3-Axis, ±2 g/±4 g/±8 g/±16 g Ultralow Power Digital Accelerometer ADXL346 Preliminary Technical Data FEATURES GENERAL DESCRIPTION Ultralow power: as low as 35 µA in measurement mode and 1 µA in standby mode at VS = 2.5 V (typical) Power consumption scales automatically with bandwidth User-selectable resolution Fixed 10-bit resolution Full resolution, where resolution increases with g range, up to 13-bit resolution at ±16 g (maintaining 4 mg/LSB scale factor in all g ranges) Patent pending, embedded memory management system with FIFO technology minimizes host processor load Single tap/double tap detection Activity/inactivity monitoring Free-fall detection Concurrent four- and six-position orientation detection Supply and I/O voltage range: 1.7 V to 2.75 V SPI (3- and 4-wire) and I2C digital interfaces Flexible interrupt modes mappable to either interrupt pin Measurement ranges selectable via serial command Bandwidth selectable via serial command Wide temperature range (−40°C to +85°C) 10,000 g shock survival Pb free/RoHS compliant Small and thin: 3 mm × 3 mm × 0.95 mm LGA package The ADXL346 is a small, thin, ultralow power, 3-axis accelerometer with high resolution (13-bit) measurement at up to ±16 g. Digital output data is formatted as 16-bit twos complement and is accessible through either a SPI (3- or 4-wire) or I2C digital interface. The ADXL346 is well suited for mobile device applications. It measures the static acceleration of gravity in tilt-sensing applications, as well as dynamic acceleration resulting from motion or shock. Its high resolution (4 mg/LSB) enables measurement of inclination changes less than 1.0°. Several special sensing functions are provided. Activity and inactivity sensing detect the presence or lack of motion by comparing the acceleration on any axis with user-set thresholds. Tap sensing detects single and double taps in any direction. Freefall sensing detects if the device is falling. Orientation detection is capable of concurrent four- and six-position sensing and a user-selectable interrupt on orientation change for 2-D or 3-D applications. These functions can be mapped individually to either of two interrupt output pins. An integrated, patent pending memory management system with 32-level first in, first out (FIFO) buffer can be used to store data to minimize host processor activity and lower overall system power consumption. Low power modes enable intelligent motion-based power management with threshold sensing and active acceleration measurement at extremely low power dissipation. APPLICATIONS Handsets Medical instrumentation Gaming and pointing devices Industrial instrumentation Personal navigation devices Hard disk drive (HDD) protection The ADXL346 is supplied in a small, thin, 3 mm × 3 mm × 0.95 mm, 16-lead, plastic package. FUNCTIONAL BLOCK DIAGRAM VS ADXL346 3-AXIS SENSOR VDD I/O POWER MANAGEMENT SENSE ELECTRONICS ADC DIGITAL FILTER 32 LEVEL FIFO CONTROL AND INTERRUPT LOGIC INT1 INT2 SDA/SDI/SDIO SERIAL I/O SDO/ALT ADDRESS CS GND 08167-001 SCL/SCLK Figure 1. Rev. PrC Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners. See the last page for disclaimers. One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781.329.4700 www.analog.com Fax: 781.461.3113 ©2009 Analog Devices, Inc. All rights reserved. ADXL346 Preliminary Technical Data TABLE OF CONTENTS Features .............................................................................................. 1 Self-Test ....................................................................................... 17 Applications....................................................................................... 1 Register Map ................................................................................... 19 General Description ......................................................................... 1 Register Definitions ................................................................... 20 Functional Block Diagram .............................................................. 1 Applications Information .............................................................. 25 Revision History ............................................................................... 2 Power Supply Decoupling ......................................................... 25 Specifications..................................................................................... 3 Mechanical Considerations for Mounting.............................. 25 Absolute Maximum Ratings............................................................ 4 Tap Detection.............................................................................. 25 Thermal Resistance ...................................................................... 4 Improved Tap Detection............................................................ 26 ESD Caution.................................................................................. 4 Tap Sign ....................................................................................... 26 Pin Configuration and Function Descriptions............................. 5 Threshold .................................................................................... 27 Typical Performance Characteristics ............................................. 6 Link Mode ................................................................................... 27 Theory of Operation ...................................................................... 10 Sleep Mode vs. Low Power Mode............................................. 27 Power Sequencing ...................................................................... 10 Using Self-Test ............................................................................ 27 Power Savings.............................................................................. 10 Orientation Sensing ................................................................... 28 Serial Communications ................................................................. 12 Axes of Acceleration Sensitivity ............................................... 29 SPI................................................................................................. 12 Layout and Design Recommendations ................................... 30 I2C ................................................................................................. 14 Outline Dimensions ....................................................................... 31 Interrupts ..................................................................................... 16 Ordering Guide .......................................................................... 31 FIFO ............................................................................................. 16 REVISION HISTORY 6/09—Revision PrC: Updated Specifications and functional descriptions of Orientation, Tap Sign and Improved Tap. 4/09—Revision PrB: Updated Absolute Maximum Ratings table to reflect correct values for the ADXL346. 3/09—Revision PrA: Initial Version Rev. PrC | Page 2 of 32 Preliminary Technical Data ADXL346 SPECIFICATIONS TA = 25°C, VS = 2.5 V, VDD I/O = 1.8 V, acceleration = 0 g, CS = 10 μF tantalum, CIO = 0.1 μF, ODR = 800 Hz, unless otherwise noted. Table 1. Specifications1 Parameter SENSOR INPUT Measurement Range Nonlinearity Inter-Axis Alignment Error Cross-Axis Sensitivity2 OUTPUT RESOLUTION All g Ranges ±2 g Range ±4 g Range ±8 g Range ±16 g Range SENSITIVITY Sensitivity at XOUT, YOUT, ZOUT Scale Factor at XOUT, YOUT, ZOUT Sensitivity at XOUT, YOUT, ZOUT Scale Factor at XOUT, YOUT, ZOUT Sensitivity at XOUT, YOUT, ZOUT Scale Factor at XOUT, YOUT, ZOUT Sensitivity at XOUT, YOUT, ZOUT Scale Factor at XOUT, YOUT, ZOUT Sensitivity Change Due to Temperature 0 g OFFSET 0 g Output for XOUT, YOUT, ZOUT 0 g Offset vs. Temperature for x-, y-, z-Axes NOISE x-, y-Axes z-Axis OUTPUT DATA RATE AND BANDWIDTH Output Data Rate (ODR)3 SELF-TEST4 Output Change in x-Axis Output Change in y-Axis Output Change in z-Axis POWER SUPPLY Operating Voltage Range (VS) Interface Voltage Range (VDD I/O) Supply Current Standby Mode Leakage Current Turn-On and Wake-Up Time5 TEMPERATURE Operating Temperature Range WEIGHT Device Weight Test Conditions Each axis User selectable Percentage of full scale Each axis 10-bit resolution Full resolution Full resolution Full resolution Full resolution Each axis ±2 g, 10-bit or full resolution ±2 g, 10-bit or full resolution ±4 g, 10-bit resolution ±4 g, 10-bit resolution ±8 g, 10-bit resolution ±8 g, 10-bit resolution ±16 g, 10-bit resolution ±16 g, 10-bit resolution Min 230 3.5 115 7.1 57 14.1 29 28.6 Typ Max Unit ±2, ±4, ±8, ±16 ±0.5 ±0.1 ±1 g % Degrees % 10 10 11 12 13 Bits Bits Bits Bits Bits 256 3.9 128 7.8 64 15.6 32 31.2 ±0.01 282 4.3 141 8.7 71 17.5 35 34.5 LSB/g mg/LSB LSB/g mg/LSB LSB/g mg/LSB LSB/g mg/LSB %/°C +150 <±1.0 mg mg/°C <1.0 LSB rms <1.5 LSB rms Each axis −150 ODR = 100 Hz for ±2 g, 10-bit or full resolution ODR = 100 Hz for ±2 g, 10-bit or full resolution User selectable 6.25 3200 Hz 0.27 −1.55 0.40 1.55 −0.27 1.95 g g g 2.75 VS V V µA µA µA ms 1.7 1.7 ODR ≥ 100 Hz ODR < 10 Hz ODR = 3200 Hz 2.5 1.8 140 35 1 1.4 −40 +85 18 1 10 °C mg All minimum and maximum specifications are guaranteed. Typical specifications are not guaranteed. Cross-axis sensitivity is defined as coupling between any two axes. Bandwidth is the −3 dB frequency and is half the output data rate, bandwidth = ODR/2. 4 Self-test change is defined as the output (g) when the SELF_TEST bit = 1 (in the DATA_FORMAT register) minus the output (g) when the SELF_TEST bit = 0 (in the DATA_FORMAT register). Due to device filtering, the output reaches its final value after 4 × τ when enabling or disabling self-test, where τ = 1/(data rate). The part needs to be in normal power operation (LOW_POWER bit = 0 in BW_RATE register) for self-test to operate correctly. 5 Turn-on and wake-up times are determined by the user-defined bandwidth. At a 100 Hz data rate, the turn-on and wake-up times are each approximately 11.1 ms. For other data rates, the turn-on and wake-up times are each approximately τ + 1.1 in milliseconds, where τ = 1/(data rate). 