CY7C1049DV33 4-Mbit (512 K × 8) Static RAM Datasheet.pdf

CY7C1049DV33
4-Mbit (512 K × 8) Static RAM
4-Mbit (512 K × 8) Static RAM
Features
Functional Description
■
Pin and function compatible with CY7C1049CV33
The CY7C1049DV33 is a high performance CMOS Static RAM
organized as 512K words by 8-bits. Easy memory expansion is
provided by an Active LOW Chip Enable (CE), an Active LOW
Output Enable (OE), and tristate drivers. You can write to the
device by taking Chip Enable (CE) and Write Enable (WE) inputs
LOW. Data on the eight I/O pins (IO0 through IO7) is then written
into the location specified on the address pins (A0 through A18).
■
High speed
❐ tAA = 10 ns
■
Low active power
❐ ICC = 90 mA at 10 ns
■
Low CMOS standby power
❐ ISB2 = 10 mA
■
2.0 V data retention
■
Automatic power down when deselected
■
TTL compatible inputs and outputs
■
Easy memory expansion with CE and OE features
■
Available in Pb-free 36-pin (400 Mil) molded SOJ and 44-pin
TSOP II packages
You can read from the device by taking Chip Enable (CE) and
Output Enable (OE) LOW while forcing Write Enable (WE) HIGH.
Under these conditions, the contents of the memory location
specified by the address pins appear on the I/O pins.
The eight input or output pins (IO0 through IO7) are placed in a
high impedance state when the device is deselected (CE HIGH),
the outputs are disabled (OE HIGH), or during a write operation
(CE LOW, and WE LOW).
The CY7C1049DV33 is available in standard 400 Mil wide 36
-pin SOJ package and 44-pin TSOP II package with center
power and ground (revolutionary) pinout.
For a complete list of related documentation, click here.
Logic Block Diagram
IO0
INPUT BUFFER
IO1
512K x 8
ARRAY
IO3
IO4
IO5
IO6
CE
COLUMN DECODER
WE
IO7
POWER
DOWN
A11
A12
A13
A14
A15
A16
A17
A18
OE
Cypress Semiconductor Corporation
Document Number: 38-05475 Rev. *I
IO2
SENSE AMPS
ROW DECODER
A0
A1
A2
A3
A4
A5
A6
A7
A8
A9
A10
•
198 Champion Court
•
San Jose, CA 95134-1709
•
408-943-2600
Revised November 20, 2014
CY7C1049DV33
Contents
Pin Configuration ............................................................. 3
Selection Guide ................................................................ 3
Maximum Ratings ............................................................. 4
Operating Range ............................................................... 4
Electrical Characteristics ................................................. 4
Capacitance ...................................................................... 4
Thermal Resistance .......................................................... 5
AC Test Loads and Waveforms ....................................... 5
Data Retention Characteristics ....................................... 5
AC Switching Characteristics ......................................... 6
Switching Waveforms ...................................................... 7
Truth Table ........................................................................ 9
Document Number: 38-05475 Rev. *I
Ordering Information ........................................................ 9
Ordering Code Definitions ........................................... 9
Package Diagrams .......................................................... 10
Acronyms ........................................................................ 12
Document Conventions ................................................. 12
Units of Measure ....................................................... 12
Document History Page ................................................. 13
Sales, Solutions, and Legal Information ...................... 14
Worldwide Sales and Design Support ....................... 14
Products .................................................................... 14
PSoC Solutions ......................................................... 14
Page 2 of 14
CY7C1049DV33
Pin Configuration
44-pin TSOP II
Top View
36-pin SOJ
Top View
A0
A1
A2
A3
A4
CE
IO0
IO1
VCC
GND
IO2
IO3
WE
A5
A6
A7
A8
A9
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
36
35
34
33
32
31
30
29
28
27
26
25
24
23
22
21
20
19
NC
A18
A17
A16
A15
OE
IO7
IO6
GND
VCC
IO5
IO4
A14
A13
A12
A11
A10
NC
NC
NC
A0
A1
A2
A3
A4
CE
IO0
IO1
VCC
VSS
IO2
IO3
WE
A5
A6
A7
A8
A9
NC
NC
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
24
23
NC
NC
NC
A18
A17
A16
A15
OE
IO7
IO6
VSS
VCC
IO5
IO4
A14
A13
A12
A11
A10
NC
NC
NC
Selection Guide
Description
-10 (Industrial)
Unit
Maximum access time
10
ns
Maximum operating current
90
mA
Maximum CMOS standby current
10
mA
Document Number: 38-05475 Rev. *I
Page 3 of 14
CY7C1049DV33
DC input voltage[1] .............................. –0.3 V to VCC + 0.3 V
Maximum Ratings
Exceeding the maximum ratings may impair the useful life of the
device. User guidelines are not tested.
