TI1 CC1310F64RGZT Simplelink ultralow power sub-1-ghz wireless mcu Datasheet

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CC1310
SWRS181B – SEPTEMBER 2015 – REVISED OCTOBER 2015
CC1310 SimpleLink™ Ultralow Power Sub-1-GHz Wireless MCU
1 Device Overview
1.1
Features
1
• Microcontroller
– Powerful ARM® Cortex®-M3
– EEMBC CoreMark® Score: 142
– EEMBC ULPBench™ Score: 158
– Up to 48-MHz Clock Speed
– 128KB of In-System Programmable Flash
– 8KB of SRAM for Cache (or as GeneralPurpose RAM)
– 20KB of Ultralow Leakage SRAM
– 2-Pin cJTAG and JTAG Debugging
– Supports Over-the-Air Upgrade (OTA)
• Ultralow Power Sensor Controller
– Can Run Autonomous From the Rest of the
System
– 16-Bit Architecture
– 2KB of Ultralow Leakage SRAM for Code and
Data
• Efficient Code-Size Architecture, Placing TI-RTOS,
Drivers and Bootloader in ROM
• RoHS-Compliant Package
– 7-mm × 7-mm RGZ VQFN48 (30 GPIOs)
– 5-mm × 5-mm RHB VQFN48 (15 GPIOs)
– 4-mm × 4-mm RSM VQFN48 (10 GPIOs)
• Peripherals
– All Digital Peripheral Pins Can Be Routed to
Any GPIO
– Four General-Purpose Timer Modules
(Eight 16-Bit or Four 32-Bit Timers, PWM Each)
– 12-Bit ADC, 200 ksamples/s, 8-Channel Analog
MUX
– Continuous Time Comparator
– Ultralow Power Clocked Comparator
– Programmable Current Source
– UART
– 2× SSI (SPI, MICROWIRE, TI)
– I2C
– I2S
– Real-Time Clock (RTC)
– AES-128 Security Module
– True Random Number Generator (TRNG)
– Support for Eight Capacitive Sensing Buttons
– Integrated Temperature Sensor
• External System
– On-Chip Internal DC-DC Converter
– Very Few External Components
– Seamless Integration With the SimpleLink™
CC1190 Range Extender
• Low Power
– Wide Supply Voltage Range: 1.8 to 3.8 V
– Active-Mode RX: 5.5 mA
– Active-Mode TX at +10 dBm: 12.9 mA
– Active-Mode MCU 48 MHz Running Coremark:
2.5 mA (51 µA/MHz)
– Active-Mode MCU: 48.5 CoreMark/mA
– Active-Mode Sensor Controller at 24 MHz:
0.4 mA + 8.2 µA/MHz
– Sensor Controller, One Wake Up Every Second
Performing One 12-Bit ADC Sampling: 0.85 µA
– Standby: 0.6 µA (RTC Running and RAM and
CPU Retention)
– Shutdown: 185 nA (Wakeup on External Events)
• RF Section
– Excellent Receiver Sensitivity –124 dBm Using
Long-Range Mode, –110 dBm at 50 kbps
– Excellent Selectivity: 52 dB
– Excellent Blocking Performance: 90 dB
– Programmable Output Power up to +14 dBm
– Single-Ended or Differential RF Interface
– Suitable for Systems Targeting Compliance With
Worldwide Radio Frequency Regulations
• ETSI EN 300 220, EN 303 131,
EN 303 204 (Europe)
• FCC CFR47 Part 15 (US)
• ARIB STD-T108 (Japan)
– Wireless M-Bus and IEEE 802.15.4g PHY
• Tools and Development Environment
– Full-Feature and Low-Cost Development Kits
– Multiple Reference Designs for Different RF
Configurations
– Packet Sniffer PC Software
– Sensor Controller Studio
– SmartRF™ Studio
– SmartRF Flash Programmer 2
– IAR Embedded Workbench® for ARM
– Code Composer Studio™
1
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
CC1310
SWRS181B – SEPTEMBER 2015 – REVISED OCTOBER 2015
1.2
•
•
•
•
•
•
•
Applications
315-, 433-, 470-, 500-, 779-, 868-, 915-,
and 920-MHz ISM and SRD Systems
Low-Power Wireless Systems
With 50-kHz to 5-MHz Channel Spacing
SmartGrid and Automatic Meter Reading
Home and Building Automation
Wireless Alarm and Security Systems
Industrial Monitoring and Control
Wireless Healthcare Applications
1.3
www.ti.com
•
•
•
•
•
•
•
Wireless Sensor Networks
Active RFID
IEEE 802.15.4g, IP-Enabled Smart Objects
(6LoWPAN), Wireless M-Bus, KNX Systems, WiSUN, ZigBee and Proprietary Systems
Energy Harvesting Applications
ESL (Electronic Shelf Label)
Long-Range Sensor Applications
Heat Cost Allocators
Description
The device is a member of the CC26xx and CC13xx family of cost-effective, ultralow power, 2.4-GHz and
sub-1-GHz RF devices. Very low active RF, MCU current, and low-power mode current consumption
provide excellent battery lifetime and allow operation on small coin-cell batteries and in energy-harvesting
applications.
The CC1310 device is the first part in a Sub-1-GHz family of cost-effective, ultralow power wireless MCUs.
The CC1310 device combines a flexible, very low power RF transceiver with a powerful 48-MHz CortexM3 microcontroller in a platform supporting multiple physical layers and RF standards. A dedicated Radio
Controller (Cortex-M0) handles low-level RF protocol commands that are stored in ROM or RAM, thus
ensuring ultralow power and flexibility. The low-power consumption of the CC1310 device does not come
at the expense of RF performance; the CC1310 device has excellent sensitivity and robustness (selectivity
and blocking) performance.
The CC1310 device is a highly integrated, true single-chip solution incorporating a complete RF system
and an on-chip DC-DC converter.
Sensors can be handled in a very low-power manner by a dedicated autonomous ultralow power MCU
that can be configured to handle analog and digital sensors; thus the main MCU (Cortex-M3) is able to
maximize sleep time.
The CC1310 power and clock management and radio systems require specific configuration and handling
by software to operate correctly. This has been implemented in the TI RTOS, and it is therefore
recommended that this software framework is used for all application development on the device. The
complete TI-RTOS and device drivers are offered in source code free of charge.
Device Information (1)
PACKAGE
BODY SIZE (NOM)
CC1310F128RGZ
PART NUMBER
VQFN (48)
7.00 mm × 7.00 mm
CC1310F128RHB
VQFN (32)
5.00 mm × 5.00 mm
CC1310F128RSM
VQFN (32)
4.00 mm × 4.00 mm
CC1310F64RGZ
VQFN (48)
7.00 mm × 7.00 mm
CC1310F64RHB
VQFN (32)
5.00 mm × 5.00 mm
CC1310F64RSM
VQFN (32)
4.00 mm × 4.00 mm
CC1310F32RGZ
VQFN (48)
7.00 mm × 7.00 mm
CC1310F32RHB
VQFN (32)
5.00 mm × 5.00 mm
CC1310F32RSM
VQFN (32)
4.00 mm × 4.00 mm
(1)
2
For more information, see Section 9, Mechanical Packaging and Orderable Information.
Device Overview
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CC1310
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1.4
SWRS181B – SEPTEMBER 2015 – REVISED OCTOBER 2015
Functional Block Diagram
Figure 1-1 shows a block diagram for the CC1310 device.
SimpleLinkTM CC1310 Wireless MCU
cJTAG
RF core
ROM
Main CPU:
ADC
ARM®
&RUWH[Œ 03
ADC
32/64/128
KB
Flash
Digital PLL
DSP Modem
8 KB
Cache
20 KB
SRAM
ARM®
&RUWH[Œ 00
General Peripherals / Modules
I 2C
4x 32-bit Timers
UART
2x SSI (SPI,µW,TI)
4 KB
SRAM
ROM
Sensor Controller
Sensor Controller
Engine
12-bit ADC, 200ks/s
I2S
Watchdog Timer
2x Analog Comparators
10 / 15 / 30 GPIOs
TRNG
SPI / I2C Digital Sensor IF
AES
Temp. / Batt. Monitor
Constant Current Source
32 ch. PDMA
RTC
Time to Digital Converter
DC/DC converter
2 KB SRAM
Figure 1-1. CC1310 Block Diagram
Device Overview
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CC1310
SWRS181B – SEPTEMBER 2015 – REVISED OCTOBER 2015
www.ti.com
Table of Contents
1
2
3
4
5
Device Overview ......................................... 1
5.11
Typical Characteristics .............................. 24
1.1
Features .............................................. 1
1.2
Applications ........................................... 2
6.1
Overview
1.3
Description ............................................ 2
6.2
Main CPU ........................................... 28
1.4
6
Detailed Description ................................... 28
............................................
28
Functional Block Diagram ............................ 3
6.3
RF Core ............................................. 29
Revision History ......................................... 4
Device Comparison ..................................... 5
Terminal Configuration and Functions .............. 6
6.4
Sensor Controller
6.5
Memory .............................................. 31
6.6
Debug
4.1
Pin Diagram – RSM Package ........................ 6
6.7
Power Management ................................. 32
4.2
Signal Descriptions – RSM Package ................. 7
4.3
Pin Diagram – RHB Package
4.4
Signal Descriptions – RHB Package ................. 9
4.5
Pin Diagram – RGZ Package ....................... 10
4.6
Signal Descriptions – RGZ Package ................ 10
......................................
6.9
General Peripherals and Modules ..................
6.10 System Architecture .................................
Application, Implementation, and Layout .........
7.1
TI Design ............................................
Device and Documentation Support ...............
8.1
Device Support ......................................
8.2
Documentation Support .............................
8.3
Additional Information ...............................
8.4
Trademarks..........................................
8.5
Electrostatic Discharge Caution .....................
8.6
Glossary .............................................
........................
8
Specifications ........................................... 12
5.1
Absolute Maximum Ratings ......................... 12
5.2
........................................
Recommended Operating Conditions ...............
Power Consumption Summary......................
RF Characteristics ..................................
Receive (RX) Parameters ...........................
Transmit (TX) Parameters ..........................
PLL Parameters .....................................
Thermal Characteristics .............................
Timing and Switching Characteristics ...............
ESD Ratings
5.3
5.4
5.5
5.6
5.7
5.8
5.9
5.10
6.8
7
8
12
12
13
13
14
...............................................
Clock Systems
30
31
33
33
34
35
36
37
37
39
40
40
40
40
16
Mechanical Packaging and Orderable
Information .............................................. 40
17
9.1
15
9
...................................
Packaging Information
..............................
40
17
2 Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
Changes from September 30, 2015 to October 23, 2015
•
Added the RSM and RHB packages
..............................................................................................
