CY7C1020CV26:512-Kbit (32 K × 16) Static RAM Datasheet.pdf

CY7C1020CV26
512-Kbit (32 K × 16) Static RAM
512-Kbit (32 K × 16) Static RAM
Features
Writing to the device is accomplished by taking chip enable (CE)
and write enable (WE) inputs LOW. If byte low enable (BLE) is
LOW, then data from I/O pins (I/O1 through I/O8), is written into
the location specified on the address pins (A0 through A14). If
byte high enable (BHE) is LOW, then data from I/O pins (I/O9
through I/O16) is written into the location specified on the address
pins (A0 through A14).
■
Temperature range
❐ Automotive: –40 °C to 125 °C
■
High speed
❐ tAA = 15 ns
■
Optimized voltage range: 2.5 V to 2.7 V
■
Automatic power down when deselected
■
Independent control of upper and lower bits
■
CMOS for optimum speed and power
■
Package offered: 44-pin TSOP II
Reading from the device is accomplished by taking
chip enable (CE) and Output Enable (OE) LOW while forcing the
write enable (WE) HIGH. If byte low enable (BLE) is LOW, then
data from the memory location specified by the address pins
appears on I/O1 to I/O8. If Byte High Enable (BHE) is LOW, then
data from memory appears on I/O9 to I/O16. See the Truth Table
on page 11 for a complete description of read and write modes.
Functional Description
The CY7C1020CV26 is a high performance CMOS static RAM
organized as 32,768 words by 16 bits. This device has an
automatic power down feature that significantly reduces power
consumption when deselected.
The input/output pins (I/O1 through I/O16) are placed in a high
impedance state when the device is deselected (CE HIGH), the
outputs are disabled (OE HIGH), the BHE and BLE are disabled
(BHE, BLE HIGH), or during a write operation
(CE LOW, and WE LOW).
The CY7C1020CV26 is available in a standard 44-pin TSOP
Type II.
For a complete list of related documentation, click here.
Logic Block Diagram
Cypress Semiconductor Corporation
Document Number: 38-05406 Rev. *G
•
198 Champion Court
•
San Jose, CA 95134-1709
•
408-943-2600
Revised September 14, 2015
CY7C1020CV26
Contents
Pin Configuration ............................................................. 3
Selection Guide ................................................................ 3
Maximum Ratings ............................................................. 4
Operating Range ............................................................... 4
Electrical Characteristics ................................................. 4
Capacitance ...................................................................... 5
AC Test Loads and Waveforms ....................................... 5
AC Switching Characteristics ......................................... 6
Switching Waveforms ...................................................... 7
Truth Table ...................................................................... 11
Ordering Information ...................................................... 12
Ordering Code Definitions ......................................... 12
Document Number: 38-05406 Rev. *G
Package Diagrams .......................................................... 13
Acronyms ........................................................................ 14
Document Conventions ................................................. 14
Units of Measure ....................................................... 14
Document History Page ................................................. 15
Sales, Solutions, and Legal Information ...................... 16
Worldwide Sales and Design Support ....................... 16
Products .................................................................... 16
PSoC® Solutions ...................................................... 16
Cypress Developer Community ................................. 16
Technical Support ..................................................... 16
Page 2 of 16
CY7C1020CV26
Pin Configuration
Figure 1. 44-pin TSOP II pinout (Top View)
Selection Guide
Description
CY7C1020CV26-15
Unit
Maximum access time
15
ns
Maximum operating current
100
mA
5
mA
Maximum CMOS standby current
Document Number: 38-05406 Rev. *G
Page 3 of 16
CY7C1020CV26
DC input voltage[1] ................................ –0.5 V to VCC+0.5 V
Maximum Ratings
Current into outputs (LOW) ........................................ 20 mA
Exceeding maximum ratings may shorten the useful life of the
device. User guidelines are not tested.
