AD AD53032 High performance driver/comparator active load on a single chip Datasheet

a
High Performance Driver/Comparator
Active Load on a Single Chip
AD53032
FEATURES
250 MHz Operation
Driver/Comparator and Active Load Included
On-Chip Schottky Diode Bridge
52-Lead LQFP Package with Built-in Heatsink
APPLICATIONS
Automatic Test Equipment
Semiconductor Test Systems
Board Test Systems
Instrumentation and Characterization Equipment
FUNCTIONAL BLOCK DIAGRAM
VCC
VCC VCC VCC
51
52
VEE
34
VEE VEE VEE
39
40
41
32
VH 47
39nF
CHDCPL
AD53032
VTERM 45
DATA 37
VHDCPL
DATA 38
39nF
CLDCPL
50V
IOD 43
DRIVER
IOD 42
VOUT
VLDCPL
RLD 49
RLD 50
VL 31
HCOMP
LEH
PRODUCT DESCRIPTION
The AD53032 is a single chip that performs the pin electronics
functions of driver, comparator and active load in ATE VLSI
and memory testers. In addition, a Schottky diode bridge for the
active load and a VCOM buffer are included internally.
The driver is a proprietary design that features three active
states: Data High Mode, Data Low Mode and Term Mode as
well as an Inhibit State. This facilitates the implementation of
high speed active termination. The output voltage range is –3 V
to +8 V to accommodate a wide variety of test devices. The
output leakage is typically less than 250 nA over the entire signal range.
LEH
QH
QHB
COMPARATOR
QL
QL
LEL
LEL
LCOMP
ACTIVE LOAD
VCOMI
IOLC
VCOMS
+1
V/I
IOL
IOLRTN
The dual comparator, with an input range equal to the driver
output range, features built-in latches and ECL-compatible
outputs. The outputs are capable of driving 50 Ω signal lines
terminated to –2 V. Signal tracking capability is upwards of
5 V/ns.
The active load can be set for up to 35 mA load current with
less than a 10 µA linearity error through the entire set range.
IOH, IOL and the buffered VCOM are independently adjustable.
Onboard Schottky diodes provide high speed switching and low
capacitance.
IOHRTN
IOH
INHL 36
INHL 35
IOHC
THERM
1.0mA/K
V/I
NC
9,33,44,46,48
2,5,8
PWRGND
ECLGND
HQGND2
HQGND
NC = NO CONNECT
Also included on the chip is an onboard temperature sensor
whose purpose is to give an indication of the surface temperature of the DCL. This information can be used to measure θJC
and θJA or flag an alarm if proper cooling is lost. Output from
the sensor is a current sink that is proportional to absolute temperature. The gain is trimmed to a nominal value of 1.0 µA/K.
As an example, the output current can be sensed by using a
10 kΩ resistor connected from +10 V to the THERM (IOUT) pin.
A voltage drop across the resistor will be developed that equals:
10K × 1 µA/K = 10 mV/K = 2.98 V at room temperature.
REV. 0
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties
which may result from its use. No license is granted by implication or
otherwise under any patent or patent rights of Analog Devices.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781/329-4700
World Wide Web Site: http://www.analog.com
Fax: 781/326-8703
© Analog Devices, Inc., 1998
AD53032–SPECIFICATIONS
DRIVER SPECIFICATIONS
(All specifications are at TJ = +85ⴗC ⴞ 5ⴗC, +VS = +12 V ⴞ 3%, –VS = –7 V = ⴞ3% unless otherwise noted. All temperature coefficients are
measured at TJ = +75ⴗC to +95ⴗC). CHDCPL = CLDCPL = 39 nF.
