AUIRFS3206 AUIRFSL3206 AUTOMOTIVE GRADE HEXFET® Power MOSFET Features Advanced Process Technology Ultra Low On-Resistance Enhanced dV/dT and dI/dT capability 175°C Operating Temperature Fast Switching Repetitive Avalanche Allowed up to Tjmax Lead-Free, RoHS Compliant Automotive Qualified * VDSS RDS(on) typ. Package Type AUIRFSL3206 TO-262 AUIRFS3206 D2-Pak 2.4m max. ID (Silicon Limited) 3.0m 210A ID (Package Limited) 120A D D Description Specifically designed for Automotive applications, this HEXFET® Power MOSFET utilizes the latest processing techniques to achieve extremely low on-resistance per silicon area. Additional features of this design are a 175°C junction operating temperature, fast switching speed and improved repetitive avalanche rating . These features combine to make this design an extremely efficient and reliable device for use in Automotive applications and a wide variety of other applications Base part number 60V D2Pak S D G TO-262 AUIRFS3206 AUIRFSL3206 S G G Gate D Drain Standard Pack Form Quantity Tube 50 Tube 50 Tape and Reel Left 800 S Source Orderable Part Number AUIRFSL3206 AUIRFS3206 AUIRFS3206TRL Absolute Maximum Ratings Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only; and functional operation of the device at these or any other condition beyond those indicated in the specifications is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. The thermal resistance and power dissipation ratings are measured under board mounted and still air conditions. Ambient temperature (TA) is 25°C, unless otherwise specified. Symbol Parameter Max. ID @ TC = 25°C Continuous Drain Current, VGS @ 10V (Silicon Limited) 210 ID @ TC = 100°C ID @ TC = 25°C Continuous Drain Current, VGS @ 10V (Silicon Limited) Continuous Drain Current, VGS @ 10V (Package Limited) 150 120 IDM PD @TC = 25°C Pulsed Drain Current Maximum Power Dissipation VGS EAS IAR EAR dv/dt TJ TSTG Linear Derating Factor Gate-to-Source Voltage Single Pulse Avalanche Energy (Thermally Limited) Avalanche Current Repetitive Avalanche Energy Peak Diode Recovery Operating Junction and Storage Temperature Range Soldering Temperature, for 10 seconds (1.6mm from case) Thermal Resistance Symbol RJC RJA Parameter Junction-to-Case Junction-to-Ambient (PCB Mount), D2 Pak Units A 840 300 W 2.0 ± 20 170 See Fig.14,15, 22a, 22b 5.0 -55 to + 175 W/°C V mJ A mJ V/ns °C 300 Typ. Max. Units ––– ––– 0.50 40 °C/W HEXFET® is a registered trademark of Infineon. *Qualification standards can be found at www.infineon.com 1 2015-10-27 AUIRFS/SL3206 Static @ TJ = 25°C (unless otherwise specified) Parameter Typ. Max. Units V Conditions 60 ––– ––– V(BR)DSS/TJ Breakdown Voltage Temp. Coefficient ––– 0.07 ––– V/°C Reference to 25°C, ID = 5mA RDS(on) Static Drain-to-Source On-Resistance ––– 2.4 3.0 m VGS = 10V, ID = 75A VGS(th) Gate Threshold Voltage 2.0 ––– 4.0 V gfs RG Forward Trans conductance Gate Resistance IDSS Drain-to-Source Leakage Current 210 ––– ––– ––– 0.7 ––– ––– ––– 20 ––– ––– 