CY7C1011DV33 2-Mbit (128 K × 16) Static RAM Datasheet.pdf

CY7C1011DV33
2-Mbit (128 K × 16) Static RAM
2-Mbit (128 K × 16) Static RAM
Features
Functional Description
The CY7C1011DV33[1] is a high-performance CMOS Static
RAM organized as 128 K words by 16 bits.
■
Pin-and function-compatible with CY7C1011CV33
■
High speed
❐ tAA = 10 ns
■
Low active power
❐ ICC = 90 mA @ 10 ns (Industrial)
■
Low CMOS standby power
❐ ISB2 = 10 mA
■
Data Retention at 2.0 V
■
Automatic power-down when deselected
■
Independent control of upper and lower bits
■
Easy memory expansion with CE and OE features
■
Available in Pb-free 44-pin TSOP II, and 48-ball VFBGA
Writing to the device is accomplished by taking Chip Enable (CE)
and Write Enable (WE) inputs LOW. If Byte Low Enable (BLE) is
LOW, then data from I/O pins (I/O0 through I/O7), is written into
the location specified on the address pins (A0 through A16). If
Byte High Enable (BHE) is LOW, then data from I/O pins (I/O8
through I/O15) is written into the location specified on the address
pins (A0 through A16).
Reading from the device is accomplished by taking Chip Enable
(CE) and Output Enable (OE) LOW while forcing the Write
Enable (WE) HIGH. If Byte Low Enable (BLE) is LOW, then data
from the memory location specified by the address pins will
appear on I/O0 to I/O7. If Byte High Enable (BHE) is LOW, then
data from memory will appear on I/O8 to I/O15. See the truth table
at the back of this data sheet for a complete description of read
and write modes.
The input/output pins (I/O0 through I/O15) are placed in a
high-impedance state when the device is deselected (CE HIGH),
the outputs are disabled (OE HIGH), the BHE and BLE are
disabled (BHE, BLE HIGH), or during a write operation (CE LOW,
and WE LOW).
The CY7C1011DV33 is available in standard Pb-free 44-pin
TSOP II with center power and ground pinout, as well as 48-ball
very fine-pitch ball grid array (VFBGA) packages.
For a complete list of related resources, click here.
Logic Block Diagram
128K X 16
SENSE AMPS
A0
A1
A2
A3
A4
A5
A6
A7
A8
ROW DECODER
INPUT BUFFER
I/O0–I/O7
I/O8–I/O15
A9
A10
A 11
A 12
A 13
A14
A15
A16
COLUMN
DECODER
BHE
WE
CE
OE
BLE
Note
1. For guidelines on SRAM system design, please refer to the “System Design Guidelines” Cypress application note, available on the internet at www.cypress.com
Cypress Semiconductor Corporation
Document Number: 38-05609 Rev. *H
•
198 Champion Court
•
San Jose, CA 95134-1709
•
408-943-2600
Revised November 12, 2014
CY7C1011DV33
Contents
Selection Guide ................................................................ 3
Pin Configurations ........................................................... 3
Maximum Ratings ............................................................. 4
Operating Range ............................................................... 4
DC Electrical Characteristics .......................................... 4
Capacitance ...................................................................... 5
Thermal Resistance .......................................................... 5
AC Test Loads and Waveforms ....................................... 5
Data Retention Characteristics ....................................... 6
Data Retention Waveform ................................................ 6
