lx305x.pdf

Obsolete Product – not recommended for new design
LX3050/52 12.5Gbps
I N T E G R A T E D
P R O D U C T S
Coplanar InGaAs/InP PIN Photo Diode
P RODUCTION D ATA S HEET
KEY FEATURES
DESCRIPTION
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LX3050 single die
LX3052, 1x4 array die
Coplanar Waveguide , 50ohm
High Responsivity
Low Dark Current
High Bandwidth
Anode/Cathode on illuminated side
125μm Pad pitch
Die good for wire bond or flip-chip
Die good for non-hermetic package
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custom assembly configurations
including traditional wirebond or flip
chip assembly
This device is ideal for
manufacturers of optical receivers,
transceivers, transponders, optical
transmission
modules
and
combination PIN photo diode –
transimpedance amplifier.
APPLICATIONS
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WWW . Microsemi .C OM
Microsemi’s InGaAs/InP PIN Photo
Diode chips are ideal for high bandwidth
1310nm and 1550nm optical networking
applications.
The device series offer high
responsivity, low dark current, and high
bandwidth for high performance and low
sensitivity receiver design.
The LX305X series of coplanar
waveguide photo diodes are currently
offered
in
die
form
allowing
manufacturers the versatility of
1310nm CATV Optical Applications
1550nm DWDM Optical Applications
SONET/SDH, ATM
10 Gigabit Ethernet, Fibre Channel
1310nm VCSEL receivers
BENEFITS
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Large Wirebond Contact Pads
Low Contact Resistance
Wire bond or flip chip applications
Ground- signal-Ground pad
configuration for standard RF test
probes
PRODUCT HIGHLIGHT
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Coplanar Design (gnd-signal-gnd) 50 ohm
characteristic impedance
125 um standard pad pitch for ease of test
Large 75um x 75um pad size for ease of
packaging
Wire bond or Flip Chip capability
LX3050
LX3050/52
LX3052
Copyright © 2003
Rev. 1.1
Microsemi
11861 Western Avenue, Garden Grove, CA. 92841, 714-898-8121, Fax: 714-893-2570
Page 1
Obsolete Product – not recommended for new design
LX3050/52 12.5Gbps
I N T E G R A T E D
P R O D U C T S
Coplanar InGaAs/InP PIN Photo Diode
P RODUCTION D ATA S HEET
Parameter
`
Test Conditions
Min
LX3050/52
Typ
Max
Units
MAXIMUM RATINGS
Operating Junction Temperature Range
Storage Temperature Range
Maximum Soldering Temperature
-20
-55
TJ
TSTG
+85
+125
+260
10 seconds maximum at temperature
o
C
C
o
C
o
ELECTRICAL CHARACTERISTICS
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`
Symbol
Active Area Diameter
Responsivity (1)
R
Dark Current
Breakdown Voltage
Capacitance
Bandwidth (2)
Cross-talk
0.90
0.85
30
0.12
13
-35
32
1.0
0.95
0.2
45
0.135
15
5
0.15
μm
A/W
nA
Volts
pF
GHz
dB
1. Antireflective coating is ¼ wavelength at 1430nm covering 1310 and 1550nm applications
2. Bandwidth is measured at –3dB electrical power (photocurrent drops to 71% of DC value) into a 50 Ohm load
Copyright © 2003
Rev. 1.1
ELECTRICALS
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Note:
ID
BVR
C
BW
S21
VR = 5V, λ = 1550nm
VR = 5V, λ = 1310nm
VR = 5V
IR = 10 μ A
VR = 5V
VR = 5V, λ = 1550nm @-3dB
1x4 array only @ 10 GHz
