CY7C1381D/CY7C1381F CY7C1383D/CY7C1383F 18 Mbit (512 K × 36/1 M × 18) Flow Through SRAM 18 Mbit (512 K × 36/1 M × 18) Flow Through SRAM Features Functional Description ■ Supports 133 MHz bus operations ■ 512 K × 36 and 1 M × 18 common I/O ■ 3.3 V core power supply (VDD) ■ 2.5 V or 3.3 V I/O supply (VDDQ) ■ Fast clock-to-output time ❐ 6.5 ns (133 MHz version) ■ Provides high performance 2-1-1-1 access rate ■ User selectable burst counter supporting Intel Pentium interleaved or linear burst sequences ■ Separate processor and controller address strobes ■ Synchronous self-timed write ■ Asynchronous output enable ■ CY7C1381D/CY7C1381F available in JEDEC-standard Pb-free 100-pin TQFP, Pb-free and non Pb-free 165-ball FPBGA package. CY7C1381F/CY7C1383F available in Pb-free and non Pb-free 119-ball BGA package ■ IEEE 1149.1 JTAG-Compatible Boundary Scan ■ ZZ sleep mode option The CY7C1381D/CY7C1381F/CY7C1383D/CY7C1383F is a 3.3 V, 512 K × 36 and 1 M × 18 synchronous flow through SRAMs, designed to interface with high speed microprocessors with minimum glue logic[1]. Maximum access delay from clock rise is 6.5 ns (133 MHz version). A 2-bit on-chip counter captures the first address in a burst and increments the address automatically for the rest of the burst access. All synchronous inputs are gated by registers controlled by a positive edge triggered clock input (CLK). The synchronous inputs include all addresses, all data inputs, address pipelining chip enable (CE1), depth-expansion chip enables (CE2 and CE3 [2]), burst control inputs (ADSC, ADSP, and ADV), write enables (BWx, and BWE), and global write (GW). Asynchronous inputs include the output enable (OE) and the ZZ pin. The CY7C1381D/CY7C1381F/CY7C1383D/CY7C1383F allows interleaved or linear burst sequences, selected by the MODE input pin. A HIGH selects an interleaved burst sequence, while a LOW selects a linear burst sequence. Burst accesses can be initiated with the processor address strobe (ADSP) or the cache controller address strobe (ADSC) inputs. Address advancement is controlled by the address advancement (ADV) input. Addresses and chip enables are registered at rising edge of clock when address strobe processor (ADSP) or address strobe controller (ADSC) are active. Subsequent burst addresses can be internally generated as controlled by the advance pin (ADV). CY7C1381D/CY7C1381F/CY7C1383D/CY7C1383F operates from a +3.3 V core power supply while all outputs operate with a +2.5 V or +3.3 V supply. All inputs and outputs are JEDEC-standard and JESD8-5-compatible. Notes 1. For best practices or recommendations, refer to the Cypress application note AN1064, SRAM System Design Guidelines on www.cypress.com. 2. CE3, CE2 are for TQFP and 165 FBGA packages only. 119 BGA is offered only in 1 chip enable. Cypress Semiconductor Corporation Document Number: 38-05544 Rev. *I • 198 Champion Court • San Jose, CA 95134-1709 • 408-943-2600 Revised February 3, 2011 [+] Feedback CY7C1381D/CY7C1381F CY7C1383D/CY7C1383F Logic Block Diagram – CY7C1381D/CY7C1381F [3] (512 K × 36) ADDRESS REGISTER A0, A1, A A [1:0] MODE Q1 ADV BURST COUNTER AND LOGIC Q0 CLR CLK ADSC ADSP DQ D , DQP D DQ D , DQP D BW D BYTE BYTE WRITE REGISTER WRITE REGISTER DQ C , DQP C DQ C , DQP C BW C WRITE REGISTER WRITE REGISTER MEMORY ARRAY DQ B , DQP B DQ B , DQP B BW B SENSE AMPS OUTPUT BUFFERS DQs DQP A DQP B DQP C WRITE REGISTER DQP D WRITE REGISTER DQ A , DQP DQ A , DQP BW A BYTE A WRITE REGISTER BYTE BWE WRITE REGISTER INPUT REGISTERS GW ENABLE REGISTER CE1 CE2 CE3 OE SLEEP Logic Block Diagram – CY7C1383D/CY7C1383F [3] (1 M × 18) A0,A1,A ADDRESS REGISTER A[1:0] MODE BURST Q1 COUNTER AND ADV Q0 DQ B ,DQP B BW B DQ A ,DQP A BW A DQ B ,DQP B WRITE DRIVER MEMORY ARRAY SENSE AMPS OUTPUT BUFFERS DQs DQP A DQP B DQ A ,DQP A WRITE DRIVER BWE GW CE 1 CE 2 CE 3 ENABLE INPUT REGISTERS OE SLEEP CONTROL Note 3. CY7C1381F and CY7C1383F have only 1 chip enable (CE1). Document Number: 38-05544 Rev. *I Page 2 of 34 [+] Feedback CY7C1381D/CY7C1381F CY7C1383D/CY7C1383F Contents Selection Guide ................................................................ 4 Pin Configurations ........................................................... 5 Pin Definitions .................................................................. 8 Functional Overview ........................................................ 9 Single Read Accesses .............................................. 10 Single Write Accesses Initiated by ADSP ................. 10 Single Write Accesses Initiated by ADSC ................. 10 Burst Sequences ............................................................ 10 Sleep Mode ............................................................... 10 ZZ Mode Electrical Characteristics ............................... 11 Truth Table ...................................................................... 12 Truth Table for Read/Write ............................................ 13 Truth Table for Read/Write ............................................ 13 IEEE 1149.1 Serial Boundary Scan (JTAG) .................. 14 Disabling the JTAG Feature ...................................... 14 TAP Controller State Diagram ....................................... 14 Test Access Port (TAP) ............................................. 14 TAP Controller Block Diagram ...................................... 14 PERFORMING A TAP RESET .................................. 14 TAP REGISTERS ...................................................... 14 TAP Instruction Set ................................................... 15 TAP Timing ...................................................................... 16 TAP AC Switching Characteristics ............................... 16 3.3 V TAP AC Test Conditions ....................................... 17 3.3 V TAP AC Output Load Equivalent ......................... 17 Document Number: 38-05544 Rev. *I TAP DC Electrical Characteristics and Operating Conditions ..................................................... 17 Identification Register Definitions ................................ 18 Scan Register Sizes ....................................................... 18 Identification Codes ....................................................... 18 119-ball BGA Boundary Scan Order ............................. 19 165-ball BGA Boundary Scan Order ............................. 20 Maximum Ratings ........................................................... 21 Operating Range ............................................................. 21 Neutron Soft Error Immunity ......................................... 21 Electrical Characteristics ............................................... 21 Capacitance .................................................................... 22 Thermal Resistance ........................................................ 22 Switching Characteristics .............................................. 23 Timing Diagrams ............................................................ 24 Ordering Information ...................................................... 28 Ordering Code Definitions ......................................... 28 Package Diagrams .......................................................... 29 Acronyms ........................................................................ 32 Document Conventions ................................................. 32 Units of Measure ....................................................... 32 Document History Page ................................................. 33 Sales, Solutions, and Legal Information ...................... 34 Worldwide Sales and Design Support ....................... 34 Products .................................................................... 34 PSoC Solutions ......................................................... 