2 3 Rev. PrC | Page 3 of 32 ADXL346 Preliminary Technical Data ABSOLUTE MAXIMUM RATINGS Table 2. Parameter Acceleration Any Axis, Unpowered Any Axis, Powered VS VDD I/O Digital Pins All Other Pins Output Short-Circuit Duration (Any Pin to Ground) Temperature Range Powered Storage Rating 10,000 g 10,000 g −0.3 V to +2.75 V −0.3 V to +2.75 V −0.3 V to VDD I/O + 0.3 V or 2.75 V, whichever is less −0.3 V to +2.75 V Indefinite Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. THERMAL RESISTANCE Table 3. Package Characteristics Package Type 16-Terminal LGA −40°C to +105°C −40°C to +105°C ESD CAUTION Rev. PrC | Page 4 of 32 θJA 150°C/W θJC 85°C/W Device Weight 18 mg Preliminary Technical Data ADXL346 VDD I/O GND RESERVED VS PIN CONFIGURATION AND FUNCTION DESCRIPTIONS 16 15 14 1 NC 2 ADXL346 13 GND 12 GND 11 INT1 10 NC +X 5 NC = NO INTERNAL CONNECTION +Z 9 6 7 8 INT2 TOP VIEW (Not to Scale) 08167-002 NC +Y CS 4 SDO/ ALT ADDRESS 3 SDA/SDI/SDIO NC SCL/SCLK Figure 2. Pin Configuration (Top View) Table 4. Pin Function Descriptions Pin No. 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 Mnemonic VDD I/O NC NC SCL/SCLK NC SDA/SDI/SDIO SDO/ALT ADDRESS CS INT2 NC INT1 GND GND VS Reserved GND Description Digital Interface Supply Voltage. Not Internally Connected. Not Internally Connected. Serial Communications Clock. Not Internally Connected. Serial Data (I2C)/Serial Data Input (SPI 4-Wire)/Serial Data Input and Output (SPI 3-Wire). Serial Data Output (SPI 4-Wire)/Alternate I2C Address Select (I2C). Chip Select. Interrupt 2 Output. Not Internally Connected. Interrupt 1 Output. Must be connected to ground. Must be connected to ground. Supply Voltage. Reserved. This pin must be connected to VS. Must be connected to ground. Rev. PrC | Page 5 of 32 ADXL346 Preliminary Technical Data TYPICAL PERFORMANCE CHARACTERISTICS Figure 3. X-Axis Zero g Offset at 25°C, VS = 2.5 V Figure 6. X-Axis Self-Test Response at 25°C, VS = 2.5 V Figure 4. Y-Axis Zero g Offset at 25°C, VS = 2.5 V Figure 7. Y-Axis Self-Test Response at 25°C, VS = 2.5 V Figure 5. Z-Axis Zero g Offset at 25°C, VS = 2.5 V Figure 8. Z-Axis Self-Test Response at 25°C, VS = 2.5 V Rev. PrC | Page 6 of 32 Preliminary Technical Data ADXL346 Figure 9. X-Axis Zero g Offset Temperature Coefficient, VS = 2.5 V Figure 12. X-Axis Zero g Offset vs. Temperature— Eight Parts Soldered to PCB, VS = 2.5 V Figure 10. Y-Axis Zero g Offset Temperature Coefficient, VS = 2.5 V Figure 13. Y-Axis Zero g Offset vs. Temperature— Eight Parts Soldered to PCB, VS = 2.5 V Figure 11. Z-Axis Zero g Offset Temperature Coefficient, VS = 2.5 V Figure 14. Z-Axis Zero g Offset vs. Temperature— Eight Parts Soldered to PCB, VS = 2.5 V Rev. PrC | Page 7 of 32 ADXL346 Preliminary Technical Data Figure 15. X-Axis Sensitivity at 25°C, VS = 2.5 V Figure 18. Supply Current at 25°C, 100 Hz Output Data Rate, VS = 2.5 V Figure 16. Y-Axis Sensitivity at 25°C, VS = 2.5 V Figure 19. Supply Current vs. Output Data Rate at 25°C—10 Parts, VS = 2.5 V Figure 17. Z-Axis Sensitivity at 25°C, VS = 2.5 V Figure 20. Supply Current vs. VS at 25°C Rev. PrC | Page 8 of 32 Preliminary Technical Data ADXL346 Figure 21. X-Axis Sensitivity Temperature Coefficient, VS = 2.5 V Figure 24. X-Axis Sensitivity vs. Temperature— Eight Parts Soldered to PCB, VS = 2.5 V Figure 22. Y-Axis Sensitivity Temperature Coefficient, VS = 2.5 V Figure 25. Y-Axis Sensitivity vs. Temperature— Eight Parts Soldered to PCB, VS = 2.5 V Figure 23. Z-Axis Sensitivity Temperature Coefficient, VS = 2.5 V Figure 26. Z-Axis Sensitivity vs. Temperature— Eight Parts Soldered to PCB, VS = 2.5 V Rev. PrC | Page 9 of 32 ADXL346 Preliminary Technical Data THEORY OF OPERATION The ADXL346 is a complete 3-axis acceleration measurement system with a selectable measurement range of ±2 g, ±4 g, ±8 g, or ±16 g. It measures both dynamic acceleration resulting from motion or shock and static acceleration, such as gravity, which allows the device to be used as a tilt sensor. The sensor is a polysilicon surface-micromachined structure built on top of a silicon wafer. Polysilicon springs suspend the structure over the surface of the wafer and provide a resistance against forces due to applied acceleration. Deflection of the structure is measured using differential capacitors that consist of independent fixed plates and plates attached to the moving mass. Acceleration deflects the proof mass and unbalances the differential capacitor, resulting in a sensor output whose amplitude is proportional to acceleration. Phase-sensitive demodulation is used to determine the magnitude and polarity of the acceleration. POWER SEQUENCING Power can be applied to VS or VDD I/O in any sequence without damaging the ADXL346. All possible power-on modes are summarized in Table 5. The interface voltage level is set with the interface supply voltage, VDD I/O, which must be present to ensure that the ADXL346 does not create a conflict on the communication bus. For single-supply operation, VDD I/O can be the same as the main supply, VS. In a dual-supply application, however, VDD I/O can differ from VS to accommodate the desired interface voltage, as long as VS is greater than or equal to VDD I/O. After VS is applied, the device enters standby mode, where power consumption is minimized and the device waits for VDD I/O to be applied and for the command to enter measurement mode to be received. (This command can be initiated by setting the measure bit in the POWER_CTL register (Address 0x2D).) In addition, any register can be written to or read from to configure the part while the device is in standby mode. It is recommended to configure the device in standby mode and then to enable measurement mode. Clearing the measure bit returns the device to the standby mode. Table 5. Power Sequencing Condition Power Off VS Off VDD I/O Off Bus Disabled On Off Bus Enabled Off On Standby or Measurement On On Description The device is completely off, but there is a potential for a communication bus conflict. The device is on in standby mode, but communication is unavailable and will create a conflict on the communication bus. The duration of this state should be minimized during power-up to prevent a conflict. No functions are available, but the device will not create a conflict on the communication bus. At power-up, the device is in standby mode, awaiting a command to enter measurement mode, and all sensor functions are off. After the device is instructed to enter measurement mode, all sensor functions are available. POWER SAVINGS Power Modes The ADXL346 automatically modulates its power consumption in proportion to its output data rate, as outlined in Table 6. If additional power savings is desired, a lower power mode is available. In this mode, the internal sampling rate is reduced, allowing for power savings in the 12.5 Hz to 400 Hz data rate range at the expense of slightly greater noise. To enter low power mode, set the LOW_POWER bit (Bit 4) in the BW_RATE register (Address 0x2C). The current consumption in low power mode is shown in Table 7 for cases where there is an advantage to using low power mode. The current consumption values shown in Table 6 and Table 7 are for a VS of 2.5 V. Table 6. Typical Current Consumption vs. Data Rate (TA = 25°C, VS = 2.5 V, VDD I/O = 1.8 V) Output Data Rate (Hz) 3200 1600 800 400 200 100 50 25 12.5 6.25 Bandwidth (Hz) 1600 800 400 200 100 50 25 12.5 6.25 3.125 Rate Code 1111 1110 1101 1100 1011 1010 1001 1000 0111 0110 IDD (µA) 140 90 140 140 140 140 90 60 45 35 Table 7. Typical Current Consumption vs. Data Rate, Low Power Mode (TA = 25°C, VS = 2.5 V, VDD I/O = 1.8 V) Output Data Rate (Hz) 400 200 100 50 25 12.5 Rev. PrC | Page 10 of 32 Bandwidth (Hz) 200 100 50 25 12.5 6.25 Rate Code 1100 1011 1010 1001 1000 0111 IDD (µA) 90 60 45 35 35 35 Preliminary Technical Data ADXL346 Auto Sleep Mode Standby Mode Additional power can be saved if the ADXL346 automatically switches to sleep mode during periods of inactivity. To enable this feature, set the THRESH_INACT register (Address 0x25) and the TIME_INACT register (Address 0x26) each to a value that signifies inactivity (the appropriate value depends on the application), and then set the AUTO_SLEEP bit and the link bit in the POWER_CTL register (Address 0x2D). Current consumption at the sub-8 Hz data rates used in this mode is typically 35 µA for a VS of 2.5 V. For even lower power operation, standby mode can be used. In standby mode, current consumption is reduced to 1 µA (typical). In this mode, no measurements are made. Standby mode is entered by clearing the measure bit (Bit 3) in the POWER_CTL register (Address 0x2D). Placing the device into standby mode preserves the contents of FIFO. Rev. PrC | Page 11 of 32 ADXL346 Preliminary Technical Data SERIAL COMMUNICATIONS SPI For SPI, either 3- or 4-wire configuration is possible, as shown in the connection diagrams in Figure 27 and Figure 28. Clearing the SPI bit in the DATA_FORMAT register (Address 0x31) selects 4-wire mode, whereas setting the SPI bit selects 3-wire mode. The maximum SPI clock speed is 5 MHz with 100 pF maximum loading, and the timing scheme follows clock polarity (CPOL) = 1 and clock phase (CPHA) = 1. CS is the serial port enable line and is controlled by the SPI master. This line must go low at the start of a transmission and high at the end of a transmission, as shown in Figure 29. SCLK is the serial port clock and is supplied by the SPI master. It is stopped high when CS is high during a period of no transmission. SDI and SDO are the serial data input and output, respectively. Data should be sampled at the rising edge of SCLK. ADXL346 PROCESSOR D OUT CS D IN/OUT SDO SCLK D OUT PROCESSOR CS D OUT SDI D OUT SDO SCLK D IN D OUT Figure 28. 4-Wire SPI Connection Diagram To read or write multiple bytes in a single transmission, the multiple-byte bit, located after the R/W bit in the first byte transfer (MB in Figure 29 to Figure 31), must be set. After the register addressing and the first byte of data, each subsequent set of clock pulses (eight clock pulses) causes the ADXL346 to point to the next register for a read or write. This shifting continues until the clock pulses cease and CS is deasserted. To perform reads or writes on different, nonsequential registers, CS must be deasserted between transmissions and the new register must be addressed separately. The timing diagram for 3-wire SPI reads or writes is shown in Figure 31. The 4-wire equivalents for SPI writes and reads are shown in Figure 29 and Figure 30, respectively. Table 8. SPI Digital Input/Output Voltage Parameter Digital Input Voltage Low Level Input Voltage (VIL) High Level Input Voltage (VIH) Digital Output Voltage Low Level Output Voltage (VOL) High Level Output Voltage (VOH) 1 Limit1 Unit 0.3 × VDD I/O 0.7 × VDD I/O V max V min 0.2 × VDD I/O 0.8 × VDD I/O V max V min Limits based on characterization results, not production tested. 