AC Switching Characteristics ......................................... 7
Switching Waveforms ...................................................... 8
Truth Table ...................................................................... 11
Document Number: 38-05609 Rev. *H
Ordering Information ...................................................... 12
Ordering Code Definitions ......................................... 12
Package Diagrams .......................................................... 13
Acronyms ........................................................................ 14
Document Conventions ................................................. 14
Units of Measure ....................................................... 14
Document History ........................................................... 15
Sales, Solutions, and Legal Information ...................... 17
Worldwide Sales and Design Support ....................... 17
Products .................................................................... 17
PSoC® Solutions ...................................................... 17
Cypress Developer Community ................................. 17
Technical Support ..................................................... 17
Page 2 of 17
CY7C1011DV33
Selection Guide
Description
-10
Unit
Maximum Access Time
10
ns
Maximum Operating Current
90
mA
Maximum CMOS Standby Current
10
mA
Pin Configurations
Figure 1. 44-pin TSOP II pinout (Top View)
TSOP II
Top View
A4
A3
A2
A1
A0
CE
I/O0
I/O1
I/O2
I/O3
VCC
VSS
I/O4
I/O5
I/O6
I/O7
WE
A16
A15
A14
A13
A12
1
44
2
3
43
42
4
41
40
39
38
5
6
7
8
9
10
11
12
37
36
35
34
33
32
31
30
29
28
27
13
14
15
16
17
18
19
20
21
22
26
25
24
23
A5
A6
A7
OE
BHE
BLE
I/O15
I/O14
I/O13
I/O12
VSS
VCC
I/O11
I/O10
I/O9
I/O8
NC
A8
A9
A10
A11
NC
Figure 2. 48-ball VFBGA pinout (Top View)
48-ball VFBGA
(Top View)
Document Number: 38-05609 Rev. *H
1
2
3
4
5
6
BLE
OE
A0
A1
A2
NC
A
I/O8
BHE
A3
A4
CE
I/O0
B
I/O9
I/O10
A5
A6
I/O1
I/O2
C
VSS
I/O11 NC
A7
I/O3
VCC
D
VCC
I/O12
NC
A16
I/O4
VSS
E
I/O14
I/O13
A14
A15
I/O5
I/O6
F
I/O15
NC
A12
A13
WE
I/O7
G
NC
A8
A9
A10
A11
NC
H
Page 3 of 17
CY7C1011DV33
DC input voltage [2] ............................. –0.3 V to VCC + 0.3 V
Maximum Ratings
Current into outputs (LOW) ........................................ 20 mA
Exceeding maximum ratings may shorten the useful life of the
device. User guidelines are not tested.
Static discharge voltage
(per MIL-STD-883, method 3015) ...... ................... > 2001 V
Storage temperature ................................ –65 C to +150 C
Latch-up current .................................................... > 200 mA
Ambient temperature with
power applied .......................................... –55 C to +125 C
Operating Range
Supply voltage on
VCC to relative GND [2] .................................–0.3 V to +4.6 V
Range
DC voltage applied to outputs
in high Z State [2] ................................ –0.3 V to VCC + 0.3 V
Industrial
Ambient Temperature
VCC
–40 C to +85 C
3.3 V  0.3 V
DC Electrical Characteristics
Over the Operating Range
Parameter
Description
-10
Test Conditions
VOH
Output HIGH voltage
VCC = Min, IOH = –4.0 mA
VOL
Output LOW voltage
VCC = Min, IOL = 8.0 mA
VIH
Input HIGH voltage
voltage[3]
