TI1 AFE5851 16 channel variable gain amplifier (vga) with octal high speed adc Datasheet

AFE5851
www.ti.com............................................................................................................................................. SLOS574A – SEPTEMBER 2008 – REVISED MARCH 2009
16 CHANNEL VARIABLE GAIN AMPLIFIER (VGA) WITH OCTAL HIGH SPEED ADC
FEATURES
1
•
•
•
•
•
•
•
16 Variable Gain Amplifiers (VGA)
– 16 Single-Ended Buffered Inputs With 1VPP
Maximum Swing
– 5.5nV/√Hz VCA Input Noise (31dB Gain).
– Variable Gain –5dB to 31dB With 0.125dB
Steps
– Digital Gain Control
3rd Order Anti-Aliasing Filter With
Programmable Cut-Off Frequency (7.5, 10 and
14MHz).
Clamping
Analog-to-Digital Converter (ADC)
– Octal channel 12-bit, 65 MSPS
– 32.5 MSPS Maximum per Input Channel
– 2 VGA Outputs Alternately Sampled by
Each ADC
– Internal and External Reference Support
– No External Decoupling Required for
References
– Serial LVDS Outputs
1.8V and 3.3V Supply
39 mW Total Power per Channel at 32.5 MSPS
64-QFN Package (9mm × 9mm)
APPLICATIONS
•
DESCRIPTION
The AFE5851 is an analog front-end targeting
applications where the power and level of integration
are critical. The device contains 16 variable gain
amplifiers (VGA), followed by an octal high speed (up
to 65 MSPS) analog to digital converter (ADC).
Each of the 16 single ended inputs is buffered,
accepts up to 1VPP maximum input swing and it is
followed by a VGA with a gain range from –5dB to
31dB. The VGA gain is digitally controlled and the
gain curves versus time can be stored in memory,
integrated within the device using the serial interface.
A selectable clamping and anti-alias low pass filter
(with 3dB attenuation at 7.5, 10 or 14MHz) is also
integrated between the VGA and ADC for every
channel. The VGA/anti-alias filter outputs are
differential (limited to 2 VPP) and drive the on-board
12-bit 65MSPS ADC that is shared between two
VGAs to optimize the power dissipation. Each VGA
output is sampled at alternate clock cycles, making
the effective sampling frequency half the input clock
rate. The ADC also scales down its power
consumption should a lower sampling rate be
selected.
The ADC outputs are serialized in LVDS streams
further minimizing power and board area. The
AFE5851 is available in a 64-pin QFN package
(9x9mm2) and is specified over the full industrial
temperature range (–40°C to 85°C).
Imaging: Ultrasound, PET
RELATED DEVICES
•
AFE5801: Octal VGA+ADC, 65 MSPS/channel
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2008–2009, Texas Instruments Incorporated
AFE5851
SLOS574A – SEPTEMBER 2008 – REVISED MARCH 2009............................................................................................................................................. www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
AVDD3
SDOUT
RESET
SCLK
SDATA
SEN
PDN
VREF_IN
TGC SYNC
BLOCK DIAGRAM
DVDD18
TIME GAIN BLOCK
AVDD18
CONTROL
VCM
SERIAL
INTERFACE
MEMORY
AAF
IN1
LVDS
VCA1
ADC 1
AAF
SERIALIZER
D1P
D1M
IN2
VCA2
AAF
IN3
VCA3
AAF
ADC 2
SERIALIZER
ADC 8
SERIALIZER
D2P
D2M
IN4
VCA4
AAF
IN15
VCA15
AAF
D8P
D8M
IN16
VCA16
fADC
Clock Divider
(by 2)
CLKINP
fCLKIN /2
FCLKP
FCLKM
fCLKIN
CLKINM
PLL
AVSS
2
FRAME CLOCK
BIT CLOCK
DCLKP
6X fCLKIN
DCLKM
DVSS
Submit Documentation Feedback
Copyright © 2008–2009, Texas Instruments Incorporated
Product Folder Link(s): AFE5851
AFE5851
www.ti.com............................................................................................................................................. SLOS574A – SEPTEMBER 2008 – REVISED MARCH 2009
DVDD18
D1P
D1M
49
DVSS
50
SDOUT
52
51
SEN
53
SDATA
54
SCLK
RESET
55
SYNC
57
56
PDN
58
NC
59
AVDD18
AVSS
AVSS
60
61
62
63
64
VCM
PINOUT
(64 pin QFN, 9x9 mm2)
41
DCLKM
9
40
FCLKP
IN10
10
39
FCLKM
IN11
11
38
D5P
IN12
12
37
D5M
IN13
13
36
D6P
IN14
14
35
D6M
IN15
15
34
D7P
IN16
16
33
D7M
DVSS
DVDD18
NC
NC
VREF_IN
AVDD18
AVSS
CLKINM
CLKINP
AVSS
32
8
IN9
D8P
IN8
31
DCLKP
D8M
42
30
D4M
RGC PACKAGE
DVDD18
43
7
29
6
IN7
28
IN6
27
D4P
26
44
25
5
24
D3M
IN5
23
45
22
4
21
D3P
IN4
20
46
19
3
AVDD18
D2M
IN3
18
D2P
47
17
48
2
VCM
1
IN2
AVDD3
IN1
PIN FUNCTIONS
NAME
NUMBER
IN1–IN16
1–16
Single-ended analog input pins for channel 1 to 16.
CLKINP, CLKINM
21, 22
Differential clock input pins. Single-ended clock also supported (See Clock Inputs Section).
VCM
17, 64
Common-mode output pins for possible bias of the analog input signals.
VREF_IN
25
Reference input in the external reference mode.
RESET
57
Hardware reset pin (active high).
SCLK
56
Serial interface clock input.
SDATA
55
Serial interface data input.
SEN
54
Serial interface enable.
SDOUT
53
Serial interface data readout.
PDN
59
Global power down control input (active high).
SYNC
58
TGC/VGA synchronization signal input
D1P/M... D4P/M
D5P/M... D8P/M
50... 43
38... 31
LVDS output for channels 1 and 2, 3 and 4, 5 and 6.... to 15 and 16.
FCLKM, FCLKP
39, 40
LVDS frame clock output.
DCLKM,DCLP
41, 42
LVDS bit clock output.
AVDD3
18
3.3V Analog supply voltage.
AVDD18
19, 24, 62
1.8V Analog supply voltage.
DVDD18
28, 30, 51
1.8V LVDS buffer supply voltage.
AVSS
20, 23, 61, 63
Analog ground.
DVSS
29, 52
Digital ground.
NC
26, 27, 60
Do not connect.
Thermal Pad
Bottom of the
package
DESCRIPTION
Connect to AVSS.
Submit Documentation Feedback
Copyright © 2008–2009, Texas Instruments Incorporated
Product Folder Link(s): AFE5851
3
AFE5851
SLOS574A – SEPTEMBER 2008 – REVISED MARCH 2009............................................................................................................................................. www.ti.com
PACKAGING/ORDERING INFORMATION (1)
PRODUCT
PACKAGELEAD
PACKAGE
DESIGNATOR
SPECIFIED
TEMPERATURE RANGE
AFE5851
QFN-64 (2)
RGC
–40°C to 85°C
(1)
(2)
PACKAGE
MARKING
ORDERING
NUMBER
TRANSPORT MEDIA,
QUANTITY
AFE5851
AFE5851IRGCT
Tape/Reel, 250
AFE5851
AFE5851IRGCR
Tape/Reel, 2000
For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
website at www.ti.com.
For the thermal pad size on the package, see the mechanical drawings at the end of this document
ABSOLUTE MAXIMUM RATINGS (1)
over operating free-air temperature range (unless otherwise noted)
RANGE
UNIT
AVDD3 to AVSS
–0.3 to 3.8
V
AVDD18 to AVSS
–0.3 to 2.2
V
DVDD18 to DVSS
–0.3 to 2.2
V
Voltage between AVSS and DVSS
–0.3 to 0.3
V
–0.3V to Minimum (3.6, AVDD3+0.3)
V
VREF_IN to AVSS
–0.3 to 2.2
V
VCLKP, VCLKM to AVSS
–0.3 to 2.2
V
Digital control pins to DVSS
–0.3 to 2.2
V
2
kV
125
°C
–60 to 150
°C
Analog input pins (INi) to AVSS
ESD
Human body model
TJ
Maximum operating junction temperature
Tstg
Storage temperature range
(1)
Stresses above those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied Exposure to absolute maximum rated conditions for extended periods may degrade device reliability
THERMAL CHARACTERISTICS
over operating free-air temperature range (unless otherwise noted)
θJA
0LFM air flow
θJC
2 oz. copper trace and pad soldered directly to a JEDEC standard 4-layer 3inch × 3inch PCB
TYP
UNIT
23.17
°C/W
22.1
°C/W
RECOMMENDED OPERATING CONDITIONS
PARAMETER
TA
MIN
Ambient Temperature
–40
AVDD3
Analog Supply Voltage (VGA)
3.0
AVDD18
Analog Supply Voltage (ADC)
1.7
DVDD18
Digital Supply Voltage (ADC, LVDS)
1.7
TYP
MAX
UNIT
85
°C
3.3
3.6
V
1.8
1.9
V
1.8
1.9
V
VCM+0.5
V
1.45
V
SUPPLIES
ANALOG INPUTS
INi
Input voltage
VCM–0.5
VREF_IN in external reference mode
1.35
VCM load
1.4
3
mA
CLOCK INPUT
fCLKIN
Input clock frequency
fChannel
Channel sampling frequency (fCLKIN/2)
Input Clock Duty Cycle
4
5
65
2.5
32.5
40%
Submit Documentation Feedback
50%
MHz
MSPS
60%
Copyright © 2008–2009, Texas Instruments Incorporated
Product Folder Link(s): AFE5851
AFE5851
www.ti.com............................................................................................................................................. SLOS574A – SEPTEMBER 2008 – REVISED MARCH 2009
RECOMMENDED OPERATING CONDITIONS (continued)
PARAMETER
VCLKP–CLKM
VCLKP
MIN
Sine wave, AC-coupled
TYP
MAX
0.5
UNIT
VPP
LVPECL, AC-coupled
1.6
VPP
LVDS, AC-coupled
0.7
VPP
LVCMOS, single-ended, VCLKM connected to AVSS
1.8
VPP
5
pF
100
Ω
DIGITAL OUTPUT
CLOAD
External load capacitance from each output pin to DVSS
RLOAD
Differential load resistance (external) between the LVDS output pairs
ELECTRICAL CHARACTERISTICS
Unless otherwise noted, typical values are at 25°C, min and max values are across full temperature range Tmin= –40°C to
Tmax=85°C, AVDD3=3.3V, AVDD18=1.8V, DVDD18=1.8V, –1dBFS analog input AC coupled with 0.1µF, internal reference
mode, maximum rated channel sampling frequency (32.5 MSPS), LVCMOS (single-ended) clock, 50% duty cycle,
anti-aliasing filter set at 14MHz (3dB corner), output clamp disabled and analog high-pass filter enabled.
PARAMETER
TEST CONDITIONS
MIN
TYP MAX
UNIT
VARIABLE GAIN AMPLIFIER (VGA)
VCM
Max input voltage swing
Linear operation
1
Common-mode voltage
DC level at the input
1.6
Gain range
Maximum gain – minimum gain
36
Maximum Gain
29.5
Gain resolution
31
Vpp
V
32.5
dB
0.125
or 1
dB
Input resistance
From input to dc bias level
5
kΩ
Input capacitance
From input to AVSS
2
pF
ANTIALIAS FILTER (AAF)
7.5 MHz filter selected
AAF cutoff frequency
10 MHz filter selected
10
14
7.5 MHz filter selected
10
–6 dB
MHz
20
7.5 MHz filter selected
18
–12 dB
24
14 MHz filter selected
30
7.5 MHz filter selected
1.2
10 MHz filter selected
MHz
14
14 MHz filter selected
10 MHz filter selected
In-band attenuation
–3 dB
14 MHz filter selected
10 MHz filter selected
AAF stop-band attenuation
7.5
At 3.2 MHz
MHz
0.5
14 MHz filter selected
dB
0.2
FULL-CHANNEL CHARACTERISTICS
Gain matching
Across channels and parts
+0.1
+0.6
Gain error
–5 to 28dB gain
Gain > 28dB gain
–1.2
±0.3
1.2
–1.8
±0.5
1.8
Offset error
31dB gain
–50
Input-referred noise voltage
5 MHz, 31dB VGA gain, low-noise mode
5
6.5
5 MHz, 31dB VGA gain, default-noise mode
SNR
Signal-to-noise ratio
HD2
Second-harmonic distortion
HD3
Third-harmonic distortion
50
5.5
–1dBFS ADC input, 6dB gain
66
–1dBFS ADC input, 17dB VGA gain, fin = 2MHz
–48
–55
–1dBFS ADC input, 31dB VGA gain, fin = 2MHz
–55
–65
–1dBFS ADC input, 17dB VGA gain, fin = 2MHz
–52
–63
–1dBFS ADC input, 31dB VGA gain, fin = 2MHz
–48
–58
Submit Documentation Feedback
Copyright © 2008–2009, Texas Instruments Incorporated
Product Folder Link(s): AFE5851
dB
dB
LSB
nV/√Hz
dBFS
dBc
dBc
5
AFE5851
SLOS574A – SEPTEMBER 2008 – REVISED MARCH 2009............................................................................................................................................. www.ti.com
ELECTRICAL CHARACTERISTICS (continued)
Unless otherwise noted, typical values are at 25°C, min and max values are across full temperature range Tmin= –40°C to
Tmax=85°C, AVDD3=3.3V, AVDD18=1.8V, DVDD18=1.8V, –1dBFS analog input AC coupled with 0.1µF, internal reference
mode, maximum rated channel sampling frequency (32.5 MSPS), LVCMOS (single-ended) clock, 50% duty cycle,
anti-aliasing filter set at 14MHz (3dB corner), output clamp disabled and analog high-pass filter enabled.