34 Page 3 of 34 [+] Feedback CY7C1381D/CY7C1381F CY7C1383D/CY7C1383F Selection Guide Description 133 MHz 100 MHz Unit Maximum Access Time 6.5 8.5 ns Maximum Operating Current 210 175 mA Maximum CMOS Standby Current 70 70 mA Document Number: 38-05544 Rev. *I Page 4 of 34 [+] Feedback CY7C1381D/CY7C1381F CY7C1383D/CY7C1383F Pin Configurations NC NC NC CY7C1383D (1 M × 18) 80 79 78 77 76 75 74 73 72 71 70 69 68 67 66 65 64 63 62 61 60 59 58 57 56 55 54 53 52 51 Document Number: 38-05544 Rev. *I A NC NC VDDQ VSSQ NC DQPA DQA DQA VSSQ VDDQ DQA DQA VSS NC VDD ZZ DQA DQA VDDQ VSSQ DQA DQA NC NC VSSQ VDDQ NC NC NC A A A A A A A A A A A A A A A A A A 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 VDDQ VSSQ NC NC DQB DQB VSSQ VDDQ DQB DQB VSS/DNU VDD NC VSS DQB DQB VDDQ VSSQ DQB DQB DQPB NC VSSQ VDDQ NC NC NC 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 MODE A A A A A1 A0 NC NC VSS VDD DQPB DQB DQB VDDQ VSSQ DQB DQB DQB DQB VSSQ VDDQ DQB DQB VSS NC VDD ZZ DQA DQA VDDQ VSSQ DQA DQA DQA DQA VSSQ VDDQ DQA DQA DQPA 100 99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81 100 99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81 CY7C1381D (512 K × 36) 80 79 78 77 76 75 74 73 72 71 70 69 68 67 66 65 64 63 62 61 60 59 58 57 56 55 54 53 52 51 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 MODE A A A A A1 A0 NC NC VSS VDD DQPC DQC DQC VDDQ VSSQ DQC DQC DQC DQC VSSQ VDDQ DQC DQC VSS/DNU VDD NC VSS DQD DQD VDDQ VSSQ DQD DQD DQD DQD VSSQ VDDQ DQD DQD DQPD A A CE1 CE2 NC NC BWB BWA CE3 VDD VSS CLK GW BWE OE ADSC ADSP ADV A A A A CE1 CE2 BWD BWC BWB BWA CE3 VDD VSS CLK GW BWE OE ADSC ADSP ADV A A Figure 1. 100-pin TQFP Pinout (3 Chip Enable) Page 5 of 34 [+] Feedback CY7C1381D/CY7C1381F CY7C1383D/CY7C1383F Pin Configurations (continued) Figure 2. 119-ball BGA Pinout CY7C1381F (512 K × 36) A 1 VDDQ 2 A 3 A ADSP 4 5 A 6 A 7 VDDQ B C NC/288M NC/144M A A A A ADSC VDD A A A A NC/576M NC/1G D E DQC DQC DQPC DQC VSS VSS NC CE1 VSS VSS DQPB DQB DQB DQB F VDDQ DQC VSS OE VSS DQB VDDQ G H J K DQC DQC VDDQ DQD DQC DQC VDD DQD BWC VSS NC VSS ADV BWB VSS NC VSS DQB DQB VDD DQA DQB DQB VDDQ DQA BWA VSS DQA DQA DQA VDDQ GW VDD CLK L DQD DQD M VDDQ DQD BWD VSS N DQD DQD VSS BWE A1 NC VSS DQA DQA P DQD DQPD VSS A0 VSS DQPA DQA R NC A MODE VDD NC A NC T U NC VDDQ NC/72M TMS A TDI A TCK A TDO NC/36M NC ZZ VDDQ 5 6 7 CY7C1383F (1 M × 18) A 1 2 3 4 VDDQ A A ADSP A A VDDQ ADSC VDD A A A NC/576M A B NC/288M A A C NC/144M A A D DQB NC VSS NC VSS DQPA NC E NC DQB VSS CE1 VSS NC DQA F VDDQ NC VSS VSS DQA VDDQ G H J NC DQB VDDQ DQB NC VDD BWB VSS NC OE ADV NC VSS NC DQA VDD DQA NC VDDQ K NC DQB VSS NC DQA L M DQB VDDQ NC DQB NC VSS BWA VSS DQA NC NC VDDQ N DQB NC VSS BWE A1 VSS DQA NC P NC DQPB VSS A0 VSS NC DQA R T U NC NC/72M VDDQ A A TMS MODE A TDI VDD NC/36M TCK NC A TDO A A NC NC ZZ VDDQ Document Number: 38-05544 Rev. *I GW VDD CLK NC NC VSS NC/1G Page 6 of 34 [+] Feedback CY7C1381D/CY7C1381F CY7C1383D/CY7C1383F Pin Configurations (continued) Figure 3. 165-ball FBGA Pinout (3 Chip Enable) CY7C1381D (512 K × 36) 2 3 4 5 6 7 8 9 10 11 A B C D E F G H J K L M N P NC/288M 1 A CE1 BWC BWB CE3 BWE ADSC ADV A NC NC/144M A CE2 BWD BWA CLK GW OE ADSP A NC/576M DQPC DQC NC DQC VDDQ VSS VDD VSS VSS VSS VSS VSS VSS VSS VDD VDDQ VDDQ VDDQ NC/1G DQB DQPB DQB DQC DQC VDDQ VDD VSS VSS VSS VDD VDDQ DQB DQB DQC DQC VDDQ VDD VSS VSS VSS VDD VDDQ DQB DQB DQC NC DQD DQC NC DQD VDDQ NC VDDQ VDD VDD VDD VSS VSS VSS VSS VSS VSS VSS VSS VSS VDD VDD VDD VDDQ NC VDDQ DQB NC DQA DQB ZZ DQA DQD DQD VDDQ VDD VSS VSS VSS VDD VDDQ DQA DQA DQD DQD VDDQ VDD VSS VSS VSS VDD VDDQ DQA DQA DQD DQPD DQD NC VDDQ VDDQ VDD VSS VSS NC VSS VDD VSS VDDQ VDDQ DQA NC DQA DQPA NC NC/72M A A TDI A A1 VSS NC TDO A A A A R MODE NC/36M A A TMS A0 TCK A A A A CY7C1383D (1 M × 18) 1 2 3 4 5 6 7 8 9 10 11 A B C D E F G H J K L M N P NC/288M A CE1 BWB NC CE3 BWE ADSC ADV A A NC/144M A CE2 NC BWA CLK GW OE ADSP A NC NC NC DQB VDDQ VSS VDD VSS VSS VSS VSS VSS VSS VSS VDD VDDQ VDDQ VDDQ NC/1G NC NC DQB VDDQ VDD VSS VSS VSS VDD VDDQ NC DQA NC NC VSS DQB DQB VDD VDD VDD VDD VDDQ VDDQ NC VDDQ NC VSS VSS VSS VSS VSS VSS VSS VDD VDD VDD VDD VSS VSS VSS VSS VSS DQB NC NC VDDQ VDDQ NC VDDQ NC NC DQA DQA DQA ZZ NC DQB NC VDDQ VDD VSS VSS VSS VDD VDDQ DQA NC DQB NC VDDQ VDD VSS VSS VSS VDD VDDQ DQA NC DQB DQPB NC NC VDDQ VDDQ VDD VSS VSS NC VSS A VSS NC VDD VSS VDDQ VDDQ DQA NC NC NC NC NC/72M A A TDI A1 TDO A A A A R MODE NC/36M A A TMS A0 TCK A A A A Document Number: 38-05544 Rev. *I NC/576M DQPA DQA Page 7 of 34 [+] Feedback CY7C1381D/CY7C1381F CY7C1383D/CY7C1383F Pin Definitions Name I/O Description A0, A1, A Input Synchronous Address inputs used to select one of the address locations. Sampled at the rising edge of the CLK if ADSP or ADSC is active LOW, and CE1, CE2, and CE3 [4] are sampled active. A[1:0] feed the 2-bit counter. BWA, BWB BWC, BWD Input Synchronous Byte write select inputs, active LOW. Qualified with BWE to conduct byte writes to the SRAM. Sampled on the rising edge of CLK. GW Input Synchronous Global write enable input, active LOW. When asserted LOW on the rising edge of CLK, a global write is conducted (all bytes are written, regardless of the values on BW[A:D] and BWE). CLK Input Clock Clock input. Used to capture all synchronous inputs to the device. Also used to increment the burst counter when ADV is asserted LOW, during a burst operation. CE1 Input Synchronous Chip enable 1 input, active LOW. Sampled on the rising edge of CLK. Used in conjunction with CE2 and CE3 [4] to select or deselect the device. ADSP is ignored if CE1 is HIGH. CE1 is sampled only when a new external address is loaded. CE2 Input Synchronous Chip enable 2 input, active HIGH. Sampled on the rising edge of CLK. Used in conjunction with CE1 and CE3 [4] to select or deselect the device. CE2 is sampled only when a new external address is loaded. CE3 [4] Input Synchronous Chip enable 3 input, active LOW. Sampled on the rising edge of CLK. Used in conjunction with CE1 and CE2 to select or deselect the device. CE3 is sampled only when a new external address is loaded. OE Input Asynchronous Output enable, asynchronous input, active LOW. Controls the direction of the I/O pins. When LOW, the I/O pins behave as outputs. When deasserted HIGH, I/O pins are tristated, and act as input data pins. OE is masked during the first clock of a read cycle when emerging from a deselected state. ADV Input Synchronous Advance input signal. Sampled on the rising edge of CLK. When asserted, it automatically increments the address in a burst cycle. ADSP Input Synchronous Address strobe from processor, sampled on the rising edge of CLK, active LOW. When asserted LOW, addresses presented to the device are captured in the address registers. A[1:0] are also loaded into the burst counter. When ADSP and ADSC are both asserted, only ADSP is recognized. ASDP is ignored when CE1 is deasserted HIGH. ADSC Input Synchronous Address strobe from controller, sampled on the rising edge of CLK, active LOW. When asserted LOW, addresses presented to the device are captured in the address registers. A[1:0] are also loaded into the burst counter. When ADSP and ADSC are both asserted, only ADSP is recognized. BWE Input Synchronous Byte write enable input, active LOW. Sampled on the rising edge of CLK. This signal must be asserted LOW to conduct a byte write. ZZ Input Asynchronous ZZ sleep input. This active HIGH input places the device in a non time critical sleep condition with data integrity preserved. For normal operation, this pin has to be LOW or left floating. ZZ pin has an internal pull down. Note 4. CE3, CE2 are for TQFP and 165 FBGA packages only. 119 BGA is offered only in 1 chip enable. Document Number: 38-05544 Rev. *I Page 8 of 34 [+] Feedback CY7C1381D/CY7C1381F CY7C1383D/CY7C1383F Pin Definitions (continued) Name I/O Description DQs I/O Synchronous Bidirectional data I/O lines. As inputs, they feed into an on-chip data register that is triggered by the rising edge of CLK. As outputs, they deliver the data contained in the memory location specified by the addresses presented during the previous clock rise of the read cycle. The direction of the