Unit
Min
Max
2.4
–
V
–
0.4
V
2.0
VCC + 0.3
V
VIL
Input LOW
–0.3
0.8
V
IIX
Input leakage current
GND < VI < VCC
–1
+1
A
IOZ
Output leakage current
GND < VOUT < VCC, Output Disabled
–1
+1
A
ICC
VCC operating supply current
VCC = Max, f = fMAX = 1/tRC
100 MHz
–
90
mA
83 MHz
–
80
66 MHz
–
70
40 MHz
–
60
ISB1
Automatic CE Power-down
Current — TTL Inputs
Max VCC, CE > VIH,
VIN > VIH or VIN < VIL, f = fMAX
–
20
mA
ISB2
Automatic CE Power-down
Current — CMOS Inputs
Max VCC, CE > VCC – 0.3 V,
VIN > VCC – 0.3 V, or VIN < 0.3 V, f = 0
–
10
mA
Notes
2. Tested initially and after any design or process changes that may affect these parameters.
3. VIL (min) = –2.0 V and VIH(max) = VCC + 2 V for pulse durations of less than 20 ns.
Document Number: 38-05609 Rev. *H
Page 4 of 17
CY7C1011DV33
Capacitance
Parameter [4]
Description
CIN
Input capacitance
COUT
I/O capacitance
Test Conditions
Max
Unit
8
pF
8
pF
TSOP II
VFBGA
Unit
50.66
27.89
C/W
17.17
14.74
C/W
TA = 25 C, f = 1 MHz, VCC = 3.3 V
Thermal Resistance
Parameter [4]
Description
JA
Thermal resistance
(junction to ambient)
JC
Thermal resistance
(junction to case)
Test Conditions
Still air, soldered on a 3 × 4.5 inch,
four-layer printed circuit board
AC Test Loads and Waveforms
Figure 3. AC Test Loads and Waveforms [5]
Z = 50
ALL INPUT PULSES
3.0 V
OUTPUT
50
* CAPACITIVE LOAD CONSISTS
OF ALL COMPONENTS OF THE
TEST ENVIRONMENT
30 pF*
GND
90%
90%
10%
10%
1.5 V
Fall Time: 1 V/ns
Rise Time: 1 V/ns
(b)
(a)
High Z characteristics:
R 317 
3.3 V
OUTPUT
R2
351
5 pF
(c)
Note
4. Tested initially and after any design or process changes that may affect these parameters.
5. AC characteristics (except high Z) are tested using the load conditions shown in (a). High Z characteristics are tested for all speeds using the test load shown in (c).
Document Number: 38-05609 Rev. *H
Page 5 of 17
CY7C1011DV33
Data Retention Characteristics
Over the Operating Range
Parameter
Conditions [6]
Description
VDR
VCC for data retention
ICCDR
Data retention current
tCDR[7]
Chip deselect to data retention
time
tR[8]
Operation recovery time
VCC = VDR = 2.0 V, CE > VCC – 0.3 V,
VIN > VCC – 0.3 V or VIN < 0.3 V
Min
Max
Unit
2.0
–
V
–
10
mA
0
–
ns
tRC
–
ns
Data Retention Waveform
Figure 4. Data Retention Waveform
DATA RETENTION MODE
VCC
3.0 V
VDR > 2 V
tCDR
3.0 V
tR
CE
Notes
6. No input may exceed VCC + 0.3 V.
7. Tested initially and after any design or process changes that may affect these parameters.
8. Full device operation requires linear VCC ramp from VDR to VCC(min.) > 50 s or stable at VCC(min.) > 50 s.
Document Number: 38-05609 Rev. *H
Page 6 of 17
CY7C1011DV33
AC Switching Characteristics
Over the Operating Range
Parameter [9]
Description
-10
Min
Max
Unit
Read Cycle
tpower[10]
VCC(typical) to the first access
100
–
s
tRC
Read cycle time
10
–
ns
tAA
Address to data valid
–
10
ns
tOHA
Data hold from address change
3
–
ns
tACE
CE LOW to data valid
–
10
ns
tDOE
OE LOW to data valid
–
5
ns
0
–
ns
–
5
ns
3
–
ns
–
5
ns
0
–
ns
tLZOE
OE LOW to low Z
[11]
[11, 12]
tHZOE
OE HIGH to high Z
tLZCE
CE LOW to low Z [11]
[11, 12]
tHZCE
CE HIGH to high Z
tPU
CE LOW to power-up
tPD
CE HIGH to power-down
–
10
ns
tDBE
Byte enable to data valid
–
5
ns
tLZBE
Byte enable to low Z
0
–
ns
Byte disable to high Z
–
6
ns
tHZBE
Write Cycle
[13, 14]
tWC
Write cycle time
10
–
ns
tSCE
CE LOW to write end
7
–
ns
tAW
Address set-up to write end
7
–
ns
tHA
Address hold from write end
0
–
ns
tSA
Address set-up to write start
0
–
ns
tPWE
WE pulse width
7
–
ns
tSD
Data set-up to write end
5
–
ns
tHD
Data hold from write end
0
–
ns
tLZWE
WE HIGH to low Z [11]
3
–
ns
–
5
ns
7
–
ns
[11, 12]
tHZWE
WE LOW to high Z
tBW
Byte enable to end of write
Notes
9. Test conditions assume signal transition time of 3 ns or less, timing reference levels of 1.5 V, input pulse levels of 0 to 3.0 V.
