ADS7887M SLAS750A – JUNE 2011 – REVISED JUNE 2011 www.ti.com 10-BIT 1.25-MSPS MICRO-POWER MINIATURE SAR ANALOG-TO-DIGITAL CONVERTER Check for Samples: ADS7887M FEATURES xxxxxx xxxxxx 1 • • • • • • • • • • • • 1.25-MHz Sample Rate Serial Device 10-Bit Resolution Zero Latency 25-MHz Serial Interface Supply Range: 2.35 V to 5.25 V Typical Power Dissipation at 1.25 MSPS: – 3.8 mW at 3-V VDD – 8 mW at 5-V VDD ±0.35 LSB INL, DNL 61-dB SINAD, –84-dB THD Unipolar Input Range: 0 V to VDD Power Down Current: 10 µA Max Wide Input Bandwidth: 15 MHz at 3 dB 6-Pin SOT23 Package APPLICATIONS • • • • • • • • Base Band Converters in Radio Communication Motor Current/Bus Voltage Sensors in Digital Drives Optical Networking (DWDM, MEMS Based Switching) Optical Sensors Battery Powered Systems Medical Instrumentations High-Speed Data Acquisition Systems High-Speed Closed-Loop Systems DESCRIPTION The ADS7887 is a 10-bit 1.25-MSPS analog-to-digital converter (ADC). The device includes a capacitor-based SAR A/D converter with inherent sample and hold. The serial interface is controlled by the CS and SCLK signals for glueless connections with microprocessors and DSPs. The input signal is sampled with the falling edge of CS, and SCLK is used for conversion and serial data output. The device operates from a wide supply range from 2.35 V to 5.25 V. The low power consumption of the device makes it suitable for battery-powered applications. The device also includes a power-saving powerdown feature for when the device is operated at lower conversion speeds. The high level of the digital input to the device is not limited to device VDD. This means the digital input can go as high as 5.25 V when device supply is 2.35 V. This feature is useful when digital signals are coming from other circuits with different supply levels. Also, this relaxes restriction on power-up sequencing. The ADS7887 is available in a 6-pin SOT23 package and is specified for operation from –55°C to 125°C. 1 Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Copyright © 2011, Texas Instruments Incorporated ADS7887M SLAS750A – JUNE 2011 – REVISED JUNE 2011 www.ti.com This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. ORDERING INFORMATION (1) PACKAGE (2) TA –55°C to 125°C (1) (2) SOT-23 – DBV Reel of 250 ORDERABLE PART NUMBER TOP-SIDE MARKING ADS7887MDBVT BCNM For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI web site at www.ti.com. Package drawings, thermal data, and symbolization are available at www.ti.com/packaging. SAR +IN CDAC OUTPUT LATCHES AND 3-STATE DRIVERS SDO COMPARATOR VDD CONVERSION AND CONTROL LOGIC SCLK CS ABSOLUTE MAXIMUM RATINGS (1) –0.3 V to +VDD +0.3 V +IN to AGND +VDD to AGND –0.3 V to 7.0 V Digital input voltage to GND –0.3V to (7.0 V) –0.3 V to (+VDD + 0.3 V) Digital output to GND Operating temperature range –55°C to 125°C Storage temperature range –65°C to 150°C Junction temperature (TJ Max) 150°C Power dissipation (TJ Max–TA)/θJA θJA Thermal impedance (2) Lead temperature, soldering (1) (2) 2 295.2°C/W Vapor phase (60 sec) 215°C Infrared (15 sec) 220°C Stresses above those listed under absolute maximum ratings may cause permanent damage to the device. Exposure to absolute maximum conditions for extended periods may affect device reliability. The package thermal impedance is