AD ADXL001 High performance, wide bandwidth accelerometer Datasheet

High Performance,
Wide Bandwidth Accelerometer
ADXL001
Using the Analog Devices, Inc. proprietary fifth-generation
iMEMs® process enables the ADXL001 to provide the desired
dynamic range that extends from ±70 g to ±500 g in combination with 22 kHz of bandwidth. The accelerometer output
channel passes through a wide bandwidth differential-to-singleended converter, which allows access to the full mechanical
performance of the sensor.
FEATURES
High performance accelerometer
±70 g, ±250 g, and ±500 g wideband ranges available
22 kHz resonant frequency structure
High linearity: 0.2% of full scale
Low noise: 4 mg/√Hz
Sensitive axis in the plane of the chip
Frequency response down to dc
Full differential signal processing
High resistance to EMI/RFI
Complete electromechanical self-test
Output ratiometric to supply
Velocity preservation during acceleration input overload
Low power consumption: 2.5 mA typical
8-terminal, hermetic ceramic, LCC package
The part can operate on voltage supplies from 3.3 V to 5 V.
The ADXL001 also has a self-test (ST) pin that can be asserted to
verify the full electromechanical signal chain for the accelerometer
channel.
The ADXL001 is available in the industry-standard 8-terminal
LCC and is rated to work over the extended industrial temperature
range (−40°C to +125°C).
15
APPLICATIONS
12
Vibration monitoring
Shock detection
Sports diagnostic equipment
Medical instrumentation
Industrial monitoring
9
RESPONSE (dB)
6
GENERAL DESCRIPTION
3
0
–3
–6
The ADXL001 is a major advance over previous generations of
accelerometers providing high performance and wide bandwidth.
This part is ideal for industrial, medical, and military applications
where wide bandwidth, small size, low power, and robust
performance are essential.
07510-102
–9
–12
–15
1
10
100
1k
FREQUENCY (Hz)
10k
100k
Figure 1. Sensor Frequency Response
FUNCTIONAL BLOCK DIAGRAM
VS
VDD
ADXL001
TIMING
GENERATOR
VDD2
MOD
DIFFERENTIAL
SENSOR
OUTPUT
AMPLIFIER
DEMOD
AMP
XOUT
COM
ST
07510-001
SELF-TEST
Figure 2.
Rev. A
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781.329.4700
www.analog.com
Fax: 781.461.3113
©2010 Analog Devices, Inc. All rights reserved.
ADXL001
TABLE OF CONTENTS
Features .............................................................................................. 1
Design Principles........................................................................ 11
Applications ....................................................................................... 1
Mechanical Sensor ..................................................................... 11
General Description ......................................................................... 1
Applications Information .............................................................. 12
Functional Block Diagram .............................................................. 1
Application Circuit..................................................................... 12
Revision History ............................................................................... 2
Self-Test ....................................................................................... 12
Specifications..................................................................................... 3
Acceleration Sensitive Axis ....................................................... 12
Specifications for 3.3 V Operation ............................................. 3
Operating Voltages Other Than 5 V ........................................ 12
Specifications for 5 V Operation ................................................ 4
Layout, Grounding, and Bypassing Considerations .................. 13
Recommended Soldering Profile ............................................... 5
Clock Frequency Supply Response .......................................... 13
Absolute Maximum Ratings............................................................ 6
Power Supply Decoupling ......................................................... 13
ESD Caution .................................................................................. 6
Electromagnetic Interference ................................................... 13
Pin Configuration and Function Descriptions ............................. 7
Outline Dimensions ....................................................................... 14
Typical Performance Characteristics ............................................. 8
Ordering Guide .......................................................................... 14
Theory of Operation ...................................................................... 11
REVISION HISTORY
2/10—Rev. 0 to Rev. A
Added -250 and -500 models ............................................ Universal
Changes to Table 1 ............................................................................ 3
Changes to Table 2 ............................................................................ 4
Added Figure 9 through Figure 18 ................................................. 8
Changes to Ordering Guide .......................................................... 14
1/09—Revision 0: Initial Version
Rev. A | Page 2 of 16
ADXL001
SPECIFICATIONS
SPECIFICATIONS FOR 3.3 V OPERATION
TA = −40°C to +125°C, VS = 3.3 V ± 5% dc, acceleration = 0 g, unless otherwise noted.