10. tPOWER gives the minimum amount of time that the power supply should be at typical VCC values until the first memory access is performed.
11. At any given temperature and voltage condition, tHZCE is less than tLZCE, tHZOE is less than tLZOE, tHZBE is less than tLZBE, and tHZWE is less than tLZWE for any given
device.
12. tHZOE, tHZCE, tHZBE and tHZWE are specified with a load capacitance of 5 pF as in part (d) of AC Test Loads. Transition is measured when the outputs enter a high
impedance state.
13. The internal write time of the memory is defined by the overlap of CE LOW, and WE LOW. CE and WE must be LOW to initiate a write, and the transition of either
of these signals can terminate the write. The input data set-up and hold timing should be referenced to the leading edge of the signal that terminates the write.
14. The minimum write cycle pulse width for Write Cycle No. 4 (WE Controlled, OE LOW) should be the sum of tSD and tHZWE.
Document Number: 38-05609 Rev. *H
Page 7 of 17
CY7C1011DV33
Switching Waveforms
Figure 5. Read Cycle No. 1 [15, 16]
tRC
ADDRESS
tOHA
DATA OUT
tAA
PREVIOUS DATA VALID
DATA VALID
Figure 6. Read Cycle No. 2 (OE Controlled) [16, 17]
ADDRESS
tRC
CE
tACE
OE
tHZOE
tDOE
BHE, BLE
tLZOE
tHZCE
tDBE
tLZBE
DATA OUT
HIGH IMPEDANCE
tLZCE
VCC
SUPPLY
CURRENT
tHZBE
DATA VALID
HIGH
IMPEDANCE
tPD
tPU
50%
50%
IICC
CC
IISB
SB
Notes
15. Device is continuously selected. OE, CE, BHE and/or BHE = VIL.
16. WE is HIGH for read cycle.
17. Address valid prior to or coincident with CE transition LOW.
Document Number: 38-05609 Rev. *H
Page 8 of 17
CY7C1011DV33
Switching Waveforms (continued)
Figure 7. Write Cycle No. 1 (CE Controlled) [18, 19]
tWC
ADDRESS
CE
tSA
tSCE
tAW
tHA
tPWE
WE
tBW
BHE, BLE
tSD
tHD
DATAI/O
Figure 8. Write Cycle No. 2 (BLE or BHE Controlled)
tWC
ADDRESS
BHE, BLE
tSA
tBW
tAW
tHA
tPWE
WE
tSCE
CE
tSD
tHD
DATA I/O
Notes
18. Data I/O is high-impedance if OE or BHE and/or BLE = VIH.
19. If CE goes HIGH simultaneously with WE going HIGH, the output remains in a high-impedance state.
Document Number: 38-05609 Rev. *H
Page 9 of 17
CY7C1011DV33
Switching Waveforms (continued)
Figure 9. Write Cycle No. 3 (WE Controlled, OE HIGH During Write) [20, 21]
tWC
ADDRESS
tSCE
CE
tAW
tHA
tSA
tPWE
WE
OE
BHE, BLE
t
SD
DATA I/O
NOTE 22
tHD
DATAIN VALID
t
HZOE
Figure 10. Write Cycle No. 4 (WE Controlled, OE LOW) [23]
