AUTOMOTIVE GRADE AUIRFS3006 HEXFET® Power MOSFET Features Advanced Process Technology Ultra Low On-Resistance Dynamic dv/dt Rating 175°C Operating Temperature Fast Switching Repetitive Avalanche Allowed up to Tjmax Lead-Free, RoHS Compliant Automotive Qualified * VDSS RDS(on) typ. max. ID (Silicon Limited) 2.5m 270A ID (Package Limited) 195A S G D2Pak AUIRFS3006 G Gate D Drain Standard Pack Form Quantity Tube 50 Tape and Reel Left 800 Package Type D2-Pak AUIRFS3006 2.0m D Description Specifically designed for Automotive applications, this HEXFET® Power MOSFET utilizes the latest processing techniques to achieve extremely low on-resistance per silicon area. Additional features of this design are a 175°C junction operating temperature, fast switching speed and improved repetitive avalanche rating . These features combine to make this design an extremely efficient and reliable device for use in Automotive applications and a wide variety of other applications Base part number 60V S Source Orderable Part Number AUIRFS3006 AUIRFS3006TRL Absolute Maximum Ratings Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only; and functional operation of the device at these or any other condition beyond those indicated in the specifications is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. The thermal resistance and power dissipation ratings are measured under board mounted and still air conditions. Ambient temperature (TA) is 25°C, unless Symbol Parameter Max. ID @ TC = 25°C Continuous Drain Current, VGS @ 10V (Silicon Limited) 270 ID @ TC = 100°C ID @ TC = 25°C Continuous Drain Current, VGS @ 10V (Silicon Limited) Continuous Drain Current, VGS @ 10V (Package Limited) 191 195 IDM PD @TC = 25°C Pulsed Drain Current Maximum Power Dissipation 1080 375 VGS EAS IAR EAR dv/dt TJ TSTG Linear Derating Factor Gate-to-Source Voltage Single Pulse Avalanche Energy (Thermally Limited) Avalanche Current Repetitive Avalanche Energy Peak Diode Recovery Operating Junction and Storage Temperature Range Soldering Temperature, for 10 seconds (1.6mm from case) Thermal Resistance Symbol RJC RJA Parameter Junction-to-Case Junction-to-Ambient (PCB Mount), D2 Pak Units A W 2.5 ± 20 320 See Fig.14,15, 22a, 22b 10 -55 to + 175 W/°C V mJ A mJ V/ns °C 300 Typ. Max. Units ––– ––– 0.40 40 °C/W HEXFET® is a registered trademark of Infineon. *Qualification standards can be found at www.infineon.com 1 2015-12-2 AUIRFS3006 Static @ TJ = 25°C (unless otherwise specified) Parameter Typ. Max. Units V Conditions 40 ––– ––– V(BR)DSS/TJ Breakdown Voltage Temp. Coefficient ––– 0.07 ––– V/°C Reference to 25°C, ID = 5mA RDS(on) Static Drain-to-Source On-Resistance ––– 2.0 2.5 m VGS = 10V, ID = 170A VGS(th) Gate Threshold Voltage 2.0 ––– 4.0 V gfs RG Forward Trans conductance Gate Resistance IDSS Drain-to-Source Leakage Current 280 ––– ––– ––– 2.0 ––– ––– ––– 20 ––– ––– 250 S VDS = 25V, ID = 170A VDS = 60V, VGS = 0V µA VDS = 48V,VGS = 0V,TJ =125°C IGSS Gate-to-Source Forward Leakage Gate-to-Source Reverse Leakage ––– ––– ––– ––– 100 -100 V(BR)DSS Drain-to-Source Breakdown Voltage Min. nA VGS = 0V, ID = 250µA VDS = VGS, ID = 250µA VGS = 20V VGS = -20V Dynamic Electrical Characteristics @ TJ = 25°C (unless otherwise specified) Qg Qgs Qgd Qsync td(on) tr td(off) tf Ciss Coss Total Gate Charge Gate-to-Source Charge Gate-to-Drain Charge Total Gate Charge Sync. (Qg - Qgd) Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Input Capacitance Output Capacitance ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– 200 37 60 140 16 182 118 189 8970 1020 300 ––– ––– ––– ––– ––– ––– ––– ––– ––– Crss Reverse Transfer Capacitance ––– 534 ––– Coss eff.