250 S VDS = 50V, ID = 75A VDS = 60V, VGS = 0V µA VDS = 48V,VGS = 0V,TJ =125°C IGSS Gate-to-Source Forward Leakage Gate-to-Source Reverse Leakage ––– ––– ––– ––– 100 -100 V(BR)DSS Drain-to-Source Breakdown Voltage Min. nA VGS = 0V, ID = 250µA VDS = VGS, ID = 150µA VGS = 20V VGS = -20V Dynamic Electrical Characteristics @ TJ = 25°C (unless otherwise specified) Qg Qgs Qgd Qsync td(on) tr td(off) tf Ciss Coss Total Gate Charge Gate-to-Source Charge Gate-to-Drain Charge Total Gate Charge Sync. (Qg - Qgd) Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Input Capacitance Output Capacitance ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– 120 29 35 85 19 82 55 83 6540 720 170 ––– ––– ––– ––– ––– ––– ––– ––– ––– Crss Reverse Transfer Capacitance ––– 360 ––– Coss eff.(ER) Effective Output Capacitance (Energy Related) ––– 1040 ––– VDD = 30V ID = 75A ns RG= 2.7 VGS = 10V VGS = 0V VDS = 50V pF ƒ = 1.0MHz, See Fig. 5 VGS = 0V, VDS = 0V to 48V Coss eff.(TR) Effective Output Capacitance (Time Related) ––– 1230 ––– VGS = 0V, VDS = 0V to 48V Min. Typ. Max. Units ––– ––– 210 ––– ––– 840 ––– ––– ––– ––– ––– ––– ––– 33 37 41 53 2.1 1.3 50 56 62 80 ––– Diode Characteristics Parameter Continuous Source Current IS (Body Diode) Pulsed Source Current ISM (Body Diode) VSD Diode Forward Voltage trr Reverse Recovery Time Qrr Reverse Recovery Charge IRRM ton Reverse Recovery Current Forward Turn-On Time ID = 75A VDS = 30V nC VGS = 10V Conditions MOSFET symbol showing the A integral reverse p-n junction diode. V TJ = 25°C,IS = 75A,VGS = 0V TJ = 25°C VDD = 51V ns TJ = 125°C IF = 75A, TJ = 25°C di/dt = 100A/µs nC TJ = 125°C A TJ = 25°C Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD) Notes: Calculated continuous current based on maximum allowable junction temperature. Bond wire current limit is 120A. Note that current limitations arising from heating of the device leads may occur with some lead mounting arrangements. Repetitive rating; pulse width limited by max. junction temperature. Limited by TJmax, starting TJ = 25°C, L = 0.023mH, RG = 25, IAS = 120A, VGS =10V. Part not recommended for use above this value. ISD 75A, di/dt 360A/µs, VDD V(BR)DSS, TJ 175°C. Pulse width 400µs; duty cycle 2%. Coss eff. (TR) is a fixed capacitance that gives the same charging time as Coss while VDS is rising from 0 to 80% VDSS. Coss eff. (ER) is a fixed capacitance that gives the same energy as Coss while VDS is rising from 0 to 80% VDSS. When mounted on 1" square PCB (FR-4 or G-10 Material). For recommended footprint and soldering techniques refer to application note #AN-994 R is measured at TJ approximately 90°C. 2 2015-10-27 AUIRFS/SL3206 1000 1000 BOTTOM VGS 15V 10V 8.0V 6.0V 5.5V 5.0V 4.8V 4.5V 100 4.5V 60µs PULSE WIDTH Tj = 25°C BOTTOM 100 4.5V 60µs PULSE WIDTH Tj = 175°C 10 10 0.1 1 10 100 0.1 VDS , Drain-to-Source Voltage (V) 10 100 Fig. 2 Typical Output Characteristics 2.5 100 RDS(on) , Drain-to-Source On Resistance (Normalized) 1000 ID, Drain-to-Source