pins is controlled by OE. When OE is asserted LOW, the pins behave as outputs. When HIGH, DQs and DQPX are placed in a tristate condition.The outputs are automatically tristated during the data portion of a write sequence, during the first clock when emerging from a deselected state, and when the device is deselected, regardless of the state of OE. DQPX I/O Synchronous Bidirectional data parity I/O lines. Functionally, these signals are identical to DQs. During write sequences, DQPX is controlled by BWX correspondingly. MODE Input Static Selects burst order. When tied to GND selects linear burst sequence. When tied to VDD or left floating selects interleaved burst sequence. This is a strap pin and must remain static during device operation. Mode pin has an internal pull-up. VDD VDDQ VSS VSSQ Power Supply Power supply inputs to the core of the device. I/O Power Supply Power supply for the I/O circuitry. Ground I/O Ground Ground for the core of the device. Ground for the I/O circuitry. TDO JTAG Serial Output Serial data-out to the JTAG circuit. Delivers data on the negative edge of TCK. If the JTAG Synchronous feature is not being used, this pin can be left unconnected. This pin is not available on TQFP packages. TDI JTAG Serial Input Serial data-in to the JTAG circuit. Sampled on the rising edge of TCK. If the JTAG feature Synchronous is not being used, this pin can be left floating or connected to VDD through a pull-up resistor. This pin is not available on TQFP packages. TMS JTAG Serial Input Serial data-in to the JTAG circuit. Sampled on the rising edge of TCK. If the JTAG feature Synchronous is not being used, this pin can be disconnected or connected to VDD. This pin is not available on TQFP packages. TCK JTAG Clock Clock input to the JTAG circuitry. If the JTAG feature is not being used, this pin must be connected to VSS. This pin is not available on TQFP packages. NC – No connects. Not internally connected to the die. 36M, 72M, 144M, 288M, 576M, and 1G are address expansion pins and are not internally connected to the die. VSS/DNU Ground/DNU This pin can be connected to ground or can be left floating. Functional Overview All synchronous inputs pass through input registers controlled by the rising edge of the clock. Maximum access delay from the clock rise (t CDV) is 6.5 ns (133 MHz device). CY7C1381D/CY7C1381F/CY7C1383D/CY7C1383F supports secondary cache in systems using a linear or interleaved burst sequence. The interleaved burst order supports Pentium and i486 processors. The linear burst sequence is suited for processors that use a linear burst sequence. The burst order is user selectable, and is determined by sampling the MODE input. Document Number: 38-05544 Rev. *I Accesses can be initiated with the processor address strobe (ADSP) or the controller address strobe (ADSC). Address advancement through the burst sequence is controlled by the ADV input. A two-bit on-chip wraparound burst counter captures the first address in a burst sequence and automatically increments the address for the rest of the burst access. Byte write operations are qualified with the byte write enable (BWE) and byte write select (BWX) inputs. A global write enable (GW) overrides all byte write inputs and writes data to all four bytes. All writes are simplified with on-chip synchronous self-timed write circuitry. Page 9 of 34 [+] Feedback CY7C1381D/CY7C1381F CY7C1383D/CY7C1383F Three synchronous chip selects (CE1, CE2, CE3 [5]) and an asynchronous output enable (OE) provide for easy bank selection and output tristate control. ADSP is ignored if CE1 is HIGH. Single Read Accesses A single read access is initiated when the following conditions are satisfied at clock rise: (1) CE1, CE2, and CE3 [5] are all asserted active, and (2) ADSP or ADSC is asserted LOW (if the access is initiated by ADSC, the write inputs must be deasserted during this first cycle). The address presented to the address inputs is latched into the address register and the burst counter and/or control logic, and later presented to the memory core. If the OE input is asserted LOW, the requested data is available at the data outputs with a maximum to tCDV after clock rise. ADSP is ignored if CE1 is HIGH. Single Write Accesses Initiated by ADSP This access is initiated when the following conditions are satisfied at clock rise: (1) CE1, CE2, CE3 [5] are all asserted active, and (2) ADSP is asserted LOW. The addresses presented are loaded into the address register and the burst inputs (GW, BWE, and BWX) are ignored during this first clock cycle. If the write inputs are asserted active (see Truth Table for Read/Write on page 13 for appropriate states that indicate a write) on the next clock rise, the appropriate data is latched and written into the device. Byte writes are allowed. All I/O are tristated during a byte write. As this is a common I/O device, the asynchronous OE input signal must be deasserted and the I/O must be tristated prior to the presentation of data to DQs. As a safety precaution, the data lines are tristated when a write cycle is detected, regardless of the state of OE. Single Write Accesses Initiated by ADSC This write access is initiated when the following conditions are satisfied at clock rise: (1) CE1, CE2, and CE3 [5] are all asserted active, (2) ADSC is asserted LOW, (3) ADSP is deasserted HIGH, and (4) the write input signals (GW, BWE, and BWX) indicate a write access. ADSC is ignored if ADSP is active LOW. The addresses presented are loaded into the address register and the burst counter, the control logic, or both, and delivered to the memory core The information presented to DQ[A:D] is written into the specified address location. Byte writes are allowed. All I/O are tristated when a write is detected, even a byte write. Because this is a common I/O device, the asynchronous OE input signal must be deasserted and the I/O must be tristated prior to the presentation of data to DQs. As a safety precaution, the data lines are tristated when a write cycle is detected, regardless of the state of OE. Burst Sequences CY7C1381D/CY7C1381F/CY7C1383D/CY7C1383F provides an on-chip two-bit wraparound burst counter inside the SRAM. The burst counter is fed by A[1:0], and can follow either a linear or interleaved burst order. The burst order is determined by the state of the MODE input. A LOW on MODE selects a linear burst sequence. A HIGH on MODE selects an interleaved burst order. Leaving MODE unconnected causes the device to default to a interleaved burst sequence. Sleep Mode The ZZ input pin is an asynchronous input. Asserting ZZ places the SRAM in a power conservation sleep mode. Two clock cycles are required to enter into or exit from this sleep mode. While in this mode, data integrity is guaranteed. Accesses pending when entering the sleep mode are not considered valid nor is the completion of the operation guaranteed. The device must be deselected prior to entering the sleep mode. CE1, CE2, CE3 [5], ADSP, and ADSC must remain inactive for the duration of tZZREC after the ZZ input returns LOW. Table 1. Interleaved Burst Address Table (MODE = Floating or VDD) First Address A1: A0 Second Address A1: A0 Third Address A1: A0 Fourth Address A1: A0 00 01 10 11 01 00 11 10 10 11 00 01 11 10 01 00 Table 2. Linear Burst Address Table (MODE = GND) First Address A1: A0 Second Address A1: A0 Third Address A1: A0 Fourth Address A1: A0 00 01 10 11 01 10 11 00 10 11 00 01 11 00 01 10 Note 5. CE3, CE2 are for TQFP and 165 FBGA packages only. 119 BGA is offered only in 1 chip enable. Document Number: 38-05544 Rev. *I Page 10 of 34 [+] Feedback CY7C1381D/CY7C1381F CY7C1383D/CY7C1383F ZZ Mode Electrical Characteristics Parameter IDDZZ tZZS tZZREC tZZI tRZZI Description Sleep mode standby current Device operation to ZZ ZZ recovery time ZZ active to sleep current ZZ inactive to exit sleep current Document Number: 38-05544 Rev. *I Test Conditions ZZ > VDD– 0.2 V ZZ > VDD – 0.2 V ZZ < 0.2 V This parameter is sampled This parameter is sampled Min Max Unit – – 80 2tCYC – 2tCYC – mA ns ns ns ns 2tCYC – 0 Page 11 of 34 [+] Feedback CY7C1381D/CY7C1381F CY7C1383D/CY7C1383F Truth Table The truth table for CY7C1381D/CY7C1381F/CY7C1383D/CY7C1383F follows.