08167-027 SDIO ADXL346 08167-028 I2C and SPI digital communications are available. In both cases, the ADXL346 operates as a slave. I2C mode is enabled if the CS pin is tied high to VDD I/O. The CS pin should always be tied high to VDD I/O or be driven by an external controller because there is no default mode if the CS pin is left unconnected. Therefore, not taking these precautions may result in an inability to communicate with the part. In SPI mode, the CS pin is controlled by the bus master. In both SPI and I2C modes of operation, data transmitted from the ADXL346 to the master device should be ignored during writes to the ADXL346. Figure 27. 3-Wire SPI Connection Diagram Table 9. SPI Timing (TA = 25°C, VS = 2.5 V, VDD I/O = 1.8 V)1 Parameter fSCLK tSCLK tDELAY tQUIET tDIS tCS,DIS tS tM tSDO tSETUP tHOLD Min Limit2, 3 Max 5 200 10 10 100 250 0.4 × tSCLK 0.4 × tSCLK 95 10 10 Unit MHz ns ns ns ns ns ns ns ns ns ns Description SPI clock frequency 1/(SPI clock frequency) mark-space ratio for the SCLK input is 40/60 to 60/40 CS falling edge to SCLK falling edge SCLK rising edge to CS rising edge CS rising edge to SDO disabled CS deassertion between SPI communications SCLK low pulse width (space) SCLK high pulse width (mark) SCLK falling edge to SDO transition SDI valid before SCLK rising edge SDI valid after SCLK rising edge The CS, SCLK, SDI, and SDO pins are not internally pulled up or down; they must be driven for proper operation. Limits based on characterization results, characterized with fSCLK = 5 MHz and bus load capacitance of 100 pF; not production tested. 3 The timing values are measured corresponding to the input thresholds (VIL and VIH) given in Table 8. 1 2 Rev. PrC | Page 12 of 32 Preliminary Technical Data ADXL346 CS tM tSCLK tDELAY tS tQUIET tCS,DIS SCLK tHOLD W SDI MB A5 tSDO X SDO A0 D7 ADDRESS BITS X D0 tDIS DATA BITS X X X 08167-029 tSETUP X Figure 29. SPI 4-Wire Write CS tSCLK tDELAY tM tS tCS,DIS tQUIET SCLK tHOLD R SDI MB A5 tSDO X SDO A0 X X tDIS ADDRESS BITS X X X D7 D0 08167-030 tSETUP DATA BITS Figure 30. SPI 4-Wire Read CS tDELAY tM tSCLK tS tQUIET tCS,DIS SCLK tSETUP SDIO tSDO tHOLD R/W MB A5 A0 ADDRESS BITS D7 D0 DATA BITS 08167-031 SDO NOTES 1. tSDO IS ONLY PRESENT DURING READS. Figure 31. SPI 3-Wire Read/Write Rev. PrC | Page 13 of 32 ADXL346 Preliminary Technical Data I2C If other devices are connected to the same I2C bus, the nominal operating voltage level of these other devices cannot exceed VDD I/O by more than 0.3 V. External pull-up resistors, RP, are necessary for proper I2C operation. Refer to the UM10204 I2C-Bus Specification and User Manual, Rev. 03—19 June 2007, when selecting pull-up resistor values to ensure proper operation. With CS tied high to VDD I/O, the ADXL346 is in I2C mode, requiring a simple 2-wire connection as shown in Figure 32. The ADXL346 conforms to the UM10204 I2C-Bus Specification and User Manual, Rev. 03—19 June 2007, available from NXP Semiconductor. It supports standard (100 kHz) and fast (400 kHz) data transfer modes if the parameters given in Table 10 and Table 11 are met. Single- or multiple-byte reads/writes are supported, as shown in Figure 33. With the ALT ADDRESS pin high, the 7-bit I2C address for the device is 0x1D, followed by the R/W bit. This translates to 0x3A for a write and 0x3B for a read. An alternate I2C address of 0x53 (followed by the R/W bit) can be chosen by grounding the ALT ADDRESS pin (Pin 7). This translates to 0xA6 for a write and 0xA7 for a read. Table 10. I2C Digital Input/Output Voltage Parameter Digital Input Voltage Low Level Input Voltage (VIL) High Level Input Voltage (VIH) Digital Output Voltage Low Level Output Voltage (VOL)2 1 2 Limit1 Unit 0.3 × VDD I/O 0.7 × VDD I/O V max V min 0.2 × VDD I/O V max Limits based on characterization results; not production tested. The limit given is only for VDD I/O < 2 V. When VDD I/O > 2 V, the limit is 0.4 V max. VDD I/O ADXL346 RP RP PROCESSOR CS SDA D IN/OUT ALT ADDRESS D OUT 08167-032 SCL Figure 32. I2C Connection Diagram (Address 0x53) SINGLE-BYTE WRITE MASTER START SLAVE ADDRESS + WRITE SLAVE STOP DATA REGISTER ADDRESS ACK ACK ACK MULTIPLE-BYTE WRITE MASTER START SLAVE ADDRESS + WRITE SLAVE DATA REGISTER ADDRESS ACK ACK DATA STOP ACK ACK SINGLE-BYTE READ MASTER START SLAVE ADDRESS + WRITE SLAVE START1 REGISTER ADDRESS ACK SLAVE ADDRESS + READ ACK NACK ACK DATA ACK DATA STOP MULTIPLE-BYTE READ SLAVE ADDRESS + WRITE START1 REGISTER ADDRESS ACK ACK SLAVE ADDRESS + READ ACK NOTES 1. THIS START IS EITHER A RESTART OR A STOP FOLLOWED BY A START. 2. THE SHADED AREAS REPRESENT WHEN THE DEVICE IS LISTENING. Figure 33. I2C Device Addressing Rev. PrC | Page 14 of 32 NACK STOP DATA 08167-033 MASTER START SLAVE Preliminary Technical Data ADXL346 Table 11. I2C Timing (TA = 25°C, VS = 2.5 V, VDD I/O = 1.8 V) Parameter fSCL t1 t2 t3 t4 t5 t63, 4, 5, 6 t7 t8 t9 t10 Limit1, 2 Max 400 Min 2.5 0.6 1.3 0.6 100 0 0.6 0.6 1.3 Unit kHz µs µs µs µs ns µs µs µs µs ns ns ns ns ns pF 0.9 300 0 t11 250 300 20 + 0.1 Cb7 Cb 400 Description SCL clock frequency SCL cycle time tHIGH, SCL high time tLOW, SCL low time tHD, STA, start/repeated start condition hold time tSU, DAT, data setup time tHD, DAT, data hold time tSU, STA, setup time for repeated start tSU, STO, stop condition setup time tBUF, bus-free time between a stop condition and a start condition tR, rise time of both SCL and SDA when receiving tR, rise time of both SCL and SDA when receiving or transmitting tF, fall time of SDA when receiving tF, fall time of both SCL and SDA when transmitting tF, fall time of both SCL and SDA when transmitting or receiving Capacitive load for each bus line 1 Limits based on characterization results, with fSCL = 400 kHz and a 3 mA sink current; not production tested. All values referred to the VIH and the VIL levels given in Table 10. 3 t6 is the data hold time that is measured from the falling edge of SCL. It applies to data in transmission and acknowledge. 4 A transmitting device must internally provide an output hold time of at least 300 ns for the SDA signal (with respect to VIH(min) of the SCL signal) to bridge the undefined region of the falling edge of SCL. 5 The maximum t6 value must be met only if the device does not stretch the low period (t3) of the SCL signal. 6 The maximum value for t6 is a function of the clock low time (t3), the clock rise time (t10), and the minimum data setup time (t5(min)). This value is calculated as t6(max) = t3 − t10 − t5(min). 7 Cb is the total capacitance of one bus line in picofarads. 2 SDA t3 t9 t10 t4 t11 SCL t6 t2 t5 t7 REPEATED START CONDITION Figure 34. I2C Timing Diagram Rev. PrC | Page 15 of 32 t1 t8 STOP CONDITION 08167-034 t4 START CONDITION ADXL346 Preliminary Technical Data INTERRUPTS The ADXL346 provides two output pins for driving interrupts: INT1 and INT2. Each interrupt function is described in detail in this section. All functions can be used simultaneously, with the only limiting feature being that some functions may need to share interrupt pins. Interrupts are enabled by setting the appropriate bit in the INT_ENABLE register (Address 0x2E) and are mapped to either the INT1 or INT2 pin based on the contents of the INT_MAP register (Address 0x2F). It is recommended that interrupt bits be configured with the interrupts disabled, preventing interrupts from being accidentally triggered during configuration. This can be done by writing a value of 0x00 to the INT_ENABLE register. Clearing interrupts is performed either by reading the data registers (Address 0x32 to Address 0x37) until the interrupt condition is no longer valid for the data-related interrupts or by reading the INT_SOURCE register (Address 0x30) for the remaining interrupts. This section describes the interrupts that can be set in the INT_ENABLE register and monitored in the INT_SOURCE register. DATA_READY The DATA_READY bit is set when new data is available and is cleared when no new data is available. SINGLE_TAP The SINGLE_TAP bit is set when a single acceleration event that is greater than the value in the THRESH_TAP register (Address 0x1D) occurs for less time than is specified in the DUR register (Address 0x21). DOUBLE_TAP The DOUBLE_TAP bit is set when two acceleration events that are greater than the value in the THRESH_TAP register (Address 0x1D) occur for less time than is specified in the DUR register (Address 0x21), with the second tap starting after the time specified by the latent register (Address 0x22) but within the time specified in the window register (Address 0x23). See the Tap Detection section for more details. Activity The activity bit is set when acceleration greater than the value stored in the THRESH_ACT register (Address 0x24) is experienced. Inactivity The inactivity bit is set when acceleration of less than the value stored in the THRESH_INACT register (Address 0x25) is experienced for more time than is specified in the TIME_INACT register (Address 0x26). The maximum value for TIME_INACT is 255 sec. FREE_FALL The FREE_FALL bit is set when acceleration of less than the value stored in the THRESH_FF register (Address 0x28) is experienced for more time than is specified in the TIME_FF register (Address 0x29). The FREE_FALL interrupt differs from the inactivity interrupt as follows: all axes always participate, the timer period is much smaller (1.28 sec maximum), and the mode of operation is always dc-coupled. Watermark The watermark bit is set when the number of samples in FIFO equals the value stored in the samples bits (Register FIFO_CTL, Address 0x38). The watermark bit is cleared automatically when FIFO is read, and the content returns to a value below the value stored in the samples bits. Overrun The overrun bit is set when new data replaces unread data. The precise operation of the overrun function depends on the FIFO mode. In bypass mode, the overrun bit is set when new data replaces unread data in the DATAX, DATAY, and DATAZ registers (Address 0x32 to Address 0x37). In all other modes, the overrun bit is set when FIFO is filled. The overrun bit is automatically cleared when the contents of FIFO are read. Orientation The orientation bit is set when the orientation of the accelerometer changes from a valid orientation to different valid orientation. An interrupt is not generated, however, if the orientation of the accelerometer changes from a valid orientation to an invalid orientation, or from a valid orientation to an invalid orientation and then back to the same valid orientation. An invalid orientation is defined as an orientation within the dead zone, or region of hysteresis. This region helps to prevent rapid orientation change due to noise when the accelerometer orientation is close to the boundary between two valid orientations. The orientations that are valid for the interrupt depends on which mode, 2-D or 3-D, is linked to the orientation interrupt. The mode