CY7C10212CV33 1-Mbit (64 K × 16) Static RAM Datasheet.pdf

CY7C10212CV33
1-Mbit (64 K × 16) Static RAM
1-Mbit (64 K × 16) Static RAM
Features
Functional Description
■
Temperature ranges
❐ Automotive-E: –40 °C to 125 °C
■
Pin and function compatible with CY7C10212CV33
■
High speed
❐ tAA = 12 ns (Automotive-E)
■
CMOS for optimum speed and power
■
Low active power: 325 mW (max)
■
Automatic power down when deselected
■
Independent control of upper and lower bits
■
Available in Pb-free 48-ball FBGA package
The CY7C10212CV33 is a high performance CMOS static RAM
organized as 65,536 words by 16 bits. This device has an
automatic power down feature that significantly reduces power
consumption when deselected.
Writing to the device is accomplished by taking Chip Enable (CE)
and Write Enable (WE) inputs LOW. If Byte Low Enable (BLE) is
LOW, then data from I/O pins (I/O0 through I/O7), is written into
the location specified on the address pins (A0 through A15). If
Byte High Enable (BHE) is LOW, then data from I/O pins (I/O8
through I/O15) is written into the location specified on the address
pins (A0 through A15).
Reading from the device is accomplished by taking Chip Enable
(CE) and Output Enable (OE) LOW while forcing the Write
Enable (WE) HIGH. If Byte Low Enable (BLE) is LOW, then data
from the memory location specified by the address pins appear
on I/O0 to I/O7. If Byte High Enable (BHE) is LOW, then data from
memory appears on I/O8 to I/O15. For more information, see the
Truth Table on page 9 for a complete description of Read and
Write modes.
The input and output pins (I/O0 through I/O15) are placed in a
high impedance state when the device is deselected (CE HIGH),
the outputs are disabled (OE HIGH), the BHE and BLE are
disabled (BHE, BLE HIGH), or during a write operation (CE LOW
and WE LOW).
For a complete list of related documentation, click here.
Logic Block Diagram
64K x 16
RAM Array
SENSE AMPS
A7
A6
A5
A4
A3
A2
A1
A0
ROW DECODER
DATA IN DRIVERS
I/O0–I/O7
I/O8–I/O15
COLUMN DECODER
A8
A9
A10
A11
A12
A13
A14
A15
BHE
WE
CE
OE
BLE
Cypress Semiconductor Corporation
Document Number: 001-82303 Rev. *B
•
198 Champion Court
•
San Jose, CA 95134-1709
•
408-943-2600
Revised November 18, 2014
CY7C10212CV33
Contents
Selection Guide ................................................................ 3
Pin Configuration ............................................................. 3
Maximum Ratings ............................................................. 4
Operating Range ............................................................... 4
Electrical Characteristics ................................................. 4
Capacitance ...................................................................... 5
Thermal Resistance .......................................................... 5
AC Test Loads and Waveforms ....................................... 5
Switching Characteristics ................................................ 6
Switching Waveforms ...................................................... 7
Truth Table ........................................................................ 9
Ordering Information ...................................................... 10
Ordering Code Definitions ......................................... 10
Document Number: 001-82303 Rev. *B
Package Diagrams .......................................................... 11
Acronyms ........................................................................ 12
Document Conventions ................................................. 12
Units of Measure ....................................................... 12
Document History Page ................................................. 13
Sales, Solutions, and Legal Information ...................... 14
Worldwide Sales and Design Support ....................... 14
Products .................................................................... 14
PSoC® Solutions ...................................................... 14
Cypress Developer Community ................................. 14
Technical Support ..................................................... 14
Page 2 of 14
CY7C10212CV33
Selection Guide
Description
-12
Unit
Maximum Access Time
12
ns
Maximum Operating Current
90
mA
Maximum CMOS Standby Current
10
mA
Pin Configuration
Figure 1. 48-ball FBGA pinout [1]
1
2
3
4
5
6
BLE
OE
A0
A1
A2
NC
A
I/O8
BHE
A3
A4
CE
I/O0
B
I/O9
I/O10
A5
A6
I/O2
I/O1
C
VSS I/O11
NC
A7
VCC
D
VCC
NC
NC
I/O4
VSS
E
I/O14 I/O13 A14
A15
I/O5
I/O6
F
I/O12
I/O3
I/O15
NC
A12
A13
WE
I/O7
G
NC
A8
A9
A10
A11
NC
H
Note
1. NC pins are not connected on the die.
Document Number: 001-82303 Rev. *B
Page 3 of 14
CY7C10212CV33
DC Input Voltage [2] ............................ –0.3 V to VCC + 0.3 V
Maximum Ratings
Current into Outputs (LOW) ........................................ 20 mA
Exceeding maximum ratings may impair the useful life of the
device. These user guidelines are not tested.