PARAMETER
TEST CONDITIONS
MIN
SFDR
Spurious free dynamic range
–1dBFS ADC input, 17dB VGA gain, fin = 2MHz
THD
Total harmonic distortion
–1dBFS ADC input, 17dB VGA gain, fin = 2MHz
IMD
Intermodulation distortion
fin1=1MHz, fin2=2MHz, Ain1, in2 = –7dBFS, 30dB VGA
gain
Group delay variation
TYP MAX
dBc
54
dBc
–70
fin from 100kHz to 14MHz, across gain settings and
channels
±3.5
fin from 100kHz to 14MHz, across channels
±1.5
Input overload recovery
≤6dB overload to within 1%
Clamp level
After amplification. Clamp enabled by default
ADC number of bits
UNIT
55
dBFS
ns
1
Input
clock
cycles
3
dB
12
Aggressor: fin = 2MHz, 1dB below ADC full-scale
Victims (channel sharing same ADC): 50Ω to AVSS
Crosstalk
65
dB
POWER
Total power dissipation
IAVDD3
AVDD3 Current consumption
IAVDD18
AVDD18 Current consumption
IDVDD18
Default-noise mode
633
723
Low-noise mode
715
831
4.7
7
Default-noise mode
259
290
Low-noise mode
310
350
81
100
DVDD18 Current consumption
Standby mode
Power down
AC PSRR
64
Full power down mode
5
Power-supply rejection ratio
mW
mA
mA
mA
mW
30
30
mW
dBc
DIGITAL CHARACTERISTICS (1)
The DC specifications refer to the condition where the digital outputs are not switching, but permanently at a valid logic level 0
or 1. Unless otherwise noted, typical values are at 25°C, min and max values are across full temperature range Tmin= –40°C
to Tmax=85°C, AVDD3=3.3V, AVDD18=1.8V, DVDD18=1.8V, external differential load resistance between the LVDS output
pair Rload=100Ω.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
DIGITAL INPUTS
High-level input voltage
1.4
3.6
Low-level input voltage
0.8
V
V
High-level input current
10
µA
Low-level input current
10
µA
4
pF
Input Capacitance
DIGITAL OUTPUTS
High-level output voltage
1375
Low-level output voltage
1025
Output differential voltage |VOD|
Output offset voltage VOS
Common-mode voltage of DiP and DiM
Output capacitance
Output capacitance inside the device, from either output to DVSS
(1)
6
mV
270
380
490
0.9
1.15
1.5
2
V
pF
Note: All LVDS specifications have been characterized but not production tested.
Submit Documentation Feedback
Copyright © 2008–2009, Texas Instruments Incorporated
Product Folder Link(s): AFE5851
AFE5851
www.ti.com............................................................................................................................................. SLOS574A – SEPTEMBER 2008 – REVISED MARCH 2009
OUTPUT INTERFACE TIMING(1)
Typical values are at 25°C, AVDD3 = 3.3V, AVDD18 = DVDD = 1.8V, LVCMOS (single ended) clock, CLOAD = 5pF, RLOAD =
100Ω, IO = 3.5mA, unless otherwise noted. Minimum and maximum values are across the full temperature range TMIN =
–40°C to TMAX = 85°C.
PARAMETER
ta
tj
TEST CONDITIONS
Aperture delay
The delay in time between the rising edge of the input sampling
clock and the actual time at which the sampling occurs
Aperture delay matching
Across channels within the same device
MIN
TYP
0.7
3
Aperture jitter
Wake-up time
ADC latency
tdelay
±150
ps
450
fs rms
10
50
Time to valid data after coming out of PDN GLOBAL mode
50
200
Time to valid data after stopping and restarting the input clock
30
200
Default, after reset
11
3
UNIT
ns
Time to valid data after coming out of STANDBY mode
Input clock rising edge (zero cross) to frame clock rising edge (zero
cross) minus half the input clock period (T).
tdelay
MAX
4.7
µs
Input
clock
cycles
6.4
ns
1
ns
Variation
At fixed supply and 20°C T difference
–1
tRISE
tFALL
Data rise time
Data fall time
Rise time measured from –100mV to 100mV
Fall time measured from 100mV to –100mV
10 MHz < fCLKIN < 65MHz
0.1
0.25
0.4
ns
tFCLKRISE
tFCLKFALL
Frame clock rise time
Frame clock fall time
Rise time measured from –100mV to 100mV
Fall time measured from 100mV to –100mV
10MHz < fCLKIN < 65MHz
0.1
0.25
0.4
ns
Frame clock duty cycle
Zero crossing of the rising edge to zero crossing of the falling edge
48
50
52
ns
Bit clock rise time
Bit clock fall time
Rise time measured from –100mV to 100mV
Fall time measured from 100mV to –100mV
10MHz < fCLKIN < 65MHz
0.1
0.2
0.35
ns
Bit clock duty cycle
Zero crossing of the rising edge to zero crossing of the falling edge
10MHz < fCLKIN < 65MHz
44%
50%
56%
tDCLKRISE
tDCLKFALL
Table 1. Output Interface Timing (1)
fCLKIN, Input Clock Frequency
[2x Channel Sampling
frequency]
(1)
Setup Time (tsu),
ns
Hold Time (th),
ns
tpdi = 0.5 × Ts + tdelay, ns
Zero-Cross Data to Zero-Cross
Clock (both edges)
Zero-Cross Clock to Zero-Cross
Data (both edges)
Input Clock Zero-Cross (rise
edge) to Frame Clock Zero-Cross
(rise-edge)
Period (T)
MHz
ns
65
15
50
20
0.5
0.8
0.5
0.8
14.6
40
25
0.75
1.05
0.75
1.05
17.04
30
33
1
1.4
1
1.4
21.19
20
50
1.7
2.1
1.7
2.1
29.52
10
100
3.8
4.2
3.8
4.2
54.71
MIN
TYP
0.35
0.65
MAX
MIN
TYP
0.3
0.6
MAX
MIN
TYP
MAX
12.35
See timing diagrams on the following page.
Submit Documentation Feedback
Copyright © 2008–2009, Texas Instruments Incorporated
Product Folder Link(s): AFE5851
7
8
Output Data
CHnOUT
Data rate = 12 x fCLKIN
Bit Clock
DCLK
Freq = 6 x fCLKIN
Frame Clock
FCLK
Freq = 0.5 x fCLKIN
Input Clock
CLKIN
Freq = fCLKIN
Input Signal
(Even Channels)
Input Signal
(Odd Channels)
D1
(D10)
D13
(D2)
D0
(D11)
D11
(D0)
ta
Sample N
D9
(D2)
D8
(D3)
D6
(D5)
D5
(D6)
D4
(D7)
SAMPLE N-5
Channels 2,4,6,8,10,12,14,16
D7
(D4)
Data bit in LSB First mode
Data bit in MSB First mode
D10
(D1)
Submit Documentation Feedback
Product Folder Link(s): AFE5851
D1
(D10)
Bit
Clock
D2
(D9)
Output
Data Pair
D3
(D8)
D0
(D11)
Sample
N+1
D10
(D1)
CHi out
tsu
DCLKM
DCLKP
D11
(D0)
11 clock cycles latency
Sample
N+5
D9
(D2)
th
D8
(D3)
D6
(D5)
D5
(D6)
D4
(D7)
Dn
SAMPLE N
Channels 2,4,6,8,10,12,14,16
D7
(D4)
D2
(D9)
Dn+1
D3
(D8)
tsu
D1
(D10)
D0
(D11)
tpdi
th
Sample
N+6
D11
(D0)
D10
(D1)
D9
(D2)
D8
(D3)
D6
(D5)
D5
(D6)
D4
(D7)
SAMPLE N
Channels 1,3,5,7,9,11,13,15
D7
(D4)
T
D3
(D8)
D2
(D9)
D1
(D10)
D0
(D11)
Sample
N+6
D10
(D1)
SAMPLE
N+1
D11
(D0)
AFE5851
SLOS574A – SEPTEMBER 2008 – REVISED MARCH 2009............................................................................................................................................. www.ti.com
Copyright © 2008–2009, Texas Instruments Incorporated
AFE5851
www.ti.com............................................................................................................................................. SLOS574A – SEPTEMBER 2008 – REVISED MARCH 2009
TYPICAL CHARACTERISTICS
All graphs are at 25°C, AVDD3 = 3.3V, AVDD18 = DVDD18 = 1.8V, –1dBFS analog input AC coupled with 0.1µF, internal
reference mode, maximum rated channel sampling frequency (32.5 MSPS), LVCMOS (single-ended) clock, 50% duty cycle,
fIN = 2MHz, anti-aliasing filter set at 14MHz (3dB corner), output clamp disable and analog high-pass filter enabled. spacer
0
0
Ain = -6 dBFS
GAIN = 6 dB
HD2 = -82.8 dBc
HD3 = -80.1 dBc
THD = 77.6 dBc
SNR = 66.4 dBFS
SINAD = 66.3 dBFS
SFDR = 80.1 dBc
-40
-60
Ain = -1 dBFS
GAIN = 30 dB
SFDR = 59.3 dBc
SNR = 64.5 dBFS
SINAD = 58.5 dBFS
THD = 58.8 dBc
HD2 = -69.3 dBc
HD3 = -59.3 dBc
-20
Amplitude - dB
Amplitude - dB
-20
-80
-40
-60
-80
-100
-100
-110
-110
0
2
4
6
8
10
f - Frequency - MHz
12
14
16
18
5
0
Figure 1. FFT for 2MHz Input Signal and 6dB Gain
Coarse Gain = 30 dB
27
23
Measured Gain - dB
Gain - dB
25
Coarse Gain = 24 dB
21
19
17
15
Coarse Gain = 12 dB
13
11
0
0.125
0.25
0.375
0.5
0.625
0.75
15
20
Figure 2. FFT for 2MHz Input Signal and 30dB Gain
31
29
10
f - Frequency - MHz
0.875
32
30
28
26
24
22
20
18
16
14
12
10
8
6
4
2
0
-2
-4
-6
0
@ -40°C
@ 25°C
@ 85°C
(Ideal+1dB) line
(Ideal-1 dB) line
4
8
20
16
Gain code
12
FINE_GAIN Register Setting
Figure 3. Fine Gain versus Gain Code
24
28
32
36
Figure 4. Measured Gain versus Gain Code and
Temperature
1
170
0.8
Output-Referred Noise - nV/√Hz
@ -40°C
0.6
Gain Error - dB
0.4
@ 25°C
0.2
0
-0.2
@ 85°C
-0.4
-0.6
Low Noise Disabled
130
110
90
Low Noise Enabled
70
-0.8
-1
0
150
4
8
12
16
20
Gain
24
28
32
36
Figure 5. Gain Error versus Gain Code and Temperature
50
-5
-3
-1 1
3
5
7
9
11 13 15 17 19 21 23 25 27 29 31
Gain - dB
Figure 6. Output-Referred Noise versus Gain
Submit Documentation Feedback
Copyright © 2008–2009, Texas Instruments Incorporated
Product Folder Link(s): AFE5851
9
AFE5851
SLOS574A – SEPTEMBER 2008 – REVISED MARCH 2009............................................................................................................................................. www.ti.com
TYPICAL CHARACTERISTICS (continued)
All graphs are at 25°C, AVDD3 = 3.3V, AVDD18 = DVDD18 = 1.8V, –1dBFS analog input AC coupled with 0.1µF, internal
reference mode, maximum rated channel sampling frequency (32.5 MSPS), LVCMOS (single-ended) clock, 50% duty cycle,
fIN = 2MHz, anti-aliasing filter set at 14MHz (3dB corner), output clamp disable and analog high-pass filter enabled. spacer
13
150
140
12
120
Input-Referred Noise - nV/√Hz
Input-Referred Noise - nV/√Hz
130
110
100
90
Low Noise Mode Disabled
80
70
60
50
40
30
Low Noise Mode Enabled
20
10
-6
-4
-2
0
2
11
10
Low Noise Mode Disabled
9
8
7
Low Noise Mode Enabled
6
5
4
6
8
Gain - dB
10
12
14
16
4
17
18
18
19
20
21
22
23
24
25
26
27
28
29
30
31
Gain - dB
Figure 7. Input-Referred Noise for Low Gains
Figure 8. Input-Referred Noise for High Gains
-40
-40
-45
-45
10 MHz, -1dB
-50
-50
5 MHz, -6 dB
HD2 - dB
HD2 - dB
10 MHz, -6 dB
-55
5 MHz, -1dB
-55
-60
-60
-65
-70
-65
-75
2 MHz, -1dB
-70
-80
-75
-80
-5
2 MHz, -6 dB
-85
0
5
10
15
Gain - dB
20
25
30
-90
-5
35
Figure 9. HD2 Across Coarse Gain and 3 Fin (–1dBFS) (1)
0
5
10
15
Gain - dB
20
25
30
35
Figure 10. HD2 Across Coarse Gain and 3 Fin (–6dBFS) (2)
-50
-50
-52
5 MHz, -1 dB
-55
-60
-56
-65
-58
-70
HD3 - dB
HD3 - dB
10 MHz, -1 dB
-54
-60
-62
-75
-80
2 MHz, -1 dB
-64
-85
10 MHz, -1 dB
-66
-90
2 MHz, -1 dB
5 MHz, -1 dB
-68
-95
-70
-5
0
5
10
15
Gain - dB
20
25
30
35
Figure 11. HD3 Across Coarse Gain and 3 Fin (–1dBFS)(1)
(1)
(2)
10
-100
-5
0
5
10
15
Gain - dB
20
25
30
35
Figure 12. HD3 Across Coarse Gain and 3 Fin (–6dBFS)(2)
For gains ≥5dB, the input amplitude is adjusted to give –1dBFS. At 5dB gain, input amplitude is 4dBm (corresponding to –1dBFS).