Storage temperature ................................ –65 C to +150 C
Static discharge voltage
(per MIL-STD-883, Method 3015) .......................... > 2001 V
Latch up current ..................................................... > 200 mA
Ambient temperature
with power applied ................................... –55 C to +125 C
Operating Range
Supply voltage
on VCC to relative GND[1] ............................–0.5 V to +4.6 V
Range
DC voltage applied to outputs
in High-Z State[1] ................................... –0.5 V to VCC+0.5 V
Ambient Temperature
VCC
–40 C to +125 C
2.5 V to 2.7 V
Automotive
Electrical Characteristics
Over the Operating Range
Parameter
Description
Test Conditions
VOH
Output HIGH voltage
VCC = Minimum, IOH = –1.0 mA
VOL
Output LOW voltage
VCC = Minimum, IOL = 1.0 mA
VIH
Input HIGH voltage
voltage[1]
CY7C1020CV26
Min
Max
Unit
2.3
–
V
–
0.4
V
2.0
VCC + 0.3
V
–0.3
0.8
V
VIL
Input LOW
IIX
Input load current
GND < VI < VCC
–5
+5
A
IOZ
Output leakage current
GND < VI < VCC, Output Disabled
–5
+5
A
IOS[2]
Output short circuit current
VCC = Maximum, VOUT = GND
–
–300
mA
ICC
VCC operating supply current
VCC = Maximum, IOUT = 0 mA,
f = fMAX = 1/tRC
–
100
mA
ISB1
Automatic CE power-down
Current – TTL Inputs
Maximum VCC, CE > VIH,
VIN > VIH or VIN < VIL, f = fMAX
–
40
mA
ISB2
Automatic CE power-down
Current – CMOS Inputs
Maximum VCC, CE > VCC – 0.3 V,
VIN > VCC – 0.3 V, or VIN < 0.3 V, f = 0
–
5
mA
Notes
1. VIL (min.) = –2.0V for pulse durations of less than 20 ns.
2. Not more than one output should be shorted at one time. Duration of the short circuit should not exceed 30 seconds.
Document Number: 38-05406 Rev. *G
Page 4 of 16
CY7C1020CV26
Capacitance
Parameter [3]
Description
CIN
Input capacitance
COUT
Output capacitance
Test Conditions
TA = 25 C, f = 1 MHz, VCC = 2.6 V
Max
Unit
8
pF
8
pF
AC Test Loads and Waveforms
Figure 2. AC Test Loads and Waveforms [4]
ALL INPUT PULSES
R 1830 
2.5V
2.6V
90%
OUTPUT
R2
1976 
30 pF
(a)
GND
90%
10%
10%
Fall Time:1 V/ns
Rise Time: 1 V/ns
(b)
Notes
3. Tested initially and after any design or process changes that may affect these parameters.
4. Test conditions assume signal transition time of 1V/ns or less, timing reference levels of 1.3 V, input pulse levels of 0 to 2.5 V and transmission line loads as in (a)
of Figure 2.
Document Number: 38-05406 Rev. *G
Page 5 of 16
CY7C1020CV26
AC Switching Characteristics
Over the Operating Range
Parameter
Description
CY7C1020CV26
Min
Max
Unit
Read Cycle
tRC
Read cycle time
15
–
ns
tAA
Address to data valid
–
15
ns
tOHA
Data hold from address change
3
–
ns
tACE
CE LOW to data valid
–
15
ns
tDOE
OE LOW to data valid
–
7
ns
[5]
0
–
ns
Z[5, 6]
–
7
ns
tLZOE
OE LOW to low Z
tHZOE
OE HIGH to high
Z[5]
tLZCE
CE LOW to low
3
–
ns
tHZCE
CE HIGH to high Z[5, 6]
–
7
ns
tPU[7]
tPD[7]
CE LOW to power-up
0
–
ns
CE HIGH to power-down
–
15
ns
tDBE
Byte enable to data valid
–
7
ns
tLZBE
Byte enable to low Z
0
–
ns
Byte disable to high Z
–
7
ns
tWC
Write cycle time
15
–
ns
tSCE
CE LOW to write end
10
–
ns
tAW
Address setup to write end
10
–
ns
tHA
Address hold from write end
0
–
ns
tSA
Address setup to write start
0
–
ns
tPWE
WE pulse width
10
–
ns
tSD
Data setup to write end
8
–
ns
tHD
Data hold from write end
0
–
ns
tHZBE
Write
Cycle[8, 9]
[5]
tLZWE
WE HIGH to Low Z
3
–
ns
tHZWE
WE LOW to High Z[5, 6]
–
4
ns
tBW
Byte enable to end of write
10
–
ns
Notes
5. At any temperature and voltage condition, tHZCE is less than tLZCE, tHZOE is less than tLZOE, and tHZWE is less than tLZWE for any device.