Current into outputs (LOW) ........................................ 20 mA
Static discharge voltage .......................................... > 2001 V
Storage temperature ................................ –65 C to +150 C
(MIL-STD-883, Method 3015)
Ambient temperature with
power applied .......................................... –55 C to +125 C
Latch up current ..................................................... > 200 mA
Operating Range
Supply voltage on
VCC to relative GND[1] .................................–0.3 V to +4.6 V
Ambient
Temperature
Range
DC voltage applied to outputs
in High Z State[1] ................................. –0.3 V to VCC + 0.3 V
Industrial
VCC
Speed
–40 C to +85 C 3.3 V  0.3 V
10 ns
Electrical Characteristics
Over the Operating Range
-10 (Industrial)
Parameter
Description
Test Conditions
VOH
Output HIGH voltage
VCC = Min, IOH = –4.0 mA
VOL
Output LOW voltage
VCC = Min, IOL = 8.0 mA
VIH[1]
Input HIGH voltage
voltage[1]
Min
Max
Unit
2.4
–
V
–
0.4
V
2.0
VCC + 0.3
V
–0.3
0.8
V
VIL[1]
Input LOW
IIX
Input leakage current
GND < VI < VCC
–1
+1
A
IOZ
Output leakage current
GND < VOUT < VCC,
Output Disabled
–1
+1
A
ICC
VCC operating supply current VCC = Max,
f = fMAX = 1/tRC
100 MHz
–
90
mA
83 MHz
–
80
mA
66 MHz
–
70
mA
40 MHz
–
60
mA
ISB1
Automatic CE
Power down current
—TTL Inputs
Max VCC, CE > VIH; VIN > VIH or
VIN < VIL, f = fMAX
–
20
mA
ISB2
Automatic CE
Power down current
—CMOS Inputs
Max VCC, CE > VCC – 0.3 V,
VIN > VCC – 0.3 V, or VIN < 0.3 V,
f=0
–
10
mA
Capacitance
Tested initially and after any design or process changes that may affect these parameters.
Parameter
Description
CIN
Input capacitance
COUT
I/O capacitance
Test Conditions
TA = 25 C, f = 1 MHz, VCC = 3.3 V
Max
Unit
8
pF
8
pF
Note
1. VIL (min.) = –2.0 V and VIH(max) = VCC + 2 V for pulse durations of less than 20 ns.
Document Number: 38-05475 Rev. *I
Page 4 of 14
CY7C1049DV33
Thermal Resistance
Tested initially and after any design or process changes that may affect these parameters.
Parameter
Description
JA
Thermal resistance
(Junction to Ambient)
JC
Thermal resistance
(Junction to Case)
36-pin SOJ
Package
Test Conditions
Still Air, soldered on a 3 × 4.5 inch, two layer printed
circuit board
44-pin TSOP II
Package
Unit
57.91
50.66
C/W
36.73
17.17
C/W
AC Test Loads and Waveforms
Figure 1. AC Test Loads and Waveforms [4]
10 ns device
Z = 50 
ALL INPUT PULSES
3.0 V
90%
OUTPUT
50 
* CAPACITIVE LOAD CONSISTS
OF ALL COMPONENTS OF THE
TEST ENVIRONMENT
30 pF*
GND
90%
10%
10%
1.5 V
Rise Time: 1 V/ns
(a)
High Z characteristics:
(b)
Fall Time: 1 V/ns
R 317
3.3 V
OUTPUT
R2
351
5 pF
(c)
Data Retention Characteristics
Over the Operating Range
Parameter
Conditions [4]
Description
VDR
VCC for data retention
ICCDR
Data retention current
VCC = VDR = 2.0 V, CE > VCC – 0.3 V
Min
Max
Unit
2.0
–
V
–
10
mA
0
–
ns
tRC
–
ns
VIN > VCC – 0.3 V or VIN < 0.3 V
tCDR[2]
tR
Chip deselect to data retention time
[5]
