (COMPA,COMPB configured for range mode) Figure 6-30. Scenario 2c SCR2=0011 SCR1=0010 State1 M2 M0 State2 Final State All 3 scenarios 2a,2b,2c are possible with the S12SDBGV1 SCR encoding 6.5.4 Scenario 3 A trigger is generated immediately when one of up to 3 given events occurs Figure 6-31. Scenario 3 SCR1=0000 State1 M012 Final State Scenario 3 is possible with S12SDBGV1 SCR encoding 6.5.5 Scenario 4 Trigger if a sequence of 2 events is carried out in an incorrect order. Event A must be followed by event B and event B must be followed by event A. 2 consecutive occurrences of event A without an intermediate MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 255 S12S Debug Module (S12DBGV2) event B cause a trigger. Similarly 2 consecutive occurrences of event B without an intermediate event A cause a trigger. This is possible by using CompA and CompC to match on the same address as shown. Figure 6-32. Scenario 4a SCR1=0100 State1 M1 SCR3=0001 State 3 M0 M2 State2 M0 M1 M1 SCR2=0011 Final State This scenario is currently not possible using 2 comparators only. S12SDBGV2 makes it possible with 2 comparators, State 3 allowing a M0 to return to state 2, whilst a M2 leads to final state as shown. Figure 6-33. Scenario 4b (with 2 comparators) SCR1=0110 State1 M2 SCR3=1110 State 3 M0 M0 State2 M01 M2 M2 SCR2=1100 M1 disabled in range mode Final State The advantage of using only 2 channels is that now range comparisons can be included (channel0) This however violates the S12SDBGV1 specification, which states that a match leading to final state always has priority in case of a simultaneous match, whilst priority is also given to the lowest channel number. For S12SDBG the corresponding CPU priority decoder is removed to support this, such that on simultaneous taghits, taghits pointing to final state have highest priority. If no taghit points to final state then the lowest channel number has priority. Thus with the above encoding from State3, the CPU and DBG would break on a simultaneous M0/M2. MC9S12VR Family Reference Manual, Rev. 4.2 256 NXP Semiconductor S12S Debug Module (S12DBGV2) 6.5.6 Scenario 5 Trigger if following event A, event C precedes event B. i.e. the expected execution flow is A->B->C. Figure 6-34. Scenario 5 SCR2=0110 SCR1=0011 State1 M1 State2 M0 Final State M2 Scenario 5 is possible with the S12SDBGV1 SCR encoding 6.5.7 Scenario 6 Trigger if event A occurs twice in succession before any of 2 other events (BC) occurs. This scenario is not possible using the S12SDBGV1 SCR encoding. S12SDBGV2 includes additions shown in red. The change in SCR1 encoding also has the advantage that a State1->State3 transition using M0 is now possible. This is advantageous because range and data bus comparisons use channel0 only. Figure 6-35. Scenario 6 SCR3=1010 SCR1=1001 State1 M0 State3 M0 Final State M12 6.5.8 Scenario 7 Trigger when a series of 3 events is executed out of order. Specifying the event order as M1,M2,M0 to run in loops (120120120). Any deviation from that order should trigger. This scenario is not possible using the S12SDBGV1 SCR encoding because OR possibilities are very limited in the channel encoding. By adding OR forks as shown in red this scenario is possible. Figure 6-36. Scenario 7 M01 SCR2=1100 SCR1=1101 State1 M1 State2 SCR3=1101 M2 State3 M12 Final State M0 M02 MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 257 S12S Debug Module (S12DBGV2) On simultaneous matches the lowest channel number has priority so with this configuration the forking from State1 has the peculiar effect that a simultaneous match0/match1 transitions to final state but a simultaneous match2/match1transitions to state2. 6.5.9 Scenario 8 Trigger when a routine/event at M2 follows either M1 or M0. Figure 6-37. Scenario 8a SCR2=0101 SCR1=0111 M01 State1 M2 State2 Final State Trigger when an event M2 is followed by either event M0 or event M1 Figure 6-38. Scenario 8b SCR2=0111 SCR1=0010 State1 M2 State2 M01 Final State Scenario 8a and 8b are possible with the S12SDBGV1 and S12SDBGV2 SCR encoding 6.5.10 Scenario 9 Trigger when a routine/event at A (M2) does not follow either B or C (M1 or M0) before they are executed again. This cannot be realized with theS12SDBGV1 SCR encoding due to OR limitations. By changing the SCR2 encoding as shown in red this scenario becomes possible. Figure 6-39. Scenario 9 SCR2=1111 SCR1=0111 State1 M01 State2 M01 Final State M2 6.5.11 Scenario 10 Trigger if an event M0 occurs following up to two successive M2 events without the resetting event M1. As shown up to 2 consecutive M2 events are allowed, whereby a reset to State1 is possible after either one or two M2 events. If an event M0 occurs following the second M2, before M1 resets to State1 then a trigger MC9S12VR Family Reference Manual, Rev. 4.2 258 NXP Semiconductor S12S Debug Module (S12DBGV2) is generated. Configuring CompA and CompC the same, it is possible to generate a breakpoint on the third consecutive occurrence of event M0 without a reset M1. Figure 6-40. Scenario 10a SCR1=0010 State1 M1 M2 SCR2=0100 SCR3=0010 M2 State2 M0 State3 Final State M1 Figure 6-41. Scenario 10b M0 SCR2=0011 SCR1=0010 State1 M2 State2 SCR3=0000 M1 State3 Final State M0 Scenario 10b shows the case that after M2 then M1 must occur before M0. Starting from a particular point in code, event M2 must always be followed by M1 before M0. If after any M2, event M0 occurs before M1 then a trigger is generated. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 259 S12S Debug Module (S12DBGV2) MC9S12VR Family Reference Manual, Rev. 4.2 260 NXP Semiconductor Chapter 7 Interrupt Module (S12SINTV1) Version Number Revision Date 01.02 13 Sep 2007 updates for S12P family devices: - re-added XIRQ and IRQ references since this functionality is used on devices without D2D - added low voltage reset as possible source to the pin reset vector 01.04 20 May 2009 added footnote about availability of “Wake-up from STOP or WAIT by XIRQ with X bit set” feature 01.05 14 Dec 2011 Re-worded for difference of Wake-up feature between STOP and WAIT modes. 7.1 Effective Date Author Description of Changes Introduction The INT module decodes the priority of all system exception requests and provides the applicable vector for processing the exception to the CPU. The INT module supports: • I bit and X bit maskable interrupt requests • A non-maskable unimplemented op-code trap • A non-maskable software interrupt (SWI) or background debug mode request • Three system reset vector requests • A spurious interrupt vector Each of the I bit maskable interrupt requests is assigned to a fixed priority level. 7.1.1 Glossary Table 7-2 contains terms and abbreviations used in the document. Table 7-2. Terminology Term CCR ISR MCU 7.1.2 • • Meaning Condition Code Register (in the CPU) Interrupt Service Routine Micro-Controller Unit Features Interrupt vector base register (IVBR) One spurious interrupt vector (at address vector base1 + 0x0080). MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 261 Interrupt Module (S12SINTV1) • • • • • • • • 7.1.3 • • • • 7.1.4 2–58 I bit maskable interrupt vector requests (at addresses vector base + 0x0082–0x00F2). I bit maskable interrupts can be nested. One X bit maskable interrupt vector request (at address vector base + 0x00F4). One non-maskable software interrupt request (SWI) or background debug mode vector request (at address vector base + 0x00F6). One non-maskable unimplemented op-code trap (TRAP) vector (at address vector base + 0x00F8). Three system reset vectors (at addresses 0xFFFA–0xFFFE). Determines the highest priority interrupt vector requests, drives the vector to the bus on CPU request Wakes up the system from stop or wait mode when an appropriate interrupt request occurs. Modes of Operation Run mode This is the basic mode of operation. Wait mode In wait mode, the clock to the INT module is disabled. The INT module is however capable of waking-up the CPU from wait mode if an interrupt occurs. Please refer to Section 7.5.3, “Wake Up from Stop or Wait Mode” for details. Stop Mode In stop mode, the clock to the INT module is disabled. The INT module is however capable of waking-up the CPU from stop mode if an interrupt occurs. Please refer to Section 7.5.3, “Wake Up from Stop or Wait Mode” for details. Freeze mode (BDM active) In freeze mode (BDM active), the interrupt vector base register is overridden internally. Please refer to Section 7.3.1.1, “Interrupt Vector Base Register (IVBR)” for details. Block Diagram Figure 7-1 shows a block diagram of the INT module. 1. The vector base is a 16-bit address which is accumulated from the contents of the interrupt vector base register (IVBR, used as upper byte) and 0x00 (used as lower byte). MC9S12VR Family Reference Manual, Rev. 4.2 262 NXP Semiconductor Interrupt Module (S12SINTV1) Peripheral Interrupt Requests Wake Up CPU Priority Decoder Non I bit Maskable Channels To CPU Vector Address IVBR I bit Maskable Channels Interrupt Requests Figure 7-1. INT Block Diagram 7.2 External Signal Description The INT module has no external signals. 7.3 Memory Map and Register Definition This section provides a detailed description of all registers accessible in the INT module. 7.3.1 Register Descriptions This section describes in address order all the INT registers and their individual bits. 7.3.1.1 Interrupt Vector Base Register (IVBR) Address: 0x0120 7 6 5 R 3 2 1 0 1 1 1 IVB_ADDR[7:0] W Reset 4 1 1 1 1 1 Figure 7-2. Interrupt Vector Base Register (IVBR) Read: Anytime Write: Anytime MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 263 Interrupt Module (S12SINTV1) Table 7-3. IVBR Field Descriptions Field Description 7–0 Interrupt Vector Base Address Bits — These bits represent the upper byte of all vector addresses. Out of reset these IVB_ADDR[7:0] bits are set to 0xFF (that means vectors are located at 0xFF80–0xFFFE) to ensure compatibility to HCS12. Note: A system reset will initialize the interrupt vector base register with “0xFF” before it is used to determine the reset vector address. Therefore, changing the IVBR has no effect on the location of the three reset vectors (0xFFFA–0xFFFE). Note: If the BDM is active (that means the CPU is in the process of executing BDM firmware code), the contents of IVBR are ignored and the upper byte of the vector address is fixed as “0xFF”. This is done to enable handling of all non-maskable interrupts in the BDM firmware. 7.4 Functional Description The INT module processes all exception requests to be serviced by the CPU module. These exceptions include interrupt vector requests and reset vector requests. Each of these exception types and their overall priority level is discussed in the subsections below. 7.4.1 S12S Exception Requests The CPU handles both reset requests and interrupt requests. A priority decoder is used to evaluate the priority of pending interrupt requests. 7.4.2 Interrupt Prioritization The INT module contains a priority decoder to determine the priority for all interrupt requests pending for the CPU. If more than one interrupt request is pending, the interrupt request with the higher vector address wins the prioritization. The following conditions must be met for an I bit maskable interrupt request to be processed. 1. The local interrupt enabled bit in the peripheral module must be set. 2. The I bit in the condition code register (CCR) of the CPU must be cleared. 3. There is no SWI, TRAP, or X bit maskable request pending. NOTE All non I bit maskable interrupt requests always have higher priority than the I bit maskable interrupt requests. If the X bit in the CCR is cleared, it is possible to interrupt an I bit maskable interrupt by an X bit maskable interrupt. It is possible to nest non maskable interrupt requests, for example by nesting SWI or TRAP calls. Since an interrupt vector is only supplied at the time when the CPU requests it, it is possible that a higher priority interrupt request could override the original interrupt request that caused the CPU to request the vector. In this case, the CPU will receive the highest priority vector and the system will process this interrupt request first, before the original interrupt request is processed. MC9S12VR Family Reference Manual, Rev. 4.2 264 NXP Semiconductor Interrupt Module (S12SINTV1) If the interrupt source is unknown (for example, in the case where an interrupt request becomes inactive after the interrupt has been recognized, but prior to the CPU vector request), the vector address supplied to the CPU will default to that of the spurious interrupt vector. NOTE Care must be taken to ensure that all interrupt requests remain active until the system begins execution of the applicable service routine; otherwise, the exception request may not get processed at all or the result may be a spurious interrupt request (vector at address (vector base + 0x0080)). 7.4.3 Reset Exception Requests The INT module supports three system reset exception request types (please refer to the Clock and Reset generator module for details): 1. Pin reset, power-on reset or illegal address reset, low voltage reset (if applicable) 2. Clock monitor reset request 3. COP watchdog reset request 7.4.4 Exception Priority The priority (from highest to lowest) and address of all exception vectors issued by the INT module upon request by the CPU is shown in Table 7-4. Table 7-4. Exception Vector Map and Priority Vector Address1 Source 0xFFFE Pin reset, power-on reset, illegal address reset, low voltage reset (if applicable) 0xFFFC Clock monitor reset 0xFFFA COP watchdog reset (Vector base + 0x00F8) Unimplemented opcode trap (Vector base + 0x00F6) Software interrupt instruction (SWI) or BDM vector request (Vector base + 0x00F4) X bit maskable interrupt request (XIRQ or D2D error interrupt)2 (Vector base + 0x00F2) IRQ or D2D interrupt request3 (Vector base + 0x00F0–0x0082) (Vector base + 0x0080) Device specific I bit maskable interrupt sources (priority determined by the low byte of the vector address, in descending order) Spurious interrupt 1 16 bits vector address based D2D error interrupt on MCUs featuring a D2D initiator module, otherwise XIRQ pin interrupt 3 D2D interrupt on MCUs featuring a D2D initiator module, otherwise IRQ pin interrupt 2 MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 265 Interrupt Module (S12SINTV1) 7.5 7.5.1 Initialization/Application Information Initialization After system reset, software should: 1. Initialize the interrupt vector base register if the interrupt vector table is not located at the default location (0xFF80–0xFFF9). 2. Enable I bit maskable interrupts by clearing the I bit in the CCR. 3. Enable the X bit maskable interrupt by clearing the X bit in the CCR. 7.5.2 Interrupt Nesting The interrupt request scheme makes it possible to nest I bit maskable interrupt requests handled by the CPU. • I bit maskable interrupt requests can be interrupted by an interrupt request with a higher priority. I bit maskable interrupt requests cannot be interrupted by other I bit maskable interrupt requests per default. In order to make an interrupt service routine (ISR) interruptible, the ISR must explicitly clear the I bit in the CCR (CLI). After clearing the I bit, other I bit maskable interrupt requests can interrupt the current ISR. An ISR of an interruptible I bit maskable interrupt request could basically look like this: 1. Service interrupt, that is clear interrupt flags, copy data, etc. 2. Clear I bit in the CCR by executing the instruction CLI (thus allowing other I bit maskable interrupt requests) 3. Process data 4. Return from interrupt by executing the instruction RTI 7.5.3 7.5.3.1 Wake Up from Stop or Wait Mode CPU Wake Up from Stop or Wait Mode Every I bit maskable interrupt request is capable of waking the MCU from wait mode. Since bus and core clocks are disabled in stop mode, only interrupt requests that can be generated without these clocks can wake the MCU from stop mode. These are listed in the device overview interrupt vector table. To determine whether an I bit maskable interrupts is qualified to wake-up the CPU or not, the same conditions as in normal run mode are applied during stop or wait mode: • If the I bit in the CCR is set, all I bit maskable interrupts are masked from waking-up the MCU. The X bit maskable interrupt request can wake up the MCU from stop or wait mode at anytime, even if the X bit in CCR is set1. MC9S12VR Family Reference Manual, Rev. 4.2 266 NXP Semiconductor Interrupt Module (S12SINTV1) If the X bit maskable interrupt request is used to wake-up the MCU with the X bit in the CCR set, the associated ISR is not called. The CPU then resumes program execution with the instruction following the WAI or STOP instruction. This features works following the same rules like any interrupt request, that is care must be taken that the X interrupt request used for wake-up remains active at least until the system begins execution of the instruction following the WAI or STOP instruction; otherwise, wake-up may not occur. 1. The capability of the XIRQ pin to wake-up the MCU with the X bit set may not be available if, for example, the XIRQ pin is shared with other peripheral modules on the device. Please refer to the Device section of the MCU reference manual for details. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 267 Interrupt Module (S12SINTV1) MC9S12VR Family Reference Manual, Rev. 4.2 268 NXP Semiconductor Chapter 8 Analog-to-Digital Converter (ADC12B6CV2) Revision History Version Number Revision Date Effective Date V02.10 29. Jun 2012 29. Jun 2012 Removed IP name in block diagram Figure 8-1 Author Description of Changes V02.11 02 Oct 2012 02 Oct 2012 Added user information to avoid maybe false external trigger events when enabling the external trigger mode (Section 8.4.2.1, “External Trigger Input). V02.12 09 Nov 2012 09 Nov 2012 Updated Table 8-9 for 8bit and 10bit resolution only version. 8.1 Introduction The ADC12B6CV2 is a 6-channel, 10-bit, multiplexed input successive approximation analog-to-digital converter. Refer to device electrical specifications for ATD accuracy. 8.1.1 • • • • • • • • • • • • • • Features 8-, 10-bit resolution. Automatic return to low power after conversion sequence Automatic compare with interrupt for higher than or less/equal than programmable value Programmable sample time. Left/right justified result data. External trigger control. Sequence complete interrupt. Analog input multiplexer for 6 analog input channels. Special conversions for VRH, VRL, (VRL+VRH)/2 and ADC temperature sensor. 1-to-6 conversion sequence lengths. Continuous conversion mode. Multiple channel scans. Configurable external trigger functionality on any AD channel or any of four additional trigger inputs. The four additional trigger inputs can be chip external or internal. Refer to device specification for availability and connectivity. Configurable location for channel wrap around (when converting multiple channels in a sequence). MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 269 Analog-to-Digital Converter (ADC12B6CV2) 8.1.2 Modes of Operation 8.1.2.1 Conversion Modes There is software programmable selection between performing single or continuous conversion on a single channel or multiple channels. 8.1.2.2 • • • MCU Operating Modes Stop Mode Entering Stop Mode aborts any conversion sequence in progress and if a sequence was aborted restarts it after exiting stop mode. This has the same effect/consequences as starting a conversion sequence with write to ATDCTL5. So after exiting from stop mode with a previously aborted sequence all flags are cleared etc. Wait Mode ADC12B6CV2 behaves same in Run and Wait Mode. For reduced power consumption continuous conversions should be aborted before entering Wait mode. Freeze Mode In Freeze Mode the ADC12B6CV2 will either continue or finish or stop converting according to the FRZ1 and FRZ0 bits. This is useful for debugging and emulation. MC9S12VR Family Reference Manual, Rev. 4.2 270 NXP Semiconductor Analog-to-Digital Converter (ADC12B6CV2) 8.1.3 Block Diagram Bus Clock Clock Prescaler ATD Clock ETRIG0 ETRIG1 ETRIG2 ETRIG3 (See device specification for availability and connectivity) Trigger Mux Mode and Sequence Complete Interrupt Compare Interrupt Timing Control ATDCTL1 ATDDIEN VDDA VSSA Successive Approximation Register (SAR) and DAC VRH VRL Results ATD 0 ATD 1 ATD 2 ATD 3 ATD 4 ATD 5 + Sample & Hold AN5 - AN4 AN3 Analog MUX Comparator AN2 AN1 AN0 Figure 8-1. ADC12B6CV2 Block Diagram MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 271 Analog-to-Digital Converter (ADC12B6CV2) 8.2 Signal Description This section lists all inputs to the ADC12B6CV2 block. 8.2.1 8.2.1.1 Detailed Signal Descriptions ANx (x = 5, 4, 3, 2, 1, 0) This pin serves as the analog input Channel x. It can also be configured as digital port or external trigger for the ATD conversion. 8.2.1.2 ETRIG3, ETRIG2, ETRIG1, ETRIG0 These inputs can be configured to serve as an external trigger for the ATD conversion. Refer to device specification for availability and connectivity of these inputs! 8.2.1.3 VRH, VRL VRH is the high reference voltage, VRL is the low reference voltage for ATD conversion. 8.2.1.4 VDDA, VSSA These pins are the power supplies for the analog circuitry of the ADC12B6CV2 block. 8.3 Memory Map and Register Definition This section provides a detailed description of all registers accessible in the ADC12B6CV2. 8.3.1 Module Memory Map Figure 8-2 gives an overview on all ADC12B6CV2 registers. NOTE Register Address = Base Address + Address Offset, where the Base Address is defined at the MCU level and the Address Offset is defined at the module level. Address Name 0x0000 ATDCTL0 0x0001 ATDCTL1 0x0002 ATDCTL2 Bit 7 R Reserved W R ETRIGSEL W R 0 W 6 0 5 0 SRES1 SRES0 AFFC Reserved 4 0 3 2 1 Bit 0 WRAP3 WRAP2 WRAP1 WRAP0 SMP_DIS ETRIGCH3 ETRIGCH2 ETRIGCH1 ETRIGCH0 ETRIGLE ETRIGP ETRIGE ASCIE ACMPIE = Unimplemented or Reserved Figure 8-2. ADC12B6CV2 Register Summary (Sheet 1 of 2) MC9S12VR Family Reference Manual, Rev. 4.2 272 NXP Semiconductor Analog-to-Digital Converter (ADC12B6CV2) Address 0x0003 0x0004 0x0005 0x0006 0x0007 0x0008 0x0009 0x000A 0x000B 0x000C 0x000D 0x000E Name R ATDCTL3 W R ATDCTL4 W R ATDCTL5 W R ATDSTAT0 W R Unimplemented W R ATDCMPEH W R W R ATDSTAT2H W R ATDSTAT2L W R ATDDIENH W R ATDDIENL W R ATDCMPHTH W ATDCMPEL 0x000F ATDCMPHTL 0x0010 ATDDR0 0x0012 ATDDR1 0x0014 ATDDR2 0x0016 ATDDR3 0x0018 ATDDR4 0x001A ATDDR5 0x001C 0x002F Unimplemented 0 R W R W R W R W R W R W R W Bit 7 6 5 4 3 2 1 Bit 0 DJM S8C S4C S2C S1C FIFO FRZ1 FRZ0 SMP2 SMP1 SMP0 SC SCAN MULT ETORF FIFOR 0 SCF 0 PRS[4:0] CD CC CB CA CC3 CC2 CC1 CC0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 1 1 1 1 1 1 1 0 0 0 0 0 0 0 0 0 CMPE[5:0] 0 0 0 CCF[5:0] 1 1 1 IEN[5:0] 0 0 0 CMPHT[5:0] See Section 8.3.2.12.1, “Left Justified Result Data (DJM=0)” and Section 8.3.2.12.2, “Right Justified Result Data (DJM=1)” See Section 8.3.2.12.1, “Left Justified Result Data (DJM=0)” and Section 8.3.2.12.2, “Right Justified Result Data (DJM=1)” See Section 8.3.2.12.1, “Left Justified Result Data (DJM=0)” and Section 8.3.2.12.2, “Right Justified Result Data (DJM=1)” See Section 8.3.2.12.1, “Left Justified Result Data (DJM=0)” and Section 8.3.2.12.2, “Right Justified Result Data (DJM=1)” See Section 8.3.2.12.1, “Left Justified Result Data (DJM=0)” and Section 8.3.2.12.2, “Right Justified Result Data (DJM=1)” See Section 8.3.2.12.1, “Left Justified Result Data (DJM=0)” and Section 8.3.2.12.2, “Right Justified Result Data (DJM=1)” 0 0 0 0 0 0 = Unimplemented or Reserved Figure 8-2. ADC12B6CV2 Register Summary (Sheet 2 of 2) MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 273 Analog-to-Digital Converter (ADC12B6CV2) 8.3.2 Register Descriptions This section describes in address order all the ADC12B6CV2 registers and their individual bits. 8.3.2.1 ATD Control Register 0 (ATDCTL0) Writes to this register will abort current conversion sequence. Module Base + 0x0000 7 R W Reset Reserved 0 6 5 4 0 0 0 0 0 0 3 2 1 0 WRAP3 WRAP2 WRAP1 WRAP0 1 1 1 1 = Unimplemented or Reserved Figure 8-3. ATD Control Register 0 (ATDCTL0) Read: Anytime Write: Anytime, in special modes always write 0 to Reserved Bit 7. Table 8-1. ATDCTL0 Field Descriptions Field 3-0 WRAP[3-0] Description Wrap Around Channel Select Bits — These bits determine the channel for wrap around when doing multi-channel conversions. The coding is summarized in Table 8-2. Table 8-2. Multi-Channel Wrap Around Coding WRAP3 WRAP2 WRAP1 WRAP0 Multiple Channel Conversions (MULT = 1) Wraparound to AN0 after Converting 0 0 0 0 Reserved1 0 0 0 1 AN1 0 0 1 0 AN2 0 0 1 1 AN3 0 1 0 0 AN4 0 1 0 1 AN5 0 1 1 0 AN5 0 1 1 1 AN5 1 0 0 0 AN5 1 0 0 1 AN5 1 0 1 0 AN5 1 0 1 1 AN5 1 1 0 0 AN5 1 1 0 1 AN5 1 1 1 0 AN5 1 1 1 1 AN5 MC9S12VR Family Reference Manual, Rev. 4.2 274 NXP Semiconductor Analog-to-Digital Converter (ADC12B6CV2) 1 8.3.2.2 If only AN0 should be converted use MULT=0. ATD Control Register 1 (ATDCTL1) Writes to this register will abort current conversion sequence. Module Base + 0x0001 R W 7 6 5 4 3 2 1 0 ETRIGSEL SRES1 SRES0 SMP_DIS ETRIGCH3 ETRIGCH2 ETRIGCH1 ETRIGCH0 0 0 1 0 1 1 1 1 Reset Figure 8-4. ATD Control Register 1 (ATDCTL1) Read: Anytime Write: Anytime Table 8-3. ATDCTL1 Field Descriptions Field Description 7 ETRIGSEL External Trigger Source Select — This bit selects the external trigger source to be either one of the AD channels or one of the ETRIG3-0 inputs. See device specification for availability and connectivity of ETRIG3-0 inputs. If a particular ETRIG3-0 input option is not available, writing a 1 to ETRISEL only sets the bit but has no effect, this means that one of the AD channels (selected by ETRIGCH3-0) is configured as the source for external trigger. The coding is summarized in Table 8-5. 6–5 SRES[1:0] A/D Resolution Select — These bits select the resolution of A/D conversion results. See Table 8-4 for coding. 4 SMP_DIS Discharge Before Sampling Bit 0 No discharge before sampling. 1 The internal sample capacitor is discharged before sampling the channel. This adds 2 ATD clock cycles to the sampling time. This can help to detect an open circuit instead of measuring the previous sampled channel. 3–0 External Trigger Channel Select — These bits select one of the AD channels or one of the ETRIG3-0 inputs as source ETRIGCH[3:0] for the external trigger. The coding is summarized in Table 8-5. Table 8-4. A/D Resolution Coding SRES1 SRES0 A/D Resolution 0 0 8-bit data 0 1 10-bit data 1 0 Reserved 1 1 Reserved MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 275 Analog-to-Digital Converter (ADC12B6CV2) Table 8-5. External Trigger Channel Select Coding 1 8.3.2.3 ETRIGSEL ETRIGCH3 ETRIGCH2 ETRIGCH1 ETRIGCH0 External trigger source is 0 0 0 0 0 AN0 0 0 0 0 1 AN1 0 0 0 1 0 AN2 0 0 0 1 1 AN3 0 0 1 0 0 AN4 0 0 1 0 1 AN5 0 0 1 1 0 AN5 0 0 1 1 1 AN5 0 1 0 0 0 AN5 0 1 0 0 1 AN5 0 1 0 1 0 AN5 0 1 0 1 1 AN5 0 1 1 0 0 AN5 0 1 1 0 1 AN5 0 1 1 1 0 AN5 0 1 1 1 1 AN5 1 0 0 0 0 ETRIG01 1 0 0 0 1 ETRIG11 1 0 0 1 0 ETRIG21 1 0 0 1 1 ETRIG31 1 0 1 X X Reserved 1 1 X X X Reserved Only if ETRIG3-0 input option is available (see device specification), else ETRISEL is ignored, that means external trigger source is still on one of the AD channels selected by ETRIGCH3-0 ATD Control Register 2 (ATDCTL2) Writes to this register will abort current conversion sequence. Module Base + 0x0002 7 R 0 W Reset 0 6 5 4 3 2 1 0 AFFC Reserved ETRIGLE ETRIGP ETRIGE ASCIE ACMPIE 0 0 0 0 0 0 0 = Unimplemented or Reserved Figure 8-5. ATD Control Register 2 (ATDCTL2) Read: Anytime Write: Anytime MC9S12VR Family Reference Manual, Rev. 4.2 276 NXP Semiconductor Analog-to-Digital Converter (ADC12B6CV2) Table 8-6. ATDCTL2 Field Descriptions Field 6 AFFC Description ATD Fast Flag Clear All 0 ATD flag clearing done by write 1 to respective CCF[n] flag. 1 Changes all ATD conversion complete flags to a fast clear sequence. For compare disabled (CMPE[n]=0) a read access to the result register will cause the associated CCF[n] flag to clear automatically. For compare enabled (CMPE[n]=1) a write access to the result register will cause the associated CCF[n] flag to clear automatically. 5 Reserved Do not alter this bit from its reset value.It is for Manufacturer use only and can change the ATD behavior. 4 ETRIGLE External Trigger Level/Edge Control — This bit controls the sensitivity of the external trigger signal. See Table 8-7 for details. 3 ETRIGP External Trigger Polarity — This bit controls the polarity of the external trigger signal. See Table 8-7 for details. 2 ETRIGE External Trigger Mode Enable — This bit enables the external trigger on one of the AD channels or one of the ETRIG3-0 inputs as described in Table 8-5. If the external trigger source is one of the AD channels, the digital input buffer of this channel is enabled. The external trigger allows to synchronize the start of conversion with external events. 0 Disable external trigger 1 Enable external trigger 1 ASCIE 0 ACMPIE ATD Sequence Complete Interrupt Enable 0 ATD Sequence Complete interrupt requests are disabled. 1 ATD Sequence Complete interrupt will be requested whenever SCF=1 is set. ATD Compare Interrupt Enable — If automatic compare is enabled for conversion n (CMPE[n]=1 in ATDCMPE register) this bit enables the compare interrupt. If the CCF[n] flag is set (showing a successful compare for conversion n), the compare interrupt is triggered. 0 ATD Compare interrupt requests are disabled. 1 For the conversions in a sequence for which automatic compare is enabled (CMPE[n]=1), an ATD Compare Interrupt will be requested whenever any of the respective CCF flags is set. Table 8-7. External Trigger Configurations ETRIGLE ETRIGP External Trigger Sensitivity 0 0 Falling edge 0 1 Rising edge 1 0 Low level 1 1 High level MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 277 Analog-to-Digital Converter (ADC12B6CV2) 8.3.2.4 ATD Control Register 3 (ATDCTL3) Writes to this register will abort current conversion sequence. Module Base + 0x0003 R W Reset 7 6 5 4 3 2 1 0 DJM S8C S4C S2C S1C FIFO FRZ1 FRZ0 0 0 1 0 0 0 0 0 = Unimplemented or Reserved Figure 8-6. ATD Control Register 3 (ATDCTL3) Read: Anytime Write: Anytime Table 8-8. ATDCTL3 Field Descriptions Field Description 7 DJM Result Register Data Justification — Result data format is always unsigned. This bit controls justification of conversion data in the result registers. 0 Left justified data in the result registers. 1 Right justified data in the result registers. Table 8-9 gives example ATD results for an input signal range between 0 and 5.12 Volts. 6–3 S8C, S4C, S2C, S1C 2 FIFO Conversion Sequence Length — These bits control the number of conversions per sequence. Table 8-10 shows all combinations. At reset, S4C is set to 1 (sequence length is 4). This is to maintain software continuity to HC12 family. Result Register FIFO Mode — If this bit is zero (non-FIFO mode), the A/D conversion results map into the result registers based on the conversion sequence; the result of the first conversion appears in the first result register (ATDDR0), the second result in the second result register (ATDDR1), and so on. If this bit is one (FIFO mode) the conversion counter is not reset at the beginning or end of a conversion sequence; sequential conversion results are placed in consecutive result registers. In a continuously scanning conversion sequence, the result register counter will wrap around when it reaches the end of the result register file. The conversion counter value (CC3-0 in ATDSTAT0) can be used to determine where in the result register file, the current conversion result will be placed. Aborting a conversion or starting a new conversion clears the conversion counter even if FIFO=1. So the first result of a new conversion sequence, started by writing to ATDCTL5, will always be place in the first result register (ATDDDR0). Intended usage of FIFO mode is continuos conversion (SCAN=1) or triggered conversion (ETRIG=1). Which result registers hold valid data can be tracked using the conversion complete flags. Fast flag clear mode may be useful in a particular application to track valid data. If this bit is one, automatic compare of result registers is always disabled, that is ADC12B6CV2 will behave as if ACMPIE and all CPME[n] were zero. 0 Conversion results are placed in the corresponding result register up to the selected sequence length. 1 Conversion results are placed in consecutive result registers (wrap around at end). 1–0 FRZ[1:0] Background Debug Freeze Enable — When debugging an application, it is useful in many cases to have the ATD pause when a breakpoint (Freeze Mode) is encountered. These 2 bits determine how the ATD will respond to a breakpoint as shown in Table 8-11. Leakage onto the storage node and comparator reference capacitors may compromise the accuracy of an immediately frozen conversion depending on the length of the freeze period. MC9S12VR Family Reference Manual, Rev. 4.2 278 NXP Semiconductor Analog-to-Digital Converter (ADC12B6CV2) Table 8-9. Examples of ideal decimal ATD Results Input Signal VRL = 0 Volts VRH = 5.12 Volts 8-Bit Codes (resolution=20mV) 10-Bit Codes (resolution=5mV) 5.120 Volts ... 0.022 0.020 0.018 0.016 0.014 0.012 0.010 0.008 0.006 0.004 0.003 0.002 0.000 255 ... 1 1 1 1 1 1 1 0 0 0 0 0 0 1023 ... 4 4 4 3 3 2 2 2 1 1 1 0 0 Table 8-10. Conversion Sequence Length Coding S8C S4C S2C S1C Number of Conversions per Sequence 0 0 0 0 6 0 0 0 1 1 0 0 1 0 2 0 0 1 1 3 0 1 0 0 4 0 1 0 1 5 0 1 1 0 6 0 1 1 1 6 1 0 0 0 6 1 0 0 1 6 1 0 1 0 6 1 0 1 1 6 1 1 0 0 6 1 1 0 1 6 1 1 1 0 6 1 1 1 1 6 Table 8-11. ATD Behavior in Freeze Mode (Breakpoint) FRZ1 FRZ0 Behavior in Freeze Mode 0 0 Continue conversion 0 1 Reserved 1 0 Finish current conversion, then freeze MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 279 Analog-to-Digital Converter (ADC12B6CV2) Table 8-11. ATD Behavior in Freeze Mode (Breakpoint) 8.3.2.5 FRZ1 FRZ0 1 1 Behavior in Freeze Mode Freeze Immediately ATD Control Register 4 (ATDCTL4) Writes to this register will abort current conversion sequence. Module Base + 0x0004 R W Reset 7 6 5 SMP2 SMP1 SMP0 0 0 0 4 3 2 1 0 0 1 PRS[4:0] 0 0 1 Figure 8-7. ATD Control Register 4 (ATDCTL4) Read: Anytime Write: Anytime Table 8-12. ATDCTL4 Field Descriptions Field Description 7–5 SMP[2:0] Sample Time Select — These three bits select the length of the sample time in units of ATD conversion clock cycles. Note that the ATD conversion clock period is itself a function of the prescaler value (bits PRS4-0). Table 8-13 lists the available sample time lengths. 4–0 PRS[4:0] ATD Clock Prescaler — These 5 bits are the binary prescaler value PRS. The ATD conversion clock frequency is calculated as follows: f BUS f ATDCLK = ----------------------------------2 PRS + 1 Refer to Device Specification for allowed frequency range of fATDCLK. Table 8-13. Sample Time Select SMP2 SMP1 SMP0 Sample Time in Number of ATD Clock Cycles 0 0 0 4 0 0 1 6 0 1 0 8 0 1 1 10 1 0 0 12 1 0 1 16 1 1 0 20 1 1 1 24 MC9S12VR Family Reference Manual, Rev. 4.2 280 NXP Semiconductor Analog-to-Digital Converter (ADC12B6CV2) 8.3.2.6 ATD Control Register 5 (ATDCTL5) Writes to this register will abort current conversion sequence and start a new conversion sequence. If the external trigger function is enabled (ETRIGE=1) an initial write to ATDCTL5 is required to allow starting of a conversion sequence which will then occur on each trigger event. Start of conversion means the beginning of the sampling phase. Module Base + 0x0005 7 R 0 W Reset 0 6 5 4 3 2 1 0 SC SCAN MULT CD CC CB CA 0 0 0 0 0 0 0 = Unimplemented or Reserved Figure 8-8. ATD Control Register 5 (ATDCTL5) Read: Anytime Write: Anytime Table 8-14. ATDCTL5 Field Descriptions Field Description 6 SC Special Channel Conversion Bit — If this bit is set, then special channel conversion can be selected using CD, CC, CB and CA of ATDCTL5. Table 8-15 lists the coding. 0 Special channel conversions disabled 1 Special channel conversions enabled 5 SCAN Continuous Conversion Sequence Mode — This bit selects whether conversion sequences are performed continuously or only once. If external trigger function is enabled (ETRIGE=1) setting this bit has no effect, thus the external trigger always starts a single conversion sequence. 0 Single conversion sequence 1 Continuous conversion sequences (scan mode) 4 MULT Multi-Channel Sample Mode — When MULT is 0, the ATD sequence controller samples only from the specified analog input channel for an entire conversion sequence. The analog channel is selected by channel selection code (control bits CD/CC/CB/CA located in ATDCTL5). When MULT is 1, the ATD sequence controller samples across channels. The number of channels sampled is determined by the sequence length value (S8C, S4C, S2C, S1C). The first analog channel examined is determined by channel selection code (CD, CC, CB, CA control bits); subsequent channels sampled in the sequence are determined by incrementing the channel selection code or wrapping around to AN0 (channel 0). 0 Sample only one channel 1 Sample across several channels 3–0 CD, CC, CB, CA Analog Input Channel Select Code — These bits select the analog input channel(s). Table 8-15 lists the coding used to select the various analog input channels. In the case of single channel conversions (MULT=0), this selection code specifies the channel to be examined. In the case of multiple channel conversions (MULT=1), this selection code specifies the first channel to be examined in the conversion sequence. Subsequent channels are determined by incrementing the channel selection code or wrapping around to AN0 (after converting the channel defined by the Wrap Around Channel Select Bits WRAP3-0 in ATDCTL0). When starting with a channel number higher than the one defined by WRAP3-0 the first wrap around will be AN5 to AN0. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 281 Analog-to-Digital Converter (ADC12B6CV2) Table 8-15. Analog Input Channel Select Coding SC CD CC CB CA Analog Input Channel 0 0 0 0 0 AN0 0 0 0 1 AN1 0 0 1 0 AN2 0 0 1 1 AN3 0 1 0 0 AN4 0 1 0 1 AN5 0 1 1 0 AN5 0 1 1 1 AN5 1 0 0 0 AN5 1 0 0 1 AN5 1 0 1 0 AN5 1 0 1 1 AN5 1 1 0 0 AN5 1 1 0 1 AN5 1 1 1 0 AN5 1 1 1 1 AN5 0 0 0 0 Internal_6, Temperature sense of ADC hardmacro 0 0 0 1 Internal_7 0 0 1 0 Internal_0 0 0 1 1 Internal_1 0 1 0 0 VRH 0 1 0 1 VRL 0 1 1 0 (VRH+VRL) / 2 0 1 1 1 Reserved 1 0 0 0 Internal_2 1 0 0 1 Internal_3 1 0 1 0 Internal_4 1 0 1 1 Internal_5 1 X X X Reserved 1 MC9S12VR Family Reference Manual, Rev. 4.2 282 NXP Semiconductor Analog-to-Digital Converter (ADC12B6CV2) 8.3.2.7 ATD Status Register 0 (ATDSTAT0) This register contains the Sequence Complete Flag, overrun flags for external trigger and FIFO mode, and the conversion counter. Module Base + 0x0006 7 R W Reset SCF 0 6 0 0 5 4 ETORF FIFOR 0 0 3 2 1 0 CC3 CC2 CC1 CC0 0 0 0 0 = Unimplemented or Reserved Figure 8-9. ATD Status Register 0 (ATDSTAT0) Read: Anytime Write: Anytime (No effect on (CC3, CC2, CC1, CC0)) Table 8-16. ATDSTAT0 Field Descriptions Field Description 7 SCF Sequence Complete Flag — This flag is set upon completion of a conversion sequence. If conversion sequences are continuously performed (SCAN=1), the flag is set after each one is completed. This flag is cleared when one of the following occurs: A) Write “1” to SCF B) Write to ATDCTL5 (a new conversion sequence is started) C) If AFFC=1 and a result register is read 0 Conversion sequence not completed 1 Conversion sequence has completed 5 ETORF External Trigger Overrun Flag — While in edge sensitive mode (ETRIGLE=0), if additional active edges are detected while a conversion sequence is in process the overrun flag is set. This flag is cleared when one of the following occurs: A) Write “1” to ETORF B) Write to ATDCTL0,1,2,3,4, ATDCMPE or ATDCMPHT (a conversion sequence is aborted) C) Write to ATDCTL5 (a new conversion sequence is started) 0 No External trigger overrun error has occurred 1 External trigger overrun error has occurred 4 FIFOR Result Register Overrun Flag — This bit indicates that a result register has been written to before its associated conversion complete flag (CCF) has been cleared. This flag is most useful when using the FIFO mode because the flag potentially indicates that result registers are out of sync with the input channels. However, it is also practical for non-FIFO modes, and indicates that a result register has been overwritten before it has been read (i.e. the old data has been lost). This flag is cleared when one of the following occurs: A) Write “1” to FIFOR B) Write to ATDCTL0,1,2,3,4, ATDCMPE or ATDCMPHT (a conversion sequence is aborted) C) Write to ATDCTL5 (a new conversion sequence is started) 0 No overrun has occurred 1 Overrun condition exists (result register has been written while associated CCFx flag was still set) MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 283 Analog-to-Digital Converter (ADC12B6CV2) Table 8-16. ATDSTAT0 Field Descriptions (continued) Field Description 3–0 CC[3:0] Conversion Counter — These 4 read-only bits are the binary value of the conversion counter. The conversion counter points to the result register that will receive the result of the current conversion. E.g. CC3=0, CC2=1, CC1=1, CC0=0 indicates that the result of the current conversion will be in ATD Result Register 6. If in non-FIFO mode (FIFO=0) the conversion counter is initialized to zero at the beginning and end of the conversion sequence. If in FIFO mode (FIFO=1) the register counter is not initialized. The conversion counter wraps around when its maximum value is reached. Aborting a conversion or starting a new conversion clears the conversion counter even if FIFO=1. 8.3.2.8 ATD Compare Enable Register (ATDCMPE) Writes to this register will abort current conversion sequence. Read: Anytime Write: Anytime Module Base + 0x0008 R 15 14 13 12 11 10 9 8 7 6 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 5 4 0 2 1 0 0 0 CMPE[5:0] W Reset 3 0 0 0 0 = Unimplemented or Reserved Figure 8-10. ATD Compare Enable Register (ATDCMPE) Table 8-17. ATDCMPE Field Descriptions Field 5–0 CMPE[5:0] Description Compare Enable for Conversion Number n (n= 5, 4, 3, 2, 1, 0) of a Sequence (n conversion number, NOT channel number!) — These bits enable automatic compare of conversion results individually for conversions of a sequence. The sense of each comparison is determined by the CMPHT[n] bit in the ATDCMPHT register. For each conversion number with CMPE[n]=1 do the following: 1) Write compare value to ATDDRn result register 2) Write compare operator with CMPHT[n] in ATDCPMHT register CCF[n] in ATDSTAT2 register will flag individual success of any comparison. 0 No automatic compare 1 Automatic compare of results for conversion n of a sequence is enabled. MC9S12VR Family Reference Manual, Rev. 4.2 284 NXP Semiconductor Analog-to-Digital Converter (ADC12B6CV2) 8.3.2.9 ATD Status Register 2 (ATDSTAT2) This read-only register contains the Conversion Complete Flags CCF[5:0]. Module Base + 0x000A R 15 14 13 12 11 10 9 8 7 6 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 5 4 3 2 1 0 0 0 CCF[5:0] W Reset 0 0 0 0 0 = Unimplemented or Reserved Figure 8-11. ATD Status Register 2 (ATDSTAT2) Read: Anytime Write: Anytime (for details see Table 8-18 below) Table 8-18. ATDSTAT2 Field Descriptions Field Description 5–0 CCF[5:0] Conversion Complete Flag n (n= 5, 4, 3, 2, 1, 0) (n conversion number, NOT channel number!)— A conversion complete flag is set at the end of each conversion in a sequence. The flags are associated with the conversion position in a sequence (and also the result register number). Therefore in non-fifo mode, CCF[4] is set when the fifth conversion in a sequence is complete and the result is available in result register ATDDR4; CCF[5] is set when the sixth conversion in a sequence is complete and the result is available in ATDDR5, and so forth. If automatic compare of conversion results is enabled (CMPE[n]=1 in ATDCMPE), the conversion complete flag is only set if comparison with ATDDRn is true. If ACMPIE=1 a compare interrupt will be requested. In this case, as the ATDDRn result register is used to hold the compare value, the result will not be stored there at the end of the conversion but is lost. A flag CCF[n] is cleared when one of the following occurs: A) Write to ATDCTL5 (a new conversion sequence is started) B) If AFFC=0, write “1” to CCF[n] C) If AFFC=1 and CMPE[n]=0, read of result register ATDDRn D) If AFFC=1 and CMPE[n]=1, write to result register ATDDRn In case of a concurrent set and clear on CCF[n]: The clearing by method A) will overwrite the set. The clearing by methods B) or C) or D) will be overwritten by the set. 0 Conversion number n not completed or successfully compared 1 If (CMPE[n]=0): Conversion number n has completed. Result is ready in ATDDRn. If (CMPE[n]=1): Compare for conversion result number n with compare value in ATDDRn, using compare operator CMPGT[n] is true. (No result available in ATDDRn) MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 285 Analog-to-Digital Converter (ADC12B6CV2) 8.3.2.10 ATD Input Enable Register (ATDDIEN) Module Base + 0x000C R 15 14 13 12 11 10 9 8 7 6 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 5 4 1 2 1 0 0 0 IEN[5:0] W Reset 3 0 0 0 0 = Unimplemented or Reserved Figure 8-12. ATD Input Enable Register (ATDDIEN) Read: Anytime Write: Anytime Table 8-19. ATDDIEN Field Descriptions Field Description 5–0 IEN[5:0] ATD Digital Input Enable on channel x (x= 5, 4, 3, 2, 1, 0) — This bit controls the digital input buffer from the analog input pin (ANx) to the digital data register. 0 Disable digital input buffer to ANx pin 1 Enable digital input buffer on ANx pin. Note: Setting this bit will enable the corresponding digital input buffer continuously. If this bit is set while simultaneously using it as an analog port, there is potentially increased power consumption because the digital input buffer maybe in the linear region. 8.3.2.11 ATD Compare Higher Than Register (ATDCMPHT) Writes to this register will abort current conversion sequence. Read: Anytime Write: Anytime Module Base + 0x000E R 15 14 13 12 11 10 9 8 7 6 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 5 4 2 1 0 0 0 CMPHT[5:0] W Reset 3 0 0 0 0 = Unimplemented or Reserved Figure 8-13. ATD Compare Higher Than Register (ATDCMPHT) Table 8-20. ATDCMPHT Field Descriptions Field Description 5–0 CMPHT[5:0] Compare Operation Higher Than Enable for conversion number n (n= 5, 4, 3, 2, 1, 0) of a Sequence (n conversion number, NOT channel number!) — This bit selects the operator for comparison of conversion results. 0 If result of conversion n is lower or same than compare value in ATDDRn, this is flagged in ATDSTAT2 1 If result of conversion n is higher than compare value in ATDDRn, this is flagged in ATDSTAT2 MC9S12VR Family Reference Manual, Rev. 4.2 286 NXP Semiconductor Analog-to-Digital Converter (ADC12B6CV2) 8.3.2.12 ATD Conversion Result Registers (ATDDRn) The A/D conversion results are stored in 6 result registers. Results are always in unsigned data representation. Left and right justification is selected using the DJM control bit in ATDCTL3. If automatic compare of conversions results is enabled (CMPE[n]=1 in ATDCMPE), these registers must be written with the compare values in left or right justified format depending on the actual value of the DJM bit. In this case, as the ATDDRn register is used to hold the compare value, the result will not be stored there at the end of the conversion but is lost. Attention, n is the conversion number, NOT the channel number! Read: Anytime Write: Anytime NOTE For conversions not using automatic compare, results are stored in the result registers after each conversion. In this case avoid writing to ATDDRn except for initial values, because an A/D result might be overwritten. 8.3.2.12.1 Left Justified Result Data (DJM=0) Module Base + 0x0010 = ATDDR0, 0x0012 = ATDDR1, 0x0014 = ATDDR2, 0x0016 = ATDDR3 0x0018 = ATDDR4, 0x001A = ATDDR5 15 14 13 12 11 10 R 8 7 6 5 4 Result-Bit[11:0] W Reset 9 0 0 0 0 0 0 0 0 0 0 0 0 3 2 1 0 0 0 0 0 0 0 0 0 = Unimplemented or Reserved Figure 8-14. Left justified ATD conversion result register (ATDDRn) Table 8-21 shows how depending on the A/D resolution the conversion result is transferred to the ATD result registers for left justified data. Compare is always done using all 12 bits of both the conversion result and the compare value in ATDDRn. Table 8-21. Conversion result mapping to ATDDRn A/D resolution DJM conversion result mapping to ATDDRn 8-bit data 0 Result-Bit[11:4] = conversion result, Result-Bit[3:0]=0000 10-bit data 0 Result-Bit[11:2] = conversion result, Result-Bit[1:0]=00 MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 287 Analog-to-Digital Converter (ADC12B6CV2) 8.3.2.12.2 Right Justified Result Data (DJM=1) Module Base + 0x0010 = ATDDR0, 0x0012 = ATDDR1, 0x0014 = ATDDR2, 0x0016 = ATDDR3 0x0018 = ATDDR4, 0x001A = ATDDR5 R 15 14 13 12 0 0 0 0 0 0 0 0 11 10 9 8 7 5 4 3 2 1 0 0 0 0 0 0 Result-Bit[11:0] W Reset 6 0 0 0 0 0 0 0 = Unimplemented or Reserved Figure 8-15. Right justified ATD conversion result register (ATDDRn) Table 8-22 shows how depending on the A/D resolution the conversion result is transferred to the ATD result registers for right justified data. Compare is always done using all 12 bits of both the conversion result and the compare value in ATDDRn. Table 8-22. Conversion result mapping to ATDDRn A/D resolution DJM conversion result mapping to ATDDRn 8-bit data 1 Result-Bit[7:0] = result, Result-Bit[11:8]=0000 10-bit data 1 Result-Bit[9:0] = result, Result-Bit[11:10]=00 MC9S12VR Family Reference Manual, Rev. 4.2 288 NXP Semiconductor Analog-to-Digital Converter (ADC12B6CV2) 8.4 Functional Description The ADC12B6CV2 consists of an analog sub-block and a digital sub-block. 8.4.1 Analog Sub-Block The analog sub-block contains all analog electronics required to perform a single conversion. Separate power supplies VDDA and VSSA allow to isolate noise of other MCU circuitry from the analog sub-block. 8.4.1.1 Sample and Hold Machine The Sample and Hold Machine controls the storage and charge of the sample capacitor to the voltage level of the analog signal at the selected ADC input channel. During the sample process the analog input connects directly to the storage node. The input analog signals are unipolar and must be within the potential range of VSSA to VDDA. During the hold process the analog input is disconnected from the storage node. 8.4.1.2 Analog Input Multiplexer The analog input multiplexer connects one of the 6 external analog input channels to the sample and hold machine. 8.4.1.3 Analog-to-Digital (A/D) Machine The A/D Machine performs analog to digital conversions. The resolution is program selectable to be either 8 or 10 bits. The A/D machine uses a successive approximation architecture. It functions by comparing the sampled and stored analog voltage with a series of binary coded discrete voltages. By following a binary search algorithm, the A/D machine identifies the discrete voltage that is nearest to the sampled and stored voltage. When not converting the A/D machine is automatically powered down. Only analog input signals within the potential range of VRL to VRH (A/D reference potentials) will result in a non-railed digital output code. 8.4.2 Digital Sub-Block This subsection describes some of the digital features in more detail. See Section 8.3.2, “Register Descriptions” for all details. 8.4.2.1 External Trigger Input The external trigger feature allows the user to synchronize ATD conversions to an external event rather than relying only on software to trigger the ATD module when a conversions is about to take place. The external trigger signal (out of reset ATD channel 5, configurable in ATDCTL1) is programmable to be edge MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 289 Analog-to-Digital Converter (ADC12B6CV2) or level sensitive with polarity control. Table 8-23 gives a brief description of the different combinations of control bits and their effect on the external trigger function. In order to avoid maybe false trigger events please enable the external digital input via ATDDIEN register first and in the following enable the external trigger mode by bit ETRIGE. Table 8-23. External Trigger Control Bits ETRIGLE ETRIGP ETRIGE SCAN Description X X 0 0 Ignores external trigger. Performs one conversion sequence and stops. X X 0 1 Ignores external trigger. Performs continuous conversion sequences. 0 0 1 X Trigger falling edge sensitive. Performs one conversion sequence per trigger. 0 1 1 X Trigger rising edge sensitive. Performs one conversion sequence per trigger. 1 0 1 X Trigger low level sensitive. Performs continuous conversions while trigger level is active. 1 1 1 X Trigger high level sensitive. Performs continuous conversions while trigger level is active. In either level or edge sensitive mode, the first conversion begins when the trigger is received. Once ETRIGE is enabled a conversion must be triggered externally after writing to ATDCTL5 register. During a conversion in edge sensitive mode, if additional trigger events are detected the overrun error flag ETORF is set. If level sensitive mode is active and the external trigger de-asserts and later asserts again during a conversion sequence, this does not constitute an overrun. Therefore, the flag is not set. If the trigger is left active in level sensitive mode when a sequence is about to be complete, another sequence will be triggered immediately. 8.4.2.2 General-Purpose Digital Port Operation Each ATD input pin can be switched between analog or digital input functionality. An analog multiplexer makes each ATD input pin selected as analog input available to the A/D converter. The pad of the ATD input pin is always connected to the analog input channel of the analog mulitplexer. Each pad input signal is buffered to the digital port register. This buffer can be turned on or off with the ATDDIEN register for each ATD input pin. This is important so that the buffer does not draw excess current when an ATD input pin is selected as analog input to the ADC12B6CV2. MC9S12VR Family Reference Manual, Rev. 4.2 290 NXP Semiconductor Analog-to-Digital Converter (ADC12B6CV2) 8.5 Resets At reset the ADC12B6CV2 is in a power down state. The reset state of each individual bit is listed within the Register Description section (see Section 8.3.2, “Register Descriptions”) which details the registers and their bit-field. 8.6 Interrupts The interrupts requested by the ADC12B6CV2 are listed in Table 8-24. Refer to MCU specification for related vector address and priority. Table 8-24. ATD Interrupt Vectors CCR Mask Local Enable Sequence Complete Interrupt I bit ASCIE in ATDCTL2 Compare Interrupt I bit ACMPIE in ATDCTL2 Interrupt Source See Section 8.3.2, “Register Descriptions” for further details. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 291 Analog-to-Digital Converter (ADC12B6CV2) MC9S12VR Family Reference Manual, Rev. 4.2 292 NXP Semiconductor Chapter 9 Pulse-Width Modulator (S12PWM8B8CV2) Table 9-1. Revision History Revision Number Revision Date Sections Affected v02.00 Feb. 20, 2009 All 9.1 Description of Changes Initial revision of scalable PWM. Started from pwm_8b8c (v01.08). Introduction The Version 2 of S12 PWM module is a channel scalable and optimized implementation of S12 PWM8B8C Version 1. The channel is scalable in pairs from PWM0 to PWM7 and the available channel number is 2, 4, 6 and 8. The shutdown feature has been removed and the flexibility to select one of four clock sources per channel has improved. If the corresponding channels exist and shutdown feature is not used, the Version 2 is fully software compatible to Version 1. 9.1.1 Features The scalable PWM block includes these distinctive features: • Up to eight independent PWM channels, scalable in pairs (PWM0 to PWM7) • Available channel number could be 2, 4, 6, 8 (refer to device specification for exact number) • Programmable period and duty cycle for each channel • Dedicated counter for each PWM channel • Programmable PWM enable/disable for each channel • Software selection of PWM duty pulse polarity for each channel • Period and duty cycle are double buffered. Change takes effect when the end of the effective period is reached (PWM counter reaches zero) or when the channel is disabled. • Programmable center or left aligned outputs on individual channels • Up to eight 8-bit channel or four 16-bit channel PWM resolution • Four clock sources (A, B, SA, and SB) provide for a wide range of frequencies • Programmable clock select logic 9.1.2 Modes of Operation There is a software programmable option for low power consumption in wait mode that disables the input clock to the prescaler. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 293 Pulse-Width Modulator (S12PWM8B8CV2) In freeze mode there is a software programmable option to disable the input clock to the prescaler. This is useful for emulation. Wait: The prescaler keeps on running, unless PSWAI in PWMCTL is set to 1. Freeze: The prescaler keeps on running, unless PFRZ in PWMCTL is set to 1. 9.1.3 Block Diagram Figure 9-1 shows the block diagram for the 8-bit up to 8-channel scalable PWM block. PWM8B8C PWM Channels Channel 7 Period and Duty Counter Channel 6 Clock Clock Select Period and Duty PWM Clock Counter Channel 5 Period and Duty Counter PWM7 PWM6 PWM5 Control Channel 4 Period and Duty Counter Channel 3 Period and Duty Enable Counter Channel 2 Polarity Period and Duty Alignment Counter Channel 1 Period and Duty Counter PWM4 PWM3 PWM2 PWM1 Channel 0 Period and Duty Counter PWM0 Maximum possible channels, scalable in pairs from PWM0 to PWM7. Figure 9-1. Scalable PWM Block Diagram 9.2 External Signal Description The scalable PWM module has a selected number of external pins. Refer to device specification for exact number. MC9S12VR Family Reference Manual, Rev. 4.2 294 NXP Semiconductor Pulse-Width Modulator (S12PWM8B8CV2) 9.2.1 PWM7 - PWM0 — PWM Channel 7 - 0 Those pins serve as waveform output of PWM channel 7 - 0. 9.3 Memory Map and Register Definition 9.3.1 Module Memory Map This section describes the content of the registers in the scalable PWM module. The base address of the scalable PWM module is determined at the MCU level when the MCU is defined. The register decode map is fixed and begins at the first address of the module address offset. The figure below shows the registers associated with the scalable PWM and their relative offset from the base address. The register detail description follows the order they appear in the register map. Reserved bits within a register will always read as 0 and the write will be unimplemented. Unimplemented functions are indicated by shading the bit. NOTE Register Address = Base Address + Address Offset, where the Base Address is defined at the MCU level and the Address Offset is defined at the module level. 9.3.2 Register Descriptions This section describes in detail all the registers and register bits in the scalable PWM module. Register Name PWME1 R W PWMPOL1 R W PWMCLK1 R W PWMPRCLK R Bit 7 6 5 4 3 2 1 Bit 0 PWME7 PWME6 PWME5 PWME4 PWME3 PWME2 PWME1 PWME0 PPOL7 PPOL6 PPOL5 PPOL4 PPOL3 PPOL2 PPOL1 PPOL0 PCLK7 PCLKL6 PCLK5 PCLK4 PCLK3 PCLK2 PCLK1 PCLK0 PCKB2 PCKB1 PCKB0 PCKA2 PCKA1 PCKA0 CAE7 CAE6 CAE5 CAE4 CAE3 CAE2 CAE1 CAE0 CON67 CON45 CON23 CON01 PSWAI PFRZ 0 0 0 W PWMCAE1 R W PWMCTL1 R W 0 = Unimplemented or Reserved Figure 9-2. The scalable PWM Register Summary (Sheet 1 of 4) MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 295 Pulse-Width Modulator (S12PWM8B8CV2) Register Name Bit 7 6 5 4 3 2 1 Bit 0 PCLKAB7 PCLKAB6 PCLKAB5 PCLKAB4 PCLKAB3 PCLKAB2 PCLKAB1 PCLKAB0 0 0 0 0 0 0 0 0 Bit 7 6 5 4 3 2 1 Bit 0 Bit 7 6 5 4 3 2 1 Bit 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 R Bit 7 6 5 4 3 2 1 Bit 0 W 0 0 0 0 0 0 0 0 R Bit 7 6 5 4 3 2 1 Bit 0 W 0 0 0 0 0 0 0 0 R Bit 7 6 5 4 3 2 1 Bit 0 W 0 0 0 0 0 0 0 0 PWMCLKAB R 1 RESERVED W R W PWMSCLA R W PWMSCLB R W RESERVED R W RESERVED R W PWMCNT02 PWMCNT12 PWMCNT22 PWMCNT32 PWMCNT42 PWMCNT52 PWMCNT62 PWMCNT72 PWMPER02 R Bit 7 6 5 4 3 2 1 Bit 0 W 0 0 0 0 0 0 0 0 R Bit 7 6 5 4 3 2 1 Bit 0 W 0 0 0 0 0 0 0 0 R Bit 7 6 5 4 3 2 1 Bit 0 W 0 0 0 0 0 0 0 0 R Bit 7 6 5 4 3 2 1 Bit 0 W 0 0 0 0 0 0 0 0 R Bit 7 6 5 4 3 2 1 Bit 0 W 0 0 0 0 0 0 0 0 Bit 7 6 5 4 3 2 1 Bit 0 R W = Unimplemented or Reserved Figure 9-2. The scalable PWM Register Summary (Sheet 2 of 4) MC9S12VR Family Reference Manual, Rev. 4.2 296 NXP Semiconductor Pulse-Width Modulator (S12PWM8B8CV2) Register Name PWMPER12 R W PWMPER22 R W PWMPER32 R W PWMPER42 R W PWMPER52 R W PWMPER62 R W PWMPER72 R W PWMDTY02 R W PWMDTY12 R W PWMDTY22 R W PWMDTY32 R W PWMDTY42 R W PWMDTY52 R W PWMDTY62 R W PWMDTY72 R W Bit 7 6 5 4 3 2 1 Bit 0 Bit 7 6 5 4 3 2 1 Bit 0 Bit 7 6 5 4 3 2 1 Bit 0 Bit 7 6 5 4 3 2 1 Bit 0 Bit 7 6 5 4 3 2 1 Bit 0 Bit 7 6 5 4 3 2 1 Bit 0 Bit 7 6 5 4 3 2 1 Bit 0 Bit 7 6 5 4 3 2 1 Bit 0 Bit 7 6 5 4 3 2 1 Bit 0 Bit 7 6 5 4 3 2 1 Bit 0 Bit 7 6 5 4 3 2 1 Bit 0 Bit 7 6 5 4 3 2 1 Bit 0 Bit 7 6 5 4 3 2 1 Bit 0 Bit 7 6 5 4 3 2 1 Bit 0 Bit 7 6 5 4 3 2 1 Bit 0 Bit 7 6 5 4 3 2 1 Bit 0 = Unimplemented or Reserved Figure 9-2. The scalable PWM Register Summary (Sheet 3 of 4) MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 297 Pulse-Width Modulator (S12PWM8B8CV2) Register Name Bit 7 6 5 4 3 2 1 Bit 0 R RESERVED W 0 0 0 0 0 0 0 0 R RESERVED W 0 0 0 0 0 0 0 0 R RESERVED W 0 0 0 0 0 0 0 0 R RESERVED W 0 0 0 0 0 0 0 0 = Unimplemented or Reserved Figure 9-2. The scalable PWM Register Summary (Sheet 4 of 4) 1 2 The related bit is available only if corresponding channel exists. The register is available only if corresponding channel exists. 9.3.2.1 PWM Enable Register (PWME) Each PWM channel has an enable bit (PWMEx) to start its waveform output. When any of the PWMEx bits are set (PWMEx = 1), the associated PWM output is enabled immediately. However, the actual PWM waveform is not available on the associated PWM output until its clock source begins its next cycle due to the synchronization of PWMEx and the clock source. NOTE The first PWM cycle after enabling the channel can be irregular. An exception to this is when channels are concatenated. Once concatenated mode is enabled (CONxx bits set in PWMCTL register), enabling/disabling the corresponding 16-bit PWM channel is controlled by the low order PWMEx bit. In this case, the high order bytes PWMEx bits have no effect and their corresponding PWM output lines are disabled. While in run mode, if all existing PWM channels are disabled (PWMEx–0 = 0), the prescaler counter shuts off for power savings. R W Reset 7 6 5 4 3 2 1 0 PWME7 PWME6 PWME5 PWME4 PWME3 PWME2 PWME1 PWME0 0 0 0 0 0 0 0 0 Figure 9-3. PWM Enable Register (PWME) Read: Anytime Write: Anytime MC9S12VR Family Reference Manual, Rev. 4.2 298 NXP Semiconductor Pulse-Width Modulator (S12PWM8B8CV2) Table 9-2. PWME Field Descriptions Note: Bits related to available channels have functional significance. Writing to unavailable bits has no effect. Read from unavailable bits return a zero Field Description 7 PWME7 Pulse Width Channel 7 Enable 0 Pulse width channel 7 is disabled. 1 Pulse width channel 7 is enabled. The pulse modulated signal becomes available at PWM output bit 7 when its clock source begins its next cycle. 6 PWME6 Pulse Width Channel 6 Enable 0 Pulse width channel 6 is disabled. 1 Pulse width channel 6 is enabled. The pulse modulated signal becomes available at PWM output bit 6 when its clock source begins its next cycle. If CON67=1, then bit has no effect and PWM output line 6 is disabled. 5 PWME5 Pulse Width Channel 5 Enable 0 Pulse width channel 5 is disabled. 1 Pulse width channel 5 is enabled. The pulse modulated signal becomes available at PWM output bit 5 when its clock source begins its next cycle. 4 PWME4 Pulse Width Channel 4 Enable 0 Pulse width channel 4 is disabled. 1 Pulse width channel 4 is enabled. The pulse modulated signal becomes available at PWM, output bit 4 when its clock source begins its next cycle. If CON45 = 1, then bit has no effect and PWM output line 4 is disabled. 3 PWME3 Pulse Width Channel 3 Enable 0 Pulse width channel 3 is disabled. 1 Pulse width channel 3 is enabled. The pulse modulated signal becomes available at PWM, output bit 3 when its clock source begins its next cycle. 2 PWME2 Pulse Width Channel 2 Enable 0 Pulse width channel 2 is disabled. 1 Pulse width channel 2 is enabled. The pulse modulated signal becomes available at PWM, output bit 2 when its clock source begins its next cycle. If CON23 = 1, then bit has no effect and PWM output line 2 is disabled. 1 PWME1 Pulse Width Channel 1 Enable 0 Pulse width channel 1 is disabled. 1 Pulse width channel 1 is enabled. The pulse modulated signal becomes available at PWM, output bit 1 when its clock source begins its next cycle. 0 PWME0 Pulse Width Channel 0 Enable 0 Pulse width channel 0 is disabled. 1 Pulse width channel 0 is enabled. The pulse modulated signal becomes available at PWM, output bit 0 when its clock source begins its next cycle. If CON01 = 1, then bit has no effect and PWM output line 0 is disabled. 9.3.2.2 PWM Polarity Register (PWMPOL) The starting polarity of each PWM channel waveform is determined by the associated PPOLx bit in the PWMPOL register. If the polarity bit is one, the PWM channel output is high at the beginning of the cycle and then goes low when the duty count is reached. Conversely, if the polarity bit is zero, the output starts low and then goes high when the duty count is reached. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 299 Pulse-Width Modulator (S12PWM8B8CV2) R W Reset 7 6 5 4 3 2 1 0 PPOL7 PPOL6 PPOL5 PPOL4 PPOL3 PPOL2 PPOL1 PPOL0 0 0 0 0 0 0 0 0 Figure 9-4. PWM Polarity Register (PWMPOL) Read: Anytime Write: Anytime NOTE PPOLx register bits can be written anytime. If the polarity is changed while a PWM signal is being generated, a truncated or stretched pulse can occur during the transition Table 9-3. PWMPOL Field Descriptions Note: Bits related to available channels have functional significance. Writing to unavailable bits has no effect. Read from unavailable bits return a zero Field 7–0 PPOL[7:0] 9.3.2.3 Description Pulse Width Channel 7–0 Polarity Bits 0 PWM channel 7–0 outputs are low at the beginning of the period, then go high when the duty count is reached. 1 PWM channel 7–0 outputs are high at the beginning of the period, then go low when the duty count is reached. PWM Clock Select Register (PWMCLK) Each PWM channel has a choice of four clocks to use as the clock source for that channel as described below. R W Reset 7 6 5 4 3 2 1 0 PCLK7 PCLKL6 PCLK5 PCLK4 PCLK3 PCLK2 PCLK1 PCLK0 0 0 0 0 0 0 0 0 Figure 9-5. PWM Clock Select Register (PWMCLK) Read: Anytime Write: Anytime NOTE Register bits PCLK0 to PCLK7 can be written anytime. If a clock select is changed while a PWM signal is being generated, a truncated or stretched pulse can occur during the transition. MC9S12VR Family Reference Manual, Rev. 4.2 300 NXP Semiconductor Pulse-Width Modulator (S12PWM8B8CV2) Table 9-4. PWMCLK Field Descriptions Note: Bits related to available channels have functional significance. Writing to unavailable bits has no effect. Read from unavailable bits return a zero Field 7-0 PCLK[7:0] Description Pulse Width Channel 7-0 Clock Select 0 Clock A or B is the clock source for PWM channel 7-0, as shown in Table 9-5 and Table 9-6. 1 Clock SA or SB is the clock source for PWM channel 7-0, as shown in Table 9-5 and Table 9-6. The clock source of each PWM channel is determined by PCLKx bits in PWMCLK and PCLKABx bits in PWMCLKAB (see Section 9.3.2.7, “PWM Clock A/B Select Register (PWMCLKAB)). For Channel 0, 1, 4, 5, the selection is shown in Table 9-5; For Channel 2, 3, 6, 7, the selection is shown in Table 9-6. Table 9-5. PWM Channel 0, 1, 4, 5 Clock Source Selection PCLKAB[0,1,4,5] PCLK[0,1,4,5] Clock Source Selection 0 0 1 1 0 1 0 1 Clock A Clock SA Clock B Clock SB Table 9-6. PWM Channel 2, 3, 6, 7 Clock Source Selection 9.3.2.4 PCLKAB[2,3,6,7] PCLK[2,3,6,7] Clock Source Selection 0 0 1 1 0 1 0 1 Clock B Clock SB Clock A Clock SA PWM Prescale Clock Select Register (PWMPRCLK) This register selects the prescale clock source for clocks A and B independently. 7 R 6 0 W Reset 0 5 4 PCKB2 PCKB1 PCKB0 0 0 0 3 0 0 2 1 0 PCKA2 PCKA1 PCKA0 0 0 0 = Unimplemented or Reserved Figure 9-6. PWM Prescale Clock Select Register (PWMPRCLK) Read: Anytime Write: Anytime NOTE PCKB2–0 and PCKA2–0 register bits can be written anytime. If the clock pre-scale is changed while a PWM signal is being generated, a truncated or stretched pulse can occur during the transition. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 301 Pulse-Width Modulator (S12PWM8B8CV2) Table 9-7. PWMPRCLK Field Descriptions Field Description 6–4 PCKB[2:0] Prescaler Select for Clock B — Clock B is one of two clock sources which can be used for all channels. These three bits determine the rate of clock B, as shown in Table 9-8. 