Changes from August 31, 2015 to September 30, 2015
•
•
•
4
Page
6
Page
Changed device status from: Product Preview to: Production Data ........................................................... 1
Removed the RSM and RHB packages .......................................................................................... 6
Changed Typical Characteristics section ........................................................................................ 24
Revision History
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CC1310
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SWRS181B – SEPTEMBER 2015 – REVISED OCTOBER 2015
3 Device Comparison
Table 3-1. Device Family Overview
DEVICE
PHY SUPPORT
FLASH
(KB)
RAM
(KB)
GPIO
CC1310F128RGZ
Proprietary, Wireless M-Bus, IEEE 802.15.4g
128
20
30
CC1310F64RGZ
Proprietary, Wireless M-Bus, IEEE 802.15.4g
64
16
30
CC1310F32RGZ
Proprietary, Wireless M-Bus, IEEE 802.15.4g
32
16
30
CC1310F128RHB
Proprietary, Wireless M-Bus, IEEE 802.15.4g
128
20
15
CC1310F64RHB
Proprietary, Wireless M-Bus, IEEE 802.15.4g
64
16
15
CC1310F32RHB
Proprietary, Wireless M-Bus, IEEE 802.15.4g
32
16
15
CC1310F128RSM
Proprietary, Wireless M-Bus, IEEE 802.15.4g
128
20
10
CC1310F64RSM
Proprietary, Wireless M-Bus, IEEE 802.15.4g
64
16
10
CC1310F32RSM
Proprietary, Wireless M-Bus, IEEE 802.15.4g
32
16
10
PACKAGE SIZE
7 mm × 7 mm
5 mm × 5 mm
4 mm × 4 mm
Device Comparison
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CC1310
SWRS181B – SEPTEMBER 2015 – REVISED OCTOBER 2015
www.ti.com
4 Terminal Configuration and Functions
17 VSS
18 DCDC_SW
19 VDDS_DCDC
20 VSS
21 RESET_N
22 DIO_5
23 DIO_6
Pin Diagram – RSM Package
24 DIO_7
4.1
DIO_8 25
16 DIO_4
DIO_9 26
15 DIO_3
VDDS 27
14 JTAG_TCKC
VDDR 28
13 JTAG_TMSC
CC13xx
VSS 29
12 DCOUPL
VQFN32 4x4
DCDC
X24M_P 30
X24M_N 31
11 VDDS2
10 DIO_2
Note:
1
2
3
4
5
6
7
8
RF_P
VSS
RX_TX
X32K_Q1
X32K_Q2
VSS
DIO_0
9
RF_N
VDDR_RF 32
DIO_1
I/O pins marked in bold have high drive capabilities. I/O pins marked in italics have analog capabilities.
Figure 4-1. RSM (4-mm × 4-mm) Pinout, 0.4-mm Pitch
6
Terminal Configuration and Functions
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4.2
SWRS181B – SEPTEMBER 2015 – REVISED OCTOBER 2015
Signal Descriptions – RSM Package
Table 4-1. Signal Descriptions – RSM Package
PIN
NAME
TYPE
NO.
DESCRIPTION
DCDC_SW
18
Power
Output from internal DC-DC (1).
Tie to ground for external regulator mode (1.7-V to 1.95-V operation)
DCOUPL
12
Power
1.27-V regulated digital-supply decoupling capacitor (2)
DIO_0
8
Digital I/O
GPIO, Sensor Controller, High drive capability
DIO_1
9
Digital I/O
GPIO, Sensor Controller, High drive capability
DIO_2
10
Digital I/O
GPIO, Sensor Controller, High drive capability
DIO_3
15
Digital I/O
GPIO, High drive capability, JTAG_TDO
DIO_4
16
Digital I/O
GPIO, High drive capability, JTAG_TDI
DIO_5
22
Digital/Analog I/O
GPIO, Sensor Controller, Analog
DIO_6
23
Digital/Analog I/O
GPIO, Sensor Controller, Analog
DIO_7
24
Digital/Analog I/O
GPIO, Sensor Controller, Analog
DIO_8
25
Digital/Analog I/O
GPIO, Sensor Controller, Analog
DIO_9
26
Digital/Analog I/O
GPIO, Sensor Controller, Analog
Ground – Exposed Ground Pad
EGP
—
Power
JTAG_TMSC
13
Digital I/O
JTAG TMSC
JTAG_TCKC
14
Digital I/O
JTAG TCKC
RESET_N
21
Digital input
RF_N
2
RF I/O
Negative RF input signal to LNA during RX
Negative RF output signal to PA during TX
RF_P
1
RF I/O
Positive RF input signal to LNA during RX
Positive RF output signal to PA during TX
RX_TX
4
RF I/O
Optional bias pin for the RF LNA
VDDS
27
Power
1.8-V to 3.8-V main chip supply (1)
VDDS2
11
Power
1.8-V to 3.8-V GPIO supply (1)
VDDS_DCDC
19
Power
1.8-V to 3.8-V DC-DC supply.
Tie to ground for external regulator mode (1.7-V to 1.95-V operation)
VDDR
28
Power
1.7-V to 1.95-V supply, typically connect to output of internal DC-DC (3) (2)
VDDR_RF
32
Power
1.7-V to 1.95-V supply, typically connect to output of internal DC-DC (4) (2)
3, 7, 17,
20, 29
Power
Ground
X32K_Q1
5
Analog I/O
32-kHz crystal oscillator pin 1
X32K_Q2
6
Analog I/O
32-kHz crystal oscillator pin 2
X24M_N
30
Analog I/O
24-MHz crystal oscillator pin 1
X24M_P
31
Analog I/O
24-MHz crystal oscillator pin 2
VSS
(1)
(2)
(3)
(4)
Reset, active low. No internal pullup
See Section 8.2, technical reference manual for more details.
Do not supply external circuitry from this pin.
If internal DC-DC is not used, this pin is supplied internally from the main LDO.
If internal DC-DC is not used, this pin must be connected to VDDR for supply from the main LDO.
Terminal Configuration and Functions
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7
CC1310
SWRS181B – SEPTEMBER 2015 – REVISED OCTOBER 2015
17 DCDC_SW
18 VDDS_DCDC
19 RESET_N
20 DIO_7
21 DIO_8
22 DIO_9
23 DIO_10
Pin Diagram – RHB Package
24 DIO_11
4.3
www.ti.com
DIO_1 25
16 DIO_6
DIO_13 26
15 DIO_5
DIO_14 27
14 JTAG_TCKC
VDDS 28
13 JTAG_TMSC
CC13xx
VDDR 29
12 DCOUPL
VQFN32 5x5
DCDC
X24M_P 30
X24M_N 31
11 VDDS2
10 DIO_4
Note:
1
2
3
4
5
6
7
8
RF_P
RX_TX
X32K_Q1
X32K_Q2
DIO_0
DIO_1
DIO_2
9
RF_N
VDDR_RF 32
DIO_3
I/O pins marked in bold have high drive capabilities. I/O pins marked in italics have analog capabilities.
Figure 4-2. RHB (5-mm × 5-mm) Pinout, 0.5-mm Pitch
8
Terminal Configuration and Functions
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4.4
SWRS181B – SEPTEMBER 2015 – REVISED OCTOBER 2015
Signal Descriptions – RHB Package
Table 4-2. Signal Descriptions – RHB Package
PIN
NAME
NO.
TYPE
DESCRIPTION
DCDC_SW
17
Power
Output from internal DC-DC (1)
DCOUPL
12
Power
1.27-V regulated digital-supply decoupling (2)
DIO_0
6
Digital I/O
GPIO, Sensor Controller
DIO_1
7
Digital I/O
GPIO, Sensor Controller
DIO_2
8
Digital I/O
GPIO, Sensor Controller, High drive capability
DIO_3
9
Digital I/O
GPIO, Sensor Controller, High drive capability
DIO_4
10
Digital I/O
GPIO, Sensor Controller, High drive capability
DIO_5
15
Digital I/O
GPIO, High drive capability, JTAG_TDO
DIO_6
16
Digital I/O
GPIO, High drive capability, JTAG_TDI
DIO_7
20
Digital/Analog I/O
GPIO, Sensor Controller, Analog
DIO_8
21
Digital/Analog I/O
GPIO, Sensor Controller, Analog
DIO_9
22
Digital/Analog I/O
GPIO, Sensor Controller, Analog
DIO_10
23
Digital/Analog I/O
GPIO, Sensor Controller, Analog
DIO_11
24
Digital/Analog I/O
GPIO, Sensor Controller, Analog
DIO_12
25
Digital/Analog I/O
GPIO, Sensor Controller, Analog
DIO_13
26
Digital/Analog I/O
GPIO, Sensor Controller, Analog
DIO_14
27
Digital/Analog I/O
GPIO, Sensor Controller, Analog
EGP
—
Power
Ground – Exposed Ground Pad
JTAG_TMSC
13
Digital I/O
JTAG TMSC, High drive capability
JTAG_TCKC
14
Digital I/O
JTAG TCKC
RESET_N
19
Digital input
RF_N
2
RF I/O
Negative RF input signal to LNA during RX
Negative RF output signal to PA during TX
RF_P
1
RF I/O
Positive RF input signal to LNA during RX
Positive RF output signal to PA during TX
RX_TX
3
RF I/O
Optional bias pin for the RF LNA
VDDR
29
Power
1.7-V to 1.95-V supply, typically connect to output of internal DCDC (3) (2)
VDDR_RF
32
Power
1.7-V to 1.95-V supply, typically connect to output of internal DCDC (4) (2)
VDDS
28
Power
1.8-V to 3.8-V main chip supply (1)
VDDS2
11
Power
1.8-V to 3.8-V GPIO supply (1)
VDDS_DCDC
18
Power
1.8-V to 3.8-V DC-DC supply
X24M_N
30
Analog I/O
24-MHz crystal oscillator pin 1
X24M_P
31
Analog I/O
24-MHz crystal oscillator pin 2
X32K_Q1
4
Analog I/O
32-kHz crystal oscillator pin 1
X32K_Q2
5
Analog I/O
32-kHz crystal oscillator pin 2
(1)
(2)
(3)
(4)
Reset, active-low. No internal pullup
See Section 8.2, technical reference manual for more details.
Do not supply external circuitry from this pin.
If internal DC-DC is not used, this pin is supplied internally from the main LDO.
If internal DC-DC is not used, this pin must be connected to VDDR for supply from the main LDO.
Terminal Configuration and Functions
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CC1310
SWRS181B – SEPTEMBER 2015 – REVISED OCTOBER 2015
25 JTAG_TCKC
26 DIO_16
27 DIO_17
29 DIO_19
28 DIO_18
31 DIO_21
30 DIO_20
34 VDDS_DCDC
33 DCDC_SW
32 DIO_22
35 RESET_N
Pin Diagram – RGZ Package
36 DIO_23
4.5
www.ti.com
DIO_24 37
24 JTAG_TMSC
DIO_25 38
23 DCOUPL
DIO_26 39
22 VDDS3
DIO_27 40
21 DIO_15
20 DIO_14
DIO_28 41
DIO_29 42
DIO_30 43
19 DIO_13
18 DIO_12
CC13xx
VQFN48 7x7
DCDC
VDDS 44
VDDR 45
17 DIO_11
16 DIO_10
15 DIO_9
14 DIO_8
X24M_N 46
X24M_P 47
Note:
4
5
6
7
8
9
X32K_Q2
DIO_1
DIO_2
DIO_3
DIO_4
DIO_7 12
3
RX_TX
X32K_Q1
DIO_6 11
2
DIO_5 10
1
RF_P
13 VDDS2
RF_N
VDDR_RF 48
I/O pins marked in bold have high drive capabilities. I/O pins marked in italics have analog capabilities.
Figure 4-3. RGZ (7-mm × 7-mm) Pinout, 0.5-mm Pitch
4.6
Signal Descriptions – RGZ Package
Table 4-3. Signal Descriptions – RGZ Package
PIN
NAME
TYPE
NO.
DESCRIPTION
DCDC_SW
33
Power
Output from internal DC-DC (1)
DCOUPL
23
Power
1.27-V regulated digital-supply (decoupling capacitor) (2)
DIO_1
6
Digital I/O
GPIO, Sensor Controller
DIO_2
7
Digital I/O
GPIO, Sensor Controller
DIO_3
8
Digital I/O
GPIO, Sensor Controller
DIO_4
9
Digital I/O
GPIO, Sensor Controller
DIO_5
10
Digital I/O
GPIO, Sensor Controller, High drive capability
DIO_6
11
Digital I/O
GPIO, Sensor Controller, High drive capability
DIO_7
12
Digital I/O
GPIO, Sensor Controller, High drive capability
DIO_8
14
Digital I/O
GPIO
DIO_9
15
Digital I/O
GPIO
DIO_10
16
Digital I/O
GPIO
DIO_11
17
Digital I/O
GPIO
DIO_12
18
Digital I/O
GPIO
DIO_13
19
Digital I/O
GPIO
(1)
(2)
10
See technical reference manual listed in Documentation Support for more details.
Do not supply external circuitry from this pin.
Terminal Configuration and Functions
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SWRS181B – SEPTEMBER 2015 – REVISED OCTOBER 2015
Table 4-3. Signal Descriptions – RGZ Package (continued)
PIN
TYPE
DESCRIPTION
NAME
NO.