Operation recovery time
Figure 2. Data Retention Waveform
DATA RETENTION MODE
VCC
3.0V
tCDR
VDR > 2V
3.0V
tR
CE
Notes
2. Tested initially and after any design or process changes that may affect these parameters.
3. AC characteristics (except High Z) are tested using the load conditions shown in Figure 1 (a). High Z characteristics are tested for all speeds using the test load shown
in Figure 1 (c).
4. No input may exceed VCC + 0.3 V.
5. Full device operation requires linear VCC ramp from VDR to VCC(min.) > 50 s or stable at VCC(min.) > 50 s.
Document Number: 38-05475 Rev. *I
Page 5 of 14
CY7C1049DV33
AC Switching Characteristics
Over the Operating Range [6]
-10 (Industrial)
Parameter
Description
Min
Max
Unit
Read Cycle
tpower[7]
VCC (typical) to the first access
100
–
s
tRC
Read cycle time
10
–
ns
tAA
Address to data valid
–
10
ns
tOHA
Data hold from address change
3
–
ns
tACE
CE LOW to data valid
–
10
ns
tDOE
OE LOW to data valid
–
5
ns
tLZOE
OE LOW to Low Z[8]
0
–
ns
–
5
ns
ns
ns
tHZOE
OE HIGH to High
Z[8, 9]
Z[8]
tLZCE
CE LOW to Low
3
–
tHZCE
CE HIGH to High Z[8, 9]
–
5
tPU
CE LOW to power up
0
–
ns
tPD
CE HIGH to power down
–
10
ns
tWC
Write cycle time
10
–
ns
Write Cycle[10, 11]
tSCE
CE LOW to write end
7
–
ns
tAW
Address setup to write end
7
–
ns
tHA
Address hold from write end
0
–
ns
tSA
Address setup to write start
0
–
ns
ns
tPWE
WE pulse width
7
–
tSD
Data setup to write end
5
–
ns
tHD
Data hold from write end
tLZWE
tHZWE
0
–
ns
WE HIGH to Low
Z[8]
3
–
ns
WE LOW to High
Z[8, 9]
–
5
ns
Notes
6. Test conditions assume signal transition time of 3 ns or less, timing reference levels of 1.5 V, input pulse levels of 0 to 3.0 V, and output loading of the specified IOL/IOH
and 30 pF load capacitance.
7. tPOWER gives the minimum amount of time that the power supply must be at stable, typical VCC values until the first memory access is performed.
8. At any temperature and voltage condition, tHZCE is less than tLZCE, tHZOE is less than tLZOE, and tHZWE is less than tLZWE for any given device.
9. tHZOE, tHZCE, and tHZWE are specified with a load capacitance of 5 pF as in part (c) of Figure 1 on page 5. Transition is measured when the outputs enter a high impedance state.
10. The internal write time of the memory is defined by the overlap of CE LOW, and WE LOW. CE and WE must be LOW to initiate a write, and the transition of either of these signals
can terminate the write. The input data set up and hold timing must be referred to the leading edge of the signal that terminates the write.
11. The minimum write cycle time for Write Cycle No. 2 (WE controlled, OE LOW) is the sum of tHZWE and tSD.
Document Number: 38-05475 Rev. *I
Page 6 of 14
CY7C1049DV33
Switching Waveforms
Figure 3. Read Cycle No. 1[12, 13]
tRC
ADDRESS
tOHA
DATA I/O
tAA
PREVIOUS DATA VALID
DATAOUT VALID
Figure 4. Read Cycle No. 2 (OE Controlled)[13, 14]
ADDRESS
tRC
CE
tACE
OE
tHZOE
tDOE
DATA I/O
tHZCE
tLZOE
HIGH IMPEDANCE
DATAOUT VALID
tLZCE
tPD
tPU
VCC
SUPPLY
CURRENT
HIGH
IMPEDANCE
50%
50%
ICC
ISB
Figure 5. Write Cycle No. 1 (WE Controlled, OE HIGH During
Write)[15, 16]
