ATMEL AT28HC64BF

Features
• Fast Read Access Time – 70 ns
• Automatic Page Write Operation
– Internal Address and Data Latches for 64 Bytes
• Fast Write Cycle Times
•
•
•
•
•
•
•
•
•
– Page Write Cycle Time: 2 ms Maximum (Standard)
– 1 to 64-byte Page Write Operation
Low Power Dissipation
– 40 mA Active Current
– 100 µA CMOS Standby Current
Hardware and Software Data Protection
DATA Polling and Toggle Bit for End of Write Detection
High Reliability CMOS Technology
– Endurance: 100,000 Cycles
– Data Retention: 10 Years
Single 5 V ±10% Supply
CMOS and TTL Compatible Inputs and Outputs
JEDEC Approved Byte-wide Pinout
Industrial Temperature Ranges
Green (Pb/Halide-free) Packaging Only
64K (8K x 8)
High Speed
Parallel
EEPROM with
Page Write and
Software Data
Protection
1. Description
The AT28HC64BF is a high-performance electrically-erasable and programmable
read-only memory (EEPROM). Its 64K of memory is organized as 8,192 words by 8
bits. Manufactured with Atmel’s advanced nonvolatile CMOS technology, the device
offers access times to 55 ns with power dissipation of just 220 mW. When the device
is deselected, the CMOS standby current is less than 100 µA.
AT28HC64BF
The AT28HC64BF is accessed like a Static RAM for the read or write cycle without the
need for external components. The device contains a 64-byte page register to allow
writing of up to 64 bytes simultaneously. During a write cycle, the addresses and 1 to
64 bytes of data are internally latched, freeing the address and data bus for other
operations. Following the initiation of a write cycle, the device will automatically write
the latched data using an internal control timer. The end of a write cycle can be
detected by DATA polling of I/O7. Once the end of a write cycle has been detected, a
new access for a read or write can begin.
Atmel’s AT28HC64BF has additional features to ensure high quality and manufacturability. The device utilizes internal error correction for extended endurance and
improved data retention characteristics. An optional software data protection mechanism is available to guard against inadvertent writes. The device also includes an
extra 64 bytes of EEPROM for device identification or tracking.
3648B–PEEPR–4/09
2. Pin Configurations
32-lead PLCC Top View
A0 - A12
Addresses
CE
Chip Enable
OE
Output Enable
WE
Write Enable
I/O0 - I/O7
Data Inputs/Outputs
NC
No Connect
DC
Don’t Connect
A6
A5
A4
A3
A2
A1
A0
NC
I/O0
5
6
7
8
9
10
11
12
13
29
28
27
26
25
24
23
22
21
14
15
16
17
18
19
20
Function
A8
A9
A11
NC
OE
A10
CE
I/O7
I/O6
I/O1
I/O2
GND
DC
I/O3
I/O4
I/O5
Pin Name
4
3
2
1
32
31
30
A7
A12
NC
DC
VCC
WE
NC
2.2
Note:
2.1
28-lead SOIC Top View
NC
A12
A7
A6
A5
A4
A3
A2
A1
A0
I/O0
I/O1
I/O2
GND
2
PLCC package pins 1 and 17 are Don’t Connect.
1
2
3
4
5
6
7
8
9
10
11
12
13
14
28
27
26
25
24
23
22
21
20
19
18
17
16
15
VCC
WE
NC
A8
A9
A11
OE
A10
CE
I/O7
I/O6
I/O5
I/O4
I/O3
AT28HC64BF
3648B–PEEPR–4/09
AT28HC64BF
3. Block Diagram
DATA INPUTS/OUTPUTS
I/O0 - I/O7
VCC
GND
OE
WE
OE, CE and WE
LOGIC
CE
Y DECODER
ADDRESS
INPUTS
DATA LATCH
INPUT/OUTPUT
BUFFERS
Y-GATING
CELL MATRIX
X DECODER
IDENTIFICATION
4. Device Operation
4.1
Read
The AT28HC64BF is accessed like a Static RAM. When CE and OE are low and WE is high, the
data stored at the memory location determined by the address pins is asserted on the outputs.
The outputs are put in the high-impedance state when either CE or OE is high. This dual line
control gives designers flexibility in preventing bus contention in their systems.