calculated in accordance with JESD 51-7, except for through-hole packages, which use a trace length of zero. Submit Documentation Feedback Copyright © 2011, Texas Instruments Incorporated Product Folder Link(s): ADS7887M ADS7887M SLAS750A – JUNE 2011 – REVISED JUNE 2011 www.ti.com ELECTRICAL SPECIFICATIONS +VDD = 2.35 V to 5.25 V, TA = –55°C to 125°C, fsample = 1.25 MHz PARAMETER TEST CONDITIONS MIN TYP MAX UNIT 0 VDD V –0.20 VDD+0.20 ANALOG INPUT Full-scale input voltage span (1) Absolute input voltage range Ci Input capacitance (2) IIlkg Input leakage current +IN TA = 125°C V 21 pF 40 nA 10 Bits SYSTEM PERFORMANCE Resolution No missing codes 10 Bits INL Integral nonlinearity –1.2 ±0.35 1.2 LSB (3) DNL Differential nonlinearity –1 (4) ±0.35 1.35 LSB –2.5 ±0.5 2.5 LSB –2 ±0.5 2 LSB 530 560 (5) (6) (7) EO Offset error EG Gain error (6) SAMPLING DYNAMICS Conversion time 25-MHz SCLK Acquisition time Maximum throughput rate ns 260 ns 25-MHz SCLK 1.25 MHz Aperture delay 5 ns Step response 160 ns Overvoltage recovery 160 ns DYNAMIC CHARACTERISTICS THD Total harmonic distortion (8) 100 kHz SINAD Signal-to-noise and distortion 100 kHz 59 61 SFDR Spurious free dynamic range 100 kHz 70 81 dB Full power bandwidth At –3 dB 15 MHz –84 –67 dB dB DIGITAL INPUT/OUTPUT Logic family — CMOS VDD = 2.35 V to 5.25 V VIH High-level input voltage VIL Low-level input voltage VOH High-level output voltage At Isource = 200 µA VOL Low-level output voltage At Isink = 200 µA VDD – 0.4 5.25 VDD = 5 V 0.8 VDD = 3 V 0.4 VDD–0.2 0.4 V V V POWER SUPPLY REQUIREMENTS +VDD Supply voltage Supply current (normal mode) Power-down state supply current Power dissipation at 1.25 MHz throughput (1) (2) (3) (4) (5) (6) (7) (8) 2.35 3.3 At VDD = 2.35 V to 5.25 V, 1.25-MHz throughput 5.25 2 At VDD = 2.35 V to 5.25 V, static state 1.5 SCLK off 10 SCLK on (25 MHz) 200 VDD = 5 V 8 10 VDD = 3 V 3.8 6 V mA µA mW Ideal input span; does not include gain or offset error. Refer Figure 21 for details on sampling circuit LSB means least significant bit Exclusive Measured relative to an ideal full-scale input Offset error and gain error ensured by characterization. First transition of 000H to 001H at 0.5 × (Vref/210) Calculated on the first nine harmonics of the input frequency Submit Documentation Feedback Copyright © 2011, Texas Instruments Incorporated Product Folder Link(s): ADS7887M 3 ADS7887M SLAS750A – JUNE 2011 – REVISED JUNE 2011 www.ti.com ELECTRICAL SPECIFICATIONS (continued) +VDD = 2.35 V to 5.25 V, TA = –55°C to 125°C, fsample = 1.25 MHz PARAMETER Power dissipation in static state TEST CONDITIONS MIN TYP MAX VDD = 5 V 5.5 7.5 VDD = 3 V 3 4.5 UNIT mW Power down time 0.1 µs Power up time 0.8 µs Invalid conversions after power up 1 TEMPERATURE RANGE –55 Specified performance °C 125 TIMING REQUIREMENTS (see Figure 1) All specifications typical at TA = –55°C to 125°C, VDD = 2.35 V to 5.25 V, unless otherwise specified. TEST CONDITIONS (1) PARAMETER tconv Conversion time tq Minimum quiet time needed from bus 3-state to start of next conversion td1 Delay time, CS low to first data (0) out tsu1 Setup time, CS low to SCLK low td2 Delay time, SCLK falling to SDO th1 Hold time, SCLK falling to data valid (2) td3 Delay time, 16th SCLK falling edge to SDO 3-state tw1 Pulse duration, CS td4 Delay time, CS high to