DIO_14
20
Digital I/O
GPIO
DIO_15
21
Digital I/O
GPIO
DIO_16
26
Digital I/O
GPIO, JTAG_TDO, High drive capability
DIO_17
27
Digital I/O
GPIO, JTAG_TDI, High drive capability
DIO_18
28
Digital I/O
GPIO
DIO_19
29
Digital I/O
GPIO
DIO_20
30
Digital I/O
GPIO
DIO_21
31
Digital I/O
GPIO
DIO_22
32
Digital I/O
GPIO
DIO_23
36
Digital/Analog I/O
GPIO, Sensor Controller, Analog
DIO_24
37
Digital/Analog I/O
GPIO, Sensor Controller, Analog
DIO_25
38
Digital/Analog I/O
GPIO, Sensor Controller, Analog
DIO_26
39
Digital/Analog I/O
GPIO, Sensor Controller, Analog
DIO_27
40
Digital/Analog I/O
GPIO, Sensor Controller, Analog
DIO_28
41
Digital/Analog I/O
GPIO, Sensor Controller, Analog
DIO_29
42
Digital/Analog I/O
GPIO, Sensor Controller, Analog
DIO_30
43
Digital/Analog I/O
GPIO, Sensor Controller, Analog
EGP
—
Power
Ground – Exposed Ground Pad
JTAG_TMSC
24
Digital I/O
JTAG TMSC, High drive capability
JTAG_TCKC
25
Digital I/O
JTAG TCKC
RESET_N
35
Digital input
RF_N
2
RF I/O
Negative RF input signal to LNA during RX
Negative RF output signal to PA during TX
RF_P
1
RF I/O
Positive RF input signal to LNA during RX
Positive RF output signal to PA during TX
VDDR
45
Power
1.7-V to 1.95-V supply, typically connect to output of internal DC-DC (3) (2)
VDDR_RF
48
Power
1.7-V to 1.95-V supply, typically connect to output of internal DC-DC (4) (2)
VDDS
44
Power
1.8-V to 3.8-V main chip supply (1)
VDDS2
13
Power
1.8-V to 3.8-V DIO supply (1)
VDDS3
22
Power
1.8-V to 3.8-V DIO supply (1)
VDDS_DCDC
34
Power
1.8-V to 3.8-V DC-DC supply
X24M_N
46
Analog I/O
24-MHz crystal oscillator pin 1
X24M_P
47
Analog I/O
24-MHz crystal oscillator pin 2
RX_TX
3
RF I/O
X32K_Q1
4
Analog I/O
32-kHz crystal oscillator pin 1
X32K_Q2
5
Analog I/O
32-kHz crystal oscillator pin 2
(3)
(4)
Reset, active-low. No internal pullup
Optional bias pin for the RF LNA
If internal DC-DC is not used, this pin is supplied internally from the main LDO.
If internal DC-DC is not used, this pin must be connected to VDDR for supply from the main LDO.
Terminal Configuration and Functions
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5 Specifications
5.1
Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted) (1) (2)
VDDS (3)
MIN
MAX
UNIT
–0.3
4.1
V
–0.3
VDDS + 0.3, max 4.1
V
–0.3
VDDR + 0.3, max 2.25
V
Voltage scaling enabled
–0.3
VDDS
Voltage scaling disabled, internal reference
–0.3
1.49
Voltage scaling disabled, VDDS as reference
–0.3
VDDS / 2.9
10
dBm
–40
150
°C
Supply voltage
Voltage on any digital pin
(4)
Voltage on crystal oscillator pins, X32K_Q1, X32K_Q2, X24M_N and X24M_P
Vin
Voltage on ADC input
Input RF level
Tstg
(1)
(2)
(3)
(4)
Storage temperature
V
Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating
Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
All voltage values are with respect to VDDS, unless otherwise noted.
VDDS2 and VDDS3 must be at the same potential as VDDS.
Including analog capable DIO.
5.2
ESD Ratings
VALUE
VESD
(1)
(2)
5.3
Electrostatic discharge
Human body model (HBM), per ANSI/ESDA/JEDEC JS001 (1)
All pins
±3500
Charged device model (CDM), per JESD22-C101 (2)
All pins
±1250
UNIT
V
JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
Recommended Operating Conditions
over operating free-air temperature range (unless otherwise noted)
MIN
MAX
–40
85
°C
1.8
3.8
V
Rising supply voltage slew rate
0
100
mV/µs
Falling supply voltage slew rate
0
20
mV/µs
3
mV/µs
5
°C/s
Ambient temperature
For operation in battery-powered and 3.3-V
systems (internal DC-DC can be used to minimize
power consumption)
Operating supply voltage (VDDS)
Falling supply voltage slew rate, with low-power flash setting (1)
Positive temperature gradient in standby
(1)
(2)
12
(2)
No limitation for negative temperature gradient, or
outside standby mode
UNIT
For small coin-cell batteries, with high worst-case end-of-life equivalent source resistance, a 22-µF VDDS input capacitor must be used
to ensure compliance with this slew rate.
Applications using RCOSC_LF as sleep timer must also consider the drift in frequency caused by a change in temperature (see
Section 5.10.3.4).
Specifications
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5.4
SWRS181B – SEPTEMBER 2015 – REVISED OCTOBER 2015
Power Consumption Summary
Measured on the Texas Instruments CC1310EM-7XD-7793 reference design with Tc = 25°C, VDDS = 3.6 V with
DC-DC enabled, unless otherwise noted. Using boost mode (increasing VDDR up to 1.95 V), will increase currents below by
15% (does not apply to TX 14-dBm setting where this current is already included).
PARAMETER
Icore
Core current
consumption
TEST CONDITIONS
TYP
Reset. RESET_N pin asserted or VDDS below poweron-reset threshold
100
Shutdown. No clocks running, no retention
185
Standby. With RTC, CPU, RAM and (partial) register
retention. RCOSC_LF
0.6
Standby. With RTC, CPU, RAM and (partial) register
retention. XOSC_LF
0.7
Standby. With Cache, RTC, CPU, RAM and (partial)
register retention. RCOSC_LF
1.6
Standby. With Cache, RTC, CPU, RAM and (partial)
register retention. XOSC_LF
1.7
UNIT
nA
µA
Idle. Supply Systems and RAM powered.
570
Active. MCU running CoreMark at 48 MHz
1.2 mA + 25.5 µA/MHz
Active. MCU running CoreMark at 48 MHz
2.5
Active. MCU running CoreMark at 24 MHz
1.9
Radio RX
5.5
Radio TX, 10-dBm output power
12.9
Radio TX, boost mode (VDDR = 1.95 V), 14-dBm
output power
22.6
mA
mA
PERIPHERAL CURRENT CONSUMPTION (1) (2) (3)
Iperi
(1)
(2)
(3)
5.5
Peripheral power domain
Delta current with domain enabled
20
Serial power domain
Delta current with domain enabled
13
RF Core
Delta current with power domain enabled,
clock enabled, RF core idle
237
µDMA
Delta current with clock enabled, module idle
130
Timers
Delta current with clock enabled, module idle
113
I2C
Delta current with clock enabled, module idle
12
2
I S
Delta current with clock enabled, module idle
36
SSI
Delta current with clock enabled, module idle
93
UART
Delta current with clock enabled, module idle
164
µA
Adds to core current Icore for each peripheral unit activated.
Iperi is not supported in standby or shutdown modes.
Measured at 3.0 V.
RF Characteristics
over operating free-air temperature range (unless otherwise noted)
PARAMETER
Frequency bands (1)
(1)
MIN
TYP
MAX
(300)
(348)
(400)
(435)
(470)
(510)
(779)
(787)
863
930
UNIT
MHz
For more information, refer to CC1310 SimpleLink Wireless MCU Silicon Errata (SWRZ062).
Specifications
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SWRS181B – SEPTEMBER 2015 – REVISED OCTOBER 2015
5.6
www.ti.com
Receive (RX) Parameters
Measured on the Texas Instruments CC1310EM-7XD-7793 reference design with Tc = 25°C, VDDS = 3.0 V, DC-DC enabled,
fRF = 868 MHz, unless otherwise noted. All measurements are done at the antenna input with a combined RX and TX path.
PARAMETER
TEST CONDITIONS
MIN
Data rate
Data rate offset tolerance, IEEE
802.15.4g PHY
50 kbps, GFSK, 25-kHz deviation, 100-kHz RX BW
(same modulation format as IEEE 802.15.4g mandatory
mode), BER = 10–3
Data rate step size
TYP
MAX
UNIT
50
kbps
1400
ppm
1.5
bps
Digital channel filter programmable
bandwidth
Using VCO divide by 5 setting
Receiver sensitivity, 50 kbps
50 kbps, GFSK, 25-kHz deviation, 100-kHz RX BW
(same modulation format as IEEE 802.15.4g mandatory
mode), BER = 10–2 868 MHz and 915 MHZ
–110
dBm
Receiver saturation
50 kbps, GFSK, 25-kHz deviation, 100-kHz RX BW
(same modulation format as IEEE 802.15.4g mandatory
mode), BER = 10–2
10
dBm
Selectivity, ±200 kHz, 50 kbps
Wanted signal 3-dB above sensitivity limit. 50 kbps,
GFSK, 25-kHz deviation, 100-kHz RX BW (same
modulation format as IEEE 802.15.4g mandatory
mode), BER = 10–2
43, 45
dB
Selectivity, ±400 kHz, 50 kbps
Wanted signal 3-dB above sensitivity limit. 50 kbps,
GFSK, 25-kHz deviation, 100-kHz RX BW (same
modulation format as IEEE 802.15.4g mandatory
mode), BER = 10–2
48, 52
dB
Blocking ±1 MHz, 50 kbps
Wanted signal 3-dB above sensitivity limit. 50 kbps,
GFSK, 25-kHz deviation, 100-kHz RX BW (same
modulation format as IEEE 802.15.4g mandatory
mode), BER = 10–2
59, 62
dB
Blocking ±2 MHz, 50 kbps
Wanted signal 3-dB above sensitivity limit. 50 kbps,
GFSK, 25-kHz deviation, 100-kHz RX BW (same
modulation format as IEEE 802.15.4g mandatory
mode), BER = 10–2
64, 65
dB
Blocking ±5 MHz, 50 kbps
Wanted signal 3-dB above sensitivity limit. 50 kbps,
GFSK, 25-kHz deviation, 100-kHz RX BW (same
modulation format as IEEE 802.15.4g mandatory
mode), BER = 10–2
67, 68
dB
Blocking ±10 MHz, 50 kbps
Wanted signal 3-dB above sensitivity limit. 50 kbps,
GFSK, 25-kHz deviation, 100-kHz RX BW (same
modulation format as IEEE 802.15.4g mandatory
mode), BER = 10–2
75, 76
dB
40
Spurious emissions 1 GHz to 13 GHz
Radiated emissions measured according to ETSI EN
(VCO leakage at 3.5 GHz) and 30 MHz
300 220
to 1 GHz
4000
kHz
–70
dBm
Image rejection (image compensation
enabled)
Wanted signal 3-dB above sensitivity limit. 50 kbps,
GFSK, 25-kHz deviation, 100-kHz RX BW (same
modulation format as IEEE 802.15.4g mandatory
mode), BER = 10–2
44
dB
RSSI dynamic range
50 kbps, GFSK, 25-kHz deviation, 100-kHz RX BW
(same modulation format as IEEE 802.15.4g mandatory
mode). Starting from the sensitivity limit. This is the
range that will give an accuracy of ±2
95
dB
RSSI accuracy
50 kbps, GFSK, 25-kHz deviation, 100-kHz RX BW
(same modulation format as IEEE 802.15.4g mandatory
mode)
±2
dB
Receiver sensitivity, long-range mode
625 bps
10 ksps, GFSK, 5-kHz deviation, FEC (half rate),
DSSS = 8, 40-kHz RX BW , BER = 10–2
Wanted signal 3-dB above sensitivity limit. 10 ksps,
Selectivity, ±100 kHz, long-range mode
GFSK, 5-kHz deviation, FEC (half rate), DSSS = 8,
625 bps
40-kHz RX BW , BER = 10–2
14
Specifications
–124
dBm
52, 52
dB
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SWRS181B – SEPTEMBER 2015 – REVISED OCTOBER 2015
Receive (RX) Parameters (continued)
Measured on the Texas Instruments CC1310EM-7XD-7793 reference design with Tc = 25°C, VDDS = 3.0 V, DC-DC enabled,
fRF = 868 MHz, unless otherwise noted. All measurements are done at the antenna input with a combined RX and TX path.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Wanted signal 3-dB above sensitivity limit. 10 ksps,
Selectivity, ±200 kHz, long-range mode
GFSK, 5-kHz deviation, FEC (half rate), DSSS = 8,
625 bps
40-kHz RX BW , BER = 10–2
61, 61
dB
Blocking ±1 MHz, long-range mode
625 bps
Wanted signal 3-dB above sensitivity limit. 10 ksps,
GFSK, 5-kHz deviation, FEC (half rate), DSSS = 8,
40-kHz RX BW , BER = 10–2
73, 75
dB
Blocking ±2 MHz, long-range mode
625 bps
Wanted signal 3-dB above sensitivity limit. 10 ksps,
GFSK, 5-kHz deviation, FEC (half rate), DSSS = 8,
40-kHz RX BW , BER = 10–2
78, 79
dB
Blocking ±10 MHz, long-range mode
625 bps
Wanted signal 3-dB above sensitivity limit. 10 ksps,
GFSK, 5-kHz deviation, FEC (half rate), DSSS = 8,
40-kHz RX BW , BER = 10–2
89, 90
dB
5.7
Transmit (TX) Parameters
Measured on the Texas Instruments CC1310EM-7XD-7793 reference design with Tc = 25°C, VDDS = 3.0 V, DC-DC enabled,
fRF = 868 MHz, unless otherwise noted. All measurements are done at the antenna input with a combined RX and TX path.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Max output power, boost mode
VDDR = 1.95 V
Min VDDS for boost mode is 2.1 V
868 MHz and 915 MHz
14
dBm
Max output power
868 MHz and 915 MHz
12
dBm
24
dB
Output power programmable range
Output power variation
Tested at +10-dBm setting
±0.7
dB
Output power variation, boost bode
+14 dBm
±0.5
dB
Transmitting +14 dBm
ETSI restricted bands
<–59
dBm
Transmitting +14 dBm
ETSI outside restricted bands
<–51
dBm
1 GHz to 12.75 GHz
Transmitting +14 dBm
measured in 1-MHz bandwidth (ETSI)
<–37
dBm
Second harmonic
Transmitting +14 dBm, conducted
868 MHz, 915 MHz
–52, –55
dBm
Third harmonic
Transmitting +14 dBm, conducted
868 MHz, 915 MHz
–58, –55
dBm
Fourth harmonic
Transmitting +14 dBm, conducted
868 MHz, 915 MHz
–56, –56
dBm
Spurious emissions
(excluding harmonics) (1)
Harmonics
(1)
30 MHz to 1 GHz
Suitable for systems targeting compliance with EN 300 220, EN 54-25, EN 303 131, EN 303 204, FCC CFR47 Part 15, ARIB STD-T108.