is selected with the INT_3D bit in the ORIENT_CONF register (Address 0x3B). Refer to the Register 0x3B—ORIENT_CONF (Read/Write) section for more details on how to enable the orientation interrupt. FIFO The ADXL346 contains patent pending technology for an embedded memory management system with 32-level FIFO that can be used to minimize host processor burden. This buffer has four modes: bypass, FIFO, stream, and trigger (see Table 20). Each mode is selected by the settings of the FIFO_MODE bits in the FIFO_CTL register (Address 0x38). Bypass Mode In bypass mode, FIFO is not operational and, therefore, remains empty. FIFO Mode In FIFO mode, data from measurements of the x-, y-, and z-axes are stored in FIFO. When the number of samples in FIFO equals the level specified in the samples bits of the FIFO_CTL register (Address 0x38), the watermark interrupt is set. FIFO Rev. PrC | Page 16 of 32 Preliminary Technical Data ADXL346 continues accumulating samples until it is full (32 samples from measurements of the x-, y-, and z-axes) and then stops collecting data. After FIFO stops collecting data, the device continues to operate; therefore, features such as tap detection can be used after FIFO is full. The watermark interrupt continues to occur until the number of samples in FIFO is less than the value stored in the samples bits of the FIFO_CTL register. Stream Mode In stream mode, data from measurements of the x-, y-, and zaxes are stored in FIFO. When the number of samples in FIFO equals the level specified in the samples bits of the FIFO_CTL register (Address 0x38), the watermark interrupt is set. FIFO continues accumulating samples and holds the latest 32 samples from measurements of the x-, y-, and z-axes, discarding older data as new data arrives. The watermark interrupt continues occurring until the number of samples in FIFO is less than the value stored in the samples bits of the FIFO_CTL register. Trigger Mode In trigger mode, FIFO accumulates samples, holding the latest 32 samples from measurements of the x-, y-, and z-axes. After a trigger event occurs and an interrupt is sent to the INT1 or INT2 pin (determined by the trigger bit in the FIFO_CTL register), FIFO keeps the last n samples (where n is the value specified by the samples bits in the FIFO_CTL register) and then operates in FIFO mode, collecting new samples only when FIFO is not full. A delay of at least 5 μs should be present between the trigger event occurring and the start of reading data from the FIFO to allow the FIFO to discard and retain the necessary samples. Additional trigger events cannot be recognized until the trigger mode is reset. To reset the trigger mode, set the device to bypass mode and then set the device back to trigger mode. Note that the FIFO data should be read first because placing the device into bypass mode clears FIFO. the FIFO has completely popped. For SPI operation greater than 1.6 MHz, it is necessary to deassert the CS pin to ensure a total delay of 5 μs; otherwise, the delay will not be sufficient. The total delay necessary for 5 MHz operation is at most 3.4 μs. This is not a concern when using I2C mode because the communication rate is low enough to ensure a sufficient delay between FIFO reads. SELF-TEST The ADXL346 incorporates a self-test feature that effectively tests its mechanical and electronic systems simultaneously. When the self-test function is enabled (via the SELF_TEST bit in the DATA_FORMAT register, Address 0x31), an electrostatic force is exerted on the mechanical sensor. This electrostatic force moves the mechanical sensing element in the same manner as acceleration, and it is additive to the acceleration experienced by the device. This added electrostatic force results in an output change in the x-, y-, and z-axes. Because the electrostatic force is proportional to VS2, the output change varies with VS. This effect is shown in Figure 35. The scale factors shown in Table 12 can be used to adjust the expected self-test output limits for different supply voltages, VS. The self-test feature of the ADXL346 also exhibits a bimodal behavior. However, the limits shown in Table 1 and Table 13 to Table 16 are valid for both potential selftest values due to bimodality. Use of the self-test feature at data rates less than 100 Hz may yield values outside these limits. Therefore, the part should be placed into a data rate of 100 Hz or greater when using self-test. The part also needs to be in normal power operation (LOW_POWER bit = 0 in BW_RATE register, Address 0x2C) for self-test to operate correctly. Retrieving Data from FIFO The FIFO data is read through the DATAX, DATAY, and DATAZ registers (Address 0x32 to Address 0x37). When the FIFO is in FIFO, stream, or trigger mode, reads to the DATAX, DATAY, and DATAZ registers read data stored in the FIFO. Each time data is read from the FIFO, the oldest x-, y-, and z-axes data are placed into the DATAX, DATAY and DATAZ registers. If a single-byte read operation is performed, the remaining bytes of data for the current FIFO sample are lost. Therefore, all axes of interest should be read in a burst (or multiple-byte) read operation. To ensure that the FIFO has completely popped (that is, that new data has completely moved into the DATAX, DATAY, and DATAZ registers), there must be at least 5 μs between the end of reading the data registers and the start of a new read of the FIFO or a read of the FIFO_STATUS register (Address 0x39). The end of reading a data register is signified by the transition from Register 0x37 to Register 0x38 or by the CS pin going high. For SPI operation at 1.6 MHz or less, the register addressing portion of the transmission is a sufficient delay to ensure that Figure 35. Self-Test Output Change Limits vs. Supply Voltage Table 12. Self-Test Output Scale Factors for Different Supply Voltages, VS Supply Voltage, VS 1.70 V 1.80 V 2.00 V 2.50 V 2.75 V Rev. PrC | Page 17 of 32 X-, y-Axes TBD TBD TBD 1.00 TBD Z-Axis TBD TBD TBD 1.00 TBD ADXL346 Preliminary Technical Data Table 13. Self-Test Output in LSB for ±2 g, 10-Bit or Full Resolution (TA = 25°C, VS = 2.5 V, VDD I/O = 1.8 V) Axis X Y Z Min 62 −437 92 Max 437 −62 550 Unit LSB LSB LSB Table 14. Self-Test Output in LSB for ±4 g, 10-Bit Resolution (TA = 25°C, VS = 2.5 V, VDD I/O = 1.8 V) Axis X Y Z Min 31 −219 46 Max 219 −31 275 Unit LSB LSB LSB Table 15. Self-Test Output in LSB for ±8 g, 10-Bit Resolution (TA = 25°C, VS = 2.5 V, VDD I/O = 1.8 V) Axis X Y Z Min 15 −109 23 Max 109 −15 138 Unit LSB LSB LSB Table 16. Self-Test Output in LSB for ±16 g, 10-Bit Resolution (TA = 25°C, VS = 2.5 V, VDD I/O = 1.8 V) Axis X Y Z Min 8 −54 12 Max 54 −8 68 Unit LSB LSB LSB Rev. PrC | Page 18 of 32 Preliminary Technical Data ADXL346 REGISTER MAP Table 17. Register Map Hex 0x00 0x01 to 0x1C 0x1D 0x1E 0x1F 0x20 0x21 0x22 0x23 0x24 0x25 0x26 0x27 0x28 0x29 0x2A 0x2B 0x2C 0x2D 0x2E 0x2F 0x30 0x31 0x32 0x33 0x34 0x35 0x36 0x37 0x38 0x39 0x3A 0x3B 0x3C Address Dec 0 1 to 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 Name DEVID Reserved Type R Reset Value 11100101 Description Device ID. Reserved. Do not access. THRESH_TAP OFSX OFSY OFSZ DUR Latent Window THRESH_ACT THRESH_INACT TIME_INACT ACT_INACT_CTL THRESH_FF TIME_FF TAP_AXES ACT_TAP_STATUS BW_RATE POWER_CTL INT_ENABLE INT_MAP INT_SOURCE DATA_FORMAT DATAX0 DATAX1 DATAY0 DATAY1 DATAZ0 DATAZ1 FIFO_CTL FIFO_STATUS TAP_SIGN ORIENT_CONF Orient R/W R/W R/W R/W R/W R/W R/W R/W R/W R/W R/W R/W R/W R/W R R/W R/W R/W R/W R R/W R R R R R R R/W R R R/W R 00000000 00000000 00000000 00000000 00000000 00000000 00000000 00000000 00000000 00000000 00000000 00000000 00000000 00000000 00000000 00001010 00000000 00000000 00000000 00000010 00000000 00000000 00000000 00000000 00000000 00000000 00000000 00000000 00000000 00000000 00000000 00000000 Tap threshold. X-axis offset. Y-axis offset. Z-axis offset. Tap duration. Tap latency. Tap window. Activity threshold. Inactivity threshold. Inactivity time. Axis enable control for activity and inactivity detection. Free-fall threshold. Free-fall time. Axis control for single tap/double tap. Source of single tap/double tap. Data rate and power mode control. Power-saving features control. Interrupt enable control. Interrupt mapping control. Source of interrupts. Data format control. X-Axis Data 0. X-Axis Data 1. Y-Axis Data 0. Y-Axis Data 1. Z-Axis Data 0. Z-Axis Data 1. FIFO control. FIFO status. Sign and source for single tap/double tap Orientation configuration Orientation status Rev. PrC | Page 19 of 32 ADXL346 Preliminary Technical Data Register 0x25—THRESH_INACT (Read/Write) REGISTER DEFINITIONS Register 0x00—DEVID (Read Only) The DEVID register holds a fixed device ID code of 0xE6 (346 octal). The THRESH_INACT register is eight bits and holds the threshold value for detecting inactivity. The data format is unsigned, so the magnitude of the inactivity event is compared with the value in the THRESH_INACT register. The scale factor is 62.5 mg/LSB. A value of 0 may result in undesirable behavior if the inactivity interrupt is enabled. Register 0x1D—THRESH_TAP (Read/Write) Register 0x26—TIME_INACT (Read/Write) The THRESH_TAP register is eight bits and holds the threshold value for tap interrupts. The data format is unsigned, so the magnitude of the tap event is compared with the value in THRESH_TAP for normal tap detection. For information on improved tap detection, refer to the Improved Tap Detection section. The scale factor is 62.5 mg/LSB (that is, 0xFF = +16 g). A value of 0 may result in undesirable behavior if single tap/ double tap interrupts are enabled. The TIME_INACT register is eight bits and contains an unsigned time value representing the amount of time that acceleration must be less than the value in the THRESH_INACT register for inactivity to be declared. The scale factor is 1 sec/LSB. Unlike the other interrupt functions, which use unfiltered data (see the Threshold section), the inactivity function uses filtered output data. At least one output sample must be generated for the inactivity interrupt to be triggered. This results in the function appearing unresponsive if the TIME_INACT register is set to a value less than the time constant of the output data rate. A value of 0 results in an interrupt when the output data is less than the value in the THRESH_INACT register. D7 1 D6 1 D5 1 D4 0 D3 0 D2 1 D1 1 D0 0 Register 0x1E, Register 0x1F, Register 0x20—OFSX, OFSY, OFSZ (Read/Write) The OFSX, OFSY, and OFSZ registers are each eight bits and offer user-set offset adjustments in twos complement format with a scale factor of 15.6 mg/LSB (that is, 0x7F = +2 g). Register 0x21—DUR (Read/Write) The DUR