2–0 PCKA[2:0] Prescaler Select for Clock A — Clock A is one of two clock sources which can be used for all channels. These three bits determine the rate of clock A, as shown in Table 9-8. s Table 9-8. Clock A or Clock B Prescaler Selects 9.3.2.5 PCKA/B2 PCKA/B1 PCKA/B0 Value of Clock A/B 0 0 0 0 1 1 1 1 0 0 1 1 0 0 1 1 0 1 0 1 0 1 0 1 bus clock bus clock / 2 bus clock / 4 bus clock / 8 bus clock / 16 bus clock / 32 bus clock / 64 bus clock / 128 PWM Center Align Enable Register (PWMCAE) The PWMCAE register contains eight control bits for the selection of center aligned outputs or left aligned outputs for each PWM channel. If the CAEx bit is set to a one, the corresponding PWM output will be center aligned. If the CAEx bit is cleared, the corresponding PWM output will be left aligned. See Section 9.4.2.5, “Left Aligned Outputs” and Section 9.4.2.6, “Center Aligned Outputs” for a more detailed description of the PWM output modes. R W Reset 7 6 5 4 3 2 1 0 CAE7 CAE6 CAE5 CAE4 CAE3 CAE2 CAE1 CAE0 0 0 0 0 0 0 0 0 Figure 9-7. PWM Center Align Enable Register (PWMCAE) Read: Anytime Write: Anytime NOTE Write these bits only when the corresponding channel is disabled. Table 9-9. PWMCAE Field Descriptions Note: Bits related to available channels have functional significance. Writing to unavailable bits has no effect. Read from unavailable bits return a zero Field 7–0 CAE[7:0] Description Center Aligned Output Modes on Channels 7–0 0 Channels 7–0 operate in left aligned output mode. 1 Channels 7–0 operate in center aligned output mode. MC9S12VR Family Reference Manual, Rev. 4.2 302 NXP Semiconductor Pulse-Width Modulator (S12PWM8B8CV2) 9.3.2.6 PWM Control Register (PWMCTL) The PWMCTL register provides for various control of the PWM module. 7 R W Reset 6 5 4 3 2 CON67 CON45 CON23 CON01 PSWAI PFRZ 0 0 0 0 0 0 1 0 0 0 0 0 = Unimplemented or Reserved Figure 9-8. PWM Control Register (PWMCTL) Read: Anytime Write: Anytime There are up to four control bits for concatenation, each of which is used to concatenate a pair of PWM channels into one 16-bit channel. If the corresponding channels do not exist on a particular derivative, then writes to these bits have no effect and reads will return zeroes. When channels 6 and 7are concatenated, channel 6 registers become the high order bytes of the double byte channel. When channels 4 and 5 are concatenated, channel 4 registers become the high order bytes of the double byte channel. When channels 2 and 3 are concatenated, channel 2 registers become the high order bytes of the double byte channel. When channels 0 and 1 are concatenated, channel 0 registers become the high order bytes of the double byte channel. See Section 9.4.2.7, “PWM 16-Bit Functions” for a more detailed description of the concatenation PWM Function. NOTE Change these bits only when both corresponding channels are disabled. Table 9-10. PWMCTL Field Descriptions Note: Bits related to available channels have functional significance. Writing to unavailable bits has no effect. Read from unavailable bits return a zero Field Description 7 CON67 Concatenate Channels 6 and 7 0 Channels 6 and 7 are separate 8-bit PWMs. 1 Channels 6 and 7 are concatenated to create one 16-bit PWM channel. Channel 6 becomes the high order byte and channel 7 becomes the low order byte. Channel 7 output pin is used as the output for this 16-bit PWM (bit 7 of port PWMP). Channel 7 clock select control-bit determines the clock source, channel 7 polarity bit determines the polarity, channel 7 enable bit enables the output and channel 7 center aligned enable bit determines the output mode. 6 CON45 Concatenate Channels 4 and 5 0 Channels 4 and 5 are separate 8-bit PWMs. 1 Channels 4 and 5 are concatenated to create one 16-bit PWM channel. Channel 4 becomes the high order byte and channel 5 becomes the low order byte. Channel 5 output pin is used as the output for this 16-bit PWM (bit 5 of port PWMP). Channel 5 clock select control-bit determines the clock source, channel 5 polarity bit determines the polarity, channel 5 enable bit enables the output and channel 5 center aligned enable bit determines the output mode. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 303 Pulse-Width Modulator (S12PWM8B8CV2) Table 9-10. PWMCTL Field Descriptions (continued) Note: Bits related to available channels have functional significance. Writing to unavailable bits has no effect. Read from unavailable bits return a zero Field Description 5 CON23 Concatenate Channels 2 and 3 0 Channels 2 and 3 are separate 8-bit PWMs. 1 Channels 2 and 3 are concatenated to create one 16-bit PWM channel. Channel 2 becomes the high order byte and channel 3 becomes the low order byte. Channel 3 output pin is used as the output for this 16-bit PWM (bit 3 of port PWMP). Channel 3 clock select control-bit determines the clock source, channel 3 polarity bit determines the polarity, channel 3 enable bit enables the output and channel 3 center aligned enable bit determines the output mode. 4 CON01 Concatenate Channels 0 and 1 0 Channels 0 and 1 are separate 8-bit PWMs. 1 Channels 0 and 1 are concatenated to create one 16-bit PWM channel. Channel 0 becomes the high order byte and channel 1 becomes the low order byte. Channel 1 output pin is used as the output for this 16-bit PWM (bit 1 of port PWMP). Channel 1 clock select control-bit determines the clock source, channel 1 polarity bit determines the polarity, channel 1 enable bit enables the output and channel 1 center aligned enable bit determines the output mode. 3 PSWAI PWM Stops in Wait Mode — Enabling this bit allows for lower power consumption in wait mode by disabling the input clock to the prescaler. 0 Allow the clock to the prescaler to continue while in wait mode. 1 Stop the input clock to the prescaler whenever the MCU is in wait mode. 2 PFRZ PWM Counters Stop in Freeze Mode — In freeze mode, there is an option to disable the input clock to the prescaler by setting the PFRZ bit in the PWMCTL register. If this bit is set, whenever the MCU is in freeze mode, the input clock to the prescaler is disabled. This feature is useful during emulation as it allows the PWM function to be suspended. In this way, the counters of the PWM can be stopped while in freeze mode so that once normal program flow is continued, the counters are re-enabled to simulate real-time operations. Since the registers can still be accessed in this mode, to re-enable the prescaler clock, either disable the PFRZ bit or exit freeze mode. 0 Allow PWM to continue while in freeze mode. 1 Disable PWM input clock to the prescaler whenever the part is in freeze mode. This is useful for emulation. 9.3.2.7 PWM Clock A/B Select Register (PWMCLKAB) Each PWM channel has a choice of four clocks to use as the clock source for that channel as described below. R W Reset 7 6 5 4 3 2 1 0 PCLKAB7 PCLKAB6 PCLKAB5 PCLKAB4 PCLKAB3 PCLKAB2 PCLKAB1 PCLKAB0 0 0 0 0 0 0 0 0 Figure 9-9. PWM Clock Select Register (PWMCLK) Read: Anytime Write: Anytime NOTE Register bits PCLKAB0 to PCLKAB7 can be written anytime. If a clock select is changed while a PWM signal is being generated, a truncated or stretched pulse can occur during the transition. MC9S12VR Family Reference Manual, Rev. 4.2 304 NXP Semiconductor Pulse-Width Modulator (S12PWM8B8CV2) Table 9-11. PWMCLK Field Descriptions Note: Bits related to available channels have functional significance. Writing to unavailable bits has no effect. Read from unavailable bits return a zero Field Description 7 PCLKAB7 Pulse Width Channel 7 Clock A/B Select 0 Clock B or SB is the clock source for PWM channel 7, as shown in Table 9-6. 1 Clock A or SA is the clock source for PWM channel 7, as shown in Table 9-6. 6 PCLKAB6 Pulse Width Channel 6 Clock A/B Select 0 Clock B or SB is the clock source for PWM channel 6, as shown in Table 9-6. 1 Clock A or SA is the clock source for PWM channel 6, as shown in Table 9-6. 5 PCLKAB5 Pulse Width Channel 5 Clock A/B Select 0 Clock A or SA is the clock source for PWM channel 5, as shown in Table 9-5. 1 Clock B or SB is the clock source for PWM channel 5, as shown in Table 9-5. 4 PCLKAB4 Pulse Width Channel 4 Clock A/B Select 0 Clock A or SA is the clock source for PWM channel 4, as shown in Table 9-5. 1 Clock B or SB is the clock source for PWM channel 4, as shown in Table 9-5. 3 PCLKAB3 Pulse Width Channel 3 Clock A/B Select 0 Clock B or SB is the clock source for PWM channel 3, as shown in Table 9-6. 1 Clock A or SA is the clock source for PWM channel 3, as shown in Table 9-6. 2 PCLKAB2 Pulse Width Channel 2 Clock A/B Select 0 Clock B or SB is the clock source for PWM channel 2, as shown in Table 9-6. 1 Clock A or SA is the clock source for PWM channel 2, as shown in Table 9-6. 1 PCLKAB1 Pulse Width Channel 1 Clock A/B Select 0 Clock A or SA is the clock source for PWM channel 1, as shown in Table 9-5. 1 Clock B or SB is the clock source for PWM channel 1, as shown in Table 9-5. 0 PCLKAB0 Pulse Width Channel 0 Clock A/B Select 0 Clock A or SA is the clock source for PWM channel 0, as shown in Table 9-5. 1 Clock B or SB is the clock source for PWM channel 0, as shown in Table 9-5. The clock source of each PWM channel is determined by PCLKx bits in PWMCLK (see Section 9.3.2.3, “PWM Clock Select Register (PWMCLK)) and PCLKABx bits in PWMCLKAB as shown in Table 9-5 and Table 9-6. 9.3.2.8 PWM Scale A Register (PWMSCLA) PWMSCLA is the programmable scale value used in scaling clock A to generate clock SA. Clock SA is generated by taking clock A, dividing it by the value in the PWMSCLA register and dividing that by two. Clock SA = Clock A / (2 * PWMSCLA) NOTE When PWMSCLA = $00, PWMSCLA value is considered a full scale value of 256. Clock A is thus divided by 512. Any value written to this register will cause the scale counter to load the new scale value (PWMSCLA). MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 305 Pulse-Width Modulator (S12PWM8B8CV2) R W Reset 7 6 5 4 3 2 1 0 Bit 7 6 5 4 3 2 1 Bit 0 0 0 0 0 0 0 0 0 Figure 9-10. PWM Scale A Register (PWMSCLA) Read: Anytime Write: Anytime (causes the scale counter to load the PWMSCLA value) 9.3.2.9 PWM Scale B Register (PWMSCLB) PWMSCLB is the programmable scale value used in scaling clock B to generate clock SB. Clock SB is generated by taking clock B, dividing it by the value in the PWMSCLB register and dividing that by two. Clock SB = Clock B / (2 * PWMSCLB) NOTE When PWMSCLB = $00, PWMSCLB value is considered a full scale value of 256. Clock B is thus divided by 512. Any value written to this register will cause the scale counter to load the new scale value (PWMSCLB). R W Reset 7 6 5 4 3 2 1 0 Bit 7 6 5 4 3 2 1 Bit 0 0 0 0 0 0 0 0 0 Figure 9-11. PWM Scale B Register (PWMSCLB) Read: Anytime Write: Anytime (causes the scale counter to load the PWMSCLB value). 9.3.2.10 PWM Channel Counter Registers (PWMCNTx) Each channel has a dedicated 8-bit up/down counter which runs at the rate of the selected clock source. The counter can be read at any time without affecting the count or the operation of the PWM channel. In left aligned output mode, the counter counts from 0 to the value in the period register - 1. In center aligned output mode, the counter counts from 0 up to the value in the period register and then back down to 0. Any value written to the counter causes the counter to reset to $00, the counter direction to be set to up, the immediate load of both duty and period registers with values from the buffers, and the output to change according to the polarity bit. The counter is also cleared at the end of the effective period (see Section 9.4.2.5, “Left Aligned Outputs” and Section 9.4.2.6, “Center Aligned Outputs” for more details). When the channel is disabled (PWMEx = 0), the PWMCNTx register does not count. When a channel becomes enabled (PWMEx = 1), the associated PWM counter starts at the count in the PWMCNTx MC9S12VR Family Reference Manual, Rev. 4.2 306 NXP Semiconductor Pulse-Width Modulator (S12PWM8B8CV2) register. For more detailed information on the operation of the counters, see Section 9.4.2.4, “PWM Timer Counters”. In concatenated mode, writes to the 16-bit counter by using a 16-bit access or writes to either the low or high order byte of the counter will reset the 16-bit counter. Reads of the 16-bit counter must be made by 16-bit access to maintain data coherency. NOTE Writing to the counter while the channel is enabled can cause an irregular PWM cycle to occur. 7 6 5 4 3 2 1 0 R Bit 7 6 5 4 3 2 1 Bit 0 W 0 0 0 0 0 0 0 0 Reset 0 0 0 0 0 0 0 0 Figure 9-12. PWM Channel Counter Registers (PWMCNTx) 1 This register is available only when the corresponding channel exists and is reserved if that channel does not exist. Writes to a reserved register have no functional effect. Reads from a reserved register return zeroes. Read: Anytime Write: Anytime (any value written causes PWM counter to be reset to $00). 9.3.2.11 PWM Channel Period Registers (PWMPERx) There is a dedicated period register for each channel. The value in this register determines the period of the associated PWM channel. The period registers for each channel are double buffered so that if they change while the channel is enabled, the change will NOT take effect until one of the following occurs: • The effective period ends • The counter is written (counter resets to $00) • The channel is disabled In this way, the output of the PWM will always be either the old waveform or the new waveform, not some variation in between. If the channel is not enabled, then writes to the period register will go directly to the latches as well as the buffer. NOTE Reads of this register return the most recent value written. Reads do not necessarily return the value of the currently active period due to the double buffering scheme. See Section 9.4.2.3, “PWM Period and Duty” for more information. To calculate the output period, take the selected clock source period for the channel of interest (A, B, SA, or SB) and multiply it by the value in the period register for that channel: • Left aligned output (CAEx = 0) MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 307 Pulse-Width Modulator (S12PWM8B8CV2) • PWMx Period = Channel Clock Period * PWMPERx Center Aligned Output (CAEx = 1) PWMx Period = Channel Clock Period * (2 * PWMPERx) For boundary case programming values, please refer to Section 9.4.2.8, “PWM Boundary Cases”. R W Reset 7 6 5 4 3 2 1 0 Bit 7 6 5 4 3 2 1 Bit 0 1 1 1 1 1 1 1 1 Figure 9-13. PWM Channel Period Registers (PWMPERx) 1 This register is available only when the corresponding channel exists and is reserved if that channel does not exist. Writes to a reserved register have no functional effect. Reads from a reserved register return zeroes. Read: Anytime Write: Anytime 9.3.2.12 PWM Channel Duty Registers (PWMDTYx) There is a dedicated duty register for each channel. The value in this register determines the duty of the associated PWM channel. The duty value is compared to the counter and if it is equal to the counter value a match occurs and the output changes state. The duty registers for each channel are double buffered so that if they change while the channel is enabled, the change will NOT take effect until one of the following occurs: • The effective period ends • The counter is written (counter resets to $00) • The channel is disabled In this way, the output of the PWM will always be either the old duty waveform or the new duty waveform, not some variation in between. If the channel is not enabled, then writes to the duty register will go directly to the latches as well as the buffer. NOTE Reads of this register return the most recent value written. Reads do not necessarily return the value of the currently active duty due to the double buffering scheme. See Section 9.4.2.3, “PWM Period and Duty” for more information. NOTE Depending on the polarity bit, the duty registers will contain the count of either the high time or the low time. If the polarity bit is one, the output starts high and then goes low when the duty count is reached, so the duty registers contain a count of the high time. If the polarity bit is zero, the output starts low and then goes high when the duty count is reached, so the duty registers contain a count of the low time. MC9S12VR Family Reference Manual, Rev. 4.2 308 NXP Semiconductor Pulse-Width Modulator (S12PWM8B8CV2) To calculate the output duty cycle (high time as a% of period) for a particular channel: • Polarity = 0 (PPOL x =0) Duty Cycle = [(PWMPERx-PWMDTYx)/PWMPERx] * 100% • Polarity = 1 (PPOLx = 1) Duty Cycle = [PWMDTYx / PWMPERx] * 100% For boundary case programming values, please refer to Section 9.4.2.8, “PWM Boundary Cases”. R W Reset 7 6 5 4 3 2 1 0 Bit 7 6 5 4 3 2 1 Bit 0 1 1 1 1 1 1 1 1 Figure 9-14. PWM Channel Duty Registers (PWMDTYx) 1 This register is available only when the corresponding channel exists and is reserved if that channel does not exist. Writes to a reserved register have no functional effect. Reads from a reserved register return zeroes. Read: Anytime Write: Anytime 9.4 9.4.1 Functional Description PWM Clock Select There are four available clocks: clock A, clock B, clock SA (scaled A), and clock SB (scaled B). These four clocks are based on the bus clock. Clock A and B can be software selected to be 1, 1/2, 1/4, 1/8,..., 1/64, 1/128 times the bus clock. Clock SA uses clock A as an input and divides it further with a reloadable counter. Similarly, clock SB uses clock B as an input and divides it further with a reloadable counter. The rates available for clock SA are software selectable to be clock A divided by 2, 4, 6, 8,..., or 512 in increments of divide by 2. Similar rates are available for clock SB. Each PWM channel has the capability of selecting one of four clocks, clock A, Clock B, clock SA or clock SB. The block diagram in Figure 9-15 shows the four different clocks and how the scaled clocks are created. 9.4.1.1 Prescale The input clock to the PWM prescaler is the bus clock. It can be disabled whenever the part is in freeze mode by setting the PFRZ bit in the PWMCTL register. If this bit is set, whenever the MCU is in freeze mode (freeze mode signal active) the input clock to the prescaler is disabled. This is useful for emulation in order to freeze the PWM. The input clock can also be disabled when all available PWM channels are disabled (PWMEx-0 = 0). This is useful for reducing power by disabling the prescale counter. Clock A and clock B are scaled values of the input clock. The value is software selectable for both clock A and clock B and has options of 1, 1/2, 1/4, 1/8, 1/16, 1/32, 1/64, or 1/128 times the bus clock. The value selected for clock A is determined by the PCKA2, PCKA1, PCKA0 bits in the PWMPRCLK register. The MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 309 Pulse-Width Modulator (S12PWM8B8CV2) value selected for clock B is determined by the PCKB2, PCKB1, PCKB0 bits also in the PWMPRCLK register. 9.4.1.2 Clock Scale The scaled A clock uses clock A as an input and divides it further with a user programmable value and then divides this by 2. The scaled B clock uses clock B as an input and divides it further with a user programmable value and then divides this by 2. The rates available for clock SA are software selectable to be clock A divided by 2, 4, 6, 8,..., or 512 in increments of divide by 2. Similar rates are available for clock SB. MC9S12VR Family Reference Manual, Rev. 4.2 310 NXP Semiconductor Pulse-Width Modulator (S12PWM8B8CV2) Clock A PCKA2 PCKA1 PCKA0 Clock A/2, A/4, A/6,....A/512 M U X Load PWMSCLA DIV 2 Clock SA U Clock to PWM Ch 1 PCLK1 PCLKAB1 M U X M Clock to PWM Ch 2 PCLK2 PCLKAB2 X 8 16 32 64 128 M U X Clock to PWM Ch 3 PCLK3 PCLKAB3 Clock B 4 Clock B/2, B/4, B/6,....B/512 M U X Clock to PWM Ch 4 2 Divide by Prescaler Taps: Clock to PWM Ch 0 PCLK0 PCLKAB0 Count = 1 8-Bit Down Counter M U X M U 8-Bit Down Counter X M U X Load PWMSCLB DIV 2 Clock SB PCKB2 PCKB1 PCKB0 Clock to PWM Ch 5 PCLK5 PCLKAB5 M U X Clock to PWM Ch 6 PCLK6 PCLKAB6 M U X PWME7-0 Clock PFRZ Freeze Mode Signal PCLK4 PCLKAB4 Count = 1 Clock to PWM Ch 7 PCLK7 PCLKAB7 Prescale Scale Clock Select Maximum possible channels, scalable in pairs from PWM0 to PWM7. Figure 9-15. PWM Clock Select Block Diagram MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 311 Pulse-Width Modulator (S12PWM8B8CV2) Clock A is used as an input to an 8-bit down counter. This down counter loads a user programmable scale value from the scale register (PWMSCLA). When the down counter reaches one, a pulse is output and the 8-bit counter is re-loaded. The output signal from this circuit is further divided by two. This gives a greater range with only a slight reduction in granularity. Clock SA equals clock A divided by two times the value in the PWMSCLA register. NOTE Clock SA = Clock A / (2 * PWMSCLA) When PWMSCLA = $00, PWMSCLA value is considered a full scale value of 256. Clock A is thus divided by 512. Similarly, clock B is used as an input to an 8-bit down counter followed by a divide by two producing clock SB. Thus, clock SB equals clock B divided by two times the value in the PWMSCLB register. NOTE Clock SB = Clock B / (2 * PWMSCLB) When PWMSCLB = $00, PWMSCLB value is considered a full scale value of 256. Clock B is thus divided by 512. As an example, consider the case in which the user writes $FF into the PWMSCLA register. Clock A for this case will be bus clock divided by 4. A pulse will occur at a rate of once every 255x4 bus cycles. Passing this through the divide by two circuit produces a clock signal at an bus clock divided by 2040 rate. Similarly, a value of $01 in the PWMSCLA register when clock A is bus clock divided by 4 will produce a clock at an bus clock divided by 8 rate. Writing to PWMSCLA or PWMSCLB causes the associated 8-bit down counter to be re-loaded. Otherwise, when changing rates the counter would have to count down to $01 before counting at the proper rate. Forcing the associated counter to re-load the scale register value every time PWMSCLA or PWMSCLB is written prevents this. NOTE Writing to the scale registers while channels are operating can cause irregularities in the PWM outputs. 9.4.1.3 Clock Select Each PWM channel has the capability of selecting one of four clocks, clock A, clock SA, clock B or clock SB. The clock selection is done with the PCLKx control bits in the PWMCLK register and PCLKABx control bits in PWMCLKAB register. For backward compatibility consideration, the reset value of PWMCLK and PWMCLKAB configures following default clock selection. For channels 0, 1, 4, and 5 the clock choices are clock A. For channels 2, 3, 6, and 7 the clock choices are clock B. NOTE Changing clock control bits while channels are operating can cause irregularities in the PWM outputs. MC9S12VR Family Reference Manual, Rev. 4.2 312 NXP Semiconductor Pulse-Width Modulator (S12PWM8B8CV2) 9.4.2 PWM Channel Timers The main part of the PWM module are the actual timers. Each of the timer channels has a counter, a period register and a duty register (each are 8-bit). The waveform output period is controlled by a match between the period register and the value in the counter. The duty is controlled by a match between the duty register and the counter value and causes the state of the output to change during the period. The starting polarity of the output is also selectable on a per channel basis. Shown below in Figure 9-16 is the block diagram for the PWM timer. Clock Source From Port PWMP Data Register 8-Bit Counter Gate PWMCNTx (Clock Edge Sync) Up/Down Reset 8-bit Compare = PWMDTYx T M U X Q Q R M U X To Pin Driver 8-bit Compare = PWMPERx PPOLx Q Q T CAEx R PWMEx Figure 9-16. PWM Timer Channel Block Diagram 9.4.2.1 PWM Enable Each PWM channel has an enable bit (PWMEx) to start its waveform output. When any of the PWMEx bits are set (PWMEx = 1), the associated PWM output signal is enabled immediately. However, the actual PWM waveform is not available on the associated PWM output until its clock source begins its next cycle due to the synchronization of PWMEx and the clock source. An exception to this is when channels are concatenated. Refer to Section 9.4.2.7, “PWM 16-Bit Functions” for more detail. NOTE The first PWM cycle after enabling the channel can be irregular. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 313 Pulse-Width Modulator (S12PWM8B8CV2) On the front end of the PWM timer, the clock is enabled to the PWM circuit by the PWMEx bit being high. There is an edge-synchronizing circuit to guarantee that the clock will only be enabled or disabled at an edge. When the channel is disabled (PWMEx = 0), the counter for the channel does not count. 9.4.2.2 PWM Polarity Each channel has a polarity bit to allow starting a waveform cycle with a high or low signal. This is shown on the block diagram Figure 9-16 as a mux select of either the Q output or the Q output of the PWM output flip flop. When one of the bits in the PWMPOL register is set, the associated PWM channel output is high at the beginning of the waveform, then goes low when the duty count is reached. Conversely, if the polarity bit is zero, the output starts low and then goes high when the duty count is reached. 9.4.2.3 PWM Period and Duty Dedicated period and duty registers exist for each channel and are double buffered so that if they change while the channel is enabled, the change will NOT take effect until one of the following occurs: • The effective period ends • The counter is written (counter resets to $00) • The channel is disabled In this way, the output of the PWM will always be either the old waveform or the new waveform, not some variation in between. If the channel is not enabled, then writes to the period and duty registers will go directly to the latches as well as the buffer. A change in duty or period can be forced into effect “immediately” by writing the new value to the duty and/or period registers and then writing to the counter. This forces the counter to reset and the new duty and/or period values to be latched. In addition, since the counter is readable, it is possible to know where the count is with respect to the duty value and software can be used to make adjustments NOTE When forcing a new period or duty into effect immediately, an irregular PWM cycle can occur. Depending on the polarity bit, the duty registers will contain the count of either the high time or the low time. 9.4.2.4 PWM Timer Counters Each channel has a dedicated 8-bit up/down counter which runs at the rate of the selected clock source (see Section 9.4.1, “PWM Clock Select” for the available clock sources and rates). The counter compares to two registers, a duty register and a period register as shown in Figure 9-16. When the PWM counter matches the duty register, the output flip-flop changes state, causing the PWM waveform to also change state. A match between the PWM counter and the period register behaves differently depending on what output mode is selected as shown in Figure 9-16 and described in Section 9.4.2.5, “Left Aligned Outputs” and Section 9.4.2.6, “Center Aligned Outputs”. MC9S12VR Family Reference Manual, Rev. 4.2 314 NXP Semiconductor Pulse-Width Modulator (S12PWM8B8CV2) Each channel counter can be read at anytime without affecting the count or the operation of the PWM channel. Any value written to the counter causes the counter to reset to $00, the counter direction to be set to up, the immediate load of both duty and period registers with values from the buffers, and the output to change according to the polarity bit. When the channel is disabled (PWMEx = 0), the counter stops. When a channel becomes enabled (PWMEx = 1), the associated PWM counter continues from the count in the PWMCNTx register. This allows the waveform to continue where it left off when the channel is re-enabled. When the channel is disabled, writing “0” to the period register will cause the counter to reset on the next selected clock. NOTE If the user wants to start a new “clean” PWM waveform without any “history” from the old waveform, the user must write to channel counter (PWMCNTx) prior to enabling the PWM channel (PWMEx = 1). Generally, writes to the counter are done prior to enabling a channel in order to start from a known state. However, writing a counter can also be done while the PWM channel is enabled (counting). The effect is similar to writing the counter when the channel is disabled, except that the new period is started immediately with the output set according to the polarity bit. NOTE Writing to the counter while the channel is enabled can cause an irregular PWM cycle to occur. The counter is cleared at the end of the effective period (see Section 9.4.2.5, “Left Aligned Outputs” and Section 9.4.2.6, “Center Aligned Outputs” for more details). Table 9-12. PWM Timer Counter Conditions Counter Clears ($00) Counter Counts Counter Stops When PWMCNTx register written to any value When PWM channel is enabled (PWMEx = 1). Counts from last value in PWMCNTx. When PWM channel is disabled (PWMEx = 0) Effective period ends 9.4.2.5 Left Aligned Outputs The PWM timer provides the choice of two types of outputs, left aligned or center aligned. They are selected with the CAEx bits in the PWMCAE register. If the CAEx bit is cleared (CAEx = 0), the corresponding PWM output will be left aligned. In left aligned output mode, the 8-bit counter is configured as an up counter only. It compares to two registers, a duty register and a period register as shown in the block diagram in Figure 9-16. When the PWM counter matches the duty register the output flip-flop changes state causing the PWM waveform to also change state. A match between the PWM counter and the period register resets the counter and the output flip-flop, as shown in Figure 9-16, as well as performing a load from the double buffer period and duty register to the associated registers, as described in Section 9.4.2.3, “PWM Period and Duty”. The counter counts from 0 to the value in the period register – 1. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 315 Pulse-Width Modulator (S12PWM8B8CV2) NOTE Changing the PWM output mode from left aligned to center aligned output (or vice versa) while channels are operating can cause irregularities in the PWM output. It is recommended to program the output mode before enabling the PWM channel. PPOLx = 0 PPOLx = 1 PWMDTYx Period = PWMPERx Figure 9-17. PWM Left Aligned Output Waveform To calculate the output frequency in left aligned output mode for a particular channel, take the selected clock source frequency for the channel (A, B, SA, or SB) and divide it by the value in the period register for that channel. • PWMx Frequency = Clock (A, B, SA, or SB) / PWMPERx • PWMx Duty Cycle (high time as a% of period): — Polarity = 0 (PPOLx = 0) Duty Cycle = [(PWMPERx-PWMDTYx)/PWMPERx] * 100% — Polarity = 1 (PPOLx = 1) Duty Cycle = [PWMDTYx / PWMPERx] * 100% As an example of a left aligned output, consider the following case: Clock Source = bus clock, where bus clock = 10 MHz (100 ns period) PPOLx = 0 PWMPERx = 4 PWMDTYx = 1 PWMx Frequency = 10 MHz/4 = 2.5 MHz PWMx Period = 400 ns PWMx Duty Cycle = 3/4 *100% = 75% The output waveform generated is shown in Figure 9-18. E = 100 ns Duty Cycle = 75% Period = 400 ns Figure 9-18. PWM Left Aligned Output Example Waveform MC9S12VR Family Reference Manual, Rev. 4.2 316 NXP Semiconductor Pulse-Width Modulator (S12PWM8B8CV2) 9.4.2.6 Center Aligned Outputs For center aligned output mode selection, set the CAEx bit (CAEx = 1) in the PWMCAE register and the corresponding PWM output will be center aligned. The 8-bit counter operates as an up/down counter in this mode and is set to up whenever the counter is equal to $00. The counter compares to two registers, a duty register and a period register as shown in the block diagram in Figure 9-16. When the PWM counter matches the duty register, the output flip-flop changes state, causing the PWM waveform to also change state. A match between the PWM counter and the period register changes the counter direction from an up-count to a down-count. When the PWM counter decrements and matches the duty register again, the output flip-flop changes state causing the PWM output to also change state. When the PWM counter decrements and reaches zero, the counter direction changes from a down-count back to an up-count and a load from the double buffer period and duty registers to the associated registers is performed, as described in Section 9.4.2.3, “PWM Period and Duty”. The counter counts from 0 up to the value in the period register and then back down to 0. Thus the effective period is PWMPERx*2. NOTE Changing the PWM output mode from left aligned to center aligned output (or vice versa) while channels are operating can cause irregularities in the PWM output. It is recommended to program the output mode before enabling the PWM channel. PPOLx = 0 PPOLx = 1 PWMDTYx PWMDTYx PWMPERx PWMPERx Period = PWMPERx*2 Figure 9-19. PWM Center Aligned Output Waveform To calculate the output frequency in center aligned output mode for a particular channel, take the selected clock source frequency for the channel (A, B, SA, or SB) and divide it by twice the value in the period register for that channel. • PWMx Frequency = Clock (A, B, SA, or SB) / (2*PWMPERx) • PWMx Duty Cycle (high time as a% of period): — Polarity = 0 (PPOLx = 0) Duty Cycle = [(PWMPERx-PWMDTYx)/PWMPERx] * 100% — Polarity = 1 (PPOLx = 1) Duty Cycle = [PWMDTYx / PWMPERx] * 100% As an example of a center aligned output, consider the following case: MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 317 Pulse-Width Modulator (S12PWM8B8CV2) Clock Source = bus clock, where bus clock= 10 MHz (100 ns period) PPOLx = 0 PWMPERx = 4 PWMDTYx = 1 PWMx Frequency = 10 MHz/8 = 1.25 MHz PWMx Period = 800 ns PWMx Duty Cycle = 3/4 *100% = 75% Shown in Figure 9-20 is the output waveform generated. E = 100 ns E = 100 ns DUTY CYCLE = 75% PERIOD = 800 ns Figure 9-20. PWM Center Aligned Output Example Waveform 9.4.2.7 PWM 16-Bit Functions The scalable PWM timer also has the option of generating up to 8-channels of 8-bits or 4-channels of 16-bits for greater PWM resolution. This 16-bit channel option is achieved through the concatenation of two 8-bit channels. The PWMCTL register contains four control bits, each of which is used to concatenate a pair of PWM channels into one 16-bit channel. Channels 6 and 7 are concatenated with the CON67 bit, channels 4 and 5 are concatenated with the CON45 bit, channels 2 and 3 are concatenated with the CON23 bit, and channels 0 and 1 are concatenated with the CON01 bit. NOTE Change these bits only when both corresponding channels are disabled. When channels 6 and 7 are concatenated, channel 6 registers become the high order bytes of the double byte channel, as shown in Figure 9-21. Similarly, when channels 4 and 5 are concatenated, channel 4 registers become the high order bytes of the double byte channel. When channels 2 and 3 are concatenated, channel 2 registers become the high order bytes of the double byte channel. When channels 0 and 1 are concatenated, channel 0 registers become the high order bytes of the double byte channel. When using the 16-bit concatenated mode, the clock source is determined by the low order 8-bit channel clock select control bits. That is channel 7 when channels 6 and 7 are concatenated, channel 5 when channels 4 and 5 are concatenated, channel 3 when channels 2 and 3 are concatenated, and channel 1 when channels 0 and 1 are concatenated. The resulting PWM is output to the pins of the corresponding low order 8-bit channel as also shown in Figure 9-21. The polarity of the resulting PWM output is controlled by the PPOLx bit of the corresponding low order 8-bit channel as well. MC9S12VR Family Reference Manual, Rev. 4.2 318 NXP Semiconductor Pulse-Width Modulator (S12PWM8B8CV2) Clock Source 7 High Low PWMCNT6 PWMCNT7 PWM7 Period/Duty Compare Clock Source 5 High Low PWMCNT4 PWMCNT5 PWM5 Period/Duty Compare Clock Source 3 High Low PWMCNT2 PWMCNT3 PWM3 Period/Duty Compare Clock Source 1 High Low PWMCNT0 PWMCNT1 Period/Duty Compare PWM1 Maximum possible 16-bit channels Figure 9-21. PWM 16-Bit Mode Once concatenated mode is enabled (CONxx bits set in PWMCTL register), enabling/disabling the corresponding 16-bit PWM channel is controlled by the low order PWMEx bit. In this case, the high order bytes PWMEx bits have no effect and their corresponding PWM output is disabled. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 319 Pulse-Width Modulator (S12PWM8B8CV2) In concatenated mode, writes to the 16-bit counter by using a 16-bit access or writes to either the low or high order byte of the counter will reset the 16-bit counter. Reads of the 16-bit counter must be made by 16-bit access to maintain data coherency. Either left aligned or center aligned output mode can be used in concatenated mode and is controlled by the low order CAEx bit. The high order CAEx bit has no effect. Table 9-13 is used to summarize which channels are used to set the various control bits when in 16-bit mode. Table 9-13. 16-bit Concatenation Mode Summary Note: Bits related to available channels have functional significance. 9.4.2.8 CONxx PWMEx PPOLx PCLKx CAEx PWMx Output CON67 PWME7 PPOL7 PCLK7 CAE7 PWM7 CON45 PWME5 PPOL5 PCLK5 CAE5 PWM5 CON23 PWME3 PPOL3 PCLK3 CAE3 PWM3 CON01 PWME1 PPOL1 PCLK1 CAE1 PWM1 PWM Boundary Cases Table 9-14 summarizes the boundary conditions for the PWM regardless of the output mode (left aligned or center aligned) and 8-bit (normal) or 16-bit (concatenation). Table 9-14. PWM Boundary Cases 1 9.5 PWMDTYx PWMPERx PPOLx PWMx Output $00 (indicates no duty) >$00 1 Always low $00 (indicates no duty) >$00 0 Always high XX $001 (indicates no period) 1 Always high XX $001 (indicates no period) 0 Always low >= PWMPERx XX 1 Always high >= PWMPERx XX 0 Always low Counter = $00 and does not count. Resets The reset state of each individual bit is listed within the Section 9.3.2, “Register Descriptions” which details the registers and their bit-fields. All special functions or modes which are initialized during or just following reset are described within this section. • The 8-bit up/down counter is configured as an up counter out of reset. • All the channels are disabled and all the counters do not count. MC9S12VR Family Reference Manual, Rev. 4.2 320 NXP Semiconductor Pulse-Width Modulator (S12PWM8B8CV2) • • 9.6 For channels 0, 1, 4, and 5 the clock choices are clock A. For channels 2, 3, 6, and 7 the clock choices are clock B. Interrupts The PWM module has no interrupt. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 321 Pulse-Width Modulator (S12PWM8B8CV2) MC9S12VR Family Reference Manual, Rev. 4.2 322 NXP Semiconductor Chapter 10 Serial Communication Interface (S12SCIV6) Table 10-1. Revision History Version Number Revision Date 06.05 02/22/2013 fix typo Figure 10-1./10-325 Figure 10-4./10-328 update Table 10-2./10-328 10.4.4/10-342 10.4.6.3/10-349 06.06 03/11/2013 fix typo of BDL reset value,Figure 10-4 fix typo of Table 10-2,Table 10-16,reword 10.4.4/10-342 09/03/2013 update Figure 10-14./10-339 Figure 10-16./10-343 Figure 10-20./10-348 update 10.4.4/10-342,more detail for two baud add note for Table 10-16./10-342 update Figure 10-2./10-327,Figure 10-12./10-338 06.07 10.1 Effective Date Author Description of Changes Introduction This block guide provides an overview of the serial communication interface (SCI) module. The SCI allows asynchronous serial communications with peripheral devices and other CPUs. 10.1.1 Glossary IR: InfraRed IrDA: Infrared Design Associate IRQ: Interrupt Request LIN: Local Interconnect Network LSB: Least Significant Bit MSB: Most Significant Bit NRZ: Non-Return-to-Zero RZI: Return-to-Zero-Inverted RXD: Receive Pin SCI : Serial Communication Interface TXD: Transmit Pin MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 323 Serial Communication Interface (S12SCIV6) 10.1.2 Features The SCI includes these distinctive features: • Full-duplex or single-wire operation • Standard mark/space non-return-to-zero (NRZ) format • Selectable IrDA 1.4 return-to-zero-inverted (RZI) format with programmable pulse widths • 16-bit baud rate selection • Programmable 8-bit or 9-bit data format • Separately enabled transmitter and receiver • Programmable polarity for transmitter and receiver • Programmable transmitter output parity • Two receiver wakeup methods: — Idle line wakeup — Address mark wakeup • Interrupt-driven operation with eight flags: — Transmitter empty — Transmission complete — Receiver full — Idle receiver input — Receiver overrun — Noise error — Framing error — Parity error — Receive wakeup on active edge — Transmit collision detect supporting LIN — Break Detect supporting LIN • Receiver framing error detection • Hardware parity checking • 1/16 bit-time noise detection 10.1.3 Modes of Operation The SCI functions the same in normal, special, and emulation modes. It has two low power modes, wait and stop modes. • • • Run mode Wait mode Stop mode MC9S12VR Family Reference Manual, Rev. 4.2 324 NXP Semiconductor Serial Communication Interface (S12SCIV6) 10.1.4 Block Diagram Figure 10-1 is a high level block diagram of the SCI module, showing the interaction of various function blocks. SCI Data Register RXD Data In Bus Clock Infrared Decoder Receive Shift Register IDLE Receive & Wakeup Control Receive Baud Rate Receive Interrupt Generation Generator 1/16 Transmit Control Transmit Shift Register BRKD SCI Interrupt Request RXEDG BERR Data Format Control Transmit Baud Rate Generator RDRF/OR Transmit Interrupt Generation Infrared Encoder TDRE TC Data Out TXD SCI Data Register Figure 10-1. SCI Block Diagram MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 325 Serial Communication Interface (S12SCIV6) 10.2 External Signal Description The SCI module has a total of two external pins. 10.2.1 TXD — Transmit Pin The TXD pin transmits SCI (standard or infrared) data. It will idle high in either mode and is high impedance anytime the transmitter is disabled. 10.2.2 RXD — Receive Pin The RXD pin receives SCI (standard or infrared) data. An idle line is detected as a line high. This input is ignored when the receiver is disabled and should be terminated to a known voltage. 10.3 Memory Map and Register Definition This section provides a detailed description of all the SCI registers. 10.3.1 Module Memory Map and Register Definition The memory map for the SCI module is given below in Figure 10-2. The address listed for each register is the address offset. The total address for each register is the sum of the base address for the SCI module and the address offset for each register. MC9S12VR Family Reference Manual, Rev. 4.2 326 NXP Semiconductor Serial Communication Interface (S12SCIV6) 10.3.2 Register Descriptions This section consists of register descriptions in address order. Each description includes a standard register diagram with an associated figure number. Writes to a reserved register locations do not have any effect and reads of these locations return a zero. Details of register bit and field function follow the register diagrams, in bit order. Register Name SCIBDH1 R W SCIBDL1 R W SCICR11 R W SCIASR12 R W SCIACR12 R W SCIACR22 R W SCICR2 R W SCISR1 R Bit 7 6 5 4 3 2 1 Bit 0 SBR15 SBR14 SBR13 SBR12 SBR11 SBR10 SBR9 SBR8 SBR7 SBR6 SBR5 SBR4 SBR3 SBR2 SBR1 SBR0 LOOPS SCISWAI RSRC M WAKE ILT PE PT 0 0 0 0 BERRV BERRIF BKDIF 0 0 0 0 BERRIE BKDIE IREN TNP1 TNP0 0 0 BERRM1 BERRM0 BKDFE TIE TCIE RIE ILIE TE RE RWU SBK TDRE TC RDRF IDLE OR NF FE PF 0 0 TXPOL RXPOL BRK13 TXDIR 0 0 0 Reserved Reserved Reserved RXEDGIF RXEDGIE 0 W SCISR2 R W SCIDRH R AMAP R8 W SCIDRL T8 RAF R R7 R6 R5 R4 R3 R2 R1 R0 W T7 T6 T5 T4 T3 T2 T1 T0 1.These registers are accessible if the AMAP bit in the SCISR2 register is set to zero. 2,These registers are accessible if the AMAP bit in the SCISR2 register is set to one. = Unimplemented or Reserved Figure 10-2. SCI Register Summary MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 327 Serial Communication Interface (S12SCIV6) 10.3.2.1 R W Reset SCI Baud Rate Registers (SCIBDH, SCIBDL) 7 6 5 4 3 2 1 0 SBR15 SBR14 SBR13 SBR12 SBR11 SBR10 SBR9 SBR8 0 0 0 0 0 0 0 0 Figure 10-3. SCI Baud Rate Register (SCIBDH) R W Reset 7 6 5 4 3 2 1 0 SBR7 SBR6 SBR5 SBR4 SBR3 SBR2 SBR1 SBR0 0 0 1 0 0 0 0 0 Figure 10-4. SCI Baud Rate Register (SCIBDL) Read: Anytime, if AMAP = 0. Write: Anytime, if AMAP = 0. NOTE Those two registers are only visible in the memory map if AMAP = 0 (reset condition). The SCI baud rate register is used by to determine the baud rate of the SCI, and to control the infrared modulation/demodulation submodule. Table 10-2. SCIBDH and SCIBDL Field Descriptions Field Description SBR[15:0] SCI Baud Rate Bits — The baud rate for the SCI is determined by the bits in this register. The baud rate is calculated two different ways depending on the state of the IREN bit. The formulas for calculating the baud rate are: When IREN = 0 then, SCI baud rate = SCI bus clock / (SBR[15:0]) When IREN = 1 then, SCI baud rate = SCI bus clock / (2 x SBR[15:1]) Note: The baud rate generator is disabled after reset and not started until the TE bit or the RE bit is set for the first time. The baud rate generator is disabled when (SBR[15:4] = 0 and IREN = 0) or (SBR[15:5] = 0 and IREN = 1). Note: . User should write SCIBD by word access. The updated SCIBD may take effect until next RT clock start, write SCIBDH or SCIBDL separately may cause baud generator load wrong data at that time,if second write later then RT clock. 10.3.2.2 R W Reset SCI Control Register 1 (SCICR1) 7 6 5 4 3 2 1 0 LOOPS SCISWAI RSRC M WAKE ILT PE PT 0 0 0 0 0 0 0 0 Figure 10-5. SCI Control Register 1 (SCICR1) MC9S12VR Family Reference Manual, Rev. 4.2 328 NXP Semiconductor Serial Communication Interface (S12SCIV6) Read: Anytime, if AMAP = 0. Write: Anytime, if AMAP = 0. NOTE This register is only visible in the memory map if AMAP = 0 (reset condition). Table 10-3. SCICR1 Field Descriptions Field Description 7 LOOPS Loop Select Bit — LOOPS enables loop operation. In loop operation, the RXD pin is disconnected from the SCI and the transmitter output is internally connected to the receiver input. Both the transmitter and the receiver must be enabled to use the loop function. 0 Normal operation enabled 1 Loop operation enabled The receiver input is determined by the RSRC bit. 6 SCISWAI 5 RSRC 4 M 3 WAKE SCI Stop in Wait Mode Bit — SCISWAI disables the SCI in wait mode. 0 SCI enabled in wait mode 1 SCI disabled in wait mode Receiver Source Bit — When LOOPS = 1, the RSRC bit determines the source for the receiver shift register input. See Table 10-4. 0 Receiver input internally connected to transmitter output 1 Receiver input connected externally to transmitter Data Format Mode Bit — MODE determines whether data characters are eight or nine bits long. 0 One start bit, eight data bits, one stop bit 1 One start bit, nine data bits, one stop bit Wakeup Condition Bit — WAKE determines which condition wakes up the SCI: a logic 1 (address mark) in the most significant bit position of a received data character or an idle condition on the RXD pin. 0 Idle line wakeup 1 Address mark wakeup 2 ILT Idle Line Type Bit — ILT determines when the receiver starts counting logic 1s as idle character bits. The counting begins either after the start bit or after the stop bit. If the count begins after the start bit, then a string of logic 1s preceding the stop bit may cause false recognition of an idle character. Beginning the count after the stop bit avoids false idle character recognition, but requires properly synchronized transmissions. 0 Idle character bit count begins after start bit 1 Idle character bit count begins after stop bit 1 PE Parity Enable Bit — PE enables the parity function. When enabled, the parity function inserts a parity bit in the most significant bit position. 0 Parity function disabled 1 Parity function enabled 0 PT Parity Type Bit — PT determines whether the SCI generates and checks for even parity or odd parity. With even parity, an even number of 1s clears the parity bit and an odd number of 1s sets the parity bit. With odd parity, an odd number of 1s clears the parity bit and an even number of 1s sets the parity bit. 0 Even parity 1 Odd parity MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 329 Serial Communication Interface (S12SCIV6) Table 10-4. Loop Functions LOOPS RSRC Function 0 x Normal operation 1 0 Loop mode with transmitter output internally connected to receiver input 1 1 Single-wire mode with TXD pin connected to receiver input MC9S12VR Family Reference Manual, Rev. 4.2 330 NXP Semiconductor Serial Communication Interface (S12SCIV6) 10.3.2.3 SCI Alternative Status Register 1 (SCIASR1) 7 R W Reset RXEDGIF 0 6 5 4 3 2 0 0 0 0 BERRV 0 0 0 0 0 1 0 BERRIF BKDIF 0 0 = Unimplemented or Reserved Figure 10-6. SCI Alternative Status Register 1 (SCIASR1) Read: Anytime, if AMAP = 1 Write: Anytime, if AMAP = 1 Table 10-5. SCIASR1 Field Descriptions Field 7 RXEDGIF Description Receive Input Active Edge Interrupt Flag — RXEDGIF is asserted, if an active edge (falling if RXPOL = 0, rising if RXPOL = 1) on the RXD input occurs. RXEDGIF bit is cleared by writing a “1” to it. 0 No active receive on the receive input has occurred 1 An active edge on the receive input has occurred 2 BERRV Bit Error Value — BERRV reflects the state of the RXD input when the bit error detect circuitry is enabled and a mismatch to the expected value happened. The value is only meaningful, if BERRIF = 1. 0 A low input was sampled, when a high was expected 1 A high input reassembled, when a low was expected 1 BERRIF Bit Error Interrupt Flag — BERRIF is asserted, when the bit error detect circuitry is enabled and if the value sampled at the RXD input does not match the transmitted value. If the BERRIE interrupt enable bit is set an interrupt will be generated. The BERRIF bit is cleared by writing a “1” to it. 0 No mismatch detected 1 A mismatch has occurred 0 BKDIF Break Detect Interrupt Flag — BKDIF is asserted, if the break detect circuitry is enabled and a break signal is received. If the BKDIE interrupt enable bit is set an interrupt will be generated. The BKDIF bit is cleared by writing a “1” to it. 0 No break signal was received 1 A break signal was received MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 331 Serial Communication Interface (S12SCIV6) 10.3.2.4 SCI Alternative Control Register 1 (SCIACR1) 7 R W Reset RXEDGIE 0 6 5 4 3 2 0 0 0 0 0 0 0 0 0 0 1 0 BERRIE BKDIE 0 0 = Unimplemented or Reserved Figure 10-7. SCI Alternative Control Register 1 (SCIACR1) Read: Anytime, if AMAP = 1 Write: Anytime, if AMAP = 1 Table 10-6. SCIACR1 Field Descriptions Field 7 RXEDGIE Description Receive Input Active Edge Interrupt Enable — RXEDGIE enables the receive input active edge interrupt flag, RXEDGIF, to generate interrupt requests. 0 RXEDGIF interrupt requests disabled 1 RXEDGIF interrupt requests enabled 1 BERRIE Bit Error Interrupt Enable — BERRIE enables the bit error interrupt flag, BERRIF, to generate interrupt requests. 0 BERRIF interrupt requests disabled 1 BERRIF interrupt requests enabled 0 BKDIE Break Detect Interrupt Enable — BKDIE enables the break detect interrupt flag, BKDIF, to generate interrupt requests. 0 BKDIF interrupt requests disabled 1 BKDIF interrupt requests enabled MC9S12VR Family Reference Manual, Rev. 4.2 332 NXP Semiconductor Serial Communication Interface (S12SCIV6) 10.3.2.5 SCI Alternative Control Register 2 (SCIACR2) 7 R W Reset 6 5 IREN TNP1 TNP0 0 0 0 4 3 0 0 0 0 2 1 0 BERRM1 BERRM0 BKDFE 0 0 0 = Unimplemented or Reserved Figure 10-8. SCI Alternative Control Register 2 (SCIACR2) Read: Anytime, if AMAP = 1 Write: Anytime, if AMAP = 1 Table 10-7. SCIACR2 Field Descriptions Field 7 IREN 6:5 TNP[1:0] Description Infrared Enable Bit — This bit enables/disables the infrared modulation/demodulation submodule. 0 IR disabled 1 IR enabled Transmitter Narrow Pulse Bits — These bits enable whether the SCI transmits a 1/16, 3/16, 1/32 or 1/4 narrow pulse. See Table 10-8. 2:1 Bit Error Mode — Those two bits determines the functionality of the bit error detect feature. See Table 10-9. BERRM[1:0] 0 BKDFE Break Detect Feature Enable — BKDFE enables the break detect circuitry. 0 Break detect circuit disabled 1 Break detect circuit enabled Table 10-8. IRSCI Transmit Pulse Width TNP[1:0] Narrow Pulse Width 11 1/4 10 1/32 01 1/16 00 3/16 Table 10-9. Bit Error Mode Coding BERRM1 BERRM0 Function 0 0 Bit error detect circuit is disabled 0 1 Receive input sampling occurs during the 9th time tick of a transmitted bit (refer to Figure 10-19) 1 0 Receive input sampling occurs during the 13th time tick of a transmitted bit (refer to Figure 10-19) 1 1 Reserved MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 333 Serial Communication Interface (S12SCIV6) 10.3.2.6 R W Reset SCI Control Register 2 (SCICR2) 7 6 5 4 3 2 1 0 TIE TCIE RIE ILIE TE RE RWU SBK 0 0 0 0 0 0 0 0 Figure 10-9. SCI Control Register 2 (SCICR2) Read: Anytime Write: Anytime Table 10-10. SCICR2 Field Descriptions Field 7 TIE Description Transmitter Interrupt Enable Bit — TIE enables the transmit data register empty flag, TDRE, to generate interrupt requests. 0 TDRE interrupt requests disabled 1 TDRE interrupt requests enabled 6 TCIE Transmission Complete Interrupt Enable Bit — TCIE enables the transmission complete flag, TC, to generate interrupt requests. 0 TC interrupt requests disabled 1 TC interrupt requests enabled 5 RIE Receiver Full Interrupt Enable Bit — RIE enables the receive data register full flag, RDRF, or the overrun flag, OR, to generate interrupt requests. 0 RDRF and OR interrupt requests disabled 1 RDRF and OR interrupt requests enabled 4 ILIE Idle Line Interrupt Enable Bit — ILIE enables the idle line flag, IDLE, to generate interrupt requests. 0 IDLE interrupt requests disabled 1 IDLE interrupt requests enabled 3 TE Transmitter Enable Bit — TE enables the SCI transmitter and configures the TXD pin as being controlled by the SCI. The TE bit can be used to queue an idle preamble. 0 Transmitter disabled 1 Transmitter enabled 2 RE Receiver Enable Bit — RE enables the SCI receiver. 0 Receiver disabled 1 Receiver enabled 1 RWU Receiver Wakeup Bit — Standby state 0 Normal operation. 1 RWU enables the wakeup function and inhibits further receiver interrupt requests. Normally, hardware wakes the receiver by automatically clearing RWU. 0 SBK Send Break Bit — Toggling SBK sends one break character (10 or 11 logic 0s, respectively 13 or 14 logics 0s if BRK13 is set). Toggling implies clearing the SBK bit before the break character has finished transmitting. As long as SBK is set, the transmitter continues to send complete break characters (10 or 11 bits, respectively 13 or 14 bits). 0 No break characters 1 Transmit break characters MC9S12VR Family Reference Manual, Rev. 4.2 334 NXP Semiconductor Serial Communication Interface (S12SCIV6) 10.3.2.7 SCI Status Register 1 (SCISR1) The SCISR1 and SCISR2 registers provides inputs to the MCU for generation of SCI interrupts. Also, these registers can be polled by the MCU to check the status of these bits. The flag-clearing procedures require that the status register be read followed by a read or write to the SCI data register.It is permissible to execute other instructions between the two steps as long as it does not compromise the handling of I/O, but the order of operations is important for flag clearing. R 7 6 5 4 3 2 1 0 TDRE TC RDRF IDLE OR NF FE PF 1 1 0 0 0 0 0 0 W Reset = Unimplemented or Reserved Figure 10-10. SCI Status Register 1 (SCISR1) Read: Anytime Write: Has no meaning or effect Table 10-11. SCISR1 Field Descriptions Field Description 7 TDRE Transmit Data Register Empty Flag — TDRE is set when the transmit shift register receives a byte from the SCI data register. When TDRE is 1, the transmit data register (SCIDRH/L) is empty and can receive a new value to transmit.Clear TDRE by reading SCI status register 1 (SCISR1), with TDRE set and then writing to SCI data register low (SCIDRL). 0 No byte transferred to transmit shift register 1 Byte transferred to transmit shift register; transmit data register empty 6 TC Transmit Complete Flag — TC is set low when there is a transmission in progress or when a preamble or break character is loaded. TC is set high when the TDRE flag is set and no data, preamble, or break character is being transmitted.When TC is set, the TXD pin becomes idle (logic 1). Clear TC by reading SCI status register 1 (SCISR1) with TC set and then writing to SCI data register low (SCIDRL). TC is cleared automatically when data, preamble, or break is queued and ready to be sent. TC is cleared in the event of a simultaneous set and clear of the TC flag (transmission not complete). 0 Transmission in progress 1 No transmission in progress 5 RDRF Receive Data Register Full Flag — RDRF is set when the data in the receive shift register transfers to the SCI data register. Clear RDRF by reading SCI status register 1 (SCISR1) with RDRF set and then reading SCI data register low (SCIDRL). 0 Data not available in SCI data register 1 Received data available in SCI data register 4 IDLE Idle Line Flag — IDLE is set when 10 consecutive logic 1s (if M = 0) or 11 consecutive logic 1s (if M =1) appear on the receiver input. Once the IDLE flag is cleared, a valid frame must again set the RDRF flag before an idle condition can set the IDLE flag.Clear IDLE by reading SCI status register 1 (SCISR1) with IDLE set and then reading SCI data register low (SCIDRL). 0 Receiver input is either active now or has never become active since the IDLE flag was last cleared 1 Receiver input has become idle Note: When the receiver wakeup bit (RWU) is set, an idle line condition does not set the IDLE flag. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 335 Serial Communication Interface (S12SCIV6) Table 10-11. SCISR1 Field Descriptions (continued) Field Description 3 OR Overrun Flag — OR is set when software fails to read the SCI data register before the receive shift register receives the next frame. The OR bit is set immediately after the stop bit has been completely received for the second frame. The data in the shift register is lost, but the data already in the SCI data registers is not affected. Clear OR by reading SCI status register 1 (SCISR1) with OR set and then reading SCI data register low (SCIDRL). 0 No overrun 1 Overrun Note: OR flag may read back as set when RDRF flag is clear. This may happen if the following sequence of events occurs: 1. After the first frame is received, read status register SCISR1 (returns RDRF set and OR flag clear); 2. Receive second frame without reading the first frame in the data register (the second frame is not received and OR flag is set); 3. Read data register SCIDRL (returns first frame and clears RDRF flag in the status register); 4. Read status register SCISR1 (returns RDRF clear and OR set). Event 3 may be at exactly the same time as event 2 or any time after. When this happens, a dummy SCIDRL read following event 4 will be required to clear the OR flag if further frames are to be received. 2 NF Noise Flag — NF is set when the SCI detects noise on the receiver input. NF bit is set during the same cycle as the RDRF flag but does not get set in the case of an overrun. Clear NF by reading SCI status register 1(SCISR1), and then reading SCI data register low (SCIDRL). 0 No noise 1 Noise 1 FE Framing Error Flag — FE is set when a logic 0 is accepted as the stop bit. FE bit is set during the same cycle as the RDRF flag but does not get set in the case of an overrun. FE inhibits further data reception until it is cleared. Clear FE by reading SCI status register 1 (SCISR1) with FE set and then reading the SCI data register low (SCIDRL). 0 No framing error 1 Framing error 0 PF Parity Error Flag — PF is set when the parity enable bit (PE) is set and the parity of the received data does not match the parity type bit (PT). PF bit is set during the same cycle as the RDRF flag but does not get set in the case of an overrun. Clear PF by reading SCI status register 1 (SCISR1), and then reading SCI data register low (SCIDRL). 0 No parity error 1 Parity error MC9S12VR Family Reference Manual, Rev. 4.2 336 NXP Semiconductor Serial Communication Interface (S12SCIV6) 10.3.2.8 SCI Status Register 2 (SCISR2) 7 R W Reset AMAP 0 6 5 0 0 0 0 4 3 2 1 TXPOL RXPOL BRK13 TXDIR 0 0 0 0 0 RAF 0 = Unimplemented or Reserved Figure 10-11. SCI Status Register 2 (SCISR2) Read: Anytime Write: Anytime Table 10-12. SCISR2 Field Descriptions Field Description 7 AMAP Alternative Map — This bit controls which registers sharing the same address space are accessible. In the reset condition the SCI behaves as previous versions. Setting AMAP=1 allows the access to another set of control and status registers and hides the baud rate and SCI control Register 1. 0 The registers labelled SCIBDH (0x0000),SCIBDL (0x0001), SCICR1 (0x0002) are accessible 1 The registers labelled SCIASR1 (0x0000),SCIACR1 (0x0001), SCIACR2 (0x00002) are accessible 4 TXPOL Transmit Polarity — This bit control the polarity of the transmitted data. In NRZ format, a one is represented by a mark and a zero is represented by a space for normal polarity, and the opposite for inverted polarity. In IrDA format, a zero is represented by short high pulse in the middle of a bit time remaining idle low for a one for normal polarity, and a zero is represented by short low pulse in the middle of a bit time remaining idle high for a one for inverted polarity. 0 Normal polarity 1 Inverted polarity 3 RXPOL Receive Polarity — This bit control the polarity of the received data. In NRZ format, a one is represented by a mark and a zero is represented by a space for normal polarity, and the opposite for inverted polarity. In IrDA format, a zero is represented by short high pulse in the middle of a bit time remaining idle low for a one for normal polarity, and a zero is represented by short low pulse in the middle of a bit time remaining idle high for a one for inverted polarity. 0 Normal polarity 1 Inverted polarity 2 BRK13 Break Transmit Character Length — This bit determines whether the transmit break character is 10 or 11 bit respectively 13 or 14 bits long. The detection of a framing error is not affected by this bit. 0 Break character is 10 or 11 bit long 1 Break character is 13 or 14 bit long 1 TXDIR Transmitter Pin Data Direction in Single-Wire Mode — This bit determines whether the TXD pin is going to be used as an input or output, in the single-wire mode of operation. This bit is only relevant in the single-wire mode of operation. 0 TXD pin to be used as an input in single-wire mode 1 TXD pin to be used as an output in single-wire mode 0 RAF Receiver Active Flag — RAF is set when the receiver detects a logic 0 during the RT1 time period of the start bit search. RAF is cleared when the receiver detects an idle character. 0 No reception in progress 1 Reception in progress MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 337 Serial Communication Interface (S12SCIV6) 10.3.2.9 SCI Data Registers (SCIDRH, SCIDRL) 7 R 6 R8 W Reset 0 T8 0 5 4 3 0 0 0 0 0 0 2 1 0 Reserved Reserved Reserved 0 0 0 = Unimplemented or Reserved Figure 10-12. SCI Data Registers (SCIDRH) 7 6 5 4 3 2 1 0 R R7 R6 R5 R4 R3 R2 R1 R0 W T7 T6 T5 T4 T3 T2 T1 T0 0 0 0 0 0 0 0 0 Reset Figure 10-13. SCI Data Registers (SCIDRL) Read: Anytime; reading accesses SCI receive data register Write: Anytime; writing accesses SCI transmit data register; writing to R8 has no effect Table 10-13. SCIDRH and SCIDRL Field Descriptions Field Description SCIDRH 7 R8 Received Bit 8 — R8 is the ninth data bit received when the SCI is configured for 9-bit data format (M = 1). SCIDRH 6 T8 Transmit Bit 8 — T8 is the ninth data bit transmitted when the SCI is configured for 9-bit data format (M = 1). SCIDRL 7:0 R[7:0] T[7:0] R7:R0 — Received bits seven through zero for 9-bit or 8-bit data formats T7:T0 — Transmit bits seven through zero for 9-bit or 8-bit formats NOTE If the value of T8 is the same as in the previous transmission, T8 does not have to be rewritten.The same value is transmitted until T8 is rewritten In 8-bit data format, only SCI data register low (SCIDRL) needs to be accessed. When transmitting in 9-bit data format and using 8-bit write instructions, write first to SCI data register high (SCIDRH), then SCIDRL. MC9S12VR Family Reference Manual, Rev. 4.2 338 NXP Semiconductor Serial Communication Interface (S12SCIV6) 10.4 Functional Description This section provides a complete functional description of the SCI block, detailing the operation of the design from the end user perspective in a number of subsections. Figure 10-14 shows the structure of the SCI module. The SCI allows full duplex, asynchronous, serial communication between the CPU and remote devices, including other CPUs. The SCI transmitter and receiver operate independently, although they use the same baud rate generator. The CPU monitors the status of the SCI, writes the data to be transmitted, and processes received data. R8 IREN SCI Data Register FE Ir_RXD Bus Clock Receive Shift Register SCRXD Receive and Wakeup Control PF RAF RE IDLE RWU RDRF LOOPS OR RSRC M Receive Baud Rate Generator IDLE ILIE RDRF/OR Infrared Receive Decoder R16XCLK RXD NF RIE TIE WAKE Data Format Control ILT PE SBR15:SBR0 TDRE TDRE TC PT SCI Interrupt Request TC TCIE TE Transmit Baud Rate Generator 16 Transmit Control LOOPS SBK RSRC T8 Transmit Shift Register RXEDGIE Active Edge Detect RXEDGIF BKDIF RXD SCI Data Register Break Detect BKDFE SCTXD BKDIE LIN Transmit BERRIF Collision Detect BERRIE R16XCLK Infrared Transmit Encoder BERRM[1:0] Ir_TXD TXD R32XCLK TNP[1:0] IREN Figure 10-14. Detailed SCI Block Diagram MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 339 Serial Communication Interface (S12SCIV6) 10.4.1 Infrared Interface Submodule This module provides the capability of transmitting narrow pulses to an IR LED and receiving narrow pulses and transforming them to serial bits, which are sent to the SCI. The IrDA physical layer specification defines a half-duplex infrared communication link for exchange data. The full standard includes data rates up to 16 Mbits/s. This design covers only data rates between 2.4 Kbits/s and 115.2 Kbits/s. The infrared submodule consists of two major blocks: the transmit encoder and the receive decoder. The SCI transmits serial bits of data which are encoded by the infrared submodule to transmit a narrow pulse for every zero bit. No pulse is transmitted for every one bit. When receiving data, the IR pulses should be detected using an IR photo diode and transformed to CMOS levels by the IR receive decoder (external from the MCU). The narrow pulses are then stretched by the infrared submodule to get back to a serial bit stream to be received by the SCI.The polarity of transmitted pulses and expected receive pulses can be inverted so that a direct connection can be made to external IrDA transceiver modules that use active low pulses. The infrared submodule receives its clock sources from the SCI. One of these two clocks are selected in the infrared submodule in order to generate either 3/16, 1/16, 1/32 or 1/4 narrow pulses during transmission. The infrared block receives two clock sources from the SCI, R16XCLK and R32XCLK, which are configured to generate the narrow pulse width during transmission. The R16XCLK and R32XCLK are internal clocks with frequencies 16 and 32 times the baud rate respectively. Both R16XCLK and R32XCLK clocks are used for transmitting data. The receive decoder uses only the R16XCLK clock. 10.4.1.1 Infrared Transmit Encoder The infrared transmit encoder converts serial bits of data from transmit shift register to the TXD pin. A narrow pulse is transmitted for a zero bit and no pulse for a one bit. The narrow pulse is sent in the middle of the bit with a duration of 1/32, 1/16, 3/16 or 1/4 of a bit time. A narrow high pulse is transmitted for a zero bit when TXPOL is cleared, while a narrow low pulse is transmitted for a zero bit when TXPOL is set. 10.4.1.2 Infrared Receive Decoder The infrared receive block converts data from the RXD pin to the receive shift register. A narrow pulse is expected for each zero received and no pulse is expected for each one received. A narrow high pulse is expected for a zero bit when RXPOL is cleared, while a narrow low pulse is expected for a zero bit when RXPOL is set. This receive decoder meets the edge jitter requirement as defined by the IrDA serial infrared physical layer specification. 