Specifications
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Transmit (TX) Parameters (continued)
Measured on the Texas Instruments CC1310EM-7XD-7793 reference design with Tc = 25°C, VDDS = 3.0 V, DC-DC enabled,
fRF = 868 MHz, unless otherwise noted. All measurements are done at the antenna input with a combined RX and TX path.
PARAMETER
Spurious emissions outof-band, 915 MHz (1)
Spurious emissions outof-band, 920.6 MHz (1)
5.8
TEST CONDITIONS
MIN
TYP
MAX
UNIT
30 MHz–88 MHz
(within FCC restricted bands)
Transmitting +14 dBm, conducted
<–66
dBm
88 MHz–216 MHz
(within FCC restricted bands)
Transmitting +14 dBm, conducted
<–65
dBm
216 MHz–960 MHz
(within FCC restricted bands)
Transmitting +14 dBm, conducted
<–65
dBm
960 MHz–2390 MHz and above
2483.5 MHz (within FCC
restricted band)
Transmitting +14 dBm, conducted
<–55
dBm
1 GHz–12.75 GHz
(outside FCC restricted bands)
Transmitting +14 dBm, conducted
<–43
dBm
Below 710 MHz
(ARIB T-108)
Transmitting +14 dBm, conducted
<–50
dBm
710–900 MHz
(ARIB T-108)
Transmitting +14 dBm, conducted
<–63
dBm
900–915 MHz
(ARIB T-108)
Transmitting +14 dBm, conducted
<–61
dBm
930–1000 MHz
(ARIB T-108)
Transmitting +14 dBm, conducted
<–60
dBm
1000–1215 MHz
(ARIB T-108)
Transmitting +14 dBm, conducted
<–58
dBm
Above 1215 MHz
(ARIB T-108)
Transmitting +14 dBm, conducted
<–39
dBm
PLL Parameters
Measured on the Texas Instruments CC1310EM-7XD-7793 reference design with Tc = 25°C, VDDS = 3.0 V
PARAMETER
Phase noise in the 868-MHz band
Phase noise in the 915-MHz band
16
TEST CONDITIONS
MIN
TYP
MAX
UNIT
±100-kHz offset, VCO divide by 5
–95
dBc/Hz
±200-kHz offset, VCO divide by 5
–105
dBc/Hz
±400-kHz offset, VCO divide by 5
–113
dBc/Hz
±1000-kHz offset, VCO divide by 5
–121
dBc/Hz
±2000-kHz offset, VCO divide by 5
–129
dBc/Hz
±10000 kHz offset, VCO divide by 5
–140
dBc/Hz
±100-kHz offset, VCO divide by 5
–97
dBc/Hz
±200-kHz offset, VCO divide by 5
–106
dBc/Hz
±400-kHz offset, VCO divide by 5
–114
dBc/Hz
±1000-kHz offset, VCO divide by 5
–123
dBc/Hz
±2000-kHz offset, VCO divide by 5
–131
dBc/Hz
±10000-kHz offset, VCO divide by 5
–141
dBc/Hz
Specifications
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5.9
SWRS181B – SEPTEMBER 2015 – REVISED OCTOBER 2015
Thermal Characteristics
CC1310
RGZ
(VQFN)
THERMAL METRIC (1)
UNIT (2)
48 PINS
RθJA
Junction-to-ambient thermal resistance
29.6
°C/W
RθJC(top)
Junction-to-case (top) thermal resistance
15.7
°C/W
RθJB
Junction-to-board thermal resistance
6.2
°C/W
ψJT
Junction-to-top characterization parameter
0.3
°C/W
ψJB
Junction-to-board characterization parameter
6.2
°C/W
RθJC(bot)
Junction-to-case (bottom) thermal resistance
1.9
°C/W
(1)
(2)
For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report, SPRA953.
°C/W = degrees Celsius per watt.
5.10 Timing and Switching Characteristics
5.10.1 Reset Timing
MIN
RESET_N low duration
TYP
MAX
UNIT
1
µs
5.10.2 Switching Characteristics: Wakeup and Timing
Measured on the Texas Instruments CC1310EM-7XD-7793 reference design with Tc = 25°C, VDDS = 3.0 V, unless otherwise
noted. The times listed here do not include RTOS overhead.
PARAMETER
TEST CONDITIONS
MCU, Idle → Active
MCU, Standby → Active
MCU, Shutdown → Active
MIN
TYP
MAX
UNIT
14
µs
174
µs
1097
µs
Specifications
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5.10.3 Clock Specifications
5.10.3.1 24-MHz Crystal Oscillator (XOSC_HF)
Measured on the Texas Instruments CC1310EM-7XD-7793 reference design with Tc = 25°C, VDDS = 3.0 V, unless otherwise
noted. (1)
MIN
TYP
Crystal frequency
24
ESR equivalent series resistance
20
LM Motional inductance, relates to the load capacitance that is used for the
crystal (CL in Farads)
CL Crystal load capacitance
UNIT
MHz
60
< 1.6 × 10–24 / C2L
5
Ω
H
9
Start-up time (2)
(1)
(2)
MAX
150
pF
µs
Probing or otherwise stopping the Crystal while the DC-DC converter is enabled may cause permanent damage to the device.
The crystal start-up time is low because it is "kick-started" by using the RCOSC_HF oscillator (temperature and aging compensated)
that is running at the same frequency.
5.10.3.2 32.768-kHz Crystal Oscillator (XOSC_LF)
Measured on the Texas Instruments CC1310EM-7XD-7793 reference design with Tc = 25°C, VDDS = 3.0 V, unless otherwise
noted. (1)
MIN
Crystal frequency
ESR Equivalent series resistance
30
Crystal load capacitance (CL)
(1)
TYP
MAX
32.768
6
UNIT
kHz
100
kΩ
12
pF
Probing or otherwise stopping the crystal while the DC-DC converter is enabled may cause permanent damage to the device.
5.10.3.3 48-MHz RC Oscillator (RCOSC_HF)
Measured on the Texas Instruments CC1310EM-7XD-7793 reference design with Tc = 25°C, VDDS = 3.0 V, unless otherwise
noted.
MIN
Frequency
TYP
48
Uncalibrated frequency accuracy
±1%
Calibrated frequency accuracy (1)
±0.25%
Start-up time
(1)
MAX
UNIT
MHz
5
µs
Accuracy relatively to the calibration source (XOSC_HF).
5.10.3.4 32-kHz RC Oscillator (RCOSC_LF)
Measured on the Texas Instruments CC1310EM-7XD-7793 reference design with Tc = 25°C, VDDS = 3.0 V, unless otherwise
noted.
MIN
Calibrated frequency
32.768
Temperature coefficient
18
TYP
50
Specifications
MAX
UNIT
kHz
ppm/°C
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SWRS181B – SEPTEMBER 2015 – REVISED OCTOBER 2015
5.10.4 Flash Memory Characteristics
Tc = 25°C, VDDS = 3.0 V, unless otherwise noted.
PARAMETER
TEST CONDITIONS
MIN
Supported flash erase cycles before failure
TYP
MAX
100
Flash page or sector erase current
UNIT
k Cycles
Average delta current
12.6
mA
Flash page or sector erase time (1)
8
ms
Flash page or sector size
4
KB
8.15
mA
8
µs
Flash write current
Average delta current, 4 bytes at a time
Flash write time (1)
4 bytes at a time
(1)
This number is dependent on Flash aging and increases over time and erase cycles.