tWC
ADDRESS
tSCE
CE
tAW
tSA
tHA
tPWE
WE
OE
tSD
DATA I/O
tHD
DATAIN VALID
NOTE 16
tHZOE
Notes
12. Device is continuously selected. OE, CE = VIL.
13. WE is HIGH for read cycle.
14. Address valid prior to or coincident with CE transition LOW.
15. Data I/O is high impedance if OE = VIH.
16. If CE goes HIGH simultaneously with WE going HIGH, the output remains in a high impedance state.
Document Number: 38-05475 Rev. *I
Page 7 of 14
CY7C1049DV33
Switching Waveforms (continued)
Figure 6. Write Cycle No. 2 (WE Controlled, OE LOW)[17]
tWC
ADDRESS
tSCE
CE
tAW
tSA
tHA
tPWE
WE
tSD
DATA I/O
NOTE 18
tHD
DATAIN VALID
tLZWE
tHZWE
Figure 7. Write Cycle No. 3 (CE Controlled)[17, 19]
tWC
ADDRESS
tSCE
CE
tSA
tSCE
tAW
tHA
tPWE
WE
tSD
DATA I/O
tHD
DATAIN VALID
Notes
17. If CE goes HIGH simultaneously with WE going HIGH, the output remains in a high impedance state.
18. During this period the I/Os are in the output state and input signals must not be applied.
19. Data I/O is high impedance if OE = VIH.
Document Number: 38-05475 Rev. *I
Page 8 of 14
CY7C1049DV33
Truth Table
CE
H
OE
X
WE
X
L
L
H
IO0–IO7
Mode
Power
High Z
Power down
Standby (ISB)
Data Out
Read
Active (ICC)
L
X
L
Data In
Write
Active (ICC)
L
H
H
High Z
Selected, Outputs Disabled
Active (ICC)
Ordering Information
Speed
(ns)
10
Ordering Code
Package
Name
Package Type
CY7C1049DV33-10VXI
51-85090 36-pin (400-Mil) Molded SOJ (Pb-free)
CY7C1049DV33-10ZSXI
51-85087 44-pin TSOP II (Pb-free)
Operating
Range
Industrial
Contact your local Cypress sales representative for availability of these parts.
Ordering Code Definitions
CY 7 C 1 04 9
D V33 - XX XX
X X
Temperature Range: X = I
I = Industrial
Pb-free
Package Type: XX = V or ZS
V = 36-pin (400-Mil) Molded SOJ
ZS = 44-pin TSOP II
Speed: XX = 10 ns
V33 = Voltage range (3 V to 3.6 V)
D = C9, 90 nm Technology
9 = Data width × 8-bits
04 = 4-Mbit density
1 = Fast Asynchronous SRAM family
Technology Code: C = CMOS
7 = SRAM
CY = Cypress
Document Number: 38-05475 Rev. *I
Page 9 of 14
CY7C1049DV33
Package Diagrams
Figure 8. 36-pin (400-Mil) Molded SOJ V36.4, (51-85090)
51-85090 *F
Document Number: 38-05475 Rev. *I
Page 10 of 14
CY7C1049DV33
Package Diagrams (continued)
Figure 9. 44-pin TSOP Z44-II, (51-85087)
51-85087 *E
Document Number: 38-05475 Rev. *I
Page 11 of 14
CY7C1049DV33
Acronyms
Acronym
Document Conventions
Description
Units of Measure
CE
chip enable
CMOS
complementary metal oxide semiconductor
°C
degree Celcius
I/O
input/output
MHz
megahertz
OE
output enable
µA
microamperes
SOJ
small outline J-lead
µs
microseconds
SRAM
static random access memory
mA
milliamperes
TSOP
thin small outline package
mm
millimeter
TTL
transistor-transistor logic
ms
milliseconds
WE
write enable
ns
nanoseconds

ohms
%
percent
pF
pico Farad
V
Volts
W
Watts
Document Number: 38-05475 Rev. *I
Symbol
Unit of Measure
Page 12 of 14
CY7C1049DV33
Document History Page
Document Title: CY7C1049DV33, 4-Mbit (512 K × 8) Static RAM
Document Number: 38-05475
REV.