[6, 7, 8, 9, 10] Cycle Description ADDRESS Used CE1 CE2 CE3 ZZ ADSP ADSC ADV WRITE OE CLK DQ Deselected Cycle, Power Down None H X X L X L X X X L–H Tri-State Deselected Cycle, Power Down None L L X L L X X X X L–H Tri-State Deselected Cycle, Power Down None L X H L L X X X X L–H Tri-State Deselected Cycle, Power Down None L L X L H L X X X L–H Tri-State Deselected Cycle, Power Down None X X X L H L X X X L–H Tri-State Sleep Mode, Power Down None X X X H X X X X X Read Cycle, Begin Burst External L H L L L X X X L L–H Q Read Cycle, Begin Burst External L H L L L X X X H L–H Tri-State X Tri-State Write Cycle, Begin Burst External L H L L H L X L X L–H D Read Cycle, Begin Burst External L H L L H L X H L L–H Q Read Cycle, Begin Burst External L H L L H L X H H L–H Tri-State Read Cycle, Continue Burst Next X X X L H H L H L L–H Q Read Cycle, Continue Burst Next X X X L H H L H H L–H Tri-State Read Cycle, Continue Burst Next H X X L X H L H L L–H Q Read Cycle, Continue Burst Next H X X L X H L H H L–H Tri-State Write Cycle, Continue Burst Next X X X L H H L L X L–H D Write Cycle, Continue Burst Next H X X L X H L L X L–H D Read Cycle, Suspend Burst Current X X X L H H H H L L–H Q Read Cycle, Suspend Burst Current X X X L H H H H H L–H Tri-State Read Cycle, Suspend Burst Current H X X L X H H H L L–H Q Read Cycle, Suspend Burst Current H X X L X H H H H L–H Tri-State Write Cycle, Suspend Burst Current X X X L H H H L X L–H D Write Cycle, Suspend Burst Current H X X L X H H L X L–H D Notes 6. X=Don't Care, H = Logic HIGH, L = Logic LOW. 7. WRITE = L when any one or more byte write enable signals, and BWE = L or GW = L. WRITE = H when all byte write enable signals, BWE, GW = H. 8. The DQ pins are controlled by the current cycle and the OE signal. OE is asynchronous and is not sampled with the clock. 9. The SRAM always initiates a read cycle when ADSP is asserted, regardless of the state of GW, BWE, or BWX. Writes may occur only on subsequent clocks after the ADSP or with the assertion of ADSC. As a result, OE must be driven HIGH prior to the start of the write cycle to allow the outputs to tristate. OE is a don't care for the remainder of the write cycle. 10. OE is asynchronous and is not sampled with the clock rise. It is masked internally during write cycles. During a read cycle all data bits are tristate when OE is inactive or when the device is deselected, and all data bits behave as output when OE is active (LOW). Document Number: 38-05544 Rev. *I Page 12 of 34 [+] Feedback CY7C1381D/CY7C1381F CY7C1383D/CY7C1383F Truth Table for Read/Write The truth table for CY7C1381D/CY7C1381F read/write follows[11, 12]. Function (CY7C1381D/CY7C1381F) GW BWE BWD BWC BWB BWA Read H H X X X X Read H L H H H H Write Byte A (DQA, DQPA) H L H H H L Write Byte B(DQB, DQPB) H L H H L H Write Bytes A, B (DQA, DQB, DQPA, DQPB) H L H H L L Write Byte C (DQC, DQPC) H L H L H H Write Bytes C, A (DQC, DQA, DQPC, DQPA) H L H L H L Write Bytes C, B (DQC, DQB, DQPC, DQPB) H L H L L H Write Bytes C, B, A (DQC, DQB, DQA, DQPC, DQPB, DQPA) H L H L L L Write Byte D (DQD, DQPD) H L L H H H Write Bytes D, A (DQD, DQA, DQPD, DQPA) H L L H H L Write Bytes D, B (DQD, DQA, DQPD, DQPA) H L L H L H Write Bytes D, B, A (DQD, DQB, DQA, DQPD, DQPB, DQPA) H L L H L L Write Bytes D, B (DQD, DQB, DQPD, DQPB) H L L L H H Write Bytes D, B, A (DQD, DQC, DQA, DQPD, DQPC, DQPA) H L L L H L Truth Table for Read/Write The truth table for CY7C1383D/CY7C1383F read/write follows[11, 12]. Function (CY7C1383D/CY7C1383F) GW BWE BWB BWA Write Bytes D, C, A (DQD, DQB, DQA, DQPD, DQPB, DQPA) H L L L Write All Bytes H L L L Write All Bytes L X X X Read H H X X Read H L H H Write Byte A – (DQA and DQPA) H L H L Write Byte B – (DQB and DQPB) H L L H Write All Bytes H L L L Write All Bytes L X X X Notes 11. X=Don't Care, H = Logic HIGH, L = Logic LOW. 12. The table only lists a partial listing of the byte write combinations. Any combination of BWX is valid. Appropriate write is done based on which byte write is active. Document Number: 38-05544 Rev. *I Page 13 of 34 [+] Feedback CY7C1381D/CY7C1381F CY7C1383D/CY7C1383F IEEE 1149.1 Serial Boundary Scan (JTAG) Test Data-In (TDI) The CY7C1381D/CY7C1381F/CY7C1383D/CY7C1383F incorporates a serial boundary scan test access port (TAP).This part is fully compliant with 1149.1. The TAP operates using JEDEC-standard 3.3 V or 2.5 V I/O logic levels. The TDI ball is used to serially input information into the registers and can be connected to the input of any of the registers. The register between TDI and TDO is chosen by the instruction that is loaded into the TAP instruction register. TDI is internally pulled up and can be unconnected if the TAP is unused in an application. TDI is connected to the most significant bit (MSB) of any register. (See TAP Controller Block Diagram.) CY7C1381D/CY7C1381F/CY7C1383D/CY7C1383F contains a TAP controller, instruction register, boundary scan register, bypass register, and ID register. Test Data-Out (TDO) Disabling the JTAG Feature It is possible to operate the SRAM without using the JTAG feature. To disable the TAP controller, TCK must be tied LOW (VSS) to prevent clocking of the device. TDI and TMS are internally pulled up and may be unconnected. They may alternately be connected to VDD through a pull-up resistor. TDO may be left unconnected. At power up, the device comes up in a reset state, which does not interfere with the operation of the device. The TDO output ball is used to serially clock data-out from the registers. The output is active depending upon the current state of the TAP state machine. The output changes on the falling edge of TCK. TDO is connected to the least significant bit (LSB) of any register. (See TAP Controller State Diagram.) TAP Controller Block Diagram 0 TAP Controller State Diagram Bypass Register 2 1 0 1 TEST-LOGIC RESET TDI 0 0 RUN-TEST/ IDLE 1 SELECT DR-SCAN 1 SELECT IR-SCAN 0 1 1 CAPTURE-DR 31 30 29 . . . 2 1 0 1 S election Circuitr TDO y Identification Register x . . . . . 2 1 0 CAPTURE-IR 0 Boundary Scan Register 0 0 SHIFT-IR 1 0 1 EXIT1-DR 1 EXIT1-IR 0 1 0 PAUSE-IR 1 TCK TMS 0 PAUSE-DR TAP CONTROLLER 0 1 EXIT2-DR 0 EXIT2-IR 1 1 UPDATE-DR 1 Instruction Register 0 SHIFT-DR 0 Selection Circuitry 0 UPDATE-IR 1 0 The 0 or 1 next to each state represents the value of TMS at the rising edge of TCK. Test Access Port (TAP) Test Clock (TCK) The test clock is used only with the TAP controller. All inputs are captured on the rising edge of TCK. All outputs are driven from the falling edge of TCK. Test Mode Select (TMS) The TMS input is used to give commands to the TAP controller and is sampled on the rising edge of TCK. This pin may be left unconnected if the TAP is not used. The ball is pulled up internally, resulting in a logic HIGH level. Document Number: 38-05544 Rev. *I Performing a TAP Reset A reset is performed by forcing TMS HIGH (VDD) for five rising edges of TCK. This reset does not affect the operation of the SRAM and may be performed while the SRAM is operating. At power up, the TAP is reset internally to ensure that TDO comes up in a high Z state. TAP Registers Registers are connected between the TDI and TDO balls and allow data to be scanned in and out of the SRAM test circuitry. Only one register can be selected at a time through the instruction registers. Data is serially loaded into the TDI ball on the rising edge of TCK. Data is output on the TDO ball on the falling edge of TCK. Instruction Register Three-bit instructions can be serially loaded into the instruction register. This register is loaded when it is placed between the TDI and TDO balls as shown in the TAP Controller Block Diagram. Upon power up, the instruction register is loaded with the IDCODE instruction. It is also