For gains less than 5dB, the input is kept constant at 4dBm.
For gains ≥0dB, the input amplitude is adjusted to give –6dBFS. At 0dB gain, input amplitude is 4dBm (corresponding to –6dBFS).
For gains less than 0dB, the input is kept constant at 4dBm.
Submit Documentation Feedback
Copyright © 2008–2009, Texas Instruments Incorporated
Product Folder Link(s): AFE5851
AFE5851
www.ti.com............................................................................................................................................. SLOS574A – SEPTEMBER 2008 – REVISED MARCH 2009
TYPICAL CHARACTERISTICS (continued)
All graphs are at 25°C, AVDD3 = 3.3V, AVDD18 = DVDD18 = 1.8V, –1dBFS analog input AC coupled with 0.1µF, internal
reference mode, maximum rated channel sampling frequency (32.5 MSPS), LVCMOS (single-ended) clock, 50% duty cycle,
fIN = 2MHz, anti-aliasing filter set at 14MHz (3dB corner), output clamp disable and analog high-pass filter enabled. spacer
-30
-30
-40
-40
18 dB Gain
-50
24 dB Gain
-50
6 dB Gain
-60
HD3 - dB
HD2 - dB
6 dB Gain
24 dB Gain
-70
-60
-70
-80
-80
-90
-90
-100
-60
-100
-60
18 dB Gain
-50
-40
-30
-20
Output Amplitude - dBFS
-10
0
-50
-40
-30
-20
-10
0
Output Amplitude - dBFS
Figure 13. HD2 versus Output Amplitude
Figure 14. HD3 versus Output Amplitude
-40
-40
-45
-45
-50
FIN = 10 MHz
FIN = 10 MHz
HD3 - dB
HD2 - dB
-55
FIN = 5 MHz
-50
FIN = 5 MHz
-60
-55
-65
-60
-70
FIN = 2 MHz
FIN = 2 MHz
-65
-75
-80
-70
0
0.125
0.25
0.375
0.5
Fine Gain - dB
0.625
0.75
0
0.875
Figure 15. HD2 (at 24 dB Gain) Across Fine Gain
0.125
0.25
0.375
0.5
Fine Gain - dB
0.625
0.75
0.875
Figure 16. HD3 (at 24 dB Gain) Across Fine Gain
2090
-30
-40
2080
Analog HPF Disabled
10 MHz - Adjacent Channel
10 MHz - Shared Channel
2070
10 MHz - Far Channel
-60
2 MHz - Shared Channel
-70
Output Code
dB
-50
Analog HPF Enabled
2060
2050
2 MHz - Adjacent Channel
Digital HPF Enabled
2040
-80
2 MHz - Far Channel
2030
-90
1
2
3
4
5
6
7
8 9 10 11 12 13 14 15 16
Channel
Figure 17. Crosstalk
(3)
-5 -3 -1 1
(3)
3
5
7
9 11 13 15 17 19 21 23 25 27 29 31
Gain - dB
Figure 18. Output Offset Across TGC Gain
-1dB signal applied on one channel at a time and output is observed on:
1. Shared channel - second channel in the pair having a common ADC
2. Adjacent channel - channel next to the aggressor channel, but not a shared channel
3. Far channel - all other channels (neither shared or adjacent)
Submit Documentation Feedback
Copyright © 2008–2009, Texas Instruments Incorporated
Product Folder Link(s): AFE5851
11
AFE5851
SLOS574A – SEPTEMBER 2008 – REVISED MARCH 2009............................................................................................................................................. www.ti.com
TYPICAL CHARACTERISTICS (continued)
All graphs are at 25°C, AVDD3 = 3.3V, AVDD18 = DVDD18 = 1.8V, –1dBFS analog input AC coupled with 0.1µF, internal
reference mode, maximum rated channel sampling frequency (32.5 MSPS), LVCMOS (single-ended) clock, 50% duty cycle,
fIN = 2MHz, anti-aliasing filter set at 14MHz (3dB corner), output clamp disable and analog high-pass filter enabled. spacer
1
15
0
10
K = 10
5
-2
14 MHz
0
-3
-5
-4
-5
Gain - dB
Normalized Amplitude - dB
-1
Analog Filter
10 MHz
-6
-7
-15
-20
-9
-30
-10
-35
-11
-40
-12
0
1 2
3
4 5
6
K=5
K=6
K=7
K=8
K=9
-25
7.5 MHz
-8
-10
-45
0
7 8 9 10 11 12 13 14 15 16 17 18 19 20
fi - Input Frequency - MHz
0.2
0.4
Figure 19. Antialiasing Filter Frequency Response
0.75
0.56
0.725
0.7
0.54
AVDD Power, Low Noise Mode
0.5
0.65
0.625
Total Power - W
AVDD3 Power - W
0.8
1
1.2
f - Frequency - MHz
1.4
1.6
1.8
2
Total Power, Low Noise Mode
0.675
0.48
0.46
0.44
0.42
0.4
0.38
K=2
K=3
Figure 20. Highpass Filter Options
0.58
0.52
0.6
K=4
0.6
0.575
0.55
0.525
0.5
AVDD Power, Default
Total Power, Default
0.475
0.36
0.34
0.45
0.32
0.425
0.3
0
0.4
5
10
15
20
25 30 35 40 45
Clock Frequency - MSPS
50
55
60
65
0
5
10
15
20
25
30
35
40
45
50
55
60
65
Clock Frequency - MSPS
Figure 21. Analog Power versus Input Clock Frequency
Figure 22. Total Power versus Input Clock Frequency
8
4.5
7
4
Count (Number of Channels) Percent - %
6
5
4
3
2
1
3.5
3
2.5
2
1.5
1
0.5
2095
2085
2090
2075
2080
2065
2070
2055
2060
2045
2050
2035
2040
2025
Output Code
Figure 23. Gain Matching Measured at a Single Gain (30
dB) as Peak-to-Peak Variation of Gain Across Channels
on Every Device and Measured at 3 Temperatures. Every
Device at Each Temperature is Counted as One Event.
12
2030
2015
0.49
0.11
0.13
0.15
0.17
0.19
0.21
0.23
0.25
0.27
0.29
0.31
0.33
0.35
0.37
0.39
0.41
0.43
0.45
0.47
0.05
0.07
0.09
Gain Matching - dB
2020
0
0
2005
2010
Percent % of Occurences
Gain = 30 dB
Figure 24. Offset (Average Code) with Signal. Every
Channel Counted as One Event.
Submit Documentation Feedback
Copyright © 2008–2009, Texas Instruments Incorporated
Product Folder Link(s): AFE5851
AFE5851
www.ti.com............................................................................................................................................. SLOS574A – SEPTEMBER 2008 – REVISED MARCH 2009
TYPICAL CHARACTERISTICS (continued)
All graphs are at 25°C, AVDD3 = 3.3V, AVDD18 = DVDD18 = 1.8V, –1dBFS analog input AC coupled with 0.1µF, internal
reference mode, maximum rated channel sampling frequency (32.5 MSPS), LVCMOS (single-ended) clock, 50% duty cycle,
fIN = 2MHz, anti-aliasing filter set at 14MHz (3dB corner), output clamp disable and analog high-pass filter enabled. spacer
2800
2600
fIN = 2 MHz
Output Code
2400
2200
2000
1800
1600
1400
1200
1000
0
500 1000 1500 2000 2500 3000 3500 4000 4500 5000 5500 6000 6500 7000 7500 8000
Sample
Figure 25. TGC Sweep with Interpolation Disabled and High-Pass Filter Enabled
2800
2600
fIN = 2 MHz
Output Code
2400
2200
2000
1800
1600
1400
1200
1000
0
500 1000 1500 2000 2500 3000 3500 4000 4500 5000 5500 6000 6500 7000 7500 8000
Sample
Figure 26. TGC Sweep with Interpolation Disabled and High-Pass Filter Disabled
2800
2600
fIN = 2 MHz
Output Code
2400
2200
2000
1800
1600
1400
1200
1000
2500 3000 3500 4000 4500 5000 5500 6000 6500 7000 7500 8000 8500 9000 9500 10000
Sample
Figure 27. TGC Sweep with Interpolation Enabled and High-Pass Filter Disabled
Submit Documentation Feedback
Copyright © 2008–2009, Texas Instruments Incorporated
Product Folder Link(s): AFE5851
13
AFE5851
SLOS574A – SEPTEMBER 2008 – REVISED MARCH 2009............................................................................................................................................. www.ti.com
TYPICAL CHARACTERISTICS (continued)
All graphs are at 25°C, AVDD3 = 3.3V, AVDD18 = DVDD18 = 1.8V, –1dBFS analog input AC coupled with 0.1µF, internal
reference mode, maximum rated channel sampling frequency (32.5 MSPS), LVCMOS (single-ended) clock, 50% duty cycle,
fIN = 2MHz, anti-aliasing filter set at 14MHz (3dB corner), output clamp disable and analog high-pass filter enabled. spacer
0
Ain = -7 dBFS each tone
Gain = 30 dB
IMD3 = -70 dBFS
Amplitude - dB
-20
-40
-60
-80
-100
-110
0
2
4
6
8
10
f - Frequency - MHz
12
14
16
18
Figure 28. Intermodulation Distortion
DCLK
21
19
17
Analog HPA Disabled
IRN, nV/√Hz
15
13
Default
11
High Pass Digital Filter K = 4
9
7
5
3
0
0.2 0.4 0.6 0.8
1
1.2 1.4 1.6 1.8 2
f - Frequency - MHz
2.2 2.4 2.6 2.8
3
Data
Figure 29. IRN versus Frequency (Gain = 31dB)
14
Submit Documentation Feedback
Figure 30. LVDS Eye Pattern
Copyright © 2008–2009, Texas Instruments Incorporated
Product Folder Link(s): AFE5851
AFE5851
www.ti.com............................................................................................................................................. SLOS574A – SEPTEMBER 2008 – REVISED MARCH 2009
APPLICATION INFORMATION
THEORY OF OPERATION
The AFE5851 is a low power CMOS monolithic analog front end that includes a 16-channel variable gain
amplifier (VGA) followed by an 8-channel 12-bit high speed pipeline analog to digital converter (ADC) based on
switched capacitor architecture.
Each of the 16 VGA single ended inputs is buffered and accepts a maximum swing of 1VPP centered at a DC
level (VCM) of about 1.6V.
Each VGA has a gain range from –5dB to 31dB and it is digitally controlled, with a resolution of 0.125 dB. The
gain curves (common to all VGAs) versus time can be stored in memory integrated within the device using the
serial interface.
