TLP199D TOSHIBA PHOTOCOUPLER PHOTO RELAY TLP199D MEASUREMENT INSTRUMENTS LOGIC IC TESTERS / MEMORY TESTERS BOARD TESTERS / SCANNERS Unit: mm The TOSHIBA TLP199D consist of a gallium arsenide infrared emitting diode optically coupled to a photo-MOS FET in a plastic SOP package. Its characteristics include low OFF-state current and low output pin capacitance, enabling it to be used in high-frequency measurement instruments. FEATURES • 6 pin SOP (2.54SOP6) • 1-Form-A • Peak Off-State Voltage : 200 V (min) • Trigger LED Current : 3 mA (max) • On-State Current : 50 mA (max) • On-State Resistance : 50 ohm (max) • Output Capacitance : 20 pF (max) • Isolation Voltage : 1500 Vrms (min) : 2.1 mm high, 2.54 mm pitch JEDEC EIAJ TOSHIBA Weight: 0.13 g PIN CONFIGURATION (TOL VIEW) 1 6 2 5 3 4 11−7C1 1 : ANODE 2 : CATHODE 3 : N.C. 4 : DRAIN D1 5 : SOURCE 6 : DRAIN D2 SCHEMATIC 1 6 2 5 4 1 2007-10-01 TLP199D Absolute Maximum Ratings (Ta = 25°C) CHARACTERISTIC SYMBOL RATING UNIT IF 50 mA ΔIF/°C −0.5 mA/°C VR 5 V Tj 125 °C VOFF 200 V LED Forward Current Forward Current Derating (Ta > = 25°C) Reverse Voltage Junction Temperature Off-State Output Terminal Voltage DETECTOR A Connection On-State Current 50 ION B Connection On-State Current Derating C Connection 100 A Connection −0.5 ΔION/°C B Connection (Ta > = 25°C) mA 50 −0.5 mA/°C −1.0 C Connection Junction Temperature Tj 125 °C Storage Temperature Range Tstg −55~125 °C Operating Temperature Range Topr −40~85 °C Lead Soldering Temperature (10 s) Tsol 260 °C Isolation Voltage (AC, 1 minute, R.H. < = 60%) (NOTE1) BVS 1500 Vrms Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). (NOTE1) : Device considered a two-terminal device : LED side pins are shorted together, and DETECTOR side pins are shorted together. RECOMMENDED OPERATING CONDITIONS CHARACTERISTIC SYMBOL Min Typ. Max UNIT Supply Voltage VDD ⎯ ⎯ 160 V Forward Current IF 5 7.5 15 mA On-State Current ION ⎯ ⎯ 50 mA Operating Temperature Topr −20 ⎯ 60 °C Note: Recommended operating conditions are given as a design guideline to obtain expected performance of the device. Additionally, each item is an independent guideline respectively. In developing designs using this product, please confirm specified characteristics shown in this document. CIRCUIT CONNECTIONS 1 6 LOAD 1 6 2 5 AC or DC 2 5 3 4 3 4 A Connection LOAD B Connection 2 DC 1 6 2 5 3 4 LOAD DC C Connection 2007-10-01 TLP199D INDIVIDUAL ELECTRICAL CHARACTERISTICS (Ta = 25°C) DETECTOR LED CHARACTERISTIC SYMBOL TEST CONDITION Min Typ. Max UNIT Forward Voltage VF IF = 10 mA 1.0 1.15 1.3 V Reverse Current IR VR = 5 V ⎯ ⎯ 10 μA Capacitance CT V = 0, f = 1 MHz ⎯ 30 ⎯ pF Off-State Current IOFF VOFF = 160 V ⎯ ⎯ 1 nA Capacitance COFF V = 0, f = 1 MHz ⎯ 15 20 pF Min Typ. Max UNIT COUPLED ELECTRICAL CHARACTERISTICS (Ta = 25°C) CHARACTERISTIC SYMBOL TEST CONDITION Trigger LED Current IFT ION = 50 mA ⎯ 1 3 mA Return LED Current IFC IOFF = 100 μA 0.1 ⎯ ⎯ mA ION = 50 mA, IF = 5 mA ⎯ 40 50 ION = 50 mA, IF = 5 mA ⎯ 30 40 ION = 100 mA, IF = 5 mA ⎯ 15 ⎯ Min Typ. Max UNIT 0.8 ⎯ pF ⎯ Ω A Connection On-State Resistance RON B Connection C Connection Ω ISOLATION CHARACTERISTICS (Ta = 25°C) CHARACTERISTIC SYMBOL Capacitance Input to Output Isolation Resistance TEST CONDITION CS VS = 0 V, f = 1 MHz RS VS = 500 V, R.H. < = 60% ⎯ 5 × 10 BVS 10 14 1500 ⎯ ⎯ AC, 1 second (in oil) ⎯ 3000 ⎯ DC, 1 minute (in oil) ⎯ 3000 ⎯ Vdc Min Typ. Max UNIT ⎯ ⎯ 0.5 ⎯ ⎯ 0.2 AC, 1 minute Isolation Voltage 10 Vrms SWITCHING CHARACTERISTICS (Ta = 25°C) CHARACTERISTIC SYMBOL Turn-on Time tON Turn-off Time tOFF TEST CONDITION RL = 200 Ω VDD = 10 V, IF = 5 mA (NOTE 2) ms (NOTE 2) : SWITCHING TIME TEST CIRCUIT IF 1 6 RL VDD IF 2 VOUT VOUT 4 90% 10% tON 3 tOFF 2007-10-01 TLP199D RESTRICTIONS ON PRODUCT USE 20070701-EN • The information contained herein is subject to change without notice. • TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc. • The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer’s own risk. • The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. • The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. • GaAs(Gallium Arsenide) is used in this product. The dust or vapor is harmful to the human body. Do not break, cut, crush or dissolve chemically. • Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations. 4 2007-10-01