Table 1.
Parameter
SENSOR
Nonlinearity
Cross-Axis Sensitivity
Resonant Frequency
Quality Factor
SENSITIVITY
Full-Scale Range
Sensitivity
OFFSET
Zero-g Output
NOISE
Noise
Noise Density
FREQUENCY RESPONSE
−3 dB Frequency
−3 dB Frequency Drift
Over Temperature
SELF-TEST
Output Voltage Change
Logic Input High
Logic Input Low
Input Resistance
OUTPUT AMPLIFIER
Output Swing
Capacitive Load
PSRR (CFSR)
POWER SUPPLY (VS)
Functional Range
ISUPPLY
Turn-On Time
Conditions
Min
ADXL001-70
Typ Max
0.2
2
Includes package
alignment
Min
ADXL001-250
Typ Max
2
0.2
2
22
2.5
IOUT ≤ ±100 μA
100 Hz
Ratiometric
−70
+70
10 Hz to 400 Hz
10 Hz to 400 Hz
1.65
−250
1.95
1.35
1.65
0.2
1000
DC to 1 MHz
2
22
2.5
+250
−500
kHz
+500
g
mV/g
1.95
V
2.2
1.95
1.35
1.65
%
%
95
3.65
105
4.25
mg rms
mg/√Hz
32
2
32
2
32
2
kHz
%
62
mV
V
V
kΩ
125
2.1
2.1
0.66
IOUT = ±100 μA
0.2
2
Unit
85
3.3
400
30
2
4.4
2.1
To ground
ADXL001-500
Typ Max
22
2.5
16.0
1.35
Min
50
0.66
30
VS − 0.2
0.2
1000
0.9
3.135
2.5
10
50
0.66
30
VS − 0.2
0.2
1000
0.9
6
5
Rev. A | Page 3 of 16
3.135
2.5
10
50
VS − 0.2
V
pF
V/V
6
5
V
mA
ms
0.9
6
5
3.135
2.5
10
ADXL001
SPECIFICATIONS FOR 5 V OPERATION
TA = -40°C to +125°C, VS = 5 V ± 5% dc, acceleration = 0 g, unless otherwise noted.
Table 2.
Parameter
SENSOR
Nonlinearity
Cross-Axis Sensitivity
Resonant Frequency
Quality Factor
SENSITIVITY
Full-Scale Range
Sensitivity
OFFSET
Zero-g Output
NOISE
Noise
Noise Density
FREQUENCY RESPONSE
−3 dB Frequency
−3 dB Frequency Drift
Over Temperature
SELF-TEST
Output Voltage Change
Logic Input High
Logic Input Low
Input Resistance
OUTPUT AMPLIFIER
Output Swing
Capacitive Load
PSRR (CFSR)
POWER SUPPLY (VS)
Functional Range
ISUPPLY
Turn-On Time
Conditions
Min
ADXL001-70
Typ
Max
0.2
2
Includes package
alignment
Min
ADXL001-250
Typ
Max
2
0.2
2
22
2.5
IOUT ≤ ±100 μA
100 Hz
Ratiometric
−70
+70
10 Hz to 400 Hz
10 Hz to 400 Hz
2.5
−250
3.00
2.00
2.5
0.2
1000
DC to 1 MHz
2
22
2.5
+250
−500
kHz
+500
g
mV/g
3.00
V
3.3
3.00
2.00
2.5
%
%
60
2.35
70
2.76
mg rms
mg/√Hz
32
2
32
2
32
2
kHz
%
217
mV
V
V
kΩ
445
3.3
3.3
0.66
IOUT = ±100 μA
0.2
2
Unit
55
2.15
1435
30
2
6.7
3.3
To ground
ADXL001-500
Typ
Max
22
2.5
24.2
2.00
Min
50
0.66
30
VS − 0.2
0.2
1000
0.9
3.135
4.5
10
50
0.66
30
VS − 0.2
0.2
1000
0.9
6
9
3.135
Rev. A | Page 4 of 16
4.5
10
50
VS − 0.2
V
pF
V/V
6
9
V
mA
ms
0.9
6
9
3.135
4.5
10
ADXL001
RECOMMENDED SOLDERING PROFILE
Table 3. Soldering Profile Parameters
Profile Feature
Average Ramp Rate (TL to TP)
Preheat
Minimum Temperature (TSMIN)
Maximum Temperature (TSMAX)
Time (TSMIN to TSMAX), ts
TSMAX to TL
Ramp-Up Rate
Time Maintained Above Liquidous (tL)
Liquidous Temperature (TL)
Liquidous Time (tL)
Peak Temperature (TP)
Time Within 5°C of Actual Peak Temperature (tP)