WWW . Microsemi .C OM
CHARACTERISTICS
Test conditions (unless otherwise noted): TA = 25oC, VR = 5 Volts
Microsemi
11861 Western Avenue, Garden Grove, CA. 92841, 714-898-8121, Fax: 714-893-2570
Page 2
Obsolete Product – not recommended for new design
LX3050/52 12.5Gbps
I N T E G R A T E D
P R O D U C T S
Coplanar InGaAs/InP PIN Photo Diode
P RODUCTION D ATA S HEET
Active Area
,A, µm
LX3050
LX3052
32
32
Die Dimension, µm
Y
450
450
X
450
1200
Pad Dimension, µm
w
75
75
v
75
75
Pad Pitch, p,
µm
Die thickness, µm
125
125
152
152
MECHANICALS
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Part Number
IMPORTANT: For the most current data, consult MICROSEMI’s website: http://www.microsemi.com
Copyright © 2003
Rev. 1.1
WWW . Microsemi .C OM
DIE GEOMETRY
Microsemi
11861 Western Avenue, Garden Grove, CA. 92841, 714-898-8121, Fax: 714-893-2570
Page 3
Obsolete Product – not recommended for new design
LX3050/52 12.5Gbps
I N T E G R A T E D
P R O D U C T S
Coplanar InGaAs/InP PIN Photo Diode
P RODUCTION D ATA S HEET
LX3050, C-V
0.25
Vr=-5V, BW=15.8GHz
9
Vr=-4V,BW=15.5GHz
0.20
Vr=-2.4V, BW=14.0GHz
Vr=-2V, BW=13.5 GHz
Vr=-1V, Bw =10.6GHz
7
C(pF)
Vr=-3V, BW=15.0GHz
8
0.15
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Relative S21(dB)
LX3050 BW (Vr = 1-5V, 1550 nm)
0.10
0.05
6
0.00
0
5
0.0E+00
5.0E+09
1.0E+10
1.5E+10
2
4
2.0E+10
RF cross talk, LX3052
-20
-40
-60
-80
8
10
LX3050 Id@5V over Temperature
100
Id@5V (nA)
0
6
Vr(V)
Frequency (Hz)
RF Cross-talk (dB)
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CHARACTERISTIC CURVES
-100
0.0E+00
Min
ID@5V (nA)
10
Mean
ID@5V (nA)
1
Max
ID@5V (nA)
0.1
5.0E+09
1.0E+10
1.5E+10
2.0E+10
-40 -20
0
20 40 60 80 100 120
Temp (oC)
Frequency (Hz)
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LX3050 BV over Temperature
60
40
30
20
Min
BV (V)
Mean
BV (V)
GRAPHS
BV (V)
50
Max
BV (V)
10
0
-40 -20
0
20
40
60
80 100 120
Temp (oC)
Copyright © 2003
Rev. 1.1
Microsemi
11861 Western Avenue, Garden Grove, CA. 92841, 714-898-8121, Fax: 714-893-2570
Page 4
Obsolete Product – not recommended for new design
LX3050/52 12.5Gbps
I N T E G R A T E D
Coplanar InGaAs/InP PIN Photo Diode
P R O D U C T S
P RODUCTION D ATA S HEET
WWW . Microsemi .C OM
CIRCUIT MODEL
Lser
Rser
Cdiode
Rdiode
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Cshunt
Part #
Lser
(nH)
0.012
Cshunt
(pF)
0.035
Cdiode
(pF)
0.10
Rdiode
(Mohm)
25
PRECAUTIONS FOR USE
CIRCUIT MODEL
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LX3050
Rser
(Ohm)
17
ESD protection is important. Standard ESD protection procedures should be employed whenever handling InGaAs PIN photo diode.
PRODUCTION DATA – Information contained in this document is proprietary to
Microsemi and is current as of publication date. This document may not be modified in
any way without the express written consent of Microsemi. Product processing does not
necessarily include testing of all parameters. Microsemi reserves the right to change the
configuration and performance of the product and to discontinue product at any time.
Copyright © 2003
Rev. 1.1
Microsemi
11861 Western Avenue, Garden Grove, CA. 92841, 714-898-8121, Fax: 714-893-2570
Page 5