DS50EV401 www.ti.com SNLS288E – JANUARY 2008 – REVISED MARCH 2013 DS50EV401 2.5 Gbps / 5.0 Gbps or 8.0 Gbps Quad Cable and Backplane Equalizer Check for Samples: DS50EV401 FEATURES DESCRIPTION • The DS50EV401 is a low power, programmable equalizer specifically designed to reduce inter-symbol interference (ISI) induced by a variety of interconnect media. In all modes, the equalizer can operate, error free, with an input eye that is completely closed by interconnect ISI. The MODE control, allows the user to select between equalization settings for 8.0 Gbps operation or 2.5 Gbps / 5.0 Gbps operation. 1 2 • • • • • • • • • • • Automatic power management on an individual lane basis Data rate optimized equalization Operates over 7 meter of 24 AWG Twin-ax Cables up to 8 Gbps Typical residual deterministic jitter: 0.18 UI @ 8 Gbps w/ 30” of FR4 0.18 UI @ 5 Gbps w/ 40” of FR4 0.16 UI @ 2.5 Gbps w/ 40” of FR4 8 kV HBM ESD protection -40 to 85°C operating temperature range 7 mm x 7 mm 48-pin leadless WQFN package Single power supply of either 3.3V or 2.5V Low power (typically 95 mW per channel at 2.5V VDD) The DS50EV401 uses Current-mode logic (CML) on both input and output ports, which provide constant 50 ohm single-ended impedance to AC ground. Differential signaling is implemented through out the entire signal path to minimize supply induced jitter. The DS50EV401 is available in a 7mm x 7mm 48-pin leadless WQFN package, and is powered from a single power supply of either 3.3 or 2.5V. Application Diagram EQ CHANNEL - LOSS 1/4 DS50EV401 SerDes ASIC/FPGA EQ Switch Device CHANNEL - LOSS 1/4 DS50EV401 LINE CARD(S) BACKPLANE or CABLE SWITCH CARD 1 2 Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. All trademarks are the property of their respective owners. PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Copyright © 2008–2013, Texas Instruments Incorporated DS50EV401 SNLS288E – JANUARY 2008 – REVISED MARCH 2013 www.ti.com PIN DESCRIPTIONS Pin Name Pin Number I/O, Type Description HIGH SPEED DIFFERENTIAL I/O IN_0+ IN_0- 1 2 I, CML Inverting and non-inverting CML differential inputs to the equalizer. An on-chip 50Ω terminating resistor connects IN_0+ to VDD and IN_0- to VDD. IN_1+ IN_1- 4 5 I, CML Inverting and non-inverting CML differential inputs to the equalizer. An on-chip 50Ω terminating resistor connects IN_1+ to VDD and IN_1- to VDD. IN_2+ IN_2- 8 9 I, CML Inverting and non-inverting CML differential inputs to the equalizer. An on-chip 50Ω terminating resistor connects IN_2+ to VDD and IN_2- to VDD. IN_3+ IN_3- 11 12 I, CML Inverting and non-inverting CML differential inputs to the equalizer. An on-chip 50Ω terminating resistor connects IN_3+ to VDD and IN_3- to VDD. OUT_0+ OUT_0- 36 35 O, CML Inverting and non-inverting CML differential outputs from the equalizer. An on-chip 50Ω terminating resistor connects OUT_0+ to VDD and OUT_0- to VDD. OUT_1+ OUT_1- 33 32 O, CML Inverting and non-inverting CML differential outputs from the equalizer. An on-chip 50Ω terminating resistor connects OUT_1+ to VDD and OUT_1- to VDD. OUT_2+ OUT_2- 29 28 O, CML Inverting and non-inverting CML differential outputs from the equalizer. An on-chip 50Ω terminating resistor connects OUT_2+ to VDD and OUT_2- to VDD. OUT_3+ OUT_3- 26 25 O, CML Inverting and non-inverting CML differential outputs from the equalizer. An on-chip 50Ω terminating resistor connects OUT_3+ to VDD and OUT_3- to VDD. 14 I, LVCMOS MODE selects the equalizer frequency for EQ channels. MODE is internally pulled low. L = 6.0 - 8.0 Gbps setting H = 2.5 Gbps / 5.0 Gbps setting EN0 44 I, LVCMOS Channel 0 Enable Input Pin H = normal operation (enabled) L = standby mode Pin is internally pulled High. EN1 42 I, LVCMOS Channel 1 Enable Input Pin H = normal operation (enabled) L = standby mode Pin is internally pulled High. EN2 40 I, LVCMOS Channel 2 Enable Input Pin H = normal operation (enabled) L = standby mode Pin is internally pulled High. EN3 