Ramp-Down Rate
Time 25°C to Peak Temperature (tPEAK)
Sn63/Pb37
3°C/sec maximum
Pb-Free
3°C/sec maximum
100°C
150°C
60 sec to 120 sec
150°C
200°C
60 sec to 150 sec
3°C/sec
3°C/sec
183°C
60 sec to 150 sec
240°C + 0°C/−5°C
10 sec to 30 sec
6°C/sec maximum
6 minute maximum
217°C
60 sec to 150 sec
260°C + 0°C/−5°C
20 sec to 40 sec
6°C/sec maximum
8 minute maximum
Soldering Profile Diagram
CRITICAL ZONE
TL TO TP
tP
TP
tL
TSMAX
TSMIN
tS
PREHEAT
RAMP-DOWN
tPEAK
TIME (t)
Figure 3. Soldering Profile Diagram
Rev. A | Page 5 of 16
07510-022
TEMPERATURE (T)
RAMP-UP
TL
ADXL001
ABSOLUTE MAXIMUM RATINGS
Table 4.
Parameter
Acceleration (Any Axis, Unpowered and
Powered)
Supply Voltage, VS
Output Short-Circuit Duration (VOUT to GND)
Storage Temperature Range
Operating Temperature Range
Soldering Temperature (Soldering, 10 sec)
Drops onto hard surfaces can cause shocks of greater than
4000 g and can exceed the absolute maximum rating of the
device. Exercise care during handling to avoid damage.
Rating
4000 g
−0.3 V to +7.0 V
Indefinite
−65°C to +150°C
−55°C to +125°C
245°C
ESD CAUTION
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
Rev. A | Page 6 of 16
ADXL001
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
DNC
1
DNC
2
COM
3
8
7
VDD
6
XOUT
5
DNC
4
DNC = DO NOT CONNECT
ST
ADXL001
TOP VIEW
(Not to Scale)
Figure 4. Pin Configuration
Table 5. Pin Function Descriptions
Pin No.
1, 2, 5
3
4
6
7
8
Mnemonic
DNC
COM
ST
XOUT
VDD
VDD2
Description
Do Not Connect.
Common.
Self-Test Control (Logic Input).
X-Axis Acceleration Output.
3.135 V to 6 V. Connect to VDD2.
3.135 V to 6 V. Connect to VDD.
Rev. A | Page 7 of 16
07510-004
VDD2
10
5
0
Figure 7. ADXL001-70, Sensitivity Distribution
(mV/g)
Rev. A | Page 8 of 16
25
20
15
10
5
4.50
4.48
4.46
4.44
4.54
30
4.56
Figure 9: ADXL001-250, Sensitivity Distribution
4.52
(mV/g)
4.54
07510-025
15
4.52
25
4.50
Figure 6. Zero-g Bias Deviation from Ideal (TA = 125°C)
4.48
VOLTS
4.46
5
0
07510-024
10
4.44
15
4.42
20
4.40
VOLTS
4.42
25
4.40
30
4.38
40
4.38
45
4.36
Figure 5. Zero-g Bias Deviation from Ideal
4.36
16.8
16.7
16.6
16.5
16.4
16.3
16.2
16.1
16.0
15.9
15.8
15.7
15.6
15.5
0
07510-008
10
15.4
PERCENT OF POPULATION
20
15.3
15.2
07510-005
30
4.34
35
PERCENT OF POPULATION
0.07
40
4.32
0
4.30
5
07510-006
0.06
0.05
0.04
0.03
0.02
0.01
0
–0.01
–0.02
–0.03
–0.04
–0.05
50
4.34
20
PERCENT OF POPULATION
0.07
0.06
0.05
0.04
0.03
0.02
0.01
0
–0.01
–0.02
–0.03
–0.04
–0.05
–0.07
–0.06
PERCENT OF POPULATION
60
4.32
0
07510-007
–0.07
–0.06
PERCENT OF POPULATION
0
4.30
16.8
16.7
16.6
16.5
16.4
16.3
16.2
16.1
16.0
15.9
15.8
15.7
15.6
15.5
15.4
15.3
15.2
PERCENT OF POPULATION
ADXL001
TYPICAL PERFORMANCE CHARACTERISTICS
VS = 3.3 V, TA = 25°C, unless otherwise noted.