A hardware sync input pin is available (SYNC). When a pulse is applied to this pin, all the VGAs in the device
start stepping through the selected time-gain curve at the same clock cycle. This sync can also be initiated by
software using the serial interface.
A selectable anti-alias low pass filter (AAF) with 6 dB attenuation at 7.5MHz, 10MHz or 14MHz, is also
integrated, together with clamping (which can be disabled).
The VGA/AAF can output 2VPP differential swing without degradation in the specified linearity, and drive an
on-board 12-bit ADC shared between two VGAs to optimize power dissipation. Each VGA output is sampled at
the rising edge of alternating clock cycles, making the effective sampling frequency half the input clock rate. For
instance, in order to sample each analog channel at 30 MSPS, the input clock frequency needs to be 60 MHz.
This effectively introduces a half (sampling) clock delay between the sampling instants of the two analog
channels.
After the input signals are captured by the sample and hold circuit, the samples are sequentially converted by a
series of low resolution stages. The stage outputs are combined in a digital correction logic block to form the final
12-bit word with a latency of 11 clock cycles (without taking into account the delays introduced by the optional
digital signal processing functions). The 12-bit words of each channel are serialized and output as LVDS levels in
straight offset binary format. In addition to the data streams, a bit clock and frame clock are also output. The
frame clock is aligned with the 12-bit word boundary.
Notice that for the correct operation of the device (see Serial Interface Section) a positive pulse must be applied
to the Reset pin. This sets the internal control registers to zero. There is, nevertheless, no need for any type of
power-up sequencing.
INPUT CONFIGURATION
The analog input for the AFE5851 (Figure 31) consists of an analog buffer input gate biased to a value of 1.6V
(usually referred as voltage common mode, VCM). The biasing is done with an internal resistor of 5kΩ. For
proper operation, the input signal should be in the recommended input range. The maximum input swing is
limited to 1VPP before distortion/saturation of the input stage occurs. As the input DC level (VCM) is about 1.6V,
the input of the VGA should stay between 1.1V and 2.1V. If the information in the low frequencies of the signal is
irrelevant AC coupling can be used. As the input capacitor forms a high-pass filter with the internal bias resistor
(5kΩ), the value of the capacitor should allow the lowest frequency of interest to pass with minimum attenuation.
For the typical frequencies used in ultrasound (>1MHz) a value of 10nF or greater is recommended. If DC
coupling is preferred, the user can tap the VCM output pins to set the DC level of the input signal. VCM output
should be connected to high input impedance circuits as its driving capability is limited. Regardless of the chosen
input configuration, a capacitor of 100nF should be connected on each VCM input to AVSS.
Submit Documentation Feedback
Copyright © 2008–2009, Texas Instruments Incorporated
Product Folder Link(s): AFE5851
15
AFE5851
SLOS574A – SEPTEMBER 2008 – REVISED MARCH 2009............................................................................................................................................. www.ti.com
Ch1 Input
INP
5 kW
AC
Clamp coupling
Vcm
5 kW
CM buffer
Internal
Voltage
Reference
Figure 31. Input Equivalent Circuit
SERIAL INTERFACE
Register Initialization
After power-up, the internal registers must be initialized to the default value (zero). Initialization can be done in
one of two ways:
1. Through a hardware reset, by applying a positive pulse in the RESET pin
2. Through a software reset, using the serial interface, by setting the SOFTWARE RESET bit to high. Setting
this bit initializes the internal registers to the respective default values (all zeros) and then self-resets the
SOFTWARE RESET bit to low. In this case, the RESET pin can stay low (inactive).
Reset Timing
Typical values at 25°C, min and max values across the full temperature range TMIN = –40°C to TMAX = 85°C, AVDD3 = 3.3V,
AVDD18 = DVDD18 = 1.8V unless otherwise noted.
PARAMETER
CONDITIONS
MIN
t1
Power-on delay time
Delay from power-up of AVDD and LVDD to RESET pulse
active
t2
Reset pulse width
Pulse width of active RESET signal
t3
Register write delay time Delay from RESET disable to SEN active
tPO
Power-up delay time
16
MAX
UNIT
5
ms
10
ns
25
Delay from power-up of AVDD and LVDD to output stable
Submit Documentation Feedback
TYP
ns
6.5
ms
Copyright © 2008–2009, Texas Instruments Incorporated
Product Folder Link(s): AFE5851
AFE5851
www.ti.com............................................................................................................................................. SLOS574A – SEPTEMBER 2008 – REVISED MARCH 2009
Power Supply
AVDD, LVDD
t1
RESET
t2
t3
SEN
T0108-03
Figure 32. Reset Timing Diagram
Programming of different modes can be done through the serial interface formed by pins SEN (serial interface
enable), SCLK (serial interface clock), SDATA (serial interface data) and RESET. SCLK and SDATA have a
pull-down resistor to GND of 100kΩ and SEN has a 100kΩ pullup resistor to DVDD18. Serial shift of bits into the
device is enabled when SEN is low. Serial data SDATA is latched at every rising edge of SCLK when SEN is
active (low). The serial data is loaded into the register at every 24th SCLK rising edge when SEN is low. If the
word length exceeds a multiple of 24 bits, the excess bits are ignored. Data can be loaded in multiple of 24-bit
words within a single active SEN pulse (there is an internal counter that counts groups of 24 clocks after the
falling edge of SEN). The interface can work with the SCLK frequency from 20 MHz down to low speeds (few
Hertz) and even with non-50% duty cycle SCLK.
The data is divided into two main portions: a register address (8 bits) and the data itself, to load on the
addressed register (16bits). When writing to a register with unused bits, these should be set to 0. The following
timing diagram illustrates this process:
Start Sequence
End Sequence
SEN
t6
t1
t7
t2
Data Latched on Rising Edge of SCLK
SCLK
t3
SDATA
A7 A6 A5 A4 A3 A2 A1 A0 D15 D14 D13 D12 D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1
t4
D0
t5
Figure 33. Serial Interface Register Write
Submit Documentation Feedback
Copyright © 2008–2009, Texas Instruments Incorporated
Product Folder Link(s): AFE5851
17
AFE5851
SLOS574A – SEPTEMBER 2008 – REVISED MARCH 2009............................................................................................................................................. www.ti.com
Minimum values across the full temperature range, TMIN = –40°C to TMAX = 85°C, AVDD3 = 3.3V,
AVDD18 = DVDD18 = 1.8V.
PARAMETER
DESCRIPTION
MIN
TYP
MAX
UNIT
t1
SCLK period
50
ns
t2
SCLK high time
20
ns
t3
SCLK low time
20
ns
t4
Data setup time
5
ns
t5
Data hold time
5
ns
t6
SEN fall to SCLK rise
8
ns
t7
Time between last SCLK rising edge to SEN rising edge
8
ns
General Purpose Register Map
The internal registers can be divided into two groups. A group of registers to control all the general functions and
settings of the device, and a bank of registers to control the TGC/gain curves operation. Those two sets of
registers overlap in all the address space, except for the address 0 which holds the control of the register bank.
One of the bits of this register, TGC_REG_WREN (see table below) is used to access one set of registers or the
other. Its default value is zero and gives access to the general purpose registers. The TGC control registers
(described after the general purpose registers) can be accessed by writing '1' to TGC_REG_WREN.
The following table describes the function of the general purpose registers (when TGC_REGISTER_WREN is
zero, default). The address format is "address[bit of the register]":
ADDRESS
FUNCTION
DESCRIPTION
0[2]
TGC_REGISTER_WREN
0: Access to general-purpose registers. 1: Access to TGC registers
0[1]
REGISTER_READOUT_ENABLE
1: Enables readout of the registers
0[0]
SOFTWARE_RESET
1: Resets the device and self-resets the bit to zero
1[13]
EXTERNAL_REFERENCE
0: Internal reference. 1: External reference
1[11]
LOW_FREQUENCY_NOISE_SUPRESSION 0: No suppression. 1: Suppresses noise at low frequencies and pushes it to
fchannel/2
1[10]
STDBY
0: Power up. 1: Standby (fast power-up mode)
1[9:2]
PDN CHANNEL<7:0>
PDN for each individual channel (VCA+ADC). LVDS outputs logic 0.
1[1]
OUTPUT_DISABLE
0: Output enabled. 1: Output disabled
1[0]
GLOBAL_PDN
0: Power up. 1: Global power down (slow power-up mode)
2[15:13]
PATTERN_MODE
Pattern modes for serial LVDS. 000: No pattern. 001: Sync. 010: Deskew.
011: Custom reg. 100: All 1s. 101: toggle. 110: All 0s. 111: Ramp
2[11]
AVERAGING_ENABLE
0: Default (no averaging). 1: Average two channels to increase SNR.
2[10:3]
PDN_LVDS
Power down the eight data-output LVDS pairs.
3[14:13]
SERIALIZED_DATA_RATE
Serialization factor. 00: 12×. 01: 10×. 10: 16×. 11: 14×
3[12]
DIGITAL_GAIN_ENABLE
0: Default (no gain). 1: Apply digital gain set by the following registers.
3[8]
REGISTER_OFFSET_SUBTRACTION_ENA 0: Default (no subtraction). 1: Subtract offset value set in the corresponding
BLE
registers.
3[7:0]
INVERT_CHANNEL
0: Default. 1: Invert channel output
4[4]
MSB_FIRST
0: LSB first. 1: MSB first
4[3]
DFS
Data format select. 0: 2s complement. 1: Offset binary
5[13:0]
CUSTOM_PATTERN
Custom pattern data for LVDS (PATTERN_MODE = 011)
7[10]
VCA_LOW_NOISE_MODE_(INCREASE_P
OWER)
0: Low power. 1: Low noise, at the expense of increased power (5mW per
channel)
7[8:7]
SELF_TEST
00, 10: No self-test. 01: Self-test enabled. 100 mV DC applied to the input of the
channels. 11: Self-test enabled. 150 mV DC applied to the input of the
channels.
7[3:2]
FILTER_BW
00: 14MHz. 01: 10MHz. 10: 7.5MHz. 11: Not used.
7[1]
INTERNAL_AC_COUPLING
VGA coupling. 0: AC-coupled. 1: DC-coupled
13[15:11]
DIG_GAIN1
0dB to 6dB in steps of 0.2dB
18
Submit Documentation Feedback
Copyright © 2008–2009, Texas Instruments Incorporated
Product Folder Link(s): AFE5851
AFE5851
www.ti.com............................................................................................................................................. SLOS574A – SEPTEMBER 2008 – REVISED MARCH 2009
ADDRESS
FUNCTION
DESCRIPTION
13[9:2]
OFFSET_CH1
Value to be subtracted from channel 1
14[15:11]
DIG_GAIN2
0dB to 6dB in steps of 0.2dB
14[9:2]
OFFSET_CH2
Value to be subtracted from channel 2
15[15:11]
DIG_GAIN3
0dB to 6dB in steps of 0.2dB
15[9:2]
OFFSET_CH3
Value to be subtracted from channel 3
16[15:11]
DIG_GAIN4
0dB to 6dB in steps of 0.2dB
16[9:2]
OFFSET_CH4
Value to be subtracted from channel 4
17[15:11]
DIG_GAIN5
0dB to 6dB in steps of 0.2dB
17[9:2]
OFFSET_CH5
Value to be subtracted from channel 5
18[15:11]
DIG_GAIN6
0dB to 6dB in steps of 0.2dB
18[9:2]
OFFSET_CH6
Value to be subtracted from channel 6
19[15:11]
DIG_GAIN7
0dB to 6dB in steps of 0.2dB
19[9:2]
OFFSET_CH7
Value to be subtracted from channel 7
20[15:11]
DIG_GAIN8
0dB to 6dB in steps of 0.2dB
20[9:2]
OFFSET_CH8
Value to be subtracted from channel 8
21[4:1]
DIGITAL_HIGH_PASS_FILTER_CORNER_
FREQ_FOR_CHANNELS-1–4
Sets k for the high-pass filter as described in General-Purpose Register
Description (k from 2 to 10).