38 I, LVCMOS Channel 3 Enable Input Pin H = normal operation (enabled) L = standby mode Pin is internally pulled High. SD0 45 O, LVCMOS Channel 0 Signal Detect Output Pin H = signal detected L = no signal detected SD1 43 O, LVCMOS Channel 1 Signal Detect Output Pin H = signal detected L = no signal detected SD2 41 O, LVCMOS Channel 2 Signal Detect Output Pin H = signal detected L = no signal detected. SD3 39 O, LVCMOS Channel 3 Signal Detect Output Pin H = signal detected L = no signal detected VDD 3, 6, 7, 10, 13, 15, 46 Power VDD = 2.5V ± 5% or 3.3V ± 10%. VDD pins should be tied to VDD plane through low inductance path. A 0.1μF bypass capacitor should be connected between each VDD pin to GND planes. GND 22, 24, 27, 30, 31, 34 Ground Ground reference. GND should be tied to a solid ground plane through a low impedance path. DAP Ground Ground reference. The exposed pad at the center of the package must be connected to ground plane of the board. EQUALIZATION CONTROL MODE DEVICE CONTROL POWER Exposed Pad 2 Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: DS50EV401 DS50EV401 www.ti.com SNLS288E – JANUARY 2008 – REVISED MARCH 2013 PIN DESCRIPTIONS (continued) Pin Name Pin Number I/O, Type Description OTHER Reserv 16, 17, 18, 19, 20, 21, 23, 37, 47, 48 Reserved. Do not connect. Leave open. Reserv Reserv VDD SD0 EN0 SD1 EN1 SD2 EN2 SD3 EN3 Reserv 48 47 46 45 44 43 42 41 40 39 38 37 Connection Diagram IN_0+ 1 36 OUT_0+ IN_0- 2 35 OUT_0- VDD 3 34 GND IN_1+ 4 33 OUT_1+ IN_1- 5 DS50EV401 32 OUT_1- VDD 6 TOP VIEW (not to scale) 31 GND VDD 7 30 GND 29 OUT_2+ DAP = GND 22 23 24 Reserv GND VDD GND OUT_3- 21 25 Reserv 12 20 IN_3- Reserv OUT_3+ 19 26 Reserv 11 18 IN_3+ Reserv GND 17 27 Reserv 10 16 VDD Reserv OUT_2- 15 28 VDD 9 14 IN_2- MODE 8 13 IN_2+ Figure 1. TOP VIEW — Not to scale These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates. Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: DS50EV401 3 DS50EV401 SNLS288E – JANUARY 2008 – REVISED MARCH 2013 Absolute Maximum Ratings www.ti.com (1) (2) Supply Voltage (VDD) -0.5V to +4.0V LVCMOS Input Voltage -0.5V + 4.0V LVCMOS Output Voltage -0.5V to 4.0V CML Input/Output Voltage -0.5V to 4.0V Junction Temperature +150°C Storage Temperature -65°C to +150°C ESD Rating HBM, 1.5 kΩ, 100 pF >8 kV Thermal Resistance θJA, No Airflow (1) 30°C/W “Absolute Maximum Ratings” indicate limits beyond which damage to the device may occur, including inoperability and degradation of device reliability and/or performance. Functional operation of the device and/or non-degradation at the Absolute Maximum Ratings or other conditions beyond those indicated in the Recommended Operating Conditions is not implied. The Recommended Operating Conditions indicate conditions at which the device is functional and the device should not be operated beyond such conditions. Absolute Maximum Numbers are specified for a junction temperature range of -40°C to +125°C. Models are validated to Maximum Operating Voltages only. If Military/Aerospace specified devices are required, please contact the Texas Instruments Sales Office / Distributors for availability and specifications. (2) Recommended Operating Conditions Min Typ Max Units V Supply Voltage VDD to GND, or 2.375 2.5 2.625 VDD to GND 3.0 3.3 3.6 V Ambient Temperature -40 25 +85 °C Electrical Characteristics Over recommended operating supply and temperature ranges with default register settings unless other specified. Symbol Parameter Conditions Min (1) (2) Typ Max Units 510 700 mW 100 mW 490 mW POWER PD PD N Power Dissipation 3.3V Operation Signal active, VDD = 3.3V, 3.6V Power Dissipation 2.5V Operation Signal active, VDD = 2.5V, 2.625V 380 No signal, VDD = 2.5V, 2.625V 30 mW Supply Noise Tolerance Up to 50 MHz 100 mVP-P (3) No signal, VDD = 3.3V, 3.6V LVCMOS / LVTTL DC SPECIFICATIONS VIH High Level Input Voltage VIL Low Level Input Voltage VOH High Level Output Voltage 3.3V Operation 2.0 VDD V 2.5V Operation 1.6 