HIGH SPEED-10 MBit/s LOGIC GATE OPTOCOUPLERS HCPL-0600 HCPL-0601 DESCRIPTION The HCPL-0600/0601 optocouplers consist of an AlGaAS LED, optically coupled to a very high speed integrated photo-detector logic gate with a strobable output. The devices are housed in a compact small-outline package. This output features an open collector, thereby permitting wired OR outputs. The coupled parameters are guaranteed over the temperature range of -40°C to +85°C. A maximum input signal of 5 mA will provide a minimum output sink current of 13 mA (fan out of 8). An internal noise shield provides superior common mode rejection of typically 10 kV/µs. FEATURES Compact SO8 package Very high speed-10 MBit/s Superior CMR-10 kV/µs Fan-out of 8 over -40°C to +85°C Logic gate output Strobable output Wired OR-open collector U.L. recognized (File # E90700) PACKAGE DIMENSIONS 0.164 (4.16) 0.144 (3.66) SEATING PLANE • • • • • • • • APPLICATIONS • Ground loop elimination • LSTTL to TTL, LSTTL or 5-volt CMOS • Line receiver, data transmission • Data multiplexing • Switching power supplies • Pulse transformer replacement • Computer-peripheral interface 8 VCC N/C 1 0.202 (5.13) 0.182 (4.63) 0.019 (0.48) 0.010 (0.25) 0.006 (0.16) 0.143 (3.63) 0.123 (3.13) 7 VE + 2 Pin 1 VF _ 6 VO 3 0.021 (0.53) 0.011 (0.28) 5 GND N/C 4 0.244 (6.19) 0.224 (5.69) 0.008 (0.20) 0.003 (0.08) 0.050 (1.27) TYP Lead Coplanarity : 0.004 (0.10) MAX NOTE All dimensions are in inches (millimeters) Single-channel circuit drawing TRUTH TABLE (Positive Logic) Input Enable Output H H L L H H H L H L L H H NC L L NC H A 0.1 µF bypass capacitor must be connected between pins 8 and 5. (See note 1) © 2004 Fairchild Semiconductor Corporation Page 1 of 13 1/7/04 HIGH SPEED-10 MBit/s LOGIC GATE OPTOCOUPLERS HCPL-0600 HCPL-0601 ABSOLUTE MAXIMUM RATINGS (No derating required up to 85°C) Parameter Symbol Value Units Storage Temperature TSTG -40 to +125 °C Operating Temperature TOPR -40 to +85 °C Lead Solder Temperature TSOL 260 for 10 sec °C DC/Average Forward Input Current IF 50 mA Enable Input Voltage Not to exceed VCC by more than 500 mV VE 5.5 V Reverse Input Voltage VR 5.0 V Power Dissipation PI 45 mW Supply Voltage VCC (1 minute max) 7.0 V Output Current IO 50 mA Output Voltage VO 7.0 V Collector Output Power Dissipation PO 85 mW EMITTER DETECTOR RECOMMENDED OPERATING CONDITIONS Parameter Input Current, Low Level Symbol Min Max Units IFL 0 250 µA Input Current, High Level IFH *6.3 15 mA Supply Voltage, Output VCC 4.5 5.5 V Enable Voltage, Low Level VEL 0 0.8 V Enable Voltage, High Level VEH 2.0 VCC V Operating Temperature TA -40 +85 °C Fan Out (TTL load) N 8 *6.3 mA is a guard banded value which allows for at least 20% CTR degradation. Initial