TOSHIBA TC7MP01FK

TC7MP01FK
TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic
TC7MP01FK
Low-Voltage Triple Gate(6-input AND + 4-input OR + inverter)
The TC7MP01FK is a high-performance CMOS triple gate
(6-input AND + 4-input OR + inverter). Desinged for use in
1.8 V, 2.5 V, or 3.3 V systems, it achieves high-speed operation
while maintaining the CMOS low power dissipation.
It is also designed with overvoltage tolerant inputs and outputs
up to 3.6V.
All inputs are equipped with protection circuits against static
discharge.
Weight : 0.03 g (typ.)
Features
•
Low-voltage operation
: VCC = 1.65 to 3.6V
•
Quiescent supply current : ICC = 2μA(max)(Vcc=3.6V)
•
High-speed operation
: 6 input AND
tpd=3.7ns(max)(Vcc=3.3±0.3V)
tpd=5.5ns(max)(Vcc=2.5±0.2V)
tpd=11.0ns(max)(Vcc=1.8±0.15V)
4 input OR
tpd=3.5ns(max)(Vcc=3.3±0.3V)
tpd=5.0ns(max)(Vcc=2.5±0.2V)
tpd=10.0ns(max)(Vcc=1.8±0.15V)
INV.
tpd=3.8ns(max)(Vcc=3.3±0.3V)
tpd=5.2ns(max)(Vcc=2.5±0.2V)
tpd=9.5ns(max)(Vcc=1.8±0.15V)
•
Output current
: IOH/IOL=±12mA(min)(Vcc=3.0V)
: IOH/IOL=±9mA(min)(Vcc=2.3V)
: IOH/IOL=±2mA(min)(Vcc=1.65V)
•
Latch-up performance
: ±300mA
•
ESD performance
: Machine model ≥ ±200 V
Human body model ≥ ±2000 V
•
Ultra-small package
: VSSOP(US16)
•
Power-down protection provided on all inputs and outputs.
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TC7MP01FK
Pin Assighment (top view)
A
IEC Logic Symbol
16
1
Vcc
A
B
2
15
Y1
B
C
C
3
14
H
D
D
E
13
4
5
12
E
I
F
J
F
6
11
Y3
G
7
10
K
GND
8
9
Y2
G
H
I
J
K
1
&
2
3
4
15
Y1
5
6
7
>1
14
13
9
Y2
12
10
11
1
Y3
Truth Table (AND Logic)
A
B
C
D
E
F
Y1
L
x
x
x
x
x
L
x
L
x
x
x
x
L
x
×
L
x
x
x
L
x
×
×
L
x
x
L
x
×
×
×
L
x
L
x
x
x
x
x
L
L
H
H
H
H
H
H
H
Truth Table (OR Logic)
G
H
I
J
Y2
H
x
x
x
H
x
H
x
x
H
x
x
H
x
H
x
x
x
H
H
L
L
L
L
L
Truth Table (INV. Logic)
K
Y3
L
H
H
L
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2007-10-19
TC7MP01FK
Absolute Maximum Ratings (Note 1)
Characteristics
Symbol
Rating
Unit
Power supply voltage
Vcc
-0.5 to 4.6
V
DC input voltage
VIN
-0.5 to 4.6
V
DC output voltage
VOUT
Input diode current
IIK
-50
Output diode current
IOK
±50
DC output current
IOUT
±50
DC Vcc/ground current
ICC/IGND
±100
mA
Power dissipation
PD
180
mW
Storage temperature
Tstg
-65 to 150
℃
-0.5 to 4.6
(Note 2)
-0.5 to Vcc+0.5 (Note 3)
V
mA
(Note 4)
mA
mA
Note 1: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or
even destruction.
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly
even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute
maximum ratings and the operating ranges.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability
test report and estimated failure rate, etc).
Note 2: Vcc=0V
Note 3: High or low state.