(ER) Effective Output Capacitance (Energy Related) ––– 1480 ––– VDD = 39V ID = 170A ns RG= 2.7 VGS = 10V VGS = 0V VDS = 50V pF ƒ = 1.0MHz, See Fig. 5 VGS = 0V, VDS = 0V to 48V Coss eff.(TR) Effective Output Capacitance (Time Related) ––– 1920 ––– VGS = 0V, VDS = 0V to 48V Min. Typ. Max. Units ––– ––– 270 ––– ––– 1080 ––– ––– ––– ––– ––– ––– ––– 44 48 63 77 2.4 1.3 ––– ––– ––– ––– ––– Diode Characteristics Parameter Continuous Source Current IS (Body Diode) Pulsed Source Current ISM (Body Diode) VSD Diode Forward Voltage trr Reverse Recovery Time Qrr Reverse Recovery Charge IRRM ton Reverse Recovery Current Forward Turn-On Time ID = 170A VDS = 30V nC VGS = 10V Conditions MOSFET symbol showing the A integral reverse p-n junction diode. V TJ = 25°C,IS = 170A,VGS = 0V TJ = 25°C VDD = 51V ns TJ = 125°C IF = 170A, TJ = 25°C di/dt = 100A/µs nC TJ = 125°C A TJ = 25°C Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD) Notes: Calculated continuous current based on maximum allowable junction temperature. Bond wire current limit is 195A. Note that current limitations arising from heating of the device leads may occur with some lead mounting arrangements. Repetitive rating; pulse width limited by max. junction temperature. Limited by TJmax, starting TJ = 25°C, L = 0.022mH, RG = 25, IAS = 170A, VGS =10V. Part not recommended for use above this value. ISD 170A, di/dt 1360A/µs, VDD V(BR)DSS, TJ 175°C. Pulse width 400µs; duty cycle 2%. Coss eff. (TR) is a fixed capacitance that gives the same charging time as Coss while VDS is rising from 0 to 80% VDSS. Coss eff. (ER) is a fixed capacitance that gives the same energy as Coss while VDS is rising from 0 to 80% VDSS. When mounted on 1" square PCB (FR-4 or G-10 Material). For recommended footprint and soldering techniques refer to application note #AN-994 R is measured at TJ approximately 90°C. RJC value shown is at time zero 2 2015-12-2 AUIRFS3006 1000 1000 100 BOTTOM TOP 10 3.5V 60µs PULSE WIDTH Tj = 25°C ID, Drain-to-Source Current (A) ID, Drain-to-Source Current (A) TOP VGS 15V 10V 8.0V 6.0V 5.0V 4.5V 4.0V 3.5V BOTTOM 100 3.5V 60µs PULSE WIDTH Tj = 175°C 1 10 0.1 1 10 100 0.1 VDS , Drain-to-Source Voltage (V) 10 100 Fig. 2 Typical Output Characteristics 2.5 RDS(on) , Drain-to-Source On Resistance (Normalized) 1000 ID, Drain-to-Source Current) 1 VDS , Drain-to-Source Voltage (V) Fig. 1 Typical Output Characteristics TJ = 175°C 100 TJ = 25°C 10 VDS = 25V 60µs PULSE WIDTH 2.0 3.0 4.0 5.0 ID = 170A VGS = 10V 2.0 1.5 1.0 0.5 1 6.0 -60 -40 -20 7.0 Coss = Cds + Cgd Ciss 8000 4000 C oss 16 VGS, Gate-to-Source Voltage (V) VGS = 0V, f = 1 MHZ C iss = C gs + Cgd, C ds SHORTED Crss = C gd 12000 20 40 60 80 100 120 140 160 180 Fig. 4 Normalized On-Resistance vs. Temperature Fig. 3 Typical Transfer Characteristics 16000 0 TJ , Junction Temperature (°C) VGS, Gate-to-Source Voltage (V) C, Capacitance (pF) VGS 15V 10V 8.0V 6.0V 5.0V 4.5V 4.0V 3.5V ID= 170A 12 VDS = 48V VDS = 30V 8 4 C