10.4.2 LIN Support This module provides some basic support for the LIN protocol. At first this is a break detect circuitry making it easier for the LIN software to distinguish a break character from an incoming data stream. As a further addition is supports a collision detection at the bit level as well as cancelling pending transmissions. MC9S12VR Family Reference Manual, Rev. 4.2 340 NXP Semiconductor Serial Communication Interface (S12SCIV6) 10.4.3 Data Format The SCI uses the standard NRZ mark/space data format. When Infrared is enabled, the SCI uses RZI data format where zeroes are represented by light pulses and ones remain low. See Figure 10-15 below. 8-Bit Data Format (Bit M in SCICR1 Clear) Start Bit Bit 0 Bit 1 Bit 2 Bit 3 Bit 4 Bit 5 Possible Parity Bit Bit 6 STOP Bit Bit 7 Next Start Bit Standard SCI Data Infrared SCI Data 9-Bit Data Format (Bit M in SCICR1 Set) Start Bit Bit 0 Bit 1 Bit 2 Bit 3 Bit 4 Bit 5 POSSIBLE PARITY Bit Bit 6 Bit 7 Bit 8 STOP Bit NEXT START Bit Standard SCI Data Infrared SCI Data Figure 10-15. SCI Data Formats Each data character is contained in a frame that includes a start bit, eight or nine data bits, and a stop bit. Clearing the M bit in SCI control register 1 configures the SCI for 8-bit data characters. A frame with eight data bits has a total of 10 bits. Setting the M bit configures the SCI for nine-bit data characters. A frame with nine data bits has a total of 11 bits. Table 10-14. Example of 8-Bit Data Formats Start Bit Data Bits Address Bits Parity Bits Stop Bit 1 8 0 0 1 1 7 0 1 1 7 1 0 1 1 1 1 The address bit identifies the frame as an address character. See Section 10.4.6.6, “Receiver Wakeup”. When the SCI is configured for 9-bit data characters, the ninth data bit is the T8 bit in SCI data register high (SCIDRH). It remains unchanged after transmission and can be used repeatedly without rewriting it. A frame with nine data bits has a total of 11 bits. Table 10-15. Example of 9-Bit Data Formats Start Bit Data Bits Address Bits Parity Bits Stop Bit 1 9 0 0 1 1 8 0 1 1 8 1 0 1 1 1 MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 341 Serial Communication Interface (S12SCIV6) 1 10.4.4 The address bit identifies the frame as an address character. See Section 10.4.6.6, “Receiver Wakeup”. Baud Rate Generation A 16-bit modulus counter in the two baud rate generator derives the baud rate for both the receiver and the transmitter. The value from 0 to 65535 written to the SBR15:SBR0 bits determines the baud rate. The value from 0 to 4095 written to the SBR15:SBR4 bits determines the baud rate clock with SBR3:SBR0 for fine adjust. The SBR bits are in the SCI baud rate registers (SCIBDH and SCIBDL) for both transmit and receive baud generator. The baud rate clock is synchronized with the bus clock and drives the receiver. The baud rate clock divided by 16 drives the transmitter. The receiver has an acquisition rate of 16 samples per bit time. Baud rate generation is subject to one source of error: • Integer division of the bus clock may not give the exact target frequency. Table 10-16 lists some examples of achieving target baud rates with a bus clock frequency of 25 MHz. When IREN = 0 then, SCI baud rate = SCI bus clock / (SCIBR[15:0]) Table 10-16. Baud Rates (Example: Bus Clock = 25 MHz) 1 2 Bits SBR[15:0] Receiver1 Clock (Hz) Transmitter2 Clock (Hz) Target Baud Rate Error (%) 109 3669724.8 229,357.8 230,400 .452 217 1843318.0 115,207.4 115,200 .006 651 614439.3 38,402.5 38,400 .006 1302 307219.7 19,201.2 19,200 .006 2604 153,609.8 9600.6 9,600 .006 5208 76,804.9 4800.3 4,800 .006 10417 38,398.8 2399.9 2,400 .003 20833 19,200.3 1200.02 1,200 .00 41667 9599.9 600.0 600 .00 65535 6103.6 381.5 16x faster then baud rate divide 1/16 form transmit baud generator MC9S12VR Family Reference Manual, Rev. 4.2 342 NXP Semiconductor Serial Communication Interface (S12SCIV6) 10.4.5 Transmitter Internal Bus Transmit baud generator SBR15:SBR4 16 SCI Data Registers Stop SBR3:SBR0 11-Bit Transmit Register H 8 7 6 5 4 3 2 1 0 TXPOL SCTXD L MSB M Start Bus Clock LOOP CONTROL TIE TDRE IRQ Break (All 0s) Parity Generation Preamble (All 1s) PT Shift Enable PE Load from SCIDR T8 To Receiver LOOPS RSRC TDRE TC TC IRQ Transmitter Control TCIE TE BERRIF BER IRQ TCIE SBK BERRM[1:0] Transmit Collision Detect SCTXD SCRXD (From Receiver) Figure 10-16. Transmitter Block Diagram 10.4.5.1 Transmitter Character Length The SCI transmitter can accommodate either 8-bit or 9-bit data characters. The state of the M bit in SCI control register 1 (SCICR1) determines the length of data characters. When transmitting 9-bit data, bit T8 in SCI data register high (SCIDRH) is the ninth bit (bit 8). 10.4.5.2 Character Transmission To transmit data, the MCU writes the data bits to the SCI data registers (SCIDRH/SCIDRL), which in turn are transferred to the transmitter shift register. The transmit shift register then shifts a frame out through the TXD pin, after it has prefaced them with a start bit and appended them with a stop bit. The SCI data registers (SCIDRH and SCIDRL) are the write-only buffers between the internal data bus and the transmit shift register. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 343 Serial Communication Interface (S12SCIV6) The SCI also sets a flag, the transmit data register empty flag (TDRE), every time it transfers data from the buffer (SCIDRH/L) to the transmitter shift register.The transmit driver routine may respond to this flag by writing another byte to the Transmitter buffer (SCIDRH/SCIDRL), while the shift register is still shifting out the first byte. To initiate an SCI transmission: 1. Configure the SCI: a) Select a baud rate. Write this value to the SCI baud registers (SCIBDH/L) to begin the baud rate generator. Remember that the baud rate generator is disabled when the baud rate is zero. Writing to the SCIBDH has no effect without also writing to SCIBDL. b) Write to SCICR1 to configure word length, parity, and other configuration bits (LOOPS,RSRC,M,WAKE,ILT,PE,PT). c) Enable the transmitter, interrupts, receive, and wake up as required, by writing to the SCICR2 register bits (TIE,TCIE,RIE,ILIE,TE,RE,RWU,SBK). A preamble or idle character will now be shifted out of the transmitter shift register. 2. Transmit Procedure for each byte: a) Poll the TDRE flag by reading the SCISR1 or responding to the TDRE interrupt. Keep in mind that the TDRE bit resets to one. b) If the TDRE flag is set, write the data to be transmitted to SCIDRH/L, where the ninth bit is written to the T8 bit in SCIDRH if the SCI is in 9-bit data format. A new transmission will not result until the TDRE flag has been cleared. 3. Repeat step 2 for each subsequent transmission. NOTE The TDRE flag is set when the shift register is loaded with the next data to be transmitted from SCIDRH/L, which happens, generally speaking, a little over half-way through the stop bit of the previous frame. Specifically, this transfer occurs 9/16ths of a bit time AFTER the start of the stop bit of the previous frame. Writing the TE bit from 0 to a 1 automatically loads the transmit shift register with a preamble of 10 logic 1s (if M = 0) or 11 logic 1s (if M = 1). After the preamble shifts out, control logic transfers the data from the SCI data register into the transmit shift register. A logic 0 start bit automatically goes into the least significant bit position of the transmit shift register. A logic 1 stop bit goes into the most significant bit position. Hardware supports odd or even parity. When parity is enabled, the most significant bit (MSB) of the data character is the parity bit. The transmit data register empty flag, TDRE, in SCI status register 1 (SCISR1) becomes set when the SCI data register transfers a byte to the transmit shift register. The TDRE flag indicates that the SCI data register can accept new data from the internal data bus. If the transmit interrupt enable bit, TIE, in SCI control register 2 (SCICR2) is also set, the TDRE flag generates a transmitter interrupt request. MC9S12VR Family Reference Manual, Rev. 4.2 344 NXP Semiconductor Serial Communication Interface (S12SCIV6) When the transmit shift register is not transmitting a frame, the TXD pin goes to the idle condition, logic 1. If at any time software clears the TE bit in SCI control register 2 (SCICR2), the transmitter enable signal goes low and the transmit signal goes idle. If software clears TE while a transmission is in progress (TC = 0), the frame in the transmit shift register continues to shift out. To avoid accidentally cutting off the last frame in a message, always wait for TDRE to go high after the last frame before clearing TE. To separate messages with preambles with minimum idle line time, use this sequence between messages: 1. Write the last byte of the first message to SCIDRH/L. 2. Wait for the TDRE flag to go high, indicating the transfer of the last frame to the transmit shift register. 3. Queue a preamble by clearing and then setting the TE bit. 4. Write the first byte of the second message to SCIDRH/L. 10.4.5.3 Break Characters Writing a logic 1 to the send break bit, SBK, in SCI control register 2 (SCICR2) loads the transmit shift register with a break character. A break character contains all logic 0s and has no start, stop, or parity bit. Break character length depends on the M bit in SCI control register 1 (SCICR1). As long as SBK is at logic 1, transmitter logic continuously loads break characters into the transmit shift register. After software clears the SBK bit, the shift register finishes transmitting the last break character and then transmits at least one logic 1. The automatic logic 1 at the end of a break character guarantees the recognition of the start bit of the next frame. The SCI recognizes a break character when there are 10 or 11(M = 0 or M = 1) consecutive zero received. Depending if the break detect feature is enabled or not receiving a break character has these effects on SCI registers. If the break detect feature is disabled (BKDFE = 0): • Sets the framing error flag, FE • Sets the receive data register full flag, RDRF • Clears the SCI data registers (SCIDRH/L) • May set the overrun flag, OR, noise flag, NF, parity error flag, PE, or the receiver active flag, RAF (see 3.4.4 and 3.4.5 SCI Status Register 1 and 2) If the break detect feature is enabled (BKDFE = 1) there are two scenarios1 The break is detected right from a start bit or is detected during a byte reception. • Sets the break detect interrupt flag, BKDIF • Does not change the data register full flag, RDRF or overrun flag OR • Does not change the framing error flag FE, parity error flag PE. • Does not clear the SCI data registers (SCIDRH/L) • May set noise flag NF, or receiver active flag RAF. 1. A Break character in this context are either 10 or 11 consecutive zero received bits MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 345 Serial Communication Interface (S12SCIV6) Figure 10-17 shows two cases of break detect. In trace RXD_1 the break symbol starts with the start bit, while in RXD_2 the break starts in the middle of a transmission. If BRKDFE = 1, in RXD_1 case there will be no byte transferred to the receive buffer and the RDRF flag will not be modified. Also no framing error or parity error will be flagged from this transfer. In RXD_2 case, however the break signal starts later during the transmission. At the expected stop bit position the byte received so far will be transferred to the receive buffer, the receive data register full flag will be set, a framing error and if enabled and appropriate a parity error will be set. Once the break is detected the BRKDIF flag will be set. Start Bit Position Stop Bit Position BRKDIF = 1 RXD_1 Zero Bit Counter 1 2 3 4 5 6 7 8 9 10 . . . BRKDIF = 1 FE = 1 RXD_2 Zero Bit Counter 1 2 3 4 5 6 7 8 9 ... 10 Figure 10-17. Break Detection if BRKDFE = 1 (M = 0) 10.4.5.4 Idle Characters An idle character (or preamble) contains all logic 1s and has no start, stop, or parity bit. Idle character length depends on the M bit in SCI control register 1 (SCICR1). The preamble is a synchronizing idle character that begins the first transmission initiated after writing the TE bit from 0 to 1. If the TE bit is cleared during a transmission, the TXD pin becomes idle after completion of the transmission in progress. Clearing and then setting the TE bit during a transmission queues an idle character to be sent after the frame currently being transmitted. NOTE When queueing an idle character, return the TE bit to logic 1 before the stop bit of the current frame shifts out through the TXD pin. Setting TE after the stop bit appears on TXD causes data previously written to the SCI data register to be lost. Toggle the TE bit for a queued idle character while the TDRE flag is set and immediately before writing the next byte to the SCI data register. If the TE bit is clear and the transmission is complete, the SCI is not the master of the TXD pin MC9S12VR Family Reference Manual, Rev. 4.2 346 NXP Semiconductor Serial Communication Interface (S12SCIV6) 10.4.5.5 LIN Transmit Collision Detection This module allows to check for collisions on the LIN bus. LIN Physical Interface Synchronizer Stage Receive Shift Register Compare Bit Error RXD Pin LIN Bus Bus Clock Sample Point Transmit Shift Register TXD Pin Figure 10-18. Collision Detect Principle 3 4 5 6 7 8 9 BERRM[1:0] = 0:1 10 11 12 13 14 15 0 Sampling End Input Receive Shift Register 2 Sampling Begin Output Transmit Shift Register 1 Sampling End 0 Sampling Begin If the bit error circuit is enabled (BERRM[1:0] = 0:1 or = 1:0]), the error detect circuit will compare the transmitted and the received data stream at a point in time and flag any mismatch. The timing checks run when transmitter is active (not idle). As soon as a mismatch between the transmitted data and the received data is detected the following happens: • The next bit transmitted will have a high level (TXPOL = 0) or low level (TXPOL = 1) • The transmission is aborted and the byte in transmit buffer is discarded. • the transmit data register empty and the transmission complete flag will be set • The bit error interrupt flag, BERRIF, will be set. • No further transmissions will take place until the BERRIF is cleared. BERRM[1:0] = 1:1 Compare Sample Points Figure 10-19. Timing Diagram Bit Error Detection If the bit error detect feature is disabled, the bit error interrupt flag is cleared. NOTE The RXPOL and TXPOL bit should be set the same when transmission collision detect feature is enabled, otherwise the bit error interrupt flag may be set incorrectly. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 347 Serial Communication Interface (S12SCIV6) 10.4.6 Receiver Internal Bus RXPOL Data Recovery Loop Control H 11-Bit Receive Shift Register 8 7 6 5 4 3 2 1 0 L All 1s SCRXD From TXD Pin or Transmitter Stop Receive Baud Generator MSB Bus Clock SCI Data Register SBR3:SBR0 Start SBR15:SBR4 RE RAF LOOPS RSRC FE M RWU NF WAKE Wakeup Logic ILT PE PE R8 Parity Checking PT Idle IRQ IDLE ILIE BRKDFE OR Break Detect Logic Active Edge Detect Logic RDRF/OR IRQ RDRF BRKDIF BRKDIE RXEDGIF RXEDGIE RIE Break IRQ RX Active Edge IRQ Figure 10-20. SCI Receiver Block Diagram 10.4.6.1 Receiver Character Length The SCI receiver can accommodate either 8-bit or 9-bit data characters. The state of the M bit in SCI control register 1 (SCICR1) determines the length of data characters. When receiving 9-bit data, bit R8 in SCI data register high (SCIDRH) is the ninth bit (bit 8). 10.4.6.2 Character Reception During an SCI reception, the receive shift register shifts a frame in from the RXD pin. The SCI data register is the read-only buffer between the internal data bus and the receive shift register. After a complete frame shifts into the receive shift register, the data portion of the frame transfers to the SCI data register. The receive data register full flag, RDRF, in SCI status register 1 (SCISR1) becomes set, MC9S12VR Family Reference Manual, Rev. 4.2 348 NXP Semiconductor Serial Communication Interface (S12SCIV6) indicating that the received byte can be read. If the receive interrupt enable bit, RIE, in SCI control register 2 (SCICR2) is also set, the RDRF flag generates an RDRF interrupt request. 10.4.6.3 Data Sampling The RT clock rate. The RT clock is an internal signal with a frequency 16 times the baud rate. To adjust for baud rate mismatch, the RT clock (see Figure 10-21) is re-synchronized immediatelly at bus clock edge: • After every start bit • After the receiver detects a data bit change from logic 1 to logic 0 (after the majority of data bit samples at RT8, RT9, and RT10 returns a valid logic 1 and the majority of the next RT8, RT9, and RT10 samples returns a valid logic 0) To locate the start bit, data recovery logic does an asynchronous search for a logic 0 preceded by three logic 1s.When the falling edge of a possible start bit occurs, the RT clock begins to count to 16. Start Bit LSB RXD Samples 1 1 1 1 1 1 1 1 0 0 Start Bit Qualification 0 0 Start Bit Verification 0 0 0 Data Sampling RT4 RT3 RT2 RT1 RT16 RT15 RT14 RT13 RT12 RT11 RT10 RT9 RT8 RT7 RT6 RT5 RT4 RT3 RT2 RT1 RT1 RT1 RT1 RT1 RT1 RT1 RT1 RT CLock Count RT1 RT Clock Reset RT Clock Figure 10-21. Receiver Data Sampling To verify the start bit and to detect noise, data recovery logic takes samples at RT3, RT5, and RT7. Figure 10-17 summarizes the results of the start bit verification samples. Table 10-17. Start Bit Verification RT3, RT5, and RT7 Samples Start Bit Verification Noise Flag 000 Yes 0 001 Yes 1 010 Yes 1 011 No 0 100 Yes 1 101 No 0 110 No 0 111 No 0 If start bit verification is not successful, the RT clock is reset and a new search for a start bit begins. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 349 Serial Communication Interface (S12SCIV6) To determine the value of a data bit and to detect noise, recovery logic takes samples at RT8, RT9, and RT10. Table 10-18 summarizes the results of the data bit samples. Table 10-18. Data Bit Recovery RT8, RT9, and RT10 Samples Data Bit Determination Noise Flag 000 0 0 001 0 1 010 0 1 011 1 1 100 0 1 101 1 1 110 1 1 111 1 0 NOTE The RT8, RT9, and RT10 samples do not affect start bit verification. If any or all of the RT8, RT9, and RT10 start bit samples are logic 1s following a successful start bit verification, the noise flag (NF) is set and the receiver assumes that the bit is a start bit (logic 0). To verify a stop bit and to detect noise, recovery logic takes samples at RT8, RT9, and RT10. Table 10-19 summarizes the results of the stop bit samples. Table 10-19. Stop Bit Recovery RT8, RT9, and RT10 Samples Framing Error Flag Noise Flag 000 1 0 001 1 1 010 1 1 011 0 1 100 1 1 101 0 1 110 0 1 111 0 0 MC9S12VR Family Reference Manual, Rev. 4.2 350 NXP Semiconductor Serial Communication Interface (S12SCIV6) In Figure 10-22 the verification samples RT3 and RT5 determine that the first low detected was noise and not the beginning of a start bit. The RT clock is reset and the start bit search begins again. The noise flag is not set because the noise occurred before the start bit was found. Start Bit LSB 0 0 0 0 0 0 0 RT10 RT1 1 RT9 RT1 1 RT8 RT1 1 RT7 0 RT1 1 RT1 1 RT5 1 RT1 RXD Samples RT3 RT2 RT1 RT16 RT15 RT14 RT13 RT12 RT11 RT6 RT5 RT4 RT3 RT2 RT4 RT3 RT Clock Count RT2 RT Clock Reset RT Clock Figure 10-22. Start Bit Search Example 1 In Figure 10-23, verification sample at RT3 is high. The RT3 sample sets the noise flag. Although the perceived bit time is misaligned, the data samples RT8, RT9, and RT10 are within the bit time and data recovery is successful. Perceived Start Bit Actual Start Bit LSB 1 0 RT1 RT1 RT1 RT1 RT1 1 0 0 0 0 0 RT10 1 RT9 1 RT8 1 RT7 1 RT1 RXD Samples RT7 RT6 RT5 RT4 RT3 RT2 RT1 RT16 RT15 RT14 RT13 RT12 RT11 RT6 RT5 RT4 RT3 RT Clock Count RT2 RT Clock Reset RT Clock Figure 10-23. Start Bit Search Example 2 MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 351 Serial Communication Interface (S12SCIV6) In Figure 10-24, a large burst of noise is perceived as the beginning of a start bit, although the test sample at RT5 is high. The RT5 sample sets the noise flag. Although this is a worst-case misalignment of perceived bit time, the data samples RT8, RT9, and RT10 are within the bit time and data recovery is successful. Perceived Start Bit Actual Start Bit LSB RT1 RT1 0 1 0 0 0 0 RT10 0 RT9 1 RT8 1 RT7 1 RT1 Samples RT1 RXD RT9 RT8 RT7 RT6 RT5 RT4 RT3 RT2 RT1 RT16 RT15 RT14 RT13 RT12 RT11 RT6 RT5 RT4 RT3 RT Clock Count RT2 RT Clock Reset RT Clock Figure 10-24. Start Bit Search Example 3 Figure 10-25 shows the effect of noise early in the start bit time. Although this noise does not affect proper synchronization with the start bit time, it does set the noise flag. Perceived and Actual Start Bit LSB 1 1 RT1 RT1 RT1 RT1 1 1 1 0 RT1 1 RT1 1 RT1 1 RT1 1 RT1 Samples RT1 RXD 1 0 RT3 RT2 RT1 RT16 RT15 RT14 RT13 RT12 RT11 RT9 RT10 RT8 RT7 RT6 RT5 RT4 RT3 RT Clock Count RT2 RT Clock Reset RT Clock Figure 10-25. Start Bit Search Example 4 MC9S12VR Family Reference Manual, Rev. 4.2 352 NXP Semiconductor Serial Communication Interface (S12SCIV6) Figure 10-26 shows a burst of noise near the beginning of the start bit that resets the RT clock. The sample after the reset is low but is not preceded by three high samples that would qualify as a falling edge. Depending on the timing of the start bit search and on the data, the frame may be missed entirely or it may set the framing error flag. Start Bit 1 0 0 0 0 0 0 0 0 RT1 RT1 1 RT1 RT1 0 RT1 RT1 0 RT1 RT1 1 RT1 RT1 1 RT1 RT1 1 RT1 1 RT7 1 RT1 1 RT1 1 RT1 1 RT1 1 RT1 Samples LSB No Start Bit Found RXD RT1 RT1 RT1 RT1 RT6 RT5 RT4 RT3 RT Clock Count RT2 RT Clock Reset RT Clock Figure 10-26. Start Bit Search Example 5 In Figure 10-27, a noise burst makes the majority of data samples RT8, RT9, and RT10 high. This sets the noise flag but does not reset the RT clock. In start bits only, the RT8, RT9, and RT10 data samples are ignored. Start Bit LSB RT1 RT1 1 0 0 0 0 1 0 1 RT10 RT1 1 RT9 RT1 1 RT8 1 RT7 1 RT1 1 RT1 1 RT1 1 RT1 1 RT1 Samples RT1 RXD RT3 RT2 RT1 RT16 RT15 RT14 RT13 RT12 RT11 RT6 RT5 RT4 RT3 RT Clock Count RT2 RT Clock Reset RT Clock Figure 10-27. Start Bit Search Example 6 10.4.6.4 Framing Errors If the data recovery logic does not detect a logic 1 where the stop bit should be in an incoming frame, it sets the framing error flag, FE, in SCI status register 1 (SCISR1). A break character also sets the FE flag because a break character has no stop bit. The FE flag is set at the same time that the RDRF flag is set. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 353 Serial Communication Interface (S12SCIV6) 10.4.6.5 Baud Rate Tolerance A transmitting device may be operating at a baud rate below or above the receiver baud rate. Accumulated bit time misalignment can cause one of the three stop bit data samples (RT8, RT9, and RT10) to fall outside the actual stop bit. A noise error will occur if the RT8, RT9, and RT10 samples are not all the same logical values. A framing error will occur if the receiver clock is misaligned in such a way that the majority of the RT8, RT9, and RT10 stop bit samples are a logic zero. As the receiver samples an incoming frame, it re-synchronizes the RT clock on any valid falling edge within the frame. Re synchronization within frames will correct a misalignment between transmitter bit times and receiver bit times. 10.4.6.5.1 Slow Data Tolerance Figure 10-28 shows how much a slow received frame can be misaligned without causing a noise error or a framing error. The slow stop bit begins at RT8 instead of RT1 but arrives in time for the stop bit data samples at RT8, RT9, and RT10. MSB Stop RT16 RT15 RT14 RT13 RT12 RT11 RT10 RT9 RT8 RT7 RT6 RT5 RT4 RT3 RT2 RT1 Receiver RT Clock Data Samples Figure 10-28. Slow Data Let’s take RTr as receiver RT clock and RTt as transmitter RT clock. For an 8-bit data character, it takes the receiver 9 bit times x 16 RTr cycles +7 RTr cycles = 151 RTr cycles to start data sampling of the stop bit. With the misaligned character shown in Figure 10-28, the receiver counts 151 RTr cycles at the point when the count of the transmitting device is 9 bit times x 16 RTt cycles = 144 RTt cycles. The maximum percent difference between the receiver count and the transmitter count of a slow 8-bit data character with no errors is: ((151 – 144) / 151) x 100 = 4.63% For a 9-bit data character, it takes the receiver 10 bit times x 16 RTr cycles + 7 RTr cycles = 167 RTr cycles to start data sampling of the stop bit. With the misaligned character shown in Figure 10-28, the receiver counts 167 RTr cycles at the point when the count of the transmitting device is 10 bit times x 16 RTt cycles = 160 RTt cycles. The maximum percent difference between the receiver count and the transmitter count of a slow 9-bit character with no errors is: ((167 – 160) / 167) X 100 = 4.19% MC9S12VR Family Reference Manual, Rev. 4.2 354 NXP Semiconductor Serial Communication Interface (S12SCIV6) 10.4.6.5.2 Fast Data Tolerance Figure 10-29 shows how much a fast received frame can be misaligned. The fast stop bit ends at RT10 instead of RT16 but is still sampled at RT8, RT9, and RT10. Stop Idle or Next Frame RT16 RT15 RT14 RT13 RT12 RT11 RT10 RT9 RT8 RT7 RT6 RT5 RT4 RT3 RT2 RT1 Receiver RT Clock Data Samples Figure 10-29. Fast Data For an 8-bit data character, it takes the receiver 9 bit times x 16 RTr cycles + 9 RTr cycles = 153 RTr cycles to finish data sampling of the stop bit. With the misaligned character shown in Figure 10-29, the receiver counts 153 RTr cycles at the point when the count of the transmitting device is 10 bit times x 16 RTt cycles = 160 RTt cycles. The maximum percent difference between the receiver count and the transmitter count of a fast 8-bit character with no errors is: ((160 – 153) / 160) x 100 = 4.375% For a 9-bit data character, it takes the receiver 10 bit times x 16 RTr cycles + 9 RTr cycles = 169 RTr cycles to finish data sampling of the stop bit. With the misaligned character shown in Figure 10-29, the receiver counts 169 RTr cycles at the point when the count of the transmitting device is 11 bit times x 16 RTt cycles = 176 RTt cycles. The maximum percent difference between the receiver count and the transmitter count of a fast 9-bit character with no errors is: ((176 – 169) /176) x 100 = 3.98% NOTE Due to asynchronous sample and internal logic, there is maximal 2 bus cycles between startbit edge and 1st RT clock, and cause to additional tolerance loss at worst case. The loss should be 2/SBR/10*100%, it is small.For example, for highspeed baud=230400 with 25MHz bus, SBR should be 109, and the tolerance loss is 2/109/10*100=0.18%, and fast data tolerance is 4.375%-0.18%=4.195%. 10.4.6.6 Receiver Wakeup To enable the SCI to ignore transmissions intended only for other receivers in multiple-receiver systems, the receiver can be put into a standby state. Setting the receiver wakeup bit, RWU, in SCI control register 2 (SCICR2) puts the receiver into standby state during which receiver interrupts are disabled.The SCI will still load the receive data into the SCIDRH/L registers, but it will not set the RDRF flag. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 355 Serial Communication Interface (S12SCIV6) The transmitting device can address messages to selected receivers by including addressing information in the initial frame or frames of each message. The WAKE bit in SCI control register 1 (SCICR1) determines how the SCI is brought out of the standby state to process an incoming message. The WAKE bit enables either idle line wakeup or address mark wakeup. 10.4.6.6.1 Idle Input line Wakeup (WAKE = 0) In this wakeup method, an idle condition on the RXD pin clears the RWU bit and wakes up the SCI. The initial frame or frames of every message contain addressing information. All receivers evaluate the addressing information, and receivers for which the message is addressed process the frames that follow. Any receiver for which a message is not addressed can set its RWU bit and return to the standby state. The RWU bit remains set and the receiver remains on standby until another idle character appears on the RXD pin. Idle line wakeup requires that messages be separated by at least one idle character and that no message contains idle characters. The idle character that wakes a receiver does not set the receiver idle bit, IDLE, or the receive data register full flag, RDRF. The idle line type bit, ILT, determines whether the receiver begins counting logic 1s as idle character bits after the start bit or after the stop bit. ILT is in SCI control register 1 (SCICR1). 10.4.6.6.2 Address Mark Wakeup (WAKE = 1) In this wakeup method, a logic 1 in the most significant bit (MSB) position of a frame clears the RWU bit and wakes up the SCI. The logic 1 in the MSB position marks a frame as an address frame that contains addressing information. All receivers evaluate the addressing information, and the receivers for which the message is addressed process the frames that follow.Any receiver for which a message is not addressed can set its RWU bit and return to the standby state. The RWU bit remains set and the receiver remains on standby until another address frame appears on the RXD pin. The logic 1 MSB of an address frame clears the receiver’s RWU bit before the stop bit is received and sets the RDRF flag. Address mark wakeup allows messages to contain idle characters but requires that the MSB be reserved for use in address frames. NOTE With the WAKE bit clear, setting the RWU bit after the RXD pin has been idle can cause the receiver to wake up immediately. 10.4.7 Single-Wire Operation Normally, the SCI uses two pins for transmitting and receiving. In single-wire operation, the RXD pin is disconnected from the SCI. The SCI uses the TXD pin for both receiving and transmitting. MC9S12VR Family Reference Manual, Rev. 4.2 356 NXP Semiconductor Serial Communication Interface (S12SCIV6) Transmitter Receiver TXD RXD Figure 10-30. Single-Wire Operation (LOOPS = 1, RSRC = 1) Enable single-wire operation by setting the LOOPS bit and the receiver source bit, RSRC, in SCI control register 1 (SCICR1). Setting the LOOPS bit disables the path from the RXD pin to the receiver. Setting the RSRC bit connects the TXD pin to the receiver. Both the transmitter and receiver must be enabled (TE = 1 and RE = 1).The TXDIR bit (SCISR2[1]) determines whether the TXD pin is going to be used as an input (TXDIR = 0) or an output (TXDIR = 1) in this mode of operation. NOTE In single-wire operation data from the TXD pin is inverted if RXPOL is set. 10.4.8 Loop Operation In loop operation the transmitter output goes to the receiver input. The RXD pin is disconnected from the SCI. Transmitter TXD Receiver RXD Figure 10-31. Loop Operation (LOOPS = 1, RSRC = 0) Enable loop operation by setting the LOOPS bit and clearing the RSRC bit in SCI control register 1 (SCICR1). Setting the LOOPS bit disables the path from the RXD pin to the receiver. Clearing the RSRC bit connects the transmitter output to the receiver input. Both the transmitter and receiver must be enabled (TE = 1 and RE = 1). NOTE In loop operation data from the transmitter is not recognized by the receiver if RXPOL and TXPOL are not the same. 10.5 10.5.1 Initialization/Application Information Reset Initialization See Section 10.3.2, “Register Descriptions”. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 357 Serial Communication Interface (S12SCIV6) 10.5.2 10.5.2.1 Modes of Operation Run Mode Normal mode of operation. To initialize a SCI transmission, see Section 10.4.5.2, “Character Transmission”. 10.5.2.2 Wait Mode SCI operation in wait mode depends on the state of the SCISWAI bit in the SCI control register 1 (SCICR1). • If SCISWAI is clear, the SCI operates normally when the CPU is in wait mode. • If SCISWAI is set, SCI clock generation ceases and the SCI module enters a power-conservation state when the CPU is in wait mode. Setting SCISWAI does not affect the state of the receiver enable bit, RE, or the transmitter enable bit, TE. If SCISWAI is set, any transmission or reception in progress stops at wait mode entry. The transmission or reception resumes when either an internal or external interrupt brings the CPU out of wait mode. Exiting wait mode by reset aborts any transmission or reception in progress and resets the SCI. 10.5.2.3 Stop Mode The SCI is inactive during stop mode for reduced power consumption. The STOP instruction does not affect the SCI register states, but the SCI bus clock will be disabled. The SCI operation resumes from where it left off after an external interrupt brings the CPU out of stop mode. Exiting stop mode by reset aborts any transmission or reception in progress and resets the SCI. The receive input active edge detect circuit is still active in stop mode. An active edge on the receive input can be used to bring the CPU out of stop mode. 10.5.3 Interrupt Operation This section describes the interrupt originated by the SCI block.The MCU must service the interrupt requests. Table 10-20 lists the eight interrupt sources of the SCI. Table 10-20. SCI Interrupt Sources Interrupt Source Local Enable Description TDRE SCISR1[7] TIE Active high level. Indicates that a byte was transferred from SCIDRH/L to the transmit shift register. TC SCISR1[6] TCIE RDRF SCISR1[5] RIE OR SCISR1[3] IDLE SCISR1[4] Active high level. Indicates that a transmit is complete. Active high level. The RDRF interrupt indicates that received data is available in the SCI data register. Active high level. This interrupt indicates that an overrun condition has occurred. ILIE Active high level. Indicates that receiver input has become idle. MC9S12VR Family Reference Manual, Rev. 4.2 358 NXP Semiconductor Serial Communication Interface (S12SCIV6) Table 10-20. SCI Interrupt Sources RXEDGIF SCIASR1[7] RXEDGIE Active high level. Indicates that an active edge (falling for RXPOL = 0, rising for RXPOL = 1) was detected. BERRIF SCIASR1[1] BERRIE Active high level. Indicates that a mismatch between transmitted and received data in a single wire application has happened. BKDIF SCIASR1[0] BRKDIE Active high level. Indicates that a break character has been received. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 359 Serial Communication Interface (S12SCIV6) 10.5.3.1 Description of Interrupt Operation The SCI only originates interrupt requests. The following is a description of how the SCI makes a request and how the MCU should acknowledge that request. The interrupt vector offset and interrupt number are chip dependent. The SCI only has a single interrupt line (SCI Interrupt Signal, active high operation) and all the following interrupts, when generated, are ORed together and issued through that port. 10.5.3.1.1 TDRE Description The TDRE interrupt is set high by the SCI when the transmit shift register receives a byte from the SCI data register. A TDRE interrupt indicates that the transmit data register (SCIDRH/L) is empty and that a new byte can be written to the SCIDRH/L for transmission.Clear TDRE by reading SCI status register 1 with TDRE set and then writing to SCI data register low (SCIDRL). 10.5.3.1.2 TC Description The TC interrupt is set by the SCI when a transmission has been completed. Transmission is completed when all bits including the stop bit (if transmitted) have been shifted out and no data is queued to be transmitted. No stop bit is transmitted when sending a break character and the TC flag is set (providing there is no more data queued for transmission) when the break character has been shifted out. A TC interrupt indicates that there is no transmission in progress. TC is set high when the TDRE flag is set and no data, preamble, or break character is being transmitted. When TC is set, the TXD pin becomes idle (logic 1). Clear TC by reading SCI status register 1 (SCISR1) with TC set and then writing to SCI data register low (SCIDRL).TC is cleared automatically when data, preamble, or break is queued and ready to be sent. 10.5.3.1.3 RDRF Description The RDRF interrupt is set when the data in the receive shift register transfers to the SCI data register. A RDRF interrupt indicates that the received data has been transferred to the SCI data register and that the byte can now be read by the MCU. The RDRF interrupt is cleared by reading the SCI status register one (SCISR1) and then reading SCI data register low (SCIDRL). 10.5.3.1.4 OR Description The OR interrupt is set when software fails to read the SCI data register before the receive shift register receives the next frame. The newly acquired data in the shift register will be lost in this case, but the data already in the SCI data registers is not affected. The OR interrupt is cleared by reading the SCI status register one (SCISR1) and then reading SCI data register low (SCIDRL). 10.5.3.1.5 IDLE Description The IDLE interrupt is set when 10 consecutive logic 1s (if M = 0) or 11 consecutive logic 1s (if M = 1) appear on the receiver input. Once the IDLE is cleared, a valid frame must again set the RDRF flag before an idle condition can set the IDLE flag. Clear IDLE by reading SCI status register 1 (SCISR1) with IDLE set and then reading SCI data register low (SCIDRL). MC9S12VR Family Reference Manual, Rev. 4.2 360 NXP Semiconductor Serial Communication Interface (S12SCIV6) 10.5.3.1.6 RXEDGIF Description The RXEDGIF interrupt is set when an active edge (falling if RXPOL = 0, rising if RXPOL = 1) on the RXD pin is detected. Clear RXEDGIF by writing a “1” to the SCIASR1 SCI alternative status register 1. 10.5.3.1.7 BERRIF Description The BERRIF interrupt is set when a mismatch between the transmitted and the received data in a single wire application like LIN was detected. Clear BERRIF by writing a “1” to the SCIASR1 SCI alternative status register 1. This flag is also cleared if the bit error detect feature is disabled. 10.5.3.1.8 BKDIF Description The BKDIF interrupt is set when a break signal was received. Clear BKDIF by writing a “1” to the SCIASR1 SCI alternative status register 1. This flag is also cleared if break detect feature is disabled. 10.5.4 Recovery from Wait Mode The SCI interrupt request can be used to bring the CPU out of wait mode. 10.5.5 Recovery from Stop Mode An active edge on the receive input can be used to bring the CPU out of stop mode. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 361 Serial Communication Interface (S12SCIV6) MC9S12VR Family Reference Manual, Rev. 4.2 362 NXP Semiconductor Chapter 11 Serial Peripheral Interface (S12SPIV5) for S12VR64 Table 11-1. Revision History Revision Number Revision Date Sections Affected V05.00 24 Mar 2005 11.3.2/11-367 11.1 Description of Changes - Added 16-bit transfer width feature. Introduction The SPI module allows a duplex, synchronous, serial communication between the MCU and peripheral devices. Software can poll the SPI status flags or the SPI operation can be interrupt driven. 11.1.1 Glossary of Terms SPI Serial Peripheral Interface SS Slave Select SCK Serial Clock MOSI Master Output, Slave Input MISO Master Input, Slave Output MOMI Master Output, Master Input SISO 11.1.2 Slave Input, Slave Output Features The SPI includes these distinctive features: • Master mode and slave mode • Selectable 8 or 16-bit transfer width • Bidirectional mode • Slave select output • Mode fault error flag with CPU interrupt capability • Double-buffered data register • Serial clock with programmable polarity and phase • Control of SPI operation during wait mode 11.1.3 Modes of Operation The SPI functions in three modes: run, wait, and stop. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 363 Serial Peripheral Interface (S12SPIV5) for S12VR64 • • • Run mode This is the basic mode of operation. Wait mode SPI operation in wait mode is a configurable low power mode, controlled by the SPISWAI bit located in the SPICR2 register. In wait mode, if the SPISWAI bit is clear, the SPI operates like in run mode. If the SPISWAI bit is set, the SPI goes into a power conservative state, with the SPI clock generation turned off. If the SPI is configured as a master, any transmission in progress stops, but is resumed after CPU goes into run mode. If the SPI is configured as a slave, reception and transmission of data continues, so that the slave stays synchronized to the master. Stop mode The SPI is inactive in stop mode for reduced power consumption. If the SPI is configured as a master, any transmission in progress stops, but is resumed after CPU goes into run mode. If the SPI is configured as a slave, reception and transmission of data continues, so that the slave stays synchronized to the master. For a detailed description of operating modes, please refer to Section 11.4.7, “Low Power Mode Options”. 11.1.4 Block Diagram Figure 11-1 gives an overview on the SPI architecture. The main parts of the SPI are status, control and data registers, shifter logic, baud rate generator, master/slave control logic, and port control logic. MC9S12VR Family Reference Manual, Rev. 4.2 364 NXP Semiconductor Serial Peripheral Interface (S12SPIV5) for S12VR64 SPI 2 SPI Control Register 1 BIDIROE 2 SPI Control Register 2 SPC0 SPI Status Register SPIF MODF SPTEF Slave Control Interrupt Control CPOL Slave Baud Rate SPI Interrupt Request Master Baud Rate Baud Rate Generator CPHA Phase + Polarity Control Phase + Polarity Control SCK In MISO SCK Out Port Control Logic Master Control Counter Bus Clock Prescaler SPPR 3 Clock Select SPR MOSI SCK SS Baud Rate 3 Shift Clock Sample Clock Shifter SPI Baud Rate Register Data In LSBFE=1 LSBFE=0 MSB SPI Data Register LSBFE=0 LSBFE=1 LSBFE=0 LSB LSBFE=1 Data Out Figure 11-1. SPI Block Diagram 11.2 External Signal Description This section lists the name and description of all ports including inputs and outputs that do, or may, connect off chip. The SPI module has a total of four external pins. 11.2.1 MOSI — Master Out/Slave In Pin This pin is used to transmit data out of the SPI module when it is configured as a master and receive data when it is configured as slave. 11.2.2 MISO — Master In/Slave Out Pin This pin is used to transmit data out of the SPI module when it is configured as a slave and receive data when it is configured as master. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 365 Serial Peripheral Interface (S12SPIV5) for S12VR64 11.2.3 SS — Slave Select Pin This pin is used to output the select signal from the SPI module to another peripheral with which a data transfer is to take place when it is configured as a master and it is used as an input to receive the slave select signal when the SPI is configured as slave. 11.2.4 SCK — Serial Clock Pin In master mode, this is the synchronous output clock. In slave mode, this is the synchronous input clock. 11.3 Memory Map and Register Definition This section provides a detailed description of address space and registers used by the SPI. 11.3.1 Module Memory Map The memory map for the SPI is given in Figure 11-2. The address listed for each register is the sum of a base address and an address offset. The base address is defined at the SoC level and the address offset is defined at the module level. Reads from the reserved bits return zeros and writes to the reserved bits have no effect. Register Name Bit 7 6 5 4 3 2 1 Bit 0 SPIE SPE SPTIE MSTR CPOL CPHA SSOE LSBFE MODFEN BIDIROE SPISWAI SPC0 SPR2 SPR1 SPR0 SPICR1 R W SPICR2 R W 0 SPIBR R W 0 SPISR R W SPIDRH XFRW 0 0 0 SPPR2 SPPR1 SPPR0 SPIF 0 SPTEF MODF 0 0 0 0 R W R15 T15 R14 T14 R13 T13 R12 T12 R11 T11 R10 T10 R9 T9 R8 T8 SPIDRL R W R7 T7 R6 T6 R5 T5 R4 T4 R3 T3 R2 T2 R1 T1 R0 T0 Reserved R W Reserved R W = Unimplemented or Reserved Figure 11-2. SPI Register Summary MC9S12VR Family Reference Manual, Rev. 4.2 366 NXP Semiconductor Serial Peripheral Interface (S12SPIV5) for S12VR64 11.3.2 Register Descriptions This section consists of register descriptions in address order. Each description includes a standard register diagram with an associated figure number. Details of register bit and field function follow the register diagrams, in bit order. 11.3.2.1 R W Reset SPI Control Register 1 (SPICR1) 7 6 5 4 3 2 1 0 SPIE SPE SPTIE MSTR CPOL CPHA SSOE LSBFE 0 0 0 0 0 1 0 0 Figure 11-3. SPI Control Register 1 (SPICR1) Read: Anytime Write: Anytime Table 11-2. SPICR1 Field Descriptions Field Description 7 SPIE SPI Interrupt Enable Bit — This bit enables SPI interrupt requests, if SPIF or MODF status flag is set. 0 SPI interrupts disabled. 1 SPI interrupts enabled. 6 SPE SPI System Enable Bit — This bit enables the SPI system and dedicates the SPI port pins to SPI system functions. If SPE is cleared, SPI is disabled and forced into idle state, status bits in SPISR register are reset. 0 SPI disabled (lower power consumption). 1 SPI enabled, port pins are dedicated to SPI functions. 5 SPTIE SPI Transmit Interrupt Enable — This bit enables SPI interrupt requests, if SPTEF flag is set. 0 SPTEF interrupt disabled. 1 SPTEF interrupt enabled. 4 MSTR SPI Master/Slave Mode Select Bit — This bit selects whether the SPI operates in master or slave mode. Switching the SPI from master to slave or vice versa forces the SPI system into idle state. 0 SPI is in slave mode. 1 SPI is in master mode. 3 CPOL SPI Clock Polarity Bit — This bit selects an inverted or non-inverted SPI clock. To transmit data between SPI modules, the SPI modules must have identical CPOL values. In master mode, a change of this bit will abort a transmission in progress and force the SPI system into idle state. 0 Active-high clocks selected. In idle state SCK is low. 1 Active-low clocks selected. In idle state SCK is high. 2 CPHA SPI Clock Phase Bit — This bit is used to select the SPI clock format. In master mode, a change of this bit will abort a transmission in progress and force the SPI system into idle state. 0 Sampling of data occurs at odd edges (1,3,5,...) of the SCK clock. 1 Sampling of data occurs at even edges (2,4,6,...) of the SCK clock. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 367 Serial Peripheral Interface (S12SPIV5) for S12VR64 Table 11-2. SPICR1 Field Descriptions (continued) Field Description 1 SSOE Slave Select Output Enable — The SS output feature is enabled only in master mode, if MODFEN is set, by asserting the SSOE as shown in Table 11-3. In master mode, a change of this bit will abort a transmission in progress and force the SPI system into idle state. 0 LSBFE LSB-First Enable — This bit does not affect the position of the MSB and LSB in the data register. Reads and writes of the data register always have the MSB in the highest bit position. In master mode, a change of this bit will abort a transmission in progress and force the SPI system into idle state. 0 Data is transferred most significant bit first. 1 Data is transferred least significant bit first. Table 11-3. SS Input / Output Selection MODFEN 11.3.2.2 0 W Reset Master Mode Slave Mode 0 0 SS not used by SPI SS input 0 1 SS not used by SPI SS input 1 0 SS input with MODF feature SS input 1 1 SS is slave select output SS input SPI Control Register 2 (SPICR2) 7 R SSOE 0 6 XFRW 0 5 0 0 4 3 MODFEN BIDIROE 0 0 2 0 0 1 0 SPISWAI SPC0 0 0 = Unimplemented or Reserved Figure 11-4. SPI Control Register 2 (SPICR2) Read: Anytime Write: Anytime; writes to the reserved bits have no effect MC9S12VR Family Reference Manual, Rev. 4.2 368 NXP Semiconductor Serial Peripheral Interface (S12SPIV5) for S12VR64 Table 11-4. SPICR2 Field Descriptions Field Description 6 XFRW Transfer Width — This bit is used for selecting the data transfer width. If 8-bit transfer width is selected, SPIDRL becomes the dedicated data register and SPIDRH is unused. If 16-bit transfer width is selected, SPIDRH and SPIDRL form a 16-bit data register. Please refer to Section 11.3.2.4, “SPI Status Register (SPISR) for information about transmit/receive data handling and the interrupt flag clearing mechanism. In master mode, a change of this bit will abort a transmission in progress and force the SPI system into idle state. 0 8-bit Transfer Width (n = 8)1 1 16-bit Transfer Width (n = 16)1 4 MODFEN Mode Fault Enable Bit — This bit allows the MODF failure to be detected. If the SPI is in master mode and MODFEN is cleared, then the SS port pin is not used by the SPI. In slave mode, the SS is available only as an input regardless of the value of MODFEN. For an overview on the impact of the MODFEN bit on the SS port pin configuration, refer to Table 11-3. In master mode, a change of this bit will abort a transmission in progress and force the SPI system into idle state. 0 SS port pin is not used by the SPI. 1 SS port pin with MODF feature. 3 BIDIROE Output Enable in the Bidirectional Mode of Operation — This bit controls the MOSI and MISO output buffer of the SPI, when in bidirectional mode of operation (SPC0 is set). In master mode, this bit controls the output buffer of the MOSI port, in slave mode it controls the output buffer of the MISO port. In master mode, with SPC0 set, a change of this bit will abort a transmission in progress and force the SPI into idle state. 0 Output buffer disabled. 1 Output buffer enabled. 1 SPISWAI SPI Stop in Wait Mode Bit — This bit is used for power conservation while in wait mode. 0 SPI clock operates normally in wait mode. 1 Stop SPI clock generation when in wait mode. 0 SPC0 1 Serial Pin Control Bit 0 — This bit enables bidirectional pin configurations as shown in Table 11-5. In master mode, a change of this bit will abort a transmission in progress and force the SPI system into idle state. n is used later in this document as a placeholder for the selected transfer width. Table 11-5. Bidirectional Pin Configurations Pin Mode SPC0 BIDIROE MISO MOSI Master Mode of Operation Normal 0 Bidirectional 1 X Master In 0 MISO not used by SPI 1 Master Out Master In Master I/O Slave Mode of Operation Normal 0 Bidirectional 1 X Slave Out Slave In 0 Slave In MOSI not used by SPI 1 Slave I/O MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 369 Serial Peripheral Interface (S12SPIV5) for S12VR64 11.3.2.3 SPI Baud Rate Register (SPIBR) 7 R 0 W Reset 0 6 5 4 3 SPPR2 SPPR1 SPPR0 0 0 0 0 0 2 1 0 SPR2 SPR1 SPR0 0 0 0 = Unimplemented or Reserved Figure 11-5. SPI Baud Rate Register (SPIBR) Read: Anytime Write: Anytime; writes to the reserved bits have no effect Table 11-6. SPIBR Field Descriptions Field Description 6–4 SPPR[2:0] SPI Baud Rate Preselection Bits — These bits specify the SPI baud rates as shown in Table 11-7. In master mode, a change of these bits will abort a transmission in progress and force the SPI system into idle state. 2–0 SPR[2:0] SPI Baud Rate Selection Bits — These bits specify the SPI baud rates as shown in Table 11-7. In master mode, a change of these bits will abort a transmission in progress and force the SPI system into idle state. The baud rate divisor equation is as follows: BaudRateDivisor = (SPPR + 1) 2(SPR + 1) Eqn. 11-1 The baud rate can be calculated with the following equation: Baud Rate = BusClock / BaudRateDivisor Eqn. 11-2 NOTE For maximum allowed baud rates, please refer to the SPI Electrical Specification in the Electricals chapter of this data sheet. Table 11-7. Example SPI Baud Rate Selection (25 MHz Bus Clock) (Sheet 1 of 3) SPPR2 SPPR1 SPPR0 SPR2 SPR1 SPR0 Baud Rate Divisor Baud Rate 0 0 0 0 0 0 2 12.5 Mbit/s 0 0 0 0 0 1 4 6.25 Mbit/s 0 0 0 0 1 0 8 3.125 Mbit/s 0 0 0 0 1 1 16 1.5625 Mbit/s 0 0 0 1 0 0 32 781.25 kbit/s 0 0 0 1 0 1 64 390.63 kbit/s 0 0 0 1 1 0 128 195.31 kbit/s 0 0 0 1 1 1 256 97.66 kbit/s 0 0 1 0 0 0 4 6.25 Mbit/s 0 0 1 0 0 1 8 3.125 Mbit/s MC9S12VR Family Reference Manual, Rev. 4.2 370 NXP Semiconductor Serial Peripheral Interface (S12SPIV5) for S12VR64 Table 11-7. Example SPI Baud Rate Selection (25 MHz Bus Clock) (Sheet 2 of 3) SPPR2 SPPR1 SPPR0 SPR2 SPR1 SPR0 Baud Rate Divisor Baud Rate 0 0 1 0 1 0 16 1.5625 Mbit/s 0 0 1 0 1 1 32 781.25 kbit/s 0 0 1 1 0 0 64 390.63 kbit/s 0 0 1 1 0 1 128 195.31 kbit/s 0 0 1 1 1 0 256 97.66 kbit/s 0 0 1 1 1 1 512 48.83 kbit/s 0 1 0 0 0 0 6 4.16667 Mbit/s 0 1 0 0 0 1 12 2.08333 Mbit/s 0 1 0 0 1 0 24 1.04167 Mbit/s 0 1 0 0 1 1 48 520.83 kbit/s 0 1 0 1 0 0 96 260.42 kbit/s 0 1 0 1 0 1 192 130.21 kbit/s 0 1 0 1 1 0 384 65.10 kbit/s 0 1 0 1 1 1 768 32.55 kbit/s 0 1 1 0 0 0 8 3.125 Mbit/s 0 1 1 0 0 1 16 1.5625 Mbit/s 0 1 1 0 1 0 32 781.25 kbit/s 0 1 1 0 1 1 64 390.63 kbit/s 0 1 1 1 0 0 128 195.31 kbit/s 0 1 1 1 0 1 256 97.66 kbit/s 0 1 1 1 1 0 512 48.83 kbit/s 0 1 1 1 1 1 1024 24.41 kbit/s 1 0 0 0 0 0 10 2.5 Mbit/s 1 0 0 0 0 1 20 1.25 Mbit/s 1 0 0 0 1 0 40 625 kbit/s 1 0 0 0 1 1 80 312.5 kbit/s 1 0 0 1 0 0 160 156.25 kbit/s 1 0 0 1 0 1 320 78.13 kbit/s 1 0 0 1 1 0 640 39.06 kbit/s 1 0 0 1 1 1 1280 19.53 kbit/s 1 0 1 0 0 0 12 2.08333 Mbit/s 1 0 1 0 0 1 24 1.04167 Mbit/s 1 0 1 0 1 0 48 520.83 kbit/s 1 0 1 0 1 1 96 260.42 kbit/s 1 0 1 1 0 0 192 130.21 kbit/s 1 0 1 1 0 1 384 65.10 kbit/s 1 0 1 1 1 0 768 32.55 kbit/s 1 0 1 1 1 1 1536 16.28 kbit/s 1 1 0 0 0 0 14 1.78571 Mbit/s 1 1 0 0 0 1 28 892.86 kbit/s 1 1 0 0 1 0 56 446.43 kbit/s 1 1 0 0 1 1 112 223.21 kbit/s MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 371 Serial Peripheral Interface (S12SPIV5) for S12VR64 Table 11-7. Example SPI Baud Rate Selection (25 MHz Bus Clock) (Sheet 3 of 3) SPR2 SPR1 SPR0 Baud Rate Divisor Baud Rate 0 1 0 0 224 111.61 kbit/s 0 1 0 1 448 55.80 kbit/s 1 0 1 1 0 896 27.90 kbit/s 1 0 1 1 1 1792 13.95 kbit/s 1 0 0 0 16 1.5625 Mbit/s 1 0 0 1 32 781.25 kbit/s 1 0 1 0 64 390.63 kbit/s 1 0 1 1 128 195.31 kbit/s 1 1 1 0 0 256 97.66 kbit/s 1 1 1 0 1 512 48.83 kbit/s 1 1 1 1 1 0 1024 24.41 kbit/s 1 1 1 1 1 1 2048 12.21 kbit/s SPPR2 SPPR1 SPPR0 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 11.3.2.4 R SPI Status Register (SPISR) 7 6 5 4 3 2 1 0 SPIF 0 SPTEF MODF 0 0 0 0 0 0 1 0 0 0 0 0 W Reset = Unimplemented or Reserved Figure 11-6. SPI Status Register (SPISR) Read: Anytime Write: Has no effect Table 11-8. SPISR Field Descriptions Field Description 7 SPIF SPIF Interrupt Flag — This bit is set after received data has been transferred into the SPI data register. For information about clearing SPIF Flag, please refer to Table 11-9. 0 Transfer not yet complete. 1 New data copied to SPIDR. 5 SPTEF SPI Transmit Empty Interrupt Flag — If set, this bit indicates that the transmit data register is empty. For information about clearing this bit and placing data into the transmit data register, please refer to Table 11-10. 0 SPI data register not empty. 1 SPI data register empty. 4 MODF Mode Fault Flag — This bit is set if the SS input becomes low while the SPI is configured as a master and mode fault detection is enabled, MODFEN bit of SPICR2 register is set. Refer to MODFEN bit description in Section 11.3.2.2, “SPI Control Register 2 (SPICR2)”. The flag is cleared automatically by a read of the SPI status register (with MODF set) followed by a write to the SPI control register 1. 0 Mode fault has not occurred. 1 Mode fault has occurred. MC9S12VR Family Reference Manual, Rev. 4.2 372 NXP Semiconductor Serial Peripheral Interface (S12SPIV5) for S12VR64 Table 11-9. SPIF Interrupt Flag Clearing Sequence XFRW Bit SPIF Interrupt Flag Clearing Sequence 0 Read SPISR with SPIF == 1 1 Read SPISR with SPIF == 1 then Read SPIDRL Byte Read SPIDRL 1 or then Byte Read SPIDRH 2 Byte Read SPIDRL or Word Read (SPIDRH:SPIDRL) 1 2 Data in SPIDRH is lost in this case. SPIDRH can be read repeatedly without any effect on SPIF. SPIF Flag is cleared only by the read of SPIDRL after reading SPISR with SPIF == 1. Table 11-10. SPTEF Interrupt Flag Clearing Sequence XFRW Bit SPTEF Interrupt Flag Clearing Sequence 0 Read SPISR with SPTEF == 1 1 Read SPISR with SPTEF == 1 then Write to SPIDRL 1 Byte Write to SPIDRL 12 or then Byte Write to SPIDRH 13 Byte Write to SPIDRL 1 or Word Write to (SPIDRH:SPIDRL) 1 1 Any write to SPIDRH or SPIDRL with SPTEF == 0 is effectively ignored. Data in SPIDRH is undefined in this case. 3 SPIDRH can be written repeatedly without any effect on SPTEF. SPTEF Flag is cleared only by writing to SPIDRL after reading SPISR with SPTEF == 1. 2 MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 373 Serial Peripheral Interface (S12SPIV5) for S12VR64 11.3.2.5 SPI Data Register (SPIDR = SPIDRH:SPIDRL) 7 6 5 4 3 2 1 0 R R15 R14 R13 R12 R11 R10 R9 R8 W T15 T14 T13 T12 T11 T10 T9 T8 0 0 0 0 0 0 0 0 Reset Figure 11-7. SPI Data Register High (SPIDRH) 7 6 5 4 3 2 1 0 R R7 R6 R5 R4 R3 R2 R1 R0 W T7 T6 T5 T4 T3 T2 T1 T0 0 0 0 0 0 0 0 0 Reset Figure 11-8. SPI Data Register Low (SPIDRL) Read: Anytime; read data only valid when SPIF is set Write: Anytime The SPI data register is both the input and output register for SPI data. A write to this register allows data to be queued and transmitted. For an SPI configured as a master, queued data is transmitted immediately after the previous transmission has completed. The SPI transmitter empty flag SPTEF in the SPISR register indicates when the SPI data register is ready to accept new data. Received data in the SPIDR is valid when SPIF is set. If SPIF is cleared and data has been received, the received data is transferred from the receive shift register to the SPIDR and SPIF is set. If SPIF is set and not serviced, and a second data value has been received, the second received data is kept as valid data in the receive shift register until the start of another transmission. The data in the SPIDR does not change. If SPIF is set and valid data is in the receive shift register, and SPIF is serviced before the start of a third transmission, the data in the receive shift register is transferred into the SPIDR and SPIF remains set (see Figure 11-9). If SPIF is set and valid data is in the receive shift register, and SPIF is serviced after the start of a third transmission, the data in the receive shift register has become invalid and is not transferred into the SPIDR (see Figure 11-10). MC9S12VR Family Reference Manual, Rev. 4.2 374 NXP Semiconductor Serial Peripheral Interface (S12SPIV5) for S12VR64 Data A Received Data B Received Data C Received SPIF Serviced Receive Shift Register Data B Data A Data C SPIF SPI Data Register = Unspecified Data C Data B Data A = Reception in progress Figure 11-9. Reception with SPIF serviced in Time Data A Received Data B Received Data B Lost Data C Received SPIF Serviced Receive Shift Register Data B Data A Data C SPIF SPI Data Register Data A = Unspecified Data C = Reception in progress Figure 11-10. Reception with SPIF serviced too late 11.4 Functional Description The SPI module allows a duplex, synchronous, serial communication between the MCU and peripheral devices. Software can poll the SPI status flags or SPI operation can be interrupt driven. The SPI system is enabled by setting the SPI enable (SPE) bit in SPI control register 1. While SPE is set, the four associated SPI port pins are dedicated to the SPI function as: • Slave select (SS) • Serial clock (SCK) • Master out/slave in (MOSI) • Master in/slave out (MISO) MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 375 Serial Peripheral Interface (S12SPIV5) for S12VR64 The main element of the SPI system is the SPI data register. The n-bit1 data register in the master and the n-bit1 data register in the slave are linked by the MOSI and MISO pins to form a distributed 2n-bit1 register. When a data transfer operation is performed, this 2n-bit1 register is serially shifted n1 bit positions by the S-clock from the master, so data is exchanged between the master and the slave. Data written to the master SPI data register becomes the output data for the slave, and data read from the master SPI data register after a transfer operation is the input data from the slave. A read of SPISR with SPTEF = 1 followed by a write to SPIDR puts data into the transmit data register. When a transfer is complete and SPIF is cleared, received data is moved into the receive data register. This data register acts as the SPI receive data register for reads and as the SPI transmit data register for writes. A common SPI data register address is shared for reading data from the read data buffer and for writing data to the transmit data register. The clock phase control bit (CPHA) and a clock polarity control bit (CPOL) in the SPI control register 1 (SPICR1) select one of four possible clock formats to be used by the SPI system. The CPOL bit simply selects a non-inverted or inverted clock. The CPHA bit is used to accommodate two fundamentally different protocols by sampling data on odd numbered SCK edges or on even numbered SCK edges (see Section 11.4.3, “Transmission Formats”). The SPI can be configured to operate as a master or as a slave. When the MSTR bit in SPI control register1 is set, master mode is selected, when the MSTR bit is clear, slave mode is selected. NOTE A change of CPOL or MSTR bit while there is a received byte pending in the receive shift register will destroy the received byte and must be avoided. 11.4.1 Master Mode The SPI operates in master mode when the MSTR bit is set. Only a master SPI module can initiate transmissions. A transmission begins by writing to the master SPI data register. If the shift register is empty, data immediately transfers to the shift register. Data begins shifting out on the MOSI pin under the control of the serial clock. • Serial clock The SPR2, SPR1, and SPR0 baud rate selection bits, in conjunction with the SPPR2, SPPR1, and SPPR0 baud rate preselection bits in the SPI baud rate register, control the baud rate generator and determine the speed of the transmission. The SCK pin is the SPI clock output. Through the SCK pin, the baud rate generator of the master controls the shift register of the slave peripheral. • MOSI, MISO pin In master mode, the function of the serial data output pin (MOSI) and the serial data input pin (MISO) is determined by the SPC0 and BIDIROE control bits. • SS pin If MODFEN and SSOE are set, the SS pin is configured as slave select output. The SS output becomes low during each transmission and is high when the SPI is in idle state. 1. n depends on the selected transfer width, please refer to Section 11.3.2.2, “SPI Control Register 2 (SPICR2) MC9S12VR Family Reference Manual, Rev. 4.2 376 NXP Semiconductor Serial Peripheral Interface (S12SPIV5) for S12VR64 If MODFEN is set and SSOE is cleared, the SS pin is configured as input for detecting mode fault error. If the SS input becomes low this indicates a mode fault error where another master tries to drive the MOSI and SCK lines. In this case, the SPI immediately switches to slave mode, by clearing the MSTR bit and also disables the slave output buffer MISO (or SISO in bidirectional mode). So the result is that all outputs are disabled and SCK, MOSI, and MISO are inputs. If a transmission is in progress when the mode fault occurs, the transmission is aborted and the SPI is forced into idle state. This mode fault error also sets the mode fault (MODF) flag in the SPI status register (SPISR). If the SPI interrupt enable bit (SPIE) is set when the MODF flag becomes set, then an SPI interrupt sequence is also requested. When a write to the SPI data register in the master occurs, there is a half SCK-cycle delay. After the delay, SCK is started within the master. The rest of the transfer operation differs slightly, depending on the clock format specified by the SPI clock phase bit, CPHA, in SPI control register 1 (see Section 11.4.3, “Transmission Formats”). NOTE A change of the bits CPOL, CPHA, SSOE, LSBFE, XFRW, MODFEN, SPC0, or BIDIROE with SPC0 set, SPPR2-SPPR0 and SPR2-SPR0 in master mode will abort a transmission in progress and force the SPI into idle state. The remote slave cannot detect this, therefore the master must ensure that the remote slave is returned to idle state. 11.4.2 Slave Mode The SPI operates in slave mode when the MSTR bit in SPI control register 1 is clear. • Serial clock In slave mode, SCK is the SPI clock input from the master. • MISO, MOSI pin In slave mode, the function of the serial data output pin (MISO) and serial data input pin (MOSI) is determined by the SPC0 bit and BIDIROE bit in SPI control register 2. • SS pin The SS pin is the slave select input. Before a data transmission occurs, the SS pin of the slave SPI must be low. SS must remain low until the transmission is complete. If SS goes high, the SPI is forced into idle state. The SS input also controls the serial data output pin, if SS is high (not selected), the serial data output pin is high impedance, and, if SS is low, the first bit in the SPI data register is driven out of the serial data output pin. Also, if the slave is not selected (SS is high), then the SCK input is ignored and no internal shifting of the SPI shift register occurs. Although the SPI is capable of duplex operation, some SPI peripherals are capable of only receiving SPI data in a slave mode. For these simpler devices, there is no serial data out pin. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 377 Serial Peripheral Interface (S12SPIV5) for S12VR64 NOTE When peripherals with duplex capability are used, take care not to simultaneously enable two receivers whose serial outputs drive the same system slave’s serial data output line. As long as no more than one slave device drives the system slave’s serial data output line, it is possible for several slaves to receive the same transmission from a master, although the master would not receive return information from all of the receiving slaves. If the CPHA bit in SPI control register 1 is clear, odd numbered edges on the SCK input cause the data at the serial data input pin to be latched. Even numbered edges cause the value previously latched from the serial data input pin to shift into the LSB or MSB of the SPI shift register, depending on the LSBFE bit. If the CPHA bit is set, even numbered edges on the SCK input cause the data at the serial data input pin to be latched. Odd numbered edges cause the value previously latched from the serial data input pin to shift into the LSB or MSB of the SPI shift register, depending on the LSBFE bit. When CPHA is set, the first edge is used to get the first data bit onto the serial data output pin. When CPHA is clear and the SS input is low (slave selected), the first bit of the SPI data is driven out of the serial data output pin. After the nth1 shift, the transfer is considered complete and the received data is transferred into the SPI data register. To indicate transfer is complete, the SPIF flag in the SPI status register is set. NOTE A change of the bits CPOL, CPHA, SSOE, LSBFE, MODFEN, SPC0, or BIDIROE with SPC0 set in slave mode will corrupt a transmission in progress and must be avoided. 11.4.3 Transmission Formats During an SPI transmission, data is transmitted (shifted out serially) and received (shifted in serially) simultaneously. The serial clock (SCK) synchronizes shifting and sampling of the information on the two serial data lines. A slave select line allows selection of an individual slave SPI device; slave devices that are not selected do not interfere with SPI bus activities. Optionally, on a master SPI device, the slave select line can be used to indicate multiple-master bus contention. MASTER SPI SHIFT REGISTER BAUD RATE GENERATOR SLAVE SPI MISO MISO MOSI MOSI SCK SCK SS VDD SHIFT REGISTER SS Figure 11-11. Master/Slave Transfer Block Diagram 1. n depends on the selected transfer width, please refer to Section 11.3.2.2, “SPI Control Register 2 (SPICR2) MC9S12VR Family Reference Manual, Rev. 4.2 378 NXP Semiconductor Serial Peripheral Interface (S12SPIV5) for S12VR64 11.4.3.1 Clock Phase and Polarity Controls Using two bits in the SPI control register 1, software selects one of four combinations of serial clock phase and polarity. The CPOL clock polarity control bit specifies an active high or low clock and has no significant effect on the transmission format. The CPHA clock phase control bit selects one of two fundamentally different transmission formats. Clock phase and polarity should be identical for the master SPI device and the communicating slave device. In some cases, the phase and polarity are changed between transmissions to allow a master device to communicate with peripheral slaves having different requirements. 