25
20
15
10
5
Figure 8. ADXL001-70, Sensitivity Distribution (TA = 125°C)
(mV/g)
35
30
25
20
15
10
Figure 10: ADXL001-250, Sensitivity Distribution (TA = 125°C)
(mV/g)
25
15
10
5
0
(mV)
Figure 13. ADXL001-70, Self-Test Delta
Rev. A | Page 9 of 16
Figure 12. ADXL001-500, Sensitivity Distribution (TA = 125°C)
56
57
58
59
60
61
62
63
(mA)
Figure 16. ISUPPLY Distribution
64
65
(mV/g)
Figure 15. ADXL001-500, Self-Test Delta
30
25
20
15
10
5
66
67
2.900
(mV)
2.825
07510-010
55
2.750
5
2.675
5
0
07510-029
10
2.600
15
2.525
(mV/g)
2.450
30
2.375
Figure 11. ADXL001-500, Sensitivity Distribution
142
140
138
136
134
132
130
128
126
124
122
120
118
0
07510-028
5
116
10
114
15
PERCENT OF POPULATION
20
112
110
07510-026
25
2.300
20
PERCENT OF POPULATION
2.27
25
2.225
0
07510-027
30
2.150
20
PERCENT OF POPULATION
2.29
2.26
2.25
2.24
2.23
2.22
2.21
2.20
2.19
2.18
2.17
PERCENT OF POPULATION
30
2.075
0
07510-009
2.28
2.27
2.26
2.25
2.24
2.23
2.22
2.21
2.20
2.19
2.18
2.17
PERCENT OF POPULATION
0
2.000
440
435
430
425
420
415
410
405
400
395
390
385
380
375
370
365
360
PERCENT OF POPULATION
ADXL001
20
15
10
5
(mV)
Figure 14. ADXL001-250, Self-Test Delta
40
25
35
30
25
20
15
10
ADXL001
40
30
25
20
15
07510-011
5
07510-012
10
CH1 500mV BW CH2 500mV BW
3.000
2.925
2.850
2.775
2.700
2.625
2.550
2.475
2.400
2.325
2.250
2.175
0
2.100
PERCENT OF POPULATION
35
T
M10.0µs
42.80%
A CH2
1.38V
(mA)
Figure 18. Turn-On Characteristic (10 μs per DIV)
Figure 17. ISUPPLY at 125°C
Rev. A | Page 10 of 16
ADXL001
THEORY OF OPERATION
DESIGN PRINCIPLES
MECHANICAL SENSOR
The ADXL001 accelerometer provides a fully differential sensor
structure and circuit path for excellent resistance to EMI/RFI
interference.
The ADXL001 is built using the Analog Devices SOI MEMS
sensor process. The sensor device is micromachined in-plane
in the SOI device layer. Trench isolation is used to electrically
isolate, but mechanically couple, the differential sensing elements.
Single-crystal silicon springs suspend the structure over the
handle wafer and provide resistance against acceleration forces.
MOVABLE
FRAME
PLATE
CAPACITORS
UNIT
SENSING
CELL
FIXED
PLATES
UNIT
FORCING
CELL
MOVING
PLATE
ANCHOR
Figure 19. Simplified View of Sensor Under Acceleration
Rev. A | Page 11 of 16
07510-019
Figure 19 is a simplified view of one of the differential sensor
cell blocks. Each sensor block includes several differential
capacitor unit cells. Each cell is composed of fixed plates attached
to the device layer and movable plates attached to the sensor
frame. Displacement of the sensor frame changes the differential
capacitance. On-chip circuitry measures the capacitive change.