input current threshold value is 5.0 mA or less © 2004 Fairchild Semiconductor Corporation Page 2 of 13 1/7/04 HIGH SPEED-10 MBit/s LOGIC GATE OPTOCOUPLERS HCPL-0600 HCPL-0601 ELECTRICAL CHARACTERISTICS (TA = -40°C to +85°C Unless otherwise specified.) INDIVIDUAL COMPONENT CHARACTERISTICS Parameter EMITTER Input Forward Voltage Input Reverse Breakdown Voltage Input Capacitance Input Diode Temperature Coefficient DETECTOR High Level Supply Current Low Level Supply Current Low Level Enable Current High Level Enable Current High Level Enable Voltage Low Level Enable Voltage Test Conditions (IF = 10 mA) TA =25°C (IR = 10 µA) (VF = 0, f = 1 MHz) (IF = 10 mA) (VCC = 5.5 V, IF = 0 mA) (VE = 0.5 V) (VCC = 5.5 V, IF = 10 mA) (VE = 0.5 V) (VCC = 5.5 V, VE = 0.5 V) (VCC = 5.5 V, VE = 2.0 V) (VCC = 5.5 V, IF = 10 mA) (VCC = 5.5 V, IF = 10 mA) (Note 2) Symbol Min Typ** VF BVR CIN ∆VF/∆TA Max Unit 1.8 1.75 V 5.0 V pF mV/°C 60 -1.4 ICCH 7 10 mA ICCL 9 13 mA IEL IEH VEH VEL -0.8 -0.6 -1.6 -1.6 mA mA V V 2.0 0.8 SWITCHING CHARACTERISTICS (TA = -40°C to +85°C, VCC = 5 V, IF = 7.5 mA Unless otherwise specified.) AC Characteristics Test Conditions (Note 3) (TA =25°C) (RL = 350Ω, CL = 15 pF) (Fig. 12) (Note 4) (TA =25°C) Propagation Delay Time to Output Low Level (RL = 350Ω, CL = 15 pF) (Fig. 12) Pulse Width Distortion (RL = 350Ω, CL = 15 pF) (Fig. 12) Output Rise Time (RL = 350Ω, CL = 15 pF) (10-90%) (Note 5) (Fig. 12) Output Fall Time (RL = 350Ω, CL = 15 pF) (Note 6) (Fig. 12) (90-10%) Enable Propagation (IF = 7.5 mA, VEH = 3.5 V) Delay Time (RL = 350Ω, CL = 15 pF) to Output High Level (Note 7) (Fig. 13) Enable Propagation (IF = 7.5 mA, VEH = 3.5 V) Delay Time (RL = 350Ω, CL = 15 pF) to Output Low Level (Note 8) (Fig. 13) Common Mode (RL = 350Ω) (TA =25°C) |VCM| = 10 V (IF = 0 mA, VOH (Min.) = 2.0 V) Transient Immunity (Note 9)(Fig. 14) |VCM| = 50 V (at Output High Level) Common Mode (RL = 350Ω) (TA =25°C) |VCM| = 10 V Transient Immunity (IF = 7.5 mA, VOL (Max.) = 0.8 V) (at Output Low Level) (Note 10)(Fig. 14) |VCM| = 50 V Propagation Delay Time to Output High Level © 2004 Fairchild Semiconductor Corporation Page 3 of 13 Device Symbol All TPLH All TPHL All |TPHL-TPLH| 3 All tr 50 ns All tf 12 ns All tELH 20 ns All tEHL 20 ns HCPL-0600 HCPL-0601 Typ Max 20 45 25 45 75 100 75 100 35 Unit ns ns ns 10,000 |CMH| HCPL-0600 HCPL-0601 Min 5000 10,000 V/µs 10,000 |CMH| 5000 10,000 V/µs 1/7/04 HIGH SPEED-10 MBit/s LOGIC GATE OPTOCOUPLERS HCPL-0600 HCPL-0601 TRANSFER CHARACTERISTICS (TA = -40°C to +85°C Unless otherwise specified.) DC Characteristics Test Conditions Symbol Min Typ** Max Unit 100 µA High Level Output Current (VCC = 5.5 V, VO = 5.5 V) (IF = 250 µA, VE = 2.0 V) (Note 2) IOH Low Level Output