4.2
Byte Write
A low pulse on the WE or CE input with CE or WE low (respectively) and OE high initiates a write
cycle. The address is latched on the falling edge of CE or WE, whichever occurs last. The data is
latched by the first rising edge of CE or WE. Once a byte write has been started, it will automatically time itself to completion. Once a programming operation has been initiated and for the
duration of tWC, a read operation will effectively be a polling operation.
4.3
Page Write
The page write operation of the AT28HC64BF allows 1 to 64 bytes of data to be written into the
device during a single internal programming period. A page write operation is initiated in the
same manner as a byte write; after the first byte is written, it can then be followed by 1 to 63
additional bytes. Each successive byte must be loaded within 150 µs (tBLC) of the previous byte.
If the tBLC limit is exceeded, the AT28HC64BF will cease accepting data and commence the
internal programming operation. All bytes during a page write operation must reside on the same
page as defined by the state of the A6 to A12 inputs. For each WE high-to-low transition during
the page write operation, A6 to A12 must be the same.
The A0 to A5 inputs specify which bytes within the page are to be written. The bytes may be
loaded in any order and may be altered within the same load period. Only bytes which are specified for writing will be written; unnecessary cycling of other bytes within the page does not occur.
4.4
DATA Polling
The AT28HC64BF features DATA Polling to indicate the end of a write cycle. During a byte or
page write cycle, an attempted read of the last byte written will result in the complement of the
written data to be presented on I/O7. Once the write cycle has been completed, true data is valid
on all outputs, and the next write cycle may begin. DATA Polling may begin at any time during
the write cycle.
3
3648B–PEEPR–4/09
4.5
Toggle Bit
In addition to DATA Polling, the AT28HC64BF provides another method for determining the end
of a write cycle. During the write operation, successive attempts to read data from the device will
result in I/O6 toggling between one and zero. Once the write has completed, I/O6 will stop toggling, and valid data will be read. Toggle bit reading may begin at any time during the write cycle.
4.6
Data Protection
If precautions are not taken, inadvertent writes may occur during transitions of the host system
power supply. Atmel® has incorporated both hardware and software features that will protect the
memory against inadvertent writes.
4.6.1
Hardware Protection
Hardware features protect against inadvertent writes to the AT28HC64BF in the following ways:
(a) VCC sense – if VCC is below 3.8 V (typical), the write function is inhibited; (b) VCC power-on
delay – once VCC has reached 3.8 V, the device will automatically time out 5 ms (typical) before
allowing a write; (c) write inhibit – holding any one of OE low, CE high or WE high inhibits write
cycles; and (d) noise filter – pulses of less than 15 ns (typical) on the WE or CE inputs will not initiate a write cycle.
4.6.2
Software Data Protection
A software-controlled data protection feature has been implemented on the AT28HC64BF.
When enabled, the software data protection (SDP), will prevent inadvertent writes. The SDP feature may be enabled or disabled by the user; the AT28HC64BF is shipped from Atmel with SDP
disabled.
SDP is enabled by the user issuing a series of three write commands in which three specific
bytes of data are written to three specific addresses (refer to the “Software Data Protection Algorithm” diagram on page 10). After writing the 3-byte command sequence and waiting tWC, the
entire AT28HC64BF will be protected against inadvertent writes. It should be noted that even
after SDP is enabled, the user may still perform a byte or page write to the AT28HC64BF. This is
done by preceding the data to be written by the same 3-byte command sequence used to enable
SDP.
Once set, SDP remains active unless the disable command sequence is issued. Power transitions do not disable SDP, and SDP protects the AT28HC64BF during power-up and powerdown conditions. All command sequences must conform to the page write timing specifications.
The data in the enable and disable command sequences is not actually written into the device;
their addresses may still be written with user data in either a byte or page write operation.
After setting SDP, any attempt to write to the device without the 3-byte command sequence will
start the internal write timers. No data will be written to the device, however. For the duration of
tWC, read operations will effectively be polling operations.
4.7
Device Identification
An extra 64 bytes of EEPROM memory are available to the user for device identification. By raising A9 to 12 V ±0.5 V and using address locations 1FC0H to 1FFFH, the additional bytes may
be written to or read from in the same manner as the regular memory array.