loaded with the IDCODE instruction if the controller is placed in a reset state as described in the previous section. Page 14 of 34 [+] Feedback CY7C1381D/CY7C1381F CY7C1383D/CY7C1383F When the TAP controller is in the Capture-IR state, the two least significant bits are loaded with a binary ‘01’ pattern to allow for fault isolation of the board level serial test path. Bypass Register To save time when serially shifting data through registers, it is sometimes advantageous to skip certain chips. The bypass register is a single-bit register that can be placed between the TDI and TDO balls. This allows data to be shifted through the SRAM with minimal delay. The bypass register is set LOW (VSS) when the BYPASS instruction is executed. Boundary Scan Register The boundary scan register is connected to all the input and bidirectional balls on the SRAM. The boundary scan register is loaded with the contents of the RAM input and output ring when the TAP controller is in the Capture-DR state and is then placed between the TDI and TDO balls when the controller is moved to the Shift-DR state. The EXTEST, SAMPLE/PRELOAD, and SAMPLE Z instructions can be used to capture the contents of the input and output ring. The boundary scan order tables show the order in which the bits are connected. Each bit corresponds to one of the bumps on the SRAM package. The MSB of the register is connected to TDI, and the LSB is connected to TDO. Identification (ID) Register The ID register is loaded with a vendor-specific 32-bit code during the Capture-DR state when the IDCODE command is loaded in the instruction register. The IDCODE is hardwired into the SRAM and can be shifted out when the TAP controller is in the Shift-DR state. The ID register has a vendor code and other information described in Identification Register Definitions on page 18. TAP Instruction Set Overview Eight different instructions are possible with the three bit instruction register. All combinations are listed in Identification Codes on page 18. Three of these instructions are listed as RESERVED and must not be used. The other five instructions are described in detail below. Instructions are loaded into the TAP controller during the Shift-IR state, when the instruction register is placed between TDI and TDO. During this state, instructions are shifted through the instruction register through the TDI and TDO balls. To execute the instruction when it is shifted in, the TAP controller needs to be moved into the Update-IR state. EXTEST The EXTEST instruction enables the preloaded data to be driven out through the system output pins. This instruction also selects the boundary scan register to be connected for serial access between the TDI and TDO in the Shift-DR controller state. IDCODE The IDCODE instruction causes a vendor-specific 32-bit code to be loaded into the instruction register. It also places the instruction register between the TDI and TDO balls and allows Document Number: 38-05544 Rev. *I the IDCODE to be shifted out of the device when the TAP controller enters the Shift-DR state. The IDCODE instruction is loaded into the instruction register upon power up or whenever the TAP controller is given a test logic reset state. SAMPLE Z The SAMPLE Z instruction causes the boundary scan register to be connected between the TDI and TDO balls when the TAP controller is in a Shift-DR state. The SAMPLE Z command places all SRAM outputs into a high Z state. SAMPLE/PRELOAD SAMPLE/PRELOAD is a 1149.1 mandatory instruction. When the SAMPLE/PRELOAD instructions are loaded into the instruction register and the TAP controller is in the Capture-DR state, a snapshot of data on the inputs and output pins is captured in the boundary scan register. The user must be aware that the TAP controller clock can only operate at a frequency up to 20 MHz, while the SRAM clock operates more than an order of magnitude faster. Because there is a large difference in the clock frequencies, it is possible that during the Capture-DR state, an input or output undergoes a transition. The TAP may then try to capture a signal while in transition (metastable state). This does not harm the device, but there is no guarantee as to the value that is captured. Repeatable results may not be possible. To guarantee that the boundary scan register captures the correct value of a signal, the SRAM signal must be stabilized long enough to meet the TAP controller's capture setup plus hold times (tCS and tCH). The SRAM clock input might not be captured correctly if there is no way in a design to stop (or slow) the clock during a SAMPLE/PRELOAD instruction. If this is an issue, it is still possible to capture all other signals and simply ignore the value of the CK and CK captured in the boundary scan register. After the data is captured, it is possible to shift out the data by putting the TAP into the Shift-DR state. This places the boundary scan register between the TDI and TDO pins. PRELOAD allows an initial data pattern to be placed at the latched parallel outputs of the boundary scan register cells prior to the selection of another boundary scan test operation. The shifting of data for the SAMPLE and PRELOAD phases can occur concurrently when required; that is, while data captured is shifted out, the preloaded data is shifted in. BYPASS When the BYPASS instruction is loaded in the instruction register and the TAP is placed in a Shift-DR state, the bypass register is placed between the TDI and TDO balls. The advantage of the BYPASS instruction is that it shortens the boundary scan path when multiple devices are connected together on a board. EXTEST Output Bus Tri-State IEEE standard 1149.1 mandates that the TAP controller be able to put the output bus into a tristate mode. The boundary scan register has a special bit located at bit #85 (for 119-BGA package) or bit #89 (for 165-FBGA package). When this scan cell, called the “extest output bus tristate,” is latched into the preload register during the Update-DR state in Page 15 of 34 [+] Feedback CY7C1381D/CY7C1381F CY7C1383D/CY7C1383F the TAP controller, it directly controls the state of the output (Q-bus) pins, when the EXTEST is entered as the current instruction. When HIGH, it enables the output buffers to drive the output bus. When LOW, this bit places the output bus into a high Z condition. the EXTEST instruction is entered, this bit directly controls the output Q-bus pins. Note that this bit is preset HIGH to enable the output when the device is powered up, and also when the TAP controller is in the Test-Logic-Reset state. Reserved This bit can be set by entering the SAMPLE/PRELOAD or EXTEST command, and then shifting the desired bit into that cell, during the Shift-DR state. During Update-DR, the value loaded into that shift-register cell latches into the preload register. When These instructions are not implemented but are reserved for future use. Do not use these instructions. TAP Timing 1 2 Test Clock (TCK) 3 t t TH t TMSS t TMSH t TDIS t TDIH TL 4 5 6 t CYC Test Mode Select (TMS) Test Data-In (TDI) t TDOV t TDOX Test Data-Out (TDO) DON’T CARE UNDEFINED TAP AC Switching Characteristics Over the Operating Range [13, 14] Parameter Clock tTCYC tTF tTH tTL Output Times tTDOV tTDOX Setup Times tTMSS tTDIS tCS Hold Times tTMSH tTDIH tCH Description Min Max Unit TCK Clock Cycle Time TCK Clock Frequency TCK Clock HIGH Time TCK Clock LOW Time 50 – 20 20 – 20 – – ns MHz ns ns TCK Clock LOW to TDO Valid TCK Clock LOW to TDO Invalid – 0 10 – ns ns TMS Setup to TCK Clock Rise TDI Setup to TCK Clock Rise Capture Setup to TCK Rise 5 5 5 – – – ns ns ns TMS Hold after TCK Clock Rise TDI Hold after Clock Rise Capture Hold after Clock Rise 5 5 5 – – – ns ns ns Notes 13. tCS and tCH refer to the setup and hold time requirements of latching data from the boundary scan register. 