6. tHZOE, tHZBE, tHZCE, and tHZWE are specified with a load capacitance of 5 pF as in (b) of Figure 2 on page 5. Transition is measured ±500 mV from steady-state voltage.
7. This parameter is guaranteed by design and is not tested.
8. The internal write time of the memory is defined by the overlap of CE LOW, WE LOW and BHE / BLE LOW. CE, WE and BHE / BLE must be LOW to initiate a write,
and the transition of these signals can terminate the write. The input data setup and hold timing should be referenced to the leading edge of the signal that terminates
the write.
9. The minimum write pulse width for WRITE Cycle No.3 (WE Controlled, OE LOW) should be sum of tHZWE and tSD.
Document Number: 38-05406 Rev. *G
Page 6 of 16
CY7C1020CV26
Switching Waveforms
Figure 3. Read Cycle No. 1 [10, 11]
tRC
ADDRESS
tAA
tOHA
DATA OUT
PREVIOUS DATA VALID
DATA VALID
Figure 4. Read Cycle No. 2 (OE Controlled) [11, 12]
ADDRESS
tRC
CE
tACE
OE
tHZOE
tDOE
BHE, BLE
tLZOE
tHZCE
tDBE
tLZBE
DATA OUT
HIGH IMPEDANCE
tLZCE
VCC
SUPPLY
CURRENT
tHZBE
HIGH
IMPEDANCE
DATA VALID
tPD
tPU
50%
IICC
CC
50%
IISB
SB
Notes
10. Device is continuously selected. OE, CE, BHE and/or BHE = VIL,
11. WE is HIGH for read cycle.
12. Address valid prior to or coincident with CE transition LOW.
Document Number: 38-05406 Rev. *G
Page 7 of 16
CY7C1020CV26
Switching Waveforms (continued)
Figure 5. Write Cycle No. 1 (CE Controlled) [13, 14]
tWC
ADDRESS
CE
tSA
tSCE
tAW
tHA
tPWE
WE
tBW
BHE, BLE
tSD
tHD
DATA I/O
Figure 6. Write Cycle No. 2 (BLE or BHE Controlled)
tWC
ADDRESS
BHE, BLE
tSA
tBW
tAW
tHA
tPWE
WE
tSCE
CE
tSD
tHD
DATA I/O
Notes
13. Data I/O is high impedance if OE or BHE and BLE = VIH.
14. If CE goes HIGH simultaneously with WE going HIGH, the output remains in a high impedance state.
Document Number: 38-05406 Rev. *G
Page 8 of 16
CY7C1020CV26
Switching Waveforms (continued)
Figure 7. Write Cycle No. 3 (WE Controlled, OE LOW) [15]
tWC
ADDRESS
tSCE
CE
tAW
tHA
tSA
tPWE
WE
tBW
BHE, BLE
tHZWE
tSD
tHD
DATA I/O
tLZWE
Note
15. The minimum write pulse width for WRITE Cycle No.3 (WE Controlled, OE LOW) should be sum of tHZWE and tSD.
Document Number: 38-05406 Rev. *G
Page 9 of 16
CY7C1020CV26
Switching Waveforms (continued)
Figure 8. Write Cycle No. 4 (WE Controlled) [16, 17, 18]
tWC
ADDRESS
tSCE
CE1
CE2
tAW
tHA
tSA
tPWE
WE
tBW
BHE/BLE
OE
tHD
tSD
DATA I/O
NOTE 19
DATA IN VALID
tHZOE
Notes
16. The internal write time of the memory is defined by the overlap of WE, CE1 = VIL, BHE or BLE or both = VIL, and CE2 = VIH. All signals must be ACTIVE to initiate a
write and any of these signals can terminate a write by going INACTIVE. The data input setup and hold timing must refer to the edge of the signal that terminates the
write.