4
AT28HC64BF
3648B–PEEPR–4/09
AT28HC64BF
5. DC and AC Operating Range
Operating Temperature (Case)
AT28HC64BF-70
AT28HC64BF-90
AT28HC64BF-120
-40°C - 85°C
-40°C - 85°C
-40°C - 85°C
5 V ±10%
5 V ±10%
5 V ±10%
VCC Power Supply
6. Operating Modes
Mode
CE
OE
WE
I/O
Read
VIL
VIL
VIH
DOUT
Write(2)
VIL
VIH
VIL
DIN
High Z
Standby/Write Inhibit
(1)
VIH
X
X
Write Inhibit
X
X
VIH
Write Inhibit
X
VIL
X
Output Disable
X
VIH
X
High Z
VIL
High Z
Chip Erase
Notes:
VH
VIL
(3)
1. X can be VIL or VIH.
2. See “AC Write Waveforms” on page 8.
3. VH = 12.0 V ±0.5 V.
7. Absolute Maximum Ratings*
Temperature Under Bias................................ -55°C to +125°C
*NOTICE:
Storage Temperature ..................................... -65°C to +150°C
All Input Voltages
(including NC Pins)
with Respect to Ground .................................-0.6 V to +6.25 V
All Output Voltages
with Respect to Ground ...........................-0.6 V to VCC + 0.6 V
Stresses beyond those listed under “Absolute
Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and
functional operation of the device at these or any
other conditions beyond those indicated in the
operational sections of this specification is not
implied. Exposure to absolute maximum rating
conditions for extended periods may affect
device reliability
Voltage on OE and A9
with Respect to Ground ..................................-0.6 V to +13.5V
8. DC Characteristics
Symbol
Parameter
Condition
ILI
Input Load Current
ILO
Min
Max
Units
VIN = 0 V to VCC + 1 V
10
µA
Output Leakage Current
VI/O = 0 V to VCC
10
µA
ISB1
VCC Standby Current CMOS
CE = VCC - 0.3 V to VCC + 1 V
100
µA
ISB2
VCC Standby Current TTL
CE = 2.0 V to VCC + 1 V
2
mA
ICC
VCC Active Current
f = 5 MHz; IOUT = 0 mA
40
mA
VIL
Input Low Voltage
0.8
V
VIH
Input High Voltage
VOL
Output Low Voltage
IOL = 2.1 mA
VOH
Output High Voltage
IOH = -400 µA
2.0
V
0.40
2.4
V
V
5
3648B–PEEPR–4/09
9. AC Read Characteristics
AT28HC64BF-70
AT28HC64BF-90
AT28HC64BF-120
Min
Min
Min
Symbol
Parameter
Max
Max
Max
Units
tACC
Address to Output Delay
70
90
120
ns
tCE(1)
CE to Output Delay
70
tOE(2)
90
120
ns
OE to Output Delay
0
35
0
40
tDF(3)(4)
0
50
ns
OE to Output Float
0
35
0
40
0
50
ns
tOH
Output Hold
0
0
0
ns
10. AC Read Waveforms(1)(2)(3)(4)
ADDRESS
ADDRESS VALID
CE
tCE
tOE
OE
tOH
tDF
tACC
OUTPUT
Notes:
HIGH Z
OUTPUT VALID
1. CE may be delayed up to tACC - tCE after the address transition without impact on tACC.
2. OE may be delayed up to tCE - tOE after the falling edge of CE without impact on tCE or by tACC - tOE after an address change
without impact on tACC.
3. tDF is specified from OE or CE whichever occurs first (CL = 5 pF).
4. This parameter is characterized and is not 100% tested.
6
AT28HC64BF
3648B–PEEPR–4/09
AT28HC64BF
11. Input Test Waveforms and Measurement Level
tR, tF < 5 ns
12. Output Test Load
13. Pin Capacitance
f = 1 MHz, T = 25°C(1)
Symbol
CIN
COUT
Note:
Typ
Max
Units
Conditions
4
6
pF
VIN = 0 V
pF
VOUT = 0 V
8
12
1. This parameter is characterized and is not 100% tested.
7
3648B–PEEPR–4/09
14. AC Write Characteristics
Symbol
Parameter
Min
Max
Units
tAS, tOES
Address, OE Setup Time
0
ns
tAH
Address Hold Time
50
ns
tCS
Chip Select Setup Time
0
ns
tCH
Chip Select Hold Time
0
ns
tWP
Write Pulse Width (WE or CE)
100
ns
tDS
Data Setup Time
50
ns
tDH, tOEH
Data, OE Hold Time
0
ns
15. AC Write Waveforms
15.1
WE Controlled
OE
tOES
tOEH
ADDRESS
tAS
CE
tCH
tAH
tCS
WE
tWP
tDS
tDH
DATA IN
15.2
CE Controlled
OE
tOES
tOEH
ADDRESS
tAS
tCH
tAH
WE
tCS
CE
tWP
tDS
tDH
DATA IN
8
AT28HC64BF
3648B–PEEPR–4/09
AT28HC64BF
16. Page Mode Characteristics
Symbol
Parameter
Min
Max
Units
tWC
Write Cycle Time
2
ms
tAS
Address Setup Time
0
ns
tAH
Address Hold Time
50
ns
tDS
Data Setup Time
50
ns
tDH
Data Hold Time
0
ns
tWP
Write Pulse Width
100
ns
tBLC
Byte Load Cycle Time
tWPH
Write Pulse Width High
150
50
µs
ns
17. Page Mode Write Waveforms(1)(2)
OE
CE
WE
tAS
tDH
tAH
A0 -A12
tBLC
tWPH
tWP
VALID ADD
tDS
DATA
VALID DATA
tWC
Notes:
1. A6 through A12 must specify the same page address during each high to low transition of WE (or CE).
2. OE must be high only when WE and CE are both low.
18. Chip Erase Waveforms
tS
tH
tW
tS = tH = 5 µs (min.)
tW = 10 ms (min.)
VH = 12.0 V ±0.5 V
9
3648B–PEEPR–4/09
19. Software Data Protection Enable
Algorithm(1)
Notes:
20. Software Data Protection Disable
Algorithm(1)
LOAD DATA AA
TO
ADDRESS 1555
LOAD DATA AA
TO
ADDRESS 1555
LOAD DATA 55
TO
ADDRESS 0AAA
LOAD DATA 55
TO
ADDRESS 0AAA
LOAD DATA A0
TO
ADDRESS 1555
LOAD DATA 80
TO
ADDRESS 1555
WRITES ENABLED(2)
LOAD DATA XX
TO
ANY ADDRESS(4)
LOAD DATA AA
TO
ADDRESS 1555
LOAD LAST BYTE
TO
LAST ADDRESS
LOAD DATA 55
TO
ADDRESS 0AAA
ENTER DATA
PROTECT STATE
LOAD DATA 20
TO
ADDRESS 1555
1. Data Format: I/O7 - I/O0 (Hex);
Address Format: A12 - A0 (Hex).
2. Write Protect state will be activated at end of write
even if no other data is loaded.
EXIT DATA
PROTECT STATE(3)
LOAD DATA XX
TO
ANY ADDRESS(4)
3. Write Protect state will be deactivated at end of write
period even if no other data is loaded.
LOAD LAST BYTE
TO
LAST ADDRESS
4. 1 to 64 bytes of data are loaded.
Notes:
1. Data Format: I/O7 - I/O0 (Hex);
Address Format: A12 - A0 (Hex).
2. Write Protect state will be activated at end of write
even if no other data is loaded.
3. Write Protect state will be deactivated at end of write
period even if no other data is loaded.
4. 1 to 64 bytes of data are loaded.
21. Software Protected Write Cycle Waveforms(1)(2)
OE
CE
tWPH
tWP
WE
tAS
tAH
tBLC
tDH
A0 -A5
A6 - A12
tDS
DATA
tWC
Notes:
1. A6 through A12 must specify the same page address during each high to low transition of WE (or CE) after the software
code has been entered.
