UniFET TM FDB52N20 200V N-Channel MOSFET Features Description • 52A, 200V, RDS(on) = 0.049Ω @VGS = 10 V These N-Channel enhancement mode power field effect transistors are produced using Fairchild’s proprietary, planar stripe, DMOS technology. • Low gate charge ( typical 49 nC) • Low Crss ( typical 66 pF) This advanced technology has been especially tailored to minimize on-state resistance, provide superior switching performance, and withstand high energy pulse in the avalanche and commutation mode. These devices are well suited for high efficient switched mode power supplies and active power factor correction. • Fast switching • 100% avalanche tested • Improved dv/dt capability D D { z G{ G z z { S S Absolute Maximum Ratings Symbol Parameter VDSS Drain-Source Voltage ID Drain Current - Continuous (TC = 25°C) - Continuous (TC = 100°C) IDM Drain Current - Pulsed VGSS Gate-Source voltage EAS Single Pulsed Avalanche Energy IAR FDB52N20 Unit 200 V 52 33 A A 208 A ±30 V (Note 2) 2520 mJ Avalanche Current (Note 1) 52 A EAR Repetitive Avalanche Energy (Note 1) 35.7 mJ dv/dt Peak Diode Recovery dv/dt (Note 3) 4.5 V/ns PD Power Dissipation 357 2.86 W W/°C -55 to +150 °C 300 °C (Note 1) (TC = 25°C) - Derate above 25°C TJ, TSTG Operating and Storage Temperature Range TL Maximum Lead Temperature for Soldering Purpose, 1/8” from Case for 5 Seconds Thermal Characteristics Symbol Parameter Min. Max. Unit RθJC Thermal Resistance, Junction-to-Case -- 0.35 °C/W RθJA* Thermal Resistance, Junction-to-Ambient* -- 40 °C/W RθJA Thermal Resistance, Junction-to-Ambient -- 62.5 °C/W * When mounted on the minimum pad size recommended (PCB Mount) ©2005 Fairchild Semiconductor Corporation FDB52N20 Rev. A 1 www.fairchildsemi.com FDB52N20 200V N-Channel MOSFET September 2005 Device Marking FDB52N20 Device Reel Size Tape Width Quantity 330mm 24mm 800 2 FDB52N20TM Electrical Characteristics Symbol Package D -PAK TC = 25°C unless otherwise noted Parameter Conditions Min. Typ. Max Units 200 -- -- V Off Characteristics BVDSS Drain-Source Breakdown Voltage VGS = 0V, ID = 250µA ∆BVDSS / ∆TJ Breakdown Voltage Temperature Coefficient ID = 250µA, Referenced to 25°C -- 0.2 -- V/°C IDSS Zero Gate Voltage Drain Current VDS = 200V, VGS = 0V VDS = 160V, TC = 125°C --- --- 1 10 µA µA IGSSF Gate-Body Leakage Current, Forward VGS = 30V, VDS = 0V -- -- 100 nA IGSSR Gate-Body Leakage Current, Reverse VGS = -30V, VDS = 0V -- -- -100 nA 3.0 -- 5.0 V -- 0.041 0.049 Ω -- 35 -- S -- 2230 2900 pF -- 540 700 pF -- 66 100 pF -- 53 115 ns On Characteristics VGS(th) Gate Threshold Voltage VDS = VGS, ID = 250µA RDS(on) Static Drain-Source On-Resistance VGS = 10V, ID = 26A gFS Forward Transconductance VDS = 40V, ID = 26A (Note 4) Dynamic Characteristics Ciss Input Capacitance Coss Output Capacitance Crss Reverse Transfer Capacitance VDS = 25V, VGS = 0V, f = 1.0MHz Switching Characteristics td(on) Turn-On Delay Time tr Turn-On Rise Time td(off) Turn-Off Delay Time tf Turn-Off Fall Time Qg Total Gate Charge Qgs Gate-Source Charge Qgd Gate-Drain Charge VDD = 100V, ID = 52A RG = 25Ω (Note 4, 5) VDS = 160V, ID = 