11.4.3.2 CPHA = 0 Transfer Format The first edge on the SCK line is used to clock the first data bit of the slave into the master and the first data bit of the master into the slave. In some peripherals, the first bit of the slave’s data is available at the slave’s data out pin as soon as the slave is selected. In this format, the first SCK edge is issued a half cycle after SS has become low. A half SCK cycle later, the second edge appears on the SCK line. When this second edge occurs, the value previously latched from the serial data input pin is shifted into the LSB or MSB of the shift register, depending on LSBFE bit. After this second edge, the next bit of the SPI master data is transmitted out of the serial data output pin of the master to the serial input pin on the slave. This process continues for a total of 16 edges on the SCK line, with data being latched on odd numbered edges and shifted on even numbered edges. Data reception is double buffered. Data is shifted serially into the SPI shift register during the transfer and is transferred to the parallel SPI data register after the last bit is shifted in. After 2n1 (last) SCK edges: • Data that was previously in the master SPI data register should now be in the slave data register and the data that was in the slave data register should be in the master. • The SPIF flag in the SPI status register is set, indicating that the transfer is complete. Figure 11-12 is a timing diagram of an SPI transfer where CPHA = 0. SCK waveforms are shown for CPOL = 0 and CPOL = 1. The diagram may be interpreted as a master or slave timing diagram because the SCK, MISO, and MOSI pins are connected directly between the master and the slave. The MISO signal is the output from the slave and the MOSI signal is the output from the master. The SS pin of the master must be either high or reconfigured as a general-purpose output not affecting the SPI. 1. n depends on the selected transfer width, please refer to Section 11.3.2.2, “SPI Control Register 2 (SPICR2) MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 379 Serial Peripheral Interface (S12SPIV5) for S12VR64 End of Idle State Begin 1 SCK Edge Number 2 3 4 5 6 7 8 Begin of Idle State End Transfer 9 10 11 12 13 14 15 16 SCK (CPOL = 0) SCK (CPOL = 1) If next transfer begins here SAMPLE I MOSI/MISO CHANGE O MOSI pin CHANGE O MISO pin SEL SS (O) Master only SEL SS (I) tT tL MSB first (LSBFE = 0): MSB Bit 6 Bit 5 Bit 4 Bit 3 LSB first (LSBFE = 1): LSB Bit 1 Bit 2 Bit 3 Bit 4 tL = Minimum leading time before the first SCK edge tT = Minimum trailing time after the last SCK edge tI = Minimum idling time between transfers (minimum SS high time) tL, tT, and tI are guaranteed for the master mode and required for the slave mode. Bit 2 Bit 5 Bit 1 Bit 6 tI tL LSB Minimum 1/2 SCK for tT, tl, tL MSB Figure 11-12. SPI Clock Format 0 (CPHA = 0), with 8-bit Transfer Width selected (XFRW = 0) MC9S12VR Family Reference Manual, Rev. 4.2 380 NXP Semiconductor Serial Peripheral Interface (S12SPIV5) for S12VR64 End of Idle State SCK Edge Number Begin 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 Begin of Idle State End Transfer 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 SCK (CPOL = 0) SCK (CPOL = 1) If next transfer begins here SAMPLE I MOSI/MISO CHANGE O MOSI pin CHANGE O MISO pin SEL SS (O) Master only SEL SS (I) MSB first (LSBFE = 0) LSB first (LSBFE = 1) tL tT tI tL MSB Bit 14 Bit 13 Bit 12 Bit 11 Bit 10 Bit 9 Bit 8 Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 LSB Minimum 1/2 SCK LSB Bit 1 Bit 2 Bit 3 Bit 4 Bit 5 Bit 6 Bit 7 Bit 8 Bit 9 Bit 10Bit 11 Bit 12Bit 13Bit 14 MSB for tT, tl, tL tL = Minimum leading time before the first SCK edge tT = Minimum trailing time after the last SCK edge tI = Minimum idling time between transfers (minimum SS high time) tL, tT, and tI are guaranteed for the master mode and required for the slave mode. Figure 11-13. SPI Clock Format 0 (CPHA = 0), with 16-Bit Transfer Width selected (XFRW = 1) In slave mode, if the SS line is not deasserted between the successive transmissions then the content of the SPI data register is not transmitted; instead the last received data is transmitted. If the SS line is deasserted for at least minimum idle time (half SCK cycle) between successive transmissions, then the content of the SPI data register is transmitted. In master mode, with slave select output enabled the SS line is always deasserted and reasserted between successive transfers for at least minimum idle time. 11.4.3.3 CPHA = 1 Transfer Format Some peripherals require the first SCK edge before the first data bit becomes available at the data out pin, the second edge clocks data into the system. In this format, the first SCK edge is issued by setting the CPHA bit at the beginning of the n1-cycle transfer operation. The first edge of SCK occurs immediately after the half SCK clock cycle synchronization delay. This first edge commands the slave to transfer its first data bit to the serial data input pin of the master. A half SCK cycle later, the second edge appears on the SCK pin. This is the latching edge for both the master and slave. 1. n depends on the selected transfer width, please refer to Section 11.3.2.2, “SPI Control Register 2 (SPICR2) MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 381 Serial Peripheral Interface (S12SPIV5) for S12VR64 When the third edge occurs, the value previously latched from the serial data input pin is shifted into the LSB or MSB of the SPI shift register, depending on LSBFE bit. After this edge, the next bit of the master data is coupled out of the serial data output pin of the master to the serial input pin on the slave. This process continues for a total of n1 edges on the SCK line with data being latched on even numbered edges and shifting taking place on odd numbered edges. Data reception is double buffered, data is serially shifted into the SPI shift register during the transfer and is transferred to the parallel SPI data register after the last bit is shifted in. After 2n1 SCK edges: • Data that was previously in the SPI data register of the master is now in the data register of the slave, and data that was in the data register of the slave is in the master. • The SPIF flag bit in SPISR is set indicating that the transfer is complete. Figure 11-14 shows two clocking variations for CPHA = 1. The diagram may be interpreted as a master or slave timing diagram because the SCK, MISO, and MOSI pins are connected directly between the master and the slave. The MISO signal is the output from the slave, and the MOSI signal is the output from the master. The SS line is the slave select input to the slave. The SS pin of the master must be either high or reconfigured as a general-purpose output not affecting the SPI. End of Idle State Begin SCK Edge Number 1 2 3 4 End Transfer 5 6 7 8 9 10 11 12 13 14 Begin of Idle State 15 16 SCK (CPOL = 0) SCK (CPOL = 1) If next transfer begins here SAMPLE I MOSI/MISO CHANGE O MOSI pin CHANGE O MISO pin SEL SS (O) Master only SEL SS (I) tT tL MSB first (LSBFE = 0): LSB first (LSBFE = 1): MSB LSB Bit 6 Bit 1 Bit 5 Bit 2 Bit 4 Bit 3 Bit 3 Bit 4 Bit 2 Bit 5 Bit 1 Bit 6 tI tL LSB Minimum 1/2 SCK for tT, tl, tL MSB tL = Minimum leading time before the first SCK edge, not required for back-to-back transfers tT = Minimum trailing time after the last SCK edge tI = Minimum idling time between transfers (minimum SS high time), not required for back-to-back transfers Figure 11-14. SPI Clock Format 1 (CPHA = 1), with 8-Bit Transfer Width selected (XFRW = 0) MC9S12VR Family Reference Manual, Rev. 4.2 382 NXP Semiconductor Serial Peripheral Interface (S12SPIV5) for S12VR64 End of Idle State SCK Edge Number Begin 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 Begin of Idle State End Transfer 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 SCK (CPOL = 0) SCK (CPOL = 1) If next transfer begins here SAMPLE I MOSI/MISO CHANGE O MOSI pin CHANGE O MISO pin SEL SS (O) Master only SEL SS (I) tT tI tL Minimum 1/2 SCK for tT, tl, tL tL MSB first (LSBFE = 0) LSB first (LSBFE = 1) MSB Bit 14 Bit 13 Bit 12 Bit 11 Bit 10 Bit 9 Bit 8 Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 LSB LSB Bit 1 Bit 2 Bit 3 Bit 4 Bit 5 Bit 6 Bit 7 Bit 8 Bit 9 Bit 10Bit 11 Bit 12Bit 13Bit 14 MSB tL = Minimum leading time before the first SCK edge, not required for back-to-back transfers tT = Minimum trailing time after the last SCK edge tI = Minimum idling time between transfers (minimum SS high time), not required for back-to-back transfers Figure 11-15. SPI Clock Format 1 (CPHA = 1), with 16-Bit Transfer Width selected (XFRW = 1) The SS line can remain active low between successive transfers (can be tied low at all times). This format is sometimes preferred in systems having a single fixed master and a single slave that drive the MISO data line. • Back-to-back transfers in master mode In master mode, if a transmission has completed and new data is available in the SPI data register, this data is sent out immediately without a trailing and minimum idle time. The SPI interrupt request flag (SPIF) is common to both the master and slave modes. SPIF gets set one half SCK cycle after the last SCK edge. 11.4.4 SPI Baud Rate Generation Baud rate generation consists of a series of divider stages. Six bits in the SPI baud rate register (SPPR2, SPPR1, SPPR0, SPR2, SPR1, and SPR0) determine the divisor to the SPI module clock which results in the SPI baud rate. The SPI clock rate is determined by the product of the value in the baud rate preselection bits (SPPR2–SPPR0) and the value in the baud rate selection bits (SPR2–SPR0). The module clock divisor equation is shown in Equation 11-3. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 383 Serial Peripheral Interface (S12SPIV5) for S12VR64 BaudRateDivisor = (SPPR + 1) 2(SPR + 1) Eqn. 11-3 When all bits are clear (the default condition), the SPI module clock is divided by 2. When the selection bits (SPR2–SPR0) are 001 and the preselection bits (SPPR2–SPPR0) are 000, the module clock divisor becomes 4. When the selection bits are 010, the module clock divisor becomes 8, etc. When the preselection bits are 001, the divisor determined by the selection bits is multiplied by 2. When the preselection bits are 010, the divisor is multiplied by 3, etc. See Table 11-7 for baud rate calculations for all bit conditions, based on a 25 MHz bus clock. The two sets of selects allows the clock to be divided by a non-power of two to achieve other baud rates such as divide by 6, divide by 10, etc. The baud rate generator is activated only when the SPI is in master mode and a serial transfer is taking place. In the other cases, the divider is disabled to decrease IDD current. NOTE For maximum allowed baud rates, please refer to the SPI Electrical Specification in the Electricals chapter of this data sheet. 11.4.5 11.4.5.1 Special Features SS Output The SS output feature automatically drives the SS pin low during transmission to select external devices and drives it high during idle to deselect external devices. When SS output is selected, the SS output pin is connected to the SS input pin of the external device. The SS output is available only in master mode during normal SPI operation by asserting SSOE and MODFEN bit as shown in Table 11-3. The mode fault feature is disabled while SS output is enabled. NOTE Care must be taken when using the SS output feature in a multimaster system because the mode fault feature is not available for detecting system errors between masters. 11.4.5.2 Bidirectional Mode (MOMI or SISO) The bidirectional mode is selected when the SPC0 bit is set in SPI control register 2 (see Table 11-11). In this mode, the SPI uses only one serial data pin for the interface with external device(s). The MSTR bit decides which pin to use. The MOSI pin becomes the serial data I/O (MOMI) pin for the master mode, and the MISO pin becomes serial data I/O (SISO) pin for the slave mode. The MISO pin in master mode and MOSI pin in slave mode are not used by the SPI. MC9S12VR Family Reference Manual, Rev. 4.2 384 NXP Semiconductor Serial Peripheral Interface (S12SPIV5) for S12VR64 Table 11-11. Normal Mode and Bidirectional Mode When SPE = 1 Master Mode MSTR = 1 Serial Out Normal Mode SPC0 = 0 MOSI MOSI Serial In SPI SPI Serial In Bidirectional Mode SPC0 = 1 Slave Mode MSTR = 0 MISO Serial Out MOMI SPI BIDIROE Serial In Serial Out MISO Serial In SPI BIDIROE Serial Out SISO The direction of each serial I/O pin depends on the BIDIROE bit. If the pin is configured as an output, serial data from the shift register is driven out on the pin. The same pin is also the serial input to the shift register. • The SCK is output for the master mode and input for the slave mode. • The SS is the input or output for the master mode, and it is always the input for the slave mode. • The bidirectional mode does not affect SCK and SS functions. NOTE In bidirectional master mode, with mode fault enabled, both data pins MISO and MOSI can be occupied by the SPI, though MOSI is normally used for transmissions in bidirectional mode and MISO is not used by the SPI. If a mode fault occurs, the SPI is automatically switched to slave mode. In this case MISO becomes occupied by the SPI and MOSI is not used. This must be considered, if the MISO pin is used for another purpose. 11.4.6 Error Conditions The SPI has one error condition: • Mode fault error 11.4.6.1 Mode Fault Error If the SS input becomes low while the SPI is configured as a master, it indicates a system error where more than one master may be trying to drive the MOSI and SCK lines simultaneously. This condition is not permitted in normal operation, the MODF bit in the SPI status register is set automatically, provided the MODFEN bit is set. In the special case where the SPI is in master mode and MODFEN bit is cleared, the SS pin is not used by the SPI. In this special case, the mode fault error function is inhibited and MODF remains cleared. In case MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 385 Serial Peripheral Interface (S12SPIV5) for S12VR64 the SPI system is configured as a slave, the SS pin is a dedicated input pin. Mode fault error doesn’t occur in slave mode. If a mode fault error occurs, the SPI is switched to slave mode, with the exception that the slave output buffer is disabled. So SCK, MISO, and MOSI pins are forced to be high impedance inputs to avoid any possibility of conflict with another output driver. A transmission in progress is aborted and the SPI is forced into idle state. If the mode fault error occurs in the bidirectional mode for a SPI system configured in master mode, output enable of the MOMI (MOSI in bidirectional mode) is cleared if it was set. No mode fault error occurs in the bidirectional mode for SPI system configured in slave mode. The mode fault flag is cleared automatically by a read of the SPI status register (with MODF set) followed by a write to SPI control register 1. If the mode fault flag is cleared, the SPI becomes a normal master or slave again. NOTE If a mode fault error occurs and a received data byte is pending in the receive shift register, this data byte will be lost. 11.4.7 11.4.7.1 Low Power Mode Options SPI in Run Mode In run mode with the SPI system enable (SPE) bit in the SPI control register clear, the SPI system is in a low-power, disabled state. SPI registers remain accessible, but clocks to the core of this module are disabled. 11.4.7.2 SPI in Wait Mode SPI operation in wait mode depends upon the state of the SPISWAI bit in SPI control register 2. • If SPISWAI is clear, the SPI operates normally when the CPU is in wait mode • If SPISWAI is set, SPI clock generation ceases and the SPI module enters a power conservation state when the CPU is in wait mode. – If SPISWAI is set and the SPI is configured for master, any transmission and reception in progress stops at wait mode entry. The transmission and reception resumes when the SPI exits wait mode. – If SPISWAI is set and the SPI is configured as a slave, any transmission and reception in progress continues if the SCK continues to be driven from the master. This keeps the slave synchronized to the master and the SCK. If the master transmits several bytes while the slave is in wait mode, the slave will continue to send out bytes consistent with the operation mode at the start of wait mode (i.e., if the slave is currently sending its SPIDR to the master, it will continue to send the same byte. Else if the slave is currently sending the last received byte from the master, it will continue to send each previous master byte). MC9S12VR Family Reference Manual, Rev. 4.2 386 NXP Semiconductor Serial Peripheral Interface (S12SPIV5) for S12VR64 NOTE Care must be taken when expecting data from a master while the slave is in wait or stop mode. Even though the shift register will continue to operate, the rest of the SPI is shut down (i.e., a SPIF interrupt will not be generated until exiting stop or wait mode). Also, the byte from the shift register will not be copied into the SPIDR register until after the slave SPI has exited wait or stop mode. In slave mode, a received byte pending in the receive shift register will be lost when entering wait or stop mode. An SPIF flag and SPIDR copy is generated only if wait mode is entered or exited during a tranmission. If the slave enters wait mode in idle mode and exits wait mode in idle mode, neither a SPIF nor a SPIDR copy will occur. 11.4.7.3 SPI in Stop Mode Stop mode is dependent on the system. The SPI enters stop mode when the module clock is disabled (held high or low). If the SPI is in master mode and exchanging data when the CPU enters stop mode, the transmission is frozen until the CPU exits stop mode. After stop, data to and from the external SPI is exchanged correctly. In slave mode, the SPI will stay synchronized with the master. The stop mode is not dependent on the SPISWAI bit. 11.4.7.4 Reset The reset values of registers and signals are described in Section 11.3, “Memory Map and Register Definition”, which details the registers and their bit fields. • If a data transmission occurs in slave mode after reset without a write to SPIDR, it will transmit garbage, or the data last received from the master before the reset. • Reading from the SPIDR after reset will always read zeros. 11.4.7.5 Interrupts The SPI only originates interrupt requests when SPI is enabled (SPE bit in SPICR1 set). The following is a description of how the SPI makes a request and how the MCU should acknowledge that request. The interrupt vector offset and interrupt priority are chip dependent. The interrupt flags MODF, SPIF, and SPTEF are logically ORed to generate an interrupt request. 11.4.7.5.1 MODF MODF occurs when the master detects an error on the SS pin. The master SPI must be configured for the MODF feature (see Table 11-3). After MODF is set, the current transfer is aborted and the following bit is changed: • MSTR = 0, The master bit in SPICR1 resets. The MODF interrupt is reflected in the status register MODF flag. Clearing the flag will also clear the interrupt. This interrupt will stay active while the MODF flag is set. MODF has an automatic clearing process which is described in Section 11.3.2.4, “SPI Status Register (SPISR)”. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 387 Serial Peripheral Interface (S12SPIV5) for S12VR64 11.4.7.5.2 SPIF SPIF occurs when new data has been received and copied to the SPI data register. After SPIF is set, it does not clear until it is serviced. SPIF has an automatic clearing process, which is described in Section 11.3.2.4, “SPI Status Register (SPISR)”. 11.4.7.5.3 SPTEF SPTEF occurs when the SPI data register is ready to accept new data. After SPTEF is set, it does not clear until it is serviced. SPTEF has an automatic clearing process, which is described in Section 11.3.2.4, “SPI Status Register (SPISR)”. MC9S12VR Family Reference Manual, Rev. 4.2 388 NXP Semiconductor Chapter 12 Timer Module (TIM16B4CV3) Table 12-1. V03.00 Jan. 28, 2009 Initial version V03.01 Aug. 26, 2009 12.1.2/12-390 Figure 1-4./1-8 1.3.2.15/1-18 12.3.2.2/12-393, 1.3.2.3/1-8, 1.3.2.4/1-9, 12.4.3/12-404 - Correct typo: TSCR ->TSCR1; - Correct typo: ECTxxx->TIMxxx - Correct reference: Figure 1-25 -> Figure 12-22 - Add description, “a counter overflow when TTOV[7] is set”, to be the condition of channel 7 override event. - Phrase the description of OC7M to make it more explicit V03.02 Apri,12,2010 12.3.2.6/12-396 12.3.2.9/12-398 12.4.3/12-404 -Add Table 1-10 -update TCRE bit description -add Figure 1-31 V03.03 Jan,14,2013 -single source generate different channel guide 12.1 Introduction The basic scalable timer consists of a 16-bit, software-programmable counter driven by a flexible programmable prescaler. This timer can be used for many purposes, including input waveform measurements while simultaneously generating an output waveform. This timer could contain up to 4 input capture/output compare channels . The input capture function is used to detect a selected transition edge and record the time. The output compare function is used for generating output signals or for timer software delays. A full access for the counter registers or the input capture/output compare registers should take place in one clock cycle. Accessing high byte and low byte separately for all of these registers may not yield the same result as accessing them in one word. 12.1.1 Features The TIM16B4CV3 includes these distinctive features: • Up to 4 channels available. (refer to device specification for exact number) • All channels have same input capture/output compare functionality. • Clock prescaling. • 16-bit counter. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 389 Timer Module (TIM16B4CV3) 12.1.2 Modes of Operation Stop: Timer is off because clocks are stopped. Freeze: Timer counter keeps on running, unless TSFRZ in TSCR1 is set to 1. Wait: Counters keeps on running, unless TSWAI in TSCR1 is set to 1. Normal: Timer counter keep on running, unless TEN in TSCR1 is cleared to 0. 12.1.3 Block Diagrams Bus clock Timer overflow interrupt Prescaler 16-bit Counter Timer channel 0 interrupt Timer channel 1 interrupt Timer channel 2 interrupt Channel 0 Input capture Output compare Channel 1 Input capture Output compare Channel 2 Input capture Output compare Registers Channel 3 Input capture Output compare IOC0 IOC1 IOC2 IOC3 Timer channel 3 interrupt Figure 12-1. TIM16B4CV3 Block Diagram MC9S12VR Family Reference Manual, Rev. 4.2 390 NXP Semiconductor Timer Module (TIM16B4CV3) 16-bit Main Timer IOCn Edge detector Set CnF Interrupt TCn Input Capture Reg. Figure 12-2. Interrupt Flag Setting 12.2 External Signal Description The TIM16B4CV3 module has a selected number of external pins. Refer to device specification for exact number. 12.2.1 IOC3 - IOC0 — Input Capture and Output Compare Channel 3-0 Those pins serve as input capture or output compare for TIM16B4CV3 channel . NOTE For the description of interrupts see Section 12.6, “Interrupts”. 12.3 Memory Map and Register Definition This section provides a detailed description of all memory and registers. 12.3.1 Module Memory Map The memory map for the TIM16B4CV3 module is given below in Figure 12-3. The address listed for each register is the address offset. The total address for each register is the sum of the base address for the TIM16B4CV3 module and the address offset for each register. 12.3.2 Register Descriptions This section consists of register descriptions in address order. Each description includes a standard register diagram with an associated figure number. Details of register bit and field function follow the register diagrams, in bit order. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 391 Timer Module (TIM16B4CV3) Only bits related to implemented channels are valid. Register Name 0x0000 TIOS 0x0001 CFORC 0x0004 TCNTH 0x0005 TCNTL 0x0006 TSCR1 0x0007 TTOV 0x0008 TCTL1 0x0009 TCTL2 0x000A TCTL3 0x000B TCTL4 0x000C TIE 0x000D TSCR2 0x000E TFLG1 0x000F TFLG2 0x0010–0x001F TCxH–TCxL1 0x0024–0x002B Reserved 0x002C OCPD 0x002D Reserved 0x002E PTPSR 0x002F Reserved Bit 7 6 5 4 3 2 1 Bit 0 R RESERVE D W R 0 W RESERVE D R TCNT15 W R TCNT7 W R TEN W R RESERVE D W RESERVE D RESERVE D RESERVE D IOS3 IOS2 IOS1 IOS0 0 RESERVE D 0 RESERVE D 0 RESERVE D 0 0 0 0 FOC3 FOC2 FOC1 FOC0 TCNT14 TCNT13 TCNT12 TCNT11 TCNT10 TCNT9 TCNT8 TCNT6 TCNT5 TCNT4 TCNT3 TCNT2 TCNT1 TCNT0 TSWAI TSFRZ TFFCA PRNT 0 0 0 RESERVE D RESERVE D RESERVE D TOV3 TOV2 TOV1 TOV0 R W R W R W R W R W R W R W R W R W RESERVE D RESERVE D RESERVE D RESERVE D RESERVE D RESERVE D RESERVE D RESERVE D OM3 OL3 OM2 OL2 OM1 OL1 OM0 OL0 RESERVE D RESERVE D RESERVE D RESERVE D RESERVE D RESERVE D RESERVE D RESERVE D EDG3B EDG3A EDG2B EDG2A EDG1B EDG1A EDG0B EDG0A RESERVE D RESERVE D RESERVE D RESERVE D C3I C2I C1I C0I 0 0 0 RESERVE D PR2 PR1 PR0 RESERVE D RESERVE D RESERVE D C3F C2F C1F C0F 0 0 0 0 0 0 0 Bit 14 Bit 13 Bit 12 Bit 11 Bit 10 Bit 9 Bit 8 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 Bit 0 RESERVE D RESERVE D RESERVE D OCPD3 OCPD2 OCPD1 OCPD0 PTPS6 PTPS5 PTPS4 PTPS3 PTPS2 PTPS1 PTPS0 TOI RESERVE D TOF Bit 15 R Bit 7 W R W R RESERVE D W R R W R W PTPS7 Figure 12-3. TIM16B4CV3 Register Summary MC9S12VR Family Reference Manual, Rev. 4.2 392 NXP Semiconductor Timer Module (TIM16B4CV3) 1 The register is available only if corresponding channel exists. 12.3.2.1 R W Reset Timer Input Capture/Output Compare Select (TIOS) 7 6 5 4 3 2 1 0 RESERVED RESERVED RESERVED RESERVED IOS3 IOS2 IOS1 IOS0 0 0 0 0 0 0 0 0 Figure 12-4. Timer Input Capture/Output Compare Select (TIOS) Read: Anytime Write: Anytime Table 12-2. TIOS Field Descriptions Note: Writing to unavailable bits has no effect. Reading from unavailable bits return a zero. Field 3:0 IOS[3:0] 12.3.2.2 R Description Input Capture or Output Compare Channel Configuration 0 The corresponding implemented channel acts as an input capture. 1 The corresponding implemented channel acts as an output compare. Timer Compare Force Register (CFORC) 7 6 5 4 3 2 1 0 0 0 0 0 0 0 0 0 RESERVED RESERVED RESERVED FOC3 FOC2 FOC1 FOC0 0 0 0 0 0 0 0 W RESERVED Reset 0 Figure 12-5. Timer Compare Force Register (CFORC) Read: Anytime but will always return 0x0000 (1 state is transient) Write: Anytime Table 12-3. CFORC Field Descriptions Note: Writing to unavailable bits has no effect. Reading from unavailable bits return a zero. Field Description 3:0 FOC[3:0] Note: Force Output Compare Action for Channel 3:0 — A write to this register with the corresponding data bit(s) set causes the action which is programmed for output compare “x” to occur immediately. The action taken is the same as if a successful comparison had just taken place with the TCx register except the interrupt flag does not get set. If forced output compare on any channel occurs at the same time as the successful output compare then forced output compare action will take precedence and interrupt flag won’t get set. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 393 Timer Module (TIM16B4CV3) 12.3.2.3 R W Reset Timer Count Register (TCNT) 15 14 13 12 11 10 9 9 TCNT15 TCNT14 TCNT13 TCNT12 TCNT11 TCNT10 TCNT9 TCNT8 0 0 0 0 0 0 0 0 Figure 12-6. Timer Count Register High (TCNTH) R W Reset 7 6 5 4 3 2 1 0 TCNT7 TCNT6 TCNT5 TCNT4 TCNT3 TCNT2 TCNT1 TCNT0 0 0 0 0 0 0 0 0 Figure 12-7. Timer Count Register Low (TCNTL) The 16-bit main timer is an up counter. A full access for the counter register should take place in one clock cycle. A separate read/write for high byte and low byte will give a different result than accessing them as a word. Read: Anytime Write: Has no meaning or effect in the normal mode; only writable in special modes . The period of the first count after a write to the TCNT registers may be a different size because the write is not synchronized with the prescaler clock. 12.3.2.4 R W Reset Timer System Control Register 1 (TSCR1) 7 6 5 4 3 TEN TSWAI TSFRZ TFFCA PRNT 0 0 0 0 0 2 1 0 0 0 0 0 0 0 = Unimplemented or Reserved Figure 12-8. Timer System Control Register 1 (TSCR1) Read: Anytime Write: Anytime MC9S12VR Family Reference Manual, Rev. 4.2 394 NXP Semiconductor Timer Module (TIM16B4CV3) Table 12-4. TSCR1 Field Descriptions Field Description 7 TEN Timer Enable 0 Disables the main timer, including the counter. Can be used for reducing power consumption. 1 Allows the timer to function normally. If for any reason the timer is not active, there is no 64 clock for the pulse accumulator because the 64 is generated by the timer prescaler. 6 TSWAI Timer Module Stops While in Wait 0 Allows the timer module to continue running during wait. 1 Disables the timer module when the MCU is in the wait mode. Timer interrupts cannot be used to get the MCU out of wait. TSWAI also affects pulse accumulator. 5 TSFRZ Timer Stops While in Freeze Mode 0 Allows the timer counter to continue running while in freeze mode. 1 Disables the timer counter whenever the MCU is in freeze mode. This is useful for emulation. TSFRZ does not stop the pulse accumulator. 4 TFFCA Timer Fast Flag Clear All 0 Allows the timer flag clearing to function normally. 1 For TFLG1(0x000E), a read from an input capture or a write to the output compare channel (0x0010–0x001F) causes the corresponding channel flag, CnF, to be cleared. For TFLG2 (0x000F), any access to the TCNT register (0x0004, 0x0005) clears the TOF flag. This has the advantage of eliminating software overhead in a separate clear sequence. Extra care is required to avoid accidental flag clearing due to unintended accesses. 3 PRNT Precision Timer 0 Enables legacy timer. PR0, PR1, and PR2 bits of the TSCR2 register are used for timer counter prescaler selection. 1 Enables precision timer. All bits of the PTPSR register are used for Precision Timer Prescaler Selection, and all bits. This bit is writable only once out of reset. 12.3.2.5 R W Timer Toggle On Overflow Register 1 (TTOV) 7 6 5 4 3 2 1 0 RESERVED RESERVED RESERVED RESERVED TOV3 TOV2 TOV1 TOV0 0 0 0 0 0 0 0 0 Reset Figure 12-9. Timer Toggle On Overflow Register 1 (TTOV) Read: Anytime Write: Anytime Table 12-5. TTOV Field Descriptions Note: Writing to unavailable bits has no effect. Reading from unavailable bits return a zero. Field Description 3:0 TOV[3:0] Toggle On Overflow Bits — TOVx toggles output compare pin on overflow. This feature only takes effect when in output compare mode. When set, it takes precedence over forced output compare 0 Toggle output compare pin on overflow feature disabled. 1 Toggle output compare pin on overflow feature enabled. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 395 Timer Module (TIM16B4CV3) 12.3.2.6 R W Reset Timer Control Register 1/Timer Control Register 2 (TCTL1/TCTL2) 7 6 5 4 3 2 1 0 RESERVED RESERVED RESERVED RESERVED RESERVED RESERVED RESERVED RESERVED 0 0 0 0 0 0 0 0 Figure 12-10. Timer Control Register 1 (TCTL1) R W Reset 7 6 5 4 3 2 1 0 OM3 OL3 OM2 OL2 OM1 OL1 OM0 OL0 0 0 0 0 0 0 0 0 Figure 12-11. Timer Control Register 2 (TCTL2) Read: Anytime Write: Anytime Table 12-6. TCTL1/TCTL2 Field Descriptions Note: Writing to unavailable bits has no effect. Reading from unavailable bits return a zero Field Description 3:0 OMx Output Mode — These four pairs of control bits are encoded to specify the output action to be taken as a result of a successful OCx compare. When either OMx or OLx is 1, the pin associated with OCx becomes an output tied to OCx. Note: For an output line to be driven by an OCx the OCPDx must be cleared. 3:0 OLx Output Level — These fourpairs of control bits are encoded to specify the output action to be taken as a result of a successful OCx compare. When either OMx or OLx is 1, the pin associated with OCx becomes an output tied to OCx. Note: For an output line to be driven by an OCx the OCPDx must be cleared. Table 12-7. Compare Result Output Action OMx OLx Action 0 0 No output compare action on the timer output signal 0 1 Toggle OCx output line 1 0 Clear OCx output line to zero 1 1 Set OCx output line to one MC9S12VR Family Reference Manual, Rev. 4.2 396 NXP Semiconductor Timer Module (TIM16B4CV3) 12.3.2.7 R W Reset Timer Control Register 3/Timer Control Register 4 (TCTL3 and TCTL4) 7 6 5 4 3 2 1 0 RESERVED RESERVED RESERVED RESERVED RESERVED RESERVED RESERVED RESERVED 0 0 0 0 0 0 0 0 Figure 12-12. Timer Control Register 3 (TCTL3) R W Reset 7 6 5 4 3 2 1 0 EDG3B EDG3A EDG2B EDG2A EDG1B EDG1A EDG0B EDG0A 0 0 0 0 0 0 0 0 Figure 12-13. Timer Control Register 4 (TCTL4) Read: Anytime Write: Anytime. Table 12-8. TCTL3/TCTL4 Field Descriptions Note: Writing to unavailable bits has no effect. Reading from unavailable bits return a zero. Field 3:0 EDGnB EDGnA Description Input Capture Edge Control — These four pairs of control bits configure the input capture edge detector circuits. Table 12-9. Edge Detector Circuit Configuration 12.3.2.8 R W Reset EDGnB EDGnA Configuration 0 0 Capture disabled 0 1 Capture on rising edges only 1 0 Capture on falling edges only 1 1 Capture on any edge (rising or falling) Timer Interrupt Enable Register (TIE) 7 6 5 4 3 2 1 0 RESERVED RESERVED RESERVED RESERVED C3I C2I C1I C0I 0 0 0 0 0 0 0 0 Figure 12-14. Timer Interrupt Enable Register (TIE) Read: Anytime MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 397 Timer Module (TIM16B4CV3) Write: Anytime. Table 12-10. TIE Field Descriptions Note: Writing to unavailable bits has no effect. Reading from unavailable bits return a zero Field 3:0 C3I:C0I 12.3.2.9 Description Input Capture/Output Compare “x” Interrupt Enable — The bits in TIE correspond bit-for-bit with the bits in the TFLG1 status register. If cleared, the corresponding flag is disabled from causing a hardware interrupt. If set, the corresponding flag is enabled to cause a interrupt. Timer System Control Register 2 (TSCR2) 7 R W Reset TOI 0 6 5 4 0 0 0 0 0 0 3 2 1 0 RESERVED PR2 PR1 PR0 0 0 0 0 = Unimplemented or Reserved Figure 12-15. Timer System Control Register 2 (TSCR2) Read: Anytime Write: Anytime. Table 12-11. TSCR2 Field Descriptions Field 7 TOI 2:0 PR[2:0] Description Timer Overflow Interrupt Enable 0 Interrupt inhibited. 1 Hardware interrupt requested when TOF flag set. Timer Prescaler Select — These three bits select the frequency of the timer prescaler clock derived from the Bus Clock as shown in Table 12-12. Table 12-12. Timer Clock Selection PR2 PR1 PR0 Timer Clock 0 0 0 Bus Clock / 1 0 0 1 Bus Clock / 2 0 1 0 Bus Clock / 4 0 1 1 Bus Clock / 8 1 0 0 Bus Clock / 16 1 0 1 Bus Clock / 32 1 1 0 Bus Clock / 64 1 1 1 Bus Clock / 128 MC9S12VR Family Reference Manual, Rev. 4.2 398 NXP Semiconductor Timer Module (TIM16B4CV3) NOTE The newly selected prescale factor will not take effect until the next synchronized edge where all prescale counter stages equal zero. 12.3.2.10 R W Main Timer Interrupt Flag 1 (TFLG1) 7 6 5 4 3 2 1 0 RESERVED RESERVED RESERVED RESERVED C3F C2F C1F C0F 0 0 0 0 0 0 0 0 Reset Figure 12-16. Main Timer Interrupt Flag 1 (TFLG1) Read: Anytime Write: Used in the clearing mechanism (set bits cause corresponding bits to be cleared). Writing a zero will not affect current status of the bit. Table 12-13. TRLG1 Field Descriptions Note: Writing to unavailable bits has no effect. Reading from unavailable bits return a zero. Field Description 3:0 C[3:0]F Input Capture/Output Compare Channel “x” Flag — These flags are set when an input capture or output compare event occurs. Clearing requires writing a one to the corresponding flag bit while TEN is set to one. Note: When TFFCA bit in TSCR register is set, a read from an input capture or a write into an output compare channel (0x0010–0x001F) will cause the corresponding channel flag CxF to be cleared. 12.3.2.11 Main Timer Interrupt Flag 2 (TFLG2) 7 R W Reset TOF 0 6 5 4 3 2 1 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 Unimplemented or Reserved Figure 12-17. Main Timer Interrupt Flag 2 (TFLG2) TFLG2 indicates when interrupt conditions have occurred. To clear a bit in the flag register, write the bit to one while TEN bit of TSCR1 . Read: Anytime Write: Used in clearing mechanism (set bits cause corresponding bits to be cleared). Any access to TCNT will clear TFLG2 register if the TFFCA bit in TSCR register is set. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 399 Timer Module (TIM16B4CV3) Table 12-14. TRLG2 Field Descriptions Field Description 7 TOF Timer Overflow Flag — Set when 16-bit free-running timer overflows from 0xFFFF to 0x0000. Clearing this bit requires writing a one to bit 7 of TFLG2 register while the TEN bit of TSCR1 is set to one . 12.3.2.12 Timer Input Capture/Output Compare Registers High and Low 0– 3(TCxH and TCxL) R W Reset 15 14 13 12 11 10 9 0 Bit 15 Bit 14 Bit 13 Bit 12 Bit 11 Bit 10 Bit 9 Bit 8 0 0 0 0 0 0 0 0 Figure 12-18. Timer Input Capture/Output Compare Register x High (TCxH) R W Reset 7 6 5 4 3 2 1 0 Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 Bit 0 0 0 0 0 0 0 0 0 Figure 12-19. Timer Input Capture/Output Compare Register x Low (TCxL) 1 This register is available only when the corresponding channel exists and is reserved if that channel does not exist. Writes to a reserved register have no functional effect. Reads from a reserved register return zeroes. Depending on the TIOS bit for the corresponding channel, these registers are used to latch the value of the free-running counter when a defined transition is sensed by the corresponding input capture edge detector or to trigger an output action for output compare. Read: Anytime Write: Anytime for output compare function.Writes to these registers have no meaning or effect during input capture. All timer input capture/output compare registers are reset to 0x0000. NOTE Read/Write access in byte mode for high byte should take place before low byte otherwise it will give a different result. MC9S12VR Family Reference Manual, Rev. 4.2 400 NXP Semiconductor Timer Module (TIM16B4CV3) 12.3.2.13 R W Output Compare Pin Disconnect Register(OCPD) 7 6 5 4 3 2 1 0 RESERVED RESERVED RESERVED RESERVED OCPD3 OCPD2 OCPD1 OCPD0 0 0 0 0 0 0 0 0 Reset Figure 12-20. Output Compare Pin Disconnect Register (OCPD) Read: Anytime Write: Anytime All bits reset to zero. Table 12-15. OCPD Field Description Note: Writing to unavailable bits has no effect. Reading from unavailable bits return a zero. Field Description 3:0 OCPD[3:0] Output Compare Pin Disconnect Bits 0 Enables the timer channel port. Output Compare action will occur on the channel pin. These bits do not affect the input capture . 1 Disables the timer channel port. Output Compare action will not occur on the channel pin, but the output compare flag still become set. 12.3.2.14 R W Reset Precision Timer Prescaler Select Register (PTPSR) 7 6 5 4 3 2 1 0 PTPS7 PTPS6 PTPS5 PTPS4 PTPS3 PTPS2 PTPS1 PTPS0 0 0 0 0 0 0 0 0 Figure 12-21. Precision Timer Prescaler Select Register (PTPSR) Read: Anytime Write: Anytime All bits reset to zero. ... Table 12-16. PTPSR Field Descriptions Field Description 7:0 PTPS[7:0] Precision Timer Prescaler Select Bits — These eight bits specify the division rate of the main Timer prescaler. These are effective only when the PRNT bit of TSCR1 is set to 1. Table 12-17 shows some selection examples in this case. The newly selected prescale factor will not take effect until the next synchronized edge where all prescale counter stages equal zero. The Prescaler can be calculated as follows depending on logical value of the PTPS[7:0] and PRNT bit: PRNT = 1 : Prescaler = PTPS[7:0] + 1 MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 401 Timer Module (TIM16B4CV3) Table 12-17. Precision Timer Prescaler Selection Examples when PRNT = 1 PTPS7 PTPS6 PTPS5 PTPS4 PTPS3 PTPS2 PTPS1 PTPS0 Prescale Factor 0 0 0 0 0 0 0 0 1 0 0 0 0 0 0 0 1 2 0 0 0 0 0 0 1 0 3 0 0 0 0 0 0 1 1 4 - - - - - - - - - - - - - - - - - - - - - - - - - - - 0 0 0 1 0 0 1 1 20 0 0 0 1 0 1 0 0 21 0 0 0 1 0 1 0 1 22 - - - - - - - - - - - - - - - - - - - - - - - - - - - 1 1 1 1 1 1 0 0 253 1 1 1 1 1 1 0 1 254 1 1 1 1 1 1 1 0 255 1 1 1 1 1 1 1 1 256 12.4 Functional Description This section provides a complete functional description of the timer TIM16B4CV3 block. Please refer to the detailed timer block diagram in Figure 12-22 as necessary. MC9S12VR Family Reference Manual, Rev. 4.2 402 NXP Semiconductor Timer Module (TIM16B4CV3) PRE-PRESCALER PRNT tim source Clock PTPSR[7:0] PR[2:1:0] 1 MUX 0 PRESCALER CxI TCNT(hi):TCNT(lo) CxF 16-BIT COUNTER TOF INTERRUPT LOGIC TOI TE TOF CHANNEL 0 16-BIT COMPARATOR C0F TC0 EDG0A EDGE DETECT EDG0B C0F OM:OL0 CH. 0 CAPTURE IOC0 PIN LOGIC CH. 0COMPARE TOV0 IOC0 PIN IOC0 CHANNEL 1 16-BIT COMPARATOR C1F TC1 EDG1A EDGE DETECT EDG1B C1F OM:OL1 CH. 1 CAPTURE IOC1 PIN LOGIC CH. 1 COMPARE TOV1 IOC1 PIN IOC1 CHANNEL2 CHANNELn-1 16-BIT COMPARATOR TCn-1 EDG(n-1)A EDG(n-1)B Cn-1F Cn-1F EDGE DETECT CH.n-1 CAPTURE IOCn-1 PIN LOGIC CH. n-1COMPARE IOCn-1 PIN OM:OLn-1 TOVn-1 IOCn-1 n is channels number. Figure 12-22. Detailed Timer Block Diagram 12.4.1 Prescaler The prescaler divides the Bus clock by 1, 2, 4, 8, 16, 32, 64 or 128. The prescaler select bits, PR[2:0], select the prescaler divisor. PR[2:0] are in timer system control register 2 (TSCR2). The prescaler divides the Bus clock by a prescalar value. Prescaler select bits PR[2:0] of in timer system control register 2 (TSCR2) are set to define a prescalar value that generates a divide by 1, 2, 4, 8, 16, 32, 64 and 128 when the PRNT bit in TSCR1 is disabled. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 403 Timer Module (TIM16B4CV3) By enabling the PRNT bit of the TSCR1 register, the performance of the timer can be enhanced. In this case, it is possible to set additional prescaler settings for the main timer counter in the present timer by using PTPSR[7:0] bits of PTPSR register generating divide by 1, 2, 3, 4,....20, 21, 22, 23,......255, or 256. 12.4.2 Input Capture Clearing the I/O (input/output) select bit, IOSx, configures channel x as an input capture channel. The input capture function captures the time at which an external event occurs. When an active edge occurs on the pin of an input capture channel, the timer transfers the value in the timer counter into the timer channel registers, TCx. The minimum pulse width for the input capture input is greater than two Bus clocks. An input capture on channel x sets the CxF flag. The CxI bit enables the CxF flag to generate interrupt requests. Timer module must stay enabled (TEN bit of TSCR1 register must be set to one) while clearing CxF (writing one to CxF). 12.4.3 Output Compare Setting the I/O select bit, IOSx, configures channel x when available as an output compare channel. The output compare function can generate a periodic pulse with a programmable polarity, duration, and frequency. When the timer counter reaches the value in the channel registers of an output compare channel, the timer can set, clear, or toggle the channel pin if the corresponding OCPDx bit is set to zero. An output compare on channel x sets the CxF flag. The CxI bit enables the CxF flag to generate interrupt requests. Timer module must stay enabled (TEN bit of TSCR1 register must be set to one) while clearing CxF (writing one to CxF). The output mode and level bits, OMx and OLx, select set, clear, toggle on output compare. Clearing both OMx and OLx results in no output compare action on the output compare channel pin. Setting a force output compare bit, FOCx, causes an output compare on channel x. A forced output compare does not set the channel flag. Writing to the timer port bit of an output compare pin does not affect the pin state. The value written is stored in an internal latch. When the pin becomes available for general-purpose output, the last value written to the bit appears at the pin. 12.4.3.1 OC Channel Initialization The internal register whose output drives OCx can be programmed before the timer drives OCx. The desired state can be programmed to this internal register by writing a one to CFORCx bit with TIOSx, OCPDx and TEN bits set to one. Set OCx: Write a 1 to FOCx while TEN=1, IOSx=1, OMx=1, OLx=1 and OCPDx=1 Clear OCx: Write a 1 to FOCx while TEN=1, IOSx=1, OMx=1, OLx=0 and OCPDx=1 MC9S12VR Family Reference Manual, Rev. 4.2 404 NXP Semiconductor Timer Module (TIM16B4CV3) Setting OCPDx to zero allows the internal register to drive the programmed state to OCx. This allows a glitch free switch over of port from general purpose I/O to timer output once the OCPDx bit is set to zero. 12.5 Resets The reset state of each individual bit is listed within Section 12.3, “Memory Map and Register Definition” which details the registers and their bit fields 12.6 Interrupts This section describes interrupts originated by the TIM16B4CV3 block. Table 12-18 lists the interrupts generated by the TIM16B4CV3 to communicate with the MCU. Table 12-18. TIM16B4CV3 Interrupts Interrupt Offset Vector Priority Source Description C[3:0]F — — — Timer Channel 3–0 Active high timer channel interrupts 3–0 TOF — — — Timer Overflow Timer Overflow interrupt The TIM16B4CV3 could use up to 5 interrupt vectors. The interrupt vector offsets and interrupt numbers are chip dependent. 12.6.1 Channel [3:0] Interrupt (C[3:0]F) This active high outputs will be asserted by the module to request a timer channel 7 – 0 interrupt. The TIM block only generates the interrupt and does not service it. Only bits related to implemented channels are valid. 12.6.2 Timer Overflow Interrupt (TOF) This active high output will be asserted by the module to request a timer overflow interrupt. The TIM block only generates the interrupt and does not service it. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 405 Timer Module (TIM16B4CV3) MC9S12VR Family Reference Manual, Rev. 4.2 406 NXP Semiconductor Chapter 13 High-Side Drivers - HSDRV (S12HSDRVV2) for S12VR64 Table 13-1. Revision History Table Rev. No. (Item No.) Date (Submitted Sections Affected By) Substantial Change(s) V1.00 10 December 2010 All - Initial V2.00 07 Sep 2012 All - Added description and register bits for over-current masking feature All - Removed open-load detection feature V2.02 13.1 05 August 2013 Introduction The HSDRV module provides two high-side drivers typically used to drive LED or resistive loads 13.1.1 Features The HSDRV module includes two independent high-side drivers with common high voltage supply. Each driver has the following features: • Selectable gate control of high-side switches: HSDR[1:0] register bits or PWM or timer channels. • Over-current shutdown for the drivers, while they are enabled, comprising: – Interrupt flag generation – Driver shutdown – Optional masking window 13.1.2 Modes of Operation The HSDRV module behaves as follows in the system power modes: 1. MCU run mode The activation of the HSE0 or HSE1 bits enable the related high-side driver. The driver is controlled by the selected source. 2. MCU stop mode MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 407 High-Side Drivers - HSDRV (S12HSDRVV2) for S12VR64 During stop mode operation the high-side drivers are shut down, i.e. the high-side drivers are disabled and their drivers are turned off. The bits in the data register which control the drivers (HSDRx) are cleared automatically. After returning from stop mode the drivers are re-enabled and the state of the HSE bits are automatically set. If the data register bits (HSDRx) were chosen as source in PIM module, then the respective high-side driver stays turned off until the software sets the associated bit in the data register (HSDRx). When the timer or PWM were chosen as source, the respective high-side driver is controlled by the timer or PWM without further handling. When it is required that the driver stays turned off after the stop mode for this case (PWM or timer), the software must take the appropriate action to turn off the driver before entering stop mode. 13.1.3 Block Diagram Figure 13-1 shows a block diagram of the HSDRV module. The module consists of a control and an output stage. Internal functions can be routed to control the high-side drivers. See PIM chapter for routing options. Figure 13-1. HSDRV Block Diagram HS0 HS0 control HS0 Over Current VSUPHS HS1 Over Current HS1 control HS1 MC9S12VR Family Reference Manual, Rev. 4.2 408 NXP Semiconductor High-Side Drivers - HSDRV (S12HSDRVV2) for S12VR64 13.2 External Signal Description Table 13-2 shows the external pins associated with the HSDRV module. Table 13-2. HSDRV Signal Properties Name Function HS0 HS1 VSUPHS 13.2.1 Reset State High-side driver output 0 disabled (off) High-side driver output 1 disabled (off) High Voltage Power Supply for both high side drivers disabled (off) HS0, HS1— High Side Driver Pins Outputs of the two high-side drivers are intended to drive LEDs or resistive loads. 13.2.2 VSUPHS — High Side Driver Power Pin Power supply for both high-side drivers. This pin must be connected to the main power supply with the appropriate reverse battery protection network. 13.3 Memory Map and Register Definition This section provides a detailed description of all registers accessible in the HSDRV module. 13.3.1 Module Memory Map A summary of registers associated with the HSDRV module is shown in Table 13-3. Detailed descriptions of the registers and bits are given in the following sections. NOTE Register Address = Module Base Address + Address Offset, where the Module Base Address is defined at the MCU level and the Address Offset is defined at the module level. Table 13-3. Register Summary Address Offset Register Name Bit 7 6 5 4 3 2 0 0 0 0 0 0 0 0 0x0000 HSDR R W 0 0 0x0001 HSCR R W 0 0 0x0002 Reserved R W 0 0 HSOCME1 HSOCME0 0 0 1 Bit 0 HSDR1 HSDR0 HSE1 HSE0 0 0 MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 409 High-Side Drivers - HSDRV (S12HSDRVV2) for S12VR64 Table 13-3. Register Summary Address Offset Register Name Bit 7 6 5 4 3 2 1 Bit 0 Reserved Reserved Reserved Reserved Reserved Reserved Reserved Reserved 0x0003 Reserved R W 0x0004 Reserved R W 0 0 0 0 0 0 0 0 0x0005 Reserved R W 0 0 0 0 0 0 0 0 0x0006 HSIE R W 0 0 0 0 0 0 0 0x0007 HSIF R W 0 0 0 0 0 HSOCIF1 HSOCIF0 HSOCIE 0 MC9S12VR Family Reference Manual, Rev. 4.2 410 NXP Semiconductor High-Side Drivers - HSDRV (S12HSDRVV2) for S12VR64 13.3.2 Register Definition 13.3.3 Port HS Data Register (HSDR) Access: User read/write1 Module Base + 0x0000 R 7 6 5 4 3 2 0 0 0 0 0 0 W 1 0 HSDR1 HSDR0 Altern. Read Function — — — — — — OC2 OC2 — — — — — — PWM2 PWM2 Reset 0 0 0 0 0 0 0 0 = Unimplemented Figure 13-2. Port HS Data Register (HSDR) 1 Read: Anytime The data source (HSDRx or alternate function) depends on the HSE control bit settings. Write: Anytime 2 See PIM chapter for detailed routing description. Table 13-4. PTHS Register Field Descriptions Field Description 1-0 HSDRx Port HS Data Bits—Data registers or routed timer outputs or routed PWM outputs These register bits can be used to control the high-side drivers if selected as control source. See PIM section for routing details. If the associated HSEx bit is set to 0, a read returns the value of the Port HS Data Register (HSDRx). If the associated HSEx bit is set to 1, a read returns the value of the selected control source for the driver. When entering in STOP mode the Port HS Data Register (HSDRx) is cleared. 0 High-side driver is turned off 1 High-side driver is turned on NOTE After enabling the high-side driver with the HSEx bit in HSCR register, the user must wait a minimum settling time tHS_settling before turning on the high-side driver. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 411 High-Side Drivers - HSDRV (S12HSDRVV2) for S12VR64 13.3.4 HSDRV Configuration Register (HSCR) Access: User read/write1 Module Base + 0x0001 R 7 6 0 0 0 0 W Reset 5 4 HSOCME1 HSOCME0 0 0 3 2 0 0 0 0 1 0 HSE1 HSE0 0 0 = Unimplemented Figure 13-3. HSDRV Configuration Register (HSCR) 1 Read: Anytime Write: Anytime, except HSOCME (see description) Table 13-5. HSCR Register Field Descriptions Field Description 5-4 HSDRV Over-Current Mask Enable HSOCMEx These bits enable the masking of the over-current shutdown for tHSOCM on the related high-side driver, after switching the driver on. These bits are only writable when the related high-side driver is disabled (HSEx=0) 0 over-current masking window is disabled 1 over-current masking window is enabled 1-0 HSEx HSDRV Enable These bits control the bias of the related high-side driver circuit. 0 High-side driver is disabled 1 High-side driver is enabled NOTE After enabling the high-side driver (write 1 to HSEx) a settling time tHS_settling is required before the high-side driver is allowed to be turned on (e.g. by writing HSDRx bits). MC9S12VR Family Reference Manual, Rev. 4.2 412 NXP Semiconductor High-Side Drivers - HSDRV (S12HSDRVV2) for S12VR64 13.3.5 Reserved Register Access: User read/write1 Module Base + 0x0003 R W Reset 7 6 5 4 3 2 1 0 Reserved Reserved Reserved Reserved Reserved Reserved Reserved Reserved x x x x x x x x = Unimplemented Figure 13-4. Reserved Register 1 Read: Anytime Write: Only in special mode NOTE This reserved register is designed for factory test purposes only, and is not intended for general user access. Writing to this register when in special mode can alter the module’s functionality. Table 13-6. Reserved Register Field Descriptions Field 7-0 Reserved Description These reserved bits are used for test purposes. Writing to these bits can alter the module functionality. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 413 High-Side Drivers - HSDRV (S12HSDRVV2) for S12VR64 13.3.6 HSDRV Interrupt Enable Register (HSIE) Access: User read/write1 Module Base + 0x0006 7 R W HSOCIE Reset 0 6 5 4 3 2 1 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 = Unimplemented Figure 13-5. HSDRV Interrupt Enable Register (HSIE) 1 Read: Anytime Write: Anytime Table 13-7. HSIE Register Field Descriptions Field 7 HSOCIE Description HSDRV Over-Current Interrupt Enable 0 Interrupt request is disabled 1Interrupt is requested whenever a HSOCIFx flag is set MC9S12VR Family Reference Manual, Rev. 4.2 414 NXP Semiconductor High-Side Drivers - HSDRV (S12HSDRVV2) for S12VR64 13.3.7 HSDRV Interrupt Flag Register (HSIF) Access: User read/write1 Module Base + 0x0007 R 7 6 5 4 3 2 0 0 0 0 0 0 0 0 0 0 0 0 W Reset 1 0 HSOCIF1 HSOCIF0 0 0 = Unimplemented Figure 13-6. HSDRV Interrupt Flag Register (HSIF) 1 Read: Anytime Write: Write 1 to clear, writing 0 has no effect Table 13-8. HSIF Register Field Descriptions Field 1-0 HSOCIFx Description HSDRV Over-Current Interrupt Flag These flags are set to 1 when an over-current event occurs on the related high-side driver (| IHS | > | IOCTHSX |). While set the related high-side driver is turned off. Once these flags are cleared, the related driver is controlled again by the source selected in PIM module. 0 No over-current event occurred since last clearing of flag 1 An over-current event occurred since last clearing of flag MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 415 High-Side Drivers - HSDRV (S12HSDRVV2) for S12VR64 13.4 Functional Description 13.4.1 General The HSDRV module provides two high-side drivers able to drive LED or resistive loads. The driver can be controlled directly through register bits or alternatively by dedicated timer or PWM channels. See PIM chapter for routing details. 13.4.2 Over-Current Shutdown Each high-side driver has an over-current shutdown feature with a current threshold of IOCTHSX. If an over-current is detected the related interrupt flag (HSOCIF1 or HSOCIF0) is set in the HSDRV Interrupt Flag Register (HSIF). As long as the over-current interrupt flag remains set, the related high-side driver is turned off to protect the circuit. Clearing the related over-current interrupt flag returns back the control to the selected source in the PIM module. The over-current detection and driver shutdown can be masked for an initial THSOCM after switching the driver on. This can be achieved by writing the related HSOCME register bit in the HSCR register to 1. The HSOCME bits are only writable while the related driver is disabled (HSE=0). 13.4.3 Interrupts This section describes the interrupt generated by HSDRV module. The interrupt is only available in MCU run mode. Entering and exiting MCU stop mode has no effect on the interrupt flags. The HSDRV interrupt vector is named in Table 13-9. Vector addresses and interrupt priorities are defined at MCU level. 13.4.3.1 HSDRV Over Current Interrupt (HSOCI) Table 13-9. HSDRV Interrupt Sources Module Interrupt Source Module Internal Interrupt Source Local Enable HSDRV Interrupt (HSI) HSDRV Over-Current Interrupt (HSOCI) HSOCIE = 1 If an over-current is detected the related interrupt flag HSOCIFx asserts. Depending on the setting of the HSDRV Error Interrupt Enable (HSOCIE) bit an interrupt is requested. MC9S12VR Family Reference Manual, Rev. 4.2 416 NXP Semiconductor Chapter 14 High-Side Driver - HSDRV1C (HSDRV1CV3) for S12VR32 Table 14-1. Revision History Table Rev. No. (Item No.) Date (Submitted Sections Affected By) Substantial Change(s) V3.03 24 February 2015 All - Clean-ups - Re-added open-load detection feature - Added slew rate control feature V3.04 15 April 2015 All - Clean-ups 14.1 Introduction The HSDRV1C module provides one high-side driver typically used to drive LED or resistive loads. 14.1.1 Features The HSDRV1C module includes one high-side driver with high power supply. The driver has the following features: • Selectable gate control: HSDR[HSDR0] bit or PWM or timer channel. • Open-load detection. • Slew rate control. • Over-current shutdown, comprising of: — Interrupt flag generation — Driver shutdown — Optional masking window 14.1.2 Modes of Operation The HSDRV1C module behaves as follows in the system power modes: 1. MCU run mode The activation of the HSCR[HSE0] bit enables the high-side driver. The driver is controlled by the selected source. 2. MCU stop mode During stop mode operation the high-side driver is shut down. That means the high-side driver is disabled and the driver is turned off. The bit in the data register which controls the driver (HSDR[HSDR0]) is MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 417 High-Side Driver - HSDRV1C (HSDRV1CV3) for S12VR32 cleared automatically. After returning from stop mode the driver is re-enabled and the state of the HSCR[HSE0] bit is set automatically. If the data register bit (HSDR[HSDR0]) is chosen as source in the PIM module, then the high-side driver stays turned off until the software sets the associated bit in the data register (HSDR[HSDR0]). When the timer or PWM is chosen as source, the high-side driver is controlled by the timer or PWM without further handling. When it is required that the driver stays turned off after the stop mode for this case (PWM or timer), the software must take the appropriate action to turn off the driver before entering stop mode. 14.1.3 Block Diagram Figure 14-1 shows a block diagram of the HSDRV1C module. The module consists of a control and an output stage. The high-side driver gate control can be routed. See PIM chapter for routing options. Figure 14-1. HSDRV1C Block Diagram HS0 Open Load HS[0] HS0 control HS0 Over Current VSUPHS 14.2 External Signal Description Table 14-2 shows the external pins associated with the HSDRV1C module. Table 14-2. HSDRV1C Signal Properties Name Function HS[0] VSUPHS 14.2.1 Reset State High-side driver output 0 disabled (off) High Voltage Power Supply for high side driver disabled (off) HS[0] — High Side Driver Pin Output of the high-side driver intended to drive LEDs or resistive loads. 14.2.2 VSUPHS — High Side Driver Power Pin Power supply for the high-side driver. MC9S12VR Family Reference Manual, Rev. 4.2 418 NXP Semiconductor High-Side Driver - HSDRV1C (HSDRV1CV3) for S12VR32 This pin must be connected to the main power supply with the appropriate reverse battery protection network. 14.3 Memory Map and Register Definition This section provides a detailed description of all registers accessible in the HSDRV1C module. 14.3.1 Module Memory Map A summary of registers associated with the HSDRV1C module is shown in Table 14-3. Detailed descriptions of the registers and bits are given in the following sections. NOTE Register Address = Module Base Address + Address Offset, where the Module Base Address is defined at the MCU level and the Address Offset is defined at the module level. Table 14-3. Register Summary Address Offset Register Name Bit 7 6 5 4 3 2 1 0 0 0 0 Bit 0 0x0000 HSDR R W 0 0 0 0x0001 HSCR R W 0 0 0 0x0002 HSSLR R W 0 0 0 0 0 0x0003 Reserved R W Reserved Reserved Reserved Reserved Reserved Reserved Reserved Reserved 0x0004 Reserved R W 0 0 0 0 0 0 0 0 0x0005 HSSR R W 0 0 0 0 0 0 0 HSOL0 0x0006 HSIE R W 0 0 0 0 0 0 0 0x0007 HSIF R W 0 0 0 0 0 0 HSOCIE 0 HSOCME0 0 HSOLE0 HSSLCU0 0 0 HSDR0 HSE0 HSSLEN0 HSOCIF0 MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 419 High-Side Driver - HSDRV1C (HSDRV1CV3) for S12VR32 14.3.2 Register Definition 14.3.3 Port HS Data Register (HSDR) Access: User read/write1 Module Base + 0x0000 R 7 6 5 4 3 2 1 0 0 0 0 0 0 0 W 0 HSDR0 Altern. Read Function — — — — — — — OC2 — — — — — — — PWM2 Reset 0 0 0 0 0 0 0 0 = Unimplemented Figure 14-2. Port HS Data Register (HSDR) 1 Read: Anytime The data source (HSDRx or alternate function) depends on the HSE control bit settings. Write: Anytime 2 See PIM chapter for detailed routing description. Table 14-4. Port HS Data Register (HSDR) Field Descriptions Field 0 HSDR0 Description Port HS Data — Data register output or routed timer output or routed PWM output This register can be used to control the high-side driver if selected as control source. See PIM section for routing details. If the HSCR[HSE0] bit is set to 0, a read returns the value of the Port HS Data Register (HSDR[HSDRx]). If the HSCR[HSE0] bit is set to 1, a read returns the value of the selected control source for the driver. When entering in STOP mode the Port HS Data Register (HSDR) is cleared. 0 High-side driver is turned off 1 High-side driver is turned on Note: After enabling the high-side driver with the HSCR[HSE0] bit, software must wait for a minimum settling time tHS_settling before turning on the high-side driver. 14.3.4 HSDRV1C Configuration Register (HSCR) Access: User read/write1 Module Base + 0x0001 R 7 6 5 0 0 0 0 0 0 W Reset 4 HSOCME0 0 3 0 0 2 HSOLE0 0 1 0 0 0 HSE0 0 = Unimplemented Figure 14-3. HSDRV1C Configuration Register (HSCR) MC9S12VR Family Reference Manual, Rev. 4.2 420 NXP Semiconductor High-Side Driver - HSDRV1C (HSDRV1CV3) for S12VR32 1 Read: Anytime Write: Anytime, except HSOCME (see description) Table 14-5. HSDRV Configuration Register (HSCR) Field Descriptions Field Description 4 HSDRV1C Over-Current Mask Enable HSOCME0 This bit controls the masking of the over-current shutdown for tHSOCM on the high-side driver, after switching on the driver. This bit is only writable if the high-side driver is disabled (HSCR[HSE0]=0) 0 over-current masking window is disabled 1 over-current masking window is enabled 2 HSOLE0 HSDRV1C High-Load Resistance Open-Load Detection Enable This bit enables the measurement function to detect an open-load condition on the high-side driver operating on high-load resistance loads. If the high-side driver is enabled and is not being driven by the selected source, then the high-load resistance detection circuit is activated when this bit is set to ‘1’. 0 high-load resistance open-load detection is disabled 1 high-load resistance open-load detection is enabled 0 HSE0 HSDRV1C Enable This bit controls the bias of the related high-side driver circuit. 0 High-side driver is disabled 1 High-side driver is enabled Note: After enabling the high-side driver (HSCR[HSE0]=1), a settling time tHS_settling is required before the high-side driver is allowed to be turned on (e.g. by writing to the HSDR). MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 421 High-Side Driver - HSDRV1C (HSDRV1CV3) for S12VR32 14.3.5 HSDRV1C Slew Rate Control Register (HSSLR) Access: User read/write1 Module Base + 0x0002 R 7 6 5 4 3 0 0 0 0 0 0 0 0 0 0 W Reset 2 HSSLCU0 0 1 0 0 HSSLEN0 0 0 = Unimplemented Figure 14-4. HSDRV1C Slew Rate Control Register (HSSLR) 1 Read: Anytime Write: Anytime, except HSSLCU, HSSLEN (see description) Table 14-6. HSDRV1C Slew Rate Control Register (HSSLR) Field Descriptions Field Description 2 Slew Current Reduction Enable HSSLCU0 The maximum output current is reduced for ~4 us when the driver is switched on to reduce the emission if the high-side driver is used as an off-board driver.This bit is only writable when the high-side driver is disabled (HSCR[HSE0]=0) 0 Slew current reduction disabled 1 Slew current reduction enabled 0 Slew Rate Control Enable HSSLEN0 The voltage slew rate is limited for ~8 us when the driver is switched on to reduce the emission if the high-side driver is used as an off-board driver. This bit is only writable when the high-side driver is disabled (HSCR[HSE0]=0) 0 Slew rate control disabled 1 Slew rate contol enabled 14.3.6 Reserved Register Access: User read/write1 Module Base + 0x0003 R W Reset 7 6 5 4 3 2 1 0 Reserved Reserved Reserved Reserved Reserved Reserved Reserved Reserved x x x x x x x x = Unimplemented Figure 14-5. Reserved Register 1 Read: Anytime Write: Only in special mode NOTE This reserved register is designed for factory test purposes only, and is not MC9S12VR Family Reference Manual, Rev. 4.2 422 NXP Semiconductor High-Side Driver - HSDRV1C (HSDRV1CV3) for S12VR32 intended for general user access. Writing to this register when in special mode can alter the module’s functionality. Table 14-7. Reserved Register Field Descriptions Field 7-0 Reserved 14.3.7 Description These reserved bits are used for test purposes. Writing to these bits can alter the module functionality. HSDRV1C Status Register (HSSR) Access: User read1 Module Base + 0x0005 R 7 6 5 4 3 2 1 0 0 0 0 0 0 0 0 HSOL0 0 0 0 0 0 0 0 0 W Reset = Unimplemented Figure 14-6. HSDRV1C Status Register (HSSR) 1 Read: Anytime Write: No Write Table 14-8. HSDRV Status Register (HSSR) Field Descriptions Field 0 HSOL0 Description HSDRV1C Open-Load Status Bit This bit reflects the open-load condition on the driver pin. A delay of tHLROLDT must be granted after enabling the high-load resistance open-load detection function in order to read valid data. 0 No open-load condition, IHS |IHLROLDC 1 Open-load condition, IHS IHLROLDC MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 423 High-Side Driver - HSDRV1C (HSDRV1CV3) for S12VR32 14.3.8 HSDRV1C Interrupt Enable Register (HSIE) Access: User read/write1 Module Base + 0x0006 7 R W HSOCIE Reset 0 6 5 4 3 2 1 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 = Unimplemented Figure 14-7. HSDRV1C Interrupt Enable Register (HSIE) 1 Read: Anytime Write: Anytime Table 14-9. HSDRV Interrupt Enable Register (HSIE) Field Descriptions Field 7 HSOCIE Description HSDRV1C Over-Current Interrupt Enable 0 Interrupt request is disabled 1Interrupt is requested whenever the HSIF[HSOCIF0] flag is set MC9S12VR Family Reference Manual, Rev. 4.2 424 NXP Semiconductor High-Side Driver - HSDRV1C (HSDRV1CV3) for S12VR32 14.3.9 HSDRV1C Interrupt Flag Register (HSIF) Access: User read/write1 Module Base + 0x0007 R 7 6 5 4 3 2 1 0 0 0 0 0 0 0 0 0 0 0 0 0 0 W Reset 0 HSOCIF0 0 = Unimplemented Figure 14-8. HSDRV1C Interrupt Flag Register (HSIF) 1 Read: Anytime Write: Write 1 to clear, writing 0 has no effect Table 14-10. HSDRV Interrupt Flag Register (HSIF) Field Descriptions Field Description 0 HSOCIF0 HSDRV1C Over-Current Interrupt Flag These flags are set when an over-current event occurs on the high-side driver (| IHS | > | IOCTHSX |). While set the high-side driver is turned off. Once the flag is cleared, the driver is controlled again by the source selected in PIM module. 0 No over-current event occurred since last clearing of flag 1 An over-current event occurred since last clearing of flag 14.4 14.4.1 Functional Description General The HSDRV1C module provides one high-side driver able to drive LED or resistive loads. The driver can be controlled directly through a register bit or alternatively by dedicated timer or PWM channels. See PIM chapter for routing details. The features of the high-side driver, open-load and over-current detection, are described in the following sub-sections. 14.4.2 Open Load Detection A “High-load resistance Open Load Detection” can be enabled for the driver by setting the HSCR[HSOLE0] bit (refer to Section 14.3.4, “HSDRV1C Configuration Register (HSCR)”. This detection is only active when the driver is enabled and it is not being driven. To detect an open-load condition a small current IHVOLDC will flow through the load. If the driving pin HS[0] stays at a voltage above an internal threshold then an open load will be detected for the high-side driver. The open-load condition is flagged in the HSDRV Status Register (HSSR). MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 425 High-Side Driver - HSDRV1C (HSDRV1CV3) for S12VR32 NOTE The open-load detection is only active if the selected source (e.g. PWM, Timer, HSDR[HSDR0]) for the high-side driver is turned off. 14.4.3 Over-Current Shutdown The high-side driver has an over-current shutdown feature with a current threshold of IOCTHSX. If an over-current is detected the interrupt flag is set in the HSDRV Interrupt Flag Register (HSIF). As long as the over-current interrupt flag remains set, the high-side driver is turned off to protect the circuit. Clearing the related over-current interrupt flag returns back the control to the selected source in the PIM module.The over-current detection and driver shutdown can be masked for an initial THSOCM after switching the driver on. This can be achieved by setting the HSCR[HSOCME0] register bit. HSCR[HSOCME0] is only writable while the driver is disabled (HSCR[HSE0]=0). 