Current) 1 VDS , Drain-to-Source Voltage (V) Fig. 1 Typical Output Characteristics TJ = 175°C 10 TJ = 25°C 1 VDS = 25V 60µs PULSE WIDTH ID = 75A VGS = 10V 2.0 1.5 1.0 0.5 0.1 2.0 3.0 4.0 5.0 6.0 7.0 -60 -40 -20 8.0 20 VGS, Gate-to-Source Voltage (V) VGS = 0V, f = 1 MHZ Ciss = Cgs + Cgd, Cds SHORTED Crss = Cgd 10000 Coss = Cds + Cgd 8000 Ciss 6000 4000 Coss 2000 20 40 60 80 100 120 140 160 180 Fig. 4 Normalized On-Resistance vs. Temperature Fig. 3 Typical Transfer Characteristics 12000 0 TJ , Junction Temperature (°C) VGS, Gate-to-Source Voltage (V) C, Capacitance (pF) VGS 15V 10V 8.0V 6.0V 5.5V 5.0V 4.8V 4.5V TOP ID, Drain-to-Source Current (A) ID, Drain-to-Source Current (A) TOP ID= 75A VDS = 48V 16 VDS= 30V VDS= 12V 12 8 4 Crss 0 1 10 100 0 0 40 80 120 160 200 VDS , Drain-to-Source Voltage (V) QG Total Gate Charge (nC) Fig 5. Typical Capacitance vs. Drain-to-Source Voltage Fig 6. Typical Gate Charge vs. Gate-to-Source Voltage 3 2015-10-27 AUIRFS/SL3206 10000 ID, Drain-to-Source Current (A) ISD , Reverse Drain Current (A) 1000 TJ = 175°C 100 TJ = 25°C 10 1 OPERATION IN THIS AREA LIMITED BY R DS (on) 1000 1msec 100 10msec 10 1 Tc = 25°C Tj = 175°C Single Pulse VGS = 0V 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8 2.0 0.1 VSD , Source-to-Drain Voltage (V) Limited By Package ID, Drain Current (A) 160 120 80 40 0 25 50 75 100 125 150 10 100 Fig 8. Maximum Safe Operating Area V(BR)DSS , Drain-to-Source Breakdown Voltage 240 200 1 VDS , Drain-toSource Voltage (V) Fig. 7 Typical Source-to-Drain Diode 80 ID = 5mA 75 70 65 60 55 -60 -40 -20 175 0 20 40 60 80 100 120 140 160 180 TJ , Junction Temperature (°C) T C , Case Temperature (°C) Fig 9. Maximum Drain Current vs. Case Temperature Fig 10. Drain-to-Source Breakdown Voltage 2.0 EAS, Single Pulse Avalanche Energy (mJ) 800 1.5 Energy (µJ) DC 0.1 0.1 1.0 0.5 0.0 ID 21A 33A BOTTOM 120A TOP 600 400 200 0 0 10 20 30 40 50 VDS, Drain-to-Source Voltage (V) Fig 11. Typical COSS Stored Energy 4 100µsec 60 25 50 75 100 125 150 175 Starting TJ, Junction Temperature (°C) Fig 12. Maximum Avalanche Energy vs. Drain Current 2015-10-27 AUIRFS/SL3206 1 Thermal Response ( Z thJC ) D = 0.50 0.20 0.10 0.1 0.05 0.02 0.01 J 0.01 J 1 R2 R2 Ri (°C/W) R3 R3 C 2 1 3 2 3 Ci= iRi Ci= iRi SINGLE PULSE ( THERMAL RESPONSE ) 0.001 R1 R1 I (sec) 0.106416 0.0001 0.201878 0.0012621 0.190923 0.011922 Notes: 1. Duty Factor D = t1/t2 2. Peak Tj = P dm x Zthjc + Tc 0.0001 1E-006 1E-005 0.0001 0.001 0.01 0.1 t1 , Rectangular Pulse Duration (sec) Fig 13. Maximum Effective Transient Thermal Impedance, Junction-to-Case 1000 Avalanche Current (A) Duty Cycle = Single Pulse Allowed avalanche Current vs avalanche pulsewidth, tav, assuming Tj = 150°C and Tstart =25°C (Single Pulse) 100 0.01 0.05 0.10 10 Allowed avalanche Current vs avalanche pulsewidth, tav, assuming j = 25°C and Tstart = 150°C. 1 1.0E-06 1.0E-05 1.0E-04 1.0E-03 1.0E-02 1.0E-01 tav (sec) Fig 14. Avalanche Current vs. Pulse width EAR , Avalanche Energy (mJ) 