rss 0 0 1 10 100 VDS , Drain-to-Source Voltage (V) Fig 5. Typical Capacitance vs. Drain-to-Source Voltage 3 0 40 80 120 160 200 240 280 QG Total Gate Charge (nC) Fig 6. Typical Gate Charge vs. Gate-to-Source Voltage 2015-12-2 AUIRFS3006 10000 TJ = 175°C ID, Drain-to-Source Current (A) ISD , Reverse Drain Current (A) 1000 100 10 TJ = 25°C 1 OPERATION IN THIS AREA LIMITED BY R DS (on) 1000 100µsec 100 LIMITED BY PACKAGE 10 10msec 1 Tc = 25°C Tj = 175°C Single Pulse VGS = 0V 0.0 0.4 0.8 1.2 1.6 0.1 2.0 V(BR)DSS , Drain-to-Source Breakdown Voltage 300 Limited By Package ID, Drain Current (A) 250 200 150 100 50 0 50 75 100 125 150 10 100 Fig 8. Maximum Safe Operating Area Fig. 7 Typical Source-to-Drain Diode 25 1 VDS , Drain-toSource Voltage (V) VSD , Source-to-Drain Voltage (V) 80 ID = 5mA 75 70 65 60 55 -60 -40 -20 175 0 20 40 60 80 100 120 140 160 180 TJ , Junction Temperature (°C) TC , Case Temperature (°C) Fig 9. Maximum Drain Current vs. Case Temperature Fig 10. Drain-to-Source Breakdown Voltage 1400 EAS, Single Pulse Avalanche Energy (mJ) 2.0 1.5 Energy (µJ) DC 0.1 0.1 1.0 0.5 ID 20A 27A BOTTOM 170A 1200 TOP 1000 800 600 400 200 0 0.0 0 10 20 30 40 50 VDS, Drain-to-Source Voltage (V) Fig 11. Typical COSS Stored Energy 4 1msec 60 25 50 75 100 125 150 175 Starting TJ, Junction Temperature (°C) Fig 12. Maximum Avalanche Energy vs. Drain Current 2015-12-2 AUIRFS3006 Thermal Response ( Z thJC ) 1 D = 0.50 0.1 0.20 0.10 J 0.05 0.01 0.02 0.01 0.001 R1 R1 J 1 R2 R2 C 1 2 2 Ci= iRi SINGLE PULSE ( THERMAL RESPONSE ) Ri (°C/W) I (sec) 0.175365 0.000343 0.22547 0.006073 Notes: 1. Duty Factor D = t1/t2 2. Peak Tj = P dm x Zthjc + Tc 0.0001 1E-006 1E-005 0.0001 0.001 0.01 0.1 t1 , Rectangular Pulse Duration (sec) Fig 13. Maximum Effective Transient Thermal Impedance, Junction-to-Case 1000 Avalanche Current (A) Duty Cycle = Single Pulse 100 Allowed avalanche Current vs avalanche pulsewidth, tav, assuming Tj = 150°C and Tstart =25°C (Single Pulse) 0.01 0.05 0.10 10 Allowed avalanche Current vs avalanche pulsewidth, tav, assuming j = 25°C and Tstart = 150°C. 1 1.0E-06 1.0E-05 1.0E-04 1.0E-03 1.0E-02 1.0E-01 tav (sec) Fig 14. Avalanche Current vs. Pulse width EAR , Avalanche Energy (mJ) 400 TOP Single Pulse BOTTOM 1% Duty Cycle ID = 170A 300 200 100 0 25 50 75 100 125 150 175 Starting TJ , Junction Temperature (°C) Fig 15. Maximum Avalanche Energy vs. Temperature 5 Notes on Repetitive Avalanche Curves , Figures 14, 15: (For further info, see AN-1005 at www.infineon.com) 1. Avalanche failures assumption: Purely a thermal phenomenon and failure occurs at a temperature far in excess of Tjmax. This is validated for every part type. 2. Safe operation in Avalanche is allowed as long as Tjmax is not exceeded. 3. Equation below based on circuit and waveforms shown in Figures 18a, 18b. 4. PD (ave) = Average power dissipation per single avalanche pulse. 5. BV = Rated breakdown voltage (1.3 factor accounts for voltage increase during avalanche). 6. Iav = Allowable avalanche current. 