5.10.5 ADC Characteristics
Tc = 25°C, VDDS = 3.0 V, DC-DC disabled. Input voltage scaling enabled, unless otherwise noted (1)
PARAMETER
TEST CONDITIONS
MIN
Input voltage range
TYP
0
Resolution
12
LSB
Gain error
Internal 4.3-V equivalent reference (2)
–0.14
LSB
>–1
LSB
±2
LSB
Integral nonlinearity
(1)
(2)
(3)
(4)
ksamples/s
2.1
INL (4)
Effective number of bits
Total harmonic distortion
SFDR
200
Internal 4.3-V equivalent reference (2)
Differential nonlinearity
SINAD
and
SNDR
V
Bits
Offset
DNL (3)
THD
UNIT
VDDS
Sample rate
ENOB
MAX
Signal-to-noise and
distortion ratio
Spurious-free dynamic
range
Internal 4.3-V equivalent reference (2), 200 ksamples/s,
9.6-kHz input tone
10.0
VDDS as reference, 200 ksamples/s, 9.6-kHz input tone
10.2
Internal 1.44-V reference, voltage scaling disabled,
32 samples average, 200 ksamples/s, 300-Hz input tone
11.1
Internal 4.3-V equivalent reference (2), 200 ksamples/s,
9.6-kHz input tone
–65
VDDS as reference, 200 ksamples/s, 9.6-kHz input tone
–72
Internal 1.44-V reference, voltage scaling disabled,
32 samples average, 200 kspksamples/ss, 300-Hz input tone
–75
Internal 4.3-V equivalent reference (2), 200 ksamples/s,
9.6-kHz input tone
62
VDDS as reference, 200 ksamples/s, 9.6-kHz input tone
63
Internal 1.44-V reference, voltage scaling disabled,
32 samples average, 200 ksamples/s, 300-Hz input tone
69
Internal 4.3-V equivalent reference (2), 200 ksamples/s,
9.6-kHz input tone
74
VDDS as reference, 200 ksamples/s, 9.6-kHz input tone
75
Internal 1.44-V reference, voltage scaling disabled,
32 samples average, 200 ksamples/s, 300-Hz input tone
75
Conversion time
Including sampling time
Current consumption
Internal 4.3-V equivalent reference (2)
Current consumption
VDDS as reference
Reference voltage
Internal 4.3-V equivalent reference, voltage scaling enabled
(2)
Reference voltage
Internal 4.3-V equivalent reference, voltage scaling disabled
(2)
Bits
dB
dB
dB
5
µs
0.66
mA
0.75
mA
4.3
V
1.44
V
V
V
Reference voltage
VDDS as reference, voltage scaling disabled
VDDS /
2.82
Reference voltage
VDDS as reference , voltage scaling enabled
VDDS
Input Impedance
Capacitive input, Input impedance is depending on sampling time
and can be increased by increasing sampling time
>1
MΩ
Using IEEE Std 1241™ 2010 for terminology and test methods.
Input signal scaled down internally before conversion, as if voltage range was 0 to 4.3 V. Applied voltage must be within Absolute
Maximum Ratings (Section 5.1) at all times.
No missing codes. Positive DNL typically varies from 0.3 to 1.7, depending on the device (see Figure 5-7).
For a typical example, see Figure 5-6.
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5.10.6 Temperature Sensor
Measured on the Texas Instruments CC1310EM-7XD-7793 reference design with Tc = 25°C, VDDS = 3.0 V, unless otherwise
noted.
PARAMETER
TEST CONDITIONS
MIN
TYP
Resolution
Range
–40
Supply voltage coefficient
(1)
UNIT
°C
85
Accuracy
(1)
MAX
4
°C
±5
°C
3.2
°C/V
Automatically compensated when using supplied driver libraries.
5.10.7 Battery Monitor
Measured on the Texas Instruments CC1310EM-7XD-7793 reference design with Tc = 25°C, VDDS = 3.0 V, unless otherwise
noted.
PARAMETER
TEST CONDITIONS
MIN
TYP
Resolution
MAX
50
Range
1.8
mV
3.8
Accuracy
UNIT
13
V
mV
5.10.8 Continuous Time Comparator
Tc = 25°C, VDDS = 3.0 V, unless otherwise noted.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Input voltage range
0
VDDS
V
External reference voltage
0
VDDS
V
Internal reference voltage
DCOUPL as reference
1.27
Offset
3
mV
<2
mV
0.72
µs
8.6
µA
Hysteresis
Decision time
Step from –10 mV to 10 mV
Current consumption when enabled
(1)
(1)
V
Additionally, the bias module must be enabled when running in standby mode.
5.10.9 Low-Power Clocked Comparator
Tc = 25°C, VDDS = 3.0 V, unless otherwise noted.
PARAMETER
TEST CONDITIONS
Input voltage range
MIN
TYP
0
Clock frequency
MAX
VDDS
32.8
UNIT
V
kHz
Internal reference voltage, VDDS / 2
1.49 – 1.51
V
Internal reference voltage, VDDS / 3
1.01 – 1.03
V
Internal reference voltage, VDDS / 4
0.78 – 0.79
V
Internal reference voltage, DCOUPL / 1
1.25 – 1.28
V
Internal reference voltage, DCOUPL / 2
0.63 – 0.65
V
Internal reference voltage, DCOUPL / 3
0.42 – 0.44
V
Internal reference voltage, DCOUPL / 4
0.33 – 0.34
Offset
<2
Hysteresis
Decision time
Step from –50 mV to 50 mV
Current consumption when enabled
20
<5
mV
1
clock-cycle
362
Specifications
V
mV
nA
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5.10.10 Programmable Current Source
Tc = 25°C, VDDS = 3.0 V, unless otherwise noted.
PARAMETER
TEST CONDITIONS
MIN
Current source programmable output range
Resolution
Current consumption (1)
(1)
TYP
MAX
UNIT
0.25 to 20
µA
0.25
µA
23
µA
Including current source at maximum
programmable output
Additionally, the bias module must be enabled when running in standby mode.
5.10.11 DC Characteristics
PARAMETER
TEST CONDITIONS
MIN
TYP
1.32
1.54
MAX
UNIT
TA = 25°C, VDDS = 1.8 V
GPIO VOH at 8-mA load
IOCURR = 2, high drive GPIOs only
GPIO VOL at 8-mA load
IOCURR = 2, high drive GPIOs only
GPIO VOH at 4-mA load
IOCURR = 1
GPIO VOL at 4-mA load
IOCURR = 1
0.21
GPIO pullup current
Input mode, pullup enabled, Vpad = 0 V
71.7
µA
GPIO pulldown current
Input mode, pulldown enabled, Vpad = VDDS
21.1
µA
GPIO high/low input transition, no hysteresis
IH = 0,
transition between reading 0 and reading 1
0.88
V
GPIO low-to-high input transition, with hysteresis
IH = 1, transition voltage for input read as 0 → 1
1.07
V
GPIO high-to-low input transition, with hysteresis
IH = 1, transition voltage for input read as 1 → 0
0.74
V
GPIO input hysteresis
IH = 1, difference between 0 → 1
and 1 → 0 points
0.33
V
GPIO VOH at 8-mA load
IOCURR = 2, high drive GPIOs only
2.68
V
GPIO VOL at 8-mA load
IOCURR = 2, high drive GPIOs only
0.33
V
GPIO VOH at 4-mA load
IOCURR = 1
2.72
V
GPIO VOL at 4-mA load
IOCURR = 1
0.28
V
GPIO pullup current
Input mode, pullup enabled, Vpad = 0 V
277
µA
GPIO pulldown current
Input mode, pulldown enabled, Vpad = VDDS
113
µA
GPIO high/low input transition, no hysteresis
IH = 0,
transition between reading 0 and reading 1
1.67
V
GPIO low-to-high input transition, with hysteresis
IH = 1, transition voltage for input read as 0 → 1
1.94
V
GPIO high-to-low input transition, with hysteresis
IH = 1, transition voltage for input read as 1 → 0
1.54
V
GPIO input hysteresis
IH = 1, difference between 0 → 1
and 1 → 0 points
0.4
V
VIH
Lowest GPIO input voltage reliably interpreted as
a High
VIL
Highest GPIO input voltage reliably interpreted
as a Low
0.26
1.32
V
0.32
V
1.58
V
0.32
V
TA = 25°C, VDDS = 3.0 V
TA = 25°C, VDDS = 3.8 V
(1)
0.8 VDDS (1)
VDDS (1)
0.2
Each GPIO is referenced to a specific VDDS pin. See the technical reference manual listed in Section 8.2 for more details.
Specifications
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5.10.12 Synchronous Serial Interface (SSI) Characteristics
Tc = 25°C, VDDS = 3.0 V, unless otherwise noted.
PARAMETER
NO.
PARAMETER
S1
S2
(1)
S3 (1)
(1)
MIN
TYP
12
MAX
UNIT
65024
system clocks
tclk_per
SSIClk cycle time
tclk_high
SSIClk high time
0.5
tclk_per
tclk_low
SSIClk low time
0.5
tclk_per
Refer to SSI timing diagrams Figure 5-1, Figure 5-2, and Figure 5-3.
S1
S2
SSIClk
S3
SSIFss
SSITx
SSIRx
MSB
LSB
4 to 16 bits
Figure 5-1. SSI Timing for TI Frame Format (FRF = 01), Single Transfer Timing Measurement
S2
S1
SSIClk
S3
SSIFss
SSITx
MSB
LSB
8-bit control
SSIRx
0
MSB
LSB
4 to 16 bits output data
Figure 5-2. SSI Timing for MICROWIRE Frame Format (FRF = 10), Single Transfer
22
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S1
S2
SSIClk
(SPO = 0)
S3
SSIClk
(SPO = 1)
SSITx
(Master)
MSB
SSIRx
(Slave)
MSB
LSB
LSB
SSIFss
Figure 5-3. SSI Timing for SPI Frame Format (FRF = 00), With SPH = 1
Specifications
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5.11 Typical Characteristics
3.5
5
3
4.5
Current Consumption (PA)
Current Consumption (mA)
Active Mode Current
4
3.5
3
2.5
2
1.5
1
0.5
2
1.8
2.3
2.8
VDDS (V)
3.3
0
-40 -30 -20 -10
3.8
0
D007
Figure 5-4. Active Mode (MCU) Current Consumption vs
Supply Voltage (VDDS)
10 20 30 40 50 60 70 80 90
Temperature (°C)
D010
Figure 5-5. Standby MCU Current Consumption, 32-kHz Clock,
RAM and MCU Retention
2
1.5
Differential Nonlinearity (LSB)
Integral Nonlinearity (LSB)
2.5
1
0
-1
-2
1
0.5
0
-0.5
-1
0
500
1000
1500 2000 2500 3000
Digital Output Code
3500
4000
0
500
1000
1500 2000 2500 3000
Digital Output Code
D007
Figure 5-6. SoC ADC, Integral Nonlinearity vs
Digital Output Code
3500
4000
D008
Figure 5-7. SoC ADC, Differential Nonlinearity vs
Digital Output Code
1007.5
1006.4
1006.2
1007
1006.5
1005.8
ADC Code
ADC Code
1006
1005.6
1005.4
1006
1005.5
1005.2
1005
1005
1004.8
1.8
2.3
2.8
VDDS (V)
3.3
3.8
D012
Figure 5-8. SoC ADC Output vs Supply Voltage
(Fixed Input, Internal Reference, No Scaling)
24
1004.5
-40 -30 -20 -10
0
10 20 30 40
Temperature (qC)
50
60
70
80
D013
Figure 5-9. SoC ADC Output vs Temperature
(Fixed Input, Internal Reference, No Scaling)
Specifications
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-106
-106.5
-107
Sensitivity (dBm)
-107.5
-108
-108.5
-109
-109.5
-110
-110.5
-111
863
80
70
70
60
60
50
50
Selectivity (dB)
Selectivity (dB)
80
30
20
867
869
871
Frequency (MHz)
873
875 876
D011
Figure 5-11. RX (50-kbps) Sensitivity vs Frequency
Figure 5-10. RX, (50-kbps) Packet Error Rate (PER) vs
Input RF Level vs Frequency Offset, 868 MHz
40
865
10
40
30
20
10
0
0
-10
-10
-10
-10
-8
-6
-4
-2
0
2
4
Frequency offset (MHz)
6
8
10
-8
-6
D012
Figure 5-12. RX (50-kbps) Selectivity 868 MHz
-4
-2
0
2
4
Frequency offset (MHz)
6
8
10
D013
Figure 5-13. RX (50-kbps) Selectivity 915 MHz
-106
6
-107
5.8
Sensitivity (dBm)
Current Consumption (mA)
-106.5
5.6
5.4
-107.5
-108
-108.5
-109
-109.5
-110
5.2
-110.5
5
-40 -30 -20 -10
0
10 20 30 40 50 60 70 80 90
Temperature (°C)
D014
Figure 5-14. RX (50-kbps) Current Consumption vs
Temperature 868 MHz
-111
-40
-20
0
20
40
Temperaure (°C)
60
80 90
D015
Figure 5-15. RX (50-kbps) Sensitivity vs Temperature 868 MHz
Specifications
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11
-106.2
10.5
Current Consumption (mA)
Sensitivity (dBm)
-106.8
-107.4
-108
-108.6
-109.2
-109.8
10
9.5
9
8.5
8
7.5
7
6.5
6
-110.4
5.5
-111
-40 -30 -20 -10
0
5
1.8
10 20 30 40 50 60 70 80 90
Temperaure (°C)
D016
-106
23
-106.5
22.9
-107
22.8
-107.5
22.7
-108
-108.5
-109
-110
22.2
22.1
2.4
2.6 2.8
3
VDDS (V)
3.2
3.4
3.6
3.2
3.4
3.6
3.8
D019
22.4
-110.5
2.2
2.6 2.8
3
VDDS (V)
22.5
22.3
2
2.4
22.6
-109.5
-111
1.8
2.2
Figure 5-17. RX (50-kbps) Current Consumption vs
Supply Voltage 915 MHz
Current (mA)
Sensitivity (dBm)
Figure 5-16. RX (50-kbps) Sensitivity vs Temperature 915 MHz
2
22
-40
3.8
-20
0
20
40
Temperature (qC)
D020
60
80
100
D003
DCDC On, 3.6 V
Figure 5-19. TX Current Consumption With Maximum
Output Power vs Temperature 868 MHz
Figure 5-18. RX (50-kbps) Sensitivity vs Supply Voltage 868 MHz
11
14.8
10.6
14.6
Output Power (dBm)
Output Power (dBm)
10.8
14.4
14.2
10.4
10.2
10
9.8
9.6
9.4
14
-40 -30 -20 -10
0
10 20 30 40 50 60 70 80 90
Temperature (°C)
D017
Figure 5-20. TX Maximum Output vs Temperature 868 MHz
26
9.2
-40 -30 -20 -10
0
10 20 30 40 50 60 70 80 90
Temperature (°C)
D018
Figure 5-21. TX 10-dBm Output Power vs Temperature 868 MHz
Specifications
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40
14.8
35
Output Power (dBm)
Current Consumption (mA)
14.7
30
25
14.6
14.5
14.4
14.3
14.2
14.1
20
2.1
2.3
2.5
2.7
2.9
3.1
VDDS (V)
3.3
3.5
14
2.1
3.7
2.3
2.5
2.7
D021
Figure 5-22. TX Current Consumption Maximum Output Power
vs
Supply Voltage 868 MHz
2.9
3.1
VDDS (V)
3.3
3.5
3.7
D022
Figure 5-23. TX Maximum Output Power vs
Supply Voltage 915 MHz
11
10.8
Output Power (dBm)
10.6
10.4
10.2
10
9.8
9.6
9.4
9.2
1.8
2
2.2
2.4
2.6 2.8
3
VDDS (V)
3.2
3.4
3.6
3.8
D023
Figure 5-24. TX 10-dBm Output Power vs
Supply Voltage 868 MHz
Specifications
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6 Detailed Description
6.1
Overview
Section 1.4 shows a block diagram of the core modules of the CC13xx product family.