Static Discharge Voltage
(MIL-STD-883, Method 3015) ................................. > 2001 V
Storage Temperature ............................... –65 C to +150 C
Latch Up Current ................................................... > 200 mA
Ambient Temperature with
Power Applied ......................................... –55 C to +125 C
Operating Range
Supply Voltage on
VCC Relative to GND [2] ...............................–0.3 V to +4.6 V
DC Voltage Applied to Outputs
in High Z State [2] ................................ –0.3 V to VCC + 0.3 V
Range
Ambient Temperature (TA)
VCC
Automotive-E
–40 C to +125 C
3.3 V  10%
Electrical Characteristics
Over the Operating Range
Parameter
Description
Test Conditions
VOH
Output HIGH Voltage
VCC = Min, IOH = –4.0 mA
VCC = Min, IOL = 8.0 mA
-12
Min
Max
2.4
–
Unit
V
VOL
Output LOW Voltage
–
0.4
V
VIH
Input HIGH Voltage
2.0
VCC + 0.3
V
VIL
Input LOW Voltage [2]
–0.3
0.8
V
IIX
Input Leakage Current
GND < VI < VCC
–12
+12
A
I/OZ
Output Leakage Current
GND < VI < VCC, Output disabled
–12
+12
A
ICC
VCC Operating Supply Current
VCC = Max, IOUT = 0 mA,
f = fMAX = 1/tRC
–
90
mA
ISB1
Automatic CE Power Down
Current — TTL Inputs
Max VCC, CE > VIH
VIN > VIH or VIN < VIL, f = fMAX
–
20
mA
ISB2
Automatic CE Power Down
Current — CMOS Inputs
Max VCC, CE > VCC – 0.3 V,
VIN > VCC – 0.3 V, or VIN < 0.3 V, f = 0
–
10
mA
Note
2. VIL(min) = –2.0 V and VIH(max) = VCC + 0.5 V for pulse durations of less than 20 ns.
Document Number: 001-82303 Rev. *B
Page 4 of 14
CY7C10212CV33
Capacitance
Parameter [3]
Description
CIN
Input Capacitance
COUT
Output Capacitance
Test Conditions
Max
Unit
8
pF
8
pF
Test Conditions
48-ball FBGA
Unit
Test conditions follow standard test methods and
procedures for measuring thermal impedance, per
EIA/JESD51
95.32
C/W
10.68
C/W
TA = 25 C, f = 1 MHz, VCC = 3.3 V
Thermal Resistance
Parameter [3]
Description
JA
Thermal resistance
(junction to ambient)
JC
Thermal resistance
(junction to case)
AC Test Loads and Waveforms
Figure 2. AC Test Loads and Waveforms [4]
Notes
3. Tested initially and after any design or process changes that may affect these parameters.
4. Speed is tested using the Thevenin load shown in Figure 2 (a). High Z characteristics are tested using the test load shown in Figure 2 (b).
Document Number: 001-82303 Rev. *B
Page 5 of 14
CY7C10212CV33
Switching Characteristics
Over the Operating Range
Parameter [5]
Description
-12
Min
Max
Unit
Read Cycle
tpower[6]
VCC(Typical) to the First Access
100
–
s
tRC
Read Cycle Time
12
–
ns
tAA
Address to Data Valid
–
12
ns
tOHA
Data Hold from Address Change
3
–
ns
tACE
CE LOW to Data Valid
–
12
ns
tDOE
OE LOW to Data Valid
–
6
ns
0
–
ns
–
6
ns
3
–
ns
–
6
ns
tLZOE
OE LOW to Low
Z[7]
Z[7, 8]
tHZOE
OE HIGH to High
tLZCE
CE LOW to Low Z[7]
Z[7, 8]
tHZCE
CE HIGH to High
tPU[9]
tPD[9]
CE LOW to Power Up
0
–
ns
CE HIGH to Power Down
–
12
ns
tDBE
Byte Enable to Data Valid
–
6
ns
tLZBE
Byte Enable to Low Z
0
–
ns
Byte Disable to High Z
–
6
ns
tHZBE
Write
Cycle[10, 11]
tWC
Write Cycle Time
12
–
ns
tSCE
CE LOW to Write End
9
–
ns
tAW
Address Setup to Write End
9
–
ns
tHA
Address Hold from Write End
0
–
ns
tSA
Address Setup to Write Start
0
–
ns
tPWE
WE Pulse Width
8
–
ns
tSD
Data Setup to Write End
6
–
ns
tHD
Data Hold from Write End
0
–
ns
tLZWE
WE HIGH to Low Z[7]
3
–
ns
–
6
ns
8
–
ns
[7, 8]
tHZWE
WE LOW to High Z
tBW
Byte Enable to End of Write
Notes
5. Test conditions assume signal transition time of 3 ns or less, timing reference levels of 1.5 V, and input pulse levels of 0 to 3.0 V.