ANCHOR
ACCELERATION
This latest generation SOI MEMS device takes advantage
of mechanically coupled but electrically isolated differential
sensing cells. This improves sensor performance and size
because a single proof mass generates the fully differential
signal. The sensor signal conditioning also uses electrical
feedback with zero-force feedback for improved accuracy
and stability. This force feedback cancels out the electrostatic
forces contributed by the sensor circuitry.
ADXL001
APPLICATIONS INFORMATION
APPLICATION CIRCUIT
ACCELERATION SENSITIVE AXIS
Figure 20 shows the standard application circuit for the ADXL001.
Note that VDD and VDD2 should always be connected together.
The output is shown connected to a 1000 pF output capacitor
for improved EMI performance and can be connected directly
to an ADC input. Use standard best practices for interfacing
with an ADC and do not omit an appropriate antialiasing filter.
The ADXL001 is an x-axis acceleration and vibration-sensing
device. It produces a positive-going output voltage for vibration
toward its Pin 8 marking.
CVDD
0.1µF
VDD2
VDD
8
DNC
1
2
COM
Figure 21. XOUT Increases with Acceleration in the Positive X-Axis Direction
7
ADXL001
DNC
07510-002
VS
PIN 8
TOP VIEW
(Not to Scale)
3
OPERATING VOLTAGES OTHER THAN 5 V
XOUT
6
5
COUT
1nF
DNC
XOUT
The ADXL001 is specified at VS = 3.3 V and VS = 5 V. Note that
some performance parameters change as the voltage is varied.
4
In particular, the XOUT output exhibits ratiometric offset and
sensitivity with supply. The output sensitivity (or scale factor) scales
proportionally to the supply voltage. At VS = 3.3 V, the output
sensitivity is typically 16 mV/g. At VS = 5 V, the output sensitivity
is nominally 24.2 mV/g. XOUT zero-g bias is nominally equal to
VS/2 at all supply voltages.
SELF-TEST
The fixed fingers in the forcing cells are normally kept at the
same potential as that of the movable frame. When the digital
self-test input is activated, the ADXL001 changes the voltage on
the fixed fingers in these forcing cells on one side of the moving
plate. This potential creates an attractive electrostatic force, causing
the sensor to move toward those fixed fingers. The entire signal
channel is active; therefore, the sensor displacement causes a
change in XOUT. The ADXL001 self-test function verifies proper
operation of the sensor, interface electronics, and accelerometer
channel electronics.
Do not expose the ST pin to voltages greater than VS + 0.3 V. If
this cannot be guaranteed due to the system design (for instance, if
there are multiple supply voltages), then a low VF clamping
diode between ST and VS is recommended.
3.5
3.0
NOMINAL ZERO-g
HIGH LIMIT
2.5
2.0
LOW LIMIT
1.5
1.0
3.2
07510-016
Figure 20. Application Circuit
ZERO-g BIAS (V)
DNC = DO NOT CONNECT
07510-023
ST
ST
3.7
4.2
4.7
5.2
5.7
SUPPLY VOLTAGE (V)
Figure 22. Typical Zero-g Bias Levels Across Varying Supply Voltages
Self-test response in gravity is roughly proportional to the cube
of the supply voltage. For example, the self-test response for the
ADXL001-70 at VS = 5 V is approximately 1.4 V. At VS = 3.3 V,
the self-test response for the ADXL001-70 is approximately
400 mV. To calculate the self-test value at any operating voltage
other than 3.3 V or 5 V, the following formula can be applied:
(STΔ @ VX) = (STΔ @ VS) × (VX/VS)3
where:
VX is the desired supply voltage.
VS is 3.3 V or 5 V.
Rev. A | Page 12 of 16
ADXL001
LAYOUT, GROUNDING, AND BYPASSING CONSIDERATIONS
CLOCK FREQUENCY SUPPLY RESPONSE
In any clocked system, power supply noise near the clock
frequency may have consequences at other frequencies. An
internal clock typically controls the sensor excitation and the
signal demodulator for micromachined accelerometers.