6.2
Main CPU
The SimpleLink CC1310 Wireless MCU contains an ARM Cortex-M3 (CM3) 32-bit CPU, which runs the
application and the higher layers of the protocol stack.
The CM3 processor provides a high-performance, low-cost platform that meets the system requirements
of minimal memory implementation, and low-power consumption, while delivering outstanding
computational performance and exceptional system response to interrupts.
CM3 features include the following:
• 32-bit ARM Cortex-M3 architecture optimized for small-footprint embedded applications
• Outstanding processing performance combined with fast interrupt handling
• ARM Thumb®-2 mixed 16- and 32-bit instruction set delivers the high performance expected of a 32-bit
ARM core in a compact memory size usually associated with 8- and 16-bit devices, typically in the
range of a few kilobytes of memory for microcontroller-class applications:
– Single-cycle multiply instruction and hardware divide
– Atomic bit manipulation (bit-banding), delivering maximum memory use and streamlined peripheral
control
– Unaligned data access, enabling data to be efficiently packed into memory
• Fast code execution permits slower processor clock or increases sleep mode time
• Harvard architecture characterized by separate buses for instruction and data
• Efficient processor core, system, and memories
• Hardware division and fast digital-signal-processing oriented multiply accumulate
• Saturating arithmetic for signal processing
• Deterministic, high-performance interrupt handling for time-critical applications
• Enhanced system debug with extensive breakpoint and trace capabilities
• Serial wire trace reduces the number of pins required for debugging and tracing
• Migration from the ARM7™ processor family for better performance and power efficiency
• Optimized for single-cycle flash memory use
• Ultralow power consumption with integrated sleep modes
• 1.25 DMIPS per MHz
28
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6.3
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RF Core
The RF core is a highly flexible and capable radio system that interfaces the analog RF and base-band
circuits, handles data to and from the system side, and assembles the information bits in a given packet
structure.
The RF core can autonomously handle the time-critical aspects of the radio protocols, thus offloading the
main CPU and leaving more resources for the user application. The RF core offers a high-level,
command-based API to the main CPU.
The RF core supports a wide range of modulation formats, frequency bands, and accelerator features,
which include the following (not all of the features have been characterized yet, see CC1310 SimpleLink
Wireless MCU Silicon Errata, SWRZ062, for more information):
• Wide range of data rates:
– From 625 bps (offering long range and high robustness) to as high as 4 Mbps
• Wide range of modulation formats:
– Multilevel (G)FSK and MSK
– On-Off Keying (OOK) with optimized shaping to minimize adjacent channel leakage
– Coding-gain support for long range
• Dedicated packet handling accelerators:
– Forward error correction
– Data whitening
– 802.15.4g mode-switch support
– Automatic CRC
• Automatic listen-before-talk (LBT) and clear channel assist (CCA)
• Digital RSSI
• Highly configurable channel filtering, supporting channel spacing schemes from 40 kHz to 4 MHz
• High degree of flexibility, offering a future-proof solution
The RF core interfaces a highly flexible radio, with a high-performance synthesizer that can support a wide
range of frequency bands.
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Sensor Controller
The Sensor Controller contains circuitry that can be selectively enabled in standby mode. The peripherals
in this domain may be controlled by the Sensor Controller Engine, which is a proprietary power-optimized
CPU. This CPU can read and monitor sensors or perform other tasks autonomously; thereby significantly
reducing power consumption and offloading the main CM3 CPU.
A PC-based development tool called Sensor Controller Studio is used to write, test and debug code for
Sensor Controller. The tool produces C driver source code, which the System CPU application uses to
control and exchange data with the Sensor Controller Typical use cases may be (but are not limited to)
the following:
• Analog sensors using integrated ADC
• Digital sensors using GPIOs with bit-banged I2C or SPI
• Capacitive sensing
• Waveform generation
• Pulse counting
• Key scan
• Quadrature decoder for polling rotation sensors
The peripherals in the Sensor Controller include the following:
• The low-power clocked comparator can be used to wake the device from any state in which the
comparator is active. A configurable internal reference can be used in conjunction with the comparator.
The output of the comparator can also be used to trigger an interrupt or the ADC.
• Capacitive sensing functionality is implemented through the use of a constant current source, a timeto-digital converter, and a comparator. The continuous time comparator in this block can also be used
as a higher-accuracy alternative to the low-power clocked comparator. The Sensor Controller takes
care of baseline tracking, hysteresis, filtering, and other related functions.
• The ADC is a 12-bit, 200 ksamples/s ADC with eight inputs and a built-in voltage reference. The ADC
can be triggered by many different sources, including timers, I/O pins, software, the analog
comparator, and the RTC.
• The analog modules can be connected to up to eight different GPIOs
The peripherals in the Sensor Controller can also be controlled from the main application processor.
30
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Table 6-1. GPIOs Connected to the Sensor Controller (1)
ANALOG CAPABLE
7 × 7 RGZ
DIO NUMBER
5 × 5 RHB
DIO NUMBER
Y
30
14
Y
29
13
Y
28
12
Y
27
11
9
Y
26
9
8
Y
25
10
7
Y
24
8
6
Y
23
7
5
N
7
4
2
N
6
3
1
N
5
2
0
N
4
1
N
3
0
N
2
N
1
N
0
(1)
6.5
4 × 4 RSM
DIO NUMBER
Depending on the package size, up to 15 pins can be connected to the Sensor Controller. Up to 8 of
these pins can be connected to analog modules.
Memory
The flash memory provides nonvolatile storage for code and data. The flash memory is in-system
programmable.
The SRAM (static RAM) is split into two 4-KB blocks and two 6-KB blocks and can be used for both
storage of data and execution of code. Retention of the RAM contents in standby mode can be enabled or
disabled individually for each block to minimize power consumption. In addition, if flash cache is disabled,
the 8-KB cache can be used as a general-purpose RAM.
The ROM provides preprogrammed, embedded TI RTOS kernel and Driverlib. It also contains a
bootloader that can be used to reprogram the device using SPI or UART.
6.6
Debug
The on-chip debug support is done through a dedicated cJTAG (IEEE 1149.7) or JTAG (IEEE 1149.1)
interface.
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Power Management
To minimize power consumption, the CC1310 supports a number of power modes and power
management features (see Table 6-2).
Table 6-2. Power Modes
SOFTWARE CONFIGURABLE POWER MODES
ACTIVE
IDLE
STANDBY
SHUTDOWN
RESET PIN
HELD
CPU
Active
Off
Off
Off
Off
Flash
On
Available
Off
Off
Off
SRAM
On
On
On
Off
Off
Radio
Available
Available
Off
Off
Off
MODE
Supply System
Current
Wake-up Time to CPU Active (1)
Register Retention
SRAM Retention
On
On
Duty Cycled
Off
Off
1.2 mA + 25.5 µA/MHz
570 µA
0.6 µA
185 nA
0.1 µA
–
14 µs
174 µs
1015 µs
1015 µs
Full
Full
Partial
No
No
Full
Full
Full
No
No
High-Speed Clock
XOSC_HF or
RCOSC_HF
XOSC_HF or
RCOSC_HF
Off
Off
Off
Low-Speed Clock
XOSC_LF or
RCOSC_LF
XOSC_LF or
RCOSC_LF
XOSC_LF or
RCOSC_LF
Off
Off
Peripherals
Available
Available
Off
Off
Off
Sensor Controller
Available
Available
Available
Off
Off
Wake-up on RTC
Available
Available
Available
Off
Off
Wake-up on Pin Edge
Available
Available
Available
Available
Off
Wake-up on Reset Pin
Available
Available
Available
Available
Available
Brown Out Detector (BOD)
Active
Active
Duty Cycled (2)
Off
N/A
Power On Reset (POR)
Active
Active
Active
Active
N/A
(1)
(2)
Not including RTOS overhead
The Brown Out Detector is disabled between recharge periods in STANDBY. Lowering the supply voltage below the BOD threshold
between two recharge periods while in STANDBY may cause the BOD to lock the device upon wake-up until a Reset/POR releases it.
To avoid this, it is recommended that STANDBY mode is avoided if there is a risk that the supply voltage (VDDS) may drop below the
specified operating voltage range. For the same reason, it is also good practice to ensure that a power cycling operation, such as a
battery replacement, triggers a Power-on-reset by ensuring that the VDDS decoupling network is fully depleted before applying supply
voltage again (for example, inserting new batteries).
In active mode, the application CM3 CPU is actively executing code. Active mode provides normal
operation of the processor and all of the peripherals that are currently enabled. The system clock can be
any available clock source (see Table 6-2).
In idle mode, all active peripherals can be clocked, but the Application CPU core and memory are not
clocked and no code is executed. Any interrupt event brings the processor back into active mode.
In standby mode, only the always-on (AON) domain is active. An external wake-up event, RTC event, or
Sensor Controller event is required to bring the device back to active mode. MCU peripherals with
retention do not need to be reconfigured when waking up again, and the CPU continues execution from
where it went into standby mode. All GPIOs are latched in standby mode.
In shutdown mode, the device is entirely turned off (including the AON domain and Sensor Controller),
and the I/Os are latched with the value they had before entering shutdown mode. A change of state on
any I/O pin defined as a wake from shutdown pin wakes up the device and functions as a reset trigger.