register is eight bits and contains an unsigned time value representing the maximum time that an event must be above the THRESH_TAP threshold to qualify as a tap event. For information on improved tap detection, refer to the Improved Tap Detection section. The scale factor is 625 µs/LSB. A value of 0 disables the single tap/double tap functions. Register 0x22—Latent (Read/Write) The latent register is eight bits and contains an unsigned time value representing the wait time from the detection of a tap event to the start of the time window (defined by the window register) during which a possible second tap event can be detected. For information on improved tap detection, refer to the Improved Tap Detection section. The scale factor is 1.25 ms/LSB. A value of 0 disables the double tap function. Register 0x23—Window (Read/Write) Register 0x27—ACT_INACT_CTL (Read/Write) D7 ACT ac/dc D3 INACT ac/dc D6 ACT_X enable D2 INACT_X enable D5 ACT_Y enable D1 INACT_Y enable D4 ACT_Z enable D0 INACT_Z enable ACT AC/DC and INACT AC/DC Bits A setting of 0 selects dc-coupled operation, and a setting of 1 enables ac-coupled operation. In dc-coupled operation, the current acceleration magnitude is compared directly with THRESH_ACT and THRESH_INACT to determine whether activity or inactivity is detected. In ac-coupled operation for activity detection, the acceleration value at the start of activity detection is taken as a reference value. New samples of acceleration are then compared to this reference value, and if the magnitude of the difference exceeds the THRESH_ACT value, the device triggers an activity interrupt. The window register is eight bits and contains an unsigned time value representing the amount of time after the expiration of the latency time (determined by the latent register) during which a second valid tap can begin. For information on improved tap detection, refer to the Improved Tap Detection section. The scale factor is 1.25 ms/LSB. A value of 0 disables the double tap function. Similarly, in ac-coupled operation for inactivity detection, a reference value is used for comparison and is updated whenever the device exceeds the inactivity threshold. After the reference value is selected, the device compares the magnitude of the difference between the reference value and the current acceleration with THRESH_INACT. If the difference is less than the value in THRESH_INACT for the time in TIME_INACT, the device is considered inactive and the inactivity interrupt is triggered. Register 0x24—THRESH_ACT (Read/Write) ACT_x Enable Bits and INACT_x Enable Bits The THRESH_ACT register is eight bits and holds the threshold value for detecting activity. The data format is unsigned, so the magnitude of the activity event is compared with the value in the THRESH_ACT register. The scale factor is 62.5 mg/LSB. A value of 0 may result in undesirable behavior if the activity interrupt is enabled. A setting of 1 enables x-, y-, or z-axis participation in detecting activity or inactivity. A setting of 0 excludes the selected axis from participation. If all axes are excluded, the function is disabled. Rev. PrC | Page 20 of 32 Preliminary Technical Data ADXL346 Register 0x28—THRESH_FF (Read/Write) The THRESH_FF register is eight bits and holds the threshold value, in unsigned format, for free-fall detection. The root-sumsquare (RSS) value of all axes is calculated and compared with the value in THRESH_FF to determine if a free-fall event occurred. The scale factor is 62.5 mg/LSB. Note that a value of 0 mg may result in undesirable behavior if the free-fall interrupt is enabled. Values between 300 mg and 600 mg (0x05 to 0x09) are recommended. The TIME_FF register is eight bits and stores an unsigned time value representing the minimum time that the RSS value of all axes must be less than THRESH_FF to generate a free-fall interrupt. The scale factor is 5 ms/LSB. A value of 0 may result in undesirable behavior if the free-fall interrupt is enabled. Values between 100 ms and 350 ms (0x14 to 0x46) are recommended. Register 0x2A—TAP_AXES (Read/Write) D6 0 D5 0 D4 Improved tap D3 Suppress D2 TAP_X enable D1 TAP_Y enable D0 TAP_Z enable Improved Tap Bit The improved tap bit is used to enable improved tap detection. This mode of operation improves tap detection by performing an ac-coupled differential comparison of the output acceleration data. The improved tap detection is performed on the same output data available in the DATAX, DATAY and DATAZ registers. Due to the dependency on the output data rate and the ac-coupled differential measurement, the threshold and timing values for single taps and double taps need to be adjusted for improved tap detection. For further explanation of improved tap detection, refer to the Improved Tap Detection section. Suppress Bit Setting the suppress bit suppresses double tap detection if acceleration greater than the value in THRESH_TAP is present between taps. See the Tap Detection section for more details. TAP_x Enable Bits A setting of 1 in the TAP_X enable, TAP_Y enable, or TAP_Z enable bit enables x-, y-, or z-axis participation in tap detection. A setting of 0 excludes the selected axis from participation in tap detection. Register 0x2B—ACT_TAP_STATUS (Read Only) D7 0 D6 ACT_X source D5 ACT_Y source D4 ACT_Z source D3 Asleep D2 TAP_X source Asleep Bit A setting of 1 in the asleep bit indicates that the part is asleep, and a setting of 0 indicates that the part is not asleep. See the Register 0x2D—POWER_CTL (Read/Write) section for more information on autosleep mode. Register 0x2C—BW_RATE (Read/Write) D7 0 Register 0x29—TIME_FF (Read/Write) D7 0 clears the corresponding source bit when the next activity or single tap/double tap event occurs. D1 TAP_Y source D0 TAP_Z source ACT_x Source and TAP_x Source Bits These bits indicate the first axis involved in a tap or activity event. A setting of 1 corresponds to involvement in the event, and a setting of 0 corresponds to no involvement. When new data is available, these bits are not cleared but are overwritten by the new data. The ACT_TAP_STATUS register should be read before clearing the interrupt. Disabling an axis from participation D6 0 D5 0 D4 LOW_POWER D3 D2 D1 Rate D0 LOW_POWER Bit A setting of 0 in the LOW_POWER bit selects normal operation, and a setting of 1 selects reduced power operation, which has somewhat higher noise (see the Power Modes section for details). Rate Bits These bits select the device bandwidth and output data rate (see Table 6 and Table 7 for details). The default value is 0x0A, which translates to a 100 Hz output data rate. An output data rate should be selected that is appropriate for the communication protocol and frequency selected. Selecting too high of an output data rate with a low communication speed results in samples being discarded. Register 0x2D—POWER_CTL (Read/Write) D7 0 D6 0 D5 Link D4 AUTO_SLEEP D3 Measure D2 Sleep D1 D0 Wakeup Link Bit A setting of 1 in the link bit with both the activity and inactivity functions enabled delays the start of the activity function until inactivity is detected. After activity is detected, inactivity detection begins, preventing the detection of activity. This bit serially links the activity and inactivity functions. When this bit is set to 0, the inactivity and activity functions are concurrent. Additional information can be found in the Link Mode section. When clearing the link bit, it is recommended that the part be placed into standby mode and then set back to measurement mode with a subsequent write. This is done to ensure that the device is properly biased if sleep mode is manually disabled; otherwise, the first few samples of data after the link bit is cleared may have additional noise, especially if the device was asleep when the bit was cleared. AUTO_SLEEP Bit If the link bit is set, a setting of 1 in the AUTO_SLEEP bit sets the ADXL346 to switch to sleep mode when inactivity is detected (that is, when acceleration has been below the THRESH_INACT value for at least the time indicated by TIME_INACT). A setting of 0 disables automatic switching to sleep mode. See the description of the sleep bit in this section for more information. When clearing the AUTO_SLEEP bit, it is recommended that the part be placed into standby mode and then set back to measure- Rev. PrC | Page 21 of 32 ADXL346 Preliminary Technical Data ment mode with a subsequent write. This is done to ensure that the device is properly biased if sleep mode is manually disabled; otherwise, the first few samples of data after the AUTO_SLEEP bit is cleared may have additional noise, especially if the device was asleep when the bit was cleared. Register 0x2F—INT_MAP (Read/Write) D7 DATA_READY D3 Inactivity D6 SINGLE_TAP D2 FREE_FALL D5 DOUBLE_TAP D1 Watermark Measure Bit D4 Activity D0 Overrun/ orientation A setting of 0 in the measure bit places the part into standby mode, and a setting of 1 places the part into measurement mode. The ADXL346 powers up in standby mode with minimum power consumption. Any bits set to 0 in this register send their respective interrupts to the INT1 pin, whereas bits set to 1 send their respective interrupts to the INT2 pin. All selected interrupts for a given pin are OR’ed. Sleep Bit D7 DATA_READY D3 Inactivity A setting of 0 in the sleep bit puts the part into the normal mode of operation, and a setting of 1 places the part into sleep mode. Sleep mode suppresses DATA_READY, stops transmission of data to FIFO, and switches the sampling rate to one specified by the wakeup bits. In sleep mode, only the activity function can be used. When clearing the sleep bit, it is recommended that the part be placed into standby mode and then set back to measurement mode with a subsequent write. This is done to ensure that the device is properly biased if sleep mode is manually disabled; otherwise, the first few samples of data after the sleep bit is cleared may have additional noise, especially if the device was asleep when the bit was cleared. Wakeup Bits These bits control the frequency of readings in sleep mode as described in Table 18. Setting D0 0 1 0 1 D6 SINGLE_TAP D2 FREE_FALL D5 DOUBLE_TAP D1 Watermark D5 DOUBLE_TAP D1 Watermark D4 Activity D0 Overrun/ orientation Register 0x31—DATA_FORMAT (Read/Write) D6 SPI D5 INT_INVERT D4 0 D3 FULL_RES D2 Justify D1 D0 Range The DATA_FORMAT register controls the presentation of data to Register 0x32 through Register 0x37. All data, except that for the ±16 g range, must be clipped to avoid rollover. Frequency (Hz) 8 4 2 1 SELF_TEST Bit Register 0x2E—INT_ENABLE (Read/Write) D7 DATA_READY D3 Inactivity D6 SINGLE_TAP D2 FREE_FALL Bits set