21[0]
DIGITAL_HIGH_PASS_FILTER_ENABLE_F 0: No high-pass filter. 1: High-pass filter enabled
OR_CHANNELS_1–4
25[15:11]
DIG_GAIN16
0dB to 6dB in steps of 0.2dB
25[9:2]
OFFSET_CH15
Value to be subtracted from channel 16
26[15:11]
DIG_GAIN15
0dB to 6dB in steps of 0.2dB
26[9:2]
OFFSET_CH16
Value to be subtracted from channel 15
27[15:11]
DIG_GAIN14
0dB to 6dB in steps of 0.2dB
27[9:2]
OFFSET_CH13
Value to be subtracted from channel 14
28[15:11]
DIG_GAIN13
0dB to 6dB in steps of 0.2dB
28[9:2]
OFFSET_CH14
Value to be subtracted from channel 13
29[15:11]
DIG_GAIN12
0dB to 6dB in steps of 0.2dB
29[9:2]
OFFSET_CH11
Value to be subtracted from channel 12
30[15:11]
DIG_GAIN11
0dB to 6dB in steps of 0.2dB
30[9:2]
OFFSET_CH12
Value to be subtracted from channel 11
31[15:11]
DIG_GAIN10
0dB to 6dB in steps of 0.2dB
31[9:2]
OFFSET_CH9
Value to be subtracted from channel 10
32[15:11]
DIG_GAIN9
0dB to 6dB in steps of 0.2dB
32[9:2]
OFFSET_CH10
Value to be subtracted from channel 9
33[4:1]
DIGITAL_HIGH_PASS_FILTER_CORNER_
FREQ_FOR_CHANNELS_5–8
Sets k for the high-pass filter as described in General-Purpose Register
Description (k from 2 to 10).
33[0]
DIGITAL_HIGH_PASS_FILTER_ENABLE_F 0: No high-pass filter. 1: High-pass filter enabled
OR_CHANNELS_5–8
70[14]
CLAMP_DISABLE
0: Enabled. 1: Disabled
Submit Documentation Feedback
Copyright © 2008–2009, Texas Instruments Incorporated
Product Folder Link(s): AFE5851
19
AFE5851
SLOS574A – SEPTEMBER 2008 – REVISED MARCH 2009............................................................................................................................................. www.ti.com
General Purpose Register Description
AVERAGING_ENABLE
Address: 2[11]
When set to one, two samples, corresponding to two different channels on the same pair, are averaged
(channel 1 with 3, 2 with 4, 5 with 7, 6 with 8, 9 with 11, 10 with 12, 13 with 15 and 14 with 16). If both
channels receive the same input, the net effect is an improvement on SNR. The averaging is performed as:
1. Channel 1 with channel 3 comes out on channel 3 LVDS pair, followed by the average of channels 2 and
4 (on the same pair).
2. Channel 5 with channel 7 comes out on channel 4 LVDS pair, followed by the average of channels 6 and
8 (on the same pair).
3. Channel 9 with channel 11 comes out on channel 5 LVDS pair, followed by the average of channels 10
and 12 (on the same pair).
4. Channel 13 with channel 15 comes out on channel 6 LVDS pair, followed by the average of channels 14
and 16 (on the same pair).
CUSTOM_PATTERN
Address: 5[13:0]
This register stores the code that will be output when PATTER_MODE equal to '011'. See PATTERN_MODE
for more details.
DFS
Address: 4[3]
DFS stands for Data Format Select. The ADC output, by default, is in 2s complement mode. Programming
the DFS bit to '1' inverts the MSB, and the output becomes straight offset binary mode.
DIGITAL_GAIN_ENABLE
Address: 3[12]
Setting this bit to ‘1’ applies to each channel I the corresponding gain given by DIG_GAINi<15:11>. The gain
is given as 0dB+0.2dB*DIG_GAINi<15:11>. For instance, if DIG_GAIN5<15:11>=3, channel 5 is increased by
0.6dB gain. DIG_GAINi<15:11>=31 produces the same effect as DIG_GAINi<15:11>=30 setting the gain of
channel i to 6dB.
DIGITAL_HIGH_PASS_FILTER and DIGITAL_HIGH_PASS_FILTER_CORNER_FREQ
Address: 21[0]
Address: 33[0]
Address: 21[4:1]
Address: 33[4:1]
This group of 4 registers controls the characteristics of a digital high pass transfer function applied to the
output data, following the formula: y(n)= 2^k/(2^k +1) [ x(n) –x(n–1) + y(n–1)]. K is set as described by the
DIGITAL_HIGH_PASS_FILTER_CORNER_FREQ registers (one for the first 8 channels and one for the
second group of 8 channels).
EXTERNAL_REFERENCE
Address: 1[13]
Internal reference mode (default) uses approximately 3mW more power on AVDD (already included in all the
specification tables). The AFE5851 can operate in external reference mode by programming
EXTERNAL_REFERENCE to '1'. In this mode, drive the VREF_IN pin with 1.4V. Due to the high input
impedance of this pin, no special drive capabilities are required. The advantage of using the external
reference mode is that multiple AFE5851 units can be made to operate with the same external reference,
thereby improving parameters such as gain matching across devices.
FILTER_BW
Address: 7[3:2]
This bit sets the 3dB attenuation frequency for the anti-aliasing filter (AAF).
GLOBAL_PDN
Address: 1[0]
20
Submit Documentation Feedback
Copyright © 2008–2009, Texas Instruments Incorporated
Product Folder Link(s): AFE5851
AFE5851
www.ti.com............................................................................................................................................. SLOS574A – SEPTEMBER 2008 – REVISED MARCH 2009
The Global PDN bit is ORed with the signal in the external PDN pin (59). Hereby, a '1' on this bit shuts down
the device completely.
INTERNAL_AC_COUPLING
Address: 7[1]
This bit controls an internal high pass filter, Figure 31, set between the input buffer and the VCA. This filter
removes the input offset to avoid its amplification by the TGC. An alternative method is to remove the offset
effect on the digital domain, either on the device following the ADC or at the ADC output, by using the
DIGITAL HIGH PASS FILTER registers (see above).
INVERT_CHANNEL
Address: 3[7:0]
Setting the corresponding bit in INVERT_CHANNEL<7:0> inverts (digitally) the value of the signal/output
data. INVERT_CHANNEL<0> controls channels 1 and 2 at the same time, INVERT_CHANNEL<1> controls
3 and 4, and so on…
LOW_FREQUENCY_NOISE_SUPRESSION
Address: 0[11]
low-frequency noise suppression mode is specifically useful in applications where good noise performance is
desired in the frequency band of 0MHz to 1MHz (around DC). Setting this mode shifts the low-frequency
noise of the ADC in the AFE5851 to approximately fchannel/2, thereby reducing the noise floor around DC to
a much lower value.
MSB_FIRST
Address: 4[4]
By default, the first bit of the frame (following the rising edge of DCLKP) is the LSB of the ADC output.
Programming the MSB_FIRST mode inverts the bit order in the word, and the MSB is output as the first bit
following the DCLKP rising edge.
OUTPUT_DISABLE
Address: 1[1]
A '1' on this bit sets the outputs into high-impedance state.
PATTERN_MODE
Address: 2[15:13]
AFE5851 can output a variety of test patterns on the LVDS outputs. These test patterns replace the normal
ADC data output and help on debugging and synchronization with the device reading the output of the ADC:
1. PATTERN_MODE equal to ‘000’ is the default and disables this test mode, i.e., the output data is the
same as the ADC data.
2. PATTERN_MODE equal to ‘001’ (SYNC mode) replaces the normal ADC word by a fixed 111111000000
word.
3. PATTERN_MODE equal to ‘010’ sets the DESKEW mode, where the 12-bit ADC output D<11:0> is
replaced with the ‘101010101010’ word, creating a continuous stream of ones and zeros in the data line.
The exact sequence (first a zero or a one) depends on power-up. This mode only ensures alternating
ones and zeros at the output.
4. PATTERN_MODE equal to ‘011’ will output a constant code set by the bits in
CUSTOM_PATTERN<13:0>. Depending on the value of SERIALIZED_DATA_RATE (see below) the
output bits follow these rules:
a. On the default case, where SERIALIZED_DATA_RATE is ‘00’, for a 12-bit ADC data at the output,
CUSTOM_PATTERN<13:2> would be used, replacing the sampled data. These would still be
controlled by LSB-first and MSB-first modes in the same way as normal ADC data are.
b. For SERIALIZED_DATA_RATE= ’01’, 10-bit output mode is selected, and bits
CUSTOM_PATTERN<13:4> are used.
c. For SERIALIZED_DATA_RATE= ’10’, 16-bit output mode is selected. On this case,
CUSTOM_PATTERN<13:0> are used for the first 14 most significant bits, and two zeros take the
place of the LSBs.
d. For SERIALIZED_DATA_RATE= ’11’, 14-bit mode is selected, and CUSTOM_PATTERN<13:0>
takes the place of the output word.
Submit Documentation Feedback
Copyright © 2008–2009, Texas Instruments Incorporated
Product Folder Link(s): AFE5851
21
AFE5851
SLOS574A – SEPTEMBER 2008 – REVISED MARCH 2009............................................................................................................................................. www.ti.com
5. PATTERN_MODE equal to '100’ makes it always ‘1’, while setting it to ‘110’ makes the output always ‘0’.
6. PATTERN_MODE equal to ‘101’ makes the output of the device toggle between all zeros and all ones.
On the nth sample clock, the data would be ‘000000000000’ and on the following one (nth+1) it would be
‘111111111111’.
7. PATTERN_MODE equal to ‘111’ causes all the channels to output a repeating full-scale ramp pattern.
The ramp increments from zero code to full-scale code in steps of 1LSB every clock cycle. After hitting
the full-scale code, it returns back to zero code and ramps again.
PDN_Channel<7:0>
Address: 1[9:2]
Each bit controls the power down of a pair of consecutive channels (that share the same ADC). For example:
PDN_Channel<0> powers down channels 1 and 2 and the corresponding LVDS pair become high
impedance. DCLK and FCLK are not powered down; they will be active if terminated with 100Ω.
PDN_LVDS
Address: 2[10:3]
PDN_LVDS<7..0> selects which LVDS pairs become inactive (zero output). The frame and clock LVDS
streams get powerdown only when OUTPUT_DISABLE or GLOBAL_PDN are set.
REGISTER_OFFSET_SUBSTRACTION_ENABLE
Address: 3[8]
Setting this bit to ‘1’ enables the subtraction of the value on the corresponding OFFSET_CHANNELi<9:2>
from the ADC output. The number is specified in 2s complement format. For example,
OFFSET_CHANNELi<9:2>=’1000000’ means “subtract –128”. For OFFSET_CHANNELi<9:2>=’01111111’
the effect will be to subtract 127. Hereby, both addition and subtraction can be done.
Notice that the offset is applied before the digital gain (see next). In fact, digital gain is the last step and the
whole data path is 2s complement through out internally. Only when DFS=’1’ (straight binary output format),
the 2s complement word is translated into offset binary right at the end.
REGISTER_READOUT_ENABLE
Address:0[1]
The device includes an option where the contents of the internal registers can be read back. This may be
useful as a diagnostic to verify the serial interface communication between the external controller and the
AFE. First, the <REGISTER READOUT ENABLE> bit needs to be set to ‘1’. Then the user should initiate a
serial interface cycle specifying the address of the register (A7-A0) whose content has to be read. The data
bits are “don’t care”. The device will output the contents (D15-D0) of the selected register on the SDOUT pin.
The external controller can latch the contents at the rising edge of SCLK. To enable serial register writes, set
the <REGISTER READOUT ENABLE> bit back to ‘0’. The following timing diagram shows this operation (the
time specifications follow the same information provided on the table for a serial interface register write):
Start sequence
SEN
t6
t2
End sequence
t1
t7
SCLK
t3
SDATA
A7
t4
A6
A5
A4
A3
A1
A0
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
t5
SDOUT
22
A2
SDOUT TO BE LATCHED EXTERNALLY ON THE RISING EDGE
D15 D14 D13 D12 D11 D10 D9
Submit Documentation Feedback
D8
D7 D6
D5
D4
D3
D2
D1
D0
Copyright © 2008–2009, Texas Instruments Incorporated
Product Folder Link(s): AFE5851
AFE5851
www.ti.com............................................................................................................................................. SLOS574A – SEPTEMBER 2008 – REVISED MARCH 2009
SERIALIZED_DATA_RATE
Address: 3[14:13]
These two bits control the length of the data word, i.e., the number of DCLK per FCLK periods. It is possible,
for instance, to output 16bit data stream, even with a 12bit ADC. In this case, the last 4 LSBs are padded
with zeros. The pass from higher resolution to lower serialization is not supported though; i.e, it is not
possible to select a 10bit stream with a 12bit ADC.
TGC_REGISTER_WREN
Address: 0[2]
Set this bit to ‘1’ to access the TGC table and ‘0’ (default after reset) to access the general purpose register
table. As explained before, the same address may point to one bank of registers or to the other.
Nevertheless, observe that register 0 of the general purpose registers is always accessible, regardless of the
value of TGC_REGISTER_WREN. The TGC table starts at address 1.
VCA_LOW_NOISE_MODE
Address: 7[10]
Setting this bit to ‘1’ reduces the equivalent input noise of the channel to 5nV/√Hz (for a 31dB gain) at the
expense of an increase in power consumption (5mW/channel).