7. T = Allowable rise in junction temperature, not to exceed Tjmax (assumed as 25°C in Figure 13, 14). tav = Average time in avalanche. D = Duty cycle in avalanche = tav ·f ZthJC(D, tav) = Transient thermal resistance, see Figures 13) PD (ave) = 1/2 ( 1.3·BV·Iav) = T/ ZthJC Iav = 2T/ [1.3·BV·Zth] EAS (AR) = PD (ave)·tav 2015-12-2 AUIRFS3006 20 ID = 1.0A ID = 1.0mA ID = 250µA 3.5 16 3.0 12 IRRM - (A) VGS(th) Gate threshold Voltage (V) 4.0 2.5 8 2.0 IF = 112A VR = 51V 4 1.5 1.0 TJ = 125°C TJ = 25°C 0 -75 -50 -25 0 25 50 75 100 125 150 175 100 200 300 TJ , Temperature ( °C ) 400 500 600 700 800 dif / dt - (A / µs) Fig. 17 - Typical Recovery Current vs. dif/dt Fig 16. Threshold Voltage vs. Temperature 20 700 600 16 12 QRR - (nC) IRRM - (A) 500 8 4 0 400 300 IF = 170A VR = 51V 200 IF = 112A VR = 51V TJ = 125°C TJ = 25°C 100 TJ = 125°C TJ = 25°C 0 100 200 300 400 500 600 700 800 100 200 300 dif / dt - (A / µs) 400 500 600 700 800 dif / dt - (A / µs) Fig. 18 - Typical Recovery Current vs. dif/dt Fig. 19 - Typical Stored Charge vs. dif/dt 700 600 QRR - (nC) 500 400 300 200 IF = 170A VR = 51V 100 TJ = 125°C TJ = 25°C 0 100 200 300 400 500 600 700 800 dif / dt - (A / µs) Fig. 20 - Typical Stored Charge vs. dif/dt 6 2015-12-2 AUIRFS3006 Fig 21. Peak Diode Recovery dv/dt Test Circuit for N-Channel HEXFET® Power MOSFETs V(BR)DSS 15V tp L VDS D.U.T RG IAS 20V tp DRIVER + V - DD A 0.01 Fig 22a. Unclamped Inductive Test Circuit Fig 23a. Switching Time Test Circuit I AS Fig 22b. Unclamped Inductive Waveforms Fig 23b. Switching Time Waveforms Id Vds Vgs Vgs(th) Qgs1 Qgs2 Fig 24a. Gate Charge Test Circuit 7 Qgd Qgodr Fig 24b. Gate Charge Waveform 2015-12-2 AUIRFS3006 D2Pak (TO-263AB) Package Outline (Dimensions are shown in millimeters (inches)) D2Pak (TO-263AB) Part Marking Information Part Number AUFS3006 YWWA IR Logo XX Date Code Y= Year WW= Work Week XX Lot Code Note: For the most current drawing please refer to IR website at http://www.irf.com/package/ 8 2015-12-2 AUIRFS3006 D2Pak (TO-263AB) Tape & Reel Information (Dimensions are shown in millimeters (inches)) TRR 1.60 (.063) 1.50 (.059) 4.10 (.161) 3.90 (.153) FEED DIRECTION 1.85 (.073) 1.65 (.065) 1.60 (.063) 1.50 (.059) 11.60 (.457) 11.40 (.449) 0.368 (.0145) 0.342 (.0135) 15.42 (.609) 15.22 (.601) 24.30 (.957) 23.90 (.941) TRL 10.90 (.429) 10.70 (.421) 1.75 (.069) 1.25 (.049) 4.72 (.136) 4.52 (.178) 16.10 (.634) 15.90 (.626) FEED DIRECTION 13.50 (.532) 12.80 (.504) 27.40 (1.079) 23.90 (.941) 4 330.00 (14.173) MAX. NOTES : 1. COMFORMS TO EIA-418. 2. CONTROLLING DIMENSION: MILLIMETER. 3. DIMENSION MEASURED @ HUB. 4. INCLUDES FLANGE DISTORTION @ OUTER EDGE. 60.00 (2.362) MIN. 26.40 (1.039) 24.40 (.961) 3 30.40 (1.197) MAX. 4 Note: For the most current drawing please refer to IR website at http://www.irf.com/package/ 9 2015-12-2 AUIRFS3006 Qualification Information Automotive (per AEC-Q101) Comments: This part number(s) passed Automotive qualification. Infineon’s Industrial and Consumer qualification level is granted by extension of the higher Automotive level. Qualification Level Moisture Sensitivity Level D2-Pak Machine Model Human Body Model ESD Charged Device Model RoHS Compliant MSL1 Class M4 (+/- 800V)† AEC-Q101-002 Class H3A (+/- 6000V)† AEC-Q101-001 Class C5 (+/- 2000V)† AEC-Q101-005 Yes † Highest passing voltage. Revision History Date 12/2/2015 Comments Updated datasheet with corporate template Corrected ordering table on page 1. Published by Infineon Technologies AG 81726 München, Germany © Infineon Technologies AG 2015 All Rights Reserved. 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