2. OE must be high only when WE and CE are both low.
10
AT28HC64BF
3648B–PEEPR–4/09
AT28HC64BF
22. Data Polling Characteristics(1)
Symbol
Parameter
Min
tDH
Data Hold Time
tOEH
OE Hold Time
Max
OE to Output Delay
tWR
Write Recovery Time
Units
0
ns
0
ns
(1)
tOE
Note:
Typ
ns
0
ns
1. These parameters are characterized and not 100% tested. See “AC Read Characteristics” on page 6.
23. Data Polling Waveforms
tOEH
tDH
tWR
tOE
24. Toggle Bit Characteristics(1)
Symbol
Parameter
Min
tDH
Data Hold Time
tOEH
OE Hold Time
OE to Output Delay
tOEHP
OE High Pulse
tWR
Write Recovery Time
Max
Units
10
ns
10
ns
(2)
tOE
Notes:
Typ
ns
150
ns
0
ns
1. These parameters are characterized and not 100% tested.
2. See “AC Read Characteristics” on page 6.
25. Toggle Bit Waveforms(1)(2)(3)
tOEH
tDH
tOE
(2)
tWR
Notes:
1. Toggling either OE or CE or both OE and CE will operate toggle bit.
2. Beginning and ending state of I/O6 will vary.
3. Any address location may be used, but the address should not vary.
11
3648B–PEEPR–4/09
26. Normalized ICC Graphs
12
AT28HC64BF
3648B–PEEPR–4/09
AT28HC64BF
27. Ordering Information
27.1
Green Package (Pb/Halide-free)
ICC (mA)
tACC
(ns)
Active
Standby
Ordering Code
Package
Operation Range
120
40
0.1
AT28HC64BF-12JU
AT28HC64BF-12SU
32J
28S
Industrial
(-40°C to 85°C)
27.2
Die Products
Contact Atmel Sales in regards to die and wafer sales.
Package Type
32J
32-lead, Plastic J-leaded Chip Carrier (PLCC)
28S
28-lead, 0.300" Wide, Plastic Gull Wing Small Outline (SOIC)
13
3648B–PEEPR–4/09
28. Packaging Information
28.1
32J – PLCC
1.14(0.045) X 45˚
PIN NO. 1
IDENTIFIER
1.14(0.045) X 45˚
0.318(0.0125)
0.191(0.0075)
E1
E
E2
B1
B
e
A2
D1
A1
D
A
0.51(0.020)MAX
45˚ MAX (3X)
COMMON DIMENSIONS
(Unit of Measure = mm)
D2
Notes:
1. This package conforms to JEDEC reference MS-016, Variation AE.
2. Dimensions D1 and E1 do not include mold protrusion.
Allowable protrusion is .010"(0.254 mm) per side. Dimension D1
and E1 include mold mismatch and are measured at the extreme
material condition at the upper or lower parting line.
3. Lead coplanarity is 0.004" (0.102 mm) maximum.
SYMBOL
MIN
NOM
MAX
A
3.175
–
3.556
A1
1.524
–
2.413
A2
0.381
–
–
D
12.319
–
12.573
D1
11.354
–
11.506
D2
9.906
–
10.922
E
14.859
–
15.113
E1
13.894
–
14.046
E2
12.471
–
13.487
B
0.660
–
0.813
B1
0.330
–
0.533
e
NOTE
Note 2
Note 2
1.270 TYP
10/04/01
R
14
2325 Orchard Parkway
San Jose, CA 95131
TITLE
32J, 32-lead, Plastic J-leaded Chip Carrier (PLCC)
DRAWING NO.
REV.
32J
B
AT28HC64BF
3648B–PEEPR–4/09
AT28HC64BF
28.2
28S – SOIC
Dimensions in Millimeters and (Inches).
Controlling dimension: Millimeters.
0.51(0.020)
0.33(0.013)
7.60(0.2992) 10.65(0.419)
7.40(0.2914) 10.00(0.394)
PIN 1
1.27(0.50) BSC
TOP VIEW
18.10(0.7125)
17.70(0.6969)
2.65(0.1043)
2.35(0.0926)
0.30(0.0118)
0.10(0.0040)
SIDE VIEWS
0.32(0.0125)
0.23(0.0091)
0º ~ 8º
1.27(0.050)
0.40(0.016)
8/4/03
R
2325 Orchard Parkway
San Jose, CA 95131
TITLE
28S, 28-lead, 0.300" Body, Plastic Gull Wing Small Outline (SOIC)
JEDEC Standard MS-013
DRAWING NO.
REV.
28S
B
15
3648B–PEEPR–4/09
Headquarters
International
Atmel Corporation
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USA
Tel: 1(408) 441-0311
Fax: 1(408) 487-2600
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Sales Contact
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Product Contact
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Literature Requests
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3648B–PEEPR–4/09