VDD V -0.3 0.8 V IOH = -3mA, 3.3V Operation 2.4 IOH = -3mA, 2.5V Operation 2.0 VOL Low Level Output Voltage IOL = 3mA IIH Input High Current VIN = VDD, MODE pin (pull down) IIL Input Low Current (1) (2) (3) 4 V V 0.4 V +140 μA VIN = VDD, EN pins (pull up) -15 +15 μA VIN = 0V, MODE pin (pull down) -15 +15 μA VIN = 0V, EN pins (pull up) -40 μA Typical values represent most likely parametric norms at VDD = 3.3V or 2.5V, TA = 25°C., and at the Recommended Operation Conditions at the time of product characterization and are not ensured. The Electrical Characteristics tables list ensured specifications under the listed Recommended Operating Conditions except as otherwise modified or specified by the Electrical Characteristics Conditions and/or Notes. Typical specifications are estimations only and are not ensured. Allowed supply noise (mVP-P sine wave) under typical conditions. Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: DS50EV401 DS50EV401 www.ti.com SNLS288E – JANUARY 2008 – REVISED MARCH 2013 Electrical Characteristics (continued) Over recommended operating supply and temperature ranges with default register settings unless other specified. (1) (2) Symbol Parameter Conditions Min Typ Max Units 400 1000 1600 mVP-P CML RECEIVER INPUTS (IN_n+, IN_n-) VTX Input Voltage Swing (Launch Amplitude) Measured at point A, AC or DC coupled, Figure 2 VIN-S Input Voltage Sensitivity AC-Coupled or DC-Coupled Required Differential Envelope measured at point B, Figure 2, (4), See FR4 / BACKPLANE Typical Performance Eye Diagrams, 170 mVP-P 10 dB RLI Differential Input Return Loss 100 MHz – 4.0 GHz, with fixture’s effect de-embedded RIN Input Resistance Single ended to VDD 40 50 60 Ω Differential measurement with OUT_n+ and OUT_n- terminated by 50Ω to GND AC-Coupled, Figure 3 800 1000 1200 mVP-P CML OUTPUTS (OUT_n+, OUT_n-) VO Output Voltage Swing VOCM Output Common-Mode Voltage Single-ended measurement DCCoupled with 50Ω termination, (5) VDD – 0.25 V tR, tF Transition Time 20% to 80% of differential output voltage, measured within 1” from output pins, Figure 3, (5) 40 ps RO Output Resistance Single-ended to VDD RLO Differential Output Return Loss 100 MHz – 4.0 GHz, with fixture’s effect de-embedded. IN_n+ = static high tPLHD Differential Low to High Propagation Delay tPHLD Differential High to Low Propagation Delay tID Idle to Valid Differential Data tDI Valid Differential data to idle tCCSK Inter Pair Channel to Channel Skew 40 50 Ω 60 10 dB 240 ps 240 ps VIN = 800 mVp-p, 5 Gbps, EIEOS, 40” of 6 mil microstrip FR4, Figure 5, (7) 8 ns VIN = 800 mVp-p, 5 Gbps, EIOS, 40” of 6 mil microstrip FR4, Figure 5, (7) 8 ns Difference in 50% crossing between channels 7 ps UIP-P Propagation delay measurement at 50% VO between input to output, 100 Mbps, Figure 4, (6) EQUALIZATION DJ1 DJ2 DJ3 RJ (4) (5) (6) (7) (8) (9) Residual Deterministic Jitter at 8 Gbps 30” of 6 mil microstrip FR4, MODE=0, PRBS-7 (27-1) pattern, 0.18 Residual Deterministic Jitter at 5 Gbps 40” of 6 mil microstrip FR4, MODE=1, PRBS-7 (27-1) pattern, 0.18 0.21 UIP-P Residual Deterministic Jitter at 2.5 Gbps 40” of 6 mil microstrip FR4, MODE=1, PRBS-7 (27-1) pattern, 0.16 0.18 UIP-P Random Jitter (6) (9) (7) (8) (7) (8) (7) (8) 0.5 psrms VIN-S is a measurement of the input differential envelope, see FR4 / BACKPLANE Typical Performance Eye Diagrams. The device does not require an open eye. Specification is ensured by characterization at optimal MODE setting and is not tested in production. Measured with clock-like {11111 00000} pattern. Specification is ensured by characterization at optimal MODE setting and is not tested in production. Deterministic jitter is measured at the differential outputs (point C of Figure 2), minus the deterministic jitter before the test channel (point A of Figure 2). Random jitter is removed through the use of averaging or similar means. Random jitter contributed by the equalizer is defined as sqrt (JOUT2 – JIN2). JOUT is the random jitter at equalizer outputs in ps-rms, see point C of Figure 2; JIN is the random jitter at the input of the equalizer in ps-rms, see point B of Figure 2. Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: DS50EV401 5 DS50EV401 SNLS288E – JANUARY 2008 – REVISED MARCH 2013 www.ti.com TIMING DIAGRAMS A B C 6 mil FR4 Test Channel DS50EV401 Signal Source INPUT SMA Connector OUTPUT SMA Connector Figure 2. Test Setup Diagram OUT+ 80% VO = (OUT+) ± (OUT-) 80% 0V 20% 20% OUTtR tF Figure 3. CML Output Transition Times IN 0V tPLHD OUT tPHLD 0V Figure 4. Propagation Delay Timing Diagram IN+ VIN 0V INtID tDI OUT+ VO 0V OUT- Figure 5. Idle Timing Diagram 6 Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: DS50EV401 DS50EV401 www.ti.com SNLS288E – JANUARY 2008 – REVISED MARCH 2013 A A' B B' 5 0 5 0 VOH = VDD Single-ended Wavefroms @ A and B Vocm VOL = VDD - 500mV Vo = 1000 mVp-p Differential Wavefrom A-B 0V (DIFF) Figure 6. CML Output Swings at A/B Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: DS50EV401 7 DS50EV401 SNLS288E – JANUARY 2008 – REVISED MARCH 2013 www.ti.com FUNCTIONAL DESCRIPTION DS50EV401 APPLICATIONS INFORMATION The DS50EV401 is a programmable quad equalizer optimized for copper backplanes and cables at transmission rates of 2.5 Gbps up to 8 Gbps. The device consists of an input receive equalizer followed by a limiting amplifier. The equalizer is designed to open an input eye that is completely closed due to inter-symbol interference (ISI) induced by the channel interconnect. The equalization is set to keep residual deterministic jitter below 0.2 unit intervals (UI) regardless of data rate. This equalization scheme allows one equalization setting to satisfy most serial links between 2.5 and 5.0 Gbps. The DS50EV401 is intended as a unidirectional receiver that should be placed in close physical proximity to the link end point. Therefore the transmitter does not include de-emphasis as TX equalization would not be needed over the short distance between the equalizer and the end point. 1/4 DS50EV401 VDD VDD VDD DC Offset Correction VDD IN_n+ OUT_n+ CML Driver Limiting Amplifier Equalizer IN_n- OUT_nInput Termination Output Termination ENn MODE SDn Signal Detect Figure 7. General Block Diagram Data Channels The DS50EV401 consists of four data channels. Each channel provides input termination, receiver equalization, signal limiting, offset cancellation, and a CML output driver, as shown in Figure 7. The data channels support two levels of equalization, controlled by the pin MODE. The equalization levels are set simultaneously on all 4 channels, as described in Table 1. When an idle condition is sensed on a channel’s input, the transmit driver is automatically placed into electrical idle mode. The common mode voltage is set, and the differential output is forced to zero. To save power, the output driver current is powered off when the device is in electrical idle mode. All other circuits maintain their bias currents allowing a fast recovery from idle to the active state. Electric idle is performed on a per channel basis, and several channels can be in idle while others are actively passing data. Table 1. MODE Control Table 6 mil microstrip FR4 trace length (in) 8 24 AWG Twin-AX cable length (m) Frequency Channel Loss MODE 0–30 0–7 8 Gbps 16 dB 0 0–40 0–10 2.5 Gbps 5.0 Gbps 14 dB 20 dB 1 Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: DS50EV401 DS50EV401 www.ti.com SNLS288E – JANUARY 2008 – REVISED MARCH 2013 APPLICATION INFORMATION GENERAL RECOMMENDATIONS The DS50EV401 is a high performance device capable of delivering excellent performance. As with most CML devices, it is recommended that AC coupling capacitors be used to ensure I/O compatibility with other devices. In order to extract full performance from the device in a particular application, good high-speed design practices must be followed. TI’s LVDS Owner's Manual (literature number SNLA187), provides