tWC
BHE, BLE
ADDRESS
tSCE
CE
tAW
tHA
tSA
tPWE
WE
tBW
BHE, BLE
tHZWE
DATA I/O
tSD
tHD
NOTE 22
tLZWE
Notes
20. Data I/O is high-impedance if OE or BHE and/or BLE = VIH.
21. If CE goes HIGH simultaneously with WE going HIGH, the output remains in a high-impedance state.
22. During this period the I/Os are in the output state and input signals should not be applied.
23. The minimum write pulse width for Write Cycle No. 4 (WE controlled, OE LOW) should be the sum of tSD and tHZWE.
Document Number: 38-05609 Rev. *H
Page 10 of 17
CY7C1011DV33
Truth Table
CE
OE
WE
BLE
BHE
H
X
X
X
X
High Z
High Z
Power-down
Standby (ISB)
L
L
H
L
L
Data Out
Data Out
Read all bits
Active (ICC)
L
L
H
L
H
Data Out
High Z
Read lower bits only
Active (ICC)
L
L
H
H
L
High Z
Data Out
Read upper bits only
Active (ICC)
L
X
L
L
L
Data In
Data In
Write all bits
Active (ICC)
L
X
L
L
H
Data In
High Z
Write lower bits only
Active (ICC)
L
X
L
H
L
High Z
Data In
Write upper bits only
Active (ICC)
L
H
H
X
X
High Z
High Z
Selected, outputs disabled
Active (ICC)
Document Number: 38-05609 Rev. *H
I/O0–I/O7
I/O8–I/O15
Mode
Power
Page 11 of 17
CY7C1011DV33
Ordering Information
Speed
(ns)
10
Ordering Code
Package
Diagram
Package Type
CY7C1011DV33-10ZSXI
51-85087 44-pin TSOP II (Pb-free)
CY7C1011DV33-10BVXI
51-85150 48-ball VFBGA (Pb-free)
Operating
Range
Industrial
Please contact your local Cypress sales representative for availability of these parts
Ordering Code Definitions
CY 7 C 1 01 1
D V33 - 10 XX X
I
Temperature Range:
I = Industrial
Pb-free
Package Type: XX = ZS or BV
ZS = 44-pin TSOP II
BV = 48-ball VFBGA
Speed: 10 ns
Voltage Range: V33 = 3 V to 3.6 V
Process Technology: D = C9, 90 nm Technology
Data Width: 1 = × 16-bits
Density: 01 = 2-Mbit
Family Code: 1 = Fast Asynchronous SRAM family
Technology Code: C = CMOS
Marketing Code: 7 = SRAM
Company ID: CY = Cypress
Document Number: 38-05609 Rev. *H
Page 12 of 17
CY7C1011DV33
Package Diagrams
Figure 11. 44-pin TSOP Z44-II Package Outline, 51-85087
51-85087 *E
Figure 12. 48-ball VFBGA (6 × 8 × 1 mm) BV48/BZ48 Package Outline, 51-85150
51-85150 *H
Document Number: 38-05609 Rev. *H
Page 13 of 17
CY7C1011DV33
Acronyms
Acronym
Document Conventions
Description
Units of Measure
CMOS
Complementary Metal Oxide Semiconductor
CE
Chip Enable
°C
degree Celsius
I/O
Input/Output
MHz
megahertz
OE
Output Enable
µs
microsecond
SRAM
Static Random Access Memory
µA
microampere
TSOP
Thin Small Outline Package
mA
milliampere
TTL
Transistor-Transistor Logic
ns
nanosecond
VFBGA
Very Fine-Pitch Ball Grid Array
%
percent
WE
Write Enable
Document Number: 38-05609 Rev. *H
Symbol
Unit of Measure
pF
picofarad
V
volt
W
watt
Page 14 of 17
CY7C1011DV33
Document History
Document Title: CY7C1011DV33, 2-Mbit (128 K × 16) Static RAM
Document Number: 38-05609
Rev.
ECN No.
Issue Date
Orig. of
Change
**
250650
See ECN
RKF
New data sheet.