to 1 in this register indicate that their respective functions have triggered an event, whereas a value of 0 indicates that the corresponding event has not occurred. The DATA_READY, watermark, and overrun bits are always set if the corresponding events occur, regardless of the INT_ENABLE register settings, and are cleared by reading data from the DATAX, DATAY, and DATAZ registers. The DATA_READY and watermark bits may require multiple reads, as indicated in the FIFO mode descriptions in the FIFO section. Other bits, and the corresponding interrupts, including orientation if enabled, are cleared by reading the INT_SOURCE register. D7 SELF_TEST Table 18. Frequency of Readings in Sleep Mode D1 0 0 1 1 Register 0x30—INT_SOURCE (Read Only) D4 Activity D0 Overrun/ orientation Setting bits in this register to a value of 1 enables their respective functions to generate interrupts, whereas a value of 0 prevents the functions from generating interrupts. The DATA_READY, watermark, and overrun bits enable only the interrupt output; the functions are always enabled. It is recommended that interrupts be configured before enabling their outputs. A setting of 1 in the SELF_TEST bit applies a self-test force to the sensor, causing a shift in the output data. A value of 0 disables the self-test force. SPI Bit A value of 1 in the SPI bit sets the device to 3-wire SPI mode, and a value of 0 sets the device to 4-wire SPI mode. INT_INVERT Bit A value of 0 in the INT_INVERT bit sets the interrupts to active high, and a value of 1 sets the interrupts to active low. FULL_RES Bit When this bit is set to a value of 1, the device is in full resolution mode, where the output resolution increases with the g range set by the range bits to maintain a 4 mg/LSB scale factor. When the FULL_RES bit is set to 0, the device is in 10-bit mode, and the range bits determine the maximum g range and scale factor. Rev. PrC | Page 22 of 32 Preliminary Technical Data ADXL346 Justify Bit Samples Bits A setting of 1 in the justify bit selects left (MSB) justified mode, and a setting of 0 selects right justified mode with sign extension. The function of these bits depends on the FIFO mode selected (see Table 21). Entering a value of 0 in the samples bits immediately sets the watermark status bit in the INT_SOURCE register, regardless of which FIFO mode is selected. Undesirable operation may occur if a value of 0 is used for the samples bits when trigger mode is used. Range Bits These bits set the g range as described in Table 19. Table 19. g Range Setting D1 0 0 1 1 Setting D0 0 1 0 1 Table 21. Samples Bits Functions g Range ±2 g ±4 g ±8 g ±16 g FIFO Mode Bypass FIFO Stream Trigger Register 0x32 to Register 0x37—DATAX0, DATAX1, DATAY0, DATAY1, DATAZ0, DATAZ1 (Read Only) These six bytes (Register 0x32 to Register 0x37) are eight bits each and hold the output data for each axis. Register 0x32 and Register 0x33 hold the output data for the x-axis, Register 0x34 and Register 0x35 hold the output data for the y-axis, and Register 0x36 and Register 0x37 hold the output data for the z-axis. The output data is twos complement, with DATAx0 as the least significant byte and DATAx1 as the most significant byte, where x represent X, Y, or Z. The DATA_FORMAT register (Address 0x31) controls the format of the data. It is recommended that a multiple-byte read of all registers be performed to prevent a change in data between reads of sequential registers. Register 0x38—FIFO_CTL (Read/Write) D7 D6 FIFO_MODE D5 Trigger D4 D3 D2 D1 Samples D0 FIFO_MODE Bits These bits set the FIFO mode, as described in Table 20. Mode Bypass FIFO 1 0 Stream 1 1 Trigger 0x39—FIFO_STATUS (Read Only) D7 FIFO_TRIG D6 0 D5 D4 D3 D2 Entries D1 D0 FIFO_TRIG Bit A 1 in the FIFO_TRIG bit corresponds to a trigger event occurring, and a 0 means that a FIFO trigger event has not occurred. Entries Bits These bits report how many data values are stored in FIFO. Access to collect the data from FIFO is provided through the DATAX, DATAY, and DATAZ registers. FIFO reads must be done in burst or multiple-byte mode because each FIFO level is cleared after any read (single- or multiple-byte) of FIFO. FIFO stores a maximum of 32 entries, which equates to a maximum of 33 entries available at any given time because an additional entry is available at the output filter of the device. Register 0x3A—TAP_SIGN (Read Only) Table 20. FIFO Modes Setting D7 D6 0 0 0 1 Samples Bits Function None. Specifies how many FIFO entries are needed to trigger a watermark interrupt. Specifies how many FIFO entries are needed to trigger a watermark interrupt. Specifies how many FIFO samples are retained in the FIFO buffer before a trigger event. Function FIFO is bypassed. FIFO collects up to 32 values and then stops collecting data, collecting new data only when FIFO is not full. FIFO holds the last 32 data values. When FIFO is full, the oldest data is overwritten with newer data. When triggered by the trigger bit, FIFO holds the last data samples before the trigger event and then continues to collect data until full. New data is collected only when FIFO is not full. Trigger Bit A value of 0 in the trigger bit links the trigger event of trigger mode INT1, and a value of 1 links the trigger event to INT2. D7 0 D6 XSIGN D5 YSIGN D4 ZSIGN D3 0 D2 XTAP D1 YTAP D0 ZTAP xSIGN Bits These bits indicate the sign of the first axis involved in a tap event. A setting of 1 corresponds to acceleration in the negative direction, and a setting of 0 corresponds to acceleration in the positive direction. These bits update only when a new single tap/double tap event is detected, and only the axes enabled in the TAP_AXES register are updated. The TAP_SIGN register should be read before clearing the interrupt. See the Tap Sign section for more details. xTAP Bits These bits indicate the first axis involved in a tap event. A setting of 1 corresponds to involvement in the event, and a setting of 0 corresponds to no involvement. When new data is available, these bits are not cleared but are overwritten by the new data. The TAP_SIGN register should be read before clearing Rev. PrC | Page 23 of 32 ADXL346 Preliminary Technical Data the interrupt. Disabling an axis from participation clears the corresponding source bit when the next single tap/double tap event occurs. orientation. A value of 1 generates an interrupt only if the 3-D orientation changes from a valid 3-D orientation to a different valid 3-D orientation. Register 0x3B—ORIENT_CONF (Read/Write) Divisor Bits D7 INT_ ORIENT D6 D5 D4 Dead zone D3 D2 INT_ 3D D1 D0 Divisor INT_ORIENT Bit Setting the INT_ORIENT bit enables the orientation interrupt. A value of 1 overrides the overrun function of the device and replaces overrun in the INT_MAP, INT_ENABLE, and INT_ SOURCE registers with the orientation function. After setting the INT_ORIENT bit, the orientation bit in the INT_MAP and INT_ENABLE registers must be configured to map the orientation interrupt to INT1 or INT2 and to enable generation of the interrupt to the pin. The orientation interrupt is cleared by reading the INT_SOURCE register. Additionally, writing to the BW_RATE register, clearing the INT_ORIENT bit, or placing the part into standby mode clears the orientation interrupt. A value of 0 for the INT_ORIENT bit disables generation of the orientation interrupt and permits the use of the overrun function. Dead Zone Bits These bits determine the region between two adjacent orientations, where the orientation is considered invalid and is not updated. A value of 0 may result in undesirable behavior when the orientation is close to the bisector between two adjacent regions. The dead zone angle is determined by these bits, as described in Table 22. See the Orientation Sensing section for more details. Table 22. Dead Zone and Divisor Codes Decimal 0 1 2 3 4 5 6 7 Binary 000 001 010 011 100 101 110 111 Dead Zone Angle (Degrees) 3-D 2-D 3.3 5.8 8.2 10.3 12.3 14.1 15.6 17.0 2.5 6.3 9.8 13.0 16.0 18.6 20.9 23.0 These bits set the depth of the filter used to low-pass filter the measured acceleration for stable orientation sensing. The divisor length is determined by these bits, as detailed in Table 22. See the Orientation Sensing section for more details. Register 0x3C—Orient (Read Only) D7 0 D6 V2 D5 D4 2D_ORIENT D3 V3 D2 D1 D0 3D_ORIENT Vx Bits These bits show the validity of the 2-D (V2) and 3-D (V3) orientations. A value of 1 corresponds to the orientation being valid. A value of 0 means that the orientation is invalid because the current orientation is in the dead zone. xD_ORIENT Bits These bits represent the current 2-D (2D_ORIENT) and 3-D (3D_ORIENT) orientations of the accelerometer. If the orientation interrupt is enabled, this register is read to determine the orientation of the device when the interrupt occurs. Because this register updates with each new samples of acceleration data, it should be read at the time of the orientation interrupt to ensure that the orientation change that caused the interrupt is obtained. Orientation values are shown in Table 23 and Table 24. See the Orientation Sensing section for more details Changing the value in the BW_RATE register causes the orientation sensing filter to be cleared and the function to reset. Table 23. 2-D Orientation Codes Divisor 2 4 8 16 32 64 128 256 INT_3D If the orientation interrupt is enabled, the INT_3D bit determines whether 2-D or 3-D orientation detection generates an interrupt. A value of 0 generates an interrupt only if the 2-D orientation changes from a valid 2-D orientation to a different valid 2-D Decimal 0 1 2 3 Binary 00 01 10 11 Orientation Portrait positive Portrait negative Landscape positive Landscape negative Dominant Axis +X −X +Y −Y Table 24. 