If the power supply contains high frequency spikes, they may be
demodulated and interpreted as acceleration signals. A signal
appears at the difference between the noise frequency and the
demodulator frequency. If the power supply noise is 100 Hz
away from the demodulator clock, there is an output term at
100 Hz. If the power supply clock is at exactly the same frequency
as the accelerometer clock, the term appears as an offset. If the
difference frequency is outside the signal bandwidth, the output
filter attenuates it. However, both the power supply clock and
the accelerometer clock may vary with time or temperature,
which can cause the interference signal to appear in the output
filter bandwidth.
The ADXL001 addresses this issue in two ways. First, the high
clock frequency, 125 kHz for the output stage, eases the task of
choosing a power supply clock frequency such that the difference
between it and the accelerometer clock remains well outside the
filter bandwidth. Second, the ADXL001 has a fully differential
signal path, including a pair of electrically isolated, mechanically
coupled sensors. The differential sensors eliminate most of the
power supply noise before it reaches the demodulator. Good
high frequency supply bypassing, such as a ceramic capacitor
close to the supply pins, also minimizes the amount of interference.
The clock frequency supply response (CFSR) is the ratio of the
response at the output to the noise on the power supply near the
accelerometer clock frequency or its harmonics. A CFSR of 0.9 V/V
means that the signal at the output is half the amplitude of the
supply noise. This is analogous to the power supply rejection
ratio (PSRR), except that the stimulus and the response are at
different frequencies.
POWER SUPPLY DECOUPLING
For most applications, a single 0.1 μF capacitor, CDC, adequately
decouples the accelerometer from noise on the power supply.
However, in some cases, particularly where noise is present at
the 1 MHz internal clock frequency (or any harmonic thereof),
noise on the supply can cause interference on the ADXL001
output. If additional decoupling is needed, a 50 Ω (or smaller)
resistor or ferrite bead can be inserted in the supply line.
Additionally, a larger bulk bypass capacitor (in the 1 μF to
4.7 μF range) can be added in parallel to CDC.
ELECTROMAGNETIC INTERFERENCE
The ADXL001 can be used in areas and applications with high
amounts of EMI or with components susceptible to EMI emissions.
The fully differential circuitry of the ADXL001 is designed to be
robust to such interference. For improved EMI performance,
especially in automotive applications, a 1000 pF output capacitor is
recommended on the XOUT output.
Rev. A | Page 13 of 16
ADXL001
OUTLINE DIMENSIONS
0.094
0.078
0.062
0.22
0.15
0.08
(R 4 PLCS)
0.030
0.020 DIA
0.010
1
7
0.183
0.177 SQ
0.171
R 0.008
(4 PLCS)
0.055
0.050
0.045
(PLATING OPTION 1,
SEE DETAIL A
FOR OPTION 2)
0.108
0.100
0.092
0.075 REF
R 0.008
(8 PLCS)
TOP VIEW
0.010
0.006
0.002
5
3
BOTTOM VIEW
0.082
0.070
0.058
0.019 SQ
DETAIL A
(OPTION 2)
111808-C
0.208
0.197 SQ
0.188
0.031
0.025
0.019
Figure 23. 8-Terminal Ceramic Leadless Chip Carrier [LCC]
(E-8-1)
Dimensions shown in inches
ORDERING GUIDE
Model 1
ADXL001-70BEZ
ADXL001-70BEZ-R7
ADXL001-250BEZ
ADXL001-250BEZ-R7
ADXL001-500BEZ
ADXL001-500BEZ-R7
EVAL-ADXL001-250Z
EVAL-ADXL001-500Z
EVAL-ADXL001-70Z
1
Temperature Range
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
g Range
±70 g
±70 g
±250 g
±250 g
±500 g
±500 g
Z = RoHS Compliant Part.
Rev. A | Page 14 of 16
Package Description
8-Terminal LCC
8-Terminal LCC
8-Terminal LCC
8-Terminal LCC
8-Terminal LCC
8-Terminal LCC
Evaluation Board
Evaluation Board
Evaluation Board
Package Option
E-8-1
E-8-1
E-8-1
E-8-1
E-8-1
E-8-1
ADXL001
NOTES
Rev. A | Page 15 of 16
ADXL001
NOTES
©2010 Analog Devices, Inc. All rights reserved. Trademarks and
registered trademarks are the property of their respective owners.
D07510-0-2/10(A)
Rev. A | Page 16 of 16