14. Test conditions are specified using the load in TAP AC test conditions. tR/tF = 1 ns. Document Number: 38-05544 Rev. *I Page 16 of 34 [+] Feedback CY7C1381D/CY7C1381F CY7C1383D/CY7C1383F 3.3 V TAP AC Test Conditions 3.3 V TAP AC Output Load Equivalent Input pulse levels................................................VSS to 3.3 V 1.5V Input rise and fall times....................................................1 ns 50Ω Input timing reference levels.......................................... 1.5 V Output reference levels ................................................. 1.5 V TDO Test load termination supply voltage ............................. 1.5 V Z O= 50 Ω 20pF TAP DC Electrical Characteristics and Operating Conditions (0 °C < TA < +70 °C; VDD = 3.3 V ± 0.165 V unless otherwise noted) [15] Parameter VOH1 VOH2 VOL1 VOL2 VIH VIL IX Description Output HIGH Voltage Output HIGH Voltage Output LOW Voltage Output LOW Voltage Min Max Unit IOH = –4.0 mA VDDQ = 3.3 V 2.4 – V IOH = –1.0 mA VDDQ = 2.5 V 2.0 – V IOH = –100 µA VDDQ = 3.3 V 2.9 – V VDDQ = 2.5 V 2.1 – V IOL = 8.0 mA VDDQ = 3.3 V – 0.4 V IOL = 8.0 mA VDDQ = 2.5 V – 0.4 V IOL = 100 µA Input HIGH Voltage Input LOW Voltage Input Load Current Conditions GND < VIN < VDDQ VDDQ = 3.3 V – 0.2 V VDDQ = 2.5 V – 0.2 V VDDQ = 3.3 V 2.0 VDD + 0.3 V VDDQ = 2.5 V 1.7 VDD + 0.3 V VDDQ = 3.3 V –0.3 0.8 V VDDQ = 2.5 V –0.3 0.7 V –5 5 µA Note 15. All voltages referenced to VSS (GND). Document Number: 38-05544 Rev. *I Page 17 of 34 [+] Feedback CY7C1381D/CY7C1381F CY7C1383D/CY7C1383F Identification Register Definitions CY7C1381D/CY7C1381F (512 K × 36) Instruction Field CY7C1383D/CY7C1383F (1 M × 18) Description Revision Number (31:29) 000 000 Device Depth (28:24) [16] 01011 01011 Device Width (23:18) 119-BGA 101001 101001 Defines the memory type and architecture. Device Width (23:18) 165-FBGA 000001 000001 Defines the memory type and architecture. Cypress Device ID (17:12) Cypress JEDEC ID Code (11:1) Describes the version number. 100101 010101 00000110100 00000110100 1 1 ID Register Presence Indicator (0) Reserved for internal use. Defines the width and density. Allows unique identification of SRAM vendor. Indicates the presence of an ID register. Scan Register Sizes Register Name Bit Size (×36) Bit Size (×18) Instruction Bypass 3 3 Bypass 1 1 ID 32 32 Boundary Scan Order (119-ball BGA package) 85 85 Boundary Scan Order (165-ball FBGA package) 89 89 Identification Codes Instruction Code Description EXTEST 000 Captures Input/Output ring contents. Places the boundary scan register between TDI and TDO. Forces all SRAM outputs to high Z state. IDCODE 001 Loads the ID register with the vendor ID code and places the register between TDI and TDO. This operation does not affect SRAM operations. SAMPLE Z 010 Captures Input/Output ring contents. Places the boundary scan register between TDI and TDO. Forces all SRAM output drivers to a high Z state. RESERVED 011 Do Not Use. This instruction is reserved for future use. SAMPLE/PRELOAD 100 Captures Input/Output ring contents. Places the boundary scan register between TDI and TDO. Does not affect SRAM operation. RESERVED 101 Do Not Use. This instruction is reserved for future use. RESERVED 110 Do Not Use. This instruction is reserved for future use. BYPASS 111 Places the bypass register between TDI and TDO. This operation does not affect SRAM operations. Note 16. Bit #24 is “1” in the register definitions for both 2.5 V and 3.3 V versions of this device. Document Number: 38-05544 Rev. *I Page 18 of 34 [+] Feedback CY7C1381D/CY7C1381F CY7C1383D/CY7C1383F 119-ball BGA Boundary Scan Order [17, 18] Bit # Ball ID Bit # 1 H4 T4 23 24 2 Ball ID Bit # Ball ID Bit # Ball ID F6 45 G4 67 L1 E7 46 A4 68 M2 3 T5 25 D7 47 G3 69 N1 4 T6 26 H7 48 C3 70 P1 5 R5 27 G6 49 B2 71 K1 6 L5 28 E6 50 B3 72 L2 7 R6 29 D6 51 A3 73 8 U6 30 C7 52 C2 74 N2 P2 9 R7 31 B7 53 A2 75 R3 10 T7 32 C6 54 B1 76 T1 11 P6 33 A6 55 C1 77 R1 12 N7 34 C5 56 D2 78 T2 13 M6 35 B5 57 E1 79 L3 14 L7 36 G5 58 F2 80 R2 15 K6 37 B6 59 G1 81 T3 16 P7 38 D4 60 H2 82 L4 17 N6 39 B4 61 D1 83 N4 18 L6 40 F4 62 E2 84 P4 19 K7 41 M4 63 G2 85 Internal 20 J5 42 A5 64 H1 21 H6 43 K4 65 J3 22 G7 44 E4 66 2K Notes 17. Balls which are NC (No Connect) are pre-set LOW. 18. Bit# 85 is pre-set HIGH. Document Number: 38-05544 Rev. *I Page 19 of 34 [+] Feedback CY7C1381D/CY7C1381F CY7C1383D/CY7C1383F 165-ball BGA Boundary Scan Order [17, 19] Bit # Ball ID Bit # Ball ID Bit # Ball ID 1 N6 31 D10 61 G1 2 N7 32 C11 62 D2 3 N10 33 A11 63 E2 4 P11 34 B11 64 F2 5 P8 35 A10 65 G2 6 R8 36 B10 66 H1 7 R9 37 A9 67 H3 8 P9 38 B9 68 J1 9 P10 39 C10 69 K1 10 R10 40 A8 70 L1 11 R11 41 B8 71 M1 12 H11 42 A7 72 J2 13 N11 43 B7 73 K2 14 M11 44 B6 74 L2 15 L11 45 A6 75 M2 16 K11 46 B5 76 N1 17 J11 47 A5 77 N2 18 M10 48 A4 78 P1 19 L10 49 B4 79 R1 20 K10 50 B3 80 R2 21 J10 51 A3 81 P3 22 H9 52 A2 82 R3 23 H10 53 B2 83 P2 24 G11 54 C2 84 R4 25 F11 55 B1 85 P4 26 E11 56 A1 86 N5 27 D11 57 C1 87 P6 28 G10 58 D1 88 R6 89 Internal 29 F10 59 E1 30 E10 60 F1 Note 19. Bit# 89 is pre-set HIGH. Document Number: 38-05544 Rev. *I Page 20 of 34 [+] Feedback CY7C1381D/CY7C1381F CY7C1383D/CY7C1383F Maximum Ratings Exceeding the maximum ratings may impair the useful life of the device. For user guidelines, not tested. Storage Temperature ............................... –65 °C to +150 °C DC Voltage Applied to Outputs in Tri-State .........................................–0.5 V to VDDQ + 0.5 V DC Input Voltage ................................. –0.5 V to VDD + 0.5 V Current into Outputs (LOW)......................................... 20 mA Static Discharge Voltage.......................................... > 2001 V (per MIL-STD-883, Method 3015) Ambient Temperature with Power Applied .......................................... –55 °C to +125 °C Latch-up Current..................................................... > 200 mA Supply Voltage on VDD Relative to GND ......–0.3 V to +4.6 V Operating Range Supply Voltage on VDDQ Relative to GND ..... –0.3 V to +VDD Range Commercial Industrial Ambient Temperature 0 °C to +70 °C –40 °C to +85 °C VDD VDDQ 3.3 V–5%/+10% 2.5 V – 5% to VDD Neutron Soft Error Immunity Description Test Conditions Typ Max[20] Unit LSBU Logical Single-Bit Upsets 25 °C 361 394 FIT/Mb LMBU Logical Multi-Bit Upsets 25 °C 0 0.01 FIT/Mb SEL Single Event Latch Up 85 °C 0 0.1 FIT/Dev Parameter Electrical Characteristics Over the Operating Range [21, 22] Parameter Description VDD VDDQ Power Supply Voltage I/O Supply Voltage VOH Output HIGH Voltage VOL Output LOW Voltage VIH Input HIGH Voltage [21] VIL Input LOW Voltage [21] IX Input Leakage Current except ZZ and MODE Input Current of MODE Input Current of ZZ Test Conditions Min Max Unit 3.135 3.135 2.375 2.4 2.0 – – 2.0 1.7 –0.3 –0.3 –5 3.6 VDD 2.625 – – 0.4 0.4 VDD + 0.3V VDD + 0.3V 0.8 0.7 5 V V V V V V V V V V V A Input = VSS –30 – A Input = VDD – 5 A Input = VSS –5 – A for 3.3 V I/O for 2.5 V I/O for 3.3 V I/O, IOH = –4.0 mA for 2.5 V I/O, IOH = –1.0 mA for 3.3 V I/O, IOL = 8.0 mA for 2.5 V I/O, IOL = 1.0 mA for 3.3 V I/O for 2.5 V I/O for 3.3 V I/O for 2.5 V I/O GND VI VDDQ Input = VDD – 30 A IOZ Output Leakage Current GND VI VDD, Output Disabled –5 5 A IDD VDD Operating Supply Current VDD = Max, IOUT = 0 mA, f = fMAX = 1/tCYC 7.5 ns cycle, 133 MHz – 210 mA 10 ns cycle, 100 MHz – 175 mA Notes 20. No LMBU or SEL events occurred during testing; this column represents a statistical c2, 95% confidence limit calculation. For more details refer to Application Note AN54908, Accelerated Neutron SER Testing and Calculation of Terrestrial Failure Rates. 21. Overshoot: VIH(AC) < VDD + 1.5 V (pulse width less than tCYC/2), undershoot: VIL(AC) > –2 V (pulse width less than tCYC/2). 