SDO 3-state twH Pulse duration, SCLK high twL Pulse duration, SCLK low Frequency, SCLK td5 Delay time, second falling edge of clock and CS to enter in powerdown (use minimum specification to avoid accidently entering powerdown) Figure 2 td6 (1) (2) 4 MIN TYP MAX UNIT VDD = 3 V 14 × tSCLK VDD = 5 V 14 × tSCLK VDD = 3 V 40 VDD = 5 V 40 ns VDD = 3 V 15 25 VDD = 5 V 13 25 VDD = 3 V 10 VDD = 5 V 10 15 25 VDD = 5 V 13 25 7 VDD > 5 V 5.5 10 25 VDD = 5 V 8 20 VDD = 3 V 25 40 VDD = 5 V 25 40 17 30 VDD = 5 V 15 25 0.4 × tSCLK 0.4 × tSCLK VDD = 3 V 0.4 × tSCLK VDD = 5 V 0.4 × tSCLK ns ns VDD = 3 V VDD = 5 V ns ns VDD = 3 V VDD = 3 V ns ns VDD = 3 V VDD < 3 V ns ns ns ns VDD = 3 V 25 VDD = 5 V 25 VDD = 3 V -2 5 VDD = 5 V -2 5 Delay time, CS and 10th falling edge of clock to enter in VDD = 3 V powerdown (use maximum specification to avoid VDD = 5 V accidently entering powerdown) Figure 2 2 -5 2 -5 MHz ns ns 3-V Specifications apply from 2.35 V to 3.6 V, and 5-V specifications apply from 4.75 V to 5.25 V. With 50-pf load. Submit Documentation Feedback Copyright © 2011, Texas Instruments Incorporated Product Folder Link(s): ADS7887M ADS7887M SLAS750A – JUNE 2011 – REVISED JUNE 2011 www.ti.com DEVICE INFORMATION SOT23 PACKAGE (TOP VIEW) VDD 1 6 CS GND 2 5 SDO VIN 3 4 SCLK TERMINAL FUNCTIONS TERMINAL NAME I/O NO. DESCRIPTION VDD 1 – Power supply input also acts like a reference voltage to ADC. GND 2 – Ground for power supply, all analog and digital signals are referred with respect to this pin. VIN 3 I Analog signal input SCLK 4 I Serial clock SDO 5 O Serial data out CS 6 I Chip select signal, active low NORMAL OPERATION The cycle begins with the falling edge of CS. This point is indicated as a in Figure 1. With the falling edge of CS, the input signal is sampled and the conversion process is initiated. The device outputs data while the conversion is in progress. The data word contains 4 leading zeros, followed by 10-bit data in MSB first format and padded by 2 lagging zeros. The falling edge of CS clocks out the first zero, and a zero is clocked out on every falling edge of the clock until the third edge. Data is in MSB first format with the MSB being clocked out on the 4th falling edge. Data is padded with two lagging zeros as shown in Figure 1. On the 16th falling edge of SCLK, SDO goes to the 3-state condition. The conversion ends on the 14th falling edge of SCLK. The device enters the acquisition phase on the first rising edge of SCLK after the 13th falling edge. This point is indicated by b in Figure 1. CS can be asserted (pulled high) after 16 clocks have elapsed. Do not start the next conversion by pulling CS low until the end of the quiet time (tq) after SDO goes to 3-state. To continue normal operation, do not pull CS high until point b. Without this, the device does not enter the acquisition phase and no valid data is available in the next cycle. (Also refer to power down mode for more details.) CS going high any time after the conversion start aborts the ongoing conversion and SDO goes to 3-state. The high level of the digital input to the device is not limited to device VDD. This means the digital input can go as high as 5.25 V when the device supply is 2.35 V. This feature is useful when digital signals are coming from another circuit with different supply