3-D Orientation Codes Decimal 3 4 2 5 1 6 Rev. PrC | Page 24 of 32 Binary 011 100 010 101 001 110 Orientation Front Back Left Right Top Bottom Dominant Axis +X −X +Y −Y +Z −Z Preliminary Technical Data ADXL346 APPLICATIONS INFORMATION POWER SUPPLY DECOUPLING TAP DETECTION A 1 μF tantalum capacitor (CS) at VS and a 0.1 μF ceramic capacitor (CIO) at VDD I/O placed close to the ADXL346 supply pins is recommended to adequately decouple the accelerometer from noise on the power supply. If additional decoupling is necessary, a resistor or ferrite bead, no larger than 100 Ω, in series with VS may be helpful. Additionally, increasing the bypass capacitance on VS to a 10 μF tantalum capacitor in parallel with a 0.1 μF ceramic capacitor may also improve noise. The tap interrupt function is capable of detecting either single or double taps. The following parameters are shown in Figure 38 for a valid single and valid double tap event: Care should be taken to ensure that the connection from the ADXL346 ground to the power supply ground has low impedance because noise transmitted through ground has an effect similar to noise transmitted through VS. It is recommended that VS and VDD I/O be separate supplies to minimize digital clocking noise on the VS supply. If this is not possible, additional filtering of the supplies as previously mentioned may be necessary. VS The tap detection threshold is defined by the THRESH_TAP register (Address 0x1D). The maximum tap duration time is defined by the DUR register (Address 0x21). The tap latency time is defined by the latent register (Address 0x22) and is the waiting period from the end of the first tap until the start of the time window, when a second tap can be detected, which is determined by the value in the window register (Address 0x23). The interval after the latency time (set by the latent register) is defined by the window register. Although a second tap must begin after the latency time has expired, it need not finish before the end of the time defined by the window register. • • • • VDD I/O CS CIO FIRST TAP GND CS 3-WIRE OR 4-WIRE SPI OR I2C INTERFACE 08167-035 SDA/SDI/SDIO INT1 SDO/ALT ADDRESS SCL/SCLK INT2 XHI BW ADXL346 INTERRUPT CONTROL SECOND TAP VDD I/O TIME LIMIT FOR TAPS (DUR) Figure 36. Application Diagram The ADXL346 should be mounted on the PCB in a location close to a hard mounting point of the PCB to the case. Mounting the ADXL346 at an unsupported PCB location, as shown in Figure 37, may result in large, apparent measurement errors due to undampened PCB vibration. Locating the accelerometer near a hard mounting point ensures that any PCB vibration at the accelerometer is above the accelerometer’s mechanical sensor resonant frequency and, therefore, effectively invisible to the accelerometer. Multiple mounting points, close to the sensor, and/or a thicker PCB also help to reduce the effect of system resonance on the performance of the sensor. ACCELEROMETERS MOUNTING POINTS 08167-036 PCB LATENCY TIME (LATENT) INTERRUPTS MECHANICAL CONSIDERATIONS FOR MOUNTING THRESHOLD (THRESH_TAP) TIME WINDOW FOR SECOND TAP (WINDOW) SINGLE TAP INTERRUPT DOUBLE TAP INTERRUPT 08167-037 VS Figure 38. Tap Interrupt Function with Valid Single and Double Taps If only the single tap function is in use, the single tap interrupt is triggered when the acceleration goes below the threshold, as long as DUR has not been exceeded. If both single and double tap functions are in use, the single tap interrupt is triggered when the double tap event has been either validated or invalidated. Several events can occur to invalidate the second tap of a double tap event. First, if the suppress bit in the TAP_AXES register (Address 0x2A) is set, any acceleration spike above the threshold during the latency time (set by the latent register) invalidates the double tap detection, as shown in Figure 39. Figure 37. Incorrectly Placed Accelerometers Rev. PrC | Page 25 of 32 ADXL346 Preliminary Technical Data INVALIDATES DOUBLE TAP IF SUPRESS BIT SET LATENCY TIME (LATENT) TIME WINDOW FOR SECOND TAP (WINDOW) Figure 39. Double Tap Event Invalid Due to High g Event When the Suppress Bit Is Set A double tap event can also be invalidated if acceleration above the threshold is detected at the start of the time window for the second tap (set by the window register). This results in an invalid double tap at the start of this window, as shown in Figure 40. Additionally, a double tap event can be invalidated if an acceleration exceeds the time limit for taps (set by the DUR register), resulting in an invalid double tap at the end of the DUR time limit for the second tap event, also shown in Figure 40. INVALIDATES DOUBLE TAP AT START OF WINDOW XHI BW LATENCY TIME (LATENT) TIME WINDOW FOR SECOND TAP (WINDOW) Improved tap detection is enabled by setting the improved tap bit of the TAP_AXES register (Address 0x2A). When improved tap detection is enabled, the filtered output data corresponding to the output data rate set in the BW_RATE register is processed to determine if a tap event occurred. In addition, an ac-coupled differential measurement is used. This results in the timing values and threshold values for improved tap detection being different than those used for normal tap detection. TAP SIGN 08167-039 XHI BW TIME LIMIT FOR TAPS (DUR) INVALIDATES DOUBLE TAP AT END OF DUR IMPROVED TAP DETECTION When improved tap detection is used, new values must be determined based on test results. In general, no timing values (in the DUR, latent, or window registers) should be set that are less than the time step resolution set by the output data rate. The threshold value for improved tap detection can typically be set much lower than the threshold for normal tap detection. The value used depends on the value in the BW_RATE register and should be determined through system testing. Refer to the Threshold section for more details. TIME LIMIT FOR TAPS (DUR) TIME LIMIT FOR TAPS (DUR) After a tap interrupt has been received, the first axis to exceed the THRESH_TAP level is reported in the ACT_TAP_STATUS register (Address 0x2B). This register is never cleared, but is overwritten with new data. Figure 40. Tap Interrupt Function with Invalid Double Taps Single taps, double taps, or both can be detected by setting the respective bits in the INT_ENABLE register (Address 0x2E). Control over participation of each of the three axes in single tap/ double tap detection is exerted by setting the appropriate bits in the TAP_AXES register (Address 0x2A). For the double tap function to operate, both the latent and window registers must be set to a nonzero value. A negative sign is produced by experiencing a negative acceleration, which corresponds to tapping on the positive face of the device for the desired axis. The positive face of the device is the face such that movement in that direction would be positive acceleration. For example, tapping on the face that corresponds to the +X direction, labeled as front in Figure 41, would result in a negative sign for the x-axis. Tapping on the face labeled as left in Figure 41 would result in a negative sign for the y-axis, and tapping on the face labeled top would result in a negative sign for the z-axis. Conversely, tapping on the back, right, or bottom sides would result in positive signs for the corresponding axes. Every mechanical system has somewhat different single tap/ double tap responses based on the mechanical characteristics of the system. Therefore, some experimentation with values for the +z TOP (+Z) +y LEFT (+Y) +x FRONT (+X) 08167-046 TIME LIMIT FOR TAPS (DUR) 08167-038 XHI BW latent, window, and THRESH_TAP registers is required. In general, a good starting point is to set the latent register to a value greater than 0x10, to set the window register to a value greater than 0x10, and to set the THRESH_TAP register to be greater than 3 g. Setting a very low value in the latent, window, or THRESH_TAP register may result in an unpredictable response due to the accelerometer picking up echoes of the tap inputs. Figure 41. 3-D Orientation with Coordinate System Rev. PrC | Page 26 of 32 Preliminary Technical Data ADXL346 THRESHOLD The lower output data rates are achieved by decimating a common sampling frequency inside the device. The activity, free-fall, and single tap/double tap detection functions without improved tap enabled are performed using unfiltered data. Since the output data is filtered, the high frequency and high g data that is used to determine activity, free-fall, and single tap/ double tap events may not be present if the output of the accelerometer is examined. This may result in trigger events being detected when acceleration does not appear to trigger an event because the unfiltered data may have exceeded a threshold or remained below a threshold for a certain period of time while the filtered output data has not exceeded such a threshold. LINK MODE The function of the link bit is to reduce the number of activity interrupts that the processor must service by setting the device to look for activity only after inactivity. For proper operation of this feature, the processor must still respond to the activity and inactivity interrupts by reading the INT_SOURCE register (Address 0x30) and, therefore, clearing the interrupts. If an activity interrupt is not cleared, the part cannot go into autosleep mode. The asleep bit in the ACT_TAP_STATUS register (Address 0x2B) indicates if the part is asleep. SLEEP MODE VS. LOW POWER MODE In applications where a low data rate is sufficient and low power consumption is desired, it is recommended that the low power mode be used in conjunction with the FIFO. The sleep mode, while offering a low data rate and low average current consumption, suppresses the DATA_READY interrupt, preventing the accelerometer from sending an interrupt signal to the host processor when data is ready to be collected. In this application, setting the part into low power mode (by setting the LOW_POWER bit in the BW_RATE register) and enabling the FIFO in FIFO mode to collect a large value of samples reduces the power consumption of the ADXL346 and allows the host processor to go to sleep while the FIFO is filling up. USING SELF-TEST The self-test change is defined as the difference between the acceleration output of an axis with self-test enabled and the acceleration output of the same axis with self-test disabled (see Endnote 4 of Table 1). This definition assumes that the sensor does not move between these two measurements, because if the sensor moves, a non–self-test related shift corrupts the test. Proper configuration of the ADXL346 is also necessary for an accurate self-test measurement. The part should be set with a data rate greater than or equal to 100 Hz. This is done by ensuring that a value greater than or equal to 0x0A is written into the rate bits (Bit D3 through Bit D0) in the BW_RATE register (Address 0x2C). The part also needs to be placed into normal power operation by ensuring the LOW_POWER bit in the BW_RATE register is cleared (LOW_POWER bit = 0). It is also recommended that the part be set to full-resolution, 16 g mode to ensure that there is sufficient dynamic range for the entire self-test shift. This is done by setting Bit D3 of the DATA_FORMAT register (Address 0x31) and writing a value of 0x03 to the range bits (Bit D1 and Bit D0) of the DATA_FORMAT register (Address 0x31). This results in a high dynamic range for measurement and a 3.9 mg/LSB scale factor. After the part is configured for accurate self-test measurement, several samples