22. Tpower up: Assumes a linear ramp from 0 V to VDD(min) within 200 ms. During this time VIH < VDD and VDDQ < VDD. Document Number: 38-05544 Rev. *I Page 21 of 34 [+] Feedback CY7C1381D/CY7C1381F CY7C1383D/CY7C1383F Electrical Characteristics Over the Operating Range (continued)[21, 22] Parameter ISB1 Description Test Conditions Min Max Unit 7.5 ns cycle, 133 MHz – 140 mA 10 ns cycle, 100 MHz – 120 Max VDD, Device Deselected, All speeds VIN VDD – 0.3 V or VIN 0.3 V, f = 0, inputs static – 70 mA Automatic CE Power Down Current—CMOS Inputs 7.5 ns cycle, 133 MHz Max VDD, Device Deselected, VIN VDDQ – 0.3 V or VIN 0.3 V, 10 ns cycle, 100 MHz f = fMAX, inputs switching – 130 mA – 110 mA Automatic CE Power Down Current—TTL Inputs Max VDD, Device Deselected, VIN VDD – 0.3 V or VIN 0.3 V, f = 0, inputs static – 80 mA Automatic CE Power Down Current—TTL Inputs Max VDD, Device Deselected, VIN VIH or VIN VIL, f = fMAX, inputs switching ISB2 Automatic CE Power Down Current—CMOS Inputs ISB3 ISB4 All Speeds Capacitance [23] Parameter Description CIN Input Capacitance CCLK Clock Input Capacitance CIO Input/Output Capacitance Test Conditions TA = 25 °C, f = 1 MHz, VDD = 3.3 V. VDDQ = 2.5 V 100 TQFP Package 119 BGA Package 165 FBGA Package Unit 5 8 9 pF 5 8 9 pF 5 8 9 pF Test Conditions 100 TQFP Package 119 BGA Package 165 FBGA Package Unit Test conditions follow standard test methods and procedures for measuring thermal impedance, in accordance with EIA/JESD51. 28.66 23.8 20.7 °C/W 4.08 6.2 4.0 °C/W Thermal Resistance [23] Parameter Description JA Thermal Resistance (Junction to Ambient) JC Thermal Resistance (Junction to Case) Figure 4. AC Test Loads and Waveforms 3.3 V I/O Test Load R = 317 3.3 V OUTPUT OUTPUT RL = 50 Z0 = 50 VT = 1.5 V (a) INCLUDING JIG AND SCOPE Z0 = 50 VT = 1.25 V (a) R = 351 10% (c) ALL INPUT PULSES VDDQ INCLUDING JIG AND SCOPE 1 ns (b) GND 5 pF 90% 10% 90% 1 ns R = 1667 2.5 V OUTPUT RL = 50 GND 5 pF 2.5 V I/O Test Load OUTPUT ALL INPUT PULSES VDDQ R = 1538 (b) 10% 90% 10% 90% 1 ns 1 ns (c) Note 23. Tested initially and after any design or process change that may affect these parameters. Document Number: 38-05544 Rev. *I Page 22 of 34 [+] Feedback CY7C1381D/CY7C1381F CY7C1383D/CY7C1383F Switching Characteristics Over the Operating Range [24, 25] Parameter tPOWER Description VDD(Typical) to the First Access [26] 133 MHz 100 MHz Unit Min Max Min Max 1 – 1 – ms 7.5 – 10 – ns Clock tCYC Clock Cycle Time tCH Clock HIGH 2.1 – 2.5 – ns tCL Clock LOW 2.1 – 2.5 – ns Output Times tCDV Data Output Valid After CLK Rise – 6.5 – 8.5 ns tDOH Data Output Hold After CLK Rise 2.0 – 2.0 – ns tCLZ Clock to low Z [27, 28, 29] 2.0 – 2.0 – ns 0 4.0 0 5.0 ns – 3.2 – 3.8 ns 0 – 0 – ns – 4.0 – 5.0 ns [27, 28, 29] tCHZ Clock to high Z tOEV OE LOW to Output Valid [27, 28, 29] tOELZ OE LOW to Output low Z tOEHZ OE HIGH to Output high Z [27, 28, 29] Setup Times tAS Address Setup Before CLK Rise 1.5 – 1.5 – ns tADS ADSP, ADSC Setup Before CLK Rise 1.5 – 1.5 – ns tADVS ADV Setup Before CLK Rise 1.5 – 1.5 – ns tWES GW, BWE, BW[A:D] Setup Before CLK Rise 1.5 – 1.5 – ns tDS Data Input Setup Before CLK Rise 1.5 – 1.5 – ns tCES Chip Enable Setup 1.5 – 1.5 – ns tAH Address Hold After CLK Rise 0.5 – 0.5 – ns tADH ADSP, ADSC Hold After CLK Rise 0.5 – 0.5 – ns tWEH GW, BWE, BW[A:D] Hold After CLK Rise 0.5 – 0.5 – ns tADVH ADV Hold After CLK Rise 0.5 – 0.5 – ns tDH Data Input Hold After CLK Rise 0.5 – 0.5 – ns tCEH Chip Enable Hold After CLK Rise 0.5 – 0.5 – ns Hold Times Notes 24. Timing reference level is 1.5 V when VDDQ = 3.3 V and is 1.25 V when VDDQ = 2.5 V. 25. Test conditions shown in (a) of AC Test Loads unless otherwise noted. 26. This part has a voltage regulator internally; tPOWER is the time that the power needs to be supplied above VDD(minimum) initially, before a read or write operation can be initiated. 27. tCHZ, tCLZ,tOELZ, and tOEHZ are specified with AC test conditions shown in part (b) of “AC Test Loads and Waveforms” on page 22. Transition is measured ± 200 mV from steady-state voltage. 28. At any given voltage and temperature, tOEHZ is less than tOELZ and tCHZ is less than tCLZ to eliminate bus contention between SRAMs when sharing the same data bus. These specifications do not imply a bus contention condition, but reflect parameters guaranteed over worst case user conditions. Device is designed to achieve high Z prior to low Z under the same system condition. 29. This parameter is sampled and not 100% tested. Document Number: 38-05544 Rev. *I Page 23 of 34 [+] Feedback CY7C1381D/CY7C1381F CY7C1383D/CY7C1383F Timing Diagrams Figure 5. Read Cycle Timing [30] tCYC CLK t t ADS CH t CL tADH ADSP t ADS tADH ADSC t AS tAH A1 ADDRESS A2 t GW, BWE,BW WES t WEH X t CES Deselect Cycle t CEH CE t ADVS t ADVH ADV ADV suspends burst OE t OEV t OEHZ t CLZ Data Out (Q) High-Z Q(A1) t CDV t OELZ t CHZ t DOH Q(A2) Q(A2 + 1) Q(A2 + 2) t CDV Q(A2 + 3) Q(A2) Q(A2 + 1) Q(A2 + 2) Burst wraps around to its initial state Single READ BURST READ DON’T CARE UNDEFINED Note 30. On this diagram, when CE is LOW: CE1 is LOW, CE2 is HIGH and CE3 is LOW. When CE is HIGH: CE1 is HIGH or CE2 is LOW or CE3 is HIGH. Document Number: 38-05544 Rev. *I Page 24 of 34 [+] Feedback CY7C1381D/CY7C1381F CY7C1383D/CY7C1383F Timing Diagrams (continued) Figure 6. Write Cycle Timing [31, 32] t CYC CLK t t ADS CH t CL tADH ADSP t ADS ADSC extends burst tADH t ADS tADH ADSC t AS tAH A1 ADDRESS A2 A3 Byte write signals are ignored for first cycle when ADSP initiates burst t WES tWEH BWE, BW X t WES t WEH GW t CES tCEH CE t ADVS tADVH ADV ADV suspends burst OE t Data in (D) High-Z t DS t DH D(A1) D(A2) D(A2 + 1) D(A2 + 1) D(A2 + 2) D(A2 + 3) D(A3) D(A3 + 1) D(A3 + 2) OEHZ Data Out (Q) BURST READ Single WRITE BURST WRITE DON’T CARE Extended BURST WRITE UNDEFINED Notes 31. On this diagram, when CE is LOW: CE1 is LOW, CE2 is HIGH and CE3 is LOW. When CE is HIGH: CE1 is HIGH or CE2 is LOW or CE3 is HIGH. 32. Full width write can be initiated by either GW LOW; or by GW HIGH, BWE LOW and BWX LOW. Document Number: 38-05544 Rev. *I Page 25 of 34 [+] Feedback CY7C1381D/CY7C1381F CY7C1383D/CY7C1383F Timing Diagrams (continued) Figure 7. Read/Write Cycle Timing [33, 34, 35] tCYC CLK t t ADS CH t CL tADH ADSP ADSC t AS A1 ADDRESS tAH A2 A3 A4 t BWE, BW WES t A5 A6 D(A5) D(A6) WEH X t CES tCEH CE ADV OE t DS Data In (D) Data Out (Q) High-Z t OEHZ Q(A1) tDH t OELZ D(A3) tCDV Q(A4) Q(A2) Back-to-Back READs Single WRITE Q(A4+1) BURST READ DON’T CARE Q(A4+2) Q(A4+3) Back-to-Back WRITEs UNDEFINED Notes 33. On this diagram, when CE is LOW: CE1 is LOW, CE2 is HIGH and CE3 is LOW. When CE is HIGH: CE1 is HIGH or CE2 is LOW or CE3 is HIGH. 34. The data bus (Q) remains in high-Z following a WRITE cycle, unless a new read access is initiated by ADSP or ADSC. 35. GW is HIGH. Document Number: 38-05544 Rev. *I Page 26 of 34 [+] Feedback CY7C1381D/CY7C1381F CY7C1383D/CY7C1383F Timing Diagrams (continued) Figure 8. ZZ Mode Timing [36, 37] CLK t ZZ I t ZZREC ZZ t ZZI SUPPLY I DDZZ t RZZI ALL INPUTS DESELECT or READ Only (except ZZ) Outputs (Q) High-Z DON’T CARE Notes 36. Device must be deselected when entering ZZ mode. See “Truth Table” on page 12 for all possible signal conditions to deselect the device. 37. DQs are in high Z when exiting ZZ sleep mode. Document Number: 38-05544 Rev. *I Page 27 of 34 [+] Feedback CY7C1381D/CY7C1381F CY7C1383D/CY7C1383F Ordering Information Cypress offers other versions of this type of product in many different configurations and features. The below table contains only the list of parts that are currently available. For a complete listing of all options, visit the Cypress website at www.cypress.com and refer to the product summary page at http://www.cypress.com/products or contact your local sales representative. Cypress maintains a worldwide network of offices, solution centers, manufacturer's representatives and distributors. To find the office closest to you, visit us at t http://www.cypress.com/go/datasheet/offices. Speed (MHz) 133 100 Ordering Code Package Diagram Part and Package Type Operating Range CY7C1381D-133AXC 51-85050 100-pin Thin Quad Flat Pack (14 × 20 × 1.4 mm) Pb-free CY7C1381F-133BGC 51-85115 119-ball Ball Grid Array (14 × 22 × 2.4 mm) CY7C1381D-133AXI 51-85050 100-pin Thin Quad Flat Pack (14 × 20 × 1.4 mm) Pb-free lndustrial CY7C1381D-100AXC 51-85050 100-pin Thin Quad Flat Pack (14 × 20 × 1.4 mm) Pb-free Commercial CY7C1381D-100BZI 51-85180 CY7C1381D-100BZXI 165-ball Fine-Pitch Ball Grid Array (13 × 15 × 1.4 mm) Commercial lndustrial 165-ball Fine-Pitch Ball Grid Array (13 × 15 × 1.4 mm) Pb-free Ordering Code Definitions CY 7C 1381 X - XXX XXX X Temperature Range: X = C or I C = Commercial; I = Industrial Package Type: XXX = AX or BG or BZ or BZX AX = 100-pin TQFP (Pb-free) BG = 119-ball BGA BZ = 165-ball FPBGA BZX = 165-ball FPBGA (Pb-free) Frequency Range: XXX = 133 MHz or 100 MHz Die Revision: X = D or F D 90 nm F errata fix PCN084636 1381 = FT, 512 Kb × 36 (18 Mb) Marketing Code: 7C = SRAM Company ID: CY = Cypress Document Number: 38-05544 Rev. *I Page 28 of 34 [+] Feedback CY7C1381D/CY7C1381F CY7C1383D/CY7C1383F Package Diagrams Figure 9. 