TGC CONTROL REGISTER MAP
The TGC operation is described in the VGA/TGC Operation section below. This section describes the TGC
control registers which can be accessed by writing '1' to TGC_REG_WREN bit. The following table describes the
register map for all the registers involved in the TGC operation.
ADDRESS
D[15:7]
D[8]
D[7]
D[6]
0x01...0x94
D[5]
D[4]
0x95
D[2]
D[1]
D[0]
START_ INDEX
0x96
STOP_INDEX
INTERP
ENABLE
0x97
0x98
D[3]
REG_VALUES
0
START _GAIN
HOLD_ GAIN _TIME
NOT USED
0x99
0
0
0x9A
0
0
0x9B
SOFT SYNC
UNIFORM
GAIN
MODE
STATIC
PGA
FINE_GAIN
COARSE_GAIN
UNIFORM_GAIN_SLOPE
REG_VALUE
Address: 0x01[8:0] to 0x94[8:0]
Each of these 9 bit registers (148 of them) stores the time to stay at a given gain setting, during the gain
ramp. The most significant bit of each register (REG_VALUE<8>) denotes either increment or decrement
gain from current gain value. The other 8 bits (REG_VALUE<7:0>) denote the time (a multiple of 8 × Tclk;
Tclk being the channel sampling clock, i.e., double the period of the device input clock) for the change of the
gain from the CURRENT_GAIN to CURRENT_GAIN ±1dB (depending on the REG_VALUE<8>). The fastest
ramp (shortest time) for this 1dB gain change is set by REG_VALUE<7:0> equal to 0x00 and it is 8 × Tclk.
The slowest ramp (longest time) for this 1dB gain change is set by REG_VALUE<7:0> equal to 0xFF and it
is 255 × 8 × Tclk (see VGA operation – described later).
START_INDEX
Address: 0x95[7:0]
This 8 bit register specifies/points to the first REG_VALUE register of the TGC curve (i.e., where the curve
starts) and can have values ranging from 1 to 148 (in decimal).
STOP_INDEX
Address: 0x96[7:0]
This 8 bit register specifies/points to the last REG_VALUE register of the TGC curve (i.e., where the curve
finishes) and can have values ranging from 1 to 148 (in decimal).
Submit Documentation Feedback
Copyright © 2008–2009, Texas Instruments Incorporated
Product Folder Link(s): AFE5851
23
AFE5851
SLOS574A – SEPTEMBER 2008 – REVISED MARCH 2009............................................................................................................................................. www.ti.com
START_GAIN
Address: 0x97[5:0]
This 6 bit register specifies the start gain value from –5dB to 31dB.
START_GAIN = [–5 + REG_VALUE ] dB
REG_VALUE
GAIN
0x0
0x1
0x24
–5 dB
–4 dB
31 dB
STOP_GAIN
(Not a programmable register, it is an internally computed value)
Case 1:
INTERP_ENABLE=1,
STOP_GAIN = START_GAIN + (STOP_INDEX -START_INDEX) – ( 2 * Number of
decrements) + 0.875dB.
Case 2:
INTERP_ENABLE=’0’,
STOP_GAIN = START_GAIN + (STOP_INDEX-START_INDEX) – ( 2 * Number of
Decrements).
HOLD_GAIN_TIME
Address: 0x98[7:0]
This 8 bit register specifies the time for holding of the STOP_GAIN, after reaching either the STOP_GAIN
value as computed earlier or the maximum/minimum gain. After this time, the TGC starts stepping down to
the START_GAIN value in 1dB steps every Tclk. The STOP_GAIN value is held for the following number of
clocks:
HOLD_GAIN_TIME = [33 * REG_VALUE] Tclks
where Tclk is the channel sampling clock.
REG_VALUE
0x0
0x1
0xFF
HOLD_GAIN_TIME
0 Tclks
33 Tclks
8415 Tclks
INTERP_ENABLE
Address: 0x97[7]
This 8 bit register sets the ramp rate. When INTERP_ENABLE='1' the ramp rate is 0.125dB for every number
of clocks stored in REG_VALUE:
REG_VALUE
0x0
0x1
0x2
0xFF
24
SLOPE
0.125dB
0.125dB
0.125dB
0.125dB
per
per
per
per
Tclk
Tclk
2*Tclk
255*Tclk
Submit Documentation Feedback
Copyright © 2008–2009, Texas Instruments Incorporated
Product Folder Link(s): AFE5851
AFE5851
www.ti.com............................................................................................................................................. SLOS574A – SEPTEMBER 2008 – REVISED MARCH 2009
When INTERP_ENABLE='0' the ramp rate is 1dB for every 8 times the number of clocks stored in REG_VALUE:
REG_VALUE
0x0
0x1
0x2
0xFF
SLOPE
1dB per
1dB per
1dB per
1dB per
8 × Tclk
8 × Tclk
16 × Tclk
255× 8 × Tclk
SOFT_SYNC
Address 0x99[5]
Setting SOFT_SYNC bit to '1' enables the TGC engine to run periodically following a given TGC curve,
without the need for a high pulse signal in the SYNC pin (see more details below).
UNIFORM_GAIN_MODE
Address 0x99[4]
Setting this bit to ‘0’ (default) directs the TGC engine to follow an arbitrary gain versus time curve. If this bit to
‘1’ the gain is ramped up with a slope set by the UNIFORM_GAIN_SLOPE register. (See more details below)
UNIFORM_GAIN_SLOPE
Address 0x9B[7:0]
See Uniform Gain Increment Mode section below.
STATIC_PGA
Address 0x99[3]
Setting this bit to ‘1’ disables the TGC engine. COARSE_GAIN and FINE_GAIN will control the gain value,
which will be independent of time.
COARSE_GAIN
Address 0x9A[5:0]
This 6 bit register specifies the coarse gain from –5 to 31dB, in 1dB steps. Observe that only values from
0x00 to 0x24, both included, are valid. Setting a value bigger than 0x24 on the COARSE_GAIN register is
the same as setting 0x24. COARSE_GAIN = [–5 + REG_VALUE ] dB
REG_VALUE
0x0
0x1
0x24
GAIN
–5dB
–4dB
31dB
FINE_GAIN
Address 0x99[2:0]
This 3 bit register specifies the fine gain in steps of 0.125dB resolution, from 0dB to 0.875dB. FINE_GAIN =
[0.125 × REG_VALUE ] dB
REG_VALUE
0x0
0x1
0x7
GAIN
0dB
0.125dB
0.875dB
VGA/TGC OPERATION
The gain variation of the variable gain amplifier (VGA) versus time is called TGC function and on the AFE5851 is
controlled digitally. The gain is implemented by a switched network where the switches controlling the gain are
synchronized with the ADC sampling instant to minimize glitches on the output data. The gain setting depends on
the mode of operation selected by the user. There are 3 possible modes of operation: non-uniform gain, uniform
gain, and static mode. The following sections describe each in detail.
Submit Documentation Feedback
Copyright © 2008–2009, Texas Instruments Incorporated
Product Folder Link(s): AFE5851
25
AFE5851
SLOS574A – SEPTEMBER 2008 – REVISED MARCH 2009............................................................................................................................................. www.ti.com
Sync Period
GAIN Profile
SYNC
Signal Input
to AFE5851
External
System
Signal
Wait time
at start gain,
tw
Ramp up time from
start gain to stop gain,
tru
Hold time at
Wait time
stop gain,
at start gain
th
Ramp down from
stop gain to start
gain, trd
Sync Period = tru + th + trd + tw
Figure 34. SYNC Period
Non-Uniform Gain Increment Mode
In the non-uniform gain increment mode, the user sets an arbitrary shape for the gain versus time curve. For a
given time/sampling instant, the digital gain setting is obtained from an internal memory of 148 positions/registers
(named REG_VALUEs), each 9 bits wide, loaded by the user through the serial port (see Serial Interface
section). Addresses 1 to 148 can be used to access these registers, while TGC_REGISTER_WREN='1'.
As explained above, the most significant bit of each register (REG_VALUE<8>) denotes either increment or
decrement gain from current gain value. The other 8 bits (REG_VALUE<7:0>) denote the time (a multiple of
8*Tclk, being Tclk the sampling clock) for the change of the gain from the CURRENT_GAIN to CURRENT_GAIN
±1dB (depending on the REG_VALUE<8>). The fastest ramp (shortest time) for this 1dB gain change is set by
REG_VALUE<7:0> equal to 0x00 and it is 8 × Tclk. The slowest ramp (longest time) for this 1dB gain change is
set by REG_VALUE<7:0> equal to 0xFF and it is 255 × 8 × Tclk.
INTERP_ENABLE sets the way the gain is increased/decreased. By default the gain ramp is implemented in
steps of 1dB (INTERP_ENABLE equal to 0). If INTERP_ENABLE is equal to 1, the actual 1dB gain step is
implemented in 8 steps of 0.125dB.
The 148 REG_VALUE registers can be used to store either a single curve or multiple TGC curves. The
START_INDEX register points to the REG_VALUE register where the TGC curve starts and the STOP_INDEX
register points to the REG_VALUE register where the TGC curve stops. Using the START_INDEX and
STOP_INDEX registers the desired TGC curves can be chosen.
26
Submit Documentation Feedback
Copyright © 2008–2009, Texas Instruments Incorporated
Product Folder Link(s): AFE5851
AFE5851
www.ti.com............................................................................................................................................. SLOS574A – SEPTEMBER 2008 – REVISED MARCH 2009
As shown in Figure 34, a pulse high signal on the SYNC pin will set the starting gain value of the TGC curve to
the START_GAIN register value, and it will initiate the progression through the different REG_VALUEs, starting
at START_INDEX. Observe that there is no option to delay the start of gain stepping after the SYNC pulse is
received. Then, the progression continues until either the STOP_INDEX is reached or maximum/minimum gain is
exceeded. After that, the last valid value of gain is held for an extra given number of clocks set by the register
HOLD_GAIN_TIME.
After the elapsing of clocks mentioned by the HOLD_GAIN_TIME register, the TGC starts to step down (or up) to
the START_GAIN in steps of 1dB every Tclk (channel sampling clock) in preparation for the next TGC profile.
The TGC will start updating/following the REG_VALUEs again after a new high pulse on the SYNC pin is given.
The SYNC signal is latched by the rising edge of the channel sampling clock. In other words, the gain increments
at the rising edge of the channel sampling clock. Setup time with rising edge is 7ns, and hold time 4ns.
SOFT_SYNC
The TGC can run periodically following a given TGC curve but without the need for a high pulse signal in the
SYNC pin. This is done by setting SOFT_SYNC bit to '1'. Once this bit is set, the sequence of events is the same
as with the hardwired SYNC pulse. The TGC curve updates from START_INDEX to STOP_INDEX. After
reaching STOP_INDEX or the maximum/minimum gain, the STOP_GAIN value is held for HOLD_VALUE_TIME
and then the gain ramps up or down to START_GAIN. After this the TGC update starts again automatically and
repeats all these steps periodically till the SOFT_SYNC bit becomes zero.
The SYNC process through register write occurs at the serial clock edge where the register is written. If serial
clock and sample clock (channel sampling clock) are synchronous then the described relation in the hardwired
SYNC section will hold and the SYNC bit is latched by the rising edge of the channel sampling clock, respecting
a setup time with rising edge of 7ns and hold time of 4ns. If sample clock and serial clock are not synchronous
then this relationship does not apply and a clock uncertainty of ±1 sample will apply in respect to the nearest
sample clock rising edge.
Example 1: In the following example of non-uniform gain mode, all the 148 registers are loaded. Nevertheless,
the start address for the TGC is set in START_INDEX to 2 and the stop address (STOP_INDEX) to 7. The
START_GAIN is set to 6 and HOLD_GAIN_TIME is 4.
With a high pulse on the SYNC pin the gain starts from 1dB (START_GAIN=0x06). 1dB to 2dB ramp is done in
120Tclks, using eight 0.125dB steps (as INTERP_ENABLE is set to 1), each 15Tclks long. The ramp from 2dB to
3dB is done in 64Tclks, also in 0.125dB steps. The ramp from 3dB to 4dB is done in 40 Tclks. Decrement from
4dB to 3dB in 64Tclks. Gain increment from 3dB to 4dB in 56 Tclks and from 4dB to 4.875dB in 80 Tclks.
Observe that in the case where INTERP_ENABLE=1, STOP_GAIN = START_GAIN + (STOP_INDEX
-START_INDEX) – ( 2 × Number of decrements) + 0.875dB. In the case where INTERP_ENABLE=’0’,
STOP_GAIN = START_GAIN + (STOP_INDEX-START_INDEX) – ( 2 × Number of Decrements). This is due to
the fact that the interpolation engine keeps the gain increasing or decreasing when INTERP_ENABLE=1, while
the gain is frozen when INTERP_ENABLE=0.