14.4.4 Interrupts This section describes the interrupt generated by HSDRV1C module. The interrupt is only available in MCU run mode. Entering and exiting MCU stop mode has no effect on the interrupt flags. The interrupt generated by HSDRV1C module is shown in Table 14-11. Vector addresses and interrupt priorities are defined at MCU level. 14.4.4.1 HSDRV1C Over Current Interrupt (HSOCI) Table 14-11. HSDRV1C Interrupt Sources Module Interrupt Source Module Internal Interrupt Source Local Enable HSDRV1C Interrupt (HSI) HSDRV1C Over-Current Interrupt (HSOCI) HSOCIE = 1 If an over-current is detected the related interrupt flag HSOCIFx asserts. Depending on the setting of the HSDRV1C Error Interrupt Enable (HSOCIE) bit an interrupt is requested. MC9S12VR Family Reference Manual, Rev. 4.2 426 NXP Semiconductor Chapter 15 Low-Side Drivers - LSDRV (S12LSDRV1) Table 15-1. Revision History Table Rev. No. (Item No.) Date (Submitted Sections Affected By) Substantial Change(s) V1.01 22 February 2011 All - Added clarification to open-load mechanism in over-current conditions V1.02 12 April 2011 All - improved clarification to open-load mechanism in over-current conditions - corrected typos V1.03 3 April 2011 V1.04 29 January 2013 15.1 - added Note on considering settling time tLS_settling to LSDR and LSCR register Register Descriptions for description LSDR and LSCR - added Note on how to disable the low-side driver to LSDR register description All - Cleaning Introduction The LSDRV module provides two low-side drivers typically used to drive inductive loads (relays). 15.1.1 Features The LSDRV module includes two independent low side drivers with common current sink. Each driver has the following features: • Selectable driver control of low-side switches: LSDRx register bits, PWM or timer channels. See PIM chapter for routing options. • Open-load detection while enabled – While driver off: selectable high-load resistance open-load detection • Over-current protection with shutdown and interrupt while enabled • Active clamp to protect the device against over-voltage when the power transistor that is driving an inductive load (relay) is turned off. 15.1.2 Modes of Operation The LSDRV module behaves as follows in the system operating modes: 1. MCU run mode MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 427 Low-Side Drivers - LSDRV (S12LSDRV1) The activation of the LSE0 or LSE1 bits enable the related low-side driver. The driver is controlled by the selected source in the Port Integration Module (see PIM chapter). 2. MCU stop mode During stop mode operation the low-side drivers are shut down, i.e. the low-side drivers are disabled and their drivers are turned off. The bits in the data register which control the drivers (LSDRx) are cleared automatically. After returning from stop mode the drivers are re-enabled. If the data register bits (LSDRx) were chosen as source in PIM module, then the respective low-side driver stays turned off until the software sets the associated bit in the data register (LSDRx). When the timer or PWM were chosen as source, the respective low-side driver is controlled by the timer or PWM without further handling. When it is required that the driver stays turned off after the stop mode for this case (PWM or timer), the software must take the appropriate action to turn off the driver before entering stop mode. 15.1.3 Block Diagram Figure 15-1 shows a block diagram of the LSDRV module. The module consists of a control and an output stage. Internal functions can be routed to control the low-side drivers. See PIM chapter for routing options. Figure 15-1. LSDRV Block Diagram LS0 control LS1 control Low Side Driver Control LS0 LSGND LS1 MC9S12VR Family Reference Manual, Rev. 4.2 428 NXP Semiconductor Low-Side Drivers - LSDRV (S12LSDRV1) 15.2 External Signal Description Table 15-2 shows the external pins associated with the LSDRV module. Table 15-2. LSDRV Signal Properties Name Function LS0 LS1 LSGND 15.2.1 Reset State Low-side driver output 0 disabled (off) Low-side driver output 1 disabled (off) Low-side driver ground pin — LS0, LS1— Low Side Driver Pins Outputs of the two low-side drivers intended to drive inductive loads (relays). 15.2.2 LSGND — Low Side Driver Ground Pin Common current sink for both low-side driver pins. This pin should be connected on-board to the common ground. 15.3 Memory Map and Register Definition This section provides a detailed description of all registers accessible in the LSDRV module. 15.3.1 Module Memory Map A summary of registers associated with the LSDRV module is shown in Table 15-3. Detailed descriptions of the registers and bits are given in the following sections. NOTE Register Address = Module Base Address + Address Offset, where the Module Base Address is defined at the MCU level and the Address Offset is defined at the module level. Table 15-3. Register Summary Address Offset Register Name Bit 7 6 5 4 3 2 0 0 LSOLE1 Reserved 0x0000 LSDR R W 0 0 0 0 0x0001 LSCR R W 0 0 0 0 0x0002 Reserved R W Reserved Reserved Reserved Reserved 1 Bit 0 LSDR1 LSDR0 LSOLE0 LSE1 LSE0 Reserved Reserved Reserved MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 429 Low-Side Drivers - LSDRV (S12LSDRV1) Table 15-3. Register Summary Address Offset Register Name Bit 7 6 5 4 3 2 1 Bit 0 Reserved Reserved Reserved Reserved Reserved Reserved Reserved Reserved 0x0003 Reserved R W 0x0004 Reserved R W 0 0 0 0 0 0 0 0 0x0005 LSSR R W 0 0 0 0 0 0 LSOL1 LSOL0 0x0006 LSIE R W 0 0 0 0 0 0 0 0x0007 LSIF R W 0 0 0 0 0 LSOCIF1 LSOCIF0 LSOCIE 0 MC9S12VR Family Reference Manual, Rev. 4.2 430 NXP Semiconductor Low-Side Drivers - LSDRV (S12LSDRV1) 15.3.2 Register Definition 15.3.3 Port LS Data Register (LSDR) Access: User read/write1 Module Base + 0x0000 7 6 5 4 3 2 0 0 0 0 0 0 Altern. Read Function 0 0 0 0 0 0 Reset 0 0 0 0 0 0 R W 1 0 LSDR1 LSDR0 OC2 OC2 PWM2 PWM2 0 0 = Unimplemented Figure 15-2. Port LS Data Register (LSDR) 1 Read: Anytime. The data source (LSDRx or alternate function) depends on the LSE control bit settings. Write: Anytime 2 See PIM chapter for detailed routing description. Table 15-4. LSDR Register Field Descriptions Field Description 1-0 LSDRx Port LS Data Bits—Data registers or routed timer outputs or routed PWM outputs These register bits can be used to control the low-side drivers if selected as control source. See PIM section for routing details. If the associated LSEx bit is set to 0, a read returns the value of the Port LS Data Register (LSDRx). If the associated LSEx bit is set to 1, a read returns the value of the selected control source for the driver. When entering in STOP mode the Port LS Data Register (LSDR) is cleared. 0 Low-side driver is turned off 1 Low-side driver is turned on NOTE After enabling the low-side driver with the LSEx bit in LSCR register, the user must wait a minimum settling time tLS_settling before turning on the low-side driver. NOTE The low-side driver should be turned off (e.g. LDSRx=0 or OC=0 or PWM=0) and the load should be de-energized before going into Stop Mode or disabling the low-side driver with the LSEx bits. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 431 Low-Side Drivers - LSDRV (S12LSDRV1) 15.3.4 LSDRV Configuration Register (LSCR) Access: User read/write1 Module Base + 0x0001 R 7 6 5 4 0 0 0 0 0 0 0 0 W Reset 3 2 1 0 LSOLE1 LSOLE0 LSE1 LSE0 0 0 0 0 = Unimplemented Figure 15-3. LSDRV Configuration Register (LSCR) 1 Read: Anytime Write: Anytime Table 15-5. LSCR Register Field Descriptions Field 3-2 LSOLEx Description LSDRV High-Load Resistance Open-Load Detection Enable These bits enable the measurement function to detect an open-load condition on the related low-side driver operating on high-load resistance loads. If the low-side driver is enabled and is not being driven by the selected source, then the high-load resistance detection circuit is activated when this bit is set to ‘1’. 0 high-load resistance open-load detection is disabled 1 high-load resistance open-load detection is enabled 1-0 LSEx LSDRV Enable These bits control the bias of the related low-side driver circuit. 0 Low-side driver is disabled. 1 Low-side driver is enabled. NOTE After enabling the low-side driver (write “1” to LSEx) a settling time tLS_settling is required before the low-side driver is allowed to be turned on (e.g. by writing LSDRx bits). MC9S12VR Family Reference Manual, Rev. 4.2 432 NXP Semiconductor Low-Side Drivers - LSDRV (S12LSDRV1) 15.3.5 LSDRV Status Register (LSSR) Access: User read1 Module Base + 0x0005 R 7 6 5 4 3 2 1 0 0 0 0 0 0 0 LSOL1 LSOL0 0 0 0 0 0 0 0 0 W Reset = Unimplemented Figure 15-4. LSDRV Status Register (LSSR) 1 Read: Anytime Write: No Write Table 15-6. LSSR - Register Field Descriptions Field Description 1-0 LSOLx LSDRV Open-Load Status Bits These bits reflect the open-load condition status on each driver related pin. This open-load monitoring will only be active if the detection function is enabled (bits LSOLEx) and the corresponding low-side driver is enabled and turned off. A delay of tHLROLDT must be granted after enabling the high-load resistance open-load detection function in order to read valid data. 0 Open-load condition ILS IHLROLDC 1 Open-load condition ILS IHLROLDC MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 433 Low-Side Drivers - LSDRV (S12LSDRV1) 15.3.6 LSDRV Interrupt Enable Register (LSIE) Access: User read/write1 Module Base + 0x0006 7 R W LSOCIE Reset 0 6 5 4 3 2 1 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 = Unimplemented Figure 15-5. LSDRV Interrupt Enable Register (LSIE) 1 Read: Anytime Write: Anytime Table 15-7. LSIE Register Field Descriptions Field 7 LSOCIE Description LSDRV Error Interrupt Enable 0 Interrupt request is disabled 1 Interrupt will be requested whenever a LSOCIFx flag is set MC9S12VR Family Reference Manual, Rev. 4.2 434 NXP Semiconductor Low-Side Drivers - LSDRV (S12LSDRV1) 15.3.7 LSDRV Interrupt Flag Register (LSIF) Access: User read/write1 Module Base + 0x0007 R 7 6 5 4 3 2 0 0 0 0 0 0 0 0 0 0 0 0 W Reset 1 0 LSOCIF1 LSOCIF0 0 0 = Unimplemented Figure 15-6. LSDRV Interrupt Flag Register (LSIF) 1 Read: Anytime Write: Write 1 to clear, writing 0 has no effect Table 15-8. LSIF Register Field Descriptions Field Description 1-0 LSOCIFx LSDRV Over-Current Interrupt Flag These flags are set to 1 when an over-current event occurs on the related low-side driver (ILS > ILIMLSX). While set the related low-side driver is turned off. Once these flags are cleared, the related driver is again driven by the source selected in PIM module. 0 No over-current event occurred since last clearing of flag 1 An over-current event occurred since last clearing of flag MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 435 Low-Side Drivers - LSDRV (S12LSDRV1) 15.4 15.4.1 Functional Description General The LSDRV module provides two low-side drivers able to drive inductive loads (relays). The driver can be controlled directly through register bits or alternatively by dedicated timer or PWM channels. See PIM section for routing details. Both drivers feature an open-load and over-current detection described in the following sub-sections. In addition to this an active clamp (for driving relays) is protecting each driver stage. The active clamp will turn on a low-side FET if the voltage on a pin exceeds VCLAMP when the driver is turned off. 15.4.2 Open-Load Detection A “High-load resistance Open Load Detection” can be enabled for each driver by setting the corresponding LSOLEx bit (refer to Section 15.3.4, “LSDRV Configuration Register (LSCR)”. This detection will only be executed when the driver is enabled and it is not being driven (LSDRx = 0). That is because the measurement point is between the load and the driver, and the current should not go through the driver. To detect an open-load condition the voltage will be observed at the output from the driver. Then if the driving pin LSx stays at low voltage which is approximately LSGND, there is no load for the corresponding low-side driver. An open-load condition is flagged with bits LSOL0 and LSOL1 in the LSDRV Status Register (LSSR). 15.4.3 Over-Current Detection Each low-side driver has an over-current detection while enabled with a current threshold of ILIMLSX. If over-current is detected the related interrupt flag (LSOCIF1 or LSOCIF0) is set in the LSDRV Interrupt Flag Register (LSIF). As long as the over-current interrupt flag remains set the related low-side driver is turned off to protect the circuit.Clearing the related over-current interrupt flag returns back the control of the driver to the selected source in the PIM module. NOTE The open-load detection is only active if the selected source (e.g. PWM, Timer, LSDRx) for the low-side driver is turned off. 15.4.4 Interrupts This section describes the interrupt generated by LSDRV module. The interrupt is only available in MCU run mode. Entering and exiting MCU stop mode has no effect on the interrupt flags. The LSDRV interrupt vector is named in Table 15-9. Vector addresses and interrupt priorities are defined at MCU level. MC9S12VR Family Reference Manual, Rev. 4.2 436 NXP Semiconductor Low-Side Drivers - LSDRV (S12LSDRV1) Table 15-9. LSDRV Interrupt Sources Module Interrupt Source Module Internal Interrupt Source Local Enable LSDRV Interrupt (LSI) LSDRV Over-Current Interrupt (LSOCI) LSOCIE=1 15.4.4.1 LSDRV Over Current Interrupt (LSOCI) If a low-side driver over-current event is detected the related interrupt flag LSOCIFx asserts. Depending on the setting of the LSDRV Error Interrupt Enable (LSOCIE) bit an interrupt is requested. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 437 Low-Side Drivers - LSDRV (S12LSDRV1) MC9S12VR Family Reference Manual, Rev. 4.2 438 NXP Semiconductor Chapter 16 LIN Physical Layer (S12LINPHYV2) Table 16-1. Revision History Table Rev. No. (Item No.) V02.11 V02.12 V02.13 16.1 Date (Submitted Sections Affected By) 19 Sep 2013 All 20 Sep 2013 Standby Mode 8 Oct 2013 All Substantial Change(s) - Removed preliminary note. - Fixed grammar and spelling throughout the document. - Clarified Standby mode behavior. - More grammar, spelling, and formating fixes throughout the document. Introduction The LIN (Local Interconnect Network) bus pin provides a physical layer for single-wire communication in automotive applications. The LIN Physical Layer is designed to meet the LIN Physical Layer 2.2 specification from LIN consortium. 16.1.1 Features The LIN Physical Layer module includes the following distinctive features: • Compliant with LIN Physical Layer 2.2 specification. • Compliant with the SAE J2602-2 LIN standard. • Standby mode with glitch-filtered wake-up. • Slew rate selection optimized for the baud rates: 10.4 kbit/s, 20 kbit/s and Fast Mode (up to 250 kbit/s). • Switchable 34 k/330 k pullup resistors (in shutdown mode, 330 konly • Current limitation for LIN Bus pin falling edge. • Overcurrent protection. • LIN TxD-dominant timeout feature monitoring the LPTxD signal. • Automatic transmitter shutdown in case of an overcurrent or TxD-dominant timeout. • Fulfills the OEM “Hardware Requirements for LIN (CAN and FlexRay) Interfaces in Automotive Applications” v1.3. The LIN transmitter is a low-side MOSFET with current limitation and overcurrent transmitter shutdown. A selectable internal pullup resistor with a serial diode structure is integrated, so no external pullup components are required for the application in a slave node. To be used as a master node, an external MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 439 LIN Physical Layer (S12LINPHYV2) resistor of 1 k must be placed in parallel between VLINSUP and the LIN Bus pin, with a diode between VLINSUP and the resistor. The fall time from recessive to dominant and the rise time from dominant to recessive is selectable and controlled to guarantee communication quality and reduce EMC emissions. The symmetry between both slopes is guaranteed. 16.1.2 Modes of Operation The LIN Physical Layer can operate in the following four modes: 1. Shutdown Mode The LIN Physical Layer is fully disabled. No wake-up functionality is available. The internal pullup resistor is replaced by a high ohmic one (330 k) to maintain the LIN Bus pin in the recessive state. All registers are accessible. 2. Normal Mode The full functionality is available. Both receiver and transmitter are enabled. 3. Receive Only Mode The transmitter is disabled and the receiver is running in full performance mode. 4. Standby Mode The transmitter of the LIN Physical Layer is disabled. If the wake-up feature is enabled, the internal pullup resistor can be selected (330 k or 34 k). The receiver enters a low power mode and optionally it can pass wake-up events to the Serial Communication Interface (SCI). If the wake-up feature is enabled and if the LIN Bus pin is driven with a dominant level longer than tWUFR followed by a rising edge, the LIN Physical Layer sends a wake-up pulse to the SCI, which requests a wake-up interrupt. (This feature is only available if the LIN Physical Layer is routed to the SCI). 16.1.3 Block Diagram Figure 16-1 shows the block diagram of the LIN Physical Layer. The module consists of a receiver with wake-up control, a transmitter with slope and timeout control, a current sensor with overcurrent protection as well as a registers control block. MC9S12VR Family Reference Manual, Rev. 4.2 440 NXP Semiconductor LIN Physical Layer (S12LINPHYV2) + *, "#$% # ! ''() ** & %+"#$- , * .* * * Figure 16-1. LIN Physical Layer Block Diagram NOTE The external 220 pF capacitance between LIN and LGND is strongly recommended for correct operation. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 441 LIN Physical Layer (S12LINPHYV2) 16.2 External Signal Description This section lists and describes the signals that connect off chip as well as internal supply nodes and special signals. 16.2.1 LIN — LIN Bus Pin This pad is connected to the single-wire LIN data bus. 16.2.2 LGND — LIN Ground Pin This pin is the device LIN ground connection. It is used to sink currents related to the LIN Bus pin. A de-coupling capacitor external to the device (typically 220 pF, X7R ceramic) between LIN and LGND can further improve the quality of this ground and filter noise. 16.2.3 VLINSUP — Positive Power Supply External power supply to the chip. The VLINSUP supply mapping is described in device level documentation. 16.2.4 LPTxD — LIN Transmit Pin This pin can be routed to the SCI, LPDR1 register bit, an external pin, or other options. Please refer to the PIM chapter of the device specification for the available routing options. This input is only used in normal mode; in other modes the value of this pin is ignored. 16.2.5 LPRxD — LIN Receive Pin This pin can be routed to the SCI, an external pin, or other options. Please refer to the PIM chapter of the device specification for the available routing options. In standby mode this output is disabled, and sends only a short pulse in case the wake-up functionality is enabled and a valid wake-up pulse was received in the LIN Bus. MC9S12VR Family Reference Manual, Rev. 4.2 442 NXP Semiconductor LIN Physical Layer (S12LINPHYV2) 16.3 Memory Map and Register Definition This section provides a detailed description of all registers accessible in the LIN Physical Layer. 16.3.1 Module Memory Map A summary of the registers associated with the LIN Physical Layer module is shown in Table 16-2. Detailed descriptions of the registers and bits are given in the subsections that follow. NOTE Register Address = Module Base Address + Address Offset, where the Module Base Address is defined at the MCU level and the Address Offset is defined at the module level. Address Offset Register Name Bit 7 6 5 4 3 2 1 Bit 0 0 0 LPE RXONLY LPWUE LPPUE Reserved Reserved LPSLR1 LPSLR0 0x0000 LPDR R W 0 0 0 0 0x0001 LPCR R W 0 0 0 0 0x0002 Reserved R W Reserved Reserved Reserved Reserved Reserved Reserved 0x0003 LPSLRM R LPDTDIS W 0 0 0 0 0 0x0004 Reserved R W Reserved Reserved Reserved Reserved Reserved Reserved Reserved Reserved 0x0005 LPSR R W LPDT 0 0 0 0 0 0 0 0x0006 LPIE R W LPDTIE LPOCIE 0 0 0 0 0 0 0x0007 LPIF R W LPDTIF LPOCIF 0 0 0 0 0 0 LPDR1 LPDR0 Figure 16-2. Register Summary MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 443 LIN Physical Layer (S12LINPHYV2) 16.3.2 Register Descriptions This section describes all the LIN Physical Layer registers and their individual bits. 16.3.2.1 Port LP Data Register (LPDR) Access: User read/write1 Module Base + Address 0x0000 R 7 6 5 4 3 2 0 0 0 0 0 0 0 0 0 0 0 0 W Reset 1 0 LPDR1 1 LPDR0 1 = Unimplemented Figure 16-3. Port LP Data Register (LPDR) 1 Read: Anytime Write: Anytime Table 16-2. LPDR Field Description Field Description 1 LPDR1 Port LP Data Bit 1 — The LIN Physical Layer LPTxD input (see Figure 16-1) can be directly controlled by this register bit. The routing of the LPTxD input is done in the Port Inetrgation Module (PIM). Please refer to the PIM chapter of the device Reference Manual for more info. 0 LPDR0 Port LP Data Bit 0 — Read-only bit. The LIN Physical Layer LPRxD output state can be read at any time. MC9S12VR Family Reference Manual, Rev. 4.2 444 NXP Semiconductor LIN Physical Layer (S12LINPHYV2) 16.3.2.2 LIN Control Register (LPCR) Access: User read/write1 Module Base + Address 0x0001 R 7 6 5 4 0 0 0 0 0 0 0 W Reset 0 3 2 1 0 LPE RXONLY LPWUE LPPUE 0 0 0 0 = Unimplemented Figure 16-4. LIN Control Register (LPCR) 1 Read: Anytime Write: Anytime, Table 16-3. LPCR Field Description Field Description 3 LPE LIN Enable Bit — If set, this bit enables the LIN Physical Layer. 0 The LIN Physical Layer is in shutdown mode. None of the LIN Physical Layer functions are available, except that the bus line is held in its recessive state by a high ohmic (330k) resistor. All registers are normally accessible. 1 The LIN Physical Layer is not in shutdown mode. 2 RXONLY Receive Only Mode bit — This bit controls RXONLY mode. 0 The LIN Physical Layer is not in receive only mode. 1 The LIN Physical Layer is in receive only mode. 1 LPWUE LIN Wake-Up Enable — This bit controls the wake-up feature in standby mode. 0 In standby mode the wake-up feature is disabled. 1 In standby mode the wake-up feature is enabled. 0 LPPUE LIN Pullup Resistor Enable — Selects pullup resistor. 0 The pullup resistor is high ohmic (330 k). 1 The 34 kpullup is switched on (except if LPE=0 or when in standby mode with LPWUE=0) MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 445 LIN Physical Layer (S12LINPHYV2) 16.3.2.3 Reserved Register Access: User read/write1 Module Base + Address 0x0002 R W Reset 7 6 5 4 3 2 1 0 Reserved Reserved Reserved Reserved Reserved Reserved Reserved Reserved x x x x x x x x = Unimplemented Figure 16-5. LIN Test register 1 Read: Anytime Write: Only in special mode NOTE This reserved register is designed for factory test purposes only, and is not intended for general user access. Writing to this register when in special mode can alter the module’s functionality. Table 16-4. Reserved Register Field Description Field 7-0 Reserved 16.3.2.4 Description These reserved bits are used for test purposes. Writing to these bits can alter the module functionality. LIN Slew Rate Mode Register (LPSLRM) Access: User read/write1 Module Base + Address 0x0003 7 R W Reset LPDTDIS 0 6 5 4 3 2 0 0 0 0 0 0 0 0 0 0 1 0 LPSLR1 LPSLR0 0 0 = Unimplemented Figure 16-6. LIN Slew Rate Mode Register (LPSLRM) 1 Read: Anytime Write: Only in shutdown mode (LPE=0) MC9S12VR Family Reference Manual, Rev. 4.2 446 NXP Semiconductor LIN Physical Layer (S12LINPHYV2) Table 16-5. LPSLRM Field Description Field Description 7 LPDTDIS TxD-dominant timeout disable Bit — This bit disables the TxD-dominant timeout feature. Disabling this feature is only recommended for using the LIN Physical Layer for other applications than LIN protocol. It is only writable in shutdown mode (LPE=0). 0 TxD-dominant timeout feature is enabled. 1 TxD-dominant timeout feature is disabled. 1-0 LPSLR[1:0] Slew-Rate Bits — Please see section Section 16.4.2, “Slew Rate and LIN Mode Selection for details on how the slew rate control works. These bits are only writable in shutdown mode (LPE=0). 00 Normal Slew Rate (optimized for 20 kbit/s). 01 Slow Slew Rate (optimized for 10.4 kbit/s). 10 Fast Mode Slew Rate (up to 250 kbit/s). This mode is not compliant with the LIN Protocol (LIN electrical characteristics like duty cycles, reference levels, etc. are not fulfilled). It is only meant to be used for fast data transmission. Please refer to section Section 16.4.2.2, “Fast Mode (not LIN compliant) for more details on fast mode.Please note that an external pullup resistor stronger than 1 k might be necessary for the range 100 kbit/s to 250 kbit/s. 11 Reserved . 16.3.2.5 Reserved Register Access: User read/write1 Module Base + Address 0x0004 R W Reset 7 6 5 4 3 2 1 0 Reserved Reserved Reserved Reserved Reserved Reserved Reserved Reserved x x x x x x x x = Unimplemented Figure 16-7. Reserved Register 1 Read: Anytime Write: Only in special mode NOTE This reserved register is designed for factory test purposes only, and is not intended for general user access. Writing to this register when in special mode can alter the module’s functionality. Table 16-6. Reserved Register Field Description Field 7-0 Reserved Description These reserved bits are used for test purposes. Writing to these bits can alter the module functionality. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 447 LIN Physical Layer (S12LINPHYV2) 16.3.2.6 LIN Status Register (LPSR) Access: User read/write1 Module Base + Address 0x0005 R 7 6 5 4 3 2 1 0 LPDT 0 0 0 0 0 0 0 0 0 0 0 0 0 0 W Reset 0 = Unimplemented Figure 16-8. LIN Status Register (LPSR) 1 Read: Anytime Write: Never, writes to this register have no effect Table 16-7. LPSR Field Description Field Description 7 LPDT LIN Transmitter TxD-dominant timeout Status Bit — This read-only bit signals that the LPTxD pin is still dominant after a TxD-dominant timeout. As long as the LPTxD is dominant after the timeout the LIN transmitter is shut down and the LPTDIF is set again after attempting to clear it. 0 If there was a TxD-dominant timeout, LPTxD has ceased to be dominant after the timeout. 1 LPTxD is still dominant after a TxD-dominant timeout. MC9S12VR Family Reference Manual, Rev. 4.2 448 NXP Semiconductor LIN Physical Layer (S12LINPHYV2) 16.3.2.7 LIN Interrupt Enable Register (LPIE) Access: User read/write1 Module Base + Address 0x0006 7 R W LPDTIE Reset 0 6 LPOCIE 0 5 4 3 2 1 0 0 0 0 0 0 0 0 0 0 0 0 0 = Unimplemented Figure 16-9. LIN Interrupt Enable Register (LPIE) 1 Read: Anytime Write: Anytime Table 16-8. LPIE Field Description Field Description 7 LPDTIE LIN transmitter TxD-dominant timeout Interrupt Enable — 0 Interrupt request is disabled. 1 Interrupt is requested if LPDTIF bit is set. 6 LPOCIE LIN transmitter Overcurrent Interrupt Enable — 0 Interrupt request is disabled. 1 Interrupt is requested if LPOCIF bit is set. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 449 LIN Physical Layer (S12LINPHYV2) 16.3.2.8 LIN Interrupt Flags Register (LPIF) Access: User read/write1 Module Base + Address 0x0007 R W Reset 7 6 LPDTIF LPOCIF 0 0 5 4 3 2 1 0 0 0 0 0 0 0 0 0 0 0 0 0 = Unimplemented Figure 16-10. LIN Interrupt Flags Register (LPIF) 1 Read: Anytime Write: Writing ‘1’ clears the flags, writing a ‘0’ has no effect Table 16-9. LPIF Field Description Field Description 7 LPDTIF LIN Transmitter TxD-dominant timeout Interrupt Flag — LPDTIF is set to 1 when LPTxD is still dominant (0) after tTDLIM of the falling edge of LPTxD. For protection, the transmitter is disabled. This flag can only be cleared by writing a 1. Writing a 0 has no effect. Please make sure that LPDTIF=1 before trying to clear it. Clearing LPDTIF is not allowed if LPDTIF=0 already. If the LPTxD is still dominant after clearing the flag, the transmitter stays disabled and this flag is set again (see 16.4.4.2 TxD-dominant timeout Interrupt). If interrupt requests are enabled (LPDTIE= 1), LPDTIF causes an interrupt request. 0 No TxD-dominant timeout has occurred. 1 A TxD-dominant timeout has occurred. 6 LPOCIF LIN Transmitter Overcurrent Interrupt Flag — LPOCIF is set to 1 when an overcurrent event happens. For protection, the transmitter is disabled. This flag can only be cleared by writing a 1. Writing a 0 has no effect. Please make sure that LPOCIF=1 before trying to clear it. Clearing LPOCIF is not allowed if LPOCIF=0 already. If the overcurrent is still present or LPTxD is dominant after clearing the flag, the transmitter stays disabled and this flag is set again (see16.4.4.1 Overcurrent Interrupt). If interrupt requests are enabled (LPOCIE= 1), LPOCIF causes an interrupt request. 0 No overcurrent event has occurred. 1 Overcurrent event has occurred. MC9S12VR Family Reference Manual, Rev. 4.2 450 NXP Semiconductor LIN Physical Layer (S12LINPHYV2) 16.4 16.4.1 Functional Description General The LIN Physical Layer module implements the physical layer of the LIN interface. This physical layer can be driven by the SCI (Serial Communication Interface) module or directly through the LPDR register. 16.4.2 Slew Rate and LIN Mode Selection The slew rate can be selected for Electromagnetic Compatibility (EMC) optimized operation at 10.4 kbit/s and 20 kbit/s as well as at fast baud rate (up to 250 kbit/s) for test and programming. The slew rate can be chosen with the bits LPSLR[1:0] in the LIN Slew Rate Mode Register (LPSLRM). The default slew rate corresponds to 20 kbit/s. The LIN Physical Layer can also be configured to be used for non-LIN applications (for example, to transmit a PWM pulse) by disabling the TxD-dominant timeout (LPDTDIS=1). Changing the slew rate (LPSLRM Register) during transmission is not allowed in order to avoid unwanted effects. To change the register, the LIN Physical Layer must first be disabled (LPE=0). Once it is updated the LIN Physical Layer can be enabled again. NOTE For 20 kbit/s and Fast Mode communication speeds, the corresponding slew rate MUST be set; otherwise, the communication is not guaranteed (violation of the specified LIN duty cycles). For 10.4 kbit/s, the 20 kbit/s slew rate can be set but the EMC performance is worse. The up to 250 kbit/s slew rate must be chosen ONLY for fast mode, not for any of the 10.4 kbit/s or 20 kbit/s LIN compliant communication speeds. 16.4.2.1 10.4 kbit/s and 20 kbit/s When the slew rate is chosen for 10.4 kbit/s or 20 kbit/s communication, a control loop is activated within the module to make the rise and fall times of the LIN bus independent from VLINSUP and the load on the bus. 16.4.2.2 Fast Mode (not LIN compliant) Choosing this slew rate allows baud rates up to 250 kbit/s by having much steeper edges (please refer to electricals). As for the 10.4 kbit/s and 20 kbit/s modes, the slope control loop is also engaged. This mode is used for fast communication only, and the LIN electricals are not supported (for example, the LIN duty cycles). A stronger external pullup resistor might be necessary to sustain communication speeds up to 250 kbit/s. The LIN signal (and therefore the receive LPRxD signal) might not be symmetrical for high baud rates with high loads on the bus. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 451 LIN Physical Layer (S12LINPHYV2) Please note that if the bit time is smaller than the parameter tOCLIM (please refer to electricals), then no overcurrent is reported nor does an overcurrent shutdown occur. However, the current limitation is always engaged in case of a failure. 16.4.3 Modes Figure 16-11 shows the possible mode transitions depending on control bits, stop mode, and error conditions. 16.4.3.1 Shutdown Mode The LIN Physical Layer is fully disabled. No wake-up functionality is available. The internal pullup resistor is high ohmic only (330 k) to maintain the LIN Bus pin in the recessive state. LPTxD is not monitored in this mode for a TxD-dominant timeout. All the registers are accessible. Setting LPE causes the module to leave the shutdown mode and to enter the normal mode or receive only mode (if RXONLY bit is set). Clearing LPE causes the module to leave the normal or receive only modes and go back to shutdown mode. 16.4.3.2 Normal Mode The full functionality is available. Both receiver and transmitter are enabled. The internal pullup resistor can be chosen to be high ohmic (330 k) if LPPUE = 0, or LIN compliant (34 k if LPPUE = 1. If RXONLY is set, the module leaves normal mode to enter receive only mode. If the MCU enters stop mode, the LIN Physical Layer enters standby mode. 16.4.3.3 Receive Only Mode Entering this mode disables the transmitter and immediately stops any on-going transmission. LPTxD is not monitored in this mode for a TxD-dominant timeout. The receiver is running in full performance mode in all cases. To return to normal mode, the RXONLY bit must be cleared. If the device enters stop mode, the module leaves receive only mode to enter standby mode. 16.4.3.4 Standby Mode with Wake-Up Feature The transmitter of the LIN Physical Layer is disabled and the receiver enters a low power mode. NOTE Before entering standby mode, ensure no transmissions are ongoing. If LPWUE is not set, no wake up feature is available and the standby mode has the same electrical properties as the shutdown mode. This allows a low-power consumption of the device in stop mode if the wake-up feature is not needed. MC9S12VR Family Reference Manual, Rev. 4.2 452 NXP Semiconductor LIN Physical Layer (S12LINPHYV2) If LPWUE is set the receiver is able to pass wake-up events to the SCI (Serial Communication Interface). If the LIN Physical Layer receives a dominant level longer than tWUFR followed by a rising edge, it sends a pulse to the SCI which can generate a wake-up interrupt. Once the device exits stop mode, the LIN Physical Layer returns to normal or receive only mode depending on the status of the RXONLY bit. NOTE Since the wake-up interrupt is requested by the SCI, the wake-up feature is not available if the SCI is not used. The internal pullup resistor is selectable only if LPWUE = 1 (wake-up enabled). If LPWUE = 0, the internal pullup resistor is not selectable and remains at 330 k regardless of the state of the LPPUE bit. If LPWUE = 1, selecting the 330 k pullup resistor (LPPUE = 0) reduces the current consumption in standby mode. NOTE When using the LIN wake-up feature in combination with other non-LIN device wake-up features (like a periodic time interrupt), some care must be taken. If the device leaves stop mode while the LIN bus is dominant, the LIN Physical Layer returns to normal or receive only mode and the LIN bus is re-routed to the RXD pin of the SCI and triggers the edge detection interrupt (if the interrupt’s priority of the hardware that awakes the MCU is less than the priority of the SCI interrupt, then the SCI interrupt will execute first). It is up to the software to decide what to do in this case because the LIN Physical Layer can not guarantee it was a valid wake-up pulse. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 453 LIN Physical Layer (S12LINPHYV2) & &' # # # # ! "! #$"! ! "! #$"! "!%%! "! "! #$"! Figure 16-11. LIN Physical Layer Mode Transitions MC9S12VR Family Reference Manual, Rev. 4.2 454 NXP Semiconductor LIN Physical Layer (S12LINPHYV2) 16.4.4 Interrupts The interrupt vector requested by the LIN Physical Layer is listed in Table 16-10. Vector address and interrupt priority is defined at the MCU level. The module internal interrupt sources are combined into a single interrupt request at the device level. Table 16-10. Interrupt Vectors Module Interrupt Source Module Internal Interrupt Source Local Enable LIN Interrupt (LPI) LIN Txd-Dominant Timeout Interrupt (LPDTIF) LPDTIE = 1 LIN Overcurrent Interrupt (LPOCIF) LPOCIE = 1 16.4.4.1 Overcurrent Interrupt The transmitter is protected against overcurrent. In case of an overcurrent condition occurring within a time frame called tOCLIM starting from LPTxD falling edge, the current through the transmitter is limited (the transmitter is not shut down). The masking of an overcurrent event within the time frame tOCLIM is meant to avoid “false” overcurrent conditions that can happen during the discharging of the LIN bus. If an overcurrent event occurs out of this time frame, the transmitter is disabled and the LPOCIF flag is set. In order to re-enable the transmitter again, the following prerequisites must be met: 1) Overcurrent condition is over 2) LPTxD is recessive or the LIN Physical Layer is in shutdown or receive only mode for a minimum of a transmit bit time. To re-enable the transmitter then, the LPOCIF flag must be cleared (by writing a 1). NOTE Please make sure that LPOCIF=1 before trying to clear it. It is not allowed to try to clear LPOCIF if LPOCIF=0 already. After clearing LPOCIF, if the overcurrent condition is still present or the LPTxD pin is dominant while being in normal mode, the transmitter remains disabled and the LPOCIF flag is set again after a time to indicate that the attempt to re-enable has failed. This time is equal to: • minimum 1 IRC period (1 us) + 2 bus periods • maximum 2 IRC periods (2 us) + 3 bus periods If the bit LPOCIE is set in the LPIE register, an interrupt is requested. Figure 16-12 shows the different scenarios for overcurrent interrupt handling. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 455 LIN Physical Layer (S12LINPHYV2) !"# $ %$ ##& !"# $ %$ # "# !"# $ % Figure 16-12. Overcurrent interrupt handling 16.4.4.2 TxD-dominant timeout Interrupt To protect the LIN bus from a network lock-up, the LIN Physical Layer implements a TxD-dominant timeout mechanism. When the LPTxD signal has been dominant for more than tDTLIM the transmitter is disabled and the LPDT status flag and the LPDTIF interrupt flag are set. In order to re-enable the transmitter again, the following prerequisites must be met: 1) TxD-dominant condition is over (LPDT=0) 2) LPTxD is recessive or the LIN Physical Layer is in shutdown or receive only mode for a minimum of a transmit bit time To re-enable the transmitter then, the LPDTIF flag must be cleared (by writing a 1). NOTE Please make sure that LPDTIF=1 before trying to clear it. It is not allowed to try to clear LPDTIF if LPDTIF=0 already. MC9S12VR Family Reference Manual, Rev. 4.2 456 NXP Semiconductor LIN Physical Layer (S12LINPHYV2) After clearing LPDTIF, if the TxD-dominant timeout condition is still present or the LPTxD pin is dominant while being in normal mode, the transmitter remains disabled and the LPDTIF flag is set after a time again to indicate that the attempt to re-enable has failed. This time is equal to: • minimum 1 IRC period (1 us) + 2 bus periods • maximum 2 IRC periods (2 us) + 3 bus periods If the bit LPDTIE is set in the LPIE register, an interrupt is requested. Figure 16-13 shows the different scenarios of TxD-dominant timeout interrupt handling. !"! ! ! # !"! ! !"! Figure 16-13. TxD-dominant timeout interrupt handling MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 457 LIN Physical Layer (S12LINPHYV2) 16.5 16.5.1 Application Information Module Initialization The following steps should be used to configure the module before starting the transmission: 1. Set the slew rate in the LPSLRM register to the desired transmission baud rate. 2. When using the LIN Physical Layer for other purposes than LIN transmission, de-activate the dominant timeout feature in the LPSLRM register if needed. 3. In most cases, the internal pullup should be enabled in the LPCR register. 4. Route the desired source in the PIM module to the LIN Physical Layer. 5. Select the transmit mode (Receive only mode or Normal mode) in the LPCR register. 6. If the SCI is selected as source, activate the wake-up feature in the LPCR register if needed for the application (SCI active edge interrupt must also be enabled). 7. Enable the LIN Physical Layer in the LPCR register. 8. Wait for a minimum of a transmit bit. 9. Begin transmission if needed. NOTE It is not allowed to try to clear LPOCIF or LPDTIF if they are already cleared. Before trying to clear an error flag, always make sure that it is already set. 16.5.2 Interrupt handling in Interrupt Service Routine (ISR) Both interrupts (TxD-dominant timeout and overcurrent) represent a failure in transmission. To avoid more disturbances on the transmission line, the transmitter is de-activated in both cases. The interrupt subroutine must take care of clearing the error condition and starting the routine that re-enables the transmission. For that purpose, the following steps are recommended: 1. First, the cause of the interrupt must be cleared: — The overcurrent will be gone after the transmitter has been disabled. — The TxD-dominant timeout condition will be gone once the selected source for LPTxD has turned recessive. 2. Clear the corresponding enable bit (LPDTIE or LPOCIE) to avoid entering the ISR again until the flags are cleared. 3. Notify the application of the error condition (LIN Error handler) and leave the ISR. In the LIN Error handler, the following sequence is recommended: 1. Disable the LIN Physical Layer (LPCR) while re-configuring the transmission. — If the receiver must remain enabled, set the LIN Physical Layer into receive only mode instead. 2. Do all required configurations (SCI, etc.) to re-enable the transmission. 3. Wait for a transmit bit (this is needed to successfully re-enable the transmitter). MC9S12VR Family Reference Manual, Rev. 4.2 458 NXP Semiconductor LIN Physical Layer (S12LINPHYV2) 4. 5. 6. 7. Clear the error flag. Enable the interrupts again (LPDTIE and LPOCIE). Enable the LIN Physical Layer or leave the receive only mode (LPCR register). Wait for a minimum of a transmit bit before beginning transmission again. If there is a problem re-enabling the transmitter, then the error flag will be set again during step 3 and the ISR will be called again. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 459 LIN Physical Layer (S12LINPHYV2) MC9S12VR Family Reference Manual, Rev. 4.2 460 NXP Semiconductor Chapter 17 Supply Voltage Sensor - (BATSV2) Table 17-1. Revision History Table Rev. No. (Item No.) Data Sections Affected Substantial Change(s) V01.00 15 Dec 2010 all Initial Version V02.00 16 Mar 2011 17.3.2.1 17.4.2.1 - added BVLS[1] to support four voltage level - moved BVHS to register bit 6 17.1 Introduction The BATS module provides the functionality to measure the voltage of the battery supply pin VSENSE or of the chip supply pin VSUP. 17.1.1 Features Either One of the voltage present on the VSENSE or VSUP pin can be routed via an internal divider to the internal Analog to Digital Converter. Independent of the routing to the Analog to Digital Converter, it is possible to route one of these voltages to a comparator to generate a low or a high voltage interrupt to alert the MCU. 17.1.2 Modes of Operation The BATS module behaves as follows in the system power modes: 1. Run mode The activation of the VSENSE Level Sense Enable (BSESE=1) or ADC connection Enable (BSEAE=1) closes the path from the VSENSE pin through the resistor chain to ground and enables the associated features if selected. The activation of the VSUP Level Sense Enable (BSUSE=1) or ADC connection Enable (BSUAE=1) closes the path from VSUP pin through the resistor chain to ground and enables the associated features if selected. BSESE takes precedence over BSUSE. BSEAE takes precedence over BSUAE. 2. Stop mode During stop mode operation the path from the VSENSE pin through the resistor chain to ground is opened and the low voltage sense features are disabled. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 461 Supply Voltage Sensor - (BATSV2) During stop mode operation the path from the VSUP pin through the resistor chain to ground is opened and the low voltage sense features are disabled. The content of the configuration register is unchanged. 17.1.3 Block Diagram Figure 17-1 shows a block diagram of the BATS module. See device guide for connectivity to ADC channel. Figure 17-1. BATS Block Diagram VSUP ... ... VSENSE BVLC BVLS[1:0] BVHS BVHC Comparator BSUSE BSESE 1 2 BSEAE BSUAE 1 automatically closed if BSESE and/or BSEAE is active, open during Stop mode 2 automatically closed if BSUSE and/or BSUAE is active, open during Stop mode 17.2 to ADC External Signal Description This section lists the name and description of all external ports. 17.2.1 VSENSE — Supply (Battery) Voltage Sense Pin This pin can be connected to the supply (Battery) line for voltage measurements. The voltage present at this input is scaled down by an internal voltage divider, and can be routed to the internal ADC or to a MC9S12VR Family Reference Manual, Rev. 4.2 462 NXP Semiconductor Supply Voltage Sensor - (BATSV2) comparator via an analog multiplexer. The pin itself is protected against reverse battery connections. To protect the pin from external fast transients an external resistor (RVSENSE_R) is needed for protection. 17.2.2 VSUP — Voltage Supply Pin This pin is the chip supply. It can be internally connected for voltage measurement. The voltage present at this input is scaled down by an internal voltage divider, and can be routed to the internal ADC or to a comparator via an analog multiplexer. 17.3 Memory Map and Register Definition This section provides the detailed information of all registers for the BATS module. 17.3.1 Register Summary Figure 17-2 shows the summary of all implemented registers inside the BATS module. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 463 Supply Voltage Sensor - (BATSV2) NOTE Register Address = Module Base Address + Address Offset, where the Module Base Address is defined at the MCU level and the Address Offset is defined at the module level. Address Offset Register Name 0x0000 BATE Bit 7 R 0 W 0x0001 BATSR R 6 5 BVHS 4 BVLS[1:0] 3 2 1 Bit 0 BSUAE BSUSE BSEAE BSESE BVHC BVLC BVHIE BVLIE BVHIF BVLIF 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 Reserved Reserved Reserved Reserved Reserved Reserved Reserved Reserved W 0x0002 BATIE R W 0x0003 BATIF R W 0x0004 - 0x0005 Reserved 0x0006 - 0x0007 Reserved R W R W = Unimplemented Figure 17-2. BATS Register Summary 17.3.2 Register Descriptions This section consists of register descriptions in address order. Each description includes a standard register diagram with an associated figure number. Details of register bit and field function follow the register diagrams, in bit order. Unused bits read back zero. MC9S12VR Family Reference Manual, Rev. 4.2 464 NXP Semiconductor Supply Voltage Sensor - (BATSV2) 17.3.2.1 BATS Module Enable Register (BATE) Access: User read/write1 Module Base + 0x0000 7 R 0 W Reset 0 6 5 BVHS 4 BVLS[1:0] 0 0 0 3 2 1 0 BSUAE BSUSE BSEAE BSESE 0 0 0 1 = Unimplemented Figure 17-3. BATS Module Enable Register (BATE) 1 Read: Anytime Write: Anytime Table 17-2. BATE Field Description Field 6 BVHS Description BATS Voltage High Select — This bit selects the trigger level for the Voltage Level High Condition (BVHC). 0 Voltage level VHBI1 is selected 1 Voltage level VHBI2 is selected 5:4 BATS Voltage Low Select — This bit selects the trigger level for the Voltage Level Low Condition (BVLC). BVLS[1:0] 00 Voltage level VLBI1 is selected 01 Voltage level VLBI2 is selected 10 Voltage level VLBI3 is selected 11 Voltage level VLBI4 is selected 3 BSUAE BATS VSUP ADC Connection Enable — This bit connects the VSUP pin through the resistor chain to ground and connects the ADC channel to the divided down voltage. This bit can be set only if the BSEAE bit is cleared. 0 ADC Channel is disconnected 1 ADC Channel is connected 2 BSUSE BATS VSUP Level Sense Enable — This bit connects the VSUP pin through the resistor chain to ground and enables the Voltage Level Sense features measuring BVLC and BVHC. This bit can be set only if the BSESE bit is cleared. 0 Level Sense features disabled 1 Level Sense features enabled 1 BSEAE BATS VSENSE ADC Connection Enable — This bit connects the VSENSE pin through the resistor chain to ground and connects the ADC channel to divided down voltage. Setting this bit will clear bit BSUAE . 0 ADC Channel is disconnected 1 ADC Channel is connected 0 BSESE BATS VSENSE Level Sense Enable — This bit connects the VSENSE pin through the resistor chain to ground and enables the Voltage Level Sense features measuring BVLC and BVHC.Setting this bit will clear bit BSUSE 0 Level Sense features disabled 1 Level Sense features enabled NOTE MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 465 Supply Voltage Sensor - (BATSV2) When opening the resistors path to ground by changing BSESE, BSEAE or BSUSE, BSUAE then for a time TEN_UNC + two bus cycles the measured value is invalid. This is to let internal nodes be charged to correct value. BVHIE, BVLIE might be cleared for this time period to avoid false interrupts. MC9S12VR Family Reference Manual, Rev. 4.2 466 NXP Semiconductor Supply Voltage Sensor - (BATSV2) 17.3.2.2 BATS Module Status Register (BATSR) Access: User read only1 Module Base + 0x0001 R 7 6 5 4 3 2 1 0 0 0 0 0 0 0 BVHC BVLC 0 0 0 0 0 0 0 0 W Reset = Unimplemented Figure 17-4. BATS Module Status Register (BATSR) 1 Read: Anytime Write: Never Table 17-3. BATSR - Register Field Descriptions Field Description 1 BVHC BATS Voltage Sense High Condition Bit — This status bit indicates that a high voltage at VSENSE or VSUP, depending on selection, is present. 0 Vmeasured VHBI_A (rising edge) or Vmeasured VHBI_D (falling edge) 1 Vmeasured VHBI_A (rising edge) or Vmeasured VHBI_D (falling edge) 0 BVLC BATS Voltage Sense Low Condition Bit — This status bit indicates that a low voltage at VSENSE or VSUP, depending on selection, is present. 0 Vmeasured VLBI_A (falling edge) or Vmeasured VLBI_D (rising edge) 1 Vmeasured VLBI_A (falling edge) or Vmeasured VLBI_D (rising edge) Figure 17-5. BATS Voltage Sensing V VHBI_A VHBI_D VLBI_D VLBI_A t MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 467 Supply Voltage Sensor - (BATSV2) 17.3.2.3 BATS Interrupt Enable Register (BATIE) Access: User read/write1 Module Base + 0x0002 R 7 6 5 4 3 2 0 0 0 0 0 0 0 0 0 0 0 0 W Reset 1 0 BVHIE BVLIE 0 0 = Unimplemented Figure 17-6. BATS Interrupt Enable Register (BATIE) 1 Read: Anytime Write: Anytime Table 17-4. BATIE Register Field Descriptions Field 1 BVHIE Description BATS Interrupt Enable High — Enables High Voltage Interrupt . 0 No interrupt will be requested whenever BVHIF flag is set . 1 Interrupt will be requested whenever BVHIF flag is set 0 BVLIE BATS Interrupt Enable Low — Enables Low Voltage Interrupt . 0 No interrupt will be requested whenever BVLIF flag is set . 1 Interrupt will be requested whenever BVLIF flag is set . 17.3.2.4 BATS Interrupt Flag Register (BATIF) Access: User read/write1 Module Base + 0x0003 R 7 6 5 4 3 2 0 0 0 0 0 0 0 0 0 0 0 0 W Reset 1 0 BVHIF BVLIF 0 0 = Unimplemented Figure 17-7. BATS Interrupt Flag Register (BATIF) 1 Read: Anytime Write: Anytime, write 1 to clear MC9S12VR Family Reference Manual, Rev. 4.2 468 NXP Semiconductor Supply Voltage Sensor - (BATSV2) Table 17-5. BATIF Register Field Descriptions Field 1 BVHIF Description BATS Interrupt Flag High Detect — The flag is set to 1 when BVHC status bit changes. 0 No change of the BVHC status bit since the last clearing of the flag. 1 BVHC status bit has changed since the last clearing of the flag. 0 BVLIF BATS Interrupt Flag Low Detect — The flag is set to 1 when BVLC status bit changes. 0 No change of the BVLC status bit since the last clearing of the flag. 1 BVLC status bit has changed since the last clearing of the flag. 17.3.2.5 Reserved Register Access: User read/write1 Module Base + 0x0006 Module Base + 0x0007 R W Reset 7 6 5 4 3 2 1 0 Reserved Reserved Reserved Reserved Reserved Reserved Reserved Reserved x x x x x x x x Figure 17-8. Reserved Register 1 Read: Anytime Write: Only in special mode NOTE These reserved registers are designed for factory test purposes only and are not intended for general user access. Writing to these registers when in special mode can alter the module’s functionality. 17.4 17.4.1 Functional Description General The BATS module allows measuring voltages on the VSENSE and VSUP pins. The VSENSE pin is implemented to allow measurement of the supply Line (Battery) Voltage VBAT directly. By bypassing the device supply capacitor and the external reversed battery protection diode this pin allows to detect under/over voltage conditions without delay. A series resistor (RVSENSE_R) is required to protect the VSENSE pin from fast transients. The voltage at the VSENSE or VSUP pin can be routed via an internal voltage divider to an internal Analog to Digital Converter Channel. Also the BATS module can be configured to generate a low and high voltage interrupt based on VSENSE or VSUP. The trigger level of the high and low interrupt are selectable. In a typical application, the module could be used as follows: The voltage at VSENSE is observed via usage of the interrupt feature (BSESE=1, BVHIE=1), while the VSUP pin voltage is routed to the ADC to allow regular measurement (BSUAE=1). MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 469 Supply Voltage Sensor - (BATSV2) 17.4.2 Interrupts This section describes the interrupt generated by the BATS module. The interrupt is only available in CPU run mode. Entering and exiting CPU stop mode has no effect on the interrupt flags. To make sure the interrupt generation works properly the bus clock frequency must be higher than the Voltage Warning Low Pass Filter frequency (fVWLP_filter). The comparator outputs BVLC and BVHC are forced to zero if the comparator is disabled (configuration bits BSESE and BSUSE are cleared). If the software disables the comparator during a high or low Voltage condition (BVHC or BVLC active), then an additional interrupt is generated. To avoid this behavior the software must disable the interrupt generation before disabling the comparator. The BATS interrupt vector is named in Table 17-6. Vector addresses and interrupt priorities are defined at MCU level. The module internal interrupt sources are combined into one module interrupt signal. Table 17-6. BATS Interrupt Sources Module Interrupt Source Module Internal Interrupt Source Local Enable BATS Interrupt (BATI) BATS Voltage Low Condition Interrupt (BVLI) BVLIE = 1 BATS Voltage High Condition Interrupt (BVHI) BVHIE = 1 17.4.2.1 BATS Voltage Low Condition Interrupt (BVLI) To use the Voltage Low Interrupt the Level Sensing must be enabled (BSESE =1 or BSUSE =1). If measured when a) VLBI1 selected with BVLS[1:0] = 0x0 at selected pin Vmeasure VLBI1_A (falling edge) or Vmeasure VLBI1_D (rising edge) or when b) VLBI2 selected with BVLS[1:0] = 0x1 at selected pin Vmeasure VLBI2_A (falling edge) or Vmeasure VLBI2_D (rising edge) or when c) VLBI3 selected with BVLS[1:0] = 0x2 at selected pin Vmeasure VLBI3_A (falling edge) or Vmeasure VLBI3_D (rising edge) or when d) VLBI4 selected with BVLS[1:0] = 0x3 at selected pin Vmeasure VLBI4_A (falling edge) or Vmeasure VLBI4_D (rising edge) then BVLC is set. BVLC status bit indicates that a low voltage at the selected pin is present. The Low Voltage Interrupt flag (BVLIF) is set to 1 when the Voltage Low Condition (BVLC) changes state . The MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 470 Supply Voltage Sensor - (BATSV2) Interrupt flag BVLIF can only be cleared by writing a 1. If the interrupt is enabled by bit BVLIE the module requests an interrupt to MCU (BATI). 17.4.2.2 BATS Voltage High Condition Interrupt (BVHI) To use the Voltage High Interrupt the Level Sensing must be enabled (BSESE =1 or BSUSE). If measured when a) VHBI1 selected with BVHS = 0 at selected pin Vmeasure VHBI1_A (rising edge) or Vmeasure VHBI1_D (falling edge) or when a) VHBI2 selected with BVHS = 1 at selected pin Vmeasure VHBI2_A (rising edge) or Vmeasure VHBI2_D (falling edge) then BVHC is set. BVHC status bit indicates that a high voltage at the selected pin is present. The High Voltage Interrupt flag (BVHIF) is set to 1 when a Voltage High Condition (BVHC) changes state. The Interrupt flag BVHIF can only be cleared by writing a 1. If the interrupt is enabled by bit BVHIE the module requests an interrupt to MCU (BATI). MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 471 Supply Voltage Sensor - (BATSV2) MC9S12VR Family Reference Manual, Rev. 4.2 472 NXP Semiconductor Chapter 18 64 KByte Flash Module (S12FTMRG64K512V1) for S12VR64 Table 18-1. Revision History Revision Number Revision Date V01.00 17 Jun 2010 18.4.6.1/18-505 Clarify Erase Verify Commands Descriptions related to the bits MGSTAT[1:0] of the 18.4.6.2/18-506 register FSTAT. 18.4.6.3/18-506 18.4.6.14/18-516 V01.01 31 aug 2010 18.4.6.2/18-506 Updated description of the commands RD1BLK, MLOADU and MLOADF 18.4.6.12/18-513 18.4.6.13/18-514 V01.02 31 Jan 2011 18.3.2.9/18-490 V01.03 04 Oct 2013 18.3.2.9/18-490 Updated notes regarding restrictions to change Protection in Special Single Chip 18.3.2.10/18-493 Mode (SS) Sections Affected Description of Changes Updated description of protection on Section 18.3.2.9 P-Flash Protection Register (FPROT) MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 473 18.1 Introduction The FTMRG64K512 module implements the following: • 64Kbytes of P-Flash (Program Flash) memory • 64bytes of EEPROM memory The Flash memory is ideal for single-supply applications allowing for field reprogramming without requiring external high voltage sources for program or erase operations. The Flash module includes a memory controller that executes commands to modify Flash memory contents. The user interface to the memory controller consists of the indexed Flash Common Command Object (FCCOB) register which is written to with the command, global address, data, and any required command parameters. The memory controller must complete the execution of a command before the FCCOB register can be written to with a new command. CAUTION A Flash word or phrase must be in the erased state before being programmed. Cumulative programming of bits within a Flash word or phrase is not allowed. The Flash memory may be read as bytes and aligned words. Read access time is one bus cycle for bytes and aligned words. For misaligned words access, the CPU has to perform twice the byte read access command. For Flash memory, an erased bit reads 1 and a programmed bit reads 0. It is possible to read from P-Flash memory while some commands are executing on EEPROM memory. It is not possible to read from EEPROM memory while a command is executing on P-Flash memory. Simultaneous P-Flash and EEPROM operations are discussed in Section 18.4.5 Allowed Simultaneous P-Flash and EEPROM Operations. Both P-Flash and EEPROM memories are implemented with Error Correction Codes (ECC) that can resolve single bit faults and detect double bit faults. For P-Flash memory, the ECC implementation requires that programming be done on an aligned 8 byte basis (a Flash phrase). Since P-Flash memory is always read by half-phrase, only one single bit fault in an aligned 4 byte half-phrase containing the byte or word accessed will be corrected. 18.1.1 Glossary Command Write Sequence — An MCU instruction sequence to execute built-in algorithms (including program and erase) on the Flash memory. EEPROM Memory — The EEPROM memory constitutes the nonvolatile memory store for data. EEPROM Sector — The EEPROM sector is the smallest portion of the EEPROM memory that can be erased. The EEPROM sector consists of 4 bytes. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 474 64 KByte Flash Module (S12FTMRG64K512V1) for S12VR64 NVM Command Mode — An NVM mode using the CPU to setup the FCCOB register to pass parameters required for Flash command execution. Phrase — An aligned group of four 16-bit words within the P-Flash memory. Each phrase includes two sets of aligned double words with each set including 7 ECC bits for single bit fault correction and double bit fault detection within each double word. P-Flash Memory — The P-Flash memory constitutes the main nonvolatile memory store for applications. P-Flash Sector — The P-Flash sector is the smallest portion of the P-Flash memory that can be erased. Each P-Flash sector contains 512 bytes. Program IFR — Nonvolatile information register located in the P-Flash block that contains the Version ID, and the Program Once field. 18.1.2 Features 18.1.2.1 • • • • • • 64 Kbytes of P-Flash memory composed of one 64 Kbyte Flash block divided into 128 sectors of 512 bytes Single bit fault correction and double bit fault detection within a 32-bit double word during read operations Automated program and erase algorithm with verify and generation of ECC parity bits Fast sector erase and phrase program operation Ability to read the P-Flash memory while programming a word in the EEPROM memory Flexible protection scheme to prevent accidental program or erase of P-Flash memory 18.1.2.2 • • • • • • EEPROM Features 512 bytes of EEPROM memory composed of one 512 byte Flash block divided into 128 sectors of 4 bytes Single bit fault correction and double bit fault detection within a word during read operations Automated program and erase algorithm with verify and generation of ECC parity bits Fast sector erase and word program operation Protection scheme to prevent accidental program or erase of EEPROM memory Ability to program up to four words in a burst sequence 18.1.2.3 • • • P-Flash Features Other Flash Module Features No external high-voltage power supply required for Flash memory program and erase operations Interrupt generation on Flash command completion and Flash error detection Security mechanism to prevent unauthorized access to the Flash memory MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 475 64 KByte Flash Module (S12FTMRG64K512V1) for S12VR64 18.1.3 Block Diagram The block diagram of the Flash module is shown in Figure 18-1. Flash Interface Command Interrupt Request Error Interrupt Request 16bit internal bus Registers P-Flash 16Kx39 sector 0 sector 1 Protection sector 127 Security Bus Clock CPU Clock Divider FCLK Memory Controller EEPROM 256x22 sector 0 sector 1 sector 127 Figure 18-1. FTMRG64K512 Block Diagram 18.2 External Signal Description The Flash module contains no signals that connect off-chip. MC9S12VR Family Reference Manual, Rev. 4.2 476 NXP Semiconductor 64 KByte Flash Module (S12FTMRG64K512V1) for S12VR64 18.3 Memory Map and Registers This section describes the memory map and registers for the Flash module. Read data from unimplemented memory space in the Flash module is undefined. Write access to unimplemented or reserved memory space in the Flash module will be ignored by the Flash module. CAUTION Writing to the Flash registers while a Flash command is executing (that is indicated when the value of flag CCIF reads as ’0’) is not allowed. If such action is attempted the write operation will not change the register value. Writing to the Flash registers is allowed when the Flash is not busy executing commands (CCIF = 1) and during initialization right after reset, despite the value of flag CCIF in that case (refer to Section 18.6 Initialization for a complete description of the reset sequence). . Table 18-2. FTMRG Memory Map Global Address (in Bytes) 0x0_0000 - 0x0_03FF 1 Size (Bytes) 1,024 0x0_0400 – 0x0_05FF 512 0x0_4000 – 0x0_7FFF 16,284 Description Register Space EEPROM Memory NVMRES1=1 : NVM Resource area (see Figure 18-2) See NVMRES description in Section 18.4.3 Internal NVM resource (NVMRES) 18.3.1 Module Memory Map The S12 architecture places the P-Flash memory between global addresses 0x3_0000 and 0x3_FFFF as shown in Table 18-3.The P-Flash memory map is shown in Figure . The FPROT register, described in Section 18.3.2.9 P-Flash Protection Register (FPROT), can be set to Table 18-3. P-Flash Memory Addressing Global Address Size (Bytes) 0x3_0000 – 0x3_FFFF 64 K Description P-Flash Block Contains Flash Configuration Field (see Table 18-4) protect regions in the Flash memory from accidental program or erase. Three separate memory regions, one growing upward from global address 0x3_8000 in the Flash memory (called the lower region), one growing downward from global address 0x3_FFFF in the Flash memory (called the higher region), and the remaining addresses in the Flash memory, can be activated for protectio. Two separate memory MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 477 64 KByte Flash Module (S12FTMRG64K512V1) for S12VR64 regions, one growing downward from global address 0x3_FFFF in the Flash memory (called the higher region), and the remaining addresses in the Flash memory, can be activated for protectionThe Flash memory addresses covered by these protectable regions are shown in the P-Flash memory map. The higher address region is mainly targeted to hold the boot loader code since it covers the vector space. Default protection settings as well as security information that allows the MCU to restrict access to the Flash module are stored in the Flash configuration field as described in Table 18-4. Table 18-4. Flash Configuration Field 1 Global Address Size (Bytes) 0x3_FF00-0x3_FF07 8 Backdoor Comparison Key Refer to Section 18.4.6.11, “Verify Backdoor Access Key Command,” and Section 18.5.1, “Unsecuring the MCU using Backdoor Key Access” 0x3_FF08-0x3_FF0B1 4 Reserved 0x3_FF0C1 1 P-Flash Protection byte. Refer to Section 18.3.2.9, “P-Flash Protection Register (FPROT)” 0x3_FF0D1 1 EEPROM Protection byte. Refer to Section 18.3.2.10, “EEPROM Protection Register (EEPROT)” 0x3_FF0E1 1 Flash Nonvolatile byte Refer to Section 18.3.2.16, “Flash Option Register (FOPT)” 0x3_FF0F1 1 Flash Security byte Refer to Section 18.3.2.2, “Flash Security Register (FSEC)” Description 0x3FF08-0x3_FF0F form a Flash phrase and must be programmed in a single command write sequence. Each byte in the 0x3_FF08 - 0x3_FF0B reserved field should be programmed to 0xFF. MC9S12VR Family Reference Manual, Rev. 4.2 478 NXP Semiconductor 64 KByte Flash Module (S12FTMRG64K512V1) for S12VR64 P-Flash START = 0x3_0000 Flash Protected/Unprotected Region 32 Kbytes 0x3_8000 0x3_8400 0x3_8800 0x3_9000 Protection Fixed End Flash Protected/Unprotected Lower Region 1, 2, 4, 8 Kbytes 0x3_A000 Flash Protected/Unprotected Region 8 Kbytes (up to 29 Kbytes) Protection Movable End 0x3_C000 Protection Fixed End 0x3_E000 Flash Protected/Unprotected Higher Region 2, 4, 8, 16 Kbytes 0x3_F000 0x3_F800 P-Flash END = 0x3_FFFF Flash Configuration Field 16 bytes (0x3_FF00 - 0x3_FF0F) MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 479 64 KByte Flash Module (S12FTMRG64K512V1) for S12VR64 P-Flash Memory Map 1 Table 18-5. Program IFR Fields Global Address Size (Bytes) 0x0_4000 – 0x0_4007 8 Reserved 0x0_4008 – 0x0_40B5 174 Reserved 0x0_40B6 – 0x0_40B7 2 Version ID1 0x0_40B8 – 0x0_40BF 8 Reserved 0x0_40C0 – 0x0_40FF 64 Program Once Field Refer to Section 18.4.6.6, “Program Once Command” Field Description Used to track firmware patch versions, see Section 18.4.2 IFR Version ID Word Table 18-6. Memory Controller Resource Fields (NVMRES1=1) Global Address Size (Bytes) 0x0_4000 – 0x040FF 256 P-Flash IFR (see Table 18-5) 0x0_4100 – 0x0_41FF 256 Reserved. 0x0_4200 – 0x0_57FF 1 Description Reserved 0x0_5800 – 0x0_59FF 512 Reserved 0x0_5A00 – 0x0_5FFF 1,536 Reserved 0x0_6000 – 0x0_6BFF 3,072 Reserved 0x0_6C00 – 0x0_7FFF 5,120 Reserved NVMRES - See Section 18.4.3 Internal NVM resource (NVMRES) for NVMRES (NVM Resource) detail. MC9S12VR Family Reference Manual, Rev. 4.2 480 NXP Semiconductor 64 KByte Flash Module (S12FTMRG64K512V1) for S12VR64 0x0_4000 P-Flash IFR 1 Kbyte (NVMRES=1) 0x0_4400 Reserved 5k bytes RAM Start = 0x0_5800 RAM End = 0x0_59FF Reserved 512 bytes Reserved 4608 bytes 0x0_6C00 Reserved 5120 bytes 0x0_7FFF Figure 18-2. Memory Controller Resource Memory Map (NVMRES=1) 18.3.2 Register Descriptions The Flash module contains a set of 20 control and status registers located between Flash module base + 0x0000 and 0x0013. In the case of the writable registers, the write accesses are forbidden during Fash command execution (for more detail, see Caution note in Section 18.3 Memory Map and Registers). A summary of the Flash module registers is given in Figure 18-3 with detailed descriptions in the following subsections. Address & Name FCLKDIV FSEC FCCOBIX 7 R 6 5 4 3 2 1 0 FDIVLCK FDIV5 FDIV4 FDIV3 FDIV2 FDIV1 FDIV0 KEYEN1 KEYEN0 RNV5 RNV4 RNV3 RNV2 SEC1 SEC0 0 0 0 0 0 CCOBIX2 CCOBIX1 CCOBIX0 FDIVLD W R W R W Figure 18-3. FTMRG64K512 Register Summary MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 481 64 KByte Flash Module (S12FTMRG64K512V1) for S12VR64 Address & Name FRSV0 FCNFG FERCNFG FSTAT FERSTAT FPROT EEPROT FCCOBHI FCCOBLO FRSV1 FRSV2 FRSV3 FRSV4 FOPT R 7 6 5 4 3 2 1 0 0 0 0 0 0 0 0 0 0 0 0 0 FDFD FSFD 0 0 0 0 0 DFDIE SFDIE ACCERR FPVIOL MGBUSY RSVD MGSTAT1 MGSTAT0 0 0 0 0 DFDIF SFDIF FPHDIS FPHS1 FPHS0 FPLDIS FPLS1 FPLS0 0 0 0 DPS3 DPS2 DPS1 DPS0 CCOB15 CCOB14 CCOB13 CCOB12 CCOB11 CCOB10 CCOB9 CCOB8 CCOB7 CCOB6 CCOB5 CCOB4 CCOB3 CCOB2 CCOB1 CCOB0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 NV7 NV6 NV5 NV4 NV3 NV2 NV1 NV0 W R W R CCIE 0 IGNSF W R W R 0 CCIF 0 0 W R W R W R W R W R FPOPEN DPOPEN RNV6 W R W R W R W R W Figure 18-3. FTMRG64K512 Register Summary (continued) MC9S12VR Family Reference Manual, Rev. 4.2 482 NXP Semiconductor 64 KByte Flash Module (S12FTMRG64K512V1) for S12VR64 Address & Name FRSV5 FRSV6 FRSV7 R 7 6 5 4 3 2 1 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 W R W R W = Unimplemented or Reserved Figure 18-3. FTMRG64K512 Register Summary (continued) 18.3.2.1 Flash Clock Divider Register (FCLKDIV) The FCLKDIV register is used to control timed events in program and erase algorithms. 