52A VGS = 10V (Note 4, 5) -- 175 359 ns -- 48 107 ns -- 29 68 ns -- 49 63 nC -- 19 -- nC -- 24 -- nC -- -- 52 A Drain-Source Diode Characteristics and Maximum Ratings IS Maximum Continuous Drain-Source Diode Forward Current ISM Maximum Pulsed Drain-Source Diode Forward Current -- -- 204 A VSD Drain-Source Diode Forward Voltage VGS = 0V, IS = 52A -- -- 1.4 V trr Reverse Recovery Time 162 -- ns Reverse Recovery Charge VGS = 0V, IS = 52A dIF/dt =100A/µs -- Qrr -- 1.3 -- µC (Note 4) NOTES: 1. Repetitive Rating: Pulse width limited by maximum junction temperature 2. L = 1.4mH, IAS = 52A, VDD = 50V, RG = 25Ω, Starting TJ = 25°C 3. ISD ≤ 52A, di/dt ≤ 200A/µs, VDD ≤ BVDSS, Starting TJ = 25°C 4. Pulse Test: Pulse width ≤ 300µs, Duty Cycle ≤ 2% 5. Essentially Independent of Operating Temperature Typical Characteristics 2 FDB52N20 Rev. A www.fairchildsemi.com FDB52N20 200V N-Channel MOSFET Package Marking and Ordering Information Figure 1. On-Region Characteristics VGS 15.0 V 10.0 V 8.0 V 7.0 V 6.5 V 6.0 V Bottom : 5.5 V Top : 1 10 2 10 ID, Drain Current [A] 2 10 ID, Drain Current [A] Figure 2. Transfer Characteristics 0 10 150°C 1 25°C 10 -55°C * Notes : 1. VDS = 40V 2. 250µs Pulse Test * Notes : 1. 250µs Pulse Test 2. TC = 25°C -1 10 0 -1 0 10 10 1 10 10 2 4 6 VDS, Drain-Source Voltage [V] 8 10 12 VGS, Gate-Source Voltage [V] Figure 3. On-Resistance Variation vs. Drain Current and Gate Voltage Figure 4. Body Diode Forward Voltage Variation vs. Source Current and Temperatue 0.12 IDR, Reverse Drain Current [A] RDS(ON) [Ω], Drain-Source On-Resistance 2 10 0.10 0.08 VGS = 10V 0.06 0.04 VGS = 20V 0.02 * Note : TJ = 25°C 0.00 ℃ 1 10 150 ℃ 25 * Notes : 1. VGS = 0V 2. 250µs Pulse Test 0 0 25 50 75 100 125 10 150 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8 ID, Drain Current [A] VSD, Source-Drain voltage [V] Figure 5. Capacitance Characteristics Figure 6. Gate Charge Characteristics 12 6000 Ciss = Cgs + Cgd (Cds = shorted) Coss = Cds + Cgd Capacitances [pF] 4000 3000 VGS, Gate-Source Voltage [V] Crss = Cgd 5000 Coss Ciss 2000 * Note ; 1. VGS = 0 V 1000 Crss 2. f = 1 MHz VDS = 40V 10 VDS = 100V VDS = 160V 8 6 4 2 * Note : ID = 52A 0 -1 10 10 0 10 0 1 0 VDS, Drain-Source Voltage [V] 20 30 40 50 60 QG, Total Gate Charge [nC] 3 FDB52N20 Rev. A 10 www.fairchildsemi.com FDB52N20 200V N-Channel MOSFET Typical Performance Characteristics FDB52N20 200V N-Channel MOSFET Typical Performance Characteristics (Continued) Figure 7. Breakdown Voltage Variation vs. Temperature Figure 8. On-Resistance Variation vs. Temperature 3.0 RDS(ON), (Normalized) Drain-Source On-Resistance BVDSS, (Normalized) Drain-Source Breakdown Voltage 1.2 1.1 1.0 * Notes : 1. VGS = 0 V 0.9 2. ID = 250µA 2.5 2.0 1.5 1.0 * Notes : 1. VGS = 10 V 0.5 2. ID = 26 A 0.8 -100 -50 0 50 100 150 0.0 -100 200 -50 0 TJ, Junction Temperature [°C] 50 100 150 200 TJ, Junction Temperature [°C] Figure 9. Maximum Safe Operating Area Figure 10. Maximum Drain Current vs. Case Temperature 3 10 60 10 µs 2 1 10 ID, Drain Current [A] ID, Drain Current [A] 50 100 µs 1 ms 10 ms 100 ms DC 10 Operation in This Area is Limited by R DS(on) 0 10 * Notes : 1. TC = 25°C -1 10 2. TJ = 150°C -2 0 10 1 20 0 25 2 10 30 10 3. Single Pulse 10 40 10 50 75 100 125 150 TC, Case Temperature [°C] VDS, Drain-Source Voltage [V] ZθJC(t), Thermal Response Figure 11. Transient Thermal Response Curve D = 0 .5 10 -1 0 .2 0 .1 * N o te s : 1 . Z θ J C (t) = 0 .3 5 ° C /W M a x . 