100-pin Thin Plastic Quad Flat pack (14 × 20 × 1.4 mm), 51-85050 51-85050 *D Document Number: 38-05544 Rev. *I Page 29 of 34 [+] Feedback CY7C1381D/CY7C1381F CY7C1383D/CY7C1383F Package Diagrams (continued) Figure 10. 119-ball BGA (14 × 22 × 2.4 mm), 51-85115 51-85115 *C Document Number: 38-05544 Rev. *I Page 30 of 34 [+] Feedback CY7C1381D/CY7C1381F CY7C1383D/CY7C1383F Package Diagrams (continued) Figure 11. 165-ball FBGA (13 × 15 × 1.4 mm), 51-85180 51-85180 *C Document Number: 38-05544 Rev. *I Page 31 of 34 [+] Feedback CY7C1381D/CY7C1381F CY7C1383D/CY7C1383F Acronyms Acronym Description BGA ball grid array CE chip enable CMOS complementary metal oxide semiconductor DDR double data rate FPBGA fine-pitch ball grid array I/O input/output JTAG Joint Test Action Group LSB least significant bit MSB most significant bit OE output enable SRAM static random access memory TAP test access port TCK test clock TMS test mode select TDI test data-in TDO test data-out TQFP thin quad flat pack Document Conventions Units of Measure Symbol Unit of Measure ns nano seconds V Volts µA micro Amperes mA milli Amperes mm milli meter ms milli seconds MHz Mega Hertz pF pico Farad W Watts °C degree Celcius ohms % percent Document Number: 38-05544 Rev. *I Page 32 of 34 [+] Feedback CY7C1381D/CY7C1381F CY7C1383D/CY7C1383F Document History Page Document Title: CY7C1381D/CY7C1381F/CY7C1383D/CY7C1383F 18 Mbit (512 K × 36/1 M × 18) Flow Through SRAM Document Number: 38-05544 Rev. ECN No. Orig. of Change Submission Date Description of Change ** 254518 RKF See ECN New data sheet *A 288531 SYT See ECN Edited description under “IEEE 1149.1 Serial Boundary Scan (JTAG)” for non-compliance with 1149.1 Removed 117-MHz Speed Bin Added Pb-free information for 100-Pin TQFP, 119 BGA and 165 FBGA package Added comment of ‘Pb-free BG packages availability’ below the Ordering Information *B 326078 PCI See ECN Address expansion pins/balls in the pinouts for all packages are modified as per JEDEC standard Added description on EXTEST Output Bus Tri-State Changed description on the Tap Instruction Set Overview and Extest Changed Device Width (23:18) for 119-BGA from 000001 to 101001 Added separate row for 165 -FBGA Device Width (23:18) Changed JA and JC for TQFP Package from 31 and 6 C/W to 28.66 and 4.08 C/W respectively Changed JA and JC for BGA Package from 45 and 7 C/W to 23.8 and 6.2 C/W respectively Changed JA and JC for FBGA Package from 46 and 3 C/W to 20.7 and 4.0 C/W respectively Modified VOL, VOH test conditions Removed comment of ‘Pb-free BG packages availability’ below the Ordering Information Updated Ordering Information Table Changed from Preliminary to Final *C 351895 PCI See ECN Updated Ordering Information Table *D 416321 NXR See ECN Changed address of Cypress Semiconductor Corporation on Page# 1 from “3901 North First Street” to “198 Champion Court” Changed the description of IX from Input Load Current to Input Leakage Current on page# 18 Changed the IX current values of MODE on page # 18 from –5 A and 30 A to –30 A and 5 A Changed the IX current values of ZZ on page # 18 from –30 A and 5 A to –5 A and 30 A Changed VIH < VDD to VIH < VDDon page # 18 Replaced Package Name column with Package Diagram in the Ordering Information table Updated Ordering Information Table *E 475009 VKN See ECN Added the Maximum Rating for Supply Voltage on VDDQ Relative to GND Changed tTH, tTL from 25 ns to 20 ns and tTDOV from 5 ns to 10 ns in TAP AC Switching Characteristics table. Updated the Ordering Information table. *F 776456 VKN See ECN Added Part numbers CY7C1381F and CY7C1383F and its related information Added footnote# 3 regarding Chip Enable Updated Ordering Information table *G 2752731 VKN/PYRS 08/17/09 Included Soft Error Immunity Data Modified Ordering Information table by including parts that are available and Modified the disclaimer for the Ordering information. *H 2897182 NJY 03/22/2010 Removed inactive parts from Ordering Information table; Updated package diagrams. *I 3159479 NJY 02/01/2011 Updated Package Diagrams. Added Acronyms and Units of Measure. Minor edits and updated in new template. Document Number: 38-05544 Rev. *I Page 33 of 34 [+] Feedback CY7C1381D/CY7C1381F CY7C1383D/CY7C1383F Sales, Solutions, and Legal Information Worldwide Sales and Design Support Cypress maintains a worldwide network of offices, solution centers, manufacturer’s representatives, and distributors. To find the office closest to you, visit us at cypress.com/sales. Products Automotive Interface Lighting & Power Control PSoC Solutions cypress.com/go/automotive Clocks & Buffers cypress.com/go/clocks psoc.cypress.com/solutions cypress.com/go/interface PSoC 1 | PSoC 3 | PSoC 5 cypress.com/go/powerpsoc cypress.com/go/plc Memory cypress.com/go/memory Optical & Image Sensing cypress.com/go/image PSoC cypress.com/go/psoc Touch Sensing cypress.com/go/touch USB Controllers Wireless/RF cypress.com/go/USB cypress.com/go/wireless © Cypress Semiconductor Corporation, 2004-2011. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use of any circuitry other than circuitry embodied in a Cypress product. Nor does it convey or imply any license under patent or other rights. Cypress products are not warranted nor intended to be used for medical, life support, life saving, critical control or safety applications, unless pursuant to an express written agreement with Cypress. Furthermore, Cypress does not authorize its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress products in life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges. Any Source Code (software and/or firmware) is owned by Cypress Semiconductor Corporation (Cypress) and is protected by and subject to worldwide patent protection (United States and foreign), United States copyright laws and international treaty provisions. Cypress hereby grants to licensee a personal, non-exclusive, non-transferable license to copy, use, modify, create derivative works of, and compile the Cypress Source Code and derivative works for the sole purpose of creating custom software and or firmware in support of licensee product to be used only in conjunction with a Cypress integrated circuit as specified in the applicable agreement. Any reproduction, modification, translation, compilation, or representation of this Source Code except as specified above is prohibited without the express written permission of Cypress. Disclaimer: CYPRESS MAKES NO WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, WITH REGARD TO THIS MATERIAL, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE. Cypress reserves the right to make changes without further notice to the materials described herein. Cypress does not assume any liability arising out of the application or use of any product or circuit described herein. Cypress does not authorize its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress’ product in a life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges. Use may be limited by and subject to the applicable Cypress software license agreement. Document Number: 38-05544 Rev. *I Revised February 3, 2011 Page 34 of 34 All products and company names mentioned in this document may be the trademarks of their respective holders. [+] Feedback