Voltage (VCC = 5.5 V, IF = 5 mA) (VE = 2.0 V, IOL = 13 mA) (Note 2) VOL .35 0.6 V (VCC = 5.5 V, VO = 0.6 V, VE = 2.0 V, IOL = 13 mA) IFT 3 5 mA Max Unit 1.0* µA Input Threshold Current ISOLATION CHARACTERISTICS (TA = -40°C to +85°C Unless otherwise specified.) Characteristics Input-Output Insulation Leakage Current Test Conditions (Relative humidity = 45%) (TA = 25°C, t = 5 s) (VI-O = 3000 VDC) (Note 11) Withstand Insulation Test Voltage Resistance (Input to Output) Capacitance (Input to Output) Symbol Min Typ** II-O (RH < 50%, TA = 25°C) (Note 11) ( t = 1 min.) VISO (VI-O = 500 V) (Note 11) RI-O 1012 Ω (f = 1 MHz) (Note 11) CI-O 0.6 pF 2500 VRMS ** All typical values are at VCC = 5 V, TA = 25°C NOTES 1. The VCC supply to each optoisolator must be bypassed by a 0.1µF capacitor or larger. This can be either a ceramic or solid tantalum capacitor with good high frequency characteristic and should be connected as close as possible to the package VCC and GND pins of each device. 2. Enable Input - No pull up resistor required as the device has an internal pull up resistor. 3. tPLH - Propagation delay is measured from the 3.75 mA level on the HIGH to LOW transition of the input current pulse to the 1.5V level on the LOW to HIGH transition of the output voltage pulse. 4. tPHL - Propagation delay is measured from the 3.75 mA level on the LOW to HIGH transition of the input current pulse to the 1.5V level on the HIGH to LOW transition of the output voltage pulse. 5. tr - Rise time is measured from the 90% to the 10% levels on the LOW to HIGH transition of the output pulse. 6. tf - Fall time is measured from the 10% to the 90% levels on the HIGH to LOW transition of the output pulse. 7. tELH - Enable input propagation delay is measured from the 1.5V level on the HIGH to LOW transition of the input voltage pulse to the 1.5V level on the LOW to HIGH transition of the output voltage pulse. 8. tEHL - Enable input propagation delay is measured from the 1.5V level on the LOW to HIGH transition of the input voltage pulse to the 1.5V level on the HIGH to LOW transition of the output voltage pulse. 9. CMH - The maximum tolerable rate of rise of the common mode voltage to ensure the output will remain in the high state (i.e., VOUT > 2.0 V). Measured in volts per microsecond (V/µs). 10. CML - The maximum tolerable rate of fall of the common mode voltage to ensure the output will remain in the low output state (i.e., VOUT < 0.8 V). Measured in volts per microsecond (V/µs). 