17. Data I/O is high impedance if OE = VIH.
18. If CE1 goes HIGH and CE2 goes LOW simultaneously with WE = VIH, the output remains in a high impedance state.
19. During this period the I/Os are in output state. Do not apply input signals.
Document Number: 38-05406 Rev. *G
Page 10 of 16
CY7C1020CV26
Truth Table
CE
OE
WE
BLE
BHE
H
X
X
X
X
High Z
High Z
Power-Down
Standby (ISB)
L
L
H
L
L
Data Out
Data Out
Read – All bits
Active (ICC)
L
H
Data Out
High Z
Read – Lower bits only
Active (ICC)
H
L
High Z
Data Out
Read – Upper bits only
Active (ICC)
L
L
Data In
Data In
Write – All bits
Active (ICC)
L
H
Data In
High Z
Write – Lower bits only
Active (ICC)
H
L
High Z
Data In
Write – Upper bits only
Active (ICC)
L
X
L
I/O1–I/O8
I/O9–I/O16
Mode
Power
L
H
H
X
X
High Z
High Z
Selected, Outputs Disabled
Active (ICC)
L
X
X
H
H
High Z
High Z
Selected, Outputs Disabled
Active (ICC)
Document Number: 38-05406 Rev. *G
Page 11 of 16
CY7C1020CV26
Ordering Information
Speed
(ns)
15
Ordering Code
Package
Name
CY7C1020CV26-15ZSXE
Z44
Package Type
44-pin TSOP Type II (Pb-free)
Operating
Range
Automotive
Ordering Code Definitions
CY 7 C 1 02 0
C V26 - 15 ZS
X
E
Temperature Range:
E = Automotive
Pb-free
Package Type:
ZS = 44-pin TSOP Type II
Speed Grade= 15 ns
Voltage Range: V26 = 2.5 V to 2.7 V
Process Technology: C = 0.16 µm Technology
Data Width: 0 = × 16-bits
Density: 02 = 512-Kbit density
Family Code: 1 = Fast Asynchronous SRAM family
Technology Code: C = CMOS
Marketing Code: 7 = SRAM
Company ID: CY = Cypress
Document Number: 38-05406 Rev. *G
Page 12 of 16
CY7C1020CV26
Package Diagrams
Figure 9. 44-pin TSOP Z44-II Package Outline, 51-85087
51-85087 *E
Document Number: 38-05406 Rev. *G
Page 13 of 16
CY7C1020CV26
Acronyms
Acronym
Document Conventions
Description
Units of Measure
CE
Chip Enable
CMOS
Complementary Metal Oxide Semiconductor
°C
degree Celsius
I/O
Input/Output
MHz
megahertz
OE
Output Enable
µA
microampere
SRAM
Static Random Access Memory
mA
milliampere
TSOP
Thin Small Outline Package
mm
millimeter
TTL
Transistor-Transistor Logic
mV
millivolt
ns
nanosecond
Document Number: 38-05406 Rev. *G
Symbol
Unit of Measure

ohm
%
percent
pF
picofarad
V
volt
Page 14 of 16
CY7C1020CV26
Document History Page
Document Title: CY7C1020CV26, 512-Kbit (32 K × 16) Static RAM
Document Number: 38-05406
Rev.
ECN NO.
Submission
Date
Orig. of
Change
**
128060
07/30/03
EJH
Customized data sheet to meet special requirements for CG5988AF
Automotive temperature range: –40°C / +125°C
*A
352999
See ECN
SYT
Updated Document Title (to include the mention of ‘512Kb’).
Removed ‘CG5988AF’ from the Datasheet.
Updated Features (for better structure).
*B
2903127
04/01/2010
VIVG
Updated Package Diagrams.
Added Sales, Solutions, and Legal Information.
Updated to new template.
*C
3109992
12/14/2010
AJU
Added Ordering Code Definitions.
*D
3346414
08/16/2011
RAME
Updated Ordering Code Definitions.
*E
4499482
09/11/2014
MEMJ
Updated AC Switching Characteristics:
Updated Note 7.
Added Note 9 and referred the same note in “Write Cycle”.
Updated Switching Waveforms:
Added Note 15 and referred the same note in Figure 7.
Updated Package Diagrams:
spec 51-85087 – Changed revision from *C to *E.
Updated to new template.
Completing Sunset Review.
*F
4573200
11/18/2014
MEMJ
Updated Functional Description:
Added “For a complete list of related documentation, click here.” at the end.
*G
4919066
09/14/2015
VINI
Document Number: 38-05406 Rev. *G
Description of Change
Updated Switching Waveforms:
Added Figure 8.
Added Note 16, 17, 18, 19 and referred the same notes in Figure 8.
Added Acronyms and Units of Measure.
Updated to new template.
Completing Sunset Review.
Page 15 of 16
CY7C1020CV26
Sales, Solutions, and Legal Information
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Document Number: 38-05406 Rev. *G
Revised September 14, 2015
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