200 TOP Single Pulse BOTTOM 1% Duty Cycle ID = 120A 160 120 80 40 0 25 50 75 100 125 150 175 Starting TJ , Junction Temperature (°C) Fig 15. Maximum Avalanche Energy vs. Temperature 5 Notes on Repetitive Avalanche Curves , Figures 14, 15: (For further info, see AN-1005 at www.infineon.com) 1. Avalanche failures assumption: Purely a thermal phenomenon and failure occurs at a temperature far in excess of Tjmax. This is validated for every part type. 2. Safe operation in Avalanche is allowed as long as Tjmax is not exceeded. 3. Equation below based on circuit and waveforms shown in Figures 18a, 18b. 4. PD (ave) = Average power dissipation per single avalanche pulse. 5. BV = Rated breakdown voltage (1.3 factor accounts for voltage increase during avalanche). 6. Iav = Allowable avalanche current. 7. T = Allowable rise in junction temperature, not to exceed Tjmax (assumed as 25°C in Figure 13, 14). tav = Average time in avalanche. D = Duty cycle in avalanche = tav ·f ZthJC(D, tav) = Transient thermal resistance, see Figures 13) PD (ave) = 1/2 ( 1.3·BV·Iav) = T/ ZthJC Iav = 2T/ [1.3·BV·Zth] EAS (AR) = PD (ave)·tav 2015-10-27 AUIRFS/SL3206 18 ID = 1.0A 4.0 16 ID = 1.0mA ID = 250µA 3.5 14 ID = 150µA 12 IRRM - (A) VGS(th) Gate threshold Voltage (V) 4.5 3.0 2.5 10 8 6 2.0 IF = 30A VR = 51V 4 1.5 2 1.0 0 -75 -50 -25 0 25 50 75 TJ = 125°C TJ = 25°C 100 200 300 400 500 600 700 800 900 1000 100 125 150 175 dif / dt - (A / µs) TJ , Temperature ( °C ) Fig 16. Threshold Voltage vs. Temperature Fig. 17 - Typical Recovery Current vs. dif/dt 18 350 16 300 14 250 QRR - (nC) IRRM - (A) 12 10 8 6 4 2 0 IF = 45A VR = 51V 200 150 IF = 30A VR = 51V 100 TJ = 125°C TJ = 25°C 50 TJ = 125°C TJ = 25°C 0 100 200 300 400 500 600 700 800 900 1000 100 200 300 400 500 600 700 800 900 1000 dif / dt - (A / µs) dif / dt - (A / µs) Fig. 18 - Typical Recovery Current vs. dif/dt Fig. 19 - Typical Stored Charge vs. dif/dt 350 300 QRR - (nC) 250 200 150 100 50 0 IF = 45A VR = 51V TJ = 125°C TJ = 25°C 100 200 300 400 500 600 700 800 900 1000 dif / dt - (A / µs) Fig. 20 - Typical Stored Charge vs. dif/dt 6 2015-10-27 AUIRFS/SL3206 Fig 21. Peak Diode Recovery dv/dt Test Circuit for N-Channel HEXFET® Power MOSFETs V(BR)DSS 15V tp L VDS D.U.T RG IAS 20V tp DRIVER + V - DD A 0.01 Fig 22a. Unclamped Inductive Test Circuit Fig 23a. Switching Time Test Circuit I AS Fig 22b. Unclamped Inductive Waveforms Fig 23b. Switching Time Waveforms Id Vds Vgs Vgs(th) Qgs1 Qgs2 Fig 24a. Gate Charge Test Circuit 7 Qgd Qgodr Fig 24b. Gate Charge Waveform 2015-10-27 AUIRFS/SL3206 D2Pak (TO-263AB) Package Outline (Dimensions are shown in millimeters (inches)) D2Pak (TO-263AB) Part Marking Information Part Number AUFS3206 YWWA IR Logo XX Date Code Y= Year WW= Work Week XX Lot Code Note: For the most current drawing please refer to IR website at http://www.irf.com/package/ 8 2015-10-27 AUIRFS/SL3206 TO-262 Package Outline (Dimensions are shown in millimeters (inches) TO-262 Part Marking Information Part