ECN NO. Issue Date
Orig. of
Change
Description of Change
**
201560
See ECN
SWI
Advance Datasheet for C9 IPP
*A
233729
See ECN
SYT
1.AC, DC parameters are modified as per EROS (Specification # 01-2165)
2.Pb-free offering in the Ordering Information Table
*B
351096
See ECN
PCI
Changed from Advance to Preliminary
Removed 20 ns Speed bin
Corrected DC voltage (min) value in maximum ratings section from - 0.5 to - 0.3V
Redefined ICC values for Com’l and Ind’l temperature ranges
ICC (Com’l): Changed from 100, 80, and 67 mA to 90, 80 and, 75 mA for 8, 10, and
12ns speed bins respectively
ICC (Ind’l): Changed from 80 and 67 mA to 90 and 85 mA for 10 and 12ns speed
bins respectively
Added VIH(max) specification in Note# 2
Changed reference voltage level for measurement of High Z parameters from 500
mV to 200 mV
Added Data Retention Characteristics, Waveform, and footnotes 11 and 12
Changed Package Diagram name from 44-pin TSOP II Z44 to 44-pin TSOP II ZS44
Changed part names from Z to ZS in the Ordering Information Table
Added 8 ns parts in the Ordering Information Table
Added Pb-free Ordering Information
Shaded Ordering Information Table
*C
446328
See ECN
NXR
Converted from Preliminary to Final
Removed -8 speed bin
Removed Commercial Operating Range product information
Added Automotive Operating Range product information
Updated Thermal Resistance table
Updated footnote #8 on High Z parameter measurement
Replaced Package Name column with Package Diagram in the Ordering Information table
*D
1274726
See ECN VKN/AESA Corrected typo in the 44-Pin TSOP II pinout
*E
2899972
03/29/2010
AJU
*F
3059162
10/14/2010
PRAS
Added Ordering Code Definitions.
Updated Package Diagrams.
*G
3266084
05/28/2011
PRAS
Updated Functional Description (Removed “Refer to the Cypress application note
AN1064, SRAM System Guidelines for best practice recommendations.”).
Added Acronyms and Units of Measure.
Updated in new template.
*H
3440302
11/16/2011
TAVA
Removed automotive part information from the datasheet.
Updated read and write waveforms.
*I
4574311
11/19/2014
TAVA
Added related documentation hyperlink in page 1.
Updated Figure 8 in Package Diagrams (spec 51-85090 *E to *F).
Document Number: 38-05475 Rev. *I
Updated Package Diagrams.
Page 13 of 14
CY7C1049DV33
Sales, Solutions, and Legal Information
Worldwide Sales and Design Support
Cypress maintains a worldwide network of offices, solution centers, manufacturer’s representatives, and distributors. To find the office
closest to you, visit us at Cypress Locations.
Products
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© Cypress Semiconductor Corporation, 2004-2014. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use of
any circuitry other than circuitry embodied in a Cypress product. Nor does it convey or imply any license under patent or other rights. Cypress products are not warranted nor intended to be used for
medical, life support, life saving, critical control or safety applications, unless pursuant to an express written agreement with Cypress. Furthermore, Cypress does not authorize its products for use as
critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress products in life-support systems
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United States copyright laws and international treaty provisions. Cypress hereby grants to licensee a personal, non-exclusive, non-transferable license to copy, use, modify, create derivative works of,
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the express written permission of Cypress.
Disclaimer: CYPRESS MAKES NO WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, WITH REGARD TO THIS MATERIAL, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES
OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE. Cypress reserves the right to make changes without further notice to the materials described herein. Cypress does not
assume any liability arising out of the application or use of any product or circuit described herein. Cypress does not authorize its products for use as critical components in life-support systems where
a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress’ product in a life-support systems application implies that the manufacturer
assumes all risk of such use and in doing so indemnifies Cypress against all charges.
Use may be limited by and subject to the applicable Cypress software license agreement.
Document Number: 38-05475 Rev. *I
Revised November 20, 2014
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Page 14 of 14