Note 4: VOUT<GND, VOUT>Vcc
Operating Ranges (Note 1)
Characteristics
Symbol
Power supply voltage
Vcc
DC input voltage
VIN
DC output voltage
VOUT
Output current
Rating
1.65 to 3.6
1.2 to 3.6 (Note 2)
-0.3 to 3.6
Topr
Input rise and fall time
dt / dv
V
V
0 to 3.6 (Note 3)
0 to Vcc (Note 4)
IOH/IOL
Operating Temperature
Unit
±12
(Note 5)
±9
(Note 6)
±2
(Note 7)
-40 to 85
0 to 10 (Note 8)
V
mA
℃
ns/V
Note 1: The operating ranges must be maintained to ensure the normal operation of the device.
Unused inputs must be tied to either VCC or GND.
Note 2: Data retention only
Note 3: Vcc=0V
Note 4: High or low state
Note 5: Vcc=3.0 to 3.6V
Note 6: Vcc=2.3 to 2.7V
Note 7: Vcc=1.65 to 1.95V
Note 8: VIN=0.8 to 2.0V,Vcc=3.0V
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TC7MP01FK
Electrical Characteristics
DC Characteristics (Ta=-40 to 85℃, 2.7V<Vcc≦3.6V)
Characteristics
Input Voltage
Symbol
Test condition
Vcc(V)
Min
Max
H-level
VIH
-
2.7 to 3.6
2.0
-
L-level
VIL
-
2.7 to 3.6
-
0.8
IOH= -100uA
2.7 to 3.6
Vcc-0.2
-
VIN=
IOH= -6mA
2.7
2.2
-
VIH orVIL
IOH= -9mA
3.0
2.4
-
IOH= -12mA
3.0
2.2
-
IOL= 100uA
2.7 to 3.6
-
0.2
VIN=
IOL= 6mA
2.7
-
0.4
VIH orVIL
IOL= 9mA
3.0
-
0.4
IOL= 12mA
3.0
-
0.55
H-level
V0H
Output voltage
L-level
V0L
Unit
V
V
Input leakage current
IIN
VIN=0 to 3.6V
2.7 to 3.6
-
±2.0
μA
Power-off leakage current
IOFF
VIN,VOUT=0 to 3.6V
0
-
2.0
μA
ICC
VIN=VCC or GND
2.7 to 3.6
-
2.0
μA
2.7 to 3.6
-
750
μA
Quiescent supply current
ΔICC
VIN=VCC-0.6V
(per input)
DC Characteristics (Ta=-40 to 85℃, 2.3V≦Vcc≦2.7V)
Characteristics
Input voltage
Symbol
Test condition
Vcc(V)
Min
Max
H-level
VIH
-
2.3 to 2.7
1.6
-
L-level
VIL
-
2.3 to 2.7
-
0.7
IOH=-100uA
2.3 to 2.7
Vcc-0.2
-
VIN=
IOH= -3mA
2.3
2.0
-
VIH orVIL
IOH= -6mA
2.3
1.8
-
IOH= -9mA
2.3
1.7
-
IOL= 100uA
2.3 to 2.7
-
0.2
IOL= 6mA
2.3
-
0.4
IOL= 9mA
2.3
-
0.6
VIN=0 to 3.6V
2.3 to 2.7
-
±2.0
μA
H-level
V0H
Output voltage
L-level
V0L
Input leakage current
VIN=
VIH orVIL
Unit
V
V
Power-off leakage current
IOFF
VIN,VOUT=0 to 3.6V
0
-
2.0
μA
Quiescent supply current
ICC
VIN=VCC or GND
2.3 to 2.7
-
2.0
μA
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2007-10-19
TC7MP01FK
DC Characteristics (Ta=-40 to 85℃, 1.65V≦Vcc<2.3V)
Characteristics
Input voltage
Symbol
Test condition
Vcc(V)
Min
Max
H-Level
VIH
-
1.65 to 2.3
0.7×Vcc
-
L-Level
VIL
-
1.65 to 2.3
-
0.13×Vcc
H-Level
V0H
Output voltage
L-Level
V0L
VIN=
IOH=-100uA
1.65
Vcc-0.2
-
VIH orVIL
IOH=-2mA
1.65
1.3
-
IOL=2mA
1.65
-
0.2
VIN=
VIH orVIL
Unit
V
V
Input leakage current
IIN
VIN=0 to 3.6V
1.65
-
±2.0
μA
Power-off leakage current
IOFF
VIN,VOUT=0 to 3.6V
0
-
2.0
μA
Quiescent supply current
ICC
VIN=VCC or GND
1.65
-
2.0
μA
Unit
AC Characteristics (Ta=-40 to 85℃,Input: tr=tf=2.0ns, CL=30pF, RL=500Ω)
Characteristics
Symbol
Test condition
6 input AND
Propagation delay time
tpLH
tpHL
4 input OR
Figure 1,
Figure 2
INV.