levels. Also, this relaxes the restriction on power up sequencing. However, the digital output levels (VOH and VOL) are governed by VDD as listed in the SPECIFICATIONS table. a tconv tw1 b CS tsu1 1 SCLK 4 0 13 6 5 15 14 16 th1 td2 td1 SDO 2 0 0 D9 td3 D8 D1 D0 0 0 tq 1/throughput Figure 1. Interface Timing Diagram Submit Documentation Feedback Copyright © 2011, Texas Instruments Incorporated Product Folder Link(s): ADS7887M 5 ADS7887M SLAS750A – JUNE 2011 – REVISED JUNE 2011 www.ti.com POWER-DOWN MODE The device enters power down mode if CS goes high anytime after the second SCLK falling edge to before the tenth SCLK falling edge. Ongoing conversion stops and SDO goes to 3-state under this power-down condition as shown in Figure 2. td6 td5 CS 1 2 3 4 5 9 10 16 SCLK SDO Figure 2. Entering Power Down Mode A dummy cycle with CS low for more than ten SCLK falling edges brings the device out of power-down mode. For the device to come to the fully powered up condition it takes 0.8 µs. CS can be pulled high any time after the 10th falling edge as shown in Figure 3. It is not necessary to continue until the 16th clock if the next conversion starts 0.8 µs after CS going low of the dummy cycle and the quiet time (tq) condition is met. Device Starts Powering Up Device Fully Powered-Up CS SCLK 1 SDO 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 1 2 3 4 5 6 Invalid Data 7 8 9 10 11 12 13 14 15 16 Valid Data Figure 3. Exiting Power Down Mode 6 Submit Documentation Feedback Copyright © 2011, Texas Instruments Incorporated Product Folder Link(s): ADS7887M ADS7887M SLAS750A – JUNE 2011 – REVISED JUNE 2011 www.ti.com TYPICAL CHARACTERISTICS SUPPLY CURRENT vs SUPPLY VOLTAGE SUPPLY CURRENT vs SCLK FREQUENCY 1.80 1.8 1255C 1.4 −405C 1.3 1.2 1.40 1.20 2.35 V VDD 1 0.80 0.60 1 0.8 0.6 0.4 0.40 1.1 0.2 0.20 1 2.35 3.075 3.8 4.525 0 0 5.25 0 5 10 15 20 fSCLK − SCLK Frequency − MHz VDD − Supply Voltage − V 100 150 200 250 300 350 400 SIGNAL-TO-NOISE AND DISTORTION vs INPUT FREQUENCY SIGNAL-TO-NOISE AND DISTORTION vs SUPPLY VOLTAGE −10 @ 0 V Input −20 −30 61.7 61.5 61.3 61.1 60.9 60.7 60.5 −40 −40 −20 20 60 80 100 0 40 TA − Free-Air Temperature − 5C SINAD − Signal-to-Noise and Distortion − dB SINAD − Signal-to-Noise and Distortion − dB 0 62 fs = 1.25 MSPS, TA = 255C, VDD = 5 V 61.9 1 10 100 fi − Input Frequency − kHz 120 450 fs − Sample Rate − KSPS ANALOG INPUT LEAKAGE CURRENT vs FREE-AIR TEMPERATURE @ 5 V Input fs = 1.25 MSPS, fi = 100 kHz, TA = 255C 61.9 61.8 61.7 61.6 61.5 61.4 61.3 61.2 61.1 61 2.35 1000 3.075 3.8 4.525 VDD − Supply Voltage − V 5.25 Figure 7. Figure 8. Figure 9. TOTAL HARMONIC DISTORTION vs INPUT FREQUENCY TOTAL HARMONIC DISTORTION vs SUPPLY VOLTAGE SPURIOUS FREE DYNAMIC RANGE vs INPUT FREQUENCY 85 −80 THD − Total Harmonic Distortion − dB −81 −82 −83 −84 −85 −86 −87 −88 −89 fs = 1.25 MSPS, fi = 100 kHz, TA = 255C SFDR − Spurious Free Dynamic Range − dB fs = 1.25 MSPS, TA = 255C, VDD = 5 V −82 −83 −84 −85 −86 −87 −88 −89 −90 −90 1 50 Figure 6. 10 −81 0 Figure 5. 20 −80 25 Figure 4. 30 Leakage Current − nA I DD − Supply Current − mA 255C VDD = 5 V, fSCLK = 25 MHz, TA = 255C, Power Down SCLK = Free Running 1.2 5 V VDD I DD − Supply Current − mA I DD − Supply Current − mA 1.60 1.6 1.5 1.4 TA = 255C fs = 1.25 MSPS, fSCLK = 25 MHz 1.7 THD − Total Harmonic Distortion − dB SUPPLY CURRENT vs SAMPLE RATE 10 fi − Input Frequency − kHz 100 Figure 10. 