6. tPOWER gives the minimum amount of time that the power supply is at typical VCC values until the first memory access is performed.
7. At any temperature and voltage condition, tHZCE is less than tLZCE, tHZOE is less than tLZOE, and tHZWE is less than tLZWE for any given device.
8. tHZOE, tHZBE, tHZCE, and tHZWE are specified with a load capacitance of 5 pF as in part (b) of Figure 2 on page 5. Transition is measured 500 mV from steady state
voltage.
9. This parameter is guaranteed by design and is not tested.
10. The internal write time of the memory is defined by the overlap of CE LOW, WE LOW, and BHE/BLE LOW. CE, WE, and BHE/BLE is LOW to initiate a write. The
transition of these signals terminate the write. The input data setup and hold timing is referenced to the leading edge of the signal that terminates the write.
11. The minimum write cycle pulse width for write cycle 3 (WE controlled, OE LOW) should be equal to the sum of tSD and tHZWE.
Document Number: 001-82303 Rev. *B
Page 6 of 14
CY7C10212CV33
Switching Waveforms
Figure 3. Read Cycle No. 1 (Address Transition Controlled) [12, 13]
tRC
RC
ADDRESS
tOHA
DATA OUT
tAA
PREVI/OUS DATA VALID
DATA VALID
Figure 4. Read Cycle No. 2 (OE Controlled) [13, 14]
ADDRESS
tRC
CE
tACE
OE
tHZOE
tDOE
tLZOE
BHE, BLE
tHZCE
tDBE
tLZBE
DATA OUT
HIGH IMPEDANCE
tLZCE
VCC
SUPPLY
CURRENT
tHZBE
DATA VALID
HIGH
IMPEDANCE
tPD
tPU
50%
50%
ICC
ISB
Notes
12. Device is continuously selected. OE, CE, BHE, and/or BLE = VIL.
13. WE is HIGH for read cycle.
14. Address valid prior to or coincident with CE transition LOW.
Document Number: 001-82303 Rev. *B
Page 7 of 14
CY7C10212CV33
Switching Waveforms (continued)
Figure 5. Write Cycle No. 1 (CE Controlled) [15, 16]
tWC
ADDRESS
tSA
tSCE
CE
tAW
tHA
tPWE
WE
t BW
BHE, BLE
tSD
tHD
DATA I/O
Figure 6. Write Cycle No. 2 (BLE or BHE Controlled)