The CPU can differentiate between reset in this way and reset-by-reset pin or power-on-reset by reading
the reset status register. The only state retained in this mode is the latched I/O state and the flash memory
contents.
32
Detailed Description
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CC1310
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SWRS181B – SEPTEMBER 2015 – REVISED OCTOBER 2015
The Sensor Controller is an autonomous processor that can control the peripherals in the Sensor
Controller independently of the main CPU. This means that the main CPU does not have to wake up, for
example to execute an ADC sample or poll a digital sensor over SPI, thus saving both current and wakeup time that would otherwise be wasted. The Sensor Controller Studio enables the user to configure the
Sensor Controller and to choose which peripherals are controlled and which conditions wake up the main
CPU.
6.8
Clock Systems
The CC1310 supports two external and two internal clock sources.
A 24-MHz external crystal is required as the frequency reference for the radio. This signal is doubled
internally to create a 48-MHz clock.
The 32.768-kHz crystal is optional. The low-speed crystal oscillator is designed for use with a 32.768-kHz
watch-type crystal.
The internal high-speed RC oscillator (48-MHz) can be used as a clock source for the CPU subsystem.
The internal low-speed RC oscillator (32-kHz) can be used as a reference if the low-power crystal
oscillator is not used.
The 32-kHz clock source can be used as external clocking reference through GPIO.
6.9
General Peripherals and Modules
The I/O controller controls the digital I/O pins and contains multiplexer circuitry to allow a set of peripherals
to be assigned to I/O pins in a flexible manner. All digital I/Os are interrupt and wake-up capable, have a
programmable pullup and pulldown function, and can generate an interrupt on a negative or positive edge
(configurable). When configured as an output, pins can function as either push-pull or open-drain. Five
GPIOs have high-drive capabilities, which are marked in bold in Section 4.
The SSIs are synchronous serial interfaces that are compatible with SPI, MICROWIRE, and Texas
Instruments' synchronous serial interfaces. The SSIs support both SPI master and slave up to 4 MHz.
The UART implements a universal asynchronous receiver and transmitter function. It supports flexible
baud-rate generation up to a maximum of 3 Mbps.
Timer 0 is a general-purpose timer module (GPTM) that provides two 16-bit timers. The GPTM can be
configured to operate as a single 32-bit timer, dual 16-bit timers, or as a PWM module.
Timer 1, Timer 2, and Timer 3 are also GPTMs. Each of these timers is functionally equivalent to Timer 0.
In addition to these four timers, the RF core has its own timer to handle timing for RF protocols; the RF
timer can be synchronized to the RTC.
The I2S interface is used to handle digital audio see the CC13xx, CC26xx SimpleLink™ Wireless MCU
Technical Reference Manual (SWCU117) for more information.
The I2C interface is used to communicate with devices compatible with the I2C standard. The I2C interface
can handle 100 kHz and 400 kHz operation, and can serve as both I2C master and I2C slave.
The TRNG module provides a true, nondeterministic noise source for the purpose of generating keys,
initialization vectors (IVs), and other random number requirements. The TRNG is built on 24 ring
oscillators that create unpredictable output to feed a complex nonlinear-combinatorial circuit.
The watchdog timer is used to regain control if the system fails due to a software error after an external
device fails to respond as expected. The watchdog timer can generate an interrupt or a reset when a
predefined time-out value is reached.
Detailed Description
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CC1310
SWRS181B – SEPTEMBER 2015 – REVISED OCTOBER 2015
www.ti.com
The device includes a direct memory access (µDMA) controller. The µDMA controller provides a way to
offload data-transfer tasks from the CM3 CPU, thus allowing for more efficient use of the processor and
the available bus bandwidth. The µDMA controller can perform transfer between memory and peripherals.
The µDMA controller has dedicated channels for each supported on-chip module and can be programmed
to automatically perform transfers between peripherals and memory as the peripheral is ready to transfer
more data.
Some features of the µDMA controller include the following (this is not an exhaustive list):
• Highly flexible and configurable channel operation of up to 32 channels
• Transfer modes: memory-to-memory, memory-to-peripheral, peripheral-to-memory, and
peripheral-to-peripheral
• Data sizes of 8, 16, and 32 bits
The AON domain contains circuitry that is always enabled, except for in shutdown mode (where the digital
supply is off). This circuitry includes the following:
• The RTC can be used to wake the device from any state where it is active. The RTC contains three
compare and one capture registers. With software support, the RTC can be used for clock and
calendar operation. The RTC is clocked from the 32-kHz RC oscillator or crystal. The RTC can also be
compensated to tick at the correct frequency even when the internal 32-kHz RC oscillator is used
instead of a crystal.
• The battery monitor and temperature sensor are accessible by software and provide a battery status
indication as well as a coarse temperature measure.
6.10 System Architecture
Depending on the product configuration, CC1310 can function as a wireless network processor (WNP –
an IC running the wireless protocol stack, with the application running on a separate host MCU), or as a
system-on-chip (SoC) with the application and protocol stack running on the ARM CM3 core inside the
device.
In the first case, the external host MCU communicates with the device using SPI or UART. In the second
case, the application must be written according to the application framework supplied with the wireless
protocol stack.
34
Detailed Description
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CC1310
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SWRS181B – SEPTEMBER 2015 – REVISED OCTOBER 2015
7 Application, Implementation, and Layout
NOTE
Information in the following Applications section is not part of the TI component specification,
and TI does not warrant its accuracy or completeness. TI’s customers are responsible for
determining suitability of components for their purposes. Customers should validate and test
their design implementation to confirm system functionality.
Few external components are required for the operation of the CC1310 device. Figure 7-1 shows a typical
application circuit.
The board layout greatly influences the RF performance of the CC1310 device.
On the Texas Instruments CC1310EM-7XD-7793, the optimal differential impedance seen from the RF
pins into the balun and filter and antenna is 44 +j15.
Red = Not Necessary if Internal Bias is Used
Antenna
(50 )
Pin 3 (RXTX)
Optional Inductor.
Only Needed for
DCDC Operation
Pin 2 (RF N)
Pin 1 (RF P)
DC Block
Differential Operation
Red = Not Necessary if Internal Bias is Used
CC13xx
(GND exposed die
attached pad)
Pin 3 (RXTX)
Pin 2 (RF N)
Antenna
(50 )
Pin 2 (RF N)
DC Block
Pin 1 (RF P)
Pin 1 (RF P)
Single-Ended Operation
Red = Not Necessary if Internal Bias is Used
Pin 3 (RXTX)
24MHz
XTAL
(Load Caps
on Chip)
Antenna
(50 )
DC Block
Pin 2 (RF N)
Single-Ended
Operation With
Antenna Diversity
Antenna
(50 )
DC Block
Pin 1 (RF P)
Figure 7-1 does not show decoupling capacitors for power pins. For a complete reference design, see the product
folder on www.ti.com.
Figure 7-1. Differential Reference Design
Application, Implementation, and Layout
Copyright © 2015, Texas Instruments Incorporated
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35
CC1310
SWRS181B – SEPTEMBER 2015 – REVISED OCTOBER 2015
7.1
www.ti.com
TI Design
Humidity and Temp Sensor Node for Sub-1GHz Star Networks Enabling 10+ Year Coin Cell Battery Life
This TI Design uses Texas Instruments' nano-power system timer, boost converter, SimpleLink ultralow
power Sub-1-GHz wireless microcontroller (MCU) platform, and humidity sensing technologies to
demonstrate an ultralow power method to duty-cycle sensor end nodes leading to extremely long battery
life. The TI Design includes techniques for system design, detailed test results, and information to get the
design up and running quickly.
36
Application, Implementation, and Layout
Copyright © 2015, Texas Instruments Incorporated
Submit Documentation Feedback
Product Folder Links: CC1310
CC1310
www.ti.com
SWRS181B – SEPTEMBER 2015 – REVISED OCTOBER 2015
8 Device and Documentation Support
8.1
8.1.1
Device Support
Development Support
TI offers an extensive line of development tools, including tools to evaluate the performance of the
processors, generate code, develop algorithm implementations, and fully integrate and debug software
and hardware modules.
The following products support development of the CC1310 device applications:
Software Tools:
SmartRF Studio 7:
SmartRF Studio is a PC application that helps designers of radio systems to easily evaluate the RF-IC at
an early stage in the design process.
• Test functions for sending and receiving radio packets, continuous wave transmit and receive
• Evaluate RF performance on custom boards by wiring it to a supported evaluation board or debugger
• Can also be used without any hardware, but then only to generate, edit and export radio configuration
settings
• Can be used in combination with several development kits for Texas Instruments’ CCxxxx RF-ICs
Sensor Controller Studio:
Sensor Controller Studio provides a development environment for the CC13xx Sensor Controller. The
Sensor Controller is a proprietary, power-optimized CPU in the CC13xx, which can perform simple
background tasks autonomously and independent of the System CPU state.
• Allows for Sensor Controller task algorithms to be implemented using a C-like programming language
• Outputs a Sensor Controller Interface driver, which incorporates the generated Sensor Controller
machine code and associated definitions
• Allows for rapid development by using the integrated Sensor Controller task testing and debugging
functionality. This allows for live visualization of sensor data and algorithm verification.
IDEs and Compilers:
Code Composer Studio:
• Integrated development environment with project management tools and editor
• Code Composer Studio (CCS) 6.1 and later has built-in support for the CC13xx device family
• Best support for XDS debuggers; XDS100v3, XDS110 and XDS200
• High integration with TI-RTOS with support for TI-RTOS Object View
IAR Embedded Workbench for ARM
• Integrated development environment with project management tools and editor
• IAR EWARM 7.30.3 and later has built-in support for the CC13xx device family
• Broad debugger support, supporting XDS100v3, XDS200, IAR I-Jet and Segger J-Link
• Integrated development environment with project management tools and editor
• RTOS plugin available for TI-RTOS
For a complete listing of development-support tools for the CC1310 platform, visit the Texas Instruments
website at www.ti.com. For information on pricing and availability, contact the nearest TI field sales office
or authorized distributor.
8.1.2
Reference Designs
Humidity and Temp Sensor Node for Sub-1GHz Star Networks Enabling 10+ Year Coin Cell Battery Life
(TIDA-00484)
Device and Documentation Support
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Product Folder Links: CC1310
37
CC1310
SWRS181B – SEPTEMBER 2015 – REVISED OCTOBER 2015
8.1.3
www.ti.com
Device Nomenclature
To designate the stages in the product development cycle, TI assigns prefixes to all part numbers and/or
date-code. Each device has one of three prefixes/identifications: X, P, or null (no prefix) (for example,
CC1310 is in production; therefore, no prefix/identification is assigned).
Device development evolutionary flow:
X
Experimental device that is not necessarily representative of the final device's electrical
specifications and may not use production assembly flow.
P
Prototype device that is not necessarily the final silicon die and may not necessarily meet
final electrical specifications.
null
Production version of the silicon die that is fully qualified.
Production devices have been characterized fully, and the quality and reliability of the device have been
demonstrated fully. TI's standard warranty applies.
Predictions show that prototype devices (X or P) have a greater failure rate than the standard production
devices. Texas Instruments recommends that these devices not be used in any production system
because their expected end-use failure rate still is undefined. Only qualified production devices are to be
used.
TI device nomenclature also includes a suffix with the device family name. This suffix indicates the
package type (for example, RGZ).
For orderable part numbers of CC1310 devices in the RGZ (7-mm × 7-mm) package types, see the
Package Option Addendum of this document, the TI website (www.ti.com), or contact your TI sales
representative.
38
Device and Documentation Support
Copyright © 2015, Texas Instruments Incorporated
Submit Documentation Feedback
Product Folder Links: CC1310
CC1310
www.ti.com
8.2
SWRS181B – SEPTEMBER 2015 – REVISED OCTOBER 2015
Documentation Support
The following documents describe the CC1310. Copies of these documents are available on the Internet
at www.ti.com.