2.35 3.075 3.8 4.525 VDD − Supply Voltage − V Figure 11. 5.25 fs = 1.25 MSPS, TA = 255C, VDD = 5 V 84.5 84 83.5 83 82.5 82 81.5 81 80.5 80 1 10 Figure 12. Submit Documentation Feedback Copyright © 2011, Texas Instruments Incorporated Product Folder Link(s): ADS7887M 100 fi − Input Frequency − kHz 7 ADS7887M SLAS750A – JUNE 2011 – REVISED JUNE 2011 www.ti.com TYPICAL CHARACTERISTICS (continued) SPURIOUS FREE DYNAMIC RANGE vs SUPPLY VOLTAGE OFFSET ERROR vs SUPPLY VOLTAGE 1 1 fs = 1.25 MSPS, fi = 100 kHz, TA = 255C 84.5 0.8 fs = 1.25 MSPS, TA = 255C 0.8 0.6 83.5 83 82.5 82 81.5 0.4 0.2 0 −0.2 −0.4 81 −0.6 80.5 −0.8 80 2.35 3.8 3.075 4.525 VDD − Supply Voltage − V 5.25 −1 2.35 −0.4 −1 −40 5.25 −20 0 20 40 60 80 100 120 TA − Free-Air Temperature − °C Figure 15. GAIN ERROR vs FREE-AIR TEMPERATURE 1 fs = 1.25 MSPS, TA = 255C 0.8 0.6 fs = 1.25 MSPS, VDD = 5 V 0.6 E G − Gain Error − LSBs E G − Gain Error − LSBs 0 −0.2 Figure 14. 1 8 0.2 −0.8 3.075 3.8 4.525 VDD − Supply Voltage − V GAIN ERROR vs SUPPLY VOLTAGE 0.4 0.2 0 −0.2 −0.4 0.4 0.2 0 −0.2 −0.4 −0.6 −0.6 −0.8 −0.8 −1 2.35 0.4 −0.6 Figure 13. 0.8 fs = 1.25 MSPS, VDD = 5 V 0.6 E O − Offset Error − LSBs 84 E O − Offset Error − LSBs SFDR − Spurious Free Dynamic Range − dB 85 OFFSET ERROR vs FREE-AIR TEMPERATURE 3.075 3.8 4.525 VDD − Supply Voltage − V Figure 16. 5.25 −1 −40 −20 Submit Documentation Feedback 0 20 40 60 80 100 120 TA − Free-Air Temperature − °C Figure 17. Copyright © 2011, Texas Instruments Incorporated Product Folder Link(s): ADS7887M ADS7887M SLAS750A – JUNE 2011 – REVISED JUNE 2011 www.ti.com TYPICAL CHARACTERISTICS (continued) DNL DNL − LSBs 0.5 0.4 0.3 VDD = 2.35 V, fs = 1.25 MSPS, TA = 255C 0.2 0.1 0 −0.1 −0.2 −0.3 −0.4 −0.5 0 256 512 768 1024 768 1024 Output Code Figure 18. INL − LSBs INL 0.5 0.4 0.3 0.2 0.1 VDD = 2.35 V, fs = 1.25 MSPS, TA = 255C 0 −0.1 −0.2 −0.3 −0.4 −0.5 0 256 512 Output Code Figure 19. FFT 0 VDD = 2.35 V, fs = 1.25 MSPS, TA = 255C fi = 100 kHz, 8192 Points Amplitude − dB −20 −40 −60 −80 −100 −120 −140 0 125000 250000 375000 fi − Input Frequency − kHz 500000 625000 Figure 20. Submit Documentation Feedback Copyright © 2011, Texas Instruments Incorporated Product Folder Link(s): ADS7887M 9 ADS7887M SLAS750A – JUNE 2011 – REVISED JUNE 2011 www.ti.com APPLICATION INFORMATION VDD 20 W 60 W IN 16 pF 60 W 5 pF GND Figure 21. Typical Equivalent Sampling Circuit Driving the VIN and VDD Pins The VIN input to the ADS7887 should be driven with a low-impedance source. In most cases, additional buffers are not required. In cases where the source impedance exceeds 200 Ω, using a buffer helps achieve the rated performance of the converter. The THS4031 is a good choice for the driver amplifier buffer. The reference voltage for the ADS7887 A/D converter is derived internally from the supply voltage. The device offer limited low-pass filtering functionality on-chip. The supply to the converter should be driven with a low-impedance source and should be decoupled to ground. A 1-µF storage capacitor and a 10-nF decoupling capacitor should be placed close to the device. Wide low-impedance traces should be used to connect the capacitor to the pins of the device. The ADS7887 draws very little current