Parameter
Min
DIFFERENTIAL INPUT CHARACTERISTICS
(DATA to DATA, IOD to IOD, RLD to RLD)
Input Voltage
Differential Input Range
Bias Current
–2
Max
Units
0
V
–250
+250
µA
VIN = –2 V, 0.0 V
REFERENCE INPUTS
Bias Currents
–50
+50
µA
VL, VH, VT = 5 V
OUTPUT CHARACTERISTICS
Logic High Range
–2
8
V
–3
0.1
5
9
V
V
–50
0.3 – 5
–50
–0.3 – 5
+50
+0.3 + 5
+50
+0.3 + 5
mV
% of VH + mV
mV
% of VL + mV
mV/°C
DATA = H, VH = –2 V to +8 V
VL = –3 V (VH = –2 V to +6 V)
VL = –1 V (VH = +6 V to +8 V)
DATA = L, VL = –3 V to +5 V, VH = +6 V
VL = 0.0 V, VH = +0.1 V, VT = 0 V
VL = –2 V, VH = +7 V, VT = 0 V
DATA = H, VH = 0 V, VL = –3 V, V T = +3 V
DATA = H, VH = –2 V to +8 V, VL = –3 V, VT = +3 V
DATA = L, VL = –3 V, VH = +6 V, VT = +7.5 V
DATA = L, VL = 0 V , VH = +6 V, VT = +7.5 V
VL = 0 V, VH = +5 V, VT = 0 V
48
48
48
48
Ω
Ω
Ω
Ω
Ω
mA
mA
VL = –3 V, VT = 0 V, IOUT = 0, +1, +30 mA
VL = –1 V, VT = 0 V, IOUT = 0, –1, –30 mA
VH = +6 V, VT = 0 V, IOUT = 0, +1, +30 mA
VH = +6 V, VT = 0 V, IOUT = 0, –1, –30 mA
VL = 0 V, VT = 0 V, IOUT = –30 mA (Trim Point)
CBYP = 39 nF, VH = +7 V, VL = –2 V, VT = 0 V
Output to –3 V, VH = +8 V, VL = –1 V, VT = 0 V
DATA = H and Output to +8 V, VH = +6 V,
VL = –3 V, VT = 0 V, DATA = L
V
mV
% of VSET + mV
mV/°C
Ω
TERM MODE, VT = –3 V to +8 V, VL = 0 V, VH = 3 V
TERM MODE, VT = 0 V, VL = 0 V, VH = 3 V
TERM MODE, VT = –3 V to +8 V, VL = 0 V, VH = 3 V
VT = 0 V, VL = 0 V, VH = 3 V
IOUT = +30 mA, +1.0 mA, VT = –3.0 V, VH = 3 V, VL = 0 V
IOUT = –30 mA, –1.0 mA, VT = +8.0 V, VH = 3 V, VL = 0 V
IOUT = ± 30 mA, ±1.0 mA, V T = 0 V, VH = 3 V, VL = 0 V
1.6
2.1
2
<100
ns
ps/°C
ps
Measured at 50%, VH = +400 mV, VL = –400 mV
Measured at 50%, VH = +400 mV, VL = –400 mV
Measured at 50%, VH = +400 mV, VL = –400 mV
0.6
1.0
1.7
3.0
ns
ns
ns
ns
Measured 20%–80%, VL = 0 V, VH = 1 V
Measured 20%–80%, VL = 0 V, VH = 3 V
Measured 10%–90%, VL = 0 V, VH = 5 V
Measured 10%–90%, VL = –2 V, V H = 7 V
±1
±2
±4
ps/°C
ps/°C
ps/°C
% of Step + mV
Measured 20%–80%, VL = 0 V, VH = 1 V
Measured 20%–80%, VL = 0 V, VH = 3 V
Measured 10%–90%, VL = 0 V, VH = 5 V
VL, VH = –0.1 V, 0.1 V, VL, V H = 0.0 V, 1.0 V
VL, VH = 0.0 V, 3.0 V, VL, VH = 0.0 V, 5.0 V
VL, VH = –2.0 V, 7.0 V
ns
µs
VL = 0 V, VH = 0.5 V
VL = 0 V, VH = 0.5 V
Logic Low Range
Amplitude (VH and VL)
Absolute Accuracy
VH Offset
VH Gain + Linearity Error
VL Offset
VL Gain + Linearity Error
Offset TC