0 .0 5 2 . D u ty F a c to r, D = t 1 /t 2 0 .0 2 10 3 . T J M - T C = P D M * Z θ J C (t) -2 0 .0 1 PDM s in g le p u ls e t1 t2 10 -5 10 -4 10 -3 10 -2 10 -1 10 0 10 1 t 1 , S q u a re W a v e P u ls e D u ra tio n [s e c ] 4 FDB52N20 Rev. A www.fairchildsemi.com FDB52N20 200V N-Channel MOSFET Gate Charge Test Circuit & Waveform VGS Same Type as DUT 50KΩ Qg 200nF 12V 10V 300nF VDS VGS Qgs Qgd DUT 3mA Charge Resistive Switching Test Circuit & Waveforms VDS RL VDS 90% VDD VGS RG VGS DUT 10V 10% td(on) tr td(off) t on tf t off Unclamped Inductive Switching Test Circuit & Waveforms BVDSS 1 EAS = ---- L IAS2 -------------------2 BVDSS - VDD L VDS BVDSS IAS ID RG VDD tp tp 5 FDB52N20 Rev. A VDS (t) VDD DUT 10V ID (t) Time www.fairchildsemi.com FDB52N20 200V N-Channel MOSFET Peak Diode Recovery dv/dt Test Circuit & Waveforms DUT + VDS _ I SD L Driver RG VGS VGS ( Driver ) Same Type as DUT VDD • dv/dt controlled by RG • ISD controlled by pulse period Gate Pulse Width D = -------------------------Gate Pulse Period 10V IFM , Body Diode Forward Current I SD ( DUT ) di/dt IRM Body Diode Reverse Current VDS ( DUT ) Body Diode Recovery dv/dt VSD VDD Body Diode Forward Voltage Drop 6 FDB52N20 Rev. A www.fairchildsemi.com FDB52N20 200V N-Channel MOSFET Mechanical Dimensions D2-PAK 7 FDB52N20 Rev. A www.fairchildsemi.com The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is not intended to be an exhaustive list of all such trademarks. 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FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. LIFE SUPPORT POLICY FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION. 2. A critical component is any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, or (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in significant injury to the user. PRODUCT STATUS DEFINITIONS Definition of Terms Datasheet Identification Product Status Definition Advance Information Formative or In Design This datasheet contains the design specifications for product development. Specifications may change in any manner without notice. Preliminary First Production This datasheet contains preliminary data, and supplementary data will be published at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice in order to improve design. No Identification Needed Full Production This datasheet contains final specifications. Fairchild Semiconductor reserves the right to make changes at any time without notice in order to improve design. Obsolete Not In Production This datasheet contains specifications on a product that has been discontinued by Fairchild semiconductor. The datasheet is printed for reference information only. Rev. I16 8 FDB52N20 Rev. A www.fairchildsemi.com FDB52N20 200V N-Channel MOSFET TRADEMARKS