11. Device considered a two-terminal device: Pins 1,2,3 and 4 shorted together, and Pins 5,6,7 and 8 shorted together. © 2004 Fairchild Semiconductor Corporation Page 4 of 13 1/7/04 HIGH SPEED-10 MBit/s LOGIC GATE OPTOCOUPLERS HCPL-0600 HCPL-0601 TYPICAL PERFORMANCE CURVES Fig. 1 Forward Current vs. Input Forward Voltage Fig. 2 Output Voltage vs. Forward Current 100 6 5 10 Vo - OUTPUT VOLTAGE (V) IF - FORWARD CURRENT (mA) TA = 25¡C VCC = 5V TA = 85°C TA = -40°C TA = 70°C 1 TA = 25°C TA = 0°C 0.1 0.01 4 RL = 350Ω 3 RL = 1kΩ 2 1 0 0.001 0.9 1.0 1.1 1.2 1.3 1.4 1.5 1.6 0 1.7 VF - FORWARD VOLTAGE (V) 2 3 4 5 IF - FORWARD INPUT CURRENT (mA) Fig. 4 High Level Output Current vs. Temperature Fig. 3 Input Threshold Current vs. Temperature 16 IOH - HIGH LEVEL OUTPUT CURRENT (µA) 5 ITH - INPUT THRESHOLD CURRENT (mA) 1 VCC = 5V VO = 0.6V 4 3 RL = 350Ω 2 RL = 1KΩ 1 14 12 10 8 6 4 VO = VCC = 5.5V VE = 2V IF = 250 A 2 0 0 -40 -20 0 20 40 60 80 100 -20 0 20 40 60 80 100 TA - TEMPERATURE (˚C) TA - TEMPERATURE (˚C) © 2004 Fairchild Semiconductor Corporation -40 Page 5 of 13 1/7/04 HIGH SPEED-10 MBit/s LOGIC GATE OPTOCOUPLERS HCPL-0600 HCPL-0601 Fig. 5 Low Level Output Voltage vs. Temperature Fig. 6 Low Level Output Current vs. Temperature 60 0.8 CC = 5.5V IOL - LOW LEVEL OUTPUT CURRENT (mA) VOL - LOW LEVEL OUTPUT VOLTAGE (V) V VE = 2V IF = 5mA 0.7 0.6 0.5 IO = 12.8mA 0.4 IO = 16mA 0.3 IO = 6.4mA 0.2 IO = 9.6mA 0.1 V CC = 5V VE = 2V VOL = 0.6V 55 50 IF = 10-15mA 45 40 IF = 5mA 35 30 25 20 0.0 -40 -20 0 20 40 60 80 -40 100 -20 0 Fig. 7 Propagation Delay vs. Temperature 40 60 80 100 Fig. 8 Propagation Delay vs. Pulse Input Current 100 90 V CC = 5V V TP - PROPAGATION DELAY (ns) IF = 7.5mA 90 TP - PROPAGATION DELAY (ns) 20 TA - TEMPERATURE (˚C) TA - TEMPERATURE (˚C) 80 tPLH RL = 1kΩ 70 60 tPLH RL = 350Ω 50 tPHL RL = 350Ω & 1kΩ 40 CC = 5V TA = 25°C 80 tPLH RL = 1kΩ 70 60 tPLH RL = 350Ω 50 40 tPHL RL = 350Ω & 1kΩ 30 30 20 20 -40 -20 0 20 40 60 80 100 © 2004 Fairchild Semiconductor Corporation 5 7 9 11 13 15 IF - PULSE INPUT CURRENT (mA) TA - TEMPERATURE (˚C) Page 6 of 13 1/7/04 HIGH SPEED-10 MBit/s LOGIC GATE OPTOCOUPLERS HCPL-0600 HCPL-0601 Fig. 9 Typical Enable Propagation Delay vs. Temparature Fig. 10 Typical Rise and Fall Time vs. Temperature 240 90 CC = 5V V VEH = 3V VEL = 0V IF = 7.5mA 80 70 CC = 5V IF = 7.5mA 200 tELH RL = 1kΩ tf - FALL TIME (ns) tE - ENABLE PROPAGATION DELAY (ns) V 60 50 tELH RL = 350Ω 40 30 tr RL = 1kΩ 160 120 80 tr RL = 350Ω tEHL RL = 350Ω & 1kΩ 20 40 tf RL = 350Ω & 1kΩ 10 0 0 -40 -20 0 20 40 60 80 100 -40 -20 TA - TEMPERATURE (˚C) 0 20 40 60 80 100 TA - TEMPERATURE (˚C) Fig. 11 Typical Pulse Width Distortion vs. Temperature 40 PWD - PULSE WIDTH DISTORTION (ns) V CC = 5V IF = 7.5mA 35 30 25 RL = 1kΩ 20 15 10 RL = 350Ω 5 0 -40 -20 0 20 40 60 80 100 TA - TEMPERATURE (˚C) © 2004 Fairchild Semiconductor Corporation Page 7 of 13 1/7/04 HIGH SPEED-10 MBit/s LOGIC GATE OPTOCOUPLERS HCPL-0600 HCPL-0601 Pulse