detailed information about managing signal integrity and power delivery to get the most from your design. PCB LAYOUT CONSIDERATIONS FOR DIFFERENTIAL PAIRS The CML inputs and outputs must have a controlled differential impedance of 100Ω. It is preferable to route CML lines exclusively on one layer of the board, particularly for the input traces. The use of vias should be avoided if possible. If vias must be used, they should be used sparingly and must be placed symmetrically for each side of a given differential pair. Route the CML signals away from other signals and noise sources on the printed circuit board. See AN-1187 (SNOA401) for additional information on WQFN packages. PACKAGE FOOTPRINT / SOLDERING See Application Note number 1187, “Leadless Leadframe Package” for information on PCB footprint and soldering recommendations. POWER SUPPLY BYPASSING Two approaches are recommended to ensure that the DS50EV401 is provided with an adequate power supply. First, the supply (VDD) and ground (GND) pins should be connected to power planes routed on adjacent layers of the printed circuit board. The layer thickness of the dielectric should be minimized so that the VDD and GND planes create a low inductance supply with distributed capacitance. Second, careful attention to supply bypassing through the proper use of bypass capacitors is required. A 0.1μF bypass capacitor should be connected to each VDD pin such that the capacitor is placed as close as possible to the DS50EV401. Smaller body size capacitors can help facilitate proper component placement. Additionally, three capacitors with capacitance in the range of 2.2 μF to 10 μF should be incorporated in the power supply bypassing design as well. These capacitors can be either tantalum or an ultra-low ESR ceramic and should be placed as close as possible to the DS50EV401. Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: DS50EV401 9 DS50EV401 SNLS288E – JANUARY 2008 – REVISED MARCH 2013 3V3 www.ti.com VDD DS50EV401 VDD 3V3 10 PF 10 PF VDD Quad EQUALIZER VDD VDD OUT_1+ IN_1- OUT_1- IN_2+ OUT_2+ IN_2- OUT_2- IN_3+ OUT_3+ IN_3- OUT_3EN0 SD0 EN1 SD1 EN2 SD2 EN3 SD3 MODE AC Couple CAPS 75 nF OUT_0- IN_1+ Signal Detect Outputs Control Interface CML outPUT PORT - 4 CHANNEL OUT_0+ IN_0AC Couple CAPS 75 nF CML INPUT PORT - 4 CHANNEL IN_0+ DAP Reserv GND MODE: Tie High or Low or drive. (Speed Select) All Bypass CAPS 0.1 PF unless noted. VDD GND Figure 8. Typical Interface Circuit The CML inputs are AC coupled to the device as shown in Figure 8. Internal to the device are 50Ω terminations to VDD. The CML outputs drive 100 Ω transmission lines and are AC coupled and terminated at their load. The ENABLE inputs and SIGNAL DETECT outputs are optional. Internal to the device the signal detect circuity is connected to the enable circuit providing the automatic power management feature. When the No-signal condition is detected, the respective channel is placed in standby mode. The MODE pin is used to select between low and high data rate equalization settings. Depending upon the application it may be tied High, tied Low, or driven. There are several reserved pins on the device, these are NC pins and should be left open. Power is supplied through six VDD pins to the device. A 0.1µF capacitor is recommended per pin as close to the device as possible. A larger bulk capacitor is also recommended to be placed near by the device. Ground is supplied to the device via the ground pins and also the DAP. 10 Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: DS50EV401 DS50EV401 www.ti.com SNLS288E – JANUARY 2008 – REVISED MARCH 2013 TYPICAL PERFORMANCE EYE DIAGRAMS FR4 / BACKPLANE Typical Performance Eye Diagrams The plots show the unequalized and equalized eye patterns for various interconnects as noted. Unequalized is shown in the left column and the corresponding equalized eye pattern in shown in the right column. Figure 9. Unequalized Signal (40 in FR4, 