Output to output skew
tosLH
(Note)
tosHL
Vcc(V)
Min
Max
1.8±0.15
1.0
11.0
2.5±0.2
0.8
5.5
3.3±0.3
0.6
3.7
1.8±0.15
1.0
10.0
2.5±0.2
0.8
5.0
3.3±0.3
0.6
3.5
1.8±0.15
1.0
9.5
2.5±0.2
0.8
5.2
3.3±0.3
0.6
3.8
1.8±0.15
-
0.5
2.5±0.2
-
0.5
3.3±0.3
-
0.5
For CL=50pF, add approximately 300ps to the AC maximum specification.
Note: Parameter guaranteed by design.
(tosLH=|tpLHm-tpLHn|, tosHL=|tpHLm-tpHLn|)
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2007-10-19
ns
ns
TC7MP01FK
Capacitive Characteristics(Ta=25℃)
Characteristics
Symbol
Test Condition
Vcc(V)
Typ.
Unit
Input Capacitance
CIN
-
1.8, 2.5, 3.3
6
pF
1.8, 2.5, 3.3
18
1.8, 2.5, 3.3
17
1.8, 2.5, 3.3
14
6 input AND
Power dissipation capacitance
fin=10MHz
4 input OR
CPD
Table1, (Note)
INV.
pF
Note: CPD is defined as the value of the internal equivalent capacitance which is calculated from the operating
current consumption without load.
Average operating current can be obtained by the equation.
ICC(opr) =CPD・VCC・VIN+ICC/3 (per gate)
Table1 CPD Test Condition
Pin
Function
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
6 input AND
P
H
H
H
H
H
X
G
O
X
O
X
X
X
C
V
4 input OR
X
X
X
X
X
X
P
G
C
X
O
L
L
L
O
V
INV.
X
X
X
X
X
X
X
G
O
P
C
X
X
X
O
V
-Symbol explanationV=VCC(+3.3V)
X=Don’t care(Fixed to VCC or GND)
G=GND(0V)
O=Open
H=Logic1(VCC)
C=Connect a condenser(30pF) between output terminal and GND.
L=Logic0(GND)
P=Input pulse with 50% duty cycle.
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TC7MP01FK
AC Test Circuit
Measure
RL
CL
Output
CL = 30 pF
RL = 500 Ω
Figure 1
AC Waveform
tr 2.0 ns
tf 2.0 ns
VIH
90%
VM
Input
(A)
10%
GND
VOH
VM
Output
(Y)
Symbol
tpLH
tpHL
VOL
Vcc
3.3±0.3V
2.5±0.2V
1.8±0.15V
VIH
2.7V
Vcc
Vcc
VM
1.5V
Vcc/2
Vcc/2
tpLH, tpHL
Figure 2
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TC7MP01FK
Package Dimensions
Weight: 0.03 g (typ.)
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TC7MP01FK
RESTRICTIONS ON PRODUCT USE
20070701-EN GENERAL
• The information contained herein is subject to change without notice.
• TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor
devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical
stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety
in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such
TOSHIBA products could cause loss of human life, bodily injury or damage to property.
In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as
set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and
conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability
Handbook” etc.
• The TOSHIBA products listed in this document are intended for usage in general electronics applications
(computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances,
etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires
extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or
bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or
spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments,
medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his
document shall be made at the customer’s own risk.
• The products described in this document shall not be used or embedded to any downstream products of which
manufacture, use and/or sale are prohibited under any applicable laws and regulations.
• The information contained herein is presented only as a guide for the applications of our products. No responsibility
is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from
its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third
parties.
• Please contact your sales representative for product-by-product details in this document regarding RoHS
compatibility. Please use these products in this document in compliance with all applicable laws and regulations
that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses
occurring as a result of noncompliance with applicable laws and regulations.
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