• CC13xx, CC26xx SimpleLink™ Wireless MCU Technical Reference Manual (SWCU117)
• CC26xx/CC13xx Power Management Software Developer's Reference Guide (SWRS486)
• Using GCC/GDB With SimpleLink™ CC26xx/CC13xx Application Report (SWRA446)
8.2.1
Community Resources
The following links connect to TI community resources. Linked contents are provided "AS IS" by the
respective contributors. They do not constitute TI specifications and do not necessarily reflect TI's views;
see TI's Terms of Use.
TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster
collaboration among engineers. At e2e.ti.com, you can ask questions, share knowledge,
explore ideas and help solve problems with fellow engineers.
TI Embedded Processors Wiki Texas Instruments Embedded Processors Wiki. Established to help
developers get started with Embedded Processors from Texas Instruments and to foster
innovation and growth of general knowledge about the hardware and software surrounding
these devices.
8.2.2
Texas Instruments Low-Power RF Website
Texas Instruments' Low-Power RF website has all the latest products, application and design notes, FAQ
section, news and events updates. Go to www.ti.com/lprf.
8.2.3
Low-Power RF Online Community
•
•
•
Forums, videos, and blogs
RF design help
E2E interaction
Join at: www.ti.com/lprf-forum.
8.2.4
Texas Instruments Low-Power RF Developer Network
Texas Instruments has launched an extensive network of low-power RF development partners to help
customers speed up their application development. The network consists of recommended companies, RF
consultants, and independent design houses that provide a series of hardware module products and
design services, including:
• RF circuit, low-power RF, and ZigBee® design services
• Low-power RF and ZigBee module solutions and development tools
• RF certification services and RF circuit manufacturing
For help with modules, engineering services or development tools:
Search the Low-Power RF Developer Network to find a suitable partner. www.ti.com/lprfnetwork
8.2.5
Low-Power RF eNewsletter
The Low-Power RF eNewsletter is up-to-date on new products, news releases, developers’ news, and
other news and events associated with low-power RF products from TI. The Low-Power RF eNewsletter
articles include links to get more online information.
Sign up at: www.ti.com/lprfnewsletter
Device and Documentation Support
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Product Folder Links: CC1310
39
CC1310
SWRS181B – SEPTEMBER 2015 – REVISED OCTOBER 2015
8.3
www.ti.com
Additional Information
Texas Instruments offers a wide selection of cost-effective, low-power RF solutions for proprietary and
standard-based wireless applications for use in industrial and consumer applications. The selection
includes RF transceivers, RF transmitters, RF front ends, and Systems-on-Chips as well as various
software solutions for the sub-1-GHz and 2.4-GHz frequency bands.
In addition, Texas Instruments provides a large selection of support collateral such as development tools,
technical documentation, reference designs, application expertise, customer support, third-party and
university programs.
Other than providing technical support forums, videos, and blogs, the Low-Power RF E2E Online
Community also presents the opportunity to interact with engineers from all over the world.
With a broad selection of product solutions, end-application possibilities, and a range of technical support,
Texas Instruments offers the broadest low-power RF portfolio.
8.4
Trademarks
IAR Embedded Workbench is a registered trademark of IAR Systems AB.
SimpleLink, SmartRF, Code Composer Studio, E2E are trademarks of Texas Instruments.
ARM7 is a trademark of ARM Limited (or its subsidiaries).
ARM, Cortex, ARM Thumb are registered trademarks of ARM Limited (or its subsidiaries).
ULPBench is a trademark of Embedded Microprocessor Benchmark Consortium.
CoreMark is a registered trademark of Embedded Microprocessor Benchmark Consortium.
IEEE Std 1241 is a trademark of Institute of Electrical and Electronics Engineers, Incorporated.
ZigBee is a registered trademark of Zigbee Alliance.
8.5
Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
8.6
Glossary
SLYZ022 — TI Glossary.
This glossary lists and explains terms, acronyms and definitions.
9 Mechanical Packaging and Orderable Information
9.1
Packaging Information
The following pages include mechanical packaging and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and
revision of this document. For browser-based versions of this data sheet, refer to the left-hand navigation.
40
Mechanical Packaging and Orderable Information
Submit Documentation Feedback
Product Folder Links: CC1310
Copyright © 2015, Texas Instruments Incorporated
PACKAGE OPTION ADDENDUM
www.ti.com
11-Nov-2015
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
Lead/Ball Finish
MSL Peak Temp
(2)
(6)
(3)
Op Temp (°C)
Device Marking
(4/5)
CC1310F128RGZR
ACTIVE
VQFN
RGZ
48
2500
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-3-260C-168 HR
-40 to 85
CC1310
F128
CC1310F128RGZT
ACTIVE
VQFN
RGZ
48
250
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-3-260C-168 HR
-40 to 85
CC1310
F128
CC1310F128RHBR
ACTIVE
VQFN
RHB
32
3000
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-3-260C-168 HR
-40 to 85
CC1310
F128
CC1310F128RHBT
ACTIVE
VQFN
RHB
32
250
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-3-260C-168 HR
-40 to 85
CC1310
F128
CC1310F128RSMR
ACTIVE
VQFN
RSM
32
3000
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-3-260C-168 HR
-40 to 85
CC1310
F128
CC1310F128RSMT
ACTIVE
VQFN
RSM
32
250
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-3-260C-168 HR
-40 to 85
CC1310
F128
CC1310F32RGZR
ACTIVE
VQFN
RGZ
48
2500
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-3-260C-168 HR
-40 to 85
CC1310
F32
CC1310F32RGZT
ACTIVE
VQFN
RGZ
48
250
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-3-260C-168 HR
-40 to 85
CC1310
F32
CC1310F32RHBR
ACTIVE
VQFN
RHB
32
3000
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-3-260C-168 HR
-40 to 85
CC1310
F32
CC1310F32RHBT
ACTIVE
VQFN
RHB
32
250
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-3-260C-168 HR
-40 to 85
CC1310
F32
CC1310F32RSMR
ACTIVE
VQFN
RSM
32
3000
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-3-260C-168 HR
-40 to 85
CC1310
F32
CC1310F32RSMT
ACTIVE
VQFN
RSM
32
250
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-3-260C-168 HR
-40 to 85
CC1310
F32
CC1310F64RGZR
ACTIVE
VQFN
RGZ
48
2500
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-3-260C-168 HR
-40 to 85
CC1310
F64
CC1310F64RGZT
ACTIVE
VQFN
RGZ
48
250
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-3-260C-168 HR
-40 to 85
CC1310
F64
CC1310F64RHBR
ACTIVE
VQFN
RHB
32
3000
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-3-260C-168 HR
-40 to 85
CC1310
F64
CC1310F64RHBT
ACTIVE
VQFN
RHB
32
250
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-3-260C-168 HR
-40 to 85
CC1310
F64
CC1310F64RSMR
ACTIVE
VQFN
RSM
32
3000
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-3-260C-168 HR
-40 to 85
CC1310
F64
Addendum-Page 1
Samples
PACKAGE OPTION ADDENDUM
www.ti.com
Orderable Device
11-Nov-2015
Status
(1)
CC1310F64RSMT
ACTIVE
Package Type Package Pins Package
Drawing
Qty
VQFN
RSM
32
250
Eco Plan
Lead/Ball Finish
MSL Peak Temp
(2)
(6)
(3)
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-3-260C-168 HR
Op Temp (°C)
Device Marking
(4/5)
-40 to 85
CC1310
F64
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability
information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight
in homogeneous material)
(3)
MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4)
There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5)
Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6)
Lead/Ball Finish - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead/Ball Finish values may wrap to two lines if the finish
value exceeds the maximum column width.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
Addendum-Page 2
Samples
PACKAGE MATERIALS INFORMATION
www.ti.com
25-Apr-2016
TAPE AND REEL INFORMATION
*All dimensions are nominal
Device
Package Package Pins
Type Drawing
CC1310F128RGZR
VQFN
RGZ
48
SPQ
Reel
Reel
A0
Diameter Width (mm)
(mm) W1 (mm)
B0
(mm)
K0
(mm)
P1
(mm)
W
Pin1
(mm) Quadrant
2500
330.0
16.4
7.3
7.3
1.1
12.0
16.0
Q2
CC1310F128RGZT
VQFN
RGZ
48
250
180.0
16.4
7.3
7.3
1.1
12.0
16.0
Q2
CC1310F128RHBR
VQFN
RHB
32
3000
330.0
12.4
5.3
5.3
1.1
8.0
12.0
Q2
CC1310F128RHBT
VQFN
RHB
32
250
180.0
12.4
5.3
5.3
1.1
8.0
12.0
Q2
CC1310F128RSMR
VQFN
RSM
32
3000
330.0
12.4
4.25
4.25
1.15
8.0
12.0
Q2
CC1310F128RSMT
VQFN
RSM
32
250
180.0
12.4
4.25
4.25
1.15
8.0
12.0
Q2
CC1310F32RGZR
VQFN
RGZ
48
2500
330.0
16.4
7.3
7.3
1.1
12.0
16.0
Q2
CC1310F32RGZT
VQFN
RGZ
48
250
180.0
16.4
7.3
7.3
1.1
12.0
16.0
Q2
CC1310F32RHBR
VQFN
RHB
32
3000
330.0
12.4
5.3
5.3
1.1
8.0
12.0
Q2
CC1310F32RHBT
VQFN
RHB
32
250
180.0
12.4
5.3
5.3
1.1
8.0
12.0
Q2
CC1310F32RSMT
VQFN
RSM
32
250
180.0
12.4
4.25
4.25
1.15
8.0
12.0
Q2
CC1310F64RGZR
VQFN
RGZ
48
2500
330.0
16.4
7.3
7.3
1.1
12.0
16.0
Q2
CC1310F64RGZT
VQFN
RGZ
48
250
180.0
16.4
7.3
7.3
1.1
12.0
16.0
Q2
CC1310F64RHBR
VQFN
RHB
32
3000
330.0
12.4
5.3
5.3
1.1
8.0
12.0
Q2
CC1310F64RHBT
VQFN
RHB
32
250
180.0
12.4
5.3
5.3
1.1
8.0
12.0
Q2
CC1310F64RSMR
VQFN
RSM
32
3000
330.0
12.4
4.25
4.25
1.15
8.0
12.0
Q2
CC1310F64RSMT
VQFN
RSM
32
250
180.0
12.4
4.25
4.25
1.15
8.0
12.0
Q2
Pack Materials-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com
25-Apr-2016
*All dimensions are nominal
Device
Package Type
Package Drawing
Pins
SPQ
Length (mm)
Width (mm)
Height (mm)
CC1310F128RGZR
VQFN
RGZ
48
2500
367.0
367.0
38.0
CC1310F128RGZT
VQFN
RGZ
48
250
210.0
185.0
35.0
CC1310F128RHBR
VQFN
RHB
32
3000
367.0
367.0
35.0
CC1310F128RHBT
VQFN
RHB
32
250
210.0
185.0
35.0
CC1310F128RSMR
VQFN
RSM
32
3000
367.0
367.0
35.0
CC1310F128RSMT
VQFN
RSM
32
250
210.0
185.0
35.0
CC1310F32RGZR
VQFN
RGZ
48
2500
367.0
367.0
38.0
CC1310F32RGZT
VQFN
RGZ
48
250
210.0
185.0
35.0
CC1310F32RHBR
VQFN
RHB
32
3000
367.0
367.0
35.0
CC1310F32RHBT
VQFN
RHB
32
250
210.0
185.0
35.0
CC1310F32RSMT
VQFN
RSM
32
250
210.0
185.0
35.0
CC1310F64RGZR
VQFN
RGZ
48
2500
367.0
367.0
38.0
CC1310F64RGZT
VQFN
RGZ
48
250
210.0
185.0
35.0
CC1310F64RHBR
VQFN
RHB
32
3000
367.0
367.0
35.0
CC1310F64RHBT
VQFN
RHB
32
250
210.0
185.0
35.0
CC1310F64RSMR
VQFN
RSM
32
3000
367.0
367.0
35.0
CC1310F64RSMT
VQFN
RSM
32
250
210.0
185.0
35.0
Pack Materials-Page 2
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