2.5 Gbps, PRBS7) Figure 10. Equalized Signal (40 in FR4, 2.5 Gbps, PRBS7, MODE=1) Figure 11. Unequalized Signal (40 in FR4, 5 Gbps, PRBS7) Figure 12. Equalized Signal (40 in FR4, 5 Gbps, PRBS7, MODE=1) Figure 13. Unequalized Signal (30 in FR4, 8 Gbps, PRBS7) Figure 14. Equalized Signal (30 in FR4, 8 Gbps, PRBS7, MODE=0) Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: DS50EV401 11 DS50EV401 SNLS288E – JANUARY 2008 – REVISED MARCH 2013 www.ti.com TYPICAL PERFORMANCE EYE DIAGRAMS (continued) Twin-AX CABLES Typical Performance Eye Diagrams The plots show the unequalized and equalized eye patterns for various interconnects as noted. Unequalized is shown in the left column and the corresponding equalized eye pattern in shown in the right column. 12 Figure 15. Unequalized Signal (10 m 24 AWG Twin-AX Cable, 2.5 Gbps, PRBS7) Figure 16. Equalized Signal (10 m 24 AWG Twin-AX Cable, 2.5 Gbps, PRBS7, MODE=1) Figure 17. Unequalized Signal (10 m 24 AWG Twin-AX Cable, 5 Gbps, PRBS7) Figure 18. Equalized Signal (10 m 24 AWG Twin-AX Cable, 5 Gbps, PRBS7, MODE=1) Figure 19. Unequalized Signal (7 m 24 AWG Twin-AX Cable, 8 Gbps, PRBS7) Figure 20. Equalized Signal (7 m 24 AWG Twin-AX Cable, 8 Gbps, PRBS7, MODE=0) Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: DS50EV401 DS50EV401 www.ti.com SNLS288E – JANUARY 2008 – REVISED MARCH 2013 REVISION HISTORY Changes from Revision D (March 2013) to Revision E • Page Changed layout of National Data Sheet to TI format .......................................................................................................... 12 Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: DS50EV401 13 PACKAGE OPTION ADDENDUM www.ti.com 8-Oct-2015 PACKAGING INFORMATION Orderable Device Status (1) DS50EV401SQE/NOPB ACTIVE Package Type Package Pins Package Drawing Qty WQFN NJU 48 250 Eco Plan Lead/Ball Finish MSL Peak Temp (2) (6) (3) Green (RoHS & no Sb/Br) CU SN Level-3-260C-168 HR Op Temp (°C) Device Marking (4/5) -40 to 85 DS50EV401 (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability information and additional product content details. TBD: The Pb-Free/Green conversion plan has not been defined. Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes. Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above. Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material) (3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature. (4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device. (5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation of the previous line and the two combined represent the entire Device Marking for that device. (6) Lead/Ball Finish - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead/Ball Finish values may wrap to two lines if the finish value exceeds the maximum column width. Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. 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Addendum-Page 1 Samples PACKAGE OPTION ADDENDUM www.ti.com 8-Oct-2015 Addendum-Page 2 PACKAGE MATERIALS INFORMATION www.ti.com 2-Sep-2015 TAPE AND REEL INFORMATION *All dimensions are nominal Device DS50EV401SQE/NOPB Package Package Pins Type Drawing WQFN NJU 48 SPQ 250 Reel Reel A0 Diameter Width (mm) (mm) W1 (mm) 178.0 16.4 Pack Materials-Page 1 7.3 B0 (mm) K0 (mm) P1 (mm) W Pin1 (mm) Quadrant 7.3 1.3 12.0 16.0 Q1 PACKAGE MATERIALS INFORMATION www.ti.com 2-Sep-2015 *All dimensions are nominal Device Package Type Package Drawing Pins SPQ Length (mm) Width (mm) Height (mm) DS50EV401SQE/NOPB WQFN NJU 48 250 213.0 191.0 55.0 Pack Materials-Page 2 MECHANICAL DATA NJU0048D SQA48D (Rev A) www.ti.com IMPORTANT NOTICE Texas Instruments Incorporated and its subsidiaries (TI) reserve the right to make corrections, enhancements, improvements and other changes to its semiconductor products and services per JESD46, latest issue, and to discontinue any product or service per JESD48, latest issue. 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