TGC REG INDEX
REG_VALUE[8:0]
Number of Tclks
Direction of Gain Change
1
0x004
4 × 8 = 32
Increment
2
0x00F
15 × 8 = 120
Increment
3
0x008
8 × 8 = 64
Increment
4
0x005
5 × 8 40
Increment
5
0x108
8 × 8 = 64
Decrement
6
0x007
7 × 8 = 56
Increment
7
0x00A
10 × 8 = 80
Increment
...
...
...
...
147
0x00F
15 × 8 = 120
Increment
148
0x00F
15 × 8 = 120
Increment
Submit Documentation Feedback
Copyright © 2008–2009, Texas Instruments Incorporated
Product Folder Link(s): AFE5851
27
AFE5851
SLOS574A – SEPTEMBER 2008 – REVISED MARCH 2009............................................................................................................................................. www.ti.com
NAME
VALUE
START_INDEX
0x02
STOP_INDEX
0x07
START_GAIN
0x06
HOLD_GAIN_TIME
0x04
INTERP_ENABLE
1
UNIFORM_GAIN_MODE
0
Uniform Gain Increment Mode
By setting UNIFORM_GAIN_MODE to '1', the TGC engine can also be configured for a uniform increment gain
ramp mode where the gain is ramped up from the START_GAIN value to the STOP_GAIN with a slope set by
the UNIFORM_GAIN_SLOPE register. Note: STOP_GAIN is not a programmable register, but just an internally
computed value from START_GAIN, UNIFORM_GAIN_SLOPE, START_INDEX and STOP_INDEX.
If INTERP_ENABLE=1, UNIFORM_GAIN_SLOPE sets the number of Tclk (channel sampling clock) at a given
gain before incrementing or decrementing 0.125dB. If INTERP_ENABLE=0, this register sets the number of
8*Tclk (eight sampling periods) at a given gain before incrementing or decrementing 1dB. Observe that in both
cases the time it takes to step by 1dB is the same. In INTERP_ENABLE=0 the gain is stationary at the same
setting for the given time, while in the other case the gain increments in fine gain steps of 0.125dB to cover that
1dB step
When
INTERP_ENABLE
is
zero,
the
STOP_GAIN
is
computed
as
START_GAIN
+
(STOP_INDEX-START_INDEX). Nevertheless, when INTERP_ENABLE = '1', the STOP_GAIN is equal to
START_GAIN + (STOP_INDEX - START_INDEX) + 0.875dB. This is basically due to the fact that the
interpolation engine keeps the gain increasing on the second case, while, as explained above, is frozen on the
first case. Observe that START_INDEX and STOP_INDEX are not used in this case as pointers to the
REG_VALUEs table. Instead, only the difference between the two is important to compute STOP_GAIN. As
such, START_INDEX can be set to zero and STOP_INDEX will store STOP_GAIN – START_GAIN. Observe
that only positive slope ramps are possible.
Example 1: setting START_GAIN=0x2 (–3dB), START_INDEX=0x00, STOP_INDEX=0x06, INTERP_ENABLE=0
and UNIFORM_GAIN_SLOPE=0x8, will set the gain at –3dB for 8 × 8 × Tclk, then to –2dB for another 64 Tclk,
and so on, through –1, 0, 1, 2 and 3. After spending 64 × Tclk in 3dB, the gain will stay at that gain setting for
HOLD_GAIN_TIME and start stepping down back to START_GAIN, with 1dB per Tclk.
Example 2: for the same settings, START_GAIN=0x2 (–3dB), START_INDEX=0x00, STOP_INDEX=0x06, and
UNIFORM_GAIN_SLOPE=0x8, if we set INTERP_ENABLE=1, the gain will start at –3dB for 8Tclk, then
–2.875dB for another 8Tclk, then –2.750dB and so on, till 3dB. At this point, while in example 1, with
INTERP_ENABLE=0 the gain would be frozen for another 64 Tclk, in this example, the gain will continue to
increase with 0.125dB steps every 8Tclk till 3.875dB is reached. There will stay for another 8Tclk before starting
to wait for HOLD_GAIN_TIME and start stepping down.
Example 3: for START_GAIN=0x2(–3dB) , START_INDEX=0x00, STOP_INDEX=0x00, INTERP_ENABLE=1 and
UNIFORM_GAIN_SLOPE=0x1, the gain will step through –3dB, –2.875, –2.75, –2.625, –2.5, –2.375, –2.25 and
–2.125, staying at each of these 8 values 1 clock cycle (8 total). Then it will wait for HOLD_GAIN_TIME in
–2.125dB and then it will start stepping down back to –3dB.
Example 4: same settings as example 3, but with INTERP_ENABLE=0, would simply set the VGA gain to –3dB
for 8 clock cycles and then the logic would wait for HOLD_GAIN_TIME.
Static PGA Mode
The 3rd mode of operation is actually a mode where the TGC engine is disabled by writing '1' into the
STATIC_PGA bit. This enables the use of a fixed gain mode where the gain is obtained by the sum of a coarse
and a fine gain. Coarse gain can be set from –5 to 31dB, in 1dB steps, by the register COARSE_GAIN (6 bit
word from 0x00 to 0x24). Setting a value bigger than 0x24 on the COARSE_GAIN register is the same as setting
0x24. The fine gain can be set in steps of 0.125dB resolution, from 0dB to 0.875dB by the FINE_GAIN register (3
bit word with range from 0x00 to 0x07). Observe that the maximum gain, when both registers are set to their
maximum gains, is actually 31.875dB.
28
Submit Documentation Feedback
Copyright © 2008–2009, Texas Instruments Incorporated
Product Folder Link(s): AFE5851
AFE5851
www.ti.com............................................................................................................................................. SLOS574A – SEPTEMBER 2008 – REVISED MARCH 2009
ANTI ALIAS FILTER (AAF)
The AFE5851 integrates a selectable 3 order low pass filter for each of the 16 channels. The cutoff frequency
can be set for all the channels simultaneously through the serial interface (see FILTER_BW register, in the
General Purpose Register table) between 3 possible settings: 7.5, 10 and 14MHz. Figure 19 shows the
frequency response for each of these settings. The filter characteristics are set by passive components which are
subject to variations over process and temperature. A typical variation of ±5% on the frequency characteristics is
expected.
CLAMPING CIRCUIT AND OVERLOAD RECOVERY
The AFE5851 is designed in particular for ultrasound applications where the front-end device is required to
recover very quickly from an overload condition. Such overload can either be the result of a transmit pulse
feed-through or a strong echo, which can cause overload of the VGA and ADC.
Enabled by default, the AFE5851 includes a clamping circuit to further optimize the overload recovery behavior of
the complete channel (see Figure 31). The circuit can be disabled by writing a '1' in the bit 14 of the address 70
(decimal) of the General Purpose Register Map. The clamp is set to limit the signal at 3dB above the full scale of
the ADC (2Vpp).
CLOCK INPUTS
The 16 channels on the device operate from a single clock input. To ensure that the aperture delay and jitter are
the same for all channels, the AFE5851 uses a clock tree network to generate individual sampling clocks to each
channel. The clock channels for all the channels are matched from the source point to the sampling circuit of
each of the eight internal ADCs. The variation on this delay is described in the Aperture Delay parameter of the
Output Interface Timing. Its variation over time is described in the Aperture Jitter number of the same table.
Observe that the rising edges of the input clock are used to sample the even channels in one input clock period
and the odd channels in the next. Using an input clock double the speed of the channel sampling clock ensures
that the sampling instant between even and odd channels is exactly an input clock period apart and does not
depend on its duty cycle..
The AFE5851 clock input can be driven differentially (sinewave, LVPECL or LVDS) or single-ended (LVCMOS).
The clock input of the device has an internal buffer/clock amplifier (see Figure 35) which is enabled or disabled
automatically depending on the type of clock provided (autodetect feature). When enabled, the device will
consume 6mW more power from the AVDD18 supply rail, but it will also accept differential or single ended inputs
of smaller swing.
VCM
VCM
5 kW
5 kW
CLKP
CLKM
Figure 35. Internal Clock Buffer for Differential Clock Mode
Submit Documentation Feedback
Copyright © 2008–2009, Texas Instruments Incorporated
Product Folder Link(s): AFE5851
29
AFE5851
SLOS574A – SEPTEMBER 2008 – REVISED MARCH 2009............................................................................................................................................. www.ti.com
If the preferred clocking scheme for the device is single-ended, CLKINM pin should be connected to ground, i.e.,
shorted directly to AVSS (see Figure 37). In this case, the autodetect feature will shut down the internal clock
buffer and the device will go into single-ended clock input automatically. The user should connect the
single-ended clock source directly (no decoupling) to CLKINP pin, which would be the only device clock input. In
that case, it is recommended the use of low jitter square signals (LVCMOS levels, 1.8V amplitude) to drive the
ADC (see SLYT075 for further details on the theory).
For single ended sinusoidal clocks or for differential clocks (differential sinewave, LVPECL, LVDS…), the clock
amplifier should be enabled. For that, the connection scheme of Figure 36 should be used. The common-mode
voltage of the clock source should match one of the clock inputs of the AFE5851 (VCM) which is set internally
using 5kΩ resistors, as shown in Figure 35. The easiest way to ensure this is to AC couple the inputs as shown
in Figure 36. The same scheme applies to the case where the clock is single ended but its amplitude is small or
its edges are not sharp (for instance, with a sinusoidal single-ended clock). In this case, the input clock signal
can be connected with a capacitor to CLKINP (as in Figure 36) and the CLKINM should be connected to ground
also through a capacitor, i.e., AC coupled to AVSS.
0.1 mF
CLKP
Differential Sine-Wave
or PECL or LVDS Clock Input
0.1 mF
CLKM
AFE5851
AFE5851
Figure 36. Differential Clock Driving Circuit
If a transformer is used with the secondary floating (for instance, to pass from single-ended to differential) , it can
then obviously be connected directly to the clock inputs, without the need of the 100nF series capacitors.
CMOS Clock Input
CLKP
CLKM
AFE5851
AFE5851
Figure 37. Single-Ended Clock Driving Circuit
30
Submit Documentation Feedback
Copyright © 2008–2009, Texas Instruments Incorporated
Product Folder Link(s): AFE5851
AFE5851
www.ti.com............................................................................................................................................. SLOS574A – SEPTEMBER 2008 – REVISED MARCH 2009
Finally, on the differential clock configurations, Figure 38 shows the use of the CDCM7005 to generate the
AFE5851 clock signals.
VCC
Reference Clock
REF_IN
VCC
Y0
CLKP
Y0B
CLKM
CDCM7005
AFE5851
OUTP
VCXO_INP
OUTM
VCXO_INM
CTRL
CP_OUT
VCXO
Figure 38. PECL Clock Drive Using CDCM7005
DIGITAL OUTPUTS
The conversion results from all 8 ADCs are serialized and output using one LVDS data pair per ADC, at 12 times
the device input clock rate. Besides that, two more LVDS pairs are used to facilitate the interface to the circuit
reading the ADC output. For one side, a reference frame LVDS signal running at the channel rate (half the input
clock rate) indicates the beginning and end of the sample word. On top of that, the device outputs a reference
clock running at 6 times the input clock rate, with rise and fall times aligned with the individual bits. See the
Output Interface Timing section for a description of the timing diagram as well as details on the timing margins.
Figure 39 represents the device LVDS output circuit. Observe that for an LVDS output high (OUTP=1.375V,
OUTM=1.025V) the "high" switches would be closed and the “low” switches would be open. For LVDS output low
(OUTP=1.025V, OUTM=1.375V) the “low” switches would be closed and the “high” left open. As the “high” and
“low” switches have a nominal RON of 50Ω ±10%, notice that the output impedance will be nominally 100Ω in any
of those two configurations (“high” or “low” switches closed).
Submit Documentation Feedback
Copyright © 2008–2009, Texas Instruments Incorporated
Product Folder Link(s): AFE5851
31
AFE5851
+0.35 V
Low
High
SLOS574A – SEPTEMBER 2008 – REVISED MARCH 2009............................................................................................................................................. www.ti.com
OUTP
-0.35 V
High
1.2 V
Low
External
100 W Load
ROUT
OUTM
Switch impedance is
Nominally 50 W ( ±10%)
Figure 39. LVDS Output Circuit
EXTERNAL/INTERNAL REFERENCE
See EXTERNAL_REFERENCE register description in the General Purpose Register Description Section.
POWER SUPPLIES
The use of low noise power supplies with adequate decoupling is recommended, being the linear supplies the
first choice vs switched ones, which tend to generate more noise components that can be coupled to the
AFE5851.