from the supply lines. The supply line can be driven: • Directly from the system supply. • From a reference output from a low-drift and low-dropout reference voltage generator like REF3030 or REF3130. The ADS7887 can operate off a wide range of supply voltages. The actual choice of the reference voltage generator depends upon the system. Figure 23 shows one possible application circuit. • A low-pass filtered version of the system supply followed by a buffer such as the zero-drift OPA735 can also be used in cases where the system power supply is noisy. Care should be taken to ensure that the voltage at the VDD input does not exceed 7 V (especially during power up) to avoid damage to the converter. This can be done easily using single supply CMOS amplifiers like the OPA735. Figure 24 shows one possible application circuit. VDD 1 mF VDD CS VIN SDO GND SCLK 10 nF Figure 22. Supply/Reference Decoupling Capacitors 5V REF3030 IN 1 mF 3V OUT VDD CS VIN SDO GND SCLK GND 1 mF 10 nF Figure 23. Using the REF3030 Reference 10 Submit Documentation Feedback Copyright © 2011, Texas Instruments Incorporated Product Folder Link(s): ADS7887M ADS7887M SLAS750A – JUNE 2011 – REVISED JUNE 2011 www.ti.com 5V C1 R1 10 W 7V _ R2 VDD CS VIN SDO GND SCLK + 1 mF 1 mF 10 nF Figure 24. Buffering with the OPA735 Submit Documentation Feedback Copyright © 2011, Texas Instruments Incorporated Product Folder Link(s): ADS7887M 11 PACKAGE OPTION ADDENDUM www.ti.com 25-Jun-2011 PACKAGING INFORMATION Orderable Device ADS7887MDBVT Status (1) Package Type Package Drawing ACTIVE SOT-23 DBV Pins Package Qty 6 250 Eco Plan (2) Pb-Free (RoHS Exempt) Lead/ Ball Finish CU SN MSL Peak Temp (3) Samples (Requires Login) Level-2-260C-1 YEAR (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability information and additional product content details. TBD: The Pb-Free/Green conversion plan has not been defined. Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes. Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above. Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material) (3) MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature. Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the accuracy of such information. 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OTHER QUALIFIED VERSIONS OF ADS7887M : • Catalog: ADS7887 NOTE: Qualified Version Definitions: • Catalog - TI's standard catalog product Addendum-Page 1 PACKAGE MATERIALS INFORMATION www.ti.com 22-Jun-2011 TAPE AND REEL INFORMATION *All dimensions are nominal Device ADS7887MDBVT Package Package Pins Type Drawing SPQ SOT-23 250 DBV 6 Reel Reel A0 Diameter Width (mm) (mm) W1 (mm) 177.8 9.7 Pack Materials-Page 1 3.2 B0 (mm) K0 (mm) P1 (mm) 3.1 1.39 4.0 W Pin1 (mm) Quadrant 8.0 Q3 PACKAGE MATERIALS INFORMATION www.ti.com 22-Jun-2011 *All dimensions are nominal Device Package Type Package Drawing Pins SPQ Length (mm) Width (mm) Height (mm) ADS7887MDBVT SOT-23 DBV 6 250 184.0 184.0 50.0 Pack Materials-Page 2 IMPORTANT NOTICE Texas Instruments Incorporated and its subsidiaries (TI) reserve the right to make corrections, modifications, enhancements, improvements, and other changes to its products and services at any time and to discontinue any product or service without notice. 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