*A
399070
See ECN
NXR
Changed from Advance to Preliminary
Changed address of Cypress Semiconductor Corporation on Page# 1 from
“3901 North First Street” to “198 Champion Court”
Removed TQFP Package from product offering
Removed –15 speed bin
Corrected DC voltage limits in maximum ratings section from –0.5 to –0.3V and
VCC +0.5V to VCC +0.3V
Redefined ICC values for Com’l and Ind’l temperature ranges
ICC (Com’l): Changed from 100, 80 and 70 mA to 90, 80 and 75 mA for 8, 10
and 12ns speed bins respectively
ICC (Ind’l): Changed from 80 and 70 mA to 90 and 85 mA for 10 and 12ns speed
bins respectively
Modified Note# 4 on AC Test Loads
Added Static Discharge Voltage and latch-up current spec
Added VIH(max) spec in Note# 2
Changed reference voltage level for measurement of Hi-Z parameters from
500 mV to 200 mV
Added Data Retention Characteristics Table and footnote on tR
Added Write Cycle (WE Controlled, OE HIGH During Write) Timing Diagram
Changed package name for 44-pin TSOP II from Z to ZS
Added 8 ns parts in the Ordering Information table
Shaded Ordering Information Table
*B
459073
See ECN
NXR
Converted Preliminary to Final.
Removed –8 and –12 Speed bins
Removed Commercial Operating Range from product offering.
Changed the description of IIX from “Input Load Current” to “Input Leakage
Current”
Updated the Thermal Resistance table.
Changed tHZBE from 5 ns to 6 ns.
Updated footnote #7 on High-Z parameter measurement
Added footnote #12.
Updated the Ordering Information and replaced Package Name column with
Package Diagram in the Ordering Information table.
Description of Change
*C
480177
See ECN
VKN
*D
3059162
10/14/2010
PRAS
Added Ordering Code Definitions.
Updated Package Diagrams.
Added -10BVI product ordering code in the Ordering Information table.
*E
3098812
12/01/2010
PRAS
Added Acronyms and Units of Measure.
Minor edits and updated in new template.
*F
3861347
01/08/2013
TAVA
Updated Ordering Information (Updated part numbers).
Updated Package Diagrams:
spec 51-85087 – Changed revision from *C to *E.
spec 51-85150 – Changed revision from *F to *H.
*G
4187715
11/10/2013
MEMJ
Updated in new template.
Completing Sunset Review.
Document Number: 38-05609 Rev. *H
Page 15 of 17
CY7C1011DV33
Document History (continued)
Document Title: CY7C1011DV33, 2-Mbit (128 K × 16) Static RAM
Document Number: 38-05609
Rev.
ECN No.
Issue Date
Orig. of
Change
*H
4567909
11/12/2014
MEMJ
Description of Change
Updated Functional Description:
Added “For a complete list of related resources, click here.” at the end.
Updated Switching Waveforms:
Added Note 23 and referred the same note in Figure 10.
Competing Sunset Review.
Document Number: 38-05609 Rev. *H
Page 16 of 17
CY7C1011DV33
Sales, Solutions, and Legal Information
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Cypress maintains a worldwide network of offices, solution centers, manufacturer’s representatives, and distributors. To find the office
closest to you, visit us at Cypress Locations.
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integrated circuit as specified in the applicable agreement. Any reproduction, modification, translation, compilation, or representation of this Source Code except as specified above is prohibited without
the express written permission of Cypress.
Disclaimer: CYPRESS MAKES NO WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, WITH REGARD TO THIS MATERIAL, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES
OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE. Cypress reserves the right to make changes without further notice to the materials described herein. Cypress does not
assume any liability arising out of the application or use of any product or circuit described herein. Cypress does not authorize its products for use as critical components in life-support systems where
a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress’ product in a life-support systems application implies that the manufacturer
assumes all risk of such use and in doing so indemnifies Cypress against all charges.
Use may be limited by and subject to the applicable Cypress software license agreement.
Document Number: 38-05609 Rev. *H
Revised November 12, 2014
All products and company names mentioned in this document may be the trademarks of their respective holders.
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