Output Resistance
VH = –2 V
VH = +8 V
VL = –3 V
VL = +5 V
VH = +3 V
Dynamic Current Limit
Static Current Limit
Typ
Test Conditions
ECL
0.5
44
44
44
44
46
46
46
46
46
100
–85
+85
–3
–50
–0.3 + 5
8.0
+50
+0.3 + 5
VTERM
Voltage Range
VTERM Offset
VTERM Gain + Linearity Error
Offset TC
Output Resistance
DYNAMIC PERFORMANCE, (VH AND VL)
Propagation Delay Time
Propagation Delay TC
Delay Matching, Edge to Edge
Rise and Fall Times
1 V Swing
3 V Swing
5 V Swing
9 V Swing
Rise and Fall Time Temperature Coefficient
1 V Swing
3 V Swing
5 V Swing
Overshoot and Preshoot
Settling Time
to 15 mV
to 4 mV
44
1.1
0.5
46
–3.0 – 50
49
+3.0 + 50
<50
<10
–2–
REV. 0
AD53032
Parameter
Min
Delay Change vs. Pulsewidth
Minimum Pulsewidth
3 V Swing
5 V Swing
Toggle Rate
DYNAMIC PERFORMANCE, INHIBIT
Delay Time, Active to Inhibit
Delay Time, Inhibit to Active
Typ
Units
Test Conditions
<50
ps
VL = 0 V, VH = 2 V
2
3
250
ns
ns
MHz
VL = 0 V, VH = 3 V, 90% Reached, Measure @ 50%
VL = 0 V, VH = 5 V, 90% Reached, Measure @ 50%
VL = 0 V, VH = 5 V, VDUT > 3.0 V p-p
4.0
3.5
± 1.0
2.2
ns
ns
ns
ns
Measured at 50%, VH = +2 V, VL = –2 V
Measured at 50%, VH = +2 V, VL = –2 V
3.5
2.2
mV, p-p
ns
ns
3.0
5.0
4.0
+3.0 + 75
ns
ns
ns
% of Step + mV
4.0
5.5
ns
ns
dB
1.5
1.5
Delay Time Matching (Z)
I/O Spike
Rise, Fall Time, Active to Inhibit
Rise, Fall Time, Inhibit to Active
DYNAMIC PERFORMANCE , VTERM
Delay Time, VH to VTERM
Delay Time, VL to VTERM
Delay Time, VTERM to VH and VTERM to VL
Overshoot and Preshoot
VTERM Mode Rise Time
VTERM Mode Fall Time
PSRR, DRIVE or TERM Mode
Max
<200
–3.0 + 75
35
Z = Delay Time Active to Inhibit Test (Above)—
Delay Time Inhibit to Active Test (Above)
(Of Worst Two Edges)
VH = 0 V, VL = 0 V
VH = +2 V, VL = –2 V (Measured 20%/80% of 1 V Output)
VH = +2 V, VL = –2 V (Measured 20%/80% of 1 V Output)
Measured at 50%, VL = VH = +0.4 V, VTERM = –0.4 V
Measured at 50%, VL = VH = +0.4 V, VTERM = –0.4 V
Measured at 50%, VL = VH = +0.4 V, VTERM = –0.4 V
VH/VL, V TERM = (+0.4 V, –0.4 V), (0.0 V, –2.0 V),
(0.0 V, +7.0 V)
VL, VH = 0 V, VTERM = –2 V, 20%–80%
VL, VH = 0 V, VTERM = –2 V, 20%–80%
V S = VS ± 3%
Specifications subject to change without notice.
COMPARATOR SPECIFICATIONS
(All specifications are at TJ = +85ⴗC ⴞ 5ⴗC, +VS = +12 V ⴞ 3%, –VS = –7 V = ⴞ3% unless otherwise noted. All temperature coefficients are
measured at TJ = +75ⴗC to +95ⴗC).