tWC
ADDRESS
BHE, BLE
tSA
tBW
tAW
tHA
tPWE
WE
tSCE
CE
tSD
tHD
DATA I/O
Notes
15. Data I/O is high impedance if OE, BHE, and/or BLE = VIH.
16. If CE goes HIGH simultaneously with WE going HIGH, the output remains in a high impedance state.
Document Number: 001-82303 Rev. *B
Page 8 of 14
CY7C10212CV33
Switching Waveforms (continued)
Figure 7. Write Cycle No. 3 (WE Controlled, OE LOW)
tWC
ADDRESS
tSCE
CE
tAW
tHA
tSA
tPWE
WE
tBW
BHE, BLE
tHZWE
tSD
tHD
DATA I/O
tLZWE
Truth Table
CE
OE
WE
BLE
BHE
H
X
X
X
X
High Z
L
L
H
L
L
L
H
H
L
X
L
I/O0 – I/O7 I/O8 – I/O15
Mode
Power
Standby (ISB)
High Z
Power Down
Data Out
Data Out
Read – All Bits
Active (ICC)
Data Out
High Z
Read – Lower Bits Only
Active (ICC)
L
High Z
Data Out
Read – Upper Bits Only
Active (ICC)
L
L
Data In
Data In
Write – All Bits
Active (ICC)
L
H
Data In
High Z
Write – Lower Bits Only
Active (ICC)
H
L
High Z
Data In
Write – Upper Bits Only
Active (ICC)
L
H
H
X
X
High Z
High Z
Selected, Outputs Disabled
Active (ICC)
L
X
X
H
H
High Z
High Z
Selected, Outputs Disabled
Active (ICC)
Document Number: 001-82303 Rev. *B
Page 9 of 14
CY7C10212CV33
Ordering Information
Speed
(ns)
12
Ordering Code
CY7C10212CV33-12BAXE
Package
Diagram
Package Type
51-85106 48-ball FBGA (Pb-free)
Operating
Range
Automotive-E
Ordering Code Definitions
CY 7 C 1 02 1
2
C V33 - 12 BA
X E
Temperature Range:
E = Automotive-E
Pb-free
Package Type:
BA = 48-ball FBGA
Speed: 12 ns
Voltage range: V33 = 3 V to 3.6 V
Process Technology: C = 0.16 µm Technology
Fixed Value
Data width: 1 = × 16-bits
Density: 02 = 1-Mbit
Family Code: 1 = Fast Asynchronous SRAM family
Technology Code: C = CMOS
Marketing Code: 7 = SRAM
Company ID: CY = Cypress
Document Number: 001-82303 Rev. *B
Page 10 of 14
CY7C10212CV33
Package Diagrams
Figure 8. 48-ball FBGA (7 × 8.5 × 1.2 mm) BA48A Package Outline, 51-85106
51-85106 *G
Document Number: 001-82303 Rev. *B
Page 11 of 14
CY7C10212CV33
Acronyms
Acronym
Document Conventions
Description
Units of Measure
BGA
Ball Grid Array
CE
Chip Enable
°C
degree Celsius
CMOS
Complementary Metal Oxide Semiconductor
µA
microampere
FBGA
Fine-Pitch Ball Grid Array
µs
microsecond
I/O
Input/Output
mA
milliampere
OE
Output Enable
mm
millimeter
SRAM
Static Random Access Memory
mW
milliwatt
TQFP
Thin Quad Flat Pack
MHz
megahertz
TTL
Transistor-Transistor Logic
ns
nanosecond
WE
Write Enable
%
percent
pF
picofarad
V
volt
W
watt
Document Number: 001-82303 Rev. *B
Symbol
Unit of Measure
Page 12 of 14
CY7C10212CV33
Document History Page
Document Title: CY7C10212CV33, 1-Mbit (64 K × 16) Static RAM
Document Number: 001-82303
Rev.
ECN No.
Submission
Date
Orig. of
Change
**
3723052
10/29/2012
TAVA
New data sheet.
*A
4178071
10/30/2013
VINI
Updated in new template.
Completing Sunset Review.
*B
4571877
11/18/2014
VINI
Added related documentation hyperlink in page 1.
Added Note 11 in Switching Characteristics. Added note reference 11 in the
Switching Characteristics table.
Updatd Figure 7 title.
Document Number: 001-82303 Rev. *B
Description of Change
Page 13 of 14
CY7C10212CV33
Sales, Solutions, and Legal Information
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© Cypress Semiconductor Corporation, 2012-2014. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use of
any circuitry other than circuitry embodied in a Cypress product. Nor does it convey or imply any license under patent or other rights. Cypress products are not warranted nor intended to be used for
medical, life support, life saving, critical control or safety applications, unless pursuant to an express written agreement with Cypress. Furthermore, Cypress does not authorize its products for use as
critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress products in life-support systems
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and compile the Cypress Source Code and derivative works for the sole purpose of creating custom software and or firmware in support of licensee product to be used only in conjunction with a Cypress
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Disclaimer: CYPRESS MAKES NO WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, WITH REGARD TO THIS MATERIAL, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES
OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE. Cypress reserves the right to make changes without further notice to the materials described herein. Cypress does not
assume any liability arising out of the application or use of any product or circuit described herein. Cypress does not authorize its products for use as critical components in life-support systems where
a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress’ product in a life-support systems application implies that the manufacturer
assumes all risk of such use and in doing so indemnifies Cypress against all charges.
Use may be limited by and subject to the applicable Cypress software license agreement.
Document Number: 001-82303 Rev. *B
Revised November 18, 2014
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Page 14 of 14