Number AUFSL3206 YWWA IR Logo XX Date Code Y= Year WW= Work Week XX Lot Code Note: For the most current drawing please refer to IR website at http://www.irf.com/package/ 9 2015-10-27 AUIRFS/SL3206 D2Pak (TO-263AB) Tape & Reel Information (Dimensions are shown in millimeters (inches)) TRR 1.60 (.063) 1.50 (.059) 4.10 (.161) 3.90 (.153) FEED DIRECTION 1.85 (.073) 1.65 (.065) 1.60 (.063) 1.50 (.059) 11.60 (.457) 11.40 (.449) 0.368 (.0145) 0.342 (.0135) 15.42 (.609) 15.22 (.601) 24.30 (.957) 23.90 (.941) TRL 10.90 (.429) 10.70 (.421) 1.75 (.069) 1.25 (.049) 4.72 (.136) 4.52 (.178) 16.10 (.634) 15.90 (.626) FEED DIRECTION 13.50 (.532) 12.80 (.504) 27.40 (1.079) 23.90 (.941) 4 330.00 (14.173) MAX. NOTES : 1. COMFORMS TO EIA-418. 2. CONTROLLING DIMENSION: MILLIMETER. 3. DIMENSION MEASURED @ HUB. 4. INCLUDES FLANGE DISTORTION @ OUTER EDGE. 60.00 (2.362) MIN. 26.40 (1.039) 24.40 (.961) 3 30.40 (1.197) MAX. 4 Note: For the most current drawing please refer to IR website at http://www.irf.com/package/ 10 2015-10-27 AUIRFS/SL3206 Qualification Information Automotive (per AEC-Q101) Comments: This part number(s) passed Automotive qualification. Infineon’s Industrial and Consumer qualification level is granted by extension of the higher Automotive level. Qualification Level Moisture Sensitivity Level D2-Pak Machine Model Human Body Model ESD MSL1 TO-262 Charged Device Model RoHS Compliant Class M4 (+/- 800V)† AEC-Q101-002 Class H2 (+/- 4000V)† AEC-Q101-001 Class C5 (+/- 2000V)† AEC-Q101-005 Yes † Highest passing voltage. Revision History Date 10/27/2015 Comments Updated datasheet with corporate template Corrected ordering table on page 1. Published by Infineon Technologies AG 81726 München, Germany © Infineon Technologies AG 2015 All Rights Reserved. IMPORTANT NOTICE The information given in this document shall in no event be regarded as a guarantee of conditions or characteristics (“Beschaffenheitsgarantie”). With respect to any examples, hints or any typical values stated herein and/or any information regarding the application of the product, Infineon Technologies hereby disclaims any and all warranties and liabilities of any kind, including without limitation warranties of non-infringement of intellectual property rights of any third party. In addition, any information given in this document is subject to customer’s compliance with its obligations stated in this document and any applicable legal requirements, norms and standards concerning customer’s products and any use of the product of Infineon Technologies in customer’s applications. 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Except as otherwise explicitly approved by Infineon Technologies in a written document signed by authorized representatives of Infineon Technologies, Infineon Technologies’ products may not be used in any applications where a failure of the product or any consequences of the use thereof can reasonably be expected to result in personal injury. 11 2015-10-27