Parameter
DC INPUT CHARACTERISTICS
Offset Voltage (VOS)
Offset Voltage (Drift)
HCOMP, LCOMP Bias Current
Voltage Range (VCM)
Differential Voltage (VDIFF)
Gain and Linearity
LATCH ENABLE INPUTS
Logic “1” Current (IIH)
Logic “0” Current (IIL)
DIGITAL OUTPUTS
Logic “1” Voltage (VOH)
Logic “0” Voltage (VOL)
Slew Rate
SWITCHING PERFORMANCE
Propagation Delay
Input to Output
Latch Enable to Output
Propagation Delay Temperature Coefficient
Propagation Delay Change with Respect to
Slew Rate: 0.5 V, 1.0 V, 3.0 V/ns
Slew Rate: 5.0 V/ns
Amplitude: 1.0 V, 3.0 V, 5.0 V
Equivalent Input Rise Time
Pulsewidth Linearity
Settling Time
Latch Timing
Input Pulsewidth
Setup Time
Hold Time
Min
Typ
Max
Units
Test Conditions
25
mV
µV/°C
µA
V
V
% FSR
CMV = 0 V
CMV = 0 V
VIN = 0 V
µA
µA
LE, LE = –0.8 V
LE, LE = –1.8 V
V
V
V/ns
Q or Q, 50 Ω to –2 V
Q or Q, 50 Ω to –2 V
2
2
ns
ns
ps/°C
VIN = 2 V p-p,
HCOMP = +1 V, LCOMP = +1 V
<± 100
<± 350
<± 200
450
<± 200
<25
ps
ps
ps
ps
ps
ns
VIN = 0 V to 5 V
VIN = 0 V to 5 V
VIN = 1.0 V/ns
VIN = 0 V to 3 V, 3 V/ns
VIN = 0 V to 3 V, 3 V/ns, PW = 3 ns–8 ns
Settling to ± 8 mV, VIN = 1 V to 0 V
<1.5
<1.0
<1.0
ns
ns
ns
–25
50
–50
–3
50
8.0
9.0
0.05
–0.05
250
–250
–0.98
–1.5
1
0.9
2.5
Specifications subject to change without notice.
REV. 0
–3–
VIN = –3 V to +8 V
AD53032–SPECIFICATIONS
ACTIVE LOAD SPECIFICATIONS
(All specifications are at TJ = +85ⴗC ⴞ 5ⴗC, +VS = +12 V ⴞ 3%, –VS = –7 V = ⴞ3% unless otherwise noted. All temperature coefficients are
measured at TJ = +75ⴗC to +95ⴗC).
Parameter
INPUT CHARACTERISTICS
INH, INHL
Input Voltage
Bias Current
IOHC Current Program Range
IOH = 0 mA to –35 mA
IOLC Current Program Range
IOL = 0 mA to +35 mA
IOHC, IOLC Input Bias Current
IOLRTN, IOHRTN Range
VDUT Range
VDUT Range, IOH = 0 mA to –35 mA
VDUT Range, IOL = 0 mA to +35 mA
VCOMI Input Range
OUTPUT CHARACTERISTICS
Accuracy
Absolute Accuracy Error, Load Current
VCOM Buffer
Offset Error
Bias Current
Gain Error
Linearity Error
Output Current TC
DYNAMIC PERFORMANCE
Propagation Delay
± IMAX to Inhibit
Inhibit to ± IMAX
Propagation Delay Matching
I/O Spike
Settling Time to 15 mV
Settling Time to 4 mV
Min
Max
Units
Test Conditions
–2
–250
0
250
V
µA
IOHC = +1 V, IOLC = +1 V, VCOM = +2 V, VDUT = 0 V
INHL, INHL = –2 V, 0 V
0
3.5
V
VDUT = –1.7 V, +8 V
0
–300
–3
–3
–1.7
–3
–3
3.5
300
8
8
8
8
8
V
µA
V
V
V
V
V
VDUT = –3 V, +6.7 V
IOLC = 0 V, +3.5 V and IOHC = 0 V, +3.5 V
IOL = +35 mA, IOH = –35 mA, VDUT = –3 V, +8 V
IOL = +35 mA, IOH = –35 mA, IVDUT–VCOMI >1.3 V
VDUT –VCOM > 1.3 V
VCOM–VDUT > 1.3 V
IOL = +35 mA, IOH = –35 mA
–0.4 – 200
+0.4 + 200 % ISET + µA
IOL, IOH = 25 µA–35 mA, VCOM = 0 V, VDUT = ±2 V and
IOL = 25 µA–35 mA, VCOM = +8 V, VDUT = +6.7 V and
IOH = 25 µA–35 mA, VCOM = –3 V, VDUT = –1.7 V
50
10
0.2
10
mV
µA
%
mV
µA/°C
IOL, IOH = 35 mA, VCOMI = 0 V
VCOMI = 0 V
IOL, IOH = 35 mA, VCOMI = –2 V to +7 V
IOL, IOH = 35 mA, VCOMI = –2 V to +7 V
Measured at IOH, IOL = 200 µA
2.5
4.0
1.8
ns
ns
ns
mV
ns
µs
VCOM = ± 3 V, IOL = +20 mA, IOH = –20 mA
VCOM = ± 3 V, IOL = +20 mA, IOH = 20 mA
–50
–10
–0.2
–10
Typ
1
<± 2
0.8
1.5
–1.8
1.5
2.4
<250
<50
<10
VCOM = 0 V, IOL = +20 mA, IOH = –20 mA
IOL = +20 mA, IOH = –20 mA, 50 Ω Load, to 15 mV
IOL = +20 mA, IOH = –20 mA, 50 Ω Load, to 4 mV
Specifications subject to change without notice.