7 R 6 FDIVLD W Reset 0 5 4 3 FDIVLCK 0 2 1 0 0 0 0 FDIV[5:0] 0 0 0 = Unimplemented or Reserved Figure 18-4. Flash Clock Divider Register (FCLKDIV) All bits in the FCLKDIV register are readable, bit 7 is not writable, bit 6 is write-once-hi and controls the writability of the FDIV field in normal mode. In special mode, bits 6-0 are writable any number of times but bit 7 remains unwritable. CAUTION The FCLKDIV register should never be written while a Flash command is executing (CCIF=0). Table 18-7. FCLKDIV Field Descriptions Field 7 FDIVLD Description Clock Divider Loaded 0 FCLKDIV register has not been written since the last reset 1 FCLKDIV register has been written since the last reset MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 483 64 KByte Flash Module (S12FTMRG64K512V1) for S12VR64 Table 18-7. FCLKDIV Field Descriptions (continued) Field Description 6 FDIVLCK Clock Divider Locked 0 FDIV field is open for writing 1 FDIV value is locked and cannot be changed. Once the lock bit is set high, only reset can clear this bit and restore writability to the FDIV field in normal mode. 5–0 FDIV[5:0] Clock Divider Bits — FDIV[5:0] must be set to effectively divide BUSCLK down to 1 MHz to control timed events during Flash program and erase algorithms. Table 18-8 shows recommended values for FDIV[5:0] based on the BUSCLK frequency. Please refer to Section 18.4.4, “Flash Command Operations,” for more information. Table 18-8. FDIV values for various BUSCLK Frequencies BUSCLK Frequency (MHz) 1 2 18.3.2.2 MIN1 MAX2 1.0 1.6 1.6 BUSCLK Frequency (MHz) FDIV[5:0] FDIV[5:0] MIN1 MAX2 0x00 16.6 17.6 0x10 2.6 0x01 17.6 18.6 0x11 2.6 3.6 0x02 18.6 19.6 0x12 3.6 4.6 0x03 19.6 20.6 0x13 4.6 5.6 0x04 20.6 21.6 0x14 5.6 6.6 0x05 21.6 22.6 0x15 6.6 7.6 0x06 22.6 23.6 0x16 7.6 8.6 0x07 23.6 24.6 0x17 8.6 9.6 0x08 24.6 25.6 0x18 9.6 10.6 0x09 10.6 11.6 0x0A 11.6 12.6 0x0B 12.6 13.6 0x0C 13.6 14.6 0x0D 14.6 15.6 0x0E 15.6 16.6 0x0F BUSCLK is Greater Than this value. BUSCLK is Less Than or Equal to this value. Flash Security Register (FSEC) The FSEC register holds all bits associated with the security of the MCU and Flash module. MC9S12VR Family Reference Manual, Rev. 4.2 484 NXP Semiconductor 64 KByte Flash Module (S12FTMRG64K512V1) for S12VR64 7 R 6 5 4 KEYEN[1:0] 3 2 1 RNV[5:2] 0 SEC[1:0] W Reset F1 F1 F1 F1 F1 F1 F1 F1 = Unimplemented or Reserved Figure 18-5. Flash Security Register (FSEC) 1 Loaded from IFR Flash configuration field, during reset sequence. All bits in the FSEC register are readable but not writable. During the reset sequence, the FSEC register is loaded with the contents of the Flash security byte in the Flash configuration field at global address 0x3_FF0F located in P-Flash memory (see Table 18-4) as indicated by reset condition F in Figure 18-5. If a double bit fault is detected while reading the P-Flash phrase containing the Flash security byte during the reset sequence, all bits in the FSEC register will be set to leave the Flash module in a secured state with backdoor key access disabled. Table 18-9. FSEC Field Descriptions Field Description 7–6 Backdoor Key Security Enable Bits — The KEYEN[1:0] bits define the enabling of backdoor key access to the Flash KEYEN[1:0] module as shown in Table 18-10. 5–2 RNV[5:2] Reserved Nonvolatile Bits — The RNV bits should remain in the erased state for future enhancements. 1–0 SEC[1:0] Flash Security Bits — The SEC[1:0] bits define the security state of the MCU as shown in Table 18-11. If the Flash module is unsecured using backdoor key access, the SEC bits are forced to 10. Table 18-10. Flash KEYEN States KEYEN[1:0] 1 Status of Backdoor Key Access 00 DISABLED 01 DISABLED1 10 ENABLED 11 DISABLED Preferred KEYEN state to disable backdoor key access. Table 18-11. Flash Security States 1 SEC[1:0] Status of Security 00 SECURED 01 SECURED1 10 UNSECURED 11 SECURED Preferred SEC state to set MCU to secured state. The security function in the Flash module is described in Section 18.5 Security. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 485 64 KByte Flash Module (S12FTMRG64K512V1) for S12VR64 18.3.2.3 Flash CCOB Index Register (FCCOBIX) The FCCOBIX register is used to index the FCCOB register for Flash memory operations. R 7 6 5 4 3 0 0 0 0 0 0 0 0 0 0 2 0 CCOBIX[2:0] W Reset 1 0 0 0 = Unimplemented or Reserved Figure 18-6. FCCOB Index Register (FCCOBIX) CCOBIX bits are readable and writable while remaining bits read 0 and are not writable. Table 18-12. FCCOBIX Field Descriptions Field Description 2–0 CCOBIX[1:0] Common Command Register Index— The CCOBIX bits are used to select which word of the FCCOB register array is being read or written to. See 18.3.2.11 Flash Common Command Object Register (FCCOB),” for more details. 18.3.2.4 Flash Reserved0 Register (FRSV0) This Flash register is reserved for factory testing. R 7 6 5 4 3 2 1 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 W Reset = Unimplemented or Reserved Figure 18-7. Flash Reserved0 Register (FRSV0) All bits in the FRSV0 register read 0 and are not writable. 18.3.2.5 Flash Configuration Register (FCNFG) The FCNFG register enables the Flash command complete interrupt and forces ECC faults on Flash array read access from the CPU. 7 R W Reset CCIE 0 6 5 0 0 0 0 4 IGNSF 0 3 2 0 0 0 0 1 0 FDFD FSFD 0 0 = Unimplemented or Reserved Figure 18-8. Flash Configuration Register (FCNFG) MC9S12VR Family Reference Manual, Rev. 4.2 486 NXP Semiconductor 64 KByte Flash Module (S12FTMRG64K512V1) for S12VR64 CCIE, IGNSF, FDFD, and FSFD bits are readable and writable while remaining bits read 0 and are not writable. Table 18-13. FCNFG Field Descriptions Field Description 7 CCIE Command Complete Interrupt Enable — The CCIE bit controls interrupt generation when a Flash command has completed. 0 Command complete interrupt disabled 1 An interrupt will be requested whenever the CCIF flag in the FSTAT register is set (see Section 18.3.2.7 Flash Status Register (FSTAT)) 4 IGNSF Ignore Single Bit Fault — The IGNSF controls single bit fault reporting in the FERSTAT register (see Section 18.3.2.8 Flash Error Status Register (FERSTAT)). 0 All single bit faults detected during array reads are reported 1 Single bit faults detected during array reads are not reported and the single bit fault interrupt will not be generated 1 FDFD Force Double Bit Fault Detect — The FDFD bit allows the user to simulate a double bit fault during Flash array read operations and check the associated interrupt routine. The FDFD bit is cleared by writing a 0 to FDFD. 0 Flash array read operations will set the DFDIF flag in the FERSTAT register only if a double bit fault is detected 1 Any Flash array read operation will force the DFDIF flag in the FERSTAT register to be set (see Section 18.3.2.7 Flash Status Register (FSTAT)) and an interrupt will be generated as long as the DFDIE interrupt enable in the FERCNFG register is set (see Section 18.3.2.6 Flash Error Configuration Register (FERCNFG)) 0 FSFD Force Single Bit Fault Detect — The FSFD bit allows the user to simulate a single bit fault during Flash array read operations and check the associated interrupt routine. The FSFD bit is cleared by writing a 0 to FSFD. 0 Flash array read operations will set the SFDIF flag in the FERSTAT register only if a single bit fault is detected 1 Flash array read operation will force the SFDIF flag in the FERSTAT register to be set (see Section 18.3.2.7 Flash Status Register (FSTAT)) and an interrupt will be generated as long as the SFDIE interrupt enable in the FERCNFG register is set (see Section 18.3.2.6 Flash Error Configuration Register (FERCNFG)) 18.3.2.6 Flash Error Configuration Register (FERCNFG) The FERCNFG register enables the Flash error interrupts for the FERSTAT flags. R 7 6 5 4 3 2 0 0 0 0 0 0 0 0 0 0 0 0 W Reset 1 0 DFDIE SFDIE 0 0 = Unimplemented or Reserved Figure 18-9. Flash Error Configuration Register (FERCNFG) All assigned bits in the FERCNFG register are readable and writable. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 487 64 KByte Flash Module (S12FTMRG64K512V1) for S12VR64 Table 18-14. FERCNFG Field Descriptions Field Description 1 DFDIE Double Bit Fault Detect Interrupt Enable — The DFDIE bit controls interrupt generation when a double bit fault is detected during a Flash block read operation. 0 DFDIF interrupt disabled 1 An interrupt will be requested whenever the DFDIF flag is set (see Section 18.3.2.8 Flash Error Status Register (FERSTAT)) 0 SFDIE Single Bit Fault Detect Interrupt Enable — The SFDIE bit controls interrupt generation when a single bit fault is detected during a Flash block read operation. 0 SFDIF interrupt disabled whenever the SFDIF flag is set (see Section 18.3.2.8 Flash Error Status Register (FERSTAT)) 1 An interrupt will be requested whenever the SFDIF flag is set (see Section 18.3.2.8 Flash Error Status Register (FERSTAT)) 18.3.2.7 Flash Status Register (FSTAT) The FSTAT register reports the operational status of the Flash module. 7 R W Reset CCIF 1 6 0 0 5 4 ACCERR FPVIOL 0 0 3 2 MGBUSY RSVD 0 0 1 0 MGSTAT[1:0] 01 01 = Unimplemented or Reserved Figure 18-10. Flash Status Register (FSTAT) 1 Reset value can deviate from the value shown if a double bit fault is detected during the reset sequence (see Section 18.6 Initialization). CCIF, ACCERR, and FPVIOL bits are readable and writable, MGBUSY and MGSTAT bits are readable but not writable, while remaining bits read 0 and are not writable. Table 18-15. FSTAT Field Descriptions Field Description 7 CCIF Command Complete Interrupt Flag — The CCIF flag indicates that a Flash command has completed. The CCIF flag is cleared by writing a 1 to CCIF to launch a command and CCIF will stay low until command completion or command violation. 0 Flash command in progress 1 Flash command has completed 5 ACCERR Flash Access Error Flag — The ACCERR bit indicates an illegal access has occurred to the Flash memory caused by either a violation of the command write sequence (see Section 18.4.4.2 Command Write Sequence) or issuing an illegal Flash command. While ACCERR is set, the CCIF flag cannot be cleared to launch a command. The ACCERR bit is cleared by writing a 1 to ACCERR. Writing a 0 to the ACCERR bit has no effect on ACCERR. 0 No access error detected 1 Access error detected 4 FPVIOL Flash Protection Violation Flag —The FPVIOL bit indicates an attempt was made to program or erase an address in a protected area of P-Flash or EEPROM memory during a command write sequence. The FPVIOL bit is cleared by writing a 1 to FPVIOL. Writing a 0 to the FPVIOL bit has no effect on FPVIOL. While FPVIOL is set, it is not possible to launch a command or start a command write sequence. 0 No protection violation detected 1 Protection violation detected MC9S12VR Family Reference Manual, Rev. 4.2 488 NXP Semiconductor 64 KByte Flash Module (S12FTMRG64K512V1) for S12VR64 Table 18-15. FSTAT Field Descriptions (continued) Field 3 MGBUSY 2 RSVD 1–0 MGSTAT[1:0] 18.3.2.8 Description Memory Controller Busy Flag — The MGBUSY flag reflects the active state of the Memory Controller. 0 Memory Controller is idle 1 Memory Controller is busy executing a Flash command (CCIF = 0) Reserved Bit — This bit is reserved and always reads 0. Memory Controller Command Completion Status Flag — One or more MGSTAT flag bits are set if an error is detected during execution of a Flash command or during the Flash reset sequence. See Section 18.4.6, “Flash Command Description,” and Section 18.6, “Initialization” for details. Flash Error Status Register (FERSTAT) The FERSTAT register reflects the error status of internal Flash operations. R 7 6 5 4 3 2 0 0 0 0 0 0 0 0 0 0 0 0 W Reset 1 0 DFDIF SFDIF 0 0 = Unimplemented or Reserved Figure 18-11. Flash Error Status Register (FERSTAT) All flags in the FERSTAT register are readable and only writable to clear the flag. Table 18-16. FERSTAT Field Descriptions Field Description 1 DFDIF Double Bit Fault Detect Interrupt Flag — The setting of the DFDIF flag indicates that a double bit fault was detected in the stored parity and data bits during a Flash array read operation or that a Flash array read operation returning invalid data was attempted on a Flash block that was under a Flash command operation.1 The DFDIF flag is cleared by writing a 1 to DFDIF. Writing a 0 to DFDIF has no effect on DFDIF.2 0 No double bit fault detected 1 Double bit fault detected or a Flash array read operation returning invalid data was attempted while command running 0 SFDIF Single Bit Fault Detect Interrupt Flag — With the IGNSF bit in the FCNFG register clear, the SFDIF flag indicates that a single bit fault was detected in the stored parity and data bits during a Flash array read operation or that a Flash array read operation returning invalid data was attempted on a Flash block that was under a Flash command operation.1 The SFDIF flag is cleared by writing a 1 to SFDIF. Writing a 0 to SFDIF has no effect on SFDIF. 0 No single bit fault detected 1 Single bit fault detected and corrected or a Flash array read operation returning invalid data was attempted while command running 1 The single bit fault and double bit fault flags are mutually exclusive for parity errors (an ECC fault occurrence can be either single fault or double fault but never both). A simultaneous access collision (Flash array read operation returning invalid data attempted while command running) is indicated when both SFDIF and DFDIF flags are high. 2 There is a one cycle delay in storing the ECC DFDIF and SFDIF fault flags in this register. At least one NOP is required after a flash memory read before checking FERSTAT for the occurrence of ECC errors. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 489 64 KByte Flash Module (S12FTMRG64K512V1) for S12VR64 18.3.2.9 P-Flash Protection Register (FPROT) The FPROT register defines which P-Flash sectors are protected against program and erase operations. 7 R W Reset FPOPEN F1 6 RNV6 F1 5 4 FPHDIS F1 3 FPHS[1:0] F1 2 1 FPLDIS F1 F1 0 FPLS[1:0] F1 F1 = Unimplemented or Reserved Figure 18-12. Flash Protection Register (FPROT) 1 Loaded from IFR Flash configuration field, during reset sequence. The (unreserved) bits of the FPROT register are writable in Normal Single Chip Mode with the restriction that the size of the protected region can only be increased (see Section 18.3.2.9.1, “P-Flash Protection Restrictions,” and Table 18-21).All (unreserved) bits of the FPROT register are writable without restriction in Special Single Chip Mode . During the reset sequence, the FPROT register is loaded with the contents of the P-Flash protection byte in the Flash configuration field at global address 0x3_FF0C located in P-Flash memory (see Table 18-4) as indicated by reset condition ‘F’ in Figure 18-12. To change the P-Flash protection that will be loaded during the reset sequence, the upper sector of the P-Flash memory must be unprotected, then the P-Flash protection byte must be reprogrammed. If a double bit fault is detected while reading the P-Flash phrase containing the P-Flash protection byte during the reset sequence, the FPOPEN bit will be cleared and remaining bits in the FPROT register will be set to leave the P-Flash memory fully protected. Trying to alter data in any protected area in the P-Flash memory will result in a protection violation error and the FPVIOL bit will be set in the FSTAT register. The block erase of a P-Flash block is not possible if any of the P-Flash sectors contained in the same P-Flash block are protected. Table 18-17. FPROT Field Descriptions Field Description 7 FPOPEN Flash Protection Operation Enable — The FPOPEN bit determines the protection function for program or erase operations as shown in Table 18-18 for the P-Flash block. 0 When FPOPEN is clear, the FPHDIS and FPLDIS bits define unprotected address ranges as specified by the corresponding FPHS and FPLS bits 1 When FPOPEN is set, the FPHDIS and FPLDIS bits enable protection for the address range specified by the corresponding FPHS and FPLS bits 6 RNV[6] Reserved Nonvolatile Bit — The RNV bit should remain in the erased state for future enhancements. 5 FPHDIS Flash Protection Higher Address Range Disable — The FPHDIS bit determines whether there is a protected/unprotected area in a specific region of the P-Flash memory ending with global address 0x3_FFFF. 0 Protection/Unprotection enabled 1 Protection/Unprotection disabled 4–3 FPHS[1:0] Flash Protection Higher Address Size — The FPHS bits determine the size of the protected/unprotected area in P-Flash memory as shown inTable 18-19. The FPHS bits can only be written to while the FPHDIS bit is set. MC9S12VR Family Reference Manual, Rev. 4.2 490 NXP Semiconductor 64 KByte Flash Module (S12FTMRG64K512V1) for S12VR64 Table 18-17. FPROT Field Descriptions (continued) Field Description 2 FPLDIS Flash Protection Lower Address Range Disable — The FPLDIS bit determines whether there is a protected/unprotected area in a specific region of the P-Flash memory beginning with global address 0x3_8000. 0 Protection/Unprotection enabled 1 Protection/Unprotection disabled 1–0 FPLS[1:0] Flash Protection Lower Address Size — The FPLS bits determine the size of the protected/unprotected area in P-Flash memory as shown in Table 18-20. The FPLS bits can only be written to while the FPLDIS bit is set. Table 18-18. P-Flash Protection Function 1 Function1 FPOPEN FPHDIS FPLDIS 1 1 1 No P-Flash Protection 1 1 0 Protected Low Range 1 0 1 Protected High Range 1 0 0 Protected High and Low Ranges 0 1 1 Full P-Flash Memory Protected 0 1 0 Unprotected Low Range 0 0 1 Unprotected High Range 0 0 0 Unprotected High and Low Ranges For range sizes, refer to Table 18-19 and Table 18-20. Table 18-19. P-Flash Protection Higher Address Range FPHS[1:0] Global Address Range Protected Size 00 0x3_F800–0x3_FFFF 2 Kbytes 01 0x3_F000–0x3_FFFF 4 Kbytes 10 0x3_E000–0x3_FFFF 8 Kbytes 11 0x3_C000–0x3_FFFF 16 Kbytes Table 18-20. P-Flash Protection Lower Address Range FPLS[1:0] Global Address Range Protected Size 00 0x3_8000–0x3_83FF 1 Kbyte 01 0x3_8000–0x3_87FF 2 Kbytes 10 0x3_8000–0x3_8FFF 4 Kbytes 11 0x3_8000–0x3_9FFF 8 Kbytes All possible P-Flash protection scenarios are shown in Figure 18-13 . Although the protection scheme is loaded from the Flash memory at global address 0x3_FF0C during the reset sequence, it can be changed by the user. The P-Flash protection scheme can be used by applications requiring reprogramming in Normal Single Chip Mode while providing as much protection as possible if reprogramming is not required. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 491 FPHDIS = 0 FPLDIS = 0 7 6 5 4 3 2 1 0 0x3_8000 Scenario FLASH START FPLS[1:0] 0x3_FFFF FPHS[1:0] 0x3_8000 FPOPEN = 0 FPHDIS = 0 FPLDIS = 1 FPLS[1:0] FPHDIS = 1 FPLDIS = 0 FPHS[1:0] Scenario FLASH START FPHDIS = 1 FPLDIS = 1 FPOPEN = 1 64 KByte Flash Module (S12FTMRG64K512V1) for S12VR64 0x3_FFFF Unprotected region Protected region with size defined by FPLS Protected region not defined by FPLS, FPHS Protected region with size defined by FPHS Figure 18-13. P-Flash Protection Scenarios MC9S12VR Family Reference Manual, Rev. 4.2 492 NXP Semiconductor 64 KByte Flash Module (S12FTMRG64K512V1) for S12VR64 18.3.2.9.1 P-Flash Protection Restrictions In Normal Single Chip Mode the general guideline is that P-Flash protection can only be added and not removed. Table 18-21 specifies all valid transitions between P-Flash protection scenarios. Any attempt to write an invalid scenario to the FPROT register will be ignored. The contents of the FPROT register reflect the active protection scenario. See the FPHS and FPLS bit descriptions for additional restrictions. Table 18-21. P-Flash Protection Scenario Transitions To Protection Scenario1 From Protection Scenario 0 1 2 3 0 X X X X X 1 X 4 X X X X X X X X X X 6 X 7 1 18.3.2.10 X 6 7 X 3 5 5 X X 2 4 X X X X X X Allowed transitions marked with X, see Figure 18-13 for a definition of the scenarios. EEPROM Protection Register (EEPROT) The EEPROT register defines which EEPROM sectors are protected against program and erase operations. 7 R W Reset DPOPEN F1 6 5 4 0 0 0 0 0 0 3 2 1 0 F1 F1 DPS[3:0] F1 F1 = Unimplemented or Reserved Figure 18-14. EEPROM Protection Register (EEPROT) 1 Loaded from IFR Flash configuration field, during reset sequence. The (unreserved) bits of the EEPROT register are writable in Normal Single Chip Mode with the restriction that protection can be added but not removed. Writes in Normal Single Chip Mode must increase the DPS value and the DPOPEN bit can only be written from 1 (protection disabled) to 0 (protection enabled). If the DPOPEN bit is set, the state of the DPS bits is irrelevant.All DPOPEN/DPS bit registers are writable without restriction in Special Single Chip Mode. During the reset sequence, fields DPOPEN and DPS of the EEPROT register are loaded with the contents of the EEPROM protection byte in the Flash configuration field at global address 0x3_FF0D located in P-Flash memory (see Table 18-4) as indicated by reset condition F in . To change the EEPROM protection MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 493 64 KByte Flash Module (S12FTMRG64K512V1) for S12VR64 that will be loaded during the reset sequence, the P-Flash sector containing the EEPROM protection byte must be unprotected, then the EEPROM protection byte must be programmed. If a double bit fault is detected while reading the P-Flash phrase containing the EEPROM protection byte during the reset sequence, the DPOPEN bit will be cleared and DPS bits will be set to leave the EEPROM memory fully protected. Trying to alter data in any protected area in the EEPROM memory will result in a protection violation error and the FPVIOL bit will be set in the FSTAT register. Block erase of the EEPROM memory is not possible if any of the EEPROM sectors are protected. Table 18-22. EEPROT Field Descriptions Field Description 7 DPOPEN EEPROM Protection Control 0 Enables EEPROM memory protection from program and erase with protected address range defined by DPS bits 1 Disables EEPROM memory protection from program and erase 3–0 DPS[3:0] EEPROM Protection Size — The DPS[3:0] bits determine the size of the protected area in the EEPROM memory as shown inTable 18-23 . Table 18-23. EEPROM Protection Address Range DPS[3:0] Global Address Range Protected Size 0000 0x0_0400 – 0x0_041F 32 bytes 0001 0x0_0400 – 0x0_043F 64 bytes 0010 0x0_0400 – 0x0_045F 96 bytes 0011 0x0_0400 – 0x0_047F 128 bytes 0100 0x0_0400 – 0x0_049F 160 bytes 0101 0x0_0400 – 0x0_04BF 192 bytes The Protection Size goes on enlarging in step of 32 bytes, for each DPS value increasing of one. . . . 1111 18.3.2.11 0x0_0400 – 0x0_05FF 512 bytes Flash Common Command Object Register (FCCOB) The FCCOB is an array of six words addressed via the CCOBIX index found in the FCCOBIX register. Byte wide reads and writes are allowed to the FCCOB register. MC9S12VR Family Reference Manual, Rev. 4.2 494 NXP Semiconductor 64 KByte Flash Module (S12FTMRG64K512V1) for S12VR64 7 6 5 4 R 2 1 0 0 0 0 0 CCOB[15:8] W Reset 3 0 0 0 0 Figure 18-15. Flash Common Command Object High Register (FCCOBHI) 7 6 5 4 R 2 1 0 0 0 0 0 CCOB[7:0] W Reset 3 0 0 0 0 Figure 18-16. Flash Common Command Object Low Register (FCCOBLO) 18.3.2.11.1 FCCOB - NVM Command Mode NVM command mode uses the indexed FCCOB register to provide a command code and its relevant parameters to the Memory Controller. The user first sets up all required FCCOB fields and then initiates the command’s execution by writing a 1 to the CCIF bit in the FSTAT register (a 1 written by the user clears the CCIF command completion flag to 0). When the user clears the CCIF bit in the FSTAT register all FCCOB parameter fields are locked and cannot be changed by the user until the command completes (as evidenced by the Memory Controller returning CCIF to 1). Some commands return information to the FCCOB register array. The generic format for the FCCOB parameter fields in NVM command mode is shown in Table 18-24. The return values are available for reading after the CCIF flag in the FSTAT register has been returned to 1 by the Memory Controller. Writes to the unimplemented parameter fields (CCOBIX = 110 and CCOBIX = 111) are ignored with reads from these fields returning 0x0000. Table 18-24 shows the generic Flash command format. The high byte of the first word in the CCOB array contains the command code, followed by the parameters for this specific Flash command. For details on the FCCOB settings required by each command, see the Flash command descriptions in Section 18.4.6 Flash Command Description. Table 18-24. FCCOB - NVM Command Mode (Typical Usage) CCOBIX[2:0] 000 001 010 011 Byte FCCOB Parameter Fields (NVM Command Mode) HI FCMD[7:0] defining Flash command LO 6’h0, Global address [17:16] HI Global address [15:8] LO Global address [7:0] HI Data 0 [15:8] LO Data 0 [7:0] HI Data 1 [15:8] LO Data 1 [7:0] MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 495 64 KByte Flash Module (S12FTMRG64K512V1) for S12VR64 Table 18-24. FCCOB - NVM Command Mode (Typical Usage) CCOBIX[2:0] 100 101 18.3.2.12 Byte FCCOB Parameter Fields (NVM Command Mode) HI Data 2 [15:8] LO Data 2 [7:0] HI Data 3 [15:8] LO Data 3 [7:0] Flash Reserved1 Register (FRSV1) This Flash register is reserved for factory testing. R 7 6 5 4 3 2 1 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 W Reset = Unimplemented or Reserved Figure 18-17. Flash Reserved1 Register (FRSV1) All bits in the FRSV1 register read 0 and are not writable. 18.3.2.13 Flash Reserved2 Register (FRSV2) This Flash register is reserved for factory testing. R 7 6 5 4 3 2 1 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 W Reset = Unimplemented or Reserved Figure 18-18. Flash Reserved2 Register (FRSV2) All bits in the FRSV2 register read 0 and are not writable. 18.3.2.14 Flash Reserved3 Register (FRSV3) This Flash register is reserved for factory testing. MC9S12VR Family Reference Manual, Rev. 4.2 496 NXP Semiconductor 64 KByte Flash Module (S12FTMRG64K512V1) for S12VR64 R 7 6 5 4 3 2 1 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 W Reset = Unimplemented or Reserved Figure 18-19. Flash Reserved3 Register (FRSV3) All bits in the FRSV3 register read 0 and are not writable. 18.3.2.15 Flash Reserved4 Register (FRSV4) This Flash register is reserved for factory testing. R 7 6 5 4 3 2 1 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 3 2 1 0 F1 F1 F1 F1 W Reset = Unimplemented or Reserved Figure 18-20. Flash Reserved4 Register (FRSV4) All bits in the FRSV4 register read 0 and are not writable. 18.3.2.16 Flash Option Register (FOPT) The FOPT register is the Flash option register. 7 6 5 4 R NV[7:0] W Reset F1 F1 F1 F1 = Unimplemented or Reserved Figure 18-21. Flash Option Register (FOPT) 1 Loaded from IFR Flash configuration field, during reset sequence. All bits in the FOPT register are readable but are not writable. During the reset sequence, the FOPT register is loaded from the Flash nonvolatile byte in the Flash configuration field at global address 0x3_FF0E located in P-Flash memory (see Table 18-4) as indicated by reset condition F in Figure 18-21. If a double bit fault is detected while reading the P-Flash phrase containing the Flash nonvolatile byte during the reset sequence, all bits in the FOPT register will be set. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 497 64 KByte Flash Module (S12FTMRG64K512V1) for S12VR64 Table 18-25. FOPT Field Descriptions Field Description 7–0 NV[7:0] Nonvolatile Bits — The NV[7:0] bits are available as nonvolatile bits. Refer to the device user guide for proper use of the NV bits. 18.3.2.17 Flash Reserved5 Register (FRSV5) This Flash register is reserved for factory testing. R 7 6 5 4 3 2 1 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 W Reset = Unimplemented or Reserved Figure 18-22. Flash Reserved5 Register (FRSV5) All bits in the FRSV5 register read 0 and are not writable. 18.3.2.18 Flash Reserved6 Register (FRSV6) This Flash register is reserved for factory testing. R 7 6 5 4 3 2 1 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 W Reset = Unimplemented or Reserved Figure 18-23. Flash Reserved6 Register (FRSV6) All bits in the FRSV6 register read 0 and are not writable. 18.3.2.19 Flash Reserved7 Register (FRSV7) This Flash register is reserved for factory testing. R 7 6 5 4 3 2 1 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 W Reset = Unimplemented or Reserved Figure 18-24. Flash Reserved7 Register (FRSV7) All bits in the FRSV7 register read 0 and are not writable. MC9S12VR Family Reference Manual, Rev. 4.2 498 NXP Semiconductor 64 KByte Flash Module (S12FTMRG64K512V1) for S12VR64 18.4 18.4.1 Functional Description Modes of Operation The FTMRG64K512 module provides the modes of operation normal and special . The operating mode is determined by module-level inputs and affects the FCLKDIV, FCNFG, FPROT and EEPROT registers (see Table 18-27). 18.4.2 IFR Version ID Word The version ID word is stored in the IFR at address 0x0_40B6. The contents of the word are defined in Table 18-26. Table 18-26. IFR Version ID Fields • 18.4.3 [15:4] [3:0] Reserved VERNUM VERNUM: Version number. The first version is number 0b_0001 with both 0b_0000 and 0b_1111 meaning ‘none’. Internal NVM resource (NVMRES) IFR is an internal NVM resource readable by CPU , when NVMRES is active. The IFR fields are shown in Table 18-5. The NVMRES global address map is shown in Table 18-6. 18.4.4 Flash Command Operations Flash command operations are used to modify Flash memory contents. The next sections describe: • How to write the FCLKDIV register that is used to generate a time base (FCLK) derived from BUSCLK for Flash program and erase command operations • The command write sequence used to set Flash command parameters and launch execution • Valid Flash commands available for execution, according to MCU functional mode and MCU security state. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 499 64 KByte Flash Module (S12FTMRG64K512V1) for S12VR64 18.4.4.1 Writing the FCLKDIV Register Prior to issuing any Flash program or erase command after a reset, the user is required to write the FCLKDIV register to divide BUSCLK down to a target FCLK of 1 MHz. Table 18-8 shows recommended values for the FDIV field based on BUSCLK frequency. NOTE Programming or erasing the Flash memory cannot be performed if the bus clock runs at less than 0.8 MHz. Setting FDIV too high can destroy the Flash memory due to overstress. Setting FDIV too low can result in incomplete programming or erasure of the Flash memory cells. When the FCLKDIV register is written, the FDIVLD bit is set automatically. If the FDIVLD bit is 0, the FCLKDIV register has not been written since the last reset. If the FCLKDIV register has not been written, any Flash program or erase command loaded during a command write sequence will not execute and the ACCERR bit in the FSTAT register will set. 18.4.4.2 Command Write Sequence The Memory Controller will launch all valid Flash commands entered using a command write sequence. Before launching a command, the ACCERR and FPVIOL bits in the FSTAT register must be clear (see Section 18.3.2.7 Flash Status Register (FSTAT)) and the CCIF flag should be tested to determine the status of the current command write sequence. If CCIF is 0, the previous command write sequence is still active, a new command write sequence cannot be started, and all writes to the FCCOB register are ignored. 18.4.4.2.1 Define FCCOB Contents The FCCOB parameter fields must be loaded with all required parameters for the Flash command being executed. Access to the FCCOB parameter fields is controlled via the CCOBIX bits in the FCCOBIX register (see Section 18.3.2.3 Flash CCOB Index Register (FCCOBIX)). The contents of the FCCOB parameter fields are transferred to the Memory Controller when the user clears the CCIF command completion flag in the FSTAT register (writing 1 clears the CCIF to 0). The CCIF flag will remain clear until the Flash command has completed. Upon completion, the Memory Controller will return CCIF to 1 and the FCCOB register will be used to communicate any results. The flow for a generic command write sequence is shown in Figure 18-25. MC9S12VR Family Reference Manual, Rev. 4.2 500 NXP Semiconductor 64 KByte Flash Module (S12FTMRG64K512V1) for S12VR64 START Read: FCLKDIV register Clock Divider Value Check FDIV Correct? no no yes FCCOB Availability Check CCIF Set? Read: FSTAT register yes Read: FSTAT register Note: FCLKDIV must be set after each reset Write: FCLKDIV register no CCIF Set? yes Results from previous Command Access Error and Protection Violation Check ACCERR/ FPVIOL Set? no yes Write: FSTAT register Clear ACCERR/FPVIOL 0x30 Write to FCCOBIX register to identify specific command parameter to load. Write to FCCOB register to load required command parameter. More Parameters? yes no Write: FSTAT register (to launch command) Clear CCIF 0x80 Read: FSTAT register Bit Polling for Command Completion Check CCIF Set? no yes EXIT Figure 18-25. Generic Flash Command Write Sequence Flowchart MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 501 64 KByte Flash Module (S12FTMRG64K512V1) for S12VR64 18.4.4.3 Valid Flash Module Commands Table 18-27 present the valid Flash commands, as enabled by the combination of the functional MCU mode (Normal SingleChip NS, Special Singlechip SS) with the MCU security state (Unsecured, Secured). Special Singlechip mode is selected by input mmc_ss_mode_ts2 asserted. MCU Secured state is selected by input mmc_secure input asserted. + Table 18-27. Flash Commands by Mode and Security State Unsecured FCMD Command Secured NS1 SS2 NS3 SS4 0x01 Erase Verify All Blocks 0x02 Erase Verify Block 0x03 Erase Verify P-Flash Section 0x04 Read Once 0x06 Program P-Flash 0x07 Program Once 0x08 Erase All Blocks 0x09 Erase Flash Block 0x0A Erase P-Flash Sector 0x0B Unsecure Flash 0x0C Verify Backdoor Access Key 0x0D Set User Margin Level 0x0E Set Field Margin Level 0x10 Erase Verify EEPROM Section 0x11 Program EEPROM 0x12 Erase EEPROM Sector 1 Unsecured Normal Single Chip mode Unsecured Special Single Chip mode. 3 Secured Normal Single Chip mode. 4 Secured Special Single Chip mode. 2 MC9S12VR Family Reference Manual, Rev. 4.2 502 NXP Semiconductor 64 KByte Flash Module (S12FTMRG64K512V1) for S12VR64 18.4.4.4 P-Flash Commands Table 18-28 summarizes the valid P-Flash commands along with the effects of the commands on the P-Flash block and other resources within the Flash module. Table 18-28. P-Flash Commands FCMD Command 0x01 Erase Verify All Blocks 0x02 Erase Verify Block 0x03 Erase Verify P-Flash Section 0x04 Read Once 0x06 Program P-Flash 0x07 Program Once Program a dedicated 64 byte field in the nonvolatile information register in P-Flash block that is allowed to be programmed only once. 0x08 Erase All Blocks Erase all P-Flash (and EEPROM) blocks. An erase of all Flash blocks is only possible when the FPLDIS, FPHDIS, and FPOPEN bits in the FPROT register and the DPOPEN bit in the EEPROT register are set prior to launching the command. 0x09 Erase Flash Block Erase a P-Flash (or EEPROM) block. An erase of the full P-Flash block is only possible when FPLDIS, FPHDIS and FPOPEN bits in the FPROT register are set prior to launching the command. 0x0A Erase P-Flash Sector 0x0B Unsecure Flash 0x0C Verify Backdoor Access Key Supports a method of releasing MCU security by verifying a set of security keys. 0x0D Set User Margin Level Specifies a user margin read level for all P-Flash blocks. 0x0E Set Field Margin Level Specifies a field margin read level for all P-Flash blocks (special modes only). 18.4.4.5 Function on P-Flash Memory Verify that all P-Flash (and EEPROM) blocks are erased. Verify that a P-Flash block is erased. Verify that a given number of words starting at the address provided are erased. Read a dedicated 64 byte field in the nonvolatile information register in P-Flash block that was previously programmed using the Program Once command. Program a phrase in a P-Flash block. Erase all bytes in a P-Flash sector. Supports a method of releasing MCU security by erasing all P-Flash (and EEPROM) blocks and verifying that all P-Flash (and EEPROM) blocks are erased. EEPROM Commands Table 18-29 summarizes the valid EEPROM commands along with the effects of the commands on the EEPROM block. Table 18-29. EEPROM Commands FCMD Command 0x01 Erase Verify All Blocks 0x02 Erase Verify Block Function on EEPROM Memory Verify that all EEPROM (and P-Flash) blocks are erased. Verify that the EEPROM block is erased. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 503 64 KByte Flash Module (S12FTMRG64K512V1) for S12VR64 Table 18-29. EEPROM Commands FCMD Command Function on EEPROM Memory 0x08 Erase All Blocks Erase all EEPROM (and P-Flash) blocks. An erase of all Flash blocks is only possible when the FPLDIS, FPHDIS, and FPOPEN bits in the FPROT register and the DPOPEN bit in the EEPROT register are set prior to launching the command. 0x09 Erase Flash Block Erase a EEPROM (or P-Flash) block. An erase of the full EEPROM block is only possible when DPOPEN bit in the EEPROT register is set prior to launching the command. 0x0B Unsecure Flash Supports a method of releasing MCU security by erasing all EEPROM (and P-Flash) blocks and verifying that all EEPROM (and P-Flash) blocks are erased. 0x0D Set User Margin Level Specifies a user margin read level for the EEPROM block. 0x0E Set Field Margin Level Specifies a field margin read level for the EEPROM block (special modes only). 0x10 Erase Verify EEPROM Section Verify that a given number of words starting at the address provided are erased. 0x11 Program EEPROM Program up to four words in the EEPROM block. 0x12 Erase EEPROM Sector Erase all bytes in a sector of the EEPROM block. 18.4.5 Allowed Simultaneous P-Flash and EEPROM Operations Only the operations marked ‘OK’ in Table 18-30 are permitted to be run simultaneously on the Program Flash and EEPROM blocks. Some operations cannot be executed simultaneously because certain hardware resources are shared by the two memories. The priority has been placed on permitting Program Flash reads while program and erase operations execute on the EEPROM, providing read (P-Flash) while write (EEPROM) functionality. Table 18-30. Allowed P-Flash and EEPROM Simultaneous Operations EEPROM Program Flash Read Read Margin Read1 Program Sector Erase OK OK OK Mass Erase2 Margin Read1 Program Sector Erase Mass Erase2 OK 1 A ‘Margin Read’ is any read after executing the margin setting commands ‘Set User Margin Level’ or ‘Set Field Margin Level’ with anything but the ‘normal’ level specified. See the Note on margin settings in Section 18.4.6.12 Set User Margin Level Command and Section 18.4.6.13 Set Field Margin Level Command. 2 The ‘Mass Erase’ operations are commands ‘Erase All Blocks’ and ‘Erase Flash Block’ MC9S12VR Family Reference Manual, Rev. 4.2 504 NXP Semiconductor 64 KByte Flash Module (S12FTMRG64K512V1) for S12VR64 18.4.6 Flash Command Description This section provides details of all available Flash commands launched by a command write sequence. The ACCERR bit in the FSTAT register will be set during the command write sequence if any of the following illegal steps are performed, causing the command not to be processed by the Memory Controller: • Starting any command write sequence that programs or erases Flash memory before initializing the FCLKDIV register • Writing an invalid command as part of the command write sequence • For additional possible errors, refer to the error handling table provided for each command If a Flash block is read during execution of an algorithm (CCIF = 0) on that same block, the read operation will return invalid data if both flags SFDIF and DFDIF are set. If the SFDIF or DFDIF flags were not previously set when the invalid read operation occurred, both the SFDIF and DFDIF flags will be set. If the ACCERR or FPVIOL bits are set in the FSTAT register, the user must clear these bits before starting any command write sequence (see Section 18.3.2.7 Flash Status Register (FSTAT)). CAUTION A Flash word or phrase must be in the erased state before being programmed. Cumulative programming of bits within a Flash word or phrase is not allowed. 18.4.6.1 Erase Verify All Blocks Command The Erase Verify All Blocks command will verify that all P-Flash and EEPROM blocks have been erased. Table 18-31. Erase Verify All Blocks Command FCCOB Requirements CCOBIX[2:0] FCCOB Parameters 000 0x01 Not required Upon clearing CCIF to launch the Erase Verify All Blocks command, the Memory Controller will verify that the entire Flash memory space is erased. The CCIF flag will set after the Erase Verify All Blocks operation has completed. If all blocks are not erased, it means blank check failed, both MGSTAT bits will be set. Table 18-32. Erase Verify All Blocks Command Error Handling Register FSTAT Error Bit Error Condition ACCERR Set if CCOBIX[2:0] != 000 at command launch FPVIOL None MGSTAT1 Set if any errors have been encountered during the reador if blank check failed . MGSTAT0 Set if any non-correctable errors have been encountered during the read or if blank check failed. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 505 64 KByte Flash Module (S12FTMRG64K512V1) for S12VR64 18.4.6.2 Erase Verify Block Command The Erase Verify Block command allows the user to verify that an entire P-Flash or EEPROM block has been erased. The FCCOB FlashBlockSelectionCode[1:0]bits determine which block must be verified. Table 18-33. Erase Verify Block Command FCCOB Requirements CCOBIX[2:0] FCCOB Parameters 000 Flash block selection code [1:0]. See Table 18-34 0x02 Table 18-34. Flash block selection code description Selection code[1:0] Flash block to be verified 00 EEPROM 01 Invalid (ACCERR) 10 Invalid (ACCERR) 11 P-Flash Upon clearing CCIF to launch the Erase Verify Block command, the Memory Controller will verify that the selected P-Flash or EEPROM block is erased. The CCIF flag will set after the Erase Verify Block operation has completed.If the block is not erased, it means blank check failed, both MGSTAT bits will be set. Table 18-35. Erase Verify Block Command Error Handling Register Error Bit ACCERR FSTAT 18.4.6.3 FPVIOL Error Condition Set if CCOBIX[2:0] != 000 at command launch Set if an invalid FlashBlockSelectionCode[1:0] is supplied None MGSTAT1 Set if any errors have been encountered during the read or if blank check failed. MGSTAT0 Set if any non-correctable errors have been encountered during the read or if blank check failed. Erase Verify P-Flash Section Command The Erase Verify P-Flash Section command will verify that a section of code in the P-Flash memory is erased. The Erase Verify P-Flash Section command defines the starting point of the code to be verified and the number of phrases. MC9S12VR Family Reference Manual, Rev. 4.2 506 NXP Semiconductor 64 KByte Flash Module (S12FTMRG64K512V1) for S12VR64 Table 18-36. Erase Verify P-Flash Section Command FCCOB Requirements CCOBIX[2:0] 000 FCCOB Parameters 0x03 Global address [17:16] of a P-Flash block 001 Global address [15:0] of the first phrase to be verified 010 Number of phrases to be verified Upon clearing CCIF to launch the Erase Verify P-Flash Section command, the Memory Controller will verify the selected section of Flash memory is erased. The CCIF flag will set after the Erase Verify P-Flash Section operation has completed. If the section is not erased, it means blank check failed, both MGSTAT bits will be set. Table 18-37. Erase Verify P-Flash Section Command Error Handling Register Error Bit Error Condition Set if CCOBIX[2:0] != 010 at command launch Set if command not available in current mode (see Table 18-27) ACCERR Set if an invalid global address [17:0] is supplied see ) Set if a misaligned phrase address is supplied (global address [2:0] != 000) FSTAT Set if the requested section crosses a the P-Flash address boundary FPVIOL 18.4.6.4 None MGSTAT1 Set if any errors have been encountered during the read or if blank check failed. MGSTAT0 Set if any non-correctable errors have been encountered during the read or if blank check failed. Read Once Command The Read Once command provides read access to a reserved 64 byte field (8 phrases) located in the nonvolatile information register of P-Flash. The Read Once field is programmed using the Program Once command described in Section 18.4.6.6 Program Once Command. The Read Once command must not be executed from the Flash block containing the Program Once reserved field to avoid code runaway. Table 18-38. Read Once Command FCCOB Requirements CCOBIX[2:0] 000 FCCOB Parameters 0x04 Not Required 001 Read Once phrase index (0x0000 - 0x0007) 010 Read Once word 0 value 011 Read Once word 1 value 100 Read Once word 2 value 101 Read Once word 3 value MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 507 64 KByte Flash Module (S12FTMRG64K512V1) for S12VR64 Upon clearing CCIF to launch the Read Once command, a Read Once phrase is fetched and stored in the FCCOB indexed register. The CCIF flag will set after the Read Once operation has completed. Valid phrase index values for the Read Once command range from 0x0000 to 0x0007. During execution of the Read Once command, any attempt to read addresses within P-Flash block will return invalid data. 8 Table 18-39. Read Once Command Error Handling Register Error Bit Error Condition Set if CCOBIX[2:0] != 001 at command launch ACCERR Set if an invalid phrase index is supplied FSTAT 18.4.6.5 Set if command not available in current mode (see Table 18-27) FPVIOL None MGSTAT1 Set if any errors have been encountered during the read MGSTAT0 Set if any non-correctable errors have been encountered during the read Program P-Flash Command The Program P-Flash operation will program a previously erased phrase in the P-Flash memory using an embedded algorithm. CAUTION A P-Flash phrase must be in the erased state before being programmed. Cumulative programming of bits within a Flash phrase is not allowed. Table 18-40. Program P-Flash Command FCCOB Requirements CCOBIX[2:0] 000 1 FCCOB Parameters 0x06 Global address [17:16] to identify P-Flash block 001 Global address [15:0] of phrase location to be programmed1 010 Word 0 program value 011 Word 1 program value 100 Word 2 program value 101 Word 3 program value Global address [2:0] must be 000 Upon clearing CCIF to launch the Program P-Flash command, the Memory Controller will program the data words to the supplied global address and will then proceed to verify the data words read back as expected. The CCIF flag will set after the Program P-Flash operation has completed. MC9S12VR Family Reference Manual, Rev. 4.2 508 NXP Semiconductor 64 KByte Flash Module (S12FTMRG64K512V1) for S12VR64 Table 18-41. Program P-Flash Command Error Handling Register Error Bit Error Condition Set if CCOBIX[2:0] != 101 at command launch ACCERR FSTAT Set if an invalid global address [17:0] is supplied see ) Set if a misaligned phrase address is supplied (global address [2:0] != 000) FPVIOL 18.4.6.6 Set if command not available in current mode (see Table 18-27) Set if the global address [17:0] points to a protected area MGSTAT1 Set if any errors have been encountered during the verify operation MGSTAT0 Set if any non-correctable errors have been encountered during the verify operation Program Once Command The Program Once command restricts programming to a reserved 64 byte field (8 phrases) in the nonvolatile information register located in P-Flash. The Program Once reserved field can be read using the Read Once command as described in Section 18.4.6.4 Read Once Command. The Program Once command must only be issued once since the nonvolatile information register in P-Flash cannot be erased. The Program Once command must not be executed from the Flash block containing the Program Once reserved field to avoid code runaway. Table 18-42. Program Once Command FCCOB Requirements CCOBIX[2:0] 000 FCCOB Parameters 0x07 Not Required 001 Program Once phrase index (0x0000 - 0x0007) 010 Program Once word 0 value 011 Program Once word 1 value 100 Program Once word 2 value 101 Program Once word 3 value Upon clearing CCIF to launch the Program Once command, the Memory Controller first verifies that the selected phrase is erased. If erased, then the selected phrase will be programmed and then verified with read back. The CCIF flag will remain clear, setting only after the Program Once operation has completed. The reserved nonvolatile information register accessed by the Program Once command cannot be erased and any attempt to program one of these phrases a second time will not be allowed. Valid phrase index values for the Program Once command range from 0x0000 to 0x0007. During execution of the Program Once command, any attempt to read addresses within P-Flash will return invalid data. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 509 64 KByte Flash Module (S12FTMRG64K512V1) for S12VR64 Table 18-43. Program Once Command Error Handling Register Error Bit Error Condition Set if CCOBIX[2:0] != 101 at command launch ACCERR Set if an invalid phrase index is supplied Set if the requested phrase has already been programmed1 FSTAT FPVIOL 1 Set if command not available in current mode (see Table 18-27) None MGSTAT1 Set if any errors have been encountered during the verify operation MGSTAT0 Set if any non-correctable errors have been encountered during the verify operation If a Program Once phrase is initially programmed to 0xFFFF_FFFF_FFFF_FFFF, the Program Once command will be allowed to execute again on that same phrase. 18.4.6.7 Erase All Blocks Command The Erase All Blocks operation will erase the entire P-Flash and EEPROM memory space. Table 18-44. Erase All Blocks Command FCCOB Requirements CCOBIX[2:0] 000 FCCOB Parameters 0x08 Not required Upon clearing CCIF to launch the Erase All Blocks command, the Memory Controller will erase the entire Flash memory space and verify that it is erased. If the Memory Controller verifies that the entire Flash memory space was properly erased, security will be released. During the execution of this command (CCIF=0) the user must not write to any Flash module register. The CCIF flag will set after the Erase All Blocks operation has completed. Table 18-45. Erase All Blocks Command Error Handling Register Error Bit ACCERR FSTAT 18.4.6.8 FPVIOL Error Condition Set if CCOBIX[2:0] != 000 at command launch Set if command not available in current mode (see Table 18-27) Set if any area of the P-Flash or EEPROM memory is protected MGSTAT1 Set if any errors have been encountered during the verify operation MGSTAT0 Set if any non-correctable errors have been encountered during the verify operation Erase Flash Block Command The Erase Flash Block operation will erase all addresses in a P-Flash or EEPROM block. MC9S12VR Family Reference Manual, Rev. 4.2 510 NXP Semiconductor 64 KByte Flash Module (S12FTMRG64K512V1) for S12VR64 Table 18-46. Erase Flash Block Command FCCOB Requirements CCOBIX[2:0] 000 001 FCCOB Parameters 0x09 Global address [17:16] to identify Flash block Global address [15:0] in Flash block to be erased Upon clearing CCIF to launch the Erase Flash Block command, the Memory Controller will erase the selected Flash block and verify that it is erased. The CCIF flag will set after the Erase Flash Block operation has completed. Table 18-47. Erase Flash Block Command Error Handling Register Error Bit Error Condition Set if CCOBIX[2:0] != 001 at command launch Set if command not available in current mode (see Table 18-27) ACCERR Set if the supplied P-Flash address is not phrase-aligned or if the EEPROM address is not word-aligned FSTAT FPVIOL 18.4.6.9 Set if an invalid global address [17:16] is supplied Set if an area of the selected Flash block is protected MGSTAT1 Set if any errors have been encountered during the verify operation MGSTAT0 Set if any non-correctable errors have been encountered during the verify operation Erase P-Flash Sector Command The Erase P-Flash Sector operation will erase all addresses in a P-Flash sector. Table 18-48. Erase P-Flash Sector Command FCCOB Requirements CCOBIX[2:0] 000 001 FCCOB Parameters 0x0A Global address [17:16] to identify P-Flash block to be erased Global address [15:0] anywhere within the sector to be erased. Refer to Section 18.1.2.1 P-Flash Features for the P-Flash sector size. Upon clearing CCIF to launch the Erase P-Flash Sector command, the Memory Controller will erase the selected Flash sector and then verify that it is erased. The CCIF flag will be set after the Erase P-Flash Sector operation has completed. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 511 64 KByte Flash Module (S12FTMRG64K512V1) for S12VR64 Table 18-49. Erase P-Flash Sector Command Error Handling Register Error Bit Error Condition Set if CCOBIX[2:0] != 001 at command launch ACCERR FSTAT Set if an invalid global address [17:16] is supplied see ) Set if a misaligned phrase address is supplied (global address [2:0] != 000) FPVIOL 18.4.6.10 Set if command not available in current mode (see Table 18-27) Set if the selected P-Flash sector is protected MGSTAT1 Set if any errors have been encountered during the verify operation MGSTAT0 Set if any non-correctable errors have been encountered during the verify operation Unsecure Flash Command The Unsecure Flash command will erase the entire P-Flash and EEPROM memory space and, if the erase is successful, will release security. Table 18-50. Unsecure Flash Command FCCOB Requirements CCOBIX[2:0] 000 FCCOB Parameters 0x0B Not required Upon clearing CCIF to launch the Unsecure Flash command, the Memory Controller will erase the entire P-Flash and EEPROM memory space and verify that it is erased. If the Memory Controller verifies that the entire Flash memory space was properly erased, security will be released. If the erase verify is not successful, the Unsecure Flash operation sets MGSTAT1 and terminates without changing the security state. During the execution of this command (CCIF=0) the user must not write to any Flash module register. The CCIF flag is set after the Unsecure Flash operation has completed. Table 18-51. Unsecure Flash Command Error Handling Register Error Bit ACCERR FSTAT 18.4.6.11 FPVIOL Error Condition Set if CCOBIX[2:0] != 000 at command launch Set if command not available in current mode (see Table 18-27) Set if any area of the P-Flash or EEPROM memory is protected MGSTAT1 Set if any errors have been encountered during the verify operation MGSTAT0 Set if any non-correctable errors have been encountered during the verify operation Verify Backdoor Access Key Command The Verify Backdoor Access Key command will only execute if it is enabled by the KEYEN bits in the FSEC register (see Table 18-10). The Verify Backdoor Access Key command releases security if user-supplied keys match those stored in the Flash security bytes of the Flash configuration field (see Table 18-4). The Verify Backdoor Access Key command must not be executed from the Flash block containing the backdoor comparison key to avoid code runaway. MC9S12VR Family Reference Manual, Rev. 4.2 512 NXP Semiconductor 64 KByte Flash Module (S12FTMRG64K512V1) for S12VR64 Table 18-52. Verify Backdoor Access Key Command FCCOB Requirements CCOBIX[2:0] FCCOB Parameters 000 0x0C Not required 001 Key 0 010 Key 1 011 Key 2 100 Key 3 Upon clearing CCIF to launch the Verify Backdoor Access Key command, the Memory Controller will check the FSEC KEYEN bits to verify that this command is enabled. If not enabled, the Memory Controller sets the ACCERR bit in the FSTAT register and terminates. If the command is enabled, the Memory Controller compares the key provided in FCCOB to the backdoor comparison key in the Flash configuration field with Key 0 compared to 0x3_FF00, etc. If the backdoor keys match, security will be released. If the backdoor keys do not match, security is not released and all future attempts to execute the Verify Backdoor Access Key command are aborted (set ACCERR) until a reset occurs. The CCIF flag is set after the Verify Backdoor Access Key operation has completed. Table 18-53. Verify Backdoor Access Key Command Error Handling Register Error Bit Error Condition Set if CCOBIX[2:0] != 100 at command launch Set if an incorrect backdoor key is supplied ACCERR FSTAT 18.4.6.12 Set if backdoor key access has not been enabled (KEYEN[1:0] != 10, see Section 18.3.2.2 Flash Security Register (FSEC)) Set if the backdoor key has mismatched since the last reset FPVIOL None MGSTAT1 None MGSTAT0 None Set User Margin Level Command The Set User Margin Level command causes the Memory Controller to set the margin level for future read operations of the P-Flash or EEPROM block. Table 18-54. Set User Margin Level Command FCCOB Requirements CCOBIX[2:0] 000 001 FCCOB Parameters 0x0D Flash block selection code [1:0]. Table 18-34 See Margin level setting. Upon clearing CCIF to launch the Set User Margin Level command, the Memory Controller will set the user margin level for the targeted block and then set the CCIF flag. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 513 64 KByte Flash Module (S12FTMRG64K512V1) for S12VR64 NOTE When the EEPROM block is targeted, the EEPROM user margin levels are applied only to the EEPROM reads. However, when the P-Flash block is targeted, the P-Flash user margin levels are applied to both P-Flash and EEPROM reads. It is not possible to apply user margin levels to the P-Flash block only. Valid margin level settings for the Set User Margin Level command are defined in Table 18-55. Table 18-55. Valid Set User Margin Level Settings 1 2 CCOB (CCOBIX=001) Level Description 0x0000 Return to Normal Level 0x0001 User Margin-1 Level1 0x0002 User Margin-0 Level2 Read margin to the erased state Read margin to the programmed state Table 18-56. Set User Margin Level Command Error Handling Register Error Bit Error Condition Set if CCOBIX[2:0] != 001 at command launch ACCERR FSTAT Set if command not available in current mode (see Table 18-27) Set if an invalid FlashBlockSelectionCode[1:0] is supplied (See Table 18-34) Set if an invalid margin level setting is supplied FPVIOL None MGSTAT1 None MGSTAT0 None NOTE User margin levels can be used to check that Flash memory contents have adequate margin for normal level read operations. If unexpected results are encountered when checking Flash memory contents at user margin levels, a potential loss of information has been detected. 18.4.6.13 Set Field Margin Level Command The Set Field Margin Level command, valid in special modes only, causes the Memory Controller to set the margin level specified for future read operations of the P-Flash or EEPROM block. MC9S12VR Family Reference Manual, Rev. 4.2 514 NXP Semiconductor 64 KByte Flash Module (S12FTMRG64K512V1) for S12VR64 Upon clearing CCIF to launch the Set Field Margin Level command, the Memory Controller will set the Table 18-57. Set Field Margin Level Command FCCOB Requirements CCOBIX[2:0] FCCOB Parameters 000 Flash block selection code [1:0]. 0x0E 001 Table 18-34 See Margin level setting. field margin level for the targeted block and then set the CCIF flag. NOTE When the EEPROM block is targeted, the EEPROM field margin levels are applied only to the EEPROM reads. However, when the P-Flash block is targeted, the P-Flash field margin levels are applied to both P-Flash and EEPROM reads. It is not possible to apply field margin levels to the P-Flash block only. Valid margin level settings for the Set Field Margin Level command are defined in Table 18-58. Table 18-58. Valid Set Field Margin Level Settings 1 2 CCOB (CCOBIX=001) Level Description 0x0000 Return to Normal Level 0x0001 User Margin-1 Level1 0x0002 User Margin-0 Level2 0x0003 Field Margin-1 Level1 0x0004 Field Margin-0 Level2 Read margin to the erased state Read margin to the programmed state Table 18-59. Set Field Margin Level Command Error Handling Register Error Bit Error Condition Set if CCOBIX[2:0] != 001 at command launch ACCERR FSTAT Set if command not available in current mode (see Table 18-27) Set if an invalid FlashBlockSelectionCode[1:0] is supplied (See Table 18-34) Set if an invalid margin level setting is supplied FPVIOL None MGSTAT1 None MGSTAT0 None MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 515 64 KByte Flash Module (S12FTMRG64K512V1) for S12VR64 CAUTION Field margin levels must only be used during verify of the initial factory programming. NOTE Field margin levels can be used to check that Flash memory contents have adequate margin for data retention at the normal level setting. If unexpected results are encountered when checking Flash memory contents at field margin levels, the Flash memory contents should be erased and reprogrammed. 18.4.6.14 Erase Verify EEPROM Section Command The Erase Verify EEPROM Section command will verify that a section of code in the EEPROM is erased. The Erase Verify EEPROM Section command defines the starting point of the data to be verified and the number of words. Table 18-60. Erase Verify EEPROM Section Command FCCOB Requirements CCOBIX[2:0] 000 FCCOB Parameters 0x10 Global address [17:16] to identify the EEPROM block 001 Global address [15:0] of the first word to be verified 010 Number of words to be verified Upon clearing CCIF to launch the Erase Verify EEPROM Section command, the Memory Controller will verify the selected section of EEPROM memory is erased. The CCIF flag will set after the Erase Verify EEPROM Section operation has completed. If the section is not erased, it means blank check failed, both MGSTAT bits will be set. Table 18-61. Erase Verify EEPROM Section Command Error Handling Register Error Bit Error Condition Set if CCOBIX[2:0] != 010 at command launch Set if command not available in current mode (see Table 18-27) ACCERR Set if an invalid global address [17:0] is supplied Set if a misaligned word address is supplied (global address [0] != 0) FSTAT Set if the requested section breaches the end of the EEPROM block FPVIOL None MGSTAT1 Set if any errors have been encountered during the read or if blank check failed. MGSTAT0 Set if any non-correctable errors have been encountered during the read or if blank check failed. MC9S12VR Family Reference Manual, Rev. 4.2 516 NXP Semiconductor 64 KByte Flash Module (S12FTMRG64K512V1) for S12VR64 18.4.6.15 Program EEPROM Command The Program EEPROM operation programs one to four previously erased words in the EEPROM block. The Program EEPROM operation will confirm that the targeted location(s) were successfully programmed upon completion. CAUTION A Flash word must be in the erased state before being programmed. Cumulative programming of bits within a Flash word is not allowed. Table 18-62. Program EEPROM Command FCCOB Requirements CCOBIX[2:0] 000 FCCOB Parameters Global address [17:16] to identify the EEPROM block 0x11 001 Global address [15:0] of word to be programmed 010 Word 0 program value 011 Word 1 program value, if desired 100 Word 2 program value, if desired 101 Word 3 program value, if desired Upon clearing CCIF to launch the Program EEPROM command, the user-supplied words will be transferred to the Memory Controller and be programmed if the area is unprotected. The CCOBIX index value at Program EEPROM command launch determines how many words will be programmed in the EEPROM block. The CCIF flag is set when the operation has completed. Table 18-63. Program EEPROM Command Error Handling Register Error Bit Error Condition Set if CCOBIX[2:0] < 010 at command launch Set if CCOBIX[2:0] > 101 at command launch ACCERR FSTAT Set if command not available in current mode (see Table 18-27) Set if an invalid global address [17:0] is supplied Set if a misaligned word address is supplied (global address [0] != 0) Set if the requested group of words breaches the end of the EEPROM block FPVIOL 18.4.6.16 Set if the selected area of the EEPROM memory is protected MGSTAT1 Set if any errors have been encountered during the verify operation MGSTAT0 Set if any non-correctable errors have been encountered during the verify operation Erase EEPROM Sector Command The Erase EEPROM Sector operation will erase all addresses in a sector of the EEPROM block. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 517 64 KByte Flash Module (S12FTMRG64K512V1) for S12VR64 Table 18-64. Erase EEPROM Sector Command FCCOB Requirements CCOBIX[2:0] FCCOB Parameters 000 001 0x12 Global address [17:16] to identify EEPROM block Global address [15:0] anywhere within the sector to be erased. See Section 18.1.2.2 EEPROM Features for EEPROM sector size. Upon clearing CCIF to launch the Erase EEPROM Sector command, the Memory Controller will erase the selected Flash sector and verify that it is erased. The CCIF flag will set after the Erase EEPROM Sector operation has completed. Table 18-65. Erase EEPROM Sector Command Error Handling Register Error Bit Error Condition Set if CCOBIX[2:0] != 001 at command launch ACCERR FSTAT Set if an invalid global address [17:0] is suppliedsee ) Set if a misaligned word address is supplied (global address [0] != 0) FPVIOL 18.4.7 Set if command not available in current mode (see Table 18-27) Set if the selected area of the EEPROM memory is protected MGSTAT1 Set if any errors have been encountered during the verify operation MGSTAT0 Set if any non-correctable errors have been encountered during the verify operation Interrupts The Flash module can generate an interrupt when a Flash command operation has completed or when a Flash command operation has detected an ECC fault. Table 18-66. Flash Interrupt Sources Interrupt Source Global (CCR) Mask Interrupt Flag Local Enable CCIF (FSTAT register) CCIE (FCNFG register) I Bit ECC Double Bit Fault on Flash Read DFDIF (FERSTAT register) DFDIE (FERCNFG register) I Bit ECC Single Bit Fault on Flash Read SFDIF (FERSTAT register) SFDIE (FERCNFG register) I Bit Flash Command Complete NOTE Vector addresses and their relative interrupt priority are determined at the MCU level. MC9S12VR Family Reference Manual, Rev. 4.2 518 NXP Semiconductor 64 KByte Flash Module (S12FTMRG64K512V1) for S12VR64 18.4.7.1 Description of Flash Interrupt Operation The Flash module uses the CCIF flag in combination with the CCIE interrupt enable bit to generate the Flash command interrupt request. The Flash module uses the DFDIF and SFDIF flags in combination with the DFDIE and SFDIE interrupt enable bits to generate the Flash error interrupt request. For a detailed description of the register bits involved, refer to Section 18.3.2.5, “Flash Configuration Register (FCNFG)”, Section 18.3.2.6, “Flash Error Configuration Register (FERCNFG)”, Section 18.3.2.7, “Flash Status Register (FSTAT)”, and Section 18.3.2.8, “Flash Error Status Register (FERSTAT)”. The logic used for generating the Flash module interrupts is shown in Figure 18-26. CCIE CCIF DFDIE DFDIF Flash Command Interrupt Request Flash Error Interrupt Request SFDIE SFDIF Figure 18-26. Flash Module Interrupts Implementation 18.4.8 Wait Mode The Flash module is not affected if the MCU enters wait mode. The Flash module can recover the MCU from wait via the CCIF interrupt (see Section 18.4.7, “Interrupts”). 18.4.9 Stop Mode If a Flash command is active (CCIF = 0) when the MCU requests stop mode, the current Flash operation will be completed before the MCU is allowed to enter stop mode. 18.5 Security The Flash module provides security information to the MCU. The Flash security state is defined by the SEC bits of the FSEC register (see Table 18-11). During reset, the Flash module initializes the FSEC register using data read from the security byte of the Flash configuration field at global address 0x3_FF0F. The security state out of reset can be permanently changed by programming the security byte assuming that the MCU is starting from a mode where the necessary P-Flash erase and program commands are available and that the upper region of the P-Flash is unprotected. If the Flash security byte is successfully programmed, its new value will take affect after the next MCU reset. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 519 64 KByte Flash Module (S12FTMRG64K512V1) for S12VR64 The following subsections describe these security-related subjects: • Unsecuring the MCU using Backdoor Key Access • Unsecuring the MCU in Special Single Chip Mode using BDM • Mode and Security Effects on Flash Command Availability 18.5.1 Unsecuring the MCU using Backdoor Key Access The MCU may be unsecured by using the backdoor key access feature which requires knowledge of the contents of the backdoor keys (four 16-bit words programmed at addresses 0x3_FF00-0x3_FF07). If the KEYEN[1:0] bits are in the enabled state (see Section 18.3.2.2 Flash Security Register (FSEC)), the Verify Backdoor Access Key command (see Section 18.4.6.11 Verify Backdoor Access Key Command) allows the user to present four prospective keys for comparison to the keys stored in the Flash memory via the Memory Controller. If the keys presented in the Verify Backdoor Access Key command match the backdoor keys stored in the Flash memory, the SEC bits in the FSEC register (see Table 18-11) will be changed to unsecure the MCU. Key values of 0x0000 and 0xFFFF are not permitted as backdoor keys. While the Verify Backdoor Access Key command is active, P-Flash memory and EEPROM memory will not be available for read access and will return invalid data. The user code stored in the P-Flash memory must have a method of receiving the backdoor keys from an external stimulus. This external stimulus would typically be through one of the on-chip serial ports. If the KEYEN[1:0] bits are in the enabled state (see Section 18.3.2.2 Flash Security Register (FSEC)), the MCU can be unsecured by the backdoor key access sequence described below: 1. Follow the command sequence for the Verify Backdoor Access Key command as explained in Section 18.4.6.11 Verify Backdoor Access Key Command 2. If the Verify Backdoor Access Key command is successful, the MCU is unsecured and the SEC[1:0] bits in the FSEC register are forced to the unsecure state of 10 The Verify Backdoor Access Key command is monitored by the Memory Controller and an illegal key will prohibit future use of the Verify Backdoor Access Key command. A reset of the MCU is the only method to re-enable the Verify Backdoor Access Key command. The security as defined in the Flash security byte (0x3_FF0F) is not changed by using the Verify Backdoor Access Key command sequence. The backdoor keys stored in addresses 0x3_FF00-0x3_FF07 are unaffected by the Verify Backdoor Access Key command sequence. The Verify Backdoor Access Key command sequence has no effect on the program and erase protections defined in the Flash protection register, FPROT. After the backdoor keys have been correctly matched, the MCU will be unsecured. After the MCU is unsecured, the sector containing the Flash security byte can be erased and the Flash security byte can be reprogrammed to the unsecure state, if desired. In the unsecure state, the user has full control of the contents of the backdoor keys by programming addresses 0x3_FF00-0x3_FF07 in the Flash configuration field. MC9S12VR Family Reference Manual, Rev. 4.2 520 NXP Semiconductor 64 KByte Flash Module (S12FTMRG64K512V1) for S12VR64 18.5.2 Unsecuring the MCU in Special Single Chip Mode using BDM A secured MCU can be unsecured in special single chip mode by using the following method to erase the P-Flash and EEPROM memory: 1. Reset the MCU into special single chip mode 2. Delay while the BDM executes the Erase Verify All Blocks command write sequence to check if the P-Flash and EEPROM memories are erased 3. Send BDM commands to disable protection in the P-Flash and EEPROM memory 4. Execute the Erase All Blocks command write sequence to erase the P-Flash and EEPROM memory. Alternatively the Unsecure Flash command can be executed, if so the steps 5 and 6 below are skeeped. 5. After the CCIF flag sets to indicate that the Erase All Blocks operation has completed, reset the MCU into special single chip mode 6. Delay while the BDM executes the Erase Verify All Blocks command write sequence to verify that the P-Flash and EEPROM memory are erased If the P-Flash and EEPROM memory are verified as erased, the MCU will be unsecured. All BDM commands will now be enabled and the Flash security byte may be programmed to the unsecure state by continuing with the following steps: 7. Send BDM commands to execute the Program P-Flash command write sequence to program the Flash security byte to the unsecured state 8. Reset the MCU 18.5.3 Mode and Security Effects on Flash Command Availability The availability of Flash module commands depends on the MCU operating mode and security state as shown in Table 18-27. 18.6 Initialization On each system reset the flash module executes an initialization sequence which establishes initial values for the Flash Block Configuration Parameters, the FPROT and EEPROT protection registers, and the FOPT and FSEC registers. The initialization routine reverts to built-in default values that leave the module in a fully protected and secured state if errors are encountered during execution of the reset sequence. If a double bit fault is detected during the reset sequence, both MGSTAT bits in the FSTAT register will be set. CCIF is cleared throughout the initialization sequence. The Flash module holds off all CPU access for a portion of the initialization sequence. Flash reads are allowed once the hold is removed. Completion of the initialization sequence is marked by setting CCIF high which enables user commands. If a reset occurs while any Flash command is in progress, that command will be immediately aborted. The state of the word being programmed or the sector/block being erased is not guaranteed. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 521 64 KByte Flash Module (S12FTMRG64K512V1) for S12VR64 MC9S12VR Family Reference Manual, Rev. 4.2 522 NXP Semiconductor Chapter 19 32 KByte Flash Module (S12FTMRG32K128V1) for S12VR32 Table 19-1. Revision History Revision Number Revision Date V01.00 28 Jan 2014 Sections Affected Description of Changes Initial version MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 523 19.1 Introduction The FTMRG32K128 module implements the following: • 32Kbytes of P-Flash (Program Flash) memory • 128bytes of EEPROM memory The Flash memory is ideal for single-supply applications allowing for field reprogramming without requiring external high voltage sources for program or erase operations. The Flash module includes a memory controller that executes commands to modify Flash memory contents. The user interface to the memory controller consists of the indexed Flash Common Command Object (FCCOB) register which is written to with the command, global address, data, and any required command parameters. The memory controller must complete the execution of a command before the FCCOB register can be written to with a new command. CAUTION A Flash word or phrase must be in the erased state before being programmed. Cumulative programming of bits within a Flash word or phrase is not allowed. The Flash memory may be read as bytes and aligned words. Read access time is one bus cycle for bytes and aligned words. For misaligned words access, the CPU has to perform twice the byte read access command. For Flash memory, an erased bit reads 1 and a programmed bit reads 0. It is possible to read from P-Flash memory while some commands are executing on EEPROM memory. It is not possible to read from EEPROM memory while a command is executing on P-Flash memory. Simultaneous P-Flash and EEPROM operations are discussed in Section 19.4.5 Allowed Simultaneous P-Flash and EEPROM Operations. Both P-Flash and EEPROM memories are implemented with Error Correction Codes (ECC) that can resolve single bit faults and detect double bit faults. For P-Flash memory, the ECC implementation requires that programming be done on an aligned 8 byte basis (a Flash phrase). Since P-Flash memory is always read by half-phrase, only one single bit fault in an aligned 4 byte half-phrase containing the byte or word accessed will be corrected. 19.1.1 Glossary Command Write Sequence — An MCU instruction sequence to execute built-in algorithms (including program and erase) on the Flash memory. EEPROM Memory — The EEPROM memory constitutes the nonvolatile memory store for data. EEPROM Sector — The EEPROM sector is the smallest portion of the EEPROM memory that can be erased. The EEPROM sector consists of 4 bytes. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 524 32 KByte Flash Module (S12FTMRG32K128V1) for S12VR32 NVM Command Mode — An NVM mode using the CPU to setup the FCCOB register to pass parameters required for Flash command execution. Phrase — An aligned group of four 16-bit words within the P-Flash memory. Each phrase includes two sets of aligned double words with each set including 7 ECC bits for single bit fault correction and double bit fault detection within each double word. P-Flash Memory — The P-Flash memory constitutes the main nonvolatile memory store for applications. P-Flash Sector — The P-Flash sector is the smallest portion of the P-Flash memory that can be erased. Each P-Flash sector contains 512 bytes. Program IFR — Nonvolatile information register located in the P-Flash block that contains the Version ID, and the Program Once field. 19.1.2 Features 19.1.2.1 • • • • • • 32 Kbytes of P-Flash memory composed of one 32 Kbyte Flash block divided into 64 sectors of 512 bytes Single bit fault correction and double bit fault detection within a 32-bit double word during read operations Automated program and erase algorithm with verify and generation of ECC parity bits Fast sector erase and phrase program operation Ability to read the P-Flash memory while programming a word in the EEPROM memory Flexible protection scheme to prevent accidental program or erase of P-Flash memory 19.1.2.2 • • • • • • EEPROM Features 128 bytes of EEPROM memory composed of one 128 byte Flash block divided into 32 sectors of 4 bytes Single bit fault correction and double bit fault detection within a word during read operations Automated program and erase algorithm with verify and generation of ECC parity bits Fast sector erase and word program operation Protection scheme to prevent accidental program or erase of EEPROM memory Ability to program up to four words in a burst sequence 19.1.2.3 • • • P-Flash Features Other Flash Module Features No external high-voltage power supply required for Flash memory program and erase operations Interrupt generation on Flash command completion and Flash error detection Security mechanism to prevent unauthorized access to the Flash memory MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 525 32 KByte Flash Module (S12FTMRG32K128V1) for S12VR32 19.1.3 Block Diagram The block diagram of the Flash module is shown in . Flash Interface Command Interrupt Request Error Interrupt Request 16bit internal bus Registers P-Flash 8Kx39 sector 0 sector 1 Protection sector 63 Security Bus Clock CPU Clock Divider FCLK Memory Controller EEPROM 64x22 sector 0 sector 1 sector 63 Figure 19-1. FTMRG32K128 Block Diagram 19.2 External Signal Description The Flash module contains no signals that connect off-chip. MC9S12VR Family Reference Manual, Rev. 4.2 526 NXP Semiconductor 32 KByte Flash Module (S12FTMRG32K128V1) for S12VR32 19.3 Memory Map and Registers This section describes the memory map and registers for the Flash module. Read data from unimplemented memory space in the Flash module is undefined. Write access to unimplemented or reserved memory space in the Flash module will be ignored by the Flash module. CAUTION Writing to the Flash registers while a Flash command is executing (that is indicated when the value of flag CCIF reads as ’0’) is not allowed. If such action is attempted the write operation will not change the register value. Writing to the Flash registers is allowed when the Flash is not busy executing commands (CCIF = 1) and during initialization right after reset, despite the value of flag CCIF in that case (refer to Section 19.6 Initialization for a complete description of the reset sequence). . Table 19-2. FTMRG Memory Map Global Address (in Bytes) 0x0_0000 - 0x0_03FF 1 Size (Bytes) 1,024 Description Register Space 0x0_0400 – 0x0_047F 128 EEPROM Memory 0x0_4000 – 0x0_7FFF 16,284 NVMRES1=1 : NVM Resource area (see Figure 19-3) 0x3_8000 – 0x3_FFFF 32,768 P-Flash Memory See NVMRES description in Section 19.4.3 Internal NVM resource (NVMRES) 19.3.1 Module Memory Map The S12 architecture places the P-Flash memory between global addresses 0x3_8000 and 0x3_FFFF as shown in Table 19-3 .The P-Flash memory map is shown in Figure 19-2. Table 19-3. P-Flash Memory Addressing Global Address Size (Bytes) 0x3_8000 – 0x3_FFFF 32 K Description P-Flash Block Contains Flash Configuration Field (see Table 19-4) The FPROT register, described in Section 19.3.2.9 P-Flash Protection Register (FPROT), can be set to protect regions in the Flash memory from accidental program or erase. Three separate memory regions, one growing upward from global address 0x3_8000 in the Flash memory (called the lower region), one growing downward from global address 0x3_FFFF in the Flash memory (called the higher region), and MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 527 32 KByte Flash Module (S12FTMRG32K128V1) for S12VR32 the remaining addresses in the Flash memory, can be activated for protection. The Flash memory addresses covered by these protectable regions are shown in the P-Flash memory map. The higher address region is mainly targeted to hold the boot loader code since it covers the vector space. Default protection settings as well as security information that allows the MCU to restrict access to the Flash module are stored in the Flash configuration field as described in Table 19-4. Table 19-4. Flash Configuration Field 1 Global Address Size (Bytes) 0x3_FF00-0x3_FF07 8 Backdoor Comparison Key Refer to Section 19.4.6.11, “Verify Backdoor Access Key Command,” and Section 19.5.1, “Unsecuring the MCU using Backdoor Key Access” 0x3_FF08-0x3_FF0B1 4 Reserved 0x3_FF0C1 1 P-Flash Protection byte. Refer to Section 19.3.2.9, “P-Flash Protection Register (FPROT)” 0x3_FF0D1 1 EEPROM Protection byte. Refer to Section 19.3.2.10, “EEPROM Protection Register (EEPROT)” 0x3_FF0E1 1 Flash Nonvolatile byte Refer to Section 19.3.2.16, “Flash Option Register (FOPT)” 0x3_FF0F1 1 Flash Security byte Refer to Section 19.3.2.2, “Flash Security Register (FSEC)” Description 0x3FF08-0x3_FF0F form a Flash phrase and must be programmed in a single command write sequence. Each byte in the 0x3_FF08 - 0x3_FF0B reserved field should be programmed to 0xFF. P-Flash START = 0x3_8000 0x3_8400 0x3_8800 0x3_9000 Protection Fixed End Flash Protected/Unprotected Lower Region 1, 2, 4, 8 Kbytes 0x3_A000 Flash Protected/Unprotected Region 8 Kbytes (up to 29 Kbytes) Protection Movable End 0x3_C000 Protection Fixed End 0x3_E000 Flash Protected/Unprotected Higher Region 2, 4, 8, 16 Kbytes 0x3_F000 0x3_F800 P-Flash END = 0x3_FFFF Flash Configuration Field 16 bytes (0x3_FF00 - 0x3_FF0F) Figure 19-2. P-Flash Memory Map MC9S12VR Family Reference Manual, Rev. 4.2 528 NXP Semiconductor 32 KByte Flash Module (S12FTMRG32K128V1) for S12VR32 Table 19-5. Program IFR Fields 1 Global Address Size (Bytes) 0x0_4000 – 0x0_4007 8 Reserved 0x0_4008 – 0x0_40B5 174 Reserved 0x0_40B6 – 0x0_40B7 2 Version ID1 0x0_40B8 – 0x0_40BF 8 Reserved 0x0_40C0 – 0x0_40FF 64 Program Once Field Refer to Section 19.4.6.6, “Program Once Command” Field Description Used to track firmware patch versions, see Section 19.4.2 IFR Version ID Word Table 19-6. Memory Controller Resource Fields (NVMRES1=1) Global Address Size (Bytes) 0x0_4000 – 0x0_40FF 256 P-Flash IFR (see Table 19-5) 0x0_4100 – 0x0_41FF 256 Reserved. 0x0_4200 – 0x0_57FF 1 Description Reserved 0x0_5800 – 0x0_59FF 512 Reserved 0x0_5A00 – 0x0_5FFF 1,536 Reserved 0x0_6000 – 0x0_6BFF 3,072 Reserved 0x0_6C00 – 0x0_7FFF 5,120 Reserved NVMRES - See Section 19.4.3 Internal NVM resource (NVMRES) for NVMRES (NVM Resource) detail. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 529 32 KByte Flash Module (S12FTMRG32K128V1) for S12VR32 0x0_4000 P-Flash IFR 1 Kbyte (NVMRES=1) 0x0_4400 Reserved 5k bytes RAM Start = 0x0_5800 RAM End = 0x0_59FF Reserved 512 bytes Reserved 4608 bytes 0x0_6C00 Reserved 5120 bytes 0x0_7FFF Figure 19-3. Memory Controller Resource Memory Map (NVMRES=1) 19.3.2 Register Descriptions The Flash module contains a set of 20 control and status registers located between Flash module base + 0x0000 and 0x0013. In the case of the writable registers, the write accesses are forbidden during Fash command execution (for more detail, see Caution note in Section 19.3 Memory Map and Registers). A summary of the Flash module registers is given in Figure 19-4 with detailed descriptions in the following subsections. Address & Name FCLKDIV FSEC FCCOBIX 7 R 6 5 4 3 2 1 0 FDIVLCK FDIV5 FDIV4 FDIV3 FDIV2 FDIV1 FDIV0 KEYEN1 KEYEN0 RNV5 RNV4 RNV3 RNV2 SEC1 SEC0 0 0 0 0 0 CCOBIX2 CCOBIX1 CCOBIX0 FDIVLD W R W R W Figure 19-4. FTMRG32K128 Register Summary MC9S12VR Family Reference Manual, Rev. 4.2 530 NXP Semiconductor 32 KByte Flash Module (S12FTMRG32K128V1) for S12VR32 Address & Name FRSV0 FCNFG FERCNFG FSTAT FERSTAT FPROT EEPROT FCCOBHI FCCOBLO FRSV1 FRSV2 FRSV3 FRSV4 FOPT R 7 6 5 4 3 2 1 0 0 0 0 0 0 0 0 0 0 0 0 0 FDFD FSFD 0 0 0 0 0 DFDIE SFDIE ACCERR FPVIOL MGBUSY RSVD MGSTAT1 MGSTAT0 0 0 0 0 DFDIF SFDIF FPHDIS FPHS1 FPHS0 FPLDIS FPLS1 FPLS0 0 0 0 0 0 DPS1 DPS0 CCOB15 CCOB14 CCOB13 CCOB12 CCOB11 CCOB10 CCOB9 CCOB8 CCOB7 CCOB6 CCOB5 CCOB4 CCOB3 CCOB2 CCOB1 CCOB0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 NV7 NV6 NV5 NV4 NV3 NV2 NV1 NV0 W R W R CCIE 0 IGNSF W R W R 0 CCIF 0 0 W R W R W R W R W R FPOPEN DPOPEN RNV6 W R W R W R W R W Figure 19-4. FTMRG32K128 Register Summary (continued) MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 531 32 KByte Flash Module (S12FTMRG32K128V1) for S12VR32 Address & Name FRSV5 FRSV6 FRSV7 R 7 6 5 4 3 2 1 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 W R W R W = Unimplemented or Reserved Figure 19-4. FTMRG32K128 Register Summary (continued) 19.3.2.1 Flash Clock Divider Register (FCLKDIV) The FCLKDIV register is used to control timed events in program and erase algorithms. 7 R FDIVLD W Reset 6 0 5 4 3 FDIVLCK 0 2 1 0 0 0 0 FDIV[5:0] 0 0 0 = Unimplemented or Reserved Figure 19-5. Flash Clock Divider Register (FCLKDIV) All bits in the FCLKDIV register are readable, bit 7 is not writable, bit 6 is write-once-hi and controls the writability of the FDIV field in normal mode. In special mode, bits 6-0 are writable any number of times but bit 7 remains unwritable. CAUTION The FCLKDIV register should never be written while a Flash command is executing (CCIF=0). Table 19-7. FCLKDIV Field Descriptions Field 7 FDIVLD Description Clock Divider Loaded 0 FCLKDIV register has not been written since the last reset 1 FCLKDIV register has been written since the last reset MC9S12VR Family Reference Manual, Rev. 4.2 532 NXP Semiconductor 32 KByte Flash Module (S12FTMRG32K128V1) for S12VR32 Table 19-7. FCLKDIV Field Descriptions (continued) Field Description 6 FDIVLCK Clock Divider Locked 0 FDIV field is open for writing 1 FDIV value is locked and cannot be changed. Once the lock bit is set high, only reset can clear this bit and restore writability to the FDIV field in normal mode. 5–0 FDIV[5:0] Clock Divider Bits — FDIV[5:0] must be set to effectively divide BUSCLK down to 1 MHz to control timed events during Flash program and erase algorithms. Table 19-8 shows recommended values for FDIV[5:0] based on the BUSCLK frequency. Please refer to Section 19.4.4, “Flash Command Operations,” for more information. Table 19-8. FDIV values for various BUSCLK Frequencies BUSCLK Frequency (MHz) 1 2 19.3.2.2 MIN1 MAX2 1.0 1.6 1.6 BUSCLK Frequency (MHz) FDIV[5:0] FDIV[5:0] MIN1 MAX2 0x00 16.6 17.6 0x10 2.6 0x01 17.6 18.6 0x11 2.6 3.6 0x02 18.6 19.6 0x12 3.6 4.6 0x03 19.6 20.6 0x13 4.6 5.6 0x04 20.6 21.6 0x14 5.6 6.6 0x05 21.6 22.6 0x15 6.6 7.6 0x06 22.6 23.6 0x16 7.6 8.6 0x07 23.6 24.6 0x17 8.6 9.6 0x08 24.6 25.6 0x18 9.6 10.6 0x09 10.6 11.6 0x0A 11.6 12.6 0x0B 12.6 13.6 0x0C 13.6 14.6 0x0D 14.6 15.6 0x0E 15.6 16.6 0x0F BUSCLK is Greater Than this value. BUSCLK is Less Than or Equal to this value. Flash Security Register (FSEC) The FSEC register holds all bits associated with the security of the MCU and Flash module. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 533 32 KByte Flash Module (S12FTMRG32K128V1) for S12VR32 7 R 6 5 4 KEYEN[1:0] 3 2 1 RNV[5:2] 0 SEC[1:0] W Reset F1 F1 F1 F1 F1 F1 F1 F1 = Unimplemented or Reserved Figure 19-6. Flash Security Register (FSEC) 1 Loaded from IFR Flash configuration field, during reset sequence. All bits in the FSEC register are readable but not writable. During the reset sequence, the FSEC register is loaded with the contents of the Flash security byte in the Flash configuration field at global address 0x3_FF0F located in P-Flash memory (see Table 19-4) as indicated by reset condition F in Figure 19-6. If a double bit fault is detected while reading the P-Flash phrase containing the Flash security byte during the reset sequence, all bits in the FSEC register will be set to leave the Flash module in a secured state with backdoor key access disabled. Table 19-9. FSEC Field Descriptions Field Description 7–6 Backdoor Key Security Enable Bits — The KEYEN[1:0] bits define the enabling of backdoor key access to the Flash KEYEN[1:0] module as shown in Table 19-10. 5–2 RNV[5:2] Reserved Nonvolatile Bits — The RNV bits should remain in the erased state for future enhancements. 1–0 SEC[1:0] Flash Security Bits — The SEC[1:0] bits define the security state of the MCU as shown in Table 19-11. If the Flash module is unsecured using backdoor key access, the SEC bits are forced to 10. Table 19-10. Flash KEYEN States KEYEN[1:0] 1 Status of Backdoor Key Access 00 DISABLED 01 DISABLED1 10 ENABLED 11 DISABLED Preferred KEYEN state to disable backdoor key access. Table 19-11. Flash Security States 1 SEC[1:0] Status of Security 00 SECURED 01 SECURED1 10 UNSECURED 11 SECURED Preferred SEC state to set MCU to secured state. The security function in the Flash module is described in Section 19.5 Security. MC9S12VR Family Reference Manual, Rev. 4.2 534 NXP Semiconductor 32 KByte Flash Module (S12FTMRG32K128V1) for S12VR32 19.3.2.3 Flash CCOB Index Register (FCCOBIX) The FCCOBIX register is used to index the FCCOB register for Flash memory operations. R 7 6 5 4 3 0 0 0 0 0 0 0 0 0 0 2 0 CCOBIX[2:0] W Reset 1 0 0 0 = Unimplemented or Reserved Figure 19-7. FCCOB Index Register (FCCOBIX) CCOBIX bits are readable and writable while remaining bits read 0 and are not writable. Table 19-12. FCCOBIX Field Descriptions Field Description 2–0 CCOBIX[1:0] Common Command Register Index— The CCOBIX bits are used to select which word of the FCCOB register array is being read or written to. See 19.3.2.11 Flash Common Command Object Register (FCCOB),” for more details. 19.3.2.4 Flash Reserved0 Register (FRSV0) This Flash register is reserved for factory testing. R 7 6 5 4 3 2 1 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 W Reset = Unimplemented or Reserved Figure 19-8. Flash Reserved0 Register (FRSV0) All bits in the FRSV0 register read 0 and are not writable. 19.3.2.5 Flash Configuration Register (FCNFG) The FCNFG register enables the Flash command complete interrupt and forces ECC faults on Flash array read access from the CPU. 7 R W Reset CCIE 0 6 5 0 0 0 0 4 IGNSF 0 3 2 0 0 0 0 1 0 FDFD FSFD 0 0 = Unimplemented or Reserved Figure 19-9. Flash Configuration Register (FCNFG) MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 535 32 KByte Flash Module (S12FTMRG32K128V1) for S12VR32 CCIE, IGNSF, FDFD, and FSFD bits are readable and writable while remaining bits read 0 and are not writable. Table 19-13. FCNFG Field Descriptions Field Description 7 CCIE Command Complete Interrupt Enable — The CCIE bit controls interrupt generation when a Flash command has completed. 0 Command complete interrupt disabled 1 An interrupt will be requested whenever the CCIF flag in the FSTAT register is set (see Section 19.3.2.7 Flash Status Register (FSTAT)) 4 IGNSF Ignore Single Bit Fault — The IGNSF controls single bit fault reporting in the FERSTAT register (see Section 19.3.2.8 Flash Error Status Register (FERSTAT)). 0 All single bit faults detected during array reads are reported 1 Single bit faults detected during array reads are not reported and the single bit fault interrupt will not be generated 1 FDFD Force Double Bit Fault Detect — The FDFD bit allows the user to simulate a double bit fault during Flash array read operations and check the associated interrupt routine. The FDFD bit is cleared by writing a 0 to FDFD. 0 Flash array read operations will set the DFDIF flag in the FERSTAT register only if a double bit fault is detected 1 Any Flash array read operation will force the DFDIF flag in the FERSTAT register to be set (see Section 19.3.2.7 Flash Status Register (FSTAT)) and an interrupt will be generated as long as the DFDIE interrupt enable in the FERCNFG register is set (see Section 19.3.2.6 Flash Error Configuration Register (FERCNFG)) 0 FSFD Force Single Bit Fault Detect — The FSFD bit allows the user to simulate a single bit fault during Flash array read operations and check the associated interrupt routine. The FSFD bit is cleared by writing a 0 to FSFD. 0 Flash array read operations will set the SFDIF flag in the FERSTAT register only if a single bit fault is detected 1 Flash array read operation will force the SFDIF flag in the FERSTAT register to be set (see Section 19.3.2.7 Flash Status Register (FSTAT)) and an interrupt will be generated as long as the SFDIE interrupt enable in the FERCNFG register is set (see Section 19.3.2.6 Flash Error Configuration Register (FERCNFG)) 19.3.2.6 Flash Error Configuration Register (FERCNFG) The FERCNFG register enables the Flash error interrupts for the FERSTAT flags. R 7 6 5 4 3 2 0 0 0 0 0 0 0 0 0 0 0 0 W Reset 1 0 DFDIE SFDIE 0 0 = Unimplemented or Reserved Figure 19-10. Flash Error Configuration Register (FERCNFG) All assigned bits in the FERCNFG register are readable and writable. MC9S12VR Family Reference Manual, Rev. 4.2 536 NXP Semiconductor 32 KByte Flash Module (S12FTMRG32K128V1) for S12VR32 Table 19-14. FERCNFG Field Descriptions Field Description 1 DFDIE Double Bit Fault Detect Interrupt Enable — The DFDIE bit controls interrupt generation when a double bit fault is detected during a Flash block read operation. 0 DFDIF interrupt disabled 1 An interrupt will be requested whenever the DFDIF flag is set (see Section 19.3.2.8 Flash Error Status Register (FERSTAT)) 0 SFDIE Single Bit Fault Detect Interrupt Enable — The SFDIE bit controls interrupt generation when a single bit fault is detected during a Flash block read operation. 0 SFDIF interrupt disabled whenever the SFDIF flag is set (see Section 19.3.2.8 Flash Error Status Register (FERSTAT)) 1 An interrupt will be requested whenever the SFDIF flag is set (see Section 19.3.2.8 Flash Error Status Register (FERSTAT)) 19.3.2.7 Flash Status Register (FSTAT) The FSTAT register reports the operational status of the Flash module. 7 R W Reset CCIF 1 6 0 0 5 4 ACCERR FPVIOL 0 0 3 2 MGBUSY RSVD 0 0 1 0 MGSTAT[1:0] 01 01 = Unimplemented or Reserved Figure 19-11. Flash Status Register (FSTAT) 1 Reset value can deviate from the value shown if a double bit fault is detected during the reset sequence (see Section 19.6 Initialization). CCIF, ACCERR, and FPVIOL bits are readable and writable, MGBUSY and MGSTAT bits are readable but not writable, while remaining bits read 0 and are not writable. Table 19-15. FSTAT Field Descriptions Field Description 7 CCIF Command Complete Interrupt Flag — The CCIF flag indicates that a Flash command has completed. The CCIF flag is cleared by writing a 1 to CCIF to launch a command and CCIF will stay low until command completion or command violation. 0 Flash command in progress 1 Flash command has completed 5 ACCERR Flash Access Error Flag — The ACCERR bit indicates an illegal access has occurred to the Flash memory caused by either a violation of the command write sequence (see Section 19.4.4.2 Command Write Sequence) or issuing an illegal Flash command. While ACCERR is set, the CCIF flag cannot be cleared to launch a command. The ACCERR bit is cleared by writing a 1 to ACCERR. Writing a 0 to the ACCERR bit has no effect on ACCERR. 0 No access error detected 1 Access error detected 4 FPVIOL Flash Protection Violation Flag —The FPVIOL bit indicates an attempt was made to program or erase an address in a protected area of P-Flash or EEPROM memory during a command write sequence. The FPVIOL bit is cleared by writing a 1 to FPVIOL. Writing a 0 to the FPVIOL bit has no effect on FPVIOL. While FPVIOL is set, it is not possible to launch a command or start a command write sequence. 0 No protection violation detected 1 Protection violation detected MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 537 32 KByte Flash Module (S12FTMRG32K128V1) for S12VR32 Table 19-15. FSTAT Field Descriptions (continued) Field 3 MGBUSY 2 RSVD 1–0 MGSTAT[1:0] 19.3.2.8 Description Memory Controller Busy Flag — The MGBUSY flag reflects the active state of the Memory Controller. 0 Memory Controller is idle 1 Memory Controller is busy executing a Flash command (CCIF = 0) Reserved Bit — This bit is reserved and always reads 0. Memory Controller Command Completion Status Flag — One or more MGSTAT flag bits are set if an error is detected during execution of a Flash command or during the Flash reset sequence. See Section 19.4.6, “Flash Command Description,” and Section 19.6, “Initialization” for details. Flash Error Status Register (FERSTAT) The FERSTAT register reflects the error status of internal Flash operations. R 7 6 5 4 3 2 0 0 0 0 0 0 0 0 0 0 0 0 W Reset 1 0 DFDIF SFDIF 0 0 = Unimplemented or Reserved Figure 19-12. Flash Error Status Register (FERSTAT) All flags in the FERSTAT register are readable and only writable to clear the flag. Table 19-16. FERSTAT Field Descriptions Field Description 1 DFDIF Double Bit Fault Detect Interrupt Flag — The setting of the DFDIF flag indicates that a double bit fault was detected in the stored parity and data bits during a Flash array read operation or that a Flash array read operation returning invalid data was attempted on a Flash block that was under a Flash command operation.1 The DFDIF flag is cleared by writing a 1 to DFDIF. Writing a 0 to DFDIF has no effect on DFDIF.2 0 No double bit fault detected 1 Double bit fault detected or a Flash array read operation returning invalid data was attempted while command running 0 SFDIF Single Bit Fault Detect Interrupt Flag — With the IGNSF bit in the FCNFG register clear, the SFDIF flag indicates that a single bit fault was detected in the stored parity and data bits during a Flash array read operation or that a Flash array read operation returning invalid data was attempted on a Flash block that was under a Flash command operation.1 The SFDIF flag is cleared by writing a 1 to SFDIF. Writing a 0 to SFDIF has no effect on SFDIF. 0 No single bit fault detected 1 Single bit fault detected and corrected or a Flash array read operation returning invalid data was attempted while command running 1 The single bit fault and double bit fault flags are mutually exclusive for parity errors (an ECC fault occurrence can be either single fault or double fault but never both). A simultaneous access collision (Flash array read operation returning invalid data attempted while command running) is indicated when both SFDIF and DFDIF flags are high. 2 There is a one cycle delay in storing the ECC DFDIF and SFDIF fault flags in this register. At least one NOP is required after a flash memory read before checking FERSTAT for the occurrence of ECC errors. MC9S12VR Family Reference Manual, Rev. 4.2 538 NXP Semiconductor 32 KByte Flash Module (S12FTMRG32K128V1) for S12VR32 19.3.2.9 P-Flash Protection Register (FPROT) The FPROT register defines which P-Flash sectors are protected against program and erase operations. 7 R W Reset FPOPEN F1 6 RNV6 F1 5 4 FPHDIS F1 3 FPHS[1:0] F1 2 1 FPLDIS F1 F1 0 FPLS[1:0] F1 F1 = Unimplemented or Reserved Figure 19-13. Flash Protection Register (FPROT) 1 Loaded from IFR Flash configuration field, during reset sequence. The (unreserved) bits of the FPROT register are writable in Normal Single Chip Mode with the restriction that the size of the protected region can only be increased(see Section 19.3.2.9.1, “P-Flash Protection Restrictions,” and Table 19-21).All (unreserved) bits of the FPROT register are writable without restriction in Special Single Chip Mode . During the reset sequence, the FPROT register is loaded with the contents of the P-Flash protection byte in the Flash configuration field at global address 0x3_FF0C located in P-Flash memory (see Table 19-4) as indicated by reset condition ‘F’ in Figure 19-13. To change the P-Flash protection that will be loaded during the reset sequence, the upper sector of the P-Flash memory must be unprotected, then the P-Flash protection byte must be reprogrammed. If a double bit fault is detected while reading the P-Flash phrase containing the P-Flash protection byte during the reset sequence, the FPOPEN bit will be cleared and remaining bits in the FPROT register will be set to leave the P-Flash memory fully protected. Trying to alter data in any protected area in the P-Flash memory will result in a protection violation error and the FPVIOL bit will be set in the FSTAT register. The block erase of a P-Flash block is not possible if any of the P-Flash sectors contained in the same P-Flash block are protected. Table 19-17. FPROT Field Descriptions Field Description 7 FPOPEN Flash Protection Operation Enable — The FPOPEN bit determines the protection function for program or erase operations as shown in Table 19-18 for the P-Flash block. 0 When FPOPEN is clear, the FPHDIS and FPLDIS bits define unprotected address ranges as specified by the corresponding FPHS and FPLS bits 1 When FPOPEN is set, the FPHDIS and FPLDIS bits enable protection for the address range specified by the corresponding FPHS and FPLS bits 6 RNV[6] Reserved Nonvolatile Bit — The RNV bit should remain in the erased state for future enhancements. 5 FPHDIS Flash Protection Higher Address Range Disable — The FPHDIS bit determines whether there is a protected/unprotected area in a specific region of the P-Flash memory ending with global address 0x3_FFFF. 0 Protection/Unprotection enabled 1 Protection/Unprotection disabled 4–3 FPHS[1:0] Flash Protection Higher Address Size — The FPHS bits determine the size of the protected/unprotected area in P-Flash memory as shown inTable 19-19. The FPHS bits can only be written to while the FPHDIS bit is set. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 539 32 KByte Flash Module (S12FTMRG32K128V1) for S12VR32 Table 19-17. FPROT Field Descriptions (continued) Field Description 2 FPLDIS Flash Protection Lower Address Range Disable — The FPLDIS bit determines whether there is a protected/unprotected area in a specific region of the P-Flash memory beginning with global address 0x3_8000. 0 Protection/Unprotection enabled 1 Protection/Unprotection disabled 1–0 FPLS[1:0] Flash Protection Lower Address Size — The FPLS bits determine the size of the protected/unprotected area in P-Flash memory as shown in Table 19-20. The FPLS bits can only be written to while the FPLDIS bit is set. Table 19-18. P-Flash Protection Function 1 Function1 FPOPEN FPHDIS FPLDIS 1 1 1 No P-Flash Protection 1 1 0 Protected Low Range 1 0 1 Protected High Range 1 0 0 Protected High and Low Ranges 0 1 1 Full P-Flash Memory Protected 0 1 0 Unprotected Low Range 0 0 1 Unprotected High Range 0 0 0 Unprotected High and Low Ranges For range sizes, refer to Table 19-19 and Table 19-20. Table 19-19. P-Flash Protection Higher Address Range FPHS[1:0] Global Address Range Protected Size 00 0x3_F800–0x3_FFFF 2 Kbytes 01 0x3_F000–0x3_FFFF 4 Kbytes 10 0x3_E000–0x3_FFFF 8 Kbytes 11 0x3_C000–0x3_FFFF 16 Kbytes Table 19-20. P-Flash Protection Lower Address Range FPLS[1:0] Global Address Range Protected Size 00 0x3_8000–0x3_83FF 1 Kbyte 01 0x3_8000–0x3_87FF 2 Kbytes 10 0x3_8000–0x3_8FFF 4 Kbytes 11 0x3_8000–0x3_9FFF 8 Kbytes All possible P-Flash protection scenarios are shown in Figure 19-14Although the protection scheme is loaded from the Flash memory at global address 0x3_FF0C during the reset sequence, it can be changed by the user. The P-Flash protection scheme can be used by applications requiring reprogramming in Normal Single Chip Mode while providing as much protection as possible if reprogramming is not required. MC9S12VR Family Reference Manual, Rev. 4.2 540 NXP Semiconductor FPHDIS = 0 FPLDIS = 0 7 6 5 4 3 2 1 0 0x3_8000 Scenario FLASH START FPLS[1:0] 0x3_FFFF FPHS[1:0] 0x3_8000 FPOPEN = 0 FPHDIS = 0 FPLDIS = 1 FPLS[1:0] FPHDIS = 1 FPLDIS = 0 FPHS[1:0] Scenario FLASH START FPHDIS = 1 FPLDIS = 1 FPOPEN = 1 32 KByte Flash Module (S12FTMRG32K128V1) for S12VR32 0x3_FFFF Unprotected region Protected region with size defined by FPLS Protected region not defined by FPLS, FPHS Protected region with size defined by FPHS Figure 19-14. P-Flash Protection Scenarios MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 541 32 KByte Flash Module (S12FTMRG32K128V1) for S12VR32 19.3.2.9.1 P-Flash Protection Restrictions In Normal Single Chip Mode the general guideline is that P-Flash protection can only be added and not removed. Table 19-21 specifies all valid transitions between P-Flash protection scenarios. Any attempt to write an invalid scenario to the FPROT register will be ignored. The contents of the FPROT register reflect the active protection scenario. See the FPHS and FPLS bit descriptions for additional restrictions. Table 19-21. P-Flash Protection Scenario Transitions To Protection Scenario1 From Protection Scenario 0 1 2 3 0 X X X X X 1 X 4 X X X X X X X X X X 6 X 7 1 19.3.2.10 X 6 7 X 3 5 5 X X 2 4 X X X X X X Allowed transitions marked with X, see Figure 19-14 for a definition of the scenarios. EEPROM Protection Register (EEPROT) The EEPROT register defines which EEPROM sectors are protected against program and erase operations. 7 R W Reset DPOPEN F1 6 5 4 3 2 0 0 0 0 0 0 0 0 0 0 1 0 DPS[1:0] F1 F1 = Unimplemented or Reserved Figure 19-15. EEPROM Protection Register (EEPROT) 1 Loaded from IFR Flash configuration field, during reset sequence. The (unreserved) bits of the EEPROT register are writable in Normal Single Chip Mode with the restriction that protection can be added but not removed. Writes in Normal Single Chip Mode must increase the DPS value and the DPOPEN bit can only be written from 1 (protection disabled) to 0 (protection enabled). If the DPOPEN bit is set, the state of the DPS bits is irrelevant.All DPOPEN/DPS bit registers are writable without restriction in Special Single Chip Mode. During the reset sequence, fields DPOPEN and DPS of the EEPROT register are loaded with the contents of the EEPROM protection byte in the Flash configuration field at global address 0x3_FF0D located in P-Flash memory (see Table 19-4) as indicated by reset condition F in Table 19-23. To change the MC9S12VR Family Reference Manual, Rev. 4.2 542 NXP Semiconductor 32 KByte Flash Module (S12FTMRG32K128V1) for S12VR32 EEPROM protection that will be loaded during the reset sequence, the P-Flash sector containing the EEPROM protection byte must be unprotected, then the EEPROM protection byte must be programmed. If a double bit fault is detected while reading the P-Flash phrase containing the EEPROM protection byte during the reset sequence, the DPOPEN bit will be cleared and DPS bits will be set to leave the EEPROM memory fully protected. Trying to alter data in any protected area in the EEPROM memory will result in a protection violation error and the FPVIOL bit will be set in the FSTAT register. Block erase of the EEPROM memory is not possible if any of the EEPROM sectors are protected. Table 19-22. EEPROT Field Descriptions Field Description 7 DPOPEN EEPROM Protection Control 0 Enables EEPROM memory protection from program and erase with protected address range defined by DPS bits 1 Disables EEPROM memory protection from program and erase 1–0 DPS[1:0] EEPROM Protection Size — The DPS[1:0] bits determine the size of the protected area in the EEPROM memory as shown inTable 19-23 . Table 19-23. EEPROM Protection Address Range 19.3.2.11 DPS[1:0] Global Address Range Protected Size 00 0x0_0400 – 0x0_041F 32 bytes 01 0x0_0400 – 0x0_043F 64 bytes 10 0x0_0400 – 0x0_045F 96 bytes 11 0x0_0400 – 0x0_047F 128 bytes Flash Common Command Object Register (FCCOB) The FCCOB is an array of six words addressed via the CCOBIX index found in the FCCOBIX register. Byte wide reads and writes are allowed to the FCCOB register. 7 6 5 4 R 2 1 0 0 0 0 0 CCOB[15:8] W Reset 3 0 0 0 0 Figure 19-16. Flash Common Command Object High Register (FCCOBHI) MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 543 32 KByte Flash Module (S12FTMRG32K128V1) for S12VR32 7 6 5 4 R 2 1 0 0 0 0 0 CCOB[7:0] W Reset 3 0 0 0 0 Figure 19-17. Flash Common Command Object Low Register (FCCOBLO) 19.3.2.11.1 FCCOB - NVM Command Mode NVM command mode uses the indexed FCCOB register to provide a command code and its relevant parameters to the Memory Controller. The user first sets up all required FCCOB fields and then initiates the command’s execution by writing a 1 to the CCIF bit in the FSTAT register (a 1 written by the user clears the CCIF command completion flag to 0). When the user clears the CCIF bit in the FSTAT register all FCCOB parameter fields are locked and cannot be changed by the user until the command completes (as evidenced by the Memory Controller returning CCIF to 1). Some commands return information to the FCCOB register array. The generic format for the FCCOB parameter fields in NVM command mode is shown in Table 19-24. The return values are available for reading after the CCIF flag in the FSTAT register has been returned to 1 by the Memory Controller. Writes to the unimplemented parameter fields (CCOBIX = 110 and CCOBIX = 111) are ignored with reads from these fields returning 0x0000. Table 19-24 shows the generic Flash command format. The high byte of the first word in the CCOB array contains the command code, followed by the parameters for this specific Flash command. For details on the FCCOB settings required by each command, see the Flash command descriptions in Section 19.4.6 Flash Command Description. Table 19-24. FCCOB - NVM Command Mode (Typical Usage) CCOBIX[2:0] 000 001 010 011 100 101 Byte FCCOB Parameter Fields (NVM Command Mode) HI FCMD[7:0] defining Flash command LO 6’h0, Global address [17:16] HI Global address [15:8] LO Global address [7:0] HI Data 0 [15:8] LO Data 0 [7:0] HI Data 1 [15:8] LO Data 1 [7:0] HI Data 2 [15:8] LO Data 2 [7:0] HI Data 3 [15:8] LO Data 3 [7:0] MC9S12VR Family Reference Manual, Rev. 4.2 544 NXP Semiconductor 32 KByte Flash Module (S12FTMRG32K128V1) for S12VR32 19.3.2.12 Flash Reserved1 Register (FRSV1) This Flash register is reserved for factory testing. R 7 6 5 4 3 2 1 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 W Reset = Unimplemented or Reserved Figure 19-18. Flash Reserved1 Register (FRSV1) All bits in the FRSV1 register read 0 and are not writable. 19.3.2.13 Flash Reserved2 Register (FRSV2) This Flash register is reserved for factory testing. R 7 6 5 4 3 2 1 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 W Reset = Unimplemented or Reserved Figure 19-19. Flash Reserved2 Register (FRSV2) All bits in the FRSV2 register read 0 and are not writable. 19.3.2.14 Flash Reserved3 Register (FRSV3) This Flash register is reserved for factory testing. R 7 6 5 4 3 2 1 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 W Reset = Unimplemented or Reserved Figure 19-20. Flash Reserved3 Register (FRSV3) All bits in the FRSV3 register read 0 and are not writable. 19.3.2.15 Flash Reserved4 Register (FRSV4) This Flash register is reserved for factory testing. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 545 32 KByte Flash Module (S12FTMRG32K128V1) for S12VR32 R 7 6 5 4 3 2 1 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 3 2 1 0 F1 F1 F1 F1 W Reset = Unimplemented or Reserved Figure 19-21. Flash Reserved4 Register (FRSV4) All bits in the FRSV4 register read 0 and are not writable. 19.3.2.16 Flash Option Register (FOPT) The FOPT register is the Flash option register. 7 6 5 4 R NV[7:0] W Reset F1 F1 F1 F1 = Unimplemented or Reserved Figure 19-22. Flash Option Register (FOPT) 1 Loaded from IFR Flash configuration field, during reset sequence. All bits in the FOPT register are readable but are not writable. During the reset sequence, the FOPT register is loaded from the Flash nonvolatile byte in the Flash configuration field at global address 0x3_FF0E located in P-Flash memory (see Table 19-4) as indicated by reset condition F in Figure 19-22. If a double bit fault is detected while reading the P-Flash phrase containing the Flash nonvolatile byte during the reset sequence, all bits in the FOPT register will be set. Table 19-25. FOPT Field Descriptions Field Description 7–0 NV[7:0] Nonvolatile Bits — The NV[7:0] bits are available as nonvolatile bits. Refer to the device user guide for proper use of the NV bits. 19.3.2.17 Flash Reserved5 Register (FRSV5) This Flash register is reserved for factory testing. R 7 6 5 4 3 2 1 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 W Reset = Unimplemented or Reserved Figure 19-23. Flash Reserved5 Register (FRSV5) MC9S12VR Family Reference Manual, Rev. 4.2 546 NXP Semiconductor 32 KByte Flash Module (S12FTMRG32K128V1) for S12VR32 All bits in the FRSV5 register read 0 and are not writable. 19.3.2.18 Flash Reserved6 Register (FRSV6) This Flash register is reserved for factory testing. R 7 6 5 4 3 2 1 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 W Reset = Unimplemented or Reserved Figure 19-24. Flash Reserved6 Register (FRSV6) All bits in the FRSV6 register read 0 and are not writable. 19.3.2.19 Flash Reserved7 Register (FRSV7) This Flash register is reserved for factory testing. R 7 6 5 4 3 2 1 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 W Reset = Unimplemented or Reserved Figure 19-25. Flash Reserved7 Register (FRSV7) All bits in the FRSV7 register read 0 and are not writable. 19.4 19.4.1 Functional Description Modes of Operation The FTMRG32K128 module provides the modes of operation normal and special . The operating mode is determined by module-level inputs and affects the FCLKDIV, FCNFG, FPROT and EEPROT registers (see Table 19-27). MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 547 32 KByte Flash Module (S12FTMRG32K128V1) for S12VR32 19.4.2 IFR Version ID Word The version ID word is stored in the IFR at address 0x0_40B6. The contents of the word are defined in Table 19-26. Table 19-26. IFR Version ID Fields • [15:4] [3:0] Reserved VERNUM VERNUM: Version number. The first version is number 0b_0001 with both 0b_0000 and 0b_1111 meaning ‘none’. 19.4.3 Internal NVM resource (NVMRES) IFR is an internal NVM resource readable by CPU , when NVMRES is active. The IFR fields are shown in Table 19-5. The NVMRES global address map is shown in Table 19-6. 19.4.4 Flash Command Operations Flash command operations are used to modify Flash memory contents. The next sections describe: • How to write the FCLKDIV register that is used to generate a time base (FCLK) derived from BUSCLK for Flash program and erase command operations • The command write sequence used to set Flash command parameters and launch execution • Valid Flash commands available for execution, according to MCU functional mode and MCU security state. 19.4.4.1 Writing the FCLKDIV Register Prior to issuing any Flash program or erase command after a reset, the user is required to write the FCLKDIV register to divide BUSCLK down to a target FCLK of 1 MHz. Table 19-8 shows recommended values for the FDIV field based on BUSCLK frequency. NOTE Programming or erasing the Flash memory cannot be performed if the bus clock runs at less than 0.8 MHz. Setting FDIV too high can destroy the Flash memory due to overstress. Setting FDIV too low can result in incomplete programming or erasure of the Flash memory cells. When the FCLKDIV register is written, the FDIVLD bit is set automatically. If the FDIVLD bit is 0, the FCLKDIV register has not been written since the last reset. If the FCLKDIV register has not been written, any Flash program or erase command loaded during a command write sequence will not execute and the ACCERR bit in the FSTAT register will set. MC9S12VR Family Reference Manual, Rev. 4.2 548 NXP Semiconductor 32 KByte Flash Module (S12FTMRG32K128V1) for S12VR32 19.4.4.2 Command Write Sequence The Memory Controller will launch all valid Flash commands entered using a command write sequence. Before launching a command, the ACCERR and FPVIOL bits in the FSTAT register must be clear (see Section 19.3.2.7 Flash Status Register (FSTAT)) and the CCIF flag should be tested to determine the status of the current command write sequence. If CCIF is 0, the previous command write sequence is still active, a new command write sequence cannot be started, and all writes to the FCCOB register are ignored. 19.4.4.2.1 Define FCCOB Contents The FCCOB parameter fields must be loaded with all required parameters for the Flash command being executed. Access to the FCCOB parameter fields is controlled via the CCOBIX bits in the FCCOBIX register (see Section 19.3.2.3 Flash CCOB Index Register (FCCOBIX)). The contents of the FCCOB parameter fields are transferred to the Memory Controller when the user clears the CCIF command completion flag in the FSTAT register (writing 1 clears the CCIF to 0). The CCIF flag will remain clear until the Flash command has completed. Upon completion, the Memory Controller will return CCIF to 1 and the FCCOB register will be used to communicate any results. The flow for a generic command write sequence is shown in Figure 19-26. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 549 32 KByte Flash Module (S12FTMRG32K128V1) for S12VR32 START Read: FCLKDIV register Clock Divider Value Check FDIV Correct? no no yes FCCOB Availability Check CCIF Set? Read: FSTAT register yes Read: FSTAT register Note: FCLKDIV must be set after each reset Write: FCLKDIV register no CCIF Set? yes Results from previous Command ACCERR/ FPVIOL Set? no Access Error and Protection Violation Check yes Write: FSTAT register Clear ACCERR/FPVIOL 0x30 Write to FCCOBIX register to identify specific command parameter to load. Write to FCCOB register to load required command parameter. More Parameters? yes no Write: FSTAT register (to launch command) Clear CCIF 0x80 Read: FSTAT register Bit Polling for Command Completion Check CCIF Set? no yes EXIT Figure 19-26. Generic Flash Command Write Sequence Flowchart MC9S12VR Family Reference Manual, Rev. 4.2 550 NXP Semiconductor 32 KByte Flash Module (S12FTMRG32K128V1) for S12VR32 19.4.4.3 Valid Flash Module Commands Table 19-27 present the valid Flash commands, as enabled by the combination of the functional MCU mode (Normal SingleChip NS, Special Singlechip SS) with the MCU security state (Unsecured, Secured). Special Singlechip mode is selected by input mmc_ss_mode_ts2 asserted. MCU Secured state is selected by input mmc_secure input asserted. + Table 19-27. Flash Commands by Mode and Security State Unsecured FCMD Command Secured NS1 SS2 NS3 SS4 0x01 Erase Verify All Blocks 0x02 Erase Verify Block 0x03 Erase Verify P-Flash Section 0x04 Read Once 0x06 Program P-Flash 0x07 Program Once 0x08 Erase All Blocks 0x09 Erase Flash Block 0x0A Erase P-Flash Sector 0x0B Unsecure Flash 0x0C Verify Backdoor Access Key 0x0D Set User Margin Level 0x0E Set Field Margin Level 0x10 Erase Verify EEPROM Section 0x11 Program EEPROM 0x12 Erase EEPROM Sector 1 Unsecured Normal Single Chip mode Unsecured Special Single Chip mode. 3 Secured Normal Single Chip mode. 4 Secured Special Single Chip mode. 2 MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 551 32 KByte Flash Module (S12FTMRG32K128V1) for S12VR32 19.4.4.4 P-Flash Commands Table 19-28 summarizes the valid P-Flash commands along with the effects of the commands on the P-Flash block and other resources within the Flash module. Table 19-28. P-Flash Commands FCMD Command 0x01 Erase Verify All Blocks 0x02 Erase Verify Block 0x03 Erase Verify P-Flash Section 0x04 Read Once 0x06 Program P-Flash 0x07 Program Once Program a dedicated 64 byte field in the nonvolatile information register in P-Flash block that is allowed to be programmed only once. 0x08 Erase All Blocks Erase all P-Flash (and EEPROM) blocks. An erase of all Flash blocks is only possible when the FPLDIS, FPHDIS, and FPOPEN bits in the FPROT register and the DPOPEN bit in the EEPROT register are set prior to launching the command. 0x09 Erase Flash Block Erase a P-Flash (or EEPROM) block. An erase of the full P-Flash block is only possible when FPLDIS, FPHDIS and FPOPEN bits in the FPROT register are set prior to launching the command. 0x0A Erase P-Flash Sector 0x0B Unsecure Flash 0x0C Verify Backdoor Access Key Supports a method of releasing MCU security by verifying a set of security keys. 0x0D Set User Margin Level Specifies a user margin read level for all P-Flash blocks. 0x0E Set Field Margin Level Specifies a field margin read level for all P-Flash blocks (special modes only). 19.4.4.5 Function on P-Flash Memory Verify that all P-Flash (and EEPROM) blocks are erased. Verify that a P-Flash block is erased. Verify that a given number of words starting at the address provided are erased. Read a dedicated 64 byte field in the nonvolatile information register in P-Flash block that was previously programmed using the Program Once command. Program a phrase in a P-Flash block. Erase all bytes in a P-Flash sector. Supports a method of releasing MCU security by erasing all P-Flash (and EEPROM) blocks and verifying that all P-Flash (and EEPROM) blocks are erased. EEPROM Commands Table 19-29 summarizes the valid EEPROM commands along with the effects of the commands on the EEPROM block. Table 19-29. EEPROM Commands FCMD Command 0x01 Erase Verify All Blocks 0x02 Erase Verify Block Function on EEPROM Memory Verify that all EEPROM (and P-Flash) blocks are erased. Verify that the EEPROM block is erased. MC9S12VR Family Reference Manual, Rev. 4.2 552 NXP Semiconductor 32 KByte Flash Module (S12FTMRG32K128V1) for S12VR32 Table 19-29. EEPROM Commands FCMD Command Function on EEPROM Memory 0x08 Erase All Blocks Erase all EEPROM (and P-Flash) blocks. An erase of all Flash blocks is only possible when the FPLDIS, FPHDIS, and FPOPEN bits in the FPROT register and the DPOPEN bit in the EEPROT register are set prior to launching the command. 0x09 Erase Flash Block Erase a EEPROM (or P-Flash) block. An erase of the full EEPROM block is only possible when DPOPEN bit in the EEPROT register is set prior to launching the command. 0x0B Unsecure Flash Supports a method of releasing MCU security by erasing all EEPROM (and P-Flash) blocks and verifying that all EEPROM (and P-Flash) blocks are erased. 0x0D Set User Margin Level Specifies a user margin read level for the EEPROM block. 0x0E Set Field Margin Level Specifies a field margin read level for the EEPROM block (special modes only). 0x10 Erase Verify EEPROM Section Verify that a given number of words starting at the address provided are erased. 0x11 Program EEPROM Program up to four words in the EEPROM block. 0x12 Erase EEPROM Sector Erase all bytes in a sector of the EEPROM block. 19.4.5 Allowed Simultaneous P-Flash and EEPROM Operations Only the operations marked ‘OK’ in Table 19-30 are permitted to be run simultaneously on the Program Flash and EEPROM blocks. Some operations cannot be executed simultaneously because certain hardware resources are shared by the two memories. The priority has been placed on permitting Program Flash reads while program and erase operations execute on the EEPROM, providing read (P-Flash) while write (EEPROM) functionality. Table 19-30. Allowed P-Flash and EEPROM Simultaneous Operations EEPROM Program Flash Read Read Margin Read1 Program Sector Erase OK OK OK Mass Erase2 Margin Read1 Program Sector Erase Mass Erase2 OK 1 A ‘Margin Read’ is any read after executing the margin setting commands ‘Set User Margin Level’ or ‘Set Field Margin Level’ with anything but the ‘normal’ level specified. See the Note on margin settings in Section 19.4.6.12 Set User Margin Level Command and Section 19.4.6.13 Set Field Margin Level Command. 2 The ‘Mass Erase’ operations are commands ‘Erase All Blocks’ and ‘Erase Flash Block’ MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 553 32 KByte Flash Module (S12FTMRG32K128V1) for S12VR32 19.4.6 Flash Command Description This section provides details of all available Flash commands launched by a command write sequence. The ACCERR bit in the FSTAT register will be set during the command write sequence if any of the following illegal steps are performed, causing the command not to be processed by the Memory Controller: • Starting any command write sequence that programs or erases Flash memory before initializing the FCLKDIV register • Writing an invalid command as part of the command write sequence • For additional possible errors, refer to the error handling table provided for each command If a Flash block is read during execution of an algorithm (CCIF = 0) on that same block, the read operation will return invalid data if both flags SFDIF and DFDIF are set. If the SFDIF or DFDIF flags were not previously set when the invalid read operation occurred, both the SFDIF and DFDIF flags will be set. If the ACCERR or FPVIOL bits are set in the FSTAT register, the user must clear these bits before starting any command write sequence (see Section 19.3.2.7 Flash Status Register (FSTAT)). CAUTION A Flash word or phrase must be in the erased state before being programmed. Cumulative programming of bits within a Flash word or phrase is not allowed. 19.4.6.1 Erase Verify All Blocks Command The Erase Verify All Blocks command will verify that all P-Flash and EEPROM blocks have been erased. Table 19-31. Erase Verify All Blocks Command FCCOB Requirements CCOBIX[2:0] FCCOB Parameters 000 0x01 Not required Upon clearing CCIF to launch the Erase Verify All Blocks command, the Memory Controller will verify that the entire Flash memory space is erased. The CCIF flag will set after the Erase Verify All Blocks operation has completed. If all blocks are not erased, it means blank check failed, both MGSTAT bits will be set. Table 19-32. Erase Verify All Blocks Command Error Handling Register FSTAT Error Bit Error Condition ACCERR Set if CCOBIX[2:0] != 000 at command launch FPVIOL None MGSTAT1 Set if any errors have been encountered during the reador if blank check failed . MGSTAT0 Set if any non-correctable errors have been encountered during the read or if blank check failed. MC9S12VR Family Reference Manual, Rev. 4.2 554 NXP Semiconductor 32 KByte Flash Module (S12FTMRG32K128V1) for S12VR32 19.4.6.2 Erase Verify Block Command The Erase Verify Block command allows the user to verify that an entire P-Flash or EEPROM block has been erased. The FCCOB FlashBlockSelectionCode[1:0]bits determine which block must be verified. Table 19-33. Erase Verify Block Command FCCOB Requirements CCOBIX[2:0] FCCOB Parameters 000 Flash block selection code [1:0]. See Table 19-34 0x02 Table 19-34. Flash block selection code description Selection code[1:0] Flash block to be verified 00 EEPROM 01 Invalid (ACCERR) 10 Invalid (ACCERR) 11 P-Flash Upon clearing CCIF to launch the Erase Verify Block command, the Memory Controller will verify that the selected P-Flash or EEPROM block is erased. The CCIF flag will set after the Erase Verify Block operation has completed.If the block is not erased, it means blank check failed, both MGSTAT bits will be set. Table 19-35. Erase Verify Block Command Error Handling Register Error Bit ACCERR FSTAT 19.4.6.3 FPVIOL Error Condition Set if CCOBIX[2:0] != 000 at command launch Set if an invalid FlashBlockSelectionCode[1:0] is supplied None MGSTAT1 Set if any errors have been encountered during the read or if blank check failed. MGSTAT0 Set if any non-correctable errors have been encountered during the read or if blank check failed. Erase Verify P-Flash Section Command The Erase Verify P-Flash Section command will verify that a section of code in the P-Flash memory is erased. The Erase Verify P-Flash Section command defines the starting point of the code to be verified and the number of phrases. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 555 32 KByte Flash Module (S12FTMRG32K128V1) for S12VR32 Table 19-36. Erase Verify P-Flash Section Command FCCOB Requirements CCOBIX[2:0] 000 FCCOB Parameters 0x03 Global address [17:16] of a P-Flash block 001 Global address [15:0] of the first phrase to be verified 010 Number of phrases to be verified Upon clearing CCIF to launch the Erase Verify P-Flash Section command, the Memory Controller will verify the selected section of Flash memory is erased. The CCIF flag will set after the Erase Verify P-Flash Section operation has completed. If the section is not erased, it means blank check failed, both MGSTAT bits will be set. Table 19-37. Erase Verify P-Flash Section Command Error Handling Register Error Bit Error Condition Set if CCOBIX[2:0] != 010 at command launch Set if command not available in current mode (see Table 19-27) ACCERR Set if an invalid global address [17:0] is supplied see Table 19-3) Set if a misaligned phrase address is supplied (global address [2:0] != 000) FSTAT Set if the requested section crosses a the P-Flash address boundary FPVIOL 19.4.6.4 None MGSTAT1 Set if any errors have been encountered during the read or if blank check failed. MGSTAT0 Set if any non-correctable errors have been encountered during the read or if blank check failed. Read Once Command The Read Once command provides read access to a reserved 64 byte field (8 phrases) located in the nonvolatile information register of P-Flash. The Read Once field is programmed using the Program Once command described in Section 19.4.6.6 Program Once Command. The Read Once command must not be executed from the Flash block containing the Program Once reserved field to avoid code runaway. Table 19-38. Read Once Command FCCOB Requirements CCOBIX[2:0] 000 FCCOB Parameters 0x04 Not Required 001 Read Once phrase index (0x0000 - 0x0007) 010 Read Once word 0 value 011 Read Once word 1 value 100 Read Once word 2 value 101 Read Once word 3 value MC9S12VR Family Reference Manual, Rev. 4.2 556 NXP Semiconductor 32 KByte Flash Module (S12FTMRG32K128V1) for S12VR32 Upon clearing CCIF to launch the Read Once command, a Read Once phrase is fetched and stored in the FCCOB indexed register. The CCIF flag will set after the Read Once operation has completed. Valid phrase index values for the Read Once command range from 0x0000 to 0x0007. During execution of the Read Once command, any attempt to read addresses within P-Flash block will return invalid data. 8 Table 19-39. Read Once Command Error Handling Register Error Bit Error Condition Set if CCOBIX[2:0] != 001 at command launch ACCERR Set if an invalid phrase index is supplied FSTAT 19.4.6.5 Set if command not available in current mode (see Table 19-27) FPVIOL None MGSTAT1 Set if any errors have been encountered during the read MGSTAT0 Set if any non-correctable errors have been encountered during the read Program P-Flash Command The Program P-Flash operation will program a previously erased phrase in the P-Flash memory using an embedded algorithm. CAUTION A P-Flash phrase must be in the erased state before being programmed. Cumulative programming of bits within a Flash phrase is not allowed. Table 19-40. Program P-Flash Command FCCOB Requirements CCOBIX[2:0] 000 1 FCCOB Parameters 0x06 Global address [17:16] to identify P-Flash block 001 Global address [15:0] of phrase location to be programmed1 010 Word 0 program value 011 Word 1 program value 100 Word 2 program value 101 Word 3 program value Global address [2:0] must be 000 Upon clearing CCIF to launch the Program P-Flash command, the Memory Controller will program the data words to the supplied global address and will then proceed to verify the data words read back as expected. The CCIF flag will set after the Program P-Flash operation has completed. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 557 32 KByte Flash Module (S12FTMRG32K128V1) for S12VR32 Table 19-41. Program P-Flash Command Error Handling Register Error Bit Error Condition Set if CCOBIX[2:0] != 101 at command launch ACCERR FSTAT Set if an invalid global address [17:0] is supplied see Table 19-3) Set if a misaligned phrase address is supplied (global address [2:0] != 000) FPVIOL 19.4.6.6 Set if command not available in current mode (see Table 19-27) Set if the global address [17:0] points to a protected area MGSTAT1 Set if any errors have been encountered during the verify operation MGSTAT0 Set if any non-correctable errors have been encountered during the verify operation Program Once Command The Program Once command restricts programming to a reserved 64 byte field (8 phrases) in the nonvolatile information register located in P-Flash. The Program Once reserved field can be read using the Read Once command as described in Section 19.4.6.4 Read Once Command. The Program Once command must only be issued once since the nonvolatile information register in P-Flash cannot be erased. The Program Once command must not be executed from the Flash block containing the Program Once reserved field to avoid code runaway. Table 19-42. Program Once Command FCCOB Requirements CCOBIX[2:0] 000 FCCOB Parameters 0x07 Not Required 001 Program Once phrase index (0x0000 - 0x0007) 010 Program Once word 0 value 011 Program Once word 1 value 100 Program Once word 2 value 101 Program Once word 3 value Upon clearing CCIF to launch the Program Once command, the Memory Controller first verifies that the selected phrase is erased. If erased, then the selected phrase will be programmed and then verified with read back. The CCIF flag will remain clear, setting only after the Program Once operation has completed. The reserved nonvolatile information register accessed by the Program Once command cannot be erased and any attempt to program one of these phrases a second time will not be allowed. Valid phrase index values for the Program Once command range from 0x0000 to 0x0007. During execution of the Program Once command, any attempt to read addresses within P-Flash will return invalid data. MC9S12VR Family Reference Manual, Rev. 4.2 558 NXP Semiconductor 32 KByte Flash Module (S12FTMRG32K128V1) for S12VR32 Table 19-43. Program Once Command Error Handling Register Error Bit Error Condition Set if CCOBIX[2:0] != 101 at command launch ACCERR Set if an invalid phrase index is supplied Set if the requested phrase has already been programmed1 FSTAT FPVIOL 1 Set if command not available in current mode (see Table 19-27) None MGSTAT1 Set if any errors have been encountered during the verify operation MGSTAT0 Set if any non-correctable errors have been encountered during the verify operation If a Program Once phrase is initially programmed to 0xFFFF_FFFF_FFFF_FFFF, the Program Once command will be allowed to execute again on that same phrase. 19.4.6.7 Erase All Blocks Command The Erase All Blocks operation will erase the entire P-Flash and EEPROM memory space. Table 19-44. Erase All Blocks Command FCCOB Requirements CCOBIX[2:0] 000 FCCOB Parameters 0x08 Not required Upon clearing CCIF to launch the Erase All Blocks command, the Memory Controller will erase the entire Flash memory space and verify that it is erased. If the Memory Controller verifies that the entire Flash memory space was properly erased, security will be released. During the execution of this command (CCIF=0) the user must not write to any Flash module register. The CCIF flag will set after the Erase All Blocks operation has completed. Table 19-45. Erase All Blocks Command Error Handling Register Error Bit ACCERR FSTAT 19.4.6.8 FPVIOL Error Condition Set if CCOBIX[2:0] != 000 at command launch Set if command not available in current mode (see Table 19-27) Set if any area of the P-Flash or EEPROM memory is protected MGSTAT1 Set if any errors have been encountered during the verify operation MGSTAT0 Set if any non-correctable errors have been encountered during the verify operation Erase Flash Block Command The Erase Flash Block operation will erase all addresses in a P-Flash or EEPROM block. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 559 32 KByte Flash Module (S12FTMRG32K128V1) for S12VR32 Table 19-46. Erase Flash Block Command FCCOB Requirements CCOBIX[2:0] 000 001 FCCOB Parameters 0x09 Global address [17:16] to identify Flash block Global address [15:0] in Flash block to be erased Upon clearing CCIF to launch the Erase Flash Block command, the Memory Controller will erase the selected Flash block and verify that it is erased. The CCIF flag will set after the Erase Flash Block operation has completed. Table 19-47. Erase Flash Block Command Error Handling Register Error Bit Error Condition Set if CCOBIX[2:0] != 001 at command launch Set if command not available in current mode (see Table 19-27) ACCERR Set if the supplied P-Flash address is not phrase-aligned or if the EEPROM address is not word-aligned FSTAT FPVIOL 19.4.6.9 Set if an invalid global address [17:16] is supplied Set if an area of the selected Flash block is protected MGSTAT1 Set if any errors have been encountered during the verify operation MGSTAT0 Set if any non-correctable errors have been encountered during the verify operation Erase P-Flash Sector Command The Erase P-Flash Sector operation will erase all addresses in a P-Flash sector. Table 19-48. Erase P-Flash Sector Command FCCOB Requirements CCOBIX[2:0] 000 001 FCCOB Parameters 0x0A Global address [17:16] to identify P-Flash block to be erased Global address [15:0] anywhere within the sector to be erased. Refer to Section 19.1.2.1 P-Flash Features for the P-Flash sector size. Upon clearing CCIF to launch the Erase P-Flash Sector command, the Memory Controller will erase the selected Flash sector and then verify that it is erased. The CCIF flag will be set after the Erase P-Flash Sector operation has completed. MC9S12VR Family Reference Manual, Rev. 4.2 560 NXP Semiconductor 32 KByte Flash Module (S12FTMRG32K128V1) for S12VR32 Table 19-49. Erase P-Flash Sector Command Error Handling Register Error Bit Error Condition Set if CCOBIX[2:0] != 001 at command launch ACCERR FSTAT Set if an invalid global address [17:16] is supplied see Table 19-3) Set if a misaligned phrase address is supplied (global address [2:0] != 000) FPVIOL 19.4.6.10 Set if command not available in current mode (see Table 19-27) Set if the selected P-Flash sector is protected MGSTAT1 Set if any errors have been encountered during the verify operation MGSTAT0 Set if any non-correctable errors have been encountered during the verify operation Unsecure Flash Command The Unsecure Flash command will erase the entire P-Flash and EEPROM memory space and, if the erase is successful, will release security. Table 19-50. Unsecure Flash Command FCCOB Requirements CCOBIX[2:0] 000 FCCOB Parameters 0x0B Not required Upon clearing CCIF to launch the Unsecure Flash command, the Memory Controller will erase the entire P-Flash and EEPROM memory space and verify that it is erased. If the Memory Controller verifies that the entire Flash memory space was properly erased, security will be released. If the erase verify is not successful, the Unsecure Flash operation sets MGSTAT1 and terminates without changing the security state. During the execution of this command (CCIF=0) the user must not write to any Flash module register. The CCIF flag is set after the Unsecure Flash operation has completed. Table 19-51. Unsecure Flash Command Error Handling Register Error Bit ACCERR FSTAT 19.4.6.11 FPVIOL Error Condition Set if CCOBIX[2:0] != 000 at command launch Set if command not available in current mode (see Table 19-27) Set if any area of the P-Flash or EEPROM memory is protected MGSTAT1 Set if any errors have been encountered during the verify operation MGSTAT0 Set if any non-correctable errors have been encountered during the verify operation Verify Backdoor Access Key Command The Verify Backdoor Access Key command will only execute if it is enabled by the KEYEN bits in the FSEC register (see Table 19-10). The Verify Backdoor Access Key command releases security if user-supplied keys match those stored in the Flash security bytes of the Flash configuration field (see Table 19-4). The Verify Backdoor Access Key command must not be executed from the Flash block containing the backdoor comparison key to avoid code runaway. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 561 32 KByte Flash Module (S12FTMRG32K128V1) for S12VR32 Table 19-52. Verify Backdoor Access Key Command FCCOB Requirements CCOBIX[2:0] FCCOB Parameters 000 0x0C Not required 001 Key 0 010 Key 1 011 Key 2 100 Key 3 Upon clearing CCIF to launch the Verify Backdoor Access Key command, the Memory Controller will check the FSEC KEYEN bits to verify that this command is enabled. If not enabled, the Memory Controller sets the ACCERR bit in the FSTAT register and terminates. If the command is enabled, the Memory Controller compares the key provided in FCCOB to the backdoor comparison key in the Flash configuration field with Key 0 compared to 0x3_FF00, etc. If the backdoor keys match, security will be released. If the backdoor keys do not match, security is not released and all future attempts to execute the Verify Backdoor Access Key command are aborted (set ACCERR) until a reset occurs. The CCIF flag is set after the Verify Backdoor Access Key operation has completed. Table 19-53. Verify Backdoor Access Key Command Error Handling Register Error Bit Error Condition Set if CCOBIX[2:0] != 100 at command launch Set if an incorrect backdoor key is supplied ACCERR FSTAT 19.4.6.12 Set if backdoor key access has not been enabled (KEYEN[1:0] != 10, see Section 19.3.2.2 Flash Security Register (FSEC)) Set if the backdoor key has mismatched since the last reset FPVIOL None MGSTAT1 None MGSTAT0 None Set User Margin Level Command The Set User Margin Level command causes the Memory Controller to set the margin level for future read operations of the P-Flash or EEPROM block. Table 19-54. Set User Margin Level Command FCCOB Requirements CCOBIX[2:0] 000 001 FCCOB Parameters 0x0D Flash block selection code [1:0]. Table 19-34 See Margin level setting. Upon clearing CCIF to launch the Set User Margin Level command, the Memory Controller will set the user margin level for the targeted block and then set the CCIF flag. MC9S12VR Family Reference Manual, Rev. 4.2 562 NXP Semiconductor 32 KByte Flash Module (S12FTMRG32K128V1) for S12VR32 NOTE When the EEPROM block is targeted, the EEPROM user margin levels are applied only to the EEPROM reads. However, when the P-Flash block is targeted, the P-Flash user margin levels are applied to both P-Flash and EEPROM reads. It is not possible to apply user margin levels to the P-Flash block only. Valid margin level settings for the Set User Margin Level command are defined in Table 19-55. Table 19-55. Valid Set User Margin Level Settings 1 2 CCOB (CCOBIX=001) Level Description 0x0000 Return to Normal Level 0x0001 User Margin-1 Level1 0x0002 User Margin-0 Level2 Read margin to the erased state Read margin to the programmed state Table 19-56. Set User Margin Level Command Error Handling Register Error Bit Error Condition Set if CCOBIX[2:0] != 001 at command launch ACCERR FSTAT Set if command not available in current mode (see Table 19-27) Set if an invalid FlashBlockSelectionCode[1:0] is supplied (See Table 19-34) Set if an invalid margin level setting is supplied FPVIOL None MGSTAT1 None MGSTAT0 None NOTE User margin levels can be used to check that Flash memory contents have adequate margin for normal level read operations. If unexpected results are encountered when checking Flash memory contents at user margin levels, a potential loss of information has been detected. 19.4.6.13 Set Field Margin Level Command The Set Field Margin Level command, valid in special modes only, causes the Memory Controller to set the margin level specified for future read operations of the P-Flash or EEPROM block. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 563 32 KByte Flash Module (S12FTMRG32K128V1) for S12VR32 Upon clearing CCIF to launch the Set Field Margin Level command, the Memory Controller will set the Table 19-57. Set Field Margin Level Command FCCOB Requirements CCOBIX[2:0] FCCOB Parameters 000 Flash block selection code [1:0]. 0x0E 001 Table 19-34 See Margin level setting. field margin level for the targeted block and then set the CCIF flag. NOTE When the EEPROM block is targeted, the EEPROM field margin levels are applied only to the EEPROM reads. However, when the P-Flash block is targeted, the P-Flash field margin levels are applied to both P-Flash and EEPROM reads. It is not possible to apply field margin levels to the P-Flash block only. Valid margin level settings for the Set Field Margin Level command are defined in Table 19-58. Table 19-58. Valid Set Field Margin Level Settings 1 2 CCOB (CCOBIX=001) Level Description 0x0000 Return to Normal Level 0x0001 User Margin-1 Level1 0x0002 User Margin-0 Level2 0x0003 Field Margin-1 Level1 0x0004 Field Margin-0 Level2 Read margin to the erased state Read margin to the programmed state Table 19-59. Set Field Margin Level Command Error Handling Register Error Bit Error Condition Set if CCOBIX[2:0] != 001 at command launch ACCERR FSTAT Set if command not available in current mode (see Table 19-27) Set if an invalid FlashBlockSelectionCode[1:0] is supplied (See Table 19-34) Set if an invalid margin level setting is supplied FPVIOL None MGSTAT1 None MGSTAT0 None MC9S12VR Family Reference Manual, Rev. 4.2 564 NXP Semiconductor 32 KByte Flash Module (S12FTMRG32K128V1) for S12VR32 CAUTION Field margin levels must only be used during verify of the initial factory programming. NOTE Field margin levels can be used to check that Flash memory contents have adequate margin for data retention at the normal level setting. If unexpected results are encountered when checking Flash memory contents at field margin levels, the Flash memory contents should be erased and reprogrammed. 19.4.6.14 Erase Verify EEPROM Section Command The Erase Verify EEPROM Section command will verify that a section of code in the EEPROM is erased. The Erase Verify EEPROM Section command defines the starting point of the data to be verified and the number of words. Table 19-60. Erase Verify EEPROM Section Command FCCOB Requirements CCOBIX[2:0] 000 FCCOB Parameters 0x10 Global address [17:16] to identify the EEPROM block 001 Global address [15:0] of the first word to be verified 010 Number of words to be verified Upon clearing CCIF to launch the Erase Verify EEPROM Section command, the Memory Controller will verify the selected section of EEPROM memory is erased. The CCIF flag will set after the Erase Verify EEPROM Section operation has completed. If the section is not erased, it means blank check failed, both MGSTAT bits will be set. Table 19-61. Erase Verify EEPROM Section Command Error Handling Register Error Bit Error Condition Set if CCOBIX[2:0] != 010 at command launch Set if command not available in current mode (see Table 19-27) ACCERR Set if an invalid global address [17:0] is supplied Set if a misaligned word address is supplied (global address [0] != 0) FSTAT Set if the requested section breaches the end of the EEPROM block FPVIOL None MGSTAT1 Set if any errors have been encountered during the read or if blank check failed. MGSTAT0 Set if any non-correctable errors have been encountered during the read or if blank check failed. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 565 32 KByte Flash Module (S12FTMRG32K128V1) for S12VR32 19.4.6.15 Program EEPROM Command The Program EEPROM operation programs one to four previously erased words in the EEPROM block. The Program EEPROM operation will confirm that the targeted location(s) were successfully programmed upon completion. CAUTION A Flash word must be in the erased state before being programmed. Cumulative programming of bits within a Flash word is not allowed. Table 19-62. Program EEPROM Command FCCOB Requirements CCOBIX[2:0] 000 FCCOB Parameters Global address [17:16] to identify the EEPROM block 0x11 001 Global address [15:0] of word to be programmed 010 Word 0 program value 011 Word 1 program value, if desired 100 Word 2 program value, if desired 101 Word 3 program value, if desired Upon clearing CCIF to launch the Program EEPROM command, the user-supplied words will be transferred to the Memory Controller and be programmed if the area is unprotected. The CCOBIX index value at Program EEPROM command launch determines how many words will be programmed in the EEPROM block. The CCIF flag is set when the operation has completed. Table 19-63. Program EEPROM Command Error Handling Register Error Bit Error Condition Set if CCOBIX[2:0] < 010 at command launch Set if CCOBIX[2:0] > 101 at command launch ACCERR FSTAT Set if command not available in current mode (see Table 19-27) Set if an invalid global address [17:0] is supplied Set if a misaligned word address is supplied (global address [0] != 0) Set if the requested group of words breaches the end of the EEPROM block FPVIOL 19.4.6.16 Set if the selected area of the EEPROM memory is protected MGSTAT1 Set if any errors have been encountered during the verify operation MGSTAT0 Set if any non-correctable errors have been encountered during the verify operation Erase EEPROM Sector Command The Erase EEPROM Sector operation will erase all addresses in a sector of the EEPROM block. MC9S12VR Family Reference Manual, Rev. 4.2 566 NXP Semiconductor 32 KByte Flash Module (S12FTMRG32K128V1) for S12VR32 Table 19-64. Erase EEPROM Sector Command FCCOB Requirements CCOBIX[2:0] FCCOB Parameters 000 001 0x12 Global address [17:16] to identify EEPROM block Global address [15:0] anywhere within the sector to be erased. See Section 19.1.2.2 EEPROM Features for EEPROM sector size. Upon clearing CCIF to launch the Erase EEPROM Sector command, the Memory Controller will erase the selected Flash sector and verify that it is erased. The CCIF flag will set after the Erase EEPROM Sector operation has completed. Table 19-65. Erase EEPROM Sector Command Error Handling Register Error Bit Error Condition Set if CCOBIX[2:0] != 001 at command launch ACCERR FSTAT Set if an invalid global address [17:0] is supplied (see Table 19-3) Set if a misaligned word address is supplied (global address [0] != 0) FPVIOL 19.4.7 Set if command not available in current mode (see Table 19-27) Set if the selected area of the EEPROM memory is protected MGSTAT1 Set if any errors have been encountered during the verify operation MGSTAT0 Set if any non-correctable errors have been encountered during the verify operation Interrupts The Flash module can generate an interrupt when a Flash command operation has completed or when a Flash command operation has detected an ECC fault. Table 19-66. Flash Interrupt Sources Interrupt Source Global (CCR) Mask Interrupt Flag Local Enable CCIF (FSTAT register) CCIE (FCNFG register) I Bit ECC Double Bit Fault on Flash Read DFDIF (FERSTAT register) DFDIE (FERCNFG register) I Bit ECC Single Bit Fault on Flash Read SFDIF (FERSTAT register) SFDIE (FERCNFG register) I Bit Flash Command Complete NOTE Vector addresses and their relative interrupt priority are determined at the MCU level. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 567 32 KByte Flash Module (S12FTMRG32K128V1) for S12VR32 19.4.7.1 Description of Flash Interrupt Operation The Flash module uses the CCIF flag in combination with the CCIE interrupt enable bit to generate the Flash command interrupt request. The Flash module uses the DFDIF and SFDIF flags in combination with the DFDIE and SFDIE interrupt enable bits to generate the Flash error interrupt request. For a detailed description of the register bits involved, refer to Section 19.3.2.5, “Flash Configuration Register (FCNFG)”, Section 19.3.2.6, “Flash Error Configuration Register (FERCNFG)”, Section 19.3.2.7, “Flash Status Register (FSTAT)”, and Section 19.3.2.8, “Flash Error Status Register (FERSTAT)”. The logic used for generating the Flash module interrupts is shown in Figure 19-27. CCIE CCIF DFDIE DFDIF Flash Command Interrupt Request Flash Error Interrupt Request SFDIE SFDIF Figure 19-27. Flash Module Interrupts Implementation 19.4.8 Wait Mode The Flash module is not affected if the MCU enters wait mode. The Flash module can recover the MCU from wait via the CCIF interrupt (see Section 19.4.7, “Interrupts”). 19.4.9 Stop Mode If a Flash command is active (CCIF = 0) when the MCU requests stop mode, the current Flash operation will be completed before the MCU is allowed to enter stop mode. 19.5 Security The Flash module provides security information to the MCU. The Flash security state is defined by the SEC bits of the FSEC register (see Table 19-11). During reset, the Flash module initializes the FSEC register using data read from the security byte of the Flash configuration field at global address 0x3_FF0F. The security state out of reset can be permanently changed by programming the security byte assuming that the MCU is starting from a mode where the necessary P-Flash erase and program commands are available and that the upper region of the P-Flash is unprotected. If the Flash security byte is successfully programmed, its new value will take affect after the next MCU reset. MC9S12VR Family Reference Manual, Rev. 4.2 568 NXP Semiconductor 32 KByte Flash Module (S12FTMRG32K128V1) for S12VR32 The following subsections describe these security-related subjects: • Unsecuring the MCU using Backdoor Key Access • Unsecuring the MCU in Special Single Chip Mode using BDM • Mode and Security Effects on Flash Command Availability 19.5.1 Unsecuring the MCU using Backdoor Key Access The MCU may be unsecured by using the backdoor key access feature which requires knowledge of the contents of the backdoor keys (four 16-bit words programmed at addresses 0x3_FF00-0x3_FF07). If the KEYEN[1:0] bits are in the enabled state (see Section 19.3.2.2 Flash Security Register (FSEC)), the Verify Backdoor Access Key command (see Section 19.4.6.11 Verify Backdoor Access Key Command) allows the user to present four prospective keys for comparison to the keys stored in the Flash memory via the Memory Controller. If the keys presented in the Verify Backdoor Access Key command match the backdoor keys stored in the Flash memory, the SEC bits in the FSEC register (see Table 19-11) will be changed to unsecure the MCU. Key values of 0x0000 and 0xFFFF are not permitted as backdoor keys. While the Verify Backdoor Access Key command is active, P-Flash memory and EEPROM memory will not be available for read access and will return invalid data. The user code stored in the P-Flash memory must have a method of receiving the backdoor keys from an external stimulus. This external stimulus would typically be through one of the on-chip serial ports. If the KEYEN[1:0] bits are in the enabled state (see Section 19.3.2.2 Flash Security Register (FSEC)), the MCU can be unsecured by the backdoor key access sequence described below: 1. Follow the command sequence for the Verify Backdoor Access Key command as explained in Section 19.4.6.11 Verify Backdoor Access Key Command 2. If the Verify Backdoor Access Key command is successful, the MCU is unsecured and the SEC[1:0] bits in the FSEC register are forced to the unsecure state of 10 The Verify Backdoor Access Key command is monitored by the Memory Controller and an illegal key will prohibit future use of the Verify Backdoor Access Key command. A reset of the MCU is the only method to re-enable the Verify Backdoor Access Key command. The security as defined in the Flash security byte (0x3_FF0F) is not changed by using the Verify Backdoor Access Key command sequence. The backdoor keys stored in addresses 0x3_FF00-0x3_FF07 are unaffected by the Verify Backdoor Access Key command sequence. The Verify Backdoor Access Key command sequence has no effect on the program and erase protections defined in the Flash protection register, FPROT. After the backdoor keys have been correctly matched, the MCU will be unsecured. After the MCU is unsecured, the sector containing the Flash security byte can be erased and the Flash security byte can be reprogrammed to the unsecure state, if desired. In the unsecure state, the user has full control of the contents of the backdoor keys by programming addresses 0x3_FF00-0x3_FF07 in the Flash configuration field. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 569 32 KByte Flash Module (S12FTMRG32K128V1) for S12VR32 19.5.2 Unsecuring the MCU in Special Single Chip Mode using BDM A secured MCU can be unsecured in special single chip mode by using the following method to erase the P-Flash and EEPROM memory: 1. Reset the MCU into special single chip mode 2. Delay while the BDM executes the Erase Verify All Blocks command write sequence to check if the P-Flash and EEPROM memories are erased 3. Send BDM commands to disable protection in the P-Flash and EEPROM memory 4. Execute the Erase All Blocks command write sequence to erase the P-Flash and EEPROM memory. Alternatively the Unsecure Flash command can be executed, if so the steps 5 and 6 below are skeeped. 5. After the CCIF flag sets to indicate that the Erase All Blocks operation has completed, reset the MCU into special single chip mode 6. Delay while the BDM executes the Erase Verify All Blocks command write sequence to verify that the P-Flash and EEPROM memory are erased If the P-Flash and EEPROM memory are verified as erased, the MCU will be unsecured. All BDM commands will now be enabled and the Flash security byte may be programmed to the unsecure state by continuing with the following steps: 7. Send BDM commands to execute the Program P-Flash command write sequence to program the Flash security byte to the unsecured state 8. Reset the MCU 19.5.3 Mode and Security Effects on Flash Command Availability The availability of Flash module commands depends on the MCU operating mode and security state as shown in Table 19-27. 19.6 Initialization On each system reset the flash module executes an initialization sequence which establishes initial values for the Flash Block Configuration Parameters, the FPROT and EEPROT protection registers, and the FOPT and FSEC registers. The initialization routine reverts to built-in default values that leave the module in a fully protected and secured state if errors are encountered during execution of the reset sequence. If a double bit fault is detected during the reset sequence, both MGSTAT bits in the FSTAT register will be set. CCIF is cleared throughout the initialization sequence. The Flash module holds off all CPU access for a portion of the initialization sequence. Flash reads are allowed once the hold is removed. Completion of the initialization sequence is marked by setting CCIF high which enables user commands. If a reset occurs while any Flash command is in progress, that command will be immediately aborted. The state of the word being programmed or the sector/block being erased is not guaranteed. MC9S12VR Family Reference Manual, Rev. 4.2 570 NXP Semiconductor Appendix A MCU Electrical Specifications A.1 General This supplement contains the most accurate electrical information for the MC9S12VR-Family available at the time of publication. This introduction is intended to give an overview on several common topics like power supply, current injection etc. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 571 MCU Electrical Specifications Table A-1. Power Supplies Mnemonic Nominal Voltage VSS 0V Ground pin for 1.8V core supply voltage generated by on chip voltage regulator VDDX1 5.0 V 5V power supply output for I/O drivers generated by on chip voltage regulator VSSX12 0V VDDX2 5.0 V VSSX2 0V 1 3 Description Ground pin for I/O drivers 5V power supply output for I/O drivers generated by on chip voltage regulator Ground pin for I/O drivers VDDA 5.0 V External power supply for the analog-to-digital converter and for the reference circuit of the internal voltage regulator VSSA 0V Ground pin for VDDA analog supply LGND 0V Ground pin for LIN physical LSGND 0V Ground pin for low-side driver VSUP 12V/18V External power supply for voltage regulator VSUPHS 12V/18V External power supply for high-side driver 1 All VDDX pins are internally connected by metal All VSSX pins are internally connected by metal 3 VDDA, VDDX and VSSA, VSSX are connected by diodes for ESD protection 2 A.1.1 Pins There are four groups of functional pins. A.1.1.1 I/O Pins The I/O pins have a level in the range of 3.13V to 5.5V. This class of pins is comprised of all port I/O pins, the analog inputs, BKGD and the RESET pins. Some functionality may be disabled. A.1.1.2 High Voltage Pins LS[1:0], HS[1:0], PL[3:0], VSENSE have a nominal 12V level. A.1.1.3 Oscillator The pins EXTAL, XTAL dedicated to the oscillator have a nominal 1.8V level. A.1.1.4 TEST This pin is used for production testing only. The TEST pin must be tied to ground in all applications. MC9S12VR Family Reference Manual, Rev. 4.2 572 NXP Semiconductor MCU Electrical Specifications A.1.2 Current Injection Power supply must maintain regulation within operating VDDX or VDD range during instantaneous and operating maximum current conditions. Figure A-1. shows a 5V GPIO pad driver and the on chip voltage regulator with VDDX output. It shows also the power & gound pins VSUP, VDDX, VSSX and VSSA. Px represents any 5V GPIO pin. Assume Px is configured as an input. The pad driver transistors P1 and N1 are switched off (high impedance). If the voltage Vin on Px is greated than VDDX a positive injection current Iin will flow through diode D1 into VDDX node. If this injection current Iin is greater than ILoad, the internal power supply VDDX may go out of regulation. Ensure external VDDX load will shunt current greater than maximum injection current. This will be the greatest risk when the MCU is not consuming power; e.g., if no system clock is present, or if clock rate is very low which would reduce overall power consumption. Figure A-1. Current Injection on GPIO Port if Vin > VDDX VSUP Voltage Regulator VBG + _ ISUP P2 Pad Driver IDDX VDDX ILoad C Load Iin P1 D1 Iin N1 Px Vin > VDDX VSSX VSSA A.1.3 Absolute Maximum Ratings Absolute maximum ratings are stress ratings only. A functional operation under or outside those maxima is not guaranteed. Stress beyond those limits may affect the reliability or cause permanent damage of the device. This device contains circuitry protecting against damage due to high static voltage or electrical fields; however, it is advised that normal precautions be taken to avoid application of any voltages higher than MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 573 MCU Electrical Specifications maximum-rated voltages to this high-impedance circuit. Reliability of operation is enhanced if unused inputs are tied to an appropriate logic voltage level. Table A-2. Absolute Maximum Ratings1 Num Rating Symbol Min Max Unit VSUP -0.3 42 V 1 Voltage regulator supply voltage 2 LINPHY supply voltage VLINSUP -32 42 V 3 High side driver supply voltage VSUPHS -0.3 42 V 4 Battery sensor input voltage VSENSE pin VVSENSE_M -27 42 V VDDX –0.3 0.3 V VDDA2 5 Voltage difference VDDX to 6 Voltage difference VSSX to VSSA VSSX –0.3 0.3 V 7 Digital I/O input voltage sources VIN –0.3 6.0 V 8 HVI PL[3:0] input voltage (with external resistor REXT_HVI = 10k VLx -27 42 V 9 High-side driver HS[1:0] VPHS0/1 0 VSUPHS + 0.3 V 10 Low-side driver LS[1:0] VPLS0/1 0 40 V VILV –0.3 2.16 V ID –25 +25 mA IEVDD -80 +25 mA –25 +25 mA –65 155 C 3 11 EXTAL, XTAL 12 Instantaneous maximum current Single pin limit for all digital I/O pins4 13 Instantaneous maximum current on PP2 / EVDD 14 Instantaneous maximum current Single pin limit for EXTAL, XTAL I 15 Storage temperature range Tstg DL 1 Beyond absolute maximum ratings device might be damaged. VDDX and VDDA must be shorted 3 EXTAL and XTAL are shared with PE0 and PE1 5V GPIO’s 4 All digital I/O pins are internally clamped to V SSX and VDDX, or VSSA and VDDA. 2 MC9S12VR Family Reference Manual, Rev. 4.2 574 NXP Semiconductor MCU Electrical Specifications A.1.4 ESD Protection and Latch-up Immunity All ESD testing is in conformity with CDF-AEC-Q100 stress test qualification for automotive grade integrated circuits. During the device qualification ESD stresses were performed for the Human Body Model (HBM) and the Charged-Device Model. A device will be defined as a failure if after exposure to ESD pulses the device no longer meets the device specification. Complete DC parametric and functional testing is performed per the applicable device specification at room temperature followed by hot temperature, unless specified otherwise in the device specification. Table A-3. ESD and Latch-up Test Conditions Model Human Body ChargedDevice Spec JESD22-A114 JESD22-C101 Description Symbol Value Unit Series Resistance R 1500 Storage Capacitance C 100 pF Number of Pulse per pin positive negative 1 1 Series Resistance R 0 Storage Capacitance C 4 pF Latch-up for 5V GPIO’s Minimum Input Voltage Limit -2.5 V Maximum Input Voltage Limit +7.5 V Latch-up for LS/HS/HVI/V SENSE/LIN Minimum Input Voltage Limit -7 V Maximum Input Voltage Limit +21 V Table A-4. ESD Protection and Latch-up Characteristics Num Rating Symbol Min Max Unit - kV 1 HBM: LIN to LGND +/- 6 2 HBM: VSENSE, HVI[3:0] to GND +/- 4 kV 3 HBM: HS1, HS2 to GND +/- 4 kV 4 HBM: LS0, LS1 to GND +/- 2 kV 5 HBM: Pin to Pin (all Pins LS0, LS1 excluded) +/- 2 kV 6 HBM: Pin to Pin (all Pins LS0, LS1 included) +/- 1.5 kV 7 CDM : Corner Pins VCDM +/-750 8 CDM: All other Pins VCDM +/-500 9 Direct Contact Discharge IEC61000-4-2 with and with out 220pF capacitor (R=330, C=150pF): LIN vs LGND VESDIEC +/-6 VHBM - V V - kV MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 575 MCU Electrical Specifications Table A-4. ESD Protection and Latch-up Characteristics 10 11 Latch-up Current of 5V GPIO’s at T=125C positive negative ILAT Latch-up Current for LS[1:0], HS[1:0], VSENSE, LIN & HVI[3:0] at T=125C positive negative ILAT +100 -100 +100 -100 - mA - mA MC9S12VR Family Reference Manual, Rev. 4.2 576 NXP Semiconductor MCU Electrical Specifications A.1.5 Operating Conditions This section describes the operating conditions of the device. Unless otherwise noted those conditions apply to all the following data. NOTE Please refer to the temperature rating of the device with regards to the ambient temperature TA and the junction temperature TJ. For power dissipation calculations refer to Section A.1.6, “Power Dissipation and Thermal Characteristics”. Table A-5. Operating Conditions Num Rating Symbol Min Typ Max Unit 1 Voltage regulator and LINPHY supply voltage VSUP/ VLINUP 3.5 12 401 V 2 High side driver supply voltage VSUPHS 7 12 401 V 3 Voltage difference VDDX to VDDA VDDX -0.1 — 0.1 V 4 Voltage difference VSSX to VSSA VSSX -0.1 — 0.1 V 5 Oscillator fosc 4 — 20 MHz 6 Bus frequency fbus see Footnote2 — 25 MHz TJ TA –40 –40 — — 150 125 C 7 Operating junction temperature range Operating ambient temperature range3 1 Normal operating range is 6V - 18V. Continous operation at 40V is not allowed. Only Transient Conditions (Load Dump) single pulse tmax<400ms 2 Minimum bus frequency for ADC module refer to Table C-1., “ATD Operating Characteristics and for Flash Module refer to Table M-1., “NVM Timing Characteristics 3 Please refer to Section A.1.6, “Power Dissipation and Thermal Characteristics” for more details about the relation between ambient temperature TA and device junction temperature TJ. NOTE Operation is guaranteed when powering down until low voltage reset assertion. A.1.6 Power Dissipation and Thermal Characteristics Power dissipation and thermal characteristics are closely related. The user must assure that the maximum operating junction temperature is not exceeded. The average chip-junction temperature (TJ) in C can be obtained from: T = T + P J A D JA T = Junction Temperature, [C J T A = Ambient Temperature, [C MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 577 MCU Electrical Specifications P D = Total Chip Power Dissipation, [W] JA = Package Thermal Resistance, [C/W] The total power dissipation PD can be calculated from the equation below. Table A-6 below lists the power dissipation components . Figure A-2. gives an overview of the supply currents. PD = PINT + PHS + PLS + PLIN + PSENSE + PHVI - PEVDD - PGPIO Table A-6. Power Dissipation Components Power Component Description PINT = VSUP ISUP Internal Power for LQFP 48 Package with seperate VSUP and VSUPHS pins. PINT = VSUP (ISUP - IPHS0/1) Internal Power for LQFP 32 Package with single VSUP pin which is double bonded to VSUP pad and VSUPHS pad. PHS = IPHS0/12 RDSONHS0/1 Power dissipation of High-side drivers PLS = IPLS0/12 RDSONLS0/1 Power dissipation of Low-side drivers PLIN = VLIN ILIN Power dissipation of LINPHY PSENSE = VSENSE ISENSE Power dissipation of Battery Sensor PHVI = VHVI IHVI Power dissipation of High Voltage Inputs PEVDD = VDDX IEVDD Power dissipation of external load driven by EVDD. (see Figure A-2.) This component is included in PINT and is subtracted from overall MCU power dissipation PD PGPIO = VI/O II/O Power dissipation of external load driven by GPIO Port.(see Figure A-2.) Assuming the load is connected between GPIO and ground. This power component is included in PINT and is subtracted from overall MCU power dissipation PD MC9S12VR Family Reference Manual, Rev. 4.2 578 NXP Semiconductor MCU Electrical Specifications Figure A-2. Supply Currents Overview VBAT ISENSE MC9S12VR64 VSENSE LS[1:0] IPLS0/1 VBAT ISUP GND ISUPHS VSUP VSUPHS VDDA HS[1:0] IPHS0/1 VDDX1 VDDX2 VSSX1 VSSX2 HVI[3:0] IHVI II/O GPIO RL2 ILIN LIN Switch Inputs EVDD VI/O IEVDD RL1 VDDX MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 579 MCU Electrical Specifications Table A-7. Thermal Package Characteristics Num Rating Symbol Min Typ Max Unit MC9S12VR32 32LQFP 1 Thermal resistance 32LQFP, single sided PCB (natural convection) 1 2 JA — 84 — C/W 2 Thermal resistance 32LQFP, double sided PCB with 2 internal planes (natural convection) 1 2 JA — 56 — C/W 3 Thermal resistance 32LQFP, single sided PCB 1 3 (@200 ft/min) JA — 70 — C/W 4 Thermal resistance 32LQFP, double sided PCB with 2 internal planes, (@200 ft/min)1 3 JA — 49 — C/W 5 Junction to Board 32LQFP 4 JB — 32 — C/W 6 Junction to Case 32LQFP 5 JC — 23 — C/W 7 Junction to Package Top 32LQFP 6 JT — 5 — C/W MC9S12VR64 32LQFP 8 Thermal resistance 32LQFP, single sided PCB (natural convection)1 2 JA — 85 — C/W 9 Thermal resistance 32LQFP, double sided PCB with 2 internal planes (natural convection) 1 2 JA — 56 — C/W 10 Thermal resistance 32LQFP, single sided PCB (@200 ft/min) 1 3 JA — 71 — C/W 11 Thermal resistance 32LQFP, double sided PCB with 2 internal planes, (@200 ft/min) 1 3 JA — 50 — C/W 12 Junction to Board 32LQFP 4 JB — 33 — C/W 13 Junction to Case 32LQFP 5 JC — 23 — C/W 14 Junction to Package Top 32LQFP 6 JT — 5 — C/W MCS12VR64 48LQFP 1 15 Thermal resistance 48LQFP, single sided PCB (natural convection) 1 2 JA — 80 — C/W 16 Thermal resistance 48LQFP, double sided PCB with 2 internal planes (natural convection) 1 2 JA — 56 — C/W 17 Thermal resistance 48LQFP, single sided PCB (@200 ft/min) 1 3 JA — 67 — C/W 18 Thermal resistance 48LQFP, double sided PCB with 2 internal planes, (@200 ft/min) 1 3 JA — 49 — C/W 19 Junction to Board 48LQFP 4 JB — 34 — C/W 20 Junction to Case 48LQFP 5 JC — 23 — C/W 21 Junction to Package Top 48LQFP 6 JT — 5 — C/W Junction temperature is a function of die size, on-chip power dissipation, package thermal resistance, mounting site (board) temperature, ambient temperature, air flow, power dissipation of other components on the board, and board thermal resistance. MC9S12VR Family Reference Manual, Rev. 4.2 580 NXP Semiconductor MCU Electrical Specifications 2 3 4 5 6 Per JEDEC JESD51-2 with natural convection for horizontally oriented board. Board meets JESD51-9 specification for 1s or 2s2p board, respectively. Per JEDEC JESD51-6 with forced convection for horizontally oriented board. Board meets JESD51-9 specification for 1s or 2s2p board, respectively. Thermal resistance between the die and the printed circuit board per JEDEC JESD51-8. Board temperature is measured on the top surface of the board near the package. Thermal resistance between the die and the case top surface as measured by the cold plate method (MIL SPEC-883 Method 1012.1). Thermal characterization parameter indicating the temperature difference between package top and the junction temperature per JEDEC JESD51-2. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 581 MCU Electrical Specifications A.1.7 I/O Characteristics This section describes the characteristics of I/O pins Table A-8. 5-V I/O Characteristics Conditions are 4.5 V < VDDX< 5.5 V junction temperature from –40C to +150C, unless otherwise noted I/O Characteristics for all I/O pins except EXTAL, XTAL,TEST, PL, HS[1:0], LS[1:0], LIN and supply pins. Num Rating Symbol Min Typ Max Unit 1 Input high voltage VIH 0.65*VDDX — — V 2 Input high voltage VIH — — VDDX+0.3 V 3 Input low voltage VIL — — 0.35*VDDX V 4 Input low voltage VIL VSSX–0.3 — — V 5 Input hysteresis 250 — mV 6 Input leakage current (pins in high impedance input mode)1 Vin = VDDX or VSSX 1 A 7 Output high voltage (pins in output mode) IOH = –4 mA for PP[5:3], PS, PT, PAD V OH VDDX – 0.8 — V 8 Output high voltage (pins in output mode) PP[1:0] Partial Drive IOH = –2 mA Full Drive IOH = –10mA VOH VDDX – 0.8 V 9 Output high voltage (pins in output mode) PP[2]/EVDD Partial Drive IOH = –2 mA Full Drive IOH = –20mA V VDDX – 0.8 V 10 Output low voltage (pins in output mode) IOL = +4mA for PP[5:3], PS, PT, PAD V 11 Output low voltage (pins in output mode) PP[1:0] Partial drive IOL = +2mA Full drive IOL = +10mA 12 VHYS I in OH -1 0.8 V V 0.8 V Output low voltage (pins in output mode) for PP[2]/EVDD Partial drive IOL = +2mA Full drive IOL = +20mA V 0.8 V 13 Over-current Detect Threshold PP[2]/EVDD IOCD 20 55 mA 14 Internal pull up resistor on RESET pin VIH min > input voltage > VIL max RPUL 3.8 5 10.5 15 Internal pull up current VIH min > input voltage > VIL max IPUL -10 — -130 A 16 Internal pull down current VIH min > input voltage > VIL max IPDH 10 — 130 A 17 Input capacitance Cin — 7 — pF 18 Injection current2 Single pin limit Total device Limit, sum of all injected currents IICS IICP –2.5 –25 OL — — — OL OL — mA 2.5 25 1 Maximum leakage current occurs at maximum operating temperature. Current decreases by approximately one-half for each 8°C to 12°C in the temperature range from 50C to 125C. 2 Refer to Section A.1.2, “Current Injection” for more details MC9S12VR Family Reference Manual, Rev. 4.2 582 NXP Semiconductor MCU Electrical Specifications A.1.8 Supply Currents This section describes the current consumption characteristics of the device as well as the conditions for the measurements. A.1.8.1 Measurement Conditions Current is measured on VSUP & VSUPHS pins. VDDX is connected to VDDA. It does not include the current to drive external loads. Unless otherwise noted the currents are measured in special single chip mode and the CPU code is executed from RAM. For Run and Wait current measurements PLL is on and the reference clock is the IRC1M trimmed to 1MHz. The bus frequency is 25MHz and the CPU frequency is 50MHz. Table A-9, Table A-10 and Table A-11 show the configuration of the CPMU module and the peripherals for Run, Wait and Stop current measurement. Table A-9. CPMU Configuration for Pseudo Stop Current Measurement CPMU REGISTER CPMUCLKS Bit settings/Conditions PLLSEL=0, PSTP=1, CSAD=0 PRE=PCE=RTIOSCSEL=COPOSCSEL=1 CPMUOSC OSCE=1, External Square wave on EXTAL fEXTAL=4MHz, VIH= 1.8V, VIL=0V CPMURTI RTDEC=0, RTR[6:4]=111, RTR[3:0]=1111; CPMUCOP WCOP=1, CR[2:0]=111 Table A-10. CPMU Configuration for Run/Wait and Full Stop Current Measurement CPMU REGISTER CPMUSYNR CPMUPOSTDIV CPMUCLKS CPMUOSC Bit settings/Conditions VCOFRQ[1:0]=01,SYNDIV[5:0] = 24 POSTDIV[4:0]=0 PLLSEL=1 OSCE=0, Reference clock for PLL is fref=firc1m trimmed to 1MHz API settings for STOP current measurement CPMUAPICTL CPMUAPITR CPMUAPIRH/RL APIEA=0, APIFE=1, APIE=0 trimmed to >=10Khz set to $FFFF MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 583 MCU Electrical Specifications Table A-11. Peripheral Configurations for Run & Wait Current Measurement Peripheral Configuration SCI continuously transmit data (0x55) at speed of 19200 baud SPI configured to master mode, continuously transmit data (0x55) at 1Mbit/s PWM configured to toggle its pins at the rate of 40kHz ADC the peripheral is configured to operate at its maximum specified frequency and to continuously convert voltages on all input channels in sequence. DBG the module is enabled and the comparators are configured to trigger in outside range.The range covers all the code executed by the core. TIM the peripheral is configured to output compare mode, pulse accumulator and modulus counter enabled. COP & RTI enabled HSDRV 1 & 2 module is enabled but output driver disabled LSDRV 1 & 2 module is enabled but output driver disabled BATS enabled connected to SCI and continuously transmit data (0x55) at speed of 19200 baud LINPHY Table A-12. Run and Wait Current Characteristics Conditions are: VSUP=VSUPHS=18V, TA=105C, see Table A-10 and Table A-9 Num Rating Symbol Min Typ Max Unit 1 Run Current ISUPR 15 22 mA 2 Wait Current ISUPW 10 15 mA MC9S12VR Family Reference Manual, Rev. 4.2 584 NXP Semiconductor MCU Electrical Specifications Table A-13. Stop Current Characteristics Conditions are: VSUP=VSUPHS=12V API see CPMU Configuration for Pseudo Stop Current MeasurementTable A-9. Num Rating Symbol Min Typ Max Unit Stop Current all modules off 1 1 TA = TJ = -40C ISUPS 29 60 A 2 TA = TJ = 150C1 ISUPS 140 600 A 3 TA = TJ = 25C1 ISUPS 33 65 A ISUPS 55 90 A 1 TA = TJ = 105C 4 Stop Current API enabled & LINPHY in standby (see 15.4.3.4 Standby Mode with wake-up feature) 5 1 TA = TJ = 25C1 ISUPS 50 80 A If MCU is in STOP long enough then TA = TJ . Die self heating due to stop current can be ignored. Table A-14. Pseudo Stop Current Characteristics Conditions are: VSUP=VSUPHS=12V, API see CPMU Configuration for Pseudo Stop Current MeasurementTable A-9., COP & RTI enabled Num 1 Rating TA= 25C Symbol ISUPPS Min Typ Max Unit 358 480 A MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 585 MCU Electrical Specifications MC9S12VR Family Reference Manual, Rev. 4.2 586 NXP Semiconductor Appendix B VREG Electrical Specifications Table B-1. Voltage Regulator Electrical Characteristics -40oC <= TJ <= 150oC unless noted otherwise, VDDA and VDDX must be shorted on the application board. Num Characteristic 1 Input Voltages 4 Output Voltage VDDX Full Performance Mode VSUP > 6V Full Performance Mode 5.5V < VSUP <=6V Full Performance Mode 3.5V <= VSUP <=5.5V Reduced Performance Mode (stopmode) VSUP > =3.5V Symbol Min Typical Max Unit VSUP 3.5 — 40 V VDDX 4.75 4.50 3.13 5.0 5.0 — 5.25 5.25 5.25 V V V 2.5 5.5 5.75 V 0 0 0 — — — 70 25 5 mA mA mA 1 2,3 5 Load Current VDDX Full Performance Mode VSUP > 6V Full Performance Mode 3.5V <= VSUP <=6V Reduced Performance Mode (stopmode) IDDX 6 Low Voltage Interrupt Assert Level4 Low Voltage Interrupt Deassert Level VLVIA VLVID 4.04 4.19 4.23 4.38 4.40 4.49 V V 7a VDDX Low Voltage Reset deassert5 VLVRXD — — 3.13 V 7b VDDX Low Voltage Reset assert VLVRXA 2.95 3.02 — V 8 Trimmed ACLK output frequency fACLK — 20 — kHz 9 Trimmed ACLK internal clock f / fnominal 6 dfACLK - 6% — + 6% — 10 The first period after enabling the counter by APIFE might be reduced by API start up delay tsdel — — 100 s 11 Temperature Sensor Slope dVHT 5.05 5.25 5.45 mV/o C 12 Temperature Sensor Output Voltage (TJ=150oC) VHT — 2.4 — V 13 High Temperature Interrupt Assert7 High Temperature Interrupt Deassert THTIA THTID 120 110 132 122 144 134 o C C o MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 587 VREG Electrical Specifications Table B-1. Voltage Regulator Electrical Characteristics -40oC <= TJ <= 150oC unless noted otherwise, VDDA and VDDX must be shorted on the application board. Num 14 Characteristic Bandgap output voltage VBG Voltage Distribution over input voltage VSUP 15 3.5V <= VSUP <= 18V, TA = 125oC 16 VBG Voltage Distribution over ambient temperature TA VSUP = 12V, -40oC <= TA <= 125oC 17 Recovery time from STOP Symbol Min Typical Max Unit VBG 1.13 1.22 1.32 V VBGV -5 5 mV VBGV -20 20 mV tSTP_REC — — s 23 1 For the given maximum load currents and VSUP input voltages, the MCU will stay out of reset. note that the core current is derived from VDDX 3further limitation may apply due to maximum allowable T J 4 LVI is monitored on the VDDA supply domain 5LVRX is monitored on the VDDX supply domain only active during full performance mode. During reduced performance mode (stopmode) voltage supervision is solely performed by the POR block monitoring core VDD. 6The ACLK trimming must be set that the minimum period equals to 0.2ms 7VREGHTTR=$88 2Please NOTE The LVR monitors the voltages VDD, VDDF and VDDX. If the voltage drops on these supplies to a level which could prohibit the correct function (e.g. code execution) of the microcontroller, the LVR triggers. Table B-2. Recommended Capacitor Values Num Characteristic Symbol Typical1 Unit 1 VDDX capacitor2 CVDDX 100-220 nF 2 VDDA capacitor3 CVDDA 100-220 nF 3 Stability capacitor4,5 CVDD5 4.7 or 10 F 1Values are nominal component values. ceramics 3X7R ceramics 4 Can be placed anywhere on the 5V supply node (VDDA, VDDX) 54.7F X7R ceramics or 10F tantalum 2X7R MC9S12VR Family Reference Manual, Rev. 4.2 588 NXP Semiconductor Appendix C ATD Electrical Specifications This section describes the characteristics of the analog-to-digital converter. C.1 ATD Operating Characteristics The Table C-1 and Table C-2 show conditions under which the ATD operates. The following constraints exist to obtain full-scale, full range results: VSSA VRLVINVRHVDDA This constraint exists since the sample buffer amplifier can not drive beyond the power supply levels that it ties to. If the input level goes outside of this range it will effectively be clipped. Table C-1. ATD Operating Characteristics Supply voltage 3.13 V < VDDA < 5.5 V, -40oC < TJ < 150oC Num 1 2 1 Rating Symbol ATD Clock Frequency (derived from bus clock via the prescaler bus) fATDCLk ATD Conversion Period1 10 bit resolution: 8 bit resolution: NCONV10 NCONV8 Min Typ Max Unit 0.25 8.0 MHz 19 17 41 39 ATD clock Cycles The minimum time assumes a sample time of 4 ATD clock cycles. The maximum time assumes a sample time of 24 ATD clock cycles and the discharge feature (SMP_DIS) enabled, which adds 2 ATD clock cycles. C.2 Factors Influencing Accuracy Source resistance, source capacitance and current injection have an influence on the accuracy of the ATD. A further factor is that PortAD pins that are configured as output drivers switching. C.2.1 Port AD Output Drivers Switching PortAD output drivers switching can adversely affect the ATD accuracy whilst converting the analog voltage on other PortAD pins because the output drivers are supplied from the VDDA/VSSA ATD supply pins. Although internal design measures are implemented to minimize the affect of output driver noise, it is recommended to configure PortAD pins as outputs only for low frequency, low load outputs. The impact on ATD accuracy is load dependent and not specified. The values specified are valid under condition that no PortAD output drivers switch during conversion. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 589 ATD Electrical Specifications C.2.2 Source Resistance Due to the input pin leakage current as specified in conjunction with the source resistance there will be a voltage drop from the signal source to the ATD input. The maximum source resistance RS specifies results in an error (10-bit resolution) of less than 1/2 LSB (2.5 mV) at the maximum leakage current. If device or operating conditions are less than worst case or leakage-induced error is acceptable, larger values of source resistance of up to 10Kohm are allowed. C.2.3 Source Capacitance When sampling an additional internal capacitor is switched to the input. This can cause a voltage drop due to charge sharing with the external and the pin capacitance. For a maximum sampling error of the input voltage 1LSB (10-bit resilution), then the external filter capacitor, Cf 1024 * (CINS–CINN). C.2.4 Current Injection There are two cases to consider. 1. A current is injected into the channel being converted. The channel being stressed has conversion values of $3FF (in 10-bit mode) for analog inputs greater than VRH and $000 for values less than VRL unless the current is higher than specified as disruptive condition. 2. Current is injected into pins in the neighborhood of the channel being converted. A portion of this current is picked up by the channel (coupling ratio K), This additional current impacts the accuracy of the conversion depending on the source resistance. The additional input voltage error on the converted channel can be calculated as: VERR = K * RS * IINJ with IINJ being the sum of the currents injected into the two pins adjacent to the converted channel. Table C-2. ATD Electrical Characteristics Supply voltage 3.13 V < VDDA < 5.5 V, -40oC < TJ < 150oC Num 1 Rating Symbol Min Typ Max Unit RS — — 1 k 1 Max input source resistance1 2 Total input capacitance Non sampling Total input capacitance Sampling CINN CINS — — — — 10 16 pF 3 Input internal Resistance RINA - 5 15 k 4 Disruptive analog input current INA -2.5 — 2.5 mA 5 Coupling ratio positive current injection Kp — — 1E-4 A/A 6 Coupling ratio negative current injection Kn — — 5E-3 A/A 1 Refer to <st-blue>C.2.2 for further information concerning source resistance MC9S12VR Family Reference Manual, Rev. 4.2 590 NXP Semiconductor ATD Electrical Specifications C.3 ATD Accuracy Table C-3. and Table C-4. specifies the ATD conversion performance excluding any errors due to current injection, input capacitance and source resistance. C.3.1 ATD Accuracy Definitions For the following definitions see also Figure C-1. Differential non-linearity (DNL) is defined as the difference between two adjacent switching steps. V –V i i–1 DNL i = --------------------------- – 1 1LSB The integral non-linearity (INL) is defined as the sum of all DNLs: n INL n = V –V n 0 DNL i = --------------------- – n 1LSB i=1 MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 591 ATD Electrical Specifications DNL Vi-1 10-Bit Absolute Error Boundary LSB Vi $3FF 8-Bit Absolute Error Boundary $3FE $3FD $FF $3FC $3FB $3FA $3F9 $FE $3F8 $3F7 $3F6 $3F5 10-Bit Resolution $3F3 9 Ideal Transfer Curve 2 8 8-Bit Resolution $FD $3F4 7 10-Bit Transfer Curve 6 5 1 4 3 8-Bit Transfer Curve 2 1 0 5 10 15 20 25 30 35 40 45 55 60 65 70 75 80 85 90 95 100 105 110 115 120 5000 + Vin mV Figure C-1. ATD Accuracy Definitions NOTE Figure A-1 shows only definitions, for specification values refer to Table A-3 and Table A-4. Table C-3. ATD Conversion Performance 5V range MC9S12VR Family Reference Manual, Rev. 4.2 592 NXP Semiconductor ATD Electrical Specifications Supply voltage VDDA =5.12 V, -40oC < TJ < 150oC. VREF = VRH - VRL = 5.12V. fATDCLK = 8.0MHz The values are tested to be valid with no PortAD output drivers switching simultaneous with conversions. Num Rating Symbol Min Typ Max 5 Unit 1 Resolution 10-Bit LSB mV 2 Differential Nonlinearity 10-Bit DNL -1 0.5 1 counts 3 Integral Nonlinearity 10-Bit INL -2 1 2 counts 4 Absolute Error 10-Bit AE -3 2 3 counts 5 Resolution 8-Bit LSB 6 Differential Nonlinearity 8-Bit DNL -0.5 0.3 0.5 counts 7 Integral Nonlinearity 8-Bit INL -1 0.5 1 counts 8 Absolute Error 8-Bit AE -1.5 1 1.5 counts 20 mV MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 593 ATD Electrical Specifications C.3.2 ATD Analog Input Parasitics Figure C-2. ATD Input Parasitics VDDA Ileakp < 0.5A PAD0PAD5 Ileakn < 0.5A sampling time is 4 to 24 adc clock cycles of 0.25MHz to 8MHz -> 96s >= tsample >= 500ns 920 < RINA < 9.9K (incl parasitics) Ctop 3.7pF < S/H Cap < 6.2pF (incl parasitics) Cbottom connected to low ohmic supply during sampling VSSA Ctop potential just prior to sampling is either a) ~ last converted channel potential or b) ground level if S/H discharge feature is enabled. Complete 10bit conversion takes between 19 and 41 adc clock cycles Switch resistance depends on input voltage, corner ranges are shown. Leakage current is guaranteed by specification. Tjmax=130oC MC9S12VR Family Reference Manual, Rev. 4.2 594 NXP Semiconductor HSDRV Electrical Specifications Appendix D HSDRV Electrical Specifications This section provides electrical parametric and ratings for the S12HSDRV1CV3 on S12VR32 and S12HSDRV2 on S12VR64. The open-load detection feature is only available on S12VR32. The ratings below which refer to open-load detection feature are only valid for S12VR32. D.1 Operating Characteristics Table D-1. Operating Characteristics - HSDRV Num Ratings 1 High Voltage Supply for the high-side drivers. 2 VSUP_HS in case of being connected to VDDX D.2 Symbol Min Typ Max Unit VSUPHS 7 – 42 V VSUPHS_X 4.5 – 5.5 V Static Characteristics Table D-2. Static Characteristics - HSDRV (Junction Temperature From -40°C To +150°C) Characteristics noted under conditions 7V VSUPHS 18 V unless otherwise noted. Typical values noted reflect the approximate parameter mean at TJ = 25°C1 under nominal conditions unless otherwise noted. Num Ratings Symbol Min Typ Max Unit 1 Output Drain-to-Source On Resistance TJ = 150°C, IPHS0/1 = -50 mA RDS(ON) – – 18.0 2 Over-current Threshold. The threshold is valid for each HS-driver output. IOCTHSX 90 120 150 mA INOMHSX – – 50 mA Note: The high-side driver is NOT intended to switch capacitive loads. A significant capacitive load on HS0/1 would induce a current when the high-side driver gate is turned on. This current will be sensed by the over-current circuitry and eventually lead to an immediate over-current shut down. In such cases of capacitive loads you can leverage the over current masking feature or handle it by software. 3 Nominal Current for continuous operation. This value is valid for each HS-driver output. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 595 HSDRV Electrical Specifications Table D-2. Static Characteristics - HSDRV (Junction Temperature From -40°C To +150°C) Characteristics noted under conditions 7V VSUPHS 18 V unless otherwise noted. Typical values noted reflect the approximate parameter mean at TJ = 25°C1 under nominal conditions unless otherwise noted. Num 4 Ratings Leakage Current -40°C < TJ < 80°C Leakage Current -40°C < TJ< 150°C Symbol Min Typ Max Unit ILEAK_L ILEAK_H -1 -10 – – 1 10 µA A IHLROLDC – 35 – A Open Load Detection disabled. (0V < VHS0/1 < VSUP_HS) 5 1 High-Load Resistance Open-Load Detection Current (if High-side driver is enabled and gate turned off) TJ: JunctionTemperature MC9S12VR Family Reference Manual, Rev. 4.2 596 NXP Semiconductor HSDRV Electrical Specifications D.3 Dynamic Characteristics Table D-3. Dynamic Characteristics - HSDRV Characteristics noted under conditions 7V VSUPHS 18 V, -40°C TJ 150°C1 unless otherwise noted. Typical values noted reflect the approximate parameter mean at TJ = 25°C1 under nominal conditions unless otherwise noted. Num 1 Ratings Symbol Min Typ Max Unit fHS – – 10 kHz tHS_settling 1 – – s tHSOCM 10 - 11 s 1 High-Side Driver Operating Frequency 2 Settling time after the high-side driver is enabled (write HSEx Bits) 3 Over-Current Shutdown Masking Time (IRC trimmed at 1 MHz) 4 High-Load Resistance Open-Load Detection Switch On Time tHLROLOT – – 1 s 5 High-Load Resistance Open-Load Detection Time (capacitive load = 50pF) tHLROLDT – – 40 s TJ: Junction Temperature Table D-4. Dynamic Characteristics - HSDRV - VSUP_HS connected to VDDX Characteristics noted under conditions 4.5V VSUPHS 5.5V, -40°C TJ 150°C1 unless otherwise noted. Typical values noted reflect the approximate parameter mean at TJ = 25°C1 under nominal conditions unless otherwise noted. Num 1 Ratings Symbol Min Typ Max Unit fHS – – 10 kHz tHS_settling 1 – – s tHSOCM 10 - 11 s 1 High-Side Driver Operating Frequency 2 Settling time after the high-side driver is enabled (write HSEx Bits) 3 Over-Current Shutdown Masking Time(IRC trimmed at 1 MHz) 4 High-Load Resistance Open-Load Detection Switch On Time tHLROLOT – – 1 s 5 High-Load Resistance Open-Load Detection Time (capacitive load = 50pF) tHLROLDT – – 40 s TJ: Junction Temperature MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 597 HSDRV Electrical Specifications MC9S12VR Family Reference Manual, Rev. 4.2 598 NXP Semiconductor Appendix E PLL Electrical Specifications E.1 Reset, Oscillator and PLL E.1.1 Phase Locked Loop E.1.1.1 Jitter Information With each transition of the feedback clock, the deviation from the reference clock is measured and the input voltage to the VCO is adjusted accordingly.The adjustment is done continuously with no abrupt changes in the VCOCLK frequency. Noise, voltage, temperature and other factors cause slight variations in the control loop resulting in a clock jitter. This jitter affects the real minimum and maximum clock periods as illustrated in Figure E-1.. 1 0 2 3 N-1 N tmin1 tnom tmax1 tminN tmaxN Figure E-1. Jitter Definitions The relative deviation of tnom is at its maximum for one clock period, and decreases towards zero for larger number of clock periods (N). Defining the jitter as: t N t N max min J N = max 1 – ---------------------- , 1 – ---------------------- Nt Nt nom nom The following equation is a good fit for the maximum jitter: MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 599 PLL Electrical Specifications j1 J N = -------------------------------------------------N POSTDIV + 1 J(N) 1 5 10 20 N Figure E-2. Maximum Bus Clock Jitter Approximation (N=Number of Bus Cycles) NOTE On timers and serial modules a prescaler will eliminate the effect of the jitter to a large extent. MC9S12VR Family Reference Manual, Rev. 4.2 600 NXP Semiconductor PLL Electrical Specifications Table E-1. PLL Characteristics Conditions are 4.5V < VDDX < 5.5V, -40oC <= TJ <= 150oC , unless otherwise noted Num Rating Symbol Min fVCORST Typ Max Unit 8 32 MHz 50 MHz 1 VCO frequency during system reset 2 VCO locking range fVCO 32 3 Reference Clock fREF 1 4 Lock Detection Threshold Lock| 0 1.5 %1 5 Un-Lock Detection Threshold unl| 0.5 2.5 %1 6 Time to lock tlock 150 + 256/fREF s 7 Jitter fit parameter 12 IRC as reference clock source j1 1.4 % 8 Jitter fit parameter 13 XOSCLCP as reference clock source j1 1.0 % 9 PLL clock monitor failure assert frequency4 1.6 MHz fPMFA 0.45 MHz 1.1 1 % deviation from target frequency fREF = 1MHz (IRC), fBUS = 25MHz equivalent fPLL=50MHz, CPMUSYNR=0x58, CPMUREFDIV=0x00,CPMUPOSTDIV=0x00 3 f REF = 4MHz (XOSCLCP), fBUS = 24MHz equivalent fPLL=48MHz, CPMUSYNR=0x05,CPMUREFDIV=0x40,CPMUPOSTDIV=0x00 4 PLL clock monitor only available on MC9S12VR32/16 2 MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 601 PLL Electrical Specifications MC9S12VR Family Reference Manual, Rev. 4.2 602 NXP Semiconductor IRC Electrical Specifications Appendix F IRC Electrical Specifications Table F-1. IRC electrical characteristics Num Rating Symbol Min Typ Max Unit 1 Junction Temperature - 40 to 150 Celsius Internal Reference Frequency, factory trimmed fIRC1M_TRIM 0.987 1 1.013 MHz MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 603 IRC Electrical Specifications MC9S12VR Family Reference Manual, Rev. 4.2 604 NXP Semiconductor LINPHY Electrical Specifications Appendix G LINPHY Electrical Specifications G.1 Maximum Ratings Table G-1. Maximum ratings of the LINPHY Num Ratings Symbol Value Unit 1 DC voltage on LIN VLIN -32 to +42 V 2 Continuous current on LIN ILIN ± 200 1 mA 1 The current on the LIN pin is internally limited. Therefore, it should not be possible to reach the 200mA anyway. G.2 Static Electrical Characteristics Table G-2. Static electrical characteristics of the LINPHY Characteristics noted under conditions 5.5V <= VLINSUP <= 18V unless otherwise noted1 2 3. Typical values noted reflect the approximate parameter mean at TA = 25°C under nominal conditions unless otherwise noted. Num 1 Ratings VLINSUP operating range state4 Symbol Min Typ Max Unit VLINSUP_LIN 5.51 2 12 18 V ILIN_LIM 40 200 mA -1 2 Current limitation into the LIN pin in dominant VLIN = VLINSUP_LIN_MAX 3 Input leakage current in dominant state, driver off, internal pull-up on VLIN = 0V, VLINSUP = 12V ILIN_PAS_dom 4 Input leakage current in recessive state, driver off 5.5V<VLINSUP<18V, 5.5V<VLIN<18V, VLIN > VLINSUP ILIN_PAS_rec 5 Input leakage current when ground disconnected ILIN_NO_GND mA 20 A 1 mA ILIN_NO_BAT 30 A 0.4 VLINSUP -1 GNDDevice = VLINSUP, 0V<VLIN<18V, VLINSUP = 12V 6 Input leakage current when battery disconnected VLINSUP = GNDDevice, 0<VLIN<18V 7 Receiver dominant state VLINdom 8 Receiver recessive state VLINrec 0.6 9 VLIN_CNT =(Vth_dom+ Vth_rec)/2 VLIN_CNT 0.475 10 VHYS = Vth_rec -Vth_dom VHYS 11 Maximum capacitance allowed on slave node including external components Cslave 220 12a Capacitance of the LIN pin, Recessive state CLIN 20 VLINSUP 0.5 0.525 VLINSUP 0.175 VLINSUP 250 pF pF MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 605 LINPHY Electrical Specifications 12b Capacitance of the LIN pin, Recessive state CLIN 13 Internal pull-up (slave) Rslave 27 34 45 pF 40 k 1 For 2 3.5V<= VLINSUP <5V, the LINPHY is still working but with degraded parametrics. For 5V<= VLINSUP <5.5V, characterization showed that all parameters generally stay within the indicated specification, except the duty cycles D2 and D4 which may increase and potentially go beyond their maximum limits for highly loaded buses. 3 The VLINSUP voltage is provided by the VLINSUP supply. This supply mapping is described in device level documentation. 4 At temperatures above 25C the current may be naturally limited by the driver, in this case the limitation circuit is not engaged and the flag is not set. G.3 Dynamic Electrical Characteristics Table G-3. Dynamic electrical characteristics of the LINPHY Characteristics noted under conditions 5.5V<= VLINSUP <=18V unless otherwise noted1 2 3. Typical values noted reflect the approximate parameter mean at TA = 25°C under nominal conditions unless otherwise noted. Num Ratings Symbol Min Typ Max Unit 1 Minimum duration of wake-up pulse generating a wake-up interrupt tWUFR 56 72 120 s 2 TxD-dominant timeout (in IRC periods) tDTLIM 16388 16389 tIRC 3 Propagation delay of receiver trx_pd 6 s 4 Symmetry of receiver propagation delay rising edge w.r.t. falling edge trx_sym 2 s -2 LIN PHYSICAL LAYER: DRIVER CHARACTERISTICS FOR NOMINAL SLEW RATE - 20.0KBIT/S 5 Rising/falling edge time (min to max / max to min) 6 Over-current masking window (IRC trimmed at 1MHz) 7 Duty cycle 1 trise s 6.5 tOCLIM 15 D1 0.396 16 s THRec(max) = 0.744 x VLINSUP THDom(max) = 0.581 x VLINSUP VLINSUP = 5.5V...18V tBit = 50us D1 = tBus_rec(min) / (2 x tBit) 8 D2 Duty cycle 2 0.581 THRec(min) = 0.422 x VLINSUP THDom(min) = 0.284 x VLINSUP VLINSUP = 5.5V...18V tBit = 50us D2 = tBus_rec(max) / (2 x tBit) LIN PHYSICAL LAYER: DRIVER CHARACTERISTICS FOR SLOW SLEW RATE - 10.4KBIT/S 9 Rising/falling edge time (min to max / max to min) 10 Over-current masking window (IRC trimmed at 1MHz) trise tOCLIM s 13 31 32 s MC9S12VR Family Reference Manual, Rev. 4.2 606 NXP Semiconductor LINPHY Electrical Specifications Characteristics noted under conditions 5.5V<= VLINSUP <=18V unless otherwise noted1 2 3. Typical values noted reflect the approximate parameter mean at TA = 25°C under nominal conditions unless otherwise noted. Num 11 Ratings Duty cycle 3 Symbol Min D3 0.417 Typ Max Unit THRec(max) = 0.778 x VLINSUP THDom(max) = 0.616 x VLINSUP VLINSUP = 5.5V...18V tBit = 96us D3 = tBus_rec(min) / (2 x tBit) 12 D4 Duty cycle 4 0.590 THRec(min) = 0.389 x VLINSUP THDom(min) = 0.251 x VLINSUP VLINSUP = 5.5V...18V tBit = 96us D4 = tBus_rec(max) / (2 x tBit) LIN PHYSICAL LAYER: DRIVER CHARACTERISTICS FOR FAST MODE SLEW RATE - 100KBIT/S UP TO 250KBIT/S 13 Rising/falling edge time (min to max / max to min) 14 Over-current masking window (IRC trimmed at 1MHz) trise tOCLIM s 0.5 5 6 s 1For 2For 3.5V<= VLINSUP <5V, the LINPHY is still working but with degraded parametrics. 5V<= VLINSUP <5.5V, characterization showed that all parameters generally stay within the indicated specification, except the duty cycles D2 and D4 which may increase and potentially go beyond their maximum limits for highly loaded buses. 3The V LINSUP voltage is provided by the VLINSUP supply. This supply mapping is described in device level documentation. MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 607 LINPHY Electrical Specifications MC9S12VR Family Reference Manual, Rev. 4.2 608 NXP Semiconductor LSDRV Electrical Specifications Appendix H LSDRV Electrical Specifications This section provides electrical parametric and ratings for the LSDRV. H.1 Static Characteristics Table H-1. Static Characteristics - LSDRV Characteristics noted under conditions 6V VSUP 18 V, -40°C TJ 150°C1 unless otherwise noted. Typical values noted reflect the approximate parameter mean at TA = 25°C2 under nominal conditions unless otherwise noted. Num Ratings Symbol Min Typ Max Unit 1 VSUP range for LSDRV compliant electrical characteristics VSUP 6 12 18 V 2 VSUP range within which the device is working without LSDRV compliant electrical characteristics VSUP 3 Output Drain-to-Source On Resistance TJ = 25°C, IPLS0/1 = 150 mA TJ = 150°C, IPLS0/1 = 150 mA RDS(ON) Output Over-Current Threshold The threashold is valid for each LS-driver output. 4 3.5 to 6 and 18 to 27 V – – 2.3 – – 4.5 ILIMLSX 160 270 350 mA 150 mA Note: The low-side driver is NOT intended to switch capacitive loads. A significant capacitive load on PLS0/1 would induce a current when the low-side driver gate is turned on. This current will be sensed by the over-current circuitry and eventually lead to an immediate over-current shut down. 5 Nominal Current for continuous operation. This value is valid for each LS-driver output. INOMLSX – – 5 Settling time after the low-side driver is enabled (write LSEx Bits) tLS_settling 1 – 7 High-Load Resistance Open-Load Detection Current (if low-side driver is enabled and gate turned off) IHLROLDC 30 40 50 A 8 Leakage Current -40°C < TJ < 80°C Open Load Detection disabled. ILEAK_L – – 1 A A 9 Leakage Current -40°C < TJ< 150°C Open Load Detection disabled. ILEAK_H – – 10 A A s MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 609 LSDRV Electrical Specifications Table H-1. Static Characteristics - LSDRV Characteristics noted under conditions 6V VSUP 18 V, -40°C TJ 150°C1 unless otherwise noted. Typical values noted reflect the approximate parameter mean at TA = 25°C2 under nominal conditions unless otherwise noted. Num 10 1 2 Ratings Active Output Voltage Clamp (IPLS0/1 = 150 mA) Symbol Min Typ Max Unit VCLAMP 40 44 – V TJ: Junction Temperature TA: Ambient Temperature H.2 Dynamic Characteristics Table H-2. Dynamic Characteristics - LSDRV Characteristics noted under conditions 6V VSUP 18 V, -40°C TJ 150°C1 unless otherwise noted. Typical values noted reflect the approximate parameter mean at TA = 25°C2 under nominal conditions unless otherwise noted Num 1 2 Ratings 1 Low-Side Driver Operating Frequency 2 Inductive Load on each LS-driver output Symbol Min Typ Max Unit fLS – – 10 kHz LPLS0/1 – – 450 mH TJ: Junction Temperature TA: Ambient Temperature MC9S12VR Family Reference Manual, Rev. 4.2 610 NXP Semiconductor BATS Electrical Specifications Appendix I BATS Electrical Specifications This section describe the electrical characteristics of the Supply Voltage Sense module. I.1 Maximum Ratings Table I-1. Maximum ratings of the Supply Voltage Sense - (BATS). Characteristics noted under conditions 5.5V VSUP 18 V, -40°C TJ 150°C1 unless otherwise noted. Typical values noted reflect the approximate parameter mean at TA = 25°C2 under nominal conditions unless otherwise noted. Num 1 1 2 Ratings VSENSE Max Rating Symbol Min Typ Max Unit VVSENSE_M -27 – 42 V TJ: Junction Temperature TA: Ambient Temperature MC9S12VR Family Reference Manual, Rev. 4.2 NXP Semiconductor 611 BATS Electrical Specifications I.2 Static Electrical Characteristics Table I-2. Static Electrical Characteristics - Supply Voltage Sense - (BATS). Characteristics noted under conditions 5.5V VSUP 18 V, -40°C TJ 150°C1 unless otherwise noted. Typical values noted reflect the approximate parameter mean at TA = 25°C2 under nominal conditions unless otherwise noted. All parameters in this table assume a in series connected RVSENSE_R at VSENSE pin unless otherwise noted and are valid on input voltage of RVSENSE_R and not on VSENSE pin. Num 1 2 3 4 5 6 7 Ratings Symbol Min Typ Max Unit Low Voltage Warning (LBI 1) Assert (Measured on selected pin, falling edge) Deassert (Measured on selected pin, rising edge) Hysteresis (measured on selected pin) VLBI1_A VLBI1_D VLBI1_H 4.75 – – 5.5 – 0.4 6 6.5 – V V V Low Voltage Warning (LBI 2) Assert (Measured on selected pin, falling edge) Deassert (Measured on selected pin, rising edge) Hysteresis (measured on selected pin) VLBI2_A VLBI2_D VLBI2_H 6 – – 6.75 – 0.4 7 7.75 – V V V Low Voltage Warning (LBI 3) Assert (Measured on selected pin, falling edge) Deassert (Measured on selected pin, rising edge) Hysteresis (measured on selected pin) VLBI3_A VLBI3_D VLBI3_H 7 – – 7.75 – 0.4 8.5 9 – V V V Low Voltage Warning (LBI 4) Ass