Generator tr = 5ns Z O = 50Ω +5V I F = 7.5 mA 1 VCC I F = 3.75 mA Input (I F) 8 t PHL 2 Input Monitor (I F) 7 .1 f bypass Output (VO ) 6 3 CL 47Ω 4 GND tPLH Output (VO ) RL 1.5 V 90% Output (VO ) 10% 5 tf tr Fig. 12 T Test Circuit and Waveforms for tPLH, tPHL, tr and tf. Pulse Generator tr = 5ns Z O = 50Ω Input Monitor (V E) +5V 3.0 V Input (VE ) VCC 1 8 2 7 1.5 V t EHL 7.5 mA .1µf bypass 1.5 V Output (VO ) 6 3 t ELH Output (VO ) RL CL 4 GND 5 Fig. 13 Test T Circuit tEHL and tELH. © 2004 Fairchild Semiconductor Corporation Page 8 of 13 1/7/04 HIGH SPEED-10 MBit/s LOGIC GATE OPTOCOUPLERS HCPL-0600 HCPL-0601 VCC IF A 1 8 2 7 3 6 +5V .1µf bypass 350Ω B VFF 4 GND Output (VO) 5 VCM Pulse Gen Peak VCM 0V CM H 5V Switching Pos. (A), IF = 0 VO VO (Min) VO (Max) Switching Pos. (B), IF = 7.5 mA VO 0.5 V CM L Fig. 14 T Test Circuit Common Mode Transient Immunity © 2004 Fairchild Semiconductor Corporation Page 9 of 13 1/7/04 HIGH SPEED-10 MBit/s LOGIC GATE OPTOCOUPLERS HCPL-0600 HCPL-0601 8-Pin Small Outline 0.024 (0.61) 0.060 (1.52) 0.275 (6.99) 0.155 (3.94) 0.050 (1.27) © 2004 Fairchild Semiconductor Corporation Page 10 of 13 1/7/04 HIGH SPEED-10 MBit/s LOGIC GATE OPTOCOUPLERS HCPL-0600 HCPL-0601 ORDERING INFORMATION Option Order Entry Identifier Description R1 .R1 Tape and Reel (500 per Reel) R2 .R2 Tape and Reel (2500 per Reel) MARKING INFORMATION 1 0600 V X YY S 3 4 2 6 5 Definitions 1 Fairchild logo 2 Device number 3 VDE mark (Note: Only appears on parts ordered with VDE option – See order entry table) 4 One digit year code, e.g., ‘3’ 5 Two digit work week ranging from ‘01’ to ‘53’ 6 Assembly package code © 2004 Fairchild Semiconductor Corporation Page 11 of 13 1/7/04 HIGH SPEED-10 MBit/s LOGIC GATE OPTOCOUPLERS HCPL-0600 HCPL-0601 Carrier Tape Specifications 8.0 ± 0.1 3.5 ± 0.2 2 ± 0.05 4.0 ± 0.1 0.3 MAX Ø1.5 MIN 1.75 ± 0.10 5.5 ± 0.05 8.3 ± 0.1 5.2 ± 0.2 6.4 ± 0.2 0.1 MAX 12.0 ± 0.3 Ø1.5 + 0.1/-0 User Direction of Feed Reflow Profile Temperature (°C) 300 230°C, 10–30 s 250 245°C peak 200 150 Time above 183°C, 120–180 sec 100 Ramp up = 2–10°C/sec 50 • Peak reflow temperature: 245°C (package surface temperature) • Time of temperature higher than 183°C for 120–180 seconds • One time soldering reflow is recommended 0 0 0.5 1 1.5 2 2.5 3 3.5 4 4.5 Time (Minute) © 2004 Fairchild Semiconductor Corporation Page 12 of 13 1/7/04 HIGH SPEED-10 MBit/s LOGIC GATE OPTOCOUPLERS HCPL-0600 HCPL-0601 DISCLAIMER FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. LIFE SUPPORT POLICY FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury of the user. © 2004 Fairchild Semiconductor Corporation 2. A critical component in any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. Page 13 of 13 1/7/04