TOTAL FUNCTION SPECIFICATIONS
(All specifications are at TJ = +85ⴗC ⴞ 5ⴗC, +VS = +12 V ⴞ 3%, –VS = –7 V = ⴞ3% unless otherwise noted. All temperature coefficients are
measured at TJ = +75ⴗC to +95ⴗC).
Parameter
Min
OUTPUT CHARACTERISTICS
Output Leakage Current, VOUT = –2 V to +7 V
Output Leakage Current, VOUT = –3 V to +8 V
Output Capacitance
–500
–2
POWER SUPPLIES
Total Supply Range
Positive Supply
Negative Supply
Positive Supply Current
Negative Supply Current
Total Power Dissipation
Temperature Sensor Gain Factor
Typ
Max
Units
Test Conditions
+500
+2
nA
µA
pF
Driver and Load INHIBITED
V
V
V
mA
mA
W
µA/K
Driver = INH , ILOAD Program = 35 mA, Load = Active
Driver = INH , ILOAD Program = 35 mA, Load = Active
Driver = INH , ILOAD Program = 35 mA, Load = Active
RLOAD = 10 kΩ, V SOURCE = +10 V
8
19
12
–7
260
270
5.0
1
NOTES
Connecting or shorting the decoupling pins to ground will result in the destruction of the device.
Specifications subject to change without notice.
–4–
REV. 0
AD53032
Table I. Driver Truth Table
DATA
DATA
IOD
IOD
RLD
RLD
OUTPUT STATE
0
1
X
X
1
0
X
X
1
1
0
0
0
0
1
1
X
X
0
1
X
X
1
0
VL
VH
INH
VTERM
Table II. Comparator Truth Table
VOUT
>HCOMP
>HCOMP
<HCOMP
<HCOMP
X
>LCOMP
<LCOMP
>LCOMP
<LCOMP
X
OUTPUT STATES
QH
QL
LEH
LEH
LEL
LEL
QH
1
1
1
1
0
0
0
0
0
1
1
1
1
1
0
0
0
0
0
1
1
1
0
0
QH (t-1)
0
0
1
1
QH (t-1)
1
0
1
0
QL (t-1)
QL
0
1
0
1
QL (t-1)
Table III. Active Load Truth Table
OUTPUT STATES (Including Diode Bridge)
IOL
I(VOUT)
VDUT
INHL
INHL
IOH
<VCOM
>VCOM
X
0
0
1
1
1
0
V(IOHC) × 10 mA
V(IOHC) × 10 mA
0
REV. 0
–5–
V(IOLC) × 10 mA
V(IOLC) × 10 mA
0
IOL
IOH
0
AD53032
ABSOLUTE MAXIMUM RATINGS 1
Environmental
Operating Temperature (Junction) . . . . . . . . . . . . . .+175°C
Storage Temperature . . . . . . . . . . . . . . . . –65°C to +150°C
Lead Temperature (Soldering, 10 sec)3 . . . . . . . . . . +260°C
Power Supply Voltage
+VS to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +13 V
–VS to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –8 V
+VS to –VS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +20 V
PWR GND to ECL GND or HQ GND . . . . . . . . . . ± 0.4 V
Inputs
DATA, DATA, IOD, IOD, RLD, RLD . . . . . . +5 V, –3 V
DATA to DATA, IOD to IOD, RLD to RLD . . . . . . . ±3 V
LEL, LEL, LEH, LEH . . . . . . . . . . . . . . . . . . . +5 V, –3 V
LEL to LEL, LEH to LEH . . . . . . . . . . . . . . . . . . . . . ±3 V
INHL, INHL . . . . . . . . . . . . . . . . . . . . . . . . . . . +5 V, –3 V
INHL to INHL . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ± 3 V
VH, VL, VTERM, VCOM_I to GND . . . . . . . . +9 V, –4 V
VH to VL . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ± 11 V
(VH–VTERM) and (VTERM – VL) . . . . . . . . . . . . . ± 11 V
IOHC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±6 V
IOLC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±6 V
HCOMP . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +9 V, –4 V
LCOMP . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +9 V, –4 V