There is no need of any type of power-up sequencing, although a positive pulse must be applied to the Reset pin
once the power supplies are considered stable (see Serial Interface Section)
There are several types of powerdown modes. On the standby mode all circuits but the reference generator are
powered-down. This enables for a fast recovery from power down to full operation. On the full power down mode,
all the blocks are powered down (except some digital circuits). The power savings are bigger but the power-up
will also be slower (see specification tables for more details). The device includes also the possibility of powering
down pairs of channels (corresponding to the same ADC) through the use of PDN_Channel<7:0> and powering
down the LVDS outputs by using PDN_LVDS.
Finally, notice that the metallic heat sink under the package is also connected to analog ground.
LAYOUT INFORMATION
The evaluation board represents a good guideline of how to layout the board to obtain the maximum
performance out of the AFE5851. General design rules as the use of multilayer boards, single ground plane for
both, analog and digital ADC ground connections, and local decoupling ceramic chip capacitors should be
applied. The input traces should be isolated from any external source of interference or noise, including the
digital outputs as well as the clock traces. Clock should also be isolated from other signals although the low
frequencies of the input signal relaxes the jitter requirements.
In order to maintain proper LVDS timing, all LVDS traces should follow a controlled impedance design (for
example, 100Ω differential). In addition, all LVDS trace lengths should be equal and symmetrical. It is
recommended to keep trace length variations less than 150mil (0.150in or 3.81mm).
It is necessary to solder the exposed pad at the bottom of the package to a ground plane for best thermal
performance. For detailed information, see application notes QFN Layout Guidelines (SLOA122A) and QFN/SON
PCB Attachment (SLUA271A).
32
Submit Documentation Feedback
Copyright © 2008–2009, Texas Instruments Incorporated
Product Folder Link(s): AFE5851
AFE5851
www.ti.com............................................................................................................................................. SLOS574A – SEPTEMBER 2008 – REVISED MARCH 2009
DEFINITION OF SPECIFICATIONS
Analog Bandwidth – The analog input frequency at which the power of the fundamental is reduced by 3 dB with
respect to the low frequency value.
Aperture Delay –The delay in time between the rising or the falling edge of the input sampling clock (depending
on the channel) and the actual time at which the sampling occurs. This delay will be different across channels.
The maximum variation is specified as aperture delay variation (channel-channel).
Aperture Uncertainty (Jitter) – The sample-to-sample variation in aperture delay.
Clock Pulse Width/Duty Cycle – The duty cycle of a clock signal is the ratio of the time the clock signal remains
at a logic high (clock pulse width) to the period of the clock signal. Duty cycle is typically expressed as a
percentage. A perfect differential sine-wave clock results in a 50% duty cycle.
Maximum Conversion Rate – The maximum sampling rate at which certified operation is given. All parametric
testing is performed at this sampling rate unless otherwise noted.
Minimum Conversion Rate – The minimum sampling rate at which the ADC functions.
Differential Nonlinearity (DNL) – An ideal ADC exhibits code transitions at analog input values spaced exactly
1 LSB apart. The DNL is the deviation of any single step from this ideal value, measured in units of LSBs.
Integral Nonlinearity (INL) – The INL is the deviation of the ADC's transfer function from a best fit line
determined by a least squares curve fit of that transfer function, measured in units of LSBs.
Gain Error – The difference between the actual gain of a channel & its ideal (theoretical) gain, i.e., the error in
the absolute gain of the channel.
Gain Matching – The gain difference between two channels with same theoretical gain setting. For perfect
matching, the difference should be zero. On the context of this device, the gain matching is obtained in two
different ways:
1. The values on the specification table represent the expected gain matching between any two channels on
the system. The gain is measured on every channel of every device, for a given gain setting, at any
temperature. The difference between the maximum recorded gain and the minimum recorded gain
represents the gain matching at that given gain setting. The same is done for every gain setting and the
maximum difference for any gain setting is presented on the table.
2. The gain matching histogram represents the channel to channel matching inside the same device, i.e., the
maximum expected gain difference between any two channels of the same device, or in other words, the
peak-to-peak variation of absolute gains across all channels in the device. At a given gain setting for all the
channels of a given device (at one temperature assumed common to the whole device), the difference
between the channel with maximum gain and the channel with minimum gain represents one count. The
same thing is done for all the devices and for 3 temperatures (–40C, 25C and 85C). Every measurement of a
device at one given temperature represents one count.
Offset Error – The offset error is the difference, given in mV, between the ADC's actual average idle channel
output code and the ideal average idle channel output code.
Temperature Drift – The temperature drift coefficient (with respect to gain error and offset error) specifies the
change per degree Celsius of the parameter from TMIN to TMAX. It is calculated by dividing the maximum deviation
of the parameter across the TMIN to TMAX range by the difference TMAX–TMIN.
Signal-to-Noise Ratio – SNR is the ratio of the power of the fundamental (PS) to the noise floor power (PN),
excluding the power at DC and the first nine harmonics.
P
SNR + 10Log10 S
PN
(1)
SNR is either given in units of dBc (dB to carrier) when the absolute power of the fundamental is used as the
reference, or dBFS (dB to full scale) when the power of the fundamental is extrapolated to the converter’s
full-scale range.
Signal-to-Noise and Distortion (SINAD) – SINAD is the ratio of the power of the fundamental (PS) to the power
of all the other spectral components including noise (PN) and distortion (PD), but excluding dc.
Submit Documentation Feedback
Copyright © 2008–2009, Texas Instruments Incorporated
Product Folder Link(s): AFE5851
33
AFE5851
SLOS574A – SEPTEMBER 2008 – REVISED MARCH 2009............................................................................................................................................. www.ti.com
SINAD = 10 log 10
PS
PN + PD
(2)
SINAD is either given in units of dBc (dB to carrier) when the absolute power of the fundamental is used as the
reference, or dBFS (dB to full scale) when the power of the fundamental is extrapolated to the converter's
full-scale range.
Effective Number of Bits (ENOB) – The ENOB is a measure of a converter’s performance as compared to the
theoretical limit based on quantization noise.
ENOB + SINAD * 1.76
6.02
(3)
Spurious Free Dynamic Range (SFDR) – SFDR is the ratio of the power of the fundamental (PS) to the highest
FFT bin, harmonic or not, excluding DC. SFDR is typically given in units of dBc (dB to carrier).
Second Harmonic Distortion (HD2) – HD2 is the ratio of the power of the fundamental (PS) to the second
harmonic, typically given in units of dBc (dB to carrier).
Third Harmonic Distortion (HD3) –HD3 is the ratio of the power of the fundamental (PS) to the third harmonic,
typically given in units of dBc (dB to carrier).
Total Harmonic Distortion (THD) – THD is the ratio of the power of the fundamental (PS) to the power of the
first nine harmonics (PD).
THD = 10 log 10
PS
PD
(4)
THD is typically given in units of dBc (dB to carrier).
AC Power Supply Rejection Ratio (AC PSRR) – A measure of the device immunity to variations in its supply
voltage. In this datasheet, if ΔVSUP represents the change in supply voltage and ΔVOUT is the resultant change
of the ADC output code (referred to the input), then:
æ DVout ö
PSRR = 20 log ç
÷
è DVsup ø
34
(5)
Submit Documentation Feedback
Copyright © 2008–2009, Texas Instruments Incorporated
Product Folder Link(s): AFE5851
PACKAGE MATERIALS INFORMATION
www.ti.com
15-Apr-2014
TAPE AND REEL INFORMATION
*All dimensions are nominal
Device
Package Package Pins
Type Drawing
SPQ
Reel
Reel
A0
Diameter Width (mm)
(mm) W1 (mm)
B0
(mm)
K0
(mm)
P1
(mm)
W
Pin1
(mm) Quadrant
AFE5851IRGCR
VQFN
RGC
64
2000
330.0
16.4
9.3
9.3
1.5
12.0
16.0
Q2
AFE5851IRGCT
VQFN
RGC
64
250
180.0
16.4
9.3
9.3
1.5
12.0
16.0
Q2
Pack Materials-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com
15-Apr-2014
*All dimensions are nominal
Device
Package Type
Package Drawing
Pins
SPQ
Length (mm)
Width (mm)
Height (mm)
AFE5851IRGCR
VQFN
RGC
64
2000
336.6
336.6
28.6
AFE5851IRGCT
VQFN
RGC
64
250
213.0
191.0
55.0
Pack Materials-Page 2
IMPORTANT NOTICE
Texas Instruments Incorporated and its subsidiaries (TI) reserve the right to make corrections, enhancements, improvements and other
changes to its semiconductor products and services per JESD46, latest issue, and to discontinue any product or service per JESD48, latest
issue. Buyers should obtain the latest relevant information before placing orders and should verify that such information is current and
complete. All semiconductor products (also referred to herein as “components”) are sold subject to TI’s terms and conditions of sale
supplied at the time of order acknowledgment.
TI warrants performance of its components to the specifications applicable at the time of sale, in accordance with the warranty in TI’s terms
and conditions of sale of semiconductor products. Testing and other quality control techniques are used to the extent TI deems necessary
to support this warranty. Except where mandated by applicable law, testing of all parameters of each component is not necessarily
performed.
TI assumes no liability for applications assistance or the design of Buyers’ products. Buyers are responsible for their products and
applications using TI components. To minimize the risks associated with Buyers’ products and applications, Buyers should provide
adequate design and operating safeguards.
TI does not warrant or represent that any license, either express or implied, is granted under any patent right, copyright, mask work right, or
other intellectual property right relating to any combination, machine, or process in which TI components or services are used. Information
published by TI regarding third-party products or services does not constitute a license to use such products or services or a warranty or
endorsement thereof. Use of such information may require a license from a third party under the patents or other intellectual property of the
third party, or a license from TI under the patents or other intellectual property of TI.
Reproduction of significant portions of TI information in TI data books or data sheets is permissible only if reproduction is without alteration
and is accompanied by all associated warranties, conditions, limitations, and notices. TI is not responsible or liable for such altered
documentation. Information of third parties may be subject to additional restrictions.
Resale of TI components or services with statements different from or beyond the parameters stated by TI for that component or service
voids all express and any implied warranties for the associated TI component or service and is an unfair and deceptive business practice.
TI is not responsible or liable for any such statements.
Buyer acknowledges and agrees that it is solely responsible for compliance with all legal, regulatory and safety-related requirements
concerning its products, and any use of TI components in its applications, notwithstanding any applications-related information or support
that may be provided by TI. Buyer represents and agrees that it has all the necessary expertise to create and implement safeguards which
anticipate dangerous consequences of failures, monitor failures and their consequences, lessen the likelihood of failures that might cause
harm and take appropriate remedial actions. Buyer will fully indemnify TI and its representatives against any damages arising out of the use
of any TI components in safety-critical applications.
In some cases, TI components may be promoted specifically to facilitate safety-related applications. With such components, TI’s goal is to
help enable customers to design and create their own end-product solutions that meet applicable functional safety standards and
requirements. Nonetheless, such components are subject to these terms.
No TI components are authorized for use in FDA Class III (or similar life-critical medical equipment) unless authorized officers of the parties
have executed a special agreement specifically governing such use.
Only those TI components which TI has specifically designated as military grade or “enhanced plastic” are designed and intended for use in
military/aerospace applications or environments. Buyer acknowledges and agrees that any military or aerospace use of TI components
which have not been so designated is solely at the Buyer's risk, and that Buyer is solely responsible for compliance with all legal and
regulatory requirements in connection with such use.
TI has specifically designated certain components as meeting ISO/TS16949 requirements, mainly for automotive use. In any case of use of
non-designated products, TI will not be responsible for any failure to meet ISO/TS16949.
Products
Applications
Audio
www.ti.com/audio
Automotive and Transportation
www.ti.com/automotive
Amplifiers
amplifier.ti.com
Communications and Telecom
www.ti.com/communications
Data Converters
dataconverter.ti.com
Computers and Peripherals
www.ti.com/computers
DLP® Products
www.dlp.com
Consumer Electronics
www.ti.com/consumer-apps
DSP
dsp.ti.com
Energy and Lighting
www.ti.com/energy
Clocks and Timers
www.ti.com/clocks
Industrial
www.ti.com/industrial
Interface
interface.ti.com
Medical
www.ti.com/medical
Logic
logic.ti.com
Security
www.ti.com/security
Power Mgmt
power.ti.com
Space, Avionics and Defense
www.ti.com/space-avionics-defense
Microcontrollers
microcontroller.ti.com
Video and Imaging
www.ti.com/video
RFID
www.ti-rfid.com
OMAP Applications Processors
www.ti.com/omap
TI E2E Community
e2e.ti.com
Wireless Connectivity
www.ti.com/wirelessconnectivity
Mailing Address: Texas Instruments, Post Office Box 655303, Dallas, Texas 75265
Copyright © 2014, Texas Instruments Incorporated
Mouser Electronics
Authorized Distributor
Click to View Pricing, Inventory, Delivery & Lifecycle Information:
Texas Instruments:
AFE5851EVM
Similar pages