of x-, y-, and z-axis acceleration data should be retrieved from the sensor and averaged together. The number of samples averaged is a choice of the system designer, but a recommended starting point is 0.1 sec worth of data, which corresponds to 10 samples at 100 Hz data rate. The averaged values should be stored and labeled appropriately as the self-test disabled data, that is, XST_OFF, YST_OFF, and ZST_OFF. Next, self-test should be enabled by setting Bit D7 of the DATA_FORMAT register (Address 0x31). The output needs some time (about four samples) to settle after enabling self-test. After allowing the output to settle, several samples of the x-, y-, and z-axis acceleration data should be taken again and averaged. It is recommended that the same number of samples be taken for this average as was previously taken. These averaged values should again be stored and labeled appropriately as the value with selftest enabled, that is, XST_ON, YST_ON, and ZST_ON. Self-test can then be disabled by clearing Bit D7 of the DATA_FORMAT register (Address 0x31). With the stored values for self-test enabled and disabled, the self-test change is as follows: XST = XST_ON − XST_OFF YST = YST_ON − YST_OFF ZST = ZST_ON − ZST_OFF Because the measured output for each axis is expressed in LSBs, XST, YST, and ZST are also expressed in LSBs. These values can be converted to g’s of acceleration by multiplying each value by the 3.9 mg/LSB scale factor, if configured for full-resolution mode. Additionally, Table 13 through Table 16 correspond to the selftest range converted to LSBs and can be compared with the measured self-test change when operating at a VS of 2.5 V. For other voltages, the minimum and maximum self-test output values should be adjusted based on (multiplied by) the scale factors shown in Table 12. If the part was placed into ±2 g, 10bit or full-resolution mode, the values listed in Table 13 should be used. Although the fixed 10-bit mode or a range other than 16 g can be used, a different set of values, as indicated in Table 14 through Table 16, would need to be used. Using a range below 8 g may result in insufficient dynamic range and should be considered when selecting the range of operation for measuring self-test. If the self-test change is within the valid range, the test is considered successful. Generally, a part is considered to pass if the minimum magnitude of change is achieved. However, a part that changes by more than the maximum magnitude is not necessarily a failure. Rev. PrC | Page 27 of 32 ADXL346 Preliminary Technical Data ORIENTATION SENSING PORTRAIT The orientation function of the ADXL346 reports both 2-D and 3-D orientation concurrently through the orient register (Address 0x3C). The V2 and V3 bits (Bit D6 and Bit D3 in the orient register) report the validity of the 2-D and 3-D orientation codes. If V2 or V3 are set, their respective code is a valid orientation. If V2 or V3 are cleared, the orientation of the accelerometer is unknown, such as when the orientation is within the dead zone between valid regions. In 3-D orientation, the z-axis is also included. If the accelerometer is placed in a Cartesian coordinate system, as shown in Figure 41 of the Tap Sign section, the top of the device corresponds to the positive z-axis direction, the front of the device corresponds to the positive x-axis direction, and the right side of the device corresponds to the positive y-axis direction. +X NEGATIVE (01) DEADZONES +Y +Y +g +g +X LANDSCAPE POSITIVE (10) +Y NEGATIVE (11) +g +X +g +X 08167-040 For 2-D orientation sensing, the relation of the x- and y-axes to gravity is used to determine the accelerometer orientation (see Figure 42 and Table 23). Portrait positive corresponds to the x-axis being most closely aligned to the gravity vector and directed upwards, opposite the gravity vector. Portrait negative is the opposite of portrait positive with the x-axis pointing downwards along the gravity vector. Landscape positive corresponds to the y-axis being most closely aligned with the gravity vector and directed upwards, away from the gravity vector. Landscape negative is the orientation opposite landscape positive. The dead zone regions are shown in the orientations for portrait positive (+X) and portrait negative (−X) of Figure 42. These regions also exist for landscape positive (+Y) and landscape negative (−Y), as shown in Figure 42. POSITIVE (00) +Y Figure 42. 2-D Orientation with Corresponding Codes The width of the dead zone region between two or more orientation positions is determined by setting the value of the dead zone bits in the ORIENT_CONF register (Address 0x3B). The dead zone region size can be specified with a resolution of 3.6°. The dead zone angle represents the total angle where the orientation is considered invalid. Therefore, a dead zone of 10.8° corresponds to 5.4° in either direction away from the bisector of two bordering regions. An example with a dead zone region of 10.8° is shown in Figure 43. PORTRAIT POSITIVE The algorithm to detect orientation change is performed after filtering the output acceleration data to eliminate the effects of high frequency motion. This is performed by using a moving average filter of a depth set by the divisor bits (ORIENT_CONF register, Address 0x3B). The orientation register is updated at the same rate as the data rate set in the BW_RATE register, but is effectively bandwidth limited to the accelerometer bandwidth divided by the depth set by the divisor bits. To eliminate most human motion, such as walking or shaking, the value in the divisor bits should be selected to effectively limit the orientation bandwidth to 1 Hz or 2 Hz. 50.4° 45° 39.6° DEADZONE +X LANDSCAPE POSITIVE +Y +g 08167-041 The states shown in Table 24 correspond to which side of the accelerometer is directed upwards, opposite the gravity vector. As shown in Figure 41, the accelerometer is oriented in the top state. If the device is flipped over such that the top of the device is facing down, towards gravity, the orientation is reported as the bottom state. If the device is adjusted such that the positive x-axis or positive y-axis direction is pointing upwards, away from the gravity vector, the accelerometer reports the orientation as front or left, respectively. Figure 43. Orientation Showing a 10.8° Dead Zone Region By setting the INT_ORIENT bit of the ORIENT_CONF register (Address 0x3B), an interrupt can be generated when the device is placed into a new valid orientation. Only one mode of orientation detection, 2-D or 3-D, can generate an interrupt at a time. The orientation detection mode is selected by setting or clearing the INT_3D bit of the ORIENT_CONF register (Address 0x3B). For more details, refer to the description of the ORIENT_CONF register. Rev. PrC | Page 28 of 32 Preliminary Technical Data ADXL346 AXES OF ACCELERATION SENSITIVITY AZ AX 08167-042 AY Figure 44. Axes of Acceleration Sensitivity (Corresponding Output Voltage Increases When Accelerated Along the Sensitive Axis) XOUT = 1g YOUT = 0g ZOUT = 0g TOP TOP XOUT = 0g YOUT = 1g ZOUT = 0g XOUT = –1g YOUT = 0g ZOUT = 0g XOUT = 0g YOUT = 0g ZOUT = 1g Figure 45. Output Response vs. Orientation to Gravity Rev. PrC | Page 29 of 32 XOUT = 0g YOUT = 0g ZOUT = –1g 08167-043 TOP XOUT = 0g YOUT = –1g ZOUT = 0g TOP GRAVITY ADXL346 Preliminary Technical Data LAYOUT AND DESIGN RECOMMENDATIONS Figure 46 shows the recommended printed wiring board land pattern. Figure 47 and Table 25 provide details about the recommended soldering profile. 0.8000 0.3000 3.3500 0.5000 08167-044 3.3500 Figure 46. Recommended Printed Wiring Board Land Pattern (Dimensions shown in millimeters) CRITICAL ZONE TL TO TP tP TP tL TSMAX TSMIN tS RAMP-DOWN PREHEAT 08167-045 TEMPERATURE RAMP-UP TL t25°C TO PEAK TIME Figure 47. Recommended Soldering Profile Table 25. Recommended Soldering Profile1, 2 Profile Feature Average Ramp Rate from Liquid Temperature (TL) to Peak Temperature (TP) Preheat Minimum Temperature (TSMIN) Maximum Temperature (TSMAX) Time from TSMIN to TSMAX (tS) TSMAX to TL Ramp-Up Rate Liquid Temperature (TL) Time Maintained Above TL (tL) Peak Temperature (TP) Time of Actual TP − 5°C (tP) Ramp-Down Rate Time 25°C to Peak Temperature 1 2 Sn63/Pb37 3°C/sec max Condition Pb-Free 3°C/sec max 100°C 150°C 60 sec to 120 sec 3°C/sec max 183°C 60 sec to 150 sec 240 + 0/−5°C 10 sec to 30 sec 6°C/sec max 6 minutes max Based on JEDEC Standard J-STD-020D.1. For best results, the soldering profile should be in accordance with the recommendations of the manufacturer of the solder paste used. Rev. PrC | Page 30 of 32 150°C 200°C 60 sec to 180 sec 3°C/sec max 217°C 60 sec to 150 sec 260 + 0/−5°C 20 sec to 40 sec 6°C/sec max 8 minutes max Preliminary Technical Data ADXL346 OUTLINE DIMENSIONS A1 PAD CORNER 3.10 3.00 SQ 2.90 0.350 0.10 0.50 BSC 13 14 16 1 0.250 0.50 9 8 6 5 BOTTOM VIEW TOP VIEW 0.275 END VIEW 0.79 0.74 0.69 SEATING PLANE 061809-B 1.00 0.95 0.85 Figure 48. 16-Terminal Land Grid Array [LGA] (CC-16-3) Solder Terminations Finish Is Au over Ni Dimensions shown in millimeters ORDERING GUIDE Model ADXL346BCCZ1 ADXL346BCCZ-RL1 ADXL346BCCZ-RL71 EVAL-ADXL346Z1 EVAL-ADXL346Z-M1 Measurement Range (g) ±2, ±4, ±8, ±16 ±2, ±4, ±8, ±16 ±2, ±4, ±8, ±16 Specified Voltage (V) 2.5 2.5 2.5 Temperature Range −40°C to +85°C −40°C to +85°C −40°C to +85°C EVAL-ADXL346Z-S1 1 Z = RoHS Compliant Part. Rev. PrC | Page 31 of 32 Package Description 16-Terminal Land Grid Array [LGA] 16-Terminal Land Grid Array [LGA] 16-Terminal Land Grid Array [LGA] Evaluation Board Analog Devices Inertial Sensor Evaluation System, Includes ADXL346 Satellite ADXL346 Satellite, Standalone Package Option CC-16-3 CC-16-3 CC-16-3 ADXL346 Preliminary Technical Data NOTES Analog Devices offers specific products designated for automotive applications; please consult your local Analog Devices sales representative for details. Standard products sold by Analog Devices are not designed, intended, or approved for use in life support, implantable medical devices, transportation, nuclear, safety, or other equipment where malfunction of the product can reasonably be expected to result in personal injury, death, severe property damage, or severe environmental harm. Buyer uses or sells standard products for use in the above critical applications at Buyer's own risk and Buyer agrees to defend, indemnify, and hold harmless Analog Devices from any and all damages, claims, suits, or expenses resulting from such unintended use. ©2009 Analog Devices, Inc. All rights reserved. Trademarks and registered trademarks are the property of their respective owners. PR08167-0-6/09(PrC) Rev. PrC | Page 32 of 32