HCOMP, LCOMP to VOUT . . . . . . . . . . . . . . . . . . . ± 11 V
Outputs
VOUT Short Circuit Duration . . . . . . . . . . . . . . . .Indefinite2
VOUT Inhibit Mode . . . . . . . . . . . . . . . . . . . . . . . +9 V, –4 V
VHDCPL . . . . . . . . Do Not Connect Except for Cap to VCC
VLDCPL . . . . . . . . Do Not Connect Except for Cap to VEE
QH, QH, QL, QL Maximum IOUT
Continuous . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 50 mA
Surge . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .100 mA
THERM . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +13 V, 0 V
IOHRTN, IOLRTN . . . . . . . . . . . . . . . . . . +8.5 V, –3.5 V
VCOM_S Short Circuit Duration . . . . . . . . . . . . . . . 3 sec2
NOTES
1
Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the
device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Absolute maximum limits apply
individually, not in combination. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
2
Output short circuit protection is guaranteed as long as proper heatsinking is
employed to ensure compliance with the operating temperature limits.
3
To ensure lead coplanarity (± 0.002 inches) and solderability, handling with bare
hands should be avoided and the device should be stored in environments at 24°C
± 5°C (75°F ± 10°F) with relative humidity not to exceed 65%.
Table IV. Package Thermal Characteristics
Air Flow, FM
␪JA, ⴗC/W
0
200
400
33
25
22
ORDERING GUIDE
Model
Package
Description
Shipment Method
Quantity per
Shipping Container
Package
Option
AD53032JSTP
52-Lead LQFP-EDQUAD
90
SQ-52
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection.
Although the AD53032 features proprietary ESD protection circuitry, permanent damage may
occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD
precautions are recommended to avoid performance degradation or loss of functionality.
–6–
WARNING!
ESD SENSITIVE DEVICE
REV. 0
AD53032
VEE
IOD
VEE
PWRGND
IOD
VTERM
VH
PWRGND
PWRGND
RLD
RLD
VCC
VCC
PIN CONFIGURATION
52 51 50 49 48 47 46 45 44 43 42 41 40
39
VCC 1
ECLGND 2
QL 3
PIN 1
IDENTIFIER
DATA
DATA
36 INHL
37
QL 4
ECLGND 5
QH 6
INHL
VCC
33 PWRGND
35
QH 7
ECLGND 8
AD53032
34
HEAT SINK UP
(Not to Scale)
32
VEE
PWRGND 9
31
LEL 10
LEL 11
30
VL
IOLC
LEH 12
LEH 13
28
IOHC
HQGND
27
IOHRTN
29
NC = NO CONNECT
–7–
IOH
VCOMS
VCOMI
IOL
VLDCPL
IOLRTN
VOUT
VHDCPL
HQGND2
HCOMP
LCOMP
NC
THERM
14 15 16 17 18 19 20 21 22 23 24 25 26
REV. 0
VEE
38
AD53032
OUTLINE DIMENSIONS
Dimensions shown in inches and (mm).
52-Lead LQFP–EDQUAD with Integral Heat Slug
(SQ-52)
0.630 (16.00) SQ
C3413–0–11/98
0.063 (1.60)
MAX
0.030 (0.75)
0.024 (0.60)
0.018 (0.45)
0.551 (14.00) SQ
52
40
39
1
SEATING
PLANE
0.270
(6.86)
DIA
TOP VIEW
(PINS DOWN)
STANDOFF
0.004 (0.10)
MAX
27
13
14
26
0.057 (1.45)
0.055 (1.40)
0.053 (1.35)
0.006 (0.15)
0.002 (0.05)
0.008 (0.20)
0.004 (0.09)
0.039 (1.00)
BSC
78
3.58
08
PRINTED IN U.S.A.
0.020 (0.50)
0.017 (0.42)
0.014 (0.35)
CENTER FIGURES ARE TYPICAL UNLESS OTHERWISE NOTED
–8–
REV. 0
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